AD AD7564 3.3 v/5 v, low power, quad 12-bit dac Datasheet

a
LC2MOS
+3.3 V/+5 V, Low Power, Quad 12-Bit DAC
AD7564
FEATURES
Four 12-Bit DACs in One Package
4-Quadrant Multiplication
Separate References
Single Supply Operation
Guaranteed Specifications with +3.3 V/+5 V Supply
Low Power
Versatile Serial Interface
Simultaneous Update Capability
Reset Function
28-Pin SOIC, SSOP and DIP Packages
FUNCTIONAL BLOCK DIAGRAM
NC
AGND
V DD
INPUT
LATCH A
DGND
V REF D
12
DAC A
LATCH
12
DAC B
LATCH
V REF C
12
V REFB
VREF A
R FB A
DAC A
IOUT1 A
IOUT2 A
RFB B
INPUT
LATCH B
12
DAC B
IOUT1 B
IOUT2 B
RFB C
INPUT
LATCH C
APPLICATIONS
Process Control
Portable Instrumentation
General Purpose Test Equipment
12
DAC C
LATCH
12
DAC C
IOUT1 C
IOUT2 C
R FBD
INPUT
LATCH D
12
DAC D
LATCH
12
DAC D
12
FSIN
CLKIN
SDIN
IOUT2 D
CLR
CONTROL LOGIC
+
INPUT SHIFT
REGISTER
A0 A1
IOUT1 D
LDAC
AD7564
SDOUT
GENERAL DESCRIPTION
PRODUCT HIGHLIGHTS
The AD7564 contains four 12-bit DACs in one monolithic
device. The DACs are standard current output with separate
VREF, IOUT1, IOUT2 and RFB terminals. These DACs operate from
a single +3.3 V to +5 V supply.
1. The AD7564 contains four 12-bit current output DACs with
separate VREF inputs.
The AD7564 is a serial input device. Data is loaded using
FSIN, CLKIN and SDIN. Two address pins A0 and A1 set up
a device address, and this feature may be used to simplify device
loading in a multi-DAC environment. Alternatively, A0 and A1
can be ignored and the serial out capability used to configure a
daisy-chained system.
All DACs can be simultaneously updated using the asynchronous LDAC input, and they can be cleared by asserting the
asynchronous CLR input.
2. The AD7564 can be operated from a single +3.3 V to +5 V
supply.
3. Simultaneous update capability and reset function are
available.
4. The AD7564 features a fast, versatile serial interface compatible with modern 3 V and 5 V microprocessors and
microcomputers.
5. Low power, 50 µW at 5 V and 33 µW at 3.3 V.
The device is packaged in 28-pin SOIC, SSOP and DIP
packages.
REV. B
Information furnished by Analog Devices is believed to be accurate and
reliable. However, no responsibility is assumed by Analog Devices for its
use, nor for any infringements of patents or other rights of third parties
which may result from its use. No license is granted by implication or
otherwise under any patent or patent rights of Analog Devices.
One Technology Way, P.O. Box 9106, Norwood. MA 02062-9106, U.S.A.
Tel: 781/329-4700
Fax: 781/461-3113
AD7564–SPECIFICATIONS
(V = +4.75 V to +5.25 V; I A to I
Normal Mode
DD
OUT1
OUT1D
= IOUT2A = IOUT2D = AGND = 0 V; VREF = +10 V; TA = TMIN to TMAX,
unless otherwise noted)
B Grade1
Units
Test Conditions/Comments
12
± 0.5
± 0.5
Bits
LSB max
LSB max
1 LSB = VREF/212 = 2.44 mV when VREF = 10 V
±4
±5
2
5
LSBs max
LSBs max
ppm FSR/°C typ
ppm FSR/°C max
10
50
nA max
nA max
6
13
2
kΩ min
kΩ max
% max
DIGITAL INPUTS
VINH, Input High Voltage
VINL, Input Low Voltage
IINH, Input Current
CIN, Input Capacitance2
2.4
0.8
±1
10
V min
V max
µA max
pF max
DIGITAL OUTPUT (SDOUT)
Output Low Voltage (VOL)
Output High Voltage (VOH)
0.4
4.0
V max
V min
Load Circuit as in Figure 2.
4.75/5.25
V min/V max
Part Functions from 3.3 V to 5.25 V
–75
10
dB typ
µA max
Parameter
ACCURACY
Resolution
Relative Accuracy
Differential Nonlinearity
Gain Error
+25°C
TMIN to TMAX
Gain Temperature Coefficient2
Output Leakage Current
IOUT1
@ +25°C
TMIN to TMAX
REFERENCE INPUT
Input Resistance
Ladder Resistance Mismatch
POWER REQUIREMENTS
VDD Range
Power Supply Rejection2
∆Gain/∆VDD
IDD
All Grades Guaranteed Monotonic Over Temperature
Typical Input Resistance = 9.5 kΩ
Typically 0.6%
VINH = VDD, VINL = 0 V
At Input Levels of 0.8 V and 2.4 V, IDD is
Typically 2 mA.
NOTES
1
Temperature range is as follows: B Version: –40°C to +85°C.
2
Not production tested. Guaranteed by characterization at initial product release.
Specifications subject to change without notice.
–2–
REV. B
AD7564
Biased Mode1
(VDD = +3 V to +5.5 V; VIOUT1 = VIOUT2 = 1.23 V; AGND = 0 V; VREF = 0 V to 2.45 V; TA = TMIN to
TMAX, unless otherwise noted)
Parameter
A Grade2
Units
Test Conditions/Comments
ACCURACY
Resolution
12
Bits
±1
± 0.9
1 LSB = (VIOUT2 – VREF)/212 = 300 µV when
VIOUT2 = 1.23 V and VREF = 0 V
LSB max
LSB max
±4
±5
2
5
LSBs max
LSBs max
ppm FSR/°C typ
ppm FSR/°C max
Relative Accuracy
Differential Nonlinearity
Gain Error
+25°C
TMIN to TMAX
Gain Temperature Coefficient3
Output Leakage Current
IOUT1
@ +25°C
TMIN to TMAX
Input Resistance
@ IOUT2 Pins
See Terminology Section
10
50
nA max
nA max
6
kΩ min
DIGITAL INPUTS
VINH, Input High Voltage @ VDD = +5 V
VINH, Input High Voltage @ VDD = +3.3 V
VINL, Input Low Voltage @ VDD = +5 V
VINL, Input Low Voltage @ VDD = +3.3 V
IINH, Input Current
CIN, Input Capacitance3
2.4
2.1
0.8
0.6
±1
10
V min
V min
V max
V max
µA max
pF max
DIGITAL OUTPUT (SDOUT)
Output Low Voltage (VOL)
Output Low Voltage (VOL)
Output High Voltage (VOH)
Output High Voltage (VOH)
0.4
0.2
4.0
VDD – 0.2
V max
V max
V min
V min
3/5.5
V min/V max
–75
10
dB typ
µA max
POWER REQUIREMENTS
VDD Range
Power Supply Sensitivity3
∆Gain/∆VDD
IDD
All Grades Guaranteed Monotonic Over
Temperature
This Varies with DAC Input Code
Load Circuit as in Figure 2.
VDD = +5 V
VDD = +3.3 V
VDD = +5 V
VDD = +3.3 V
VINH = VDD – 0.1 V min, VINL = 0.1 V max;
SDOUT Open Circuit
IDD is typically 2 mA with VDD = +5 V,
VINH = 2.4 V min, VINL = 0.8 V max;
SDOUT Open Circuit
NOTES
1
These specifications apply with the devices biased up at 1.23 V for single supply applications. The model numbering reflects this by means of a "-B" suffix
(for example: AD7564AR-B). Figure 19 is an example of Biased Mode Operation.
2
Temperature ranges is as follows: A Version: –40°C to +85°C.
3
Not production tested. Guaranteed by characterization at initial product release.
Specifications subject to change without notice.
REV. B
–3–
AD7564
AC Performance Characteristics
Normal Mode
(VDD = +4.75 V to +5.25 V; VIOUT1 = VIOUT2 = AGND = 0 V. VREF = 6 V rms, 1 kHz sine wave; DAC output op amp is
AD843; TA = TMIN to TMAX, unless otherwise noted. These characteristics are included for Design Guidance and are
not subject to test.)
Parameter
B Grade
Units
Test Conditions/Comments
DYNAMIC PERFORMANCE
Output Voltage Settling Time
550
ns typ
Digital-to-Analog Glitch Impulse
35
nV-s typ
Multiplying Feedthrough Error
–70
dB max
Output Capacitance
Channel-to-Channel Isolation
60
30
–76
pF max
pF max
dB typ
Digital Crosstalk
Digital Feedthrough
5
5
nV-s typ
nV-s typ
Total Harmonic Distortion
Output Noise Spectral Density
@ 1 kHz
–83
dB typ
To 0.01% of Full-Scale Range. DAC Latch Alternately Loaded
with All 0s and All 1s
Measured with VREF = 0 V. DAC Register Alternately Loaded
with All 0s and All 1s
VREF = 20 V p-p, 10 kHz Sine Wave. DAC Latch Loaded
with All 0s
All 1s Loaded to DAC
All 0s Loaded to DAC
Feedthrough from Any One Reference to the Others with
20 V p-p, 10 kHz Sine Wave Applied
Effect of All 0s to All 1s Code Transition on Nonselected DACs
Feedthrough to Any DAC Output with FSIN High and Square
Wave Applied to SDIN and SCLK
VREF = 6 V rms, 1 kHz Sine Wave
30
nV/√Hz typ
All 1s Loaded to the DAC. VREF = 0 V. Output Op Amp Is
ADOP07
AC Performance Characteristics
Biased Mode
(VDD = +3 V to +5.5 V; VIOUT1 = VIOUT2 = 1.23 V; AGND = 0 V. VREF = 1 kHz, 2.45 V p-p, sine wave biased at 1.23 V; DAC
output op amp is AD820; TA = TMIN to TMAX, unless otherwise noted. These characteristics are included for Design
Guidance and are not subject to test.)
Parameter
A Grade
Units
Test Conditions/Comments
DYNAMIC PERFORMANCE
Output Voltage Settling Time
3.5
µs typ
Digital to Analog Glitch Impulse
35
nV-s typ
Multiplying Feedthrough Error
Output Capacitance
–70
100
40
5
dB max
pF max
pF max
nV-s typ
To 0.01% of Full-Scale Range. VREF = 0 V. DAC Latch Alternately Loaded with all 0s and all 1s.
Measured with VIOUT2 = 0 V and VREF = 0 V. DAC Register Alternately Loaded with all 0s and all 1s.
DAC Latch Loaded with all 0s.
All 1s Loaded to DAC
All 0s Loaded to DAC
Feedthrough to Any DAC Output with FSIN HIGH and a Square
Wave Applied to SDIN and CLKIN
–76
dB typ
20
nV/√Hz typ
Digital Feedthrough
Total Harmonic Distortion
Output Noise Spectral Density
@ 1 kHz
All 1s Loaded to DAC. VIOUT2 = 0 V; VREF = 0 V
–4–
REV. B
AD7564
Timing Specifications1
(TA = TMIN to TMAX unless otherwise noted)
Parameter
Limit at
Limit at
VDD = +3 V to +3.6 V VDD = +4.75 V to +5.25 V
Units
Description
t1
t2
t3
t4
t5
t6
t7
t82
t9
180
80
80
50
50
10
125
100
80
ns min
ns min
ns min
ns min
ns min
ns min
ns min
ns max
ns min
CLKIN Cycle Time
CLKIN High Time
CLKIN Low Time
FSIN Setup Time
Data Setup Time
Data Hold Time
FSIN Hold Time
SDOUT Valid After CLKIN Falling Edge
LDAC, CLR Pulse Width
100
40
40
30
30
5
90
70
40
NOTES
1
Not production tested. Guaranteed by characterization at initial product release. All input signals are specified with tr = tf = 5 ns (10% to 90% of VDD) and timed
from a voltage level of 1.6 V for a VDD of 5 V and from a voltage level 1.35 V for a VDD of 3.3 V.
2
t8 is measured with the load circuit of Figure 2 and defined as the time required for the output to cross 0.8 V or 2.4 V with a VDD of 5 V and 0.6 V or 2.1 V for a VDD
of 3.3 V.
t1
CLKIN(I)
t3
t2
t4
t7
FSIN(I)
t5
t6
SDIN(I)
DB15
DB0
t8
DB0
DB15
SDOUT(O)
t9
LDAC, CLR
Figure 1. Timing Diagram
1.6mA
IOL
TO OUTPUT
PIN
+1.6V
CL
50pF
200µA
IOH
Figure 2. Load Circuit for Digital Output Timing Specifications
REV. B
–5–
3
AD7564
ABSOLUTE MAXIMUM RATINGS 1
(TA = +25°C unless otherwise noted)
PIN CONFIGURATION
DIP, SOIC and SSOP Packages
VDD to DGND . . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +6 V
IOUT1 to DGND . . . . . . . . . . . . . . . . . . . –0.3 V to VDD + 0.3 V
IOUT2 to DGND . . . . . . . . . . . . . . . . . . . –0.3 V to VDD + 0.3 V
AGND to DGND . . . . . . . . . . . . . . . . . –0.3 V to VDD + 0.3 V
Digital Input Voltage to DGND . . . . . . –0.3 V to VDD + 0.3 V
VRFB, VREF to DGND . . . . . . . . . . . . . . . . . . . . . . . . . . .± 15 V
Input Current to Any Pin Except Supplies2 . . . . . . . . ± 10 mA
Operating Temperature Range
Commercial Plastic (A, B Versions). . . . . . –40°C to +85°C
Storage Temperature Range . . . . . . . . . . . . . –65°C to +150°C
Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . . . +150°C
DIP Package, Power Dissipation . . . . . . . . . . . . . . . . . 875 mW
θJA Thermal Impedance . . . . . . . . . . . . . . . . . . . . 75°C/W
Lead Temperature, Soldering (10 sec) . . . . . . . . . . 260°C
SOIC Package, Power Dissipation . . . . . . . . . . . . . . . . 875 mW
θJA Thermal Impedance . . . . . . . . . . . . . . . . . . . . 75°C/W
Lead Temperature, Soldering (10 sec) . . . . . . . . . . 260°C
Vapor Phase (60 sec) . . . . . . . . . . . . . . . . . . . . . +215°C
Infrared (15 sec) . . . . . . . . . . . . . . . . . . . . . . . . +220°C
SSOP Package, Power Dissipation . . . . . . . . . . . . . . . . 900 mW
θJA Thermal Impedance . . . . . . . . . . . . . . . . . . . 100°C/W
Lead Temperature, Soldering
Vapor Phase (60 sec) . . . . . . . . . . . . . . . . . . . . . +215°C
Infrared (15 sec) . . . . . . . . . . . . . . . . . . . . . . . . +220°C
DGND
1
28 IOUT2 B
IOUT2 C
2
27 AGND
VDD
3
26 NC
IOUT1 C
4
25 IOUT1 B
RFB C
5
24 RFB B
VREF C
6
23
IOUT2 D
7
IOUT1 D
8
AD7564
VREF B
22
IOUT2 A
TOP VIEW
21
IOUT1 A
(Not to Scale)
RFB D
9
20
RFB A
VREF D
10
19
VREF A
SDOUT
11
18
A0
CLR
12
17
A1
LDAC
13
16
CLKIN
O
FSIN
14
15
SDIN
NC = NO CONNECT
NOTES
1
Stresses above those listed under “Absolute Maximum Ratings” may cause
permanent damage to the device. This is a stress rating only and functional
operation of the device at these or any other conditions above those listed in the
operational sections of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect device reliability.
2
Transient currents of up to 100 mA will not cause SCR latch-up.
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection.
Although the AD7564 features proprietary ESD protection circuitry, permanent damage may
occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD
precautions are recommended to avoid performance degradation or loss of functionality.
–6–
WARNING!
ESD SENSITIVE DEVICE
REV. B
AD7564
PIN DESCRIPTIONS
Pin
Number
1
2
3
4
5
6
7
8
9
10
11
12
13
Mnemonic
DGND
IOUT2C
VDD
IOUT1C
RFBC
VREFC
IOUT2D
IOUT1D
RFBD
VREFD
SDOUT
CLR
LDAC
14
FSIN
15
SDIN
16
CLKIN
17
A1
18
19
20
21
22
23
24
25
26
27
A0
VREFA
RFBA
IOUT1A
IOUT2A
VREFB
RFBB
IOUT1B
N/C
AGND
28
IOUT2B
REV. B
Description
Digital Ground.
IOUT2 terminal for DAC C. This should normally connect to the signal ground of the system.
Positive power supply. This is +5 V ± 5%.
IOUT1 terminal for DAC C.
Feedback resistor for DAC C.
DAC C reference input.
IOUT2 terminal for DAC D. This should normally connect to the signal ground of the system.
IOUT1 terminal for DAC D.
Feedback resistor for DAC D.
DAC D reference input.
This shift register output allows multiple devices to be connected in a daisy chain configuration.
Asynchronous CLR input. When this input is taken low, all DAC latches are loaded with all 0s.
Asynchronous LDAC input. When this input is taken low, all DAC latches are simultaneously updated with the
contents of the input latches.
Level-triggered control input (active low). This is the frame synchronization signal for the input data. When FSIN
goes low, it enables the input shift register, and data is transferred on the falling edges of CLKIN. If the address
bits are valid, the 12-bit DAC data is transferred to the appropriate input latch on the sixteenth falling edge after
FSIN goes low.
Serial data input. The device accepts a 16-bit word. DB0 and DB1 are DAC select bits. DB2 and DB3 are device
address bits. DB4 to DB15 contain the 12-bit data to be loaded to the selected DAC.
Clock Input. Data is clocked into the input shift register on the falling edges of CLKIN. Add a pull-down resistor on
the clock line to avoid timing issues.
Device address pin. This input in association with A0 gives the device an address. If DB2 and DB3 of the serial
input stream do not correspond to this address, the data which follows is ignored and not loaded to any input
latch. However, it will appear at SDOUT irrespective of this.
Device address pin. This input in association with A1 gives the device an address.
DAC A reference input.
Feedback resistor for DAC A.
IOUT1 terminal for DAC A.
IOUT2 terminal for DAC A. This should normally connect to the signal ground of the system.
DAC B reference input.
Feedback resistor for DAC B.
IOUT1 terminal for DAC B.
No Connect pin.
This pin connects to the back gates of the current steering switches. It should be connected to the signal ground
of the system.
IOUT2 terminal for DAC B. This should normally connect to the signal ground of the system.
–7–
AD7564
Output Voltage Settling Time
TERMINOLOGY
Relative Accuracy
This is the amount of time it takes for the output to settle to a
specified level for a full-scale input change. For the AD7564, it
is specified with the AD843 as the output op amp.
Relative accuracy or endpoint linearity is a measure of the
maximum deviation from a straight line passing through the
endpoints of the DAC transfer function. It is measured after adjusting for zero error and full-scale error and is normally expressed in Least Significant Bits or as a percentage of full-scale
reading.
Digital to Analog Glitch Impulse
This is the amount of charge injected into the analog output
when the inputs change state. It is normally specified as the
area of the glitch in either pA-secs or nV-secs, depending upon
whether the glitch is measured as a current or voltage signal. It
is measured with the reference input connected to AGND and
the digital inputs toggled between all 1s and all 0s.
Differential Nonlinearity
Differential nonlinearity is the difference between the measured
change and the ideal 1 LSB change between any two adjacent
codes. A specified differential nonlinearity of 1 LSB maximum
ensures monotonicity.
AC Feedthrough Error
This is the error due to capacitive feedthrough from the DAC
reference input to the DAC IOUT terminal, when all 0s are
loaded in the DAC.
Gain Error
Gain error is a measure of the output error between an ideal
DAC and the actual device output. It is measured with all 1s
in the DAC after offset error has been adjusted out and is expressed in Least Significant Bits. Gain error is adjustable to
zero with an external potentiometer.
Channel-to-Channel Isolation
Channel-to-channel isolation refers to the proportion of input
signal from one DAC’s reference input which appears at the
output of any other DAC in the device and is expressed in dBs.
Output Leakage Current
Digital Crosstalk
Output leakage current is current which flows in the DAC
ladder switches when these are turned off. For the IOUT1
terminal, it can be measured by loading all 0s to the DAC and
be measured by loading all 0s to the DAC and measuring the IOUT1
current. Minimum current will flow in the IOUT2 line when the
DAC is loaded with all 1s. This is a combination of the switch
leakage current and the ladder termination resistor current.
The IOUT2 leakage current is typically equal to that in IOUT1.
The glitch impulse transferred to the output of one converter
due to a change in digital input code to the other converter is
defined as the Digital Crosstalk and is specified in nV-secs.
Digital Feedthrough
When the device is not selected, high frequency logic activity on
the device digital inputs is capacitively coupled through the device to show up at on the IOUT pin and subsequently on the op
amp output. This noise is digital feedthrough.
Output Capacitance
This is the capacitance from the IOUT1 pin to AGND.
Table I. AD7564 Loading Sequence
DB15
DB11 DB10 DB9
DB0
DB8
DB7
DB6
DB5
DB4
DB3
DB2
DB1
DB0
A1
A0
DS1
DS0
Table II. DAC Selection
DS1
DS0
Function
0
0
1
1
0
1
0
1
DAC A Selected
DAC B Selected
DAC C Selected
DAC D Selected
–8–
REV. B
Typical Performance Curves–AD7564
0.5
0.5
NORMAL MODE OF OPERATION
VDD = +5V
TA = +25°C
0.4
0.4
0.3
0.3
INL – LSBs
DNL – LSBs
NORMAL MODE OF OPERATION
VDD = +5V
TA = +25°C
0.2
0.1
0.2
0.1
0.0
0.0
2
4
6
VREF – Volts
8
10
2
Figure 3. Differential Nonlinearity Error vs. VREF
(Normal Mode)
8
10
0
VREFC = 20V p-p SINE WAVE
ALL OTHER REFERENCE INPUTS = 0V
DAC C LOADED WITH ALL 1s
ALL OTHER DACs LOADED WITH ALL 0s
–10
VREFB = 0V
ALL OTHER REFERENCE INPUTS = 20V p-p SINE WAVE
DAC B LOADED WITH ALL 0s
ALL OTHER DACs LOADED WITH ALL 1s
–10
–20
VOUTB/VOUTC – dBs
–20
VOUTB/VOUTC – dBs
6
VREF – Volts
Figure 6. Integral Nonlinearity Error vs. VREF
(Normal Mode)
0
–30
–40
–50
–60
–30
–40
–50
–60
–70
–70
–80
–80
–90
–90
103
104
105
FREQUENCY – Hz
106
103
Figure 4. Channel-to-Channel Isolation (1 DAC to 1 DAC)
106
0
NORMAL MODE OF OPERATION
VDD = +5V
VIN = +6V rms
OP AMP = AD713
TA = +25°C
VDD = +5V
TA = +25°C
VIN = 20V p-p
OP AMP = AD711
–10
–20
DAC LOADED WITH ALL 1s
–30
GAIN – dB
–60
104
105
FREQUENCY – Hz
Figure 7. Channel-to-Channel Isolation (1 DAC to All
Other DACs)
–50
THD – dBs
4
–70
–80
–40
–50
DAC LOADED WITH ALL 0s
–60
–70
–80
–90
–90
–100
–100
102
1k
103
104
FREQUENCY – Hz
105
Figure 5. Total Harmonic Distortion vs. Frequency
(Normal Mode)
REV. B
10k
100k
FREQUENCY – Hz
1M
10M
Figure 8. Multiplying Frequency Response vs. Digital
Code (Normal Mode)
–9–
AD7564
2.0
2.0
VDD = +3.3V
TA = +25°C
OP AMP = AD820
VREF = +1.23V (AD589)
1.8
1.6
1.6
1.4
DNL – LSBs
INL – LSBs
1.4
1.2
1.0
0.8
1.0
0.8
0.6
0.4
0.4
0.2
0.2
0.4
0.6
0.8
1.0
|VREF – VBIAS| – Volts
0.0
0.2
1.4
1.2
Figure 9. Integral Nonlinearity Error vs. VREF
(Biased Mode)
0.4
0.6
0.8
1.0
|VREF – VBIAS| – Volts
1.4
1.2
Figure 12. Differential Nonlinearity Error vs. VREF
(Biased Mode)
2.0
2.0
VDD = +5V
TA = +25°C
OP AMP = AD820
VBIAS = +1.23V (AD589)
1.8
1.6
1.6
1.4
DNL – LSBs
1.2
1.0
0.8
1.2
1.0
0.8
0.6
0.6
0.4
0.4
0.2
0.2
0.0
0.2
0.4
0.6
0.8
1.0
|VREF – VBIAS| – Volts
1.2
VDD = +5V
TA = +25°C
OP AMP = AD820
VBIAS = +1.23V (AD589)
1.8
1.4
INL – LSBs
1.2
0.6
0.0
0.2
0.0
0.2
1.4
0.4
0.2
0.1
LINEARITY ERROR – LSBs
0.0
–0.1
–0.2
–0.3
VDD = +3.3V
TA = +25°C
VBIAS = 1.23V
VREF = 0V
1024
2048
CODE – LSBs
1.2
1.4
0.2
0.1
0.0
–0.1
–0.5
0
0.6
0.8
1.0
|VREF – VBIAS| – Volts
NORMAL MODE
VDD = +5V
TA = +25°C
VREF = 10V
0.3
–0.4
0.4
Figure 13. Differential Nonlinearity Error vs. VREF
(Biased Mode)
Figure 10. Integral Nonlinearity Error vs. VREF
(Biased Mode)
LINEARITY ERROR – LSBs
VDD = +3.3V
TA = +25°C
OP AMP = AD820
VREF = +1.23V (AD589)
1.8
3072
0
4095
1024
2048
CODE – LSBs
3072
4095
Figure 14. All Codes Linearity Plot (Normal Mode)
Figure 11. All Codes Linearity Plot (Biased Mode)
–10–
REV. B
AD7564
Bringing the CLR line low resets the DAC latches to all 0s. The
input latches are not affected so that the user can revert to the
previous analog output if desired.
GENERAL DESCRIPTION
D/A Section
The AD7564 contains four 12-bit current output D/A converters. A simplified circuit diagram for one of the D/A converters
is shown in Figure 15.
CLKIN
16-BIT INPUT
SHIFT REGISTER
FSIN
V REF
R
2R
C
2R
B
R
2R
A
R
2R
S9
2R
S8
2R
S0
Figure 16. Input Logic
2R
3
UNIPOLAR BINARY OPERATION
(2-Quadrant Multiplication)
R/2
R FB
Figure 17 shows the standard unipolar binary connection diagram for one of the DACs in the AD7564. When VIN is an ac
signal, the circuit performs 2-quadrant multiplication. Resistors
R1 and R2 allow the user to adjust the DAC gain error. Offset
can be removed by adjusting the output amplifier offset voltage.
I OUT1
I OUT2
SHOWN FOR ALL 1s ON DAC
Figure 15. Simplified D/A Circuit Diagram
A segmented scheme is used whereby the 2 MSBs of the 12-bit
data word are decoded to drive the three switches A, B and C.
The remaining 10 bits of the data word drive the switches S0 to
S9 in a standard R-2R ladder configuration.
R2 10Ω
RFBA
R1 20Ω
VIN
Each of the switches A to C steers 1/4 of the total reference
current with the remaining current passing through the R-2R
section.
IOUT1A
DAC A
IOUT2A
C1
A1
VOUT
VREFA
AD7564
SIGNAL
GND
A1: AD707
AD711
AD843
AD845
NOTES
1. ONLY ONE DAC IS SHOWN FOR CLARITY.
2. DIGITAL INPUT CONNECTIONS ARE OMITTED.
3. C1 PHASE COMPENSATION (5–15pF) MAY BE
REQUIRED WHEN USING HIGH SPEED AMPLIFIER.
All DACs have separate VREF, IOUT1, IOUT2 and RFB pins.
When an output amplifier is connected in the standard configuration of Figure 17, the output voltage is given by:
V OUT = D ×V REF
Figure 17. Unipolar Binary Operation
A1 should be chosen to suit the application. For example, the
AD707 is ideal for very low bandwidth applications while the
AD843 and AD845 offer very fast settling time in wide bandwidth applications. Appropriate multiple versions of these amplifiers can be used with the AD7564 to reduce board space
requirements.
where D is the fractional representation of the digital word
loaded to the DAC. Thus, in the AD7564, D can be set from 0
to 4095/4096.
Interface Section
The AD7564 is a serial input device. Three input signals control the serial interface. These are FSIN, CLKIN and SDIN.
The timing diagram is shown in Figure 1.
The code table for Figure 17 is shown in Table III.
Data applied to the SDIN pin is clocked into the input shift register on each falling edge of CLKIN. SDOUT is the shift register output. It allows multiple devices to be connected in a daisy
chain fashion with the SDOUT pin of one device connected to
the SDIN of the next device. FSIN is the frame synchronization
for the device.
When the sixteen bits have been received in the input shift register, DB2 and DB3 (A0 and A1) are checked to see if they correspond to the state on pins A0 and A1. If it does, then the word
is accepted. Otherwise, it is disregarded. This allows the user
to address a number of AD7564s in a very simple fashion. DB1
and DB0 of the 16-bit word determine which of the four DAC
input latches is to be loaded. When the LDAC line goes low, all
four DAC latches in the device are simultaneously loaded with
the contents of their respective input latches and the outputs
change accordingly.
REV. B
SDOUT
SDIN
Table III. Unipolar Binary Code Table
Digital Input
MSB . . . LSB
Analog Output
(VOUT as Shown in Figure 17)
1111 1111 1111
1000 0000 0001
1000 0000 0000
0111 1111 1111
0000 0000 0001
0000 0000 0000
–VREF (4095/4096)
–VREF (2049/4096)
–VREF (2048/4096)
–VREF (2047/4096)
–VREF (1/4096)
–VREF (0/4096) = 0
NOTE
Nominal LSB size for the circuit of Figure 17 is given by: V REF (1/4096).
–11–
AD7564
BIPOLAR OPERATION
4-Quadrant Multiplication)
In the current mode circuit of Figure 19, IOUT2 and hence IOUT1,
is biased positive by an amount VBIAS. For the circuit to operate
correctly, the DAC ladder termination resistor must be connected internally to IOUT2. This is the case with the AD7564.
The output voltage is given by:
Figure 18 shows the standard connection diagram for bipolar
operation of any one of the DACs in the AD7564. The coding
is offset binary as shown in Table IV. When VIN is an ac signal,
the circuit performs 4-quadrant multiplication. To maintain
the gain error specifications, resistors R3, R4 and R5 should be
ratio matched to 0.01%.

R
V OUT = D × FB × (V
R
DAC

R4 20kΩ
RFBA
R1 20Ω
IOUT1A
VIN
DAC A
C1
IOUT2A
R4 20Ω
A1
R3
10kΩ
VREFA
AD7564
NOTES:
Voltage Mode Circuit
A2
VOUT
SIGNAL
GND

) +V BIAS

As D varies from 0 to 4095/4096, the output voltage varies
from VOUT = VBIAS to VOUT = 2 VBIAS – VIN. VBIAS should be a
low impedance source capable of sinking and sourcing all possible variations in current at the IOUT2 terminal without any
problems.
20kΩ
R5
R2 10Ω
BIAS –V IN
1. ONLY ONE DAC IS SHOWN FOR CLARITY.
2. DIGITAL INPUT CONNECTIONS ARE OMITTED.
3. C1 PHASE COMPENSATION (5–15pF) MAY BE
REQUIRED WHEN USING HIGH SPEED AMPLIFIER, A1.
Figure 18. Bipolar Operation (4-Quadrant Multiplication)
Table IV. Bipolar (Offset Binary) Code Table
Digital Input
MSB . . . LSB
Analog Output
(VOUT as Shown in Figure 18)
1111 1111 1111
1000 0000 0001
1000 0000 0000
0111 1111 1111
0000 0000 0001
0000 0000 0000
–VREF (2047/2048)
–VREF (1/2048)
–VREF (0/2048 = 0)
–VREF (1/2048)
–VREF (2047/2048)
–VREF (2048/2048) = –VREF
Figure 20 shows DAC A of the AD7564 operating in the
voltage-switching mode. The reference voltage, VIN is applied
to the IOUT1 pin, IOUT2 is connected to AGND and the output
voltage is available at the VREF terminal. In this configuration, a
positive reference voltage results in a positive output voltage;
making single supply operation possible. The output from the
DAC is a voltage at a constant impedance (the DAC ladder resistance). Thus, an op amp is necessary to buffer the output
voltage. The reference voltage input no longer sees a constant
input impedance, but one which varies with code. So, the voltage input should be driven from a low impedance source.
It is important to note that VIN is limited to low voltages because the switches in the DAC no longer have the same sourcedrain voltage. As a result, their on-resistance differs and this
degrades the integral linearity of the DAC. Also, VIN must not
go negative by more than 0.3 volts or an internal diode will turn
on, causing possible damage to the device. This means that the
full-range multiplying capability of the DAC is lost.
NOTE
Nominal LSB size for the circuit of Figure 18 is given by: V REF (1/2048).
R1
R2
RFBA
SINGLE SUPPLY APPLICATIONS
The “–B” versions of the AD7564 are specified and tested for
single supply applications. Figure 19 shows a typical circuit for
operation with a single +3.3 V to +5 V supply.
VIN
IOUT1A
IOUT2A
A1
DAC A
VOUT
VREFA
AD7564
RFBA
NOTES
1. ONLY ONE DAC IS SHOWN FOR CLARITY.
2. DIGITAL INPUT CONNECTIONS ARE OMITTED.
3. C1 PHASE COMPENSATION (5–15pF) MAY BE
REQUIRED WHEN USING HIGH SPEED AMPLIFIER.
IOUT1A
VIN
A1
DAC A
VREFA
VOUT
IOUT2A
AD7564
Figure 20. Single Supply Voltage Switching Mode
Operation
VBIAS
NOTES:
1. ONLY ONE DAC IS SHOWN FOR CLARITY.
2. DIGITAL INPUT CONNECTIONS ARE OMITTED.
3. C1 PHASE COMPENSATION (5–15pF) MAY BE
REQUIRED WHEN USING HIGH SPEED AMPLIFIER, A1.
Figure 19. Single Supply Current Mode Operation
–12–
REV. B
AD7564
MICROPROCESSOR INTERFACING
AD7564 to 80C51 Interface
AD7564 to 68HC11 Interface
Figure 22 shows a serial interface between the AD7564 and the
68HC11 microcontroller. SCK of the 68HC11 drives SCLK of
the AD7564 while the MOSI output drives the serial data line of
the AD7564. The FSIN signal is derived from a port line
(PC7 shown).
A serial interface between the AD7564 and the 80C51 microcontroller is shown in Figure 21. TXD of the 80C51 drives
SCLK of the AD7564 while RXD drives the serial data line of
the part. The FSIN signal is derived from the port line P3.3.
The 80C51 provides the LSB of its SBUF register as the first bit
in the serial data stream. Therefore, the user will have to ensure
that the data in the SBUF register is arranged correctly so that
the data word transmitted to the AD7564 corresponds to the
loading sequence shown in Table I. When data is to be transmitted to the part, P3.3 is taken low. Data on RXD is valid on
the falling edge of TXD. The 80C51 transmits its serial data in
8-bit bytes with only eight falling clock edges occurring in the
transmit cycle. To load data to the AD7564, P3.3 is left low
after the first eight bits are transferred and a second byte of data
is then transferred serially to the AD7564. When the second
serial transfer is complete, the P3.3 line is taken high. Note that
the 80C51 outputs the serial data byte in a format which has the
LSB first. The AD7564 expects the MSB first. The 80C51
transmit routine should take this into account.
For correct operation of this interface, the 68HC11 should be
configured such that its CPOL bit is a 0 and its CPHA bit is a 1.
When data is to be transmitted to the part, PC7 is taken low.
When the 68HC11 is configured like this, data on MOSI is valid
on the falling edge of SCK. The 68HC11 transmits its serial
data in 8-bit bytes (MSB first), with only eight falling clock
edges occurring in the transmit cycle. To load data to the
AD7564 , PC7 is left low after the first eight bits are transferred
and a second byte of data is then transferred serially to the
AD7564. When the second serial transfer is complete, the PC7
line is taken high.
AD7564*
64HC11*
PC5
AD7564*
80C51*
CLR
PC6
LDAC
PC7
FSIN
CLR
SCK
SCLK
P3.4
LDAC
MOSI
SDIN
P3.3
FSIN
P3.5
TXD
SCLK
RXD
SDIN
*ADDITIONAL PINS OMMITTED FOR CLARITY
Figure 22. AD7564 to 64HC11 Interface
*ADDITIONAL PINS OMMITTED FOR CLARITY
Figure 21. AD7564 to 80C51 Interface
LDAC and CLR on the AD7564 are also controlled by 80C51
port outputs. The user can bring LDAC low after every two
bytes have been transmitted to update the DAC which has been
programmed. Alternatively, it is possible to wait until all the input registers have been loaded (sixteen byte transmits) and then
update the DAC outputs.
REV. B
In Figure 22, LDAC and CLR are controlled by the PC6
and PC5 port outputs. As with the 80C51, each DAC of the
AD7564 can be updated after each two-byte transfer, or else
all DACs can be simultaneously updated. This interface
is suitable for both 3 V and 5 V versions of the 68HC11
microcontroller.
–13–
3
AD7564
AD7564 to ADSP-2101/ADSP-2103 Interface
Figure 23 shows a serial interface between the AD7564 and the
ADSP-2101/ADSP-2103 digital signal processors. The ADSP2101 operates from 5 V while the ADSP-2103 operates from
3 V supplies. These processors are set up to operate in the
SPORT Transmit Alternate Framing Mode.
AD7564*
TMS320C25*
+5V
CLR
The following DSP conditions are recommended: Internal
SCLK; Active low Framing Signal; 16-bit word length. Transmission is initiated by writing a word to the TX register after the
SPORT has been enabled. The data is then clocked out on every rising edge of SCLK after TFS goes low. TFS stays low until the next data transfer.
XF
LDAC
FSX
FSIN
DX
SDIN
CLKIN
CLKX
CLOCK
GENERATION
*ADDITIONAL PINS OMMITTED FOR CLARITY
AD7564*
ADSP-2101/
ADSP-2103
Figure 24. AD7564 to TMS320C25 Interface
+5V
APPLICATION HINTS
Output Offset
CLR
FO
LDAC
TFS
FSIN
DT
SDIN
SCLK
CLKIN
*ADDITIONAL PINS OMMITTED FOR CLARITY
Figure 23. AD7564 to ADSP-2101/ADSP-2103 Interface
AD7564 to TMS320C25 Interface
Figure 24 shows an interface circuit for the TMS320C25 digital
signal processor. The data on the DX pin is clocked out of
the processor’s Transmit Shift Register by the CLKX signal.
Sixteen-bit transmit format should be chosen by setting the FO
bit in the ST1 register to 0. The transmit operation begins
when data is written into the data transmit register of the
TMS320C25. This data will be transmitted when the FSX line
goes low while CLKX is high or going high. The data, starting
with the MSB, is then shifted out to the DX pin on the rising
edge of CLKX. When all bits have been transmitted, the user
can update the DAC outputs by bringing the XF output flag
low.
CMOS D/A converters in circuits such as Figures 17, 18 and 19
exhibit a code dependent output resistance which in turn can
cause a code dependent error voltage at the output of the amplifier. The maximum amplitude of this error, which adds to the
D/A converter nonlinearity, depends on VOS, where VOS is the
amplifier input offset voltage. For the AD7564 to maintain
specified accuracy with VREF at 10 V, it is recommended that
VOS be no greater than 500 µV, or (50 × 10–6) × (VREF), over
the temperature range of operation. Suitable amplifiers include
the ADOP-07, ADOP-27, AD711, AD845 or multiple versions
of these.
Temperature Coefficients
The gain temperature coefficient of the AD7564 has a maximum value of 5 ppm/°C and a typical value of 2 ppm/°C. This
corresponds to gain shifts of 2 LSBs and 0.8 LSBs respectively
over a 100°C temperature range. When trim resistors R1 and
R2 are used to adjust full scale in Figures 17 and 18, their temperature coefficients should be taken into account. For further
information see “Gain Error and Gain Temperature Coefficient
of CMOS Multiplying DACs,” Application Note, Publication
Number E630c-5-3/86, available from Analog Devices.
High Frequency Considerations
The output capacitances of the AD7564 DACs work in conjunction with the amplifier feedback resistance to add a pole to
the open loop response. This can cause ringing or oscillation.
Stability can be restored by adding a phase compensation capacitor in parallel with the feedback resistor. This is shown as
C1 in Figures 17 and 18.
–14–
REV. B
AD7564
In the circuit of Figure 25:
APPLICATIONS
Programmable State Variable Filter
C1 = C2, R7 = R8, R3 = R4 (i.e., the same code is loaded to
each DAC).
The AD7564 with its multiplying capability and fast settling
time is ideal for many types of signal conditioning applications.
The circuit of Figure 25 shows its use in a state variable filter
design. This type of filter has three outputs: low pass, high pass
and bandpass. The particular version shown in Figure 25 uses
the AD7564 to control the critical parameters fO, Q and AO. Instead of several fixed resistors, the circuit uses the DAC equivalent resistances as circuit elements.
Resonant Frequency, fO = 1/(2 π R3C1)
Quality Factor, Q = (R6/R8) × (R2/R5)
Bandpass Gain, AO = –R2/R1
Using the values shown in Figure 25, the Q range is 0.3 to 5 and
the fO range is 0 to 12 kHz.
Thus, R1 in Figure 25 is controlled by the 12-bit digital word
loaded to DAC A of the AD7564. This is also the case with R2,
R3 and R4. The fixed resistor R5 is the feedback resistor, RFBB.
DAC Equivalent Resistance, REQ = (RLADDER × 4096)/N
where: RLADDER is the DAC ladder resistance
N is the DAC Digital Code in Decimal (0 < N < 4096)
C3 10pF
R8
30kΩ
C1 1000pF
HIGH
PASS
OUTPUT
A2
R6
10kΩ
R7
30kΩ
C2 1000pF
A3
A4
LOW
PASS
OUTPUT
A1
IOUT1A
IOUT1B
RFBB
VREFB
VREFC
IOUT1C
VREFD
IOUT1D
R5
VIN
VREFA
DAC A
(R1)
DAC B
(R2)
DAC C
(R3)
DAC D
(R4)
AD7564
IOUT2A
IOUT2B
AGND
IOUT2C
IOUT2D
NOTES
1. A1, A2, A3, A4, : 1/4 X AD713.
2. DIGITAL INPUT CONNECTIONS ARE OMITTED.
3. C3 IS A COMPENSATION CAPACITOR TO ELIMINATE Q AND GAIN VARIATIONS
CAUSED BY AMPLIFIER GAIN AND BANDWIDTH LIMITATIONS.
Figure 25. Programmable 2nd Order State Variable Filter
REV. B
–15–
BAND
PASS
OUTPUT
3
AD7564
OUTLINE DIMENSIONS
1.565 (39.75)
1.380 (35.05)
28
15
0.580 (14.73)
0.485 (12.31)
1
14
0.625 (15.88)
0.600 (15.24)
0.100 (2.54)
BSC
0.250 (6.35)
MAX
0.195 (4.95)
0.125 (3.17)
0.015 (0.38)
GAUGE
PLANE
0.015
(0.38)
MIN
0.200 (5.08)
0.115 (2.92)
SEATING
PLANE
0.022 (0.56)
0.014 (0.36)
0.700 (17.78)
MAX
0.005 (0.13)
MIN
0.015 (0.38)
0.008 (0.20)
0.070 (1.78)
0.050 (1.27)
071006-A
COMPLIANT TO JEDEC STANDARDS MS-011
CONTROLLING DIMENSIONS ARE IN INCHES; MILLIMETER DIMENSIONS
(IN PARENTHESES) ARE ROUNDED-OFF INCH EQUIVALENTS FOR
REFERENCE ONLY AND ARE NOT APPROPRIATE FOR USE IN DESIGN.
CORNER LEADS MAY BE CONFIGURED AS WHOLE LEADS.
Figure 26. 28-Lead Plastic Dual In-Line Package [PDIP]
Wide Body
(N-28-2)
Dimensions shown in inches and (millimeters)
18.10 (0.7126)
17.70 (0.6969)
15
28
7.60 (0.2992)
7.40 (0.2913)
14
2.65 (0.1043)
2.35 (0.0925)
0.30 (0.0118)
0.10 (0.0039)
COPLANARITY
0.10
10.65 (0.4193)
10.00 (0.3937)
1.27 (0.0500)
BSC
0.51 (0.0201)
0.31 (0.0122)
SEATING
PLANE
0.75 (0.0295)
45°
0.25 (0.0098)
8°
0°
0.33 (0.0130)
0.20 (0.0079)
COMPLIANT TO JEDEC STANDARDS MS-013-AE
CONTROLLING DIMENSIONS ARE IN MILLIMETERS; INCH DIMENSIONS
(IN PARENTHESES) ARE ROUNDED-OFF MILLIMETER EQUIVALENTS FOR
REFERENCE ONLY AND ARE NOT APPROPRIATE FOR USE IN DESIGN.
1.27 (0.0500)
0.40 (0.0157)
06-07-2006-A
1
Figure 27. 28-Lead Standard Small Outline Package [SOIC_W]
Wide Body
(RW-28)
Dimensions shown in millimeters and (inches)
–16–
REV. B
AD7564
10.50
10.20
9.90
15
28
5.60
5.30
5.00
1
8.20
7.80
7.40
14
0.65 BSC
0.38
0.22
SEATING
PLANE
8°
4°
0°
COMPLIANT TO JEDEC STANDARDS MO-150-AH
0.95
0.75
0.55
060106-A
0.05 MIN
COPLANARITY
0.10
0.25
0.09
1.85
1.75
1.65
2.00 MAX
Figure 28. 28-Lead Shrink Small Outline Package [SSOP]
(RS-28)
Dimensions shown in millimeters
ORDERING GUIDE
Model
AD7564AR-B
AD7564ARS-B
AD7564ARS-BREEL
AD7564ARSZ-B
AD7564ARSZ-BREEL
AD7564ARZ-B
AD7564ARZ-BREEL
AD7564BN
AD7564BNZ
AD7564BR
AD7564BR-REEL
AD7564BRS
AD7564BRS-REEL
AD7564BRSZ
AD7564BRSZ-REEL
AD7564BRZ
AD7564BRZ-REEL
Temperature Range
−40°C to +85°C
−40°C to +85°C
−40°C to +85°C
−40°C to +85°C
−40°C to +85°C
−40°C to +85°C
−40°C to +85°C
−40°C to +85°C
−40°C to +85°C
−40°C to +85°C
−40°C to +85°C
−40°C to +85°C
−40°C to +85°C
−40°C to +85°C
−40°C to +85°C
−40°C to +85°C
−40°C to +85°C
Package Description
28-Lead SOIC_W
28-Lead SSOP
28-Lead SSOP
28-Lead SSOP
28-Lead SSOP
28-Lead SOIC_W
28-Lead SOIC_W
28-Lead PDIP
28-Lead PDIP
28-Lead SOIC_W
28-Lead SOIC_W
28-Lead SSOP
28-Lead SSOP
28-Lead SSOP
28-Lead SSOP
28-Lead SOIC_W
28-Lead SOIC_W
REVISION HISTORY
2/12—Rev. A to Rev. B
Changes to Pin 16 Description ....................................................... 7
Updated Outline Dimensions ....................................................... 17
Changes to Ordering Guide .......................................................... 17
©2012 Analog Devices, Inc. All rights reserved. Trademarks and
registered trademarks are the property of their respective owners.
D10540-0-2/12(B)
REV. B
–17–
Package Option
RW-28
RS-28
RS-28
RS-28
RS-28
RW-28
RW-28
N-28-2
N-28-2
RW-28
RW-28
RS-28
RS-28
RS-28
RS-28
RW-28
RW-28