Document Number: MM908E622 Rev. 2.0, 6/2008 Freescale Semiconductor Technical Data Integrated Quad Half-bridge, Triple High Side and EC Glass Driver with Embedded MCU and LIN for High End Mirror 908E622 QUAD HALF-BRIDGE, TRIPLE HIGH SIDE SWITCH AND EC GLASS CIRCUITRY WITH EMBEDDED MCU AND LIN The 908E622 is an integrated single package solution that includes a high-performance HC08 microcontroller with a SMARTMOSTM analog control IC. The HC08 includes flash memory, a timer, enhanced serial communications interface (ESCI), a 10 bit analog-to-digital converter (ADC), serial peripheral interface (SPI) (only internal), and an internal clock generator module (ICG). The analog control die provides four half-bridge and three high side outputs with diagnostic functions, an EC glass driver circuit, a Halleffect sensor input, analog inputs, voltage regulator, window watchdog, and local interconnect network (LIN) physical layer. The single package solution, together with LIN, provides optimal application performance adjustments and space saving PCB design. It is well suited for the control of automotive high-end mirrors. DWB SUFFIX 98ASA10712D 54-PIN SOICW-EP Features • • • • • • • • • • • High performance M68HC908EY16 core 16K bytes of On-chip flash memory, 512 bytes of RAM Two 16-bit, 2-channel timers LIN physical layer interface Autonomous MCU watchdog / MCU supervision One analog input with switchable current source Four low RDS(ON) Half-bridge outputs Three low RDS(ON) high side outputs EC glass driver circuitry Wake-up and 2/3-pin Hall-effect sensor input 12 microcontroller I / Os ORDERING INFORMATION Device Temperature Range (TA) Package MM908E622ACDWB/ R2 - 40°C to 85°C 54 SOICW-EP 100nF 4.7μF 100nF >2 2μF 908E622 LIN VSUP[1:8] VDDA/VREFH EVDD VDD L0 Wake Up Input HB1 HB2 M VSSA/VREFL EVSS VSS M 4 x Half Bridge Outputs HB3 M RST_A RST IRQ_A IRQ HB4 HS1 High Side Output 1 PTA0/KBD0 PTA1/KBD1 PTA2/KBD2 PTA3/KBD3 PTA4/KBD4 HS2 High Side Output 2 HS3 High Side Output 3 μC PortB PTB3/AD3 PTB4/AD4 PTB5/AD5 ECR EC EC - Glas Control μC PortC PTC2/MCLK PTC3/OSC2 PTC4/OSC1 μC PortA Internally connected μC PortD μC PortE Internally connected HVDD A0 A0CST PTD0/TACH0 PTD1/TACH1 PTE1/RxD H0 GND[1:4] EP TESTMODE Switched 5V output Analog Input with current source Analog Input current source trim 2-/3-pin hall sensor input Pull to ground for user mode Figure 1. 908E622 Simplified Application Diagram Freescale Semiconductor, Inc. reserves the right to change the detail specifications, as may be required, to permit improvements in the design of its products. © Freescale Semiconductor, Inc., 2005-2008. All rights reserved. 2 DDRA PORT A SPSCK PTA5/SPSCK PTB0/AD0 MOSI PTC1/MOSI ADOUT MISO SS PWM PTC0/MISO PTA6/SS PTD0/TACH0 TXD PTE0/TXD IRQ_A PORT D PORT E DDRD DDRE Analog Multiplexer SPI & CONTROL Autonomous Watchdog Reset Control LIN Physical Layer Figure 2. 908E622 Simplified Internal Block Diagram PTE0/TXD PTE1/RXD PTD0/TACH0 PTD1/TACH1 PTC4/OSC1 PTC3/OSC2 PTC2/MCLK PTC1/MOSI PTC0/MISO BEMF Module Prescaler Module Arbiter Module Periodic Wake-up Timebase Module Configuration Register Module Serial Peripheral Interface Module Computer Operating Properly Module Enhanced Serial Communication Interface Module 2-channel Timer Interface Module B PORT C DDRC FLSVPP PTD1/TACH1 Security Module Power-ON Reset Module RST PTC4/OSC1 Single External IRQ Module VREFH VDDA 10 Bit Analog-toVREFL Digital Converter Module VSSA VDD POWER VSS IRQ 24 Internal System Integration Module PTA6/SS PTA5/SPSCK PTA4/KBD4 PTA3/KBD3 PTA2/KBD2 PTA1/KBD1 PTA0/KBD0 PTB7/AD7/TBCH1 PTB6/AD6/TBCH0 PTB5/AD5 PTB4/AD4 PTB3/AD3 PTB2/AD2 PTB1/AD1 PTB0/AD0 VDDA/VREFH PTC3/OSC2 PTC2/MCLK PTB5/AD5 PTB4/AD4 PTB3/AD3 PTA4/KBD4 RST OSC2 Internal Clock OSC1 Generator Module User Flash Vector Space, 36 Bytes IRQ PTA3/KBD3 EVDD 2-channel Timer Interface Module A PTE1/RXD RXD PTD0/TACH0 PTE1/RXD RST_A PTA2/KBD2 EVSS 5-Bit Keyboard Interrupt Module LIN PTA1/KBD1 PTA0/KBD0 VSSA/VREFL VSS A0 A0CST H0 Hallport EC ECR HB4 HB3 HB2 HB1 Analog Port with Current Source EC glass Driver & Diagnostic Half Bridge Driver & Diagnostic Half Bridge Driver & Diagnostic Half Bridge Driver & Diagnostic Half Bridge Driver & Diagnostic HS3 HS2 High Side Driver & Diagnostic High Side Driver & Diagnostic HS1[a:b] L0 HVDD VDD High Side Driver & Diagnostic Wakeup Port Switched VDD Driver & Diagnostic Voltage Regulator VSUP[1:8] Control and Status Register, 64 Bytes User Flash, 15,872 Bytes User RAM, 512 Bytes Monitor ROM, 310 Bytes Flash programming (Burn-in), 1024 Bytes Single Breakpoint Break Module GND[1:4] M68HC08 CPU CPU ALU Registers INTERNAL BLOCK DIAGRAM INTERNAL BLOCK DIAGRAM TESTMODE Internal Bus DDRB PORT B 908E622 Analog Integrated Circuit Device Data Freescale Semiconductor PIN CONNECTIONS PIN CONNECTIONS Transparent Top View of Package PTC4/OSC1 PTC3/OSC2 PTC2/MCLK PTB5/AD5 PTB4/AD4 PTB3/AD3 1 54 2 53 3 52 4 51 5 50 6 49 IRQ RST 7 48 8 47 (PTD0/TACH0/BEMF -> PWM) PTD1/TACH1 9 46 10 45 RST_A IRQ_A 11 44 12 43 LIN A0CST A0 GND1 HB4 VSUP1 GND2 HB3 VSUP2 EC ECR TESTMODE GND3 HB2 VSUP3 13 14 15 42 Exposed Pad 41 40 16 39 17 38 18 37 19 36 20 35 21 34 22 33 23 32 24 31 25 30 26 29 27 28 PTA0/KBD0 PTA1/KBD1 PTA2/KBD2 FLSVPP PTA3/KBD3 PTA4/KBD4 VDDA/VREFH EVDD EVSS VSSA/VREFL (PTE1/RXD <- RXD) VSS VDD HVDD L0 H0 HS3 VSUP8 HS2 VSUP7 HS1b HS1a VSUP6 VSUP5 GND4 HB1 VSUP4 Figure 3. Pin Connections Table 1. Pin Definitions A functional description of each pin can be found in the Functional Pin Description section beginning on page 20. Die Pin Pin Name Formal Name Definition MCU 1 2 3 PTC4/OSC1 PTC3/OSC2 PTC2/MCLK Port C I/Os These pins are special function, bidirectional I/O port pins that are shared with other functional modules in the MCU. MCU 4 5 6 PTB5/AD5 PTB4/AD4 PTB3/AD3 Port B I/Os These pins are special function, bidirectional I/O port pins that are shared with other functional modules in the MCU. MCU 7 IRQ External Interrupt Input MCU 8 RST External Reset MCU / Analog 9 (PTD0/TACH0/BEMF -> PWM) PWM signal This pin is an asynchronous external interrupt input pin. This pin is bidirectional, allowing a reset of the entire system. It is driven low when any internal reset source is asserted. This pin is the PWM signal test pin. It internally connects the MCU PTD0/TACH0 pin with the Analog die PWM input. Note: Do not connect in the application. MCU 10 PTD1/TACH1 Port D I /Os This pin is a special function, bidirectional I /O port pin that is shared with other functional modules in the MCU. 908E622 Analog Integrated Circuit Device Data Freescale Semiconductor 3 PIN CONNECTIONS Table 1. Pin Definitions (continued) A functional description of each pin can be found in the Functional Pin Description section beginning on page 20. Die Pin Pin Name Formal Name Definition MCU / Analog 44 (PTE1/ RXD <- RXD) LIN Transceiver Output This pin is the LIN Transceiver output test pin. It internally connects the MCU PTE1/RXD pin with the Analog die LIN transceiver output pin RXD. Note: Do not connect in the application. MCU These pins are the power supply and voltage reference pins for the analog-to-digital converter (ADC). VSSA/VREFL VDDA/VREFH ADC Supply and 48 MCU 46 47 EVSS EVDD MCU Power Supply Pins MCU 49 50 52 53 54 PTA4/KBD4 PTA3/KBD3 PTA2/KBD2 PTA1/KBD1 PTA0/KBD0 Port A I /Os MCU 51 FLSVPP Test Pin Analog 11 RST_A Internal Reset Analog 12 IRQ_A Internal Interrupt Output Analog 13 LIN LIN Bus Analog 14 A0CST Analog Input Trim Pin Analog 15 A0 Analog Input Pin Analog 16 19 25 30 GND1 GND2 GND3 GND4 Power Ground Pins These pins are device power ground connections. Analog 29 26 20 17 HB1 HB2 HB3 HB4 Half-bridge Outputs This device includes power MOSFETs configured as four half-bridge driver outputs. These outputs may be configured for DC motor drivers, or as high side and low side switches. Analog 18 21 27 28 31 32 35 VSUP1 VSUP2 VSUP3 VSUP4 VSUP5 VSUP6 VSUP7 Power Supply Pins Analog 22 23 EC ECR EC Glass Pin Analog 24 TESTMODE Analog 34 35 HS1a HS1b High Side HS1 Output This output pin is a low RDS(ON) high side switch. Analog 36 HS2 High Side HS2 Output These output pins are low RDS(ON) high side switches. High Side HS3 Output 38 HS3 39 H0 Analog 45 Reference Pins These pins are the ground and power supply pins, respectively. The MCU operates from a single power supply. These pins are special function, bidirectional I/O port pins that are shared with other functional modules in the MCU. For test purposes only. Do not connect in the application. This pin is the bidirectional reset pin of the analog die. This pin is the interrupt output pin of the analog die indicating errors or wake-up events. This pin represents the single wire bus transmitter and receiver. This is the Analog Input Trim Pin for the A0 input. This is to connect a known fixed resistor value to trim the current source measurement. This pin is an analog input port with selectable source values. Note: The HB3 and HB4 have a lower RDS(ON) then HB1 and HB2. These pins are device power supply pins. EC Ballast Resistor Pin These are the Electrochrome Circuitry Pins. The EC Pin has to be connected to the EC Glass and the ECR Pin has to be connected to the external ballast resistor. TESTMODE Input Pin for test purpose only. In application, this pin needs to be tied GND. Hall-effect Sensor / General Purpose Input This pin provides an input for a Hall-effect sensor or general purpose input. 908E622 4 Analog Integrated Circuit Device Data Freescale Semiconductor PIN CONNECTIONS Table 1. Pin Definitions (continued) A functional description of each pin can be found in the Functional Pin Description section beginning on page 20. Die Pin Pin Name Formal Name Definition Analog 40 L0 Wake-up Input This pin provides an high voltage input, which is wake-up capable. Analog 41 HVDD Switchable VDD Output This pin is a switchable VDD output for driving resistive loads requiring a regulated 5.0V supply; e.g. potentiometers. Analog 42 VDD Voltage Regulator Output The + 5.0V voltage regulator output pin is intended to supply the embedded microcontroller. Analog 43 VSS Voltage Regulator Ground Ground pin for the connection of all non-power ground connections (microcontroller and sensors). – EP Exposed Pad Exposed Pad The exposed pad pin on the bottom side of the package conducts heat from the chip to the PCB board. 908E622 Analog Integrated Circuit Device Data Freescale Semiconductor 5 ELECTRICAL CHARACTERISTICS MAXIMUM RATINGS ELECTRICAL CHARACTERISTICS MAXIMUM RATINGS Table 2. Maximum Ratings All voltages are with respect to ground unless otherwise noted. Exceeding limits on any pin may cause permanent damage to the device. Rating Symbol Value Unit Analog Chip Supply Voltage under Normal Operation (Steady-state) VSUP(SS) - 0.3 to 28 Analog Chip Supply Voltage under Transient Conditions(1) VSUP(PK) - 0.3 to 40 VDD - 0.3 to 5.5 VIN (ANALOG) - 0.3 to 5.5 VIN (MCU) VSS - 0.3 to VDD +0.3 All Pins except VDD, VSS, PTA0:PTA4 IPIN(1) ±15 PTA0:PTA4 IPIN(2) ± 25 Maximum Microcontroller VSS Output Current IMVSS 100 mA Maximum Microcontroller VDD Input Current IMVDD 100 mA Normal Operation (Steady-state) VBUS(SS) -18 to 40 Transient Input Voltage (per ISO7637 Specification) and with External Components (Figure 4, page 17) VBUS(PK) -150 to 100 VESD1-1 ±1000 VESD1-2 ±2000 ELECTRICAL RATINGS Supply Voltage V MCU Chip Supply Voltage Input Pin Voltage V Analog Chip Microcontroller Chip Maximum Microcontroller Current per Pin mA LIN Supply Voltage V ESD Voltage V Human Body Model (2) H0 pin Human Body Model(2) all other pins Machine Model VESD2 ±200 Charge Device Model(2) VESD3 ± 750 (2) Notes 1. Transient capability for pulses with a time of t < 0.5 sec. 2. ESD testing is performed in accordance with the Human Body Model (HBM) (CZAP = 100pF, RZAP = 1500Ω), the Machine Model (MM) (CZAP = 200pF, RZAP = 0Ω), and the Charge Device Model (CDM), Robotic (CZAP = 4.0pF). 908E622 6 Analog Integrated Circuit Device Data Freescale Semiconductor ELECTRICAL CHARACTERISTICS MAXIMUM RATINGS Table 2. Maximum Ratings (continued) All voltages are with respect to ground unless otherwise noted. Exceeding limits on any pin may cause permanent damage to the device. Rating Symbol Value Unit Operating Ambient Temperature(3) TA - 40 to 85 °C Operating Junction Temperature(4) TJ - 40 to 125 °C Storage Temperature TSTG - 40 to 150 °C Peak Package Reflow Temperature During Reflow(5), (6) TPPRT Note 6 °C THERMAL RATINGS Notes 3. The limiting factor is junction temperature; taking into account the power dissipation, thermal resistance, and heat sinking. 4. The temperature of analog and MCU die is strongly linked via the package, but can differ in dynamic load conditions, usually because of higher power dissipation on the analog die. The analog die temperature must not exceed 150°C under these conditions. 5. Pin soldering temperature limit is for 10 seconds maximum duration. Not designed for immersion soldering. Exceeding these limits may cause malfunction or permanent damage to the device. 6. Freescale’s Package Reflow capability meets Pb-free requirements for JEDEC standard J-STD-020C. For Peak Package Reflow Temperature and Moisture Sensitivity Levels (MSL), Go to www.freescale.com, search by part number [e.g. remove prefixes/suffixes and enter the core ID to view all orderable parts. (i.e. MC33xxxD enter 33xxx), and review parametrics. 908E622 Analog Integrated Circuit Device Data Freescale Semiconductor 7 ELECTRICAL CHARACTERISTICS STATIC ELECTRICAL CHARACTERISTICS STATIC ELECTRICAL CHARACTERISTICS Table 3. Static Electrical Characteristics All characteristics are for the analog chip only. Refer to the 68HC908EY16 datasheet for characteristics of the microcontroller chip. Characteristics noted under conditions 9.0V ≤ VSUP ≤ 16V, - 40°C ≤ TJ ≤ 125°C, unless otherwise noted. Typical values noted reflect the approximate parameter mean at TA = 25°C under nominal conditions, unless otherwise noted. Characteristic Symbol Min Typ Max Unit VSUP1 9.0 — 16 V VSUP2 7.5 — 20 V IRUN — 25 — mA ISTOP — 40 50 μA ISLEEP — 12 20 μA Low-state Output Voltage (IOUT = -1.5mA) VOL – – 0.4 High-state Output Voltage (IOUT = 250μA) VOH 3.85 – – COUT – 4.0 – Input Logic Low Voltage VIL – – 1.5 Input Logic High Voltage VIH 3.5 – – Input pins - Capacitance(10) CIN – 4.0 – pF Pins IRQ_A, RST_A - Pullup Resistor RPULLUP1 – 10 – kΩ Pins SS - Pullup Resistor RPULLUP2 – 100 – kΩ RPULLDOWN – 100 – kΩ IPULLUP – 35 – μA SUPPLY VOLTAGE RANGE Nominal Operating Voltage Extended Operating Voltage (LIN only 8..18V)(8) SUPPLY CURRENT RANGE Normal Mode(8) VSUP = 12V, Analog Chip in Normal Mode (PSON=1), MCU Operating Using Internal Oscillator at 32MHz (8.0MHz Bus Frequency), SPI, ESCI, ADC Enabled Stop Mode(8), (9) VSUP = 12V, Voltage Regulator with limited current capability Sleep Mode(8), (9) VSUP = 12V, Voltage Regulator off DIGITAL INTERFACE RATINGS (ANALOG DIE) Output pins RST_A, IRQ_A, RXD (MISO probe only) Output pin RXD - Capacitance V (10) Input pins RST_A, PWM (SS, MOSI, TXD probe only) Pins MOSI, SPSCK, PWM - Pulldown Resistor Pin TXD - Pullup Current Source pF V Notes 7. Device is fully functional, but some of the parameters might be out of spec. 8. Total current measured at GND pins. 9. Stop and Sleep mode current will increase if VSUP exceeds 15V. 10. This parameter is guaranteed by process monitoring but is not production tested. 908E622 8 Analog Integrated Circuit Device Data Freescale Semiconductor ELECTRICAL CHARACTERISTICS STATIC ELECTRICAL CHARACTERISTICS Table 3. Static Electrical Characteristics (continued) All characteristics are for the analog chip only. Refer to the 68HC908EY16 datasheet for characteristics of the microcontroller chip. Characteristics noted under conditions 9.0V ≤ VSUP ≤ 16V, - 40°C ≤ TJ ≤ 125°C, unless otherwise noted. Typical values noted reflect the approximate parameter mean at TA = 25°C under nominal conditions, unless otherwise noted. Characteristic Symbol Min Typ Max Unit Threshold VLVRON 3.8 4.2 4.65 V Hysteresis VLVR_HYS 50 – 300 mV Threshold VLVION 6.0 – 7.5 Hysteresis VLVI_HYS 0.3 – 0.8 Threshold VHVION 20 – 24 Hysteresis VHVI_HYS 0.5 – 1.5 TION 125 – 150 TIH 5.0 – 10.0 TRON 155 – 180 TIH 5.0 – 10.0 IOUT = 60mA, 7.5V < VSUP < 20V VDDRUN1 4.75 5.0 5.25 IOUT = 60mA, VSUP < 7.5V and VSUP > 20V VDDRUN2 4.75 5.0 5.25 IOUTRUN – 120 150 mA VLR – – 100 mV STOP Mode Output Voltage(13) VDDSTOP 4.75 5.0 5.25 V STOP Mode Total Output Current IOUTSTOP 150 500 1100 μA SYSTEM RESETS AND INTERRUPTS Low Voltage Reset (LVR) Low Voltage Interrupt (LVI) V High Voltage Interrupt (HVI) V High Temperature Interrupt (HTI)(11) Threshold TJ Hysteresis °C High Temperature Reset (HTR)(11) Threshold TJ Hysteresis °C VOLTAGE REGULATOR(12) Normal Mode Output Voltage(13) Normal Mode Total Output Current Load Regulation - IOUT = 60mA, VSUP = 9.0V, TJ = 125°C V Notes 11. This parameter is guaranteed by process monitoring but is not production tested. 12. Specification with external low ESR ceramic capacitor 1.0μF< C < 4.7μF and 200mΩ ≤ ESR ≤ 10Ω. Its not recommended to use capacitor values above 4.7μF 13. When switching from Normal to Stop mode or from Stop mode to Normal mode, the output voltage can vary within the output voltage specification. 908E622 Analog Integrated Circuit Device Data Freescale Semiconductor 9 ELECTRICAL CHARACTERISTICS STATIC ELECTRICAL CHARACTERISTICS Table 3. Static Electrical Characteristics (continued) All characteristics are for the analog chip only. Refer to the 68HC908EY16 datasheet for characteristics of the microcontroller chip. Characteristics noted under conditions 9.0V ≤ VSUP ≤ 16V, - 40°C ≤ TJ ≤ 125°C, unless otherwise noted. Typical values noted reflect the approximate parameter mean at TA = 25°C under nominal conditions, unless otherwise noted. Characteristic Symbol Min Typ Max Unit Recessive State, TXD HIGH, IOUT = 1.0μA V LIN_REC VSUP -1 — — Dominant State, TXD LOW, 500Ω External Pullup Resistor V LIN_DOM — — 1.4 Normal Mode Pullup Resistor to VSUP R PU 20 30 47 kΩ Stop, Sleep Mode Pullup Current Source IPU — 20 — μA Output Current Shutdown Threshold IBLIM 100 230 280 mA Output Current Shutdown Timing IBLS 5.0 – 40 µs LIN PHYSICAL LAYER LIN Transceiver Output Voltage V Leakage Current to GND VSUP Disconnected, VBUS at 18V IBUS – 1.0 10 µA IBUS-PAS-REC 0.0 3.0 20 µA IBUS-NOGND -1.0 – 1.0 mA Receiver Threshold Dominant VBUS_DOM – – 0.4 Receiver Threshold Recessive VBUS_REC 0.6 – – VBUS_CNT 0.475 0.5 0.525 VBUS_HYS – – 0.175 Recessive state, 8.0V ≤ VSUP ≤ 18V, 8.0V ≤ VBUS ≤ 18V, VBUS ≥ VSUP GND Disconnected, VGND = VSUP, VBUS at -18V LIN Receiver Receiver Threshold Center Receiver Threshold Hysteresis VSUP 908E622 10 Analog Integrated Circuit Device Data Freescale Semiconductor ELECTRICAL CHARACTERISTICS STATIC ELECTRICAL CHARACTERISTICS Table 3. Static Electrical Characteristics (continued) All characteristics are for the analog chip only. Refer to the 68HC908EY16 datasheet for characteristics of the microcontroller chip. Characteristics noted under conditions 9.0V ≤ VSUP ≤ 16V, - 40°C ≤ TJ ≤ 125°C, unless otherwise noted. Typical values noted reflect the approximate parameter mean at TA = 25°C under nominal conditions, unless otherwise noted. Characteristic Symbol Min Typ Max Unit RDS(ON)-HS1 – 185 225 IHSOC1 6.0 – 9.0 A tOCB – 4-8 – µs CRRATIOHS1 0.84 1.2 1.56 V/A fPWMHS – – 25 kHz VHSF – 0.9 – V ILeakHS – <0.2 10 µA RDS(ON)-HS23 – 440 500 IHSOC23 3.6 – 5.6 A tOCB – 4.8 – µs CRRATIOHS23 1.16 1.66 2.16 V/A fPWMHS – – 25 kHz VHSF – 0.9 – V ILeakHS – <0.2 10 µA HIGH SIDE OUTPUT HS1 Switch On Resistance mΩ TJ = 25°C, ILOAD = 1.0 A Over-current Shutdown Over-current Shutdown blanking Current to Voltage time(14) Ratio(15) VADOUT [V] / IHS [A], (measured and trimmed IHS = 2.0A) High Side Switching Frequency(14) High Side Freewheeling Diode Forward Voltage TJ = 25°C, ILOAD = 1.0A Leakage Current HIGH SIDE OUTPUTS HS2 AND HS3 (16) Switch On Resistance mΩ TJ = 25°C, ILOAD = 1.0A Over-current Shutdown Over-current Shutdown blanking time (14) Current to Voltage Ratio(15) VADOUT [V] / IHS [A], (measured and trimmed IHS = 2.0A) High Side Switching Frequency(14) High Side Freewheeling Diode Forward Voltage TJ = 25°C, ILOAD = 1.0A Leakage Current Notes 14. This parameter is guaranteed by process monitoring but is not production tested. 15. This parameter is guaranteed only if correct trimming was applied. 16. The high side HS3 can be only used for resistive loads. 908E622 Analog Integrated Circuit Device Data Freescale Semiconductor 11 ELECTRICAL CHARACTERISTICS STATIC ELECTRICAL CHARACTERISTICS Table 3. Static Electrical Characteristics (continued) All characteristics are for the analog chip only. Refer to the 68HC908EY16 datasheet for characteristics of the microcontroller chip. Characteristics noted under conditions 9.0V ≤ VSUP ≤ 16V, - 40°C ≤ TJ ≤ 125°C, unless otherwise noted. Typical values noted reflect the approximate parameter mean at TA = 25°C under nominal conditions, unless otherwise noted. Characteristic Symbol Min Typ Max Unit High Side, TJ = 25°C, ILOAD = 1.0A – 750 900 Low Side, TJ = 25°C, ILOAD = 1.0A – 750 900 1.0 – 1.5 1.0 – 1.5 tOCB – 4.8 – μs fPWM – – 25 kHz HALF-BRIDGE OUTPUTS HB1 AND HB2 Switch On Resistance mΩ RDS(ON)-HB12 Over-current Shutdown IHBOC12 High Side Low Side Over-current Shutdown blanking time (17) Switching Frequency (17) A Freewheeling Diode Forward Voltage V High Side, TJ = 25°C, ILOAD = 1.0A VHSF – 0.9 – Low Side, TJ = 25°C, ILOAD = 1.0A VLSF – 0.9 – ILeakHB – <0.2 10 VADOUT [V] / IHB [A], CSA = 1, (measured and trimmed IHS = 200mA) 17.5 25.0 32.5 VADOUT [V] / IHB [A], CSA = 0, (measured and trimmed IHS = 500mA) 3.5 5.0 6.5 Leakage Current Low Side Current to Voltage Ratio (18) µA V/A CRRATIOHB12 HALF-BRIDGE OUTPUTS HB3 AND HB4 Switch On Resistance RDS(ON)-HB34 mΩ High Side, TJ = 25°C, ILOAD = 1.0A – 275 325 Low Side, TJ = 25°C, ILOAD = 1.0A – 275 325 High Side 4.8 – 7.2 Low Side 4.8 – 7.2 tOCB – 4.8 – μs fPWM – – 25 kHz High Side, TJ = 25°C, ILOAD = 1.0A VHSF – 0.9 – Low Side, TJ = 25°C, ILOAD = 1.0A VLSF – 0.9 – ILeakHB – <0.2 10 VADOUT [V] / IHB [A], CSA = 1, (measured and trimmed IHS = 500mA) 3.5 5.0 6.5 VADOUT [V] / IHB [A], CSA = 0, (measured and trimmed IHS = 2.0A) 0.7 1.0 1.3 Over-current Shutdown Over-current Shutdown blanking time(17) Switching Frequency (17) IHBOC34 A Freewheeling Diode Forward Voltage Leakage Current Low Side Current to Voltage Ratio(18) V CRRATIOHB34 µA V/A Notes 17. This parameter is guaranteed by process monitoring but is not production tested. 18. This parameter is guaranteed only if correct trimming was applied 908E622 12 Analog Integrated Circuit Device Data Freescale Semiconductor ELECTRICAL CHARACTERISTICS STATIC ELECTRICAL CHARACTERISTICS Table 3. Static Electrical Characteristics (continued) All characteristics are for the analog chip only. Refer to the 68HC908EY16 datasheet for characteristics of the microcontroller chip. Characteristics noted under conditions 9.0V ≤ VSUP ≤ 16V, - 40°C ≤ TJ ≤ 125°C, unless otherwise noted. Typical values noted reflect the approximate parameter mean at TA = 25°C under nominal conditions, unless otherwise noted. Characteristic Symbol Min Typ Max Unit T1 measured on ECR Pin, TJ = 25°C, ILOAD = 100mA RDS(ON)T1 – 1.0 1.2 Ω T2 measured on EC Pin, TJ = 25°C, ILOAD = 100mA RDS(ON)T2 – 400 600 mΩ T1 (short to GND) IT1OC 0.6 – 1.0 T2 (short to VSUP) IT2OC 0.6 – 1.0 ROC – 10 – kΩ ECDACRES – 6.0 – Bit VECREG 0.18 – 1.4 V IHVDDOC 25 35 50 mA HVDDT1:0 = 00 – 950 – HVDDT1:0 = 01 – 536 – HVDDT1:0 = 10 – 234 – HVDDT1:0 = 11 – 78 – EC OUTPUTS EC AND ECR Switch On Resistance Over-current Shutdown A Open Load Detection (Bit ECOLT is set) set @ min output load DAC resolution (from 0V to 1.4V) Regulated Output Voltage (@ I = 1.0mA) SWITCHABLE VDD OUTPUT HVDD Over-current Shutdown Over-current Shutdown Blanking Time(19) tHVDDOCB µs Over-current Flag Delay(19) tHVDDOCFD – 0.5 – ms Dropout Voltage @ ILOAD = 20mA VHVDDDROP – 110 300 mV RATIOVSUP 4.75 5.0 5.25 – Voltage / Temperature Slope(19) STtoV – 26 – mV/°C Output Voltage @ 25°C VT25 1.7 1.9 2.1 V VSUP DOWN SCALER(20) Voltage Ratio (RATIO VSUP = VSUP / VADOUT) INTERNAL DIE TEMPERATURE SENSOR(20) Notes 19. This parameter is guaranteed by process monitoring but is not production tested. 20. This parameter is guaranteed only if correct trimming was applied 908E622 Analog Integrated Circuit Device Data Freescale Semiconductor 13 ELECTRICAL CHARACTERISTICS STATIC ELECTRICAL CHARACTERISTICS Table 3. Static Electrical Characteristics (continued) All characteristics are for the analog chip only. Refer to the 68HC908EY16 datasheet for characteristics of the microcontroller chip. Characteristics noted under conditions 9.0V ≤ VSUP ≤ 16V, - 40°C ≤ TJ ≤ 125°C, unless otherwise noted. Typical values noted reflect the approximate parameter mean at TA = 25°C under nominal conditions, unless otherwise noted. Characteristic Symbol Min Typ Max Unit HALL-EFFECT SENSOR INPUT H0 - GENERAL PURPOSE INPUT MODE (H0MS = 0) Input Voltage Low Threshold VLT – – 1.5 V Input Voltage High Threshold VHT 3.5 – – V Input Voltage Hysteresis VHH 100 – 500 mV Pullup resistor RPH 7.0 10 13 kΩ HALL-EFFECT SENSOR INPUT H0 - 2PIN HALL SENSOR INPUT MODE (H0MS = 1) Output Voltage V VSUP < 17V VHALL1 – VSUP-1.2 – VSUP >17V VHALL2 – – 15.8 Output Drop @ IOUT = 15mA VH0D – – 2.5 V Sense Current Threshold IHSCT 6.0 7.9 10 mA Sense Current Hysteresis IHSCH 650 1100 1650 µA Sense Current Limitation VHSCLIM 20 40 70 mA ANALOG INPUT A0, A0CST Current Source A0, A0CST(21), (22) µA CSSEL1:0 = 00 ICS1 – 40 – CSSEL1:0 = 01 ICS2 – 120 – ICS3 – 320 – ICS4 – 800 – Input Voltage Threshold Low VLT – – 1.5 V Input Voltage Threshold High VHT 3.5 – – V Input Voltage Hysteresis VLH 0.5 – – V IN -10 – 10 µA tWUP – 20 – µs CSSEL1:0 = 10 CSSEL1:0 = 11 WAKE-UP INPUT L0 Input Current Wake-up Filter Time(23) Notes 21. This parameter is guaranteed only if correct trimming was applied 22. The current values are optimized to read a NTC temperature sensor, e.g. EPCOS type B57861 (R25 = 3000Ω, R/T characteristic 8016) 23. This parameter is guaranteed by process monitoring but is not production tested. 908E622 14 Analog Integrated Circuit Device Data Freescale Semiconductor ELECTRICAL CHARACTERISTICS DYNAMIC ELECTRICAL CHARACTERISTICS DYNAMIC ELECTRICAL CHARACTERISTICS Table 4. Dynamic Electrical Characteristics All characteristics are for the analog chip only. Please refer to the 68HC908EY16 datasheet for characteristics of the microcontroller chip. Characteristics noted under conditions 9.0V ≤ VSUP ≤ 16V, - 40°C ≤ TJ ≤ 125°C, unless otherwise noted. Typical values noted reflect the approximate parameter mean at TA = 25°C under nominal conditions, unless otherwise noted. Characteristic Symbol Min Typ Max Unit Dominant Propagation Delay TXD to LIN t DOM-MIN — — 50 μs Dominant Propagation Delay TXD to LIN t DOM-MAX — — 50 μs Recessive Propagation Delay TXD to LIN t REC-MIN — — 50 μs Recessive Propagation Delay TXD to LIN t REC-MAX — — 50 μs Duty Cycle 1: D1 = tBUS_REC(MIN) / (2 x tBIT), tBIT = 50μs, VSUP = 7.0V..18V D1 0.396 – – Duty Cycle 2: D2 = tBUS_REC(MAX) / (2 x tBIT), tBIT = 50μs, VSUP = 7.6V..18V D2 – – 0.581 Dominant Propagation Delay TXD to LIN t DOM-MIN — — 100 μs Dominant Propagation Delay TXD to LIN t DOM-MAX — — 100 μs Recessive Propagation Delay TXD to LIN t REC-MIN — — 100 μs Recessive Propagation Delay TXD to LIN t REC-MAX — — 100 μs Duty Cycle 3: D3 = tBUS_REC(MIN) / (2 x tBIT), tBIT = 96μs, VSUP = 7.0V..18V D3 0.417 – – Duty Cycle4: D4 = tBUS_REC(MAX) / (2 x tBIT), tBIT = 96μs, VSUP = 7.6V..18V D4 – – 0.590 SRFAST — 20 — V / μs Receiver Dominant Propagation Delay(27) t RL — 3.5 6.0 μs Receiver Recessive Propagation Delay(27) t RH — 3.5 6.0 μs t R-SYM - 2.0 — 2.0 μs t PROPWL 30 50 150 μs t WAKE — 20 — μs LIN PHYSICAL LAYER Driver Characteristics for Normal Slew Rate(24), (25) Driver Characteristics for Slow Slew Rate(24), (26) Driver Characteristics for Fast Slew Rate LIN High Slew Rate (Programming Mode) Receiver Characteristics and Wake-up Timings Receiver Propagation Delay Symmetry Bus Wake-up Deglitcher Bus Wake-up Event Reported (28) Notes 24. VSUP from 7.0V to 18V, bus load R0 and C0 1.0nF / 1.0kΩ, 6.8nF / 660Ω, 10nF / 500Ω. Measurement thresholds: 50% of TXD signal to LIN signal threshold defined at each parameter. 25. See Figure 6, page 17. 26. See Figure 7, page 18. 27. Measured between LIN signal threshold VIL or VIH and 50% of RXD signal. 28. t WAKE is typically 2 internal clock cycles after LIN rising edge detected. See Figure 9 and Figure 8, page 18. In Sleep mode, the VDD rise time is strongly dependent upon the decoupling capacitor at the VDD pin. 908E622 Analog Integrated Circuit Device Data Freescale Semiconductor 15 ELECTRICAL CHARACTERISTICS MICROCONTROLLER PARAMETRICS Table 4. Dynamic Electrical Characteristics (continued) All characteristics are for the analog chip only. Please refer to the 68HC908EY16 datasheet for characteristics of the microcontroller chip. Characteristics noted under conditions 9.0V ≤ VSUP ≤ 16V, - 40°C ≤ TJ ≤ 125°C, unless otherwise noted. Typical values noted reflect the approximate parameter mean at TA = 25°C under nominal conditions, unless otherwise noted. Characteristic Symbol Min Typ Max Unit f SPIOP 0.25 — 4.0 MHz tRST 0.8 1.25 1.94 ms tNORMREQ 51 80 150 ms Watchdog Period (WDP1:0 = 00) tWD80 52 80 124 ms Watchdog Period (WDP1:0 = 01) tWD40 26 40 62 ms Watchdog Period (WDP1:0 = 10) tWD20 13 20 31 ms Watchdog Period (WDP1:0 = 11) tWD10 6.5 10 15.5 ms SPI INTERFACE TIMING SPI Operating Recommended Frequency(29) State Machine Reset Low-level Duration after VDD High Normal Request Timeout Window Watchdog Timer(30) Notes 29. This parameter is guaranteed by process monitoring but is not production tested. 30. This parameter is guaranteed only if correct trimming was applied. Additionally See Watchdog Period Range Value (AWD Trim) on page 50 MICROCONTROLLER PARAMETRICS Table 5. Microcontroller For a detailed microcontroller description, refer to the MC68HC908EY16 datasheet. Module Description Core High performance HC08 core with a maximum internal bus frequency of 8.0MHz Timer Two 16-bit timers with 2 channels (TIM A and TIM B) Flash 16K Bytes RAM 512 Bytes ADC 10-Bit Analog-to-Digital Converter SPI SPI module ESCI Standard serial communication interface (SCI) module Bit-time measurement Arbitration Prescaler with fine baudrate adjustment ICG Internal Clock Generation Module 908E622 16 Analog Integrated Circuit Device Data Freescale Semiconductor ELECTRICAL CHARACTERISTICS TIMING DIAGRAMS TIMING DIAGRAMS Transient Pulse Generator LIN, L0 10k 1nF Note: Waveform in accordance to ISO7637 part 1, test pulses 1, 2, 3a and 3b. Figure 4. Test Circuit for Transient Test Pulses VSUP VSUP R0 TXD LIN RXD C0 R0R0 and C0C0 Combinations: and combinations: • 1.0kΩ and 1.0nF - 1k Ohm and 1nF • 600Ω - 660and Ohm6.8nF and 6.8nF • 500Ω - 500and Ohm10nF and 10nF Figure 5. Test Circuit for LIN Timing Measurements TXD tREC-MAX VLIN tDOM-MIN 58.1% VSUP 74.4% VSUP 40% VSUP LIN 60% VSUP 28.4% VSUP 42.2% VSUP tDOM-MAX tREC-MIN RXD tRL tRH Figure 6. LIN Timing Measurements for Normal Slew Rate 908E622 Analog Integrated Circuit Device Data Freescale Semiconductor 17 ELECTRICAL CHARACTERISTICS TIMING DIAGRAMS TXD tREC-MAX VLIN tDOM-MIN 61.6% VSUP 77.8% VSUP 40% VSUP LIN 60% VSUP 25.1% VSUP 38.9% VSUP tDOM-MAX tREC-MIN RXD tRL tRH Figure 7. LIN Timing Measurements for Slow Slew Rate Vrec VLIN_REC LIN 0.4VSUP 0.4 VSUP Dominant level Dominant Level IRQ_A tTpropWL PROPWL tTwake WAKE Figure 8. Wake-up Stop Mode Timing Vrec VLIN_REC LIN 0.4VSUP 0.4 VSUP DominantLevel level Dominant VDD t TpropWL PROPWL tTwake WAKE Figure 9. Wake-up Sleep Mode Timing 908E622 18 Analog Integrated Circuit Device Data Freescale Semiconductor ELECTRICAL CHARACTERISTICS TIMING DIAGRAMS VSUP VDD RST_A TRST TNORMREQ Figure 10. Power On Reset and Normal Request Timeout Timing 908E622 Analog Integrated Circuit Device Data Freescale Semiconductor 19 FUNCTIONAL DESCRIPTION INTRODUCTION FUNCTIONAL DESCRIPTION INTRODUCTION The 908E622 was designed and developed as a highly integrated and cost effective solution for automotive and industrial applications. For automotive body electronics, the 908E622 is well suited to perform complete mirror control via a three-wire LIN bus. This device combines an HC908EY16 MCU core with flash memory together with a SMARTMOS IC chip. The SMARTMOS IC chip combines power and control in one chip. Power switches are provided on the SMARTMOS IC configured as half-bridge outputs and three high side switches. Other ports are also provided, which include a circuitry for EC-glass control, one Hall-effect sensor input port, one analog input port with a switched current source, one wake-up pin, and a selectable HVDD pin. An internal voltage regulator provides power to the MCU chip. Also included in this device is a LIN physical layer, which communicates using a single wire. This enables this device to be compatible with three-wire bus systems, where one wire is used for communication, one for battery, and one for ground. FUNCTIONAL PIN DESCRIPTION See Figure 2, 908E622 Simplified Internal Block Diagram, page 2, for a graphic representation of the various pins referred to in the following paragraphs. Also, see the pin diagram on page 3 for a depiction of the pin locations on the package. PORT A I /O PINS These pins are special function, bidirectional I/O port pins that are shared with other functional modules in the MCU. PTA0 : PTA4 are shared with the keyboard interrupt pins, KBD0 : KBD4. The PTA5/SPSCK pin is not accessible in this device, and is internally connected to the SPI clock pin of the analog die. The PTA6/SS pin is not accessible in this device, and is internally connected to the SPI slave select input of the analog die. For details, refer to the 68HC908EY16 datasheet. PORT B I/O PINS These pins are special function, bidirectional I/O port pins that are shared with other functional modules in the MCU. All pins are shared with the ADC module. PTB0/AD0 is internally connected to the ADOUT pin of the analog die, allowing diagnostic measurements to be calculated; e.g., current recopy, VSUP, etc. The PTB1/AD1, PTB2/AD2, PTB6/AD6/TBCH0, PTB7/ AD7/TBCH1 pins are not accessible in this device. For details, refer to the 68HC908EY16 datasheet. PORT D I /O PINS PTD0/ TACH0/BEMF and PTD1/ TACH1 are special function, bidirectional I /O port pins that can also be programmed to be timer pins. PTD0/TACH0 pin is internally connected to the PWM input of the analog die and only accessible for test purposes (cannot be used in the application). For details, refer to the 68HC908EY16 datasheet. PORT E I /O PIN PTE0/ TXD and PTE1/ RXD are special function, bidirectional I/O port pins that can also be programmed to be enhanced serial communication. PTE0/TXD is internally connected to the TXD pin of the analog die. The connection for the receiver must be done externally. PTE1/RXD is internally connected to the RXD pin of the analog die and only accessible for test purposes (cannot be used in the application). For details, refer to the 68HC908EY16 datasheet. EXTERNAL INTERRUPT PIN (IRQ) The IRQ pin is an asynchronous external interrupt pin. This pin contains an internal pullup resistor that is always activated, even when the IRQ pin is pulled LOW. For details, refer to the 68HC908EY16 datasheet. EXTERNAL RESET PIN (RST) PORT C I/O PINS These pins are special function, bidirectional I/O port pins that are shared with other functional modules in the MCU. For example, PTC2 : PTC4 are shared with the ICG module. PTC0/MISO and PTC1/MOSI are not accessible in this device, and are internally connected to the MISO and MOSI SPI pins of the analog die. For details, refer to the 68HC908EY16 datasheet. A logic [0] on the RST pin forces the MCU to a known startup state. RST is bidirectional, allowing a reset of the entire system. It is driven LOW when any internal reset source is asserted. This pin contains an internal pullup resistor that is always activated, even when the reset pin is pulled LOW. For details, refer to the 68HC908EY16 datasheet. 908E622 20 Analog Integrated Circuit Device Data Freescale Semiconductor FUNCTIONAL DESCRIPTION FUNCTIONAL PIN DESCRIPTION POWER SUPPLY PINS (VSUP1: VSUP8) ANALOG INPUT PINS (A0, A0CST) VSUP1: VSUP8 are device power supply pins. The nominal input voltage is designed for operation from 12V systems. Owing to the low ON-resistance and current requirements of the half-bridge driver outputs and high side output drivers, multiple VSUP pins are provided. All VSUP pins must be connected to get full chip functionality. These pins are analog inputs with selectable current source values. The A0CST is intent to trim the A0 input. POWER GROUND PINS (GND1:GND4) GND1:GND4 are device power ground connections. Owing to the low ON-resistance and current requirements of the half-bridge driver outputs and high side output drivers, multiple pins are provided. GND1 and GND2 pins must be connected to get full chip functionality. WAKE-UP INPUT PIN (L0) This pin is 40V rated input. It can be used as wake-up source for a system wake-up. The input is falling or rising edge sensitive. Important: If unused, this pin should be connected to VSUP or GND to avoid parasitic transitions. In Low Power mode, this could lead to random wake-up events. SWITCHABLE VDD OUTPUT PIN (HVDD) The HVDD pin is a switchable VDD output for driving resistive loads requiring a regulated 5.0V supply; e.g., 3-pin Hall-effect sensors or potentiometers. The output is shortcircuit protected. HALF-BRIDGE OUTPUT PINS (HB1: HB4) The 908E622 device includes power MOSFETs configured as four half-bridge driver outputs. The HB3: HB4 have a lower RDS(ON), to run higher currents (e.g. fold motor), than the HB1:B2 outputs. The HB1 : HB4 outputs are short-circuit and overtemperature protected, and they feature current recopy. Over current protection is done on both high side and low side FET’s. The current recopy are done on the low side MOSFETs. HIGH SIDE OUTPUT PINS (HS1:HS3) The HS output pins are a low RDS(ON) high side switches. Each HS switch is protected against over-temperature and over-current. The output is capable of limiting the inrush current with an automatic PWM or feature a real PWM capability using the PWM input. The HS1 has a lower RDS(ON), to run higher currents (e.g. heater) than the HS2 and HS3 outputs. For the HS1 two pins (HS1a:HS1b) are necessary for the current capability and have to be connected externally. Important: The HS3 can be only used to drive resistive loads. LIN BUS PIN (LIN) The LIN pin represents the single-wire bus transmitter and receiver. It is suited for automotive bus systems and is based on the LIN bus specification. + 5.0 V VOLTAGE REGULATOR OUTPUT PIN (VDD) The VDD pin is needed to place an external capacitor to stabilize the regulated output voltage. The VDD pin is intended to supply the embedded microcontroller. Important The VDD pin should not be used to supply other loads; use the HVDD pin for this purpose. The VDD, EVDD and VDDA/VREFH pins must be connected together. VOLTAGE REGULATOR GROUND PIN (VSS) The VSS pin is the ground pin for the connection of all nonpower ground connections (microcontroller and sensors). Important VSS, EVSS and VSSA/VREFL pins must be connected together. RESET PIN (RST_A) RST_A is the bidirectional reset pin of the analog die. It is an open drain with pullup resistor and must be connected to the RST pin of the MCU. EC GLASS PINS (ECR, EC) These pins are used to drive the electrochrome function on EC glass mirrors. The ECR pin is used to connect an external ballast resistor. The EC pin provides the mirror with an regulated output voltage up to 1.4V. The output voltage can be selected by an integrated DA converter. HALL-EFFECT SENSOR INPUT PIN (H0) The Hall-effect sensor input pin H0 provides an input for Hall-effect sensors (2pin or 3pin) or a switch. INTERRUPT PIN (IRQ_A) IRQ_A is the interrupt output pin of the analog die indicating errors or wake-up events. It is an open drain with pullup resistor and must be connected to the IRQ pin of the MCU. ADC SUPPLY/REFERENCE PINS (VDDA/VREFH AND VSSA/VREFL) VDDA and VSSA are the power supply pins for the analogto-digital converter (ADC). VREFH and VREFL are the reference voltage pins for the ADC. 908E622 Analog Integrated Circuit Device Data Freescale Semiconductor 21 FUNCTIONAL DESCRIPTION FUNCTIONAL PIN DESCRIPTION The supply and reference signals are internally connected. It is recommended that a high quality ceramic decoupling capacitor be placed between these pins. For details, refer to the 68HC908EY16 datasheet. MCU POWER SUPPLY PINS (EVDD AND EVSS) EVDD and EVSS are the power supply and ground pins. The MCU operates from a single power supply. Fast signal transitions on MCU pins place high, short duration current demands on the power supply. To prevent noise problems, take special care to provide power supply bypassing at the MCU. For details, refer to the 68HC908EY16 datasheet. EVDD VDD 0,1µF EVSS This pin is for test purpose only. In the application this pin has to be forced to GND. For Programming/Test this pin has to be forced to VDD to bring the analog die into Test mode. In Test mode, the Reset Timeout (80ms) is disabled and the LIN receiver is disabled NOTE: After detecting a RESET (internal or external), the PSON bit needs to be set within 80ms. If not the device will automatically enter sleep mode. MCU TEST PIN (FLSVPP) This pin is for test purposes only. This pin should be either left open (not connected) or can be connected to GND. EXPOSED PAD PIN VDDA/VREFH µC TEST MODE PIN (TESTMODE) 4,7µF Analog Die The exposed pad pin on the bottom side of the package conducts heat from the chip to the PCB board. For thermal performance, the pad must be soldered to the PCB board. It is recommended that the pad be connected to the ground potential. VSS VSSA/VREFL 908E622 22 Analog Integrated Circuit Device Data Freescale Semiconductor FUNCTIONAL DESCRIPTION FUNCTIONAL INTERNAL BLOCK DESCRIPTION FUNCTIONAL INTERNAL BLOCK DESCRIPTION MM908E622 - Functional Block Diagram MC68HC908EY16 Core SMARTMOS Analog Control IC Internal Regulators & Safety Voltage Regulation Reset & Wake-up Switched VDD Watchdog Timer M68HC08 CPU w/ ALU, RAM, Flash ROM Power Module w/Power-On Reset Control & Interface Internal Clock Module Hall Sensor Interface Analog Multiplexer LIN Interface SPI Interface & PWM Control Analog Input w/Integrated Current Source 10-Bit ADC Module I/O Ports A, B, C, D, E Outputs Timer Modules High Side Drivers & Diagnostics H-Bridge Drivers & Diagnostics Communication Modules Electrochrome Glass Driver & Diagnostics Reset & IRQ Internal Regulators & Safety Control & Interface Outputs MC68HC908EY16 Core SMARTMOS ANALOG CONTROL IC INTERNAL REGULATORS & SAFETY: VOLTAGE REGULATION The voltage regulator circuitry provides the regulated voltage for the Analog IC, as well as the VDD/VSS rails for the core IC. The on-chip regulator consists of two elements, the main regulator, and the low voltage reset circuit. The VDD regulator accepts an unregulated input supply and provides a regulated VDD supply to all digital sections of the device. The output of the regulator is also connected to the VDD pin to provide the 5.0 V to the microcontroller. SWITCHED VDD WATCHDOG TIMER The watchdog timer module generates a reset, in case of a watchdog timeout or wrong watchdog timer reset. A watchdog reset event will reset all registers in the SPI, excluding the RSR. RESET, IRQ & WAKE-UP There are several functions on the Analog IC that can generate a reset or wake-up signal to the core IC. There is a pin that is used to detect an external wake-up event. The Reset signal has many possible sources in the Analog IC circuitry. The IRQ function on the Analog IC will notify the core IC of pending system critical conditions. This function provides a switchable +5.0V VDD rail for an external load. 908E622 Analog Integrated Circuit Device Data Freescale Semiconductor 23 FUNCTIONAL DESCRIPTION FUNCTIONAL INTERNAL BLOCK DESCRIPTION CONTROL & INTERFACE: HALL SENSOR INTERFACE This interface can be configured to support an input pin as a general purpose input, or as a hall-effect sensor input to be able to read 3-pin / 2-pin hall sensors or switches. ELECTROCHROME GLASS DRIVER & DIAGNOSTICS The driver provides a controlled voltage, in order to adjust the transparency of an electrochrome glass, and to control the reflection of a rear view mirror. The value of the voltage can be adjusted by the use of an on-chip DA converter. SPI INTERFACE & PWM CONTROL The SPI and PWM interfaces are mastered by the core IC (CPU), and are used to control the output functions of the Analog IC, as well as to report status and failure information of the Analog IC. LIN INTERFACE The LIN interface function supports the single wire bus transmit and receive capabilities. It is suited for automotive bus systems, and is based on the LIN bus/physical layer specification. The LIN driver is a low side MOSFET with slope control, internal current limitation, and thermal shutdown. ANALOG MULTIPLEXER To be able to have different sources for the MCU with one single signal, an analog multiplexer is integrated in the analog IC. This multiplexer has eleven different sources on the Analog IC, which can be selected with the SS[3:0] bits (through SPI communication) in the A0MUCTL register. ANALOG INPUT W/INTEGRATED CURRENT SOURCE The A0 pin provides a switchable current source to allow the reading of switches, NTC, etc., without the need for an additional supply line for the sensor (single wire). There are four different selectable current source values. OUTPUTS: HIGH SIDE DRIVERS & DIAGNOSTICS The HS outputs are low RDS(ON) high side switches. Each HS switch is protected against over-temperature and over-current. The output is capable of limiting the inrush current with an automatic PWM, or feature a real PWM capability using the PWM input. H-BRIDGE DRIVERS & DIAGNOSTICS The device includes power MOSFETs configured as four half-bridge driver outputs. These outputs are short-circuit and over-temperature protected. Over-current protection is done on both high side and low side MOSFETs. MM68HC908EY16 CORE IC M68HC08 CPU W/ALU, RAM, FLASH ROM This possesses the functionality of the CPU08 architecture, along with 512 bytes of RAM and 15,872 bytes of FLASH memory, with in-circuit programming. POWER MODULE W/P0WER-ON-RESET This block of circuitry manages the power supplied to the core IC, as well as providing POR, LVI, Watchdog timer, and MCU supervision circuitry (COP). INTERNAL CLOCK MODULE This module provides the clocks needed by the core IC functions, without the need for external components. Software selectable bus frequencies are available. It also provides a clock monitor function. 10-BIT ADC MODULE This module provides an 8-channel, 10-bit successive approximation analog-to-digital converter (ADC). I/O PORTS A, B, C, D, E There are many I/O pins that are controlled by the CPU through the several I/O ports of the core IC. TIMER MODULES There are two 16-bit, 2 channel timer interface modules with selectable input capture, output compare, and PWM capabilities for each channel. COMMUNICATION MODULES There are several communication functions supported by the core IC, including an enhanced serial communication interface module (ESCI) for the LIN communication, and an SPI module for inter-IC communication. RESET & IRQ There are interrupt and reset connections between the Analog IC and the core IC, for concise control and error/ exception management. 908E622 24 Analog Integrated Circuit Device Data Freescale Semiconductor FUNCTIONAL DEVICE OPERATION OPERATIONAL MODES FUNCTIONAL DEVICE OPERATION OPERATIONAL MODES Power Up RESET VDD High and Reset Delay (tRST) expired Normal Request PSON = 0 and Normal Request timeout (tNORMREQ) expired Reset (LVR, HTR, WDR, ext. Reset) SLEEP Command PSON = 1 VDD Low NORMAL Wake-up Interrupt Power Down TESTMODE = 1 The 908E622 offers three operating modes: Normal (Run), Stop, and Sleep. In Normal mode, the device is active and is operating under normal application conditions. The Stop and Sleep modes are low power modes with wake-up capabilities. The different modes can be selected by the STOP and SLEEP bits in the System Control Register. Figure 11 describes how transitions are done between the different operating modes, and Table 6, page 27 gives an overview of the operating modes. STOP Command 908E622 ANALOG DIE MODES OF OPERATION Wake-up (Reset) Reset (LVR, ext. Reset) SLEEP STOP Reset (LVR, ext. Reset, (HTR)) Figure 11. Operating Modes and Transitions Normal Mode Stop Mode This Mode is normal operating mode of the device. All functions and power stages are active and can be enabled/ disabled. The voltage regulator provides the +5V VDD to the MCU. After a reset (e.g. Power On Reset, Wake-Up from Sleep), the MCU sets the PSON bit in the System Control Register within 80ms typical (tNORMREQ). This is to ensure the MCU has started up and is operating correctly. If the PSON bit is not set within the required time frame, the device enters SLEEP mode to reduce power consumption (fail safe). This MCU monitoring can be disabled, e.g. for programming by applying VDD on the TESTMODE pin. In Stop mode, the voltage regulator still supplies the MCU with VDD (limited current capability). To enter the Stop mode, the STOP bit in the System Control Register has to be set and the MCU has to be stopped (see the 908EY16 datasheet for details). Wake-up from this mode is possible by LIN bus activity or the wake-up input L0, and is maskable with the LINIE and/or L0IE bits in the Interrupt Mask Register. The analog die is generating an interrupt on IRQ_A pin to wake-up the MCU. The wake-up / interrupt source can be evaluated with the L0IF and LINIF bits in the Interrupt Flag Register. Stop mode has a higher current consumption than Sleep mode, but allows a quicker wake-up. Additionally, the wake- 908E622 Analog Integrated Circuit Device Data Freescale Semiconductor 25 FUNCTIONAL DEVICE OPERATION OPERATIONAL MODES up sources can be selected (maskable) which is not possible in Sleep mode. Figure 12 show the procedure to enter the Stop mode and how the system wakes up. MCU Power Die From Reset behaves like a power on reset. The wake-up / reset source can be evaluated by the L0WF and/or LINWF bits in the Reset Status Register. Sleep mode has a lower current consumption than Stop mode, but requires a longer time to wake-up. The wake-up sources can not be selected (not maskable). Figure 13 show the procedure to enter the Sleep mode and how a wake-up is performed. MCU Power Die initialize From Reset operate initialize Enable/disable LIN/L0 wakeup SPI: STOP =1 Switch to VREG low current mode operate MCU STOP Wake-up on LIN or L0 ? SPI: SLEEP =1 Switch off VREG VDD low, RST low Assert IRQ IRQ interrupt ? Switch to VREG high current mode Wake-up on LIN or L0 ? SPI: reason for interrupt Store Wake-up Event Figure 12. STOP mode Wake-up Procedure Sleep Mode In Sleep mode, the voltage regulator is turned off and the MCU is not supplied (VDD = 0V), the RST_A pin also is pulled low. To enter the Sleep mode, the Sleep bit in the System Control Register has to be set. Wake-up from this mode is possible by LIN bus activity or the wake-up input L0, and is not maskable. The wake-up Start VREG VDD high, RST high Figure 13. SLEEP Mode Wake-up Procedure Table 6 summarized the Operating modes. 908E622 26 Analog Integrated Circuit Device Data Freescale Semiconductor FUNCTIONAL DEVICE OPERATION OPERATIONAL MODES Table 6. Operating Modes Overview MCU monitoring/ Watchdog Function Power Stages LIN Interface LOW Disabled Disabled Disabled N/A HIGH tNORMREQ (80 ms typical) time out to set PSON bit in System Control Register Disabled Disabled VDD ON N/A HIGH Window Watchdog active if enabled Enabled Enabled VDD ON with limited current capability LIN wake-up, L0 state change HIGH Disabled Disabled Recessive state with wake-up capability LOW Disabled Disabled Recessive state with wake-up capability Device Mode Voltage Regulator Wake-up Capabilities Reset VDD ON N/A Normal Request VDD ON Normal (Run) Stop RST_A Output (SPI PSON=1)(31) Sleep VDD OFF LIN wake-up L0 state change Notes 31. The SPI is still active in Stop mode. However, due to the limited current capability of the voltage regulator in Stop mode, the PSON bit has to be set before the increased current caused from a running MCU causes an LVR. OPERATING MODES OF THE MCU For a detailed description of the operating modes of the MCU, refer to the MC68HC908EY16 datasheet. INTERRUPTS The 908E622 has seven different interrupt sources. An interrupt pulse on the IRQ_A pin is generated to report an event or fault to the MCU. All interrupts are maskable and can be enabled/disabled via the SPI (Interrupt Mask Register). After reset all interrupts are automatically disabled. Low Voltage Interrupt High Temperature Interrupt The high temperature interrupt (HTI) is generated by the on chip temperature sensors. If the chip temperature is above the HTI threshold, the HTIF bit in the Interrupt Flag Register will be set. If the high temperature interrupt is enabled (HTIE = 1), an interrupt will be initiated. During Stop and Sleep mode the HTI circuitry is disabled. Low voltage interrupt (LVI) is related to external supply voltage VSUP. If this voltage falls below the LVI threshold, it will set the LVIF bit in the Interrupt Flag Register. In case the low voltage interrupt is enabled (LVIE = 1), an interrupt will be initiated. During Sleep and Stop mode the low voltage interrupt circuitry is disabled. The LIN Interrupt is related to the Stop mode. If the LIN interrupt is enabled (LINIE = 1) in Stop mode, an interrupt is asserted if a rising edge is detected, and the bus was dominant longer than TpropWL. After the wake-up / interrupt, the LINIF is indicating the reason for the wake-up / interrupt. High Voltage Interrupt Power Stage Fail Interrupt The high voltage interrupt (HVI) is related to the external supply voltage VSUP. If this voltage rises above the HVI threshold, it will set the HVIF bit in the Interrupt Flag Register. If the high voltage interrupt is enabled (HVIE = 1), an interrupt will be initiated. During Stop and Sleep mode the HVI circuitry is disabled. The power stage fail flag indicates an error condition on any of the power stages (see Figure 14, page 28). In case the power stage fail interrupt is enabled (PSFIE = 1), an interrupt will be initiated if: During Stop and Sleep mode, the PSFI circuitry is disabled. LIN Interrupt 908E622 Analog Integrated Circuit Device Data Freescale Semiconductor 27 FUNCTIONAL DEVICE OPERATION OPERATIONAL MODES HO Input Interrupt The H0 interrupt flag H0IF is set in run mode by a state change of the H0F flag (rising or falling edge on the enabled input). The interrupt function is available if the input is selected as General Purpose, or as 2pin Hallsensor input. The interrupt is maskable with the H0IE bit in the Interrupt Mask Register. During Stop and Sleep mode the H0I circuitry is disabled. L0 input Interrupt The L0 interrupt flag L0IF is set in run mode by a state change of the L0F flag (rising or falling edge). The interrupt is maskable with the L0IE bit in the interrupt mask register. INTERRUPT FLAG REGISTER (IFR) LVIF - Low Voltage Flag Bit This read/write flag is set on low voltage condition. Clear LVIF by writing a logic [1] to LVIF. If a low voltage condition is still present while writing a logical one to LVIF, writing has no effect. Therefore, a low voltage interrupt cannot be lost due to inadvertent clearing of LVIF. Reset clears the LVIF bit. Writing a logic [0] to LVIF has no effect. 1 = low voltage condition has occurred 0 = low voltage condition has not occurred HVIF - High Voltage Flag Bit Register Name and Address: IFR - $0A Bit7 6 5 4 3 2 1 L0IF H0IF LINIF 0 HTIF LVIF HVIF 0 0 0 0 0 0 0 Read Bit0 PSFIF Write Reset condition is still present while writing a logical one to HTIF, the writing has no effect. Therefore, a high temperature interrupt cannot be lost due to an inadvertent clearing of HTIF. Reset clears the HTIF bit. Writing a logic [0] to HTIF has no effect. 1 = high temperature condition has occurred 0 = high temperature condition has not occurred 0 L0IF - L0 Input Flag Bit This read/write flag is set on a falling or rising edge at the L0 input. Clear L0IF by writing a logic [1] to L0IF. Reset clears the L0IF bit. Writing a logic [0] to L0IF has no effect. 1 = rising or falling edge on L0 input detected 0 = no state change on L0 input detected H0IF - H0 Input Flag Bit This read/write flag is set on a falling or rising edge at the H0 input. Clear H0IF by writing a logic [1] to H0IF. Reset clears the H0IF bit. Writing a logic [0] to H0IF has no effect. 1 = state change on the hallflags detected 0 = no state change on the hallflags detected This read/write flag is set on a high voltage condition. Clear HVIF by writing a logic [1] to HVIF. If a high voltage condition is still present while writing a logical one to HVIF, the writing has no effect. Therefore, a high voltage interrupt cannot be lost due to an inadvertent clearing of HVIF. Reset clears the HVIF bit. Writing a logic [0] to HVIF has no effect. 1 = high voltage condition has occurred 0 = high voltage condition has not occurred PSFIF - Power Stage Fail Bit This read-only flag is set on a fail condition on one of the power outputs (HBx, HSx, HVDD, EC, H0). Reset clears the PSFIF bit. Clear this flag, by writing a logic [1] to the appropriate fail flag. 1 = power stage fail condition has occurred 0 = power stage fail condition has not occurred H0OCF HVDDOCF HB2OC This read/write flag is set if a rising edge is detected and the bus was dominant longer than TpropWL. Clear LINIF by writing a logic [1] to LINIF. Reset clears the LINIF bit. Writing a logic [0] to LINIF has no effect. 1 = LIN bus interrupt has occurred 0 = not LIN bus interrupt occurred since last clear HB3OC This read/write flag is set on high temperature condition. Clear HTIF by writing a logic [1] to HTIF. If a high temperature HVDDOCF HB1OC LINIF - LIN Flag Bit HTIF - High Temperature Flag Bit H0OCF HBFF PSFIF HB4OC HS1OC HS2OC HSFF HS3OC ECOLF ECFF ECOCF Figure 14. Principal Implementation of the PSFIF 908E622 28 Analog Integrated Circuit Device Data Freescale Semiconductor FUNCTIONAL DEVICE OPERATION OPERATIONAL MODES Note: Disabling of the high temperature reset can lead to a destruction of the part, in cases of high temperature. This bit was foreseen for test purposes only! INTERRUPT MASK REGISTER (IMR) Register Name and Address: IMR - $09 Bit7 6 5 4 3 2 1 Bit0 L0IE H0IE LINIE HTRD HTIE LVIE HVIE PSFIE 0 0 0 0 0 0 0 0 Read Write Reset HTIE - High Temperature Interrupt Enable Bit This read/write bit enables CPU interrupts by the high temperature flag, HTIF. Reset clears the HTIE bit. 1 = interrupt requests from HTIF flag enabled 0 = interrupt requests from HTIF flag disabled LVIE - Low Voltage Interrupt Enable Bit L0IE - L0 Input Interrupt Enable Bit This read/write bit enables CPU interrupts by the L0 flag, L0IF. Reset clears the L0IE bit. 1 = interrupt requests from L0IF flag enabled 0 = interrupt requests from L0IF flag disabled H0IE - H0 Input Interrupt Enable Bit This read/write bit enables CPU interrupts by the Hallport flag, H0IF. Reset clears the H0IE bit. 1 = interrupt requests from H0IF flag enabled 0 = interrupt requests from H0IF flag disabled LINIE - LIN line Interrupt Enable Bit This read/write bit enables CPU interrupts by the LIN flag, LINIF. Reset clears the LINIE bit. 1 = interrupt requests from LINIF flag enabled 0 = interrupt requests from LINIF flag disabled HTRD - High Temperature Reset Disable Bit This read/write bit disables the high temperature reset function. Reset clears the HTRD bit. 1 = high temperature reset is disabled 0 = high temperature reset is enabled This read/write bit enables CPU interrupts by the low voltage flag, LVIF.Reset clears the LVIE bit. 1 = interrupt requests from LVIF flag enabled 0 = interrupt requests from LVIF flag disabled HVIE - High Voltage Interrupt Enable Bit This read/write bit enables CPU interrupts by the high voltage flag, HVIF.Reset clears the HVIE bit. 1 = interrupt requests from HVIF flag enabled 0 = interrupt requests from HVIF flag disabled PSFIE - Power Stage Fail Interrupt Enable Bit This read/write bit enables CPU interrupts by power stage fail flag, PSFIF. Reset clears the PSFIE bit. 1 = interrupt requests from PSFIF flag enabled 0 = interrupt requests from PSFIF flag disabled RESETS The 908E622 has four internal and one external reset source. Each internal reset event will cause a reset pin low for tRST (1.25 ms typical), after the reset event is gone. 908E622 Analog Integrated Circuit Device Data Freescale Semiconductor 29 FUNCTIONAL DEVICE OPERATION OPERATIONAL MODES SPI REGISTERS WDRE WD Reset Sensor Reset SPI Register (not RSR) VDD HTRD HTR Reset Sensor Clear RSR and set POR Bit RST_A RSR POR internal VREG LVR Main VREG MONO FLOP Pulse Duration after reset event is removed Figure 15. Internal Reset Routing RESET SOURCE High Temperature Reset The device is protected against high temperature. When the chip temperature exceeds a certain temperature, a reset (HTR) is generated. The reset is flagged by the HTR bit in the Interrupt Flag Register. A HTR event will reset all registers in the SPI excluding the RSR. The HTR can be disabled by the HTRD bit in the Interrupt Mask register. Note: Disabling the high temperature reset can lead to destruction of the part, in cases of high temperature. This bit was foreseen for test purposes only! Watchdog Reset The Watchdog module generates a reset, because of a watchdog timeout or wrong watchdog timer reset. Reset is flagged by the WDR bit in the Reset Status Register. A Watchdog reset event will reset all registers in the SPI excluding the RSR. Main VREG Low Voltage Reset The LVR is related to the Main VDD. When the voltage falls below a certain threshold, it will pull down the RST_A pin. Reset is flagged by the LVR bit in the Reset Status Register. An LVR event will reset all register in the SPI, excluding the RSR. Power On Reset The POR is related to the internal 5V supply. When the device detects a power on, the POR bit in the Reset Status Register (RSR) is set. A power on reset will reset all registers in the SPI including the RSR and set the POR bit. The Power On Reset circuitry will force the RST_A pin low for tRST after the VDD has reached its nominal value (above LVR Threshold). Also see Figure 10, page 19). Reset pin / external Reset An external reset can be applied by pulling down the RST_A pin. The reset event is flagged by the PINR bit in the reset status register. Reset Status Register This register contains five flags that show the source of the last reset. A power on reset sets the POR bit and clears all other bits in the Reset Status Register. All bits can be cleared by writing a one to the corresponding bit. Uncleared bits remain set as long as they are not cleared by a power on reset or by software. In addition the register includes two flags which will indicate the source of a wake-up from Sleep mode: Either by LIN bus activity or an event on the L0 wake-up input pin. 908E622 30 Analog Integrated Circuit Device Data Freescale Semiconductor FUNCTIONAL DEVICE OPERATION OPERATIONAL MODES Register Name and Address: RSR - $0D Bit7 6 5 4 3 POR PINR WDR HTR LVR 1 0 0 0 0 Read 2 1 Bit0 0 LINWF LOWF Write POR 0 0 0 POR— Power On Reset Bit This read/write bit is set after power on. The bit is cleared by writing a logic “1” to this location. 1 = Reset due to power on 0 = no power on reset PINR— Reset Forced from External Reset Pin Bit This read/write bit is set after a reset was forced on the external reset RST_A pin. The bit is cleared by writing a logic “1” to this location. 1 = reset source is external reset pin 0 = no external reset WDR— Watch Dog Reset Bit This read/write flag is set due to watchdog timeout or a wrong watchdog timer reset. Clear WDR by writing a logic “1” to WDR. 1 = reset source is watchdog 0 = no watchdog reset HTR— High Temperature Reset Bit This read/write bit is set if the chip temperature exceeds a certain value. The bit is cleared by writing a logic “1” to this location. 1 = reset due to high temperature condition 0 = no high temperature reset LVR— Low Voltage Reset Bit This read/write bit is set if the external VDD voltage coming from the main voltage regulator falls below a certain value. Bit is cleared by writing a logic “1” to this location. 1 = reset due to low voltage condition 0 = no low voltage reset LINWF— LIN Wake-up Flag This read/write bit is set if a bus activity was the case of an wake-up. Bit is cleared by writing a logic “1” to this location. 1 = Wake-up due to bus activity 0 = no wake-up due to bus activity L0WF— L0 Wake-up Flag This read/write bit is set if a event on the L0 pin caused an wake-up. Bit is cleared by writing a logic “1” to this location. 1 = Wake-up due to L0 pin 0 = no Wake-up due to L0 pin ANALOG DIE INPUTS / OUTPUTS LIN PHYSICAL LAYER The LIN bus pin provides a physical layer for single-wire communication in automotive applications. The LIN physical layer is designed to meet the LIN physical layer specification. The LIN driver is a low side MOSFET with internal current limitation and thermal shutdown. An internal pullup resistor with a serial diode structure is integrated, so no external pullup components are required for the application in a slave mode. The fall time from dominant to recessive, and the rise time from recessive to dominant is controlled. The symmetry between both slew rate controls is guaranteed. The slew rate can be selected for optimized operation at 10 and 20kBit/s, as well as high baud rates for test and programming. The slew rate can be adapted with 2 bits SRS[1:0] in the System Control Register. The initial slew rate is optimized for 20kBit/s. The LIN pin offers high susceptibility immunity level from external disturbance, guaranteeing communication during external disturbance. The LIN transmitter circuitry is enabled by setting the PSON bit in the System Control Register (SYSCTL). If the transmitter works in the current limitation region, the LINCL bit in the System Status Register (SYSSTAT) is set and the LIN transceiver is disabled after a certain time. For improved performance and safe behavior when the LIN bus shorts to Ground, or LIN bus leakage during low power mode, the internal pull-up resistor on the LIN pin is disconnected from VSUP and a small current source keeps the LIN bus at recessive level. In case of a LIN bus short to GND, this feature will reduce the current consumption in STOP and SLEEP modes. 908E622 Analog Integrated Circuit Device Data Freescale Semiconductor 31 FUNCTIONAL DEVICE OPERATION OPERATIONAL MODES MODE PSON SRS[1:0] VSUP Wake-up LINIF Control 10µA LINCL 30k LIN bus TXD Slope Control Wake-up Filter GND Receiver TESTMODE RXD Figure 16. LIN Interface TXD Pin The TXD pin is the MCU interface to control the state of the LIN transmitter (see Figure 2, page 2). When TXD is LOW, the LIN pin is low (dominant state). When TXD is HIGH, the LIN output MOSFET is turned off (recessive state). The TXD pin has an internal pullup current source in order to set the LIN bus to recessive state in the event, for instance, the microcontroller could not control it during system power-up or power-down. RXD Pin The RXD transceiver pin is the MCU interface, which reports the state of the LIN bus voltage. LIN HIGH (recessive state) is reported by a high level on RXD, LIN LOW (dominant state) by a low level on RXD. followed by an rising edge will set the LINIF flag and generate an interrupt which causes a system wake-up (see Figure 8, page 18) SLEEP Mode and Wake-up Feature During SLEEP mode operation, the transmitter of the physical layer is disabled and the internal pullup resistor is disconnected from VSUP. A small current source keeps the LIN pin in recessive state. The receiver is still active to be able to detect wake-up events on the LIN bus line. A dominant level longer than tPROPWL followed by an rising edge will generate a system wake-up (reset), and set the LINWF flag in the Reset Status register (RSR). Also see Figure 9, page 18). A0 INPUT AND ANALOG MULTIPLEXER STOP Mode and Wake-up Feature During STOP mode operation the transmitter of the physical layer is disabled and the internal pullup resistor is disconnected from VSUP, and a small current source keeps the LIN pin in recessive state. The receiver is still active and able to detect wake-up events on the LIN bus line. If the LIN interrupt is enabled (LINIE bit in the Interrupt Mask register is set), a dominant level longer than tPROPWL A0 - Analog Input Input A0 is an analog input used for reading switches or as analog inputs for potentiometers, NTC, etc. A0 is internally connected to the analog multiplexer. This pin offers a switchable current source. To read the Analog Input the pin, it has to be selected with the SS[3:0] bits in the A0MUCTL register. 908E622 32 Analog Integrated Circuit Device Data Freescale Semiconductor FUNCTIONAL DEVICE OPERATION OPERATIONAL MODES Source Selection Bits VDD SSx 4 CSSEL Selectable Current Source PSON ADOUT CSON Analog Multiplexer A0 SS[0:3] Analog Port A0/A0CST A0CST 1% Figure 17. Analog Input and Multiplexer A0 Current Source The pin A0 provides a switchable current source, to be able to read in switches, NTC, etc., without the need of an additional supply line for the sensor. The overall enable of this feature is done by setting the PSON bit in the System Control register. In addition, the pin has to be selected with the SS[3:0] bits. The current source can be enabled with the CSON Bit, and adjusted with the bits CSSEL[1:0]. The CSSEL[1:0] bit’s four different current values can be selected (40, 120, 320 and 800µA). This function is halted during STOP and SLEEP mode operations. The current source is derived from the VDD voltage and is constant up to an output voltage of ~4.75V. IA0(UA0) 100% connected. Switching the current sources to this resistor allows the user to measure the current, and use the measured value for calculating the current on A0. Analog Multiplexer / ADOUT Pin The ADOUT pin is the analog output interface to the Analog-to-digital converter of the MCU. To be able to have different sources for the MCU with one single signal, an analog multiplexer is integrated in the analog die. This multiplexer has twelve different sources, which can be selected with the SS[3:0] bits in the A0MUCTL register. Half-bridge (HB1:HB4) Current Recopy The multiplexer is connected to the four current sense circuits on the low side FET of the half bridges. This sense circuits offers a voltage proportional to the current through the MOSFET. The resolution is depending on the CSA bit in the A0 and Multiplexer control register (A0MUCTL). High Side (HS1:HS3) Current Recopy The multiplexer is connected to the three high side switches. These sense circuits offer a voltage proportional to the current through the transistor. Analog Input A0 and A0CST UA0[V] 4.75 5 To calibrate the current sources an extra pin (A0CST) is envisioned. On this pin, an accurate resistor can to be A0 and A0CST are directly connected to the analog multiplexer. It offers the possibility to read analog values from the periphery. 908E622 Analog Integrated Circuit Device Data Freescale Semiconductor 33 FUNCTIONAL DEVICE OPERATION OPERATIONAL MODES Temperature Sensor CSA — H-Bridges Current Sense Amplification Select Bit The analog die includes an on chip temperature sensor. This sensor offers a voltage which is proportional to the actual mean chip junction temperature. This read/write bit selects the current sense amplification of the H-bridges HB1:HB4 current recopy. Reset clears the CSA bit. 1 = low current sense amplification 0 = high current sense amplification VSUP Prescaler The VSUP prescaler offers a possibility to measure the external supply voltage. The output of this voltage is VSUP / RATIOVSUP. SS[3:0] — Analog Source Input Select Bits These read/write bits selects the analog input source for the ADOUT pin. Reset clears the SS[3:0] bits EC Output The EC output is directly connected to the multiplexer to be able to read the actual voltage on the EC pin. A0 and Multiplexer Control Register (A0MUCTL) Register Name and Address: A0MUCTL - $08 Bit7 6 5 CSON CSSEL 1 CSSEL 0 CSA SS3 SS2 SS1 SS0 0 0 0 0 0 0 0 0 Read Write Reset 4 3 2 1 This read/write bit enables the current source for the A0 or A0CST inputs. Reset clears CSON bit. 1 = Current Source enabled 0 = Current Source disabled CSSEL[1:0] — Current Source Select Bits These read/write bits select the current source values for A0 or A0CST input. Reset clears CSSEL[1:0] bits. CSSEL1 CSSEL0 Current Source Enable (typ.) 0 0 40µA 0 1 120µA 1 0 320µA 1 1 800µA SS3 SS2 SS1 SS0 Channel 0 0 0 0 current recopy HB1 0 0 0 1 current recopy HB2 0 0 1 0 current recopy HB3 0 0 1 1 current recopy HB4 0 1 0 0 current recopy HS1 0 1 0 1 current recopy HS2 0 1 1 0 current recopy HS3 0 1 1 1 not used 1 0 0 0 Chip temperature 1 0 0 1 VSUP prescaler 1 0 1 0 Pin A0 1 0 1 1 Pin A0CST 1 1 0 0 Pin EC 1 1 0 1 not used 1 1 1 0 not used 1 1 1 1 not used Bit0 CSON — Current Source on/off Table 7. A0 Current Source Level Selection Bits Table 8. Analog Multiplexer Configuration Bits. Hall-Effect Sensor Input Pin H0 The H0 pin can be configured as general purpose input (H0MS = 0), or as hall-effect sensor input (H0MS = 1), to be able to read 3pin / 2pin hall sensors or switches. 908E622 34 Analog Integrated Circuit Device Data Freescale Semiconductor FUNCTIONAL DEVICE OPERATION OPERATIONAL MODES VDD 10k H0PD VSUP H0MS H0MS H0 H0EN H0F H0EN Current Sense Figure 18. General Purpose / Hall-effect Sensor Input (H0) After switching on the hallport (H0EN = “1”), the hallsensor needs some time to stabilize the output. In RUN mode, the software has to take care about waiting for a few µs (40) before sensing the hallflags. The hallport output current is sensed. In case of an overcurrent (short to GND), the hallport over-current flag (H0OCF) is set and the current is limited. For proper operation of the current limitation, an external capacitor (>100nF) close to the H0 pin is required. Current Coded Hallsensor Input H0 is selected as “2 pin hallsensor input”, if the corresponding H0MS bit in the H0/L0 Status and Control Register (HLSCTL) is set. In this mode, the pin current to GND is monitored by a special sense circuitry. Setting the H0EN bit in the H0/L0 Status and Control Register, switches the output to VSUP and enables the sense circuitry. The result of the sense operation is given by the H0F flag. The flag is low if the sensed current is higher than the sense current threshold IHSCT. In this configuration, the HO pin is protected (current limitation) against a short circuit to GND. VSUP 2 pin hall sensor H0EN Current Sense H0 >0.1uF H0F GND V Figure 19. H0 Used as 2-Pin Hallsensor Input 908E622 Analog Integrated Circuit Device Data Freescale Semiconductor 35 FUNCTIONAL DEVICE OPERATION OPERATIONAL MODES General Purpose Input H0 is selected as general purpose input, if the H0MS bit in the H0/L0 Status and Control Register (HLSCTL) is cleared. In this mode, the input is usable as a standard 5V input. The VDD H0 input has a selectable internal pullup resistor. The pullup can be switched off with the H0PD bit in the H0/L0 Status and Control Register (HLSCTL). After reset, the internal pullup is enabled. VDD 3 pin hall sensor HVDD Vs 10k HVDDON H0PD H0F H0 OUT GND GND Figure 20. H0 Used as 3 Pin Hall-effect Sensor Input VDD 10k H0PD H0F H0 GND Figure 21. H0 Used to Read in Standard Switches H0 Interrupt Wake-up Input L0 The interrupt functionality on this pin is only available in RUN mode. H0 interrupt flag H0IF is set in run mode by a state change of the H0 flag (rising or falling edge on the enabled input). The interrupt function is available if the input is selected as General Purpose, or as a 2pin Hallsensor input. The interrupt can be masked with the H0IE bit in the interrupt mask register. The device provides one wake-up capable input for reading VSUP or VDD related signals. RUN Mode The actual input state is reflected in the L0F bit of the H0/ L0 Status and Control register (HLSCTL). The L0 pin offers an interrupt capability on rising and falling edge. The interrupt can be enabled with the L0IE bit in the Interrupt Mask register. 908E622 36 Analog Integrated Circuit Device Data Freescale Semiconductor FUNCTIONAL DEVICE OPERATION OPERATIONAL MODES STOP/SLEEP Mode H0EN — H0 Input 2pin Hall-effect Sensor Enable Bit During STOP and SLEEP mode, the pin can be used to wake-up the device. Before entering the STOP or SLEEP mode, the actual state of the input is stored. If the state is changing during in the STOP or SLEEP mode, a wake-up is initiated. This read/write bit enables the 2pin hall-effect sensor sense circuitry. Reset clears the H0EN bit. 1 = Hallport H0 is switched on and sensed 0 = Hallport H0 disabled H0PD — Hallport Pullup Disable Bit H0 / L0 Status and Control Register (HLSCTL) This read/write bit disables the H0 pullup resistor. Reset clears the H0PD bit. 1 = Hallport pullup resistor on H0 disabled 0 = Hallport pullup resistor on H0 enabled Register Name and Address: HLSCTL - $07 Read Bit7 6 5 L0F 0 0 4 3 2 1 Bit0 H0F H0OCF H0EN H0PD H0MS 0 0 0 Write Reset 0 0 0 0 0 H0MS — H0 Mode Select These read/write bits select the mode of the H0 input. Reset clears the H0MS bits. 1 = H0 is 2-pin hallsensor input 0 = H0 is general purpose input Half-bridge Outputs L0F — L0 Flag Bit This read only flag reflects the state of the L0 input 1 = L0 input high 0 = L0 input low H0OCF — H0 Over-current Flag Bit This read/write flag is set with an over-current condition on H0 during 2pin hallsensor mode. Clear H0OCF by writing a logic [1] to H0OCF. Reset clears the H0OCF bit. 1 = over-current condition on H0 pin has occurred 0 = no over-current condition on H0 pin has occurred H0F — H0 Flag Bit Outputs HB1:HB4 provide four low resistive half-bridge output stages. The half-bridges can be used in H-bridge, high side or low side configurations. Reset clears all bits in the H-bridge Output Register (HBOUT), owing to the fact that all half-bridge outputs are switched off. HB1:HB4 output features • Short-circuit (over-current) protection on high side and low side MOSFETs • Current recopy feature (low side MOSFET) • Over-temperature protection • Over-voltage and under-voltage protection • Active clamp on low side MOSFET This read only flag reflects the state of the H0 input 1 = Hallport sensed high / current below threshold detected 0 = Hallport sensed low / current above threshold detected 908E622 Analog Integrated Circuit Device Data Freescale Semiconductor 37 FUNCTIONAL DEVICE OPERATION OPERATIONAL MODES VSUP On/Off High Side Driver Charge Pump Over-temperature Protection Over-current Protection Status PWM Control HBx On/Off Low Side Driver Current Recopy Current Limitation Active Clamp Over-current Protection Status PWM GND Figure 22. Half-bridge Push-Pull Output Driver Half-bridge Control HBx_H, HBx_L — Half-bridge Output Switches Each output MOSFET can be controlled individually. The general enable of the circuitry is done by setting PSON in the System Control Register (SYSCTL). The HBx_L and HBx_H bits form one half-bridge. It is not possible to switch on both MOSFETs in one half-bridge at the same time. If both bits are set, the high side MOSFET is in PWM mode. To avoid both MOSFETs (high side and low side) of one half-bridge being on at the same time, a break-before-make circuit exists. Switching the high side MOSFET on is inhibited, as long as the potential between gate and VSS is not below a certain threshold. Switching the low side MOSFET on is blocked as long as the potential between gate and source of the high side MOSFET did not fall below a certain threshold. These read/write bits select the output of each half-bridge output according to the following table. Reset clears all HBx_H, HBx_L bits. HALF-BRIDGE OUTPUT REGISTER (HBOUT) Register Name and Address: HBOUT - $01 Bit7 Read Write Reset 6 5 4 3 2 0 0 0 0 0 HBx_H HBx_L Mode 0 0 Low side and high side MOSFET off 0 1 High side MOSFET off, low side MOSFET on 1 0 High side MOSFET on, low side MOSFET off 1 1 High side MOSFET in PWM mode Half-bridge PWM mode 1 Bit0 HB4_ HB4_ HB3_ HB3_ HB2_ HB2_ HB1_ HB1_ H L H L H L H L 0 Table 9. Half-Bridge Configuration 0 0 The PWM mode is selected by setting both HBxL and HBxH of one Half-bridge to “1”. In this mode, the high side MOSFET is controlled by the incoming PWM signal on the PWM pin (see Figure 2, page 2). If the incoming signal is high, the high side MOSFET is switched on. 908E622 38 Analog Integrated Circuit Device Data Freescale Semiconductor FUNCTIONAL DEVICE OPERATION OPERATIONAL MODES If the incoming signal is low, the high side MOSFET is switched off. With the current recirculation mode control bit CRM in the Half-bridge Status and Control Register (HBSCTL), the recirculation behavior in PWM mode can be controlled. If CRM is set the corresponding low-side MOSFET is switched on if the PWM controlled high side MOSFET is off. Half-bridge Current Recopy Each low side MOSFET has an additional sense output to allow a current recopy feature. These sense sources are internally amplified and switched to the Analog Multiplexer. The factor for the Current Sense amplification can be selected via the CSA bit in the A0MUCTL register (see page 32) CSA = “1”: low resolution selected CSA = “0”: high resolution selected “1” to the HBxOCF in the Half-bridge Status and Control Register (HBSCTL), or by a reset. Half-bridge Over-voltage/Under-voltage Protection The half-bridge outputs are protected against undervoltage and over-voltage conditions. This protection is done by the low and high voltage interrupt circuitry. If one of these flags (LVIF, HVIF) are set. The outputs are automatically disabled if the VIS bit in the System Control Register (SYSCTL) is cleared. The over-voltage and under-voltage status flags are cleared (and the outputs reenabled) by writing a “1” to the LVIF / HVIF flags in the Interrupt Flag Register (IFR)- or by a reset. Clearing this flag has no effect as long as the high voltage or low voltage condition is still present. Half-bridge Status and Control Register (HBSCTL) Half-bridge Over-temperature Protection The outputs are protected against over-temperature conditions. Each power output comprises two different temperature thresholds. The first threshold is the high temperature interrupt (HTI). If the temperature reaches this threshold, the HTIF bit in the Interrupt Flag Register (IFR) is set, and an interrupt will be initiated, if the HTIE bit in the Interrupt Mask register is set. In addition, this interrupt can be used to automatically turn off the power stages. This shutdown can be enabled/disabled by the HTIS0-1 bits in the System Control Register (SYSCTL). The high temperature interrupts flag (HTIF) is cleared (and the outputs reenabled) by writing a “1” to the HTIF flag in the Interrupt Flag Register (IFR), or by a reset. Clearing this flag has no effect as long as a high temperature condition is present. If the HTI shutdown is disabled, a second threshold high temperature reset (HTR) will be used to turn off all power stages (HB (all Fet’s), HS, HVDD, EC, H0) in order to protect the device. Half-bridge Over-current Protection The Half-bridges are protected against short to GND, VSUP, and load shorts. The over-current protection is implemented on each HB. If an over-current condition on the high side MOSFET occurs, the high side MOSFET is automatically switched off. An over-current condition on the low side MOSFET will automatically turn off the low side MOSFET. In both cases, the corresponding HBxOCF flag in the Half-bridge Status and Control Register (HBSCTL) is set. The over-current status flag is cleared (and the corresponding Half-bridge MOSFETs reenabled) by writing a Register Name and Address: HBSCTL - $03 Bit7 Read 6 5 4 3 2 1 Bit0 0 0 0 HB4 OCF HB3 OCF HB2 OCF HB1 OCF 0 0 0 0 0 0 0 CRM Write Reset 0 CRM — Current Recirculation Mode bit This read/write bit selects the recirculation mode during PWM. Reset clears the CRM bit. 1 = recirculation via switched on low side MOSFET 0 = recirculation via low side free wheeling diode HBxOCF — Half-bridges Over-current Flag Bit This read/write bit indicates that an over-current condition on either the LS or the HS FET on HBx has occurred. Clear HBxOCF and enable Half-bridge by writing a logic [1] to HBxOCF. Writing a logic [0] to HBxOCF has no effect. Reset clears the HBxOCF bit. 1 = over-current condition on HBx occurred 0 = no over-current condition on HBx High Side Drivers The high side outputs are low resistive high side switches targeted for driving lamps. The high sides are protected against over-temperature, over-current and over-voltage/ under-voltage. 908E622 Analog Integrated Circuit Device Data Freescale Semiconductor 39 FUNCTIONAL DEVICE OPERATION OPERATIONAL MODES VSUP PSON on/off HSxON Control HSxPWM Status Current Limit PWM HS - Driver charge pump over-current protection inrush current limiter PWM HSx Figure 23. HS Circuitry HIGH SIDE OPERATING MODES The high sides outputs are enabled if the PSON bit in the System Control Register (SYSCTL) is set. Each high side output is permanently switched on, if the HSxON bit in the High Side Output Register (HSOUT) is set. PWM control of the output is enabled, if the HSxPWM bit High Side Output Register (HSOUT) is set. In this operating mode, the high side MOSFET is on, if the input PWM signal (PWM pin) is high. Table 10 shows the behavior of the high side MOSFETs depending on the HSONx and PWMHSx bits. HSxPWM HSxON 1 0 If the current reaches the over-current shutdown value, the high side will be automatically turned off. With the next rising edge of the PWM input signal, the output will turn on again (current limitation). The HSxOCF bit will be set, software has to distinguish between an inrush current, and a real short on the output. Mode HSxON 0 0 High side MOSFET off 0 1 High side MOSFET on, in case of overcurrent the over-current flag (HSxOCF) is set and the high side MOSFET is turned off In this mode, the PWM duty cycle is either controlled by the PWM input signal, or when the over-current shutdown value is reached by the part itself. Without reaching the over-current shutdown, the high side driver is directly driven from the PWM input signal. If the Input signal is high, the output is on. If low, the output is off (PWM control). Table 10. High-Side Configuration Bits HSxPWM Mode 1 1 High side MOSFET is switched on and the inrush current limitation is enabled. This means the high side will start automatically with a current limitation around the over-current shutdown threshold. (PWM signal must be applied, see Figure 24) If the high side enters current limitation the HSxOCF bit is set, but the output is not disabled. The software needs to distinguish between an inrush current and a real short on the output. High Side Over-voltage / Under-voltage Protection The outputs are protected against under / over-voltage conditions. This protection is done by the low and high voltage interrupt circuitry. If an over /under-voltage condition is detected (LVIF / HVIF), and the VIS Bit is in the High Side Status Register is cleared, the output is disabled. 908E622 40 Analog Integrated Circuit Device Data Freescale Semiconductor FUNCTIONAL DEVICE OPERATION OPERATIONAL MODES The over / under-voltage status flags are cleared (and the output reenabled) by writing a logic [1] to the LVIF / HVIF flags in the Interrupt Flag Register, or by reset. Clearing this flag has no effect as long as a high or low voltage condition is present. HIGH SIDE OVER-TEMPERATURE PROTECTION The outputs are protected against over-temperature conditions. Each power output comprises two different temperature thresholds. The first threshold is the high temperature interrupt (HTI). When the temperature reaches this threshold, the HTI bit in the interrupt flag register is set. An interrupt will be generated, When the HTIE bit in the interrupt mask register is set. In addition, this interrupt can be used to automatically turn off the power stages (all high sides, on half-bridges, just the high side FETs). This shutdown can be enabled/disabled by the HTIS0 Bit. The high temperature interrupt flag (HTIE) is cleared (and the outputs reenabled) by writing a logic [1] to the HTIF flag in the Interrupt Status Register, or by reset. Clearing this flag has no effect, as long as a high temperature condition is present. If the HTIS shutdown is disabled, a second threshold (HTR) will be used to turn off all power stages (HB (all FETs), HS, HVDD, EC, H0) in order to protect the device. HIGH SIDE OVER-CURRENT PROTECTION The HS outputs are protected against over-current. When the over-current limit is reached, the output will be automatically switched off and the over-current flag is set. Due to the high inrush current of bulbs, a special feature was implemented to avoid an over-current shutdown during this inrush current. If a PWM frequency will be supplied to the PWM input during the switch on of a bulb, the inrush current will be limited to the over-current shutdown limit. This means, if the current reaches the over-current shutdown, the high side will be switched off, but each rising edge on the PWM input will enable the driver again. The duty cycle supplied by the MCU has no influence on the switch-on time of the high side driver. In order to distinguish between a shutdown due to an inrush current or a real shutdown, the software checks to see if the over-current status flag (HSxOCF) in the High Side Status register is set beyond a certain period of time. HS Current HS Over-Current Shutdown Threshold t PWM Terminal t Figure 24. Inrush Current Limitation on HS Outputs 908E622 Analog Integrated Circuit Device Data Freescale Semiconductor 41 FUNCTIONAL DEVICE OPERATION OPERATIONAL MODES 1 = High Side x is turned on 0 = High Side x is turned off High Side Current Recopy Each high side has an additional sense output to allow a current recopy feature. This sense source is internally connected to a shunt resistor. The drop voltage is amplified and switched to the Analog Multiplexer. Switchable HVDD Outputs The HVDD pin is a switchable 5V output pin. It can be used for driving external circuitry which requires a 5V voltage. The output is enabled with the PSON bit in the System Control register and can be switched on / off with the HVDD_ON bit in the High Side Out register. Low or high voltage conditions (LVIF / HVIF) will have no influence on this circuitry. HSxPWM — High Side PWM on/off Bits These read/write bits enable the PWM control of the High Side FETs. Reset clears the HSxPWM bits. 1 = High Side x is controlled by PWM input signal 0 = High Side x is not controlled by PWM input signal High Side Status Register (HSSTAT) Register Name and Address: HSSTAT - $04 Bit7 HVDD Over-temperature Protection The output is protected against over-temperature conditions. Read HVDD Over-current Protection Reset Write The HVDD output is protected against over-current. In case the current reach the over-current limit, the output current will be limited and the HVDDOCF over-current flag in the System Status register is set. High Side Out Register (HSOUT) Register Name and Address: HSOUT - $02 Bit7 Read Write HVDD ON Reset 0 6 0 0 5 4 3 2 1 Bit0 HS3P WM HS2P WM HS1P WM HS3O N HS2O N HS1O N 0 0 0 0 0 0 HVDD-ON — HVDD On Bit This read/write bit enables the HVDD output. Reset clears the HVDDON bit. 1 = HVDD enabled 0 = HVDD disabled HSxON — High Side on/off Bits These read/write bits turn on the High Side Fet’s permanently. Reset clears the HSxON bits. HVDD OCF 0 6 5 4 3 0 0 0 0 0 0 0 0 2 1 Bit0 HS3O CF HS2O CF HS1O CF 0 0 0 HSxOCF — High Side Overcurrent Flag Bit This read/write flag is set by an over-current condition at the high side drivers x. Clear HSxOCF and enable the HS Driver by writing a logic [1] to HSxOCF. Writing a logic [0] to HSxOCF has no effect. Reset clears the HSxOCF bit. 1 = over-current condition on high side drivers has occurred 0 = no over-current condition on high side drivers has occurred HVDDOCF — HVDD Output Over-current Flag Bit This read/write flag is set by an over-current condition at the HVDD pin. Clear HVDDOCF and enable the output by writing a logic [1] to the HVDDOCF Flag. Writing a logic [0] to HVDDOCF has no effect. Reset clears the HVDDOCF bit. 1 = over-current condition on VDD output has occurred 0 = no over-current condition on VDD output has occurred Electrochrome Circuitry The EC glass is controlled by two transistors. T1 switches the EC glass on/off, and T2 controls the EC output voltage given by the 6Bit DA Converter. 908E622 42 Analog Integrated Circuit Device Data Freescale Semiconductor FUNCTIONAL DEVICE OPERATION OPERATIONAL MODES VSUP Control EC output voltage On/Off ECRON T1 ECOCF ECOL ECR ECON ECOCF EC 6Bit DAC On/Off T2 GND Figure 25. EC Circuitry EC Open Load Detection EC Digital to Analog Converter Open Load can be detected by setting ECOLT. A small current source sources a typical 200μA on the EC pin, and the voltage on the pin is measured. If the voltage is above the typical 2.0V (typical 10K threshold), the ECOLF bit in the EC Status and Control Register ECSCTL is set, indicating the open load condition. If the Open load circuitry is activated (ECOLT=1), the EC glass is disabled. The EC output, and therefore the voltage on the EC glass are controlled. The EC glass circuitry has a 6 bit D/A converter to control the output voltage between 0 and 1.4V. EC D/A Converter Control Register (ECDACC) Register Name and Address: ECDACC - $06 EC Short Circuit Protection The EC output is protected against shorts to VSUP. In case of a short-circuit, the ECOCF in the EC Status and the Control Register (ECSCTL) are set, and the EC circuitry is disabled. The EC output is protected against shorts to GND. In case of a short-circuit, the ECOCF in the EC Status and the Control Register (ECSCTL) are set, and the EC circuitry is disabled. Read Bit7 6 5 4 3 2 1 Bit0 0 0 ECD A5 ECD A4 ECD A3 ECD A2 ECD A1 ECD A0 0 0 0 0 0 0 0 0 Write Reset ECDAx — Digital to Analog Bits These read/write bits set the output voltage on the EC pin. 908E622 Analog Integrated Circuit Device Data Freescale Semiconductor 43 FUNCTIONAL DEVICE OPERATION OPERATIONAL MODES EC Status and Control Register (ECSCTL) System Control Register (SYSCTL) Register Name and Address: ECSCTL - $05 Read Write Reset Register Name and Address: SYSCTL - $00 Bit7 6 5 4 3 2 1 Bit0 ECO N ECO LT ECR ON 0 0 0 ECO CF ECO LF Read 0 0 0 0 0 0 Reset 0 0 Bit7 6 5 0 0 STOP SLEEP 0 0 PSON Write 0 4 3 2 1 Bit0 HTIS1 HTIS0 VIS SRS1 SRS0 0 0 0 0 0 ECON — Electrochrome Circuitry Enable Bit PSON — Power Stages On Bit This read/write bit enables transistor T2 of the electrochrome circuitry. Reset clears the ECON bit. 1 = T2 EC circuitry enabled 0 = T2 EC circuitry disabled This read/write bit enables the power stages (half-bridges, high sides, LIN transmitter, A0 Current Sources, and HVDD output). Reset clears the PSON bit. 1 = power stages enabled 0 = power stages disabled ECOLT — Electrochrome Circuitry Open Load Test Bit This read/write bit enables the open load test for the electrochrome circuitry. If this bit is set, the EC Glass functionality is ceased. Reset clears the ECOLT bit. 1 = EC Open Load circuitry enabled 0 = EC Open Load circuitry disabled ECRON — EC Resistor enable Bit This read/write bit enables transistor T1 of the electrochrome circuitry. Reset clears the ECRON bit. 1 = T1 EC circuitry enabled 0 = T1 EC circuitry disabled Note: Controlling the output voltage on pin EC is done by transistor T2 only. The enable of T1 will switch the VSUP voltage via the external EC resistor to the EC glass. ECOCF — EC Output Over-current Flag Bit This read/write flag is set on short-circuit conditions at the EC output (short to VSUP/ short to GND). Clear ECOCF and enable the EC circuitry by writing a logic [1] to ECOCF. Writing a logic [0] to ECOCF has no effect. Reset clears the ECOCF bit. 1 = short-circuit condition on EC output detected 0 = no short-circuit condition on EC output detected ECOLF — EC Open Load Flag Bit This read/write flag is set on an open load condition of the EC output. Clear ECOLF and disable the EC circuitry by writing a logic [1] to ECOLF. Writing a logic [0] to ECOLF has no effect. Reset clears the ECOLF bit. 1 = open load condition on EC output detected 0 = no open load condition on EC output detected STOP — Change to STOP Mode Bit This write bit instructs the chip to enter Stop mode (See Operational Modes on page 25). Reset or CPU interrupt requests clear the STOP bit. 1 = go to Stop mode 0 = not in stop mode In order to safely enter Stop mode, all other bits (Bit7-Bit2) have to be “0”. Otherwise, the STOP command will not be executed. SLEEP — Change to SLEEP Mode Bit This write bit instructs the chip to enter Sleep mode (See Operational Modes on page 25). Reset or CPU interrupt requests clear the SLEEP bit. 1 = go to Sleep mode 0 = not in sleep mode In order to safely enter Sleep mode, all other bits (Bit7Bit2) have to be “0”. Otherwise the SLEEP command will not be executed. HTIS0-1 — High Temperature Interrupt Shutdown Bits This read/write bit selects the power stage behavior at High Temperature Interrupt (HTI). Reset clears the HTIS0-1 bits. The HTIS0 bit selects the behavior of the high side HS1:3 and the high side FET of the half-bridges HB1:4. 1 = automatic HTI shutdown of the high side drivers disabled 0 = automatic HTI shutdown of the high side drivers enabled The HTIS1 bit selects the behavior of the low side drivers of the half-bridges HB1:4. 1 = automatic HTI shutdown of the low side drivers disabled 0 = automatic HTI shutdown of the low side drivers enabled 908E622 44 Analog Integrated Circuit Device Data Freescale Semiconductor FUNCTIONAL DEVICE OPERATION OPERATIONAL MODES The user must take care to protect the device against thermal destruction! VF — Voltage Failure Bit VIS — Over /Under-voltage Interrupt Shutdown This read/write bit selects the power stage behavior at LVI/ HVI. Reset clears the VIS bit. 1 = automatic LVI/HVI shutdown disabled 0 = automatic LVI/HVI shutdown enabled These read/write bits enable the user to select the appropriate LIN slew rate for different Baudrate configurations. Reset clears the SRS1:0 bits. SRS1 SRS0 Slew rate 0 0 Initial Slew Rate (20kBaud) 0 1 High Speed II (8x) 1 0 Slow Slew Rate (10kBaud) 1 1 High Speed I (4x) VF Figure 26. VF Flag Generation H0F — H0 Failure Bit This read only bit is a copy of the H0OCF bit in the H0/L0 Status and Control Register (HLSCTL) 1 = over-current detected on H0 0 = no over-current on H0 Table 11. LIN Slew Rate Selection Bits HVDDF— HVDD Failure Bit The high speed slew rates are used, for example, for programming via the LIN, and are not intended for use in the application. This read only bit is a copy of the HVDDOCF bit in the High Side Status register 1 = HVDD pin fail 0 = HVDD normal operating HSF— HS1:3 Failure Bit This read only bit is set if a fail condition on one of the high side outputs is present 1 = HS1:3 pin fail 0 = HS1:3 normal operating System Status Register (SYSSTAT) Register Name and Address: SYSSTAT - $0C Bit7 6 5 4 3 2 1 Bit0 LINC L HTIF VF H0F HVD DF HSF HBF ECF HS1OCF HS2OCF HSF HS3OCF Write Reset HVIF LVIF SRS0-1 — LIN Slew rate Select Bits Read This read only bit indicates that the supply voltage was out of the allowed range. The bit is set if either the LVIF or the HVIF in the Interrupt Flag register are set. 1 = low/high voltage condition detected 0 = no voltage failure condition detected 0 0 0 0 0 0 0 0 LINCL — LIN Current Limitation Bit This read only bit is set if the LIN transmitter operates in the current limitation region. Due to excessive power dissipation in the transmitter, the driver will be automatically turned off after a certain time. 1 = transmitter operating in current limitation region 0 = transmitter not operating in current limitation region HTIF— Over-temperature Status Bit This read only bit is a copy of the HTIF bit in the Interrupt Flag register 1 = over-temperature condition 0 = no over-temperature condition Figure 27. HSF flag generation HBF— HB1:4 Failure Bit This read only bit is set if a fail condition on one of the halfbridge outputs is present. 1 = HB1:4 pin over-current fail 0 = HB1:4 normal operating HB1OCF HB2OCF HB3OCF HBF HB4OCF Figure 28. HBF Flag Generation 908E622 Analog Integrated Circuit Device Data Freescale Semiconductor 45 FUNCTIONAL DEVICE OPERATION OPERATIONAL MODES ECF— EC pin Failure Bit This read only bit is set if a fail condition on the electrochrome output is present 1 = EC pin fail 0 = EC normal operating ECOLF ECOCF ECF Figure 29. ECF flag generation watchdog timer is automatically cleared, in order to give the MCU the full time to reset the watchdog. Sleep Mode Operations of the watchdog function are halted in sleep mode. Due to the main voltage regulator asserting an LVR reset, the Watchdog functionality is disabled, and the WDRE bit is cleared as soon as sleep mode is entered. To reenable this function bit WDRE has to be set after wake-up. Watchdog Control Register (WDCTL) WINDOW WATCHDOG The window watchdog is to supervise the device and to recover from (e.g. code runaways) or similar conditions. The use of a window watchdog adds additional safety as the watchdog clear has not only to occur, but to be done at a certain time frame / window. Register Name and Address: WDCTL - $0B Bit7 Read Write Reset Normal Mode The window watchdog function is only available in Normal mode, and is halted in Stop and Sleep mode. Upon setting the WDRE bit, the watchdog functionality is activated. Once this function is enabled, it is not possible to disable it via software. Reset clears the WDRE bit. To prevent a Watchdog reset, the Watchdog timer has to be cleared in the Window Open frame. This is done by writing a logic “1” to the WDRST bit in the Watchdog Control register (WDCTL). The actual reset of the watchdog counter occurs at the end of the corresponding SPI transmission, with the rising edge of the SS signal. If the watchdog is enabled, it will generate a system reset when the timer has reached its end value, or if a watchdog reset (WDRST) has occurred in the closed window. The watchdog period can be selected with 2 bits in the WDCTL, in order to get 10ms, 20ms, 40ms, and 80ms periods. Window closed no watch dog clear allowed WD timing x 50% Window open for watch dog clear WD timing x 50% WD period ( timing selected by Bits WDP1:0) 6 5 WDR WDP WDP E 1 0 0 0 0 4 3 2 1 Bit0 0 0 0 0 0 WDR ST 0 0 0 0 0 WDRE - Watchdog Reset Enable Bit This read/write (write once) bit activates the watchdog The WDRE can only be set and can’t be cleared by software. Reset clears the WDRE bit. 1 = Watchdog enabled 0 = Watchdog disabled WDP1:0 - Watchdog Period Select Bits This read/write bit select the clock rate of the Watchdog. Reset clears the WDP1:0 bits. Table 12. Watchdog Period Selection Bits WDP1 WDP0 Mode 0 0 80ms window watchdog period 0 1 40ms window watchdog period 1 0 20ms window watchdog period 1 1 10ms window watchdog period WDRST - Watchdog Reset Bit This write only bit resets the Watchdog. Write a logic [1] to reset the watchdog timer. 1 = Reset WD and restart timer 0 = no effect Figure 30. Window Watchdog Period Voltage Regulator Stop Mode Operations of the watchdog function is ceased in stop mode (counter/oscillator stopped). After a wake-up, the The 908E622 contains a low power, low drop voltage regulator to provide internal power and external power for the 908E622 46 Analog Integrated Circuit Device Data Freescale Semiconductor FUNCTIONAL DEVICE OPERATION LOGIC COMMANDS AND REGISTERS MCU. The on-chip regulator consist of two elements, the main regulator, and the low voltage reset circuit. The VDD regulator accepts an unregulated input supply and provides a regulated VDD supply to all digital sections of the device. The output of the regulator is also connected to the VDD pin to provide the 5.0V to the microcontroller. STOP Mode During STOP mode, the Stop mode regulator will take care of suppling a regulated output voltage. The Stop mode regulator has a limited output current capability. SLEEP Mode In Sleep mode, the main voltage regulator external VDD is turned off and the LVR circuitry will force the RST_A pin low. Run Mode During RUN mode, the main voltage regulator is on. It will provide a regulated supply to all digital sections. LOGIC COMMANDS AND REGISTERS 908E622 SERIAL PHERIPHERAL INTERFACE (SPI) The Serial Peripheral Interface (SPI) creates the communication link between the MCU and the analog die. The interface consists of four pins • MOSI - Master Out Slave In (internal pulldown) • MISO - Master In Slave Out • SPSCK - Serial Clock (internal pulldown) • SS - Slave Select (internal pullup) A complete data transfer via the SPI, consists of 2 bytes. The master sends address and data, the slave returns system status and the data of the selected address. SS Read/Write, Address, Parity R/W MOSI A4 A3 A2 A1 A0 Data (Register write) P X D7 D6 D5 System Status Register S7 MISO S6 S5 S4 S3 S2 D4 D3 D2 D1 D0 D2 D1 D0 Data (Register read) S1 S0 D7 D6 D5 D4 D3 SPSCK Rising edge of SPSCK Change MISO/MOSI Output Falling edge of SPSCK Sample MISO/MOSI Input Slave latch register address Slave latch data Figure 31. SPI Protocol • During the inactive phase of SS, the new data transfer will • After a write operation the transmitted data will be latched be prepared. The falling edge on the SS line, indicates the into the register, by the rising edge of SS. start of a new data transfer (framing) and puts MISO in the • Register read data is internally latched into the SPI, at the low impedance mode. The first valid data is moved to time when the parity bit is transferred MISO with the rising edge of SPSCK. • SS high will force MISO to a high impedance • The MOSI and MISO will change data on a rising edge of SPSCK. Master Address Byte • The MOSI and MISO will be sampled on a falling edge of SPSCK. A4 - A0 • The data transfer is only valid, if exactly 16 sample clock includes the address of the desired register. edges are present in the active phase of SS. 908E622 Analog Integrated Circuit Device Data Freescale Semiconductor 47 FUNCTIONAL DEVICE OPERATION LOGIC COMMANDS AND REGISTERS R/W includes the information if it is a read or a write operation. • If R/W = 1 (read operation), second byte of master contains no valid information, slave just transmits back register data. • If R/W = 0 (write operation), master sends data to be written in the second byte, slave sends concurrently contents of selected register prior to write operation, write data is latched in the SMARTMOS registers on rising edge of SS. Parity P completes the total number of 1 bits of (R/W,A[4-0]) to an even number. e.g. (R/W,A[4-0]) = 100001 -> P0 = 0. The parity bit is only evaluated during write operations and ignored for read operations. Bit X not used Master Data Byte This byte includes data to be written or no valid data during a read operation. Slave Status Byte This byte always includes the contents of the system status register ($0C), independent if it is a write or read operation, or which register was selected. Slave Data Byte This byte includes the contents of selected register, during write operation in includes the register content prior to write operation. 908E622 48 Analog Integrated Circuit Device Data Freescale Semiconductor FUNCTIONAL DEVICE OPERATION LOGIC COMMANDS AND REGISTERS SPI REGISTER OVERVIEW Table 13 SUMMARIZES THE SPI REGISTER ADDRESSES AND THE BIT NAMES OF EACH REGISTER. Table 13. SPI Register Overview Addr Register Name R/W $00 System Control (SYSCTL) R $01 $02 $03 $04 $05 $06 $07 $08 $09 $0A $0B $0C $0D $0E $0F Half-bridge Output (HBOUT) High Side Output (HSOUT) Half-bridge Status and Control (HBSCTL) High Side Status and Control (HSSCTL) EC Status and Control (ECSCTL) EC Digital to Analog Control (ECDACC) H0/L0 Status and Control (HLSCTL) A0 and Multiplexer Control (A0MUCTL) Interrupt Mask (IMR) Interrupt Flag (IFR) Watchdog Control (WDCTL) System Status (SYSSTAT) Reset Status (RSR) System Test (SYSTEST) System Trim 1 (SYSTRIM1) Bit 7 6 5 4 3 2 1 0 PSON 0 0 HTIS1 HTIS0 VIS SRS1 SRS0 STOP SLEEP HB4_H HB4_L HB3_H HB3_L HB2_H HB2_L HB1_H HB1_L HVDDON 0 HS3PWM HS2PWM HS1PWM HS3ON HS2ON HS1ON CRM 0 0 0 HB4OCF HB3OCF HB2OCF HB1OCF HVDDOCF 0 0 0 0 HS3OCF HS2OCF HS1OCF ECON ECOLT ECRON 0 0 0 ECOCF ECOLF 0 0 ECDAC5 ECDAC4 ECDAC3 ECDAC2 ECDAC1 ECDAC0 L0F 0 0 H0OCF H0F H0EN H0PD H0MS CSON CSSEL1 CSSEL0 CSA SS3 SS2 SS1 SS0 L0IE H0IE LINIE HTRD HTIE LVIE HVIE PSFIE L0IF H0IF LINIF 0 HTIF LVIF HVIF PSFIF WDRE WDP1 WDP0 0 0 0 0 0 W R W R W R W R W R W R W R W R W R W R W R WDRST W R LINCL HTIF VF H0F HVDDF HSF HBF ECF POR PINR WDR HTR LVR 0 LINWF L0WF itrim2 itrim1 itrim0 W R W R reserved W R HVDDT1 HVDDT0 reserved reserved itrim3 W 908E622 Analog Integrated Circuit Device Data Freescale Semiconductor 49 FUNCTIONAL DEVICE OPERATION LOGIC COMMANDS AND REGISTERS Table 13. SPI Register Overview $10 $11 System Trim 2 (SYSTRIM2) System Trim 3 (SYSTRIM3) R 0 W 0 CRHBHC1 CRHBHC0 R 0 W 0 0 0 0 0 0 CRHB5 CRHB4 CRHB3 CRHB2 CRHB1 CRHB0 0 0 0 0 0 0 CRHS5 CRHS4 CRHS3 CRHS2 CRHS1 CRHS0 0 CRHBHC3 CRHBHC2 FACTORY TRIMMING AND CALIBRATION To enhance the ease-of-use of the 908E622, various parameters (e.g. ICG trim value) are stored in the flash memory of the device. The following flash memory locations are reserved for this purpose and might have a value different from the “empty” ($FF) state: • $FD80:$FDDF Trim and Calibration Values • $FFFE :$FFFF Reset Vector In the event the application uses these parameters, one has to take care not to erase or override these values. If these parameters are not used, these flash locations can be erased and otherwise used. Watchdog Period Range Value (AWD Trim) Trim Values The window watchdog supervises device recovery (e.g. from code runaways). The application software has to clear the watchdog within the open window. Due to the high variation of the watchdog period, and therefore the reduced width of the watchdog window, a value is stored at address $FDCF. This value classifies the watchdog period into 3 ranges (Range 0, 1, 2). It allows the application software to select one of three time intervals to clear the watchdog based on the stored value. The classification is done in a way that the application software can have up to ±19% variation of the of optimal clear interval, e.g. caused by ICG variation. The usage of the trim values located in the flash memory is explained by the following. Effective Open Window Having a variation in the watchdog period in conjunction with a 50% open window, results in an effective open window, which can be calculated by: latest window open time: t_open = t_wd max / 2 earliest window closed time: t_closed = t_wd min Internal Clock Generator (ICG) Trim Value The internal clock generator (ICG) module is used to create a stable clock source for the microcontroller, without using any external components. The untrimmed frequency of the low frequency base clock (IBASE) will vary as much as ±25 percent due to process, temperature, and voltage dependencies. To compensate these dependencies, a ICG trim value is located at address $FDC2. After trimming, the ICG is in a range of typ. ±2% (±3% max.) at nominal conditions (filtered (100nF), and stabilized (4.7μF) VDD = 5V, TAmbient~25°C), and will vary over temperature and voltage (VDD), as indicated in the 68HC908EY16 datasheet. To trim the ICG, this value has to be copied to the ICG Trim Register ICGTR at address $38 of the MCU. Important The value has to copied after every reset. Table 14. Window Clear Interval Window Period Range Select bits Watchdog Period t_wd Optimal Clear Interval The optimal clear interval, meaning the clear interval with the biggest possible variation to latest window open time, and to the earliest window closed time, can be calculated with the following formula: t_opt = t_open + (t_open+t_closed) / 2 See Table 14 to select the optimal clear interval for the watchdog based on the Window No. and chosen period. Effective Open Window Optimal Clear Interval $FDCF WDP1:0 min. max. Unit t_open t_closed Unit t_opt Unit max. variation 0 00 68 92 ms 46 68 ms 57 ms ±19.3% 01 34 46 23 34 28.5 10 17 23 11.5 17 14.25 11 8.5 11.5 5.75 8.5 7.125 908E622 50 Analog Integrated Circuit Device Data Freescale Semiconductor FUNCTIONAL DEVICE OPERATION LOGIC COMMANDS AND REGISTERS Table 14. Window Clear Interval Window Period Range Select bits 1 2 Watchdog Period t_wd ms 92 77 124 01 46 62 31 46 38.5 10 23 31 15.5 23 19.25 11 11.5 15.5 7.75 11.5 9.625 00 52 68 34 52 01 26 34 17 26 21.5 10 13 17 8.5 13 10.75 11 6.5 8.5 4.25 6.5 5.375 ms ms ms 43 ms ±19.5% ms ±20.9% System Trim Register 1 (SYSTRIM1) System Test Register (SYSTEST) Register Name and Address: IBIAS - $0F Read Write Reset Bit7 6 5 4 3 2 1 Bit0 HVD DT1 HVD DT0 0 0 reser ved reser ved ITRI M3 ITRI M2 ITRI M1 ITRI M0 0 0 0 0 0 0 0 0 Note: do not change (set) the reserved bits HVDDT1:0 - HVDD Over-current Shutdown Delay Bits Register Name and Address: SYSTEST - $0E Reset 62 92 For improved application performance, and to ensure the outlined datasheet values, the analog die needs to be trimmed. For this purpose, 3 trim values are stored in the Flash memory at addresses $FDC4 - $FDC6. These values have to be copied into the analog die SPI registers: • copy $FDC4 into SYSTRIM1 register $0F • copy $FDC5 into SYSTRIM2 register $10 • copy $FDC6 into SYSTRIM3 register $11 Note: These values have to be copied to the respective SPI register after a reset, to ensure proper trimming of the device. Write Optimal Clear Interval 00 Analog Die System Trim Values Read Effective Open Window Bit7 6 5 4 3 2 1 Bit0 reser ved reser ved reser ved reser ved reser ved reser ved reser ved reser ved 0 0 0 0 0 0 0 0 Note: do not write to the reserved bits The System Test Register is reserved for production testing and is not allowed to be written into. These read/write bits allow changing the filter time (for capacitive load) for the HVDD over-current detection. Reset clears the HVDDT1:0 bits an sets the delay to the maximum value. Table 15. HVDD Over-current Shutdown Selection Bits HVDDT1 HVDDT0 typical Delay 0 0 950μs 0 1 536μs 1 0 234μs 1 1 78μs ITRIM3:0 - IRef Trim Bits These write only bits are for trimming the internal current references IRef (also A0, A0CST). The provided trim values have to be copied into these bits after every reset. Reset clears the ITRIM3:0 bits. 908E622 Analog Integrated Circuit Device Data Freescale Semiconductor 51 FUNCTIONAL DEVICE OPERATION LOGIC COMMANDS AND REGISTERS Table 16. IRef Trim Bits CRHB5:3 - Current Recopy HB3:4 Trim Bits itrim3 itrim2 itrim2 itrim0 Adjustment 0 0 0 0 0 0 0 0 1 2% These write only bits are for trimming the current recopy of the half-bridge HB3 and HB4 (CSA=1). The provided trim values have to be copied into these bits after every reset. Reset clears the CRHB5:3 bits. Table 18. Current Recopy Trim for HB3:4 (CSA=1) 0 0 1 0 4% 0 0 1 1 8% 0 1 0 0 12% 0 1 0 1 -2% 0 1 1 0 -4% 0 1 1 1 -8% 1 0 0 0 -12% CRHB5 CRHB4 CRHB3 Adjustment 0 0 0 0 0 0 1 -5% 0 1 0 -10% 0 1 1 -15% 1 0 0 reserved 1 0 1 5% 1 1 0 10% 1 1 1 15% System Trim Register 2 (SYSTRIM2) Register Name and Address: IFBHBTRIM - $10 Bit7 6 5 4 3 2 1 Bit0 Read 0 0 0 0 0 0 0 0 Write CRH BHC 1 CRH BHC 0 CRH B5 CRH B4 CRH B3 CRH B2 CRH B1 CRH B0 Reset 0 0 0 0 0 0 0 0 CRHBHC1:0 - Current Recopy HB1:2 Trim Bits These write only bits are for trimming the current recopy of the half-bridge HB1 and HB2 (CSA=0). The provided trim values have to be copied into these bits after every reset. Reset clears the CRHBHC1:0 bits. Table 17. Current Recopy Trim for HB1:2 (CSA=0) CRHBHC1 CRHBHC0 Adjustment 0 0 0 0 1 -10% 1 0 5% 1 1 10% CRHB2:0 - Current Recopy HB1:2 Trim Bits These write only bits are for trimming of the current recopy of the half-bridge HB1 and HB2 (CSA=1). The provided trim values have to be copied into these bits after every reset. Reset clears the CRHB2:0 bits. Table 19. Current Recopy Trim for HB1:2 (CSA=1) CRHB2 CRHB1 CRHB0 Adjustment 0 0 0 0 0 0 1 -5% 0 1 0 -10% 0 1 1 -15% 1 0 0 reserved 1 0 1 5% 1 1 0 10% 1 1 1 15% 908E622 52 Analog Integrated Circuit Device Data Freescale Semiconductor FUNCTIONAL DEVICE OPERATION LOGIC COMMANDS AND REGISTERS System Trim Register 3 (SYSTRIM3) Register Name and Address: IFBHSTRIM - $11 Bit7 6 5 4 3 2 1 Bit0 0 0 0 0 0 0 0 0 CRH S4 CRH S3 CRH S2 CRH S1 CRH S0 0 0 0 0 0 Read Write CRH CRH CRH BHC3 BHC2 S5 Reset 0 0 0 CRHBHC3:2 - Current Recopy HB3:4 Trim Bits These write only bits are for trimming the current recopy of the half-bridge HB3 and HB4 (CSA=0). The provided trim values have to be copied into these bits after every reset. Reset clears the CRHBHC3:2 bits. Table 20. Current Recopy Trim for HB3:4 (CSA=0) CRHBHC3 CRHBHC2 Adjustment 0 0 0 0 1 -10% 1 0 5% 1 1 10% CRHS5 CRHS4 CRHS3 Adjustment 0 1 0 -10% 0 1 1 -15% 1 0 0 reserved 1 0 1 5% 1 1 0 10% 1 1 1 15% CRHS2:0 - Current Recopy HS1 Trim Bits These write only bits are for trimming the current recopy of the high side HS1. The provided Trim values have to be copied into these bits after every reset. Reset clears the CRHS2:0 bits. Current Recopy Trim for HS1 CRHS2 CRHS1 CRHS0 Adjustment 0 0 0 0 0 0 1 -5% 0 1 0 -10% 0 1 1 -15% 1 0 0 reserved 1 0 1 5% 1 1 0 10% 1 1 1 15% CRHS5:3 - Current Recopy HS2:3 Trim Bits These write only bits are for trimming the current recopy of the high side HS2 and HS3. The provided trim values have to be copied into these bits after every reset. Reset clears the CRHS5:3 bits. Table 21. Current Recopy Trim for HS2:3 CRHS5 CRHS4 CRHS3 Adjustment 0 0 0 0 0 0 1 -5% 908E622 Analog Integrated Circuit Device Data Freescale Semiconductor 53 TYPICAL APPLICATIONS TYPICAL APPLICATIONS DEVELOPMENT SUPPORT As the 908E622 has the MC68HC908EY16 MCU embedded, typically all the development tools available for the MCU also apply for this device. However, due to the additional analog die circuitry and the nominal +12V supply voltage, some additional items have to be considered: • nominal 12V rather than 5V or 3V supply • high voltage VTST might be applied not only to IRQ pin, but IRQ_A pin • MCU monitoring (Normal request time-out) has to be disabled For a detailed information on the MCU related development support see the MC68HC908EY16 datasheet section development support. The programming is principally possible at two stages in the manufacturing process, first on chip level, before the IC is soldered onto a pcb board, and second after the IC is soldered onto the pcb board. Chip Level Programming At the Chip level, the easiest way is to only power the MCU with +5V (see Figure 32), and not to provide the analog chip with VSUP. In this setup, all the analog pins should be left open (e.g. VSUP[1:8]), and interconnections between the MCU and analog die have to be separated (e.g. IRQ - IRQ_A). This mode is well described in the MC68HC908EY16 datasheet - section development support. VSUP[1:8] VDD GND[1:4] VSS +5V VDDA/VREFH RST EVDD RST_A +5V 1 1µF + 4 C1- GND C2+ V+ + 5 RS232 DB-9 VCC + 3 1µF C1+ 100nF C2- MAX232 V- 7 T2OUT 3 8 R2IN +5V 1µF 9.8304MHz CLOCK 6 +5V + TESTMODE CLK PTB4/AD4 T2IN 10 6 3 2 10k PTC4/OSC1 1µF 74HC125 5 EVSS + 2 R2OUT 9 MM908E622 IRQ_A 15 4.7µF VSSA/VREFL 1µF 10k 74HC125 2 IRQ VTST 16 5 4 10k DATA PTA1/KBD1 PTA0/KBD0 10k PTB3/AD3 1 Figure 32. Normal Monitor Mode Circuit (MCU only) PCB Level Programming Of course its also possible to supply the whole system with Vsup instead (12V), as described in Figure 33, page 55. If the IC is soldered onto the pcb board, its typically not possible to separately power the MCU with +5V. The whole system has to be powered up and providing VSUP (see Figure 33). 908E622 54 Analog Integrated Circuit Device Data Freescale Semiconductor TYPICAL APPLICATIONS . VDD VSUP 47µF + 100nF VSUP[1:8] VDD GND[1:4] VSS VDDA/VREFH RST EVDD RST_A 100nF VDD 1 1µF VCC 16 + + 3 4 1µF C1+ VTST C1- GND C2+ V+ + 5 RS232 DB-9 C2- MAX232 7 T2OUT 3 8 R2IN VDD 1µF 10k 9.8304MHz CLOCK VDD TESTMODE CLK 10k PTC4/OSC1 1µF PTB4/AD4 10 6 74HC125 R2OUT 9 EVSS + 2 + T2IN MM908E622 IRQ_A 10k 74HC125 2 4.7µF VSSA/VREFL 1µF 15 6 V- IRQ 10k 5 DATA PTA1/KBD1 PTA0/KBD0 10k 4 PTB3/AD3 3 2 1 5 Figure 33. Normal Monitor Mode Circuit Table 22 summarizes the possible configurations and the necessary setups. Table 22. Monitor Mode Signal Requirements and Options Mode IRQ RST Normal Monitor Forced Monitor VTST VDD TEST MODE 1 X 1 $FFFF (blank) VDD VDD Reset Vector Serial Communication Mode Selection PTA0 PTA1 PTB3 PTB4 1 0 0 1 1 0 X VDD VDD 0 not $FFFF (not blank) X X X ICG COP OFF disabled disabled 9.8304 MHz 2.4576 MHz 9600 OFF disabled disabled 9.8304 MHz 2.4576 MHz 9600 ON disabled disabled — Nominal 1.6MHz Nominal 6300 ON enabled enabled — Nominal 1.6MHz Nominal 6300 X GND User Communication Speed Normal Request Bus Baud Time-out External Clock Frequency Rate X Notes 32. PTA0 must have a pullup resistor to VDD in monitor mode 33. 34. 35. 36. External clock is a 4.9152MHz, 9.8304MHz or 19.6608MHz canned oscillator on OCS1 Communication speed with external clock is depending on external clock value. Baud rate is bus frequency / 256 X = don’t care VTST is a high voltage VDD + 3.5V ≤ VTST ≤ VDD + 4.5V EMC/EMI RECOMMENDATIONS VSUP Pins (VSUP[1:8]) This paragraph gives some device specific recommendations to improve EMC/EMI performance. Further generic design recommendations can be e.g. found on the Freescale web site www.freescale.com. Its recommended to place a high quality ceramic decoupling capacitor close to the VSUP pins to improve EMC/EMI behavior. 908E622 Analog Integrated Circuit Device Data Freescale Semiconductor 55 TYPICAL APPLICATIONS LIN Pin For DPI (Direct Power Injection) and ESD (Electrostatic Discharge), it is recommended to place a high quality ceramic decoupling capacitor near the LIN pin. An additional varistor will further increase the immunity against ESD. A ferrite in the LIN line will suppress some of the noise induced. Voltage Regulator Output Pins (VDD and VSS) Use a high quality ceramic decoupling capacitor to stabilize the regulated voltage. MCU Digital Supply Pins (EVDD and EVSS) Fast signal transitions on MCU pins place high, shortduration current demands on the power supply. To prevent noise problems, take special care to provide power supply bypassing at the MCU. It is recommended that a high quality ceramic decoupling capacitor be placed between these pins. MCU Analog Supply Pins (VREFH/VDDA and VREFL/ VSSA) To avoid noise on the analog supply pins, its important to take special care on the layout. The MCU digital and analog supplies should be tied to the same potential via separate traces and connected to the voltage regulator output. Figure 34 and Figure 35 show the recommendations on schematics and layout level, and Table 23 indicates recommended external components and layout considerations. D1 VSUP[1:8] VSUP C1 + VDD C2 VSS VDDA/VREFH L1 LIN LIN EVDD V1 C5 C3 MM908E622 C4 EVSS GND[1:4] VSSA/VREFL Figure 34. EMC/EMI recommendations 908E622 56 Analog Integrated Circuit Device Data Freescale Semiconductor TYPICAL APPLICATIONS 1 54 2 53 3 52 4 51 5 50 49 VDDA/VREFH 48 8 EVDD 47 9 EVSS 46 10 VSSA/VREFL 45 11 44 12 LIN 43 VDD 42 908E622 16 GND1 39 38 17 18 VSUP1 19 GND2 VSUP8 37 36 VSUP7 20 21 41 40 15 VSUP2 35 34 23 VSUP6 32 24 VSUP5 31 GND3 GND4 30 VSUP3 VSUP4 25 29 26 D1 28 VBAT V1 27 GND 33 22 C1 14 VSS C2 C5 13 C4 7 C3 6 LIN L1 Figure 35. PCB Layout Recommendations . Table 23. Component Value Recommendation Component Recommended Value(37) D1 Comments / Signal routing reverse battery protection C1 Bulk Capacitor C2 100nF, SMD Ceramic, Low ESR Close to VSUP pins with good ground return C3 100nF, SMD Ceramic, Low ESR Close (<3mm) to digital supply pins (EVDD, EVSS) with good ground return. The positive analog (VREFH/ VDDA) and the digital (EVDD) supply should be connected right at the C3. C4 4,7uF, SMD Ceramic, Low ESR Bulk Capacitor C5 180pF, SMD Ceramic, Low ESR Close (<5mm) to LIN pin. Total Capacitance on LIN has to be below 220pF. (Ctotal = CLIN-Pin + C5 + CVaristor ~ 10pF + 180pF + 15pF) V1(38) (38) L1 Varistor Type TDK AVR-M1608C270MBAAB Optional (close to LIN connector) SMD Ferrite Bead Type TDK MMZ2012Y202B Optional, (close to LIN connector) Notes 37. Freescale does not assume liability, endorse, or want components from external manufactures that are referenced in circuit drawings or tables. While Freescale offers component recommendations in this configuration, it is the customer’s responsibility to validate their application. 38. Components are recommended to improve EMC and ESD performance. 908E622 Analog Integrated Circuit Device Data Freescale Semiconductor 57 PACKAGING PACKAGE DIMENSIONS PACKAGING PACKAGE DIMENSIONS Important For the most current revision of the package, visit www.freescale.com and do a keyword search on the 98A 908E622 58 Analog Integrated Circuit Device Data Freescale Semiconductor PACKAGING PACKAGE DIMENSIONS drawing number: 98ASA10712D. DWB SUFFIX 54-PIN SOICW-EP 98ASA10712D ISSUE 0 908E622 Analog Integrated Circuit Device Data Freescale Semiconductor 59 PACKAGING PACKAGE DIMENSIONS DWB SUFFIX 54-PIN SOICW-EP 98ASA10712D ISSUE 0 908E622 60 Analog Integrated Circuit Device Data Freescale Semiconductor PACKAGING PACKAGE DIMENSIONS DWB SUFFIX 54-PIN SOICW-EP 98ASA10712D ISSUE 0 908E622 Analog Integrated Circuit Device Data Freescale Semiconductor 61 ADDITIONAL INFORMATION THERMAL ADDENDUM ADDITIONAL INFORMATION THERMAL ADDENDUM INTEGRATED QUAD H-BRIDGE, TRIPLE HIGH-SIDE AND EC GLASS DRIVER WITH EMBEDDED MCU AND LIN FOR MIRROR Thermal Addendum Introduction This thermal addendum ia provided as a supplement to the MM908E622 technical data sheet. The addendum provides thermal performance information that may be critical in the design and development of system applications. All electrical, application and packaging information is provided in the data sheet. Package and Thermal Considerations This MM908E622 is a dual die package. There are two heat sources in the package independently heating with P1 and P2. This results in two junction temperatures, TJ1 and TJ2, and a thermal resistance matrix with RθJAmn. For m, n = 1, RθJA11 is the thermal resistance from Junction 1 to the reference temperature while only heat source 1 is heating with P1. For m = 1, n = 2, RθJA12 is the thermal resistance from Junction 1 to the reference temperature while heat source 2 is heating with P2. This applies to RθJ21 and RθJ22, respectively. TJ1 TJ2 = RθJA11 RθJA12 RθJA21 RθJA22 . P1 P2 The stated values are solely for a thermal performance comparison of one package to another in a standardized environment. This methodology is not meant to and will not predict the performance of a package in an applicationspecific environment. Stated values were obtained by measurement and simulation according to the standards listed below. 908E622 54-PIN SOICW-EP DWB SUFFIX 98ARL105910 54-PIN SOICW-EP Note For package dimensions, refer to the 908E622 device datasheet. Standards Table 24. Thermal Performance Comparison 1.0 1 = Power Chip, 2 = Logic Chip [°C/W] Thermal Resistance m = 1, n=1 m = 1, n = 2 m = 2, n = 1 m = 2, n=2 RθJAmn (1)(2) 23 20 24 RθJBmn (2)(3) 9.0 6.0 10 RθJAmn (1)(4) 52 47 52 RθJCmn (5) 1.0 0 2.0 Notes 1. Per JEDEC JESD51-2 at natural convection, still air condition. 2. 2s2p thermal test board per JEDEC JESD51-7and JESD51-5. 3. Per JEDEC JESD51-8, with the board temperature on the center trace near the power outputs. 4. Single layer thermal test board per JEDEC JESD51-3 and JESD51-5. 5. Thermal resistance between the die junction and the exposed pad, “infinite” heat sink attached to exposed pad. 1.0 0.2 0.2 * All measurements are in millimeters Soldermast openings Thermal vias connected to top buried plane 54 Terminal SOIC-EP 0.65 mm Pitch 17.9 mm x 7.5 mm Body 10.3 mm x 5.1 mm Exposed Pad Figure 36. Thermal Land Pattern for Direct Thermal Attachment Per JEDEC JESD51-5 908E622 62 Analog Integrated Circuit Device Data Freescale Semiconductor ADDITIONAL INFORMATION THERMAL ADDENDUM PTC4/OSC1 PTC3/OSC2 PTC2/MCLK PTB5/AD5 PTB4/AD4 PTB3/AD3 1 54 2 53 3 52 4 51 5 50 6 49 IRQ RST 7 48 8 47 (PTD0/TACH0/BEMF -> PWM) PTD1/TACH1 9 46 10 45 RST_A IRQ_A 11 44 LIN A0CST A0 GND1 HB4 VSUP1 GND2 HB3 VSUP2 EC ECR TESTMODE GND3 HB2 VSUP3 13 12 14 15 43 42 Exposed Pad 41 40 16 39 17 38 18 37 19 36 20 35 21 34 22 33 23 32 24 31 25 30 26 29 27 28 A PTA0/KBD0 PTA1/KBD1 PTA2/KBD2 FLSVPP PTA3/KBD3 PTA4/KBD4 VDDA/VREFH EVDD EVSS VSSA/VREFL (PTE1/RXD <- RXD) VSS VDD HVDD L0 H0 HS3 VSUP8 HS2 VSUP7 HS1b HS1a VSUP6 VSUP5 GND4 HB1 VSUP4 908E622 Pin Connections 54-Pin SOICW-EP 0.65 mm Pitch 17.9 mm x 7.5 mm Body 10.3 mm x 5.1 mm Exposed Pad Figure 37. Thermal Test Board Table 25. Thermal Resistance Performance Device on Thermal Test Board Material: RθJAmn Single layer printed circuit board FR4, 1.6 mm thickness Cu traces, 0.07 mm thickness Outline: 80 mm x 100 mm board area, including edge connector for thermal testing Area A: Cu heat-spreading areas on board surface Ambient Conditions: Natural convection, still air Table 25. Thermal Resistance Performance 1 = Power Chip, 2 = Logic Chip (°C/W) Thermal Resistance Area A (mm2) m = 1, n=1 m = 1, n = 2 m = 2, n = 1 RθJSmn 0 53 48 53 300 39 34 38 600 35 30 34 0 21 16 20 300 15 11 15 600 14 9.0 13 RθJA is the thermal resistance between die junction and ambient air. RθJSmn is the thermal resistance between die junction and the reference location on the board surface near a center lead of the package. This device is a dual die package. Index m indicates the die that is heated. Index n refers to the number of the die where the junction temperature is sensed. m = 2, n=2 908E622 Analog Integrated Circuit Device Data Freescale Semiconductor 63 ADDITIONAL INFORMATION THERMAL ADDENDUM Thermal Resistance [ºC/W] 60 50 40 30 20 x 10 0 RθJA11 RθJA22 RθJA12 = RθJA21 0 300 600 Heat spreading area A [mm²] Figure 38. Device on Thermal Test Board RθJA Thermal Resistance [ºC/W] 100 10 1 x 0.1 1.00E-03 1.00E-02 RθJA11 RθJA22 RθJA12 = RθJA21 1.00E-01 1.00E+00 1.00E+01 1.00E+02 1.00E+03 1.00E+04 Time[s] Figure 39. Transient Thermal Resistance RθJA (1.0 W Step Response) Device on Thermal Test Board Area A = 600 (mm2) 908E622 64 Analog Integrated Circuit Device Data Freescale Semiconductor REVISION HISTORY THERMAL ADDENDUM REVISION HISTORY REVISION 2.0 DATE 6/2008 DESCRIPTION OF CHANGES • • • • • • • Added Revision History Changed STOP Mode Total Output Current on page 9 from 850 to 1100μA Changed Sense Current Hysteresis on page 14 from 800 to 650μA Changed Normal Request Timeout on page 16 from 124 to 150ms Updated Freescale form and style to the current format Updated package drawing Added Functional Internal Block Description section 908E622 Analog Integrated Circuit Device Data Freescale Semiconductor 65 How to Reach Us: Home Page: www.freescale.com Web Support: http://www.freescale.com/support USA/Europe or Locations Not Listed: Freescale Semiconductor, Inc. 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