Fairchild FDG327NZ 20v n-channel powertrench mosfet Datasheet

FDG327NZ
20V N-Channel PowerTrench MOSFET
General Description
Features
This N-Channel MOSFET has been designed
specifically to improve the overall efficiency of DC/DC
converters using either synchronous or conventional
switching PWM controllers. It has been optimized use
in small switching regulators, providing an extremely
low RDS(ON) and gate charge (QG) in a small package.
• 1.5 A, 20 V.
Applications
• Low gate charge
• DC/DC converter
• High performance trench technology for extremely
low RDS(ON)
RDS(ON) = 90 mΩ @ VGS = 4.5 V.
RDS(ON) = 100 mΩ @ VGS = 2.5 V
RDS(ON) = 140 mΩ @ VGS = 1.8 V
• Fast switching speed
• Power management
• Load switch
• High power and current handling capability.
S
D
D
G
Pin 1
SC70-6
D
D
Absolute Maximum Ratings
Symbol
TA=25oC unless otherwise noted
Ratings
Units
VDSS
Drain-Source Voltage
Parameter
20
V
VGSS
Gate-Source Voltage
±8
ID
Drain Current
– Continuous
(Note 1a)
– Pulsed
1.5
A
6
PD
Power Dissipation for Single Operation
TJ, TSTG
Operating and Storage Junction Temperature Range
(Note 1a)
(Note 1b)
0.42
W
0.38
–55 to +150
°C
°C/W
Thermal Characteristics
RθJA
Thermal Resistance, Junction-to-Ambient
(Note 1a)
300
RθJA
Thermal Resistance, Junction-to-Ambient
(Note 1b)
333
Package Marking and Ordering Information
Device Marking
Device
Reel Size
Tape width
Quantity
.37
FDG327NZ
7’’
8mm
3000 units
2005 Fairchild Semiconductor Corporation
FDG327NZ Rev C(W)
FDG327NZ
April 2005
Symbol
TA = 25°C unless otherwise noted
Parameter
Test Conditions
Min Typ
Max
Units
Off Characteristics
ID = 250 µA
BVDSS
Drain–Source Breakdown Voltage
VGS = 0 V,
∆BVDSS
∆TJ
IDSS
Breakdown Voltage Temperature
Coefficient
Zero Gate Voltage Drain Current
ID = 250 µA, Referenced to 25°C
VDS = 16 V,
VGS = 0 V
1
µA
IGSS
Gate–Body Leakage
VGS = ± 8 V,
VDS = 0 V
±10
µA
1.5
V
On Characteristics
20
V
11
mV/°C
(Note 2)
VDS = VGS,
ID = 250 µA
ID = 250 µA, Referenced to 25°C
VGS(th)
∆VGS(th)
∆TJ
Gate Threshold Voltage
Gate Threshold Voltage
Temperature Coefficient
0.4
0.7
RDS(on)
Static Drain–Source
On–Resistance
ID(on)
On–State Drain Current
VGS = 4.5 V,
ID = 1.5 A
VGS = 2.5 V,
ID = 1.4 A
VGS = 1.8 V,
ID = 1.2 A
VGS = 4.5 V, ID = 1.5 A, TJ =125°C
VGS = 4.5V,
VDS = 5 V
gFS
Forward Transconductance
VDS = 10 V,
ID = 1.5 A
2.2
S
VDS = 10 V,
f = 1.0 MHz
V GS = 0 V
412
pF
81
pF
44
pF
VGS = 15 mV, f = 1.0 MHz
1.9
Ω
VDD = 10 V,
VGS = 4.5 V,
13
23
ns
12
22
ns
33
53
ns
18
20
ns
4.2
6
nC
–2
68
77
90
86
mV/°C
90
100
140
123
mΩ
3
A
Dynamic Characteristics
Ciss
Input Capacitance
Coss
Output Capacitance
Crss
Reverse Transfer Capacitance
RG
Gate Resistance
Switching Characteristics
td(on)
Turn–On Delay Time
tr
Turn–On Rise Time
td(off)
Turn–Off Delay Time
tf
Turn–Off Fall Time
Qg
Total Gate Charge
Qgs
Gate–Source Charge
Qgd
Gate–Drain Charge
(Note 2)
VDS = 10 V,
VGS = 4.5 V
ID = 1 A,
RGEN = 6 Ω
ID = 1.5 A,
0.4
nC
1
nC
Drain–Source Diode Characteristics and Maximum Ratings
trr
Drain–Source Diode Forward
Voltage
Diode Reverse Recovery Time
Qrr
Diode Reverse Recovery Charge
VSD
VGS = 0 V,
IS = 0.32 A
IF = 1.5 A,
diF/dt = 100 A/µs
0.6
(Note 2)
1.2
V
4
nS
2
nC
Notes:
1. RθJA is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of
the drain pins. RθJC is guaranteed by design while RθCA is determined by the user's board design.
a)
300°C/W when
mounted on a 1in2 pad
of 2 oz copper.
b)
333°C/W when mounted
on a minimum pad of 2 oz
copper.
2. Pulse Test: Pulse Width < 300µs, Duty Cycle < 2.0%
FDG327NZ Rev C(W)
FDG327NZ
Electrical Characteristics
FDG327NZ
Typical Characteristics
1.8
VGS= 4.5V
2.0V
RDS(ON), NORMALIZED
DRAIN-SOURCE ON-RESISTANCE
10
ID, DRAIN CURRENT (A)
1.8V
2.5V
V
8
6
1.5V
4
2
VGS=1.5V
1.6
1.8V
1.4
2.0V
1.2
2.5V
3.0V
4.5V
1
0.8
0
0
1
2
0
3
2
4
VDS, DRAIN TO SOURCE VOLTAGE (V)
Figure 1. On-Region Characteristics.
10
0.22
ID = 1.5A
VGS = 4.5V
1.4
RDS(ON), ON-RESISTANCE (OHM)
RDS(ON), NORMALIZED
DRAIN-SOURCE ON-RESISTANCE
8
Figure 2. On-Resistance Variation with
Drain Current and Gate Voltage.
1.5
1.3
1.2
1.1
1
0.9
0.8
0.7
ID = 0.8A
0.17
TA = 125oC
0.12
TA = 25oC
0.07
0.02
-50
-25
0
25
50
75
100
125
150
0.5
1.5
o
TJ, JUNCTION TEMPERATURE ( C)
2.5
3.5
4.5
VGS, GATE TO SOURCE VOLTAGE (V)
Figure 3. On-Resistance Variation
withTemperature.
Figure 4. On-Resistance Variation with
Gate-to-Source Voltage.
10
10
TA = -55oC
o
IS, REVERSE DRAIN CURRENT (A)
VDS = 5.0V
ID, DRAIN CURRENT (A)
6
ID, DRAIN CURRENT (A)
25 C
8
o
125 C
6
4
2
VGS = 0V
1
TA = 125oC
0.1
25oC
-55oC
0.01
0.001
0.0001
0
0.5
1
1.5
2
VGS, GATE TO SOURCE VOLTAGE (V)
Figure 5. Transfer Characteristics.
2.5
0
0.2
0.4
0.6
0.8
1
1.2
1.4
VSD, BODY DIODE FORWARD VOLTAGE (V)
Figure 6. Body Diode Forward Voltage Variation
with Source Current and Temperature.
FDG327NZ Rev C(W)
FDG327NZ
Typical Characteristics
600
f = 1 MHz
VGS = 0 V
VDS = 5V
ID = 1.5A
10V
500
4
CAPACITANCE (pF)
VGS, GATE-SOURCE VOLTAGE (V)
5
15V
3
2
1
CISS
400
300
200
COSS
100
CRSS
0
0
0
1
2
3
4
0
5
5
Qg, GATE CHARGE (nC)
Figure 7. Gate Charge Characteristics.
100µs
1ms
10ms
100ms
1s
1
10s
DC
VGS = 4.5V
SINGLE PULSE
RθJA = 333oC/W
TA = 25oC
0.01
0.1
1
10
100
SINGLE PULSE
RθJA = 333°C/W
TA = 25°C
15
10
5
0
0.0001
0.001
0.01
VDS, DRAIN-SOURCE VOLTAGE (V)
0.1
1
10
100
1000
t1, TIME (sec)
Figure 9. Maximum Safe Operating Area.
r(t), NORMALIZED EFFECTIVE TRANSIENT
THERMAL RESISTANCE
20
20
RDS(ON) LIMIT
0.1
15
Figure 8. Capacitance Characteristics.
P(pk), PEAK TRANSIENT POWER (W)
ID, DRAIN CURRENT (A)
10
10
VDS, DRAIN TO SOURCE VOLTAGE (V)
Figure 10. Single Pulse Maximum
Power Dissipation.
1
D = 0.5
RθJA(t) = r(t) * RθJA
o
RθJA = 333 C/W
0.2
0.1
0.1
P(pk)
0.05
t1
0.02
0.01
t2
TJ - TA = P * RθJA(t)
Duty Cycle, D = t1 / t2
SINGLE PULSE
0.01
0.0001
0.001
0.01
0.1
1
10
100
1000
t1, TIME (sec)
Figure 11. Transient Thermal Response Curve.
Thermal characterization performed using the conditions described in Note 1b.
Transient thermal response will change depending on the circuit board design.
FDG327NZ Rev C(W)
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DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.
As used herein:
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1. Life support devices or systems are devices or
support device or system whose failure to perform can
systems which, (a) are intended for surgical implant into
be reasonably expected to cause the failure of the life
the body, or (b) support or sustain life, or (c) whose
support device or system, or to affect its safety or
failure to perform when properly used in accordance
with instructions for use provided in the labeling, can be
effectiveness.
reasonably expected to result in significant injury to the
user.
PRODUCT STATUS DEFINITIONS
Definition of Terms
Datasheet Identification
Product Status
Definition
Advance Information
Formative or
In Design
This datasheet contains the design specifications for
product development. Specifications may change in
any manner without notice.
Preliminary
First Production
This datasheet contains preliminary data, and
supplementary data will be published at a later date.
Fairchild Semiconductor reserves the right to make
changes at any time without notice in order to improve
design.
No Identification Needed
Full Production
This datasheet contains final specifications. Fairchild
Semiconductor reserves the right to make changes at
any time without notice in order to improve design.
Obsolete
Not In Production
This datasheet contains specifications on a product
that has been discontinued by Fairchild semiconductor.
The datasheet is printed for reference information only.
Rev. I15
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