NTMFS4C028N Power MOSFET 30 V, 52 A, Single N−Channel, SO−8 FL Features • • • • Low RDS(on) to Minimize Conduction Losses Low Capacitance to Minimize Driver Losses Optimized Gate Charge to Minimize Switching Losses These Devices are Pb−Free, Halogen Free/BFR Free and are RoHS Compliant www.onsemi.com V(BR)DSS RDS(ON) MAX ID MAX 4.73 mW @ 10 V Applications 30 V • CPU Power Delivery • DC−DC Converters 52 A 7.0 mW @ 4.5 V D (5−8) MAXIMUM RATINGS (TJ = 25°C unless otherwise stated) Parameter Symbol Value Unit Drain−to−Source Voltage VDSS 30 V Gate−to−Source Voltage VGS ±20 V ID 16.4 A Continuous Drain Current RqJA (Note 1) TA = 25°C Power Dissipation RqJA (Note 1) TA = 25°C PD 2.51 W Continuous Drain Current RqJA ≤ 10 s (Note 1) TA = 25°C ID 25.3 A Power Dissipation RqJA ≤ 10 s (Note 1) Continuous Drain Current RqJA (Note 2) TA = 80°C TA = 25°C TA = 25°C S (1,2,3) 12.3 TA = 80°C Steady State N−CHANNEL MOSFET MARKING DIAGRAMS 19.0 PD ID TA = 80°C D 6.0 9.0 A 1 6.8 TA = 25°C PD 0.76 W Continuous Drain Current RqJC (Note 1) TC = 25°C ID 52 A Power Dissipation RqJC (Note 1) TC = 25°C PD 25.5 W TA = 25°C, tp = 10 ms IDM 146 A TC =80°C S SO−8 FLAT LEAD S CASE 488AA S STYLE 1 G W Power Dissipation RqJA (Note 2) Pulsed Drain Current G (4) 39 D 4C028 AYWZZ D D A Y W ZZ = Assembly Location = Year = Work Week = Lot Traceabililty ORDERING INFORMATION Current Limited by Package TA = 25°C IDmax 80 A TJ, TSTG −55 to +150 °C IS 23 A Drain to Source dV/dt dV/dt 7.0 V/ns Single Pulse Drain−to−Source Avalanche Energy (TJ = 25°C, VGS = 10 V, IL = 29 Apk, L = 0.1 mH, RGS = 25 W) (Note 3) EAS 42 mJ TL 260 °C Operating Junction and Storage Temperature Source Current (Body Diode) Lead Temperature for Soldering Purposes (1/8″ from case for 10 s) Package Shipping† NTMFS4C028NT1G SO−8 FL (Pb−Free) 1500 / Tape & Reel NTMFS4C028NT3G SO−8 FL (Pb−Free) 5000 / Tape & Reel Device †For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specifications Brochure, BRD8011/D. Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected. 1. Surface−mounted on FR4 board using 1 sq−in pad, 1 oz Cu. 2. Surface−mounted on FR4 board using the minimum recommended pad size. 3. Parts are 100% tested at TJ = 25°C, VGS = 10 V, IL = 20 Apk, EAS = 20 mJ. © Semiconductor Components Industries, LLC, 2016 August, 2016 − Rev. 1 1 Publication Order Number: NTMFS4C028N/D NTMFS4C028N THERMAL RESISTANCE MAXIMUM RATINGS Symbol Value Junction−to−Case (Drain) Parameter RqJC 4.9 Junction−to−Ambient – Steady State (Note 4) RqJA 49.8 Junction−to−Ambient – Steady State (Note 5) RqJA 164.6 Junction−to−Ambient – (t ≤ 10 s) (Note 4) RqJA 21.0 Unit °C/W 4. Surface−mounted on FR4 board using 1 sq−in pad, 1 oz Cu. 5. Surface−mounted on FR4 board using the minimum recommended pad size. ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise specified) Parameter Symbol Test Condition Min Typ Max Unit OFF CHARACTERISTICS Drain−to−Source Breakdown Voltage V(BR)DSS VGS = 0 V, ID = 250 mA 30 Drain−to−Source Breakdown Voltage (transient) V(BR)DSSt VGS = 0 V, ID(aval) = 8.4 A, Tcase = 25°C, ttransient = 100 ns 34 Drain−to−Source Breakdown Voltage Temperature Coefficient V(BR)DSS/ TJ Zero Gate Voltage Drain Current Gate−to−Source Leakage Current IDSS V V 14.4 VGS = 0 V, VDS = 24 V mV/°C TJ = 25°C 1.0 TJ = 125°C 10 IGSS VDS = 0 V, VGS = ±20 V VGS(TH) VGS = VDS, ID = 250 mA mA ±100 nA 2.1 V ON CHARACTERISTICS (Note 6) Gate Threshold Voltage Negative Threshold Temperature Coefficient Drain−to−Source On Resistance 1.3 VGS(TH)/TJ RDS(on) 4.8 mV/°C VGS = 10 V ID = 30 A 3.9 4.73 VGS = 4.5 V ID = 18 A 5.8 7.0 Forward Transconductance gFS VDS = 1.5 V, ID = 15 A Gate Resistance RG TA = 25°C 50 0.3 1.0 mW S 2.0 W CHARGES AND CAPACITANCES Input Capacitance CISS Output Capacitance COSS Reverse Transfer Capacitance CRSS 1252 VGS = 0 V, f = 1 MHz, VDS = 15 V 610 pF 126 Capacitance Ratio CRSS/CISS Total Gate Charge QG(TOT) 10.9 Threshold Gate Charge QG(TH) 1.9 Gate−to−Source Charge QGS Gate−to−Drain Charge QGD 5.4 Gate Plateau Voltage VGP 3.1 V 22.2 nC Total Gate Charge VGS = 0 V, VDS = 15 V, f = 1 MHz VGS = 4.5 V, VDS = 15 V; ID = 30 A QG(TOT) VGS = 10 V, VDS = 15 V; ID = 30 A 0.101 3.4 nC SWITCHING CHARACTERISTICS (Note 7) Turn−On Delay Time Rise Time Turn−Off Delay Time Fall Time td(ON) tr td(OFF) 10 VGS = 4.5 V, VDS = 15 V, ID = 15 A, RG = 3.0 W tf 32 16 6.0 6. Pulse Test: pulse width v 300 ms, duty cycle v 2%. 7. Switching characteristics are independent of operating junction temperatures. www.onsemi.com 2 ns NTMFS4C028N ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise specified) Parameter Symbol Test Condition Min Typ Max Unit SWITCHING CHARACTERISTICS (Note 7) Turn−On Delay Time Rise Time Turn−Off Delay Time Fall Time td(ON) tr td(OFF) 7.0 VGS = 10 V, VDS = 15 V, ID = 15 A, RG = 3.0 W tf 28 ns 20 4.0 DRAIN−SOURCE DIODE CHARACTERISTICS Forward Diode Voltage Reverse Recovery Time VSD TJ = 25°C 0.79 TJ = 125°C 0.65 tRR Charge Time ta Discharge Time tb Reverse Recovery Charge VGS = 0 V, IS = 10 A 1.1 V 31 VGS = 0 V, dIS/dt = 100 A/ms, IS = 30 A QRR 15 16 15 6. Pulse Test: pulse width v 300 ms, duty cycle v 2%. 7. Switching characteristics are independent of operating junction temperatures. www.onsemi.com 3 ns nC NTMFS4C028N TYPICAL CHARACTERISTICS 100 4.5 V to 10 V 100 4.0 V 90 TJ = 25°C 90 3.8 V ID, DRAIN CURRENT (A) ID, DRAIN CURRENT (A) 80 70 3.6 V 60 3.4 V 50 40 3.2 V 30 3.0 V 20 2.8 V VGS = 2.6 V 10 70 60 50 40 30 20 TJ = 125°C 1 2 3 4 0 5 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0 5.5 VGS, GATE−TO−SOURCE VOLTAGE (V) Figure 1. On−Region Characteristics Figure 2. Transfer Characteristics RDS(on), DRAIN−TO−SOURCE RESISTANCE (W) VDS, DRAIN−TO−SOURCE VOLTAGE (V) 0.026 0.024 0.022 ID = 30 A 0.020 0.018 0.016 0.014 0.012 0.010 0.008 0.006 0.004 0.002 3 TJ = −55°C TJ = 25°C 0 0 RDS(on), DRAIN−TO−SOURCE RESISTANCE (W) 80 10 0 4 5 6 7 8 9 10 0.009 0.008 TJ = 25°C VGS = 4.5 V 0.007 0.006 0.005 VGS = 10 V 0.004 0.003 10 20 30 40 50 60 70 VGS, GATE VOLTAGE (V) ID, DRAIN CURRENT (A) Figure 3. On−Resistance vs. Gate−to−Source Voltage Figure 4. On−Resistance vs. Drain Current and Gate Voltage 1600 1.7 1.6 1.5 VGS = 10 V ID = 30 A 1400 C, CAPACITANCE (pF) RDS(on), NORMALIZED DRAIN−TO− SOURCE RESISTANCE (W) VDS = 5 V 1.4 1.3 1.2 1.1 1.0 0.9 0.8 0.7 −50 VGS = 0 V TJ = 25°C Ciss 1200 1000 Coss 800 600 400 Crss 200 0 −25 0 25 50 75 100 125 150 0 5 10 15 20 25 TJ, JUNCTION TEMPERATURE (°C) VDS, DRAIN−TO−SOURCE VOLTAGE (V) Figure 5. On−Resistance Variation with Temperature Figure 6. Capacitance Variation www.onsemi.com 4 30 NTMFS4C028N 1000 10 VGS = 10 V VDD = 15 V ID = 15 A QT 8 t, TIME (ns) VGS, GATE−TO−SOURCE VOLTAGE (V) TYPICAL CHARACTERISTICS 6 QGD QGS 4 VGS = 10 V VDD = 15 V ID = 30 A TJ = 25°C 2 0 2 4 6 8 10 12 14 16 18 10 td(on) 1 22 24 20 10 100 QG, TOTAL GATE CHARGE (nC) RG, GATE RESISTANCE (W) Figure 7. Gate−to−Source and Drain−to−Source Voltage vs. Total Charge Figure 8. Resistive Switching Time Variation vs. Gate Resistance 20 1000 18 0 V < VGS < 10 V VGS = 0 V 16 ID, DRAIN CURRENT (A) IS, SOURCE CURRENT (A) td(off) tf tr 1 0 14 TJ = 25°C TJ = 125°C 12 10 8 6 4 2 0 100 10 ms 100 ms 10 1 ms 10 ms 1 RDS(on) Limit Thermal Limit Package Limit 0.1 dc 0.01 0.4 0.5 0.6 0.7 0.8 0.9 1.0 0.01 0.1 1 10 100 VSD, SOURCE−TO−DRAIN VOLTAGE (V) VDS, DRAIN−TO−SOURCE VOLTAGE (V) Figure 9. Diode Forward Voltage vs. Current Figure 10. Maximum Rated Forward Biased Safe Operating Area 80 20 18 ID = 20 A 70 16 60 14 50 12 GFS (S) EAS, SINGLE PULSE DRAIN−TO− SOURCE AVALANCHE ENERGY (mJ) 100 10 8 40 30 6 20 4 10 2 0 0 25 50 75 100 125 150 0 5 10 15 20 25 30 35 TJ, STARTING JUNCTION TEMPERATURE (°C) ID (A) Figure 11. Maximum Avalanche Energy vs. Starting Junction Temperature Figure 12. GFS vs. ID www.onsemi.com 5 40 45 50 NTMFS4C028N TYPICAL CHARACTERISTICS ID, DRAIN CURRENT (A) 100 10 1 1.E−08 1.E−07 1.E−06 1.E−05 1.E−04 1.E−03 PULSE WIDTH (sec) Figure 13. Avalanche Characteristics 100 Duty Cycle = 0.5 R(t) (°C/W) 10 1 0.2 0.1 0.05 0.02 0.01 0.1 Single Pulse 0.01 0.000001 0.00001 0.0001 0.001 0.1 0.01 PULSE TIME (sec) Figure 14. Thermal Response www.onsemi.com 6 1 10 100 1000 NTMFS4C028N PACKAGE DIMENSIONS DFN5 5x6, 1.27P (SO−8FL) CASE 488AA ISSUE M 2X NOTES: 1. DIMENSIONING AND TOLERANCING PER ASME Y14.5M, 1994. 2. CONTROLLING DIMENSION: MILLIMETER. 3. DIMENSION D1 AND E1 DO NOT INCLUDE MOLD FLASH PROTRUSIONS OR GATE BURRS. 0.20 C D A 2 B D1 2X 0.20 C 4X E1 q E 2 c 1 2 3 DIM A A1 b c D D1 D2 E E1 E2 e G K L L1 M q A1 4 TOP VIEW C SEATING PLANE DETAIL A 0.10 C A 0.10 C SIDE VIEW DETAIL A STYLE 1: PIN 1. SOURCE 2. SOURCE 3. SOURCE 4. GATE 5. DRAIN RECOMMENDED SOLDERING FOOTPRINT* 2X 0.495 0.10 b C A B 0.05 c MILLIMETERS MIN NOM MAX 1.10 0.90 1.00 0.00 −−− 0.05 0.33 0.41 0.51 0.23 0.28 0.33 5.00 5.30 5.15 4.70 4.90 5.10 3.80 4.00 4.20 6.00 6.30 6.15 5.70 5.90 6.10 3.45 3.65 3.85 1.27 BSC 0.51 0.575 0.71 1.20 1.35 1.50 0.51 0.575 0.71 0.125 REF 3.00 3.40 3.80 0_ −−− 12 _ 4.560 8X 2X 1.530 e/2 e L 1 4 3.200 K 4.530 E2 PIN 5 (EXPOSED PAD) L1 M 1.330 2X 0.905 1 G 0.965 D2 4X 1.000 4X 0.750 BOTTOM VIEW 1.270 PITCH DIMENSIONS: MILLIMETERS *For additional information on our Pb−Free strategy and soldering details, please download the ON Semiconductor Soldering and Mounting Techniques Reference Manual, SOLDERRM/D. ON Semiconductor and are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries. ON Semiconductor owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. 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