ICX206AKB Diagonal 4.5mm (Type 1/4) CCD Image Sensor for NTSC Color Video Cameras Description The ICX206AKB is an interline CCD solid-state image sensor suitable for NTSC color video cameras. Compared with the current product ICX086AKB, sensitivity and saturation signal are improved drastically through the adoption of Super HAD CCD technology. Ye, Cy, Mg, and G complementary color mosaic filters are used. This chip features a field period readout system and an electronic shutter with variable charge-storage time. Also, this outline is miniaturized by using original package. Features • Maximum package dimensions: φ8mm • High sensitivity (+4dB compared with ICX086AKB) • High saturation signal (+2.2dB compared with ICX086AKB) • Horizontal register: 3.3 to 5.0V drive • Reset gate: 3.3 to 5.0V drive • No voltage adjustment (Reset gate and substrate bias are not adjusted.) • Low smear and low dark current • Excellent antiblooming characteristics • Continuous variable-speed shutter • Recommended range of exit pupil distance: –20 to –100mm • Ye, Cy, Mg, and G complementary color mosaic filters on chip Device Structure • Interline CCD image sensor • Image size: • Number of effective pixels: • Total number of pixels: • Chip size: • Unit cell size: • Optical black: • Number of dummy bits: • Substrate material: 13 pin PCA (Ceramic) AAAAA AAAAA AAAAA AAAAA AAAAA Pin 1 1 V 2 Pin 8 H 12 25 Optical black position (Top View) Diagonal 4.5mm (Type 1/4) 510 (H) × 492 (V) approx. 250K pixels 537 (H) × 505 (V) approx. 270K pixels 4.47mm (H) × 3.80mm (V) 7.15µm (H) × 5.55µm (V) Horizontal (H) direction: Front 2 pixels, rear 25 pixels Vertical (V) direction: Front 12 pixels, rear 1 pixel Horizontal 16 Vertical 1 (even fields only) Silicon ∗Super HAD CCD is a registered trademark of Sony Corporation. Super HAD CCD is a CCD that drastically improves sensitivity by introducing newly developed semiconductor technology by Sony Corporation into Sony's high-performance HAD (Hole-Accumulation Diode) sensor. Sony reserves the right to change products and specifications without prior notice. This information does not convey any license by any implication or otherwise under any patents or other right. Application circuits shown, if any, are typical examples illustrating the operation of the devices. Sony cannot assume responsibility for any problems arising out of the use of these circuits. –1– E97Z29B99 ICX206AKB VOUT GND NC Vφ1 Vφ2 Vφ3 Vφ4 Block Diagram and Pin Configuration (Top View) 7 6 5 4 3 2 1 Vφ4 Vφ3 Hφ2 Vertical Register 1 Cy Ye Cy Ye G Mg G Mg Cy Ye Cy Ye G Mg G Mg Cy Ye Cy Ye Mg G Mg G 13 2 Vφ2 12 3 Vφ1 Note) NC Horizontal Register Note) 5 10 VL 6 : Photo sensor 9 VL RG 13 12 8 φSUB GND VDD VOUT Hφ2 11 Hφ1 10 φSUB VDD 9 RG 11 4 7 8 Hφ1 Pin Description Pin No. Symbol Description Pin No. Symbol Description 1 Vφ4 Vertical register transfer clock 8 VDD Supply voltage 2 Vφ3 Vertical register transfer clock 9 φSUB Substrate clock 3 Vφ2 Vertical register transfer clock 10 VL Protective transistor bias 4 Vφ1 Vertical register transfer clock 11 RG Reset gate clock 5 NC 12 Hφ1 Horizontal register transfer clock 6 GND GND 13 Hφ2 Horizontal register transfer clock 7 VOUT Signal output Absolute Maximum Ratings Item Against φSUB Against GND Against VL Ratings Unit VDD, VOUT, RG – φSUB –40 to +8 V Vφ1, Vφ3 – φSUB –50 to +15 V Vφ2, Vφ4, VL – φSUB –50 to +0.3 V Hφ1, Hφ2, GND – φSUB –40 to +0.3 V VDD, VOUT, RG – GND –0.3 to +18 V Vφ1, Vφ2, Vφ3, Vφ4 – GND –10 to +18 V Hφ1, Hφ2 – GND –10 to +6 V Vφ1, Vφ3 – VL –0.3 to +28 V Vφ2, Vφ4, Hφ1, Hφ2, GND – VL –0.3 to +15 V to +15 V Voltage difference between vertical clock input pins Between input clock pins Hφ1 – Hφ2 –5 to +5 V –13 to +13 V Storage temperature –30 to +80 °C Operating temperature –10 to +60 °C Hφ1, Hφ2 – Vφ4 ∗1 +24V (Max.) when clock width < 10µs, clock duty factor < 0.1%. –2– Remarks ∗1 ICX206AKB Bias Conditions Symbol Item Min. Typ. Max. Unit 14.55 15.0 ∗1 15.45 V Supply voltage VDD Protective transistor bias VL Substrate clock φSUB ∗2 Reset gate clock φRG ∗2 Remarks ∗1 VL setting is the VVL voltage of the vertical transfer clock waveform, or the same power supply as the VL power supply for the V driver should be used. ∗2 Do not apply a DC bias to the substrate clock and reset gate clock pins, because a DC bias is generated within the CCD. DC Characteristics Item Symbol Supply current Min. IDD Typ. Max. Unit 3 5 mA Remarks Clock Voltage Conditions Item Readout clock voltage Vertical transfer clock voltage Horizontal transfer clock voltage Min. Typ. Max. Unit Waveform diagram VVT 14.55 15.0 15.45 V 1 VVH1, VVH2 –0.05 0 0.05 V 2 VVH3, VVH4 –0.2 0 0.05 V 2 VVL1, VVL2, VVL3, VVL4 –8.0 –7.0 –6.5 V 2 VVL = (VVL3 + VVL4)/2 VφV 6.3 7.0 8.05 V 2 VφV = VVHn – VVLn (n = 1 to 4) Symbol VVH = (VVH1 + VVH2)/2 VVH3 – VVH –0.25 0.1 V 2 VVH4 – VVH –0.25 0.1 V 2 VVHH 0.3 V 2 High-level coupling VVHL 0.3 V 2 High-level coupling VVLH 0.3 V 2 Low-level coupling VVLL 0.3 V 2 Low-level coupling VφH 3.0 3.3 5.25 V 3 VHL –0.05 0 0.05 V 3 3.0 3.3 5.5 V 4 Input through 0.1µF capacitance VRGLH – VRGLL 0.4 V 4 Low-level coupling VRGL – VRGLm 0.5 V 4 Low-level coupling 23.5 V 5 VφRG Reset gate clock voltage Remarks Substrate clock voltage VφSUB 21.0 22.0 –3– ICX206AKB Clock Equivalent Circuit Constant Item Symbol Min. Typ. Max. Unit CφV1, CφV3 390 pF CφV2, CφV4 220 pF CφV12, CφV34 330 pF CφV23, CφV41 270 pF CφV13 82 pF CφV24 75 pF Capacitance between horizontal transfer clock and GND CφH1, CφH2 33 pF Capacitance between horizontal transfer clocks CφHH 33 pF Capacitance between reset gate clock and GND CφRG 5 pF Capacitance between substrate clock and GND CφSUB 100 pF Vertical transfer clock series resistor R1, R2, R3, R4 100 Ω Vertical transfer clock ground resistor RGND 15 Ω Horizontal transfer clock series resistor RφH 15 Ω Reset gate clock series resistor RφRG 39 Ω Capacitance between vertical transfer clock and GND Capacitance between vertical transfer clocks Vφ1 Remarks Vφ2 CφV12 R1 R2 RφH RφH Hφ2 Hφ1 CφV1 CφHH CφV2 CφV41 CφV23 CφH1 CφH2 CφV13 CφV24 CφV4 RGND CφV3 R4 R3 CφV34 Vφ4 Vφ3 Vertical transfer clock equivalent circuit Horizontal transfer clock equivalent circuit RφRG RGφ CφRG Reset gate clock equivalent circuit –4– ICX206AKB Drive Clock Waveform Conditions (1) Readout clock waveform 100% 90% II II φM VVT φM 2 10% 0% tr twh 0V tf (2) Vertical transfer clock waveform Vφ1 Vφ3 VVHH VVH1 VVHH VVH VVHL VVHL VVH3 VVHL VVL1 VVH VVHH VVHH VVHL VVL3 VVLH VVLH VVLL VVLL VVL VVL Vφ2 Vφ4 VVHH VVHH VVH VVH VVHH VVHH VVHL VVH2 VVHL VVHL VVH4 VVL2 VVHL VVLH VVLH VVLL VVLL VVL VVL4 VVH = (VVH1 + VVH2)/2 VVL = (VVL3 + VVL4)/2 VφV = VVHn – VVLn (n = 1 to 4) –5– VVL ICX206AKB (3) Horizontal transfer clock waveform tr twh tf 90% twl VφH 10% VHL (4) Reset gate clock waveform tr twh tf VRGH twl Point A VφRG RG waveform VRGLH VRGL VRGLL VRGLm Hφ1 waveform 10% VRGLH is the maximum value and VRGLL is the minimum value of the coupling waveform during the period from Point A in the above diagram until the rising edge of RG. In addition, VRGL is the average value of VRGLH and VRGLL. VRGL = (VRGLH + VRGLL)/2 Assuming VRGH is the minimum value during the interval twh, then: VφRG = VRGH – VRGL Negative overshoot level during the falling edge of RG is VRGLm. (5) Substrate clock waveform 100% 90% φM VφSUB 10% VSUB 0% (A bias generated within the CCD) tr twh –6– φM 2 tf ICX206AKB Clock Switching Characteristics Item Symbol VT Vertical transfer clock Vφ1, Vφ2, Vφ3, Vφ4 Horizontal transfer clock Readout clock During imaging Hφ twh twl tr tf Min. Typ. Max. Min. Typ. Max. Min. Typ. Max. Min. Typ. Max. 2.3 2.5 0.1 0.1 During Hφ1 parallel-serial Hφ2 conversion 46 41 46 5.6 Reset gate clock φRG 11 Substrate clock φSUB 1.5 1.65 14 76 6.5 9.5 6.5 9.5 0.007 0.007 5.6 0.007 0.007 80 6.0 5.0 0.5 µs During readout 250 ns ∗1 5 41 Unit Remarks ns ∗2 µs ns 0.5 µs During drain charge ∗1 When vertical transfer clock driver CXD1267AN is used. ∗2 When VφH = 3.0V. tf ≥ tr – 2ns, and the cross-point voltage (VCR) for the Hφ1 rising side of the Hφ1 and Hφ2 waveforms must be at least VφH/2 [V]. –7– ICX206AKB Image Sensor Characteristics Item (Ta = 25°C) Symbol Min. Typ. S 680 900 RMgG 0.93 1.35 2 RYeCy 1.15 1.48 2 Saturation signal Ysat 900 Smear Sm Video signal shading SHy Sensitivity Sensitivity ratio Max. Unit Measurement method mV 1 Remarks mV 3 0.01 % 4 20 % 5 Zone 0 and I 25 % 5 Zone 0 to II' ∆Sr 10 % 6 ∆Sb 10 % 6 Dark signal Ydt 2 mV 7 Ta = 60°C Dark signal shading ∆Ydt 1 mV 8 Ta = 60°C Flicker Y Fy 2 % 9 Flicker R-Y Fcr 5 % 9 Flicker B-Y Fcb 5 % 9 Line crawl R Lcr 3 % 10 Line crawl G Lcg 3 % 10 Line crawl B Lcb 3 % 10 Line crawl W Lcw 3 % 10 Lag Lag 0.5 % 11 Uniformity between video signal channels 0.007 Ta = 60°C Zone Definition of Video Signal Shading 510 (H) 10 8 9 V 10 H 8 H 8 Zone 0, I Zone II, II' V 10 492 (V) 10 Ignored region Effective pixel region Measurement System [∗Y] [∗A] CCD signal output Y signal output LPF1 (3dB down 4MHz) CCD C.D.S AMP S [∗C] H LPF2 S H Chroma signal output (3dB down 1MHz) Note) Adjust the amplifier gain so that the gain between [∗A] and [∗Y], and between [∗A] and [∗C] equals 1. –8– ICX206AKB Image Sensor Characteristics Measurement Method Measurement conditions 1) In the following measurements, the device drive conditions are at the typical values of the bias and clock voltage conditions. 2) In the following measurements, spot blemishes are excluded and, unless otherwise specified, the optical black level (OB) is used as the reference for the signal output, which is taken as the value of Y signal output or chroma signal output of the measurement system. Color coding of this image sensor & Composition of luminance (Y) and chroma (color difference) signals Cy Ye Cy Ye A1 G Mg G Mg Cy Ye Cy Ye Mg G Mg G B A2 As shown in the left figure, fields are read out. The charge is mixed by pairs such as A1 and A2 in the A field. (pairs such as B in the B field) As a result, the sequence of charges output as signals from the horizontal shift register (Hreg) is, for line A1, (G + Cy), (Mg + Ye), (G + Cy), and (Mg + Ye). Hreg Color Coding Diagram These signals are processed to form the Y signal and chroma (color difference) signal. The Y signal is formed by adding adjacent signals, and the chroma signal is formed by subtracting adjacent signals. In other words, the approximation: Y = {(G + Cy) + (Mg + Ye)} × 1/2 = 1/2 {2B + 3G + 2R} is used for the Y signal, and the approximation: R – Y = {(Mg + Ye) – (G + Cy)} = {2R – G} is used for the chroma (color difference) signal. For line A2, the signals output from Hreg in sequence are (Mg + Cy), (G + Ye), (Mg + Cy), (G + Ye). The Y signal is formed from these signals as follows: Y = {(G + Ye) + (Mg + Cy)} × 1/2 = 1/2 {2B + 3G + 2R} This is balanced since it is formed in the same way as for line A1. In a like manner, the chroma (color difference) signal is approximated as follows: – (B – Y) = {(G + Ye) – (Mg + Cy)} = – {2B – G} In other words, the chroma signal can be retrieved according to the sequence of lines from R – Y and – (B – Y) in alternation. This is also true for the B field. –9– ICX206AKB Definition of standard imaging conditions 1) Standard imaging condition I: Use a pattern box (luminance 706cd/m2, color temperature of 3200K halogen source) as a subject. (Pattern for evaluation is not applicable.) Use a testing standard lens with CM500S (t = 1.0mm) as an IR cut filter and image at F5.6. The luminous intensity to the sensor receiving surface at this point is defined as the standard sensitivity testing luminous intensity. 2) Standard imaging condition II: Image a light source (color temperature of 3200K) with a uniformity of brightness within 2% at all angles. Use a testing standard lens with CM500S (t = 1.0mm) as an IR cut filter. The luminous intensity is adjusted to the value indicated in each testing item by the lens diaphragm. 3) Standard imaging condition III: Image a light source (color temperature of 3200K) with a uniformity of brightness within 2% at all angles. Use a testing standard lens (exit pupil distance –33mm) with CM500S (t = 1.0mm) as an IR cut filter. The luminous intensity is adjusted to the value indicated in each testing item by the lens diaphragm. 1. Sensitivity Set to standard imaging condition I. After selecting the electronic shutter mode with a shutter speed of 1/250s, measure the Y signal (Ys) at the center of the screen and substitute the value into the following formula. S = Ys × 250 [mV] 60 2. Sensitivity ratio Set to standard imaging condition II. Adjust the luminous intensity so that the average value of the Y signal output is 200mV, and then measure the Mg signal output (SMg [mV]) and G signal output (SG [mV]), and Ye signal output (SYe [mV]) and Cy signal output (SCy [mV]) at the center of the screen with frame readout method. Substitute the values into the following formula. RMgG = SMg/SG RYeCy = SYe/SCy 3. Saturation signal Set to standard imaging condition II. After adjusting the luminous intensity to 10 times the intensity with average value of the Y signal output, 200mV, measure the minimum value of the Y signal. 4. Smear Set to standard imaging condition II. With the lens diaphragm at F5.6 to F8, adjust the luminous intensity to 500 times the intensity with average value of the Y signal output, 200mV. When the readout clock is stopped and the charge drain is executed by the electronic shutter at the respective H blankings, measure the maximum value YSm [mV] of the Y signal output and substitute the value into the following formula. 1 YSm 1 × × × 100 [%] (1/10V method conversion value) Sm = 10 200 500 5. Video signal shading Set to standard imaging condition III. With the lens diaphragm at F5.6 to F8, adjust the luminous intensity so that the average value of the Y signal output is 200mV. Then measure the maximum (Ymax [mV]) and minimum (Ymin [mV]) values of the Y signal and substitute the values into the following formula. SHy = (Ymax – Ymin)/200 × 100 [%] 6. Uniformity between video signal channels Set to standard imaging condition II. Adjust the luminous intensity so that the average value of the Y signal output is 200mV, and then measure the maximum (Crmax, Cbmax [mV]) and minimum (Crmin, Cbmin [mV]) values of the R – Y and B – Y channels of the chroma signal and substitute the values into the following formula. ∆Sr = | (Crmax – Crmin)/200 | × 100 [%] ∆Sb = | (Cbmax – Cbmin)/200 | × 100 [%] – 10 – ICX206AKB 7. Dark signal Measure the average value of the Y signal output (Ydt [mV]) with the device ambient temperature 60°C and the device in the light-obstructed state, using the horizontal idle transfer level as a reference. 8. Dark signal shading After measuring 7, measure the maximum (Ydmax [mV]) and minimum (Ydmin [mV]) values of the Y signal output and substitute the values into the following formula. ∆Ydt = Ydmax – Ydmin [mV] 9. Flicker 1) Fy Set to standard imaging condition II. Adjust the luminous intensity so that the average value of the Y signal output is 200mV, and then measure the difference in the signal level between fields (∆Yf [mV]). Then substitute the value into the following formula. Fy = (∆Yf/200) × 100 [%] 2) Fcr, Fcb Set to standard imaging condition II. Adjust the luminous intensity so that the average value of the Y signal output is 200mV, insert an R or B filter, and then measure both the difference in the signal level between fields of the chroma signal (∆Cr, ∆Cb) as well as the average value of the chroma signal output (CAr, CAb). Substitute the values into the following formula. Fci = (∆Ci/CAi) × 100 [%] (i = r, b) 10. Line crawls Set to standard imaging condition II. Adjust the luminous intensity so that the average value of the Y signal output is 200mV, and then insert a white subject and R, G, and B filters and measure the difference between Y signal lines for the same field (∆Ylw, ∆Ylr, ∆Ylg, ∆Ylb [mV]). Substitute the values into the following formula. Lci = (∆Yli/200) × 100 [%] (i = w, r, g, b) 11. Lag Adjust the Y signal output value generated by strobe light to 200mV. After setting the strobe light so that it strobes with the following timing, measure the residual signal (Ylag). Substitute the value into the following formula. Lag = (Ylag/200) × 100 [%] FLD V1 Light Strobe light timing Y signal output 200mV Output – 11 – Ylag (lag) RG Hφ1 Hφ2 XV4 XSG2 XV3 XSG1 XV1 XV2 XSUB CXD1267AN 16 5 13 12 11 8 9 10 22/20V 14 7 15 17 4 6 19 18 3 22/16V 1/35V 0.1 4 5 6 ICX206AKB (BOTTOM VIEW) 3 2 1 0.1 13 12 11 10 Hφ1 2 100k Vφ3 Vφ4 RG 20 NC 9 φSUB 1 Vφ1 VL 15V Vφ2 Hφ2 GND – 12 – 8 7 VOUT 3.3/20V VDD Drive Circuit 0.01 3.9k 1500p 100 2SK523 3.3/16V 1M CCD OUT –7.0V ICX206AKB ICX206AKB Spectral Sensitivity Characteristics (excludes both lens characteristics and light source characteristics) 1.0 Ye 0.8 Relative Response Cy G 0.6 0.4 Mg 0.2 0.0 400 450 500 550 600 650 700 Wave Length [nm] Sensor Readout Clock Timing Chart V1 2.5 V2 Odd Field V3 V4 31.3 1.2 1.5 2.5 2.0 0.3 V1 V2 Even Field V3 V4 Unit: µs – 13 – – 14 – CCD OUT V4 V3 V2 V1 HD BLK VD FLD 492 491 525 1 2 3 4 5 520 Drive Timing Chart (Vertical Sync) 10 2 4 6 1 3 5 15 2 4 6 1 3 5 492 491 2 4 6 1 3 5 280 2 4 6 1 3 5 ICX206AKB 275 270 265 260 20 – 15 – SUB V4 V3 V2 V1 RG H2 H1 BLK HD 15 10 510 1 2 3 5 505 500 Drive Timing Chart (Horizontal Sync) ICX206AKB 10 15 16 1 2 1 2 3 5 10 5 1 2 3 25 20 ICX206AKB Notes on Handling 1) Static charge prevention CCD image sensors are easily damaged by static discharge. Before handling be sure to take the following protective measures. a) Either handle bare handed or use non-chargeable gloves, clothes or material. Also use conductive shoes. b) When handling directly use an earth band. c) Install a conductive mat on the floor or working table to prevent the generation of static electricity. d) Ionized air is recommended for discharge when handling CCD image sensor. e) For the shipment of mounted substrates, use boxes treated for the prevention of static charges. 2) Soldering a) Make sure the package temperature does not exceed 80°C. b) Solder dipping in a mounting furnace causes damage to the glass and other defects. Use a ground 30W soldering iron and solder each pin in less than 2 seconds. For repairs and remount, cool sufficiently. c) To dismount an image sensor, do not use a solder suction equipment. When using an electric desoldering tool, use a thermal controller of the zero cross On/Off type and connect it to ground. 3) Dust and dirt protection Image sensors are packed and delivered by taking care of protecting its glass plates from harmful dust and dirt. Clean glass plates with the following operation as required, and use them. a) Operate in clean environments (around class 1000 is appropriate). b) Do not either touch glass plates by hand or have any object come in contact with glass surfaces. Should dirt stick to a glass surface, blow it off with an air blower. (For dirt stuck through static electricity ionized air is recommended.) c) Clean with a cotton bud and ethyl alcohol if the grease stained. Be careful not to scratch the glass. d) Keep in a case to protect from dust and dirt. To prevent dew condensation, preheat or precool when moving to a room with great temperature differences. e) When a protective tape is applied before shipping, just before use remove the tape applied for electrostatic protection. Do not reuse the tape. 4) Do not expose to strong light (sun rays) for long periods, color filters will be discolored. When high luminance objects are imaged with the exposure level control by electronic-iris, the luminance of the imageplane may become excessive and discolor of the color filter will possibly be accelerated. In such a case, it is advisable that taking-lens with the automatic-iris and closing of the shutter during the power-off mode should be properly arranged. For continuous using under cruel condition exceeding the normal using condition, consult our company. 5) Exposure to high temperature or humidity will affect the characteristics. Accordingly avoid storage or usage in such conditions. 6) CCD image sensors are precise optical equipment that should not be subject to too much mechanical shocks. 7) Eclipse (to get dark around the four corners of the picture) may occur when some object lenses are in the open iris state. Top view AAAAAA AAAAAA AAAAAA AAAAAA AAAAAA AAAAAA Effective image sensor area – 16 – 4.14 φ5 .1 2 Sealed resin exuded area 1.4 2.0 – 17 – H GOLD PLATING Fe-Ni-Co Alloy 0.4g LEAD TREATMENT LEAD MATERIAL PACKAGE WEIGHT + 0.1 φ0.25 – 0.05 ~ 1.5 3.80 7.25 ± 0.1 7.60 ± 0.25 V Ceramic A PACKAGE MATERIAL PACKAGE STRUCTURE ~ B 7.60 ± 0.25 7.25 ± 0.1 3.80 3.15 13pin PCA φ 0 8. 2.50 ± 0.3 B' 6 5 4 ~ 11 3 C 1 13 2 12 71 φ5. φ0.3 M ∗ Center of the package: The center is halfway between two pairs of opposite sides, as measured from “B”, “B'”. 8. The thickness of the cover glass is 0.75mm, and the refractive index is 1.5. 7. The tilt of the effective image area relative to the bottom “C” is less than 60µm. 6. The height from the bottom “C” to the effective image area is 1.44 ± 0.15mm. 5. The rotation angle of the effective image area relative to H and V is ± 1°. 4. The center of the effective image area relative to the center of the package (∗) is (H, V) = (0, 0) ± 0.15mm. 3. The bottom “C” of the package is the height reference. 2. The point “B” of the package is the horizontal reference. The point “B'” of the package is the vertical reference. 1. “A” is the center of the effective image area. 7 9 10 12- .71° 25 8 .4 0 φ4 Unit: mm 25 0. 1.4 ° ± .86 0 12 Package Outline ICX206AKB