CDCD5704 www.ti.com SCAS823 – DECEMBER 2006 Rambus™ XDR™ CLOCK GENERATOR FEATURES • • • • • • • • • • • • High-Speed Clock Support: 300-MHz–667-MHz Clock Source for XDR Memory Subsystems and Redwood Logic Interface Quad (Open-Drain) Differential Output Drivers Spread-Spectrum Compatible Clock Input Can Be Distributed to Minimize EMI Differential or Single-Ended Reference Clock Input of 100 MHz or 133 MHz Serial Interface Features: Programmable Frequency Multiplier, Select Any One to Four Outputs and Mode of Operation Supports Frequency Multiplication Factors of: ×3, ×4, ×5, ×6, ×8, ×9/2, ×15/2, ×15/4 All PLL Loop Filter Components Are Integrated Low |Cycle-to-Cycle| of 1–6 Cycle Jitter: – 40 ps: 300–635 MHz – 30 ps: 636–667 MHz PLLs Are Powered Down if No Valid REF Clock (<10 MHz) Is Detected or VDD Is Below 1.6 V Operates From Single 2.5-V Supply (±0.125 V) Packaged in TSSOP-28 Commercial Temperature Range 0°C to 70°C PW PACKAGE (TOP VIEW) VDDP VSSP ISET VSS REFCLK REFCLKB VDDC VSSC SCL SDA EN ID0 ID1 BYPASS 1 2 3 4 5 6 7 8 9 10 11 12 13 14 28 27 26 25 24 23 22 21 20 19 18 17 16 15 VDD CLK0 CLK0B VSS CLK1 CLK1B VDD VSS CLK2 CLK2B VSS CLK3 CLK3B VDD P0043-01 APPLICATIONS • XDR Memory Subsystem and Redwood Logic Interface DESCRIPTION The CDCD5704 clock generator provides the necessary clock signals to support an XDR memory subsystem and Redwood logic interface using a reference clock input with or without spread-spectrum modulation. Contained in a 28-pin TSSOP package that includes four differential clock outputs, the CDCD5704 provides an off-the-shelf solution for a broad range of high-performance interface applications. The block diagram shows the major components of the CDCD5704, which include a phase-locked loop, a bypass multiplexer, and four differential output buffers (CLK0 to CLK3). All four outputs can be disabled by a logical low at the input of the EN pin. An output is enabled when EN is high and a value of 1 is in its serial interface register (RegA–RegD). The PLL receives a reference clock input signal, REFCLK, and outputs a clock signal at a frequency equal to the input frequency times the multiplication factor. The PLL output clock signal is fed to the differential output buffers to drive the enabled clocks. Disabled outputs are set to high impedance. Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. Rambus, XDR are trademarks of Rambus Inc. All other trademarks are the property of their respective owners. PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. Copyright © 2006, Texas Instruments Incorporated CDCD5704 www.ti.com SCAS823 – DECEMBER 2006 The bypass mode routes the input clock REFCLK to the differential output buffers, bypassing the PLL. To ensure that the CDCD5704 clock generator always performs correctly, the device switches off the PLL and the outputs are in the high-impedance state, once the clock input is below 10 MHz. If the supply voltage VDD is less than VPUC, all logic gates are reset, the PLL is powered down, and the outputs are in the high-impedance state. Therefore, the device only starts its operation if these minimum requirements are met. Because the CDCD5704 is based on PLL circuitry, it requires a stabilization time to achieve phase-lock of the PLL. With use of an external reference clock, this signal must be fixed-frequency and fixed-phase prior to the start of stabilization time. The device operates from a single 2.5-V supply voltage. The CDCD5704 device is characterized for operation from 0°C to 70°C. FUNCTIONAL BLOCK DIAGRAM VDDP VDDC VDD BYPASS CLK0 CLK0 MUX REFCLK REFCLKB CLK0 CLK0B CLK1 PLL 1 300 MHz to 667 MHz CLk1 CLK1B CLK2 CLK2 VDDP VDDC VDD SDA Power Down Logic CLK2B CLK3 CLK3 Serial Interface Control Logic CLK3B SCL ID0 ID1 EN ISET Current and Voltage Reference RSET VSSP VSSC VSS B0137-01 2 Submit Documentation Feedback CDCD5704 www.ti.com SCAS823 – DECEMBER 2006 Table 1. TERMINAL FUNCTIONS TERMINAL NAME TYPE NO. DESCRIPTION BYPASS 14 Input CLK0 27 Output If 0, the PLL is bypassed and the PLL is switched off. Output for Clock0 CLK0B 26 Output Complementary output for Clock0 CLK1 24 Output Output for Clock1 CLK1B 23 Output Complementary output for Clock1 CLK2 20 Output Output for Clock2 CLK2B 19 Output Complementary output for Clock2 CLK3 17 Output Output for Clock3 CLK3B 16 Output Complementary output for Clock3 EN 11 Input Output enable; if 0, all outputs are disabled. ID0 12 Input Device ID, bit 0 ID1 13 Input Device ID, bit 1 ISET 3 Output REFCLK 5 Input Reference clock input REFCLKB 6 Input Complementary reference clock input SCL 9 Input Serial interface clock, 3.3-V compatible Serial interface data, 3.3-V compatible Set clock driver current with external resistor SDA 10 Input VDD 15, 22, 28 Power 2.5-V power supply for outputs 7 Power 2.5-V power supply for core VDDC VDDP 1 Power 2.5-V power supply for PLL 4, 18, 21, 25 Ground Ground VSSC 8 Ground Ground for core VSSP 2 Ground Ground for PLL VSS SERIAL INTERFACE The following section describes the serial interface programming. In general, the serial interface slave supports byte-write/-read and word-write/-read protocol as defined in the SMBus or I2C specification. Serial Interface Operation Requirement The internal timing of the serial interface logic block in the CDCD5704 requires a timing reference derived from the input clock (REFCLK). A reference clock must be present at the REFCLK pin for the serial interface to be operational. Serial Interface Device Address A6 A5 A4 A3 A2 A1 A0 W/R 1 1 0 1 1 ID1 ID0 0/1 The device-ID is determined by the external pins ID0 and ID1. They are part of the device 8-bit address. Therefore, four different devices (00, 01, 10, and 11) can be addressed via the same serial interface. The least significant bit of the address designates a write or read operation. R/W Bit: 0 = write to CDCD5704 device 1 = read from CDCD5704 device Submit Documentation Feedback 3 CDCD5704 www.ti.com SCAS823 – DECEMBER 2006 Command Code Definition Bit Description C7 1 = byte-write/-read or word-write/-read operation (C6:C0) Byte offset for byte-write/-read or word-write/-read operation Command Code for Byte-Write/-Read Operation Hex Code C7 C6 C5 C4 C3 C2 C1 C0 Byte 0 80h 1 0 0 0 0 0 0 0 Byte 1 81h 1 0 0 0 0 0 0 1 Byte 2 82h 1 0 0 0 0 0 1 0 Hex Code C7 C6 C5 C4 C3 C2 C1 C0 Word 0: Byte 0 and byte 1 80h 1 0 0 0 0 0 0 0 Word 1: Byte 1 and byte 2 81h 1 0 0 0 0 0 0 1 Command Code for Word-Write/-Read Operation Serial Interface Generic Programming Sequence 1 7 1 1 S Slave Address Wr A S Start Condition Sr Repeated Start Condition Rd Read (Bit Value = 1) Wr Write (Bit Value = 0) A Acknowledge (ACK = 0 and NACK = 1) P Stop Condition PE 8 Data Byte 1 1 A P Packet Error Master-to-Slave Transmission Slave-to-Master Transmission M0053-01 Byte-Write Programming Sequence 1 7 1 1 8 1 8 1 1 S Slave Address Wr A Command Code A Data Byte A P Byte-Read Programming Sequence 1 7 1 1 8 1 1 7 1 1 S Slave Address Wr A Command Code A S Slave Address Rd A ... 8 1 1 Data Byte A P 1 4 Submit Documentation Feedback CDCD5704 www.ti.com SCAS823 – DECEMBER 2006 Word-Write Programming Sequence 1 7 1 1 8 1 8 1 S Slave Address Wr A Command Code A Data Byte Low A ... 8 1 1 Data Byte High A P Word-Read Programming Sequence 1 7 1 1 8 1 1 7 1 1 S Slave Address Wr A Command Code A S Slave Address Rd A 8 1 8 1 1 Data Byte A Data Byte A P ... 1 P S Bit 6 Bit 7 (MSB) tw(SCLL) A Bit 0 (LSB) P tw(SCLH) tr(SM) tf(SM) VIH(SM) SCLK VIL(SM) th(START) tsu(START) t(BUS) th(SDATA) tsu(SDATA) tr(SDATA) tsu(STOP) tf(SDATA) VIH(SM) SDATA VIL(SM) T0131-01 Figure 1. Timing Diagram, Serial Control Interface Submit Documentation Feedback 5 CDCD5704 www.ti.com SCAS823 – DECEMBER 2006 Serial Interface Configuration Command Bitmap Byte 0 Bit Bit Name Description/Function Type Power-Up Condition 7 RES Reserved R/W 0 6 MULT2 Multiplication factor, bit 2 R/W 0 5 MULT1 Multiplication factor, bit 1 R/W 0 4 MULT0 Multiplication factor, bit 0 R/W 1 3 RegA Enable CLK0 R/W 1 2 RegB Enable CLK1 R/W 1 1 RegC Enable CLK2 R/W 1 0 RegD Enable CLK3 R/W 1 Bit Bit Name Description/Function Type Power-Up Condition 7 RES Reserved R/W 0 6 RES Reserved R/W 0 5 RES Reserved R/W 0 4 RES Reserved R/W 0 3 RES Reserved for vendor option R/W 0 2 RES Reserved for vendor option R/W 0 1 RES Reserved for vendor option R/W 0 0 RegTest Vendor test register. If high, then Vendor Test R/W 0 Bit Bit Name Description/Function Type Power-Up Condition 7 REV0 Device revision, bit 4 R 0 6 REV0 Device revision, bit 3 R 0 5 REV0 Device revision, bit 2 R 0 4 REV0 Device revision, bit 1 R 0 3 REV0 Device revision, bit 0 R 0 2 VID2 Vendor ID bit 2 R 0 1 VID1 Vendor ID bit 1 R 1 0 VID0 Vendor ID bit 0 R 1 Byte 1 Byte 2 6 Submit Documentation Feedback CDCD5704 www.ti.com SCAS823 – DECEMBER 2006 FUNCTIONAL DESCRIPTION OF THE LOGIC PLL Multiplication Factor Selection Mult2 (1) (2) Mult1 Mult0 Output Frequency (MHz) Multiplication Factor REFCLK = 100 MHz REFCLK = 133 MHz 0 0 0 3 300 400 0 (1) 0 (1) 1 (1) 4 (1) 400 533 0 1 0 5 500 667 0 1 1 6 600 800 (2) 1 0 0 8 800 (2) – (2) 1 0 1 9/2 450 600 1 1 0 15/2 750 (2) – (2) 1 1 1 15/4 375 500 Default settings after power up Output at this frequency does not conform to all the ac device characteristics in the Device Characteristics table, or ouput frequency is not supported. Modes of Operation EN BYPASS Reg-Test RegA RegB RegC RegD CLK0 CLK1 CLK2 CLK3 L X X X X X X HI-Z HI-Z HI-Z HI-Z H X 1 X X X X H L 0 X X X X REFCLK REFCLK REFCLK REFCLK H H 0 0 0 0 0 HI-Z HI-Z HI-Z HI-Z H H 0 1 0 0 0 PLL CLK HI-Z HI-Z HI-Z H H 0 0 1 0 0 HI-Z PLL CLK HI-Z HI-Z H H 0 1 1 0 0 PLL CLK PLL CLK HI-Z HI-Z H H 0 0 0 1 0 HI-Z HI-Z PLL CLK HI-Z H H 0 1 0 1 0 PLL CLK HI-Z PLL CLK HI-Z H H 0 0 1 1 0 HI-Z PLL CLK PLL CLK HI-Z H H 0 1 1 1 0 PLL CLK PLL CLK PLL CLK HI-Z H H 0 0 0 0 1 HI-Z HI-Z HI-Z PLL CLK H H 0 1 0 0 1 PLL CLK HI-Z HI-Z PLL CLK H H 0 0 1 0 1 HI-Z PLL CLK HI-Z PLL CLK H H 0 1 1 0 1 PLL CLK PLL CLK HI-Z PLL CLK H H 0 0 0 1 1 HI-Z HI-Z PLL CLK PLL CLK H H 0 1 0 1 1 PLL CLK HI-Z PLL CLK PLL CLK H H 0 0 1 1 1 HI-Z PLL CLK PLL CLK PLL CLK H 0 (1) 1 (1) 1 (1) 1 (1) 1 (1) PLL CLK PLL CLK PLL CLK PLL CLK H (1) RESERVED FOR VENDOR TEST Default settings after power up Submit Documentation Feedback 7 CDCD5704 www.ti.com SCAS823 – DECEMBER 2006 ABSOLUTE MAXIMUM RATINGS over operating free-air temperature range (unless otherwise noted) (1) VDD Supply voltage range (2) VI Input voltage range VO Output voltage range IIK Input clamp current, (VI < 0, VI > VDD) IO Continuous output current Thermal resistance, junction-to-ambient RθJC Thermal resistance, junction-to-case RθJB Thermal resistance, junction-to-board TJ Maximum junction temperature Tstg Storage temperature range (3) UNIT V For SCL and SDA –0.3 to 3.6 For all other inputs –0.3 to VDD + 0.25 (2) RθJA VALUE –0.3 to 2.8 –0.5 to VDD + 0.5 V ±20 mA ±50 mA No airflow 94.4 Airflow 150 ft/min 82.8 Airflow 250 ft/min 79.1 Airflow 500 ft/min (1) (2) (3) (3) (3) V K/W 74 No airflow 31.8 K/W No airflow 68.9 K/W 125 °C –65 to 150 °C Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. The input and output negative voltage ratings may be exceeded if the input and output clamp-current ratings are observed. The package thermal impedance is calculated in accordance with JESD 51 and JEDEC2S1P (high-k board). RECOMMENDED DC OPERATING CONDITIONS MIN NOM MAX UNIT VDDP Supply voltage for PLL 2.375 2.5 2.625 V VDDC Supply voltage for core 2.375 2.5 2.625 V VDD Supply voltage for clock buffers 2.375 2.5 TA Operating free-air temperature VIL,CLK Low-level input voltage, REFCLK/REFCLKB VIX,CLK VIH,CLKD ∆VIX,CLK Difference in crossing-point voltage VIL SE Low-level, single-ended input voltage, REFCLK Vth SE Single-ended input-voltage threshold, REFCLK VIH SE High-level, single-ended input voltage, REFCLK VIL L Low-level input voltage, ID0, ID1, EN, BYPASS VIH L High-level input voltage, ID0, ID1, EN, BYPASS VIL SM Low-level input voltage, SCL, SDA (2) VIH SM High-level input voltage, SCL, SDA (2) 1.4 (1) (2) 8 2.625 V 0 70 °C –0.15 0.15 V Crossing-point voltage, input voltage threshold, REFCLK/REFCLKB 0.2 0.55 V High-level input voltage, REFCLK/REFCLKB 0.6 0.95 V 0.15 V –0.15 (1) Vth – 0.3 V 0.35 Vth 0.5 VDD V SE + 0.3 2.625 V –0.15 0.8 V 1.4 2.625 V –0.15 0.8 V 3.465 V SE When using a single-ended clock input, Vth is supplied to the REFCLKB pin. Duty cycle of single-ended REFCLK input is measured at Vth. This range of SCL and SDA input high voltage allows the CDCD5704 to co-exist with 3.3 V, 2.5 V, and 1.8 V devices on the same serial-interface bus system. Submit Documentation Feedback CDCD5704 www.ti.com SCAS823 – DECEMBER 2006 RECOMMENDED AC OPERATING CONDITIONS MIN tCYCLE,IN REFCLK/REFCLKB input cycle time tCYC,TEST REFCLK/REFCLKB input cycle time for BYPASS NOM cycles (2) DCIN Input duty cycle over 10,000 tr/tf Rise and fall time for REFCLK signal from 20% to 80% of input voltage VIN tcr/tcf Difference between rise time and fall time of REFCLK signal from 20% to 80% frequency (3) fm,IN SSC frequency modulation repeat Pm tria Modulation index (= frequency deviation/center frequency) for triangle modulation (3) Pm n tria Modulation index (= frequency deviation/center frequency) for non-triangle modulation (4) tSR Input slew rate REFCLK/REFCLKB UNIT 7 11 ns 4 40 ns 185 ps Input |cycle-to-cycle| jitter (1) tJ,IN MAX 40% 60% 175 700 ps 150 ps 33 kHz 30 0.6% 0.5% 1 4 V/ns 100 kHz SERIAL INTERFACE TIMING fSCLK SCLK frequency (5) 0 th(START) START hold time (5) 4 µs 4.7 µs 4 µs 4.7 µs 300 ps 250 ps duration (5) tw(SCLL) SCLK low-pulse tw(SCLH) SCLK high-pulse duration (5) tsu(START) START setup time (5) th(SDATA) SDATA hold time (5) tsu(SDATA) SDATA setup time (5) tr(SDATA)/ tr(SM) SDATA/SCLK input rise time (5) 1000 ns tf(SDATA)/ tf(SM) SDATA/SCLK input fall time (5) 300 ns tsu(STOP) STOP setup time (5) t(BUS) Bus free time (1) (2) (3) (4) (5) 4 µs 4.7 µs RefCLK jitter is measured at (VIH(nom) – VIL(nom))/2 and is the absolute value of the worst-case deviation. Measured at crossing points for differential clock input or at input threshold voltage VTH for single-ended clock input. If input modulation is used; input modulation is allowed but not required. The amount of allowed spreading for any non-triangular modulation is determined by the induced downstream tracking skew, which cannot exceed the skew generated by the specified 0.6% triangular modulation. Typically, the amount of allowed non-triangular modulation is about 0.5%. See Figure 1 for the timing behavior of the serial interface. DEVICE CHARACTERISTICS over recommended operating free-air temperature range (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT OVERALL PARAMETER IDD Supply current (= IVDD + IVDDP + IVDDC) VPUC Supply voltage threshold for power-up control circuit At 300 MHz and 2.625 V 70 85 At 667 MHz and 2.625 V 90 115 mA Over complete supply voltage range 1.1 1.8 2.2 V Output load; see Figure 3. 0.9 1 1.1 V 0.3 0.325 0.35 V DC DEVICE CHARACTERISTICS Differential output crossing-point voltage (1) VOX single-ended) (2) VCOS Output voltage swing (p-p, VOL,ABS Absolute output low voltage (3) VISET Reference voltage for swing control current IREF (4) (1) (2) (3) (4) 0.85 VDD = 2.375 V to 2.625 V, T = 0°C to 70°C 0.98 V 1 1.02 V VOX is measured on external divider as shown in Figure 3. VCOS = (clock output high voltage – clock output low voltage), at the measurement points shown in Figure 3, excluding overshoot and undershoot. VOL,ABS is measured at the clock output of the package, instead of the measurement points of Figure 3. IREF is equal to VISET/RRC. Tolerance of RRC must be ±1% or smaller. Submit Documentation Feedback 9 CDCD5704 www.ti.com SCAS823 – DECEMBER 2006 DEVICE CHARACTERISTICS (continued) over recommended operating free-air temperature range (unless otherwise noted) PARAMETER TEST CONDITIONS IOL/IREF Ratio of output low current to reference current IOL,ABS Minimum current at VOL,ABS (5) VOL,ABS = 0.85 V VOL,SDA SDA output low voltage VDD = 2.375 V to 2.625 V, IOH = 4 mA IOL,SDA SDA output low current VDD = 2.375 V to 2.625 V, VO = 0.8 V IOZ Output 3-state current CLK0 to CLK4 IIR REFCLK input current IIL Logic input current MIN TYP MAX 6.8 7 7.2 45 UNIT mA 0.4 6 V mA ±50 µA VI = 0 V or VDD ±5 µA VI = 0 V or VDD ±10 µA AC DEVICE CHARACTERISTICS CIR Input capacitance, REFCLK, REFCLKB (6) 2 7 pF CIL Input capacitance logic pins (7) 2 10 pF tCYCLE Clock cycle time 3.33 ns tjit(per) 300 MHz to 667 MHz, possible SSC is not taken into account (8) |Cycle-to-cycle jitter| of 1–6 clock cycles 1.5 10,000 cycles, 300 MHz to 635 MHz (9) 40 10,000 cycles, 636 MHz to 667 MHz (9) 30 ps (10) L1 SSB phase noise at 1 MHz 300-MHz–667-MHz output L20 SSB phase noise at 20 MHz 300-MHz–667-MHz output (10) –115 –97 dBc/Hz –150 –128 dBc/Hz ∆tskew(o) Drift in tskew(o) (11) VDD = 2.375 V to 2.625 V, T = 0 to 70°C odc Output duty cycle tODC,ERR |Cycle-to-cycle| duty-cycle error tERR,SSC PLL output phase error when tracking SSC tr/tf Output rise and fall time VOUT = 20%–80% tcr/tcf Difference between output rise and fall times VOUT = 20%–80%, fout = 300 MHz to 667 MHz ZOUT Output dynamic impedance (12) VOL = 0.9 V tL Power-up lock time Time from VDD, VDDP, VDDC being applied and settled until clock outputs are settled 3 ms tL(ω) PLL lock time after (1) frequency change via serial interface (programming of SCL and SDA pins completed) or (2) EN and/or BYPASS changed state Time from signals for selecting a mode of operation (1) or (2) applied and settled until clock outputs are settled 3 ms 15 45% 50% 55% 300 MHz to 635 MHz 40 636 MHz to 667 MHz 30 (5) (6) (7) (8) ps ps –100 100 ps 100 300 ps 100 ps Ω 750 Minimum IOL,ABS is measured at the clock output pins of the package, as shown in Figure 3. Capacitance measured at frequency = 1 MHz, dc bias = 0.9 V, and VAC < 100 mV Capacitance measured at frequency = 1 MHz, dc bias = 0.9 V, and VAC < 100 mV Maximum and minimum output clock cycle times are based on nominal output frequency of 300 MHz and 667 MHz, respectively. For spread-spectrum-modulated differential or single-ended REFCLK, the output clock tracks the modulation of the input. (9) Output short-term jitter specification is the absolute value of the worst-case deviation and is defined in the Jitter section. (10) Device must not exceed the upper limit of L(f) for 1-MHz to 100-MHz offset as shown in the Phase Noise section. (11) tskew is the timing difference between any two of the four differential clocks and is measured at common-mode voltage. ∆tskew is the change in tskew when the operating temperature and supply voltage change. (12) ZOUT is defined at the output pins directly. The value is determined as the ac small-signal impedance at low frequencies (< 100 kHz) and when output is driving a high state. 10 Submit Documentation Feedback CDCD5704 www.ti.com SCAS823 – DECEMBER 2006 PHASE NOISE For the offset frequency range from 1 MHz to 100 MHz, phase noise of the CDCD5704 does not exceed the single-sideband phase noise (spectral purity) described by the following equation given by Rambus. L(f) = 10 log [1 + (50 × 106 / f)2.4] – 138 dBc/Hz Selected numerical values are in given in the following table. f = offset frequency 1 (L1) 5 10 15 20 (L20) 40 80 100 MHz L(f) = SSB phase noise –97 –114 –121 –125 –128 –134 –137 –138 dBc/Hz −80 Rambus Spec Range: 1 MHz 3 fOffset 3 20 MHz −90 Phase Noise − dBc/Hz −100 667 MHz −110 −120 Rambus Spec −130 300 MHz 400 MHz −140 −150 −160 100k 1M fOffset − Offset Frequency − Hz 10M 20M 100M G001 Figure 2. Phase Noise Plot Submit Documentation Feedback 11 CDCD5704 www.ti.com SCAS823 – DECEMBER 2006 VTS R1 CLK R2 VT = 1.2 V Z0=50 W RT R3 CDCD5704 XCG VTS Measurement Points ISET R1 CLKB R2 VT = 1.2 V Z0=50 W RT R3 RRC S0201-01 NOTE: In the power-up sequence, the rise time for the external voltage applied to the clock output pins (VTS) must be equal to or longer than the rise time for the supply voltage of the device (VDD, VDDP, VDDC). VALUE for 50-Ω LINE VALUE for IOL,ABS TOLERANCE UNIT R1 Termination resistor PARAMETER 39.2 34 ±1% Ω R2 Termination resistor 66.5 31.8 ±1% Ω R3 Termination resistor 93.1 48.7 ±1% Ω RT Termination resistor 49.9 28 ±1% Ω RRC Swing control resistor 200 147 ±1% Ω VTS Source termination voltage 2.5 2.5 ±5% V VT Termination voltage 1.2 1.2 ±5% V Figure 3. Output Test Load VH 80% V(t) VL tf 20% tr T0132-01 Figure 4. Input and Output Waveforms 12 Submit Documentation Feedback CDCD5704 www.ti.com SCAS823 – DECEMBER 2006 CLK Vx+ Vx, nom Vx– CLKB T0133-01 Figure 5. Crossing-Point Voltage CLK CLKB tCYCLE,i tCYCLE,i+1 tJ = tCYCLE,i – tCYCLE,i+1 Over 10,000 Consecutive Cycles T0134-01 Figure 6. One-Period Cycle-to-Cycle Jitter CLK CLKB t4CYCLE,i t4CYCLE,i+1 tJ = t4CYCLE,i – t4CYCLE,i+1 Over 10,000 Consecutive Cycles T0135-01 Figure 7. Four-Period Cycle-to-Cycle Jitter Cycle (i) Cycle (i+1) CLK CLKB tPW+,i tPW–,i tPW–,i+1 tCYCLE,i tPW+,i+1 tCYCLE,i+1 tDC,ERR = tPW+,i – tPW+,i+1 and tPW–,i – tPW–,i+1 T0136-01 Figure 8. Cycle-to-Cycle Duty-Cycle Error Submit Documentation Feedback 13 CDCD5704 www.ti.com SCAS823 – DECEMBER 2006 APPLICATION INFORMATION XDR Memory Subsystem (Source: Rambus) XDR System Topology Termination DRSL: 3.2 GHz DQ BYTE [2N+1] XDR DRAM n ASIC XIO XMC DQ BYTE [2N] · · · DQ BYTE [1] DQ BYTE [0] PLL ´4 XDR DRAM 0 RSL: 800 MHz RQ BUS [0:11] CFM 400 MHZ System Clock XDR Clock Generator CDCD5704 CTM 400 MHZ To Other Subsystems M0054-01 14 Submit Documentation Feedback PACKAGE OPTION ADDENDUM www.ti.com 8-Jan-2007 PACKAGING INFORMATION Orderable Device Status (1) Package Type Package Drawing Pins Package Eco Plan (2) Qty CDCD5704PW ACTIVE TSSOP PW 28 50 Green (RoHS & no Sb/Br) CU NIPDAU Level-1-260C-UNLIM CDCD5704PWG4 ACTIVE TSSOP PW 28 50 Green (RoHS & no Sb/Br) CU NIPDAU Level-1-260C-UNLIM CDCD5704PWR ACTIVE TSSOP PW 28 2000 Green (RoHS & no Sb/Br) CU NIPDAU Level-1-260C-UNLIM CDCD5704PWRG4 ACTIVE TSSOP PW 28 2000 Green (RoHS & no Sb/Br) CU NIPDAU Level-1-260C-UNLIM Lead/Ball Finish MSL Peak Temp (3) (1) The marketing status values are defined as follows: ACTIVE: Product device recommended for new designs. LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect. NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design. PREVIEW: Device has been announced but is not in production. Samples may or may not be available. OBSOLETE: TI has discontinued the production of the device. (2) Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability information and additional product content details. TBD: The Pb-Free/Green conversion plan has not been defined. Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes. Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above. Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight in homogeneous material) (3) MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature. Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals. TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release. In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis. Addendum-Page 1 MECHANICAL DATA MTSS001C – JANUARY 1995 – REVISED FEBRUARY 1999 PW (R-PDSO-G**) PLASTIC SMALL-OUTLINE PACKAGE 14 PINS SHOWN 0,30 0,19 0,65 14 0,10 M 8 0,15 NOM 4,50 4,30 6,60 6,20 Gage Plane 0,25 1 7 0°– 8° A 0,75 0,50 Seating Plane 0,15 0,05 1,20 MAX PINS ** 0,10 8 14 16 20 24 28 A MAX 3,10 5,10 5,10 6,60 7,90 9,80 A MIN 2,90 4,90 4,90 6,40 7,70 9,60 DIM 4040064/F 01/97 NOTES: A. B. C. D. All linear dimensions are in millimeters. This drawing is subject to change without notice. Body dimensions do not include mold flash or protrusion not to exceed 0,15. Falls within JEDEC MO-153 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 IMPORTANT NOTICE Texas Instruments Incorporated and its subsidiaries (TI) reserve the right to make corrections, modifications, enhancements, improvements, and other changes to its products and services at any time and to discontinue any product or service without notice. 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