Features
•
•
•
•
•
•
•
•
•
•
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Up to 1.6M Used Gates and 596 Pads with 3.3V, 3V and 2.5V Libraries
High Speed - 170 ps Gate Delay - 2 Input NAND, FO = 2 (nominal)
System Level Integration Technology Cores on Request
Memories: SRAM and TPRAM, Gate Level or Embedded, with EDAC
I/O Interfaces:
– 5V Tolerant/Compliant (S) or 3V (R) Matrix Options
– CMOS, LVTTL, LVDS, PCI, USB, etc.
– Output Currents Programmable from 2 to 24 mA, by Step of 2 mA
– Cold Sparing Buffers (2 µA Max. Leakage Current at 3.6V Worst Case Mil Temp.)
250 MHz PLL (on request), 220 MHz LVDS and 800 MHz Max. Toggle Frequency at 3.3V
Deep Submicron CAD Flow
ESD better than 2000V
No Single Event Latch-Up below an LET Threshold of 80 MeV/mg/cm2
SEU Hardened Flip-flops
Tested Up to a Total Dose of 300 Krad (Si) according to Mil STD 883 Method 1019
Quality Grades
- QML Q and V with SMD 5962-01B01 and 5962-08B01
- ESCC QML with ESCC 9202 / 076
Description
The MH1RT Gate Array and Embedded Array families from Atmel are fabricated on a
radiation hardened 0.35 micron CMOS process, with up to 4 levels of metal for interconnect. This family features arrays with up to 1.6 million routable gates and 596
pads. The high density and high pin count capabilities of the MH1RT family, coupled
with the ability to embed cores or memories on the same silicon, make the MH1RT
series of arrays one of the best choices for System Level Integration.
Rad Hard
1.6M Used Gates
0.35 µm CMOS
Sea of Gates/
Embedded Array
MH1RT
The MH1RT series is supported by an advanced software environment based on
industry standards linking proprietary and commercial tools. Verilog®, DFT®, Synopsys® and Vital are the reference front end tools. The Cadence® ‘Logic Design Planner’
floor planning associated with timing driven layout provides an efficient back end
cycle.
The MH1RT series comes as a dual use of the MH1 series, adding:
- through process changes, the latch-up susceptibility better than 80 MeV/mg/cm2 and
the 300 Krad (Si) radiation level as required by most space programs.
- through cells relayout, an SEU built-in protection allowing to SEU harden only where
it is necessary with respect to function requirements
With a background of 15 years experience, the MH1RT series comes as the Atmel
7th generation of ASIC series designed for radiation hardened applications.
4110L–AERO–11/10
Table 1. List of Available MH1RT Matrices
Notes:
Device
Number
Typical Routable
Gates
Max Pad
Count
Max
I/O Count
Gate
Speed(1)
Max. Sites Count
MH1099E
519,000
332
324
180 ps
920,385
MH1156E
764,000
412
404
180 ps
1,447,975
MH1242E
1,198,000
512
504
180 ps
2,275,377
MH1332E
1,634,000
596
588
180 ps
3,098,804
1. Nominal 2 Input NAND Gate FO = 2 at 3.3V.
Design
Design Systems
Supported
Atmel supports several major software systems for design with complete macro cell libraries, as
well as utilities for checking the netlist and estimated pre-route delay simulations.
The following design systems are supported:
Table 2. Supported design systems
2
System
Available Tools
Cadence
NCsim® - Verilog Simulator
Encounter™ - Floorplanner
RTL compiler® - Synthesis (Ambit)
Mentor/Model Tech
Questasim/Modelsim Verilog and VHDL (VITAL) Simulator
DFT - Scan insertion and ATPG, BIST
Synopsys®
Design Compiler™ - Synthesis
Primetime® - Static Path
Formality® - Equivalence Checking
DFTmax - Scan insertion and ATPG
MH1RT
4110L–AERO–11/10
MH1RT
Design Flow
and Tools
Atmel’s design flow for Gate Array/Embedded Array is structured to allow the designer to consolidate the greatest number of system components possible onto the same silicon chip, using
available third party design tools. Atmel’s cell library reflects silicon performance over extremes
of temperature, voltage, and process, and includes the effects of metal loading, inter-level
capacitance, and edge rise and fall times. The Design Flow includes clock tree synthesis to minimize skew and latency. RC extraction is performed on final design database and incorporated
into the timing analysis.
The Typical Gate Array/Embedded Array Design Flow, shown on page 4, provides a pictorial
description of the typical interaction between Atmel’s Gate Array/Embedded Array design staff
and the customer. Atmel will deliver design kits to support the customer’s synthesis, verification,
floorplanning, and SCAN insertion activities. Tools such as Synopsys Synthesis, Cadence and
Mentor Logic Simulators are used, and many others are available. Should a design include
embedded memory or an embedded core, Atmel needs to understand the partition of the Array,
and define the location of the memory blocks and/or cores (preliminary place and route) so that
an underlayer layout model can be created (Base Wafer).
Following the Logic Review, the design is routed, and post-route RC data is extracted. Following
post-route verification and the Design Review, the design is taped out for fabrication.
The purpose of these reviews is to check the conformity of the design to Atmel rules, and
acknowledge it in formal documents.
3
4110L–AERO–11/10
Figure 1. Typical Gate Array/Embedded Array Design Flow
Atmel
Design Kit
Delivery
Base Wafer
Definition
Kickoff
Design
Synthesis
SCAN
Insertion
Functional
and Static
Path Sims
Atmel
Preliminary
Place & Route
Floorplan
Base Wafer
Creation
Atmel
Database
Handoff
Database
Acceptance
Base Wafer
Pre-route
Verification
Logic
Review
Atmel
Atmel
Place & Route
and
Clock Tree
Post-route
Verification
Base Wafer
Fabrication
Design
Review
Atmel
Tape Out
Metallization
Layers
Atmel
Masks
Generation
Atmel
Joint
Fab.,
Assembly
and Test
Rev.1.6 - 07/2003
Atmel
Customer
4
MH1RT
4110L–AERO–11/10
MH1RT
Pin Definition
Requirements
The corner pads are reserved for Power and Ground only. All other pads are fully programmable
as Input, Output, Bidirectional, Power or Ground. When implementing a design with 5V compliant buffers, one buffer site must be reserved for the VDD5 pin, which is used to distribute power to
the buffers.
Figure 2. Gate Array
Figure 3. Embedded Array
SRAM
Core
Standard
Gate Array
Architecture
Core
I/O Site: Pad and
Sub-Sections
The I/O sites can be configured as input, output, 3-state output and bidirectional buffers, each
with pullup or pulldown capability, if required, by utilizing their corresponding sub-section. Bidirectionnal buffers are the result of an input and output buffers placed in adjacent sub-sections in
the same I/O site. Special buffers may require multiple I/O sites. Oscillators require 2 I/O sites,
each power and ground pin utilizes one I/O site.
PCI Buffers
PCI compatible input and output buffers are available for each bias voltage, 3V and 5V.
LVDS Buffers
Each LVDS buffer uses 2 I/O sites.
LVDS drivers are specific for each bias voltage and require one external current bias resistor per
chip; LVDS receiver is the same for all bias voltages and requires 1 external line matching 100 Ω
resistor per receiver.
Cold Sparing
It is the use of twice the same chip, A1 and A2, A1 ON and A2 OFF, with all signal pins/pads
connected by pairs, A1I1 with A2I1, A101 with A201,...
5
4110L–AERO–11/10
During this mode operation:
–
the chip OFF must survive and operate when turned ON without functional, AC, DC
or reliability impact,
–
the current pulled by the OFF chip must be limited to a low value: Atmel specification
for their dedicated cold sparing buffers is 2 µA worst case by signal pins/pads.
For any other operation mode, refer to maximum ratings.
Memory Blocks
6
Memory blocks can be either synthesized on gates (when smaller than 8 bits) or compiled and
embedded in the array itself. Various combinations of Through Flow or Bus Watch EDACs, 4, 8,
16 and 32 bit wide, can be used to alleviate the effect of SEU induced errors.
MH1RT
4110L–AERO–11/10
MH1RT
ASIC Design
Translation
Atmel has successfully translated existing designs from most major ASIC vendors (LSI Logic®,
Motorola®, SMOS®, Oki®, NEC®, Fujitsu®, AMI® and others) into the gate arrays. These designs
have been optimized for speed and gate count and modified to add logic or memory, or replicated for a pin-to-pin compatible, drop-in replacement.
Design Entry
Design entry is performed by the customer using an Atmel ASIC library. A complete netlist and
vector set must then be provided to Atmel. Upon acceptance of this data set, Atmel continues
with the standard design flow.
FPGA and PLD
Conversions
Atmel has successfully translated existing FPGA/PLD designs from most major vendors (Xilinx®, Actel®, Altera®, AMD® and Atmel) into the gate arrays. There are four primary reasons to
convert from an FPGA/PLD to a gate array. Conversion of high volume devices for a single or
combined design is cost effective. Performance can often be optimized for speed or low power
consumption. Several FPGA/PLDs can be combined onto a single chip to minimize cost while
reducing on-board space requirements. Finally, in situations where an FPGA/PLD was used for
fast cycle time prototyping, a gate array may provide a lower cost answer for long-term volume
production.
Cell Library
Atmel's MH1RT Series gate arrays make use of an extensive library of macro cell structures,
including logic cells, buffers and inverters, multiplexers, decoders, and I/O options. Soft macros
are also available.
The MH1RT Series PLL operates at frequencies of up to 250 MHz with minimal phase error and
jitter, making it ideal for frequency synthesis of high speed on-chip clocks and chip to chip
synchronization.
These cells are well characterized by use of SPICE modeling at the transistor level, with performance verified on manufactured test arrays. Characterization is performed over the rated
temperature and voltage ranges to ensure that the simulation accurately predicts the performance of the finished product.
Cells
Number of Cells
Logic Cells
95
I/O Buffers
3V or 2.5V or 3.3V
5V Tolerant
5V Compliant
110
36
70
Specific Cells
LVDS, PCI
11
SEU Hardened Cells
9
Cold Sparing
63
7
4110L–AERO–11/10
Electrical Characteristics
Absolute Maximum Ratings
Operating Ambient Temperature ................. -55°C to +125°C
*NOTE:
Storage Temperature.................................... -65°C to +150°C
Maximum Input Voltage VDD ........ +0.5V and VCC + 0.5V
Maximum 3.3V Operating Voltage ...................... 4V (VDD)
Stresses beyond those listed under "Absolute Maximum
Ratings” may cause permanent damage to the device. This is
a stress rating only and functional operation of the device at
these or any other conditions beyond those indicated in the
operational sections of this specification is not implied.
Exposure to absolute maximum rating conditions for
extended periods may affect device reliability.
Maximum 5V Operating Voltage .......................... 6V (VCC)
ESD level ........................................................... > 2000V
DC Characteristics
Applicable over recommended operating temperature and voltage range unless otherwise noted.
Table 3. 2.5V DC Characteristics
Symbol
Parameter
Buffer
TA
Operating Temperature
VDD
Supply Voltage
IIL
Low-level Input Current
Pull-up resistors PRU1 (1)
Pull down resistor PRD1
Min.
Typ
Max.
Units
All
-55
25
125
C
All
2.3
2.5
2.7
V
VIN = VSS
1
230
5
µA
CMOS
-1
70
-5
VIN = VDD ( Max.)
-1
-5
70
1
5
540
µA
IIH
High level Input Current
Pull-up resistors PRU1
Pull down resistor PRD1 (2) CMOS
Vin = Vdd or Vss, Vdd = Vdd
(Max.)
No pull resistor
1
µA
IOZ
High impedance state
output current
All
Test Condition
-1
–
CMOS
0.3Vdd
PCI
VIL
Low level Input voltage
0.325Vdd
Schmitt level
0.78
CMOS
0.7 Vdd
PCI
0.475Vdd
VIH
High level Input voltage
Delta V
CMOS Hysterisis
IICS
Cold sparing leakage input
current
PICZ
Vin = 0 to VDDmax
IOCS
Cold sparing leakage
output current
POxxZ
Vout = 0 to VDDmax
VCSTH (3)
Supply threshold of cold
sparing buffers
POxxZ
Iocs = 100 µA
8
MH1RT
Schmitt level
1.25
V
1.06
0.25
V
1.61
0.34
V
-2
2
-2
2
0.5
µA
µA
V
4110L–AERO–11/10
MH1RT
Table 3. 2.5V DC Characteristics (Continued)
Symbol
Parameter
VOL
Low-level Output Voltage (4) PO11
IOL = 0.8 mA, Vdd = Vdd (Min.)
VOH
High level output voltage (5) PO11
Ioh = -0.6 mA, Vdd = Vdd (Min.)
IOS (6)
Output short circuit current
Iosn
Iosp
Vdd = Vdd (Max.),
Vout = Vdd
Vouy = Vss
ICCSB
Leakage current per cell
Vdd = Vdd (Max.)
ICCOP
Dynamic current per gate
Vdd = Vdd (Max.)
1.
2.
3.
4.
Buffer
PO11
PO11
Test Condition
Min.
Typ
Max.
Units
0.4
V
2
V
0.27
15
8
mA
4
nA
0.32
µW/MHz
For standard pull-ups: PRU (#), # = {1-31} index for Ron: Ron = # x RO where RO = 19 kΩ typ, 30 kΩ Max., 12 kΩ Min.
For standard pull-downs: PRD (#), # = {1-31} index for Ron: Ron = # x RO where RO = 11 kΩ typ, 30 kΩ Max., 5 kΩ Min.
Guaranteed not tested
For output buffers PO (1-C) (1-C):
1-C: hex value: convert hex to decimal x IO = p and n-channel output drive
IO = 1.6 mA for standard buffers (including cold sparing) measured at Vol = 0.4V
5.
For output buffers PO (1-C) (1-C):
1-C: hex value: convert hex to decimal x IO = p and n-channel output drive
IO = -1.6 mA for standard buffers (including cold sparing) measured at Voh = 2.0V
6.
Supplied as a design limit but not guaranteed or tested. No more than one output may be shorted at a time for a maximum duration of 10
seconds.
Table 4. 3V DC Characteristics
Symbol
Parameter
Buffer
TA
Operating Temperature
VDD
Supply Voltage
IIL
Low-level Input Current
Pull-up resistors PRU1 (1)
Pull down resistor PRD1
IIH
High level Input Current
Pull-up resistors PRU1
Pull down resistor PRD1
IOZ
High impedance state
output current
(2)
Min.
Typ
Max.
Units
All
-55
25
125
C
All
2.7
3.0
3.3
V
CMOS
Test Condition
VIN = VSS
CMOS
VIN = VDD( Max.)
All
VIN = VDD OR VSS, VDD =
VDD (Max.)
No pull resistor
-1
108
-5
1
330
5
-1
-5
108
1
5
825
µA
-1
1
µA
CMOS
0.8
PCI
VIL
Low level Input voltage
Schmitt level
CMOS
PCI
VIH
High level Input voltage
Delta V
CMOS Hysterisis
Schmitt level
µA
0.325VDD
0.90
V
1.42
2
V
0.475VDD
1.25
0.31
1.93
0.42
V
9
4110L–AERO–11/10
Table 4. 3V DC Characteristics (Continued)
Symbol
Parameter
Buffer
Test Condition
IICS
Cold sparing leakage input
current
PICZ
VIN = 0 to VDDmax
IOCS
Cold sparing leakage
output current
POxxZ
Vout = 0 to VDDmax
VCSTH (3)
Supply threshold of cold
sparing buffers
POxxZ
Iocs = 100 µA
PO11
IOL = 1 mA, Vdd = Vdd(Min.)
PO11
Ioh = -0.8 mA, Vdd = Vdd(Min.)
Low-level Output Voltage
Min.
Typ
Max.
Units
-2
–
-2
µA
-2
–
-2
–
0.5
–
V
–
–
0.4
V
2.4
–
–
V
µA
VOL
(4)
VOH
High level output voltage
PO11
PO11
Vdd = Vdd(Max.),
Vout = Vdd
Vouy = Vss
–
–
21
12
mA
IOS (6)
Output short circuit current
Iosn
Iosp
ICCSB
Leakage current per cell
–
Vdd = Vdd(Max.)
–
0.6
5
nA
ICCOP
Dynamic current per gate
–
Vdd = Vdd(Max.)
–
–
0.54
µW/MHz
1.
2.
3.
4.
5.
6.
(5)
For standard pull-ups: PRU (#), # = {1-31} index for Ron: Ron = # x RO where RO = 15 kΩ typ, 25 kΩ Max., 10 kΩ Min.
For standard pull-downs: PRD (#), # = {1-31} index for Ron: Ron = # x RO where RO = 9 kΩ typ, 25 kΩ Max., 4 kΩ Min.
Guaranteed not tested.
For output buffers PO (1-C) (1-C):
1-C: hex value: convert hex to decimal x IO = p and n-channel output drive
IO = -1.8 mA for standard buffers (including cold sparing) measured at Vol = 0.4V
For output buffers PO (1-C) (1-C):1-C:
hex value: convert hex to decimal x IO = p and n-channel output drive
IO = -1.8 mA for standard buffers (including cold sparing) measured at Voh = 2.4V
Supplied as a design limit but not guaranteed or tested. No more than one output may be shorted at a time for a maximum duration of 10
seconds.
Table 5. 3.3V DC Characteristics
Symbol
Parameter
Buffer
TA
Operating Temperature
VDD
Supply Voltage
IIL
Low-level Input Current
Pull-up resistors PRU1 (1)
Pull down resistor PRD1
IIH
High level Input Current
Pull-up resistors PRU1
Pull down resistor PRD1
Ioz
High impedance state
output current
(2)
Min.
Typ
Max.
Units
All
-55
25
125
C
All
3
3.3
3.6
V
1
400
5
µA
VIN = VSS
-1
120
-5
VIN = VDD( Max.)
1
5
900
µA
CMOS
-1
-5
150
-1
1
µA
All
Vin = Vdd or Vss, Vdd =
Vdd(Max.)
No pull resistor
CMOS
Test Condition
CMOS
0.8
PCI
VIL
Low level Input voltage
10
MH1RT
Schmitt level
0.325Vdd
0.99
V
1.51
4110L–AERO–11/10
MH1RT
Table 5. 3.3V DC Characteristics (Continued)
Symbol
Parameter
Buffer
Test Condition
CMOS
Min.
Typ
Max.
2
PCI
0.475Vdd
Schmitt level
V
VIH
High level Input voltage
Delta V
CMOS Hysterisis
1.40
IICS
Cold sparing leakage input
current
PICZ
Vdd = Vss = 0V
Vin = 0 to VDD Max
-2
-2
IOCS
Cold sparing leakage
output current
POxxZ
Vdd = Vss = 0V
Vin = 0 to VDD Max
-2
-2
VCSTH (3)
Supply threshold of cold
sparing buffers
POxxZ
Iocs = 100 µA
PO11
IOL = 2 mA, Vdd = Vdd(Min.)
PO11
Ioh = -1.8 mA, Vdd = Vdd(Min.)
PO11
PO11
Vdd = Vdd(Max.),
Vout = Vdd
Vouy = Vss
0.37
2.08
0.48
(4)
VOH
High level output voltage
IOS (6)
Output short circuit current
Iosn
Iosp
ICCSB
Leakage current per cell
Vdd = Vdd(Max.)
ICCOP
Dynamic current per gate
Vdd = Vdd(Max.)
1.
2.
3.
4.
5.
6.
V
0.5
Low-level Output Voltage
VOL
(5)
Units
µA
µA
V
0.4
2.4
V
V
0.7
23
13
mA
5
nA
0.69
µW/MHz
For standard pull-ups: PRU(#), # = {1-31} index for Ron: Ron = # x RO where RO = 14 kΩ typ, 25 kΩ Max., 9 kΩ Min.
For standard pull-downs:PRD(#), # = {1-31} index for Ron: Ron = # x RO where RO = 8kΩ typ, 20 kΩ Max., 4 kΩ Min.
Guaranteed not tested.
For output buffers PO (1-C) (1-C):
1-C: hex value: convert hex to kΩ x IO = p and n-channel output drive
IO = -2.0 mA for standard buffers (including cold sparing) measured at Vol = 0.4V
For output buffers PO (1-C) (1-C):
1-C: hex value: convert hex to kΩ x IO = p and n-channel output drive
IO = -2.0 mA for standard buffers (including cold sparing) measured at Voh = 2.4V
Supplied as a design limit but not guaranteed or tested. No more than one output may be shorted at a time for a maximum duration of 10
seconds.
Table 6. 5V DC Characteristics
Symbol
Parameter
Buffer
TA
Operating Temperature
Vdd
Test Condition
Min.
Typ
Max.
Units
All
-55
25
125
C
Supply Voltage
5V Tolerant
3.0
3.3
3.6
V
Vcc
Supply Voltage
5V Compliant
4.5
5
5.5
V
CMOS
-1
180
-5
1
690
5
µA
IIL
Low-level Input Current
Pull-up resistors PRU1 (1)
Pull down resistor PRD1
VIN = VSS
11
4110L–AERO–11/10
Table 6. 5V DC Characteristics (Continued)
Symbol
Parameter
Buffer
Test Condition
Min.
IIH
High level Input Current
Pull-up resistors PRU1
Pull down resistor PRD1 (2) CMOS
VIN = VDD( Max.)
Ioz
High impedance state
output current
Vin = Vdd orVss,Vdd=Vdd(max
No pull resistor
All
Typ
Max.
Units
-1
-5
30
1
5
400
µA
-1
1
µA
PICV, PICV5
0.8
PCI
Vil
Low level Input voltage
0.325Vdd
Schmitt level
0.99
PICV, PICV5
2
PCI
High level Input voltage
Delta V
CMOS Hysterisis
IICS
Cold sparing leakage input
current
PICZ
Vin = 0 to VDDmax
IOCS
Cold sparing leakage
output current
POxxZ
Vout = 0 to VDDmax
VCSTH (3)
Supply threshold of cold
sparing buffers
POxxZ
Iocs = 100 µA
VOL (4)
Low Voltage/2.5V range
Low Voltage/3.0V range
Low Voltage/3.3V range
Low Voltage/2.5V range
Low Voltage/3.0V range
Low Voltage/3.3V range
PO11V
PO11V
PO11V
PO11V5
PO11V5
PO11V5
Iol = 0.5 mA
Iol = 0.6 mA
Iol = 1.2 mA
Iol = 1.1 mA
Iol = 1.3 mA
Iol = 1.5 mA
VOH (5)
Low Voltage/2.5V range
Low Voltage/3.0V range
Low Voltage/3.3V range
Low Voltage/2.5V range
Low Voltage/3.0V range
Low Voltage/3.3V range
PO11V
PO11V
PO11V
PO11V5
PO11V5
PO11V5
Ioh = 0.5 mA
Ioh = 0.6 mA
Ioh = 1.2 mA
Ioh = 1.1 mA
Ioh = 1.3 mA
Ioh = 1.5 mA
IOS (6)
Output short circuit current
Iosn
Iosp
PO11V
PO11V
Vdd = Vdd(Max.),
Vout = Vdd
Vouy = Vss
1.
2.
3.
12
1.51
0.475Vdd
VIH
Schmitt level
V
1.40
0.37
V
2.08
0.48
V
-2
-2
-2
-2
0.6
µA
µA
V
0.4
2
2.4
2.4
2.4
2.4
2.4
V
V
28
17
mA
For 5V tolerant/compliant pull-ups: PRU(#), # = {1-31} index for Ron: Ron = # x RO where RO = 14 kΩ typ, 25 kΩ Max., 8 kΩ
Min.
For 5V tolerant/compliant pull-downs: PRD(#), # = {1-31} index for Ron: Ron = # x RO where:
RO = 19 kΩ typ, 45 kΩ Max., 9 kΩ Min. in 3.3V range,
RO = 23 kΩ typ, 55 kΩ Max., 11 kΩ Min. in 3V range,
RO = 36 kΩ typ, 80 kΩ Max., 17 kΩ Min. in 2.5V range,
Guaranteed not tested.
MH1RT
4110L–AERO–11/10
MH1RT
4.
5.
6.
Tolerant Buffers (including cold spearing):
IO = -1.0, 1.3, 1.4 mA measured at VOL = 0.4, 0.4, 0.4V in 2.5, 3.0, 3.3V range respectively.
Compliant Buffers (VCC = 4.5V)
IO = -1.1, 1.4, 1.6 mA measured at VOL = 0.4, 0.4, 0.4 V in 2.5, 3.0, 3.3V range respectively.
Tolerant Buffers (including cold spearing):
IO = -1.0, -1.3, -1.4 mA measured at VOH = 2.0, 2.4, 2.4V in 2.5, 3.0, 3.3V range respectively.
Compliant Buffers (VCC = 4.5V)
IO = -1.1, -1.4, -1.6 mA measured at VOH = 2.0, 2.4, 2.4 V in 2.5, 3.0, 3.3V range respectively.
Supplied as a design limit but not guaranteed or tested. No more than one output may be shorted at a time for a maximum duration of 10
seconds.
LVDS Driver DC
and AC
Characteristics
Applicable over recommended operating temperature and voltage range unless otherwise noted.
Table 7. 2.5V LVDS Driver DC/AC Characteristics
Symbol
Parameter
Test Condition
Min.
Max.
Units
Comments
TA
Operating Temperature
–
-55
125
°C
–
VDD
Supply Voltage
Core
2.3
2.7
V
–
|VOD|
Output differential voltage
Rload = 100Ω
247
454
mV
see Figure 4
VOS
Output offset voltage
Rload = 100Ω
622
1375
mV
see Figure 4
|Delta VOD|
(1)
Change in |VOD|
Rload = 100Ω
0
50
mV
see Figure 4
|Delta VOS|
(1)
Change in VOS: Steady-state Rload = 100Ω
0
50
mV
–
Change in VOS: Dynamic
state
0
100
mV
–
ISA, ISB
Output current
Drivers shorted to ground or VDD
1.0
6.3
mA
–
ISAB
Output current
Drivers shorted together
2.4
4.8
mA
–
Rbias
Bias resistor
–
9.8
10.2
KΩ
1 per chip
Ibias
Bias static current
–
5.8
11.7
mA
F Max
Maximum operating
frequency
VDD = 2.5V ± 0.2V
–
180
MHz
Consumption
14.8 mA
Clock
Clock signal duty cycle
Max. frequency
45
55
%
–
Tfall
Fall time 80-20%
Rload = 100Ω
669
1178
ps
see Figure 4
Trise
Rise time 20-80%
Rload = 100Ω
670
1167
ps
see Figure 4
Tp
Propagation delay
Rload = 100Ω
1270
2660
ps
see Figure 4
Tsk1
Duty cycle skew
Rload = 100Ω
0
110
ps
–
Tsk2
Channel to channel skew
(same edge)
Rload = 100Ω
0
50
ps
–
(1)
Parameter guaranteed by design, not tested
13
4110L–AERO–11/10
Table 8. 3V LVDS Driver DC/ AC Characteristics
Symbol
Parameter
Test Condition
Min.
Max.
Units
Comments
TA
Operating Temperature
–
-55
125
⋅C
–
VDD
Supply Voltage
Core
2.7
3.3
V
–
|VOD|
Output differential voltage
Rload = 100Ω
247
454
mV
see Figure 4
VOS
Output offset voltage
Rload = 100Ω
622
1375
mV
see Figure 4
|Delta VOD|
(1)
Change in |VOD|
Rload = 100Ω
0
50
mV
–
Change in VOS: Steady-state Rload = 100Ω
0
50
mV
–
Change in VOS: Dynamic
state
0
150
mV
–
|Delta VOS|
(1)
ISA, ISB
Output current
Drivers shorted to ground or VDD
1.0
6.3
mA
–
ISAB
Output current
Drivers shorted together
2.6
5
mA
–
Rbias
Bias resistor
–
12.8
13.2
KΩ
1 per chip
Ibias
Bias static current
–
6.5
13.8
mA
–
F Max.
Maximum operating
frequency
VDD = 3V ± 0.3V
–
200
MHz
Consumption
18.6 mA
Clock
Clock signal duty cycle
Max. frequency
45
55
%
–
Tfall
Fall time 80-20%
Rload = 100Ω
512
968
ps
see Figure 4
Trise
Rise time 20-80%
Rload = 100Ω
512
970
ps
see Figure 4
Tp
Propagation delay
Rload = 100Ω
1150
2300
ps
see Figure 4
Tsk1
Duty cycle skew
Rload = 100Ω
0
70
ps
–
Tsk2
Channel to channel skew
(same edge)
Rload = 100Ω
0
50
ps
–
(1)
Parameter guaranteed by design, not tested
Table 9. 3.3V LVDS Driver DC/ AC Characteristics
Symbol
Parameter
Test Condition
Min.
Max.
Units
Comments
TA
Operating Temperature
–
-55
125
°C
–
VDD
Supply Voltage
–
3
3.6
V
–
|VOD|
Output differential voltage
Rload = 100Ω
247
454
mV
see Figure 4
VOS
Output offset voltage
Rload = 100Ω
622
1375
mV
see Figure 4
|Delta VOD|
(1)
Change in |VOD|
Rload = 100Ω
0
50
mV
–
14
MH1RT
4110L–AERO–11/10
MH1RT
Table 9. 3.3V LVDS Driver DC/ AC Characteristics
Symbol
Min.
Max.
Units
Comments
Change in VOS: Steady-state Rload = 100Ω
0
50
mV
–
Change in VOS: Dynamic
state
0
200
mV
–
|Delta VOD|
Change in |VOD| between "0"
and "1"
Rload = 100Ω
0
50
mV
–
|Delta VOS|
Change in |VOS| between "0"
and "1"
Rload = 100Ω
0
200
mV
–
ISA, ISB
Output current
Drivers shorted to ground or VDD
1.0
6.2
mA
–
ISAB
Output current
Drivers shorted together
2.6
4.8
mA
–
Rbias
Bias resistor
–
16.3
16.7
kΩ
1 per chip
Ibias
Bias static current
–
7
14.6
mA
–
F Max.
Maximum operating
frequency
VDD = 3.3V ± 0.3V
–
220
MHz
Consumption
20.9 mA
Clock
Clock signal duty cycle
Max. frequency
45
55
%
–
Tfall
Fall time 80-20%
Rload = 100Ω
445
838
ps
see Figure 4
Trise
Rise time 20-80%
Rload = 100Ω
445
841
ps
see Figure 4
Tp
Propagation delay
Rload = 100Ω
1120
2120
ps
see Figure 4
Tsk1
Duty cycle skew
Rload = 100Ω
0
80
ps
–
Tsk2
Channel to channel skew
(same edge)
Rload = 100Ω
0
50
ps
–
|Delta VOS|
(1)
Parameter
Test Condition
Figure 4. Test Termination Measurements
A
VOD
100 Ω
B
( VA + VB )
VOS = -------------------------2
Figure 5. Rise and Fall Measurements
A
5 pF
100 Ω
B
15
4110L–AERO–11/10
Table 10. LVDS Receiver DC/ AC Characteristics
Symbol
Parameter
Test Condition
Min.
Max.
Units
Comments
TA
Operating Temperature
–
-55
125
⋅C
–
VDD
Supply Voltage
–
2.3
3.6
V
–
Vi
Input voltage range
–
0
2400
mV
–
Vidth
Input differential voltage
–
-100
+100
mV
–
3.5
2.7
2.4
–
Propagation delay
0.9
0.7
0.7
ns
Tp
Cout = 50 pF, VDD = 2.5V ± 0.2V
Cout = 50 pF, VDD = 3.0V ± 0.3V
Cout = 50 pF, VDD = 3.3V ± 0.3V
Tskew
Duty cycle distortion
Cout = 50 pF
-
500
ps
–
Table 11. I/O Buffers DC Characteristics
Symbol
Parameter
Test Condition
Typical
Units
CIN
Capacitance, Input Buffer (die)
3V
2.4
pF
COUT
Capacitance, Output Buffer (die)
3V
5.6
pF
CI/O
Capacitance, Bi-Directional
3V
6.6
pF
16
MH1RT
4110L–AERO–11/10
MH1RT
Testability
Techniques
For complex designs, involving blocks of memory and/or cores, careful attention must be given
to design-for-test techniques. The sheer size of complex designs and the number of functional
vectors that would need to be created to exercise them fully, strongly suggests the use of more
efficient techniques. Combinations of SCAN paths, multiplexed access to memory and/or core
blocks, and built-in-self-test logic must be employed, in addition to functional test patterns, to
provide both the user and Atmel the ability to test the finished product.
An example of a highly complex design could include a PLL for clock management or synthesis,
a microcontroller or DSP engine or both, SRAM to support the microcontroller or DSP engine,
and glue logic to support the interconnectivity of each of these blocks. The design of each of
these blocks must take into consideration the fact that the manufactured device will be tested on
a high performance digital tester. Combinations of parametric, functional, and structural tests,
defined for digital testers, should be employed to create a suite of manufacturing tests.
The type of block dictates the type of testability technique to be employed. The PLL will, by construction, provide access to key nodes so that functional and/or parametric testing can be
performed. Since a digital tester must control all the clocks during the testing of a Gate
Array/Embedded Array, provision must be made for the VCO to be bypassed. Atmel’s PLLs
include a multiplexing capability for just this purpose. The addition of a few pins will allow other
portions of the PLL to be isolated for test, without impinging upon the normal functionality.
In a similar vein, access to microcontroller, DSP, and SRAM blocks must be provided so that
controllability and observability of the inputs and outputs to the blocks are achieved with the minimum amount of preconditioning. SRAM blocks need to provide access to both address and data
ports so that comprehensive memory tests can be performed. Multiplexing I/O pins provides a
method for providing this accessibility.
The glue logic can be designed using full SCAN techniques to enhance its testability.
It should be noted that, in almost all of these cases, the purpose of the testability technique is to
provide Atmel a means to assess the structural integrity of a Gate Array/Embedded Array, i.e.,
sort devices with manufacturing-induced defects. All of the techniques described above should
be considered supplemental to a set of patterns which exercise the functionality of the design in
its anticipated operating modes.
17
4110L–AERO–11/10
Advanced
Packaging
The MH1RT Series are offered in ceramic packages: multi-layer quad flat packs (MQFP), multi layer column grid array (MCGA) and multi-layer land grid array (MLGA). Packages lid may be
connected to ground or not.
Table 12. Packaging Options
Notes:
Package Type (1,2)
Pin Count
MQFP
132,196, 256 and 352
MCGA and MLGA
349, 472 (1.27 mm pitch)
1. Contact Atmel local design centers to check the availability of the matrix/package combination.
2. Four decks packages.
Document
Revision
History
4110K - 11/07
1. Added missing ESD information. See pages 1 & 8.
4110L - 11/10
1. Add LGA package option
2. Correction of LVDS transmitter tables (VOL/VOH)
18
MH1RT
4110L–AERO–11/10
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4110L–AERO–11/10