FEATURES Envelope tracking RF detector with output proportional to input voltage Separate TruPwr rms output No balun or external tuning required Excellent temperature stability Input power dynamic range of 47 dB Input frequency range from dc to 6 GHz 130 MHz envelope bandwidth Envelope delay: 2 ns Single-supply operation: 4.75 V to 5.25 V Supply current: 21.5 mA Power-down mode: 130 μW FUNCTIONAL BLOCK DIAGRAM VPOS 15 ADL5511 400Ω BIAS AND POWERDOWN CONTROL ENBL 4 20pF RMS G = 1.7 ENVELOPE G = 1.5 100 Ω 14 FLT4 11 VRMS 10 VENV 9 EREF RFIN 2 250Ω 10kΩ FLT1 3 5pF 250Ω 0.8pF 400Ω 0.4pF VPOS 13 6 7 VPOS 8 NC APPLICATIONS 12 16 1 5 FLT2 FLT3 COMM 09602-001 Data Sheet DC to 6 GHz Envelope and TruPwr RMS Detector ADL5511 Figure 1. RMS power and envelope detection of W-CDMA, CDMA2000, LTE, and other complex waveforms Drain modulation based power amplifier linearization Power amplifier linearization employing envelope-tracking methods CH1 HIGH 20mV VRMS VENV CH1 200mV Ω CH3 200mV CH2 30.8mV Ω M 100ns A CH4 CH4 234mV Ω T –68ns 1.60V 09602-002 RF INPUT Figure 2. RMS and Envelope Response to a 20 MHz QPSK-Based LTE Carrier (Test Model E-TM1_1_20MHz) GENERAL DESCRIPTION The ADL5511 is an RF envelope and TruPwr™ rms detector. The envelope output voltage is presented as a voltage that is proportional to the envelope of the input signal. The rms output voltage is independent of the peak-to-average ratio of the input signal. The rms output is a linear-in-V/V voltage with a conversion gain of 1.9 V/V rms at 900 MHz. The envelope output has a conversion gain of 1.46 V/V at 900 MHz and is referenced to an internal 1.1 V reference voltage, which is available on the EREF pin. The ADL5511 can operate from dc to 6 GHz on signals with envelope bandwidths up to 130 MHz. The extracted envelope can be used for RF power amplifier (PA) linearization and efficiency enhancements and the rms output can be used for rms power measurement. The high rms accuracy and fast envelope response are particularly useful for envelope detection and power measurement of broadband, high peak-to-average signals that are used in CDMA2000, W-CDMA, and LTE systems. The ADL5511 operates from −40°C to +85°C and is available in a 16-lead, 3 mm × 3 mm LFCSP package. Rev. A Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. Specifications subject to change without notice. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective owners. One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781.329.4700 www.analog.com Fax: 781.461.3113 ©2011–2012 Analog Devices, Inc. All rights reserved. ADL5511 Data Sheet TABLE OF CONTENTS Features .............................................................................................. 1 Output Drive Capability and Buffering ................................... 18 Applications ....................................................................................... 1 Applications Information .............................................................. 19 Functional Block Diagram .............................................................. 1 Basic Connections ...................................................................... 19 General Description ......................................................................... 1 Operation Below 1 GHz/Envelope Filtering........................... 19 Revision History ............................................................................... 2 Choosing a Value for the RMS Averaging Capacitor (CFLT4).. 20 Specifications..................................................................................... 3 Envelope Tracking Accuracy .................................................... 21 Absolute Maximum Ratings ............................................................ 7 Time Domain Envelope Tracking Accuracy........................... 21 ESD Caution .................................................................................. 7 VRMS and VENV Output Offset............................................. 22 Pin Configuration and Function Descriptions ............................. 8 Device Calibration and Error Calculation .............................. 22 Typical Performance Characteristics ............................................. 9 Error vs. Frequency .................................................................... 23 Circuit Description ......................................................................... 17 Evaluation Board ........................................................................ 24 Envelope Propagation Delay ..................................................... 17 Outline Dimensions ....................................................................... 26 RMS Circuit Description ........................................................... 17 Ordering Guide .......................................................................... 26 RMS Filtering .............................................................................. 17 REVISION HISTORY 2/12—Rev. 0 to Rev. A Changes to Equation 4 ................................................................... 19 Updated Outline Dimensions ....................................................... 26 7/11—Revision 0: Initial Version Rev. A | Page 2 of 28 Data Sheet ADL5511 SPECIFICATIONS TA = 25°C, VPOS = 5 V, CFLT4 = 100 nF, 75 Ω shunt termination resistor to ground on (ac-coupled) RFIN, three-point calibration on VENV and VRMS at +5 dBm, −15 dBm, and −26 dBm, unless otherwise noted. Table 1. Parameter FREQUENCY RANGE ENVELOPE CONVERSION (100 MHz) Input Range (±1 dB Error) Maximum Input Level Minimum Input Level Conversion Gain Intercept Output Voltage High Power In Low Power In RMS Conversion Input Range (±1 dB Error) Maximum Input Level Minimum Input Level Conversion Gain Intercept Output Voltage High Power In Low Power In ENVELOPE CONVERSION (900 MHz) Input Range (±1 dB Error) Maximum Input Level Minimum Input Level Conversion Gain Intercept Output Voltage High Power In Low Power In RMS Conversion Input Range (±1 dB Error) Maximum Input Level Minimum Input Level Conversion Gain Intercept Output Voltage High Power In Low Power In Conditions Input RFIN Input RFIN to output (VENV − VEREF) CW input ±1 dB error ±1 dB error VENV = (Gain × VIN) + Intercept Min DC Typ Max 6 Unit GHz 46 17 −29 1.42 −5 dB dBm dBm V/V rms mV PIN = +10 dBm, +707 mV rms PIN = −20 dBm, +22.4 mV rms Input RFIN to output (VRMS) CW input ±1 dB error ±1 dB error VRMS = (Gain × VIN) + Intercept 1.00 26 V mV 46 17 −29 1.92 11 dB dBm dBm V/V rms mV PIN = +10 dBm, +707 mV rms PIN = −20 dBm, +22.4 mV rms Input RFIN to output (VENV − VEREF) CW input ±1 dB error ±1 dB error VENV = (Gain × VIN) + Intercept 1.38 53 V mV 46 17 −29 1.46 −5 dB dBm dBm V/V rms mV PIN = +10 dBm, +707 mV rms PIN = −20 dBm, +22.4 mV rms Input RFIN to output (VRMS) CW input ±1 dB error ±1 dB error VRMS = (Gain × VIN) + Intercept 1.02 26 V mV 46 17 −29 1.9 13 dB dBm dBm V/V rms mV PIN = +10 dBm, +707 mV rms PIN = −20 dBm, +22.4 mV rms 1.35 54 V mV Rev. A | Page 3 of 28 ADL5511 Parameter ENVELOPE CONVERSION (1900 MHz) Input Range (±1 dB Error) Maximum Input Level Minimum Input Level Conversion Gain Intercept Data Sheet Conditions Input RFIN to output (VENV − VEREF) CW input ±1 dB error ±1 dB error VENV = (Gain × VIN) + Intercept Min Typ Max Unit 47 dB 17 −30 dBm dBm 1.5 −5 V/V rms mV Output Voltage High Power In PIN = +10 dBm, +707 mV rms 1.05 V Low Power In RMS Conversion PIN = −20 dBm, +22.4 mV rms Input RFIN to output (VRMS) 28 mV Input Range (±1 dB Error) Maximum Input Level CW input ±1 dB error 47 17 dB dBm Minimum Input Level Conversion Gain ±1 dB error VRMS = (Gain × VIN) + Intercept −30 1.96 dBm V/V rms 14 mV 1.40 56 V mV Intercept Output Voltage High Power In Low Power In ENVELOPE CONVERSION (2140 MHz) PIN = +10 dBm, +707 mV rms PIN = −20 dBm, +22.4 mV rms Input RFIN to output (VENV − VEREF) Input Range (±1 dB Error) Maximum Input Level ±1 dB error CW Input 47 17 dB dBm Minimum Input Level Conversion Gain ±1 dB error VENV = (Gain × VIN) + Intercept −30 1.53 dBm V/V rms −5 mV 1.07 28 V mV Intercept Output Voltage High Power In Low Power In RMS Conversion Input Range (±1 dB Error) PIN = +10 dBm, +707 mV rms PIN = −20 dBm, +22.4 mV rms Input RFIN to output (VRMS) CW input 47 dB ±1 dB error ±1 dB error VRMS = (Gain × VIN) + Intercept 17 −30 dBm dBm 1.99 13 V/V rms mV Output Voltage High Power In PIN = +10 dBm, +707 mV rms 1.42 V Low Power In PIN = −20 dBm, +22.4 mV rms 56 mV Maximum Input Level Minimum Input Level Conversion Gain Intercept Rev. A | Page 4 of 28 Data Sheet Parameter ENVELOPE CONVERSION (2600 MHz) Input Range (±1 dB Error) Maximum Input Level Minimum Input Level Conversion Gain Intercept Output Voltage High Power In Low Power In RMS Conversion Input Range (±1 dB Error) Maximum Input Level Minimum Input Level Conversion Gain Intercept Output Voltage High Power In Low Power In ENVELOPE CONVERSION (3500 MHz) Input Range (±1 dB Error) Maximum Input Level Minimum Input Level Conversion Gain Intercept Output Voltage High Power In Low Power In RMS Conversion Input Range (±1 dB Error) Maximum Input Level Minimum Input Level Conversion Gain Intercept Output Voltage High Power In Low Power In ADL5511 Conditions Input RFIN to output (VENV − VEREF) CW Input ±1 dB error ±1 dB error VENV = (Gain × VIN) + Intercept Min Typ Max Unit 47 17 −30 1.56 −3 dB dBm dBm V/V rms mV PIN = +10 dBm, +707 mV rms PIN = −20 dBm, +22.4 mV rms Input RFIN to output (VRMS) CW input ±1 dB error ±1 dB error VRMS = (Gain × VIN) + Intercept 1.10 30 V mV 47 17 −30 2.04 15 dB dBm dBm V/V rms mV PIN = +10 dBm, +707 mV rms PIN = −20 dBm, +22.4 mV rms Input RFIN to output (VENV − VEREF) CW Input ±1 dB error ±1 dB error VENV = (Gain × VIN) + Intercept 1.46 58 V mV 47 17 −30 1.56 −5 dB dBm dBm V/V rms mV PIN = +10 dBm, +707 mV rms PIN = −20 dBm, +22.4 mV rms Input RFIN to output (VRMS) CW input ±1 dB error ±1 dB error VRMS = (Gain × VIN) + Intercept 1.10 28 V mV 47 17 −30 2.03 12 dB dBm dBm V/V rms mV PIN = +10 dBm, +707 mV rms PIN = −20 dBm, +22.4 mV rms 1.46 57 V mV Rev. A | Page 5 of 28 ADL5511 Parameter ENVELOPE CONVERSION (6000 MHz) Input Range (±1 dB Error) Maximum Input Level Minimum Input Level Conversion Gain Intercept Output Voltage High Power In Low Power In RMS Conversion Input Range (±1 dB Error) Maximum Input Level Minimum Input Level Conversion Gain Intercept Output Voltage High Power In Low Power In ENVELOPE OUTPUT Maximum Output Voltage Output Offset Envelope Bandwidth Pulse Response Time Envelope Delay Output Current Drive RMS OUTPUT Maximum Output Voltage Output Offset Output Current Drive ENABLE INTERFACE Logic Level to Enable Power Logic Level to Disable Power POWER SUPPLIES Operating Range Quiescent Current Data Sheet Conditions Input RFIN to output (VENV − VEREF) CW Input ±1 dB error ±1 dB error VENV = (Gain × VIN) + Intercept Min Typ Max Unit 45 17 −28 0.85 −10 dB dBm dBm V/V rms mV PIN = +10 dBm, +707 mV rms PIN = −20 dBm, +22.4 mV rms Input RFIN to output (VRMS) CW input ±1 dB error ±1 dB error VRMS = (Gain × VIN) + Intercept 0.60 11 V mV 45 17 −28 1.11 7 dB dBm dBm V/V rms mV PIN = +10 dBm, +707 mV rms PIN = −20 dBm, +22.4 mV rms Pin VENV VPOS = 5 V, RLOAD ≥ 500 Ω, CLOAD ≤ 10 pF No signal at RFIN 3 dB Input level = no signal to 5 dBm, 10% to 90% response time RFIN to VENV Load = 500 Ω||10 pF Pin VRMS VPOS = 5 V, RLOAD ≥ 10 kΩ No signal at RFIN Load = 1.3 kΩ Pin ENBL 4.75 V ≤ VPOS ≤ 5.25 V 4.75 V ≤ VPOS ≤ 5.25 V 0.80 35 V mV 3.5 2 130 4 V mV MHz ns 2 15 ns mA 3.8 23 3 V mV mA −40°C < TA < +85°C RFIN < −10 dBm, ENBL high RFIN < −10 dBm, ENBL low RFIN = 15 dBm, ENBL high Rev. A | Page 6 of 28 3.6 2.0 4.75 5.25 21.5 26 43.8 V V V mA μA mA Data Sheet ADL5511 ABSOLUTE MAXIMUM RATINGS Table 2. Parameter Supply Voltage, VPOS ENBL RFIN (RFIN AC-Coupled) Equivalent RF Power (Peak Envelope Power or CW), re: 50 Ω Internal Power Dissipation θJA θJC Maximum Junction Temperature Operating Temperature Range Storage Temperature Range ESD (FICDM) ESD (HBM) Rating 5.5 V 0 V, VPOS 5.6 V p-p 19 dBm 580 mW 68.9°C/W 17.5°C/W 125°C −40°C to +85°C −65°C to +150°C 1250 V 2000 V Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational section of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. ESD CAUTION Rev. A | Page 7 of 28 ADL5511 Data Sheet 13 NC PIN 1 INDICATOR FLT3 1 12 NC 11 VRMS FLT1 3 TOP VIEW (Not to Scale) 10 VENV 9 EREF NC 8 COMM 5 ENBL 4 NC 7 ADL5511 NC 6 RFIN 2 NOTES 1. NC = NO CONNECT. DO NOT CONNECT TO THIS PIN. 2. THE EXPOSED PAD SHOULD BE CONNECTED TO BOTH THERMAL AND ELECTRICAL GROUNDS. 09602-103 16 FLT2 15 VPOS 14 FLT4 PIN CONFIGURATION AND FUNCTION DESCRIPTIONS Figure 3. Pin Configuration Table 3. Pin Function Descriptions Pin No. 1, 16 Mnemonic FLT3, FLT2 2 RFIN 3 FLT1 4 ENBL 5 6, 7, 8, 12, 13 9 10 COMM NC EREF VENV 11 VRMS 14 15 0 FLT4 VPOS EP Description External Envelope Filter. With the FLT3 and FLT2 pins not connected, two internal low-pass filters (operating in series) with corner frequencies of approximately 1000 MHz and 800 MHz remove the residual RF carrier (at two times the original input frequency) from the envelope signal. External, supply-referenced capacitors connected to FLT3 and FLT2 can be used to reduce this corner frequency. See the Basic Connections section for more information. RF Input. RFIN should be externally ac-coupled. RFIN has a nominal input impedance of 250 Ω. To achieve a broadband 50 Ω input impedance, an external 75 Ω shunt resistor should be connected between the source side of the ac coupling capacitor and ground. External Envelope Filter. A capacitor to ground on this pin can be used to reduce the nominal minimum input frequency. The capacitance on this pin helps to reduce any residual RF carrier presence on the EREF output pin. See the Basic Connections section for more information. Device Enable/Disable. A logic high on this pin enables the device. A logic low on this pin disables the device. Device Ground. Connect to a low impedance ground plane. Do not connect to these pins. Reference Voltage for Envelope Output. The nominal value is 1.1 V. Envelope Output. The voltage on this pin represents the envelope of the input signal and is referred to EREF. VENV can source a current of up to 15 mA. Capacitive loading should not exceed 10 pF to achieve the specified envelope bandwidth. Lighter loads should be chosen when possible. The nominal output voltages on EREF and VENV with no signal present track with temperature. For dc-coupled envelope output, EREF should be used as a reference giving the true envelope voltage of VENV − VEREF. For ac coupling of the envelope output, the VENV pin can drive a 50 Ω load, if maximum current drive capability of 15 mA is not exceeded. See the Output Drive Capability and Buffering section for more information. RMS Output Pin. This voltage is ground referenced and has a nominal swing of 0 V to 3.8 V. VRMS has a linearin-V/V transfer function with a nominal slope of 2 V/V. RMS Averaging Capacitor. Connect between FLT4 and VPOS. Supply Voltage Pin. Operational range is 4.75 V to 5.25 V with a supply current of 21.5 mA. Exposed Pad. The exposed pad should be connected to both thermal and electrical grounds. Rev. A | Page 8 of 28 Data Sheet ADL5511 TYPICAL PERFORMANCE CHARACTERISTICS TA = 25°C, VPOS = 5 V, CFLT4 = 100 nF, 75 Ω shunt termination resistor to ground on (ac-coupled) RFIN, TA = +25°C (black), −40°C (blue), +85°C (red), three-point calibration on VENV and VRMS at +5 dBm, −15 dBm, and −26 dBm, unless otherwise noted. 10 1 10 100MHz 900MHz 1900MHz 2140MHz 2600MHz 3500MHz 6000MHz 100MHz 900MHz 1900MHz 2140MHz 2600MHz 3500MHz 6000MHz OUTPUT (V) OUTPUT (V) 1 0.1 0.1 –25 –20 –15 –10 –5 0 5 10 15 20 INPUT (dBm) 0.01 –30 09602-003 0.001 –30 –20 –15 –10 –5 0 5 10 15 20 INPUT (dBm) Figure 7. VRMS Output vs. Input Level, at Various Frequencies at 25°C, Supply 5 V Figure 4. VENV Output vs. Input Level, at Various Frequencies at 25°C, Supply 5 V 10 –25 09602-006 0.01 10 5V, –40°C 5V, +25°C 5V, +85°C 5V, –40°C 5V, +25°C 5V, +85°C 1 OUTPUT (V) OUTPUT (V) 1 0.1 0.1 –20 –15 –10 –5 0 5 10 15 20 INPUT (dBm) 0.01 –30 65 –5 0 5 10 15 20 3.0 450 –40°C +25°C +85°C 2.8 400 2.6 2.4 350 SHUNT RESISTANCE (Ω) 55 50 45 40 35 30 25 20 2.2 300 2.0 1.8 250 1.6 1.4 200 1.2 150 1.0 SHUNT RESISTANCE 0.8 100 15 10 0.6 0.4 50 5 0.2 SHUNT CAPACITANCE –25 –20 –15 –10 –5 0 5 10 15 INPUT (dBm) 20 0 09602-005 SUPPLY CURRENT (mA) –10 Figure 8. VRMS Output vs. Input Level and Temperature at 1900 MHz, Supply 5 V 60 0 –30 –15 0 1 2 3 4 5 FREQUENCY (GHz) Figure 6. Supply Current vs. Input Level and Temperature Figure 9. Input Impedance vs. Frequency Rev. A | Page 9 of 28 SHUNT CAPACITANCE (pF) 70 –20 INPUT (dBm) Figure 5. VENV Output vs. Input Level and Temperature at 1900 MHz, Supply 5 V 75 –25 6 0 09602-008 –25 09602-004 0.001 –30 09602-007 0.01 Data Sheet 3 2 2 1 1 –1 –1 –2 –2 –25 –20 –15 –10 –5 0 5 10 15 PIN (dBm) –3 –30 2 1 1 ERROR (dB) 2 0 –1 –2 –2 –15 –10 –5 PIN (dBm) 0 5 10 15 –3 –30 Figure 11. VRMS Output Temperature Drift from +25°C, Three-Point Calibration for Multiple Devices at −40°C, +25°C, and +85°C at 100 MHz 2 2 1 1 ERROR (dB) 3 0 –1 –2 –2 –15 –10 –5 PIN (dBm) 0 5 10 15 –3 –30 09602-011 –20 0 5 10 15 –25 –20 –15 –10 –5 PIN (dBm) 0 5 10 15 0 –1 –25 –5 Figure 14. VRMS Output Delta from +25°C Output Voltage for Multiple Devices at −40°C and +85°C at 100 MHz 3 –3 –30 –10 0 –1 09602-010 ERROR (dB) 3 –20 –15 Figure 13. VENV Output Delta from +25°C Output Voltage for Multiple Devices at −40°C and +85°C at 100 MHz 3 –25 –20 PIN (dBm) Figure 10. VENV Output Temperature Drift from +25°C, Three-Point Calibration for Multiple Devices at −40°C, +25°C, and +85°C at 100 MHz –3 –30 –25 –25 –20 –15 –10 –5 0 5 10 15 PIN (dBm) Figure 12. VENV Output Temperature Drift from +25°C, Three-Point Calibration for Multiple Devices at −40°C, +25°C, and +85°C at 900 MHz Rev. A | Page 10 of 28 09602-013 –3 –30 ERROR (dB) 0 Figure 15. VENV Output Delta from +25°C Output Voltage for Multiple Devices at −40°C and +85°C at 900 MHz 09602-014 0 09602-012 ERROR (dB) 3 09602-009 ERROR (dB) ADL5511 ADL5511 3 2 2 1 1 –1 –1 –2 –2 –25 –20 –15 –10 –5 PIN (dBm) 0 5 10 15 –3 –30 2 1 1 ERROR (dB) 2 0 –1 –2 –2 –15 –10 –5 0 5 10 15 PIN (dBm) –3 –30 2 2 1 1 ERROR (dB) 3 0 –1 –2 –2 –10 –5 PIN (dBm) 0 5 10 15 –3 –30 09602-030 –15 5 10 15 –25 –20 –15 –10 –5 0 5 10 15 0 –1 –20 0 Figure 20. VENV Output Delta from +25°C Output Voltage for Multiple Devices at −40°C and +85°C at 1900 MHz 3 –25 –5 PIN (dBm) Figure 17. VENV Output Temperature Drift from +25°C, Three-Point Calibration for Multiple Devices at −40°C, +25°C, and +85°C at 1900 MHz –3 –30 –10 0 –1 09602-029 ERROR (dB) 3 –20 –15 Figure 19. VRMS Output Delta from +25°C Output Voltage for Multiple Devices at −40°C and +85°C at 900 MHz 3 –25 –20 PIN (dBm) Figure 16. VRMS Output Temperature Drift from +25°C, Three-Point Calibration for Multiple Devices at −40°C, +25°C, and +85°C at 900 MHz –3 –30 –25 –25 –20 –15 –10 –5 0 5 10 15 PIN (dBm) Figure 18. VRMS Output Temperature Drift from +25°C, Three-Point Calibration for Multiple Devices at −40°C, +25°C, and +85°C at 1900 MHz Rev. A | Page 11 of 28 09602-032 –3 –30 ERROR (dB) 0 Figure 21. VRMS Output Delta from +25°C Output Voltage for Multiple Devices at −40°C and +85°C at 1900 MHz 09602-033 0 09602-031 ERROR (dB) 3 09602-015 ERROR (dB) Data Sheet Data Sheet 3 2 2 1 1 –1 –1 –2 –2 –25 –20 –15 –10 –5 0 5 10 15 PIN (dBm) –3 –30 2 1 1 ERROR (dB) 2 0 –1 –2 –2 –15 –10 –5 0 5 10 15 PIN (dBm) –3 –30 2 2 1 1 ERROR (dB) 3 0 –1 –2 –2 –10 –5 PIN (dBm) 0 5 10 15 –3 –30 09602-036 –15 5 10 15 –25 –20 –15 –10 –5 0 5 10 15 0 –1 –20 0 Figure 26. VRMS Output Delta from +25°C Output Voltage for Multiple Devices at −40°C and +85°C at 2140 MHz 3 –25 –5 PIN (dBm) Figure 23. VRMS Output Temperature Drift from +25°C, Three-Point Calibration for Multiple Devices at −40°C, +25°C, and +85°C at 2140 MHz –3 –30 –10 0 –1 09602-035 ERROR (dB) 3 –20 –15 Figure 25. VENV Output Delta from +25°C Output Voltage for Multiple Devices at −40°C and +85°C at 2140 MHz 3 –25 –20 PIN (dBm) Figure 22. VENV Output Temperature Drift from +25°C, Three-Point Calibration for Multiple Devices at −40°C, +25°C, and +85°C at 2140 MHz –3 –30 –25 –25 –20 –15 –10 –5 0 5 10 15 PIN (dBm) Figure 24. VENV Output Temperature Drift from +25°C, Three-Point Calibration for Multiple Devices at −40°C, +25°C, and +85°C at 2600 MHz Rev. A | Page 12 of 28 09602-038 –3 –30 ERROR (dB) 0 Figure 27. VENV Output Delta from +25°C Output Voltage for Multiple Devices at −40°C and +85°C at 2600 MHz 09602-039 0 09602-037 ERROR (dB) 3 09602-034 ERROR (dB) ADL5511 ADL5511 3 2 2 1 1 –1 –1 –2 –2 –25 –20 –15 –10 –5 0 5 10 15 PIN (dBm) –3 –30 2 1 1 ERROR (dB) 2 0 –1 –2 –2 –15 –10 –5 0 5 10 15 PIN (dBm) –3 –30 2 2 1 1 ERROR (dB) 3 0 –1 –2 –2 –10 –5 PIN (dBm) 0 5 10 15 –3 –30 09602-042 –15 5 10 15 –25 –20 –15 –10 –5 0 5 10 15 0 –1 –20 0 Figure 32. VENV Output Delta from +25°C Output Voltage for Multiple Devices at −40°C and +85°C at 3500 MHz 3 –25 –5 PIN (dBm) Figure 29. VENV Output Temperature Drift from +25°C Linear Reference for Multiple Devices at −40°C, +25°C, and +85°C, 3500 MHz Frequency –3 –30 –10 0 –1 09602-041 ERROR (dB) 3 –20 –15 Figure 31. VRMS Output Delta from +25°C Output Voltage for Multiple Devices at −40°C and +85°C at 2600 MHz 3 –25 –20 PIN (dBm) Figure 28. VRMS Output Temperature Drift from +25°C Linear Reference for Multiple Devices at −40°C, +25°C, and +85°C, 2600 MHz Frequency –3 –30 –25 –25 –20 –15 –10 –5 0 5 10 15 PIN (dBm) Figure 30. VRMS Output Temperature Drift from +25°C Linear Reference for Multiple Devices at −40°C, +25°C, and +85°C, 3500 MHz Frequency Rev. A | Page 13 of 28 09602-044 –3 –30 ERROR (dB) 0 Figure 33. VRMS Output Delta from +25°C Output Voltage for Multiple Devices at −40°C and +85°C at 3500 MHz 09602-045 0 09602-043 ERROR (dB) 3 09602-040 ERROR (dB) Data Sheet Data Sheet 3 3 2 2 1 1 ERROR (dB) 0 –1 –1 –2 –15 –10 –5 0 5 10 15 PIN (dBm) –3 –30 2 2 1 1 ERROR (dB) 3 0 –2 –2 –10 –5 0 5 10 15 PIN (dBm) 09602-047 –1 –15 –3 –30 10 0 –10 –20 –30 –40 –50 –30 –25 –20 –15 –10 –5 RFIN (dBm) 0 5 10 15 09602-020 –60 –80 –35 0 5 10 15 –25 –20 –15 –10 –5 0 5 10 15 Figure 38. VRMS Output Delta from +25°C Output Voltage for Multiple Devices at −40°C and +85°C at 6000 MHz NORMALIZED VENV FREQUENCY RESPONSE (dB) 20 –70 –5 PIN (dBm) Figure 35. VRMS Output Temperature Drift from +25°C Linear Reference for Multiple Devices at −40°C, +25°C, and +85°C, 6000 MHz Frequency THD (dBc) CARRIER SUPPRESSION (dBc) ENVELOPE GAIN (dB) –10 0 –1 –20 –15 Figure 37. VENV Output Delta from +25°C Output Voltage for Multiple Devices at −40°C and +85°C at 6000 MHz 3 –25 –20 PIN (dBm) Figure 34. VENV Output Temperature Drift from +25°C Linear Reference for Multiple Devices at −40°C, +25°C, and +85°C, 6000 MHz Frequency –3 –30 –25 2 –40°C +25°C +85°C 0 –2 –4 –6 –8 –10 –12 –14 –16 1 10 100 ENVELOPE FREQUENCY (MHz) Figure 36. THD on VENV vs. RF Input Level; 1900 MHz RF Input, AM Modulated by a 20 MHz Sine Wave (Modulation Index = 0.25), VENV Output AC-Coupled into a 50 Ω Spectrum Analyzer Load 09602-016 –20 09602-017 –25 09602-046 –2 –3 –30 ERROR (dB) 0 1000 09602-065 ERROR (dB) ADL5511 Figure 39. Normalized VENV Frequency Response, VENV AC-Coupled into a 50 Ω Spectrum Analyzer Load Rev. A | Page 14 of 28 Data Sheet ADL5511 PULSED RFIN 1 VENBL 4 VENV +5dBm VENV +1dBm –3dBm +5dBm +1dBm –10dBm –3dBm –10dBm 2 M10ns T A CH2 1.88V 111.6ns Figure 40. VENV Output Response to Various RF Input Pulse Levels 900 MHz Frequency REF1 CH4 7V 250mV 1µs M1µs A CH4 T 3.996µs 3.78V 09602-026 CH1 200mV Ω CH3 125mV Ω REF4 125mV 10ns 09602-023 R1 Figure 43. VENV Output Response to Enable Gating at Various RF Input Levels, 900 MHz Frequency 2 PULSED RFIN VENBL 4 +5dBm +1dBm VRMS VRMS +5dBm –3dBm +1dBm –3dBm –10dBm –10dBm R4 M1µs A CH4 T –824ns 2.2V Figure 41. VRMS Output Response to Various RF Input Pulse Levels 900 MHz Frequency, CFLT4 = Open REF1 CH4 7V 220mV 1µs M1µs A CH4 T 4.012µs 3.78V 09602-027 CH2 200mV Ω REF4 125mV 1µs 09602-024 R1 Figure 44. VRMS Output Response to Enable Gating at Various RF Input Levels, 900 MHz Frequency, CFLT4 = Open 2 VENBL 4 PULSED RFIN +5dBm +5dBm –3dBm dBc VRMS VRMS +1dBm +1dBm –3dBm –10dBm –10dBm R4 CH2 200mV Ω M100µs A CH4 125mV 100µs T –100.5µs 2.2V Figure 42. VRMS Output Response to Various RF Input Pulse Levels, 900 MHz Frequency, CFLT4 = 100 nF REF4 CH4 7V 220mV 40µs M40µs A CH4 T 160.4µs 3.78V 09602-028 REF4 09602-025 R4 Figure 45. VRMS Output Response to Enable Gating at Various RF Input Levels, 900 MHz Frequency, CFLT4 = 100 nF Rev. A | Page 15 of 28 ADL5511 Data Sheet 3 2 ERROR (dB) 1 0 0 –1 –1 –2 –2 –3 –25 –20 –15 –10 –5 0 INPUT (dBm) 5 10 15 –3 –25 09602-021 ERROR (dB) 1 CW QAM64 QPSK 1CWCDMA 4CWCDMA LTE –20 –15 –10 –5 INPUT (dBm) Figure 46. VRMS Error from CW Linear Reference vs. Signal Modulation, Frequency = 900 MHz, CLPF = 0.1 µF (CW, QPSK, QAM64, 1CW-CDMA, 4CW-CDMA, LTE Test Model E-TM1_1_20MHz) 0 5 10 15 09602-022 2 3 CW QAM64 QPSK 1CWCDMA 4CWCDMA LTE Figure 47. VRMS Error from CW Linear Reference vs. Signal Modulation, Frequency = 2140 MHz, CLPF = 0.1 µF (CW, QPSK, QAM64, 1CW-CDMA, 4CW-CDMA, LTE Test Model E-TM1_1_20MHz) Rev. A | Page 16 of 28 Data Sheet ADL5511 CIRCUIT DESCRIPTION RMS CIRCUIT DESCRIPTION The ADL5511 employs a proprietary rectification technique to strip off the carrier of an input signal to reveal the true envelope. In this first detection stage, the carrier frequency is doubled and an on-chip two-pole passive low-pass filter accurately preserves the envelope and filters out the carrier. The poles of this filter, as defined by the on-chip RC filters (0.4 pF, 400 Ω, 0.8 pF, 250 Ω) values allow some carrier leakthrough for common RF frequencies. This is to ensure that maximum envelope bandwidth can be maintained. For more details, see the Basic Connections section. The rms processing is done using a proprietary translinear technique. This method is a mathematically accurate rms computing approach and achieves unprecedented rms accuracies for complex modulation signals irrespective of the crest factor of the input signal. An integrating filter capacitor does the square-domain averaging. The VRMS output can be expressed as T2 ∫ VIN × dt 2 VPOS VRMS = A × 15 T1 ADL5511 400Ω BIAS AND POWERDOWN CONTROL ENBL 4 RFIN 2 20pF RMS G = 1.7 ENVELOPE G = 1.5 100 Ω 14 FLT4 11 VRMS 10 VENV 9 EREF FLT1 3 250Ω 5pF 400Ω 6 VPOS 7 8 NC 12 The on-chip rms filtering corner is internally set by a 400 Ω resistor and a 20 pF capacitor, yielding a corner frequency of approximately 20 MHz. Whereas this filters out all carrier frequencies, most of the modulation envelope is not filtered. For adequate rms filtering, connect an external filter capacitor between FLT4 (Pin 14) and VPOS (Pin 15). This capacitance acts on the internal 400 Ω resistor (see Figure 48) to yield a new corner frequency for the rms filter given by 0.8pF VPOS 13 RMS FILTERING 16 1 5 FLT2 FLT3 COMM 09602-049 0.4pF (1) Note that A is a scaling parameter that is decided on by the on-chip resistor ratio, and there are no other scaling parameters involved in this computation, which means that the rms output is inherently free from any sources of error due to temperature, supply, and process variation. 250Ω 10kΩ T2 − T1 Figure 48. Block Diagram The extracted envelope is further processed in two parallel channels, one computing the rms value of the envelope and the other transferring the envelope with appropriate scaling to the envelope output. C FLT4 = ENVELOPE PROPAGATION DELAY The delay specified in this data sheet is with no external capacitor at the FLT2 and FLT3 pins. The delay through the ADL5511, although very small, depends upon a number of factors, notable of which are internal filter component values and op amp compensation capacitors. The delay will vary from part to part by approximately ±15% due to process variations. In addition, the choice of external FLT2 and FLT3 values, as well as load on the VNEV pin will increase the delay. In this case, the delay variation will be dominated by the part-to-part tolerance of the external capacitors. 1 − 20 pF ( 2π × f RMS × 400 Ω) (2) For example, a supply-referenced 0.1 µF capacitor on FLT4 reduces the corner frequency of the rms averaging circuit to approximately 4 kHz. RMS filtering has a direct impact on rms accuracy. For most accurate detection, the rms filter corner should be low enough to filter out most of the modulation content. This will correspond to a corner frequency that is significantly lower than the bandwidth of the signal being measured. See the Choosing a Value for the RMS Averaging Capacitor (CFLT4) section for more details and filtering options. Rev. A | Page 17 of 28 ADL5511 Data Sheet OUTPUT DRIVE CAPABILITY AND BUFFERING The envelope output of the ADL5511 is presented on the VENV pin as a single-ended buffered output with low output impedance. To achieve high envelope bandwidth, this output is not ground referenced, unlike the VRMS output, which is ground referenced. The VENV output has a no signal dc value of about 1.1 V. This dc reference is temperature dependent and is presented as a standalone reference voltage on the EREF pin and as a buffered output. The true envelope at any instant of time is simply (VENV − VEREF), but these two pins do not constitute a differential output. EREF is a fixed dc voltage and VENV carries all the envelope information. The VENV output is capable of supporting a parallel load of 500 Ω and 10 pF at full-scale envelope output and maximum bandwidth. Lighter loads (higher R and lower C) are always recommended whenever possible to minimize power consumption and achieve maximum possible bandwidth. The maximum source/sink current capacity of the VNEV output is 15 mA peak and load conditions should be such that this is not exceeded. The maximum output voltage at this pin is approximately (VPOS − 1.5) V. For the case of ac coupling only, the VENV output can drive a 50 Ω load, as long as the maximum signal swing does not exceed an amplitude of approximately 1.5 V p-p. This corresponds to the peak signal current of 15 mA into the 50 Ω load. If a 50 Ω drive capability is desired, the maximum input signal to ADL5511 should be adjusted, such that this output swing condition is not exceeded. A 50 Ω load should never be dc coupled to the VENV output, as it presents a current draw of >20 mA even for no-signal condition corresponding to 1.1 V nominal dc voltage at the VENV pin. The VRMS buffered output can source a maximum current of 3 mA, but is not designed to sink any appreciable amount of current. If current sink capability is desired at this pin, a shunt resistance to ground can be connected. The VRMS output has an on-chip series resistance of 100 Ω, to allow a low-pass filtering of the residual ripple using a single shunt capacitor at this pin. Large shunt capacitors at this pin may also require a shunt resistor to be placed to allow fast discharging of the capacitor. The internal shunt resistance on the VRMS pin is 10 kΩ. Note that any shunt resistance placed on this pin creates a resistive divider with the on-chip 100 Ω series resistance. The EREF output buffer also has 3 mA current sourcing capability. The internal shunt resistance on this pin through which any current must be sunk, is 12 kΩ. A capacitor to ground can be placed on this pin to eliminate any RF or envelope ripple at this pin to ensure that voltage at this pin acts as a clean reference for the VENV output for all possible carrier and envelope frequencies. Viewing the Envelope on an Oscilloscope When viewing the VENV output on an oscilloscope, use a low capacitive FET probe. This reduces the capacitance presented to the VENV output and avoids the corresponding effects of larger capacitive loads. Rev. A | Page 18 of 28 Data Sheet ADL5511 APPLICATIONS INFORMATION +5V C14 0.1µF C13 100pF VPOS 15 ADL5511 R5 75Ω RFIN FLT1 20pF 14 RMS G = 1.7 ENVELOPE G = 1.5 100 Ω 11 FLT4 C17 0.1µF VPOS VRMS RMS OUTPUT VENV ENVELOPE OUTPUT EREF ENVELOPE REFERENCE 2 250Ω 10kΩ 10 3 C2 100pF 250Ω 5pF 9 400Ω 0.4pF 0.8pF VPOS 13 6 VPOS 8 7 12 16 FLT2 NC C10 (SEE TEXT) 1 5 FLT3 COMM C6 (SEE TEXT) VPOS 09602-050 C1 100pF 400Ω BIAS AND POWERDOWN CONTROL ENBL 4 Figure 49. Basic Connections BASIC CONNECTIONS Basic connections for operation of the ADL5511 are shown in Figure 49. The ADL5511 requires a single supply of 5 V. The supply is connected to the VPOS supply pin. Decouple this pin using two capacitors with values equal or similar to those shown in Figure 49. Place these capacitors as close as possible to the VPOS pin. An external 75 Ω resistor combines with the relatively high RF input impedance of the ADL5511 to provide a broadband 50 Ω match. Place an ac coupling capacitor between this resistor and RFIN. The envelope output is available on Pin 10 (VENV) and is referenced to the 1.1 V dc voltage on Pin 9 (EREF). The rms output voltage is available at the VRMS pin with rms averaging provided by the supply-referenced capacitance on Pin 14 (FLT4). ground referenced capacitor to Pin 3 (FLT1). The value of the external capacitance is set using the following equation: CFLT1 = As part of the internal signal processing algorithm, the RF input signal passes through a low-pass filter comprising of a 10 kΩ resistor and a 5 pF capacitor (see Figure 49). This corresponds to a corner frequency of approximately 3.2 MHz. If the carrier frequency is less than approximately ten times this value (32 MHz), this corner frequency must be reduced. The internal 5 pF capacitance can be augmented by connecting a (3) For example, a 100 pF capacitance on FLT1 will reduce the corner frequency to 150 kHz. As a general guideline, this corner frequency should be set to be at least one tenth of the minimum expected carrier frequency. This ensures a flat frequency response around the frequency of interest. The envelope detection path of the ADL5511 includes internal carrier-suppression low-pass filtering. With the FLT2 and FLT3 pins not connected, two internal 1 GHz and 800 MHz low-pass filters (operating in series) remove the RF carrier from the envelope output signal. The equations for these filters are as follows: OPERATION BELOW 1 GHZ/ENVELOPE FILTERING To operate the ADL5511 at frequencies below 1 GHz, a number of external capacitors must be added to the FLT3, FLT2, and FLT1 pins. These changes are in addition to the choice of an appropriate rms averaging capacitor, see the Choosing a Value for the RMS Averaging Capacitor (CFLT4) section. 1 − 5 pF (2π × f 3dB × 10,000 Ω) 1 ≅ 1 GHz (2π × 0.4 pF × 400 Ω) (4) 1 ≅ 800 MHz ( 2π × 0.8 pF × 250 Ω) (5) and Because the envelope detection circuitry includes a full-wave rectifier, this filter has to primarily suppress the signal at twice the original input frequency. Rev. A | Page 19 of 28 ADL5511 Data Sheet For input frequencies in the 900 MHz range, there will still be significant carrier content on the envelope output. With the two filters providing a combined 6 dB roll-off at approximately 900 MHz and with the residual carrier at 1.8 GHz, carrier filtering of approximately 18 dB can be expected (the two single-pole filters provide a combined roll-off of 12 dB per octave. The internal filtering of the carrier in the envelope detection path can be augmented by adding additional supply-referenced capacitance to the FLT2 and FLT3 pins. The required capacitance can be calculated using the following equations: C FLT2 = 1 ( 2π × f FLT2 × 400 Ω) − 0.4 pF (6) − 0.8 pF (7) and C FLT3 = 1 ( 2π × f FLT3 × 250 Ω) where fLT2 and fLT3 are the desired corner frequencies. For example, to set the corner frequency to 200 MHz, CFLT2 and CFLT3 should be set to 1.6 pF and 2.4 pF, respectively. The two corner frequencies should be set so that they are approximately equal. Care should be taken not to set the corner frequency of this carrier suppression filter too low as it will start to degrade envelope bandwidth. The ADL5511 has an envelope bandwidth of 130 MHz. Thus, if the capacitors on FLT2 and FLT3 are so big that the carrier-suppression corner frequency approaches 130 MHz, the carrier filtering effort will directly impact the envelope bandwidth. Thus, the corner frequency should be set low enough so that the RF carrier is adequately removed from the envelope output while still maintaining the desired envelope bandwidth. An alternative option would be to filter the carrier at the VENV output using a higher order filter. CHOOSING A VALUE FOR THE RMS AVERAGING CAPACITOR (CFLT4) CFLT4 provides the averaging function for the internal rms computation, the result of which is available at the VRMS output. As already noted, the on-chip rms filtering corner is internally set by a 400 Ω resistor and a 20 pF capacitor, yielding a corner frequency of approximately 20 MHz. For adequate rms filtering, connect an external filter capacitor between FLT4 (Pin 14) and VPOS (Pin 15). This capacitance acts on the internal 400 Ω resistor to yield a new corner frequency for the rms filter given by the following equation: C FLT4 = 1 − 20 pF ( 2 π × f FLT 4 × 400 Ω) (8) For example, a supply-referenced 0.1 µF capacitor on FLT4 reduces the corner frequency of the rms averaging circuit to approximately 4 kHz. The size of the rms filtering capacitor has a direct impact on the rms accuracy up to a point. For most accurate detection, the rms filter corner should be low enough to filter out most of the modulation content. This corresponds to a corner frequency that is significantly less than the bandwidth of the signal being measured. Table 4 shows recommended minimum values of CFLT4 for popular modulation schemes. Using smaller capacitor values than these will result in rms measurement errors; using higher values will not further improve rms accuracy but will reduce the output noise on VRMS at the expense of increased rise and fall times. In Table 4, rise and fall times are also shown along with residual output noise. The recommended minimum values for CFLT4 were experimentally determined by starting out with a large capacitance value on the FLT4 pin (for example, 10 µF). The value of VRMS was noted for a fixed input power level (for example, 0 dBm). The value of CFLT4 was then progressively reduced (this can be done with press-down capacitors) until the value of VRMS started to deviate from its original value (this indicates that the accuracy of the rms computation is degrading and that CFLT4 is becoming too small). The recommended minimum value for CFLT4 is roughly inversely proportional to the bandwidth of the input signal, that is, wider bandwidth signals tend to require smaller minimum filter capacitances. As already noted, the value of CFLT4 sets up an internal low pass corner frequency, which filters the rms voltage. As carrier bandwidth increases, a larger proportion of the residual noise (which has been effectively mixed down to baseband) is filtered away. This results in smaller capacitances being required as carrier bandwidths increase. Table 4. Recommended Minimum CFLT4 Values for Various Modulation Schemes (Pin = 0 dBm) Modulation/Standard W-CDMA, One-Carrier, TM1-64 W-CDMA Four-Carrier, TM1-64, TM1-32, TM1-16, TM1-8 LTE Test Model E-TM1_1_4MHz LTE Test Model E-TM1_1_10MHz LTE Test Model E-TM1_1_20MHz PEP to RMS Ratio 9.83 dB 12.08 dB Signal Bandwidth 3.84 MHz 18.84 MHz CFLT4 (Min) 220 nF 100 nF Output Noise 98 mV p-p 140 mV p-p Rise/Fall Time (10% to 90%) 82 µs/310 µs 40 µs/140 µs 9.83 dB 11.99 dB 11.58 dB 4 MHz 10 MHz 20 MHz 220 nF 100 nF 47 nF 135 mV p-p 89 mV p-p 90 mV p-p 82 µs/310 µs 40 µs/140 µs 20 µs/70 µs Rev. A | Page 20 of 28 Data Sheet ADL5511 improves until it sharply degrades at an input power level of approximately 13 dBm. This sharp decrease is caused by the clipping of the AM signal’s peak envelope. Figure 51 also shows carrier leakage at VENV in dBc with respect to the input carrier amplitude. For applications that are not response time critical, a relatively large capacitor can be placed on the FLT4. There is no maximum capacitance limit for CFLT4. Figure 50 shows how output noise, rise time and fall time vary vs. CFLT4 when the ADL5511 is driven by an 1.9 GHz LTE carrier with a bandwidth of 10 MHz (LTE Test Model E-TM1_1_10MHz, peak-to-average ratio = 11.99 dB). 800 600 100000 500 10000 400 1000 300 100 200 10 100 1 0 10 0.1 1000 100 TIME DOMAIN ENVELOPE TRACKING ACCURACY The envelope tracking accuracy of the ADL5511 can also be assessed in the time domain by looking at the input peak power levels that cause clipping. 09602-066 1 RISE/FALL TIME (µs) 10000000 OUTPUT NOISE (mV p-p) 10% TO 90% RISE TIME (µs) 90% TO 10% FALL TIME (µs) 1000000 700 OUTPUT NOISE (mV p-p) This measurement, when conducted over the full input power range of the ADL5511, suffers from measurement inaccuracies of the input modulated signal due to the spectrum analyzer’s noise floor and therefore does not accurately reveal the ADL5511’s limitations at the lower end of the measurement range. In addition to this, the process of generating an AM signal for this test (using the ADL5390 multiplier) is not perfect and resulted in a source signal whose envelope was not harmonically pure. CFLT4 (nF) Figure 50. Output Noise, Rise and Fall Times vs. CFLT4 Capacitance, 10 MHz BW LTE Carrier (LTE Test Model E-TM1_1_10MHz) at 1.9 GHz with PIN = 0 dBm ENVELOPE TRACKING ACCURACY The envelope tracking accuracy of the ADL5511 is measured in terms of the higher order distortion of the envelope output when the RF input signal is AM modulated using a low-harmonic sinusoid at a given frequency. Such an input sinusoidal envelope has been generated using the ADL5390 multiplier modulator. This generates a double sideband AM modulated signal of a known modulation index. In this measurement, the ADL5511 acts as free-running AM demodulator without requiring a local oscillator to demodulate the signal. 20 The usable rms input power range of the ADL5511 varies depending on the desired accuracy level and the peak-toaverage ratio of the input signal. Figure 4 shows the linear operating range of the VENV output when the RF input is driven by unmodulated sine waves at various frequencies. This shows operation up to rms input levels of approximately 19 dBm. If the signal has a peak-to-average ratio that is greater than the square root of two, the usable input range on RFIN will decrease. In general, the maximum input power for linear operation should be determined by the peak envelope power (PEP) of the input signal. Figure 52 shows the time-domain response of the VENV output to a 900 MHz LTE carrier with a bandwidth of 20 MHz (Test Model E-TM1_2_20MHz). The signal level of the carrier (7 dBm rms, 19 dBm PEP) was deliberately increased until clipping was observed at the VENV output. Note that the peak envelope power of a signal is derived based on the rms level of the signal during a peak cycle, that is V p-p/√2. For example, a signal that achieves a peak voltage of 10 V (or 20 V p-p) has a PEP of 30 dBm. According to this definition, the PEP of a sine wave is equal to its rms power level because it has a constant envelope. 10 0 –10 –20 –30 –40 –50 –70 THD (dBc) CARRIER SUPPRESSION (dBc) ENVELOPE GAIN (dB) –80 –35 –30 –25 –20 –15 –10 –5 RFIN (dBm) 0 5 10 15 09602-069 –60 Figure 51 shows such a plot total harmonic distortion (THD) of the VENV output vs. RF input power for the modulation index of 0.25. As the input power level increases, the THD 09602-055 Figure 51. THD on VENV vs. RF Input Level; 1900 MHz RF Input, AM Modulated by a 20 MHz Sine Wave (Modulation Index = 0.25), VENV Output AC-Coupled into a 50 Ω Spectrum Analyzer Load Figure 52. VENV Response to a 20 MHz LTE Carrier with a PEP of 19 dBm that has been Triggered to Capture the Envelope’s Peak Level Rev. A | Page 21 of 28 ADL5511 Data Sheet VRMS AND VENV OUTPUT OFFSET DEVICE CALIBRATION AND ERROR CALCULATION The 900 MHz RF power sweeps in Figure 53 and Figure 54 show distributions of the VRMS and VENV outputs voltages for multiple devices at 25°C. The VRMS output response flattens out at approximately −30 dBm while the various VENV response traces begin to fanout unpredictably (Figure 4 and Figure 7 show this behavior at other frequencies). While these plots suggest that operation at input levels down to −30 dBm is feasible, account must also be taken for variations over temperature. Figure 10 to Figure 38 show how the linearity error starts to increase below input levels of −20 dBm (the size of the error varies between VENV and VRMS and with frequency). Because slope and intercept vary from device to device, calibration must be performed to achieve high accuracy. In general, calibration is performed by applying two or more known input power levels to the ADL5511 and measuring the corresponding output voltages. The calibration points are generally chosen to be within the linear operating range of the device. For a two-point calibration, the conversion gain (or slope) and intercept are calculated for VRMS and VENV using the following equations: VRMS (mV) 100 10 –20 –10 0 10 Once slope and intercept are calculated, an equation can be written that allows calculation of the input rms or envelope level using the following equations: 09602-067 –30 INPUT (dBm) Figure 53. VRMS Output vs. Input Level Distribution of 50 Devices, 900 MHz Frequency VINRMS = (VRMS − InterceptVRMS)/SlopeRMS (11) VINENV = (VENV − InterceptVENV)/SlopeVENV (12) The law conformance error, that is, the difference between the actual input level (VIN_IDEAL) and the measured/calculated input level (VMEASURED), of these calculations can be calculated using the following equation: 10000 1000 Error (dB) = 20 × log [(VMEASURED − Intercept)/(Slope × VIN_IDEAL)] 100 –30 –20 –10 0 10 INPUT (dBm) 09602-068 10 1 –40 (10) Because the gain and intercept of the rms and envelope paths will be different, both paths should be calibrated, that is, with a measured signal applied to RFIN, VENV, and VRMS. To ensure that the voltage at VENV and VRMS is a steady-state value, a constant envelope signal such as a sine wave should be used as the source during calibration. 1000 VENV (mV) Intercept = VOUT1 − (Slope × VIN1) (9) where: VIN is the rms input voltage to RFIN. VOUT is the voltage output at VRMS or VENV. 10000 1 –40 Slope = (VOUT2 − VOUT1)/(VIN2 − VIN1) Figure 54. VENV Output vs. Input Level Distribution of 50 Devices, 900 MHz Frequency Rev. A | Page 22 of 28 (13) Data Sheet ADL5511 Figure 55 is a plot of this error for VENV at 1900 MHz for a multiple devices at +25°C, +85°C, and −40°C with calibration performed at two points, −14 dBm and +5 dBm (notice how the error at 25°C at the calibration points is zero). These error plots for all temperatures are calculated using the 25°C slope and intercept. This is consistent with calibration in a mass production environment where calibration at temperature is generally not practical. 3 ERROR VS. FREQUENCY Figure 57 and Figure 58 show how the VRMS and VENV output voltages and error vary with input frequency when the ADL5511 is calibrated at a single frequency. In this example, the ADL5511 has been calibrated at 25°C at 1.9 GHz. The plots also show how the output voltage and error vary above and below this frequency. –40°C +25°C +85°C 600 6 500 4 400 2 300 0 200 VRMS AT –40°C VRMS AT +25°C VRMS AT +85°C ERROR AT –40°C ERROR AT +25°C ERROR AT +85°C 100 –2 0 –20 –15 –10 –5 PIN (dBm) 0 5 10 15 2000 3000 4000 By adding a third calibration point, the linearity of the ADL5511 can be enhanced at lower power levels. With a three-point calibration, calibration coefficients (slope and intercept) are calculated for each segment (thus, there will be two slopes and two intercepts). Figure 56 shows the same data as Figure 55, but with a threepoint calibration (calibration points at −26 dBm, −15 dBm, and +5 dBm. This helps to extend the usable operating range of the ADL5511 well below −25 dBm. 8 350 6 300 4 250 2 200 0 150 –2 –4 VENV AT –40°C VENV AT +25°C VENV AT +85°C ERROR AT –40°C ERROR AT +25°C ERROR AT +85°C 50 –40°C +25°C +85°C 0 0 1000 2000 –6 3000 4000 FREQUENCY (MHz) 1 ERROR (dB) –6 6000 400 100 2 5000 –8 6000 Figure 58. VENV Output vs. Frequency for a Fixed Input Power, PIN = 0 dBm, Calibration at 1.9 GHz, 25°C 0 –1 –25 –20 –15 –10 –5 PIN (dBm) 0 5 10 15 09602-059 –2 –3 –30 5000 FREQUENCY (MHz) Figure 55. VENV Linearity Error vs. Input Level and Temperature Using a Two-Point Calibration at 1900 MHz 3 1000 –4 Figure 57. VRMS Output vs. Frequency for a Fixed Input Power, PIN = 0 dBm, Calibration at 1.9 GHz, 25°C OUTPUT (mV) –25 0 09602-058 –3 –30 ERROR (dB) –2 –1 ERROR (dB) 0 09602-060 ERROR (dB) 1 09602-061 OUTPUT (mV) 2 Figure 56. VENV Linearity Error vs. Input Level and Temperature Using a ThreePoint Calibration at 1900 MHz Rev. A | Page 23 of 28 ADL5511 Data Sheet EVALUATION BOARD Figure 59 shows the schematic of the ADL5511 evaluation board. This 4-layer board is powered by a single supply in the 4.75 V to 5.25 V range. The power supply is decoupled by 100 pF and 0.1 µF capacitors. The VRMS output is accessible via a clip lead (a pad is also available where an SMA connector is installed). The VENV output is accessible via an SMA connector. For responsetime critical measurements where stray capacitance must be minimized, R2 can be removed and a FET probe can be attached to JP1 (JP1 must be installed). 09602-062 Table 5 details the various configuration options of the evaluation board. Figure 60 and Figure 61 show the bottom side and top side layouts, respectively. The RF input has a broadband match of 50 Ω using a single 75 Ω resistor at R5. Figure 59. Evaluation Board Schematic Rev. A | Page 24 of 28 ADL5511 09602-063 09602-064 Data Sheet Figure 61. Layout of Evaluation Board, Top Side Figure 60. Layout of Evaluation Board, Bottom Side Table 5. Evaluation Board Configuration Options Component VPOS, GND C13, C14 Description Ground and supply vector pins. Power supply decoupling. Nominal supply decoupling of 0.01 µF and 100 pF. C17 RMS filter capacitor (FLT4). The internal rms averaging capacitor can be augmented by placing additional capacitance in C17. RF input interface. The 75 Ω resistor at R5 combines with the ADL5511 internal input impedance to give a broadband input impedance of around 50 Ω. C1 is an ac coupling capacitor, which should be chosen according to nominal carrier frequency. RMS output and output filtering. The combination of C9 and the internal 100 Ω output resistance can be used to form a low-pass filter to reduce the output noise on the VRMS output beyond the reduction due to C17 (capacitor on FLT4). The rms output is available on the VRMS clip-on test point. To observe VRMS using an SMA cable, an SMA connector can be soldered on to the pad labeled VRMS1. R5, C1 R18, C9 R19, C8, R2, JP1 R20, C7 R1, SW1 C6, C10 C2 R3, R14, R15, R16, R17 VENV output and output filtering. The VENV output is available on the VENV SMA connector. If post-envelope filtering is desired, R19 and C8 can be used to form a low-pass filter at the VENV output. R2 can be removed to isolate the JP1 jumper from the VENV SMA connector and JP1 can be installed and used to interface to a FET probe. This helps to eliminate any excessive trace and connector capacitance. Envelope reference output and output filtering. The EREF output is available on the EREF clip-on test point. The dc reference voltage at Pin EREF can be filtered by the low-pass filter formed by the combination of R20 and C7. To observe the EREF voltage using an SMA cable, an SMA connector can be soldered onto the pad labeled EREF1. Device enable. When the switch is set toward the SW1 label, the ENBL pin is connected to VPOS, which enables the ADL5511. In the opposite switch position, the ENBL pin is grounded which disables the ADL5511. Envelope carrier-removal filters (FLT2, FLT3). The corner frequency of the internal VENV two-pole carrier-removal filter can be reduced by placing additional capacitors in C6 and C10. Envelope reference carrier-removal filter (FLT1). The internal filter that removes the carrier from the envelope reference dc voltage can be augmented by placing a capacitor in C2. Alternate interface. The P2 edge connector provides an alternate access point to the various ADL5511 signals. Rev. A | Page 25 of 28 Default Condition Not applicable C13 = 100 pF (Size 0402) C14 = 0.1 µF (Size 0402) C17 = 0.1 µF (Size 0402) R5 = 75 Ω (Size 0402) C1 = 100 pF (Size 0402) R18 = 0 Ω (Size 0402) C9 = open (Size 0402) VRMS clip-on test point = installed VRMS1 SMA connector = open VENV SMA connector = installed R19, R2 = 0 Ω (Size 0402) C8 = open (Size 0402) JP1 = open R20 = 0 Ω (Size 0402) C7 = open (Size 0402) EREF clip-on test point = installed EREF1 SMA connector = open R1 = 0 Ω (Size 0402) SW1 = towards SW1 label C6, C10 = open (Size 0402) C2 = 100 pF (Size 0402) R3, R14, R15, R16, R17 = open (Size 0402) ADL5511 Data Sheet OUTLINE DIMENSIONS 0.30 0.23 0.18 0.50 BSC PIN 1 INDICATOR 16 13 1 12 EXPOSED PAD 1.75 1.60 SQ 1.45 9 TOP VIEW 0.80 0.75 0.70 SEATING PLANE 0.50 0.40 0.30 4 8 5 0.25 MIN BOTTOM VIEW 0.05 MAX 0.02 NOM COPLANARITY 0.08 0.20 REF FOR PROPER CONNECTION OF THE EXPOSED PAD, REFER TO THE PIN CONFIGURATION AND FUNCTION DESCRIPTIONS SECTION OF THIS DATA SHEET. COMPLIANT TO JEDEC STANDARDS MO-220-WEED-6. 08-16-2010-E PIN 1 INDICATOR 3.10 3.00 SQ 2.90 Figure 62. 16-Lead Lead Frame Chip Scale Package [LFCSP_WQ] 3 mm × 3 mm Body, Very Thin Quad (CP-16-22) Dimensions shown in millimeters ORDERING GUIDE Model1 ADL5511ACPZ-R7 ADL5511-EVALZ 1 Temperature Range −40°C to +85°C Package Description 16-Lead Lead Frame Chip Scale Package [LFCSP_WQ] Evaluation Board Z = RoHS Compliant Part. Rev. A | Page 26 of 28 Package Option CP-16-22 Ordering Quantity 1500 Data Sheet ADL5511 NOTES Rev. A | Page 27 of 28 ADL5511 Data Sheet NOTES ©2011–2012 Analog Devices, Inc. All rights reserved. Trademarks and registered trademarks are the property of their respective owners. D09602-0-2/12(A) Rev. A | Page 28 of 28