C2012X8R1E334M125AA TDK Item Description : C2012X8R1E334MT**** DC Bias Characteristic 0 Application & Main Feature -5 Cap. Change/% Commercial Grade ( High Temperature Application ) Series C2012 [EIA CC0805] -10 -15 -20 -25 -30 -35 -40 0 5 10 15 20 25 30 DC Bias/V 2.00mm 1.25mm 1.25mm 0.20mm 0.50mm +/-0.2mm +/-0.2mm +/-0.2mm Min. Min. Temperature Characteristic Temperature Characteristics 20 10 10000 0 1000 100 10 1 0.1 0.01 Rated Voltage 1E (25Vdc) 0.01 Capacitance 0.1 1 |Z| Capacitance Tolerance -40 -50 -60 -70 10 100 1000 -80 -60 -40 -20 ESR 40 60 80 100 120 140 160 180 TCBias(1/2Rated) Ripple Temperature Rise Characteristics 25 Temperature Rise/degC Dissipation Factor 1000 100 10 Not Applicable 20 15 10 5 0 1 0.001 20 Temp.Chara. 10000 3% Max. 0 Temperature/degC Cap. vs. Freq. Characteristic M (+/-20%) AEC-Q200 -30 Frequency/MHz 330nF 1.52Gohm Min. -20 -90 0.001 Insulation Resistance -10 -80 0.001 Cap./nF Characterization Sheet ( Multilayer Ceramic Chip Capacitors ) X8R (-55 to 150 degC +/-15%) |Z|, ESR vs. Freq. Characteristics 100000 Cap. Change/% L W T B G |Z|, ESR/ohm Dimensions 0.01 0.1 1 10 Frequency/MHz 100 1000 0 0.5 1 100kHz All specifications are subject to change without notice. 1.5 2 Current/Arms 500kHz 1MHz January 3, 2016