AD ADCLK846BCPZ 1.8 v, 6 lvds/12 cmos outputs low power clock fanout buffer Datasheet

1.8 V, 6 LVDS/12 CMOS Outputs
Low Power Clock Fanout Buffer
ADCLK846
FEATURES
FUNCTIONAL BLOCK DIAGRAM
ADCLK846
LVDS/CMOS
OUT0 (OUT0A)
OUT0 (OUT0B)
VREF
OUT1 (OUT1A)
CLK
OUT1 (OUT1B)
CLK
CTRL_A
LVDS/CMOS
OUT2 (OUT2A)
OUT2 (OUT2B)
OUT3 (OUT3A)
APPLICATIONS
Low jitter clock distribution
Clock and data signal restoration
Level translation
Wireless communications
Wired communications
Medical and industrial imaging
ATE and high performance instrumentation
OUT3 (OUT3B)
OUT4 (OUT4A)
OUT4 (OUT4B)
CTRL_B
SLEEP
OUT5 (OUT5A)
OUT5 (OUT5B)
07226-001
Selectable LVDS/CMOS outputs
Up to 6 LVDS (1.2 GHz) or 12 CMOS (250 MHz) outputs
<16 mW per channel (100 MHz operation)
54 fs integrated jitter (12 kHz to 20 MHz)
100 fs additive broadband jitter
2.0 ns propagation delay (LVDS)
135 ps output rise/fall (LVDS)
65 ps output-to-output skew (LVDS)
Sleep mode
Pin-programmable control
1.8 V power supply
Figure 1.
GENERAL DESCRIPTION
The ADCLK846 is a 1.2 GHz/250 MHz, LVDS/CMOS, fanout
buffer optimized for low jitter and low power operation. Possible
configurations range from 6 LVDS to 12 CMOS outputs,
including combinations of LVDS and CMOS outputs. Two
control lines are used to determine whether fixed blocks of
outputs are LVDS or CMOS outputs.
The clock input accepts various types of single-ended and
differential logic levels including LVPECL, LVDS, HSTL, CML,
and CMOS.
Table 8 provides interface options for each type of connection.
The SLEEP pin enables a sleep mode to power down the device.
This device is available in a 24-pin LFCSP package. It is specified
for operation over the standard industrial temperature range of
−40°C to +85°C.
Rev. A
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other
rights of third parties that may result from its use. Specifications subject to change without notice. No
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Fax: 781.461.3113
©2009 Analog Devices, Inc. All rights reserved.
ADCLK846
TABLE OF CONTENTS
Features .............................................................................................. 1
Typical Performance Characteristics ..............................................8
Applications ....................................................................................... 1
Functional Description .................................................................. 11
Functional Block Diagram .............................................................. 1
Clock Inputs ................................................................................ 11
General Description ......................................................................... 1
AC-Coupled Applications ......................................................... 11
Revision History ............................................................................... 2
Clock Outputs ............................................................................. 12
Specifications..................................................................................... 3
Control and Function Pins........................................................ 12
Electrical Characteristics ............................................................. 3
Power Supply............................................................................... 12
Timing Characteristics ................................................................ 4
Applications Information .............................................................. 13
Clock Characteristics ................................................................... 5
Logic and Power Characteristics ................................................ 5
Using the ADCLK846 Outputs for ADC Clock
Applications ................................................................................ 13
Absolute Maximum Ratings............................................................ 6
LVDS Clock Distribution .......................................................... 13
Determining Junction Temperature .......................................... 6
CMOS Clock Distribution ........................................................ 13
ESD Caution .................................................................................. 6
Input Termination Options ....................................................... 14
Thermal Performance .................................................................. 6
Outline Dimensions ....................................................................... 15
Pin Configuration and Function Descriptions ............................. 7
Ordering Guide .......................................................................... 15
REVISION HISTORY
6/09—Rev. 0 to Rev. A
No Content Updates ...................................................... Throughout
4/09—Revision 0: Initial Version
Rev. A | Page 2 of 16
ADCLK846
SPECIFICATIONS
ELECTRICAL CHARACTERISTICS
Typical values are given for VS = 1.8 V and TA = 25°C, unless otherwise noted. Minimum and maximum values are given over the full
VS = 1.8 V ± 5% and TA = −40°C to +85°C variations, unless otherwise noted. Input slew rate > 1 V/ns, unless otherwise noted.
Table 1.
Parameter
CLOCK INPUTS
Input Frequency
Input Sensitivity, Differential
Symbol
Min
Typ
0
Input Voltage Offset
Input Sensitivity, Single-Ended
Input Resistance (Differential)
Input Capacitance
Input Bias Current (Each Pin)
LVDS CLOCK OUTPUTS
Output Frequency
Differential Output Voltage
Offset Voltage
Short-Circuit Current
Unit
1200
MHz
mV p-p
150
Input Level
Input Common-Mode Voltage
Input Common-Mode Range
Max
VCM
VCMR
VS/2 − 0.1
0.4
V p-p
VS/2 + 0.05
VS − 0.4
V
V
+350
mV
mV p-p
kΩ
pF
μA
1200
454
50
1.375
50
6
MHz
mV
mV
V
mV
mA
30
150
7
2
CIN
−350
VOD
ΔVOD
VOS
ΔVOS
ISA, ISB
1.8
247
344
1.125
1.25
3
CMOS CLOCK OUTPUTS
Output Frequency
Output Voltage High
VOH
Output Voltage Low
VOL
Reference Voltage
Output Voltage
Output Resistance
Output Current
VREF
250
MHz
0.1
0.35
V
V
V
V
VS − 0.1
VS − 0.35
VS/2 − 0.1
VS/2
60
VS/2 + 0.1
500
Rev. A | Page 3 of 16
V
Ω
μA
Conditions
Differential input
Jitter performance is improved with higher slew
rates (greater voltage swing)
Larger voltage swings can turn on the protection
diodes and can degrade jitter performance
Inputs are self-biased; enables ac coupling
Inputs are dc-coupled with 200 mV p-p signal
applied
CLK ac-coupled; CLK ac-bypassed to ground
Full input swing
Termination = 100 Ω; differential (OUTx, OUTx)
See Figure 9 for a swing vs. frequency plot
Each pin (output shorted to GND )
Single-ended; termination = open
OUTx and OUTx in phase
With 10 pF load each output; see Figure 16 for
swing vs. frequency
At 1 mA load
At 10 mA load
At 1 mA load
At 10 mA load
±500 μA
ADCLK846
TIMING CHARACTERISTICS
Table 2.
Parameter
LVDS OUTPUTS
Output Rise/Fall Time
Propagation Delay, CLK-to-LVDS Output
Temperature Coefficient
Output Skew 1
All LVDS Outputs on the Same Part
All LVDS Outputs Across Multiple Parts
Additive Time Jitter
Integrated Random Jitter
Symbol
Min
Typ
Max
Unit
tR, tF
tPD
1.5
135
2.0
2.0
235
2.7
ps
ns
ps/°C
65
390
ps
ps
54
74
86
150
260
Broadband Random Jitter 2
Crosstalk-Induced Jitter
CMOS OUTPUTS
Output Rise/Fall Time
Propagation Delay, CLK-to-CMOS Output
Temperature Coefficient
Output Skew2
All CMOS Outputs on the Same Part
All CMOS Outputs Across Multiple Parts
Additive Time Jitter
Integrated Random Jitter
Broadband Random Jitter 3
Crosstalk-Induced Jitter
LVDS-TO-CMOS OUTPUT SKEW2
LVDS Output(s) and CMOS Output(s)
on the Same Part
1
2
3
tR, tF
tPD
2.5
525
3.2
2.2
fs rms
fs rms
fs rms
fs rms
fs rms
950
4.2
ps
ns
ps/°C
175
640
ps
ps
56
100
260
0.8
1.6
Conditions
Termination = 100 Ω differential; 3.5 mA
20% to 80% measured differentially
VICM = VREF, VID = 0.5 V
BW = 12 kHz to 20 MHz, CLK = 1000 MHz
BW = 50 kHz to 80 MHz, CLK = 1000 MHz
BW = 12 kHz to 20 MHz, CLK = 1000 MHz
Input slew rate = 1 V/ns
Calculated from spur energy with an interferer
10 MHz offset from carrier
Termination = open
20% to 80%; CMOS load = 10 pF
10 pF load
fs rms
fs rms
fs rms
BW = 12 kHz to 20 MHz, CLK = 200 MHz
Input slew = 2 V/ns; see Figure 11
Calculated from spur energy with an interferer
10 MHz offset from carrier
ns
CMOS load = 10 pF and LVDS load = 100 Ω
This is the difference between any two similar delay paths while operating at the same voltage and temperature.
Measured at rising edge of clock signal.
Calculated from SNR of ADC method.
Rev. A | Page 4 of 16
ADCLK846
CLOCK CHARACTERISTICS
Table 3. Clock Output Phase Noise
Parameter
CLK-TO-LVDS ABSOLUTE PHASE NOISE
1000 MHz
Min
CLK-TO-CMOS ABSOLUTE PHASE NOISE
200 MHz
Typ
Max
Unit
−90
−108
−117
−126
−134
−141
−146
dBc/Hz
dBc/Hz
dBc/Hz
dBc/Hz
dBc/Hz
dBc/Hz
dBc/Hz
−100
−117
−128
−138
−147
−153
−156
dBc/Hz
dBc/Hz
dBc/Hz
dBc/Hz
dBc/Hz
dBc/Hz
dBc/Hz
Conditions
Input slew rate > 1 V/ns
At 10 Hz offset
At 100 Hz offset
At 1 kHz offset
At 10 kHz offset
At 100 kHz offset
At 1 MHz offset
At 10 MHz offset
Input slew rate > 1 V/ns
At 10 Hz offset
At 100 Hz offset
At 1 kHz offset
At 10 kHz offset
At 100 kHz offset
At 1 MHz offset
At 10 MHz offset
LOGIC AND POWER CHARACTERISTICS
Table 4. Control Pin Characteristics
Parameter
CONTROL PINS
(CTRL_A, CTRL_B, SLEEP) 1
Logic 1 Voltage
Logic 0 Voltage
Logic 1 Current
Logic 0 Current
Capacitance
POWER
Supply Voltage Requirement
LVDS Outputs, Full Operation
LVDS at 100 MHz
LVDS at 1200 MHz
CMOS Outputs, Full Operation
CMOS at 100 MHz
Symbol
Min
VIH
VIL
IIH
IIL
VS − 0.4
5
−5
Typ
Max
Unit
8
0.4
20
+5
V
V
μA
μA
pF
1.8
1.89
V
VS = 1.8 V ± 5%
55
110
70
130
mA
mA
All outputs enabled as LVDS and loaded, RL = 100 Ω
All outputs enabled as LVDS and loaded, RL = 100 Ω
75
95
mA
155
190
mA
3
mA
All outputs enabled as CMOS and loaded,
CMOS load = 10 pF
All outputs enabled as CMOS and loaded,
CMOS load = 10 pF
SLEEP pin pulled high; does not include power
dissipated in external resistors
2
VS
CMOS at 250 MHz
1.71
Sleep
Power Supply Rejection 2
LVDS
CMOS
PSRTPD
PSRTPD
1
These pins each have a 200 kΩ internal pull-down resistor.
2
Change in TPD per change in VS.
0.9
1.2
ps/mV
ps/mV
Rev. A | Page 5 of 16
Conditions
ADCLK846
ABSOLUTE MAXIMUM RATINGS
DETERMINING JUNCTION TEMPERATURE
Table 5.
Parameter
Supply Voltage
VS to GND
Inputs
CLK and CLK
CMOS Inputs
Outputs
Maximum Voltage
Voltage Reference Voltage (VREF)
Operating Temperature Range
Ambient
Junction
Storage Temperature Range
To determine the junction temperature on the application PCB,
use the following formula:
Rating
TJ = TCASE + (ΨJT × PD)
2V
where:
TJ is the junction temperature (°C).
TCASE is the case temperature (°C) measured by the customer at
top center of the package.
ΨJT is indicated in Table 6.
PD is the power dissipation.
−0.3 V to +2 V
−0.3 V to +2 V
−0.3 V to +2 V
−0.3 V to +2 V
Values of θJA are provided for package comparison and PCB
design considerations. θJA can be used for a first-order
approximation of TJ by the equation
−40°C to +85°C
150°C
−65°C to +150°C
TJ = TA + (θJA × PD)
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
where TA is the ambient temperature (°C).
Values of θJB are provided for package comparison and PCB
design considerations.
ESD CAUTION
THERMAL PERFORMANCE
Table 6.
Parameter
Junction-to-Ambient Thermal Resistance
Still Air
0.0 m/sec Airflow
Moving Air
1.0 m/sec Airflow
2.5 m/sec Airflow
Junction-to-Board Thermal Resistance
Moving Air
1.0 m/sec Airflow
Junction-to-Case Thermal Resistance
Moving Air
Die-to-Heat Sink
Junction-to-Top-of-Package Characterization Parameter
Still Air
0 m/sec Airflow
1
Symbol
Description
Value 1
Unit
57.0
°C/W
49.8
44.7
°C/W
°C/W
35.2
°C/W
2.0
°C/W
1.0
°C/W
θJA
Per JEDEC JESD51-2
θJMA
Per JEDEC JESD51-6
θJB
Per JEDEC JESD51-8
θJC
Per MIL-STD 883, Method 1012.1
ΨJT
Per JEDEC JESD51-2
Results are from simulations. The PCB is a JEDEC multilayer type. Thermal performance for actual applications requires careful inspection of the conditions in the
application to determine if they are similar to those assumed in these calculations.
Rev. A | Page 6 of 16
ADCLK846
24
23
22
21
20
19
OUT0 (OUT0A)
OUT0 (OUT0B)
VS
OUT1 (OUT1A)
OUT1 (OUT1B)
VS
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS
PIN 1
INDICATOR
ADCLK846
TOP VIEW
(Not to Scale)
18
17
16
15
14
13
OUT2 (OUT2A)
OUT2 (OUT2B)
VS
OUT3 (OUT3A)
OUT3 (OUT3B)
VS
NOTES:
1. EXPOSED PADDLE MUST BE CONNECTED TO GND.
07226-002
1
2
3
4
5
6
SLEEP 7
OUT5 (OUT5B) 8
OUT5 (OUT5A) 9
VS 10
OUT4 (OUT4B) 11
OUT4 (OUT4A) 12
VREF
CLK
CLK
VS
CTRL_A
CTRL_B
Figure 2. Pin Configuration
Table 7. Pin Function Descriptions
Pin No.
1
2
3
4, 10, 13, 16, 19, 22
5
6
7
8
9
11
12
14
15
17
18
20
21
23
24
(25)
Mnemonic
VREF
CLK
CLK
VS
CTRL_A
CTRL_B
SLEEP
OUT5 (OUT5B)
OUT5 (OUT5A)
OUT4 (OUT4B)
OUT4 (OUT4A)
OUT3 (OUT3B)
OUT3 (OUT3A)
OUT2 (OUT2B)
OUT2 (OUT2A)
OUT1 (OUT1B)
OUT1 (OUT1A)
OUT0 (OUT0B)
OUT0 (OUT0A)
EPAD
Description
Reference Voltage.
Clock Input (Negative).
Clock Input (Positive).
Supply Voltage.
CMOS Input Control for Output 1 to Output 0. (0: LVDS, 1: CMOS.)
CMOS Input Control for Output 5 to Output 2. (0: LVDS, 1: CMOS.)
CMOS Input for Sleep Mode. (0: normal operation, 1: sleep.)
Complementary Side of Differential LVDS Output 5, or CMOS Output 5 on Channel B.
True Side of Differential LVDS Output 5, or CMOS Output 5 on Channel A.
Complementary Side of Differential LVDS Output 4, or CMOS Output 4 on Channel B.
True Side of Differential LVDS Output 4, or CMOS Output 4 on Channel A.
Complementary Side of Differential LVDS Output 3, or CMOS Output 3 on Channel B.
True Side of Differential LVDS Output 3, or CMOS Output 3 on Channel A.
Complementary Side of Differential LVDS Output 2, or CMOS Output 2 on Channel B.
True Side of Differential LVDS Output 2, or CMOS Output 2 on Channel A.
Complementary Side of Differential LVDS Output 1, or CMOS Output 1 on Channel B.
True Side of Differential LVDS Output 1, or CMOS Output 1 on Channel A.
Complementary Side of Differential LVDS Output 0, or CMOS Output 0 on Channel B.
True Side of Differential LVDS Output 0, or CMOS Output 0 on Channel A.
Exposed Paddle. The exposed paddle must be connected to ground.
Rev. A | Page 7 of 16
ADCLK846
TYPICAL PERFORMANCE CHARACTERISTICS
VS = 1.8 V, TA = 25°C, unless otherwise noted.
2
M 200ps 10.0GS/s
CH1
–36.0mV
CH2 100mV
Figure 3. LVDS Output Waveform at 1200 MHz
M 1.0ns 10.0GS/s
CH1
–36.0mV
07226-006
CH2 100mV
07226-003
2
Figure 6. LVDS Output Waveform at 200 MHz
2.3
2.4
2.3
PROPAGATION DELAY (ns)
PROPATATION DELAY (ns)
2.2
2.1
2.0
1.9
1.8
2.2
2.1
2.0
1.9
1.8
1.7
1.6
0.3
0.5
0.7
0.9
1.1
1.3
1.5
1.7
INPUT DIFFERENTIAL (V p-p)
1.4
200
07226-004
1.7
0.1
800
1000
1200
1400
1600
Figure 7. LVDS Propagation Delay vs. VCM
715
DIFFERENTIAL OUTPUT SWING (mV p-p)
54
53
52
51
50
49
48
47
0
200
400
600
800
1000
FREQUENCY (MHz)
1200
07226-105
46
705
695
685
675
1.62
1.72
1.82
1.92
POWER SUPPLY (V)
Figure 8. LVDS Output Swing vs. Power Supply Voltage
Figure 5. LVDS Output Duty Cycle vs. Frequency
Rev. A | Page 8 of 16
07226-014
55
DUTY CYCLE (%)
600
INPUT COMMON-MODE (mV)
Figure 4. LVDS Propagation Delay vs. VID
45
400
07226-007
1.5
ADCLK846
–80
ABSOLUTE PHASE NOISE MEASURED @ 1GHz WITH AGILENT
E5052 USING WENZEL CLOCK SOURCE CONSISTING OF A
WENZEL 100MHz CRYSTAL OSCILLATOR (P/N 500-06672),
WENZEL 5× MULTIPLIER (P/N LNOM-100-5-13-14-F-A), AND A
WENZEL 2× MULTIPLIER (P/N LNDD-500-14-14-1-D).
–90
800
PHASE NOISE (dBc/Hz)
–100
700
600
500
–110
–120
ADCLK846
–130
–140
CLOCK SOURCE
–150
–160
100
1k
10k
100k
Figure 9. LVDS Differential Output Swing vs. Input Frequency
10M
100M
Figure 12. Absolute Phase Noise LVDS at 1000 MHz
150
200
125
BOTH BANKS CMOS
150
100
CURRENT (mA)
CURRENT (mA)
1M
FREQUENCY OFFSET (Hz)
07226-112
1700
INPUT FREQUENCY (MHz)
–180
10
07226-009
1600
1500
1400
1300
1200
1100
900
1000
800
700
600
500
400
100
300
–170
400
200
DIFFERENTIAL OUTPUT SWING (mV p-p)
900
75
50
BANK A CMOS,
BANK B LVDS
100
50
200
400
600
800
1000
1200
1400
1600
1800
FREQUENCY (MHz)
0
25
54
400
53
350
52
DUTY CYCLE (%)
450
300
250
200
47
50
46
2.0
INPUT SLEW RATE (V/ns)
2.5
175
200
225
250
49
100
1.5
150
50
48
1.0
125
51
150
07226-011
JITTER (fS rms)
55
0.5
100
Figure 13. LVDS/CMOS Current vs. Frequency with Various Logic
Combinations
500
0
75
FREQUENCY (MHz)
Figure 10. LVDS Current vs. Frequency, All Banks Set to LVDS
0
50
45
0
50
100
150
200
250
FREQUENCY (MHz)
Figure 14. CMOS Output Duty Cycle vs. Frequency, 10 pF Load
Figure 11. Additive Broadband Jitter vs. Input Slew Rate
Rev. A | Page 9 of 16
07226-114
0
07226-110
0
BOTH BANKS LVDS
07226-113
BANK A LVDS,
BANK B CMOS
25
ADCLK846
CH1 300mV
1.25ns/DIV
CH1
954mV
CH1 300mV
Figure 15. CMOS Output Waveform at 200 MHz, 10 pF Load
5.0ns/DIV
954mV
Figure 18. CMOS Output Waveform at 50 MHz, 10 pF Load
1.8
1.9
1.8
RL = 750Ω
25°C
RL = 1kΩ
1.7
OUTPUT SWING (V)
1.7
OUTPUT SWING (V)
CH1
07226-018
1
07226-115
1
1.6
85°C
1.5
1.4
1.6
RL = 500Ω
RL = 300Ω
1.5
1.3
100
150
200
250
FREQUENCY (MHz)
Figure 16. CMOS Output Swing vs. Frequency and Temperature, 10 pF Load
2.0
1.9
CL = 5pF
1.7
CL = 10pF
1.6
1.5
CL = 20pF
1.4
1.3
1.2
1.1
1.0
0
50
100
150
200
250
FREQUENCY (MHz)
07226-017
OUTPUT SWING (V)
1.8
Figure 17. CMOS Output Swing vs. Frequency and Capacitive Load
Rev. A | Page 10 of 16
1.4
0
50
100
150
200
250
FREQUENCY (MHz)
Figure 19. CMOS Output Swing vs. Frequency and Resistive Load
07226-015
1.1
50
07226-116
1.2
ADCLK846
FUNCTIONAL DESCRIPTION
VS
9kΩ
9.5kΩ
9kΩ
8.5kΩ
CLK
CLK
GND
07226-023
The ADCLK846 clock input is distributed to all output channels.
Each channel bank is pin programmable for either LVDS or
CMOS levels. This allows the selection of multiple logic
configurations ranging from 6 LVDS to 12 CMOS outputs,
along with other combinations using both types of logic.
Figure 20. ADCLK846 Input Stage
CLOCK INPUTS
The differential inputs of the ADCLK846 are internally selfbiased. The clock inputs have a resistor divider, which sets the
common-mode level for the inputs. The complementary inputs
are biased about 30 mV lower than the true input to avoid
oscillations if the input signal ceases. See Figure 20 for
the equivalent input circuit.
AC-COUPLED APPLICATIONS
The inputs can be ac-coupled or dc-coupled. Table 8 displays
a guide for input logic compatibility. If a single-ended input is
desired, this can be accommodated by ac or dc coupling to one
side of the differential input. Bypass the other input to ground
by a capacitor.
The second option allows the use of the VREF pin to set the dc
bias level for the ADCLK846. The VREF pin can be connected
to CLK and CLK through resistors. This method allows lower
impedance termination of signals at the ADCLK846 (see
Figure 32).
Note that jitter performance degrades with low input slew rate,
as shown in Figure 11. See Figure 28 through Figure 32 for
different termination schemes.
The internal bias resistors are still in parallel with the external
biasing. However, the relatively high impedance of the internal
resistors allows the external termination to VREF to dominate.
This is also useful if it is not desirable to offset the inputs slightly
as previously mentioned using only the internal biasing.
When ac coupling is desired, the ADCLK846 offers two
options. The first option requires no external components
(excluding the dc blocking capacitor); it allows the user to
couple the reference signal onto the clock input pins (see
Figure 31).
Table 8. Input Logic Compatibility
Supply (V)
3.3
2.5
1.8
3.3
2.5
1.8
1.5
3.3
2.5
1.8
Logic
CML
CML
CML
CMOS
CMOS
CMOS
HSTL
LVDS
LVPECL
LVPECL
LVPECL
Common Mode (V)
2.9
2.1
1.4
1.65
1.25
0.9
0.75
1.25
2.0
1.2
0.5
Output Swing (V)
0.8
0.8
0.8
3.3
2.5
1.8
0.75
0.4
0.8
0.8
0.8
Rev. A | Page 11 of 16
AC-Coupled
Yes
Yes
Yes
Not allowed
Not allowed
Yes
Yes
Yes
Yes
Yes
Yes
DC-Coupled
Not allowed
Not allowed
Yes
Not allowed
Not allowed
Yes
Yes
Yes
Not allowed
Yes
Yes
ADCLK846
CLOCK OUTPUTS
POWER SUPPLY
Each driver consists of a differential LVDS output or two singleended CMOS outputs (always in phase). When the LVDS driver
is enabled, the corresponding CMOS driver is in tristate. When
the CMOS driver is enabled, the corresponding LVDS driver is
powered down and tristated. Figure 21 and Figure 22 display
the equivalent output stage.
The ADCLK846 requires a 1.8 V ± 5% power supply for VS.
Best practice recommends bypassing the power supply on
the PCB with adequate capacitance (>10 μF) and bypassing
all power pins with adequate capacitance (0.1 μF) as close to
the part as possible. The layout of the ADCLK846 evaluation
board (ADCLK846/PCBZ) provides a good layout example.
VS
Exposed Metal Paddle
3.5mA
The exposed metal paddle on the ADCLK846 package is an
electrical connection, as well as a thermal enhancement. For
the device to function properly, the paddle must be properly
attached to ground (GND). The ADCLK846 dissipates heat
through its exposed paddle. The PCB acts as a heat sink for the
ADCLK846. The PCB attachment must provide a good thermal
path to a larger heat dissipation area, such as the ground plane
on the PCB. This requires a grid of vias from the top layer down
to the ground plane. See Figure 23 for an example.
OUTx
07226-024
OUTx
3.5mA
Figure 21. LVDS Output Simplified Equivalent Circuit
VS
VS
OUTxB
07226-025
OUTxA
VIAS TO GND PLANE
Figure 22. CMOS Equivalent Output Circuit
07226-026
CONTROL AND FUNCTION PINS
Logic Select for CTRL_A
CTRL_A selects either CMOS (high) or LVDS (low) logic for
Output 1 and Output 0. This pin has an internal 200 kΩ pulldown resistor.
Logic Select for CTRL_B
CTRL_B selects either CMOS (high) or LVDS (low) logic for
Output 5, Output 4, Output 3, and Output 2. This pin has an
internal 200 kΩ pull-down resistor.
Sleep Mode
SLEEP powers down the chip except for the band gap. The
input is active high, which puts the outputs into a high-Z state.
This pin has a 200 kΩ pull-down resistor. The control pins are
operational during sleep mode.
Rev. A | Page 12 of 16
Figure 23. PCB Land Example for Attaching Exposed Paddle
ADCLK846
APPLICATIONS INFORMATION
USING THE ADCLK846 OUTPUTS FOR ADC CLOCK
APPLICATIONS
⎡ 1
SNR = 20log ⎢
⎢⎣ 2πf ATJ
The ADCLK846 provides clock outputs that are selectable
as either CMOS or LVDS level outputs. LVDS is a differential
output option that uses a current-mode output stage. The
nominal current is 3.5 mA, which yields 350 mV output swing
across a 100 Ω resistor. The LVDS output meets or exceeds all
ANSI/TIA/EIA-644 specifications. A recommended termination circuit for the LVDS outputs is shown in Figure 25.
If ac coupling is necessary, place decoupling capacitors either
before or after the 100 Ω termination resistor.
VS
VS
LVDS
100Ω
100Ω
DIFFERENTIAL (COUPLED)
LVDS
07226-028
Any high speed analog-to-digital converter (ADC) is extremely
sensitive to the quality of the sampling clock provided by the
user. An ADC can be thought of as a sampling mixer, and any
noise, distortion, or timing jitter on the clock is combined with
the desired signal at the ADC output. Clock integrity requirements scale with the analog input frequency and resolution,
with higher analog input frequency applications at ≥14-bit
resolution being the most stringent. The theoretical SNR of
an ADC is limited by the ADC resolution and the jitter on
the sampling clock. Considering an ideal ADC of infinite
resolution where the step size and quantization error can be
ignored, the available SNR can be expressed approximately by
LVDS CLOCK DISTRIBUTION
⎤
⎥
⎥⎦
Figure 25. LVDS Output Termination
where:
fA is the highest analog frequency being digitized.
TJ is the rms jitter on the sampling clock.
See the AN-586 Application Note at www.analog.com for more
information on LVDS.
Figure 24 shows the required sampling clock jitter as a function
of the analog frequency and effective number of bits (ENOB).
See AN-756 Application Note and AN-501 Application Note
for more information.
The output drivers of the ADCLK846 can also be configured
as CMOS drivers. When selected as a CMOS driver, each
output becomes a pair of CMOS outputs. These outputs are
1.8 V CMOS compatible.
1
SNR = 20log 2πf T
A J
100
When single-ended CMOS clocking is used, some of the
following guidelines outlined in this section apply.
18
Design point-to-point connections such that each driver has
only one receiver, if possible. Connecting outputs in this manner
allows for simple termination schemes and minimizes ringing
due to possible mismatched impedances on the output trace.
Series termination at the source is generally required to provide
transmission line matching and/or to reduce current transients
at the driver.
16
90
TJ =
100
fS
200
f
14
S
400
f
70
S
12
1ps
60
2ps
10
10p
s
8
50
40
ENOB
SNR (dB)
80
100
fA FULL-SCALE SINE WAVE ANALOG FREQUENCY (MHz)
1k
07226-027
6
30
10
Figure 24. SNR and ENOB vs. Analog Input Frequency
The value of the resistor is dependent on the board design and
timing requirements (typically 10 Ω to 100 Ω is used). CMOS
outputs are also limited in terms of the capacitive load or trace
length that they can drive. Typically, trace lengths less than
3 inches are recommended to preserve signal rise/fall times
and signal integrity.
Many high performance ADCs feature differential clock inputs
to simplify the task of providing the required low jitter clock on
a noisy PCB. Distributing a single-ended clock on a noisy PCB
can result in coupled noise on the sample clock. Differential
distribution has inherent common-mode rejection that can
provide superior clock performance in a noisy environment.
The ADCLK846 features LVDS outputs that provide differential
clock outputs, which enable clock solutions that maximize converter SNR performance. Consider the input requirements of
the ADC (differential or single-ended, logic level, termination)
when selecting the best clocking/converter solution.
Rev. A | Page 13 of 16
CMOS
10Ω
60.4Ω
(1.0 INCH)
CMOS
MICROSTRIP
07226-076
110
CMOS CLOCK DISTRIBUTION
Figure 26. Series Termination of CMOS Output
ADCLK846
VCC
Termination at the far end of the PCB trace is a second option.
The CMOS outputs of the ADCLK846 do not supply enough
current to provide a full voltage swing with a low impedance
resistive, far-end termination, as shown in Figure 27. Match the
far-end termination network to the PCB trace impedance and
provide the desired switching point. The reduced signal swing
may still meet receiver input requirements in some applications.
This can be useful when driving long trace lengths on less
critical nets.
CLK
CLK
VCC
VS
10Ω
50Ω
CLK
100Ω
Figure 29. Typical AC-Coupled or DC-Coupled CML Configurations
(see Table 8 for CML Coupling Limitations)
CMOS
07226-077
CMOS
07226-129
CLK
100Ω
Figure 27. CMOS Output with Far-End Termination
CLK
Because of the limitations of single-ended CMOS clocking,
consider using differential outputs when driving high speed
signals over long traces. The ADCLK846 offers LVDS outputs
that are better suited for driving long traces where the inherent
noise immunity of differential signaling provides superior
performance for clocking converters.
CLK
50Ω
50Ω
VCC – 2V
CLK
INPUT TERMINATION OPTIONS
CLK
50Ω
Figure 32 illustrates the use of the VREF to provide low impedance termination into VS/2. In addition, Figure 32 shows a way
to negate the 30 mV input offset with external resistor values.
For example, use 1.8 V CMOS with long traces to provide farend termination.
50Ω
07226-130
For single-ended operation, always bypass unused input to
GND as shown in Figure 31.
VCC – 2V
Figure 30. Typical AC-Coupled or DC-Coupled LVPECL Configurations
(see Table 8 for LVPECL DC Coupling Limitations)
CLK
CLK
CLK
CLK
CLK
100Ω
CLK
CLK
Figure 28. Typical AC-Coupled or DC-Coupled LVDS or HSTL Configurations
(see Table 8)
07226-131
CLK
Figure 31. Typical 1.8 V CMOS Configurations for Short Trace Lengths
(see Table 8 for CMOS compatibility)
VREF
CLK
CLK
07226-132
100Ω
CLK
07226-128
CLK
Figure 32. Use of the VREF to Provide Low Impedance Termination into VS/2
Rev. A | Page 14 of 16
ADCLK846
OUTLINE DIMENSIONS
0.60 MAX
4.00
BSC SQ
TOP
VIEW
0.50
BSC
3.75
BSC SQ
0.50
0.40
0.30
1.00
0.85
0.80
12° MAX
SEATING
PLANE
0.80 MAX
0.65 TYP
0.30
0.23
0.18
PIN 1
INDICATOR
24 1
19
18
*2.45
EXPOSED
PAD
2.30 SQ
2.15
(BOTTOMVIEW)
13
12
7
6
0.23 MIN
2.50 REF
0.05 MAX
0.02 NOM
0.20 REF
COPLANARITY
0.08
FOR PROPER CONNECTION OF
THE EXPOSED PAD, REFER TO
THE PIN CONFIGURATION AND
FUNCTION DESCRIPTIONS
SECTION OF THIS DATA SHEET.
*COMPLIANT TO JEDEC STANDARDS MO-220-VGGD-2
EXCEPT FOR EXPOSED PAD DIMENSION
080808-A
PIN 1
INDICATOR
0.60 MAX
Figure 33. 24-Lead Lead Frame Chip Scale Package [LFCSP_VQ]
4 mm × 4 mm Body, Very Thin Quad
CP-24-2
Dimensions shown in millimeters
ORDERING GUIDE
Model
ADCLK846BCPZ 1
ADCLK846BCPZ-REEL71
ADCLK846/PCBZ1
1
Temperature Range
−40°C to +85°C
−40°C to +85°C
Package Description
24-Lead LFCSP_VQ
24-Lead LFCSP_VQ
Evaluation Board
Z = RoHS Compliant Part.
Rev. A | Page 15 of 16
Package Option
CP-24-2
CP-24-2
ADCLK846
NOTES
©2009 Analog Devices, Inc. All rights reserved. Trademarks and
registered trademarks are the property of their respective owners.
D07226-0-6/09(A)
Rev. A | Page 16 of 16