ZP DMN3150L N-channel enhancement mode field effect transistor Datasheet

DMN3150L
N-CHANNEL ENHANCEMENT MODE FIELD EFFECT TRANSISTOR
Features
Mechanical Data
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Low On-Resistance:
RDS(ON) < 54mΩ @ VGS = 10V
RDS(ON) < 72mΩ @ VGS = 4.5V
RDS(ON) < 115mΩ @ VGS = 2.5V
Low Gate Threshold Voltage
Low Input Capacitance
Fast Switching Speed
Low Input/Output Leakage
Lead Free By Design/RoHS Compliant (Note 2)
"Green" Device (Note 3)
Qualified to AEC-Q101 Standards for High Reliability
Case: SOT-23
Case Material: Molded Plastic, “Green” Molding Compound.
UL Flammability Classification Rating 94V-0
Moisture Sensitivity: Level 1 per J-STD-020
Terminals: Finish – Matte Tin annealed over Copper leadframe.
Solderable per MIL-STD-202, Method 208
Terminal Connections: See Diagram
Weight: 0.008 grams (approximate)
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SOT-23
Drain
D
Gate
G
S
Source
TOP VIEW
Maximum Ratings
Pin Configuration
EQUIVALENT CIRCUIT
@TA = 25°C unless otherwise specified
Characteristic
Drain Source Voltage
Gate-Source Voltage
Drain Current (Note 1)
Drain Current (Note 1)
Body-Diode Continuous Current (Note 1)
Symbol
VDSS
VGSS
TA = 25°C
TA = 70°C
Pulsed
ID
IDM
IS
Value
30
±12
3.8
3.1
15
2.0
Unit
V
V
A
A
A
Thermal Characteristics
Characteristic
Total Power Dissipation (Note 1)
Thermal Resistance, Junction to Ambient @TA = 25°C (Note 1)
Operating and Storage Temperature Range
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Symbol
PD
RθJA
TJ, TSTG
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Value
1.4
90
-55 to +150
Unit
W
°C/W
°C
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DMN3150L
N-CHANNEL ENHANCEMENT MODE FIELD EFFECT TRANSISTOR
Electrical Characteristics
@TA = 25°C unless otherwise specified
Characteristic
OFF CHARACTERISTICS (Note 4)
Drain-Source Breakdown Voltage
Zero Gate Voltage Drain Current
Symbol
Min
Typ
Max
Unit
BVDSS
IDSS
30
⎯
⎯
⎯
V
nA
IGSS
⎯
⎯
⎯
800
±80
±800
VGS(th)
0.62
0.92
1.4
V
RDS (ON)
⎯
⎯
39
52
90
54
72
115
mΩ
|Yfs|
VSD
⎯
⎯
3
⎯
⎯
1.16
S
V
Gate Resistance
Rg
-
4.17
-
Ω
Total Gate Charge (10V)
Qg
-
8.2
-
nC
Qg
Qgs
Qgd
tD(on)
tr
tD(off)
tf
Ciss
Coss
Crss
⎯
⎯
⎯
3.7
0.7
1.1
1.14
3.49
15.02
3.26
305
74
48
⎯
⎯
⎯
nC
nC
nC
ns
ns
ns
ns
pF
pF
pF
Gate-Body Leakage
ON CHARACTERISTICS (Note 4)
Gate Threshold Voltage
Static Drain-Source On-Resistance
Forward Transconductance
Source-Drain Diode Forward Voltage
DYNAMIC CHARACTERISTICS
Total Gate Charge (4.5V)
Gate-Source Charge
Gate-Drain Charge
Turn-On Delay Time
Turn-On Rise Time
Turn-Off Delay Time
Turn-Off Fall Time
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
Notes:
nA
Test Condition
VGS = 0V, ID = 250μA
VDS = 28V, VGS = 0V
VGS = ±12V, VDS = 0V
VGS = ±19V, VDS = 0V
VDS = VGS, ID = 250μA
VGS = 10V, ID = 3.8A
VGS = 4.5V, ID = 3.6A
VGS = 2.5V, ID = 3.1A
VDS = 5V, ID = 3.1A
VGS = 0V, IS = 2.0A
VDS =0V, VGS = 0V,
f = 1MHz
VGS = 10 V, VDS = 10V,
ID = 3.8 A
VGS =4.5 V, VDS = 10V,
ID = 3.8 A
VDD = 15V, VGEN = 10V,
RGEN = 6Ω, RL = 3.9Ω
VDS = 5V, VGS = 0V
f = 1.0MHz
1. Device mounted on FR-4 PCB. t ≤5 sec.
2. No purposefully added lead.
3. Short duration pulse test used to minimize self-heating effect.
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