LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only DOT MATRIX LED DISPLAY(1.2Inch) Pb Lead-Free Parts LMD5711/2CSR-XX/P2-PF DATA SHEET DOC. NO : QW0905- LMD5711/2CSR-XX/P2-PF REV. : A DATE : 1 6 - Feb - 2009 發行 立碁電子 DCC LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only PART NO. Page 1/8 LMD5711/2CSR-XX/P2-PF Package Dimensions 4.57X4=18.28 (0.72") 8.1 (0.319") 4.57X6=27.42 (1.08") 31.7 (1.248") 22.86 (0.9") 造 ψ 22.6(0.89") LMD5711/2CSR-XX/P2-PF LIGITEK ψ0.51 TYP. 3.2± 0.5 2.54X6=15.24 (0.6") PIN NO.1 Note : 1.All dimension are in millimeters and (lnch) tolerance is ±0.25mm unless otherwise noted. 2.Specifications are subject to change without notice. LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only PART NO. LMD5711/2CSR-XX/P2-PF Page 2/8 Internal Circuit Diagram LMD5711CSR-XX/P2-PF COLUMN ROW PIN 1 9 2 14 3 8 4 5 12 5 1 6 7 7 2 1 2 13 3 3 4 5 4,11 10 6 LMD5712CSR-XX/P2-PF COLUMN ROW PIN 1 9 2 14 3 8 4 5 12 5 1 6 7 7 2 1 2 13 3 4 5 4,11 10 6 3 LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only PART NO. Page 3/8 LMD5711/2CSR-XX/P2-PF Electrical Connection PIN NO LMD5711CSR-XX/P2-PF PIN NO LMD5712CSR-XX/P2-PF 1 Anode Row 5 1 Cathode Row 5 2 Anode Row 7 2 Cathode Row 7 3 Cathode Column 2 3 Anode Column 2 4 Cathode Column 3 4 Anode Column 3 5 Anode Row 4 5 Cathode Row 4 6 Cathode Column 5 6 Anode Column 5 7 Anode Row 6 7 Cathode Row 6 8 Anode Row 3 8 Cathode Row 3 9 Anode Row 1 9 Cathode Row 1 10 Cathode Column 4 10 Anode Column 4 11 Cathode Column 3 11 Anode Column 3 12 Anode Row 4 12 Cathode Row 4 13 Cathode Column 1 13 Anode Column 1 14 Anode Row 2 14 Cathode Row 2 LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only PART NO. LMD5711/2CSR-XX/P2-PF Page 4/8 Absolute Maximum Ratings at Ta=25 ℃ Ratings Symbol Parameter UNIT SR Forward Current Per Chip IF 30 mA Peak Forward Current Per Chip (Duty 1/10,0.1ms Pulse Width) IFP 100 mA Power Dissipation Per Chip PD 100 mW Reverse Current Per Any Chip Ir 10 μA Operating Temperature Topr -25 ~ +85 ℃ Storage Temperature Tstg -25 ~ +85 ℃ Part Selection And Application Information(Ratings at 25℃) CHIP PART NO Material Emitted Electrical λP (nm) △λ 660 20 (nm) Iv(mcd) Vf(v) Min. Typ. Max. Min. Typ. 1.5 1.8 2.4 5.0 8.5 IV-M Column Cathode LMD5711CSR-XX/P2-PF GaAlAs LMD5712CSR-XX/P2-PF common cathode or anode Red Column Anode Note : 1.The forward voltage data did not including ±0.1V testing tolerance. 2. The luminous intensity data did not including ±15% testing tolerance. 2:1 LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only PART NO. LMD5711/2CSR-XX/P2-PF Page 5/8 Test Condition For Each Parameter Symbol Unit Test Condition Forward Voltage Per Chip Vf volt If=20mA Luminous Intensity Per Chip Iv mcd If=10mA Peak Emission Wavelength λP nm If=20mA Spectral Line Half-Width △λ nm If=20mA Ir μA Vr=5V Parameter Reverse Current Any Chip Luminous Intensity Matching Ratio IV-M LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only PART NO. Page 6/8 LMD5711/2CSR-XX/P2-PF Typical Electro-Optical Characteristics Curve SR CHIP Fig.1 Forward current vs. Forward Voltage Fig.2 Relative Intensity vs. Forward Current 3.0 2.5 100 Relative Intensity Normalize @20mA Forward Current(mA) 1000 10 1.0 2.0 1.5 1.0 0.5 0.0 0.1 1.0 2.0 3.0 4.0 1.0 5.0 10 Fig.3 Forward Voltage vs. Temperature Fig.4 Relative Intensity vs. Temperature 3.0 Relative Intensity@20mA Normalize @25℃ 1.2 Forward Voltage@20mA Normalize @25℃ 1000 Forward Current(mA) Forward Voltage(V) 1.1 1.0 0.9 0.8 -40 -20 0 20 40 60 80 100 Fig.5 Relative Intensity vs. Wavelength 1.0 0.5 0.0 600 650 700 Wavelength (nm) 2.5 2.0 1.5 1.0 0.5 0.0 -40 -20 0 20 40 60 Ambient Temperature( ℃) Ambient Temperature( ℃) Relative Intensity@20mA 100 750 80 100 LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only LMD5711/2CSR-XX/P2-PF PART NO. Page 7/8 Soldering Condition(Pb-Free) 1.Iron: Soldering Iron:30W Max Temperature 350° C Max Soldering Time:3 Seconds Max(One time only) Distance:Solder Temperature 1/16 Inch Below Seating Plane For 3 Seconds At 260°C 2.Wave Soldering Profile Dip Soldering Preheat: 120°C Max Preheat time: 60seconds Max Ramp-up:2°C/sec(max) Ramp-Down:-5°C/sec(max) Solder Bath:260°C Max Dipping Time:3 seconds Max Distance:Solder Temperature 1/16 Inch Below Seating Plane For 3 Seconds At 260°C Temp(° C) 260°C3sec Max 260° 5°/sec max 120° 25° 0° 0 2° /sec max Preheat 50 100 150 Time(sec) 60 Seconds Max Note: 1.Wave solder should not be made more than one time. 2.You can just only select one of the soldering conditions as above. 造 LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only PART NO. Page 8/8 LMD5711/2CSR-XX/P2-PF Reliability Test: Test Item Test Condition Description Reference Standard 1.Under Room Temperature 2.If=10mA 3.t=1000 hrs (-24hrs, +72hrs) This test is conducted for the purpose of detemining the resistance of a part in electrical and themal stressed. MIL-STD-750: 1026 MIL-STD-883: 1005 JIS C 7021: B-1 High Temperature Storage Test 1.Ta=105 ℃±5 ℃ 2.t=1000 hrs (-24hrs, +72hrs) The purpose of this is the resistance of the device which is laid under condition of high temperature for hours. MIL-STD-883:1008 JIS C 7021: B-10 Low Temperature Storage Test 1.Ta=-40 ℃±5℃ 2.t=1000 hrs (-24hrs, +72hrs) The purpose of this is the resistance of the device which is laid under condition of low temperature for hours. High Temperature High Humidity Test 1.Ta=65 ℃±5℃ 2.RH=90 %~95 % 3.t=240hrs ±2hrs The purpose of this test is the resistance of the device under tropical for hours. 1.Ta=105 ℃±5 ℃&-40 ℃±5℃ (10min) (10min) 2.total 10 cycles The purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. MIL-STD-202: 107D MIL-STD-750: 1051 MIL-STD-883: 1011 Solder Resistance Test 1.T.Sol=260 ℃±5℃ 2.Dwell time= 10 ±1sec. This test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. MIL-STD-202: 210A MIL-STD-750: 2031 JIS C 7021: A-1 Solderability Test 1.T.Sol=230 ℃±5℃ 2.Dwell time=5 ±1sec This test intended to see soldering well performed or not. MIL-STD-202: 208D MIL-STD-750: 2026 MIL-STD-883: 2003 JIS C 7021: A-2 造 Thermal Shock Test JIS C 7021: B-12 MIL-STD-202:103B JIS C 7021: B-11 品製造 Operating Life Test