HIGH-SPEED 32/16K x 16 SYNCHRONOUS DUAL-PORT STATIC RAM Features ◆ ◆ ◆ ◆ ◆ True Dual-Ported memory cells which allow simultaneous access of the same memory location High-speed clock to data access – Commercial: 9/12/15ns (max.) – Industrial: 12ns (max.) Low-power operation – IDT709279/69S Active: 950mW (typ.) Standby: 5mW (typ.) – IDT709279/69L Active: 950mW (typ.) Standby: 1mW (typ.) Flow-Through or Pipelined output mode on either port via the FT/PIPE pin Dual chip enables allow for depth expansion without additional logic ◆ ◆ ◆ ◆ ◆ ◆ ◆ IDT709279/69S/L Counter enable and reset features Full synchronous operation on both ports – 4ns setup to clock and 1ns hold on all control, data, and address inputs – Data input, address, and control registers – Fast 9ns clock to data out in the Pipelined output mode – Self-timed write allows fast cycle time – 15ns cycle time, 67MHz operation in Pipelined output mode Separate upper-byte and lower-byte controls for multiplexed bus and bus matching compatibility TTL- compatible, single 5V (±10%) power supply Industrial temperature range (–40°C to +85°C) is available for selected speeds Available in a 100-pin Thin Quad Flatpack (TQFP) package Green parts available. See ordering information Functional Block Diagram R/WR UBR R/WL UBL CE0L CE1L 1 0 0/1 CE0R CE1R 1 0 0/1 LBR OER LBL OEL FT/PIPEL 0/1 1b 0b b a 1a 0a I/O8LI/O15L 0a 1a a b 0b 1b 0/1 FT/PIPER I/O8R-I/O15R , , I/O Control I/O Control I/O0L-I/O7L I/O0R-I/O7R A14R(1) A14L(1) A0L CLKL ADSL CNTENL CNTRSTL Counter/ Address Reg. MEMORY ARRAY Counter/ Address Reg. A0R CLKR ADSR CNTENR CNTRSTR 3243 drw 01 NOTE: 1. A14X is a NC for IDT709269. JUNE 2015 1 ©2015 Integrated Device Technology, Inc. DSC-3243/15 IDT709279/69S/L High-Speed 32/16K x 16 Synchronous Dual-Port Static RAM Description Preliminary Industrial and Commercial Temperature Ranges The IDT709279/69 is a high-speed 32/16K x 16 bit synchronous Dual-Port RAM. The memory array utilizes Dual-Port memory cells to allow simultaneous access of any address from both ports. Registers on control, data, and address inputs provide minimal setup and hold times. The timing latitude provided by this approach allows systems to be designed with very short cycle times. With an input data register, the IDT709279/69 has been optimized for applications having unidirectional or bidirectional data flow in bursts. An automatic power down feature, controlled by CE0 and CE1, permits the on-chip circuitry of each port to enter a very low standby power mode. Fabricated using CMOS high-performance technology, these devices typically operate on only 950mW of power. A8L A7L A6L A5L A4L A3L A2L A1L A0L CNTENL CLKL ADSL GND ADSR CLKR CNTENR A0R A1R A2R A3R A4R A5R A6R A7R A8R Pin Configurations(2,3,4) Index A9L A10L A11L A12L A13L 3 73 4 72 5 71 6 70 7 69 8 68 9 67 10 IDT709279/69PF PN100(5) 11 12 13 100-Pin TQFP Top View(6) 14 66 65 64 63 62 15 61 16 60 17 59 18 58 19 57 20 56 21 55 22 54 23 53 24 52 51 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 A9R A10R A11R A12R A13R A14R(1) NC NC NC LBR UBR CE0R CE1R CNTRSTR GND R/WR OER FT/PIPER GND I/O15R I/O14R I/O13R I/O12R I/O11R I/O10R I/O9L I/O8L VCC I/O7L I/O6L I/O5L I/O4L I/O3L I/O2L GND I/OIL I/O0L GND I/O0R I/O1R I/O2R I/O3R I/O4R I/O5R I/O6R VCC I/O7R I/O8R I/O9R NC A14L(1) NC NC NC LBL UBL CE0L CE1L CNTRSTL VCC R/WL OEL FT/PIPEL GND I/O15L I/O14L I/O13L I/O12L I/O11L I/O10L 100 99 98 97 96 95 94 93 92 91 90 89 88 87 86 85 84 83 82 81 80 79 78 77 76 1 75 2 74 3243 drw 02 NOTES: 1. A14X is a NC for IDT709269. 2. All VCC pins must be connected to power supply. 3. All GND pins must be connected to ground supply. 4. Package body is approximately 14mm x 14mm x 1.4mm 5. This package code is used to reference the package diagram. 6. This text does not indicate orientation of the actual part-marking. 2 6.42 IDT709279/69S/L High-Speed 32/16K x 16 Synchronous Dual-Port Static RAM Preliminary Industrial and Commercial Temperature Ranges Pin Names Left Port Right Port Names CE0L, CE1L CE0R, CE1R Chip Enables (3) R/WL R/WR Read/Write Enable OEL OER Output Enable A0L - A14L(1) A0R - A14R(1) Address I/O0L - I/O15L I/O0R - I/O15R Data Input/Output CLKL CLKR Clock UBL UBR Upper Byte Select(2) LBL LBR Lower Byte Select(2) ADSL ADSR Address Strobe CNTENL CNTENR Counter Enable CNTRSTL CNTRSTR Counter Reset FT/PIPEL FT/PIPER Flow-Through/Pipeline VSS Power GND Ground NOTES: 1. A14x is a NC for IDT709269. 2. LB and UB are single buffered regardless of state of FT/PIPE. 3. CEo and CE1 are single buffered when FT/PIPE = VIL, CEo and CE1 are double buffered when FT/PIPE = VIH, i.e. the signals take two cycles to deselect. 3243 tbl 01 Truth Table I—Read/Write and Enable Control(1,2,3) OE CLK CE0 CE1 UB LB R/W Upper Byte I/O8-15 Lower Byte I/O0-7 X ↑ H X X X X High-Z High-Z Deselected—Power Down X ↑ X L X X X High-Z High-Z Deselected—Power Down X ↑ L H H H X High-Z High-Z Both Bytes Deselected X ↑ L H L H L DIN High-Z Write to Upper Byte Only X ↑ L H H L L High-Z DIN Write to Lower Byte Only X ↑ L H L L L DIN DIN Write to Both Bytes L ↑ L H L H H DOUT High-Z Read Upper Byte Only L ↑ L H H L H High-Z DOUT Read Lower Byte Only L ↑ L H L L H DOUT DOUT Read Both Bytes H X L H L L X High-Z High-Z Outputs Disabled Mode 3243 tbl 02 NOTES: 1. "H" = VIH, "L" = VIL, "X" = Don't Care. 2. ADS, CNTEN, CNTRST = X. 3. OE is an asynchronous input signal. 6.42 3 IDT709279/69S/L High-Speed 32/16K x 16 Synchronous Dual-Port Static RAM Preliminary Industrial and Commercial Temperature Ranges Truth Table II—Address Counter Control(1,2) External Address Previous Internal Address Internal Address Used CLK An X An ↑ ADS CNTEN CNTRST I/O(3) X H DI/O (n) L(4) (5) MODE External Address Used X An An + 1 ↑ H L H DI/O(n+1) Counter Enabled—Internal Address generation X An + 1 An + 1 ↑ H H H DI/O(n+1) External Address Blocked—Counter disabled (An + 1 reused) X X A0 ↑ X X L(4) DI/O(0) Counter Reset to Address 0 3243 tbl 03 NOTES: 1. "H" = VIH, "L" = VIL, "X" = Don't Care. 2. CE0, LB, UB, and OE = VIL; CE1 and R/W = VIH. 3. Outputs configured in Flow-Through Output mode: if outputs are in Pipelined mode the data out will be delayed by one cycle. 4. ADS is independent of all other signals including CE0, CE1, UB and LB. 5. The address counter advances if CNTEN = VIL on the rising edge of CLK, regardless of all other signals including CE0, CE1, UB and LB. Recommended DC Operating Recommended Operating Temperature and Supply Voltage(1) Conditions Grade Commercial Industrial Symbol Ambient Temperature GND VCC 0OC to +70OC 0V 5.0V + 10% -40OC to +85OC 0V 5.0V + 10% NOTES: 1. This is the parameter TA. This is the "instant on" case temperature. 3243 tbl 04 Parameter VCC Supply Voltage GND Ground VIH Input High Voltage VIL Min. Typ. Max. Unit 4.5 5.0 5.5 V 0 0 0 V 2.2 ____ (2) Input Low Voltage -0.5 ____ (1) 6.0 0.8 Capacitance(1) Absolute Maximum Ratings(1) Commercial & Industrial Unit Terminal Voltage with Respect to GND -0.5 to +7.0 V TBIAS TemperatureUnder Bias -55 to +125 o C TSTG Storage Temperature -65 to +150 o C TJN Junction Temperature +150 o C IOUT DC Output Current VTERM (2) Rating (TA = +25°C, f = 1.0MHz) Symbol CIN COUT(2) 50 V 3243 tbl 05 NOTES: 1. VTERM must not exceed VCC + 10%. 2. VIL > -1.5V for pulse width less than 10ns. Symbol V Parameter Input Capacitance Output Capacitance Conditions(2) Max. Unit VIN = 0V 9 pF VOUT = 0V 10 pF 3243 tbl 07 NOTES: 1. These parameters are determined by device characterization, but are not production tested. 2. COUT also references CI/O. mA 3243 tbl 06 NOTES: 1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. 2. VTERM must not exceed VCC + 10% for more than 25% of the cycle time or 10ns maximum, and is limited to < 20mA for the period of VTERM > VCC + 10%. 3. Ambient Temperature Under Bias. No AC Conditions. Chip Deselect. 4 6.42 IDT709279/69S/L High-Speed 32/16K x 16 Synchronous Dual-Port Static RAM Preliminary Industrial and Commercial Temperature Ranges DC Electrical Characteristics Over the Operating Temperature Supply Voltage Range (VCC = 5.0V ± 10%) 709279/69S/L Symbol Parameter Test Conditions Min. Max. Unit |ILI| Input Leakage Current(1) VCC = 5.5V, VIN = 0V to VCC ___ 10 µA |ILO| Output Leakage Current CE0 = VIH or CE1 = VIL, VOUT = 0V to VCC ___ 10 µA VOL Output Low Voltage IOL = +4mA ___ 0.4 V VOH Output High Voltage IOH = -4mA 2.4 ___ V 3243 tbl 08 NOTE: 1. At VCC < 2.0V input leakages are undefined. DC Electrical Characteristics Over the Operating Temperature and Supply Voltage Range(6) (VCC = 5V ± 10%) 709279/69X9 Com'l Only Symbol ICC ISB1 ISB2 ISB3 ISB4 Parameter Dynamic Operating Current (Both Ports Active) Standby Current (Both Ports - TTL Level Inputs) Standby Current (One Port - TTL Level Inputs) Full Standby Current (Both Ports CMOS Level Inputs) Full Standby Current (One Port CMOS Level Inputs) Test Condition Version 709279/69X12 Com'l & Ind 709279/69X15 Com'l Only Typ.(4) Max. Typ.(4) Max. Typ.(4) Max. Unit mA COM'L S L 210 210 390 350 200 200 345 305 190 190 325 285 IND S L ____ ____ 380 340 ____ ____ 200 200 ____ ____ ____ ____ COM'L S L 50 50 135 115 50 50 110 90 50 50 110 90 IND S L ____ ____ 125 105 ____ ____ 50 50 ____ ____ ____ ____ CE"A" = V IL and CE"B" = V IH(3) Active Port Outputs Disabled, f=fMAX(1) COM'L S L 140 140 270 240 130 130 230 200 120 120 220 190 IND S L ____ ____ 245 215 ____ ____ 130 130 ____ ____ ____ ____ Both Ports CER and CEL > V CC - 0.2V V IN > V CC - 0.2V or V IN < 0.2V, f = 0(2) COM'L S L 1.0 0.2 15 5 1.0 0.2 15 5 1.0 0.2 15 5 IND S L ____ ____ 15 5 ____ ____ 1.0 0.2 ____ ____ ____ ____ CE"A" < 0.2V and CE"B" > V CC - 0.2V (5) V IN > V CC - 0.2V or V IN < 0.2V, Active Port Outputs Disabled, f = fMAX(1) COM'L S L 130 130 245 225 120 120 205 185 110 110 195 175 IND S L ____ ____ 220 200 ____ ____ 120 120 ____ ____ ____ ____ CEL and CER= V IL Outputs Disabled f = fMAX(1) CEL = CER = V IH f = fMAX(1) mA mA mA mA 3243 tbl 09 NOTES: 1. At f = fMAX, address and control lines (except Output Enable) are cycling at the maximum frequency clock cycle of 1/tCYC, using "AC TEST CONDITIONS" at input levels of GND to 3V. 2. f = 0 means no address, clock, or control lines change. Applies only to input at CMOS level standby. 3. Port "A" may be either left or right port. Port "B" is the opposite from port "A". 4. VCC = 5V, TA = 25°C for Typ, and are not production tested. ICC DC(f=0) = 150mA (Typ). 5. CEX = VIL means CE0X = VIL and CE1X = VIH CEX = VIH means CE0X = VIH or CE1X = VIL CEX < 0.2V means CE0X < 0.2V and CE1X > VCC - 0.2V CEX > VCC - 0.2V means CE0X > VCC - 0.2V or CE1X < 0.2V "X" represents "L" for left port or "R" for right port. 6. 'X' in part numbers indicate power rating (S or L). 6.42 5 IDT709279/69S/L High-Speed 32/16K x 16 Synchronous Dual-Port Static RAM Preliminary Industrial and Commercial Temperature Ranges AC Test Conditions GND to 3.0V Input Pulse Levels 3ns Max. Input Rise/Fall Times Input Timing Reference Levels 1.5V Output Reference Levels 1.5V Figures 1,2 and 3 Output Load 3243 tbl 10 5V 5V 893Ω 893Ω DATAOUT DATAOUT 30pF 347Ω 5pF* 347Ω 3243 drw 04 3243 drw 05 Figure 1. AC Output Test load. 8 7 Figure 2. Output Test Load (For tCKLZ, tCKHZ, tOLZ, and tOHZ). *Including scope and jig. 10pF is the I/O capacitance of this device, and 30pF is the AC Test Load Capacitance 6 tCD1, tCD2 (Typical, ns) 5 4 3 2 1 0 -1 20 40 60 80 100 120 140 160 180 200 Capacitance (pF) Figure 3. Typical Output Derating (Lumped Capacitive Load). 6 6.42 3243 drw 06 , IDT709279/69S/L High-Speed 32/16K x 16 Synchronous Dual-Port Static RAM Preliminary Industrial and Commercial Temperature Ranges AC Electrical Characteristics Over the Operating Temperature Range (Read and Write Cycle Timing)(3,4) (VCC = 5V ± 10%, TA = 0°C to +70°C) 709279/69X9 Com'l Only 709279/69X12 Com'l & Ind 709279/69X15 Com'l Only Min. Max. Min. Max. Min. Max. Unit 25 ____ 30 ____ 35 ____ ns 15 ____ 20 ____ 25 ____ ns (2) 12 ____ 12 ____ 12 ____ ns (2) ns Symbol Parameter tCYC1 Clock Cycle Time (Flow-Through) tCYC2 Clock Cycle Time (Pipelined)(2) tCH1 tCL1 Clock High Time (Flow-Through) Clock Low Time (Flow-Through) (2) 12 ____ 12 ____ 12 ____ tCH2 Clock High Time (Pipelined) (2) 6 ____ 8 ____ 10 ____ ns tCL2 Clock Low Time (Pipelined)(2) 6 ____ 8 ____ 10 ____ ns tR Clock Rise Time ____ 3 ____ 3 ____ 3 ns tF Clock Fall Time ____ 3 ____ 3 ____ 3 ns tSA Address Setup Time 4 ____ 4 ____ 4 ____ ns tHA Address Hold Time 1 ____ 1 ____ 1 ____ ns tSC Chip Enable Setup Time 4 ____ 4 ____ 4 ____ ns tHC Chip Enable Hold Time 1 ____ 1 ____ 1 ____ ns tSB Byte Enable Setup Time 4 ____ 4 ____ 4 ____ ns tHB Byte Enable Hold Time 1 ____ 1 ____ 1 ____ ns tSW R/W Setup Time 4 ____ 4 ____ 4 ____ ns tHW R/W Hold Time 1 ____ 1 ____ 1 ____ ns tSD Input Data Setup Time 4 ____ 4 ____ 4 ____ ns tHD ns Input Data Hold Time 1 ____ 1 ____ 1 ____ tSAD ADS Setup Time 4 ____ 4 ____ 4 ____ ns tHAD ADS Hold Time 1 ____ 1 ____ 1 ____ ns tSCN CNTEN Setup Time 4 ____ 4 ____ 4 ____ ns tHCN CNTEN Hold Time 1 ____ 1 ____ 1 ____ ns tSRST CNTRST Setup Time 4 ____ 4 ____ 4 ____ ns tHRST CNTRST Hold Time 1 ____ 1 ____ 1 ____ ns tOE Output Enable to Data Valid ____ 9 ____ 12 ____ 15 ns tOLZ Output Enable to Output Low-Z (1) 2 ____ 2 ____ 2 ____ ns tOHZ Output Enable to Output High-Z(1) 1 7 1 7 1 7 ns tCD1 Clock to Data Valid (Flow-Through)(2) ____ 20 ____ 25 ____ 30 ns ____ 9 ____ 12 ____ 15 ns 2 ____ 2 ____ 2 ____ ns (2) tCD2 Clock to Data Valid (Pipelined) tDC Data Output Hold After Clock High tCKHZ tCKLZ (1) 2 9 2 9 2 9 ns (1) 2 ____ 2 ____ 2 ____ ns ns Clock High to Output High-Z Clock High to Output Low-Z Port-to-Port Delay tCWDD Write Port Clock High to Read Data Delay ____ 35 ____ 40 ____ 50 tCCS Clock-to-Clock Setup Time ____ 15 ____ 15 ____ 20 ns 3243 tbl 11 NOTES: 1. Transition is measured 0mV from Low or High-impedance voltage with the Output Test Load (Figure 2). This parameter is guaranteed by device characterization, but is not production tested. 2. The Pipelined output parameters (tCYC2, tCD2) apply to either or both left and right ports when FT/PIPE = VIH. Flow-through parameters (tCYC1, tCD1) apply when FT/PIPE = VIL for that port. 3. All input signals are synchronous with respect to the clock except for the asynchronous Output Enable (OE) and FT/PIPE. FT/PIPE should be treated as a DC signal, i.e. steady state during operation. 4. 'X' in part number indicates power rating (S or L). 6.42 7 IDT709279/69S/L High-Speed 32/16K x 16 Synchronous Dual-Port Static RAM Preliminary Industrial and Commercial Temperature Ranges Timing Waveform of Read Cycle for Flow-Through Output (FT/PIPE"X" = VIL)(3,7) tCYC1 tCH1 tCL1 CLK CE0 tSC tSC tHC tHC (4) CE1 tSB tHB UB, LB tHB tSB R/W tSW tHW tSA tHA (5) ADDRESS An An + 1 tCKLZ An + 3 tCKHZ (1) Qn DATAOUT OE An + 2 tDC tCD1 Qn + 1 (1) tOHZ Qn + 2 (1) tOLZ tDC (1) (2) tOE 3243 drw 07 Timing Waveform of Read Cycle for Pipelined Output (FT/PIPE"X" = VIH)(3,7) tCYC2 tCH2 tCL2 CLK CE0 tSC tSC tHC tHC (4) CE1 tSB UB, LB tSB tHB tHB (6) R/W (5) ADDRESS tSW tHW tSA tHA An An + 1 (1 Latency) An + 2 tDC tCD2 DATAOUT Qn tCKLZ An + 3 Qn + 1 (1) tOHZ Qn + 2 (1) tOLZ (6) (1) (2) OE tOE 3243 drw 08 NOTES: 1. Transition is measured 0mV from Low or High-impedance voltage with the Output Test Load (Figure 2). 2. OE is asynchronously controlled; all other inputs are synchronous to the rising clock edge. 3. ADS = VIL, CNTEN and CNTRST = VIH. 4. The output is disabled (High-Impedance state) by CE0 = VIH, CE1 = VIL, UB = VIH, or LB = VIH following the next rising edge of the clock. Refer to Truth Table 1. 5. Addresses do not have to be accessed sequentially since ADS = VIL constantly loads the address on the rising edge of the CLK; numbers are for reference use only. 6. If UB or LB was HIGH, then the Upper Byte and/or Lower Byte of DATAOUT for Qn + 2 would be disabled (High-Impedance state). 7. "x" denotes Left or Right port. The diagram is with respect to that port. 8 6.42 IDT709279/69S/L High-Speed 32/16K x 16 Synchronous Dual-Port Static RAM Preliminary Industrial and Commercial Temperature Ranges Timing Waveform of a Bank Select Pipelined Read(1,2) tCH2 tCYC2 tCL2 CLK tSA ADDRESS(B1) CE0(B1) tHA A0 tSC tHC tSC tHC tCD2 tCKHZ tCD2 Q3 Q1 tDC tDC tSA (3) tCD2 Q0 DATAOUT(B1) ADDRESS(B2) A6 A5 A4 A3 A2 A1 tCKLZ (3) tCKHZ (3) tHA A0 A6 A5 A4 A3 A2 A1 tSC tHC CE0(B2) tSC tHC tCKHZ (3) tCD2 DATAOUT(B2) tCKLZ tCD2 Q2 (3) Q4 tCKLZ (3) 3243 drw 09 Timing Waveform of a Bank Select Flow-Through Read(6) tCH1 tCYC1 tCL1 CLK tSA A0 ADDRESS(B1) CE0(B1) tHA tSC A6 A5 A4 A3 A2 A1 tHC tSC tHC tCD1 tCD1 D0 DATAOUT(B1) tCKHZ tCD1 D3 tCKLZ tDC (1) D5 tCKHZ (1) tCKLZ (1) tHA A0 ADDRESS(B2) tCD1 D1 tDC tSA (1) A1 A6 A5 A4 A3 A2 tSC tHC CE0(B2) tSC tHC tCD1 DATAOUT(B2) tCKLZ (1) tCKHZ (1) tCD1 D2 tCKLZ (1) tCKHZ (1) D4 3243 drw 09a NOTES: 1. B1 Represents Bank #1; B2 Represents Bank #2. Each Bank consists of one IDT709279/69 for this waveform, and are setup for depth expansion in this example. ADDRESS(B1) = ADDRESS(B2) in this situation. 2. UB, LB, OE, and ADS = VIL; CE1(B1), CE1(B2), R/W, CNTEN, and CNTRST = VIH. 3. Transition is measured 0mV from Low or High-impedance voltage with the Output Test Load (Figure 2). 4. CE0, UB, LB, and ADS = VIL; CE1, CNTEN, and CNTRST = VIH. 5. OE = VIL for the Right Port, which is being read from. OE = VIH for the Left Port, which is being written to. 6. If tCCS < maximum specified, then data from right port READ is not valid until the maximum specified for tCWDD. If tCCS > maximum specified, then data from right port READ is not valid until tCCS + tCD1. tCWDD does not apply in this case. 6.42 9 IDT709279/69S/L High-Speed 32/16K x 16 Synchronous Dual-Port Static RAM Preliminary Industrial and Commercial Temperature Ranges Timing Waveform with Port-to-Port Flow-Through Read(1,2,3,5) CLK "A" tSW tHW R/W "A" tSA ADDRESS "A" NO MATCH MATCH tSD DATAIN "A" tHA tHD VALID tCCS (4) CLK "B" tCD1 R/W "B" ADDRESS "B" tSW tHW tSA tHA NO MATCH MATCH tCWDD (4) tCD1 DATAOUT "B" VALID VALID tDC tDC 3243 drw 10 NOTES: 1. Transition is measured 0mV from Low or High-impedance voltage with the Output Test Load (Figure 2). 2. CE0, UB, LB, and ADS = VIL; CE1, CNTEN, and CNTRST = VIH. 3. OE = VIL for the Right Port, which is being read from. OE = VIH for the Left Port, which is being written to. 4. If tCCS < maximum specified, then data from right port READ is not valid until the maximum specified for tCWDD. If tCCS > maximum specified, then data from right port READ is not valid until tCCS + tCD1. tCWDD does not apply in this case. 5. All timing is the same for both left and right ports. Port "A" may be either left or right port. Port "B" is the opposite of Port "A". 10 6.42 IDT709279/69S/L High-Speed 32/16K x 16 Synchronous Dual-Port Static RAM Preliminary Industrial and Commercial Temperature Ranges Timing Waveform of Pipelined Read-to-Write-to-Read (OE = VIL)(3) tCYC2 tCH2 tCL2 CLK CE0 tSC tHC CE1 tSB tHB UB, LB tSW tHW R/W (4) ADDRESS tSW tHW An tSA tHA An +1 An + 2 An + 3 An + 2 An + 4 tSD tHD DATAIN Dn + 2 tCD2 (2) tCKHZ (1) (1) tCD2 tCKLZ Qn + 3 Qn DATAOUT READ NOP (5) WRITE READ 3243 drw 11 Timing Waveforn of Pipelined Read-to-Write-to-Read (OE Controlled)(3) tCH2 tCYC2 tCL2 CLK CE0 tSC tHC tSB tHB CE1 UB, LB tSW tHW R/W (4) ADDRESS tSW tHW An tSA tHA An +1 An + 2 tSD DATAIN Dn + 2 tCD2 (2) An + 3 An + 4 An + 5 tHD Dn + 3 tCKLZ(1) tCD2 Qn DATAOUT Qn + 4 tOHZ(1) OE READ WRITE READ 3243 drw 12 NOTES: 1. Transition is measured 0mV from Low or High-impedance voltage with the Output Test Load (Figure 2). 2. Output state (High, Low, or High-impedance) is determined by the previous cycle control signals. 3. CE0, UB, LB, and ADS = VIL; CE1, CNTEN, and CNTRST = VIH. 4. Addresses do not have to be accessed sequentially since ADS = VIL constantly loads the address on the rising edge of the CLK; numbers are for reference use only. 5. "NOP" is "No Operation." Data in memory at the selected address may be corrupted and should be re-written to guarantee data integrity. 6.42 11 IDT709279/69S/L High-Speed 32/16K x 16 Synchronous Dual-Port Static RAM Preliminary Industrial and Commercial Temperature Ranges Timing Waveform of Flow-Through Read-to-Write-to-Read (OE = VIL)(3) tCH1 tCYC1 tCL1 CLK CE0 tSC tHC tSB tHB CE1 UB, LB tSW tHW R/W tSW tHW (4) ADDRESS tSA An tHA An +1 An + 2 An + 4 An + 3 An + 2 tSD tHD DATAIN Dn + 2 tCD1 (2) tCD1 Qn DATAOUT tCD1 tCD1 Qn + 3 Qn + 1 tDC tCKHZ (5) NOP READ (1) tCKLZ WRITE (1) tDC READ 3243 drw 13 Timing Waveform of Flow-Through Read-to-Write-to-Read (OE Controlled)(3) tCYC1 tCH1 tCL1 CLK CE0 tSC tHC tSB tHB CE1 UB, LB tSW tHW R/W tSW tHW (4) ADDRESS tSA An tHA An +1 An + 2 DATAIN Dn + 2 (2) DATAOUT An + 3 An + 4 An + 5 tSD tHD Dn + 3 tDC tCD1 Qn tOE tCD1 (1) tCKLZ tOHZ (1) tCD1 Qn + 4 tDC OE READ WRITE READ 3243 drw 14 NOTES: 1. Transition is measured 0mV from Low or High-impedance voltage with the Output Test Load (Figure 2). 2. Output state (High, Low, or High-impedance is determined by the previous cycle control signals. 3. CE0, UB, LB, and ADS = VIL; CE1, CNTEN, and CNTRST = VIH. 4. Addresses do not have to be accessed sequentially since ADS = VIL constantly loads the address on the rising edge of the CLK; numbers are for reference use only. 5. "NOP" is "No Operation." Data in memory at the selected address may be corrupted and should be re-written to guarantee data integrity. 12 6.42 IDT709279/69S/L High-Speed 32/16K x 16 Synchronous Dual-Port Static RAM Preliminary Industrial and Commercial Temperature Ranges Timing Waveform of Pipelined Read with Address Counter Advance(1) tCH2 tCYC2 tCL2 CLK tSA ADDRESS tHA An tSAD tHAD ADS tSAD tHAD CNTEN tSCN tHCN tCD2 DATAOUT Qx - 1(2) Qn + 2(2) Qn + 1 Qn Qx Qn + 3 tDC READ EXTERNAL ADDRESS READ WITH COUNTER COUNTER HOLD READ WITH COUNTER 3243 drw 15 Timing Waveform of Flow-Through Read with Address Counter Advance(1) tCH1 tCYC1 tCL1 CLK tSA ADDRESS tHA An tSAD tHAD ADS tSAD tHAD tSCN tHCN CNTEN tCD1 DATAOUT Qx(2) Qn Qn + 1 Qn + 2 Qn + 3(2) Qn + 4 tDC READ EXTERNAL ADDRESS READ WITH COUNTER COUNTER HOLD READ WITH COUNTER 3243 drw 16 NOTES: 1. CE0, OE, UB, and LB = VIL; CE1, R/W, and CNTRST = VIH. 2. If there is no address change via ADS = VIL (loading a new address) or CNTEN = VIL (advancing the address), i.e. ADS = VIH and CNTEN = VIH, then the data output remains constant for subsequent clocks. 6.42 13 IDT709279/69S/L High-Speed 32/16K x 16 Synchronous Dual-Port Static RAM Preliminary Industrial and Commercial Temperature Ranges Timing Waveform of Write with Address Counter Advance (Flow-Through or Pipelined Outputs)(1) tCH2 tCYC2 tCL2 CLK tSA tHA An ADDRESS INTERNAL(3) ADDRESS An(1) An + 2 An + 1 An + 4 An + 3 tSAD tHAD ADS CNTEN tSD tHD Dn + 1 Dn DATAIN WRITE EXTERNAL ADDRESS Dn + 1 Dn + 4 Dn + 3 Dn + 2 WRITE WRITE WITH COUNTER COUNTER HOLD WRITE WITH COUNTER 3243 drw 17 Timing Waveform of Counter Reset (Pipelined Outputs)(2) tCH2 tCYC2 tCL2 CLK tSA tHA (4) An ADDRESS INTERNAL(3) ADDRESS Ax(6) 0 1 An + 2 An + 1 An + 1 An tSW tHW R/W ADS CNTEN tSRST tHRST CNTRST tSD tHD D0 DATAIN (5) COUNTER RESET WRITE ADDRESS 0 READ ADDRESS 0 READ ADDRESS 1 Qn Q1 Q0 DATAOUT READ ADDRESS n READ ADDRESS n+1 3243 drw 18 NOTES: 1. CE0, UB, LB, and R/W = VIL; CE1 and CNTRST = VIH. 2. CE0, UB, LB = VIL; CE1 = VIH. 3. The "Internal Address" is equal to the "External Address" when ADS = VIL and equals the counter output when ADS = VIH. 4. Addresses do not have to be accessed sequentially since ADS = VIL constantly loads the address on the rising edge of the CLK; numbers are for reference use only. 5. Output state (High, Low, or High-impedance) is determined by the previous cycle control signals. 6. No dead cycle exists during counter reset. A READ or WRITE cycle may be coincidental with the counter reset cycle. ADDR0 will be accessed. Extra cycles are shown here simply for clarification. 7. CNTEN = VIL advances Internal Address from ‘An’ to ‘An +1’. The transition shown indicates the time required for the counter to advance. The ‘An +1’Address is written to during this cycle. 14 6.42 IDT709279/69S/L High-Speed 32/16K x 16 Synchronous Dual-Port Static RAM Preliminary Industrial and Commercial Temperature Ranges A Functional Description Depth and Width Expansion The IDT709279/69 provides a true synchronous Dual-Port Static RAM interface. Registered inputs provide minimal set-up and hold times on address, data, and all critical control inputs. All internal registers are clocked on the rising edge of the clock signal, however, the self-timed internal write pulse is independent of the LOW to HIGH transition of the clock signal. An asynchronous output enable is provided to ease asynchronous bus interfacing. Counter enable inputs are also provided to stall the operation of the address counters for fast interleaved memory applications. A HIGH on CE0 or a LOW on CE1 for one clock cycle will power down the internal circuitry to reduce static power consumption. Multiple chip enables allow easier banking of multiple IDT709279/69's for depth expansion configurations. When the Pipelined output mode is enabled, two cycles are required with CE0 LOW and CE1 HIGH to re-activate the outputs. The IDT709279/69 features dual chip enables (refer to Truth Table I) in order to facilitate rapid and simple depth expansion with no requirements for external logic. Figure 4 illustrates how to control the various chip enables in order to expand two devices in depth. The IDT709279/69 can also be used in applications requiring expanded width, as indicated in Figure 4. Since the banks are allocated at the discretion of the user, the external controller can be set up to drive the input signals for the various devices as required to allow for 32-bit or wider applications. A15/A14(1) IDT709279/69 CE0 CE1 IDT709279/69 VCC CE1 VCC Control Inputs Control Inputs IDT709279/69 CE0 IDT709279/69 CE1 CE1 CE0 CE0 Control Inputs Control Inputs 3243 drw 19 Figure 4. Depth and Width Expansion with IDT709279/69 NOTE: 1. A14 is for IDT709269. 6.42 15 , CNTRST CLK ADS CNTEN R/W OE IDT709279/69S/L High-Speed 32/16K x 16 Synchronous Dual-Port Static RAM Preliminary Industrial and Commercial Temperature Ranges Ordering Information XXXXX A 99 A Device Type Power Speed Package A A A Process/ Temperature Range Blank 8 Tube or Tray Tape and Reel Blank I(1) Commercial (0°C to +70°C) Industrial (-40°C to +85°C) G(2) Green PF 100-pin TQFP (PN100) 9 12 15 Commercial Only Commercial & Industrial Commercial Only S L Standard Power Low Power 709279 709269 512K (32K x 16-Bit) Synchronous Dual-Port RAM 256K (16K x 16-Bit) Sunchronous Dual-Port RAM Speed in nanoseconds 3243 drw 20 NOTES: 1. Industrial temperature range is available. For specific speeds, packages and powers contact your sales office. 2. Green parts available. For specific speeds, packages and powers contact your local sales office. Ordering Information for Flow-through Devices Old Flow-through Part New Combined Part 70927S/L20 709279S/L9 70927S/L25 709279S/L12 70927S/L30 709279S/L15 3243 tbl 12 IDT Clock Solution for IDT709279/69 Dual-Port Dual-Port I/O Specitications IDT Dual-Port Part Number Voltage 709279/69 5 Clock Specifications I/O Input Capacitance Input Duty Cycle Requirement Maximum Frequency Jitter Tolerance IDT Non-PLL Clock Device TTL 9pF 40% 100 150ps 49FCT805T 3243 tbl 13 16 6.42 IDT709279/69S/L High-Speed 32/16K x 16 Synchronous Dual-Port Static RAM Preliminary Industrial and Commercial Temperature Ranges Datasheet Document History 12/9/98: 06/03/99: 11/10/99: 03/31/00: 05/24/00: 08/24/01: 06/21/04: 01/29/09: 06/24/15: Initiated datasheet document history Converted to new format Cosmetic and typographical corrections Added additional notes to pin configurations Pages 13 & 14 Updated timing waveforms Page 15 Added Depth and Width Expansion section Changed drawing format Page 3 Deleted note 6 for Table II Replaced IDT logo Combined Pipelined 709279 family and Flow-through 70927 family offerings into one data sheet Changed ±200mV in waveform notes to 0mV Added corresponding part chart with ordering information Page 1 Inserted diamond in copy Page 4 Changed information in Truth Table II, Increased storage temperature parameter, clarified TA parameter Page 5 Changed DC Electrical parameters–changed wording from "Open" to "Disabled" Page 16 Fixed typeface in heading Added Industrial Temperature Ranges and removed related notes Pages 1, 16 and Page Header Removed Preliminary status Page 5 & 7 Removed Industrial Temperature Ranges for 15ns speed from DC and AC Electrical Characteristics Page 16 Removed Industrial Temperature from 15ns speed in ordering information Consolidated multiple devices into one datasheet Page 2 Added date revision to pin configuration Page 4 Added Junction Temperature to Absolute Maximum Ratings Table Added Ambient Temperature footnote Page 5 & 6 Added 6ns & 7ns speed DC power numbers to the DC Electrical Characteristics Table Page 8 Added 6ns & 7ns speed AC timing numbers to the AC Electrical Characteristics Table Page 17 Added 6ns & 7ns speed grades to ordering information Added IDT Clock Solution Table Page 1 & 18 Replaced old logo with new TM logo Page 17 Removed "IDT" from orderable part number Page 1 Added green availability to Features Page 2 Removed IDT in reference to fabrication Page 2 Removed date from the 100-pin TQFP configuration Page 2 & 17 The package code PN100-1 changed to PN100 to match standard package codes Page 5 Removed the X6 & X7 speed grade options and combined the X9, X12 & X15 speed grade options into one DC Elec Chars table Page 7 Removed the X6 & X7 speed grade options from the AC Elec Chars table Page 16 Added Green and Tape & Reel indicators to the Ordering Information CORPORATE HEADQUARTERS 6024 Silver Creek Valley Road San Jose, CA 95138 for SALES: 800-345-7015 or 408-284-8200 fax: 408-284-2775 www.idt.com The IDT logo is a registered trademark of Integrated Device Technology, Inc. 6.42 17 for Tech Support: 408-284-2794 [email protected]