ETC1 AS91L1002BU10L100C The as91l1006bu is a one to 6-port jtag gateway Datasheet

AS91L1006BU
July 2004
6-Port JTAG Gateway
Description
The AS91L1006BU is a one to 6-port
JTAG gateway. It partitions a single JTAG chain
into six separate chains. These separate chains
can be optionally configured to operate as a single
chain.
The AS91L1006BU device is used to
provide enhanced capabilities to the standard
IEEE1149.1. It enables the IEEE1149.1 interface
to be used in a true Multi-Drop environment without
any additional signals. This Multi-Drop capability
enables the standard IEEE1149.1 interface to be
used not just for stand alone PCB (Printed Circuit
Board) testing, but also for complete system
testing including all PCBs within a system back
plane environment.
The AS91L1006BU provides the capability
of partitioning the PCB, into multiple smaller
IEEE1149.1 scan chains totally under software
control. Partitioning the IEEE1149.1 chains on the
PCB has several benefits which include easier
fault diagnostics capabilities as a fault on one of
the IEEE1149.1 Local Scan Ports (LSPs) does
not render the PCB untestable, faster flash
programming on the PCBs, and removal of
IEEE1149.1 signal loading issues.
All of the protocols required for
addressing the AS91L1006BU device via the
Multi-Drop capability and the protocols for
configuring which of the six IEEE1149.1 LSPs on
the AS91L1006BU are to be used, is handled via
3rd party ATPG tools from vendors like AssetIntertech and JTAG Technologies. In a Multi-Drop
environment it is also possible to perform
interconnect tests between multiple PCBs within a
system thus extending the interconnect tests to
the back plane itself.
Key Features
Device Multi-Drop addressable via the IEEE
1149.1 protocol
Support for 6 local scan chains addressable via
the IEEE 1149.1 interface
Support for Pass-Through™
Support for the IEEE 1149.1 USERCODE
instruction
Support for Status instruction enabling nonintrusive monitoring of the system card
Local Scan Port (LSP) enable signal provides the
ability to use non IEEE 1149.1 compliant devices
that require JTAG enable signal
Provides the ability to initiate Self-Test on a
remote PCB via a standard IEEE 1149.1
command
Support for JTAG Technologies AutoWR™
feature
Pinout and feature set compatible (complete
second source) with the Firecron JTS06BU
device
Available in a 100-pin LQFP or a 100-pin
FPBGA lead free package
Device Block Diagram
P a s s T h r o u g h E n a b le
P r im a r y 1 1 4 9 . 1
J T A G In te rfa c e
LSP1
S ta tu s D a ta
LSP2
U s e rc o d e
D a ta
D e v ic e
a d d re s s
1 1 4 9 . 1 T A P C o n t r o lle r
and
B o u n d a r y R e g is t e r S e le c t io n L o g ic
D e v ic e
S e le c t io n
L o g ic
P a s s T h ro u g h
L o g ic & L o c a l
S c a n P o rt
C o n n e c t io n /
C o n f ig
lo g ic
L o c a l S c a n P o rt
P a r k /U n -p a rk
S y n c L o g ic
LSP3
LSP4
LSP5
LSP6
Figure 1 - AS91L1006BU Device Block Diagram
Alliance Semiconductor
2575 Augustine Drive • Santa Clara, CA 95054 • T: 408-855-4900 • F: 408-855-4999 • www.alsc.com
July 2004
AS91L1006BU
AS91L1006BU Gateway Functional Description
The basic structure of the AS91L1006BU
device is shown in Figure-1. The core of the device
is the 16-state IEEE1149.1 TAP controller state
machine. All accesses to the internal registers of
the AS91L1006BU device are controlled via this
state machine during normal operation as per the
IEEE1149.1 standard. The address selection logic
enables the AS91L1006BU to operate in a MultiDrop environment within system backplane.
The address selection logic compares the
scanned address to the slot address value
presented on the I/O of the AS91L1006BU device.
The LSP park/unpark logic provides control
through instructions scanned in under the
IEEE1149.1 protocol, to select, which LSP will be
placed into the active, scan chain. The passthrough and LSP connection logic selects the
signal paths for the LSP IEEE1149.1 signals. The
Selected Single
Device
Figure-2 shows the device selection state
machine. The AS91L1006BU will perform an
address compare on the slot address presented
at its I/O and the value scanned in via the
IEEE1149.1. If the value matches then the
AS91L1006BU becomes selected and is ready for
normal access via IEEE1149.1 commands. If the
address does not match then the device will
proceed to the unselected mode, where it will
remain until the AS91L1006BU is issued a
GOTOWAIT instruction or a reset occurs via
TRST or the LSP_RESET pin.
Device
Unselected
Parked-RTI
Parked-TLR
Wait for
Selection
Select Group
of Devices
device also supports a Pass-Through mode which
enables the primary IEEE1149.1 signals to be
routed to any of the LSPs. This signal routing is
selectable via I/O pins on the AS91L1006BU
device.
Select All
Devices
Figure 2 - AS91L1006BU
Selection Logic State machine
ParkedPauseDR
UnParked
ParkedPauseIR
Figure 3 - The LSP
Park/Unpark State Machine
The LSP Park/Unpark State Machine controls the insertion of the LSPs into the current active scan
chain. The ability to park the LSP in certain IEEE1149.1 states, enable the AS91L1006BU to perform
several functions including backplane interconnect testing and IC BIST.
www.alsc.com
Alliance Semiconductor
2003, 2004 © Copyright Alliance Semiconductor Corporation. All Rights reserved.
2
July 2004
AS91L1006BU
AS91L1006BU Detailed Mode of Operation
Addressing the AS91L1006BU device
After a Test-Logic-Reset or power-up, the
AS91L1006BU device will be in its Wait-forSelection state with its TDO pin tri-stated, thus
avoiding contention in a Multi-Drop environment.
The AS91L1006BU device will respond to a
device-select sequence for a particular address
that is auto generated by third party test tools with
respect to the address that is pre-loaded on its
S(5..0). Once this sequence has been completed,
the AS91L1006BU device will respond to normal
IEEE 1149.1 instructions. Note that addresses 6063 have been reserved and the AS91L1006BU
device will not respond if the user selects these
addresses.
The AS91L1006BU device should be in
the Wait-for-Selection mode, which can be
entered into by issuing an asynchronous reset
(through the deassertion of TRST) or by issuing a
synchronous reset (through the assertion of TMS
for five cycles of TCK). After the device has been
selected, it can be issued a GOTOWAIT
instruction.
The internal IEEE1149.1 state machine of
the AS91L1006BU device is taken to the Shift-IR
phase and the required Device-ID is shifted into
the Instruction register. As the IEEE1149.1 state
machine passes through the Update-IR phase,
the address is matched to the value on the S(5-0)
pins on the AS91L1006BU device; if the values
match, then the AS91L1006BU device is selected
and is ready to receive any normal IEEE1149.1
command.
S(5-0) value
IR (7 – 0) value
< 3A hex or 60
decimal
XXVVVVVV
Table 1 - AS91L1006BU
www.alsc.com
Device Selection Table
Alliance Semiconductor
2003, 2004 © Copyright Alliance Semiconductor Corporation. All Rights reserved.
3
July 2004
AS91L1006BU
Table 2 - AS91L1006BU Multi Cast Group
Selection Table
Selection
Mode
Single
Address
Mode
Binary
Function
Address
XX000000 to Single AS91L1006BU
XX111010
selected the TDO of
the device will be
active
Broad
XX111011
Cast Mode
Multi-Cast XX111100
Group 0
Multi-Cast XX111101
Group 1
Multi-Cast XX111110
Group 2
Multi-Cast XX111111
Group 3
www.alsc.com
All accessible
AS91L1006BU
devices are selected
for operation. TDO on
all devices will be in
HighZ
Access all
AS91L1006BU
devices that have
been placed in GRP0
by their MCGR
contents
Access all
AS91L1006BU
devices that have
been placed in GRP1
by their MCGR
contents
Access all
AS91L1006BU
devices that have
been placed in GRP2
by their MCGR
contents
Access all
AS91L1006BU
devices that have
been placed in GRP3
by their MCGR
contents
Table 3 - AS91L1006BU Device
Register Description
Register
Name
Instruction
Register
BoundaryScan
Register
Bypass
Register
Device
Identification
Register
User Code
Register
Status
Register
Description
AS91L1006BU device
addressing and instructiondecode
IEEE Std. 1149.1 required
register
IEEE Std. 1149.1 required
register
IEEE Std. 1149.1 required
register
IEEE Std. 1149.1 optional
register
IEEE Std. 1149.1 optional
register
AS91L1006BU device non
intrusive 8-bit register pre load
able from the I/O pins
Self Test
Register
AS91L1006BU device specific
single bit register for initiating
self testing on a PCB
Mode
Register
AS91L1006BU device local-port
configuration and control bits
Auto Write
Register
AS91L1006BU device Auto
Write feature enable register
LSP Async
Reset
Register
AS91L1006BU device Async
reset register for the LSPs
Alliance Semiconductor
2003, 2004 © Copyright Alliance Semiconductor Corporation. All Rights reserved.
4
July 2004
AS91L1006BU
Instructions
BYPASS
Hex OpCode
FF
EXTEST
00
00000000
Boundary-Scan Register
SAMPLE/PRELOAD
81
10000001
Boundary-Scan Register
IDCODE
AA
10101010
Device Identification Register
UNPARK
E7
11100111
Device Identification Register
PARKTLR
C5
11000101
Device Identification Register
PARKRTI
84
10000100
Device Identification Register
PARKPAUSE
C6
11000110
Device Identification Register
GOTOWAIT*
C3
11000011
Device Identification Register
MODESELECT
8E
10001110
Mode Register
MCGRSELECT
03
00000011
Multi-Cast Group Register.
SOFTRESET
88
10001000
Device Identification Register
USERCODE
97
10010111
User Programmable 32 Bit Identification Register
AUTOWR
98
10011000
Auto Write Feature Enable Register
STEST_PCB
99
10011001
Single bit low pulse, used to initiate function on PCB
(SELF_TEST pin)
STATUS_BYTE
9A
10011010
LSP_ASYNC_RESET
9B
10011011
User programmable status byte (USER_STATUS_DATA
pins)
Toggles LSP TRST while maintaining the AS91L1006BU
in the selected state.
TBD
TBD
Other Undefined
Binary Op- Data Register
Code
11111111 Bypass Register
Device Identification Register
Table 4 - AS91L1006BU Device Instruction Register OpCodes
Note: All instructions act on a single selected AS91L1006BU device only.
* This instruction causes the AS91L1006BU to become unselected and revert to the Wait-forSelection state.
www.alsc.com
Alliance Semiconductor
2003, 2004 © Copyright Alliance Semiconductor Corporation. All Rights reserved.
5
July 2004
AS91L1006BU
AS91L1006BU device Register descriptions
Bypass Register
Multi-Cast Group Register
It is a mandatory single bit register that can
be connected between PRIM_TDI and PRIM_TDO
of the AS91L1006BU device.
This 2-bit data register enables the host
system to place the AS91L1006BU into one of
four distinct addressable groups.
MCGR Register Bits
[1..0]
00
Binary Selection Address
MCGR GROUP
XX111100
GRP0
01
XX111101
GRP1
10
XX111110
GRP2
11
XX111111
GRP3
Table 5 - Multicast Group Register Mapping
Note: The MCGR is reset to 00 upon receiving TRST or the entering of the Test-Logic-Reset
state.
IDCODE Register
It is an optional 32-bit register that can be
connected between PRIM_TDI and PRIM_TDO of
the AS91L1006BU device. The contents of the
IDCODE register will be loaded with the following
data when the AS91L1006BU enters Test-LogicReset or passes through Capture-IR:
"00000000000000001000001101101111"
Bits 0 to 11 indicate ALSC Jedec ID value of:
“001101101111”
Bits 12 to 27 indicate the part number of the
device: “0000000000010000”
Bits 28 to 31 indicate the revision of the device:
“0000”
USERCODE Register
The USERCODE is an 8-bit register that can
be addressed via standard IEEE1149.1
commands, which are automatically generated by
third party test tools. AS91L1006BU returns all
zeroes if read from this registerUSERUSER and
does have the ability to write into this register.
* The AS91L1006BU is a complete second source and pin for pin replacement of the
Firecron JTS06BU device.
www.alsc.com
Alliance Semiconductor
2003, 2004 © Copyright Alliance Semiconductor Corporation. All Rights reserved.
6
July 2004
AS91L1006BU
SELF_TEST Register
The AS91L1006BU device supports a
single output pin that can be controlled via the
IEEE1149.1 interface. When the instruction is
loaded into the AS91L1006BU instruction register,
a single bit data register is connected which is
always reset to logic zero when the TAP state
machine enters Capture-DR. This will cause the
SELF_TEST pin to pulse low for one cycle of TCK,
during the Update-DR phase. This low going pulse
can be used to initiate self-tests on PCB’s in a rack
via the JTAG interface.
internal registers to be reset. In order to enable
async reset tests on LSPs, the test tool should
instruct the device to toggle the LSP reset pins
while maintaining the set up information in the
AS91L1006BU. When the instruction is loaded
into the AS91L1006BU instruction register, a
single bit data register is connected as the data
register which is always reset to logic zero when
the TAP state machine enters Capture-DR. This
will cause the LSP TRST pins to pulse low for one
TCK cycle, during the Update-DR phase.
AUTOWR Register
LSP_ASYNC_RST Register
The AS91L1006BU device supports async
reset tests on the devices connected to the LSPs.
The standard method of performing these tests by
utilizing the primary TRST pin cannot be used as it
will cause the AS91L1006BU to deselect and its
This is a 6-bit register that controls the passthrough of the JTAG Technologies AutoWR™
signal to any LSP. The register is reset to all
zeros when entering the Test-Logic-Reset state.
Note: The MCGR is reset to 00 upon receiving TRST or the entering of the
Test-Logic-Reset state
AutoWr
Register
(Bit 2 –
Bit 0)
000
LSP 3
AutoWr
Signal
LSP 2
AutoWr
Signal
LSP 1
AutoWr
Signal
LSP 6
AutoWr
Signal
LSP 5
AutoWr
Signal
LSP 4
AutoWr
Signal
High Z
AutoWr
Register
(Bit 5 – Bit
3)
000
High Z
High Z
High Z
High Z
High Z
001
High Z
High Z
Active
001
High Z
High Z
Active
011
High Z
Active
Active
011
High Z
Active
Active
100
Active
High Z
High Z
100
Active
High Z
High Z
101
Active
High Z
Active
101
Active
High Z
Active
110
Active
Active
High Z
110
Active
Active
High Z
111
Active
Active
Active
111
Active
Active
Active
Table 6 - AUTOWR Register Mapping
www.alsc.com
Alliance Semiconductor
2003, 2004 © Copyright Alliance Semiconductor Corporation. All Rights reserved.
7
July 2004
AS91L1006BU
MODE_SELECT Register
The Mode_Select register allows the LSP
of the AS91L1006BU to be connected in various
different configurations. A LSP is selected for
connection within the scan chain by the contents of
the Mode_Select register.
Mode_Select
Register (Bit 15
-> Bit 8)
XXX0X000
LSP Configuration (If Port
Unparked)
TDI ->Register->LSP_Data
If the LSP is not parked in a stable state,
i.e.: Pause-DR, Pause-IR, Run-Test-Idle or TestLogic-Reset, it will be connected into the active
scan chain. If all LSPs are parked in a stable
state, then the AS91L1006BU will perform a
bypass of the 6-LSP chain section. In this way if
both sections are in the bypass mode then the
AS91L1006BU is performing a loopback of TDI>Register->TDO to the host device.
Mode_Select
Register (Bit 7 ->
Bit 0)
XXX0X000
LSP Configuration (If Port
Unparked)
LSP_Data ->TDO
XXX0X001
TDI ->Register->LSP1->PAD->
LSP_Data
XXX0X001
LSP_Data ->LSP4->PAD>TDO
XXX0X010
TDI ->Register->LSP2->PAD->
LSP_Data
XXX0X010
LSP_Data ->LSP5->PAD>TDO
XXX0X011
TDI ->Register->LSP1->PAD>LSP2->PAD-> LSP_Data
XXX0X011
LSP_Data ->LSP4->PAD>LSP5->PAD->TDO
XXX0X100
TDI ->Register->LSP3->PAD->
LSP_Data
XXX0X100
LSP_Data ->LSP6->PAD>TDO
XXX0X101
TDI ->Register->LSP1->PAD>LSP3->PAD-> LSP_Data
XXX0X101
LSP_Data ->LSP4->PAD>LSP6->PAD->TDO
XXX0X110
TDI ->Register->LSP2->PAD>LSP3->PAD-> LSP_Data
XXX0X110
LSP_Data ->LSP5->PAD>LSP6->PAD->TDO
XXX0X111
TDI ->Register->LSP1->PAD>LSP2->PAD->LSP3->PAD->
LSP_Data
XXX0X111
LSP_Data ->LSP4->PAD>LSP5->PAD->LSP6->PAD>TDO
Table 7 - Mode Select Register Mapping
X = Don’t care
Register = AS91L1006BU device instruction register or any of the AS91L1006BU device test
data registers.
PAD = Insertion of a 1-bit register for data synchronization.
Upon entering Test-Logic-Reset, the register bits will be loaded with “0000000”.
www.alsc.com
Alliance Semiconductor
2003, 2004 © Copyright Alliance Semiconductor Corporation. All Rights reserved.
8
July 2004
AS91L1006BU
Pass Through Support within the AS91L1006BU Device
The AS91L1006BU device supports a
Pass-Through mode where the primary or master
IEEE1149.1 JTAG signals can be routed to any
one of the LSPs. When this mode is activated, the
“Debug Enable” signal for that LSP will go active,
which can be used to place a processor such as
the MPC8260 into BDM (Background Debug
mode), if required. If no processors are present in
the LSP, the Pass-Through mode can be used to
assist in the generation of the test vectors or
memory tests for the devices that are linked into
the selected LSP. The pass-through feature has
the effect of simplifying the test vector generation
for the LSP, as it also has the effect of removing
the AS91L1006BU device from the test vector
generation process.
PASS_THRU_Enable PASS_THRU_SEL(2) PASS_THRU_SEL(1) PASS_THRU_SEL(0) Active LSP
High
X
X
X
Low
Low
Low
Low
Normal
Operation
LSP1
Low
Low
Low
High
LSP2
Low
Low
High
Low
LSP3
Low
Low
High
High
LSP4
Low
High
Low
Low
LSP5
Low
High
Low
High
LSP6
Table 8 - Pass through mode in AS91L1006BU
Note: When PASS_THRU_ENABLE is deasserted (logic “1”), then the LSPs are under
control of the AS91L1006BU device logic. When PASS_THRU_ENABLE is asserted (logic
“0”) and if an invalid combination is presented on the PASS_THRU_SEL lines, then all LSPs
are tri-stated.
www.alsc.com
Alliance Semiconductor
2003, 2004 © Copyright Alliance Semiconductor Corporation. All Rights reserved.
9
July 2004
AS91L1006BU
Signal Description
PIN NAME
LSP1_TCK
LSP1_TMS
LSP1_TDO
LSP1_TDI
LSP1_TRST
PIN
TYPE
OUT
OUT
OUT
IN
OUT
PIN
NUMBER
LQFP
31
32
35
33
29
PIN
DESCRIPTION
NUMBER
FPBGA
H4
IEEE1149.1 Test Clock on LSP 1
when PASS_THRU_ENABLE is
HIGH.
J4
H5
K4
K3
Stable state
after port/reset
Buffered version
of signal present
on primary TCK
Pin is in Pass-Through mode when
PASS_THRU_ENABLE = 0 and
PASS_THRU_SEL[2:0] = 000.
This pin is tri-stated for all other
combinations.
IEEE1149.1 Test Mode Select on
Logic '1'
LSP 1 when PASS_THRU_ENABLE
is HIGH.
Pin is in Pass-Through mode when
PASS_THRU_ENABLE = 0 and
PASS_THRU_SEL[2:0] = 000.
This pin is tri-stated for all other
combinations.
IEEE1149.1 Test Data Out on LSP 1 Logic '1'
when PASS_THRU_ENABLE is
HIGH.
Pin is in Pass-Through mode when
PASS_THRU_ENABLE = 0 and
PASS_THRU_SEL[2:0] = 000.
This pin is tri-stated for all other
combinations.
IEEE1149.1 Test Data In on LSP 1
when PASS_THRU_ENABLE is
HIGH.
Pin is in Pass-Through mode when
PASS_THRU_ENABLE = 0 and
PASS_THRU_SEL[2:0] = 000.
IEEE1149.1 Test Reset on LSP 1
when PASS_THRU_ENABLE is
HIGH.
Buffered version
of signal present
on primary TRST
Pin is in Pass-Through mode when
PASS_THRU_ENABLE = 0 and
PASS_THRU_SEL[2:0] = 000.
This pin is tri-stated for all other
combinations.
www.alsc.com
Alliance Semiconductor
2003, 2004 © Copyright Alliance Semiconductor Corporation. All Rights reserved.
10
July 2004
PIN NAME
LSP1_AutoWR
LSP1_DE
LSP2_TCK
LSP2_TMS
LSP2_TDO
AS91L1006BU
PIN
TYPE
OUT
OUT
OUT
OUT
OUT
PIN
NUMBER
LQFP
30
28
41
42
45
PIN
Stable state
DESCRIPTION
NUMBER
after port/reset
FPBGA
J3
Flash, Memory Auto-Write on LSP 1 Logic '1'
when PASS_THRU_ENABLE is
HIGH.
J2
J6
H6
J7
Pin is in Pass-Through mode when
PASS_THRU_ENABLE = 0 and
PASS_THRU_SEL[2:0] = 000;
PRIM_AutoWR is routed to output.
This pin is tri-stated for all other
combinations.
Pass-Through Debug Enable Output Logic '1'
on Local Scan Port 1.
Active low output when
PASS_THRU_ENABLE = 0 and
PASS_THRU_SEL[2:0] = 000.
This pin is high for all other
combinations.
IEEE1149.1 Test Clock on LSP 2
when PASS_THRU_ENABLE is
HIGH.
Buffered version
of signal present
on primary TCK
Pin is in Pass-Through mode when
PASS_THRU_ENABLE = 0 and
PASS_THRU_SEL[2:0] = 001.
This pin is tri-stated for all other
combinations.
IEEE1149.1 Test Mode Select on
Logic '1'
LSP 2 when PASS_THRU_ENABLE
is HIGH.
Pin is in Pass-Through mode when
PASS_THRU_ENABLE = 0 and
PASS_THRU_SEL[2:0] = 001.
This pin is tri-stated for all other
combinations.
IEEE1149.1 Test Data Out on LSP 2 Logic '1'
when PASS_THRU_ENABLE is
HIGH.
Pin is in Pass-Through mode when
PASS_THRU_ENABLE = 0 and
PASS_THRU_SEL[2:0] = 001.
This pin is tri-stated for all other
combinations.
www.alsc.com
Alliance Semiconductor
2003, 2004 © Copyright Alliance Semiconductor Corporation. All Rights reserved.
11
July 2004
PIN NAME
LSP2_TDI
LSP2_TRST
LSP2_AutoWR
LSP2_DE
LSP3_TCK
AS91L1006BU
PIN
TYPE
IN
OUT
OUT
OUT
OUT
PIN
NUMBER
LQFP
44
37
40
36
49
PIN
DESCRIPTION
NUMBER
FPBGA
K7
IEEE1149.1 Test Data In on LSP 2
when PASS_THRU_ENABLE is
HIGH.
K5
K6
J5
K9
Pin is in Pass-Through mode when
PASS_THRU_ENABLE = 0 and
PASS_THRU_SEL[2:0] = 001.
IEEE1149.1 Test Reset on LSP 2
when PASS_THRU_ENABLE is
HIGH.
Stable state
after port/reset
Buffered version
of signal present
on primary TRST
Pin is in Pass-Through mode when
PASS_THRU_ENABLE = 0 and
PASS_THRU_SEL[2:0] = 001.
This pin is tri-stated for all other
combinations.
Flash, Memory Auto-Write on LSP 2 Logic '1'
when PASS_THRU_ENABLE is
HIGH.
Pin is in Pass-Through mode when
PASS_THRU_ENABLE = 0 and
PASS_THRU_SEL[2:0] = 001;
PRIM_AutoWR is routed to output.
This pin is tri-stated for all other
combinations.
PASS_THRU Debug Enable Output Logic '1'
on LSP 2.
Active low output when
PASS_THRU_ENABLE = 0 and
PASS_THRU_SEL[2:0] = 001.
This pin is high for all other
combinations.
IEEE1149.1 Test Clock on LSP 3
when PASS_THRU_ENABLE is
HIGH.
Buffered version
of signal present
on primary TCK
Pin is in Pass-Through mode when
PASS_THRU_ENABLE = 0 and
PASS_THRU_SEL[2:0] = 010.
This pin is tri-stated for all other
combinations.
www.alsc.com
Alliance Semiconductor
2003, 2004 © Copyright Alliance Semiconductor Corporation. All Rights reserved.
12
July 2004
PIN NAME
LSP3_TMS
LSP3_TDO
LSP3_TDI
LSP3_TRST
LSP3_LSP_
AutoWR
AS91L1006BU
PIN
TYPE
OUT
OUT
IN
OUT
OUT
PIN
NUMBER
LQFP
50
53
52
47
48
PIN
Stable state
DESCRIPTION
NUMBER
after port/reset
FPBGA
K10
IEEE1149.1 Test Mode Select on
Logic '1'
LSP 3 when PASS_THRU_ENABLE
is HIGH.
H10
J10
J8
K8
Pin is in Pass-Through mode when
PASS_THRU_ENABLE = 0 and
PASS_THRU_SEL[2:0] = 010.
This pin is tri-stated for all other
combinations.
IEEE1149.1 Test Data Out on LSP 3 Logic '1'
when PASS_THRU_ENABLE is
HIGH.
Pin is in Pass-Through mode when
PASS_THRU_ENABLE = 0 and
PASS_THRU_SEL[2:0] = 010.
This pin is tri-stated for all other
combinations.
IEEE1149.1 Test Data In on LSP 3
when PASS_THRU_ENABLE is
HIGH.
Pin is in Pass-Through mode when
PASS_THRU_ENABLE = 0 and
PASS_THRU_SEL[2:0] = 010.
IEEE1149.1 Test Reset on LSP 3
when PASS_THRU_ENABLE is
HIGH.
Buffered version
of signal present
on primary TRST
Pin is in Pass-Through mode when
PASS_THRU_ENABLE = 0 and
PASS_THRU_SEL[2:0] = 010.
This pin is tri-stated for all other
combinations.
Flash, Memory Auto-Write on LSP 3 Logic '1'
when PASS_THRU_ENABLE is
HIGH.
Pin is in Pass-Through mode when
PASS_THRU_ENABLE = 0 and
PASS_THRU_SEL[2:0] = 010;
PRIM_AutoWR is routed to output.
This pin is tri-stated for all other
combinations.
www.alsc.com
Alliance Semiconductor
2003, 2004 © Copyright Alliance Semiconductor Corporation. All Rights reserved.
13
July 2004
PIN NAME
LSP3_DE
LSP4_TCK
LSP4_TMS
LSP4_TDO
LSP4_TDI
AS91L1006BU
PIN
TYPE
OUT
OUT
OUT
OUT
IN
PIN
NUMBER
LQFP
46
79
78
76
77
PIN
Stable state
DESCRIPTION
NUMBER
after port/reset
FPBGA
H7
PASS_THRU Debug Enable Output Logic '1'
on LSP 3.
A8
A9
B10
B9
Active low output when
PASS_THRU_ENABLE = 0 and
PASS_THRU_SEL[2:0] = 010.
This pin is high for all other
combinations.
IEEE1149.1 Test Clock on LSP 4
when PASS_THRU_ENABLE is
HIGH.
Buffered version
of signal present
on primary TCK
Pin is in Pass-Through mode when
PASS_THRU_ENABLE = 0 and
PASS_THRU_SEL[2:0] = 011.
This pin is tri-stated for all other
combinations.
IEEE1149.1 Test Mode Select on
Logic '1'
LSP 4 when PASS_THRU_ENABLE
is HIGH.
Pin is in Pass-Through mode when
PASS_THRU_ENABLE = 0 and
PASS_THRU_SEL[2:0] = 011.
This pin is tri-stated for all other
combinations.
IEEE1149.1 Test Data Out on LSP 4 Logic '1'
when PASS_THRU_ENABLE is
HIGH.
Pin is in Pass-Through mode when
PASS_THRU_ENABLE = 0 and
PASS_THRU_SEL[2:0] = 011.
This pin is tri-stated for all other
combinations.
IEEE1149.1 Test Data In on LSP 4
when PASS_THRU_ENABLE is
HIGH.
Pin is in Pass-Through mode when
PASS_THRU_ENABLE = 0 and
PASS_THRU_SEL[2:0] = 011.
www.alsc.com
Alliance Semiconductor
2003, 2004 © Copyright Alliance Semiconductor Corporation. All Rights reserved.
14
July 2004
PIN NAME
LSP4_TRST
LSP4_AutoWR
LSP4_DE
LSP5_TCK
LSP5_TMS
AS91L1006BU
PIN
TYPE
OUT
OUT
OUT
OUT
OUT
PIN
NUMBER
LQFP
81
80
83
70
69
PIN
DESCRIPTION
NUMBER
FPBGA
A7
IEEE1149.1 Test Reset on LSP 4
when PASS_THRU_ENABLE is
HIGH.
B8
B7
D10
D9
Stable state
after port/reset
Buffered version
of signal present
on primary TRST
Pin is in Pass-Through mode when
PASS_THRU_ENABLE = 0 and
PASS_THRU_SEL[2:0] = 011.
This pin is tri-stated for all other
combinations.
Flash, Memory Auto-Write on LSP 4 Logic '1'
when PASS_THRU_ENABLE is
HIGH.
Pin is in Pass-Through mode when
PASS_THRU_ENABLE = 0 and
PASS_THRU_SEL[2:0] = 011;
PRIM_AutoWR is routed to output.
This pin is tri-stated for all other
combinations.
PASS_THRU Debug Enable Output Logic '1'
on LSP 4.
Active low output when
PASS_THRU_ENABLE = 0 and
PASS_THRU_SEL[2:0] = 011.
This pin is high for all other
combinations.
IEEE1149.1 Test Clock on LSP 5
when PASS_THRU_ENABLE is
HIGH.
Buffered version
of signal present
on primary TCK
Pin is in Pass-Through mode when
PASS_THRU_ENABLE = 0 and
PASS_THRU_SEL[2:0] = 100.
This pin is tri-stated for all other
combinations.
IEEE1149.1 Test Mode Select on
Logic '1'
LSP 5 when PASS_THRU_ENABLE
is HIGH.
Pin is in Pass-Through mode when
PASS_THRU_ENABLE = 0 and
PASS_THRU_SEL[2:0] = 100.
This pin is tri-stated for all other
combinations.
www.alsc.com
Alliance Semiconductor
2003, 2004 © Copyright Alliance Semiconductor Corporation. All Rights reserved.
15
July 2004
PIN NAME
LSP5_TDO
LSP5_TDI
LSP5_TRST
LSP5_AutoWR
LSP5_DE
AS91L1006BU
PIN
TYPE
OUT
IN
OUT
OUT
PIN
NUMBER
LQFP
67
68
72
71
75
PIN
Stable state
DESCRIPTION
NUMBER
after port/reset
FPBGA
E8
IEEE1149.1 Test Data Out on LSP 5 Logic '1'
when PASS_THRU_ENABLE is
HIGH.
E7
C9
D8
C10
Pin is in Pass-Through mode when
PASS_THRU_ENABLE = 0 and
PASS_THRU_SEL[2:0] = 100.
This pin is tri-stated for all other
combinations.
IEEE1149.1 Test Data In on LSP 5
when PASS_THRU_ENABLE is
HIGH.
Pin is in Pass-Through mode when
PASS_THRU_ENABLE = 0 and
PASS_THRU_SEL[2:0] = 100.
IEEE1149.1 Test Reset on LSP 5
when PASS_THRU_ENABLE is
HIGH.
Buffered version
of signal present
on primary TRST
Pin is in Pass-Through mode when
PASS_THRU_ENABLE = 0 and
PASS_THRU_SEL[2:0] = 100.
This pin is tri-stated for all other
combinations.
Flash, Memory Auto-Write on LSP 5 Logic '1'
when PASS_THRU_ENABLE is
HIGH.
Pin is in Pass-Through mode when
PASS_THRU_ENABLE = 0 and
PASS_THRU_SEL[2:0] = 100;
PRIM_AutoWR is routed to output.
This pin is tri-stated for all other
combinations.
PASS_THRU Debug Enable Output Logic '1'
on LSP 5.
Active low output when
PASS_THRU_ENABLE = 0 and
PASS_THRU_SEL[2:0] = 100.
This pin is high for all other
combinations.
www.alsc.com
Alliance Semiconductor
2003, 2004 © Copyright Alliance Semiconductor Corporation. All Rights reserved.
16
July 2004
PIN NAME
LSP6_TCK
LSP6_TMS
LSP6_TDO
LSP6_TDI
LSP6_TRST
AS91L1006BU
PIN
TYPE
OUT
OUT
OUT
IN
OUT
PIN
NUMBER
LQFP
61
60
57
58
64
PIN
DESCRIPTION
NUMBER
FPBGA
F10
IEEE1149.1 Test Clock on LSP 6
when PASS_THRU_ENABLE is
HIGH.
F9
G10
G8
E9
Stable state
after port/reset
Buffered version
of signal present
on primary TCK
Pin is in Pass-Through mode when
PASS_THRU_ENABLE = 0 and
PASS_THRU_SEL[2:0] = 101.
This pin is tri-stated for all other
combinations.
IEEE1149.1 Test Mode Select on
Logic '1'
LSP 6 when PASS_THRU_ENABLE
is HIGH.
Pin is in Pass-Through mode when
PASS_THRU_ENABLE = 0 and
PASS_THRU_SEL[2:0] = 101.
This pin is tri-stated for all other
combinations.
IEEE1149.1 Test Data Out on LSP 6 Logic '1'
when PASS_THRU_ENABLE is
HIGH.
Pin is in Pass-Through mode when
PASS_THRU_ENABLE = 0 and
PASS_THRU_SEL[2:0] = 101.
This pin is tri-stated for all other
combinations.
IEEE1149.1 Test Data In on LSP 6
when PASS_THRU_ENABLE is
HIGH.
Pin is in Pass-Through mode when
PASS_THRU_ENABLE = 0 and
PASS_THRU_SEL[2:0] = 101.
IEEE1149.1 Test Reset on LSP 5
when PASS_THRU_ENABLE is
HIGH.
Buffered version
of signal present
on primary TRST
Pin is in Pass-Through mode when
PASS_THRU_ENABLE = 0 and
PASS_THRU_SEL[2:0] = 101.
This pin is tri-stated for all other
combinations.
www.alsc.com
Alliance Semiconductor
2003, 2004 © Copyright Alliance Semiconductor Corporation. All Rights reserved.
17
July 2004
PIN NAME
LSP6_AutoWR
LSP6_DE
AS91L1006BU
PIN
TYPE
OUT
OUT
PIN
NUMBER
LQFP
63
65
PIN
Stable state
DESCRIPTION
NUMBER
after port/reset
FPBGA
F7
Flash, Memory Auto-Write on LSP 6 Logic '1'
when PASS_THRU_ENABLE is
HIGH.
E10
Pin is in Pass-Through mode when
PASS_THRU_ENABLE = 0 and
PASS_THRU_SEL[2:0] = 101;
PRIM_AutoWR is routed to output.
This pin is tri-stated for all other
combinations.
PASS_THRU Debug Enable Output Logic '1'
on LSP 6.
Active low output when
PASS_THRU_ENABLE = 0 and
PASS_THRU_SEL[2:0] = 101.
This pin is high for all other
combinations.
IEEE1149.1 Primary Test Clock
Input.
IEEE1149.1 Primary Test Mode
Select Input.
IEEE1149.1 Primary Test Data
Output. This pin is tri-stated when
AS91L1006BUis not selected.
PRIM_TCK
IN
87
A6
PRIM_TMS
IN
21
G2
PRIM_TDO
OUT
20
G1
PRIM_TDI
IN
19
G3
IEEE1149.1 Primary Test Data Input
PRIM_TRST
IN
22
H2
IEEE1149.1 Primary Test Reset
Input.
PRIM_AutoWR
IN
S[5:0]
IN
*TOE
IN
HighZ
This active low asynchronous reset
input signal places AS91L1006U in
Wait-for-Selection state.
16
F1
Primary Auto-Write Input controlled
by test equipment to shorten Flash
memory programming.
8,7,6,5,100, D2,D1,D3,C AS91L1006BU Slot Address[5:0]
99
2,B2,A2 Inputs.
88
B6
Used to set address at which
AS91L1006BU will respond; typically
set by hardwired connection on the
backplane.
Test Output Enable Input.
Tri-states all LSPs, when asserted
low.
www.alsc.com
Alliance Semiconductor
2003, 2004 © Copyright Alliance Semiconductor Corporation. All Rights reserved.
18
July 2004
AS91L1006BU
PIN NAME
PIN
TYPE
LSP_RESET_n
IN
AS91L1006BU_
SELECTED
LSP_ENABLE
USER_STATUS
_BYTE[7:0]
SELF_TEST
PASS_THRU_
ENABLE
PASS_THRU_
SEL12:0]
OUT
OUT
IN
OUT
IN
IN
PIN
NUMBER
LQFP
14
25
24
PIN
DESCRIPTION
NUMBER
FPBGA
F4
LSP Reset Input.
Stable state
after port/reset
K1
Active low resets AS91L1006BU to
“Wait-for-Selection” state and pulses
all LSP TRST output pins to low.
This resets all devices with TRST
function; typically this signal would be
connected to a power-on-reset
function.
AS91L1006BU_Selected Output.
Logic '1'
J1
Active low when AS91L1006BU is
selected; typically used to control off
board buffering.
LSP Enabled Output.
Logic '1'
Active low when AS91L1006BU is
selected; typically used to set
IEEE1149.1 compliance enable pins
on devices.
84, 85, 92, C7,C6,C5,C AS91L1006BU Status_Byte Inputs.
93, 94, 96, 4,B4,A4,B3,
97, 98
A3(MSB- Used to provide status information of
(MSB-LSB)
LSB)
the PCB under test back to the test
master via the IEEE1149.1 bus. Eight
signals levels can be monitored and
then reported via the IEEE1149.1 bus
in a non intrusive manner.
27
K2
Provides a low going output pulse
Logic '1'
under command from the
IEEE1149.1 bus, which can be used
to start self-test functions on a PCB.
9
E4
PASS_THRU Enable Input.
Active high disables Pass-Through
mode.
Active low enables Pass-Through
mode.
13,12,10
E2,E1,E3 PASS_THRU Select Inputs.
(MSB-LSB) (MSB-LSB)
Used to select active routing of PassThrough ports enabled by active low
on PASS_THRU_ENABLE pin.
000 = LSP1
001 = LSP2
010 = LSP3
011 = LSP4
100 = LSP5
101 = LSP6
www.alsc.com
Alliance Semiconductor
2003, 2004 © Copyright Alliance Semiconductor Corporation. All Rights reserved.
19
July 2004
AS91L1006BU
PIN NAME
PIN
TYPE
GND
POWER
VCC
POWER
ASIC_TEST_
EN
IN
PIN
NUMBER
LQFP
38, 86, 11,
26, 43, 59,
74, 95, 2,
17, 54, 55
90
PIN
DESCRIPTION
NUMBER
FPBGA
D6, G5, C3, Ground pins.
D7, E5, F6,
G4,H8, H9,
J9,B1, A5,
F2
39, 91, 3, D5, G6, C8, VCC pins.
18, 34, 51, D4, E6, F5,
66,
G7,
82,23,56 H3,G9,H1
89
B5
Factory Test_Enable Input.
This pin should be left unconnected.
IEEE1149.1 ASIC Test Clock Input.
ASIC_TCK
IN
62
F8
ASIC_TMS
IN
15
F3
ASIC_TDO
OUT
73
A10
IEEE1149.1 ASIC Test Mode Select.
Input
IEEE1149.1 ASIC Test Clock Output.
ASIC_TDI
IN
4
A1
IEEE1149.1 ASIC Test Clock Input.
1
C1
No Connects
Stable state
after port/reset
Table 9 - AS91L0006BU Signal Description
Absolute Maximum Ratings
Parameter
Maximum Range
Supply Voltage (Vcc)
-0.3V to 5.5V
DC Input Voltage (Vi)
-0.5V to Vcc +0.5V
Max sink current when Vi = -0.5V
-20mA
Max source current when Vi = Vcc + 0.5V
+20mA
Max Junction Temperature with power applied Tj
+125 degrees C
Max Storage temperature
-55 to +150 degree C
Table 10 - Absolute Maximum Ratings
Note: Stress above the stated maximum values may cause irreparable damage to the device.
Correct operation of the device at these values is not guaranteed.
Recommended Operating Conditions
www.alsc.com
Alliance Semiconductor
2003, 2004 © Copyright Alliance Semiconductor Corporation. All Rights reserved.
20
July 2004
AS91L1006BU
Parameter
Operating Range
Supply Voltage (Vcc)
3.0V to 3.6V
Input Voltage (Vi)
0V to Vcc
Output Voltage (Vo)
0V to Vcc
Operating Temperature (Ta)
Commercial
0 C to 70 C
Industrial (Ta)
-40 deg C to +85 deg C, 3.00V to 3.6V
Table 11 - Recommended Operating Conditions
www.alsc.com
Alliance Semiconductor
2003, 2004 © Copyright Alliance Semiconductor Corporation. All Rights reserved.
21
July 2004
AS91L1006BU
AC Electrical Characteristics
Tch
Tcl
Tcw
TCK
Tsu
Th
TMS
TDI
Toe
Tco
TDO
High Z
High Z
Tpd
Lsp Signal
Figure 4 - AS91L1006BU AC Timing Diagram
SYMBOL Parameter
MIN
MAX
UNITS
TCK clock pulse width
100
-
ns
Tch
TCK pulse width high
50
-
ns
Tcl
TCK pulse width low
50
-
ns
Tsu
TCK Setup time
30
-
ns
Th
TCK Hold time
40
-
ns
Toe
Neg Edge TCK to valid data enable
20
-
ns
Tco
Neg Edge TCK to valid data
15
-
ns
Tpd
Pass through Mode Primary/Lsp Delay
-
10
ns
Tcw
Table 12 - AS91L1006BU AC Timing Information
www.alsc.com
Alliance Semiconductor
2003, 2004 © Copyright Alliance Semiconductor Corporation. All Rights reserved.
22
July 2004
AS91L1006BU
DC Electrical Characteristics
Symbol
VIH
VIL
Symbol
VOH
VOL
Parameter
Minimum High Input
Voltage
Maximum Low Input
Voltage
Parameter
Max
5.25
Min
2.0
0.8V
-0.3V
Value
Condition
Minimum High Output
Voltage
2.4V
Ioh=24mA or 8mA as defined
by pin
Minimum LowOutput
Voltage
0.4V
Iol=24mA or 8mA as defined
by pin
Ioz
Tristate output leakage -10 or 10 mA
Icc
Maximum quiecennt
supply current
Maximum dynamic
supply current
Iccd
Condition
2mA
80mA
TCK freq equal to 10 MHz
Table 13 - AS91L1006BU DC Electrical Characteristics
Packaging Information
The AS91L1006BU is available in a 100-pin LQFP or a 100-pin FPBGA lead free package.
SYM BO L
1
LE AD S
A
1
A
2
M IN
M IN
D
M A X
N O M
0 .0 5
1 .3 5
M AX
1 .4 5
B A S IC
1 8 .0 0
B A S IC
1 4 .0 0
0 .1 5
0 .6 0
L1
R EF
1
M IN
b
1 .0 0
0 .1 7
M A X
0 .2 7
B A S IC
0 .5 0
ccc
M AX
0 .0 8
ddd
N O M
e
0 .0 8
M S -0 2 6
JED EC R EF #
3
0 .1 5
1 .4 0
L
D
D1
Square
1 .6 0
M AX.
A
D
Square
100 LEA D
TO L.
NOTES :
1. ALL LIN EAR DIM ENSIO NS ARE IN M ILLIM E TE RS .
2. PLAS TIC BO DY D IM EN SIO NS DO N O T INC LU DE FLAS H O R PR O TUSIO N .
M AX ALLO W ABLE 0.25 PER SIDE.
3. LEAD C O UN T O N D RA W ING N O T RE PRESENTATIVE O F A CTUAL PACKAG E.
12 NOM
A
A1
0-7
TYP
A
A2
-C0.09/0.20 TYP
e
0.25
L1
L
b
CCC
LEAD COPLANARITY
al al al
M A-B S
D S
12 NOM
Figure 5 - LQFP-100
www.alsc.com
Alliance Semiconductor
2003, 2004 © Copyright Alliance Semiconductor Corporation. All Rights reserved.
21
July 2004
AS91L1006BU
D
A
2
REV.
A
B
B
Revisions
DESCRIPTION
Initial document release.
Updated ball coplanarity limits from
0.20mm to 0.15mm.
ECN
91253
DATE
12-04-01
E
C
0.15 C
D1
K
I
H
G
F
E1
E
D
C
B
A
1
2
3
4
5
b
6
7
8
SYMBOL
A
A1
A2
b
D
D1
E
E1
e
PACKAGE NUMBER
JEDEC REF #
DIMENSIONS
MIN.
-0.30
0.25
0.50
NOM.
---0.60
11.00 BSC
9.00 BSC
11.00 BSC
9.00 BSC
1.00
FBGA0100-11F
MO-192 VAR. AAC-1
9 10
0.25 M
C A B
0.25 M
C
Figure 6 - FPBGA-100
www.alsc.com
Alliance Semiconductor
2003, 2004 © Copyright Alliance Semiconductor Corporation. All Rights reserved.
22
MAX.
1.70
-1.10
0.70
July 2004
AS91L1006BU
Device Selector Guide and Ordering Information
AS91L
XXXX
UU - CC PP - TEMP - L
Aliance Semiconductor
system solution
Blank = leaded
F = lead free
G = green
Device family
1001
1002
1003
1006
C = Commercial (0 to 70 degrees C)
I = Industrial (-40 to 85 degrees C)
Package
L100 = 100 pin LQFP
F100 = 100 pin FPBGA
Product version
S = standard
U = 16-bit user code
BU = 8-bit status/user code
E = enhanced
Clock speed
10 = 10 MHz TCK
40 = 40 MHz TCK
Figure 7 - Part Numbering Guide
www.alsc.com
Alliance Semiconductor
2003, 2004 © Copyright Alliance Semiconductor Corporation. All Rights reserved.
23
July 2004
AS91L1006BU
Part Number
Description
AS91L1006BU – 10L100-C
JTAG 6-Port Gateway, 100-pin LQFP
package, commercial
AS91L1006BU – 10L100-CF
JTAG 6-Port Gateway, 100-pin LQFP
package, commercial, lead free
AS91L1006BU – 10L100-I
JTAG 6-Port Gateway, 100-pin LQFP
package, industrial
AS91L1006BU – 10L100-IF
JTAG 6-Port Gateway, 100-pin LQFP
package, industrial, lead free
AS91L1006BU – 10F100-C
JTAG 6-Port Gateway 100-pin FPBGA
package, commercial
AS91L1006BU – 10F100-CG
JTAG 6-Port Gateway 100-pin FPBGA,
commercial, green package
AS91L1006BU – 10F100-I
JTAG 6-Port Gateway 100-pin FPBGA
package, industrial
AS91L1006BU – 10F100-IG
JTAG 6-Port Gateway 100-pin FPBGA,
industrial, green package
AS91L1006BU – 40L100-CF
JTAG 6-Port Gateway, 100-pin LQFP
package, commercial, lead free, 40 MHz
TCK
AS91L1006BU – 40L100-IF
JTAG 6-Port Gateway, 100-pin LQFP
package, industrial, lead free, 40 MHz
TCK
AS91L1006BU – 40F100-CG
JTAG 6-Port Gateway 100-pin FPBGA,
commercial, green package, 40 MHz TCK
AS91L1006BU – 40F100-IG
JTAG 6-Port Gateway 100-pin FPBGA,
industrial, green package, 40 MHz TCK
Table 14 - Valid Part Number Combinations
www.alsc.com
Alliance Semiconductor
2003, 2004 © Copyright Alliance Semiconductor Corporation. All Rights reserved.
24
July 2004
Device
Master
AS91L1006BU
Package Options
Description
FPBGA-100
(1mm pitch)
LQFP-100
AS91L1001
JTAG Test Controller
x
x
AS91L1002
JTAG Test Sequencer
x
x
AS91L1003U
3-Port Gateway
x
x
AS91L1006BU
6-Port Gateway
x
x
Table 15 - JTAG Controller Product Family
www.alsc.com
Alliance Semiconductor
2003, 2004 © Copyright Alliance Semiconductor Corporation. All Rights reserved.
25
July 2004
www.alsc.com
AS91L1006BU
Alliance Semiconductor
2003, 2004 © Copyright Alliance Semiconductor Corporation. All Rights reserved.
26