Semtech E8405A 100-500mhz dual channel, digitally programmed pin electronics solution Datasheet

E8405A
100-500MHz Dual Channel, Digitally
Programmed Pin Electronics Solution
PRELIMINARY
Features
TEST AND MEASUREMENT PRODUCTS
Description
The E8405A has a Driver and Window Comparator receiver
and commutating Load Circuit for each channel with performance settings to save power or maximize bandwidth. Also
present is a PMU per channel that also doubles as a resistive
load function to the DUT. Each PMU has a 16-bit ADC for
analog parametric measurement.
• Two Fully Integrated Pin Channels including:
- 16-bit DACs for each level
- Tri-level Driver
- Window Receiver
- 4mA/40mA Ranged Active Commutating Load
- Parametric Measurement Unit
- Thevinen Load
- Waveform Clamps
- 16-bit ADC for PMU measurements
• Driver, Comparator and PMU maximum 8V span over
-2 to +7V range
• Configurable Output Protection
• 4 PMU current ranges; 24mA, 2.4mA, 240μA, 24μA
• On-Chip ADC for each PMU
• 50MHz Serial Bus Programming
- SPI™/QSPI™/ MICROWIRE™
- Daisy-chainable
• Power Dissipation
~0.9W/Channel (quiescent, Low Perf, I/O mode)
~1.0W/Channel (quiescent, High Perf, I/O mode)
• Pin and Software Compatible to E8400, E8410, E8415
• Digitally Programmable Performance/Power
• Differential Drive and Receive Functionality
• Optimal Small Swing Performance
• Small 11mm x 11mm Package
All level’s DACs for the Driver, Receiver, Load and PMU are
on-chip and are programmed via a high speed serial bus.
Each of the level’s DACs have offset and gain registers for
on-chip calibrations.
The Driver circuit is capable of forcing two levels to the DUT
(DVH and DVL) as well as a third voltage for a termination
level (DVT) to terminate high-speed DUT signals to the Comparator receivers into a high quality 50Ω load. The Driver
can also be configured to a high impedance (HiZ) state for
an open termination of DUT signals.
Waveform clamps are also available to clip the input signals
from a DUT when not using the Driver as a termination.
The clamps prevent reflections from returning to the DUT
transmission line which can create timing errors and false
triggering.
All of the on-chip DAC levels and configuration registers
for each channel may be programmed via SET commands.
This PinCast method of programming allows all channels in
a system to be programmed concurrently with a simple set
command whereby any pin channel that had been assigned
to that set will respond.
Functional Block Diagram
The two driver circuits may be placed into a differential drive
mode. This reduces driver-to-driver skews to levels difficult to
achieve by external deskewing. The two window comparators
may also be placed into a differential receive mode. These
features enable higher quality testing of differential signals
to/from the DUT.
Applications
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Logic Testers
Mixed-Signal Test Equipment
Memory Testers
Flash Memory Testers
ASIC Verifiers
SPI and QSPI and trademarks of Motorola, Inc.
MICROWIRE is a trademark of National Semiconductor Corp.
Revision 6, October 19, 2007
www.semtech.com
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