IRF GSELDIRUH33PA13B20K Eldrs test report Datasheet

IRUH33PA13B20K
ELDRS Test Report
FEBRUARY 2006
Revision A
International Rectifier currently does not have a DSCC approved Radiation Hardness Assurance
Program for MIL-PRF-38534.
ELDRS Test Report
IRUH33PA13B20K
February 2006, Rev A
Table of Contents
Introduction .………………………………………………. 3
Summary of Results ……………………………………... 3
Test Method .……………………………………………… 3
Test Plan .…………………………………………………. 3
Test Facility ………………………………………………. 4
Test Results ...……………………………………………. 5
Conclusion .………………………………………………...9
Appendix A – Electrical Data
Appendix B – Radiation Test Specification
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ELDRS Test Report
IRUH33PA13B20K
February 2006, Rev A
INTRODUCTION
This test report covers the total ionizing dose tests performed on the IRUH33PA13B20K
Adjustable Low Dropout linear regulator in a hermetic package. The ELDRS test was performed
on ten samples of the device from production lot H903185, which had completed MIL-PRF38534 “H” level assembly and screening. On January 19, 2006 International Rectifier tested this
device for ELDRS hardness at the University of Massachusetts, Nuclear Research Facility using
their CO60 source.
SUMMARY OF RESULTS
All of the test samples passed the post radiation test requirements for total ionizing dose levels
up to 44.6K RAD(Si). The results show more degradation on the off-bias devices for all tests
parameters as a function of radiation. The “ON” biased samples passed the post radiation test
requirements for all of the required dose levels.
TEST METHOD
The test method used as a guide in the development of the Test Plan was MIL-STD-883,
Method 1019 Ionizing Radiation, Condition C. This method establishes the basic requirements
for the performance and execution of the tests.
TEST PLAN
The samples were exposed to CO60 irradiation in both an “ON” and “OFF” biased state per the
requirements of the test plan and the radiation test specification. Post radiation testing of the
devices occurred at the UMass facility after each dose step was complete. The devices were
tested starting on January 20, 2006 for post radiation effects for dose levels up to 100K Rad(Si)
at a dose rate of 0.065 Rad(Si)/sec.
ON Biased serial numbers: 111, 114, 89, 67, 96
OFF Biased serial numbers: 94, 93, 85, 117, 76
Control Samples: 71 and 107.
The Radiation Test Specification is included in Appendix B. The testing occurred in the
following manner:
1.0
Purpose
The purpose of this test is to characterize and qualify the ELDRS effects for International Rectifier’s hybrid
low dropout regulator devices. The data resulting from the tests may be incorporated in the IR data sheet
for the product.
2.0
Test Responsibility
International Rectifier shall be responsible for conducting the tests, which shall be performed at the
University of Massachusetts Research Reactor facility. International Rectifier shall be responsible for the
final Test Report.
3.0
Test Facility
3.1 Nuclear Reactor
The University of Massachusetts Research Reactor shall be used to provide the source for Gamma
radiation. UMRR will also provide information on dose rate, total dose, irradiation test times and dosimetry
for this evaluation.
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ELDRS Test Report
IRUH33PA13B20K
February 2006, Rev A
3.2 Test Equipment
The necessary test equipment including interface board, cables, power supplies, measurement system,
etc. shall be provided by International Rectifier.
3.3 Sample Size
Sample size shall be determined based on device type, characterization parameters. As a minimum, the
sample size shall meet the requirements of Mil- PRF-38534. Sample size for this TID evaluation equals 12
devices. Five of the samples shall be biased with the worst-case input voltage of 6.8 volts and five samples
shall be biased “in-circuit” with the power supply turned off. Two samples shall be maintained as controls of
which one shall be tested at each dose step.
4.0
Test Devices
4.1 The following device is planned for Total Ionizing Dose characterization:
a. IRUH33PA13B20K
4.2 All devices shall be subjected to a minimum of 160hrs of burn-in and electrically tested over the entire
operating range prior to radiation exposure.
4.3 All devices shall be tested after each radiation exposure per T090104G within 1 hour and placed back
on to radiation exposure within 2 hours.
5.0
Test Method
MIL-STD-883, Method 1019 Condition C shall be used to establish the procedure for all testing described
herein.
6.0
Record Keeping
7.0
Test Report
The Reactor facility shall provide dosimetry data for the CO60 source. Each exposure run shall be
cataloged with the appropriate number in order to maintain correlation to the appropriate data set. IR will be
responsible for collecting and compiling the test data.
The Test Report shall include the following information:
a.
Device type(s), serial numbers, wafer lot identification (per active component)
b.
Test dates
c.
Facility, source type
d.
Bias conditions
e.
Comments and observations
f.
Pre and Post Electrical data
g.
Summary descriptive including graphs (if applicable)
TEST FACILITY
The University of Massachusetts, Lowell, Nuclear Research Reactor is a 1 Mega-Watt,
Uranium235 enhanced core reactor. The UMass Lowell Radiation Laboratory provides controlled
radiation environments and analytical measurement services to government organizations and
to industry. The laboratory provides facilities for proton, neutron, and gamma environments. The
Gamma Cave is an irradiation room inside this facility having an equi-dimensional volume of 512
cubic feet. A wide range of dose rates, 1Gray (100 rad) per hour to 10,000 Gray (1 Mrad) per
hour, is available. Several small ports penetrate one shielding wall to provide access for
instrumentation cables.
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ELDRS Test Report
IRUH33PA13B20K
February 2006, Rev A
Test Results
The key pre and post radiation test results are shown in Tables 1 thru 10. In Figures 1-6, the
parametric shifts are shown graphically for all exposed devices. The raw test data for all the
parameters tested is shown in Appendix A. As outlined in the Test Plan, five of the devices
exposed to total ionizing dose irradiation were biased “ON” with the maximum input voltage and
five samples were placed in the bias circuit with the power supply off or biased “OFF”. All
samples passed the post radiation test requirements up to 44.6K RAD(Si). The parameters
affected the most by the ionizing radiation were Output Voltage, Ripple Rejection, and
Shutdown Threshold Voltage with the worst-case condition being the “OFF” bias.
The output voltage shift over radiation exposure with a 1.5A load current was +6.2% for the
“OFF” biased samples and + 3.7% for the “ON” biased samples after exposure 100K RAD(Si).
The shift at 44.6K RAD(Si) exposure was +4.7% for the “OFF” biased samples and + 3.2% for
the “ON” biased samples.
Table 1 “ON” Biased Samples, VOUT, VIN=3.3V @1.5A
T#1
Serial #
71
107
111
114
89
67
96
Min
Avg
Max
VOUT
0
2.510
2.494
2.497
2.509
2.506
2.503
2.506
2.497
2.504
2.509
6
2.510
2.495
2.510
2.520
2.520
2.515
2.524
2.510
2.518
2.524
KRAD LEVEL
22
2.505
2.495
2.545
2.550
2.554
2.549
2.566
2.545
2.553
2.566
Limits
45
2.508
2.493
2.572
2.579
2.588
2.580
2.588
2.572
2.581
2.588
100
2.509
2.492
2.587
2.595
2.601
2.597
2.602
2.587
2.596
2.602
Min
2.375
2.375
2.375
2.375
2.375
2.375
2.375
2.375
2.375
2.375
Max
2.625
2.625
2.625
2.625
2.625
2.625
2.625
2.625
2.625
2.625
U/M
V
V
V
V
V
V
V
V
V
V
Table 2 “OFF” Biased Samples, VOUT, VIN=3.3V @1.5A
VOUT
T#1
Serial #
71
107
94
93
85
117
76
Min
Avg
Max
0
2.510
2.494
2.505
2.499
2.500
2.510
2.499
2.499
2.503
2.510
6
2.510
2.495
2.516
2.517
2.514
2.529
2.515
2.514
2.518
2.529
KRAD LEVEL
22
2.505
2.495
2.569
2.563
2.561
2.570
2.556
2.556
2.564
2.570
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45
2.508
2.493
2.608
2.610
2.604
2.612
2.600
2.600
2.607
2.612
100
2.509
2.492
2.665
2.655
2.651
2.661
2.651
2.651
2.657
2.665
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Limits
Min
Max
2.375
2.625
2.375
2.625
2.375
2.625
2.375
2.625
2.375
2.625
2.375
2.625
2.375
2.625
2.375
2.625
2.375
2.625
2.375
2.625
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U/M
V
V
V
V
V
V
V
V
V
V
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ELDRS Test Report
IRUH33PA13B20K
February 2006, Rev A
Table 3 “ON” Biased Samples, VDROP, IOUT=3A
T#8
VDROP
Serial #
71
107
111
114
89
67
96
Min
Avg
Max
0
0.20
0.19
0.20
0.20
0.19
0.19
0.20
0.192
0.195
0.199
6
0.20
0.19
0.21
0.21
0.20
0.21
0.20
0.197
0.206
0.212
KRAD LEVEL
22
0.19
0.19
0.22
0.22
0.22
0.22
0.22
0.215
0.217
0.219
45
0.19
0.19
0.23
0.23
0.23
0.23
0.23
0.227
0.231
0.234
100
0.20
0.19
0.24
0.24
0.24
0.25
0.25
0.239
0.244
0.250
Limits
Min
Max
0
0.4
0
0.4
0
0.4
0
0.4
0
0.4
0
0.4
0
0.4
0
0.4
0
0.4
0
0.4
U/M
V
V
V
V
V
V
V
V
V
V
Table 4 “OFF” Biased Samples, VDROP, IOUT=3A
T#8
Serial #
71
107
94
93
85
117
76
Min
Avg
Max
0
0.20
0.19
0.20
0.19
0.21
0.20
0.20
0.192
0.199
0.210
VDROP
KRAD LEVEL
6
22
45
0.20
0.19
0.19
0.19
0.19
0.19
0.20
0.22
0.22
0.20
0.22
0.23
0.22
0.23
0.25
0.22
0.22
0.24
0.21
0.22
0.24
0.204
0.215
0.223
0.212
0.222
0.237
0.223
0.230
0.249
100
0.20
0.19
0.25
0.25
0.23
0.27
0.25
0.232
0.252
0.265
Limits
Min
Max
0
0.4
0
0.4
0
0.4
0
0.4
0
0.4
0
0.4
0
0.4
0
0.4
0
0.4
0
0.4
U/M
V
V
V
V
V
V
V
V
V
V
Table 5 “ON” Biased Samples, CURRENT LIMIT, VIN=3.3
T#9
Serial #
71
107
111
114
89
67
96
Min
Avg
Max
0
9.2
8.9
8.8
8.8
8.8
9.1
8.9
8.795
8.890
9.112
6
9.2
9.2
9.1
9.1
9.1
9.0
8.8
8.845
9.026
9.117
CURRENT LIMIT
KRAD LEVEL
22
45
100
9.2
9.1
8.9
9.3
9.1
9.1
9.3
9.1
8.8
9.3
8.9
8.9
9.3
9.1
8.9
8.9
8.9
8.5
9.1
9.1
8.8
8.935
8.868
8.511
9.161
8.986
8.783
9.252
9.095
8.874
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Limits
Min
Max
3
10
3
10
3
10
3
10
3
10
3
10
3
10
3
10
3
10
3
10
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U/M
A
A
A
A
A
A
A
A
A
A
6
ELDRS Test Report
IRUH33PA13B20K
February 2006, Rev A
Table 6 “OFF” Biased Samples, CURRENT LIMIT, VIN=3.3
T#9
Serial #
71
107
94
93
85
117
76
Min
Avg
Max
0
9.2
8.9
8.7
8.7
8.5
8.9
8.5
8.477
8.649
8.885
CURRENT LIMIT
KRAD LEVEL
6
22
45
100
9.2
9.2
9.1
8.9
9.2
9.3
9.1
9.1
8.8
8.8
9.1
9.1
8.8
9.1
9.5
8.8
8.5
8.8
8.5
8.5
9.1
9.1
9.1
8.9
9.1
9.1
9.1
8.9
8.481
8.798
8.505
8.511
8.861
8.980
9.040
8.838
9.117
9.116
9.459
9.101
Limits
Min
Max
3
10
3
10
3
10
3
10
3
10
3
10
3
10
3
10
3
10
3
10
U/M
A
A
A
A
A
A
A
A
A
A
Table 7 “ON” Biased Samples, RIPPLE REJECTION = 120Hz.
T#10
Serial #
71
107
111
114
89
67
96
Min
Avg
Max
0
97.2
98.2
98.6
97.6
99.8
100.4
97.6
97.600
98.810
100.400
6
97.2
98.1
100.4
99.2
100.5
101.2
99.8
99.230
100.224
101.200
RIPPLE REJECTION
KRAD LEVEL
22
45
99.2
99.2
98.2
99.2
98.6
89.5
100.4
91.8
98.7
89.5
99.2
89.6
101.1
89.5
98.630
89.450
99.590
89.970
101.100
91.820
100
98.2
99.8
61.9
61.9
60.7
60.8
61.9
60.740
61.460
61.940
Limits
Min Max
40
200
40
200
40
200
40
200
40
200
40
200
40
200
40
200
40
200
40
200
U/M
dB
dB
dB
dB
dB
dB
dB
dB
dB
dB
Table 8 “OFF” Biased Samples, RIPPLE REJECTION = 120Hz
T#10
Serial #
71
107
94
93
85
117
76
Min
Avg
Max
0
97.2
98.2
98.1
99.2
98.1
98.1
99.7
98.060
98.622
99.740
RIPPLE REJECTION
KRAD LEVEL
6
22
45
100
97.2
99.2
99.2
98.2
98.1
98.2
99.2
99.8
99.8
95.1
63.3
58.0
99.2
96.3
64.9
59.7
100.5
95.9
61.9
59.7
99.2
95.5
64.8
59.7
98.6
95.9
64.9
59.7
98.630
95.110
61.900
58.020
99.468
95.744
63.946
59.370
100.500
96.310
64.860
59.720
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Limits
Min Max
40
200
40
200
40
200
40
200
40
200
40
200
40
200
40
200
40
200
40
200
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U/M
dB
dB
dB
dB
dB
dB
dB
dB
dB
dB
7
ELDRS Test Report
IRUH33PA13B20K
February 2006, Rev A
Table 9 “ON” Biased Samples, VOLTAGE SHUTDOWN
T#11
VSHDN
Serial #
71
107
111
114
89
67
96
Min
Avg
Max
0
1.38
1.32
1.34
1.36
1.36
1.32
1.34
1.319
1.344
1.360
6
1.38
1.34
1.36
1.38
1.38
1.34
1.38
1.338
1.367
1.380
KRAD LEVEL
22
1.37
1.31
1.45
1.45
1.45
1.43
1.51
1.432
1.459
1.505
45
1.35
1.35
1.51
1.47
1.51
1.45
1.53
1.447
1.493
1.530
100
1.36
1.36
1.53
1.53
1.53
1.51
1.55
1.507
1.527
1.548
Limits
Min
Max
1
1.7
1
1.7
1
1.7
1
1.7
1
1.7
1
1.7
1
1.7
1
1.7
1
1.7
1
1.7
U/M
V
V
V
V
V
V
V
V
V
V
Table 10 “OFF” Biased Samples, VOLTAGE SHUTDOWN
T#11
Serial #
71
107
94
93
85
117
76
Min
Avg
Max
0
1.38
1.32
1.32
1.34
1.32
1.34
1.32
1.319
1.327
1.339
VSHDN
KRAD LEVEL
6
22
45
1.38
1.37
1.35
1.34
1.31
1.35
1.38
1.47
1.50
1.34
1.45
1.49
1.36
1.43
1.47
1.40
1.47
1.49
1.36
1.41
1.45
1.338
1.411
1.447
1.367
1.449
1.478
1.401
1.474
1.499
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100
1.36
1.36
1.47
1.47
1.44
1.47
1.44
1.444
1.457
1.465
Limits
Min
Max
1
1.7
1
1.7
1
1.7
1
1.7
1
1.7
1
1.7
1
1.7
1
1.7
1
1.7
1
1.7
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U/M
V
V
V
V
V
V
V
V
V
V
8
ELDRS Test Report
IRUH33PA13B20K
February 2006, Rev A
Parametric Shifts as a Function of ELDRS Radiation
Figure 1
71_CNTRL
VOUT
VOUT (Vin 3.3v @1.5A)
107_CNTRL
2.680
2.660
2.640
2.620
2.600
2.580
2.560
2.540
2.520
2.500
2.480
94
93
85
117
76
111
114
89
1
10
100
KRAD
67
96
Figure 2
VOUT
VOUT (Vin 3.3v @50mA)
71_CNTRL
2.680
2.660
2.640
2.620
2.600
2.580
2.560
2.540
2.520
2.500
2.480
107_CNTRL
94
93
85
117
76
111
114
89
1
10
KRAD
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96
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ELDRS Test Report
IRUH33PA13B20K
February 2006, Rev A
Figure 3
VOUT
VOUT (Vin 3.8v @3A)
71_CNTRL
2.680
2.660
2.640
2.620
2.600
2.580
2.560
2.540
2.520
2.500
2.480
107_CNTRL
94
93
85
117
76
111
114
89
1
10
100
KRAD
67
96
Figure 4
71_CNTRL
VOUT (Vin 2.8v @50mA)
107_CNTRL
2.700
94
93
VOUT
2.650
85
2.600
117
76
2.550
111
2.500
114
89
2.450
1
10
KRAD
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67
96
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ELDRS Test Report
IRUH33PA13B20K
February 2006, Rev A
Figure 5
VREF (3.3V @25mA)
71_CNTRL
107_CNTRL
1.350
94
VREF
1.330
93
85
1.310
117
1.290
76
111
1.270
114
1.250
89
1
10
100
KRAD
67
96
Figure 6
71_CNTRL
RIPPLE REJ RATIO (F=120Hz)
107_CNTRL
94
100.0
Ripple Rej (dB)
93
90.0
85
117
80.0
76
70.0
111
60.0
114
50.0
89
1
10
KRAD
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96
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ELDRS Test Report
IRUH33PA13B20K
February 2006, Rev A
CONCLUSION
The IRUH33PA13B20K has demonstrated hardness to ELDRS radiation exposure up to 44.6
KRAD(Si) at dose rate of 0.065 Rad (Si)/sec with no parametric failures when device is in the
“ON” or “OFF” bias condition and the results show it to meet all the post radiation test
requirements. There are parametric shifts for Output Voltage, Dropout Voltage, Ripple
Rejection, and Shutdown Threshold Voltage, which need to be considered in designs where
tight tolerances over the life of the product need to be maintained.
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ELDRS Test Report
IRUH33PA13B20K
February 2006, Rev A
Appendix A
Electrical Data
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ELDRS Test Report
IRUH33PA13B20K
February 2006, Rev A
Electrical Test Data (Pre-radiation)
TEST
Vout1
Vout2
Vout3
Vout4
Vout5
Line
Reg
Load
Reg
Vdrop
Current
Limit
Ripple
Rej.
Vshdn
Vout
@shdn
Ishdn*
Max
Limit
2.525
2.625
2.625
2.625
2.625
6.25
73.8
0.4
10
200
1.6
100
----
Min
Limit
Serial
#
71
107
94
93
85
117
76
111
114
89
67
96
2.475
2.375
2.375
2.375
2.375
-6.25
-73.8
0
3
65
1.0
-100
----
(V)
(V)
(V)
(V)
(V)
(mV)
(mV)
(V)
(A)
(dB)
(V)
(mV)
(uA)
2.510
2.494
2.505
2.499
2.500
2.510
2.499
2.497
2.509
2.506
2.503
2.506
2.505
2.492
2.501
2.497
2.497
2.506
2.497
2.495
2.505
2.504
2.501
2.503
2.507
2.493
2.503
2.500
2.501
2.509
2.501
2.497
2.510
2.507
2.501
2.505
2.504
2.492
2.502
2.497
2.498
2.505
2.497
2.494
2.505
2.505
2.501
2.503
1.268
1.258
1.271
1.267
1.267
1.273
1.267
1.266
1.272
1.272
1.269
1.265
-0.678
0.181
-1.718
-0.407
-0.407
0.090
-0.904
0.045
-0.542
0.090
-0.136
-0.949
4.370
4.541
3.237
2.402
4.260
2.834
4.157
3.010
4.206
3.547
2.428
3.199
0.201
0.193
0.195
0.192
0.210
0.203
0.195
0.195
0.199
0.192
0.192
0.197
9.152
8.907
8.658
8.749
8.477
8.885
8.477
8.840
8.840
8.795
9.112
8.862
97.18
98.18
98.06
99.15
98.06
98.10
99.74
98.58
97.60
99.83
100.40
97.64
1.378
1.319
1.319
1.339
1.319
1.339
1.319
1.339
1.360
1.360
1.319
1.340
-1.967
-1.059
-1.033
-1.133
-1.119
-0.975
-1.018
-1.248
-1.578
-1.535
-2.338
-1.332
0.151
0.147
0.145
0.145
0.144
0.151
0.149
0.146
0.150
0.145
0.151
0.146
* Data collected for information purposes only parameter not specified for post radiation.
Electrical Test Data (Post radiation – 6K RAD(Si))
TEST
Vout1
Vout2
Vout3
Vout4
Vout5
Line
Reg
Load
Reg
Vdrop
Current
Limit
Ripple
Rej.
Vshdn
Vout
@shdn
Ishdn*
Max
Limit
2.625
2.625
2.625
2.625
2.625
12.5
147.6
0.4
10
200
1.7
100
----
Min
Limit
Serial
#
71
107
94
93
85
117
76
111
114
89
67
96
2.375
2.375
2.375
2.375
2.375
-12.5
-147.6
0
3
65
1.0
-100
----
(V)
(V)
(V)
(V)
(V)
(mV)
(mV)
(V)
(A)
(dB)
(V)
(mV)
(uA)
2.510
2.495
2.516
2.517
2.514
2.529
2.515
2.510
2.520
2.520
2.515
2.524
2.505
2.493
2.513
2.514
2.512
2.523
2.512
2.505
2.517
2.516
2.512
2.522
2.507
2.496
2.516
2.516
2.515
2.526
2.517
2.510
2.520
2.520
2.514
2.524
2.504
2.494
2.514
2.514
2.513
2.524
2.513
2.506
2.519
2.517
2.512
2.522
1.268
1.263
1.274
1.277
1.276
1.281
1.276
1.273
1.278
1.277
1.275
1.279
-0.677
-0.225
-1.31
-0.993
-0.722
-0.406
0.1355
-0.180
0.6777
-0.180
0.3614
0.4969
4.37
4.297
4.468
4.023
2.932
3.008
4.805
3.21
5.719
3.026
3.396
2.368
0.201
0.189
0.204
0.204
0.223
0.219
0.208
0.212
0.212
0.197
0.208
0.204
9.152
9.198
8.790
8.845
8.481
9.072
9.117
9.072
9.072
9.117
9.026
8.845
97.18
98.14
99.79
99.23
100.50
99.19
98.63
100.40
99.23
100.50
101.20
99.79
1.378
1.336
1.378
1.338
1.359
1.401
1.359
1.359
1.380
1.380
1.338
1.380
-1.967
-1.034
-1.034
-1.277
-1.233
-0.557
-2.111
-2.212
-2.457
-0.859
-2.338
-1.332
0.1514
0.146
0.1427
0.1474
0.1413
0.1464
0.1435
0.1444
0.1462
0.1445
0.1512
0.1461
* Data collected for information purposes only parameter not specified for post radiation.
205 Crawford St, Leominster, Ma 01453
Tel: 976-534-5776
www.irf.com
14
ELDRS Test Report
IRUH33PA13B20K
February 2006, Rev A
Electrical Test Data (Post radiation – 22K RAD(Si))
TEST
Vout1
Vout2
Vout3
Vout4
Vout5
Line
Reg
Load
Reg
Vdrop
Current
Limit
Ripple
Rej.
Vshdn
Vout
@shdn
Ishdn*
Max
Limit
2.625
2.625
2.625
2.625
2.625
12.5
147.6
0.4
10
200
1.7
100
----
Min
Limit
Serial
#
71
107
94
93
85
117
76
111
114
89
67
96
2.375
2.375
2.375
2.375
2.375
-12.5
-147.6
0
3
40
1.0
-100
----
(V)
(V)
(V)
(V)
(V)
(mV)
(mV)
(V)
(A)
(dB)
(V)
(mV)
(uA)
2.505
2.495
2.569
2.563
2.561
2.570
2.556
2.545
2.550
2.554
2.549
2.566
2.503
2.492
2.566
2.560
2.557
2.567
2.552
2.541
2.548
2.551
2.544
2.562
2.507
2.495
2.569
2.563
2.559
2.569
2.556
2.547
2.551
2.556
2.549
2.566
2.504
2.491
2.565
2.558
2.557
2.566
2.551
2.540
2.547
2.552
2.545
2.562
1.268
1.262
1.300
1.296
1.295
1.300
1.291
1.289
1.291
1.294
1.289
1.301
0.4516
-0.541
-0.541
-0.271
0
0.7226
-0.180
0
0.6774
0.271
0.4968
0.6774
4.534
3.915
4.025
3.761
3.208
3.438
4.166
5.714
2.704
4.518
2.37
4.78
0.189
0.189
0.223
0.219
0.230
0.223
0.215
0.215
0.219
0.215
0.219
0.215
9.207
9.252
8.844
9.071
8.798
9.116
9.071
9.252
9.252
9.252
8.935
9.113
99.150
98.150
95.110
96.310
95.870
95.520
95.910
98.630
100.400
98.670
99.150
101.100
1.369
1.306
1.474
1.453
1.432
1.474
1.411
1.453
1.453
1.453
1.432
1.505
-1.565
-1.738
-2.227
-3.149
-3.351
-3.235
-3.423
-0.686
-1.162
-1.867
-1.507
-2.602
0.149
0.1488
0.1388
0.1399
0.1387
0.1433
0.1417
0.1367
0.1419
0.1386
0.1393
0.1421
* Data collected for information purposes only parameter not specified for post radiation.
Electrical Test Data (Post radiation – 44K RAD(Si))
TEST
Vout1
Vout2
Vout3
Vout4
Vout5
Line
Reg
Load
Reg
Vdrop
Current
Limit
Ripple
Rej.
Vshdn
Vout
@shdn
Ishdn*
Max
Limit
2.625
2.625
2.625
2.625
2.625
12.5
147.6
0.4
10
200
1.7
100
----
Min
Limit
Serial
#
71
107
94
93
85
117
76
111
114
89
67
96
2.375
2.375
2.375
2.375
2.375
-12.5
-147.6
0
3
40
1.0
-100
----
(V)
(V)
(V)
(V)
(V)
(mV)
(mV)
(V)
(A)
(dB)
(V)
(mV)
(uA)
2.508
2.493
2.608
2.610
2.604
2.612
2.600
2.572
2.579
2.588
2.580
2.588
2.503
2.491
2.606
2.608
2.601
2.609
2.597
2.571
2.578
2.585
2.578
2.586
2.510
2.494
2.608
2.609
2.605
2.611
2.600
2.573
2.579
2.588
2.580
2.589
2.503
2.491
2.606
2.606
2.601
2.609
2.597
2.571
2.577
2.584
2.578
2.587
1.267
1.260
1.317
1.323
1.319
1.323
1.317
1.305
1.307
1.311
1.307
1.311
-0.0903
-0.0903
1.265
-0.0452
2.169
0
0.6327
0.4972
1.085
-0.2712
0.0452
0.4972
7.459
3.813
2.861
2.134
3.323
1.983
3.439
1.604
1.54
2.311
1.783
2.485
0.189
0.186
0.223
0.234
0.249
0.238
0.238
0.234
0.227
0.227
0.234
0.231
9.134
9.089
9.089
9.459
8.505
9.050
9.095
9.050
8.868
9.050
8.868
9.095
99.240
99.240
63.290
64.860
61.900
64.820
64.860
89.450
91.820
89.450
89.640
89.490
1.352
1.352
1.499
1.488
1.468
1.488
1.447
1.509
1.468
1.509
1.447
1.530
-0.982
-1.73
-1.241
-1.942
-2.072
-3.31
-2.417
-2.417
-3.152
-3.282
-3.742
-4.074
0.1478
0.1458
0.1384
0.1406
0.1381
0.1411
0.1409
0.1376
0.1395
0.1361
0.1356
0.1369
* Data collected for information purposes only parameter not specified for post radiation.
205 Crawford St, Leominster, Ma 01453
Tel: 976-534-5776
www.irf.com
15
ELDRS Test Report
IRUH33PA13B20K
February 2006, Rev A
Electrical Test Data (Post radiation – 100K RAD(Si))
TEST
Vout1
Vout2
Vout3
Vout4
Vout5
Line
Reg
Load
Reg
Vdrop
Current
Limit
Ripple
Rej.
Vshdn
Vout
@shdn
Ishdn*
Max
Limit
2.625
2.625
2.625
2.625
2.625
12.5
147.6
0.4
10
200
1.7
100
----
Min
Limit
Serial
#
71
107
94
93
85
117
76
111
114
89
67
96
2.375
2.375
2.375
2.375
2.375
-12.5
-147.6
0
3
40
1.0
-100
----
(V)
(V)
(V)
(V)
(V)
(mV)
(mV)
(V)
(A)
(dB)
(V)
(mV)
(uA)
2.509
2.492
2.665
2.655
2.651
2.661
2.651
2.587
2.595
2.601
2.597
2.602
2.503
2.491
2.661
2.655
2.650
2.659
2.648
2.584
2.591
2.598
2.593
2.599
2.508
2.493
2.664
2.654
2.650
2.660
2.651
2.585
2.594
2.601
2.597
2.603
2.503
2.491
2.660
2.653
2.649
2.658
2.647
2.584
2.592
2.598
2.594
2.599
1.269
1.260
1.349
1.346
1.343
1.348
1.343
1.310
1.315
1.318
1.316
1.318
0
0
-0.677
1.401
0.4518
-0.858
1.446
1.129
0.2259
-0.677
-0.632
0.5421
5.659
4.497
0.7832
0.467
0.7231
2.436
1.91
2.896
3.316
3.027
3.856
4.724
0.197
0.189
0.254
0.254
0.232
0.265
0.254
0.243
0.243
0.239
0.250
0.247
8.855
9.127
9.101
8.829
8.511
8.874
8.874
8.829
8.874
8.874
8.511
8.829
98.150
99.830
58.020
59.670
59.720
59.720
59.720
61.940
61.900
60.740
60.780
61.94
1.357
1.357
1.465
1.465
1.444
1.465
1.444
1.527
1.527
1.527
1.507
1.548
-2.027
-0.719
-2.405
-0.836
-1.225
-2.045
-2.75
-1.542
-2.16
-2.074
-4.059
-2.376
0.1499
0.1475
0.1455
0.1408
0.1418
0.145
0.1435
0.1346
0.1359
0.1332
0.1339
0.1338
* Data collected for information purposes only parameter not specified for pre-radiation.
205 Crawford St, Leominster, Ma 01453
Tel: 976-534-5776
www.irf.com
16
ELDRS Test Report
IRUH33PA13B20K
February 2006, Rev A
Appendix B
Radiation Test Specification
205 Crawford St, Leominster, Ma 01453
Tel: 976-534-5776
www.irf.com
17
ELDRS Test Report
IRUH33PA13B20K
February 2006, Rev A
Specification #
T090104G
Revision: A
ECN #
Date:
IR Base Part No. IRRUH33PA13B20K
PRODUCT DISCRIPTION: ADJUSTABLE LOW DROPOUT VOLTAGE REGULATOR
Automatic Test
Tester: PXI TEST CONSOLE 04-134-TC
Table 1: Pre Radiation Tests, 25C tests only 1
Prog.
Ref.
A
Test
Output Voltage
Symbol
V out
A
Output Voltage
V out
A
Output Voltage
V out
A
Output Voltage
V out
A
Output Voltage
V ref
A
Line Regulation
Vrline
A
Load Regulation
Vrload
A
Dropout Voltage
Vdrop
Test Conditions
Vin = 3.30 Vdc
Iout = 1.5 A
Vin = 3.3 Vdc
Iout = 50 mA
Vin = 3.8 Vdc
Iout = 3.0 A
Vin = 2.8 Vdc
Iout = 50 mA
Vin = 3.3 Vdc
Iout = 25mA
2.9V < Vin < 3.8V
Iout = 50 mA
Vin = 3.3V
50mA < Io < 3.0A
Iout = 3A
A
Current Limit
I limit
A
Ripple Rejection
Rrej
A
Shutdown
Threshold
Vshutdown
A
Output voltage
At Shutdown
Vout shdn
A
Shutdown
Pin Current
Ishutdown
Rad Level:
Pre Rad
Notes
MIN
2.475
MAX
2.525
Units
Vdc
Pre Rad
2.375
2.625
Vdc
Pre Rad
2.375
2.625
Vdc
Pre Rad
2.375
2.625
Vdc
Pre Rad
1.225
1.305
Vdc
Pre Rad
-6.25
6.25
mVdc
Pre Rad
-73.8
73.8
mVdc
Pre Rad
0
0.40
Vdc
Vin = 3.3 Vdc
Pre Rad
3.0
10.0
A
F= 120 Hz
Iout = 50 mA
Vin = 5.0 Vdc, Vshutdown ramp
from 0.8V to 4.8V, output
monitored for 100mV drop below
Vin = 3.3 Vdc
Iout = 50 mA
Vshdn = +5 Vdc
Vin = 3.3 Vdc
Iout = 50 mA
Vshdn = +5 Vdc
Pre Rad
65
200
dB
Pre Rad
1.0
1.6
V
Pre Rad
-0.1
+0.1
V
---
---
uA
Pre Rad
2
Notes:
1. Regulator shall be biased at a nominal Vout of 2.5V with Radjust set at 976 ohms and tested to the limits specified on the data sheet.
2. These tests are performed for information purposes only.
This is proprietary information of International
Rectifier Hi-Rel Products and it is understood
that this will not be divulged to a third party
or used in any way prejudicial to the interest
of International Rectifier Hi-Rel Products.
205 Crawford St, Leominster, Ma 01453
Tel: 976-534-5776
www.irf.com
18
ELDRS Test Report
IRUH33PA13B20K
February 2006, Rev A
Automatic Test
Tester: PXI TEST CONSOLE 04-134-TC
Table 2: Post Radiation Tests, 25C tests only 1
Prog.
Ref.
B
Test
Output Voltage
Symbol
V out
B
Output Voltage
V out
B
Output Voltage
V out
B
Output Voltage
V out
B
Output Voltage
V ref
B
Line Regulation
Vrline
B
Load Regulation
Vrload
B
Dropout Voltage
Vdrop
Test Conditions
Vin = 3.30 Vdc
Iout = 1.5 A
Vin = 3.3 Vdc
Iout = 50 mA
Vin = 3.8 Vdc
Iout = 3.0 A
Vin = 2.8 Vdc
Iout = 50 mA
Vin = 3.3 Vdc
Iout = 25mA
2.9V < Vin < 3.8V
Iout = 50 mA
Vin = 3.3V
50mA < Io < 3.0A
Iout = 3A
B
Current Limit
I limit
B
Ripple Rejection
Rrej
B
Shutdown
Threshold
Output voltage
At Shutdown
Vshutdown
Shutdown
Pin Current
Ishutdown
B
B
Vout shdn
Rad Level:
Post Rad
Notes
MIN
2.375
MAX
2.625
Units
Vdc
Post Rad
2.375
2.625
Vdc
Post Rad
2.375
2.625
Vdc
Post Rad
2.375
2.625
Vdc
Post Rad
1.202
1.328
Vdc
Post Rad
-12.5
12.5
mVdc
Post Rad
-147.6
147.6
mVdc
Post Rad
0
0.40
Vdc
Vin = 3.3 Vdc
Post Rad
3.0
10.0
A
F= 120 Hz
Iout = 50 mA
Vin = 5.0 Vdc, Vshutdown ramp
from 0.8V to 4.8V, output
Vin = 3.3 Vdc
Iout = 50 mA
Vshdn = +5 Vdc
Vin = 3.3 Vdc
Iout = 50 mA
Vshdn = +5 Vdc
Post Rad
40
200
dB
Post Rad
1.0
1.7
V
Post Rad
-0.1
+0.1
V
---
---
uA
Post Rad
2
Notes:
1. Regulator shall be biased at a nominal Vout of 2.5V with Radjust set at 976 ohms and tested to the limits specified on the data sheet.
2. These tests are performed for information purposes only.
This is proprietary information of International
Rectifier Hi-Rel Products and it is understood
that this will not be divulged to a third party
or used in any way prejudicial to the interest
of International Rectifier Hi-Rel Products.
205 Crawford St, Leominster, Ma 01453
Tel: 976-534-5776
www.irf.com
19
ELDRS Test Report
IRUH33PA13B20K
February 2006, Rev A
Table 3: Total Dose Radiation Requirements
Bias Conditions
Dose Step Profile
Dose Rate Range
Board Number
Program Card Number
Chamber
Test Temperature
High Dose Rate 3
Vin = 6.8V, Vout = 2.5V, Io=10mA
30K, 20K, 50K, 50K, 50K
50 to 300 Rad(Si)/sec
TF-02-011
05-043-TA
Gamma Cave
25C +/-5C
Unbiased, in circuit with power supply off
30K, 20K, 50K, 50K, 50K
50 to 300 Rad(Si)/sec
TF-02-011
05-043-TA
Gamma Cave
25C +/-5C
Bias Conditions
Dose Step Profile
Dose Rate Range
Board Number
Program Card Number
Chamber
Test Temperature
Low Dose Rate 3
Vin = 6.8V, Vout = 2.5V, Io=10mA
30K, 20K, 50K, 50K, 50K
0.01 to 0.10 Rad(Si)/sec
TF-02-008
05-043-TA
Hot Cell
25C +/-5C
Unbiased, in circuit with power supply off
30K, 20K, 50K, 50K, 50K
0.01 to 0.10 Rad(Si)/sec
TF-02-008
05-043-TA
Hot Cell
25C +/-5C
3. Performed at during initial qualification of the device and retested only when specified by Quality Assurance due to a change per
MIL-PRF-38534.
5
4
3
2
1
Radiation Circuit
976 ohm 1%
Vin
1uF 50V
205 Crawford St, Leominster, Ma 01453
1uF 50V
Tel: 976-534-5776
250 ohm 5%
www.irf.com
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