AD ADG506AKP Cmos 8-/16-channel analog multiplexer Datasheet

a
CMOS
8-/16-Channel Analog Multiplexers
ADG506A/ADG507A
FUNCTIONAL BLOCK DIAGRAM
FEATURES
44 V Supply Maximum Rating
V SS to VDD Analog Signal Range
Single/Dual Supply Specifications
Wide Supply Ranges (10.8 V to 16.5 V)
Extended Plastic Temperature Range
(–40ⴗC to +85ⴗC)
Low Power Dissipation (28 mW max)
Low Leakage (20 pA typ)
Available in 28-Lead DIP, SOIC, PLCC, TSSOP and LCCC
Packages
Superior Alternative to:
DG506A, Hl-506
DG507A, Hl-507
GENERAL DESCRIPTION
The ADG506A and ADG507A are CMOS monolithic analog
multiplexers with 16 channels and dual 8 channels, respectively.
The ADG506A switches one of 16 inputs to a common output,
depending on the state of four binary addresses and an enable
input. The ADG507A switches one of eight differential inputs to
a common differential output, depending on the state of three
binary addresses and an enable input. Both devices have TTL
and 5 V CMOS logic compatible digital inputs.
The ADG506A and ADG507A are designed on an enhanced
LC2MOS process, which gives an increased signal capability of
VSS to VDD and enables operation over a wide range of supply
voltages. The devices can operate comfortably anywhere in the
10.8 V to 16.5 V single or dual supply range. These multiplexers
also feature high switching speeds and low RON.
PRODUCT HIGHLIGHTS
1. Single/Dual Supply Specifications with a Wide Tolerance
The devices are specified in the 10.8 V to 16.5 V range for
both single and dual supplies.
2. Extended Signal Range
The enhanced LC2MOS processing results in a high breakdown and an increased analog signal range of VSS to VDD.
3. Break-Before-Make Switching
Switches are guaranteed break-before-make so input signals
are protected against momentary shorting.
ORDERING GUIDE
Model1
Temperature
Range
Package
Option2
ADG506AKN
ADG506AKR
ADG506AKP
ADG506ABQ
ADG506ATQ
ADG506ATE
–40°C to +85°C
–40°C to +85°C
–40°C to +85°C
–40°C to +85°C
–55°C to +125°C
–55°C to +125°C
N-28
R-28
P-28A
Q-28
Q-28
E-28A
ADG507AKN
ADG507AKR
ADG507AKP
ADG507AKRU
ADG507ABQ
ADG507ATQ
ADG507ATE
–40°C to +85°C
–40°C to +85°C
–40°C to +85°C
–40°C to +85°C
–40°C to +85°C
–55°C to +125°C
–55°C to +125°C
N-28
R-28
P-28A
RU-28
Q-28
Q-28
E-28A
NOTES
1
To order MIL-STD-883, Class B processed parts, add /883B to part number.
See Analog Devices’ Military/Aerospace Reference Manual (1994) for military
data sheet.
2
E = Leadless Ceramic Chip Carrier (LCCC); N = Plastic DIP; P = Plastic
Leaded Chip Carrier (PLCC); Q = Cerdip; R = 0.3" Small Outline IC (SOIC);
RU = Thin Shrink Small Outline Package (TSSOP).
4. Low Leakage
Leakage currents in the range of 20 pA make these multiplexers
suitable for high precision circuits.
REV. C
Information furnished by Analog Devices is believed to be accurate and
reliable. However, no responsibility is assumed by Analog Devices for its
use, nor for any infringements of patents or other rights of third parties
which may result from its use. No license is granted by implication or
otherwise under any patent or patent rights of Analog Devices.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 781/329-4700
World Wide Web Site: http://www.analog.com
Fax: 781/326-8703
© Analog Devices, Inc., 1998
ADG506A/ADG507A–SPECIFICATIONS
Dual Supply (V
DD
= +10.8 V to +16.5 V, VSS = –10.8 V to –16.5 V unless otherwise noted)
Parameter
ANALOG SWITCH
Analog Signal Range
RON
ADG506A
ADG506A
ADG507A
ADG507A
K Version
B Version
–40ⴗC to
–40ⴗC to
+25ⴗC +85ⴗC
+25ⴗC +85ⴗC
ADG506A
ADG507A
T Version
–55ⴗC to
+25ⴗC +125ⴗC
VSS
VDD
280
450
300
VSS
VDD
280
450
VSS
VDD
300
0.6
5
400
RON Drift
RON Match
0.6
5
IS (OFF), Off Input Leakage
0.02
1
0.04
1
1
0.04
1
1
ID (OFF), Off Output Leakage
ADG506A
ADG507A
ID (ON), On Channel Leakage
ADG506A
ADG507A
IDIFF, Differential Off Output
Leakage (ADG507A Only)
DIGITAL CONTROL
VINH, Input High Voltage
VINL, Input Low Voltage
IINL or IINH
CIN Digital Input Capacitance
DYNAMIC CHARACTERISTICS
tTRANSITION 1
tOPEN
1
tON (EN)1
tOFF (EN)
1
OFF Isolation
CS (OFF)
CD (OFF)
ADG506A
ADG507A
QINJ, Charge Injection
POWER SUPPLY
IDD
VSS
VDD
600
400
50
200
100
200
100
0.02
1
0.04
1
1
0.04
1
1
50
200
100
200
100
0.02
1
0.04
1
1
0.04
1
1
600
V1 = ± 10 V, V2 = ⫿10 V; Test Circuit 5
2.4
0.8
1
2.4
0.8
1
2.4
0.8
1
V min
V max
µA max
pF max
10
400
400
200
300
50
25
200
300
200
300
8
400
10
400
400
200
300
50
25
200
300
200
300
VDD = 15 V (± 10%), VSS = –15 V (± 10%)
VDD = 15 V (± 5%), VSS = –15 V (± 5%)
–10 V ≤ VS ≤ +10 V, IDS = 1 mA
–10 V ≤ VS ≤ +10 V, IDS = 1 mA
200
100
200
100
nA max
400
–10 V ≤ VS ≤ +10 V, IDS = 1 mA; Test Circuit 1
V1 = ± 10 V, V2 = ⫿10 V; Test Circuit 2
25
8
Comments
nA typ
nA max
nA typ
nA max
nA max
nA typ
nA max
nA max
50
25
400
10
400
400
ns typ
ns max
ns typ
ns min
ns typ
ns max
ns typ
ns max
V1 = ± 10 V, V2 = ⫿10 V; Test Circuit 3
V1 = ± 10 V, V2 = ⫿10 V; Test Circuit 4
VIN = 0 to VDD
V1 = ± 10 V, V2 = +10 V; Test Circuit 6
Test Circuit 7
Test Circuit 8
Test Circuit 8
68
50
5
68
50
5
68
50
5
dB typ
dB min
pF typ
VEN = 0.8 V, RL = 1 kΩ, CL = 15 pF,
VS = 7 V rms, f = 100 kHz
VEN = 0.8 V
44
22
4
44
22
4
44
22
4
pF typ
pF typ
pC typ
VEN = 0.8 V
0.6
0.6
20
0.6
1.5
20
0.2
Power Dissipation
600
400
V min
V max
Ω typ
Ω max
Ω max
Ω max
%/°C typ
% typ
25
1.5
ISS
VSS
VDD
0.6
5
8
200
300
50
25
200
300
200
300
VSS
VDD
280
450
300
Units
10
20
0.2
10
28
1.5
0.2
10
28
28
RS = 0 Ω, VS = 0 V; Test Circuit 9
mA typ VIN = VINL or VlNH
mA max
µA typ
VIN = VIN or VINH
mA max
mW typ
mW max
NOTES
1
Sample tested at +25°C to ensure compliance.
Specifications subject to change without notice.
–2–
REV. C
Single Supply (V
ADG506A/ADG507A
DD = +10.8 V to +16.5 V, VSS = GND = 0 V unless otherwise noted)
Parameter
ANALOG SWITCH
Analog Signal Range
RON
RON Drift
RON Match
IS (OFF), Off Input Leakage
ID (OFF), Off Output Leakage
ADG506A
ADG507A
ID (ON), On Channel Leakage
ADG506A
ADG507A
IDIFF, Differential Off Output
Leakage (ADG507A Only)
DIGITAL CONTROL
VINH, Input High Voltage
VINL, Input Low Voltage
IINL or IINH
CIN Digital Input Capacitance
DYNAMIC CHARACTERISTICS
tTRANSITION 1
tOPEN
1
tON (EN)1
tOFF (EN)
1
OFF Isolation
CS (OFF)
CD (OFF)
ADG506A
ADG507A
QINJ, Charge Injection
POWER SUPPLY
IDD
ADG506A
ADG506A
ADG507A
ADG507A
K Version
B Version
–40ⴗC to
–40ⴗC to
+25ⴗC +85ⴗC
+25ⴗC +85ⴗC
ADG506A
ADG507A
T Version
–55ⴗC to
+25ⴗC +125ⴗC
Units
VSS
VDD
500
700
0.6
5
VSS
VDD
500
700
0.6
5
V min
V max
Ω typ
0 V ≤ VS ≤ +10 V, IDS = 0.5 mA; Test Circuit 1
Ω max
%/°C typ 0 V ≤ VS ≤ +10 V, IDS = 0.5 mA
% typ
0 V ≤ VS ≤ +10 V, IDS = 0.5 mA
0.02
1
0.04
1
1
0.04
1
1
VSS
VDD
1000
50
200
100
200
100
VSS
VDD
1000
0.02
1
0.04
1
1
0.04
1
1
200
100
200
100
1000
200
100
nA typ
nA max
nA typ
nA max
nA max
nA typ
nA max
nA max
50
200
100
25
25
nA max
2.4
0.8
1
2.4
0.8
1
2.4
0.8
1
V min
V max
µA max
pF max
8
600
10
600
600
8
300
450
50
25
250
450
250
450
300
450
50
25
250
450
250
450
600
10
600
600
600
10
600
600
V1 = +10 V/0 V, V2 = 0 V/ +10 V;
Test Circuit 4
V1 = +10 V/0 V, V2 = 0 V/ +10 V;
Test Circuit 5
VIN = 0 to VDD
ns typ
ns max
ns typ
ns min
ns typ
ns max
ns typ
ns max
V1 = +10 V/0 V, V2 = +10 V; Test Circuit 6
Test Circuit 7
Test Circuit 8
Test Circuit 8
68
50
5
68
50
5
dB typ
dB min
pF typ
VEN = 0.8 V, RL = 1 kΩ, CL = 15 pF,
VS = 3.5 V rms, f = 100 kHz
VEN = 0.8 V
44
22
4
44
22
4
44
22
4
pF typ
pF typ
pC typ
VEN = 0.8 V
0.6
0.6
0.6
10
1.5
1.5
10
10
25
25
25
NOTES
1
Sample tested at +25°C to ensure compliance.
Specifications subject to change without notice.
RS = 0 Ω, VS = 0 V; Test Circuit 9
mA typ VIN = VINL or VlNH
mA max
mW typ
mW max
Truth Table (ADG506A)
Truth Table (ADG507A)
A3
EN On Switch
A2
A1
A0
EN On Switch Pair
0
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
X
0
0
0
0
1
1
1
1
X
0
0
1
1
0
0
1
1
X
0
1
0
1
0
1
0
1
0
1
1
1
1
1
1
1
1
X
0
0
0
0
0
0
0
0
1
1
1
1
1
1
1
1
REV. C
V1 = +10 V/0 V, V2 = 0 V/ +10 V;
Test Circuit 2
V1 = +10 V/0 V, V2 = 0 V/ +10 V;
Test Circuit 3
68
50
5
1.5
Power Dissipation
0.02
1
0.04
1
1
0.04
1
1
50
VSS
VDD
25
8
300
450
50
25
250
450
250
450
VSS
VDD
500
700
0.6
5
Comments
A2
X
0
0
0
0
1
1
1
1
0
0
0
0
1
1
1
1
A1
X
0
0
1
1
0
0
1
1
0
0
1
1
0
0
1
1
A0
X
0
1
0
1
0
1
0
1
0
1
0
1
0
1
0
1
–3–
NONE
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
X = Don’t Care
NONE
1
2
3
4
5
6
7
8
ADG506A/ADG507A
Power Dissipation (Any Package)
Up to +75°C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 470 mW
Derates above +75°C by . . . . . . . . . . . . . . . . . . 6 mW/°C
Operating Temperature
Commercial (K Version) . . . . . . . . . . . . . . –40°C to +85°C
Industrial (B Version) . . . . . . . . . . . . . . . . –40°C to +85°C
Extended (T Version) . . . . . . . . . . . . . . . –55°C to +125°C
Storage Temperature Range . . . . . . . . . . . . –65°C to +150°C
Lead Temperature (Soldering, 10 secs) . . . . . . . . . . . . +300°C
ABSOLUTE MAXIMUM RATINGS 1
(TA = 25°C unless otherwise noted)
VDD to VSS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 44 V
VDD to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25 V
VSS to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –25 V
Analog Inputs2
Voltage at S, D . . . . . . . . . . . . . . . . . . . . . . . VSS – 2 V to VDD
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . + 2 V or
. . . . . . . . . . . . . . . . . . . . . . 20 mA, Whichever Occurs First
Continuous Current, S or D . . . . . . . . . . . . . . . . . . . . . 20 mA
Pulsed Current S or D
1 ms Duration, 10% Duty Cycle . . . . . . . . . . . . . . . . 40 mA
Digital Inputs2
Voltage at A, EN . . . . . . . . . . . . . . . . . . . . . . . . . . VSS – 4 V
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . to VDD + 4 V or
. . . . . . . . . . . . . . . . . . . . . . 20 mA, Whichever Occurs First
NOTES
1
Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the
device at these or any other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect device reliability.
2
Overvoltage at A, EN, S or D will be clamped by diodes. Current should be limited
to the Maximum Rating above.
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection.
Although the ADG506A /ADG507A feature proprietary ESD protection circuitry, permanent
damage may occur on devices subjected to high energy electrostatic discharges. Therefore, proper
ESD precautions are recommended to avoid performance degradation or loss of functionality.
WARNING!
ESD SENSITIVE DEVICE
PIN CONFIGURATIONS
DIP, SOIC
LCCC
S6
ADG506A 24
S14 6
TOP VIEW 23 S5
S13 7 (Not to Scale) 22 S4
S15 5
25
S7
S14 6
24
S6
3
2
1
28 27 26
S8
VSS
VDD
D
4
PIN 1
IDENTIFIER
S15 5
25 S7
S14 6
24 S6
ADG506A
23
S5
TOP VIEW
(Not to Scale)
22
S4
S13 7
ADG506A
23 S5
21
S3
S12 8
TOP VIEW
(Not to Scale)
22 S4
S13 7
S12 8
NC
28 27 26
S16
1
NC
2
S8
3
D
4
VSS
25 S7
NC
26 S8
S16 4
VDD
27 VSS
NC 3
S16
NC 2
S15 5
PLCC
28 D
NC
VDD 1
S12 8
21 S3
S11 9
S11 9
20 S2
S10 10
20
S2
S11 9
21 S3
S10 10
19 S1
S9 11
19
S1
S10 10
20 S2
S9 11
19 S1
A0
18
EN
16 17
A1
14 15
A2
15 A2
NC = NO CONNECT
NC
GND
12 13
NC = NO CONNECT
A3
EN
A0
A1
16 A1
A3 14
A2
NC 13
12 13 14 15 16 17 18
A3
17 A0
NC
18 EN
GND
S9 11
GND 12
NC = NO CONNECT
DIP, SOIC, TSSOP
TOP VIEW 23 S5A
S5B 7 (Not to Scale) 22 S4A
S7B 5
25
S7A
S6B 6
24
S6A
S5A
S5B 7
ADG507A
23
S4B 8
TOP VIEW
(Not to Scale)
22
S4A
21
DA
4
3
2
1
28 27 26
VSS
VDD
28 27 26
DB
1
S8B
2
NC
S8A
S6A
ADG507A 24
S6B 6
3
DA
S7B 5
4
VSS
25 S7A
DB
26 S8A
S8B 4
VDD
27 VSS
NC 3
S8B
DB 2
NC
28 DA
S8A
PLCC
LCCC
VDD 1
PIN 1
IDENTIFIER
S7B 5
25 S7A
S6B 6
24 S6A
S5B 7
ADG507A
23 S5A
S3A
S4B 8
TOP VIEW
(Not to Scale)
22 S4A
S4B 8
21 S3A
S3B 9
20 S2A
S2B 10
20
S2A
S3B 9
21 S3A
S2B 10
19 S1A
S1B 11
19
S1A
S2B 10
20 S2A
S1B 11
19 S1A
NC = NO CONNECT
18
EN
A0
16 17
A1
A2
14 15
NC
NC
NC = NO CONNECT
12 13
GND
EN
15 A2
A0
NC 14
A1
16 A1
A2
NC 13
12 13 14 15 16 17 18
NC
17 A0
NC
18 EN
GND
S1B 11
GND 12
S3B
9
NC = NO CONNECT
–4–
REV. C
Typical Performance Characteristics–ADG506A/ADG507A
The multiplexers are guaranteed functional with reduced single or dual supplies down to 4.5 V.
Figure 1. RON as a Function of VD (VS): Dual Supply
Voltage, TA = +25 °C
Figure 4. RON as a Function of VD (VS) Single Supply
Voltage, TA = +25 °C
Figure 2. Leakage Current as a Function of Temperature
(Note: Leakage Currents Reduce as the Supply Voltages
Reduce)
Figure 5. Trigger Levels vs. Power Supply Voltage, Dual
or Single Supply, TA = +25 °C
Figure 3. tTRANSITION vs. Supply Voltage: Dual and Single
Supplies, TA = + 25°C (Note: For VDD and /VSS / < 10 V; V1 =
VDD /VSS, V2 = VSS /VDD. See Test Circuit 6)
REV. C
Figure 6. IDD vs. Supply Voltage: Dual or Single Supply,
TA = +25 °C
–5–
ADG506A/ADG507A–Test Circuits
Note: All Digital Input Signal Rise and Fall Times Measured from 10% to 90% of 3 V. tR = tF = 20 ns.
Test Circuit 2. IS (OFF)
Test Circuit 1. RON
Test Circuit 3. ID (OFF)
Test Circuit 5. IDIFF
Test Circuit 4. ID (ON)
Test Circuit 6. Switching Time of Multiplexer, tTRANSITION
Test Circuit 7. Break-Before-Make Delay, tOPEN
–6–
REV. C
ADG506A/ADG507A
Test Circuit 8. Enable Delay, tON (EN), tOFF (EN)
Test Circuit 9. Charge Injection
SINGLE SUPPLY AUTOMOTIVE APPLICATION
The excellent performance of the multiplexers under single
supply conditions makes the ADG506A/ADG507A suitable in
applications such as automotive and disc drives where only
positive power supply voltages are normally available. The following application circuit shows the ADG507A connected as an
8-channel differential multiplexer in an automotive, data acquisition application circuit.
The AD7580 is a 10-bit successive approximation ADC, which
has an on-chip sample-hold amplifier and provides a conversion
result in 20 µs. The ADC has differential analog inputs and is
configured in the application circuit for a span of 2.5 V over a
common-mode range 0 V to + 5 V. Wider common-mode ranges
can be accommodated. See the AD7579/AD7580 data sheet for
more details. The complete system operates from +12 V (+10%)
and +5 V supplies. The analog input signals to the ADG507A
contain information such as temperature, pressure, speed etc.
Figure 7. ADG507A in a Single Supply Automotive Data Acquisition Application
REV. C
–7–
TERMINOLOGY
tOFF (EN)
RON
RON Match
RON Drift
IS (OFF)
tTRANSITION
Ohmic resistance between terminals D and S
Difference between the RON of any two channels
Change in RON versus temperature
Source terminal leakage current when the switch
is off
Drain terminal leakage current when the switch
is off
Leakage current that flows from the closed switch
into the body
Analog voltage on terminal S or D
Channel input capacitance for “OFF” condition
Channel output capacitance for “OFF” condition
Digital input capacitance
Delay time between the 50% and 90% points of
the digital input and switch “ON” condition
ID (OFF)
ID (ON)
VS (VD)
CS (OFF)
CD (OFF)
CIN
tON (EN)
Delay time between the 50% and 10% points of
the digital input and switch “OFF” condition
Delay time between the 50% and 90% points of
the digital inputs and switch “ON” condition
when switching from one address state to
another
“OFF” time measured between 50% points of
both switches when switching from one address
state to another
Maximum input voltage for Logic “0”
Minimum input voltage for Logic “1”
Input current of the digital input
Most positive voltage supply
Most negative voltage supply
Positive supply current
Negative supply current
tOPEN
VINL
VINH
IINL (IINH)
VDD
VSS
IDD
ISS
C1150c–0–6/98
ADG506A/ADG507A
OUTLINE DIMENSIONS
Dimensions shown in inches and (mm).
28-Lead Cerdip (Suffix Q)
28-Lead Plastic DIP (Suffix N)
1.490 (37.84) MAX
0.550 (13.97)
0.53 (13.47)
0.525 (13.33)
0.515 (13.08)
1.45(36.83)
1.44 (36.58)
0.606 (15.4)
0.594 (15.09)
0.16 (4.07)
0.14 (3.56)
0.22 (5.59) GLASS
MAX
SEALANT
0.2
(5.08)
MAX
0.020 (0.508) 0.105 (2.67)
0.015 (0.381) 0.095 (2.42)
0.012 (0.305)
0.175 (4.45) 0.008 (0.203)
0.12 (3.05)
0.11 (2.79)
0.099 (2.28)
0.386 (9.80)
0.378 (9.60)
0.1043 (2.65)
0.0926 (2.35)
PIN 1
IDENTIFIER
8° 0.0500 (1.27)
0.0192 (0.49)
0° 0.0157 (0.40)
SEATING 0.0125 (0.32)
0.0138 (0.35)
PLANE 0.0091 (0.23)
26
25
TOP VIEW
11
12
19
18
0.456 (11.582)
0.450 (11.430) SQ
0.498 (12.57)
SQ
0.485 (12.32)
14
SEATING
PLANE
0.0433
(1.10)
MAX
0.0256 (0.65) 0.0118 (0.30)
BSC
0.0075 (0.19)
0.028 (0.70)
0.020 (0.50)
8°
0°
0.0079 (0.20)
0.0035 (0.090)
28-Terminal Leadless Ceramic Chip Carrier (Suffix E)
0.050 ⴞ0.005
01.27 ⴞ0.13
0.021 (0.533) 0.430 (10.5)
0.013 (0.331)
0.390 (9.9)
0.032 (0.812)
0.026 (0.661)
(PINS DOWN)
1
PIN 1
0.006 (0.15)
0.002 (0.05)
0.0291 (0.74)
x 45°
0.0098 (0.25)
28-Terminal Plastic Leaded Chip Carrier (Suffix P)
4
15
0.256 (6.50)
0.246 (6.25)
14
28
0.177 (4.50)
0.169 (4.30)
1
0.4193 (10.65)
0.3937 (10.00)
15
0.2992 (7.60)
0.2914 (7.40)
28
5
0.012 (0.305)
0.008 (0.203)
15°
0°
28-Lead TSSOP (Suffix RU)
0.7125 (18.10)
0.6969 (17.70)
0.0500
(1.27)
BSC
0.02 (0.5)
0.016 (0.406)
0.18(4.57)
MAX
LEAD NO. 1 IDENTIFIED BY DOT OR NOTCH
LEADS ARE SOLDER OR TIN PLATED KOVAR OR ALLOY 42
28-Lead SOIC (Suffix R)
0.0118 (0.30)
0.0040 (0.10)
0.125
(3.175)
MIN
15ⴗ
0
LEAD NO. 1 IDENTIFIED BY DOT OR NOTCH
LEADS ARE SOLDER OR TIN PLATED KOVAR OR ALLOY 42
PIN 1
0.62 (15.74)
0.59 (14.93)
0.075
(1.91)
REF
0.100 (2.54)
0.064 (1.63)
0.458 (11.63)
0.442 (11.23) 0.458
SQ
(11.63)
MAX
SQ
0.120 (3.04)
0.090 (2.29)
0.180 (4.51)
0.165 (4.20)
0.095 (2.41)
0.075 (1.90)
0.011 (0.28)
0.007 (0.18)
R TYP
0.075
(1.91)
REF
0.088 (2.24)
0.054 (1.37)
–8–
26
2
5
0.300 (7.62)
BSC
0.150
(3.51)
BSC
4
28
5
1
BOTTOM
VIEW
19
18
0.055 (1.40)
0.045 (1.14)
12
11
0.200
(5.08)
BSC
0.015 (0.38)
MIN
0.028 (0.71)
0.022 (0.56)
0.050
(1.27)
BSC
45° TYP
REV. C
PRINTED IN U.S.A.
0.065 (1.66)
0.045 (1.15)
0.06 (1.52)
0.05 (1.27)