Order
Now
Product
Folder
Support &
Community
Tools &
Software
Technical
Documents
DAC8775
SLVSBY7 – FEBRUARY 2017
DAC8775 Quad-Channel, 16-Bit Programmable Current Output and Voltage Output
Digital-to-Analog Converter with Adaptive Power Management
1 Features
3 Description
•
The DAC8775 is a quad-channel precision, fully
integrated, 16-bit, digital-to-analog converter (DAC)
with adaptive power management, and is designed to
meet the requirements of industrial control
applications. The adaptive power management
circuit, when enabled, minimizes the power
dissipation of the chip. When programmed as a
current output, the supply voltage on the current
output driver is regulated between 4.5 V and 32 V
based on continuous feedback of voltage on the
current output pin via an integrated buck/boost
converter. When programmed as a voltage output,
this circuit generates a programmable supply voltage
for the voltage output stage (±15 V). DAC8775 also
contains an LDO to generate the digital supply (5 V)
from a single power supply pin.
1
•
•
•
•
•
•
•
•
•
•
•
•
Output Current:
– 0 mA to 24 mA; 3.5 mA to 23.5 mA; 0 mA to
20 mA; 4 mA to 20 mA; ±24 mA
Output Voltage (with/without 20% over-range):
– 0 V to 5 V; 0 V to 10 V; ±5 V; ±10 V
– 0 V to 6 V; 0 V to 12 V; ±6 V; ±12 V
Adaptive Power Management
Single Wide Power Supply Pin (12 V – 36 V )
±0.1% FSR Total Unadjusted Error (TUE)
DNL: ±1 LSB Max
Internal 5-V Reference (10 ppm/°C max)
Internal 5-V Digital Power Supply Output
CRC/Frame Error Check, Watchdog Timer
Thermal Alarm, Open/Short Circuit for System
Reliability
Safe Actions on Alarm Condition
Auto Learn Load Detection
Wide Temperature Range: –40°C to +125°C
DAC8775 is also implemented with a Highway
Addressable Remote Transducer (HART) Signal
Interface to superimpose an external HART signal on
the current output. The slew rate of the current output
DAC is register programmable. The device can
operate with a single external power supply of +12 V
to +36 V using the integrated buck/boost converters
or with external power supplies when the buck/boost
converters are disabled.
2 Applications
•
•
•
•
•
•
4-mA to 20-mA Current Loops
Analog Output Modules
Programmable Logic Controllers (PLCs)
Building Automation
Sensor Transmitters
Process Control
Device Information(1)
PART NUMBER
PACKAGE
DAC8775
VQFN (72)
BODY SIZE (NOM)
10.00 mm x 10.00 mm
(1) For all available packages, see the orderable addendum at
the end of the data sheet.
Block Diagram
REFOUT DVDD_EN DVDD
Internal
Reference
ALARM
CHANNEL - A
Amp
SDIN
RESET
CLR
SYNC
SDO
SPI Shift Register Input
Control Logic
SCLK
VNEG_IN_X LP_X
LN_X
VPOS_IN_X
Buck/Boost Converters
PVSS_X
AGND_X
DVDD
LDO
LDAC
REFIN AVDD PVDD_X
User
Calibration
Register
IRANGE
X
DAC
IAmp
IENABLE
Alarm
Watchdog
Timer
DAC Input
Register
Current
Source
HART_IN_x
CCOMP_X
VENABLE
VAmp
Slew Rate
Control
VOUT_X
VSENSEN_x
Feedback
Power On
Reset
IOUT_X
VSENSEP_X
CHANNEL - B
CHANNEL - C
CHANNEL - D
AGND1 AGND2 AGND3
Copyright © 2016, Texas Instruments Incorporated
1
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
DAC8775
SLVSBY7 – FEBRUARY 2017
www.ti.com
Table of Contents
1
2
3
4
5
6
7
Features ..................................................................
Applications ...........................................................
Description .............................................................
Revision History.....................................................
Device Comparison Table.....................................
Pin Configuration and Functions .........................
Specifications.........................................................
7.1
7.2
7.3
7.4
7.5
7.6
7.7
8
8.4 Device Functional Modes........................................ 43
8.5 Register Maps ........................................................ 47
1
1
1
2
3
3
6
9
Application and Implementation ........................ 60
9.1 Application Information............................................ 60
9.2 Typical Application ................................................. 63
10 Power Supply Recommendations ..................... 67
11 Layout................................................................... 69
11.1 Layout Guidelines ................................................. 69
11.2 Layout Example .................................................... 70
Absolute Maximum Ratings ...................................... 6
ESD Ratings.............................................................. 6
Recommended Operating Conditions....................... 6
Thermal Information .................................................. 7
Electrical Characteristics........................................... 7
Timing Requirements: Write and Readback Mode . 13
Typical Characteristics ............................................ 15
12 Device and Documentation Support ................. 72
12.1
12.2
12.3
12.4
12.5
12.6
Detailed Description ............................................ 34
8.1 Overview ................................................................. 34
8.2 Functional Block Diagram ....................................... 34
8.3 Feature Description................................................. 34
Documentation Support .......................................
Receiving Notification of Documentation Updates
Community Resources..........................................
Trademarks ...........................................................
Electrostatic Discharge Caution ............................
Glossary ................................................................
72
72
72
72
72
72
13 Mechanical, Packaging, and Orderable
Information ........................................................... 73
4 Revision History
2
DATE
REVISION
NOTES
February 2017
*
Initial release.
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
DAC8775
www.ti.com
SLVSBY7 – FEBRUARY 2017
5 Device Comparison Table
PRODUCT
RESOLUTION
DIFFERENTIAL
NONLINEARITY (LSB)
DAC8775
16
±1
6 Pin Configuration and Functions
DCDC_AGND_CD
VNEG_IN_D
VNEG_IN_C
PBKG
RESET
ALARM
DVDD
DVDD_EN
HARTIN_C
CCOMP_C
HARTIN_D
CCOMP_D
VSENSEP_C
VSENSEN_C
VSENSEP_D
VSENSEN_D
DAC_AGND_CD
VNEG_IN_D
72
71
70
69
68
67
66
65
64
63
62
61
60
59
58
57
56
55
RWF Package
72-Pin VQFN
Top View
PVDD_D
1
54
IOUT_D
LP_D
2
53
VPOS_IN_D
PVSS_D
3
52
VOUT_D
LN_D
4
51
VNEG_IN_C
PVDD_C
5
50
IOUT_C
LP_C
6
49
VPOS_IN_C
PVSS_C
7
48
VOUT_C
LN_C
8
47
REFOUT
DCDC_AGND_AB
(1)
33
34
35
36
DAC_AGND_AB
VNEG_IN_A
IOUT_A
VSENSEP_A
VPOS_IN_A
37
VSENSEN_A
38
18
32
17
PBKG
VSENSEN_B
PVDD_A
31
VOUT_A
VSENSEP_B
39
30
16
29
LP_A
CCOMP_A
VNEG_IN_B
HARTIN_A
40
28
15
CCOMP_B
PVSS_A
27
IOUT_B
HARTIN_B
VPOS_IN_B
41
26
42
14
25
13
LN_A
CLR
PVDD_B
SYNC
VOUT_B
24
43
SDO
12
23
LP_B
LDAC
AVDD
22
44
21
11
SDIN
PVSS_B
SCLK
REFGND
20
REFIN
45
VNEG_IN_B
46
Pad
19
Thermal
10
VNEG_IN_A
9
LN_B
Not to scale
Thermal pad should be connected to ground.
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
3
DAC8775
SLVSBY7 – FEBRUARY 2017
www.ti.com
Pin Functions
PIN
NAME
DESCRIPTION
NO.
PVDD_D
1
Buck-Boost Converter power switch supply D
LP_D
2
External Inductor terminal - positive D
PVSS_D
3
Ground for Buck-Boost converter switches D
LN_D
4
External Inductor terminal - negative D
PVDD_C
5
Buck-Boost Converter power switch supply C
LP_C
6
External Inductor terminal - positive C
PVSS_C
7
Ground for Buck-Boost converter switches C
LN_C
8
External Inductor terminal - negative C
DCDC_AGND_AB
9
Analog GND Buck-Boost converter Channels A and B
LN_B
10
External Inductor terminal - negative B
PVSS_B
11
Ground for Buck-Boost converter switches B
LP_B
12
External Inductor terminal - positive B
PVDD_B
13
Buck-Boost Converter power switch supply B
LN_A
14
External Inductor terminal - negative A
PVSS_A
15
Ground for Buck-Boost converter switches A
LP_A
16
External Inductor terminal - positive A
PVDD_A
17
Buck-Boost Converter power switch supply A
PBKG
18
Chip substrate, connect to 0 V
VNEG_IN_A
19
Negative power supply for VOUT_A and IOUT_A
VNEG_IN_B
20
Negative power supply for VOUT_B and IOUT_A
SCLK
21
Serial clock input of serial peripheral interface (SPI™). Data can be transferred at rates up to 25 MHz.
Schmitt-Trigger logic input.
SDIN
22
Serial data input. Data are clocked into the 24-bit input shift register on the falling edge of the serial clock
input. Schmitt-Trigger logic input.
LDAC
23
Load DAC latch control input. A logic low on this pin loads the input shift register data into the DAC
register and updates the DAC output.
SDO
24
Serial data output. Data are valid on the falling edge of SCLK.
SYNC
25
SPI bus chip select input (active low). Data bits are not clocked into the serial shift register unless SYNC
is low. When SYNC is high, SDO is in high-impedance status.
CLR
26
Level Triggered clear pin (Active High). Clears all DAC channel to zero code or mid code (see DAC clear
section)
HARTIN_B
27
Input pin for HART modulation. for IOUT_B
CCOMP_B
28
External compensation capacitor connection pin for VOUT_B . Addition of the external capacitor improves
the stability with high capacitive loads at the VOUT_B pin by reducing the bandwidth of the output
amplifier at the expense of increased settling time.
HARTIN_A
29
Input pin for HART modulation. for IOUT_A
CCOMP_A
30
External compensation capacitor connection pin for VOUT_A . Addition of the external capacitor improves
the stability with high capacitive loads at the VOUT_A pin by reducing the bandwidth of the output
amplifier at the expense of increased settling time.
VSENSEP_B
31
Sense output pin for the positive voltage output (channel B) load connection.
VSENSEN_B
32
Sense output pin for the negative voltage output (channel B) load connection.
VSENSEP_A
33
Sense output pin for the positive voltage output (channel A) load connection.
VSENSEN_A
34
Sense output pin for the negative voltage output (channel A) load connection.
DAC_AGND_AB
35
Analog GND DAC Channels A and B
VNEG_IN_A
36
Negative power supply for VOUT_A and IOUT_A
IOUT_A
37
Current Output Pin (Channel A)
VPOS_IN_A
38
Positive power supply for VOUT_A and IOUT_A
VOUT_A
39
Voltage Output Pin (Channel A)
VNEG_IN_B
40
Negative power supply for VOUT_B and IOUT_B
4
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
DAC8775
www.ti.com
SLVSBY7 – FEBRUARY 2017
Pin Functions (continued)
PIN
NAME
DESCRIPTION
NO.
IOUT_B
41
Current Output Pin (Channel B)
VPOS_IN_B
42
Positive power supply for VOUT_B and IOUT_B
VOUT_B
43
Voltage Output Pin (Channel B)
AVDD
44
Power supply for all analog circuitry of the device except buck-boost converters and output amplifiers
REFGND
45
Reference ground
REFIN
46
Reference input
REFOUT
47
Internal reference output. Connects to REFIN when using internal reference.
VOUT_C
48
Voltage Output Pin (Channel C)
VPOS_IN_C
49
Positive power supply for VOUT_C and IOUT_C
IOUT_C
50
Current Output Pin (Channel C)
VNEG_IN_C
51
Negative power supply for VOUT_C and IOUT_C
VOUT_D
52
Voltage Output Pin (Channel D)
VPOS_IN_D
53
Positive power supply for VOUT_D and IOUT_D
IOUT_D
54
Current Output Pin (Channel D)
VNEG_IN_D
55
Negative power supply for VOUT_D and IOUT_D
DAC_AGND_CD
56
Analog GND DAC Channels C and D
VSENSEN_D
57
Sense output pin for the negative voltage output (channel D) load connection.
VSENSEP_D
58
Sense output pin for the positive voltage output (channel D) load connection.
VSENSEN_C
59
Sense output pin for the negative voltage output (channel C) load connection.
VSENSEP_C
60
Sense output pin for the positive voltage output (channel C) load connection.
CCOMP_D
61
External compensation capacitor connection pin for VOUT_D . Addition of the external capacitor improves
the stability with high capacitive loads at the VOUT_D pin by reducing the bandwidth of the output
amplifier at the expense of increased settling time.
HARTIN_D
62
Input pin for HART modulation. for IOUT_D
CCOMP_C
63
External compensation capacitor connection pin for VOUT_C . Addition of the external capacitor improves
the stability with high capacitive loads at the VOUT_C pin by reducing the bandwidth of the output
amplifier at the expense of increased settling time.
HARTIN_C
64
Input pin for HART modulation. for IOUT_C
DVDD_EN
65
Internal power-supply enable pin. Connect this pin to PBKG to disable the internal DVDD, or leave this
pin unconnected to enable the internal DVDD. When this pin is connected to PBKG, an external supply
must be connected to the DVDD pin.
DVDD
66
Digital Supply pin (Input/Output) Internal DVDD enabled when DVDD_EN is floating, External DVDD must
be supplied when DVDD_EN is connected to PBKG
ALARM
67
ALARM pin. Open drain output. External pull-up resistor required (10 kΩ). The pin goes low (active) when
the ALARM condition is detected on any of the outputs (OUT_A through OUT_D) (open circuit, over
temperature, watchdog timeout, and others).
RESET
68
Reset input (active low). Logic low on this pin causes the device to perform a reset. A hardware reset
must be issued using this pin after power up.
PBKG
69
Chip substrate, connect to 0 V
VNEG_IN_C
70
Negative power supply for VOUT_C
VNEG_IN_D
71
Negative power supply for VOUT_D
DCDC_AGND_CD
72
Analog GND Buck-Boost converter Channels C and D
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
5
DAC8775
SLVSBY7 – FEBRUARY 2017
www.ti.com
7 Specifications
7.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted) (1)
Input voltage
Output voltage
Input current
MIN
MAX
PVDD_x/AVDD to PBKG
-0.3
40
PVSS_x/REFGND/DCDC_AGND_x/DAC_AGND_x
to PBKG
-0.3
0.3
VPOS_IN_x to VNEG_IN_x
-0.3
40
VPOS_IN_x to PBKG
-0.3
33
VNEG_IN_x to PBKG
-20
0.3
VSENSEN_x to PBKG
VNEG_IN_x
VPOS_IN_x
VSENSEP_x to PBKG
V
VNEG_IN_x
VPOS_IN_x
DVDD to PBKG
-0.3
6
REFOUT/REFIN to PBKG
-0.3
6
Digital input voltage to PBKG
-0.3
DVDD+0.3
VOUT_x to PBKG
VNEG_IN_x
VPOS_IN_x
IOUT_x to PBKG
VNEG_IN_x
VPOS_IN_x
SDO, ALARM to PBKG
-0.3
DVDD+0.3
Current into any digital input pin
-10
Power dissipation
Operating junction temperature, TJ
V
10
mA
(TJmax – TA)/θJA
W
-40
150
Junction temperature range, TJmax
150
Storage temperature, Tstg
(1)
UNIT
-65
°C
150
Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended
Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
7.2 ESD Ratings
VALUE
V(ESD)
(1)
(2)
Electrostatic discharge
Human body model (HBM), per ANSI/ESDA/JEDEC JS-001, all
pins (1)
±2000
Charged device model (CDM), per JEDEC specification JESD22C101, all pins (2)
±500
UNIT
V
JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
7.3 Recommended Operating Conditions
over operating free-air temperature range (unless otherwise noted)
MIN
NOM
MAX
UNIT
POWER SUPPLY
PVDD_x/AVDD_x to
PBKG/PVSS_x (1)
VPOS_IN_x to
PBKG (1)
VNEG_IN_x to
PBKG (1)
Positive supply voltage to ground range
12
36
V
Positive supply voltage to ground range
12
33
V
Negative supply voltage to substrate for current output mode
-18
0
V
Negative supply voltage to substrate for voltage output mode
-18
-5
V
12
36
V
-7
7
V
VPOS_IN_x to
VNEG_IN_x (1)
VSENSEN_x to PBKG
(1)
6
The minimum headroom spec for voltage output stage must be met
The minimum headroom spec for voltage output stage and the compliance voltage for current output stage should be met. When BuckBoost converter is enabled VPOS_IN_x/VNEG_IN_x are generated internally to meet headroom and compliance specs. When BuckBoost converter is disabled VPOS_IN_x, AVDD, and PVDD must be tied together.
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
DAC8775
www.ti.com
SLVSBY7 – FEBRUARY 2017
Recommended Operating Conditions (continued)
over operating free-air temperature range (unless otherwise noted)
MIN
DVDD to PBKG
Digital supply voltage to substrate
NOM
MAX
2.7
UNIT
5.5
V
DIGITAL INPUTS
VIH
Input high voltage
VIL
Input low voltage
2
V
0.6
V
4.95
5.05
V
-40
125
°C
REFERENCE INPUT
REFIN to PBKG
Reference input to substrate
TEMPERATURE RANGE
TA
Operating temperature
7.4 Thermal Information
DAC8775
THERMAL METRIC (1)
RWF (VQFN)
UNIT
72 PINS
RθJA
Junction-to-ambient thermal resistance
21.7
°C/W
RθJC(top)
Junction-to-case (top) thermal resistance
3.3
°C/W
RθJB
Junction-to-board thermal resistance
1.9
°C/W
ΨJT
Junction-to-top characterization parameter
0.1
°C/W
ΨJB
Junction-to-board characterization parameter
1.9
°C/W
RθJC(bot)
Junction-to-case (bottom) thermal resistance
0.2
°C/W
(1)
For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report.
7.5 Electrical Characteristics
AVDD/PVDD_x/VPOS_IN_x = +15 V, VNEG_IN_x = -15 V, VSENSEN_x = PBKG = PVSS_x = 0 V, External DVDD = 2.7 V.
VOUT : RL = 1 kΩ, CL = 200 pF, IOUT : RL = 250 Ω; all specifications -40℃ to +125℃, unless otherwise noted. REFIN= +5 V
external;, Buck-Boost Converter disabled unless otherwise stated
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
CURRENT OUTPUT
0
IOUT
Output Current Ranges
24
mA
0
20
mA
3.5
23.5
mA
-24
24
mA
4
20
mA
Accuracy
Resolution
INL
Relative Accuracy (1)
DNL
Differential Nonlinearity (1)
16
-12
12
LSB
Bipolar range only
-16
16
LSB
Ensured monotonic
-1
1
-0.14
0.14
%FSR
-40℃ to +125℃, 4 to 20 mA
-0.4
0.4
%FSR
TA = +25℃, 4 to 20 mA
-0.2
0.2
%FSR
-0.12
0.12
%FSR
-0.1
0.1
%FSR
-40℃ to +125℃
TUE
Total Unadjusted Error (1)
TA = +25°C
OE
Offset Error (1)
OE-TC
Offset Error Temperature Coefficient
(1)
Bits
All ranges except bipolar range
-40℃ to +125℃
TA = +25°C
-40℃ to +125℃
-0.05
0.05
4
LSB
%FSR
ppm FSR/ºC
For current output all ranges except ±24 mA, low code of 256d and a high code of 65535d are used, for ±24 mA range low code of 0d
and a high code of 65535d. For voltage output, low code of 256d and a high code of 65535d are used
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
7
DAC8775
SLVSBY7 – FEBRUARY 2017
www.ti.com
Electrical Characteristics (continued)
AVDD/PVDD_x/VPOS_IN_x = +15 V, VNEG_IN_x = -15 V, VSENSEN_x = PBKG = PVSS_x = 0 V, External DVDD = 2.7 V.
VOUT : RL = 1 kΩ, CL = 200 pF, IOUT : RL = 250 Ω; all specifications -40℃ to +125℃, unless otherwise noted. REFIN= +5 V
external;, Buck-Boost Converter disabled unless otherwise stated
PARAMETER
ZCE
Zero Code Error
ZCE-TC
Zero Code Error Temperature
Coefficient
TEST CONDITIONS
Gain Error (2)
Gain Error Temperature Coefficient
Positive Full Scale Error
NFSE
Negative Full Scale Error
PFSE-TC
Positive Full Scale Error Temperature
Coefficient
NFSE-TC
Negative Full Scale Error Temperature
Coefficient
BPZE
Bipolar Zero Error
BPZE-TC
Bipolar Zero Error Temperature
Coefficient
uA
-18
18
uA
TA = 25℃, 0x0000h into DAC
1.2
m%FSR
TA = 25℃, 0x0000h into DAC, 4 to 20
mA
1.8
m%FSR
4
ppm/ºC
0x0000h into DAC, -40℃ to +125℃
-40℃ to +125℃, 4 to 20 mA
TA = +25℃, 4 to 20 mA
-0.125
0.125
%FSR
-0.25
0.25
%FSR
-0.2
0.2
%FSR
-0.12
0.12
%FSR
-40℃ to +125℃
0xFFFFh into DAC, -40℃ to +125℃, 4
to 20 mA
3
ppm FSR/ºC
-0.125
0.125
%FSR
-0.25
0.25
%FSR
0xFFFFh into DAC, TA = 25℃
0.016
%FSR
0xFFFFh into DAC, TA = 25℃, 4 to 20
mA
0.024
%FSR
0x0000h into DAC, Bipolar range only,
-40℃ to +125℃
-0.125
0x0000h into DAC, Bipolar range only,
TA = 25℃
0.125
0.02
Bipolar range only
%FSR
ppm FSR/ºC
5
ppm FSR/ºC
Bipolar range only, 0x8000h into DAC 40℃ to +125℃
-0.05
0.05
Bipolar range only, 0x8000h into DAC,
TA = +25°C
-0.02
0.02
%FSR
0x8000h into DAC,-40℃ to +125℃
Compliance Voltage
Output = ±24 mA
%FSR
5
4
Output = 24 mA
VCL
UNIT
-40℃ to +125℃, 0x0000h into DAC, 4
to 20 mA
0xFFFFh into DAC, -40℃ to +125℃
PFSE
MAX
15
TA = +25°C
GE-TC
TYP
-15
-40℃ to +125℃
GE
MIN
-40℃ to +125℃, 0x0000h into DAC
|VNEG_
IN_x|+3
All except ±24 mA range
ppm/ºC
VPOS_I
N_x-3
V
VPOS_I
N_x-3
V
1.2
RL
Resistive Load
DC-PSRR
DC Power Supply Rejection Ratio
Code = 0x8000, 20 mA range
0.1
µA/V
ZO
Output Impedance
Code = 0x8000
10
MΩ
IOLEAK
Output Current Leakage
Iout is disabled or in power-down
1
nA
±24 mA range
0.625
KΩ
HART INTERFACE
VHART-IN HART Input
Corresponding Output
(2)
8
400
HART In = 500 mVpp 1.2 KHz
500
1
600
mVpp
mApp
No load, DVDD supply ramps up before VPOS_IN_x,and VNEG_IN_x, ramp rate of VPOS_IN_x,and VNEG_IN_x limited to 18 V/msec
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
DAC8775
www.ti.com
SLVSBY7 – FEBRUARY 2017
Electrical Characteristics (continued)
AVDD/PVDD_x/VPOS_IN_x = +15 V, VNEG_IN_x = -15 V, VSENSEN_x = PBKG = PVSS_x = 0 V, External DVDD = 2.7 V.
VOUT : RL = 1 kΩ, CL = 200 pF, IOUT : RL = 250 Ω; all specifications -40℃ to +125℃, unless otherwise noted. REFIN= +5 V
external;, Buck-Boost Converter disabled unless otherwise stated
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
VOLTAGE OUTPUT
Voltage Output Ranges (normal mode)
VOUT
Voltage Output Ranges (Overrange
mode)
0
5
V
0
10
V
-5
5
V
-10
10
V
0
6
V
0
12
V
-6
6
V
-12
12
V
12
LSB
Accuracy
Resolution
16
INL
Relative Accuracy, INL (1)
DNL
Differential Nonlinearity, DNL (1)
TUE
ZCE
ZCE-TC
BPZE
Total Unadjusted Error, TUE (1)
Zero Code Error
(3)
Zero Code Error Temperature
Coefficient
Bipolar Zero Error
BPZE-TC
Bipolar Zero Error Temperature
Coefficient
GE
Gain Error (1)
GE-TC
Gain Error Temperature Coefficient
PFSE
NFSE
PFSE-TC
NFSE-TC
Positive Full Scale Error
Negative Full Scale Error (3)
Positive Full Scale Error Temperature
Coefficient
Negative Full Scale Error Temperature
Coefficient
Headroom
(3)
Bits
-12
Ensured monotonic
-40℃ to +125℃, VOUT unloaded
TA = +25°C, VOUT unloaded
Unipolar ranges only, VOUT unloaded,
-40℃ to +125℃
-1
-0.1
1
±0.05
LSB
0.1
%FSR
-0.075
0.075
%FSR
-2.5
2.5
Unipolar ranges only, VOUT unloaded,
TA = 25℃
0.14
Unipolar ranges only, -40℃ to +125℃
2
mV
mV
ppm FSR/ºC
Bipolar range only, 0x8000h into DAC 40℃ to +125℃, VOUT unloaded
-0.03
0.03
%FSR
Bipolar range only, 0x8000h into DAC,
TA = +25°C, VOUT unloaded
-0.025
0.025
%FSR
Bipolar range only, 0x8000h into DAC,
-40℃ to +125℃, VOUT unloaded
-40℃ to +125℃, VOUT unloaded
TA = +25°C, VOUT unloaded
1
-0.1
0.1
%FSR
-0.07
0.07
%FSR
-40℃ to +125℃
0xFFFFh into DAC, -40℃ to +125℃,
VOUT unloaded
3
-0.1
0xFFFFh into DAC, TA = 25℃, VOUT
unloaded
Bipolar ranges only, 0x0000h into
DAC, -40℃ to +125℃, VOUT
unloaded
ppm FSR/ºC
ppm FSR/ºC
0.1
0.03
-0.06
%FSR
%FSR
0.06
%FSR
Bipolar ranges only, 0x0000h into
DAC, TA = 25℃, VOUT unloaded
0.002
VOUT unloaded, -40℃ to +125℃
2
ppm FSR/ºC
2
ppm FSR/ºC
VOUT unloaded, -40℃ to +125℃
%FSR
Output unloaded, VPOS_IN_x with
respect to VOUT_x, 0xFFFFh into
DAC, No load
0.5
V
Output unloaded, VPOS_IN_x with
respect to VOUT_x, 0xFFFFh into
DAC, 1 kΩ load
3
V
DAC code at 0d, this error includes offset error of the DAC since the DAC is linear between 0d to 65535d
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
9
DAC8775
SLVSBY7 – FEBRUARY 2017
www.ti.com
Electrical Characteristics (continued)
AVDD/PVDD_x/VPOS_IN_x = +15 V, VNEG_IN_x = -15 V, VSENSEN_x = PBKG = PVSS_x = 0 V, External DVDD = 2.7 V.
VOUT : RL = 1 kΩ, CL = 200 pF, IOUT : RL = 250 Ω; all specifications -40℃ to +125℃, unless otherwise noted. REFIN= +5 V
external;, Buck-Boost Converter disabled unless otherwise stated
PARAMETER
Footroom
TEST CONDITIONS
RL
Capacitive Load Stability
MAX
UNIT
V
Unipolar ranges only, VNEG_IN_x with
respect to VOUT_x, 0x0000h into DAC
5
V
17
23
mA
SCLIM[1:0] = "01" (see register map)
8
11
mA
SCLIM[1:0] = "10" (see register map)
22
28
mA
SCLIM[1:0] = "11" (see register map)
26
34
mA
Load
CL
TYP
3
SCLIM[1:0] = "00" (see register map)
Short-Circuit Current
MIN
Bipolar, ranges only, VNEG_IN_x with
respect to VOUT_x, 0x0000h into DAC
1
kΩ
RL = Open
20
nF
RL = 1 kΩ
20
nF
1
µF
RL = 1 kΩ with External compensation
capacitor (150 pF) connected
Voltage output enabled, VOUT = Mid
Scale, UP10V range
ZO
DC Output Impedance
ILEAK
Output Leakage (VOUT_x Pin)
DC-PSRR
DC Power Supply Rejection Ratio
No output load
VSENSEP Impedance
VSENSEN Impedance
0.01
Ω
Voltage output disabled (POC = '1')
50
MΩ
Voltage output disabled (POC = '0')
30
kΩ
Voltage output disabled (POC = '1')
1
nA
10
µV/V
VOUT enabled Mid-Scale UP10
240
kΩ
VOUT enabled Mid-Scale UP10
120
kΩ
VOUT = Full scale, BP12V range, per
channel
0.35
mA
100
pF
EXTERNAL REFERENCE INPUT
IREF
External Reference Current
Reference Input Capacitance
INTERNAL REFERENCE OUTPUT
VREF
Reference Output
VREF-TC
Reference TC
DAC Voltage Output Total Unadjusted
Error (1)
TUE
TA = 25°C
4.99
5.01
TA = -40℃ to +125℃
-13
13
ppm/°C
V
TA = -25℃ to +125℃
-10
10
ppm/°C
-40°C to +125°C, VOUT_x unloaded,
Internal reference enabled
0.2
%FSR
-40°C to +125°C, Internal reference
enabled
0.2
%FSR
-40°C to +125°C, Internal reference
enabled, 4 mA to 20 mA range
0.5
%FSR
Output Noise (0.1 Hz to 10 Hz)
TA = 25°C
13
µV p-p
Noise Spectral Density
At 10 kHz, At 25°C
DAC Current Output Total Unadjusted
Error (1)
CL
Capacitive Load
IL
Load Current
200
nV/sqrtHz
600
nF
±5
mA
20
mA
Short Circuit Current
Ref-Out shorted to PBKG
Load Regulation
Sourcing and Sinking, TA = +25°C
5
µV/mA
Line Regulation
TA = +25°C
2
uV/V
BUCK BOOST CONVERTER
RON
Switch On Resistanvce
TA = +25°C
3
Ω
ILEAK
Switch Leakage Current
TA = +25°C
20
nA
L
Inductor
Between LP_x and LN_x
100
µH
10
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
DAC8775
www.ti.com
SLVSBY7 – FEBRUARY 2017
Electrical Characteristics (continued)
AVDD/PVDD_x/VPOS_IN_x = +15 V, VNEG_IN_x = -15 V, VSENSEN_x = PBKG = PVSS_x = 0 V, External DVDD = 2.7 V.
VOUT : RL = 1 kΩ, CL = 200 pF, IOUT : RL = 250 Ω; all specifications -40℃ to +125℃, unless otherwise noted. REFIN= +5 V
external;, Buck-Boost Converter disabled unless otherwise stated
PARAMETER
TEST CONDITIONS
MIN
TYP
TA = +25°C, PVDD = AVDD = 36 V,
Buck-Boost Converter enabled
ILMAX
Peak Inductor Current
VO
Output Voltage
VO
Output Voltage
CL
Load Capacitor
VPOS_IN_x and VNEG_IN_x
Start Up Time
After enabling VPOS_IN_x and
VNEG_IN_x with 10 µF load capacitor
on these pins
MAX
0.5
UNIT
A
VPOS_IN_x minimum
4
V
VPOS_IN_x maximum
32
V
VNEG_IN_x minimum
-18
V
VNEG_IN_x maximum
-5
V
10
µF
3
ms
5
V
DVDD LDO
VO
Output Voltage
ILOAD
Load Current
10
mA
CL
Load Capacitor
0.2
nF
THERMAL ALARM
Trip Point
150
°C
Hysteresis
15
°C
0.4
V
DIGITAL INPUTS
Hysteresis Voltage
Input Current
Input Current (DVDD_EN)
Pin Capacitance
-5
5
µA
-10
10
µA
Per pin
10
pF
DIGITAL OUTPUTS
SDO
VOL
Output Low Voltage
VOH
Output High Voltage
ILEAK
High Impedance Leakage
Sinking 200 µA
Sourcing 200 µA
0.4
DVDD0.5
V
-5
High Impedance Output Capacitance
V
5
10
µA
pF
ALARM
VOL
Output Low Voltage
0.4
V
ILEAK
High Impedance Leakage
At 2.5 mA
50
µA
High Impedance Output Capacitance
10
pF
5
mA
POWER REQUIREMENTS
IAVDD+IP
VDD
Current Flowing into AVDD and PVDD
All Buck-Boost converter positive
output enabled, IOUT_x mode
operation, All IOUT channels enabled,
0 mA, PVDD = AVDD = 12 V, Internal
reference, VNEG_IN_x = 0 V
All IOUT Active, 0 mA, 0 to 24 mA
range, VNEG_IN_x = 0 V
IPVDD_x
Current Flowing into PVDD
IDVDD
Current Flowing into DVDD
IVPOS_IN
_x
Buck-Boost converter enabled, Peak
current
0.1
All digital pins at DVDD, DVDD = 5.5 V
1.8
VOUT active, No load, 0 to 10 V
range, Mid scale code
5
0.5
Buck-Boost converter disabled
IOUT active, 0 mA, 0 to 24 mA range
Current Flowing into VPOS_IN_x
3.5
mA
A
mA
mA
1.2
mA
3
mA
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
11
DAC8775
SLVSBY7 – FEBRUARY 2017
www.ti.com
Electrical Characteristics (continued)
AVDD/PVDD_x/VPOS_IN_x = +15 V, VNEG_IN_x = -15 V, VSENSEN_x = PBKG = PVSS_x = 0 V, External DVDD = 2.7 V.
VOUT : RL = 1 kΩ, CL = 200 pF, IOUT : RL = 250 Ω; all specifications -40℃ to +125℃, unless otherwise noted. REFIN= +5 V
external;, Buck-Boost Converter disabled unless otherwise stated
PARAMETER
TEST CONDITIONS
IVNEG_IN
Current Flowing into VNEG_IN_x
_x
MIN
TYP
IOUT active, 0 mA, ±24 mA range
VOUT active, No load, 0 to 10 V range,
Mid scale code
MAX
UNIT
1.2
mA
3
mA
1.1
W
PDISS
Power Dissipation (PVDD+AVDD)
All Buck-Boost converter positive
output enabled, IOUT_x mode
operation, All IOUT channels enabled,
Rload = 1 Ω, 24 mA, PVDD = AVDD =
12 V, Internal reference, VNEG_IN_x =
0V
IVSENSE
P
Current Flowing into VSENSEP
VOUT disabled
40
nA
IVSENSE
N
Current Flowing into VSENSEN
VOUT disabled
20
nA
0.86
DYNAMIC PERFORMANCE
Voltage Output
Tsett
Output Voltage Settling Time
Output Voltage Ripple
SR
Slew Rate
Power-On Glitch Magnitude
0 to10 V, to ±0.03% FSR RL = 1K||CL
= 200 pF
15
µs
0 to 5 V, to ±0.03% FSR RL = 1K||CL
= 200 pF
10
µs
-5 to 5 V, to ±0.03% FSR RL = 1K||CL
= 200 pF
15
µs
-10 to 10 V, to ±0.03% FSR RL =
1K||CL = 200 pF
30
µs
Buck-Boost converter enabled, 50
KHz, 20dB/decade filter on
VPOS_IN_x
2
mVpp
RL = 1K||CL = 200 pF
1
V/µs
(2)
0.1
Power-off Glitch Magnitude (4)
Channel to Channel DC Crosstalk
Full scale swing on adjacent channel
Code-to-Code Glitch
Digital Feedthrough
AC-PSRR
V
0.8
V
2
m%FSR
0.15
µV-sec
1
nV-sec
LSB p-p
Output Noise (0.1 Hz to 10 Hz
bandwidth)
UP10V, Mid scale
0.1
Output Noise (100 kHz bandwidth)
UP10V, Mid scale
200
µVrms
Output Noise Spectral Density
BP20V Measured at 10 kHz, Mid scale
200
nV/sqrtHz
AC Power Supply Rejection Ratio
200 mV 50/60Hz Sine wave
superimposed on power supply
voltage. (AC analysis)
-75
dB
24 mA Step, to 0.1% FSR, no L
10
µs
24 mA Step, to 0.1% FSR , L = 1 mH,
CL = 22 nF
50
µs
8
µApp
Current Output
Tsett
Output Current Settling Time
Output Current Ripple
Inductive Load (5)
L
AC-PSRR
(4)
(5)
12
Buck-Boost converter enabled, 50
KHz, 20dB/decade filter on
VPOS_IN_x
AC Power Supply Rejection Ratio
50
200 mV 50/60Hz Sine wave
superimposed on power supply
voltage.
-75
mH
dB
Vout disabled, no load, ramp rate of VPOS_IN_x,and VNEG_IN_x limited to 18 V/msec
680 nF is required at IOUT pin for 50 mH pure inductor load.
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
DAC8775
www.ti.com
SLVSBY7 – FEBRUARY 2017
7.6 Timing Requirements: Write and Readback Mode
At TA = –40°C to +125°C and DVDD = +2.7 V to +5.5 V, unless otherwise noted.
PARAMETER
TEST CONDITIONS
MIN
MAX
UNIT
25
MHz
fSCLK
Max clock frequency
t1
SCLK cycle time
40
ns
t2
SCLK high time
18
ns
t3
SCLK low time
18
ns
t4
SYNC falling edge to SCLK falling edge setup time
15
ns
t5
24th/32nd SCLK falling edge to SYNC rising edge
13
ns
t6
SYNC high time
40
ns
t7
Data setup time
8
ns
t8
Data hold time
5
ns
t9
SYNC rising edge to LDAC falling edge
33
ns
t10
LDAC pulse width low
10
t11
LDAC falling edge to DAC output response time
ns
50
See Electrical
Characteristics
ns
t12
DAC output settling time
t13
CLR high time
t14
CLR activation time
50
ns
t15
SCLK rising edge to SDO valid
14
ns
t16
SYNC rising edge to DAC output response time
50
ns
t17
LDAC falling edge to SYNC rising edge
t18
t19
10
µs
ns
100
ns
RESET pulse width
10
ns
SYNC rising edge to CLR falling/rising edge
60
ns
t1
SCLK
1
t6
2
24
t3
t4
t5
t2
SYNC
t7
SDIN
t8
t19
MSB
LSB
LDAC = 0
t12
t16
VOUT_x
t10
t9
LDAC
t17
t11
VOUT_x
t13
t19
t19
CLR
t14
VOUT_x
t18
RESET
VOUT_x
Figure 1. Write Mode Timing
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
13
DAC8775
SLVSBY7 – FEBRUARY 2017
SCLK
1
www.ti.com
2
24
1
2
24
SYNC
Read Command
SDIN
MSB
NOP Command
LSB
MSB
LSB
Readback Data
SDO
MSB
GARBAGE
LSB
t15
Figure 2. Readback Mode Timing
14
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
DAC8775
www.ti.com
SLVSBY7 – FEBRUARY 2017
7.7 Typical Characteristics
AVDD/PVDD_x/VPOS_IN_x = +15 V, VNEG_IN_x = –15 V, PBKG = PVSS_x = 0 V, External DVDD = 5 V, VOUT disabled,
IOUT RL = 250 Ω, TA = 25℃, REFIN = +5 V external, Buck-Boost Converter disabled, unless otherwise stated.
1.0
8
3.5 mA to 23.5 mA
6
4 mA to 20 mA
0 mA to 24 mA
0 mA to 20 mA
0.6
±24 mA
DNL Error (LSB)
INL Error (LSB)
4
0.8
2
0
-2
3.5 mA to 23.5 mA
4 mA to 20 mA
0 mA to 24 mA
0 mA to 20 mA
±24 mA
0.4
0.2
0.0
-0.2
-0.4
-4
-0.6
-6
-0.8
-8
-1.0
0
8192
16384
24576
32768
40960
49152
57344
0
65536
DAC Code
Figure 3. IOUT Linearity Error vs Digital Input Code
16384
24576
8.0
15
6.0
INL Error (LSB)
-5
49152
57344
65536
C001
3.5 mA to 23.5 mA
4 mA to 20 mA
0 mA to 24 mA
0 mA to 20 mA
±24 mA
4.0
0
40960
Figure 4. IOUT Differential Linearity Error vs Digital Input
Code
20
5
32768
DAC Code
10
TUE (m%FSR)
8192
C002
2.0
0.0
-2.0
-10
3.5 mA to 23.5 mA
4 mA to 20 mA
-4.0
-15
0 mA to 24 mA
0 mA to 20 mA
-6.0
±24 mA
-20
-8.0
0
8192
16384
24576
32768
40960
49152
57344
DAC Code
65536
±40
±10
5
0.8
40.0
0.6
30.0
0.4
20.0
TUE (m%FSR )
50.0
0.0
-0.2
-0.4
35
50
65
80
95
110
125
C007
Figure 6. IOUT Linearity Error vs Temperature
1.0
0.2
20
Temperature (oC)
Figure 5. IOUT Total Unadjusted Error vs Digital Input Code
DNL Error (LSB)
±25
C003
10.0
0.0
-10.0
-20.0
-0.6
-0.8
3.5 mA to 23.5 mA
4 mA to 20 mA
0 mA to 24 mA
0 mA to 20 mA
-30.0
-40.0
4 mA to 20 mA
0 mA to 24 mA
0 mA to 20 mA
±24 mA
±24 mA
-1.0
3.5 mA to 23.5 mA
-50.0
±40
±25
±10
5
20
35
50
65
Temperature (oC)
80
95
110
125
±40
Figure 7. IOUT Differential Linearity Error vs Temperature
±25
±10
5
20
35
50
65
80
95
110
Temperature (oC)
C007
125
C007
Figure 8. IOUT Total Unadjusted Error vs Temperature
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
15
DAC8775
SLVSBY7 – FEBRUARY 2017
www.ti.com
Typical Characteristics (continued)
50
50
40
40
30
30
Gain Error (m%FSR)
Offset Error (m%FSR)
AVDD/PVDD_x/VPOS_IN_x = +15 V, VNEG_IN_x = –15 V, PBKG = PVSS_x = 0 V, External DVDD = 5 V VOUT disabled,
IOUT RL = 250 Ω, TA = 25℃, REFIN= +5 V external, Buck-Boost Converter disabled, unless otherwise stated.
20
10
0
±10
±20
±30
±40
3.5 mA to 23.5 mA
4 mA to 20 mA
0 mA to 24 mA
0 mA to 20 mA
20
10
0
±10
±20
±30
±40
±24 mA
±50
±25
±10
5
20
35
50
65
80
95
110
Temperature (oC)
125
±40
±25
±10
5
50
4.0
40
3.0
30
2.0
1.0
0.0
-1.0
-2.0
0 mA to 24 mA
-4.0
0 mA to 20 mA
35
50
65
80
95
110
125
C007
Figure 10. IOUT Gain Error vs Temperature
5.0
-3.0
20
Temperature (oC)
Full Scale Error (m%FSR)
Zero Code Error (µA)
0 mA to 20 mA
±24 mA
C007
Figure 9. IOUT Offset Error vs Temperature
20
10
0
±10
±20
±30
±40
-5.0
3.5 mA to 23.5 mA
4 mA to 20 mA
0 mA to 24 mA
0 mA to 20 mA
±24 mA
±50
±40
±25
±10
5
20
35
50
65
80
95
110
Temperature (oC)
125
±40
±10
5
40
Negative Full Scale Error (m%FSR)
24
12
6
0
±6
±12
±24 mA
±24
±30
35
50
65
80
95
110
125
C007
Figure 12. IOUT Full Scale Error vs Temperature
50
18
20
Temperature (oC)
30
±18
±25
C007
Figure 11. IOUT Zero Code Error vs Temperature
Bipolar Zero Error (m%FSR)
4 mA to 20 mA
0 mA to 24 mA
±50
±40
30
20
10
0
±10
±20
±30
±24 mA
±40
±50
±40
±25
±10
5
20
35
50
65
Temperature (oC)
80
95
110
125
±40
±25
±10
5
20
35
50
65
Temperature (oC)
C007
Figure 13. IOUT Bipolar Zero Error vs Temperature
16
3.5 mA to 23.5 mA
80
95
110
125
C007
Figure 14. IOUT Negative Full Scale Error vs Temperature
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
DAC8775
www.ti.com
SLVSBY7 – FEBRUARY 2017
Typical Characteristics (continued)
AVDD/PVDD_x = VPOS_IN_x , VNEG_IN_x = PBKG = PVSS_x = 0 V, External DVDD = 5 V VOUT disabled, IOUT R L = 250
Ω, TA = 25℃, REFIN = +5 V external, Buck-Boost Converter disabled, unless otherwise stated.
1.0
8.0
0.8
6.0
0.6
4.0
DNL Error (LSB)
INL Error (LSB)
0.4
2.0
0.0
-2.0
-4.0
-6.0
0.2
0.0
-0.2
-0.4
3.5 mA to 23.5 mA
4 mA to 20 mA
-0.6
0 mA to 24 mA
0 mA to 20 mA
-0.8
-8.0
3.5 mA to 23.5 mA
4 mA to 20 mA
0 mA to 24 mA
0 mA to 20 mA
-1.0
12
14
16
18
20
22
24
26
28
30
VPOS (V)
12
32
14
16
18
20
22
24
26
28
30
VPOS (V)
C015
Figure 15. IOUT Linearity Error vs Power Supplies
32
C015
Figure 16. IOUT Differential Linearity Error vs Power
Supplies
1.0
8.0
0.8
6.0
0.6
4.0
DNL Error (LSB)
INL Error (LSB)
0.4
2.0
0.0
-2.0
-4.0
±24 mA
0.0
-0.2
-0.4
-0.6
-6.0
±24 mA
-0.8
-8.0
-1.0
12
12.5
13
13.5
14
14.5
15
15.5
16
16.5
17
17.5
VPOS (V)
12
18
12.5
13
13.5
14
14.5
15
15.5
16
16.5
17
17.5
VPOS (V)
C015
|VPOS_IN_x| = |VNEG_IN_x|
18
C015
|VPOS_IN_x| = |VNEG_IN_x|
Figure 17. IOUT Linearity Error vs Power Supplies
Figure 18. IOUT Differential Linearity Error vs Power
Supplies
50.0
50.0
40.0
40.0
30.0
30.0
20.0
20.0
TUE (m%FSR)
TUE (m%FSR)
0.2
10.0
0.0
-10.0
-20.0
10.0
0.0
-10.0
-20.0
-30.0
3.5 mA to 23.5 mA
4 mA to 20 mA
-30.0
-40.0
0 mA to 24 mA
0 mA to 20 mA
-40.0
-50.0
±24 mA
-50.0
12
14
16
18
20
22
24
VPOS (V)
26
28
30
32
12
12.5
13
13.5
14
14.5
15
15.5
16
16.5
17
17.5
VPOS (V)
C015
18
C015
|VPOS_IN_x| = |VNEG_IN_x|
Figure 19. IOUT Total Unadjusted Error vs Power Supplies
Figure 20. IOUT Total Unadjusted Error vs Power Supplies
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
17
DAC8775
SLVSBY7 – FEBRUARY 2017
www.ti.com
Typical Characteristics (continued)
AVDD/PVDD_x/VPOS_IN_x = +15 V, VNEG_IN_x = –15 V, PBKG = PVSS_x = 0 V, External DVDD = 5 V VOUT disabled,
IOUT RL = 250 Ω, TA = 25℃, REFIN = +5 V external, Buck-Boost Converter disabled, unless otherwise stated.
30
2.5
2.0
1.5
VPOS/ VNEG IDD (mA)
VPOS/ VNEG IDD (mA)
20
10
0
±10
IDD-VPOS
±20
1.0
0.5
0.0
-0.5
-1.0
IDD-VPOS
-1.5
IDD-VNEG
IDD-VNEG
-2.0
-2.5
±30
0
8192
16384
24576
32768
40960
49152
57344
DAC Code
65536
±40
±25
±10
5
20
±24 mA Range
35
50
65
Temperature (oC)
C001
80
95
110
125
C001
±24 mA Range, Mid Scale Code
Figure 21. IOUT Power Supply Current vs Digital Input Code
Figure 22. IOUT Power Supply Current vs Temperature
2.5
2.0
VPOS/ VNEG IDD (mA)
1.5
1.0
0.5
0.0
-0.5
-1.0
IDD-VPOS
-1.5
IDD-VNEG
-2.0
-2.5
12
13
14
15
16
17
VPOS (V)
18
C001
|VPOS_IN_x| = |VNEG_IN_x|, ±24 mA Range, Mid Scale Code
Figure 23. IOUT Power Supply Current vs Power Supplies Voltages
18
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
DAC8775
www.ti.com
SLVSBY7 – FEBRUARY 2017
Typical Characteristics (continued)
AVDD/PVDD_x/VPOS_IN_x = +15 V, VNEG_IN_x = –15 V, PBKG = PVSS_x = 0 V, External DVDD = 5 V VOUT disabled,
IOUT RL = 250 Ω, TA = 25℃, REFIN = +5 V external, Buck-Boost Converter disabled, unless otherwise stated.
0 mA to 24 mA (5 mA/div)
SYNC (5 V/div)
small signal settling (0.1 %FSR/div)
-24 mA to +24 mA (10 mA/div)
SYNC (5 V/div)
Time (2µs/ div)
Time (2 µs/div)
C001
C001
0-24 mA Range
AVDD/PVDD_x/VPOS_IN_x = +18 V, VNEG_IN_x = –18 V,
IOUT RL = 625 Ω
Figure 24. IOUT Full-Scale Settling Time, Rising Edge
Figure 25. IOUT Full-Scale Settling Time, Rising Edge
+24 mA to -24 mA (10 mA/div)
SYNC (5 V/div)
24 mA to 0 mA (5 mA/div)
SYNC (5 V/div)
small signal settling (0.1 %FSR/div)
Time (2 µs/div)
Time (2 µs/div)
C001
0-24 mA Range
C001
AVDD/PVDD_x/VPOS_IN_x = +18 V, VNEG_IN_x = –18 V,
IOUT RL = 625 Ω
Figure 26. IOUT Full-Scale Settling Time, Falling Edge
Figure 27. IOUT Full-Scale Settling Time, Falling Edge
IOUT (200 µA/div)
IOUT (400 µA/div)
SYNC (5 V/div)
SYNC (5 V/div)
Time (800 ns/div)
Time (800 ns/div)
C005
C005
0-24 mA Range, 8000h - 7FFFh
0-24 mA Range, 7FFFh - 8000h
Figure 28. IOUT Glitch Impulse, Rising Edge, 1LSB Step
Figure 29. IOUT Glitch Impulse, Falling Edge, 1LSB Step
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
19
DAC8775
SLVSBY7 – FEBRUARY 2017
www.ti.com
Typical Characteristics (continued)
AVDD/PVDD_x/VPOS_IN_x = +15 V, VNEG_IN_x = –15 V, PBKG = PVSS_x = 0 V, External DVDD = 5 V VOUT disabled,
IOUT RL = 250 Ω, TA = 25℃, REFIN = +5 V external, Buck-Boost Converter disabled, unless otherwise stated.
IOUT (8 µA/div)
SYNC (5 V/div)
AVDD (5 V/div)
IOUT (300 nA/div)
Time (2 ms/div)
Time (800 ns/div)
C005
C004
0-24 mA Range
Figure 30. IOUT Power-On Glitch
Figure 31. IOUT Enable Glitch
2500
IOUT (20 nA/div)
Noise PSD (nV/ sqrt-Hz)
2000
IOUT = 24 mA
IOUT = 12 mA
1500
IOUT = 0 mA
1000
500
0
Time (1 s/div)
10
100
1000
10000
100000
1000000
Frequency (Hz)
C001
C001
0-24 mA Range
0-24mA Range, Mid Scale Code
Figure 33. IOUT Noise Density vs Frequency
Figure 32. IOUT Noise, 0.1 Hz to 10 Hz
IOUT (3 µA/div)
SCLK (5 V/div)
Time (4 µs/div)
C004
0-24 mA Range, Mid Scale Code, SCLK = 1 MHz
Figure 34. Clock Feedthrough IOUT, 1MHz
20
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
DAC8775
www.ti.com
SLVSBY7 – FEBRUARY 2017
Typical Characteristics (continued)
AVDD/PVDD_x = +15 V, PBKG = PVSS_x = 0 V, External DVDD = 5 V, VOUT disabled, IOUT RL = 250 Ω, TA = 25℃, REFIN
= +5 V external, Buck-Boost Converter enabled (Full Tracking Mode), unless otherwise stated.
1.0
8
6
4 mA to 20 mA
0.8
0 mA to 24 mA
0 mA to 20 mA
0.6
±24 mA
DNL Error (LSB)
INL Error (LSB)
4
3.5 mA to 23.5 mA
2
0
-2
0.4
0.2
0.0
-0.2
-0.4
-4
-0.6
-6
-0.8
-8
3.5 mA to 23.5 mA
4 mA to 20 mA
0 mA to 24 mA
0 mA to 20 mA
±24 mA
-1.0
0
8192
16384
24576
32768
40960
49152
57344
DAC Code
0
65536
8192
16384
24576
32768
40960
49152
57344
65536
DAC Code
C002
Figure 35. IOUT Linearity Error vs Digital Input Code
C001
Figure 36. IOUT Differential Linearity Error vs Digital Input
Code
20
15
3.5 mA to 23.5 mA
4 mA to 20 mA
0 mA to 24 mA
0 mA to 20 mA
10
TUE (m%FSR)
±24 mA
5
0
-5
-10
-15
-20
0
8192
16384
24576
32768
40960
49152
DAC Code
57344
65536
C003
Figure 37. IOUT Total Unadjusted Error vs Digital Input Code
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
21
DAC8775
SLVSBY7 – FEBRUARY 2017
www.ti.com
Typical Characteristics (continued)
AVDD/PVDD_x = +15 V, PBKG = PVSS_x = 0 V, External DVDD = 5 V, VOUT disabled, IOUT RL = 250 Ω, TA = 25℃, REFIN
= +5 V external, Buck-Boost Converter enabled (Full Tracking Mode), unless otherwise stated.
-24 mA to +24 mA (8 mA/div)
0 mA to 24 mA (8 mA/div)
VNEG (5 V/div)
VPOS (2 V/div)
VPOS (5 V/div)
Time (200 µs/div)
Time (1 ms/div)
C001
0-24 mA Range
C001
IOUT RL = 625 Ω
Figure 38. IOUT Full-Scale Settling Time, Rising Edge
Figure 39. IOUT Full-Scale Settling Time, Rising Edge
+24 mA to -24 mA (8 mA/div)
VNEG (5 V/div)
VPOS (5 V/div)
24 mA to 0 mA (8 mA/div)
VPOS (2 V/div)
Time (2 µs/div)
Time (1 ms/div)
C001
0-24 mA Range
C001
IOUT RL = 625 Ω
Figure 40. IOUT Full-Scale Settling Time, Falling Edge
Figure 41. IOUT Full-Scale Settling Time, Falling Edge
2500
VPOS (20 mV/div)
IOUT (4 µA/div)
Noise PSD (nV/ sqrt-Hz)
2000
IOUT = 24 mA
IOUT = 12 mA
1500
IOUT = 0 mA
1000
500
0
10
100
1000
10000
100000
Time (1 µs/div)
1000000
Frequency (Hz)
C001
C001
0-24 mA Range
0-24 mA Range, Mid Scale Code
Figure 42. IOUT Noise Density vs Frequency
22
Submit Documentation Feedback
Figure 43. IOUT Ripple
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
DAC8775
www.ti.com
SLVSBY7 – FEBRUARY 2017
Typical Characteristics (continued)
AVDD/PVDD_x/VPOS_IN_x = +15 V, VNEG_IN_x = –15 V, VSENSEN_x = PBKG = PVSS_x = 0 V, External DVDD = 5 V.
VOUT No load, IOUT disabled; TA = 25℃, REFIN = +5 V external;, Buck-Boost Converter disabled unless otherwise stated.
1.0
8
0.8
6
0.6
DNL Error (LSB)
INL Error (LSB)
4
2
0
-2
-4
-6
0.2
0.0
-0.2
-0.4
±10 V
±5 V
-0.6
±10 V
±5 V
0 V to 10 V
0 V to 5 V
-0.8
0 V to 10 V
0 V to 5 V
-1.0
-8
0
8192
16384
24576
32768
40960
49152
57344
0
65536
DAC Code
6.0
10
4.0
INL Error (LSB)
15
5
0
-5
-10
32768
40960
49152
57344
65536
C001
2.0
0.0
-2.0
-4.0
±10 V
±5 V
-6.0
0 V to 10 V
0 V to 5 V
±5 V
0 V to 10 V
0 V to 5 V
-8.0
-20
0
8192
16384
24576
32768
40960
49152
57344
±40
65536
±25
±10
5
20
35
50
65
80
95
110
125
Temperature (oC)
DAC Code
C007
C003
Figure 47. VOUT Linearity Error vs Temperature
Figure 46. VOUT Total Unadjusted Error vs Digital Input
Code
1.0
50.0
0.8
40.0
0.6
30.0
0.4
20.0
TUE (m%FSR )
DNL Error (LSB)
24576
Figure 45. VOUT Differential Linearity Error vs Digital Input
Code
8.0
-15
16384
DAC Code
20
±10 V
8192
C002
Figure 44. VOUT Linearity Error vs Digital Input Code
TUE (m%FSR)
0.4
0.2
0.0
-0.2
-0.4
±10 V
±5 V
0 V to 10 V
0 V to 5 V
10.0
0.0
-10.0
-20.0
-0.6
±10 V
±5 V
-30.0
-0.8
0 V to 10 V
0 V to 5 V
-40.0
-1.0
-50.0
±40
±25
±10
5
20
35
50
65
Temperature (oC)
80
95
110
125
±40
±10
5
20
35
50
65
80
95
110
Temperature (oC)
C007
Figure 48. VOUT Differential Linearity Error vs Temperature
±25
125
C007
Figure 49. VOUT Total Unadjusted Error vs Temperature
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
23
DAC8775
SLVSBY7 – FEBRUARY 2017
www.ti.com
Typical Characteristics (continued)
AVDD/PVDD_x/VPOS_IN_x = +15 V, VNEG_IN_x = –15 V, VSENSEN_x = PBKG = PVSS_x = 0 V, External DVDD = 5 V.
VOUT No load, IOUT disabled; TA = 25℃, REFIN = +5 V external; Buck-Boost Converter disabled unless otherwise stated.
50
2.0
40
1.6
±5 V
0 V to 10 V
0 V to 5 V
1.2
Zero Code Error (mV)
Gain Error (m%FSR)
30
±10 V
20
10
0
±10
±20
0.0
-0.4
-0.8
-1.2
0 V to 10 V
±40
-1.6
0 V to 5 V
-2.0
±40
±25
±10
5
20
35
50
65
80
95
110
Temperature (oC)
125
±40
±25
±10
5
20
35
50
65
80
95
110
Temperature (oC)
C007
Figure 50. VOUT Gain Error vs Temperature
125
C007
Figure 51. VOUT Zero Code Error vs Temperature
50
30
40
±10 V
±5 V
24
30
0 V to 10 V
0 V to 5 V
18
Bipolar Zero Error (m%FSR)
Full Scale Error (m%FSR)
0.4
±30
±50
20
10
0
±10
±20
±30
±40
±50
12
6
0
±6
±12
±18
±10 V
±24
±5 V
±30
±40
±25
±10
5
20
35
50
65
80
95
110
Temperature (oC)
125
±40
±25
±10
5
20
40
20
30
15
20
10
10
5
VOUT (V)
25
±10
50
65
80
95
110
125
C007
Figure 53. VOUT Bipolar Zero Error vs Temperature
50
0
35
Temperature (oC)
C007
Figure 52. VOUT Full Scale Error vs Temperature
Negative Full Scale Error (m%FSR)
0.8
0
±5
±10
±20
±15
±30
±10 V
±5 V
±40
±20
±50
±25
±40
±25
±10
5
20
35
50
65
Temperature (oC)
80
95
110
125
SCLM = b'00
SCLM = b'11
±40
±32
±24
±16
SCLM = b'10
SCLM = b'01
±8
0
8
16
VOUT Load Current (mA)
C007
24
32
40
C001
±10-V Range, Full Scale Code for VOUT sourcing & Zero Scale
Code for VOUT Sinking
Figure 54. VOUT Negative Full Scale Error vs Temperature
Figure 55. VOUT Output Voltage vs Load Current
24
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
DAC8775
www.ti.com
SLVSBY7 – FEBRUARY 2017
Typical Characteristics (continued)
AVDD/PVDD_x/VPOS_IN_x = +15 V, VNEG_IN_x = –15 V, VSENSEN_x = PBKG = PVSS_x = 0 V, External DVDD = 5 V.
VOUT No load, IOUT disabled; TA = 25℃, REFIN = +5 V external; Buck-Boost Converter disabled unless otherwise stated.
1.0
8.0
0.8
6.0
0.6
4.0
DNL Error (LSB)
INL Error (LSB)
0.4
2.0
0.0
-2.0
0.2
0.0
-0.2
-0.4
-4.0
-6.0
±10 V
±5 V
-0.6
±10 V
±5 V
0 V to 10 V
0 V to 5 V
-0.8
0 V to 10 V
0 V to 5 V
-8.0
-1.0
12
12.5
13
13.5
14
14.5
15
15.5
16
16.5
17
17.5
VPOS (V)
12
18
12.5
13
13.5
14
14.5
|VPOS_IN_x| = VNEG_IN_x
15
15.5
16
16.5
17
17.5
VPOS (V)
C015
18
C015
|VPOS_IN_x| = VNEG_IN_x
Figure 56. VOUT Linearity Error vs Power Supplies
Figure 57. VOUT Differential Linearity Error vs Power
Supplies
50.0
4
40.0
3
VPOS/ VNEG IDD (mA)
30.0
TUE (m%FSR)
20.0
10.0
0.0
-10.0
-20.0
-30.0
±10 V
±5 V
-40.0
0 V to 10 V
0 V to 5 V
1
IDD-VPOS
0
IDD-VNEG
±1
±2
±3
-50.0
±4
12
12.5
13
13.5
14
14.5
15
15.5
16
16.5
17
17.5
VPOS (V)
18
0
8192
16384
24576
32768
40960
49152
57344
DAC Code
C015
|VPOS_IN_x| = VNEG_IN_x
65536
C001
|VPOS_IN_x| = VNEG_IN_x, 10-V Range
Figure 58. VOUT Total Unadjusted Error vs Power Supplies
Figure 59. VOUT Power Supply Current vs Digital Input
Code
5
5.0
4
4.0
3
3.0
VPOS/ VNEG IDD (mA)
VPOS/ VNEG IDD (mA)
2
2
1
IDD-VPOS
0
IDD-VNEG
±1
±2
2.0
1.0
IDD-VPOS
0.0
IDD-VNEG
-1.0
-2.0
±3
-3.0
±4
-4.0
-5.0
±5
±40
±25
±10
5
20
35
50
65
80
95
110
Temperature (oC)
125
12
Figure 60. VOUT Power Supply Current vs Temperature
14
15
16
17
VPOS (V)
C001
|VPOS_IN_x| = VNEG_IN_x, 10-V Range, Mid Scale Code
13
18
C001
|VPOS_IN_x| = VNEG_IN_x, 10-V Range, Mid Scale Code
Figure 61. VOUT Power Supply Current vs Power Supplies
Voltages
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
25
DAC8775
SLVSBY7 – FEBRUARY 2017
www.ti.com
Typical Characteristics (continued)
AVDD/PVDD_x/VPOS_IN_x = +15 V, VNEG_IN_x = –15 V, VSENSEN_x = PBKG = PVSS_x = 0 V, External DVDD = 5 V.
VOUT No load, IOUT disabled; TA = 25℃, REFIN = +5 V external;, Buck-Boost Converter disabled unless otherwise stated.
VOUT (2 V/div)
VOUT (2 V/div)
SYNC (5 V/div)
SYNC (5 V/div
small signal settling (0.1 %FSR/div)
small signal settling (0.1 %FSR/div)
Time (4 µs/div)
Time (4 µs/div)
C001
10-V Range, Load 1K//200pF
C001
10-V Range, Load 1K//200pF
Figure 62. VOUT Full-Scale Settling Time, Rising Edge
Figure 63. VOUT Full-Scale Settling Time, Falling Edge
VOUT (50 mV/div)
VOUT (50 mV/div)
SYNC (5 V/div)
SYNC (2 V/div)
Time (800 ns/div)
Time (800 ns/div)
C005
10-V Range, 7FFFh - 8000h
C005
10-V Range, 8000h - 7FFFh
Figure 64. VOUT Glitch Impulse, Rising Edge, 1LSB Step
Figure 65. VOUT Glitch Impulse, Falling Edge, 1LSB Step
VOUT (0.2 V/div)
SYNC (5 V/div)
AVDD (5 V/div)
VOUT (2 mV/div)
Time (1 ms/div)
Time (2 µs/div)
C005
C004
10V Range
Figure 66. VOUT Power-On Glitch
26
Submit Documentation Feedback
Figure 67. VOUT Enable Glitch
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
DAC8775
www.ti.com
SLVSBY7 – FEBRUARY 2017
Typical Characteristics (continued)
AVDD/PVDD_x/VPOS_IN_x = +15 V, VNEG_IN_x = –15 V, VSENSEN_x = PBKG = PVSS_x = 0 V, External DVDD = 5 V.
VOUT No load, IOUT disabled; TA = 25℃, REFIN = +5 V external; Buck-Boost Converter disabled unless otherwise stated.
1000
900
Noise PSD (nV/ sqrt-Hz)
800
VOUT (5 µv/div)
700
600
500
VOUT = 10 V
400
VOUT = 5 V
300
VOUT = 0 V
200
100
0
Time (1 s/div)
10
100
1000
10000
100000
1000000
Frequency (Hz)
C001
C001
10-V Range
10-V Range, Mid Scale Code
Figure 69. VOUT Noise Density vs Frequency
Figure 68. VOUT Noise, 0.1 Hz to 10 Hz
VOUT (2 mV/div)
SCLK (5 V/div)
Time (4 µs/div)
C004
10-V Range, Mid Scale Code, SCLK = 1MHz
Figure 70. Clock Feedthrough VOUT, 1MHz
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
27
DAC8775
SLVSBY7 – FEBRUARY 2017
www.ti.com
Typical Characteristics (continued)
AVDD/PVDD_x = +15 V, VSENSEN_x = PBKG = PVSS_x = 0 V, External DVDD = 5 V. VOUT No load, IOUT disabled; T A =
25℃, REFIN = +5 V external; Buck-Boost Converter enabled (Full Tracking Mode), unless otherwise stated.
1.0
8
6
±10 V
±5 V
0.8
0 V to 10 V
0 V to 5 V
0.6
DNL Error (LSB)
INL Error (LSB)
4
2
0
-2
0.4
0.2
0.0
-0.2
-0.4
-4
-6
-8
±10 V
±5 V
-0.8
0 V to 10 V
0 V to 5 V
-1.0
0
8192
16384
24576
32768
40960
49152
57344
DAC Code
0
65536
16384
24576
15
3000
Noise PSD (nV/ sqrt-Hz)
10
5
0
-5
±5 V
0 V to 10 V
0 V to 5 V
40960
49152
57344
65536
C001
Figure 72. VOUT Differential Linearity Error vs Digital Input
Code
3500
±10 V
32768
DAC Code
20
-10
8192
C002
Figure 71. VOUT Linearity Error vs Digital Input Code
TUE (m%FSR)
-0.6
VOUT = 10 V
2500
VOUT = 5 V
2000
VOUT = 0 V
1500
1000
500
-15
-20
0
0
8192
16384
24576
32768
DAC Code
40960
49152
57344
10
65536
100
1000
10000
100000
1000000
Frequency (Hz)
C003
C001
10-V Range
Figure 73. VOUT Total Unadjusted Error vs Digital Input
Code
Figure 74. VOUT Noise Density vs Frequency
VNEG (0.2 V/div)
VPOS (0.2 V/div)
VOUT (1 mV/div)
Time (1 ms/div)
C001
10-V Range, Mid Scale Code
Figure 75. VOUT Ripple
28
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
DAC8775
www.ti.com
SLVSBY7 – FEBRUARY 2017
Typical Characteristics (continued)
5.004
5.015
5.002
5.012
Reference Output Voltage (V)
Reference Output Voltage (V)
AVDD/PVDD_x/VPOS_IN_x = +15 V, VNEG_IN_x = –15 V, PBKG = PVSS_x = 0 V, External DVDD = 5 V. VOUT disabled,
IOUT disabled, TA = 25℃, Buck-Boost Converter disabled, unless otherwise stated.
5.000
4.998
4.996
4.994
4.992
4.990
4.988
5.009
5.006
5.003
VREF
5.000
4.997
4.994
4.991
4.986
4.988
4.984
4.985
±40
±25
±10
5
20
35
50
65
80
95
110
Temperature (oC)
125
±5
±4
±3
±2
±1
0
1
2
3
4
5
Load Current (mA)
C001
C001
30 Units
Figure 76. Internal Reference Voltage vs Temperature
Figure 77. Internal Reference Voltage vs Load Current
5.015
2500
5.009
2000
Noise PSD (nV/ sqrt-Hz)
Reference Output Voltage (V)
5.012
5.006
5.003
VREF
5.000
4.997
4.994
4.991
VREF
1500
1000
500
4.988
4.985
0
12
15
18
21
24
AVDD (V)
27
30
33
10
36
100
1000
Figure 78. Internal Reference Voltage vs Power Supply
10000
100000
1000000
Frequency (Hz)
C001
C001
Figure 79. Internal Reference Noise Density vs Frequency
VREF (5 µv/div)
Time (1 s/div)
C001
Figure 80. Internal Reference Noise, 0.1 Hz to 10 Hz
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
29
DAC8775
SLVSBY7 – FEBRUARY 2017
www.ti.com
Typical Characteristics (continued)
AVDD/PVDD_x = +15 V, PBKG = PVSS_x = 0 V, External DVDD = 5 V, VOUT disabled, IOUT RL = 250Ω, TA = 25℃, BuckBoost Converter enabled (Full Tracking Mode), unless otherwise stated.
2500
VPOS (20 mV/div)
Noise PSD (nV/ sqrt-Hz)
2000
VREF
VREF (1mV/ div)
1500
1000
500
0
10
100
1000
10000
Frequency (Hz)
100000
Time (1 µs/div)
1000000
C001
C001
0-24 mA Range, Full Scale Code on all channels
0-24 mA Range, Full Scale Code on all channels
Figure 81. Internal Reference Noise Density vs Frequency
30
Submit Documentation Feedback
Figure 82. Internal Reference Ripple
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
DAC8775
www.ti.com
SLVSBY7 – FEBRUARY 2017
Typical Characteristics (continued)
AVDD/PVDD_x = +15 V, PBKG = PVSS_x = 0 V, External DVDD = 5 V, TA = 25℃, Buck-Boost Converter enabled (Full
Tracking Mode), unless otherwise stated.
VNEG (2 V/div)
VNEG (2 V/div)
VPOS (1 V/div)
VPOS (1 V/div)
SYNC (5 V/div)
SYNC (5 V/div)
Time (2 ms/div)
Time (2 ms/div)
C001
C001
Figure 83. Buck-Boost Converter Power-On (IOUT Mode)
Figure 84. Buck-Boost Converter Power-On (VOUT Mode)
4000
160
IOUT = 24 mA, 1k
140
IOUT = 12 mA, 1k
120
IOUT = 24 mA, 250
100
IOUT = 12 mA, 250
VPOS Noise PSD (µV/ sqrt-Hz)
VPOS Noise PSD (µV/ sqrt-Hz)
180
IOUT = 0 mA
80
60
40
20
3500
VOUT = 10 V
3000
VOUT = 5 V
VOUT = 0 V
2500
2000
1500
1000
500
0
0
±20
10
100
1000
10000
100000
1000000
Frequency (Hz)
10
100
1000
10000
100000
1000000
Frequency (Hz)
C001
0-24 mA Range, RL = 250 Ω
C001
10-V Range, No Load
Figure 85. VPOS Noise Density (IOUT Mode) vs Frequency
Figure 86. VPOS Noise Density (VOUT Mode) vs Frequency
450
VNEG Noise PSD (µV/ sqrt-Hz)
400
VOUT = 10 V
350
VOUT = 5 V
300
VOUT = 0 V
250
200
150
100
50
0
10
100
1000
10000
Frequency (Hz)
100000
1000000
C001
10-V Range, No Load
Figure 87. VNEG Noise Density (VOUT Mode) vs Frequency
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
31
DAC8775
SLVSBY7 – FEBRUARY 2017
www.ti.com
Typical Characteristics (continued)
AVDD/PVDD_x = +15 V, VNEG_IN_x = PBKG = PVSS_x = 0 V, External DVDD = 5 V, VOUT disabled, IOUT enabled 0-24
mA Range, TA = 25℃, REFIN = +5 V external, Buck-Boost Converter VPOS_IN_x enabled (Full Tracking Mode), unless
otherwise stated.
100
100
90
PVDD =12V, RL=1k
PVDD=24V, RL=250
PVDD=24V, RL=1k
PVDD =36V, RL=250
PVDD =36V, RL=1k
90
80
80
70
VPOS Efficiency (%)
IOUT Efficiency (%)
PVDD =12V, RL=250
60
50
40
30
60
50
40
PVDD =12V, RL=250
30
20
20
10
10
PVDD =12V, RL=1k
PVDD=24V, RL=250
PVDD=24V, RL=1k
PVDD =36V, RL=250
PVDD =36V, RL=1k
0
0
0
2
4
6
8
10
12
14
16
18
20
22
IOUT (mA)
24
0
2
Figure 88. IOUT Efficiency vs Load Current
8
10
12
14
16
18
20
22
IOUT (mA)
24
C001
Figure 89. VPOS Efficiency (IOUT Mode) vs Load Current
PVDD =12V, RL=250
PVDD =12V, RL=1k
PVDD=24V, RL=250
PVDD=24V, RL=1k
PVDD =36V, RL=250
PVDD =36V, RL=1k
90
VPOS DCDC Efficiency (%)
80
70
60
50
40
30
80
70
60
50
40
30
PVDD =12V, RL=250
PVDD =12V, RL=1k
20
PVDD=24V, RL=250
PVDD=24V, RL=1k
10
10
PVDD =36V, RL=250
PVDD =36V, RL=1k
0
0
20
±40
±25
5
±10
20
35
50
65
80
95
110
Temperature (oC)
Full Scale Code
125
±40
±25
±10
5
IOUT = 24 mA
Full Scale Code
Figure 90. IOUT Efficiency vs Temperature
20
35
50
65
80
95
110
Temperature (oC)
C001
125
C001
IOUT = 24 mA
Figure 91. VPOS Efficiency (IOUT Mode) vs Temperature
2500
4000
PVDD=12V, RL=250
2250
PVDD=12V, RL=1k
PVDD Power Dissipation (mW)
PVDD Power Dissipation (mW)
6
100
90
2000
PVDD=24V, RL=250
1750
PVDD=24V, RL=1k
1500
PVDD=36V, RL=250
1250
PVDD=36V, RL=1k
1000
750
500
250
3600
PVDD=12V, RL=250
PVDD=12V, RL=1k
3200
PVDD=24V, RL=250
PVDD=24V, RL=1k
2800
PVDD=36V, RL=250
PVDD=36V, RL=1k
2400
2000
1600
1200
800
400
0
0
0
2
4
6
8
10
12
14
IOUT (mA)
Full Scale Code
16
18
20
22
24
±40
±25
±10
5
20
35
50
65
Temperature (oC)
C001
IOUT = 24 mA
80
95
110
125
C001
Full Scale Code, 24 mA on all channels
Figure 92. PVDD Power Loss (IOUT Mode) vs Load Current
32
4
C001
100
IOUT Efficiency (%)
70
Figure 93. PVDD Power Loss (IOUT Mode) vs Temperature
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
DAC8775
www.ti.com
SLVSBY7 – FEBRUARY 2017
Typical Characteristics (continued)
50
100
46
90
42
80
PVDD = 12 V
38
70
PVDD = 24 V
60
PVDD = 36 V
VPOS Efficiency (%)
Die Temperature (oC)
AVDD/PVDD_x = +15 V, PBKG = PVSS_x = 0 V, External DVDD = 5 V, VOUT enabled, 10-V Range, Load 1K//200pF, IOUT
disabled, TA = 25℃, REFIN = +5 V external, Buck-Boost Converter enabled (Full Tracking Mode), unless otherwise stated.
34
30
26
50
40
22
PVDD=12V, RL=250
PVDD=12V, RL=1k
18
PVDD=24V, RL=250
PVDD=24V, RL=1k
20
14
PVDD=36V, RL=250
PVDD=36V, RL=1k
10
10
30
0
0
2
4
6
8
10
12
14
16
18
20
22
IOUT (mA)
24
0
1
2
3
4
5
6
7
8
9
VOUT Load (mA)
C001
10
C001
VOUT disabled, IOUT = 24 mA (all channels), VNEG_IN_x = 0 V
Figure 94. Intenal Die Temperature (IOUT Mode) vs Load
Current
Figure 95. VPOS Efficiency (VOUT Mode) vs Load Current
2000
1800
PVDD = 12 V
1800
1600
PVDD = 24 V
1600
1400
PVDD = 36 V
PVDD Power Dissipation (mW)
PVDD Power Dissipation (mW)
2000
1200
1000
800
600
400
200
0
1400
1200
1000
800
600
PVDD = 12 V
400
PVDD = 24 V
200
PVDD = 36 V
0
0
1
2
3
4
5
6
7
8
9
VOUT Load (mA)
10
±40
±25
±10
5
20
Full Scale Code on all channels
35
50
65
80
95
110
Temperature (oC)
C001
125
C001
Full Scale Code on all channels
Figure 96. PVDD Power Loss (VOUT Mode) vs Load Current
Figure 97. PVDD Power Loss (VOUT Mode) vs Temperature
50
3.60
46
3.40
42
3.20
38
3.00
I-DVDD (mA)
Die Temperature (oC)
Forward Sweep
34
30
Reverse Sweep
2.80
2.60
26
PVDD = 12 V
22
PVDD = 24 V
2.20
18
PVDD = 36 V
2.00
2.40
1.80
14
1.60
10
0
1
2
3
4
5
6
VOUT Load (mA)
7
8
9
10
0.0
0.5
1.0
1.5
2.0
2.5
3.0
3.5
4.0
4.5
5.0
Logic Level (V)
C001
5.5
C001
All channels enabled
Figure 98. Internal Die Temperature (VOUT Mode) vs Load
Current
Figure 99. Power Supply Current (DVDD) vs Input Logic
Level
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
33
DAC8775
SLVSBY7 – FEBRUARY 2017
www.ti.com
8 Detailed Description
8.1 Overview
Each channel of DAC8775 consists of a resistor-string digital-to-analog converter (DAC) followed by buffer
amplifiers. The output of the buffer drives the current output stage and the voltage output amplifier. The resistorstring section is simply a string of resistors, each of value R, from REFIN to PBKG, as the Functional Block
Diagram illustrates. This type of architecture ensures DAC monotonicity. The 16-bit binary digital code loaded to
the DAC register determines at which node on the string the voltage is tapped off before being fed into the output
amplifier. The current output stage converts the output from the string to current using a precision current source.
The voltage output provides a voltage output to the external load. When the current output stage or the voltage
output stage is disabled, the respective output pin is in Hi-Z state. After power-on, both output stages are
disabled. Each channel of DAC8775 also contains a Buck-Boost converter which can be used to generate the
power supply for the current output stage and voltage output amplifier.
8.2 Functional Block Diagram
REFIN
Buck-Boost
Converters
VPOS_IN_x
Current
Source
Current Out
Voltage Out
IOUT_x
VOUT_x
VNEG_IN_x
AGND1
Copyright © 2016, Texas Instruments Incorporated
Figure 100. General Architecture
8.3 Feature Description
8.3.1 Current Output Stage
Each channel's current output stage consists of a pre-conditioner and a precision current source as shown in
Figure 101. This stage provides a current output according to the DAC code. The output range can be
programmed as 0 mA to 20 mA, 0 mA to 24 mA, 4 mA to 20 mA, 3.5 mA to 23.5 mA, or ±24 mA. In the current
output mode, the maximum compliance voltage on pin IOUT_x is between (-|VNEG_IN_x| + 3 V) ≤ |IOUT_x| ≤
(VPOS_IN_x – 3 V). This compliance voltage is automatically maintained when the Buck-Boost converter is used
to generate these supplies (see Buck-Boost Converter section). However, when using an external supply for
VPOS_IN_x pin (Buck-Boost converter disabled), the VPOS_IN_x and VNEG_IN_x supplies should be chosen
such that this compliance voltage is maintained.
34
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
DAC8775
www.ti.com
SLVSBY7 – FEBRUARY 2017
Feature Description (continued)
VPOS_IN_x
Rsense
Sourcing
PMOS
IOUT
DAC
Sinking
NMOS
Iload
Rload
Rsense
VNEG_IN_x
Copyright © 2016, Texas Instruments Incorporated
Figure 101. Current Output
The 16 bit data can be written to DAC8775 using address 0x05 (DAC data registers, see Table 5 and Table 6).
For a 0-mA to 20-mA output range:
ª CODE º
IOUT_x = 20 mA. « N »
¬ 2
¼
(1)
For a 0-mA to 24-mA output range:
ª CODE º
IOUT_x = 24 mA. « N »
¬ 2
¼
(2)
For a 3.5-mA to 23.5-mA output range:
ª CODE º
IOUT_x = 20 mA. « N » + 3.5 mA
¬ 2
¼
(3)
For a 4-mA to 20-mA output range:
ª CODE º
IOUT_x = 16 mA. « N » + 4 mA
¬ 2
¼
(4)
For a -24-mA to 24-mA output range:
ª CODE º
IOUT_x = 48 mA. «
» - 24 mA
¬ 2N ¼
(5)
Where:
• CODE is the decimal equivalent of the code loaded to the DAC.
• N is the bits of resolution; 16.
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
35
DAC8775
SLVSBY7 – FEBRUARY 2017
www.ti.com
Feature Description (continued)
8.3.2 Voltage Output Stage
The voltage output stage as conceptualized in Figure 102 provides the voltage output according to the DAC code
and the output range setting. The output range can be programmed as 0 V to +5 V or 0 V to +10 V for unipolar
output mode, and ±5 V or ±10 V for bipolar output mode. In addition, an option is available to increase the output
voltage range by 20%. The output current drive can be up to 10 mA. The output stage has short-circuit current
protection that limits the output current to 16 mA, this limit can be changed to 8 mA, 20 mA or 24mA via writing
bits 15 and 14 of address 0x04. This minimum headroom and footroom for the voltage output stage is
automatically maintained when the Buck-Boost converter is used to generate these supplies. However, when
using an external supply for VPOS_IN_x and VNEG_IN_x pin (Buck-Boost converter disabled) the minimum
headroom and footroom as per must be maintained. In this case, the Recommended Operating Conditions
shows the maximum allowable difference between VPOS_IN_x and VNEG_IN_x.
The voltage output is designed to drive capacitive loads of up to 1 μF. For loads greater than 20 nF, an external
compensation capacitor can be connected between CCOMP_x and VOUT_x to keep the output voltage stable at
the expense of reduced bandwidth and increased settling time. Note that, a step response (due to input code
change) on the voltage output pin loaded with large capacitive load (> 20 nF) will trigger the short circuit limit
circuit of the output stage. This will result in setting the short circuit alarm status bits. Therefore, it is
recommended to use slew rate control for large step change, when the voltage output pin is loaded with high
capacitive loads.
R3
120K
VSENSEP_X
S1
R2
120K
VOUT_X
DAC
R0
120K
R2
17K t 24K
RFB
60K
R1
120K
REFIN
S3
R1
42K - Open
VSENSEN_X
S2
Copyright © 2016, Texas Instruments Incorporated
Figure 102. Voltage Output
The VSENSEP_x pin is provided to enable sensing of the load. Ideally, it is connected to VOUT_x at the
terminals. Additionally, it can also be used to connect remotely to points electrically "nearer" to the load. This
allows the internal output amplifier to ensure that the correct voltage is applied across the load as long as
headroom is available on the power supply. However, if this line is cut, the amplifier loop would be broken.
Therefore, an optional resistor can be used between VOUT_x and VSENSEP_x to prevent this.
The VSENSEN_x pin can be used to sense the remote ground and offset the VOUT pin accordingly. The
VSENSEN_x pin can sense a maximum of ±7 V difference from the PBKG pin of the DAC8775.
The 16-bit data can be written to DAC8775 as shown in DAC data registers, see Table 5 and Table 6.
For unipolar output mode:
ª CODE º
VOUT_x = VREFIN.GAIN. «
»
¬ 2N ¼
(6)
For bipolar output mode:
ª CODE º
VOUT_x = VREFIN.GAIN. «
»
¬ 2N ¼
36
GAIN.VREFIN
2
Submit Documentation Feedback
(7)
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
DAC8775
www.ti.com
SLVSBY7 – FEBRUARY 2017
Feature Description (continued)
Where:
• CODE is the decimal equivalent of the code loaded to the DAC.
• N is the bits of resolution; 16.
• VREFIN is the reference voltage; for internal reference, VREFIN = +5 V.
• GAIN is automatically selected for a desired voltage output range as shown in Table 7.
8.3.3 Buck-Boost Converter
The DAC8775 includes a Buck-Boost Converter for each channel to minimize the power dissipation of the chip
and provides significant system integration. This Buck-Boost converter is based on a Single Inductor Multiple
Output (SIMO) architecture and requires a single inductor (per channel) to simultaneously generate all the analog
power supplies required by the chip. The Buck-Boost converters utilize three on-chip switches (shown in
Figure 103) which are synchronously controlled via current mode control logic. These converters are designed to
work in discontinuous conduction mode (DCM) with an external inductor (per channel) of value 100 µH
connected between LN_x and LP_x pins (see Buck-Boost Converter External Component Selection section). The
peak inductor current inductor is limited to a value of 0.5 A internally.
LP_x
LN_x
PVDD_x
VPOS_IN_x
External Inductor
PVSS_x
PVSS_x
External
Schottky
Diodes
VNEG_IN_x
x = {A,B,C,D}
Copyright © 2016, Texas Instruments Incorporated
Figure 103. Buck-Boost Converter
These Buck-Boost converters employ a variable switching frequency technique. This technique increases the
converter efficiency at all loads by automatically reducing the switching frequency at light loads and increasing it
at heavy loads. At no load condition, the converter stops switching completely until the load capacitor discharges
by a preset voltage. At this point the converter automatically starts switching and recharges the load capacitor(s).
In addition to saving power at all loads, this technique ensures low switching noise on the converter outputs at
light loads. The minimum load capacitor for these Buck-Boost converters is 10 µF. This capacitor must be
connected between the schottky diode(s) and ground (0 V) for each arm of each Buck-Boost converter (A, B, C,
D). The Buck-Boost converter, when enabled, generates ripple on the supply pins (VPOS_IN_x and
VNEG_IN_x). This ripples is typically attenuated by the power supply rejection ratio of the output amplifiers
(IOUT_x or VOUT_x) and appears as noise on the output pin of the amplifiers (IOUT_x and VOUT_x). A larger
load capacitor in combination with additional filter (see Application Information section) reduces the output ripple
at the expense of increasing settling time of the converter output.
The input voltage to the Buck-Boost converters (pin PVDD_x) can vary from +12 V to +36 V. These outputs can
be individually enabled or disabled via the user SPI interface (see Commands in Table 5 and Table 6).
8.3.3.1 Buck-Boost Converters Outputs
Each of the four Buck-Boost converters can be used to provide power to the current output stage or the voltage
output stage by enabling the respective Buck-Boost converter and connecting the power supplies as shown in
Figure 104. Additional passive filters can optionally be added between the schottky diode and input supply pins
(VPOS_IN_x and VNEG_IN_x) to attenuate the ripple feeding into the VPOS_IN_x and VNEG_IN_x pin.
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
37
DAC8775
SLVSBY7 – FEBRUARY 2017
www.ti.com
Feature Description (continued)
DAC8775
D1
Rfilt1
LN_x
Cfilt1
Cload
PVSS_x
VPOS_IN_x
D2
AGND_x
Rfilt2
LP_x
Cfilt2
Cload
PVSS_x
VNEG_IN_x
AGND_x
Copyright © 2016, Texas Instruments Incorporated
Figure 104. Buck-Boost Converter Positive and Negative Outputs
8.3.3.2 Selecting and Enabling Buck-Boost Converters
The analog outputs of the Buck-Boost converters can be enabled in two different ways: Current Output Mode or
Voltage Output Mode. Any and all combination of the DAC8775 Buck-Boost converters can be selected by
writing to address 0x06 (see Table 5). The positive/negative arm of the selected Buck-Boost converter can be
enabled via writing to address 0x07 (see Table 6). Note that, VNEG_IN_x is internally shorted to PBKG when the
negative arm of Buck-Boost converter is not enabled.
When used in voltage output mode, the Buck-Boost converter generates a constant ±15.0 V for the positive and
negative power supplies. Alternatively this constant voltage may be modified by the clamp register setting for
each channel.
When used in current output mode the Buck-Boost converter generates the positive and negative power supply
based on the RANGE setting, for example the negative power supply is only generated for ±24 mA range.
The minimum voltage that the Buck-Boost converter can generate on the VPOS_IN_x pin in 4.96 V with a typical
efficiency of 75% at PVDD_x = 12 V and a load current of 24 mA, thus significantly minimizing power dissipation
on chip. The maximum voltage that the Buck-Boost converter can generate on the VPOS_IN_x pin is 32 V.
Similarly, the minimum voltage that the Buck-Boost converter can generate on the VNEG_IN_x pin in –18.0 V.
The maximum voltage that the Buck-Boost converter can generate on the VNEG_IN_x pin in –5.0 V.
8.3.3.3 Configurable Clamp Feature and Current Output Settling Time
A large signal step on the output pin IOUT_x (for example 0 mA to 24 mA) with a load of 1 KΩ would require that
the respective Buck-Boost converter change the output voltage on the VPOS_IN_x pin from 4 V to 27 V. Thus,
the current output settling time will be dominated by the settling time of the VPOS_IN_x voltage. A trade off can
be made to reduce the settling time at the expense of power saving by increasing the minimum voltage that the
respective Buck-Boost converter generates on the positive output.
The DAC8775 implements a configurable clamp feature. This feature allows multiple modes of operation based
on CCLP[1:0] and HSCLMP bits (see Table 6).
8.3.3.3.1 Default Mode - CCLP[1:0] = "00" - Current Output Only
This is the default mode of operation, CCLP[1:0] = "00" for Buck-Boost converter is to be in full tracking mode.
The minimum voltage generated on VPOS_IN_x in this case is 4 V. The Buck-Boost converter varies the positive
and negative outputs adaptively such that the voltage across these outputs and IOUT_x pins is ≤ 3 V. This is
accomplished by internally feeding back the voltage across the current output PMOS and NMOS to the
respective Buck-Boost converter control circuit. For example, for a load current of 24 mA flowing through a load
resistance of 1 KΩ, the generated voltage at the VPOS_IN_x pin will be around 27 V.
38
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
DAC8775
www.ti.com
SLVSBY7 – FEBRUARY 2017
Feature Description (continued)
8.3.3.3.2 Fixed Clamp Mode - CCLP[1:0] = "01" - Current and Voltage Output
In this mode of operation, the user can over-ride the default operation by writing "01" to CCLP[1:0]. The minimum
voltage generated on VPOS_IN_x and VNEG_IN_x can be adjusted by writing to PCLMP[3:0] / NCLMP[3:0]
(address 0x07). The voltage setting for current output and voltage output are specified in Table 6.
8.3.3.3.3 Auto Learn Mode - CCLP[1:0] = "10" - Current Output Only
In this mode ,the device automatically senses the load on the current output terminal and sets the minimum
voltage generated on VPOS_IN_x terminals to a fixed value. The value is calculated such that for any code
change, the settling time is dependent only on the DAC settling time. For example, with a load of 250 Ω and a
maximum current of 24 mA, the Buck-Boost output voltage is set as 9 - 12 V. This achieves the maximum power
saving without sacrificing settling time because the Buck-Boost output is fixed.
In order to ensure the correct operation of auto-learn mode, following steps below must be followed.
1. The device must be enabled in full tracking mode, CCLP[1:0] = "00".
2. Current output is enabled and a code greater then 4000h should be written to the DAC.
3. Write CCLP[1:0] = "10" to enable auto learn mode.
At this point, the clamp register (PCLMP - address 0x07) is populated with the appropriate settings. The clamp
status bit CLST (address 0x0B) is set once the clamp register is populated indicating the completion of this
process. In this mode the PCLMP bits are read only. Typically, this process of sensing the load is done only once
after power up. In order to re initiate this process, the CCLP bits must be rewritten with "10".
8.3.3.3.4 High Side Clamp (HSCLMP)
The default maximum positive voltage that the Buck-Boost converter can generate is 32 V. However, this voltage
can be reduced to 26 V by writing '1' to HSCLMP bit (address 0x0E, Table 6). Note that this feature can be
enabled or disabled per channel by selecting the corresponding channel (address 0x03, Table 6).
8.3.3.4 Buck-Boost Converters and Open Circuit Current Output
In normal operating condition when current output is loaded with a resistive load, the Buck-Boost converter varies
the positive and negative outputs adaptively such that the voltage across these outputs and IOUT_x pins is ≤ 3
V. However, if the current output is in open circuit condition, the Buck-Boost converter output would rail to fixed
voltages as described in Table 1.
Table 1. Open Circuit IOUT with Buck-Boost Converter
BUCK-BOOST
POSITIVE ARM
BUCK-BOOST
NEGATIVE ARM
Enabled
Enabled
Enabled
Enabled
Enabled
Disabled
All ranges except ±24 mA
IOUT RANGE
IOUT PIN VOLTAGE
VPOS_IN_x
VNEG_IN_x
All Ranges
≥0V
20 V
–5 V
±24 mA only
<0V
4V
–20 V
≥0V
32 V
0V
8.3.4 Analog Power Supply
After power up it is required that a hardware reset is issued using the RESET pin.
The DAC8775 is design to operate with a single power supply (12 V to 36 V) using integrated Buck-Boost
converter. In this mode, pins PVDD_x and AVDD must be tied together and driven by the same power supply.
VPOS_INx and VNEG_IN_x will be enabled as programmed by the device registers. It is recommended that
DVDD is applied first to reduce output transients.
The DAC8775 can also be operated without using the integrated Buck-Boost converter. In this mode, pins
PVDD_x, AVDD, and VPOS_IN_x must be tied together and driven by the same power supply (12 V to 36 V). In
this mode in order to reduce output transients it is recommended that DVDD is applied first, followed by
VPOS_IN_x / PVDD_x / AVDD and finally REFIN. Note that in this mode, the minimum required head room and
foot room for the output amplifiers must be met.
Recommended Operating Conditions shows the maximum and minimum allowable limits for all the power
supplies when DAC8775 is powered using external power supplies.
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
39
DAC8775
SLVSBY7 – FEBRUARY 2017
www.ti.com
8.3.5 Digital Power Supply
The digital power supply to DAC8775 can be internally generated or externally supplied. This is determined by
the status of DVDD_EN pin.
When the DVDD_EN pin is left floating, the voltage on DVDD pin is generated via an internal LDO. The typical
value of the voltage generated on DVDD pin is 5 V. In this mode, the DVDD pin can also be used to power other
digital components on the board. The maximum drive capability of this pin is 10mA. Please note that to ensure
stability the minimum load capacitance on this pin is limited to 100 pF, where as the maximum load capacitance
is limited to 0.1 µF.
When the DVDD_EN pin is tied to 0 V, the internal LDO is disabled and the DVDD pin must be powered via an
external digital supply.
8.3.6 Internal Reference
The DAC8775 includes an integrated 5-V reference with an initial accuracy of ±10 mV maximum and a
temperature drift coefficient of 10 ppm/°C maximum. A buffered output capable of driving up to 5 mA is available
on REFOUT. The internal reference for DAC8775 is disabled by default. To enable the internal reference,
REF_EN bit on address 0x02h must be set to '1' (see Table 6).
8.3.7 Power-On-Reset
The DAC8775 contain power on reset circuits which is based on AVDD and DVDD power supplies. After poweron, the power-on-reset circuit ensures that all registers are at their default values (see Table 5). The current,
voltage output DACs, and the Buck-Boost converters are disabled. The current output pin is in high impedance
state.
The voltage output pin is in a 30kΩ-to-GND state; however, the VSENSEP_x pin is an open circuit. The voltage
output pin impedance may be changed to high-impedance by the POC bit setting.
8.3.8 ALARM Pin
The DAC8775 contains an ALARM pin. When one or more of following events occur, the ALARM pin is pulled
low:
1. The load on any channel's IOUT_x pin is in open circuit (> 500 µsec); or
2. The voltage at IOUT_x, when enabled, reaches a level where the accuracy of the output current would be
compromised. This condition is detected by monitoring internal voltage levels of the IOUT_x circuitry and will
typically be below the specified compliance voltage minimum of 3 V (> 500 µsec). Note that, when the buck
boost converter is enabled in full tracking mode (CCLP[1:0] = "00"), a transient alarm signal can be observed
during the current output transition. This condition occurs because the compliance voltage for current output
is violated as the buck boost converter is adjusting the power supply. Alternatively the alarm can be
programmed to only indicate an alarm once the DC/DC has reached saturation and the compliance voltage
condition is still being violated; or
3. The die temperature has exceeded +150°C; or
4. The SPI watchdog timer exceeded the timeout period (if enabled); or
5. The SPI frame error check (CRC) encountered an error (if enabled).
6. A short circuit current limit is reached (> 500 µsec) on any VOUT_x when enabled in voltage output mode.
7. The Buck-Boost converter has reached the maximum output voltage (set by bit HSCLMP, Table 6 address
0x0E).
When connecting the ALARM pins of multiple DAC8775 devices together, forming a wired-AND function, the host
processor should read the status register of each device to know all the fault conditions that are present.
The ALARM pin continuously monitors the above mentioned conditions and returns to open drain condition if the
alarm condition is removed (non-latched behavior - default). For condition (1) mentioned above and Buck-Boost
converter used to power the DAC, the ALARM pin if pulled low due to the alarm condition will remain pulled low
even after the alarm condition is removed (latched behavior). In this condition the alarm pin can be reset by
1. Resetting the corresponding fault bits in the status register (address 0x0B, Table 6); or
2. Performing software reset (write to address 0x01, Table 6); or
3. Toggling hardware reset pin; or
40
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
DAC8775
www.ti.com
SLVSBY7 – FEBRUARY 2017
4. Performing power on reset.
Note that if the alarm action bits are programmed to "10" (AC_IOC[1:0], the Buck-Boost converter and the current
output amplifier are automatically disabled upon the event of open circuit on current output. In this case, the
ALARM automatically resets to the default behavior (non-latched behavior).
8.3.9 Power GOOD Bits
Each Buck-Boost converter in DAC8775 has a read only bit called power good (PGx) (address 0x0B, Table 6).
This bit is set to logic '1' when both of the following conditions are met:
1. The VPOS_IN_x > 4 V (if enabled) and
2. The VNEG_IN_x < –3 V (if enabled)
The PGx bit indicates the status of the outputs of the enabled Buck-Boost converters. For example if the output
of Buck-Boost converter A is the only one enabled, then the PGA bit will be set to a logic '1' only after the
positive output pins of the Buck-Boost converter A are ≥ 3.0 V and the negative output pin of Buck-boost
converter A is ≤ -3.0 V.
8.3.10 Status Register
Since, DAC8775 contains one ALARM pin for the entire chip, the status of individual fault condition can be
checked using the status register. This register (see Register Maps and Bit Functions section) consists of five
types of ALARM status bits (Faults on current and voltage outputs , Over temperature condition, CRC errors,
Watchdog timeout and Buck-Boost converter power good) and two status bit (User toggle, Auto Learn status).
The device continuously monitors these conditions. When an alarm occurs, the ALARM pin is pulled low and the
corresponding status bit is set ('1'). Whenever one of these status bits is set, it remains set until the user clears it
by writing '1' to corresponding bit on address 0x0B. The status bit can also be cleared by performing a hardware
reset, software reset, or power-on reset, note that it takes a minimum of 8 µsec for the status register to get
reset. These bits are reasserted if the ALARM condition continues to exist in the next monitoring cycle.
8.3.11 Status Mask
The ALARM pin for DAC8775 is triggered by any of the alarm conditions (see ALARM Pin section). However,
these different alarm conditions can be masked from creating the alarm signal at the pin by using the status
mask register. The status mask register (address 0x0C, Table 6) has the same bit order as the status register
except that it can be set to mask any or all status bits that create the alarm signal.
8.3.12 Alarm Action
The DAC8775 implements an alarm action register (address 0x0D,Table 6). By writing to this register, the user
can select the action that the device will take automatically in case of a specific alarm condition. In case, different
setting are chosen for different alarm conditions, the following priority (high to low) will be considered when taking
action:
1. Over temperature alarm
2. Output fault alarm
3. CRC error/Watchdog timer fault alarm
This device also contains a 6-bit alarm code register (address 0x0E, Table 6) which can be loaded to the DACs if
the alarm action register is set to "01". Note that the alarm code, once set, remains set even if the alarm
condition is removed. Also note that the alarm action change to the programmed code is a step function even if
slew rate control is enabled.
8.3.13 Watchdog Timer
This feature is useful to ensure that communication between the host processor and the DAC8775 has not been
lost. It can be enabled by setting the WEN (address 0x03) bit to '1', see Table 6. The watchdog timeout period
can be set using the WPD[1:0] address 0x03) bits. The timer period is based off an internal oscillator with a
typical value of 8 MHz.
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
41
DAC8775
SLVSBY7 – FEBRUARY 2017
www.ti.com
If enabled, the chip must have an SPI frame with 0x10 as the write address byte written to the device within the
programmed timeout period. Otherwise, the ALARM pin asserts low and the WDT bit (address 0x0B) of the
status register is set to '1'. The WDT bit is set to '0' with a software/hardware reset, or by disabling the watchdog
timer (WEN = '0'), or powering down the device.
When using multiple DAC8775 devices in a daisy-chain configuration, the open-drain ALARM pins of all devices
can be connected together to form a wired-AND network. The watchdog timer can be enabled in any number of
the devices in the chain although enabling it in one device in the chain should be sufficient. The wired-AND
ALARM pin may get pulled low because of the simultaneous presence of different trigger conditions in the
devices in the daisy-chain. The host processor should read the status register of each device to know all the fault
conditions present in the chain.
8.3.14 Programmable Slew Rate
The slew rate control feature allows the user to control the rate at which the output voltage or current changes.
This feature is disabled by default and can be enabled for the selected channel by writing logic '1' to the SREN
bit at address 0x04 (see Table 6). With the slew rate control feature disabled, the output changes smoothly at a
rate limited by the output drive circuitry and the attached load.
With this feature enabled, the output does not slew directly between the two values. Instead, the output steps
digitally at a rate defined by bits [2:0] (SR_STEP) and bits [3:0] (SRCLK_RATE) on address 0x04 (see Table 6).
SR_RATE defines the rate at which the digital slew updates; SRCLK_STEP defines the amount by which the
output value changes at each update. Table 6 shows different settings for SRCLK_STEP and SR_RATE.
The time required for the output to slew over a given range can be expressed as Equation 8:
Slew Time =
Output Change
Step Size.Update Clock Frequency.LSB Size
(8)
Where:
• Slew Time is expressed in seconds
• Output Change is expressed in amps (A) for current output mode or volts (V) for voltage output mode
When the slew rate control feature is enabled, the output changes happen at the programmed slew rate. This
configuration results in a staircase formation at the output. If the CLR pin is asserted, the output slews to the
zero-scale value at the programmed slew rate. When a new DAC data is written, the output starts slewing to the
new value at the slew rate determined by the current DAC code and the new DAC data. The update clock
frequency for any given value is the same for all output ranges. The step size, however, varies across output
ranges for a given value of step size because the LSB size is different for each output range.
Note that disabling the slew rate feature while the DAC is executing the slew rate command will abort the slew
rate operation and the DAC output will stay at the last code after which the slew rate disable command was
acknowledged.
8.3.15 HART Interface
On the DAC8775, digital communication such as HART can be modulated onto the input signal for each channel.
In the case where the RANGE (address 0x04) bits are programmed such that the IOUT_x is enabled, the
external HART signal (ac voltage; 500 mVPP, 1200 Hz and 2200 Hz) can be capacitively coupled in through the
HARTIN_x pin and transferred to a current that is superimposed on the current output. The HARTIN_x pin has a
typical input impedance of 20 kΩ to 30 kΩ, depending on the selected current output range, which together with
the input capacitor used to couple the external HART signal into the HARTIN_x pin can be used to form a highpass filter to attenuate frequencies below the HART bandpass region. In addition to this filter, an external passive
filter is recommended to complete the filtering requirements of the HART specifications. Figure 105 illustrates the
output current versus time operation for a typical HART interface.
42
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
DAC8775
www.ti.com
Note:
SLVSBY7 – FEBRUARY 2017
DC current = 6 mA.
Figure 105. Output Current vs Time
The HART pin for the selected channel can be enabled by writing logic '1' to the HTEN bit at address 0x04 (see
Table 5 and Table 6).
8.4 Device Functional Modes
8.4.1 Serial Peripheral Interface (SPI)
The device is controlled over a versatile four-wire serial interface (SDIN, SDO, SCLK, and SYNC) that operates
at clock rates of up to 25 MHz and is compatible with SPI, QSPI™, Microwire™, and digital signal processing
(DSP) standards. The SPI communication command consists of a write address byte and a data word for a total
of 24 bits (when CRC is disabled). The timing for the digital interface is shown in the Timing Requirements: Write
and Readback Mode section.
8.4.1.1 Stand-Alone Operation
The serial clock SCLK can be a continuous or a gated clock. When SYNC is high, the SCLK and SDIN signals
are blocked and the SDO pin is in a HiZ state. Exactly 24 falling clock edges must be applied before SYNC is
brought high. If SYNC is brought high before the 24th falling SCLK edge, then the data written are not transferred
into the internal registers. If more than 24 falling SCLK edges are applied before SYNC is brought high, then the
last 24 bits are used. The device internal registers are updated from the Shift Register on the rising edge of
SYNC. In order for another serial transfer to take place, SYNC must be brought low again.
8.4.1.2 Daisy-Chain Operation
For systems that contain more than one device, the SDO pin can be used to daisy-chain multiple devices
together. Daisy-chain operation can be useful for system diagnostics and in reducing the number of serial
interface lines. The daisy chain feature can be enabled by writing logic '0' to DSDO bit address 0x03 (see Table
6), the SDO pin is set to HiZ when DSDO bit is set to 1. By connecting the SDO of the first device to the SDIN
input of the next device in the chain, a multiple-device interface is constructed, as Figure 11 illustrates.
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
43
DAC8775
SLVSBY7 – FEBRUARY 2017
www.ti.com
Device Functional Modes (continued)
C
DAC8775
SDIN
B
DAC8775
SDIN
SDO
A
DAC8775
SDIN
SDO
SCLK
SCLK
SCLK
SYNC
SYNC
SYNC
LDAC
LDAC
LDAC
SDO
Copyright © 2016, Texas Instruments Incorporated
Figure 106. Three DAC8775s in Daisy-Chain Mode
The DAC8775 provides two modes for daisy-chain operation: normal and transparent. The TRN bit in the Reset
config register determines which mode is used. In Normal mode (TRN bit = '0'), the data clocked into the SDIN
pin are transferred into the shift register. The first falling edge of SYNC starts the operating cycle. SCLK is
continuously applied to the SPI Shift Register when SYNC is low. If more than 24 clock pulses are applied, the
data ripple out of the shift register and appear on the SDO line. These data are clocked out on the rising edge of
SCLK and are valid on the falling edge. By connecting the SDO pin of the first device to the SDIN input of the
next device in the chain, a multiple-device interface is constructed. Each device in the system requires 24 clock
pulses. Therefore, the total number of clock cycles must equal 24 × N, where N is the total number of DAC8775s
in the chain. When the serial transfer to all devices is complete, SYNC is taken high. This action latches the data
from the SPI Shift registers to the device internal registers synchronously for each device in the daisy-chain, and
prevents any further data from being clocked in. Note that a continuous SCLK source can only be used if SYNC
is held low for the correct number of clock cycles. For gated clock mode, a burst clock containing the exact
number of clock cycles must be used and SYNC must be taken high after the final clock in order to latch the
data.
In Transparent mode (address 0x02h, TRN bit = '1' Table 6), the data clocked into SDIN are routed to the SDO
pin directly; the Shift Register is bypassed. When SCLK is continuously applied with SYNC low, the data clocked
into the SDIN pin appear on the SDO pin almost immediately (with approximately a 12 ns delay); there is no 24
clock delay, as there is in normal operating mode. While in Transparent mode, no data bits are clocked into the
Shift Register, and the device does not receive any new data or commands. Putting the device into transparent
mode eliminates the 24 clock delay from SDIN to SDO caused by the Shift Register, thus greatly speeding up the
data transfer. For example, consider three DAC8775s (C, B, and A) in a daisy-chain configuration (see Figure
11). The data from the SPI controller are transferred first to C, then to B, and finally to A. In normal daisy-chain
operation, a total of 72 clocks are needed to transfer one word to A. However, if C and B are placed into Sleep
mode, the first 24 data bits are directly transferred to A (through C and B); therefore, only 24 clocks are needed.
To wake the device up from transparent mode and return to normal operation, the hardware RESET pin must be
toggled.
8.4.2 SPI Shift Register
The SPI Shift Register is 24 bits wide (refer to the Frame Error Checking section for 32-bit frame mode). The
default 24-bit input frame consists of an 8-bit address byte followed by a 16-bit data word as shown in Table 2.
Table 2. Default SPI Frame
44
BIT 23:BIT 16
BIT 15:BIT 0
Address byte
Data word
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
DAC8775
www.ti.com
SLVSBY7 – FEBRUARY 2017
8.4.3 Write Operation
A typical write to program a channel of the DAC8775 consists of writing to the following registers in the sequence
shown in Figure 12.
Select Buck-Boost
Register (x06h)
Config Buck-Boost
Register (x07h)
Select DAC Register
(x03h)
Config DAC Register
(x04h)
Program DAC Data
Register (x05h)
Figure 107. Typical Write to DAC8775
8.4.4 Read Operation
A read operation is accomplished when DB 23 is '1' (see Table 3). A no-operation (NOP) command should follow
the read operation in order to clock out an addressed register. The read register value is output MSB first on
SDO on successive falling edges of SCLK.
Table 3. Register Read Address Functions (1)
ADDRESS BYTE
(1)
DB23
DB 22: DB 16
Read/Write Bit
Register Addresses
'X' denotes don't care bits.
8.4.5 Updating the DAC Outputs and LDAC Pin
Depending on the status of both SYNC and LDAC, and after data have been transferred into the DAC Data
registers, the DAC outputs can be updated either in asynchronous mode or synchronous mode.
8.4.5.1 Asynchronous Mode
In this mode, the LDAC pin is set low before the rising edge of SYNC. This action places the DAC8775 into
Asynchronous mode, and the LDAC signal is ignored. The DAC latches are updated immediately when SYNC
goes high.
8.4.5.2 Synchronous Mode
To use this mode, set LDAC high before the rising edge of SYNC, and then take LDAC low after SYNC goes
high. In this mode, when LDAC stays high, the DAC latch is not updated; therefore, the DAC output does not
change. The DAC latch is updated by taking LDAC low any time after a certain delay from the rising edge of
SYNC (see Figure 1). If this delay requirement is not satisfied, invalid data are loaded. Refer to the Timing
Requirements: Write and Readback Mode section for details.
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
45
DAC8775
SLVSBY7 – FEBRUARY 2017
www.ti.com
8.4.6 Hardware RESET Pin
When the RESET pin is low, the device is in hardware reset. All the analog outputs (VOUT_A to VOUT_D and
IOUT_A to IOUT_D), all the registers except the POC register, and the DAC latches are set to the default reset
values. In addition, the Gain and Zero registers are loaded with default values, communication is disabled, and
the signals on SYNC and SDIN are ignored (note that SDO is in a high-impedance state). When the RESET pin
is high, the serial interface returns to normal operation and all the analog outputs (VOUT_A to VOUT_D and
IOUT_A to IOUT_D) maintain the reset value until a new value is programmed.
8.4.7 Hardware CLR Pin
The CLR pin is an active high input that should be low for normal operation. When this pin is a logic '1', all the
outputs are cleared to either zero-scale code or midscale code depending on the status of the CLSLx bit (see
Reset Register (address = 0x01) [reset = 0x0000]). While CLR is high, all LDAC pulses are ignored. When CLR
is taken low again, the DAC outputs remain cleared until new data is written to the DACs. The contents of the
Offset registers, Gain registers, and DAC input registers are not affected by taking CLR high. Note that the clear
action will result in the outputs clearing to the default value instantaneously even if slew rate control is enabled.
8.4.8 Frame Error Checking
If the DAC8775 is used in a noisy environment, error checking can be used to check the integrity of SPI data
communication between the device and the host processor. This feature can be enabled by setting the CREN bit
address 0x03 (see Table 6).
The frame error checking scheme is based on the CRC-8-ATM (HEC) polynomial x8 + x2 + x + 1 (that is,
100000111). When error checking is enabled, the SPI frame width is 32 bits, as shown in Table 1. The normal
24-bit SPI data are appended with an 8-bit CRC polynomial by the host processor before feeding it to the device.
For a register readback, the CRC polynomial is output on the SDO pins by the device as part of the 32 bit frame.
Note that the user has to start with the default 24 bit frame and enable frame error checking through the CREN
bit and switch to the 32 bit frame. Alternatively, the user can use a 32-bit frame from the beginning and pad the 8
MSB bits as the device will only use the last 24 bits until the CRCEN bit is set. The frame length has to be
carefully managed, especially when using daisy-chaining in combination with CRC checking to ensure correct
operation.
Table 4. SPI Frame with Frame Error Checking Enabled
BIT 31:BIT 8
BIT 7:BIT 0
Normal SPI frame data
8-bit CRC polynomial
The DAC8775 decodes the 32-bit input frame data to compute the CRC remainder. If no error exists in the
frame, the CRC remainder is zero. When the remainder is non-zero (that is, the input frame has single- or
multiple-bit errors), the ALARM pin asserts low and the CRE bit of the status register (address 0x0B) is also set
to '1'. Note that the ALARM pin can be asserted low for any of the different conditions as explained in the
ALARM Pin section. The CRE bit is set to '0' with a software or hardware reset, or by disabling the frame error
checking, or by powering down the device. In the case of a CRC error, the specific SPI frame is blocked from
writing to the device.
Frame error checking can be enabled for any number of DAC8775 devices connected in a daisy-chain
configuration. However, it is recommended to enable error checking for none or all devices in the chain. When
connecting the ALARM pins of all combined devices, forming a wired-AND function, the host processor should
read the status register of each device to know all the fault conditions present in the chain. For proper operation,
the host processor must provide the correct number of SCLK cycles in each frame, taking care to identify
whether or not error checking is enabled in each device in the daisy-chain.
8.4.9 DAC Data Calibration
Each channel of the DAC8775 contains a dedicated user calibration register set. This feature allows the user to
trim the system gain and offset errors. Both the voltage output and the current output have common user
calibration registers available. The user calibration feature is disabled by default. To enable this feature for a
selected channel(s), the CLEN bit (DB0) on address 0x08 must be set to logic '1 (see Table 6).
46
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
DAC8775
www.ti.com
SLVSBY7 – FEBRUARY 2017
8.4.9.1 DAC Data Gain and Offset Calibration Registers
The DAC calibration register set includes one gain calibration and one offset calibration register (16 bits for
DAC8775) per channel (address 0x09 and 0x0A). The range of gain adjustment is typically ±50% of full-scale
with 1 LSB per step. The power-on value of the gain register is 0x8000 which is equivalent to a gain of 1. The
offset code adjustment is typically ±32,768 LSBs with 1 LSB per step. The input data format of the gain register
is unsigned straight binary, and the input data format of the offset register is twos complement. The gain and
offset calibration is described by Equation 9.
ª
§ User_Gain + 215
CODE_OUT = «CODE. ¨
¨
216
©
¬«
º
·
¸¸ + User_Zero »
¹
¼»
(9)
Where:
• CODE is the decimal equivalent of the code loaded to the DAC.
• VREFIN is the reference voltage; for internal reference, VREFIN = +5 V.
• GAIN is automatically selected for a desired voltage output range as shown in Table 7.
• User_Offset is the signed 16-bit code in the offset register.
• User_GAIN is the unsigned 16-bit code in the gain register.
It is important to note that this is a purely digital implementation and the output is still limited by the programmed
value at both ends of the voltage or current output range. Therefore, the user must remember that the correction
only makes sense for endpoints inside of the true device end points. If the user desires to correct more than just
the actual device error, for example a system offset, the valid range for the adjustment would change accordingly
and must be taken into account. This range is set by the RANGE bits as described in Table 6.
8.5 Register Maps
8.5.1 DAC8775 Commands
Table 5. Address Functions
ADDRESS
BYTE
FUNCTION
READ/WRITE
PER CHANNEL
POWER-ON RESET
VALUE
0x00
No operation (NOP)
Write
No
0x0000
0x01
Reset register
Read+Write
No
0x0000
0x02
Reset config register
Read+Write
No
0x0000
0x03
Select DAC register
Read+Write
No
0x0000
0x04
Configuration DAC register
Read+Write
Yes
0x0000
0x05
DAC data register
Read+Write
Yes
0x0000
0x06
Select Buck-Boost converter register
Read+Write
No
0x0000
0x07
Configuration Buck-Boost converter register
Read+Write
Yes
0x0000
0x08
DAC channel calibration enable register
Read+Write
Yes
0x0000
0x09
DAC channel gain calibration register
Read+Write
Yes
0x0000
0x0A
DAC channel offset calibration register
Read+Write
Yes
0x0000
0x0B
Status register
Read+Write
No
0x1000
0x0C
Status mask register
Read+Write
No
0x0000
0x0D
Alarm action register
Read+Write
No
0x0000
0x0E
User alarm code register
Read+Write
Yes
0x0000
0x0F
Reserved
N/A
N/A
N/A
0x10
Write watchdog timer reset
Write
No
0x0000
0x11
Device ID
Read
No
0x0000
0x12 - 0xFF
Reserved
N/A
N/A
N/A
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
47
DAC8775
SLVSBY7 – FEBRUARY 2017
www.ti.com
Note that, in order to write to (or read from) a per channel address, corresponding Buck-Boost converter and
DAC channel must be selected using commands 0x06 and 0x03.
8.5.2 Register Maps and Bit Functions
Table 6. Register Map
ADDRESS
BITS
15
14
13
12
11
10
9
8
7
6
5
4
3
2
1
0
0x01
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
RST
0x02
x
x
x
CLREND
CLRENC
CLRENB
CLRENA
x
x
x
x
REF_EN
TRN
CLR
POC
0x03
x
x
x
CLSLD
CLSLC
CLSLB
CLSLA
CHD
CHC
CHB
CHA
DSDO
CREN
0x04
SCLIM[1:0]
HTEN
OTEN
SRCLK_RATE[3:0]
0x05
SR_STEP[2:0]
SREN
WPD[1:0]
UBT
WEN
RANGE[3:0]
DAC_DATA[15:0]
0x06
x
x
x
x
0x07
x
x
x
x
0x08
x
x
x
x
x
x
x
x
CCLP[1:0]
x
x
x
x
PCLMP[3:0]
x
x
x
0x09
x
DCD
DCC
NCLMP[3:0]
x
x
x
x
DCB
DCA
PNSEL[1:0]
x
x
x
CLEN
UGAIN[15:0]
0x0A
UOFF[15:0]
0x0B
x
x
x
CLST
WDT
PGD
PGC
PGB
PGA
UTGL
CRE
TMP
FD
FC
FB
FA
0x0C
x
x
x
x
MWT
x
x
x
x
x
MCRE
MTMP
MFD
MFC
MFB
MFA
0x0D
x
x
x
x
x
x
0x0E
ACODE[15:10]
x
x
HSCLMP
0
AC_CRE_WDT[1:0]
x
x
x
AC_IOC[1:0]
x
AC_VSC[1:0]
x
x
x
x
x
x
RWD
0x10
x
x
x
x
x
x
x
x
x
x
x
x
x
0x11
x
x
x
x
x
x
x
x
x
x
x
x
x
AC_TMP[1:0]
DID[2:0]
Table 7. Voltage Output GAIN vs DAC Range
BIT 3: Bit 0
(RANGE)
GAIN
0000
1
0001
2
0010
2
0011
4
1000
1.2 (20% Over-range)
1001
2.4 (20% Over-range)
1010
2.4 (20% Over-range)
1011
4.8 (20% Over-range)
8.5.2.1 No Operation Register (address = 0x00) [reset = 0x0000]
Figure 108. No Operation Register
15
14
13
12
11
10
9
8
3
2
1
0
Reserved
W
7
6
5
4
Reserved
W
LEGEND: R/W = Read/Write; R = Read only; W = Write Only; -n = value after reset
Table 8. No Operation Field Descriptions
Bit
15:10
48
Field
Type
Reset
Description
Reserved
W
00000000
00000000
Reserved
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
DAC8775
www.ti.com
SLVSBY7 – FEBRUARY 2017
8.5.2.2 Reset Register (address = 0x01) [reset = 0x0000]
Figure 109. Reset Register
15
14
13
12
11
10
9
8
3
2
1
0
RST
R/W
Reserved
R/W
7
6
5
4
Reserved
R/W
LEGEND: R/W = Read/Write; R = Read only; -n = value after reset
Table 9. Reset Register Field Descriptions
Bit
15:1
0
Field
Type
Reset
Description
Reserved
R/W
00000000
0000000
Reserved
RST
R/W
0
Reset. When set, it resets all registers except POC register bit to
the respective power-on reset default value. After reset
completes the RST bit clears
8.5.2.3 Reset Config Register (address = 0x02) [reset = 0x0000]
Figure 110. Reset Config Register
15
14
Reserved
R/W
13
12
CLREND
R/W
11
CLRENC
R/W
10
CLRENB
R/W
9
CLRENA
R/W
8
Reserved
R/W
7
6
Reserved
R/W
5
4
REF_EN
R/W
3
TRN
R/W
2
CLR
R/W
1
POC
R/W
0
UBT
R/W
LEGEND: R/W = Read/Write; R = Read only; -n = value after reset
Table 10. Reset Config Register Field Descriptions
Bit
Field
Type
Reset
Description
15:13
Reserved
R/W
000
Reserved
12
CLREND
R/W
0
Clear Enable
0 - DACD hardware and software clear is disabled
1 - DACD hardware and software clear is enabled
11
CLRENC
R/W
0
Clear Enable
0 - DACC hardware and software clear is disabled
1 - DACC hardware and software clear is enabled
10
CLRENB
R/W
0
Clear Enable
0 - DACB hardware and software clear is disabled
1 - DACB hardware and software clear is enabled
9
CLRENA
R/W
0
Clear Enable
0 - DACA hardware and software clear is disabled
1 - DACA hardware and software clear is enabled
8:5
Reserved
R/W
0000
Reserved
4
REF_EN
R/W
0
Internal reference enable/disable
0 - Internal reference disabled (default)
1 - Internal reference enabled
3
TRN
R/W
0
Enable transparent mode (see section "daisy chain operation")
2
CLR
R/W
0
Active high, clears all DAC registers to either zero or full scale
based on CLSL bit. After clear completes the CLR bit resets.
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
49
DAC8775
SLVSBY7 – FEBRUARY 2017
www.ti.com
Table 10. Reset Config Register Field Descriptions (continued)
Bit
Field
Type
Reset
Description
1
POC
R/W
0
Power-Off-Condition
0 - IOUT_x to HIZ, VOUT_x to 30K-to-PBKG at power up,
hardware or software reset (default)
1 - IOUT_x and VOUT_x to HIZ at power up, hardware and
software reset
0
UBT
R/W
0
User Bit - This bit can be used to check if the communication to
the chip is working correctly by writing a known value to this bit
and reading that value from the status register toggle bit. The
toggle resister bit UTGL (address 0x0B) is set to the same value
as the UBT bit.
8.5.2.4 Select DAC Register (address = 0x03) [reset = 0x0000]
Figure 111. Select DAC Register
15
14
Reserved
R/W
13
12
CLSLD
R/W
11
CLSLC
R/W
10
CLSLB
R/W
7
CHC
R/W
6
CHB
R/W
5
CHA
R/W
4
DSDO
R/W
3
CREN
R/W
2
WPD[1:0]
R/W
9
CLSLA
R/W
8
CHD
R/W
1
0
WEN
R/W
LEGEND: R/W = Read/Write; R = Read only; -n = value after reset
Table 11. Select DAC Register Field Descriptions
Bit
Field
Type
Reset
Description
Reserved
R/W
000
Reserved
12
CLSLD
R/W
0
Clear Select
0 - DACD DAC registers cleared to zero scale upon hardware or
software clear (default)
1 - DACD DAC registers cleared to mid scale upon hardware or
software clear
11
CLSLC
R/W
0
Clear Select
0 - DACC DAC registers cleared to zero scale upon hardware or
software clear (default)
1 - DACC DAC registers cleared to mid scale upon hardware or
software clear
10
CLSLB
R/W
0
Clear Select
0 - DACB DAC registers cleared to zero scale upon hardware or
software clear (default)
1 - DACB DAC registers cleared to mid scale upon hardware or
software clear
9
CLSLA
R/W
0
Clear Select
0 - DACA DAC registers cleared to zero scale upon hardware or
software clear (default)
1 - DACA DAC registers cleared to mid scale upon hardware or
software clear
8
CHD
R/W
0
Channel D selected
7
CHC
R/W
0
Channel C selected
6
CHB
R/W
0
Channel B selected
5
CHA
R/W
0
Channel A selected
4
DSDO
R/W
0
Disable SDO - When set, this bit disables daisy chain operation
and SDO pin is set to HiZ, enabled by default
3
CREN
R/W
0
Enable CRC - When set, this bit enables frame error checking,
disabled by default
15:13
50
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
DAC8775
www.ti.com
SLVSBY7 – FEBRUARY 2017
Table 11. Select DAC Register Field Descriptions (continued)
Bit
Field
Type
Reset
Description
2:1
WPD[1:0]
R/W
00
Watchdog Timer Period
00 - 10 ms (typical)
01 - 51 ms (typical)
10 - 102 ms (typical)
11 - 204 ms (typical)
WEN
R/W
0
Enable Watchdog Timer - When set, this bit enables watchdog
timer, disabled by default
0
8.5.2.5 Configuration DAC Register (address = 0x04) [reset = 0x0000]
Figure 112. Configuration DAC Register
15
14
13
HTEN
R/W
12
OTEN
R/W
11
10
9
SRCLK_RATE[3:0]
R/W
8
6
SR_STEP[2:0]
R/W
5
4
SREN
R/W
3
2
0
SCLIM[1:0]
R/W
7
1
RANGE[3:0]
R/W
LEGEND: R/W = Read/Write; R = Read only; -n = value after reset
Table 12. Configuration DAC Register Field Descriptions
Bit
Field
Type
Reset
Description
SCLIM[1:0]
R/W
00
Voltage output short circuit limit
00 - 16 mA (default). Actual value will be between the minimum
and maximum values specified in Electrical Characteristics.
01 - 8 mA. Actual value will be between the minimum and
maximum values specified in Electrical Characteristics.
10 - 20 mA. Actual value will be between the minimum and
maximum values specified in Electrical Characteristics.
11 - 24 mA. Actual value will be between the minimum and
maximum values specified in Electrical Characteristics.
13
HTEN
R/W
0
Enable HART - When set, this bit enables HART, disabled by
default
12
OTEN
R/W
0
Output Enabled - When set, this bit enables DAC (Voltage or
Current) outputs, disabled by default
SRCLK_RATE[3:0]
R/W
0000
Slew Clock Rate
0000 - DAC updates
0001 - DAC updates
0010 - DAC updates
0011 - DAC updates
0100 - DAC updates
0101 - DAC updates
0110 - DAC updates
0111 - DAC updates
1000 - DAC updates
1001 - DAC updates
1010 - DAC updates
1011 - DAC updates
1100 - DAC updates
1101 - DAC updates
1110 - DAC updates
1111 - DAC updates
15:14
11:8
7:5
SR_STEP[2:0]
R/W
000
at 258,065 Hz (default)
at 200,000 Hz
at 153,845 Hz
at 131,145 Hz
at 115,940 Hz
at 69,565 Hz
at 37,560 Hz
at 25,805 Hz
at 20,150 Hz
at 16,030 Hz
at 10,295 Hz
at 8,280 Hz
at 6,900 Hz
at 5,530 Hz
at 4,240 Hz
at 3,300 Hz
Slew Rate Step Size
000 - 1 LSB (default)
001 - 2 LSB
010 - 4 LSB
011 - 8 LSB
100 - 16 LSB
101 - 32 LSB
110 - 64 LSB
111 - 128 LSB
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
51
DAC8775
SLVSBY7 – FEBRUARY 2017
www.ti.com
Table 12. Configuration DAC Register Field Descriptions (continued)
Bit
Field
Type
Reset
Description
4
SREN
R/W
0
Slew Rate Enabled - When set, this bit enables slew rate
feature, disabled by default
RANGE[3:0]
R/W
0000
Range, Please note that upon changing the range, the DAC
output changes based on CLSLx (Address 0x03)
0000 - Voltage output 0 to +5 V (default)
0001 - Voltage output 0 to +10 V
0010 - Voltage output ±5 V
0011 - Voltage output ±10 V
0100 - Current output 3.5 mA to 23.5 mA
0101 - Current output 0 to 20 mA
0110 - Current output 0 to 24 mA
0111 - Current output ±24 mA
1000 - Voltage output 0 to +6 V
1001 - Voltage output 0 to +12 V
1010 - Voltage output ±6 V
1011 - Voltage output ±12 V
11xx - Current output 4 mA to 20 mA
3:0
8.5.2.6 DAC Data Register (address = 0x05) [reset = 0x0000]
Figure 113. DAC Data Register
15
14
13
12
11
DAC_DATA[15:8]
R/W
10
9
8
7
6
5
4
2
1
0
3
DAC_DATA[7:0]
R/W
LEGEND: R/W = Read/Write; R = Read only; -n = value after reset
Table 13. DAC Data Register Field Descriptions
Bit
15:0
Field
Type
DAC_DATA[15:0]
R/W
Reset
Description
16-bit DAC data
8.5.2.7 Select Buck-Boost Converter Register (address = 0x06) [reset = 0x0000]
Figure 114. Select Buck-Boost Converter Register
15
14
13
12
11
10
9
8
3
DCD
R/W
2
DCC
R/W
1
DCB
R/W
0
DCA
R/W
Reserved
R/W
7
6
5
4
Reserved
R/W
LEGEND: R/W = Read/Write; R = Read only; -n = value after reset
Table 14. Select Buck-Boost Converter Register Field Descriptions
Bit
Field
Type
Reset
Description
Reserved
R/W
00000000
0000
Reserved
3
DCD
R/W
0
Buck-Boost converter D selected
2
DCC
R/W
0
Buck-Boost converter C selected
1
DCB
R/W
0
Buck-Boost converter B selected
0
DCA
R/W
0
Buck-Boost converter A selected
15:4
52
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
DAC8775
www.ti.com
SLVSBY7 – FEBRUARY 2017
8.5.2.8 Configuration Buck-Boost Register (address = 0x07) [reset = 0x0000]
Figure 115. Configuration Buck-Boost Register
15
14
13
12
11
Reserved
R/W
7
6
10
9
CCLP[1:0]
R/W
5
4
PCLMP[1:0]
R/W
3
8
PCLMP[3:2]
R/W
2
1
NCLMP[3:0]
R/W
0
PNSEL[1:0]
R/W
LEGEND: R/W = Read/Write; R = Read only; -n = value after reset
Table 15. Configuration Buck-Boost Register Field Descriptions
Field
Type
Reset
Description
15:12
Bit
Reserved
R/W
0000
Reserved
11:10
CCLP[1:0]
R/W
00
Buck-Boost converter configurable clamp setting
00 - Buck-Boost converter in full tracking mode (default)
01 - User can write to PCLMP and NCLMP bits
10 - PCLMP bits are populated automatically to optimum value "Auto Learn mode", User cannot write to PCLMP bits
11 - Invalid
PCLMP[3:0]
R/W
0000
Buck-Boost converter positive clamp setting, DAC output
unloaded - Buck-Boost converter positive arm low side clamp
9:6
Current Output Mode
Voltage Output Mode
0000
4.0 V (default)
Invalid
0001
5.0 V
Invalid
0010
6.0 V
Invalid
0011
9.0 V
9.0 V
0100
11.0 V
Invalid
0101
12.0 V
Invalid
0110
13.0 V
Invalid
0111
14.0 V
Invalid
1000
15.0 V
15.0 V
1001
18.0 V
18.0 V
1010
20.0 V
Invalid
1011
23.0 V
Invalid
1100
25.0 V
Invalid
1101
27.0 V
Invalid
1110
30.0 V
Invalid
1111
32.0 V
Invalid
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
53
DAC8775
SLVSBY7 – FEBRUARY 2017
www.ti.com
Table 15. Configuration Buck-Boost Register Field Descriptions (continued)
Bit
Field
Type
Reset
Description
5:2
NCLMP[3:0]
R/W
0000
Buck-Boost converter negative clamp setting, DAC output
unloaded - Buck-Boost converter negative arm low side clamp
1:0
PNSEL[1:0]
R/W
00
Current Output Mode
Voltage Output Mode
0000
–5.0 V
Invalid
0001
–6.0 V
Invalid
0010
–9.0 V
–9.0 V
0011
–11.0 V
Invalid
0100
–12.0 V
Invalid
0101
–13.0 V
Invalid
0110
–14.0 V
Invalid
0111
–15.0 V
–15.0 V (default)
1000
–18.0 V
Invalid
1001
–18.0 V
–18.0 V
101x
Invalid
Invalid
11xx
Invalid
Invalid
Enable Buck-Boost converter positive and negative arm
00 - Buck-Boost converter positive and negative arm disabled
(default)
01 - Buck-Boost converter positive arm enabled and negative
arm disabled
10 - Buck-Boost converter positive arm disabled and negative
arm enabled
11 - Buck-Boost converter positive arm and negative arm
enabled
8.5.2.9 DAC Channel Calibration Enable Register (address = 0x08) [reset = 0x0000]
Figure 116. DAC Channel Calibration Enable Register
15
14
13
12
11
10
9
8
3
2
1
0
CLEN
R/W
Reserved
R/W
7
6
5
4
Reserved
R/W
LEGEND: R/W = Read/Write; R = Read only; -n = value after reset
Table 16. DAC Channel Calibration Enable Register Field Descriptions
Bit
15:1
0
Field
Type
Reset
Description
Reserved
R/W
00000000
0000000
Reserved
CLEN
R/W
0
Enable DAC calibration - When set, this bit enables DAC data
calibration, disabled by default
8.5.2.10 DAC Channel Gain Calibration Register (address = 0x09) [reset = 0x0000]
Figure 117. DAC Channel Gain Calibration Register
15
14
13
12
11
10
9
8
3
2
1
0
UGAIN[15:8]
R/W
7
6
5
4
UGAIN[7:0]
54
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
DAC8775
www.ti.com
SLVSBY7 – FEBRUARY 2017
R/W
LEGEND: R/W = Read/Write; R = Read only; -n = value after reset
Table 17. DAC Channel Gain Calibration Register Field Descriptions
Bit
15:0
Field
Type
Reset
Description
UGAIN[15:0]
R/W
00000000
00000000
16-bit user gain data
8.5.2.11 DAC Channel Offset Calibration Register (address = 0x0A) [reset = 0x0000]
Figure 118. DAC Channel Offset Calibration Register
15
14
13
12
11
10
9
8
3
2
1
0
UOFF[15:8]
R/W
7
6
5
4
UOFF[7:0]
R/W
LEGEND: R/W = Read/Write; R = Read only; -n = value after reset
Table 18. DAC Channel Offset Calibration Register Field Descriptions
Bit
15:0
Field
Type
Reset
Description
UOFF[15:0]
R/W
00000000
00000000
16-bit user offset data
8.5.2.12 Status Register (address = 0x0B) [reset = 0x1000]
Figure 119. Status Register
15
14
Reserved
R/W
13
12
CLST
R/W
11
WDT
R/W
10
PGF
R/W
9
PGC
R/W
8
PGB
R/W
7
PGA
R/W
6
UTGL
R/W
5
CRE
R/W
4
TMP
R/W
3
FD
R/W
2
FC
R/W
1
FB
R/W
0
FA
R/W
LEGEND: R/W = Read/Write; R = Read only; -n = value after reset
Table 19. Status Register Field Descriptions
Bit
Field
Type
Reset
Description
Reserved
R/W
000
Reserved
12
CLST
R/W
1
Auto Learn status - Indicates that Auto Learn operation is
finished
11
WDT
R/W
0
Watchdog timer fault - Indicates that watchdog timer fault has
occurred
10
PGF
R/W
0
Buck-Boost D power good - Indicates the power good condition
on Buck-Boost converter D
9
PGC
R/W
0
Buck-Boost C power good - Indicates the power good condition
on Buck-Boost converter C
8
PGB
R/W
0
Buck-Boost B power good - Indicates the power good condition
on Buck-Boost converter B
7
PGA
R/W
0
Buck-Boost A power good - Indicates the power good condition
on Buck-Boost converter A
6
UTGL
R/W
0
User toggle - Copy of user bit (UBT)
5
CRE
R/W
0
CRC error - Indicates CRC error condition
4
TMP
R/W
0
Over temperature - Indicates over temperature condition
15:13
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
55
DAC8775
SLVSBY7 – FEBRUARY 2017
www.ti.com
Table 19. Status Register Field Descriptions (continued)
Bit
Field
Type
Reset
Description
3
FD
R/W
0
Fault channel D - Indicates fault condition channel D
2
FC
R/W
0
Fault channel C - Indicates fault condition channel C
1
FB
R/W
0
Fault channel B - Indicates fault condition channel B
0
FA
R/W
0
Fault channel A - Indicates fault condition channel A
8.5.2.13 Status Mask Register (address = 0x0C) [reset = 0x0000]
Figure 120. Status Mask Register
15
14
13
12
11
MWT
R/W
10
9
Reserved
R/W
8
5
MCRE
R/W
4
MTMP
R/W
3
MFD
R/W
2
MFC
R/W
1
MFB
R/W
0
MFA
R/W
Reserved
R/W
7
6
Reserved
R/W
LEGEND: R/W = Read/Write; R = Read only; -n = value after reset
Table 20. Status Mask Register Field Descriptions
Bit
15:12
11
10:6
Field
Type
Reset
Description
Reserved
R/W
0000
Reserved
MWT
R/W
0
Mask WDT - When set, it masks the alarm pin from watchdog
timer fault condition
Reserved
R/W
00000
Reserved
5
MCRE
R/W
0
CRC error - When set, it masks the alarm pin from CRC error
condition
4
MTMP
R/W
0
Mask TMP - When set, it masks the alarm pin from over
temperature condition
3
MFD
R/W
0
Mask FD - When set, it masks the alarm pin from fault condition
channel D
2
MFC
R/W
0
Mask FC - When set, it masks the alarm pin from fault condition
channel C
1
MFB
R/W
0
Mask FB - When set, it masks the alarm pin from fault condition
channel B
0
MFA
R/W
0
Mask FA - When set, it masks the alarm pin from fault condition
channel A
8.5.2.14 Alarm Action Register (address = 0x0D) [reset = 0x0000]
Figure 121. Alarm Action Register
15
14
13
12
11
10
9
2
1
8
Reserved
R/W
7
6
AC_CRE_WDT[1:0]
R/W
5
4
AC_IOC[1:0]
R/W
3
AC_VSC[1:0]
R/W
0
AC_TMP[1:0]
R/W
LEGEND: R/W = Read/Write; R = Read only; -n = value after reset
56
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
DAC8775
www.ti.com
SLVSBY7 – FEBRUARY 2017
Table 21. Alarm Action Register Field Descriptions
Field
Type
Reset
Description
15:8
Bit
Reserved
R/W
00000000
Reserved
7:6
AC_CRE_WDT[1:0]
R/W
00
Action CRC error and Watchdog timer fault circuit condition
00 - No action on Buck-Boost converters, no action on DACs
(default)
01 - No action on Buck-Boost converters, respective user alarm
code on all DACs
10 - All Buck-Boost converters and DACs disabled and remain
disabled even after the alarm condition is removed.
11 - Invalid
5:4
AC_IOC[1:0]
R/W
00
Action current output open circuit condition
00 - No action on Buck-Boost converters, no action on DACs
(default)
01 - No action on Buck-Boost converters, respective user alarm
code on DAC(s) initiating the alarm
10 - All Buck-Boost converters and DACs disabled and remain
disabled even after the alarm condition is removed.
11 - Invalid
3:2
AC_VSC[1:0]
R/W
00
Action voltage output short circuit condition
00 - No action on Buck-Boost converters, no action on DACs
(default)
01 - No action on Buck-Boost converters, respective user alarm
code on DAC(s) initiating the alarm
10 - All Buck-Boost converters and DACs disabled and remain
disabled even after the alarm condition is removed.
11 - Invalid
1:0
AC_TMP[1:0]
R/W
00
Action over temperature condition
00 - No action on Buck-Boost converters, no action on DACs
(default)
01 - No action on Buck-Boost converters, respective user alarm
code on all DACs
10 - All Buck-Boost converters and DACs disabled and remain
disabled even after the alarm condition is removed.
11 - Invalid
8.5.2.15 User Alarm Code Register (address = 0x0E) [reset = 0x0000]
Figure 122. User Alarm Code Register
15
14
13
12
11
10
9
HSCLMP
R/W
8
0
R/W
3
2
1
0
ACODE[15:10]
R/W
7
6
5
4
Reserved
R/W
LEGEND: R/W = Read/Write; R = Read only; -n = value after reset
Table 22. User Alarm Code Register Field Descriptions
Bit
Field
Type
Reset
Description
ACODE[15:10]
R/W
000000
6 bit alarm code data
9
HSCLMP
R/W
0
Buck-Boost positive output high side clamp
0 - Buck-Boost converter positive output high side clamp set to
32 V (default)
1 - Buck-Boost converter positive output high side clamp set to
26 V (default)
8
0
R/W
0
0
Reserved
R/W
00000000
Reserved
15:10
7:0
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
57
DAC8775
SLVSBY7 – FEBRUARY 2017
www.ti.com
8.5.2.16 Reserved Register (address = 0x0F) [reset = N/A]
Figure 123. Reserved Register
15
14
13
12
11
10
9
8
3
2
1
0
Reserved
7
6
5
4
Reserved
LEGEND: R/W = Read/Write; R = Read only; -n = value after reset
Table 23. Reserved Register Field Descriptions
Bit
15:0
Field
Type
Reset
Description
Reserved
–
N/A
Reserved
8.5.2.17 Write Watchdog Timer Register (address = 0x10) [reset = 0x0000]
Figure 124. Write Watchdog Timer Register
15
14
13
12
11
10
9
8
3
2
1
0
RWD
W
Reserved
W
7
6
5
4
Reserved
W
LEGEND: R/W = Read/Write; R = Read only; W = Write only; -n = value after reset
Table 24. Write Watchdog Timer Register Field Descriptions
Bit
15:1
0
Field
Type
Reset
Description
Reserved
–
00000000
0000000
Reserved
RWD
W
0
Reset watchdog timer, this bit clears itself after resetting watch
dog timer
8.5.2.18 Device ID Register (address = 0x11) [reset = 0x0000]
Figure 125. Device ID Register
15
14
13
12
11
10
9
8
3
2
1
DID[2:0]
R
0
Reserved
R
7
6
5
Reserved
4
R
LEGEND: R/W = Read/Write; R = Read only; -n = value after reset
Table 25. Device ID Register Field Descriptions
Bit
58
Field
Type
Reset
Description
15:3
Reserved
–
00000000
00000
Reserved
2:0
DID [2:0]
R
000
3-bit device identification code
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
DAC8775
www.ti.com
SLVSBY7 – FEBRUARY 2017
8.5.2.19 Reserved Register (address 0x12 - 0xFF) [reset = N/A]
Figure 126. Reserved Register
15
14
13
12
11
10
9
8
3
2
1
0
Reserved
7
6
5
4
Reserved
LEGEND: R/W = Read/Write; R = Read only; -n = value after reset
Table 26. Reserved Register Field Descriptions
Bit
15:0
Field
Type
Reset
Description
Reserved
–
N/A
Reserved
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
59
DAC8775
SLVSBY7 – FEBRUARY 2017
www.ti.com
9 Application and Implementation
NOTE
Information in the following applications sections is not part of the TI component
specification, and TI does not warrant its accuracy or completeness. TI’s customers are
responsible for determining suitability of components for their purposes. Customers should
validate and test their design implementation to confirm system functionality.
9.1 Application Information
9.1.1 Buck-Boost Converter External Component Selection
100P+
LN_x
LP_x
VNEG_IN_x
VPOS_IN_x
10PF
10PF
DAC8775
Copyright © 2016, Texas Instruments Incorporated
Figure 127. DAC8775 External Buck-Boost Components with Recommended Values
The buck-boost converters integrated in the DAC8775 each require three external passive components for
operation: a single inductor per channel as well as storage capacitors and switching diodes for each VPOS_IN_x
and VNEG_IN_x channels that are active. If only one output is used, either VPOS_IN_x or VNEG_IN_x, the
inactive output components may be removed and the respective inputs tied to ground. In order to meet the
parametric performance outlined in the Electrical Characteristics section for the voltage output, 500 mV of footroom is required on VNEG_IN_x.
The recommended value for the external inductor is 100 µH with at least 500 mA peak inductor current.
Reducing the inductor value to as low as 80 µH is possible, though this will limit the buck-boost converter
maximum input voltage to output voltage ratio, reduce efficiency, and increase ripple. Reducing the inductor
below 80 µH will result in device damage. Peak inductor current should be rated at 500 mA or greater with 20%
inductance tolerance at peak current. If peak inductor current for an inductor is violated the effective inductance
is reduced, which will impact maximum input to output voltage ratio, efficiency, and ripple.
An output, or storage, X7R capacitor with value of 10 µF and voltage rating of 50 V is recommended though
other values and dielectric materials may be used without damaging the DAC8775. Reducing capacitor value will
increase buck-boost converter output ripple and reduced voltage rating will reduce effective capacitance at fullscale buck-boost converter outputs. X7R capacitors are rated for –55°C to 125°C operation with 15% maximum
capacitance variance over temperature. Designs operating over reduced temperature spans and with loose
efficiency requirements may use different dielectric material. C0G capacitor typically offer tighter capacitance
variance but come in larger packages, but may be beneficial substitutes.
60
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
DAC8775
www.ti.com
SLVSBY7 – FEBRUARY 2017
Application Information (continued)
The external diode switches illustrated on the left and right side of the 100 µH inductor shown in Figure 127
should be selected based on reverse voltage rating, reverse recovery time, leakage or parasitic capacitance, and
current or power ratings. Breakdown voltage rating of at least 60 V is recommended to accommodate for the
maximum voltage that may be across the diode when both VPOS_x and VNEG_x are both active during
switching of the DC/DCs. Minimal reverse recovery time and parasitic capacitance is recommended in order to
preserve efficiency of the DC/DCs. The external diode should be rated for at least 500 mA average forward
current.
9.1.2 Voltage and Current Ouputs on a Shared Terminal
Figure 128 illustrates a simplified block diagram of the voltage output stages of the DAC8775.
R1
R2
VSENSEP_x
S1
+
DAC
R3
+
A1
VOUT_x
A2
S3
R6
R4
R5
VSENSEN_x
REFIN
S2
R7
R8
S4
Copyright © 2016, Texas Instruments Incorporated
Figure 128. Simplified Block Diagram of Voltage Output Architecture
When designing for a shared voltage and current output terminal it is important to consider leakage paths that
may corrupt the voltage or current output stages.
When the voltage output is active and the current output is inactive the IOUT_x pin becomes a high-impedance
node and therefore does not significantly load the voltage output in a way that would degrade VOUT_x
performance. When the voltage output is inactive and the current output is active switches S1, S2, and S4 all
become open while switch S3 is controlled by the POC bit in the Reset Config Register for each respective
channel. When the POC bit is set to a 0, the default value, switch S3 is closed when VOUT is disabled. This
creates a leakage path with respect to the current output when the terminals are shared which will create a loaddependent error. In order to reduce this error the POC bit can be set to a 1 which opens switch S3, effectively
making the VOUT pin high-impedance and reducing the magnitude of leakage current.
9.1.3 Optimizing Current Output Settling time with Auto learn Mode
When the buck-boost converters are active power and heat dissipation of the device are at a minimum, however
settling time of the current output is dominated by the slew rate of the buck-boost converter, which is significantly
slower that the current output signal chain alone. When the buck-boost converters are bypassed settling time of
the current output is minimized while power and heat dissipation are significant.
Auto-learn mode offers an alternative mode which allows the buck-boost converter to learn the size of the load
and choose a clamped output value that does not change over the full range of the selected current output. This
allows a balance between settling time and power dissipation. There are two options for entering auto-learn
mode:
• Enable the buck-boost converter in full-tracking mode followed by enabling the current output. Until the DAC
code 0x4000 is passed, settling time will be dominated by the buck-boost converter. After code 0x400 is
surpassed the buck-boost converter detects the load and sets the clamp value appropriately.
• Enable the buck-boost converter in clamp-mode with clamp value set to a greater voltage than required by
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
61
DAC8775
SLVSBY7 – FEBRUARY 2017
www.ti.com
Application Information (continued)
the largest load the current output will be expected to drive, followed by enabling the current output. Enter fulltracking mode. In this case the clamp value of maintained without the buck-boost converter output changing,
therefore settling time is set by the IOUT_x signal chain. After code 0x4000 is surpassed the buck-boost
converter detects the load and adjusts the clamp value appropriately. At all times using this initialization
procedure the settling time is defined by the IOUT_x signal chain.
9.1.4 Protection for Industrial Transients
In order to successfully protect the DAC8775, or any integrated circuit, against industrial transient testing the
internal structures and how they may behave when exposed to said signals must be understood. Figure 129
depicts a simplified representation of internal structures present on the device’s output pins which are
represented as a pair of clamp-to-rail diodes connected to the VPOS_IN_x and VNEG_IN_x supply rails.
D2
C2
VPOS_IN_x
D4
LN_x
C1
LP_x
VNEG_IN_x
D1
D3
VPOS_IN_x
VSENSEP_x
R1
VPOS_IN_x
VNEG_IN_x
C3
VPOS_IN_x
CCOMP_x
VPOS_IN_x
VNEG_IN_x
VOUT_x
R2
IOUT_x
R3
D5
FB1
Shared Voltage &
Current Output Terminal
VPOS_IN_x
VNEG_IN_x
VNEG_IN_x
D6
D7
C4
VNEG_IN_x
DAC8775
(Single Channel Illustrated for Simplicity)
Copyright © 2016, Texas Instruments Incorporated
Figure 129. Simplified Block Diagram of Internal Structures and External Protection
When these internal structures are exposed to industrial transient testing, without the external protection
components, the diode structures will become forward biased and conduct current. If the conducted current is too
large, which is often true for high-voltage industrial transient tests, the structures will become permanently
damaged and impact device functionality.
Both attenuation and diversion strategies are implemented to protect the internal structures as well as the device
itself. Attenuation is realized by capacitor C4 which forms an R/C low-pass filter when interacting with the source
impedance of the transient generator, ferrite bead FB1 also helps attenuate high-frequency current, along with
both AC and DC current limiters realized by series pass elements R1, R2, and R3. Diversion is achieved by
transient voltage suppressor (TVS) diode D7 and clamp-to-rail diodes D5 and D6. The combined effects of both
strategies effectively limit the current flowing into the device and through the internal diode structures such that
the device is not damaged and remains functional.
It is important to also include TVS diodes D1 and D4 at the VPOS_IN_x and VNEG_IN_x nodes in order to
provide a discharge path for the energy that is going to be sent to these nodes through diodes D5, D6, and the
internal diode structures. Without these diodes when current is diverted to these nodes the DC/DC converter
storage capacitors C1 and C2 will charge, slowly increasing the voltage at these nodes.
62
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
DAC8775
www.ti.com
SLVSBY7 – FEBRUARY 2017
Application Information (continued)
9.1.5 Implementing HART with DAC8775
The DAC8775 features internal resistors to convert a 500-mVpp HART FSK signal sourced by an external HART
modem. These resistors are ratiometrically matched to the gain-setting resistors for the current output signal
chain to ensure that a 500-mVpp input at the HART_IN_x pin is delivered as a 1-mApp signal at the respective
IOUT_x pin regardless of which gain mode is selected.
An external capacitor, placed in series between the HART_IN_x pin and HART FSK source, is required to AC
couple the HART FSK signal to the HART_IN_x pin. The recommended capacitance for this external capacitor is
from 10 nF to 22 nF.
9.2 Typical Application
9.2.1 1W Power Dissipation, Quad Channel, EMC and EMI Protected Analog Output Module with
Adaptive Power Management
Isolation
Barrier
Field
Connections
100µH
3300pF
+12V
487NŸ
100pF
301NŸ
SW
VIN
VOUT/FB
EN
13-65V Field
Supply Input
2.2µF
10µF
34NŸ
LM5166
SS
HYS
0.033µF
+12V
100P+
10PF
10PF
RSET
GND
10PF
0.1PF
PGOOD
PAD
RT
PVDD
AVDD
VPOS_IN_x
LN_x
LP_x
VNEG_IN_x
301NŸ
Field Ground
DVDD
0.1PF
0.1PF
0.1PF
15Ÿ
DVDD_EN
VSENSEP_x
(Optional)
VDD
VCC1
CS
VPOS_IN_x
CCOMP_x
VCC2
INA
OUTA
SYNC
OUTB
SDIN
OUTC
SCLK
Ferrite Bead
15Ÿ
MOSI
INB
SCLK
INC
MISO
OUTD
ISO7641
ISO7641
IND
GND1
Shared Voltage &
Current Output Terminal
VOUT_x
DAC8775
36V
Bidirectional
TVS Diode
15Ÿ
IOUT_x
SDO
GND2
1nF
VNEG_IN_x
HART_IN_x
Digital Controller
22nF
HART Signal
FSK 1200-2200Hz
VSENSEN_x
VCC1
GND
VCC2
OUTA
CS
INA
MOSI
INB
SCLK
INC
MISO
OUTD
ISO7641
ISO7641
GND1
RESET
OUTB
CLR
OUTC
LDAC
PVSS
ALARM
AGND
IND
GND2
(Single Channel Illustrated for Simplicity)
Copyright © 2016, Texas Instruments Incorporated
Figure 130. DAC8775 in Quad-Channel PLC AO Module
9.2.2 Design Requirements
Analog I/O modules are used by programmable logic controllers (PLCs) to interface sensors, actuators, and
other field instruments. These modules must meet stringent electrical specifications for both accuracy and robust
protection. These outputs are typically current outputs based on the 4-mA to 20-mA range and derivatives or
voltage outputs ranging from 0 V to 5 V, 0 V to 10 V, ±5 V, and ±10 V. Common error budgets accommodate
0.1% full-scale range total unadjusted error (% FSR TUE) at room temperature. Designs that desire stronger
accuracy over temperature frequently implement calibration. Often the PLC back-plane provides access to a 12V to 36-V analog supply from which a majority of analog supply voltages are derived.
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
63
DAC8775
SLVSBY7 – FEBRUARY 2017
www.ti.com
Typical Application (continued)
Analog output
between each
channel count
reduced power
modules are frequently multi-channel modules featuring either channel-to-channel isolation
channel or group isolation where several channels share a common ground connection. As
increases it is desirable to maintain small form-factor requiring high levels of integration and
dissipation in order to control heat inside of the PLC enclosure.
Therefore the design requirements are:
• Support of standard industrial automation voltage and current output spans
• Operation with standard industrial automation supply voltages from 12 V to 36 V
• Current and voltage outputs with TUE less than 0.1% at 25°C
• Total on-board power dissipation less than or equal to 1 W
• At minimum criteria B IEC61000-4 ESD, EFT, CI, and Surge immunity
9.2.3 Detailed Design Procedure
AVDD
RA
RB
AVDD
A2
AVDD
+
AVDD
Q1
+
Q2
AVSS
A1
IOUT
AVDD
SYNC
AVSS
VOUTA
DIN
RSET
SCLK
GND
VOUTB
LDAC
GND
VREFIN/VREFOUT
AVDD
+
A3
VOUT
AVSS
RG1
RFB
RG2
Copyright © 2016, Texas Instruments Incorporated
Figure 131. Generic Design for Typical PLC Current and Voltage Outputs
Figure 131 illustrates a common generic solution for realizing the desired voltage and current output spans for
industrial automation applications.
The current output circuit is comprised of amplifiers A1 and A2, MOSFETs Q1 and Q2, and the three resistors
RSET, RA, and RB. This two-stage current source enables the ground-referenced DAC output voltage to drive
the high-side amplifier required for the current-source.
64
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
DAC8775
www.ti.com
SLVSBY7 – FEBRUARY 2017
Typical Application (continued)
The voltage output circuit is composed of amplifier A3 and the resistor network consisting of RFB, RG1, and
RG2. A3 operates as a modified summing amplifier, where the DAC controls the non-inverting input and inverting
input has one path to GND and a second to VREF. This configuration allows the single-ended DAC to create
both the unipolar 0-V to 5-V and 0-V to 10-V outputs and the bipolar ±5-V and ±10-V outputs by modifying the
values of RG1 and RG2.
Though this generic circuit realizes the desired spans, both the voltage and current outputs have short-comings.
The current output high-side supply voltage is typically 24 V, when driving low impedance loads with this supply
voltage a considerable amount of power is dissipated on RB and Q2. This power dissipation results in increased
heat which leads to drift errors for amplifiers A1 and A2 as well as the DAC, resistors, and the reference voltage.
In order to reduce the power dissipation in the high-side voltage to current converter circuit a feedback system
which monitors the voltage drop across Q2 and adaptively adjusts the high-side supply voltage can be
implemented. This feedback system adjusts the high side supply voltage to the minimum supply required to keep
Q2 in the linear region of operation, avoiding compliance voltage saturation, reducing power dissipation and heat
to a minimum which helps maintain accuracy.
The generic voltage output circuit performs well but does not compensate for errors associated with excessive
output impedance or differences in ground potential from the local PLC ground and the load ground. A modified
circuit can be implemented which provides connections to sense errors associated with both output impedance
voltage drops and differences in ground potentials, this circuit is shown in Figure 128.
Figure 130 illustrates the DAC8775 along with the LM5166 in a quad-channel PLC analog output module. The
DAC8775 includes the generic voltage and current output circuits along with buck-boost converter and feedback
circuits for the current output and positive and negative sense connections for the voltage output circuit. The
DAC8775 includes an internal reference and internal LDO for supplying the field-side of a digital isolator along
with the buck-boost converter generating the single or dual high voltage supplies required for the output circuits,
all powered from a single supply.
The DAC8775 buck-boost converter operates at peak efficiency with 12-V input voltage with peak power
consumption of approximately 780mW. The LM5166 circuit accepts a wide range of input voltages from just
above 12 V to 65 V, providing coverage for most standard PLC supply voltages, and buck-converts this supply
voltage to the optimal 12-V supply for the DAC8775. Cumulative power dissipation for the DAC8775 and LM5166
is under 1 W.
Two ISO7641 devices implement galvanic isolation for all of the digital communication lines, though only a single
ISO7641 is required for basic communication with the DAC8775 SPI compatible interface. An output protection
circuit is included which is designed to provide immunity to the IEC61000-4 industrial transient and radiation test
suite. The protection circuit includes transient voltage suppressor (TVS) diodes, clamp-to-rail steering diodes,
and pass elements in the form of resistors and ferrite beads.
9.2.4 Application Curves
0.08%
0.05%
A
0.06%
C
B
Total Unadjusted Error (FSR)
Total Unadjusted Error (FSR)
0.07%
D
0.05%
0.04%
0.03%
0.02%
0.01%
0.00%
-0.01%
0.04%
A
B
0.03%
C
D
0.02%
0.01%
0.00%
-0.01%
-0.02%
-0.03%
-0.04%
-0.02%
-0.05%
0
8192
16384
24576
32768
40960
49152
57344
Code
65536
0
C001
Figure 132. 4-mA to 20-mA IOUT TUE vs Code
8192
16384
24576
32768
40960
49152
57344
Code
Product Folder Links: DAC8775
C001
Figure 133. ±10-V VOUT TUE vs Code
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
65536
65
DAC8775
SLVSBY7 – FEBRUARY 2017
www.ti.com
Typical Application (continued)
Total Power Dissipation (W)
1.0
0.9
0.8
0.7
0.6
0.5
RL = 0
RL = 249
RL = 487
RL = 750
RL = 976
0.4
12
15
18
21
24
27
PVDD (V)
30
33
36
C001
Figure 134. Total On-Board Power Dissipation vs Supply
66
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
DAC8775
www.ti.com
SLVSBY7 – FEBRUARY 2017
10 Power Supply Recommendations
There are three possible hardware power supply configurations for the DAC8775: the internal DC/DC provides
both positive and negative supply voltages, the internal DC/DC provides only one of the supply voltages with an
external supply provided on the other, or the internal DC/DC is not used at all and external supply voltages are
provided for both positive and negative supply voltages. Simple illustrations for each case are shown below.
12V to 36V
100P+
10PF
10PF
PVDD
AVDD
VPOS_IN_x
0.1PF
LN_x
LP_x
VNEG_IN_x
10PF
DAC8775
PVSS
AGND
(Single Channel Illustrated for Simplicity)
Copyright © 2016, Texas Instruments Incorporated
Figure 135. DAC8775 With Dual Supplies from Internal DC/DC
Figure 136 illustrates using a single supply from the DAC8775 internal DC/DC and the other supply from an
external source. In this example the VNEG_IN_x supply is the input being supplied by an external supply, or
ground for unipolar output spans. A similar scheme could be used if VPOS_IN_x was supplied by an external
supply and VNEG_IN_x was supplied by the internal DC/DC.
12V to 36V
100P+
10PF
AVDD
VPOS_IN_x
0.1PF
LN_x
LP_x
VNEG_IN_x
10PF
PVDD
To GND or
External Supply
DAC8775
PVSS
AGND
(Single Channel Illustrated for Simplicity)
Copyright © 2016, Texas Instruments Incorporated
Figure 136. DAC8775 With Single Supply from Internal DC/DC
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
67
DAC8775
SLVSBY7 – FEBRUARY 2017
www.ti.com
The scheme in Figure 137 should be used if the internal DC/DC is not used at all and external supplies are
selected for VPOS_IN_x and VNEG_IN_x. When using external supplies for VPOS_IN_x it is important that
VPOS_IN_x, PVDD, and AVDD nodes are tied to the same voltage potential with the same ramp-rate.
To GND or
External Supply
+12V
10PF
PVDD
AVDD
VPOS_IN_x
0.1PF
LN_x
LP_x
VNEG_IN_x
0.1PF
DAC8775
PVSS
AGND
(Single Channel Illustrated for Simplicity)
Copyright © 2016, Texas Instruments Incorporated
Figure 137. DAC8775 with External Supplies
68
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
DAC8775
www.ti.com
SLVSBY7 – FEBRUARY 2017
11 Layout
11.1 Layout Guidelines
An example layout based on the design discussed in the Typical Application section is shown in the Layout
Example section. Figure 139 shows the top-layer of the design which illustrates all component placement as no
components are placed on the bottom layer. Figure 140 shows two of the internal power-layers: the layer on the
left contains VPOS_IN_B, VPOS_IN_C, VNEG_IN_B, and VNEG_IN_D nets while the layer on the right contains
VPOS_IN_A, VPOS_IN_D, VNEG_IN_A, and VNEG_IN_C nets.
The layer stack-up for this 6-layer example layout is shown below. A 6-layer design is not required, however
provides optimal conditions for ground and power-supply planes. The solid ground plane beneath the majority of
the signal traces, which are placed on the top layer, allows for a clean return path for sensitive analog traces and
keeps them isolated from the internal power supply nets which will exhibit ripple from the DC/DC converter.
Signal Traces and Ground Fill
Solid Ground Plane
Split Power Supply Plane for 13V to 66V Field Supply Connection and PVDD/AVDD net
Split VPOS_IN_B, VPOS_IN_C, VNEG_IN_B, and VNEG_IN_D net Planes
Split VPOS_IN_A, VPOS_IN_D, VNEG_IN_A, and VNEG_IN_C net Planes
Signal Traces and Ground Fill
Figure 138. Example Layout Layer Stack-Up
Traces for the DC/DC external components should be as low impedance, low inductance, and low capacitance
as possible in order to maintain optimum performance. As such wide traces should be used to minimize
inductance with minimal use of vias as vias will contribute large inductance and capacitance to the trace. For this
reason it is recommended that all DC/DC components placed on the top layer.
The industrial transient protection circuit should be placed as close to the output connectors as possible to
ensure that the return currents from these transients have a controlled path to exit the PCB which does not
impact the analog circuitry.
Split ground planes for the DC/DC, digital, and analog grounds are not required but may be helpful to isolated
ground return currents from cross-talk. If split ground planes are used care should be taken to ensure that signal
traces are only placed above or below the locations where their respective grounds are placed in order to
mitigate unexpected return paths or coupling to the other ground planes. If a single ground plane is used it is
advisable to follow similar practices implementing a star-ground where the respective return currents interact with
one another minimally. The example layout uses a single ground plane, based on measured results, performs
similarly to an identical version with split ground planes.
The perimeter of the board is stitched with vias in order to enhance design performance against environments
which may include radiated emissions. Additional vias are placed in critical areas nearby the design in order to
place ground pours in between nodes to reduce cross-talk between adjacent traces.
Standard best-practices should be applied to the remaining components, including but not limited to, placing
decoupling capacitors close to their respective pins and using wide traces or copper pours where possible,
particularly for power traces where high current may flow.
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
69
DAC8775
SLVSBY7 – FEBRUARY 2017
www.ti.com
11.2 Layout Example
Channel B DC/DC
Components
Channel C DC/DC
Components
12V Output
Buck-Converter
Channel A DC/DC
Components
Channel D DC/DC
Components
Channel A Output
Protection Circuit
Channel B Output
Protection Circuit
Channel C Output
Protection Circuit
Channel D Output
Protection Circuit
Figure 139. Application Example Layout
70
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
DAC8775
www.ti.com
SLVSBY7 – FEBRUARY 2017
Layout Example (continued)
Figure 140. Example Design Internal Copper Pours
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
71
DAC8775
SLVSBY7 – FEBRUARY 2017
www.ti.com
12 Device and Documentation Support
12.1 Documentation Support
12.1.1 Related Documentation
For related documentation see the following:
• DAC8775 EVM User's Guide (SBAU248)
• LM5166 3-V to 65-V Input, 500-mA Synchronous Buck Converter with Ultra-Low IQ Data Sheet (SNVSA67)
• ISO76x1 Low-Power Triple and Quad-Channels Digital Isolators (SLLSEC3)
12.2 Receiving Notification of Documentation Updates
To receive notification of documentation updates, navigate to the device product folder on ti.com. In the upper
right corner, click on Alert me to register and receive a weekly digest of any product information that has
changed. For change details, review the revision history included in any revised document.
12.3 Community Resources
The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective
contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of
Use.
TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration
among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help
solve problems with fellow engineers.
Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and
contact information for technical support.
12.4 Trademarks
Microwire, E2E are trademarks of Texas Instruments.
SPI, QSPI are trademarks of Motorola, Inc.
All other trademarks are the property of their respective owners.
12.5 Electrostatic Discharge Caution
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
12.6 Glossary
SLYZ022 — TI Glossary.
This glossary lists and explains terms, acronyms, and definitions.
72
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
DAC8775
www.ti.com
SLVSBY7 – FEBRUARY 2017
13 Mechanical, Packaging, and Orderable Information
The following pages include mechanical, packaging, and orderable information. This information is the most
current data available for the designated devices. This data is subject to change without notice and revision of
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
Product Folder Links: DAC8775
73
PACKAGE OPTION ADDENDUM
www.ti.com
17-Feb-2017
PACKAGING INFORMATION
Orderable Device
Status
(1)
Package Type Package Pins Package
Drawing
Qty
Eco Plan
Lead/Ball Finish
MSL Peak Temp
(2)
(6)
(3)
Op Temp (°C)
Device Marking
(4/5)
DAC8775IRWFR
ACTIVE
VQFN
RWF
72
2000
Green (RoHS
& no Sb/Br)
CU NIPDAU
Level-3-260C-168 HR
-40 to 125
DAC8775
DAC8775IRWFT
ACTIVE
VQFN
RWF
72
250
Green (RoHS
& no Sb/Br)
CU NIPDAU
Level-3-260C-168 HR
-40 to 125
DAC8775
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability
information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that
lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between
the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight
in homogeneous material)
(3)
MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4)
There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
(5)
Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
(6)
Lead/Ball Finish - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead/Ball Finish values may wrap to two lines if the finish
value exceeds the maximum column width.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
Addendum-Page 1
Samples
PACKAGE OPTION ADDENDUM
www.ti.com
17-Feb-2017
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
Addendum-Page 2
PACKAGE MATERIALS INFORMATION
www.ti.com
17-Feb-2017
TAPE AND REEL INFORMATION
*All dimensions are nominal
Device
DAC8775IRWFR
Package Package Pins
Type Drawing
VQFN
RWF
72
SPQ
Reel
Reel
A0
Diameter Width (mm)
(mm) W1 (mm)
2000
330.0
24.4
Pack Materials-Page 1
10.3
B0
(mm)
K0
(mm)
P1
(mm)
W
Pin1
(mm) Quadrant
10.3
1.1
16.0
24.0
Q2
PACKAGE MATERIALS INFORMATION
www.ti.com
17-Feb-2017
*All dimensions are nominal
Device
Package Type
Package Drawing
Pins
SPQ
Length (mm)
Width (mm)
Height (mm)
DAC8775IRWFR
VQFN
RWF
72
2000
367.0
367.0
45.0
Pack Materials-Page 2
PACKAGE OUTLINE
RWF0072A
VQFN - 0.9 mm max height
SCALE 1.400
PLASTIC QUAD FLATPACK - NO LEAD
10.1
9.9
B
A
PIN 1 INDEX AREA
10.1
9.9
0.9 MAX
C
SEATING PLANE
0.05
0.00
0.08
2X 8.5
(0.2) TYP
36
19
37
18
8.5 0.1
2X
8.5
1
PIN 1 ID
(OPTIONAL)
68X 0.5
54
72
55
72X
0.5
0.3
72X
0.3
0.2
0.1
0.05
C A
B
4221567/A 07/2014
NOTES:
1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing
per ASME Y14.5M.
2. This drawing is subject to change without notice.
3. The package thermal pad must be soldered to the printed circuit board for thermal and mechanical performance.
www.ti.com
EXAMPLE BOARD LAYOUT
RWF0072A
VQFN - 0.9 mm max height
PLASTIC QUAD FLATPACK - NO LEAD
SYMM
(1.3) TYP
72
72X (0.6)
55
1
54
72X (0.25)
(1.3)
TYP
68X (0.5)
SYMM
(9.8)
( 0.2) TYP
VIA
37
18
19
36
( 8.5)
(9.8)
LAND PATTERN EXAMPLE
SCALE:10X
0.07 MAX
ALL AROUND
0.07 MIN
ALL AROUND
SOLDER MASK
OPENING
METAL
SOLDER MASK
OPENING
METAL
UNDER SOLDER MASK
NON SOLDER MASK
DEFINED
(PREFERRED)
SOLDER MASK
DEFINED
SOLDER MASK DETAILS
4221567/A 07/2014
NOTES: (continued)
4. This package is designed to be soldered to a thermal pad on the board. For more information, see Texas Instruments literature
number SLUA271 (www.ti.com/lit/slua271).
www.ti.com
EXAMPLE STENCIL DESIGN
RWF0072A
VQFN - 0.9 mm max height
PLASTIC QUAD FLATPACK - NO LEAD
METAL
TYP
72X (0.6)
72X (0.25)
(1.3) TYP
55
72
1
54
(1.3)
TYP
68X (0.5)
SYMM
(9.8)
18
37
19
SYMM
( 1.1)
TYP
36
(9.8)
SOLDER PASTE EXAMPLE
BASED ON 0.125 mm THICK STENCIL
EXPOSED PAD
60% PRINTED SOLDER COVERAGE BY AREA
SCALE:10X
4221567/A 07/2014
NOTES: (continued)
5. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate
design recommendations.
www.ti.com
IMPORTANT NOTICE FOR TI DESIGN INFORMATION AND RESOURCES
Texas Instruments Incorporated (‘TI”) technical, application or other design advice, services or information, including, but not limited to,
reference designs and materials relating to evaluation modules, (collectively, “TI Resources”) are intended to assist designers who are
developing applications that incorporate TI products; by downloading, accessing or using any particular TI Resource in any way, you
(individually or, if you are acting on behalf of a company, your company) agree to use it solely for this purpose and subject to the terms of
this Notice.
TI’s provision of TI Resources does not expand or otherwise alter TI’s applicable published warranties or warranty disclaimers for TI
products, and no additional obligations or liabilities arise from TI providing such TI Resources. TI reserves the right to make corrections,
enhancements, improvements and other changes to its TI Resources.
You understand and agree that you remain responsible for using your independent analysis, evaluation and judgment in designing your
applications and that you have full and exclusive responsibility to assure the safety of your applications and compliance of your applications
(and of all TI products used in or for your applications) with all applicable regulations, laws and other applicable requirements. You
represent that, with respect to your applications, you have all the necessary expertise to create and implement safeguards that (1)
anticipate dangerous consequences of failures, (2) monitor failures and their consequences, and (3) lessen the likelihood of failures that
might cause harm and take appropriate actions. You agree that prior to using or distributing any applications that include TI products, you
will thoroughly test such applications and the functionality of such TI products as used in such applications. TI has not conducted any
testing other than that specifically described in the published documentation for a particular TI Resource.
You are authorized to use, copy and modify any individual TI Resource only in connection with the development of applications that include
the TI product(s) identified in such TI Resource. NO OTHER LICENSE, EXPRESS OR IMPLIED, BY ESTOPPEL OR OTHERWISE TO
ANY OTHER TI INTELLECTUAL PROPERTY RIGHT, AND NO LICENSE TO ANY TECHNOLOGY OR INTELLECTUAL PROPERTY
RIGHT OF TI OR ANY THIRD PARTY IS GRANTED HEREIN, including but not limited to any patent right, copyright, mask work right, or
other intellectual property right relating to any combination, machine, or process in which TI products or services are used. Information
regarding or referencing third-party products or services does not constitute a license to use such products or services, or a warranty or
endorsement thereof. Use of TI Resources may require a license from a third party under the patents or other intellectual property of the
third party, or a license from TI under the patents or other intellectual property of TI.
TI RESOURCES ARE PROVIDED “AS IS” AND WITH ALL FAULTS. TI DISCLAIMS ALL OTHER WARRANTIES OR
REPRESENTATIONS, EXPRESS OR IMPLIED, REGARDING TI RESOURCES OR USE THEREOF, INCLUDING BUT NOT LIMITED TO
ACCURACY OR COMPLETENESS, TITLE, ANY EPIDEMIC FAILURE WARRANTY AND ANY IMPLIED WARRANTIES OF
MERCHANTABILITY, FITNESS FOR A PARTICULAR PURPOSE, AND NON-INFRINGEMENT OF ANY THIRD PARTY INTELLECTUAL
PROPERTY RIGHTS.
TI SHALL NOT BE LIABLE FOR AND SHALL NOT DEFEND OR INDEMNIFY YOU AGAINST ANY CLAIM, INCLUDING BUT NOT
LIMITED TO ANY INFRINGEMENT CLAIM THAT RELATES TO OR IS BASED ON ANY COMBINATION OF PRODUCTS EVEN IF
DESCRIBED IN TI RESOURCES OR OTHERWISE. IN NO EVENT SHALL TI BE LIABLE FOR ANY ACTUAL, DIRECT, SPECIAL,
COLLATERAL, INDIRECT, PUNITIVE, INCIDENTAL, CONSEQUENTIAL OR EXEMPLARY DAMAGES IN CONNECTION WITH OR
ARISING OUT OF TI RESOURCES OR USE THEREOF, AND REGARDLESS OF WHETHER TI HAS BEEN ADVISED OF THE
POSSIBILITY OF SUCH DAMAGES.
You agree to fully indemnify TI and its representatives against any damages, costs, losses, and/or liabilities arising out of your noncompliance with the terms and provisions of this Notice.
This Notice applies to TI Resources. Additional terms apply to the use and purchase of certain types of materials, TI products and services.
These include; without limitation, TI’s standard terms for semiconductor products http://www.ti.com/sc/docs/stdterms.htm), evaluation
modules, and samples (http://www.ti.com/sc/docs/sampterms.htm).
Mailing Address: Texas Instruments, Post Office Box 655303, Dallas, Texas 75265
Copyright © 2017, Texas Instruments Incorporated