AD ADIS16250ACCZ Programmable low power gyroscope Datasheet

Programmable Low Power Gyroscope
ADIS16250
FUNCTIONAL BLOCK DIAGRAM
FEATURES
AUX
ADC
AUX
DAC VREF
ADIS16250
TEMPERATURE
SENSOR
GYROSCOPE
SENSOR
RATE
FILT
SIGNAL
CONDITIONING
AND
CONVERSION
DIGITAL
CONTROL
SELF-TEST
VCC
CALIBRATION
AND
DIGITAL
PROCESSING
POWER
MANAGEMENT
ALARM
CS
SPI
PORT
SCLK
DIN
DOUT
AUXILIARY
I/O
COM
RST
DIO0 DIO1
06070-001
Yaw rate gyro with digital range scaling
±80°/sec, ±160°/sec, and ±320°/sec settings
14-bit digital gyroscope sensor outputs
12-bit digital temperature sensor output
Calibrated sensitivity and bias
Single-command bias calibration
Digitally controlled sample rate
Digitally controlled frequency response
Dual alarm settings with rate/threshold limits
Embedded integration for short-term angle estimates
Digitally activated self-test
Digitally activated low power mode
Interrupt-driven wake-up
SPI®-compatible serial interface
50 Hz sensor bandwidth
Auxiliary 12-bit ADC input and 12-bit DAC output
Auxiliary digital input/output
Single-supply operation: 4.75 V to 5.25 V
2000 g powered shock survivability
Figure 1.
APPLICATIONS
Instrumentation control
Platform control and stabilization
Motion control and analysis
Avionics instrumentation
Navigation
Image stabilization
Robotics
GENERAL DESCRIPTION
The ADIS16250 is a complete, angular rate measurement
system available in a single compact package enabled by Analog
Devices, Inc., iSensor™ integration. By enhancing Analog
Devices iMEMS® sensor technology with an embedded signal
processing solution, the ADIS16250 provides factory calibrated
and tunable digital sensor data in a convenient format that can
be accessed using a simple SPI serial interface. The SPI interface
provides access to measurements for the gyroscope, temperature,
power supply, and one auxiliary analog input. Easy access to
calibrated digital sensor data provides developers with a systemready device, reducing development time, cost, and program risk.
through several built-in features, including a single-command
auto-zero recalibration function, as well as configurable sample
rate and frequency response. Additional features can be used to
further reduce system complexity, including:
The device range can be digitally selected from three different
settings: ±80°/sec, ±160°/sec, and ±320°/sec. Unique
characteristics of the end system are accommodated easily
The ADIS16250 is available in an 11 mm × 11 mm × 5.5 mm,
laminate-based land grid array (LGA) package with a
temperature range of −40°C to +85°C.
•
•
•
•
Configurable alarm function
Auxiliary 12-bit ADC and DAC
Two configurable digital I/O ports
Digital self-test function
System power dissipation can be optimized via the ADIS16250
power management features, including an interrupt-driven wake-up.
Rev. 0
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 781.329.4700
www.analog.com
Fax: 781.461.3113
©2006 Analog Devices, Inc. All rights reserved.
ADIS16250
TABLE OF CONTENTS
Features .............................................................................................. 1
Temperature Sensor ................................................................... 10
Applications....................................................................................... 1
Auxiliary ADC Function........................................................... 10
Functional Block Diagram .............................................................. 1
Basic Operation .............................................................................. 11
General Description ......................................................................... 1
Serial Peripheral Interface (SPI)............................................... 11
Specifications..................................................................................... 3
Data Output Register Access .................................................... 12
Timing Specifications .................................................................. 5
Programming and Control............................................................ 14
Absolute Maximum Ratings............................................................ 6
Control Register Overview ....................................................... 14
ESD Caution.................................................................................. 6
Control Register Access............................................................. 14
Pin Configuration and Function Descriptions............................. 7
Calibration................................................................................... 15
Recommended Layout ................................................................. 7
Global Commands ..................................................................... 15
Typical Performance Characteristics ............................................. 8
Operational Control................................................................... 16
Theory of Operation ...................................................................... 10
Status and Diagnostics............................................................... 18
Overview...................................................................................... 10
Outline Dimensions ....................................................................... 20
Relative Angle Estimate ............................................................. 10
Ordering Guide .......................................................................... 20
REVISION HISTORY
10/06—Revision 0: Initial Version
Rev. 0 | Page 2 of 20
ADIS16250
SPECIFICATIONS
TA = −40°C to +85°C, VCC = 5.0 V, angular rate = 0°/sec, ±1 g, ±320°/sec range setting, unless otherwise noted.
Table 1.
Parameter
SENSITIVITY
Initial
Nonlinearity
BIAS
In Run Bias Stability
Turn-On—Turn-On Bias Stability
Angular Random Walk
Linear Acceleration Effect
Voltage Sensitivity
NOISE PERFORMANCE
Output Noise
Rate Noise Density
FREQUENCY RESPONSE
3 dB Bandwidth
Sensor Resonant Frequency
Turn-on Time
SELF-TEST STATE
Change for Positive Stimulus
Change for Negative Stimulus
TEMPERATURE SENSOR
Output at 25°C
Scale Factor
ADC INPUT
Resolution
Integral Nonlinearity
Differential Nonlinearity
Offset Error
Gain Error
Input Range
Input Capacitance
ON-CHIP VOLTAGE REFERENCE
Accuracy
Temperature Coefficient
Output Impedance
Conditions
Clockwise rotation is positive output
25°C, dynamic range = ±320°/sec 1
25°C, dynamic range = ±160°/sec
25°C, dynamic range = ±80°/sec
Best fit straight line
Min
Typ
Max
Unit
0.07253
0.07326
0.03663
0.01832
0.1
0.07400
degrees/sec/LSB
degrees/sec/LSB
degrees/sec/LSB
% of FS
25°C, 1 σ
25°C, 1 σ
25°C, 1 σ
Any axis
VCC = 4.75 V to 5.25 V
0.016
0.05
3.6
0.2
1.0
degrees/sec
degrees/sec
degrees/Hz
degrees/sec/g
degrees/sec/V
At 25°C, ±320°/sec dynamic range, no filtering
At 25°C, ±160°/sec dynamic range, minimum
four tap filter setting
At 25°C, ±80°/sec dynamic range, minimum 16
tap filter setting
At 25°C, f = 25 Hz, no average
0.48
0.28
degrees/sec rms
degrees/sec rms
0.14
degrees/sec rms
0.056
degrees/sec/√Hz
rms
See Analog Bandwidth section for adjustment
50
14
60
160
Hz
kHz
ms
SLEEP mode recovery to 2°/sec of final value
Initial power-up to first data-ready pulse
320°/sec dynamic range setting
320°/sec dynamic range setting
439
−439
721
−721
LSB
LSB/°C
12
±2
±1
±4
±2
Bits
LSB
LSB
LSB
LSB
V
pF
V
mV
ppm/oC
Ω
2.5
20
2.5
At +25°C
−10
+10
±40
70
Rev. 0 | Page 3 of 20
LSB
LSB
0
6.88
0
During acquisition
1092
−1092
ADIS16250
Parameter
DAC OUTPUT
Resolution
Relative Accuracy
Differential Nonlinearity
Offset Error
Gain Error
Output Range
Output Impedance
Output Settling Time
LOGIC INPUTS
Input High Voltage, VINH
Input Low Voltage, VINL
Logic 1 Input Current, IINH
Logic 0 Input Current, IINL
All except RST
RST 2
Input Capacitance, CIN
DIGITAL OUTPUTS
Output High Voltage, VOH
Output Low Voltage, VOL
SLEEP TIMER
Timeout Period 3
FLASH MEMORY
Endurance 4
Data Retention 5
CONVERSION RATE
Minimum Conversion Time
Maximum Conversion Time
Maximum Throughput Rate
Minimum Throughput Rate
POWER SUPPLY
Operating Voltage Range VCC
Power Supply Current
Conditions
5 kΩ/100 pF to GND
Min
Typ
Max
12
4
1
±5
±0.5
0 to 2.5
2
10
For Code 101 to Code 4095
Bits
LSB
LSB
mV
%
V
Ω
μs
2.0
For CS signal when used to wake up from
SLEEP mode
VIH = 3.3 V
VIL = 0 V
ISOURCE = 1.6 mA
ISINK = 1.6 mA
0.8
0.55
V
V
V
±0.2
±10
μA
−40
−1
10
−60
μA
mA
pF
2.4
0.5
0.4
V
V
128
Sec
20,000
20
TJ = 55°C
Cycles
Years
3.906
7.75
256
0.129
4.75
Normal mode at 25°C
Fast mode at 25°C
Sleep mode at 25°C
1
Unit
5.0
18
44
425
ms
Sec
SPS
SPS
5.25
V
mA
mA
μA
The sensor is capable of ±600°/sec but the specifications herein are for ±320°/sec only.
The RST pin has an internal pull-up.
3
Guaranteed by design.
4
Endurance is qualified as per JEDEC Standard 22 Method A117 and measured at −40°C, +25°C, +85°C, and +125°C.
5
Retention lifetime equivalent at junction temperature (TJ) 55°C as per JEDEC Standard 22 Method A117. Retention lifetime decreases with junction temperature.
2
Rev. 0 | Page 4 of 20
ADIS16250
TIMING SPECIFICATIONS
TA = −40°C to +85°C, VCC = 5.0 V, unless otherwise noted.
Table 2.
Parameter
fSCLK
tDATARATE
tDATARATE
tCSHIGH
tCS
tDAV
tDSU
tDHD
tDF
tDR
tSFS
Unit
MHz
MHz
μs
μs
ns
ns
ns
ns
ns min
ns min
ns typ
100
24.4
48.8
5
5
12.5
12.5
5
Guaranteed by design; typical specifications are not tested or guaranteed.
Based on sample rate selection.
tDATA RATE
CS
SCLK
Figure 2. SPI Chip Select Timing
CS
tCS
SCLK
tSFS
1
2
3
4
5
6
15
16
tDAV
DOUT
MSB
DB14
DB13
tDSU
DIN
W/R
DB12
DB11
A4
A3
DB10
DB2
DB1
LSB
tDHD
A5
A2
D2
Figure 3. SPI Timing
(Utilizing SPI Settings Typically Identified as Phase = 1, Polarity = 1)
Rev. 0 | Page 5 of 20
D1
LSB
06070-003
2
Max1
2.5
1.0
Typ
06070-002
1
Min 1
0.01
0.01
40
100
1/fSCLK
48.8
Description
Fast mode 2
Normal mode2
Chip select period, fast mode2
Chip select period, normal mode2
Chip select high
Chip select to clock edge
Data output valid after SCLK edge
Data input setup time before SCLK rising edge
Data input hold time after SCLK rising edge
Data output fall time
Data output rise time
CS high after SCLK edge
ADIS16250
ABSOLUTE MAXIMUM RATINGS
1
Rating
2000 g
2000 g
−0.3 V to +6.0 V
−0.3 V to +5.5 V
−0.3 V to +3.5 V
−40°C to +125°C
−65°C to +150°C
Extended exposure to temperatures outside of the specified temperature
range of −40°C to +85°C can adversely affect the accuracy of the factory
calibration. For best accuracy, store the parts within the specified operating
range of −40°C to +85°C.
+8191 LSB
LONGITUDINAL
AXIS
CLOCK-WISE
ROTATION
10
5 6
1
–8192 LSB
LATERAL
AXIS
RATE IN
06070-011
Parameter
Acceleration (Any Axis, Unpowered, 0.5 ms)
Acceleration (Any Axis, Powered, 0.5 ms)
VCC to COM
Digital Input/Output Voltage to COM
Analog Inputs to COM
Operating Temperature Range1
Storage Temperature Range1
RATEOUT
RATE
AXIS
Table 3.
Figure 4. RATE OUT Level Increase with Clockwise Rotation Increase
ESD CAUTION
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to
absolute maximum rating conditions for extended periods may
affect device reliability.
Rev. 0 | Page 6 of 20
ADIS16250
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS
VREF COM COM VCC VCC
1
DOUT
2
DIN
3
CS
4
DIO0
5
19
18
17
16
15
FILT
14
RATE
13
AUX
ADC
12
AUX
DAC
DNC = DO NOT CONNECT 11
9
10
7
8
DNC
ADIS16250
TOP VIEW
(Not To Scale)
POSITIVE OUTPUT
ROTATIONAL
DIRECTION
6
DIO1 RST DNC DNC DNC
06070-004
20
SCLK
Figure 5. Pin Configuration
Table 4. Pin Function Descriptions
Pin No.
1
2
3
4
5, 6
7
8, 9, 10, 11
12
13
14
15
Mnemonic
SCLK
DOUT
DIN
CS
DIO0, DIO1
RST
DNC
AUX DAC
AUX ADC
RATE
FILT
Type 1
I
O
I
I
I/O
I
–
O
I
O
I
16, 17
18, 19
20
VCC
COM
VREF
S
S
O
1
Descriptions
SPI, Serial Clock.
SPI, Data Output.
SPI, Data Input.
SPI, Chip Select, Active Low.
Multifunction Digital Input/Output Pin.
Reset, Active Low. This resets the sensor signal conditioning circuit and initiates a start-up sequence.
Do Not Connect.
Auxiliary DAC Analog Output Voltage.
Auxiliary ADC Analog Input Voltage.
Analog Rate Signal Output (uncalibrated).
Analog Amplifier Summing Junction. This is used for setting the analog bandwidth. See Analog
Bandwidth section for more details.
5.0 V Power Supply.
Common. Reference point for all circuitry in the ADIS16250.
Precision Reference Output.
S = supply; O = output; I = input.
RECOMMENDED LAYOUT
9.673 BSC 20×
0.973 BSC 4×
Figure 6. Recommended Pad Layout
Rev. 0 | Page 7 of 20
07060-010
0.973 BSC 4×
1.127 BSC 20×
0.773 BSC 16×
0.500 BSC 2×
ADIS16250
TYPICAL PERFORMANCE CHARACTERISTICS
4
0.5
3
2
σ+1
BIAS (°/s)
BIAS (°/s)
1
0
µ
0
–1
σ–1
–2
–35
–20
–5
10
25
40
55
70
85
100
TEMPERATURE (°C)
–0.5
06070-012
–4
–50
0
500
1000
Figure 7. Bias vs. Temperature
2000
2500
3000
Figure 10. Bias vs. Time
2.0
3
1.5
2
1.0
SENSITIVITY (%)
4
1
BIAS (°/s)
1500
TIME (Minutes)
06070-015
–3
0
–1
0.5
0
σ+1
–0.5
µ
–2
–1.0
–3
–1.5
MINIMUM
TYPICAL
–2.0
–50
06070-013
–4
MAXIMUM
SUPPLY VOLTAGE (4.75V, 5.00V, 5.25V)
–35
–20
–5
10
25
40
55
70
85
TEMPERATURE (°C)
Figure 8. Bias vs. Supply Voltage
100
06070-016
σ–1
Figure 11. Sensitivity vs. Temperature
1
2.0
SENSITIVITY (%)
1.0
0.1
0.5
0
–0.5
–1.0
0.01
0.1
1
10
100
TAU (Seconds)
1000
Figure 9. Root Allan Variance vs. TAU
–2.0
MINIMUM
TYPICAL
MAXIMUM
SUPPLY VOLTAGE (4.75V, 5.00V, 5.25V)
Figure 12. Sensitivity vs. Supply Voltage
Rev. 0 | Page 8 of 20
06070-017
–1.5
06070-014
ROOT ALLAN VARIANCE (°/s)
1.5
ADIS16250
13.75
18.5
18.3
13.70
18.1
MAXIMUM
17.9
CURRENT (mA)
SENSITIVITY (°/s/LSB)
13.65
13.60
13.55
13.50
17.7
17.5
TYPICAL
17.3
MINIMUM
17.1
13.45
16.9
13.40
0
100
200
300
400
500
600
RATE (°/s)
16.5
–50
–35
–20
–5
10
25
40
55
70
85
100
85
100
TEMPERATURE (°C)
Figure 13. Sensitivity vs. Angular Rate
06070-021
16.7
06070-018
13.35
Figure 16. Current vs. Temperature
42.0
–30
41.8
–35
41.6
–40
SELF-TEST (°/s)
CURRENT (mA)
41.4
MAXIMUM
41.2
41.0
TYPICAL
40.8
MINIMUM
–45
–50
–55
40.6
–60
40.4
–35
–20
–5
10
25
40
55
70
85
100
TEMPERATURE (°C)
–70
–50
06070-019
40.0
–50
–35
–20
–5
10
25
40
55
70
TEMPERATURE (°C)
Figure 14. Current vs. Temperature
06070-022
–65
40.2
Figure 17. Self-Test vs. Temperature
65
0.65
60
0.60
MAXIMUM
CURRENT (mA)
50
45
0.55
TYPICAL
0.50
MINIMUM
0.45
40
30
–50
–35
–20
–5
10
25
40
55
70
TEMPERATURE (°C)
85
100
0.35
–50
–35
–20
–5
10
25
40
55
70
TEMPERATURE (°C)
Figure 15. Self-Test vs. Temperature
Figure 18. Current vs. Temperature
Rev. 0 | Page 9 of 20
85
100
06070-023
0.40
35
06070-020
SELF-TEST (°/s)
55
ADIS16250
THEORY OF OPERATION
OVERVIEW
AUXILIARY ADC FUNCTION
The core angular rate sensor integrated inside the ADIS16250
is based on the Analog Devices iMEMS technology. This sensor
operates on the principle of a resonator gyro. Two polysilicon
sensing structures each contain a dither frame electrostatically
driven to resonance. This provides the necessary velocity
element to produce a Coriolis force during rotation. At two of
the outer extremes of each frame, orthogonal to the dither
motion, are movable fingers placed between fixed fingers to form
a capacitive pickoff structure that senses Coriolis motion.
The resulting signal is fed to a series of gain and demodulation
stages that produce the electrical rate signal output.
The auxiliary ADC function integrates a standard 12-bit ADC
into the ADIS16250 to digitize other system-level analog
signals. The output of the ADC can be monitored through the
AUX_ADC control register, as defined in Table 6. The ADC is a
12-bit successive approximation converter. The output data is
presented in straight binary format with the full-scale range
extending from 0 V to VREF. A high precision, low drift, factory
calibrated 2.5 V reference is also provided.
The base sensor output signal is sampled using an ADC, and then
the digital data is fed into a proprietary digital calibration circuit.
This circuit contains calibration coefficients from the factory
calibration, along with user-defined calibration registers that can
be used to calibrate system-level errors.
The calibrated gyro data (GYRO_OUT) is made available
through output data registers along with temperature, power
supply, auxiliary ADC, and relative angle output calculations.
Figure 19 shows the equivalent circuit of the analog input
structure of the ADC. The input capacitor (C1) is typically 4 pF
and can be attributed to parasitic package capacitance. The two
diodes provide ESD protection for the analog input. Care must
be taken to ensure that the analog input signals never exceed
the supply rails by more than 300 mV. This causes the diodes to
become forward-biased and to start conducting. The diodes can
handle 10 mA without causing irreversible damage. The resistor
is a lumped component that represents the on resistance of the
switches. The value of this resistance is typically 100 Ω.
Capacitor C2 represents the ADC sampling capacitor and is
typically 16 pF.
RELATIVE ANGLE ESTIMATE
VDD
TEMPERATURE SENSOR
An internal temperature sensor monitors the sensor’s junction
temperature. The TEMP_OUT data register provides a digital
representation of this measurement. This sensor provides
a convenient temperature measurement for system-level
characterization and calibration feedback.
D
C1
D
R1 C2
06070-005
The ANGL_OUT register offers the integration of the
GYRO_OUT data. In order for this information to be useful,
the reference angle must be known. This can be accomplished
by reading the register contents at the initial time, before
starting the monitoring, or by setting its contents to zero. This
number is reset to zero when the NULL command is used, after
a RESET command is used, and during power-up. This function
can be used to estimate change in angle over a period. The user
is cautioned to fully understand the stability requirements and
the time period over which to use this estimated relative angle
position.
Figure 19. Equivalent Analog Input Circuit
Conversion Phase: Switch Open
Track Phase: Switch Closed
For ac applications, removing high frequency components from
the analog input signal is recommended by the use of a low-pass
filter on the analog input pin.
In applications where harmonic distortion and signal-to-noise
ratio are critical, the analog input must be driven from a low
impedance source. Large source impedances significantly affect
the ac performance of the ADC. This can necessitate the use of
an input buffer amplifier. When no input amplifier is used to drive
the analog input, the source impedance should be limited to
values lower than 1 kΩ.
Rev. 0 | Page 10 of 20
ADIS16250
BASIC OPERATION
The ADIS16250 is designed for simple integration into
industrial system designs, requiring only a 5.0 V power supply
and a four-wire, industry standard serial peripheral interface (SPI).
All outputs and user-programmable functions are handled by
a simple register structure. Each register is 16 bits in length and
has its own unique bit map. The 16 bits in each register consist
of an upper (D8 to D15) byte and a lower (D0 to D7) byte, each
of which has its own 6-bit address.
Writing to Registers
SERIAL PERIPHERAL INTERFACE (SPI)
Reading the contents of a register requires a modification to the
sequence in Figure 20. In this case, the first two bits in the DIN
sequence are 0, followed by the address of the register. Each register
has two addresses (upper, lower), but either one can be used to
access its entire 16 bits of data. The final 8 bits of the DIN sequence
are irrelevant and can be counted as “don’t cares” during a read
command. During the next data frame, the DOUT sequence
contains the register’s 16-bit data, as shown in Figure 21.
Although a single read command requires two separate data
frames, the full duplex mode minimizes this overhead, requiring
only one extra data frame when continuously sampling.
Figure 20 displays a typical data frame for writing a command
to a control register. In this case, the first bit of the DIN
sequence is a 1, followed by a 0, the 6-bit address, and
the 8-bit data command. Because each write command covers
a single byte of data, two data frames are required when writing
the entire 16-bit space of a register.
Reading from Registers
The ADIS16250 serial peripheral interface (SPI) port includes
four signals: chip select (CS), serial clock (SCLK), data input
(DIN), and data output (DOUT). The CS line enables the
ADIS16250 SPI port and frames each SPI event. When this
signal is high, the DOUT lines are in a high impedance state
and the signals on DIN and SCLK have no impact on operation.
A complete data frame contains 16 clock cycles. Because the SPI
port operates in full duplex mode, it supports simultaneous,
16-bit receive (DIN) and transmit (DOUT) functions during the
same data frame.
Refer to Table 2, Figure 2, and Figure 3 for detailed timing and
operation of the SPI port.
DATA FRAME
CS
SCLK
W/R
A5
A4
A3
A2
A1
A0
REGISTER ADDRESS
WRITE = 1
READ = 0
DC7
DC6
DC5 DC4
DC3
DC2
DC1
DATA FOR WRITE COMMANDS
DON’T CARE FOR READ COMMANDS
DC0
06070-006
DIN
Figure 20. DIN Bit Sequence
CS
DATA FRAME
DATA FRAME
SCLK
W/R BIT
DOUT
ADDRESS
DON’T CARE
NEXT COMMAND
ZERO
BASED ON PREVIOUS COMMAND
16-BIT REGISTER CONTENTS
Figure 21. SPI Sequence for Read Commands
Rev. 0 | Page 11 of 20
06070-007
DIN
ADIS16250
DATA OUTPUT REGISTER ACCESS
The ADIS16250 provides access to calibrated rotation
measurements, relative angle estimates, power supply
measurements, temperature measurements, and an auxiliary
12-bit ADC channel. This output data is continuously updating
internally, regardless of user read rates. The following bit map
describes the structure of all output data registers in the
ADIS16250.
Table 5. Register Bit Map
MSB
LSB
ND
EA
D13
D12
D11
D10
D9
D8
D7
D6
D5
D4
D3
D2
D1
D0
The MSB holds the new data (ND) indicator. When the output
registers are updated with new data, the ND bit goes to a 1 state.
After the output data is read, it returns to a 0 state. The EA bit is
used to indicate a system error or an alarm condition that can
result from a number of conditions, such as a power supply that
is out of the specified operating range. See the Status and
Diagnostics section for more details. The output data is either
12 bits or 14 bits in length. For all of the 12-bit output data, the
Bit D13 and Bit D12 are assigned “don’t care” status.
The output data register map is located in Table 6 and provides
all of the necessary details for accessing each register’s data.
Table 7 displays the output coding for the GYRO_OUT register.
Figure 22 provides an example SPI read cycle for this register.
Table 6. Data Output Register Information
Name
ENDURANCE
SUPPLY_OUT
GYRO_OUT
AUX_ADC
TEMP_OUT
ANGL_OUT
1
Function
Flash Memory Write Counter
Power Supply Data
Gyroscope Data
Auxiliary Analog Input Data
Sensor Temperature Data
Angle Output
Address
0x01, 0x00
0x03, 0x02
0x05, 0x04
0x0B, 0x0A
0x0D, 0x0C
0x0F, 0x0E
Resolution (Bits)
16
12
14
12
12
14
Data Format
Binary
Binary
Twos Complement
Binary
Twos Complement
Binary
Scale Factor
(per LSB)
1 count
1.832 mV
0.07326°/sec 1
0.61 mV
0.1453°C
0.03663°
Assumes that the scaling is set to 320°/sec.
Table 7. Output Coding Example, GYRO_OUT 1, 2
±320°/sec Range
600°/sec
320°/sec
80°/sec
40°/sec
0.07326°/sec
0°/sec
−0.07326°/sec
−40°/sec
−80°/sec
−320°/sec
−600°/sec
1
2
Rate of Rotation
±160°/sec Range
300°/sec
160°/sec
40°/sec
20°/sec
0.03663°/sec
0°/sec
−0.03663°/sec
−20°/sec
−40°/sec
−160°/sec
−300°/sec
±80°/sec Range
150°/sec
80°/sec
20°/sec
10°/sec
0.018315°/sec
0°/sec
−0.018315°/sec
−10°/sec
−20°/sec
−80°/sec
−150°/sec
Two MSBs have been masked off and are not considered in the coding.
Nominal sensitivity and zero offset null performance are assumed.
Rev. 0 | Page 12 of 20
Binary Output
01 1111 1111 1111
01 0001 0001 0001
00 0100 0100 0100
00 0010 0010 0010
00 0000 0000 0001
00 0000 0000 0000
11 1111 1111 1111
11 1101 1101 1110
11 1011 1011 1100
10 1110 1111 0000
10 0000 0000 0000
HEX Output
0x1FFF
0x1110
0x0444
0x0222
0x0001
0x0000
0x3FFF
0x3DDE
0x3BBC
0x2EF0
0x2000
Decimal
8191
4368
1092
546
1
0
−1
−546
−1092
−4368
−8192
ADIS16250
CS
SCLK
DIN
ADDRESS = 000101
DOUT
DATA = 1011 1101 1101 1110
NEW DATA, NO ALARM, GYRO_OUT = –40°/SECOND
Figure 22. Example Read Cycle
Rev. 0 | Page 13 of 20
07060-008
W/R BIT = 0
ADIS16250
PROGRAMMING AND CONTROL
CONTROL REGISTER OVERVIEW
CONTROL REGISTER ACCESS
The ADIS16250 offers many programmable features controlled
by writing commands to the appropriate control registers using the
SPI. The following sections describe these controls and specify
each function and corresponding register configuration. The
features available for configuration in this register space are as
follows:
Table 8 displays the control register map for the ADIS16250,
including address, volatile status, basic function, and
accessibility (read/write). The following sections contain
detailed descriptions and configurations for each of these
registers.
•
Calibration
•
Global commands
•
Operational control
•
Sample rate
•
Power management
•
Digital filtering
•
Dynamic range
•
DAC output
•
Digital I/O
•
Operational status and diagnostics
•
Self test
•
Status conditions
•
Alarms
The ADIS16250 is a flash-based device with the nonvolatile
functional registers implemented as flash registers. Take into
account the endurance limitation of 20,000 writes when
considering the system-level integration of these devices.
The ENDURANCE register (see Table 30) maintains a flash
memory write count, which provides a tool for keeping track of
the limit. The nonvolatile column in Table 8 indicates the registers
that are recovered on power-up. Use a manual flash update
command (using the command register) to store the nonvolatile
data registers once they are configured properly. When
performing a manual flash update command, make sure that
the power supply remains within limits for a minimum of 50 ms
after the start of the update. This ensures a successful write of
the nonvolatile data.
Table 8. Control Register Mapping
Register Name
Type
Volatility
GYRO_OFF
GYRO_SCALE
R/W
R/W
Nonvolatile
Nonvolatile
ALM_MAG1
ALM_MAG2
ALM_SMPL1
ALM_SMPL2
ALM_CTRL
R/W
R/W
R/W
R/W
R/W
Nonvolatile
Nonvolatile
Nonvolatile
Nonvolatile
Nonvolatile
AUX_DAC
GPIO_CTRL
MSC_CTRL
SMPL_PRD
SENS/AVG
R/W
R/W
R/W
R/W
R/W
SLP_CNT
STATUS
COMMAND
1
Volatile
Volatile
Nonvolatile 1
Nonvolatile
Nonvolatile
Address
0x10
0x14
0x16
0x18 to to 0x1F
0x20
0x22
0x24
0x26
0x28
0x2A to 0x2F
0x30
0x32
0x34
0x36
0x38
Bytes
4
2
2
8
2
2
2
2
2
6
2
2
2
2
2
R/W
Volatile
0x3A
2
R
W
Volatile
N/A
0x3C
0x3E
2
2
Function
Reserved
Gyroscope bias offset factor
Gyroscope scale factor
Reserved
Alarm 1 amplitude threshold
Alarm 2 amplitude threshold
Alarm 1 sample period
Alarm 2 sample period
Alarm source control register
Reserved
Auxiliary DAC data
Auxiliary digital I/O control register
Miscellaneous control register
ADC sample period control
Defines the dynamic range (sensitivity setting)
and the number of taps for the digital filter
Counter used to determine length of powerdown mode
System status register
System command register
The contents of the upper byte are nonvolatile; the contents of the lower byte are volatile
Rev. 0 | Page 14 of 20
Reference Table
Table 9, Table 10
Table 11, Table 12
Table 31, Table 32
Table 35, Table 36
Table 33, Table 34
Table 37, Table 38
Table 39, Table 40
Table 21, Table 22
Table 23, Table 24
Table 26, Table 27
Table 15, Table 16
Table 19, Table 20
Table 17, Table 18
Table 28, Table 29
Table 13, Table 14
ADIS16250
CALIBRATION
GLOBAL COMMANDS
The ADIS16250 is factory-calibrated for sensitivity and bias.
It also provides several user calibration functions for
simplifying field-level corrections. The calibration factors are
stored in nonvolatile memory and are applied using the
following linear calibration equation:
The ADIS16250 provides global commands for common
operations such as auto null, factory calibration restore, manual
FLASH update, auxiliary DAC latch, and software reset. Each of
these global commands has a unique control bit assigned to it in
the COMMAND register and is initiated by writing a 1 to its
assigned bit.
y = mx + b
where:
y = calibrated output data
x = precalibration data
m = sensitivity scale factor
b = offset scale factor
There are three options for system-level calibrations of the bias
in the ADIS16250: auto null, factory calibration restore, and
manual calibration updates. The auto null and factory reset
options are described in the Global Commands section.
Optional field-level calibrations use the above equation and
require two steps: (1) characterize the behavior of the
ADIS16250 at predefined critical operating conditions, and (2)
use this characterization data to calculate and load the
appropriate adjustment factors into the GYRO_OFF (“b”).
The GYRO_SCALE (“m”) register can also be adjusted to
implement corrections in the sensitivity scale factor through the
system calibration process.
The GYRO_OFF provides a calibration range of ±37.5°/sec, and
its contents are nonvolatile. The GYRO_SCALE register
provides a calibration range of 0 to 1.9995, and its contents are
also nonvolatile.
Table 9. GYRO_OFF Register Definition
Scale1
0.018315°/sec
Address
0x11,
0x10
1
Default
0x0000
Format
Twos
complement
Access
R/W
Scale is the weight of each LSB.
The auto null function does two things: it resets the contents of
the ANGL_OUT register to zero, and it adjusts the GYRO_OUT
register to zero. This automated adjustment takes two steps: (1)
read GYRO_OUT and (2) write the opposite of this value into
the GRYO_OFF register. Sensor noise influences the accuracy
of this step. For optimal calibration accuracy, set the number of
filtering taps to its maximum, wait for the appropriate number
of samples to process through the filter, and then exercise this
option.
The factory calibration restore command sets the contents of
GYRO_OFF to 0x0000 and GYRO_SCALE to 0x0800, erasing
any field-level calibration contents. The manual FLASH update
writes the contents of each nonvolatile register into FLASH
memory for storage. This process takes approximately 50 ms
and requires the power supply voltage to be within specification
for the duration of the event. It is worth noting that this
operation also automatically follows the auto null and factory
reset commands.
The DAC latch command loads the contents of AUX_DAC into
the DAC latches. Since the AUX_DAC contents must be
updated one byte at a time, this command ensures a stable DAC
output voltage during updates. Finally, the software reset
command sends the ADIS16250 digital processor into a restart
sequence, effectively doing the same thing as the RST line.
Table 13. COMMAND Register Definition
Address
0x3F, 0x3E
Default
N/A
Format
N/A
Table 10. GYRO_OFF Bit Descriptions
Table 14. COMMAND Bit Descriptions
Bit
15:12
11:0
Bit
15:8
7
6:4
3
2
1
0
Description
Not used
Data bits
Table 11. GYRO_SCALE Register Definition
Address
0x13, 0x12
Scale1
0.0488%
Default2
0x0800
Format
Binary
1 Scale is the weight of each LSB.
2 Equates to a scale factor of one.
Access
R/W
Table 12. GYRO_SCALE Bit Descriptions
Bit
15:12
11:0
Description
Not used
Data bits
Rev. 0 | Page 15 of 20
Description
Not used
Software reset command
Not used
Manual FLASH update command
Auxiliary DAC data latch
Factory Calibration Restore command
Auto null command
Access
Write only
ADIS16250
OPERATIONAL CONTROL
Power Management
Internal Sample Rate
In addition to offering two different performance modes for
power optimization, the ADIS16250 offers a programmable
shutdown period. Writing the appropriate sleep time to the
SLP_CNT register shuts the device down for the specified time.
The following example provides an illustration of this
relationship:
The internal sample rate defines how often data output variables
are updated, independent of the rate at which they are read out
on the SPI port. The SMPL_PRD register controls the ADIS16250
internal sample rate and has two parts: a selectable time base and
a multiplier. The sample period can be calculated using the
following equation:
B7 … B0 = 00000110
Sleep period = 3 seconds
TS = TB × (NS + 1)
After completing the sleep period, the ADIS16250 returns to
normal operation. If measurements are required before sleep
period completion, the ADIS16250 can be awakened by putting
the CS line in a zero logic state. Otherwise, the CS line must be
kept high to maintain sleep mode.
Where:
TS = sample period
TB = time base
NS = increment setting
The default value is the maximum 256 samples per second, and
the contents of this register are nonvolatile.
Table 15. SMPL_PRD Register Definition
Address
0x37, 0x36
Default
0x0001
Format
N/A
1
Access
R/W
Scale1
0.5sec
Default
0x0000
Format
Binary
Access
R/W
Scale is the weight of each LSB.
Table 18. SLP_CNT Bit Descriptions
Bit
15:8
7:0
Table 16. SMPL_PRD Bit Descriptions
Bit
15:8
7
6:0
Table 17. SLP_CNT Register Definition
Address
0x3B, 0x3A
Description
Not used
Time base, 0 = 1.953 ms, 1 = 60.54 ms
Multiplier
Description
Not used
Data bits
Analog Bandwidth
The analog bandwidth of the ADIS16250 is 50 Hz. This
bandwidth can be reduced by placing an external capacitor
across the RATE and FILT pins. In this case, the analog
bandwidth can be calculated using the following equation:
Here is an example calculation of the sample period for the
ADIS16250:
If SMPL_PRD = 0x0007, B7 − B0 = 00000111
fOUT = 1/(2 × π × ROUT × (COUT + 0.068 μF))
B7 = 0 → TB = 1.953 ms
ROUT = 45.22 kΩ
B6…B0 = 000000111 → NS = 7
COUT = external capacitance
TS = TB × (NS + 1) = 1.953 ms × (7 + 1) = 15.624 ms
Digital Filtering
fS = 1∕TS = 64 SPS
The sample rate setting has a direct impact on the SPI data rate
capability. For sample rates of 64 SPS and above, the SPI SCLK
can run at a rate up to 2.5 MHz. For sample rates below 64 SPS,
the SPI SCLK can run at a rate up to 1 MHz.
The sample rate setting also affects the power dissipation.
When the sample rate is set below 64 SPS, the power dissipation
reduces by a factor of 60%. The two different modes of
operation offer a system-level trade-off between performance
(sample rate, serial transfer rate) and power dissipation.
The ADIS16250 GYRO_OUT signal path has a nominal analog
bandwidth of 50 Hz. The ADIS16250 provides a Bartlett Window
FIR filter for additional noise reduction on all of the output data
registers. The SENS/AVG register stores the number of taps in
this filter in seven, “power of two,” step sizes (that is, –2M = 1, 2, 4,
16, 32, 64, and 128). Filter setup requires one simple step: write
the appropriate M factor to the assigned bits in the SENS/AVG
register. The bit assignments are listed in Table 20. The following
equation offers a frequency response relationship for this filter:
Rev. 0 | Page 16 of 20
H B ( f ) = H A2 ( f ) ⇒ H A ( f ) =
sin (π × N × f × t s )
N × sin (π × f × t s )
ADIS16250
0
N=4
N=2
Table 21. AUX_DAC Register Definition
–20
Address
0x31, 0x30
N = 16
MAGNITUDE (dB)
–40
Default
0x0000
Format
Binary
Access
R/W
Table 22. AUX_DAC Bit Descriptions
–60
–100
Bit
15:12
11:0
–120
General-Purpose I/O
N = 128
–80
07060-009
–140
–160
0.001
0.01
0.1
1
FREQUENCY (f/fs)
Figure 23. Bartlett Window FIR Frequency Response
Dynamic Range
The ADIS16250 provides three dynamic range settings: ±80°/sec,
±160°/sec, and ±320°/sec. The lower dynamic range settings
(80, 160) limit the minimum filter tap sizes in order to maintain
the resolution as the maximum rate measurements decrease.
The recommended order for programming the SENS/AVG
register is (1) dynamic range and then (2) filtering response.
The contents of the SENS/AVG register are nonvolatile.
The ADIS16250 provides two general-purpose pins that enable
digital I/O control using the SPI. The GPIO_CTRL control
register establishes the configuration of these pins and handles
the SPI-to-pin controls. Each pin provides the flexibility of both
input (read) and output (write) operations. For example, writing
a 0x0202 to this register establishes Line 0 as an output and sets
its level as a one. Writing 0x0000 to this register establishes both
lines as inputs, and their status can be read through Bit 0 and Bit 1
of this register.
The digital I/O lines are also available for data-ready and
alarm/error indications. In the event of conflict, the following
priority structure governs the digital I/O configuration:
Table 19. SENS/AVG Register Definition
Address
0x39, 0x38
Default
0x0400
Format
Binary
Description
Not used
Data bits
Access
R/W
•
GPIO_CTRL
•
MSC_CTRL
•
ALM_CTRL
Table 23. GPIO_CTRL Register Definition
Table 20. SENS/AVG Bit Descriptions
Bit
15:11
10:8
Value
100
010
001
7:4
3:0
Address
0x33, 0x32
Description
Not used
Sensitivity selection bits
320°/sec (default condition)
160°/sec, filter taps ≥ 4 (Bit 3:0 ≥ 0x02)
80°/sec, filter taps ≥16 (Bit 3:0 ≥ 0x04)
Not used
Filter tap setting, M = binary number
(number of taps, N = 2M)
Default
0x0000
Format
N/A
Access
R/W
Table 24. GPIO_CTRL Bit Descriptions
Bit
15:10
9
8
7:2
1
Auxiliary DAC
The auxiliary DAC provides a 12-bit level adjustment function.
The AUX_DAC register controls the operation of this feature. It
offers a rail-to-rail buffered output that has a range of 0 V to 2.5 V.
The DAC can drive its output to within 5 mV of the ground
reference when it is not sinking current. As the output
approaches ground, the linearity begins to degrade (100 LSB
beginning point). As the sink current increases, the nonlinear
range increases. The DAC output latch function, contained in
the COMMAND register, provides continuous operation while
writing each byte of this register. The contents of this register
are volatile, which means that the desired output level must be
set after every reset and power cycle event.
0
Rev. 0 | Page 17 of 20
Description
Not used
General-purpose I/O line 0, data direction control
1 = output, 0 = input
General-purpose I/O line 1, data direction control
1 = output, 0 = input
Not used
General-purpose I/O line 0 polarity
1 = high, 0 = low
General-purpose I/O line 1 polarity
1 = high, 0 = low
ADIS16250
For example, the standard 50 Hz bandwidth reflects an exponential
response with a time constant of 2 ms. Note that the digital filtering
impacts this delay as well. The appropriate bit definitions for selftest are listed in Table 26 and Table 27.
STATUS AND DIAGNOSTICS
The ADIS16250 provides a number of status and diagnostic
functions. Table 25 provides a summary of these functions,
along with their appropriate control registers.
Status Conditions
Table 25. Status and Diagnostic Functions
Function
Data-ready I/O indicator
Self test, mechanical check for MEMS sensor
Status
Check for predefined error conditions
Flash memory endurance
Alarms
Configure and check for user-specific
conditions
Register
MSC_CTRL
MSC_CTRL
STATUS
ENDURANCE
ALM_MAG1/2
ALM_SMPL1/2
ALM_CTRL
Data-Ready I/O Indicator
The STATUS register contains the following error-condition
flags: Alarm conditions, self-test status, angular rate over range,
SPI communication failure, control register update failure, and
power supply out of range. See Table 28 and Table 29 for the
appropriate register access and bit assignment for each flag.
The bits assigned for checking power supply range and angular
rate over range automatically reset to zero when the error
condition no longer exists. The remaining error-flag bits in the
STATUS register require a read in order to return them to zero.
Note that a STATUS register read clears all of the bits to zero.
The data-ready function provides an indication of updated
output data. The MSC_CTRL register provides the opportunity
to configure either of the general-purpose I/O pins (DIO0 and
DIO1) as a data-ready indicator signal.
Table 28. STATUS Register Definition
Table 26. MSC_CTRL Register Definition
Bit
15:10
9
Address
0x35, 0x34
Default
0x0000
Format
N/A
Access
R/W
Address
0x3D, 0x3C
8
Bit
15:11
10
7:6
5
9
8
7:3
2
1
0
Format
N/A
Access
Read only
Table 29. STATUS Bit Descriptions
Table 27. MSC_CTRL Bit Descriptions
Description
Not used
Internal self-test enable:
1 = enabled, 0 = disabled
External negative rotation self-test enable
1 = enabled, 0 = disabled
External positive rotation self-test enable
1 = enabled, 0 = disabled
Not used
Data-ready enable
1 = enabled, 0 = disabled
Data-ready polarity
1 = active high, 0 = active low
Data-ready line select
1 = DIO1, 0 = DIO0
Default
0x0000
4
3
2
1
0
Description
Not used
Alarm 2 status:
1 = active, 0 = inactive
Alarm 1 status
1 = active, 0 = inactive
Not used
Self-test diagnostic error flag
1 = error condition, 0 = normal operation
Angular rate over range
1 = error condition, 0 = normal operation
SPI communications failure
1 = error condition, 0 = normal operation
Control register update failed
1 = error condition, 0 = normal operation
Power supply in range above 5.25 V
1 = above 5.25 V, 0 = below 5.25V (normal)
Power supply below 4.75 V
1 = below 4.75 V, 0 = above 4.75V (normal)
Flash Memory Endurance
Self Test
The MSC_CTRL register also provides a self-test function,
which verifies the MEMS sensor’s mechanical integrity. There
are two different self-test options: (1) internal self-test and (2)
external self-test. The internal test provides a simple, two-step
process for checking the MEMS sensor: (1) start the process by
writing a 1 to Bit 10 in the MSC_CTRL register and (2) check
the result by reading Bit 5 of the STATUS register.
The ENDURANCE register maintains a running count of
writes to the flash memory.
Table 30. ENDURANCE Register Definition
Address
0x01, 0x00
The external self-test is a static condition that can be enabled
and disabled. In this test, both positive and negative MEMS
sensor movements are available. After writing to the appropriate
control bit, the GYRO_OUT register reflects the changes after a
delay that reflects the sensor signal chain response time.
Rev. 0 | Page 18 of 20
Default
N/A
Format
Binary
Access
Read only
ADIS16250
Alarms
Table 36. ALM_MAG2 Bit Designations
The ADIS16250 provides two independent alarm options for
event detection. Event detections occur when output register
data meets the configured conditions. Configuration options are:
Bit
15
14
13:0
•
•
•
•
•
All output data registers are available for monitoring
as the source data
The source data can be filtered or unfiltered
Comparisons can be static or dynamic (rate of change)
The threshold levels and times are configurable
Comparison can be greater than or less than
The ALM_MAG1 register and the ALM_MAG2 register both
establish the threshold level for detecting events. They take on the
format of the source data and provide a bit for establishing the
greater than/less than comparison direction. When making
dynamic comparisons, the ALM_SMPL1 register and the
ALM_SMPL2 register establish the number of averages taken for
the source data as a reference for comparison. In this configuration,
each subsequent source data sample is subtracted from the previous
one, establishing an instantaneous delta. The ALM_CTRL register
controls the source data selection, static/dynamic selection, filtering
selection, and digital I/O usage for the alarms.
Table 37. ALM_SMPL2 Register Definition
Address
0x27, 0x26
Bit
15:8
7:0
Bit
15
N DS
∑ y (n + 1) − y (n)
n =1
Default
0x0000
Format
N/A
11
10:8
000
001
010
011
100
101
110
111
Access
R/W
Table 32. ALM_MAG1 Bit Designations
Bit
15
14
13:0
Description
Comparison polarity: 1 = greater than, 0 = less than
Not used
Data bits: format matches source data format
7:5
4
Table 33. ALM_SMPL1 Register Definition
Address
0x25, 0x24
Default
0x0000
Format
Binary
Access
R/W
3
2
Table 34. ALM_SMPL1 Bit Designations
Bit
15:8
7:0
Description
Not used
Data bits
1
0
Table 35. ALM_MAG2 Register Definition
Address
0x23, 0x22
Default
0x0000
Value
000
001
010
011
100
101
110
111
YC = factor to be compared with M C
Address
0x21, 0x20
Format
N/A
Default
0x0000
Format
N/A
Access
R/W
Table 40. ALM_CTRL Bit Designations
y (n) = sampled output data
Table 31. ALM_MAG1 Register Definition
Access
R/W
Description
Not used
Data bits
Address
0x29, 0x28
M C = magnitude for comparison in ALM_MAG1/2
Rate of change alarm ⇒
Compare YC with M C according to ALM_MAG1/2 MSB (> or < ?)
Format
Binary
Table 39. ALM_CTRL Register Definition
N DS = number of samples in ALM_SMPL1/2
1
N DS
Default
0x0000
Table 38. ALM_SMPL2 Bit Designations
14:12
The rate of change calculation is
YC =
Description
Comparison polarity: 1 = greater than, 0 = less than
Not used
Data bits: format matches source data format
Access
R/W
Rev. 0 | Page 19 of 20
Description
Rate of change (ROC) enable for alarm 2
1 = rate of change, 0 = static level
Alarm 2 source selection
Disable
Power supply output
Gyroscope output
Inactive
Inactive
Auxiliary ADC output
Temperature sensor output
Inactive
Rate of change (ROC) enable for alarm 1
1 = rate of change, 0 = static level
Alarm 1 source selection
Disable
Power supply output
Gyroscope output
Inactive
Inactive
Auxiliary ADC output
Temperature sensor output
Inactive
Not used
Filtered data comparison
1 = filtered data, 0 = unfiltered data
Not used
Alarm output enable
1 = enabled, 0 = disabled
Alarm output polarity
1 = active high, 0 = active low
Alarm output line select
1 = DIO1, 0 = DIO0
ADIS16250
Preliminary Technical Data
OUTLINE DIMENSIONS
PIN 1
INDICATOR
1.200 BSC
(8 PLCS)
11.127 MAX
16
15
11.000
TYP
20
1.00 BSC
(20 PLCS)
1
10.173
BSC
0.900 BSC
(16 PLCS)
11
10
6
5
BOTTOM VIEW
TOP VIEW
0.373 BSC
(20 PLCS)
7.00 TYP
092006-A
5.50
MAX
SIDE VIEW
Figure 24. 20-Terminal Land Grid Array [LGA]
(CC-20-1)
Dimensions shown in millimeters
ORDERING GUIDE
Model
ADIS16250ACCZ 1
ADIS16250/PCBZ1
1
Temperature Range
−40°C to +85°C
Package Description
20-Terminal Land Grid Array [LGA]
Evaluation Board
Z = Pb-free part.
©2006 Analog Devices, Inc. All rights reserved. Trademarks and
registered trademarks are the property of their respective owners.
D06070-0-10/06(0)
Rev. 0 | Page 20 of 20
Package Option
CC-20-1
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