GS74117AX FP-BGA Commercial Temp Industrial Temp 256K x 16 4Mb Asynchronous SRAM Features 7, 8, 10, 12 ns 3.3 V VDD Center VDD and VSS Fine Pitch BGA 256K x 16 Bump Configuration • Fast access time: 7, 8, 10, 12 ns • CMOS low power operation: 150/130/105/95 mA at minimum cycle time • Single 3.3 V power supply • All inputs and outputs are TTL-compatible • Byte control • Fully static operation • Industrial Temperature Option: –40° to 85°C • Package: X: 6 mm x 10 mm Fine Pitch Ball Grid Array package Description The GS74117A is a high speed CMOS Static RAM organized as 262,144 words by 16 bits. Static design eliminates the need for external clocks or timing strobes. The GS operates on a single 3.3 V power supply and all inputs and outputs are TTLcompatible. The GS74117A is available in a 6 x 10 mm Fine Pitch BGA package. Pin Descriptions Symbol 2 3 4 5 6 A LB OE A0 A1 A2 NC B DQ1 UB A3 A4 CE DQ16 C DQ3 DQ2 A5 A6 DQ15 DQ14 D VSS DQ4 A17 A7 DQ13 VDD E VDD DQ5 NC A16 DQ12 VSS F DQ6 DQ7 A8 A9 DQ10 DQ11 G DQ8 NC A10 A11 WE DQ9 H NC A12 A13 A14 A15 NC Package X 6 x 10 mm Bump Pitch Top View Description A0–A17 Address input DQ1–DQ16 Data input/output CE Chip enable input LB Lower byte enable input (DQ1 to DQ8) UB Upper byte enable input (DQ9 to DQ16) WE Write enable input OE Output enable input VDD +3.3 V power supply VSS Ground NC No connect Rev: 1.02 10/2002 1 1/12 Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com. © 2001, Giga Semiconductor, Inc. GS74117AX Block Diagram A0 Address Input Buffer Row Decoder Memory Array Column Decoder A17 CE WE Control OE _____ UB LB _____ I/O Buffer DQ1 DQ16 Truth Table CE OE WE LB UB DQ1 to DQ8 DQ9 to DQ16 VDD Current H X X X X Not Selected Not Selected ISB1, ISB2 L L Read Read L H Read High Z H L High Z Read L L Write Write L H Write Not Write, High Z H L Not Write, High Z Write L L L X H L L H H X X High Z High Z L X X H H High Z High Z IDD Note: X: “H” or “L” Rev: 1.02 10/2002 2/12 Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com. © 2001, Giga Semiconductor, Inc. GS74117AX Absolute Maximum Ratings Parameter Symbol Rating Unit Supply Voltage VDD –0.5 to +4.6 V Input Voltage VIN –0.5 to VDD +0.5 (≤ 4.6 V max.) V Output Voltage VOUT –0.5 to VDD +0.5 (≤ 4.6 V max.) V Allowable power dissipation PD 0.7 W Storage temperature TSTG –55 to 150 oC Note: Permanent device damage may occur if Absolute Maximum Ratings are exceeded. Functional operation shall be restricted to Recommended Operating Conditions. Exposure to higher than recommended voltages for extended periods of time could affect device reliability. Recommended Operating Conditions Parameter Symbol Min Typ Max Unit Supply Voltage for -7/-8/-10/-12 VDD 3.0 3.3 3.6 V Input High Voltage VIH 2.0 — VDD +0.3 V Input Low Voltage VIL –0.3 — 0.8 V Ambient Temperature, Commercial Range TAc 0 — 70 o Ambient Temperature, Industrial Range TAI –40 — 85 oC C Notes: 1. Input overshoot voltage should be less than VDD +2 V and not exceed 20 ns. 2. Input undershoot voltage should be greater than –2 V and not exceed 20 ns. Rev: 1.02 10/2002 3/12 Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com. © 2001, Giga Semiconductor, Inc. GS74117AX Capacitance Parameter Symbol Test Condition Max Unit Input Capacitance CIN VIN = 0 V 5 pF Output Capacitance COUT VOUT = 0 V 7 pF Notes: 1. Tested at TA = 25°C, f = 1 MHz 2. These parameters are sampled and are not 100% tested. DC I/O Pin Characteristics Parameter Symbol Test Conditions Min Max Input Leakage Current IIL VIN = 0 to VDD – 1 uA 1 uA Output Leakage Current ILO Output High Z VOUT = 0 to VDD –1 uA 1 uA Output High Voltage VOH IOH = –4 mA 2.4 — Output Low Voltage VOL ILO = +4 mA — 0.4 V Power Supply Currents Parameter Symbol Test Conditions 0 to 70°C –40 to 85°C Unit 7 ns 8 ns 10 ns 12 ns 7 ns 8 ns 10 ns 12 ns IDD CE ≤ VIL All other inputs ≥ VIH or ≤ VIL Min. cycle time IOUT = 0 mA 150 130 105 90 160 140 115 100 mA Standby Current ISB1 CE ≥ VIH All other inputs ≥ VIH or ≤VIL Min. cycle time 28 30 25 22 38 40 35 32 mA Standby Current ISB2 CE ≥ VDD – 0.2 V All other inputs ≥ VDD – 0.2 V or ≤ 0.2 V Operating Supply Current Rev: 1.02 10/2002 10 4/12 Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com. 20 mA © 2001, Giga Semiconductor, Inc. GS74117AX AC Test Conditions Output Load 1 Parameter Conditions Input high level VIH = 2.4 V Input low level VIL = 0.4 V 50Ω Input rise time tr = 1 V/ns VT = 1.4 V Input fall time tf = 1 V/ns Input reference level 1.4 V Output Load 2 Output reference level 1.4 V 3.3 V Output load Fig. 1& 2 DQ Rev: 1.02 10/2002 589Ω DQ Note: 1. Include scope and jig capacitance. 2. Test conditions as specified with output loading as shown in Fig. 1 unless otherwise noted. 3. Output load 2 for tLZ, tHZ, tOLZ and tOHZ 5/12 Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com. 30pF1 5pF1 434Ω © 2001, Giga Semiconductor, Inc. GS74117AX AC Characteristics Read Cycle Parameter Symbol Read cycle time -7 -8 -10 -12 Unit Min Max Min Max Min Max Min Max tRC 7 — 8 — 10 — 12 — ns Address access time tAA — 7 — 8 — 10 — 12 ns Chip enable access time (CE) tAC — 7 — 8 — 10 — 12 ns Byte enable access time (UB, LB) tAB — 3 — 3.5 — 4 — 5 ns Output enable to output valid (OE) tOE — 3 — 3.5 — 4 — 5 ns Output hold from address change tOH 3 — 3 — 3 — 3 — ns Chip enable to output in low Z (CE) tLZ* 3 — 3 — 3 — 3 — ns Output enable to output in low Z (OE) tOLZ* 0 — 0 — 0 — 0 — ns Byte enable to output in low Z (UB, LB) tBLZ* 0 — 0 — 0 — 0 — ns Chip disable to output in High Z (CE) tHZ* — 3.5 — 4 — 5 — 6 ns Output disable to output in High Z (OE) tOHZ* — 3 — 3.5 — 4 — 5 ns Byte disable to output in High Z (UB, LB) tBHZ* — 3 — 3.5 — 4 — 5 ns * These parameters are sampled and are not 100% tested. Read Cycle 1: CE = OE = VIL, WE = VIH, UB and, or LB = VIL tRC Address tAA tOH Data Out Rev: 1.02 10/2002 Previous Data Data valid 6/12 Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com. © 2001, Giga Semiconductor, Inc. GS74117AX Read Cycle 2: WE = VIH tRC Address tAA CE tAC tHZ tLZ tAB UB, LB tBHZ tBLZ OE tOE tOHZ Data valid tOLZ High impedance Data Out Write Cycle Parameter Symbol Write cycle time -7 -8 -10 -12 Unit Min Max Min Max Min Max Min Max tWC 7 — 8 — 10 — 12 — ns Address valid to end of write tAW 5 — 5.5 — 7 — 8 — ns Chip enable to end of write tCW 5 — 5.5 — 7 — 8 — ns Byte enable to end of write tBW 5 — 5.5 — 7 — 8 — ns Data set up time tDW 3.5 — 4 — 4.5 — 6 — ns Data hold time tDH 0 — 0 — 0 — 0 — ns Write pulse width tWP 5 — 5.5 — 7 — 8 — ns Address set up time tAS 0 — 0 — 0 — 0 — ns Write recovery time (WE) tWR 0 — 0 — 0 — 0 — ns Write recovery time (CE) tWR1 0 — 0 — 0 — 0 — ns Output Low Z from end of write tWLZ* 3 — 3 — 3 — 3 — ns Write to output in High Z tWHZ* — 3 — 3.5 — 4 — 5 ns * These parameters are sampled and are not 100% tested. Rev: 1.02 10/2002 7/12 Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com. © 2001, Giga Semiconductor, Inc. GS74117AX Write Cycle 1: WE control tWC Address tAW tWR OE tCW CE tBW UB, LB tAS tWP WE tDW tDH Data valid Data In tWHZ tWLZ Data Out High impedance Write Cycle 2: CE control tWC Address tAW tWR1 OE tAS tCW CE tBW UB, LB tWP WE tDW Data valid Data In Data Out Rev: 1.02 10/2002 tDH High impedance 8/12 Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com. © 2001, Giga Semiconductor, Inc. GS74117AX Write Cycle 3: UB, LB control tWC Address tAW tWR1 OE tAS tCW CE tBW UB, LB tWP WE tDW Data valid Data In Data Out Rev: 1.02 10/2002 tDH High impedance 9/12 Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com. © 2001, Giga Semiconductor, Inc. GS74117AX Package X—6 mm x 10 mm FP-BGA Symbol D E Pin A1 Index Top View A Unit: mm A 1.10±0.10 A1 0.20~0.30 fb f0.30~0.40 c 0.36(TYP) D 10.0±0.05 D1 5.25 E 6.0±0.05 E1 3.75 e 0.75(TYP) aaa 0.10 c A1 Pin A1 Index Side View aaa A B C D E F G H 1 2 3 4 5 6 fb Solder Ball e E1 e D1 Bottom View Rev: 1.02 10/2002 10/12 Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com. © 2001, Giga Semiconductor, Inc. GS74117AX Ordering Information Part Number* Package Access Time Temp. Range GS74117AX-7 6 mm x 10 mm BGA 7 ns Commercial GS74117AX-8 6 mm x 10 mm BGA 8 ns Commercial GS74117AX-10 6 mm x 10 mm BGA 10 ns Commercial GS74117AX-12 6 mm x 10 mm BGA 12 ns Commercial GS74117AX-7I 6 mm x 10 mm BGA 7 ns Industrial GS74117AX-8I 6 mm x 10 mm BGA 8 ns Industrial GS74117AX-10I 6 mm x 10 mm BGA 10 ns Industrial GS74117AX-12I 6 mm x 10 mm BGA 12 ns Industrial Status * Customers requiring delivery in Tape and Reel should add the character “T” to the end of the part number. For example: GS74117AX-8T Rev: 1.02 10/2002 11/12 Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com. © 2001, Giga Semiconductor, Inc. GS74117AX 4Mb Asynchronous Datasheet Revision History Rev. Code: Old; New 74117A_r1 Types of Changes Format or Content Format/Content Page #/Revisions/Reason • Creation of new datasheet 74117A_r1; 74117A_r1_01 Content • Updated Recommended Operating Conditions table on page 3 • Updated Read Cycle and Write Cycle AC Characteristics tables 74117A_r1_01; 74117A_r1_02 Content • Removed 6 ns speed bin from entire document Rev: 1.02 10/2002 12/12 Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com. © 2001, Giga Semiconductor, Inc.