Product Folder Order Now Support & Community Tools & Software Technical Documents DLP470TE DLPS106 – APRIL 2018 DLP470TE 0.47 4K UHD DMD 1 Features 3 Description • The TI DLP470TE digital micromirror device (DMD) is a digitally controlled micro-electromechanical system (MEMs) spatial light modulator (SLM) that enables bright, full 4K UHD display solutions. When coupled with the appropriate optical system, the DLP470TE DMD displays true 4K UHD resolution (over 8 million pixels on screen) and is capable of delivering accurate, detailed images to a variety of surfaces. The DLP470TE DMD, together with the DLPC4422 display controller and DLPA100 power and motor driver, comprise the DLP® 0.47 4K UHD chipset. This solution is a great fit for many high brightness 4K UHD display systems. 1 • • 0.47-Inch Diagonal Micromirror Array – 4K UHD (3840 × 2160) Display Resolution – 5.4 Micron Micromirror Pitch – ±17° Micromirror Tilt (Relative to Flat Surface) – Bottom Illumination 2xLVDS Input Data Bus Dedicated DLPC4422 Display Controller, DLPA100 Power Management IC and Motor Driver for Reliable Operation 2 Applications • • • • • • Device Information(1) 4K UHD Display Laser TV Business and Education Digital Signage Gaming Home Cinema PART NUMBER DLP470TE PACKAGE FXJ (257) BODY SIZE (NOM) 32.2 mm × 22.3 mm (1) For all available packages, see the orderable addendum at the end of the data sheet. Simplified Schematic DAD CTRL DAD CTRL SCP CTRL DLPC4422 Display Controller 3.3V to 1.8V Translator SCP CTRL C/D DMD DATA C/D DMD CLK C/D SCTRL VOFFSET VBIAS TPS65145 (Voltage Regultor) 3.3V VRESET PG_OFFSET DLP470TE DMD EN_OFFSET VREG DLPC4422 Display Controller 1.8V A/B DMD DATA A/B DMD CLK A/B SCTRL 1 An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications, intellectual property matters and other important disclaimers. PRODUCTION DATA. DLP470TE DLPS106 – APRIL 2018 www.ti.com Table of Contents 1 2 3 4 5 6 7.3 Feature Description................................................. 7.4 Device Functional Modes........................................ 7.5 Optical Interface and System Image Quality Considerations ......................................................... 7.6 Micromirror Array Temperature Calculation............ 7.7 Micromirror Landed-On/Landed-Off Duty Cycle ..... Features .................................................................. 1 Applications ........................................................... 1 Description ............................................................. 1 Revision History..................................................... 2 Pin Configuration and Functions ......................... 3 Specifications....................................................... 10 8 6.1 6.2 6.3 6.4 6.5 6.6 6.7 Absolute Maximum Ratings .................................... 10 Storage Conditions.................................................. 11 ESD Ratings............................................................ 11 Recommended Operating Conditions..................... 11 Thermal Information ................................................ 14 Electrical Characteristics......................................... 15 Capacitance at Recommended Operating Conditions ................................................................ 15 6.8 Timing Requirements .............................................. 16 6.9 System Mounting Interface Loads .......................... 19 6.10 Micromirror Array Physical Characteristics ........... 20 6.11 Micromirror Array Optical Characteristics ............. 22 6.12 Window Characteristics......................................... 23 6.13 Chipset Component Usage Specification ............. 23 7 25 25 25 26 27 Application and Implementation ........................ 30 8.1 Application Information............................................ 30 8.2 Typical Application ................................................. 30 8.3 DMD Die Temperature Sensing.............................. 31 9 Power Supply Recommendations...................... 33 9.1 DMD Power Supply Power-Up Procedure .............. 33 9.2 DMD Power Supply Power-Down Procedure ......... 33 10 Device and Documentation Support ................. 36 10.1 10.2 10.3 10.4 10.5 10.6 10.7 Detailed Description ............................................ 24 Device Support...................................................... Documentation Support ....................................... Receiving Notification of Documentation Updates Community Resources.......................................... Trademarks ........................................................... Electrostatic Discharge Caution ............................ Glossary ................................................................ 36 36 37 37 37 37 37 11 Mechanical, Packaging, and Orderable Information ........................................................... 38 7.1 Overview ................................................................. 24 7.2 Functional Block Diagram ....................................... 24 4 Revision History NOTE: Page numbers for previous revisions may differ from page numbers in the current version. 2 DATE REVISION NOTES April 2018 * Initial release. Submit Documentation Feedback Copyright © 2018, Texas Instruments Incorporated Product Folder Links: DLP470TE DLP470TE www.ti.com DLPS106 – APRIL 2018 5 Pin Configuration and Functions Series 410 Package 257-pin FXJ Bottom View 2 1 4 3 6 5 7 8 10 12 14 16 18 20 22 24 26 28 30 9 11 13 15 17 19 21 23 25 27 29 Z W V U T R P N M L K J H G F E D C B A CAUTION To ensure reliable, long-term operation of the .47” 4K UHD S410 DMD, it is critical to properly manage the layout and operation of the signals identified in the table below. For specific details and guidelines, refer to the PCB Design Requirements for TI DLP Standard TRP Digital Micromirror Devices application report before designing the board. Submit Documentation Feedback Copyright © 2018, Texas Instruments Incorporated Product Folder Links: DLP470TE 3 DLP470TE DLPS106 – APRIL 2018 www.ti.com Pin Functions (1) PIN NAME NO. D_AN(0) C6 D_AN(1) C3 D_AN(2) E1 D_AN(3) C4 D_AN(4) D1 D_AN(5) B8 D_AN(6) F4 D_AN(7) E3 D_AN(8) C11 D_AN(9) F3 D_AN(10) K4 D_AN(11) H3 D_AN(12) J3 D_AN(13) C13 D_AN(14) A5 D_AN(15) A3 D_AP(0) C7 D_AP(1) C2 D_AP(2) E2 D_AP(3) B4 D_AP(4) C1 D_AP(5) B7 D_AP(6) E4 D_AP(7) D3 D_AP(8) C12 D_AP(9) F2 D_AP(10) J4 D_AP(11) G3 D_AP(12) J2 D_AP(13) C14 D_AP(14) A6 D_AP(15) A4 (1) (2) 4 INTERNAL TERMINATION TRACE LENGTH (mil) I/O (2) SIGNAL DATA RATE I LVDS DDR Differential Data negative 805.0 I LVDS DDR Differential Data positive 805.0 DESCRIPTION The .47” 4K UHD TRP 2xLVDS series 410 DMD is a component of one or more DLP chipsets. Reliable function and operation of the .47” 4K UHD TRP 2xLVDS series 410 DMD requires that it be used in conjunction with the other components of the applicable DLP chipset, including those components that contain or implement TI DMD control technology. TI DMD control technology is the TI technology and devices for operating or controlling a DLP DMD. I = Input, O = Output, P = Power, G = Ground, NC = No connect Submit Documentation Feedback Copyright © 2018, Texas Instruments Incorporated Product Folder Links: DLP470TE DLP470TE www.ti.com DLPS106 – APRIL 2018 Pin Functions(1) (continued) PIN NAME NO. D_BN(0) N4 D_BN(1) Z11 D_BN(2) W4 D_BN(3) W10 D_BN(4) L1 D_BN(5) V8 D_BN(6) W6 D_BN(7) M1 D_BN(8) R4 D_BN(9) W1 D_BN(10) U4 D_BN(11) V2 D_BN(12) Z5 D_BN(13) N3 D_BN(14) Z2 D_BN(15) L4 D_BP(0) M4 D_BP(1) Z12 D_BP(2) Z4 D_BP(3) Z10 D_BP(4) L2 D_BP(5) V9 D_BP(6) W7 D_BP(7) N1 D_BP(8) P4 D_BP(9) V1 D_BP(10) T4 D_BP(11) V3 D_BP(12) Z6 D_BP(13) N2 D_BP(14) Z3 D_BP(15) L3 INTERNAL TERMINATION TRACE LENGTH (mil) I/O (2) SIGNAL DATA RATE I LVDS DDR Differential Data negative 805.0 I LVDS DDR Differential Data positive 805.0 DESCRIPTION Submit Documentation Feedback Copyright © 2018, Texas Instruments Incorporated Product Folder Links: DLP470TE 5 DLP470TE DLPS106 – APRIL 2018 www.ti.com Pin Functions(1) (continued) PIN NAME NO. D_CN(0) H27 D_CN(1) A20 D_CN(2) H28 D_CN(3) K28 D_CN(4) K30 D_CN(5) C23 D_CN(6) G27 D_CN(7) J30 D_CN(8) B24 D_CN(9) A21 D_CN(10) A27 D_CN(11) C29 D_CN(12) A26 D_CN(13) C25 D_CN(14) A29 D_CN(15) C30 D_CP(0) J27 D_CP(1) A19 D_CP(2) H29 D_CP(3) K27 D_CP(4) K29 D_CP(5) C22 D_CP(6) F27 D_CP(7) H30 D_CP(8) B25 D_CP(9) B21 D_CP(10) B27 D_CP(11) C28 D_CP(12) A25 D_CP(13) C24 D_CP(14) A28 D_CP(15) B30 6 INTERNAL TERMINATION TRACE LENGTH (mil) I/O (2) SIGNAL DATA RATE I LVDS DDR Differential Data negative 805.0 I LVDS DDR Differential Data positive 805.0 DESCRIPTION Submit Documentation Feedback Copyright © 2018, Texas Instruments Incorporated Product Folder Links: DLP470TE DLP470TE www.ti.com DLPS106 – APRIL 2018 Pin Functions(1) (continued) PIN NAME NO. D_DN(0) V25 D_DN(1) V28 D_DN(2) T30 D_DN(3) V27 D_DN(4) U30 D_DN(5) W23 D_DN(6) R27 D_DN(7) T28 D_DN(8) V20 D_DN(9) R28 D_DN(10) L27 D_DN(11) N28 D_DN(12) M28 D_DN(13) V18 D_DN(14) Z26 D_DN(15) Z28 D_DP(0) V24 D_DP(1) V29 D_DP(2) T29 D_DP(3) W27 D_DP(4) V30 D_DP(5) W24 D_DP(6) T27 D_DP(7) U28 D_DP(8) V19 D_DP(9) R29 D_DP(10) M27 I/O (2) SIGNAL DATA RATE INTERNAL TERMINATION DESCRIPTION TRACE LENGTH (mil) 805.0 I LVDS DDR Differential Data negative 805.0 I LVDS DDR Differential Data positive D_DP(11) P28 D_DP(12) M29 D_DP(13) V17 D_DP(14) Z25 D_DP(15) Z27 SCTRL_AN G1 I LVDS DDR Differential Serial control negative (3) 805.0 SCTRL_AP F1 I LVDS DDR Differential Serial control negative (3) 805.0 SCTRL_BN V5 I LVDS DDR Differential Serial control negative (3) 805.0 SCTRL_BP V4 I LVDS DDR Differential Serial control negative (3) 805.0 (3) 805.0 SCTRL_CN C26 I LVDS DDR Differential Serial control negative SCTRL_CP C27 I LVDS DDR Differential Serial control positive (3) 805.0 SCTRL_DN P30 I LVDS DDR Differential Serial control negative (3) 805.0 DDR (3) SCTRL_DP R30 I LVDS Differential Serial control positive DCLK_AN H2 I LVDS Differential Clock negative (3) 805.0 DCLK_AP H1 I LVDS Differential Clock positive (3) 805.0 (3) DCLK_BN V6 I LVDS Differential Clock negative DCLK_BP V7 I LVDS Differential Clock positive (3) (3) 805.0 805.0 805.0 These signals are very sensible to noise or intermittent power connections, which can cause irreversible DMD micromirror array damage or, to a lesser extent, image disruption. Consider this precaution during DMD board design and manufacturer handling of the DMD subassemblies. Submit Documentation Feedback Copyright © 2018, Texas Instruments Incorporated Product Folder Links: DLP470TE 7 DLP470TE DLPS106 – APRIL 2018 www.ti.com Pin Functions(1) (continued) PIN NAME NO. I/O (2) SIGNAL DATA RATE INTERNAL TERMINATION DESCRIPTION TRACE LENGTH (mil) DCLK_CN D27 I LVDS Differential Clock negative (3) 805.0 DCLK_CP E27 I LVDS Differential Clock positive (3) 805.0 (3) DCLK_DN N29 I LVDS Differential Clock negative DCLK_DP N30 I LVDS Differential Clock positive (3) Pull down Serial communications port clock. Active only when SCPENZ is logic low. (3) Pull down Serial communications port data input. Synchronous to SCPCLK rising edge. (3) Pull down Serial communications port enable active low. (3) SCPCLK A10 I LVCMOS SCPDI A12 I LVCMOS SCPENZ C10 I LVCMOS SCPDO A11 O LVCMOS RESET_ADDR(0) Z13 RESET_ADDR(1) W13 RESET_ADDR(2) V10 I LVCMOS RESET_ADDR(3) W14 RESET_MODE(0) W9 RESET_SEL(0) V14 RESET_SEL(1) Z8 RESET_STROBE Z9 I LVCMOS Pull down Rising edge latches in RESET_ADDR, RESET_MODE, & RESET_SEL. (3) PWRDNZ A8 I LVCMOS Pull down Active low device reset. (3) RESET_OEZ W15 I LVCMOS Pull up Active low output enable for internal reset driver circuits. (3) RESET_IRQZ V16 O LVCMOS Active low output interrupt to DLP display controller EN_OFFSET C9 O LVCMOS Active high enable for external VOFFSET regulator PG_OFFSET A9 I LVCMOS TEMP_N B18 Analog Temperature sensor diode cathode B17 Analog Temperature sensor diode anode TEMP_P I NC No Connect U16, U17, U18, U19 NC W11 B11 RESERVED_BC Z20 RESERVED_BD C18 RESERVED_PFE A18 RESERVED_TM C8 RESERVED_TP0 Z19 RESERVED_TP1 W20 RESERVED_TP2 W19 VBIAS (4) (4) 8 C15, C16, V11, V12 Serial communications port output. Pull down Reset driver address select. (3) LVCMOS Pull down Reset driver level select. (3) Reset driver level select. (3) RESERVED **MUST VERIFY WITH SRC DATA SHEET RESERVED_BB SDR 805.0 Reset driver mode select. (3) D12, D13, D14, D15, D16, D17, D18, D19, U12, U13, U14, U15 RESERVED_BA SDR 805.0 Analog Pull up Pull Down Active low fault from external VOFFSET regulator (3) Do not connect on DLP system board. No connect. No electrical connections from CMOS bond pad to package pin. No connect. No electrical connection from CMOS bond pad to package pin. O LVCMOS Do not connect on DLP system board I LVCMOS I Analog Do not connect on DLP system board P Analog Supply voltage for positive bias level of micromirror reset signal. Pull down Connect to ground on DLP system board VBIAS, VCC, VOFFSET, and VRESET power supplies must be connected for proper DMD operation. Submit Documentation Feedback Copyright © 2018, Texas Instruments Incorporated Product Folder Links: DLP470TE DLP470TE www.ti.com DLPS106 – APRIL 2018 Pin Functions(1) (continued) PIN NAME NO. I/O (2) SIGNAL DATA RATE INTERNAL TERMINATION DESCRIPTION VRESET (4) G4, H4, J1, K1 P Analog Supply voltage for negative reset level of micromirror reset signal VOFFSET (4) A30, B2, M30, Z1, Z30 P Analog Supply voltage for HVCMOS logic. Supply voltage for positive offset level of micromirror reset signal. Supply voltage for stepped high voltage at micromirror address electrodes. Analog Supply voltage for LVCMOS core. Supply voltage for positive offset level of micromirror reset signal during power down. Supply voltage for normal high level at micromirror address electrodes. VCC (4) A24, A7, B10, B13, B16, B19, B22, B28, B5, C17, C20, D4, J29, K2, L29, M2, N27, U27, V13, V15, V22, W17, W21, W26, W29, W3, Z18, Z23, Z29, Z7 P VSS (5) A13, A22, A23, B12, B14, B15, B20, B23, B26, B29, B3, B6, B9, C19, C21, C5, D2, G2, J28, K3, L28, L30, M3, P27, P29, U29, V21, V23, V26, W12, W16, W18, W2, W22, W25, W28, W30, W5, W8, Z21, Z22, Z24 G (5) TRACE LENGTH (mil) Device ground. Common return for all power. VSS must be connected for proper DMD operation. Submit Documentation Feedback Copyright © 2018, Texas Instruments Incorporated Product Folder Links: DLP470TE 9 DLP470TE DLPS106 – APRIL 2018 www.ti.com 6 Specifications 6.1 Absolute Maximum Ratings Over operating free-air temperature range (unless otherwise noted). Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device is not implied at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure above or below the Recommended Operating Conditions for extended periods may affect device reliability. MIN MAX UNIT SUPPLY VOLTAGES VCC Supply voltage for LVCMOS core logic (1) –0.5 2.3 V VOFFSET Supply voltage for HVCMOS and micromirror electrode (1) (2) –0.5 11 V VBIAS Supply voltage for micromirror electrode (1) –0.5 19 V VRESET Supply voltage for micromirror electrode (1) –15 –0.3 V |VBIAS – VOFFSET| Supply voltage difference (absolute value) (3) 11 V (4) 34 V –0.5 VCC + 0.5 V –0.5 VCC + 0.5 V |VBIAS – VRESET| Supply voltage difference (absolute value) INPUT VOLTAGES Input voltage for all other LVCMOS input pins (1) Input voltage for all other LVDS input pins (1) (5) (6) |VID| Input differential voltage (absolute value) 500 mV IID Input differential current (5) 6.3 mA ƒCLOCK Clock frequency for LVDS interface, DCLK_A 400 MHz ƒCLOCK Clock frequency for LVDS interface, DCLK_B 400 MHz ƒCLOCK Clock frequency for LVDS interface, DCLK_C 400 MHz ƒCLOCK Clock frequency for LVDS interface, DCLK_D 400 MHz 0 90 °C –40 90 °C Clocks ENVIRONMENTAL TARRAY and TWINDOW Temperature, operating (7) Temperature, non–operating (7) |TDELTA| Absolute temperature delta between any point on the window edge and the ceramic test point TP1 (8) 30 °C TDP Dew point temperature, operating and non–operating (non-condensing) 81 °C (1) (2) (3) (4) (5) (6) (7) (8) 10 All voltages are referenced to common ground VSS. VBIAS, VCC, VOFFSET, and VRESET power supplies are all required for proper DMD operation. VSS must also be connected. VOFFSET supply transients must fall within specified voltages. Exceeding the recommended allowable voltage difference between VBIAS and VOFFSET may result in excessive current draw. Exceeding the recommended allowable voltage difference between VBIAS and VRESET may result in excessive current draw. LVDS differential inputs must not exceed the specified limit or damage may result to the internal termination resistors. This maximum LVDS input voltage rating applies when each input of a differential pair is at the same voltage potential. The highest temperature of the active array (as calculated using Micromirror Array Temperature Calculation) or of any point along the window edge as defined in Figure 10. The locations of thermal test points TP2, TP3, TP4, and TP5 in Figure 10 are intended to measure the highest window edge temperature. If a particular application causes another point on the window edge to be at a higher temperature, that point should be used. Temperature delta is the highest difference between the ceramic test point 1 (TP1) and anywhere on the window edge as shown in Figure 10. The window test points TP2, TP3, TP4, and TP5 shown in Figure 10 are intended to result in the worst case delta. If a particular application causes another point on the window edge to result in a larger delta temperature, that point should be used. Submit Documentation Feedback Copyright © 2018, Texas Instruments Incorporated Product Folder Links: DLP470TE DLP470TE www.ti.com DLPS106 – APRIL 2018 6.2 Storage Conditions Applicable for the DMD as a component or non-operating in a system. TDMD DMD storage temperature TDP-AVG Average dew point temperature (non-condensing) TDP-ELR Elevated dew point temperature range (non-condensing) CTELR Cumulative time in elevated dew point temperature range (1) (2) MIN MAX –40 80 °C 28 °C (1) (2) 28 UNIT 36 °C 24 months The average over time (including storage and operating) that the device is not in the elevated dew point temperature range. Exposure to dew point temperatures in the elevated range during storage and operation should be limited to less than a total cumulative time of CTELR. 6.3 ESD Ratings VALUE V(ESD) (1) (2) Electrostatic discharge Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001 (1) ±2000 Charged device model (CDM), per JEDEC specification JESD22-C101 (2) ±500 UNIT V JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process. JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process. 6.4 Recommended Operating Conditions Over operating free-air temperature range (unless otherwise noted). The functional performance of the device specified in this data sheet is achieved when operating the device within the limits defined by this table. No level of performance is implied when operating the device above or below these limits. MIN NOM MAX UNIT 1.65 1.8 1.95 V 9.5 10 10.5 V 17.5 18 18.5 V –14.5 –14 VOLTAGE SUPPLY VCC LVCMOS logic supply voltage (1) VOFFSET Mirror electrode and HVCMOS voltage (1) (2) VBIAS Mirror electrode voltage (1) VRESET Mirror electrode voltage (1) –13.5 V |VBIAS – VOFFSET| Supply voltage difference (absolute value) (3) 10.5 V |VBIAS – VRESET| Supply voltage difference (absolute value) (4) 33 V 0.7 × VCC VCC + 0.3 V LVCMOS INTERFACE VIH(DC) DC input high voltage (5) (5) VIL(DC) DC input low voltage VIH(AC) AC input high voltage (5) VIL(AC) AC input low voltage (5) tPWRDNZ (1) (2) (3) (4) (5) (6) PWRDNZ pulse duration (6) –0.3 0.3 × VCC V 0.8 × VCC VCC + 0.3 V –0.3 0.2 × VCC V 10 ns All voltages are referenced to common ground VSS. VBIAS, VCC, VOFFSET, and VRESET power supplies are all required for proper DMD operation. VSS must also be connected. VOFFSET supply transients must fall within specified max voltages. To prevent excess current, the supply voltage difference |VBIAS – VOFFSET| must be less than the specified limit. See Power Supply Recommendations, Figure 14, and Table 8. To prevent excess current, the supply voltage difference |VBIAS – VRESET| must be less than the specified limit. See Power Supply Recommendations, Figure 14, and Table 8. Low-speed interface is LPSDR and adheres to the Electrical Characteristics and AC/DC Operating Conditions table in JEDEC Standard No. 209B, “Low-Power Double Data Rate (LPDDR)” JESD209B. Tester conditions for VIH and VIL. (a) Frequency = 60 MHz. Maximum rise time = 2.5 ns at 20/80 (b) Frequency = 60 MHz. Maximum fall time = 2.5 ns at 80/20 PWRDNZ input pin resets the SCP and disables the LVDS receivers. PWRDNZ input pin overrides SCPENZ input pin and tristates the SCPDO output pin. Submit Documentation Feedback Copyright © 2018, Texas Instruments Incorporated Product Folder Links: DLP470TE 11 DLP470TE DLPS106 – APRIL 2018 www.ti.com Recommended Operating Conditions (continued) Over operating free-air temperature range (unless otherwise noted). The functional performance of the device specified in this data sheet is achieved when operating the device within the limits defined by this table. No level of performance is implied when operating the device above or below these limits. MIN NOM MAX UNIT 500 kHz 900 ns SCP INTERFACE ƒSCPCLK SCP clock frequency (7) tSCP_PD Propagation delay, clock to Q, from rising-edge of SCPCLK to valid SCPDO (8) 0 tSCP_NEG_ENZ Time between falling-edge of SCPENZ and the first rising-edge of SCPCLK 1 µs tSCP_POS_ENZ Time between falling-edge of SCPCLK and the rising-edge of SCPENZ 1 µs tSCP_DS SCPDI clock setup time (before SCPCLK falling edge) (8) 800 ns tSCP_DH SCPDI hold time (after SCPCLK falling edge) (8) 900 ns tSCP_PW_ENZ SCPENZ inactive pulse duration (high level) 2 µs ƒCLOCK Clock frequency for LVDS interface (all channels), DCLK (9) |VID| Input differential voltage (absolute value) (10) VCM Common mode voltage (10) (10) 400 MHz 300 440 mV 1100 1200 1300 mV 1520 mV 2000 ns 150 VLVDS LVDS voltage tLVDS_RSTZ Time required for LVDS receivers to recover from PWRDNZ ZIN Internal differential termination resistance 80 100 120 Ω ZLINE Line differential impedance (PWB/trace) 90 100 110 Ω (7) (8) (9) (10) 12 880 The SCP clock is a gated clock. Duty cycle must be 50% ± 10%. SCP parameter is related to the frequency of DCLK. See Figure 2. See LVDS timing requirements in Timing Requirements and Figure 6. See LVDS waveform requirements in Figure 5. Submit Documentation Feedback Copyright © 2018, Texas Instruments Incorporated Product Folder Links: DLP470TE DLP470TE www.ti.com DLPS106 – APRIL 2018 Recommended Operating Conditions (continued) Over operating free-air temperature range (unless otherwise noted). The functional performance of the device specified in this data sheet is achieved when operating the device within the limits defined by this table. No level of performance is implied when operating the device above or below these limits. MIN NOM MAX UNIT ENVIRONMENTAL TARRAY Array temperature, long–term operational (11) (12) (13) (14) 10 40 to 70 (14) °C 0 10 °C TWINDOW Window temperature – operational (16) (17) 85 °C |TDELTA| Absolute temperature delta between any point on the window edge and the ceramic test point TP1 (18) (19) 14 °C TDP-AVG Average dew point temperature (non–condensing) (20) 28 °C TDP-ELR Elevated dew point temperature range (non-condensing) (21) CTELR Cumulative time in elevated dew point temperature range L Operating system luminance ILLUV Illumination wavelengths < 395 nm (11) ILLVIS Illumination wavelengths between 395 nm and 800 nm ILLIR Illumination wavelengths > 800 nm ILLθ Array temperature, short–term operational (12) (15) 28 (19) Illumination marginal ray angle (17) 0.68 36 °C 24 months 4000 lm 2.00 mW/cm2 mW/cm2 Thermally limited 10 mW/cm2 55 deg (11) Simultaneous exposure of the DMD to the maximum Recommended Operating Conditions for temperature and UV illumination reduces device lifetime. (12) The array temperature cannot be measured directly and must be computed analytically from the temperature measured at test point 1 (TP1) shown in Figure 10 and the package thermal resistance (Thermal Information) using the Micromirror Array Temperature Calculation. (13) Long-term is defined as the usable life of the device. (14) Per Figure 1, the maximum operational array temperature should be derated based on the micromirror landed duty cycle that the DMD experiences in the end application. See Micromirror Landed-On/Landed-Off Duty Cycle for a definition of micromirror landed duty cycle. (15) Array temperatures beyond those specified as long-term are recommended for short-term conditions only (power-up). Short-term is defined as the cumulative time over the usable life of the device and is less than 500 hours. (16) The locations of thermal test points TP2, TP3, TP4, and TP5 in Figure 10 are intended to measure the highest window edge temperature. For most applications, the locations shown are representative of the highest window edge temperature. If a particular application causes additional points on the window edge to be at a higher temperature, test points should be added to those locations. (17) The maximum marginal ray angle of the incoming illumination light at any point in the micromirror array, including the pond of micromirrors (POM), should not exceed 55 degrees from the normal to the device array plane. The device window aperture has not necessarily been designed to allow incoming light at higher maximum angles to pass to the micromirrors, and the device performance has not been tested nor qualified at angles exceeding this. Illumination light exceeding this angle outside the micromirror array (including POM) will contribute to thermal limitations described in this document, and may negatively affect lifetime. (18) Temperature delta is the highest difference between the ceramic test point 1 (TP1) and anywhere on the window edge as shown in Figure 10. The window test points TP2, TP3, TP4, and TP5 shown in Figure 10 are intended to result in the worst case delta temperature. If a particular application causes another point on the window edge to result in a larger delta in temperature, that point should be used. (19) DMD is qualified at the combination of the maximum temperature and maximum lumens specified. Operation of the DMD outside of these limits has not been tested. (20) The average over time (including storage and operating) that the device is not in the elevated dew point temperature range. (21) Exposure to dew point temperatures in the elevated range during storage and operation should be limited to less than a total cumulative time of CTELR. Submit Documentation Feedback Copyright © 2018, Texas Instruments Incorporated Product Folder Links: DLP470TE 13 DLP470TE Maximum Recommended Array Temperature - Operational (¹C) DLPS106 – APRIL 2018 www.ti.com 80 70 60 50 40 30 0/100 5/95 10/90 15/85 20/80 25/75 30/70 35/65 40/60 45/55 50/50 100/0 95/5 90/10 85/15 80/20 75/25 70/30 65/35 60/40 55/45 50/50 Micromirror Landed Duty Cycle Figure 1. Maximum Recommended Array Temperature - Derating Curve 6.5 Thermal Information DLP470TE THERMAL METRIC FXJ Package UNIT 257 PINS Thermal resistance, active area to test point 1 (TP1) (1) (1) 14 0.90 °C/W The DMD is designed to conduct absorbed and dissipated heat to the back of the package where it can be removed by an appropriate heat sink. The heat sink and cooling system must be capable of maintaining the package within the temperature range specified in the Recommended Operating Conditions. The total heat load on the DMD is largely driven by the incident light absorbed by the active area; although other contributions include light energy absorbed by the window aperture and electrical power dissipation of the array. Optical systems should be designed to minimize the light energy falling outside the window clear aperture since any additional thermal load in this area can significantly degrade the reliability of the device. Submit Documentation Feedback Copyright © 2018, Texas Instruments Incorporated Product Folder Links: DLP470TE DLP470TE www.ti.com DLPS106 – APRIL 2018 6.6 Electrical Characteristics Over operating free-air temperature range (unless otherwise noted). PARAMETER TEST CONDITIONS VOH High level output voltage VCC = 1.8 V, IOH = –2 mA VOL Low level output voltage VCC = 1.95 V, IOL = 2 mA IOZ High impedance output current VCC = 1.95 V IIL Low level input current VCC = 1.95 V, VI = 0 (1) (2) IIH High level input current ICC Supply current VCC IOFFSET Supply current VOFFSET (3) (3) (4) UNIT 0.8 x VCC V –40 0.2 x VCC V 25 µA –1 µA 110 µA 1500 mA VOFFSET = 10.5 V 13.2 mA VBIAS = 18.5 V 3.6 mA VRESET = –14.5 V –9 mA 2925.0 mW 138.6 mW 66.6 mW 130.5 mW 3260.7 mW Supply current VBIAS Supply current VRESET PCC Supply power dissipation VCC (2) VCC = 1.95 V POFFSET Supply power dissipation VOFFSET (3) VOFFSET = 10.5 V PBIAS Supply power dissipation VBIAS (3) (4) VBIAS = 18.5 V PRESET Supply power dissipation VRESET (4) VRESET = –14.5 V PTOTAL Supply power dissipation VTOTAL (4) MAX VCC = 1.95 V IRESET (1) (2) (3) TYP VCC = 1.95 V, VI = VCC IBIAS (4) MIN Applies to LVCMOS pins only. Excludes LVDS pins and MBRST (15:0) pins. See the Pin Functions table for pull–up and pull–down configuration per device pin. To prevent excess current, the supply voltage difference |VBIAS – VOFFSET| must be less than the specified limits listed in the Recommended Operating Conditions table. To prevent excess current, the supply voltage difference |VBIAS – VRESET| must be less than specified limit in Recommended Operating Conditions. 6.7 Capacitance at Recommended Operating Conditions Over operating free-air temperature range (unless otherwise noted). PARAMETER TEST CONDITIONS MIN TYP MAX UNIT CI_lvds LVDS input capacitance 2xLVDS ƒ = 1 MHz 20 pF CI_nonlvds Non-LVDS input capacitance 2xLVDS ƒ = 1 MHz 20 pF CI_tdiode Temperature diode input capacitance 2xLVDS ƒ = 1 MHz 30 pF CO Output capacitance ƒ = 1 MHz 20 pF Submit Documentation Feedback Copyright © 2018, Texas Instruments Incorporated Product Folder Links: DLP470TE 15 DLP470TE DLPS106 – APRIL 2018 www.ti.com 6.8 Timing Requirements MIN NOM MAX UNIT SCP (1) tr Rise slew rate 20% to 80% reference points 1 3 V/ns tf Fall slew rate 80% to 20% reference points 1 3 V/ns tr Rise slew rate 20% to 80% reference points 0.7 1 V/ns tf Fall slew rate 80% to 20% reference points 0.7 1 V/ns DCLK_A, LVDS pair 2.5 ns DCLK_B, LVDS pair 2.5 ns DCLK_C, LVDS pair 2.5 ns LVDS tC (2) Clock cycle tW Pulse duration DCLK_D, LVDS pair 2.5 DCLK_A, LVDS pair 1.19 1.25 ns DCLK_B, LVDS pair 1.19 1.25 ns DCLK_C, LVDS pair 1.19 1.25 ns 1.19 1.25 ns DCLK_D, LVDS pair tSu Setup time th Hold time D_A(15:0) before DCLK_A, LVDS pair 0.275 ns D_B(15:0) before DCLK_B, LVDS pair 0.275 ns D_C(15:0) before DCLK_C, LVDS pair 0.275 ns D_D(15:0) before DCLK_D, LVDS pair 0.275 ns SCTRL_A before DCLK_A, LVDS pair 0.275 ns SCTRL_B before DCLK_B, LVDS pair 0.275 ns SCTRL_C before DCLK_C, LVDS pair 0.275 ns SCTRL_D before DCLK_D, LVDS pair 0.275 ns D_A(15:0) after DCLK_A, LVDS pair 0.195 ns D_B(15:0) after DCLK_B, LVDS pair 0.195 ns D_C(15:0) after DCLK_C, LVDS pair 0.195 ns D_D(15:0) after DCLK_D, LVDS pair 0.195 ns SCTRL_A after DCLK_A, LVDS pair 0.195 ns SCTRL_B after DCLK_B, LVDS pair 0.195 ns SCTRL_C after DCLK_C, LVDS pair 0.195 ns SCTRL_D after DCLK_D, LVDS pair 0.195 (3) (4) –1.25 1.25 ns –1.25 1.25 ns tSKEW Skew time Channel B relative to channel A tSKEW Skew time Channel D relative to channel C (5) (6), LVDS pair (1) (2) (3) (4) (5) (6) 16 ns ns See Figure 3 for rise time and fall time for SCP. See Figure 5 for timing requirements for LVDS. Channel A (Bus A) includes the following LVDS pairs: DCLK_AN and DCLK_AP, SCTRL_AN and SCTRL_AP, D_AN(15:0) and D_AP(15:0). Channel B (Bus B) includes the following LVDS pairs: DCLK_BN and DCLK_BP, SCTRL_BN and SCTRL_BP, D_BN(15:0) and D_BP(15:0). Channel C (Bus C) includes the following LVDS pairs: DCLK_CN and DCLK_CP, SCTRL_CN and SCTRL_CP, D_CN(15:0) and D_CP(15:0). Channel D (Bus D) includes the following LVDS pairs: DCLK_DN and DCLK_DP, SCTRL_DN and SCTRL_DP, D_DN(15:0) and D_DP(15:0). Submit Documentation Feedback Copyright © 2018, Texas Instruments Incorporated Product Folder Links: DLP470TE DLP470TE www.ti.com DLPS106 – APRIL 2018 SCPCLK falling–edge capture for SCPDI. tSCP_NEG_ENZ tSCP_POS_ENZ SCPCLK rising–edge launch for SCPDO. SCPENZ 50% 50% tSCP_DS SCPDI 000000000000000000000000000000000000000000000000 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 000000000000000000000000000000000000000000000000 DI tSCP_DH 50% 00000000000000000000 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00000000000000000000 50% tC SCPCLK fSCPCLK = 1 / tC 50% 50% 50% 50% tSCP_PD 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 0000000000000000000000000000000000000000000000000000000000000000000000 SCPDO 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 0000000000000000000000000000000000000000000000000000000000000000000000 DO 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 50% Figure 2. SCP Timing Requirements Voltage (V) See Recommended Operating Conditions for fSCPCLK, tSCP_DS, tSCP_DH and tSCP_PD specifications. VCC 0 tr. tf. Not to Scale Time Figure 3. SCP Requirements for Rise and Fall See Timing Requirements for tr and tf specifications and conditions. Submit Documentation Feedback Copyright © 2018, Texas Instruments Incorporated Product Folder Links: DLP470TE 17 DLP470TE DLPS106 – APRIL 2018 www.ti.com Device pin output under test Tester channel CLOAD Figure 4. Test Load Circuit for Output Propagation Measurement For output timing analysis, the tester pin electronics and its transmission line effects must be taken into account. System designers should use IBIS or other simulation tools to correlate the timing reference load to a system environment. VLVDS max = VCM max + | 1/2 * VID max | tf VCM VID tr VLVDS min = VCM min ± | 1/2 * VID max | Figure 5. LVDS Waveform Requirements See Recommended Operating Conditions for VCM, VID, and VLVDS specifications and conditions. 18 Submit Documentation Feedback Copyright © 2018, Texas Instruments Incorporated Product Folder Links: DLP470TE DLP470TE www.ti.com DLPS106 – APRIL 2018 tc tw tw DCLK_P DCLK_N 50% th th tsu tsu D_P(?:0) D_N(?:0) 50% th th tsu tsu SCTRL_P SCTRL_N 50% tskew tc tw tw DCLK_P DCLK_N 50% th th tsu tsu D_P(?:0) D_N(?:0) 50% th th tsu tsu SCTRL_P SCTRL_N 50% Figure 6. Timing Requirements See Timing Requirements for timing requirements and LVDS pairs per channel (bus) defining D_P(?:0) and D_N(?:0). 6.9 System Mounting Interface Loads Table 1. System Mounting Interface Loads PARAMETER Thermal interface area (1) Electrical interface area (1) (1) MIN NOM MAX UNIT 12 kg 25 kg Uniformly distributed within area shown in Figure 7. Submit Documentation Feedback Copyright © 2018, Texas Instruments Incorporated Product Folder Links: DLP470TE 19 DLP470TE DLPS106 – APRIL 2018 www.ti.com Electrical Interface Area Thermal Interface Area Figure 7. System Mounting Interface Loads 6.10 Micromirror Array Physical Characteristics Table 2. Micromirror Array Physical Characteristics PARAMETER DESCRIPTION Number of active columns Number of active rows (1) (1) Micromirror (pixel) pitch (1) Micromirror active array width (1) Micromirror active array height (1) Micromirror active border (top / bottom) Micromirror active border (right / left) (1) (2) 20 (2) (2) VALUE UNIT M 1920 micromirrors N 1080 micromirrors P 5.4 µm Micromirror pitch × number of active columns 10.368 mm Micromirror pitch × number of active rows 5.832 mm Pond of micromirrors (POM) 80 micromirrors/side Pond of micromirrors (POM) 84 micromirrors/side See Figure 8. The structure and qualities of the border around the active array includes a band of partially functional micromirrors referred to as the pond of micromirrors (POM). These micromirrors are structurally and/or electrically prevented from tilting toward the bright or ON state but still require an electrical bias to tilt toward the OFF state. Submit Documentation Feedback Copyright © 2018, Texas Instruments Incorporated Product Folder Links: DLP470TE DLP470TE www.ti.com DLPS106 – APRIL 2018 0 1 2 3 M M M M ± ± ± ± 4 3 2 1 Off-State Light Path 0 1 2 3 Active Micromirror Array NxP M x N Micromirrors N± 4 N± 3 N± 2 N± 1 MxP P Incident Illumination Light Path P P Pond Of Micromirrors (POM) omitted for clarity. Details omitted for clarity. Not to scale. P Figure 8. Micromirror Array Physical Characteristics Refer to section Micromirror Array Physical Characteristics table for M, N, and P specifications. Submit Documentation Feedback Copyright © 2018, Texas Instruments Incorporated Product Folder Links: DLP470TE 21 DLP470TE DLPS106 – APRIL 2018 www.ti.com 6.11 Micromirror Array Optical Characteristics Table 3. Micromirror Array Optical Characteristics PARAMETER Mirror tilt angle, variation device to device (1) (2) MIN (3) (4) NOM 15.6 Adjacent micromirrors Number of out-of-specification micromirrors (1) (2) (3) (4) (5) (5) 17.0 MAX UNIT 18.4 degrees 0 Non-Adjacent micromirrors micromirrors 10 Measured relative to the plane formed by the overall micromirror array. Variation can occur between any two individual mircromirrors located on the same device or located on different devices. Additional variation exists between the micromirror array and the package datums. See package drawing. See Figure 9. An out-of-specification micromirror is defined as a micromirror that is unable to transition between the two landed states. Off State Light Path Not to scale. 0 1 2 3 M M M M ± ± ± ± Details omitted for clarity. 4 3 2 1 Border micromirrors omitted for clarity 0 1 2 3 Tilted Axis of Pixel Rotation Off-State Landed Edge On-State Landed Edge N± 4 N± 3 N± 2 N± 1 Incident Illumination Light Path (1) Pond of micromirrors (POM) omitted for clarity. (2) Refer to section Micromirror Array Physical Characteristics table for M, N, and P specifications. Figure 9. Micromirror Landed Orientation and Tilt 22 Submit Documentation Feedback Copyright © 2018, Texas Instruments Incorporated Product Folder Links: DLP470TE DLP470TE www.ti.com DLPS106 – APRIL 2018 6.12 Window Characteristics Table 4. DMD Window Characteristics DESCRIPTION MIN Window material Window refractive index at 546.1 nm 1.5119 Window transmittance, minimum within the wavelength range 420-680 nm. Applies to all angles 0°-30° AOI. (1) (2) Window transmittance, average over the wavelength range 420-680 nm. Applies to all angles 30°-45° AOI. (1) (2) (1) (2) NOM Corning Eagle XG 97% 97% Single-pass through both surfaces and glass. Angle of incidence (AOI) is the angle between an incident ray and the normal to a reflecting or refracting surface. 6.13 Chipset Component Usage Specification Reliable function and operation of the DLP470TE DMD requires that it be used in conjunction with the other components of the applicable DLP chipset, including those components that contain or implement TI DMD control technology. TI DMD control technology consists of the TI technology and devices used for operating or controlling a DLP DMD. Submit Documentation Feedback Copyright © 2018, Texas Instruments Incorporated Product Folder Links: DLP470TE 23 DLP470TE DLPS106 – APRIL 2018 www.ti.com 7 Detailed Description 7.1 Overview The DMD is a 0.47 inch diagonal spatial light modulator which consists of an array of highly reflective aluminum micromirrors. The DMD is an electrical input, optical output micro-electrical-mechanical system (MEMS). The electrical interface is low voltage differential signaling (LVDS). The DMD consists of a two-dimensional array of 1bit CMOS memory cells. The array is organized in a grid of M memory cell columns by N memory cell rows. Refer to the Functional Block Diagram. The positive or negative deflection angle of the micromirrors can be individually controlled by changing the address voltage of underlying CMOS addressing circuitry and micromirror reset signals (MBRST). The DLP470TE DMD is part of the chipset is comprised of the DLP470TE DMD, the DLPC4422 display controller, and the DLPA100 power and motor driver. To ensure reliable operation, the DLP470TE DMD must always be used with the DLPC4422 display controller and the DLPA100 power and motor driver. DATA_A SCTRL_A DCLK_A VSS VCC VOFFSET VRESET VBIAS MBRST PWRDNZ SCP 7.2 Functional Block Diagram Channel A Interface Column Read and Write Control Bit Lines Control (0,0) Voltages Word Lines Micromirror Array Bit Lines Row (M-1, N-1) Bit Lines Voltage Generators Column Read and Write Control Control DATA_B SCTRL_B DCLK_B VSS VCC VOFFSET VRESET VBIAS MBRST RESET_CTRL Channel B Interface Channels C and D not shown. For pin details on channels A, B, C, and D, refer to the Pin Configurations and Functions table and the LVDS interface section of Timing Requirements. 24 Submit Documentation Feedback Copyright © 2018, Texas Instruments Incorporated Product Folder Links: DLP470TE DLP470TE www.ti.com DLPS106 – APRIL 2018 7.3 Feature Description 7.3.1 Power Interface The DMD requires five DC voltages: DMD_P3P3V, DMD_P1P8V, VOFFSET, VRESET, and VBIAS. DMD_P3P3V is created by the DLPA100 power and motor driver and is used on the DMD board to create the other 4 DMD voltages, as well as powering various peripherals (TMP411, I2C, and TI level translators). DMD_P1P8V is created by the TI PMIC LP38513S and provides the VCC voltage required by the DMD. VOFFSET (10 V), VRESET (–14 V), and VBIAS (18 V) are made by the TI PMIC TPS65145 and are supplied to the DMD to control the micromirrors. 7.3.2 Timing The data sheet provides timing at the device pin. For output timing analysis, the tester pin electronics and its transmission line effects must be taken into account. Figure 4 shows an equivalent test load circuit for the output under test. Timing reference loads are not intended as a precise representation of any particular system environment or depiction of the actual load presented by a production test. System designers should use IBIS or other simulation tools to correlate the timing reference load to a system environment. The load capacitance value stated is only for characterization and measurement of AC timing signals. This load capacitance value does not indicate the maximum load the device is capable of driving. 7.4 Device Functional Modes DMD functional modes are controlled by the DLPC4422 display controller. See the DLPC4422 display controller data sheet or contact a TI applications engineer. 7.5 Optical Interface and System Image Quality Considerations TI assumes no responsibility for end-equipment optical performance. Achieving the desired end-equipment optical performance involves making trade-offs between numerous component and system design parameters. System optical performance and image quality strongly relate to optical system design parameter trade offs. Although it is not possible to anticipate every conceivable application, projector image quality and optical performance is contingent on compliance to the optical system operating conditions described in the following sections. 7.5.1 Numerical Aperture and Stray Light Control The angle defined by the numerical aperture of the illumination and projection optics at the DMD optical area should be the same. This angle should not exceed the nominal device micromirror tilt angle unless appropriate apertures are added in the illumination and/or projection pupils to block out flat-state and stray light from the projection lens. The micromirror tilt angle defines DMD capability to separate the "ON" optical path from any other light path, including undesirable flat-state specular reflections from the DMD window, DMD border structures, or other system surfaces near the DMD such as prism or lens surfaces. If the numerical aperture exceeds the micromirror tilt angle, or if the projection numerical aperture angle is more than two degrees larger than the illumination numerical aperture angle (and vice versa), contrast degradation, and objectionable artifacts in the display border and/or active area could occur. 7.5.2 Pupil Match TI’s optical and image quality specifications assume that the exit pupil of the illumination optics is nominally centered within 2° of the entrance pupil of the projection optics. Misalignment of pupils can create objectionable artifacts in the display border or active area, which may require additional system apertures to control, especially if the numerical aperture of the system exceeds the pixel tilt angle. 7.5.3 Illumination Overfill The active area of the device is surrounded by an aperture on the inside DMD window surface that masks structures of the DMD chip assembly from normal view, and is sized to anticipate several optical operating conditions. Overfill light illuminating the window aperture can create artifacts from the edge of the window aperture opening and other surface anomalies that may be visible on the screen. The illumination optical system should be designed to limit light flux incident anywhere on the window aperture from exceeding approximately 10% of the average flux level in the active area. Depending on the particular system optical architecture, overfill light may have to be further reduced below the suggested 10% level in order to be acceptable. Submit Documentation Feedback Copyright © 2018, Texas Instruments Incorporated Product Folder Links: DLP470TE 25 DLP470TE DLPS106 – APRIL 2018 www.ti.com 7.6 Micromirror Array Temperature Calculation Array TP2 2X 11.75 TP5 TP4 2X 16.10 TP3 Window Edge (4 surfaces) TP3 (TP2) TP4 TP5 TP1 5.05 16.10 TP1 Figure 10. DMD Thermal Test Points 26 Submit Documentation Feedback Copyright © 2018, Texas Instruments Incorporated Product Folder Links: DLP470TE DLP470TE www.ti.com DLPS106 – APRIL 2018 Micromirror Array Temperature Calculation (continued) Micromirror array temperature cannot be measured directly, therefore it must be computed analytically from measurement points on the outside of the series S410 package, the package thermal resistance, the electrical power, and the illumination heat load. The relationship between array temperature and the reference ceramic temperature (thermal test TP1 in Figure 10) is provided by the following equations: TARRAY = TCERAMIC + (QARRAY × RARRAY-TO-CERAMIC) QARRAY = QELECTRICAL + (0.40 × QINCIDENT) where • • • • • • TARRAY = computed array temperature (°C) TCERAMIC = measured ceramic temperature (°C) (TP1 location) RARRAY-TO-CERAMIC = thermal resistance of package (Thermal Information) from array to ceramic TP1 (°C/Watt) QARRAY = total (electrical + absorbed) DMD power on the array (Watts) QELECTRICAL = nominal electrical power QINCIDENT = incident optical power to DMD (Watts) The electrical power dissipation of the DMD is variable and depends on the voltages, data rates and operating frequencies. A nominal electrical power dissipation to use when calculating array temperature is 1.3 W. The absorbed power from the illumination source is variable and depends on the operating state of the micromirrors and the intensity of the light source. The equations shown above are valid for each DMD chip in a system. It assumes an illumination distribution of 83.7% on the active array, and 16.3% on the array border. Sample calculations: QELECTRICAL = 1.3 W TCERAMIC = 55.0°C (measured) QINCIDENT = 30 W (measured) QARRAY = 1.3 W + (0.4 × 30 W) = 13.3 W TARRAY = 55.0°C + (13.3 W × 0.90°C/W) = 67.0°C 7.7 Micromirror Landed-On/Landed-Off Duty Cycle 7.7.1 Definition of Micromirror Landed-On/Landed-Off Duty Cycle The micromirror landed-on/landed-off duty cycle (landed duty cycle) denotes the amount of time (as a percentage) that an individual micromirror is landed in the ON state versus the amount of time the same micromirror is landed in the OFF state. As an example, a landed duty cycle of 100/0 indicates that the referenced pixel is in the ON state 100% of the time (and in the OFF state 0% of the time), whereas 0/100 would indicate that the pixel is in the OFF state 100% of the time. Likewise, 50/50 indicates that the pixel is ON for 50% of the time (and OFF for 50% of the time). Note that when assessing the landed duty cycle, the time spent switching from one state (ON or OFF) to the other state (OFF or ON) is considered negligible and is thus ignored. Since a micromirror can only be landed in one state or the other (ON or OFF), the two numbers (percentages) always add to 100. Submit Documentation Feedback Copyright © 2018, Texas Instruments Incorporated Product Folder Links: DLP470TE 27 DLP470TE DLPS106 – APRIL 2018 www.ti.com Micromirror Landed-On/Landed-Off Duty Cycle (continued) 7.7.2 Landed Duty Cycle and Useful Life of the DMD Knowing the long-term average landed duty cycle (of the end product or application) is important because subjecting all (or a portion) of the DMD micromirror array (also called the active array) to an asymmetric landed duty cycle for a prolonged period of time can reduce the DMD usable life. Note that it is the symmetry or asymmetry of the landed duty cycle that is of relevance. The symmetry of the landed duty cycle is determined by how close the two numbers (percentages) are to being equal. For example, a landed duty cycle of 50/50 is perfectly symmetrical whereas a landed duty cycle of 100/0 or 0/100 is perfectly asymmetrical. 7.7.3 Landed Duty Cycle and Operational DMD Temperature Operational DMD temperature and landed duty cycle interact to affect DMD usable life, and this interaction can be exploited to reduce the impact that an asymmetrical landed duty cycle has on the DMD usable life. This is quantified in the de-rating curve shown in Figure 1. The importance of this curve is that: • All points along this curve represent the same usable life. • All points above this curve represent lower usable life (and the further away from the curve, the lower the usable life). • All points below this curve represent higher usable life (and the further away from the curve, the higher the usable life). In practice, this curve specifies the maximum operating DMD temperature at a given long-term average landed duty cycle. 7.7.4 Estimating the Long-Term Average Landed Duty Cycle of a Product or Application During a given period of time, the landed duty cycle of a given pixel follows from the image content being displayed by that pixel. For example, in the simplest case, when displaying pure-white on a given pixel for a given time period, that pixel operates under a 100/0 landed duty cycle during that time period. Likewise, when displaying pure-black, the pixel operates under a 0/100 landed duty cycle. Between the two extremes (ignoring for the moment color and any image processing that may be applied to an incoming image), the landed duty cycle tracks one-to-one with the; gray scale value, as shown in Table 5. Table 5. Grayscale Value and Landed Duty Cycle 28 GRAYSCALE VALUE LANDED DUTY CYCLE 0% 0/100 10% 10/90 20% 20/80 30% 30/70 40% 40/60 50% 50/50 60% 60/40 70% 70/30 80% 80/20 90% 90/10 100% 100/0 Submit Documentation Feedback Copyright © 2018, Texas Instruments Incorporated Product Folder Links: DLP470TE DLP470TE www.ti.com DLPS106 – APRIL 2018 Accounting for color rendition (but still ignoring image processing) requires knowing both the color intensity (from 0% to 100%) for each constituent primary color (red, green, or blue) for the given pixel as well as the color cycle time for each primary color, where “color cycle time” is the total percentage of the frame time that a given primary must be displayed in order to achieve the desired white point. Use the following equation to calculate the landed duty cycle of a given pixel during a specified time period Landed Duty Cycle = (Red_Cycle_% × Red_Scale_Value) + (Green_Cycle_% × Green_Scale_Value) + (Blue_Cycle_% × Blue_Scale_Value) where • • • Red_Cycle_% represents the percentage of the frame time that red is displayed to achieve the desired white point Green_Cycle_% represents the percentage of the frame time that green is displayed to achieve the desired white point Blue_Cycle_% represents the percentage of the frame time that blue is displayed to achieve the desired white point For example, assume that the red, green, and blue color cycle times are 50%, 20%, and 30% respectively (in order to achieve the desired white point), then the landed duty cycle for various combinations of red, green, and blue color intensities would be as shown in Table 6 and Table 7. Table 6. Example Landed Duty Cycle for Full-Color, Color Percentage CYCLE PERCENTAGE RED GREEN BLUE 50% 20% 30% Table 7. Example Landed Duty Cycle for Full-Color SCALE VALUE RED GREEN BLUE LANDED DUTY CYCLE 0% 0% 0% 0/100 100% 0% 0% 50/50 0% 100% 0% 20/80 0% 0% 100% 30/70 12% 0% 0% 6/94 0% 35% 0% 7/93 0% 0% 60% 18/82 100% 100% 0% 70/30 0% 100% 100% 50/50 100% 0% 100% 80/20 12% 35% 0% 13/87 0% 35% 60% 25/75 12% 0% 60% 24/76 100% 100% 100% 100/0 Submit Documentation Feedback Copyright © 2018, Texas Instruments Incorporated Product Folder Links: DLP470TE 29 DLP470TE DLPS106 – APRIL 2018 www.ti.com 8 Application and Implementation NOTE Information in the following application section is not part of the TI component specifications, and TI does not warrant its accuracy or completeness. TI’s customers are responsible for determining suitability of components for their purposes. Customers should validate and test their design implementation to confirm system functionality. 8.1 Application Information Texas Instruments DLP technology is a micro-electro-mechanical systems (MEMS) technology that modulates light using a digital micromirror device (DMD). The DMD is a spatial light modulator, which reflects incoming light from an illumination source to one of two directions, towards the projection optics or collection optics. The new TRP pixel with a higher tilt angle increases brightness performance and enables smaller system electronics for size constrained applications. Typical applications using the DLP470NE include home theater, digital signage, interactive displays, low-latency gaming displays, and portable smart displays. The most recent class of chipsets from Texas Instruments is based on a breakthrough micromirror technology called TRP. With a smaller pixel pitch of 5.4 µm and increased tilt angle of 17 degrees, TRP chipsets enable higher resolution in a smaller form factor and enhanced image processing features while maintaining high optical efficiency. DLP chipsets are a great fit for any system that requires high resolution and high brightness displays. 8.2 Typical Application The DLP470TE DMD combined with two display controllers (DLPC4422), an FPGA, a power management device (DLPA100), and other electrical, optical, and mechanical components, enables bright, affordable, full 4K UHD display solutions. A typical 4K UHD system application using the DLP470TE DMD is shown in Figure 11. 1.1V 1.8V DLPA100 2.5V (Asic 3.3V CTRL Voltages) 5V Signals Colorwheel 2 Motor CTRL FLASH 1.1V 1.8V DLPA100 2.5V (Asic 3.3V CTRL Voltages) 5V Signals Colorwheel 1 Motor CTRL Lamp Ballast DATA ADDR Connector MUX FPGA BD, Field, CLK, DE, H/V-Synch DLPC4422 Master Asic HBT SPI LVDS West (960x1080 @ 240Hz) DAD CTRL and SCP CTRL I2C Flex ASIC TPs TEST GPIO GPIO Lines Config. Lines DATA DLPC4422 Master Asic DATA DDR3 LVDS East (960x1080 @ 240Hz) Flex ADDR 3.3V TSP65145 (DMD Voltages) Level Translators JTAG DATA ASIC TPs Test GPIO FE Bypass Input from Front End Board Vx1 3840x2160 @ 60Hz FE CTRL 10V -14V 18V DLP470TE DMD TMP411 Temperature Sensor JTAG FLASH DATA ADDR Optical Actuator Electronics Optical Actuator Figure 11. Typical 4K UHD Application Diagram 30 Submit Documentation Feedback Copyright © 2018, Texas Instruments Incorporated Product Folder Links: DLP470TE DLP470TE www.ti.com DLPS106 – APRIL 2018 8.2.1 Design Requirements A DLP470TE projection system is created by using the DMD chipset, including the DLP470TE, DLPC4422, and DLPA100. The DLP470TE is used as the core imaging device in the display system and contains a 0.47-inch array of micromirrors. The DLPC4422 controller is the digital interface between the DMD and the rest of the system, taking digital input from front end receiver and driving the DMD over a high speed interface. The DLPA100 power management device provides voltage regulators for the DMD, controller, and illumination functionality. Other core components of the display system include an FPGA, illumination source, an optical engine for the illumination and projection optics, other electrical and mechanical components, and software. The illumination source options include lamp, LED, laser, or laser phosphor. The type of illumination used and desired brightness will have a major effect on the overall system design and size. 8.2.2 Detailed Design Procedure For a complete DLP system, an optical module or light engine is required that contains the DLP470TE DMD, associated illumination sources, optical elements, and necessary mechanical components. To ensure reliable operation, the DLP470TE DMD must always be used with the DLPC4422 display controller and the DLPA100 PMIC driver. Refer to the PCB design requirements to see DLP standard TRP digital micromirror devices for the DMD board design and manufacturer handling of the DMD sub-assemblies. 8.2.3 Application Curves When LED illumination is utilized, the typical LED-current-to-luminance relationship is shown in Figure 12. Figure 12. Luminance vs. Current 8.3 DMD Die Temperature Sensing The DMD features a built-in thermal diode that measures the temperature at one corner of the die outside the micromirror array. The thermal diode can be interfaced with the TMP411 temperature sensor as shown in Figure 13. The serial bus from the TMP411 can be connected to the DLPC4422 display controller to enable its temperature sensing features. See the DLPC4422 Programmers’ Guide for instructions on installing the DLPC4422 controller support firmware bundle and obtaining the temperature readings. The software application contains functions to configure the TMP411 to read the DMD temperature sensor diode. This data can be leveraged to incorporate additional functionality in the overall system design such as adjusting illumination, fan speeds, and so forth. All communication between the TMP411 and the DLPC4422 controller will be completed using the I2C interface. The TMP411 connects to the DMD via pins B17 and B18 as outlined in Pin Configuration and Functions. Submit Documentation Feedback Copyright © 2018, Texas Instruments Incorporated Product Folder Links: DLP470TE 31 DLP470TE DLPS106 – APRIL 2018 www.ti.com DMD Die Temperature Sensing (continued) 3.3V R2 To Application Controller R1 TMP411 DLP470TE SCL VCC SDA D+ R3 R5 TEMP_P ALERT C1 THERM R4 GND R6 DTEMP_N GND (1) Details omitted for clarity, see the TI Reference Design for connections to the DLPC4422 controller. (2) See the TMP411 datasheet for system board layout recommendation. (3) See the TMP411 datasheet and the TI reference design for suggested component values for R1, R2, R3, R4, and C1. (4) R5 = 0 Ω. R6 = 0 Ω. Zero ohm resistors should be located close to the DMD package pins. Figure 13. TMP411 Sample Schematic 32 Submit Documentation Feedback Copyright © 2018, Texas Instruments Incorporated Product Folder Links: DLP470TE DLP470TE www.ti.com DLPS106 – APRIL 2018 9 Power Supply Recommendations The following power supplies are all required to operate the DMD: • VSS • VBIAS • VCC • VOFFSET • VRESET DMD power-up and power-down sequencing is strictly controlled by the DLP display controller. CAUTION For reliable operation of the DMD, the following power supply sequencing requirements must be followed. Failure to adhere to any of the prescribed power-up and power-down requirements may affect device reliability. See Figure 14. VBIAS, VCC, VOFFSET, and VRESET power supplies must be coordinated during power-up and power-down operations. Failure to meet any of the below requirements will result in a significant reduction in the DMD reliability and lifetime. Common ground VSS must also be connected. 9.1 DMD Power Supply Power-Up Procedure • • • • • During power-up, VCC must always start and settle before VOFFSET plus Delay1 specified in Table 8, VBIAS, and VRESET voltages are applied to the DMD. During power-up, it is a strict requirement that the voltage difference between VBIAS and VOFFSET must be within the specified limit shown in Recommended Operating Conditions. During power-up, there is no requirement for the relative timing of VRESET with respect to VBIAS. Power supply slew rates during power-up are flexible, provided that the transient voltage levels follow the requirements specified in the Absolute Maximum Ratings, in the Recommended Operating Conditions, and in Figure 14. During power-up, LVCMOS input pins must not be driven high until after VCC have settled at operating voltages listed in the Recommended Operating Conditions. 9.2 DMD Power Supply Power-Down Procedure • • • • • During power-down, VCC must be supplied until after VBIAS, VRESET, and VOFFSET are discharged to within the specified limit of ground. See Table 8. During power-down, it is a strict requirement that the voltage difference between VBIAS and VOFFSET must be within the specified limit shown in the Recommended Operating Conditions. During power-down, there is no requirement for the relative timing of VRESET with respect to VBIAS. Power supply slew rates during power-down are flexible, provided that the transient voltage levels follow the requirements specified in the Absolute Maximum Ratings, in the Recommended Operating Conditions, and in Figure 14. During power-down, LVCMOS input pins must be less than specified in the Recommended Operating Conditions. Submit Documentation Feedback Copyright © 2018, Texas Instruments Incorporated Product Folder Links: DLP470TE 33 DLP470TE DLPS106 – APRIL 2018 www.ti.com DMD Power Supply Power-Down Procedure (continued) Not to scale. Details omitted for clarity Note 1 VCC VSS VOFFSET Note 4 Delay 1 Note 2 ûV < Specification VSS VBIAS VSS Note 3 ûV < Specification VRESET VSS EN_OFFSET VSS Note 9 Delay 2 PG_OFFSET Note 5 Note 7 VSS RESET_OEZ VSS Note 6 Note 8 PWRDNZ and RESETZ VSS (1) See Recommended Operating Conditions, and the Pin Functions table. (2) To prevent excess current, the supply voltage difference |VOFFSET – VBIAS| must be less than the specified limit in the Recommended Operating Conditions (3) To prevent excess current, the supply difference |VBIAS – VRESET| must be less than the specified limit in the Recommended Operating Conditions. (4) VBIAS should power up after VOFFSET has powered up, per the Delay1 specification in Table 8 (5) PG_OFFSET should turn off after EN_OFFSET has turned off, per the Delay2 specification in Table 8. (6) DLP controller software enables the DMD power supplies VBIAS, VRESET, VOFFSET with VCC active after RESET_OEZ is at logic high. (7) DLP controller software initiates the global VBIAS command. (8) After the DMD micromirror park sequence is complete, the DLP controller software initiates a hardware power-down that activates PWRDNZ and disables VBIAS, VRESET, and VOFFSET. (9) Under power-loss conditions where emergency DMD micromirror park procedures are being enacted by the DLP controller hardware, EN_OFFSET may turn off after PG_OFFSET has turned off. The OEZ signal goes high prior to PG_OFFSET turning off to indicate the DMD micromirror has completed the emergency park procedures. Figure 14. DMD Power Supply Requirements 34 Submit Documentation Feedback Copyright © 2018, Texas Instruments Incorporated Product Folder Links: DLP470TE DLP470TE www.ti.com DLPS106 – APRIL 2018 DMD Power Supply Power-Down Procedure (continued) Table 8. DMD Power-Supply Requirements PARAMETER DESCRIPTION Delay1 Delay from VOFFSET settled at recommended operating voltage to VBIAS and VRESET power up Delay2 PG_OFFSET hold time after EN_OFFSET goes low MIN NOM 1 2 MAX 100 Submit Documentation Feedback Copyright © 2018, Texas Instruments Incorporated Product Folder Links: DLP470TE UNIT ms ns 35 DLP470TE DLPS106 – APRIL 2018 www.ti.com 10 Device and Documentation Support 10.1 Device Support 10.1.1 Device Nomenclature DLP470TE FXJ Package type Device descriptor Figure 15. Part Number Description 10.1.2 Device Markings The device marking includes both human-readable information and a 2-dimensional matrix code. The humanreadable information is described in Figure 16. The 2-dimensional matrix code is an alpha-numeric character string that contains the DMD part number, part 1 of the serial number, and part 2 of the serial number. The first character of the DMD serial number (part 1) is the manufacturing year. The second character of the DMD serial number (part 1) is the manufacturing month. The last character of the DMD Serial Number (part 2) is the bias voltage bin letter. Example: *1910-503AB GHXXXXX LLLLLLM 2-Dimension Matrix Code TI Internal Numbering (Part Number and Serial Number) DMD Part Number YYYYYYY *1910-5bbcB GHXXXXX LLLLLLM Part 1 of Serial Number Part 2 of Serial Number (7 characters) (7 characters) Figure 16. DMD Marking Locations 10.2 Documentation Support 10.2.1 Related Documentation The following documents contain additional information related to the chipset components used with the DLP470TE. • DLPC4422 Display Controller Data Sheet • DLPA100 Power Management and Motor Driver Data Sheet 36 Submit Documentation Feedback Copyright © 2018, Texas Instruments Incorporated Product Folder Links: DLP470TE DLP470TE www.ti.com DLPS106 – APRIL 2018 10.3 Receiving Notification of Documentation Updates To receive notification of documentation updates, navigate to the device product folder on ti.com. In the upper right corner, click on Alert me to register and receive a weekly digest of any product information that has changed. For change details, review the revision history included in any revised document. 10.4 Community Resources The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of Use. TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help solve problems with fellow engineers. Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and contact information for technical support. 10.5 Trademarks E2E is a trademark of Texas Instruments. DLP is a registered trademark of Texas Instruments. All other trademarks are the property of their respective owners. 10.6 Electrostatic Discharge Caution These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates. 10.7 Glossary SLYZ022 — TI Glossary. This glossary lists and explains terms, acronyms, and definitions. Submit Documentation Feedback Copyright © 2018, Texas Instruments Incorporated Product Folder Links: DLP470TE 37 DLP470TE DLPS106 – APRIL 2018 www.ti.com 11 Mechanical, Packaging, and Orderable Information The following pages include mechanical, packaging, and orderable information. This information is the most current data available for the designated devices. This data is subject to change without notice and revision of this document. For browser-based versions of this data sheet, refer to the left-hand navigation. 38 Submit Documentation Feedback Copyright © 2018, Texas Instruments Incorporated Product Folder Links: DLP470TE PACKAGE OPTION ADDENDUM www.ti.com 27-Apr-2018 PACKAGING INFORMATION Orderable Device Status (1) DLP470TEFXJ ACTIVE Package Type Package Pins Package Drawing Qty CLGA FXJ 257 33 Eco Plan Lead/Ball Finish MSL Peak Temp (2) (6) (3) RoHS & Green (In Work) Call TI Call TI Op Temp (°C) Device Marking (4/5) (1) The marketing status values are defined as follows: ACTIVE: Product device recommended for new designs. LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect. NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design. PREVIEW: Device has been announced but is not in production. Samples may or may not be available. OBSOLETE: TI has discontinued the production of the device. (2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may reference these types of products as "Pb-Free". RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption. Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based flame retardants must also meet the <=1000ppm threshold requirement. (3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature. (4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device. (5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation of the previous line and the two combined represent the entire Device Marking for that device. (6) Lead/Ball Finish - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead/Ball Finish values may wrap to two lines if the finish value exceeds the maximum column width. Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals. TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release. In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis. 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