PD - 94622A SMPS MOSFET IRFPS29N60L HEXFET® Power MOSFET Applications • Zero Voltage Switching SMPS VDSS RDS(on) typ. Trr typ. ID • Telecom and Server Power Supplies • Uninterruptible Power Supplies 175mΩ 600V 130ns 29A • Motor Control applications Features and Benefits • SuperFast body diode eliminates the need for external diodes in ZVS applications. • Lower Gate charge results in simpler drive requirements. • Enhanced dv/dt capabilities offer improved ruggedness. • Higher Gate voltage threshold offers improved noise immunity . Super-247™ Absolute Maximum Ratings Parameter ID @ TC = 25°C Continuous Drain Current, VGS @ 10V Max. 29 Units ID @ TC = 100°C Continuous Drain Current, VGS @ 10V 18 A IDM 110 Pulsed Drain Current PD @TC = 25°C Power Dissipation c VGS Linear Derating Factor Gate-to-Source Voltage dv/dt TJ Peak Diode Recovery dv/dt Operating Junction and TSTG Storage Temperature Range e 480 W 3.8 ±30 W/°C V 15 -55 to + 150 V/ns °C Soldering Temperature, for 10 seconds 300 (1.6mm from case ) Mounting torque, 6-32 or M3 screw 1.1(10) N•m (lbf•in) Diode Characteristics Symbol Parameter Min. Typ. Max. Units IS Continuous Source Current ––– ––– 29 ISM (Body Diode) Pulsed Source Current ––– ––– 110 c Conditions MOSFET symbol A (Body Diode) showing the integral reverse p-n junction diode. TJ = 25°C, IS = 29A, VGS = 0V VSD Diode Forward Voltage ––– ––– 1.5 V trr Reverse Recovery Time ––– 130 190 ––– 240 360 ns TJ = 25°C, IF = 29A TJ = 125°C, di/dt = 100A/µs ––– 630 950 nC Qrr Reverse Recovery Charge ––– 1820 2720 IRRM Reverse Recovery Current ton Forward Turn-On Time www.irf.com ––– 9.4 14 f f T = 25°C, I = 29A, V = 0V f T = 125°C, di/dt = 100A/µs f J S GS J A TJ = 25°C Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD) 1 8/26/04 IRFPS29N60L Static @ TJ = 25°C (unless otherwise specified) Symbol Parameter Min. Typ. Max. Units V(BR)DSS ∆V(BR)DSS/∆TJ Drain-to-Source Breakdown Voltage RDS(on) ––– V Conditions 600 ––– VGS = 0V, ID = 250µA Breakdown Voltage Temp. Coefficient ––– 0.53 ––– V/°C Reference to 25°C, ID = 1mA Static Drain-to-Source On-Resistance ––– 175 210 mΩ V VGS = 10V, ID = 17A f VGS(th) Gate Threshold Voltage 3.0 ––– IDSS Drain-to-Source Leakage Current ––– ––– 50 µA VDS = 600V, VGS = 0V ––– ––– 2.0 mA VDS = 480V, VGS = 0V, TJ = 125°C Gate-to-Source Forward Leakage ––– ––– 100 nA VGS = 30V Gate-to-Source Reverse Leakage ––– ––– -100 Internal Gate Resistance ––– 0.86 ––– Ω f = 1MHz, open drain IGSS RG 5.0 VDS = VGS, ID = 250µA VGS = -30V Dynamic @ TJ = 25°C (unless otherwise specified) Symbol Parameter gfs Qg Forward Transconductance Qgs Min. Typ. Max. Units S Conditions 15 ––– ––– VDS = 50V, ID = 17A Total Gate Charge ––– ––– 220 Gate-to-Source Charge ––– ––– 67 Qgd Gate-to-Drain ("Miller") Charge ––– ––– 96 td(on) Turn-On Delay Time ––– 34 ––– tr Rise Time ––– 100 ––– td(off) Turn-Off Delay Time ––– 66 ––– RG = 4.3Ω tf Fall Time ––– 54 ––– VGS = 10V, See Fig. 11a & 11b Ciss Input Capacitance ––– 6160 ––– VGS = 0V Coss Output Capacitance ––– 530 ––– Crss Reverse Transfer Capacitance ––– 44 ––– Coss eff. Effective Output Capacitance ––– 250 ––– Coss eff. (ER) Effective Output Capacitance ––– 190 ––– ID = 29A nC VDS = 480V VGS = 10V, See Fig. 7 & 15 f VDD = 300V ns ID = 29A f VDS = 25V pF ƒ = 1.0MHz, See Fig. 5 VGS = 0V,VDS = 0V to 480V g (Energy Related) Avalanche Characteristics Symbol EAS Parameter Single Pulse Avalanche Energy IAR Avalanche Current EAR Repetitive Avalanche Energy c d c Typ. ––– Max. 570 Units mJ ––– 29 A ––– 48 mJ Typ. Max. Units ––– 0.26 0.24 ––– ––– 40 Thermal Resistance Symbol Parameter h RθJC Junction-to-Case RθCS Case-to-Sink, Flat, Greased Surface Junction-to-Ambient RθJA h Notes: Repetitive rating; pulse width limited by max. junction temperature. (See Fig. 11) Starting TJ = 25°C, L = 1.5mH, RG = 25Ω, IAS = 29A. (See Figure 12a) ISD ≤ 29A, di/dt ≤ 830A/µs, VDD ≤ V(BR)DSS, TJ ≤ 150°C. 2 °C/W Pulse width ≤ 300µs; duty cycle ≤ 2%. Coss eff. is a fixed capacitance that gives the same charging time as Coss while VDS is rising from 0 to 80% VDSS. Coss eff.(ER) is a fixed capacitance that stores the same energy as Coss while VDS is rising from 0 to 80% VDSS. Rθ is measured at TJ approximately 90°C www.irf.com IRFPS29N60L 1000 100 BOTTOM 10 100 20µs PULSE WIDTH Tj = 25°C VGS 15V 10V 9.0V 7.0V 7.0V 5.5V 5.0V 4.5V TOP ID, Drain-to-Source Current (A) ID, Drain-to-Source Current (A) TOP 1 0.1 10 BOTTOM VGS 15V 10V 9.0V 7.0V 7.0V 5.5V 5.0V 4.5V 4.5V 1 20µs PULSE WIDTH Tj = 150°C 4.5V 0.01 0.1 0.1 1 10 100 0.1 VDS, Drain-to-Source Voltage (V) Fig 1. Typical Output Characteristics 10 100 Fig 2. Typical Output Characteristics 1000.00 3.0 100.00 T J = 150°C 10.00 T J = 25°C 1.00 0.10 VDS = 50V 20µs PULSE WIDTH 0.01 ID = 28A 2.5 VGS = 10V 2.0 (Normalized) RDS(on) , Drain-to-Source On Resistance ID, Drain-to-Source Current (Α) 1 VDS, Drain-to-Source Voltage (V) 1.5 1.0 0.5 0.0 4 6 8 VGS , Gate-to-Source Voltage (V) Fig 3. Typical Transfer Characteristics www.irf.com 10 -60 -40 -20 0 20 40 60 80 100 120 140 160 T J , Junction Temperature (°C) Fig 4. Normalized On-Resistance vs. Temperature 3 IRFPS29N60L 100000 35 Coss = Cds + Cgd 10000 30 Ciss Energy (µJ) C, Capacitance(pF) 40 VGS = 0V, f = 1 MHZ Ciss = C gs + Cgd, C ds SHORTED Crss = Cgd 1000 Coss 100 25 20 15 10 Crss 5 10 0 1 10 100 1000 0 VDS, Drain-to-Source Voltage (V) 200 300 400 500 700 Fig 6. Typ. Output Capacitance Stored Energy vs. VDS 1000.00 20 ID= 28A ISD, Reverse Drain Current (A) VDS= 480V VDS= 300V VDS= 150V 16 100.00 12 8 4 T J = 150°C 10.00 T J = 25°C 1.00 VGS = 0V 0 0 40 80 120 160 200 Q G Total Gate Charge (nC) Fig 7. Typical Gate Charge vs. Gate-to-Source Voltage 4 600 VDS, Drain-to-Source Voltage (V) Fig 5. Typical Capacitance vs. Drain-to-Source Voltage VGS , Gate-to-Source Voltage (V) 100 240 0.10 0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 VSD, Source-to-Drain Voltage (V) Fig 8. Typical Source-Drain Diode Forward Voltage www.irf.com IRFPS29N60L ID, Drain-to-Source Current (A) 1000 30 OPERATION IN THIS AREA LIMITED BY R DS(on) 25 ID, Drain Current (A) 100 100µsec 10 1msec 1 Tc = 25°C Tj = 150°C Single Pulse 20 15 10 5 10msec 0.1 0 1 10 100 1000 10000 25 VDS, Drain-to-Source Voltage (V) VGS RG RD 100 125 150 Fig 10. Maximum Drain Current vs. Case Temperature VDS 90% D.U.T. + -VDD 10V Pulse Width ≤ 1 µs Duty Factor ≤ 0.1 % Fig 11a. Switching Time Test Circuit www.irf.com 75 T C , Case Temperature (°C) Fig 9. Maximum Safe Operating Area VDS 50 10% VGS td(on) tr t d(off) tf Fig 11b. Switching Time Waveforms 5 IRFPS29N60L Thermal Response ( Z thJC ) 1 D = 0.50 0.1 0.20 0.10 0.05 0.01 0.02 0.01 SINGLE PULSE ( THERMAL RESPONSE ) 0.001 1E-006 1E-005 0.0001 0.001 0.01 0.1 t1 , Rectangular Pulse Duration (sec) Fig 12. Maximum Effective Transient Thermal Impedance, Junction-to-Case VGS(th) Gate threshold Voltage (V) 5.0 ID = 250µA 4.0 3.0 2.0 1.0 -75 -50 -25 0 25 50 75 100 125 150 T J , Temperature ( °C ) Fig 13. Threshold Voltage vs. Temperature 6 www.irf.com 1 IRFPS29N60L EAS , Single Pulse Avalanche Energy (mJ) 1200 ID TOP 13A 18A BOTTOM 29A 1000 800 600 400 200 0 25 50 75 100 125 150 Starting T J , Junction Temperature (°C) Fig 14a. Maximum Avalanche Energy vs. Drain Current 15V V(BR)DSS DRIVER L VDS D.U.T RG + - VDD IAS 20V tp tp A 0.01Ω I AS Fig 14b. Unclamped Inductive Test Circuit Fig 14c. Unclamped Inductive Waveforms Current Regulator Same Type as D.U.T. QG 50KΩ 12V VGS V .2µF .3µF D.U.T. QGS + V - DS QGD VG VGS 3mA IG ID Current Sampling Resistors Fig 15a. Gate Charge Test Circuit www.irf.com Charge Fig 15b. Basic Gate Charge Waveform 7 IRFPS29N60L Peak Diode Recovery dv/dt Test Circuit Circuit Layout Considerations • Low Stray Inductance • Ground Plane • Low Leakage Inductance Current Transformer + D.U.T + - - + RG • • • • dv/dt controlled by RG Driver same type as D.U.T. ISD controlled by Duty Factor "D" D.U.T. - Device Under Test Driver Gate Drive P.W. Period D= + - VDD P.W. Period VGS=10V * D.U.T. ISD Waveform Reverse Recovery Current Body Diode Forward Current di/dt D.U.T. VDS Waveform Diode Recovery dv/dt Re-Applied Voltage Body Diode VDD Forward Drop Inductor Curent Ripple ≤ 5% ISD * VGS = 5V for Logic Level Devices Fig 16. For N-Channel HEXFET® Power MOSFETs 8 www.irf.com IRFPS29N60L Super-247™ (TO-274AA) Package Outline 0.13 [.005] 16.10 [.632] 15.10 [.595] 2X R 3.00 [.118] 2.00 [.079] 0.25 [.010] 5.50 [.216] 4.50 [.178] A B A 13.90 [.547] 13.30 [.524] 2.15 [.084] 1.45 [.058] 1.30 [.051] 0.70 [.028] 16.10 [.633] 15.50 [.611] 4 20.80 [.818] 19.80 [.780] 4 C 1 2 3 B 14.80 [.582] 13.80 [.544] 5.45 [.215] 2X Ø 1.60 [.063] MAX. 4.25 [.167] 3.85 [.152] 3X 1.60 [.062] 1.45 [.058] 0.25 [.010] B A 3X E E 1.30 [.051] 1.10 [.044] 2.35 [.092] 1.65 [.065] S ECT ION E-E NOTES : 1. DIMENS IONING AND T OLERANCING PER AS ME Y14.5M-1994. 2. DIMENS IONS ARE S HOWN IN MILLIMET ERS [INCHES ] 3. CONT ROLLING DIMENS ION: MILLIMET ER 4. OUT LINE CONFORMS T O JEDEC OUTLINE T O-274AA LEAD AS S IGNMENT S MOS FET 1 - GAT E 2 - DRAIN 3 - S OURCE 4 - DRAIN IGBT 1 - GAT E 2 - COLLECT OR 3 - EMITT ER 4 - COLLECT OR Super-247™ (TO-274AA)Part Marking Information EXAMPLE: THIS IS AN IRFPS37N50A WITH ASSEMBLY LOT CODE A8B9 INTERNATIONAL RECTIFIER LOGO PART NUMBER IRFPS37N50A A8B9 0020 ASSEMBLY LOT CODE TOP DATE CODE (YYWW) YY = YEAR WW = WEEK Super TO-247™ package is not recommended for Surface Mount Application. Data and specifications subject to change without notice. This product has been designed and qualified for the Industrial market. Qualification Standards can be found on IR’s Web site. IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105 TAC Fax: (310) 252-7903 Visit us at www.irf.com for sales contact information.08/04 www.irf.com 9