CDCLVD1204 www.ti.com SCAS898A – MAY 2010 – REVISED JUNE 2010 2:4 Low Additive Jitter LVDS Buffer Check for Samples: CDCLVD1204 FEATURES DESCRIPTION • • The CDCLVD1204 clock buffer distributes one of two selectable clock inputs, (IN0, IN1), to 4 pairs of differential LVDS clock outputs (OUT0, OUT3) with minimum skew for clock distribution. The CDCLVD1204 can accept two clock sources into an input multiplexer. The inputs can either be LVDS, LVPECL, or LVCMOS. 1 • • • • • • • • • • 2:4 Differential Buffer Low Additive Jitter: <300 fs RMS in 10-kHz to 20-MHz Low Output Skew of 20 ps (Max) Universal Inputs Accept LVDS, LVPECL, and LVCMOS Selectable Clock Inputs through Control Pin 4 LVDS Outputs, ANSI EAI/TIA-644A Standard Compatible Clock Frequency up to 800 MHz 2.375 V–2.625 V Device Power Supply LVDS Reference Voltage, VAC_REF, Available for Capacitive Coupled Inputs Industrial Temperature Range: –40°C to 85°C Packaged in 3 mm × 3 mm 16-Pin QFN (RGT) ESD Protection Exceeds 3 kV HBM, 1 kV CDM The IN_SEL pin selects the input which is routed to the outputs. If this pin is left open it disables the outputs (static). The part supports a fail safe function. The device incorporates an input hysteresis which prevents random oscillation of the outputs in the absence of an input signal. The device operates in 2.5V supply environment and is characterized from –40°C to 85°C (ambient temperature). The CDCLVD1204 is packaged in small 16-pin, 3-mm × 3-mm QFN package. APPLICATIONS • • • • • The CDCLVD1204 is specifically designed for driving 50 Ω transmission lines. In case of driving the inputs in single ended mode, the appropriate bias voltage (VAC_REF) should be applied to the unused negative input pin. Telecommunications/Networking Medical Imaging Test and Measurement Equipment Wireless Communications General Purpose Clocking ASIC 156.25 MHz Oscillator (156.25 MHz) PHY1 CDCLVD1204 LVDS Buffer IN_SEL PHY2 FPGA Figure 1. Application Example 1 Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. Copyright © 2010, Texas Instruments Incorporated CDCLVD1204 SCAS898A – MAY 2010 – REVISED JUNE 2010 www.ti.com These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates. VCC Reference Generator VAC_REF INP0 IN_MUX INN0 INP1 OUTP [0..3] LVDS OUTN [0..3] INN1 VCC 200 kW IN_SEL 200 kW GND Figure 2. CDCLVD1204 Block Diagram OUTP2 OUTN1 OUTP1 OUTN0 OUTP0 RGT PACKAGE (TOP VIEW) 12 11 10 9 13 OUTN2 14 OUTP3 15 3mm x 3mm 16 pin QFN (RGT) 8 VAC_REF 7 INN0 6 INP0 5 VCC Thermal Pad 2 1 2 3 4 IN_SEL INP1 INN1 16 GND OUTN3 Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): CDCLVD1204 CDCLVD1204 www.ti.com SCAS898A – MAY 2010 – REVISED JUNE 2010 PIN DESCRIPTIONS CDCLVD1204 Pin Descriptions PIN NAME TYPE NO. DESCRIPTION VCC 5 Power 2.5 V supply for the device GND 1 Ground Device ground INP0, INN0 6, 7 Input Differential input pair or single ended input INP1, INN1 3, 4 Input Differential redundant input pair or single ended input 8 Output Bias voltage output for capacitive coupled inputs. If used, it is recommended to use a 0.1µF to GND on this pin. OUTP0, OUTN0 9, 10 Output Differential LVDS output pair No. 0 OUTP1, OUTN1 11,12 Output Differential LVDS output pair No. 1 OUTP2, OUTN2 13,14 Output Differential LVDS output pair No. 2 OUTP3, OUTN3 15,16 Output Differential LVDS output pair No. 3 2 Input with an internal 200kΩ pull-up and pull-down VAC_REF IN_SEL Thermal Pad Input selection – selects input port; (See Table 1) See thermal management recommendations Table 1. Input Selection (1) IN_SEL ACTIVE CLOCK INPUT 0 INP0, INN0 1 INP1, INN1 Open None (1) The input buffers are disabled and the outputs are static. ABSOLUTE MAXIMUM RATINGS Over operating free-air temperature range (unless otherwise noted). (1) VALUE UNIT –0.3 to 2.8 V Input voltage range, VI –0.2 to VCC +0.2 V Output voltage range, VO –0.2 to VCC+0.2 V Supply voltage range, VCC Driver short circuit current , IOSD See Note Electrostatic discharge (Human Body Model, 1.5 kΩ, 100 pF) (1) (2) (2) >3000 V Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. The output can handle the permanent short. RECOMMENDED OPERATING CONDITIONS Over operating free-air temperature range (unless otherwise noted). Device supply voltage, VCC Ambient temperature, TA MIN TYP MAX 2.375 2.5 2.625 V 85 °C –40 UNIT Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): CDCLVD1204 3 CDCLVD1204 SCAS898A – MAY 2010 – REVISED JUNE 2010 www.ti.com THERMAL INFORMATION CDCLVD1204 THERMAL METRIC (1) RGT UNITS 16 PINS qJA Junction-to-ambient thermal resistance 51.3 qJC(top) Junction-to-case(top) thermal resistance 85.4 qJB Junction-to-board thermal resistance 20.1 yJT Junction-to-top characterization parameter 1.3 yJB Junction-to-board characterization parameter 19.4 qJC(bottom) Junction-to-case(bottom) thermal resistance 6 (1) °C/W For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report, SPRA953. ELECTRICAL CHARACTERISTICS At VCC = 2.375 V to 2.625 V and TA = –40°C to 85°C (unless otherwise noted). PARAMETER TEST CONDITIONS MIN TYP MAX UNIT IN_SEL CONTROL CHARACTERISTICS VdI3 3-State VdIH Input high voltage Open VdIL Input low voltage IdIH Input high current VCC = 2.625 V, VIH = 2.625 V IdIL Input low current VCC = 2.625 V, VIL = 0 V Rpull(IN_SEL) Input pull-up/ pull-down resistor 0.5×VCC V 0.7×VCC V 0.2×VCC V 30 mA –30 mA 200 kΩ 2.5V LVCMOS (see Figure 7) INPUT CHARACTERISTICS fIN Input frequency External threshold voltage applied to complementary input Vth Input threshold voltage VIH Input high voltage VIL Input low voltage IIH Input high current VCC = 2.625 V, VIH = 2.625 V IIL Input low current VCC = 2.625 V, VIL = 0 V ΔV/ΔT Input edge rate 20% – 80% CIN Input capacitance 200 MHz 1.5 V Vth + 0.1 VCC V 0 Vth – 0.1 V 10 mA 1.1 –10 1.5 mA V/ns 2.5 pF DIFFERENTIAL INPUT CHARACTERISTICS fIN Input frequency Clock input VIN, Differential input voltage peak-to-peak VICM = 1.25 V VICM Input common-mode voltage range VIN, DIFF, PP > 0.4V IIH Input high current VCC = 2.625 V, VIH = 2.625 V IIL Input low current VCC = 2.625 V, VIL = 0 V ΔV/ΔT Input edge rate 20% to 80% CIN Input capacitance 4 DIFF 800 MHz 0.3 1.6 VPP 1 VCC – 0.3 V 10 mA –10 mA 0.75 V/ns 2.5 Submit Documentation Feedback pF Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): CDCLVD1204 CDCLVD1204 www.ti.com SCAS898A – MAY 2010 – REVISED JUNE 2010 ELECTRICAL CHARACTERISTICS (continued) At VCC = 2.375 V to 2.625 V and TA = –40°C to 85°C (unless otherwise noted). PARAMETER TEST CONDITIONS MIN TYP MAX UNIT 250 450 mV –15 15 mV 1.1 1.375 –15 15 LVDS OUTPUT CHARACTERISTICS |VOD| Differential output voltage magnitude ΔVOD Change in differential output voltage magnitude VOC(SS) Steady-state common mode output voltage ΔVOC(SS) Steady-state common mode output voltage VIN, DIFF, PP = 0.6 V,RL = 100 Ω Vring Output overshoot and undershoot Percentage of output amplitude VOD VOS Output ac common mode VIN, DIFF, PP = 0.6 V, RL = 100 Ω IOS Short-circuit output current VOD = 0 V tPD Propagation delay VIN, DIFF, PP = 0.3 V tSK, PP Part-to-part skew tSK, O Output skew tSK,P Pulse skew(with 50% duty cycle input) Crossing-point-to-crossing-point distortion tRJIT Random additive jitter (with 50% duty cycle input) Edge speed = 0.75V/ns 10 kHz – 20 MHz tR/tF Output rise/fall time 20% to 80%,100 Ω, 5 pF ICCSTAT Static supply current Outputs unterminated, f = 0 Hz ICC100 Supply current All outputs, RL = 100 Ω, f = 100 MHz ICC800 Supply current All outputs, RL = 100 Ω, f = 800 MHz VIN, DIFF, PP = 0.3 V,RL = 100 Ω V mV 10% 25 1.5 –50 70 mVPP ±24 mA 2.5 ns 600 ps 20 ps 50 ps 0.3 ps, RMS 50 300 ps 17 28 mA 40 58 mA 60 80 mA 1.25 1.35 VAC_REF CHARACTERISTICS VAC_REF Reference output voltage VCC = 2.5 V, Iload = 100 µA 1.1 Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): CDCLVD1204 V 5 CDCLVD1204 SCAS898A – MAY 2010 – REVISED JUNE 2010 www.ti.com Typical Additive Phase Noise Characteristics for 100 MHz Clock PARAMETER MIN TYP MAX UNIT phn100 Phase noise at 100 Hz offset -132.9 dBc/Hz phn1k Phase noise at 1 kHz offset -138.8 dBc/Hz phn10k Phase noise at 10 kHz offset -147.4 dBc/Hz phn100k Phase noise at 100 kHz offset -153.6 dBc/Hz phn1M Phase noise at 1 MHz offset -155.2 dBc/Hz phn10M Phase noise at 10 MHz offset -156.2 dBc/Hz phn20M Phase noise at 20 MHz offset -156.6 dBc/Hz tRJIT Random additive jitter from 10 kHz to 20 MHz 171 fs, RMS Typical Additive Phase Noise Characteristics for 737.27 MHz Clock PARAMETER phn100 Phase noise at 100 Hz offset phn1k Phase noise at 1 kHz offset phn10k Phase noise at 10 kHz offset phn100k MIN TYP MAX UNIT -80.2 dBc/Hz -114.3 dBc/Hz -138 dBc/Hz Phase noise at 100 kHz offset -143.9 dBc/Hz phn1M Phase noise at 1 MHz offset -145.2 dBc/Hz phn10M Phase noise at 10 MHz offset -146.5 dBc/Hz phn20M Phase noise at 20 MHz offset -146.6 dBc/Hz tRJIT Random additive jitter from 10 kHz to 20 MHz 65 fs, RMS 6 Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): CDCLVD1204 CDCLVD1204 www.ti.com SCAS898A – MAY 2010 – REVISED JUNE 2010 TYPICAL CHARACTERISTICS INPUT CLOCK AND OUTPUT CLOCK PHASE NOISES vs FREQUENCY FROM THE CARRIER (TA = 25°C and VCC = 2.5V) Input clock RMS jitter is 32 fs from 10 kHz to 20 MHz and additive RMS jitter is 152 fs Figure 3. 100 MHz Input and Output Phase Noise Plot Differential Output Voltage vs Frequency VOD − Differential Output Voltage − mV 350 TA = 25oC 340 2.625V 330 320 2.5V 310 300 2.375V 290 280 270 260 250 0 100 200 300 400 500 600 700 800 Frequency − MHz Figure 4. Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): CDCLVD1204 7 CDCLVD1204 SCAS898A – MAY 2010 – REVISED JUNE 2010 www.ti.com TEST CONFIGURATIONS Oscilloscope 100 W LVDS Figure 5. LVDS Output DC Configuration During Device Test Phase Noise Analyzer LVDS 50 W Figure 6. LVDS Output AC Configuration During Device Test Figure 7. DC Coupled LVCMOS Input During Device Test VOH OUTNx VOD OUTPx VOL 80% VOUT,DIFF,PP (= 2 x VOD) 20% 0V tr tf Figure 8. Output Voltage and Rise/Fall Time 8 Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): CDCLVD1204 CDCLVD1204 www.ti.com SCAS898A – MAY 2010 – REVISED JUNE 2010 INNx INPx tPLH0 tPHL0 tPLH1 tPHL1 OUTN0 OUTP0 OUTN1 OUTP1 tPLH2 tPHL2 OUTN2 OUTP2 tPHL3 tPLH3 OUTN3 OUTP3 (1) Output skew is calculated as the greater of the following: As the difference between the fastest and the slowest tPLHn or the difference between the fastest and the slowest tPHLn (n = 0, 1, 2, 3). (2) Part-to-part skew is calculated as the greater of the following: As the difference between the fastest and the slowest tPLHn or the difference between the fastest and the slowest tPHLn across multiple devices (n = 0, 1, 2, 3). Figure 9. Output Skew and Part-to-Part Skew Vring OUTNx VOD 0V Differential OUTPx Figure 10. Output Overshoot and Undershoot VOS GND Figure 11. Output AC Common Mode Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): CDCLVD1204 9 CDCLVD1204 SCAS898A – MAY 2010 – REVISED JUNE 2010 www.ti.com APPLICATION INFORMATION THERMAL MANAGEMENT For reliability and performance reasons, the die temperature should be limited to a maximum of 125°C. The device package has an exposed pad that provides the primary heat removal path to the printed circuit board (PCB). To maximize the heat dissipation from the package, a thermal landing pattern including multiple vias to a ground plane must be incorporated into the PCB within the footprint of the package. The Thermal Pad must be soldered down to ensure adequate heat conduction to of the package. Figure 12 shows a recommended land and via pattern. Figure 12. Recommended PCB Layout POWER-SUPPLY FILTERING High-performance clock buffers are sensitive to noise on the power supply, which can dramatically increase the additive jitter of the buffer. Thus, it is essential to reduce noise from the system power supply, especially when jitter/phase noise is critical to applications. Filter capacitors are used to eliminate the low-frequency noise from the power supply, where the bypass capacitors provide the low impedance path for high-frequency noise and guard the power-supply system against the induced fluctuations. These bypass capacitors also provide instantaneous current surges as required by the device and should have low equivalent series resistance (ESR). To properly use the bypass capacitors, they must be placed close to the power-supply pins and laid out with short loops to minimize inductance. It is recommended to add as many high-frequency (for example, 0.1 mF) bypass capacitors as there are supply pins in the package. It is recommended, but not required, to insert a ferrite bead between the board power supply and the chip power supply that isolates the high-frequency switching noises generated by the clock driver; these beads prevent the switching noise from leaking into the board supply. Choose an appropriate ferrite bead with low dc resistance because it is imperative to provide adequate isolation between the board supply and the chip supply, as well as to maintain a voltage at the supply pins that is greater than the minimum voltage required for proper operation. Board Supply Chip Supply Ferrite Bead 1 µF 10 µF 0.1 µF Figure 13. Power-Supply Decoupling 10 Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): CDCLVD1204 CDCLVD1204 www.ti.com SCAS898A – MAY 2010 – REVISED JUNE 2010 LVDS OUTPUT TERMINATION The proper LVDS termination for signal integrity over two 50 Ω lines is 100 Ω between the outputs on the receiver end. Either dc-coupled termination or ac-coupled termination can be used for LVDS outputs. It is recommended to place termination resister close to the receiver. If the receiver is internally biased to a voltage different than the output common mode voltage of the CDCLVD1204, ac-coupling should be used. If the LVDS receiver has internal 100 Ω termination, external termination must be omitted. Unused outputs can be left open without connecting any trace to the output pins. Z = 50 W 100 W CDCLVD1204 LVDS Z = 50 W Figure 14. Output DC Termination 100 nF Z = 50 W 100 W CDCLVD1204 LVDS Z = 50 W 100 nF Figure 15. Output AC Termination (With the Receiver Internally Biased) INPUT TERMINATION The CDCLVD1204 inputs can be interfaced with LVDS, LVPECL, or LVCMOS drivers. LVDS Driver can be connected to CDCLVD1204 inputs with dc or ac coupling as shown Figure 16 and Figure 17, respectively. Z = 50 W 100 W LVDS CDCLVD1204 Z = 50 W Figure 16. LVDS Clock Driver Connected to CDCLVD1204 Input (DC Coupled) 100 nF Z = 50 W LVDS CDCLVD1204 Z = 50 W 100 nF 50 W 50 W VAC_REF Figure 17. LVDS Clock Driver Connected to CDCLVD1204 Input (AC Coupled) Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): CDCLVD1204 11 CDCLVD1204 SCAS898A – MAY 2010 – REVISED JUNE 2010 www.ti.com Figure 18 shows how to connect LVPECL inputs to the CDCLVD1204. The series resistors are required to reduce the LVPECL signal swing if the signal swing is >1.6 Vpp. 75 W 100 nF Z = 50 W CDCLVD1204 LVPECL Z = 50 W 100 nF 75 W 150 W 150 W 50 W 50 W VAC_REF Figure 18. LVPECL Clock Driver Connected to CDCLVD1204 Input Figure 19 illustrates how to couple a 2.5 V LVCMOS clock input to the CDCLVD1204 directly. The series resistance (RS) should be placed close to the LVCMOS driver if needed. 3.3 V LVCMOS clock input swing needs to be limited to VIH ≤ VCC. RS LVCMOS (2.5V) Z = 50 W CDCLVD1204 V V Vth = IH + IL 2 Figure 19. 2.5V LVCMOS Clock Driver Connected to CDCLVD1204 Input For unused input, it is recommended to ground both the input pins (INP, INN) using 1 kΩ resistors. 12 Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): CDCLVD1204 CDCLVD1204 www.ti.com SCAS898A – MAY 2010 – REVISED JUNE 2010 REVISION HISTORY Changes from Original (May 2010) to Revision A Page • Changed Features bullet - From: ESD Protection Exceeds 2 kV HBM, 500 V CDM To: ESD Protection Exceeds 3 kV HBM, 1 kV CDM .............................................................................................................................................................. 1 • Updated the VAC_REF pin description ..................................................................................................................................... 3 • Updated Table 1 - Input Selection ........................................................................................................................................ 3 • Electrostatic discharge was >2000 ....................................................................................................................................... 3 • ΔVOD values, MIN was-50, MAX was 50 .............................................................................................................................. 5 • VOC(SS) MIN value was 1.125 ................................................................................................................................................ 5 • ΔVOC(SS) values, MIN was-50, MAX was 50 .......................................................................................................................... 5 • Vring MAX value was 20% ..................................................................................................................................................... 5 • VOS values, TYP was 30, MAX was 100 ............................................................................................................................... 5 • tPD MAX value was 2 ............................................................................................................................................................. 5 • tSK, PP - deleted the TYP value of 300 ................................................................................................................................... 5 • tR/tF MIN value was 200 ........................................................................................................................................................ 5 • ICCSTAT MAX value was 25 .................................................................................................................................................... 5 Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): CDCLVD1204 13 PACKAGE OPTION ADDENDUM www.ti.com 11-Apr-2013 PACKAGING INFORMATION Orderable Device Status (1) Package Type Package Pins Package Drawing Qty Eco Plan Lead/Ball Finish (2) MSL Peak Temp Op Temp (°C) Top-Side Markings (3) (4) CDCLVD1204RGTR ACTIVE QFN RGT 16 3000 Green (RoHS & no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR -40 to 85 D1204 CDCLVD1204RGTT ACTIVE QFN RGT 16 250 Green (RoHS & no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR -40 to 85 D1204 (1) The marketing status values are defined as follows: ACTIVE: Product device recommended for new designs. LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect. NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design. PREVIEW: Device has been announced but is not in production. Samples may or may not be available. OBSOLETE: TI has discontinued the production of the device. (2) Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability information and additional product content details. TBD: The Pb-Free/Green conversion plan has not been defined. Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes. Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above. Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight in homogeneous material) (3) MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature. (4) Multiple Top-Side Markings will be inside parentheses. Only one Top-Side Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation of the previous line and the two combined represent the entire Top-Side Marking for that device. Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals. TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release. 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Addendum-Page 1 Samples PACKAGE MATERIALS INFORMATION www.ti.com 24-Aug-2013 TAPE AND REEL INFORMATION *All dimensions are nominal Device Package Package Pins Type Drawing SPQ Reel Reel A0 Diameter Width (mm) (mm) W1 (mm) B0 (mm) K0 (mm) P1 (mm) W Pin1 (mm) Quadrant CDCLVD1204RGTR QFN RGT 16 3000 330.0 12.4 3.3 3.3 1.1 8.0 12.0 Q2 CDCLVD1204RGTT QFN RGT 16 250 180.0 12.4 3.3 3.3 1.1 8.0 12.0 Q2 Pack Materials-Page 1 PACKAGE MATERIALS INFORMATION www.ti.com 24-Aug-2013 *All dimensions are nominal Device Package Type Package Drawing Pins SPQ Length (mm) Width (mm) Height (mm) CDCLVD1204RGTR QFN RGT 16 3000 338.1 338.1 20.6 CDCLVD1204RGTT QFN RGT 16 250 210.0 185.0 35.0 Pack Materials-Page 2 IMPORTANT NOTICE Texas Instruments Incorporated and its subsidiaries (TI) reserve the right to make corrections, enhancements, improvements and other changes to its semiconductor products and services per JESD46, latest issue, and to discontinue any product or service per JESD48, latest issue. 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