Intersil AD7541 12-bit, multiplying d/a converter Datasheet

AD7541
®
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LE SU D7521Data Sheet
A
POSSIB
May 2002
12-Bit, Multiplying D/A Converter
Features
The AD7541 is a monolithic, low cost, high performance,
12-bit accurate, multiplying digital-to-analog converter
(DAC).
• 12-Bit Linearity 0.01%
FN3107.3
• Pretrimmed Gain
• Low Gain and Linearity Tempcos
Intersil’ wafer level laser-trimmed thin-film resistors on
CMOS circuitry provide true 12-bit linearity with TTL/CMOS
compatible operation.
• Full Temperature Range Operation
• Full Input Static Protection
Special tabbed-resistor geometries (improving time stability),
full input protection from damage due to static discharge by
diode clamps to V+ and ground, large IOUT1 and IOUT2 bus
lines (improving superposition errors) are some of the
features offered by Intersil AD7541.
• TTL/CMOS Compatible
• +5V to +15V Supply Range
• 20mW Low Power Dissipation
• Current Settling Time 1µs to 0.01% of FSR
• Four Quadrant Multiplication
Pinout
Functional Block Diagram
AD7541
(PDIP)
TOP VIEW
VREF IN
10kΩ
10kΩ
20kΩ
20kΩ
10kΩ
10kΩ
(17)
IOUT1 1
18 RFEEDBACK
IOUT2 2
17 VREF IN
GND 3
20kΩ
20kΩ
20kΩ
20kΩ
(3)
16 V+
BIT 1 (MSB) 4
15 BIT 12 (LSB)
BIT 2 5
14 BIT 11
BIT 3 6
13 BIT 10
BIT 4 7
12 BIT 9
BIT 5 8
11 BIT 8
BIT 6 9
10 BIT 7
SPDT
NMOS
SWITCHES
IOUT2 (2)
IOUT1 (1)
10kΩ
MSB
(4)
BIT 2
(5)
RFEEDBACK
(18)
BIT 3
(6)
NOTE: Switches shown for digital inputs “High”.
Part Number Information
NONLINEARITY
TEMP. RANGE (oC)
AD7541JN
0.02% (11-Bit)
0 to 70
18 Ld PDIP
E18.3
AD7541KN
0.01% (12-Bit)
0 to 70
18 Ld PDIP
E18.3
PART NUMBER
1
PACKAGE
PKG. NO.
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 321-724-7143 | Intersil (and design) is a trademark of Intersil Americas Inc.
Copyright © Intersil Americas Inc. 2002. All Rights Reserved
AD7541
Absolute Maximum Ratings
Thermal Information
Supply Voltage (V+ to GND) . . . . . . . . . . . . . . . . . . . . . . . . . . +17V
VREF . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±25V
Digital Input Voltage Range . . . . . . . . . . . . . . . . . . . . . . . V+ to GND
Output Voltage Compliance . . . . . . . . . . . . . . . . . . . . . -100mV to V+
Thermal Resistance (Typical, Note 1)
Operating Conditions
θJA (oC/W)
PDIP Package . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
80
Maximum Junction Temperature . . . . . . . . . . . . . . . . . . . . . . .150oC
Maximum Storage Temperature . . . . . . . . . . . . . . . -65oC to 150oC
Maximum Lead Temperature (Soldering 10s) . . . . . . . . . . . . .300oC
Temperature Range . . . . . . . . . . . . . . . . . . . . . . . . . . . 0oC to 70oC
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the
device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE:
1. θJA is measured with the component mounted on a low effective thermal conductivity test board in free air. See Tech Brief TB379 for details.
V+ = +15V, VREF = +10V, VOUT1 = VOUT2 = 0V, TA = 25oC, Unless Otherwise Specified
Electrical Specifications
TA = 25oC
PARAMETER
TEST CONDITIONS
TA MIN-MAX
MIN
TYP
MAX
MIN
MAX
UNITS
12
-
-
12
-
Bits
-
-
±0.024
-
±0.024
% of FSR
-
-
±0.012
-
±0.012
% of FSR
SYSTEM PERFORMANCE (Note 4)
Resolution
Nonlinearity
-10V ≤ VREF ≤ +10V
VOUT1 = VOUT2 = 0V
See Figure 4 (Note 5)
J
K
Monotonicity
Guaranteed
Gain Error
-10V ≤ VREF ≤ +10V (Note 5)
-
-
±0.3
-
±0.4
% of FSR
Output Leakage Current (Either Output)
VOUT1 = VOUT2 = 0
-
-
±50
-
±200
nA
Power Supply Rejection
V+ = 14.5V to 15.5V
See Figure 5 (Note 5)
-
-
±0.005
-
±0.01
% of FSR/% of
∆V+
Output Current Settling Time
To 0.1% of FSR
See Figure 9 (Note 6)
-
-
1
-
1
µs
Feedthrough Error
VREF = 20VP-P, 10kHz
All Digital Inputs Low
See Figure 8 (Note 6)
-
-
1
-
1
mVP-P
All Digital Inputs High
IOUT1 at Ground
5
10
20
5
20
kΩ
DYNAMIC CHARACTERISTICS
REFERENCE INPUTS
Input Resistance
ANALOG OUTPUT
Voltage Compliance
Output Capacitance
Both Outputs, See Maximum
Ratings (Note 7)
COUT1
All Digital Inputs High
See Figure 7 (Note 6)
COUT2
COUT1
All Digital Inputs Low
See Figure 7 (Note 6)
COUT2
Output Noise (Both Outputs)
See Figure 6
2
-100mV to V+
-
-
200
-
200
pF
-
-
60
-
60
pF
-
-
60
-
60
pF
-
-
200
-
200
pF
Equivalent to 10kΩ Johnson Noise
AD7541
V+ = +15V, VREF = +10V, VOUT1 = VOUT2 = 0V, TA = 25oC, Unless Otherwise Specified (Continued)
Electrical Specifications
TA = 25oC
PARAMETER
TEST CONDITIONS
TA MIN-MAX
MIN
TYP
MAX
MIN
MAX
UNITS
-
-
0.8
-
0.8
V
2.4
-
-
2.4
-
V
-
-
±1
-
±1
µA
8
pF
DIGITAL INPUTS
Low State Threshold, VIL
(Notes 2, 6)
High State Threshold, VIH
Input Current
VIN = 0V or V+ (Note 6)
Input Coding
See Tables 1 and 2 (Note 6)
Input Capacitance
(Note 6)
Binary/Offset Binary
-
-
8
-
POWER SUPPLY CHARACTERISTICS
Power Supply Voltage Range
Accuracy Is Not Guaranteed Over
This Range
+5 to +16
V
I+
All Digital Inputs High or Low
(Excluding Ladder Network)
-
-
2.0
-
2.5
mA
Total Power Dissipation
(Including Ladder Network)
-
20
-
-
-
mW
NOTES:
2. The digital control inputs are zener protected; however, permanent damage may occur on unconnected units under high energy electrostatic
fields. Keep unused units in conductive foam at all times.
3. Do not apply voltages higher than VDD or less than GND potential on any terminal except VREF and RFEEDBACK .
4. Full scale range (FSR) is 10V for unipolar and ±10V for bipolar modes.
5. Using internal feedback resistor, RFEEDBACK .
6. Guaranteed by design or characterization and not production tested.
7. Accuracy not guaranteed unless outputs at ground potential.
Definition of Terms
Detailed Description
Nonlinearity: Error contributed by deviation of the DAC
transfer function from a “best fit straight line” function.
Normally expressed as a percentage of full scale range. For
a multiplying DAC, this should hold true over the entire VREF
range.
The AD7541 is a 12-bit, monolithic, multiplying D/A converter.
A highly stable thin film R-2R resistor ladder network and
NMOS SPDT switches form the basis of the converter circuit.
CMOS level shifters provide low power TTL/CMOS
compatible operation. An external voltage or current reference
and an operational amplifier are all that is required for most
voltage output applications. A simplified equivalent circuit of
the DAC is shown on page 1, (Functional Diagram). The
NMOS SPDT switches steer the ladder leg currents between
IOUT1 and IOUT2 buses which must be held at ground
potential. This configuration maintains a constant current in
each ladder leg independent of the input code. Converter
errors are further eliminated by using wider metal
interconnections between the major bits and the outputs. Use
of high threshold switches reduces the offset (leakage) errors
to a negligible level.
Resolution: Value of the LSB. For example, a unipolar
converter with n bits has a resolution of LSB = (VREF)/2N. A
bipolar converter of N bits has a resolution of
LSB = (VREF)/2(N-1). Resolution in no way implies linearity.
Settling Time: Time required for the output function of the
DAC to settle to within 1/2 LSB for a given digital input
stimulus, i.e., 0 to Full Scale.
Gain Error: Ratio of the DAC’s operational amplifier output
voltage to the nominal input voltage value.
Feedthrough Error: Error caused by capacitive coupling
from VREF to output with all switches OFF.
Output Capacitance: Capacitance from IOUT1 , and IOUT2
terminals to ground.
Output Leakage Current: Current which appears on
IOUT1, terminal when all digital inputs are LOW or on IOUT2
terminal when all inputs are HIGH.
3
Each circuit is laser-trimmed, at the wafer level, to better
than 12-bits linearity. For the first four bits of the ladder,
special trim-tabbed geometries are used to keep the body of
the resistors, carrying the majority of the output current,
undisturbed. The resultant time stability of the trimmed
circuits is comparable to that of untrimmed units.
AD7541
The level shifter circuits are comprised of three inverters with
a positive feedback from the output of the second to first
(Figure 1). This configuration results in TTL/COMS
compatible operation over the full military temperature
range. With the ladder SPDT switches driven by the level
shifter, each switch is binary weighted for an “ON” resistance
proportional to the respective ladder leg current. This
assures a constant voltage drop across each switch,
creating equipotential terminations for the 2R ladder resistor,
resulting in accurate leg currents.
Unipolar Binary Operation
The circuit configuration for operating the AD7541 in
unipolar mode is shown in Figure 2. With positive and
negative VREF values the circuit is capable of 2-Quadrant
multiplication. The “Digital Input Code/Analog Output Value”
table for unipolar mode is given in Table 1. A Schottky diode
(HP5082-2811 or equivalent) prevents IOUT1 from negative
excursions which could damage the device. This precaution
is only necessary with certain high speed amplifiers.
+15V
V+
1 3
4
6
TO LADDER
VREF
±10V
BIT 1 (MSB)
8
TTL/CMOS
INPUT
DIGITAL
INPUT
2
5
16 RFEEDBACK
18
IOUT1
5 AD7541 1
17
4
9
15
7
BIT 12 (LSB)
IOUT2 IOUT1
FIGURE 1. CMOS LEVEL SHIFTER AND SWITCH
3
2
-
IOUT2
VOUT
A
CR1
+
GND
FIGURE 2. UNIPOLAR BINARY OPERATION (2-QUADRANT
MULTIPLICATION)
Zero Offset Adjustment
Typical Applications
1. Connect all digital inputs to GND.
General Recommendations
Static performance of the AD7541 depends on IOUT1 and
IOUT2 (pin 1 and pin 2) potentials being exactly equal to
GND (pin 3).
The output amplifier should be selected to have a low input
bias current (typically less than 75nA), and a low drift
(depending on the temperature range). The voltage offset of
the amplifier should be nulled (typically less than ±200µV).
The bias current compensation resistor in the amplifier’s
non-inverting input can cause a variable offset. Noninverting input should be connected to GND with a low
resistance wire.
Ground-loops must be avoided by taking all pins going to
GND to a common point, using separate connections.
The V+ (pin 16) power supply should have a low noise level
and should not have any transients exceeding +17V.
Unused digital inputs must be connected to GND or V+ for
proper operation.
A high value resistor (~1MΩ) can be used to prevent static
charge accumulation, when the inputs are open-circuited for
any reason.
When gain adjustment is required, low tempco
(approximately 50ppm/oC) resistors or trim-pots should be
selected.
4
2. Adjust the offset zero adjust trimpot of the output
operational amplifier for 0V ±0.5mV (Max) at VOUT .
Gain Adjustment
1. Connect all digital inputs to VDD .
2. Monitor VOUT for a -VREF (1 - 1/212) reading.
3. To increase VOUT , connect a series resistor, (0Ω to
250Ω), in the IOUT1 amplifier feedback loop.
4. To decrease VOUT , connect a series resistor, (0Ω to
250Ω), between the reference voltage and the VREF
terminal.
TABLE 1. CODE TABLE - UNIPOLAR BINARY OPERATION
DIGITAL INPUT
ANALOG OUTPUT
111111111111
-VREF (1 - 1/212)
100000000001
-VREF (1/2 + 1/212)
100000000000
-VREF/2
011111111111
-VREF (1/2 - 1/212)
000000000001
-VREF (1/212)
000000000000
0
Bipolar (Offset Binary) Operation
The circuit configuration for operating the AD7541 in the
bipolar mode is given in Figure 3. Using offset binary digital
input codes and positive and negative reference voltage
values Four-Quadrant multiplication can be realized. The
“Digital Input Code/Analog Output Value” table for bipolar
mode is given in Table 2.
AD7541
A “Logic 1” input at any digital input forces the corresponding
ladder switch to steer the bit current to IOUT1 bus. A “Logic 0”
input forces the bit current to IOUT2 bus. For any code the
IOUT1 and IOUT2 bus currents are complements of one
another. The current amplifier at IOUT2 changes the polarity of
IOUT2 current and the transconductance amplifier at IOUT1
output sums the two currents. This configuration doubles the
output range of the DAC. The difference current resulting at
zero offset binary code, (MSB = “Logic 1”, All other bits =
“Logic 0”), is corrected by using an external resistive divider,
from VREF to IOUT2 .
Offset Adjustment
1. Adjust VREF to approximately +10V.
9. Connect MSB (Bit 1) to “Logic 1” and all other bits to
“Logic 0”.
10. Adjust R4 for 0V ±0.2mV at VOUT .
Gain Adjustment
1. Connect all digital inputs to VDD .
2. Monitor VOUT for a -VREF (1 - 1/211) volts reading.
3. To increase VOUT , connect a series resistor, (0Ω to
250Ω), in the IOUT1 amplifier feedback loop.
4. To decrease VOUT , connect a series resistor, (0Ω to
250Ω), between the reference voltage and the VREF
terminal.
TABLE 2. CODE TABLE - BIPOLAR (OFFSET BINARY)
OPERATION
2. Set R4 to zero.
DIGITAL INPUT
3. Connect all digital inputs to “Logic 1”.
ANALOG OUTPUT
111111111111
-VREF (1 - 1/211)
100000000001
-VREF (1/211)
6. Connect all digital inputs to “Logic 0”.
100000000000
0
7. Adjust IOUT2 amplifier offset zero adjust trimpot for 0V
±0.1mV at IOUT1 amplifier output.
011111111111
VREF (1/211)
000000000001
VREF (1 - 1/211)
000000000000
VREF
4. Adjust IOUT1 amplifier offset zero adjust trimpot for 0V
±0.1mV at IOUT2 amplifier output.
5. Connect a short circuit across R2.
8. Remove short circuit across R2.
±10V
VREF
+15V
17
BIT 1 (MSB)
16
4
18
1
IOUT1
6
+
DIGITAL
INPUT
A1
VOUT
AD7541
R1 10K
R2 10K
R5 10K
15
BIT 12 (LSB)
2
IOUT2
3
GND
6
+
A2
R3
390K
R4
500Ω
NOTE: R1 and R2 should be 0.01%, low-TCR resistors.
FIGURE 3. BIPOLAR OPERATION (4-QUADRANT MULTIPLICATION)
5
AD7541
Test Circuits
+15V
VREF
4
17
16
18
5
1
BIT 1 (MSB)
12-BIT
BINARY
COUNTER
RFEEDBACK
IOUT1
AD7541
AD7541
15
BIT 12
(LSB)
2
3
IOUT2
HA2600
+
10K
0.01%
1MΩ
GND
CLOCK
-
VREF
HA2600
+
BIT 1
LINEARITY
ERROR X 100
10K 0.01%
(MSB)
14-BIT
REFERENCE
DAC
BIT 12
BIT 13
BIT 14
FIGURE 4. NONLINEARITY TEST CIRCUIT
+15V
UNGROUNDED
SINE WAVE
GENERATION
40Hz 1.0VP-P
VREF
500K
+10V
5K 0.01%
BIT 1 (MSB)
BIT 12
(LSB)
17
4
16
RFEEDBACK 5K 0.01%
18
IOUT1
5
1
AD7541
HA2600
IOUT2
+
15 3 2
HA2600
+
VERROR X 100
GND
FIGURE 5. POWER SUPPLY REJECTION TEST CIRCUIT
+11V (ADJUST FOR VOUT = 0V)
+15V
1K
100Ω
17
4
5
15µF
16
2
-
AD7541
101ALN
IOUT1
15
3
1
+
50K
1K
-50V
0.1µF
FIGURE 6. NOISE TEST CIRCUIT
6
f = 1kHz
BW = 1Hz
10K
IOUT2
VOUT
QUAN
TECH
MODEL
134D
WAVE
ANALYZER
AD7541
Test Circuits
(Continued)
+15V
NC
BIT 1 (MSB)
+15V
17
16
4
18
5
AD7541
1
17
3
+15V
VREF = 20VP-P 10kHz SINE WAVE
BIT 1 (MSB)
NC
17
16
4
18
5
AD7541
IOUT1 3
1
IOUT2
HA2600
15 3
2
2
1K
2
100mVP-P
1MHz
SCOPE
BIT 12 (LSB)
BIT 12 (LSB)
6
VOUT
GND
FIGURE 7. OUTPUT CAPACITANCE TEST CIRCUIT
FIGURE 8. FEEDTHROUGH ERROR TEST CIRCUIT
+15V
VREF
+10V
3t: 5% SETTLING
9t: 0.01% SETTLING
EXTRAPOLATE
BIT 1 (MSB)
+5V
0V
DIGITAL INPUT
17
16
4
5
AD7541
1
15
BIT 12 (LSB)
IOUT2
2
3
OSCILLOSCOPE
+100mV
100Ω
GND
FIGURE 9. OUTPUT CURRENT SETTLING TIME TEST CIRCUIT
+15V
VREF +10V
BIT 1 (MSB)
BIT 2
BIT 12 (LSB)
17
16
4
18
5
AD7541
1
15
3
2
RFEEDBACK
IOUT1
IOUT2
CC
-
A
+
VOUT
GND
FIGURE 10. GENERAL DAC CIRCUIT WITH COMPENSATION CAPACITOR, CC
Dynamic Performance
The dynamic performance of the DAC, also depends on the
output amplifier selection. For low speed or static
applications, AC specifications of the amplifier are not very
critical. For high-speed applications slew-rate, settling-time,
openloop gain and gain/phase-margin specifications of the
amplifier should be selected for the desired performance.
The output impedance of the AD7541 looking into IOUT1
varies between 10kΩ (RFEEDBACK alone) and 5kΩ
(RFEEDBACK in parallel with the ladder resistance).
7
Similarly the output capacitance varies between the
minimum and the maximum values depending on the input
code. These variations necessitate the use of compensation
capacitors, when high speed amplifiers are used.
A capacitor in parallel with the feedback resistor (as shown
in Figure 10) provides the necessary phase compensation to
critically damp the output.
A small capacitor connected to the compensation pin of the
amplifier may be required for unstable situations causing
oscillations. Careful PC board layout, minimizing parasitic
capacitances, is also vital.
AD7541
Dual-In-Line Plastic Packages (PDIP)
N
E18.3 (JEDEC MS-001-BC ISSUE D)
E1
INDEX
AREA
1 2 3
18 LEAD DUAL-IN-LINE PLASTIC PACKAGE
N/2
INCHES
-B-
SYMBOL
-AD
E
BASE
PLANE
-C-
A2
SEATING
PLANE
A
L
D1
e
B1
D1
eA
A1
eC
B
0.010 (0.25) M
C
L
C A B S
C
eB
NOTES:
1. Controlling Dimensions: INCH. In case of conflict between English and
Metric dimensions, the inch dimensions control.
2. Dimensioning and tolerancing per ANSI Y14.5M-1982.
3. Symbols are defined in the “MO Series Symbol List” in Section 2.2 of
Publication No. 95.
4. Dimensions A, A1 and L are measured with the package seated in
JEDEC seating plane gauge GS-3.
5. D, D1, and E1 dimensions do not include mold flash or protrusions.
Mold flash or protrusions shall not exceed 0.010 inch (0.25mm).
6. E and eA are measured with the leads constrained to be perpendicular to datum -C- .
MILLIMETERS
MIN
MAX
MIN
MAX
NOTES
A
-
0.210
-
5.33
4
A1
0.015
-
0.39
-
4
A2
0.115
0.195
2.93
4.95
-
B
0.014
0.022
0.356
0.558
-
B1
0.045
0.070
1.15
1.77
8, 10
C
0.008
0.014
0.204
0.355
-
D
0.845
0.880
21.47
D1
0.005
-
0.13
-
5
22.35
5
E
0.300
0.325
7.62
8.25
6
E1
0.240
0.280
6.10
7.11
5
e
0.100 BSC
2.54 BSC
-
eA
0.300 BSC
7.62 BSC
6
eB
-
0.430
-
10.92
7
L
0.115
0.150
2.93
3.81
4
N
18
18
9
Rev. 0 12/93
7. eB and eC are measured at the lead tips with the leads unconstrained.
eC must be zero or greater.
8. B1 maximum dimensions do not include dambar protrusions. Dambar
protrusions shall not exceed 0.010 inch (0.25mm).
9. N is the maximum number of terminal positions.
10. Corner leads (1, N, N/2 and N/2 + 1) for E8.3, E16.3, E18.3, E28.3,
E42.6 will have a B1 dimension of 0.030 - 0.045 inch (0.76 - 1.14mm).
All Intersil U.S. products are manufactured, assembled and tested utilizing ISO9000 quality systems.
Intersil Corporation’s quality certifications can be viewed at www.intersil.com/design/quality
Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design, software and/or specifications at any time without
notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and
reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result
from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.
For information regarding Intersil Corporation and its products, see www.intersil.com
8
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