MC74HC589A 8-Bit Serial or Parallel-Input/Serial-Output Shift Register with 3-State Output High−Performance Silicon−Gate CMOS The MC74HC589A device consists of an 8−bit storage latch which feeds parallel data to an 8−bit shift register. Data can also be loaded serially (see the Function Table). The shift register output, QH, is a 3−state output, allowing this device to be used in bus−oriented systems. The HC589A directly interfaces with the SPI serial data port on CMOS MPUs and MCUs. Features • • • • • • • • • Output Drive Capability: 15 LSTTL Loads Outputs Directly Interface to CMOS, NMOS, and TTL Operating Voltage Range: 2.0 to 6.0 V Low Input Current: 1 mA High Noise Immunity Characteristic of CMOS Devices In Compliance with the Requirements Defined by JEDEC Standard No. 7 A Chip Complexity: 526 FETs or 131.5 Equivalent Gates NLV Prefix for Automotive and Other Applications Requiring Unique Site and Control Change Requirements; AEC−Q100 Qualified and PPAP Capable These Devices are Pb−Free, Halogen Free and are RoHS Compliant SERIAL DATA INPUT SA A B PARALLEL DATA INPUTS C D E F G H LATCH CLOCK SHIFT CLOCK http://onsemi.com SOIC−16 D SUFFIX CASE 751B TSSOP−16 DT SUFFIX CASE 948F PIN ASSIGNMENT B 1 16 VCC C 2 15 A D 3 14 E 4 13 F 5 12 SA SERIAL SHIFT/ PARALLEL LOAD LATCH CLOCK G 6 11 H 7 10 GND 8 9 SHIFT CLOCK OUTPUT ENABLE QH MARKING DIAGRAMS 16 HC589AG AWLYWW 14 1 SOIC−16 15 1 16 2 VCC = PIN 16 GND = PIN 8 3 4 5 DATA LATCH HC 589A ALYWG G SHIFT REGISTER 1 6 TSSOP−16 7 9 12 SERIAL QH DATA OUTPUT 11 SERIAL SHIFT/ 13 PARALLEL LOAD 10 OUTPUT ENABLE = Assembly Location = Wafer Lot = Year = Work Week = Pb−Free Package (Note: Microdot may be in either location) ORDERING INFORMATION Figure 1. Logic Diagram © Semiconductor Components Industries, LLC, 2014 August, 2014 − Rev. 7 A WL, L YY, Y WW, W G or G See detailed ordering and shipping information in the package dimensions section on page 10 of this data sheet. 1 Publication Order Number: MC74HC589A/D MC74HC589A MAXIMUM RATINGS Symbol Parameter Value Unit VCC DC Supply Voltage (Referenced to GND) −0.5 to +7.0 V Vin DC Input Voltage (Referenced to GND) −0.5 ≤ VCC + 0.5 V Vout DC Output Voltage (Referenced to GND) −0.5 ≤ VCC + 0.5 V Iin DC Input Current, per Pin ±20 mA Iout DC Output Current, per Pin ±35 mA ICC DC Supply Current, VCC and GND Pins ±75 mA IGND DC Ground Current per Ground Pin ±75 mA TSTG Storage Temperature Range −65 to +150 _C 260 _C TL Lead Temperature, 1 mm from Case for 10 Seconds TJ Junction Temperature Under Bias +150 _C qJA Thermal Resistance PDIP SOIC TSSOP 78 112 148 _C/W PD Power Dissipation in Still Air at 85_C PDIP SOIC TSSOP 750 500 450 mW MSL Moisture Sensitivity FR Flammability Rating VESD ILatchup Level 1 Oxygen Index: 30% − 35% ESD Withstand Voltage Latchup Performance UL 94 V−0 @ 0.125 in Human Body Model (Note 1) Machine Model (Note 2) Charged Device Model (Note 3) Above VCC and Below GND at 85_C (Note 4) > 4000 > 200 > 1000 V ±300 mA Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected. 1. Tested to EIA/JESD22−A114−A. 2. Tested to EIA/JESD22−A115−A. 3. Tested to JESD22−C101−A. 4. Tested to EIA/JESD78. RECOMMENDED OPERATING CONDITIONS Symbol VCC Vin, Vout Parameter Min Max Unit DC Supply Voltage (Referenced to GND) 2.0 6.0 V DC Input Voltage, Output Voltage (Referenced to GND) 0 VCC V −55 )125 _C 0 0 0 1000 800 500 400 ns TA Operating Temperature, All Package Types tr, tf Input Rise and Fall Time VCC = 2.0 V VCC = 3.0 V VCC = 4.5 V VCC = 6.0 V (Figure 2) Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond the Recommended Operating Ranges limits may affect device reliability. 5. Unused inputs may not be left open. All inputs must be tied to a high−logic voltage level or a low−logic input voltage level. http://onsemi.com 2 MC74HC589A DC ELECTRICAL CHARACTERISTICS (Voltages Referenced to GND) VCC V −55_C to 25_C ≤ 85_C ≤ 125_C Unit Vout = 0.1 V or VCC *0.1 V |Iout| ≤ 20 mA 2.0 3.0 4.5 6.0 1.5 2.1 3.15 4.2 1.5 2.1 3.15 4.2 1.5 2.1 3.15 4.2 V Maximum Low−Level Input Voltage Vout = 0.1 V or VCC *0.1 V |Iout| ≤ 20 mA 2.0 3.0 4.5 6.0 0.5 0.9 1.35 1.8 0.5 0.9 1.35 1.8 0.5 0.9 1.35 1.8 V Minimum High−Level Output Voltage Vin = VIH or VIL |Iout| ≤ 20 mA 2.0 4.5 6.0 1.9 4.4 5.9 1.9 4.4 5.9 1.9 4.4 5.9 V 3.0 4.5 6.0 2.48 3.98 5.48 2.34 3.84 5.34 2.20 3.70 5.20 2.0 4.5 6.0 0.1 0.1 0.1 0.1 0.1 0.1 0.1 0.1 0.1 3.0 4.5 6.0 0.26 0.26 0.26 0.33 0.33 0.33 0.40 0.40 0.40 Symbol Parameter VIH Minimum High−Level Input Voltage VIL VOH Test Conditions |Iout| ≤ 2.4 mA |Iout| ≤ 6.0 mA |Iout| ≤ 7.8 mA Vin = VIH or VIL VOL Guaranteed Limit Maximum Low−Level Output Voltage Vin = VIH |Iout| ≤ 20 mA |Iout| ≤ 2.4 mA |Iout| ≤ 6.0 mA |Iout| ≤ 7.8 mA Vin = VIH or VIL V Iin Maximum Input Leakage Current Vin = VCC or GND 6.0 ±0.1 ±1.0 ±1.0 mA IOZ Maximum Three−State Leakage Current Output in High−Impedance State Vin = VIL or VIH Vout = VCC or GND 6.0 ±0.5 ±5.0 ±10 mA ICC Maximum Quiescent Supply Current (per Package) Vin = VCC or GND Iout = 0 mA 6.0 4 40 160 mA http://onsemi.com 3 MC74HC589A AC ELECTRICAL CHARACTERISTICS (CL = 50 pF, Input tr = tf = 6 ns) VCC Symbol Parameter Guaranteed Limit V −55_C to 25_C ≤ 85_C ≤ 125_C Unit fmax Maximum Clock Frequency (50% Duty Cycle) (Figures 3 and9) 2.0 3.0 4.5 6.0 6.0 15 30 35 4.8 10 24 28 4.0 8.0 20 24 MHz tPLH, tPHL Maximum Propagation Delay, Latch Clock to QH (Figures 2 and 9) 2.0 3.0 4.5 6.0 175 100 40 30 225 110 50 40 275 125 60 50 ns tPLH, tPHL Maximum Propagation Delay, Shift Clock to QH (Figures 3 and 9) 2.0 3.0 4.5 6.0 160 90 30 25 200 130 40 30 240 160 48 40 ns tPLH, tPHL Maximum Propagation Delay, Serial Shift/Parallel Load to QH (Figures 5 and 9) 2.0 3.0 4.5 6.0 160 90 30 25 200 130 40 30 240 160 48 40 ns tPLZ, tPHZ Maximum Propagation Delay, Output Enable to QH (Figures 4 and 10) 2.0 3.0 4.5 6.0 150 80 27 23 170 100 30 25 200 130 40 30 ns tPZL, tPZH Maximum Propagation Delay, Output Enable to QH (Figures 4 and 10) 2.0 3.0 4.5 6.0 150 80 27 23 170 100 30 25 200 130 40 30 ns tTLH, tTHL Maximum Output Transition Time, Any Output (Figures 2 and 9) 2.0 3.0 4.5 6.0 60 23 12 10 75 27 15 13 90 31 18 15 ns Cin Maximum Input Capacitance − 10 10 10 pF Cout Maximum Three−State Output Capacitance (Output in High−Impedance State) − 15 15 15 pF Typical @ 25_C, VCC = 5.0 V CPD Power Dissipation Capacitance (per Package)* 50 *Used to determine the no−load dynamic power consumption: PD = CPD VCC 2f + ICC VCC . http://onsemi.com 4 pF MC74HC589A TIMING REQUIREMENTS (Input tr = tf = 6 ns) VCC Symbol Parameter Guaranteed Limit V −55_C to 25_C ≤ 85_C ≤ 125_C Unit tsu Minimum Setup Time, A−H to Latch Clock (Figure 6) 2.0 3.0 4.5 6.0 100 40 20 17 125 50 25 21 150 60 30 26 ns tsu Minimum Setup Time, Serial Data Input SA to Shift Clock (Figure 7) 2.0 3.0 4.5 6.0 100 40 20 17 125 50 25 21 150 60 30 26 ns tsu Minimum Setup Time, Serial Shift/Parallel Load to Shift Clock (Figure 8) 2.0 3.0 4.5 6.0 100 40 20 17 125 50 25 21 150 60 30 26 ns th Minimum Hold Time, Latch Clock to A−H (Figure 6) 2.0 3.0 4.5 6.0 25 10 5 5 30 12 6 6 40 15 8 7 ns th Minimum Hold Time, Shift Clock to Serial Data Input SA (Figure 7) 2.0 3.0 4.5 6.0 5 5 5 5 5 5 5 5 5 5 5 5 ns tw Minimum Pulse Width, Shift Clock (Figure 3) 2.0 3.0 4.5 6.0 75 40 15 13 95 50 19 16 110 60 23 19 ns tw Minimum Pulse Width, Latch Clock (Figure 2) 2.0 3.0 4.5 6.0 80 40 16 14 100 50 20 17 120 60 24 20 ns tw Minimum Pulse Width, Serial Shift/Parallel Load (Figure 5) 2.0 3.0 4.5 6.0 80 40 16 14 100 50 20 17 120 60 24 20 ns Maximum Input Rise and Fall Times (Figure 2) 2.0 3.0 4.5 6.0 1000 800 500 400 1000 800 500 400 1000 800 500 400 ns tr, tf http://onsemi.com 5 MC74HC589A FUNCTION TABLE Inputs Resulting Function Output Enable Serial Shift/ Parallel Load Latch Clock Shift Clock Serial Input SA Parallel Inputs A−H Data Latch Contents Shift Register Contents Output QH Force Output into High Impedance State H X X X X X X X Z Load Parallel Data into Data Latch L H L, H, X a−h a−h U U Transfer Latch Contents to Shift Register L L L, H, X X X U LRN → SRN LRH Contents of Input Latch and Shift Register are Unchanged L H L, H, L, H, X X U U U Load Parallel Data into Data Latch and Shift Register L L X X a−h a−h a−h h Shift Serial Data into Shift Register L H D X * SRA = D, SRN → SRN+1 SRG → SRH Load Parallel Data in Data Latch and Shift Serial Data into Shift Register L H D a−h a−h SRA = D, SRN → SRN+1 SRG → SRH Operation LR SR a−h D = = = = X latch register contents shift register contents data at parallel data inputs A−H data (L, H) at serial data input SA U = remains unchanged X = don’t care Z = high impedance * = depends on Latch Clock input SWITCHING WAVEFORMS tr LATCH CLOCK tf 1/fmax VCC 90% 50% 10% tw tw GND tPLH SHIFT CLOCK tPLH QH tTLH Figure 3. (Serial Shift/Parallel Load = H) VCC tw GND tPLZ tPHZ 50% SERIAL SHIFT/ PARALLEL LOAD HIGH IMPEDANCE 50% tPZH QH 50% 50% tPZL QH tPHL tTHL Figure 2. (Serial Shift/Parallel Load = L) OUTPUT ENABLE GND tPHL 90% 50% 10% QH VCC 50% 10% VOL 90% VOH VCC 50% 50% GND tPLH QH tPHL 50% HIGH IMPEDANCE Figure 4. Figure 5. http://onsemi.com 6 MC74HC589A SWITCHING WAVEFORMS DATA VALID A−H DATA VALID VCC SA 50% GND tsu LATCH CLOCK VCC 50% GND th tsu SHIFT CLOCK 50% th 50% Figure 6. Figure 7. VCC SERIAL SHIFT/ PARALLEL LOAD 50% GND tsu SHIFT CLOCK 50% Figure 8. TEST POINT TEST POINT OUTPUT DEVICE UNDER TEST 1 kW OUTPUT DEVICE UNDER TEST CL * CL* CONNECT TO VCC WHEN TESTING tPLZ AND tPZL. CONNECT TO GND WHEN TESTING tPHZ AND tPZH. *Includes all probe and jig capacitance. *Includes all probe and jig capacitance. Figure 10. Test Circuit Figure 9. Test Circuit PIN DESCRIPTIONS Data Inputs data in stage H is shifted out QH, being replaced by the data previously stored in stage G. A, B, C, D, E, F, G, H (Pins 15, 1, 2, 3, 4, 5, 6, 7) Latch Clock (Pin 12) Parallel data inputs. Data on these inputs are stored in the data latch on the rising edge of the Latch Clock input. Data latch clock. A low−to−high transition on this input loads the parallel data on inputs A−H into the data latch. SA (Pin 14) Output Enable (Pin 10) Serial data input. Data on this input is shifted into the shift register on the rising edge of the Shift Clock input if Serial Shift/Parallel Load is high. Data on this input is ignored when Serial Shift/Parallel Load is low. Active−low output enable A high level applied to this pin forces the QH output into the high impedance state. A low level enables the output. This control does not affect the state of the input latch or the shift register. Control Inputs Serial Shift/Parallel Load (Pin 13) Output Shift register mode control. When a high level is applied to this pin, the shift register is allowed to serially shift data. When a low level is applied to this pin, the shift register accepts parallel data from the data latch. QH (Pin 9) Serial data output. This pin is the output from the last stage of the shift register. This is a 3−state output. Shift Clock (Pin 11) Serial shift clock. A low−to−high transition on this input shifts data on the serial data input into the shift register and http://onsemi.com 7 MC74HC589A SHIFT CLOCK SERIAL DATA INPUT, SA OUTPUT ENABLE SERIAL SHIFT/ PARALLEL LOAD LATCH CLOCK PARALLEL DATA INPUTS A L H L L B L L L L C L H L L D L L L L E L H L H F L H L H G L L L L H L H H H QH ÉÉÉÉ ÉÉÉÉ HIGH IMPEDANCE H SERIAL SHIFT LOAD RESET LATCH LATCH AND SHIFT REGISTER L H H L H L H LOAD LATCH Figure 11. Timing Diagram http://onsemi.com 8 H L L L H SERIAL SHIFT SERIAL SHIFT PARALLEL LOAD SHIFT REGISTER L PARALLEL LOAD SHIFT REGISTER PARALLEL LOAD, LATCH, AND SHIFT REGISTER L H H SERIAL SHIFT MC74HC589A OUTPUT 10 ENABLE 14 SA SHIFT 11 CLOCK SERIAL SHIFT/ 13 PARALLEL LOAD 12 LATCH CLOCK 15 A STAGE A D Q C S D C Q R STAGE B B PARALLEL DATA INPUTS C D E F G 1 D Q C 2 S D C Q R STAGE C* 3 STAGE D* 4 STAGE E* 5 STAGE F* 6 STAGE G* STAGE H H 7 D Q C VCC S D C Q R *Stages C thru G (not shown in detail) are identical to stages A and B above. Figure 12. Logic Detail http://onsemi.com 9 9 QH MC74HC589A ORDERING INFORMATION Package Shipping† MC74HC589ADG SOIC−16 (Pb−Free) 48 Units / Rail NLV74HC589ADG* SOIC−16 (Pb−Free) 48 Units / Rail MC74HC589ADR2G SOIC−16 (Pb−Free) 2500 Tape & Reel NLV74HC589ADR2G* SOIC−16 (Pb−Free) 2500 Tape & Reel MC74HC589ADTR2G TSSOP−16 (Pb−Free) 2500 Tape & Reel NLV74HC589ADTR2G* TSSOP−16 (Pb−Free) 2500 Tape & Reel Device †For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specifications Brochure, BRD8011/D. *NLV Prefix for Automotive and Other Applications Requiring Unique Site and Control Change Requirements; AEC−Q100 Qualified and PPAP Capable. http://onsemi.com 10 MC74HC589A PACKAGE DIMENSIONS TSSOP−16 CASE 948F ISSUE B 16X K REF 0.10 (0.004) 0.15 (0.006) T U M T U S V S S K ÉÉÉ ÇÇÇ ÇÇÇ ÉÉÉ K1 2X L/2 16 9 J1 B −U− L SECTION N−N J PIN 1 IDENT. N 0.25 (0.010) 8 1 M 0.15 (0.006) T U S A −V− NOTES: 1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M, 1982. 2. CONTROLLING DIMENSION: MILLIMETER. 3. DIMENSION A DOES NOT INCLUDE MOLD FLASH. PROTRUSIONS OR GATE BURRS. MOLD FLASH OR GATE BURRS SHALL NOT EXCEED 0.15 (0.006) PER SIDE. 4. DIMENSION B DOES NOT INCLUDE INTERLEAD FLASH OR PROTRUSION. INTERLEAD FLASH OR PROTRUSION SHALL NOT EXCEED 0.25 (0.010) PER SIDE. 5. DIMENSION K DOES NOT INCLUDE DAMBAR PROTRUSION. ALLOWABLE DAMBAR PROTRUSION SHALL BE 0.08 (0.003) TOTAL IN EXCESS OF THE K DIMENSION AT MAXIMUM MATERIAL CONDITION. 6. TERMINAL NUMBERS ARE SHOWN FOR REFERENCE ONLY. 7. DIMENSION A AND B ARE TO BE DETERMINED AT DATUM PLANE −W−. N F DETAIL E −W− C 0.10 (0.004) −T− SEATING PLANE H D DETAIL E G DIM A B C D F G H J J1 K K1 L M SOLDERING FOOTPRINT* 7.06 1 0.65 PITCH 16X 0.36 16X 1.26 DIMENSIONS: MILLIMETERS *For additional information on our Pb−Free strategy and soldering details, please download the ON Semiconductor Soldering and Mounting Techniques Reference Manual, SOLDERRM/D. http://onsemi.com 11 MILLIMETERS MIN MAX 4.90 5.10 4.30 4.50 −−− 1.20 0.05 0.15 0.50 0.75 0.65 BSC 0.18 0.28 0.09 0.20 0.09 0.16 0.19 0.30 0.19 0.25 6.40 BSC 0_ 8_ INCHES MIN MAX 0.193 0.200 0.169 0.177 −−− 0.047 0.002 0.006 0.020 0.030 0.026 BSC 0.007 0.011 0.004 0.008 0.004 0.006 0.007 0.012 0.007 0.010 0.252 BSC 0_ 8_ MC74HC589A PACKAGE DIMENSIONS SOIC−16 CASE 751B−05 ISSUE K −A− 16 NOTES: 1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M, 1982. 2. CONTROLLING DIMENSION: MILLIMETER. 3. DIMENSIONS A AND B DO NOT INCLUDE MOLD PROTRUSION. 4. MAXIMUM MOLD PROTRUSION 0.15 (0.006) PER SIDE. 5. DIMENSION D DOES NOT INCLUDE DAMBAR PROTRUSION. ALLOWABLE DAMBAR PROTRUSION SHALL BE 0.127 (0.005) TOTAL IN EXCESS OF THE D DIMENSION AT MAXIMUM MATERIAL CONDITION. 9 −B− 1 P 8 PL 0.25 (0.010) 8 B M S DIM A B C D F G J K M P R G R K F X 45 _ C −T− SEATING PLANE J M D MILLIMETERS MIN MAX 9.80 10.00 3.80 4.00 1.35 1.75 0.35 0.49 0.40 1.25 1.27 BSC 0.19 0.25 0.10 0.25 0_ 7_ 5.80 6.20 0.25 0.50 INCHES MIN MAX 0.386 0.393 0.150 0.157 0.054 0.068 0.014 0.019 0.016 0.049 0.050 BSC 0.008 0.009 0.004 0.009 0_ 7_ 0.229 0.244 0.010 0.019 16 PL 0.25 (0.010) M T B S A S SOLDERING FOOTPRINT* 8X 6.40 16X 1 1.12 16 16X 0.58 1.27 PITCH 8 9 DIMENSIONS: MILLIMETERS *For additional information on our Pb−Free strategy and soldering details, please download the ON Semiconductor Soldering and Mounting Techniques Reference Manual, SOLDERRM/D. ON Semiconductor and the are registered trademarks of Semiconductor Components Industries, LLC (SCILLC) or its subsidiaries in the United States and/or other countries. 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