FDS8878 N-Channel PowerTrench® MOSFET tm 30V, 10.2A, 14mΩ Features General Description rDS(on) = 14mΩ, VGS = 10V, ID = 10.2A This N-Channel MOSFET has been designed specifically to improve the overall efficiency of DC/DC converters using either synchronous or conventional switching PWM controllers. It has been optimized for low gate charge, low rDS(on) and fast switching speed. rDS(on) = 17mΩ, VGS = 4.5V, ID = 9.3A High performance trench technology for extremely low rDS(on) Applications Low gate charge DC/DC converters High power and current handling capability RoHS Compliant Branding Dash 5 1 2 3 4 5 4 6 3 7 2 8 1 SO-8 ©2007 Fairchild Semiconductor Corporation FDS8878 Rev. B 1 www.fairchildsemi.com FDS8878 N-Channel PowerTrench® MOSFET April 2007 Symbol VDSS Drain to Source Voltage Parameter Ratings 30 Units V VGS Gate to Source Voltage ±20 V Continuous (TA = 25oC, VGS = 10V, RθJA = 50oC/W) 10.2 A Continuous (TA = 25 C, VGS = 4.5V, RθJA = 50 C/W) 9.3 A Pulsed 80 A Single Pulse Avalanche Energy (Note 1) 57 mJ Power dissipation 2.5 W Derate above 25oC 20 mW/oC Drain Current ID o EAS PD TJ, TSTG o Operating and Storage Temperature o -55 to 150 C Thermal Characteristics RθJC Thermal Resistance, Junction to Case (Note 2) 25 oC/W RθJA Thermal Resistance, Junction to Ambient (Note 2a) 50 oC/W RθJA Thermal Resistance, Junction to Ambient (Note 2b) 125 o C/W Package Marking and Ordering Information Device Marking FDS8878 Device FDS8878 Package SO-8 Reel Size 330mm Tape Width 12mm Quantity 2500 units Electrical Characteristics TJ = 25°C unless otherwise noted Symbol Parameter Test Conditions Min Typ Max Units 30 - - - V - 1 - - 250 - - ±100 nA V Off Characteristics BVDSS Drain to Source Breakdown Voltage IDSS Zero Gate Voltage Drain Current IGSS Gate to Source Leakage Current ID = 250µA, VGS = 0V VDS = 24V VGS = 0V TJ = 150oC VGS = ±20V µA On Characteristics VGS(TH) rDS(on) Gate to Source Threshold Voltage Drain to Source On Resistance VGS = VDS, ID = 250µA 1.2 - 2.5 ID = 10.2A, VGS = 10V - 11.0 14.0 ID = 9.3A, VGS = 4.5V - 13.8 17.0 ID = 10.2A, VGS = 10V, TJ = 150oC - 17.5 22.7 - 897 - pF - 190 - pF - 111 - pF 0.7 2.9 5.0 Ω - 17 26 nC mΩ Dynamic Characteristics CISS Input Capacitance COSS Output Capacitance CRSS Reverse Transfer Capacitance RG Gate Resistance VGS = 0.5V, f = 1MHz Qg(TOT) Total Gate Charge at 10V VGS = 0V to 10V Qg(5) Total Gate Charge at 5V VGS = 0V to 5V Qg(TH) Threshold Gate Charge VGS = 0V to 1V Qgs Gate to Source Gate Charge Qgs2 Qgd VDS = 15V, VGS = 0V, f = 1MHz VDD = 15V ID = 10.2A Ig = 1.0mA - 9 14 nC - 0.9 1.4 nC - 2.5 - nC Gate Charge Threshold to Plateau - 1.7 - nC Gate to Drain “Miller” Charge - 3.3 - nC ©2007 Fairchild Semiconductor Corporation FDS8878 Rev. B 2 www.fairchildsemi.com FDS8878 N-Channel PowerTrench® MOSFET MOSFET Maximum Ratings TA = 25°C unless otherwise noted tON Turn-On Time - - 54 ns td(ON) Turn-On Delay Time - 7 - ns tr Rise Time - 29 - ns td(OFF) Turn-Off Delay Time - 45 - ns tf Fall Time - 18 - ns tOFF Turn-Off Time - - 94 ns ISD = 10.2A - - 1.25 V ISD = 2.1A - - 1.0 V VDD = 15V, ID = 10.2A VGS = 10V, RGS = 16Ω Drain-Source Diode Characteristics VSD Source to Drain Diode Voltage trr Reverse Recovery Time ISD = 10.2A, dISD/dt = 100A/µs - - 19 ns QRR Reverse Recovered Charge ISD = 10.2A, dISD/dt = 100A/µs - - 9.5 nC Notes: 1: Starting TJ = 25°C, L = 1mH, IAS = 10.7A, VDD = 30V, VGS = 10V. 2: RθJA is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of the drain pins. RθJC is guaranteed by design while RθJA is determined by the user’s board design. a) 50°C/W when mounted on a 1in2 pad of 2 oz copper. b) 125°C/W when mounted on a minimum pad. ©2007 Fairchild Semiconductor Corporation FDS8878 Rev. B 3 www.fairchildsemi.com FDS8878 N-Channel PowerTrench® MOSFET Switching Characteristics (VGS = 10V) 12 1.0 ID, DRAIN CURRENT (A) POWER DISSIPATION MULTIPLIER 1.2 0.8 0.6 0.4 VGS = 10V 9 VGS = 4.5V 6 3 0.2 RθJA=50oC/W 0 0 0 25 50 75 125 100 150 25 50 TA , AMBIENT TEMPERATURE (oC) Figure 1. Normalized Power Dissipation vs Ambient Temperature 75 100 125 TA , AMBIENT TEMPERATURE (oC) 150 Figure 2. Maximum Continuous Drain Current vs Ambient Temperature 2 NORMALIZED THERMAL IMPEDANCE, ZθJA 1 0.1 DUTY CYCLE-DESCENDING ORDER D = 0.5 0.2 0.1 0.05 0.02 0.01 0.01 SINGLE PULSE o RθJA = 125 C/W 0.001 -4 10 -3 -2 10 10 -1 0 10 10 1 10 2 3 10 10 t, RECTANGULAR PULSE DURATION (s) Figure 3. Normalized Maximum Transient Thermal Impedance P(PK), PEAK TRANSIENT POWER (W) 1000 VGS = 10V SINGLE PULSE o RθJA = 125 C/W o 100 TA = 25 C 10 1 0.5 -4 10 -3 -2 10 10 -1 0 10 10 1 10 2 10 3 10 t, PULSE WIDTH (s) Figure 4. Single Pulse Maximum Power Dissipation ©2007 Fairchild Semiconductor Corporation FDS8878 Rev. B 4 www.fairchildsemi.com FDS8878 N-Channel PowerTrench® MOSFET Typical Characteristics TJ = 25°C unless otherwise noted 80 PULSE DURATION = 80µs DUTY CYCLE = 0.5%MAX If R = 0 tAV = (L)(IAS)/(1.3*RATED BVDSS - VDD) If R ≠ 0 tAV = (L/R)ln[(IAS*R)/(1.3*RATED BVDSS - VDD) +1] ID, DRAIN CURRENT (A) IAS, AVALANCHE CURRENT (A) 100 10 STARTING TJ = 25oC 60 VDS = 5V 40 TJ = 25oC 20 TJ = 150oC STARTING TJ = 150oC 0 1 1 0.01 0.1 1 10 2 100 3 4 5 VGS, GATE TO SOURCE VOLTAGE (V) tAV, TIME IN AVALANCHE (ms) Figure 6. Transfer Characteristics NOTE: Refer to Fairchild Application Notes AN7514 and AN7515 Figure 5. Unclamped Inductive Switching Capability 80 50 PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX VGS = 10V rDS(ON), DRAIN TO SOURCE ON RESISTANCE (mW) TA = 25oC PULSE DURATION = 80µs DUTY CYCLE = 0.5%MAX 60 ID, DRAIN CURRENT (A) TJ = -55oC VGS = 5V 40 VGS = 3.5V 20 40 ID = 10.2A 30 20 ID = 1A 10 VGS = 3V 0 0.0 0.2 0.4 0.6 0 0.8 2 VDS, DRAIN TO SOURCE VOLTAGE (V) Figure 7. Saturation Characteristics 6 8 10 Figure 8. Drain to Source On Resistance vs Gate Voltage and Drain Current 1.2 PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX 1.4 NORMALIZED GATE THRESHOLD VOLTAGE NORMALIZED DRAIN TO SOURCE ON RESISTANCE 1.6 4 VGS, GATE TO SOURCE VOLTAGE (V) 1.2 1.0 VGS = VDS, ID = 250µA 1.0 0.8 VGS = 10V, ID = 10.2A 0.8 -80 0.6 -40 0 40 80 120 160 -80 TJ, JUNCTION TEMPERATURE (oC) 0 40 80 120 160 TJ, JUNCTION TEMPERATURE (oC) Figure 9. Normalized Drain to Source On Resistance vs Junction Temperature ©2007 Fairchild Semiconductor Corporation FDS8878 Rev. B -40 Figure 10. Normalized Gate Threshold Voltage vs Junction Temperature 5 www.fairchildsemi.com FDS8878 N-Channel PowerTrench® MOSFET Typical Characteristics TJ = 25°C unless otherwise noted 2000 PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX CISS = CGS + CGD 1000 1.4 C, CAPACITANCE (pF) NORMALIZED DRAIN TO SOURCE ON RESISTANCE 1.6 1.2 1.0 VGS = 10V, ID = 10.2A 0.8 -80 -40 0 40 80 120 VGS = 0V, f = 1MHz 10 160 0.1 TJ, JUNCTION TEMPERATURE (oC) Figure 11. Normalized Drain to Source Breakdown Voltage vs Junction Temperature 8 6 4 WAVEFORMS IN DESCENDING ORDER: ID = 10.2A ID = 1A 2 6 9 12 15 1ms 1 10ms THIS AREA IS LIMITED BY rDS(on) 100ms 1s SINGLE PULSE TJ = MAX RATED 0.1 0.01 0.01 18 10s DC TA = 25oC 0.1 1 10 100 VDS, DRAIN to SOURCE VOLTAGE (V) Qg, GATE CHARGE (nC) Figure 13. Gate Charge Waveforms for Constant Gate Currents ©2007 Fairchild Semiconductor Corporation FDS8878 Rev. B 100us 10 RθJA = 125oC/W 0 3 30 100 VDD = 15V 0 1 10 VDS , DRAIN TO SOURCE VOLTAGE (V) Figure 12. Capacitance vs Drain to Source Voltage ID, DRAIN CURRENT (A) VGS , GATE TO SOURCE VOLTAGE (V) 10 COSS ≅ CDS + CGD CRSS = CGD Figure 14. Forward Bias Safe Operating Area 6 www.fairchildsemi.com FDS8878 N-Channel PowerTrench® MOSFET Typical Characteristics TJ = 25°C unless otherwise noted BVDSS VDS tP VDS L IAS VARY tP TO OBTAIN REQUIRED PEAK IAS VDD + RG VDD - VGS DUT tP 0V IAS 0 0.01Ω tAV Figure 15. Unclamped Energy Test Circuit Figure 16. Unclamped Energy Waveforms VDS VDD Qg(TOT) VDS VGS L VGS = 10V Qg(5) VGS + - Qgs2 VDD DUT VGS = 5V VGS = 1V Ig(REF) 0 Qg(TH) Qgs Qgd Ig(REF) 0 Figure 17. Gate Charge Test Circuit Figure 18. Gate Charge Waveforms VDS tON tOFF td(ON) td(OFF) RL tf tr VDS 90% 90% + VGS VDD 10% 10% 0 DUT 90% RGS VGS VGS 0 Figure 19. Switching Time Test Circuit ©2007 Fairchild Semiconductor Corporation FDS8878 Rev. B 50% 10% 50% PULSE WIDTH Figure 20. Switching Time Waveforms 7 www.fairchildsemi.com FDS8878 N-Channel PowerTrench® MOSFET Test Circuits and Waveforms The maximum rated junction temperature, TJM, and the thermal resistance of the heat dissipating path determines the maximum allowable device power dissipation, PDM, in an application. Therefore the application’s ambient temperature, TA (oC), and thermal resistance RθJA (oC/W) must be reviewed to ensure that TJM is never exceeded. Equation 1 mathematically represents the relationship and serves as the basis for establishing the rating of the part. ( T JM – T A ) P = ------------------------------DM RθJA thermal impedance curve. Thermal resistances corresponding to other copper areas can be obtained from Figure 21 or by calculation using Equation 2. The area, in square inches is the top copper area including the gate and source pads. 26 0.23 + Area R θJA = 64 + ------------------------------- (EQ. 1) (EQ. 2) The transient thermal impedance (ZθJA) is also effected by varied top copper board area. Figure 22 shows the effect of copper pad area on single pulse transient thermal impedance. Each trace represents a copper pad area in square inches corresponding to the descending list in the graph. Spice and SABER thermal models are provided for each of the listed pad areas. In using surface mount devices such as the SO8 package, the environment in which it is applied will have a significant influence on the part’s current and maximum power dissipation ratings. Precise determination of PDM is complex and influenced by many factors: Copper pad area has no perceivable effect on transient thermal impedance for pulse widths less than 100ms. For pulse widths less than 100ms the transient thermal impedance is determined by the die and package. Therefore, CTHERM1 through CTHERM5 and RTHERM1 through RTHERM5 remain constant for each of the thermal models. A listing of the model component values is available in Table 1. 1. Mounting pad area onto which the device is attached and whether there is copper on one side or both sides of the board. 2. The number of copper layers and the thickness of the board. 3. The use of external heat sinks. 4. The use of thermal vias. 200 5. Air flow and board orientation. RθJA = 64 + 26/(0.23+Area) RθJA (oC/W) 6. For non steady state applications, the pulse width, the duty cycle and the transient thermal response of the part, the board and the environment they are in. Fairchild provides thermal information to assist the designer’s preliminary application evaluation. Figure 21 defines the RθJA for the device as a function of the top copper (component side) area. This is for a horizontally positioned FR-4 board with 1oz copper after 1000 seconds of steady state power with no air flow. This graph provides the necessary information for calculation of the steady state junction temperature or power dissipation. Pulse applications can be evaluated using the Fairchild device Spice thermal model or manually utilizing the normalized maximum transient ZθJA, THERMAL IMPEDANCE (oC/W) 150 120 90 150 100 50 0.001 0.01 0.1 1 AREA, TOP COPPER AREA (in2) 10 Figure 21. Thermal Resistance vs Mounting Pad Area COPPER BOARD AREA - DESCENDING ORDER 0.04 in2 0.28 in2 0.52 in2 0.76 in2 1.00 in2 60 30 0 10-1 100 101 t, RECTANGULAR PULSE DURATION (s) 102 103 Figure 22. Thermal Impedance vs Mounting Pad Area ©2007 Fairchild Semiconductor Corporation FDS8878 Rev. B 8 www.fairchildsemi.com FDS8878 N-Channel PowerTrench® MOSFET Thermal Resistance vs. Mounting Pad Area .SUBCKT FDS8878 2 1 3 *February 2005 Ca 12 8 7.8e-10 Cb 15 14 7.8e-10 Cin 6 8 .78e-9 Dbody 7 5 DbodyMOD Dbreak 5 11 DbreakMOD Dplcap 10 5 DplcapMOD DRAIN 2 5 10 ESLC + LGATE GATE 1 Lgate 1 9 5.29e-9 Ldrain 2 5 1.0e-9 Lsource 3 7 0.18e-9 Rbreak 17 18 RbreakMOD 1 Rdrain 50 16 RdrainMOD 1.6e-3 Rgate 9 20 2.3 RSLC1 5 51 RSLCMOD 1e-6 RSLC2 5 50 1e3 Rsource 8 7 RsourceMOD 8.9e-3 Rvthres 22 8 RvthresMOD 1 Rvtemp 18 19 RvtempMOD 1 S1a 6 12 13 8 S1AMOD S1b 13 12 13 8 S1BMOD S2a 6 15 14 13 S2AMOD S2b 13 15 14 13 S2BMOD 11 + 17 EBREAK 18 - 50 RDRAIN 6 8 EVTHRES + 19 8 EVTEMP RGATE + 18 22 9 20 21 16 DBODY MWEAK 6 MMED MSTRO RLGATE LSOURCE CIN 8 7 RSOURCE RLgate 1 9 52.9 RLdrain 2 5 10 RLsource 3 7 1.8 Mmed 16 6 8 8 MmedMOD Mstro 16 6 8 8 MstroMOD Mweak 16 21 8 8 MweakMOD DBREAK + 5 51 ESG RLDRAIN RSLC1 51 RSLC2 Ebreak 11 7 17 18 32.9 Eds 14 8 5 8 1 Egs 13 8 6 8 1 Esg 6 10 6 8 1 Evthres 6 21 19 8 1 Evtemp 20 6 18 22 1 It 8 17 1 LDRAIN DPLCAP 12 S1A S2A 14 13 13 8 S1B CA RLSOURCE RBREAK 15 17 18 RVTEMP S2B 13 CB 6 8 VBAT 5 8 EDS - 19 IT 14 + + EGS SOURCE 3 - + 8 22 RVTHRES Vbat 22 19 DC 1 ESLC 51 50 VALUE={(V(5,51)/ABS(V(5,51)))*(PWR(V(5,51)/(1e-6*170),5))} .MODEL DbodyMOD D (IS=2.0E-12 IKF=10 N=1.01 RS=7.0e-3 TRS1=8e-4 TRS2=2e-7 + CJO=3.5e-10 M=0.55 TT=7e-11 XTI=2) .MODEL DbreakMOD D (RS=0.2 TRS1=1e-3 TRS2=-8.9e-6) .MODEL DplcapMOD D (CJO=3.8e-10 IS=1e-30 N=10 M=0.45) .MODEL MstroMOD NMOS (VTO=2.36 KP=150 IS=1e-30 N=10 TOX=1 L=1u W=1u) .MODEL MmedMOD NMOS (VTO=1.95 KP=5.0 IS=1e-30 N=10 TOX=1 L=1u W=1u RG=2.3) .MODEL MweakMOD NMOS (VTO=1.57 KP=0.02 IS=1e-30 N=10 TOX=1 L=1u W=1u RG=23 RS=0.1) .MODEL RbreakMOD RES (TC1=8.3e-4 TC2=-8e-7) .MODEL RdrainMOD RES (TC1=15e-3 TC2=0.1e-5) .MODEL RSLCMOD RES (TC1=1e-4 TC2=1e-6) .MODEL RsourceMOD RES (TC1=1e-3 TC2=3e-6) .MODEL RvtempMOD RES (TC1=-1.8e-3 TC2=2e-7) .MODEL RvthresMOD RES (TC1=-2.0e-3 TC2=-6e-6) MODEL S1AMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-4 VOFF=-3.5) .MODEL S1BMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-3.5 VOFF=-4) .MODEL S2AMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-1.5 VOFF=-1.0) .MODEL S2BMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-1.0 VOFF=-1.5).ENDSNote: For further discussion of the PSPICE model, consult A New PSPICE Sub-Circuit for the Power MOSFET Featuring Global Temperature Options; IEEE Power Electronics Specialist Conference Records, 1991, written by William J. Hepp and C. Frank Wheatley. ©2007 Fairchild Semiconductor Corporation FDS8878 Rev. B 9 www.fairchildsemi.com FDS8878 N-Channel PowerTrench® MOSFET PSPICE Electrical Model REV February 2005 template FDS8878 n2,n1,n3 electrical n2,n1,n3 { var i iscl dp..model dbodymod = (isl=2.0e-12,ikf=10,nl=1.01,rs=7.0e-3,trs1=8e-4,trs2=2e-7,cjo=3.5e-10,m=0.55,tt=7e-11,xti=2) dp..model dbreakmod = (rs=0.2,trs1=1e-3,trs2=-8.9e-6) dp..model dplcapmod = (cjo=3.8e-10,isl=10e-30,nl=10,m=0.45) m..model mstrongmod = (type=_n,vto=2.36,kp=150,is=1e-30, tox=1) m..model mmedmod = (type=_n,vto=1.95,kp=5.0,is=1e-30, tox=1) m..model mweakmod = (type=_n,vto=1.57,kp=0.02,is=1e-30, tox=1,rs=0.1) LDRAIN DPLCAP 5 sw_vcsp..model s1amod = (ron=1e-5,roff=0.1,von=-4,voff=-3.5) sw_vcsp..model s1bmod = (ron=1e-5,roff=0.1,von=-3.5,voff=-4) 10 sw_vcsp..model s2amod = (ron=1e-5,roff=0.1,von=-1.5,voff=-1.0) RLDRAIN RSLC1 sw_vcsp..model s2bmod = (ron=1e-5,roff=0.1,von=-1.0,voff=-1.5) 51 c.ca n12 n8 = 7.8e-10 RSLC2 c.cb n15 n14 = 7.8e-10 ISCL c.cin n6 n8 = .78e-9 spe.ebreak n11 n7 n17 n18 = 32.9GATE 1 spe.eds n14 n8 n5 n8 = 1 spe.egs n13 n8 n6 n8 = 1 spe.esg n6 n10 n6 n8 = 1 spe.evthres n6 n21 n19 n8 = 1 spe.evtemp n20 n6 n18 n22 = 1 RDRAIN 6 8 ESG EVTHRES + 19 8 + LGATE DBREAK 50 - dp.dbody n7 n5 = model=dbodymod dp.dbreak n5 n11 = model=dbreakmod dp.dplcap n10 n5 = model=dplcapmod EVTEMP RGATE + 18 22 9 20 21 11 MWEAK EBREAK + 17 18 - MMED MSTRO CIN DBODY 16 6 RLGATE 8 LSOURCE 7 RSOURCE i.it n8 n17 = 1 12 l.lgate n1 n9 = 5.29e-9 l.ldrain n2 n5 = 1.0e-9 l.lsource n3 n7 = 0.18e-9 S1A S2A 14 13 13 8 S1B CA res.rlgate n1 n9 = 52.9 res.rldrain n2 n5 = 10 res.rlsource n3 n7 = 1.8 RBREAK 15 17 18 RVTEMP CB 6 8 - 19 IT 14 + + EGS SOURCE 3 RLSOURCE S2B 13 DRAIN 2 VBAT 5 8 EDS - m.mmed n16 n6 n8 n8 = model=mmedmod, l=1u, w=1u m.mstrong n16 n6 n8 n8 = model=mstrongmod, l=1u, w=1u m.mweak n16 n21 n8 n8 = model=mweakmod, l=1u, w=1u + 8 22 RVTHRES res.rbreak n17 n18 = 1, tc1=8.3e-4,tc2=-8e-7 res.rdrain n50 n16 = 1.6e-3, tc1=15e-3,tc2=0.1e-5 res.rgate n9 n20 = 2.3 res.rslc1 n5 n51 = 1e-6, tc1=1e-4,tc2=1e-6 res.rslc2 n5 n50 = 1e3 res.rsource n8 n7 = 8.9e-3, tc1=1e-3,tc2=3e-6 res.rvthres n22 n8 = 1, tc1=-2.0e-3,tc2=-6e-6 res.rvtemp n18 n19 = 1, tc1=-1.8e-3,tc2=2e-7 sw_vcsp.s1a n6 n12 n13 n8 = model=s1amod sw_vcsp.s1b n13 n12 n13 n8 = model=s1bmod sw_vcsp.s2a n6 n15 n14 n13 = model=s2amod sw_vcsp.s2b n13 n15 n14 n13 = model=s2bmod v.vbat n22 n19 = dc=1 equations { i (n51->n50) +=iscl iscl: v(n51,n50) = ((v(n5,n51)/(1e-9+abs(v(n5,n51))))*((abs(v(n5,n51)*1e6/170))** 5)) } } ©2007 Fairchild Semiconductor Corporation FDS8878 Rev. B 10 www.fairchildsemi.com FDS8878 N-Channel PowerTrench® MOSFET SABER Electrical Model JUNCTION th REV February 2005 FDS8878T Copper Area =1.0 in2 CTHERM1 TH 8 2.0e-3 CTHERM2 8 7 5.0e-3 CTHERM3 7 6 1.0e-2 CTHERM4 6 5 4.0e-2 CTHERM5 5 4 9.0e-2 CTHERM6 4 3 2e-1 CTHERM7 3 2 1 CTHERM8 2 TL 3 RTHERM1 CTHERM1 8 RTHERM2 RTHERM1 TH 8 1e-1 RTHERM2 8 7 5e-1 RTHERM3 7 6 1 RTHERM4 6 5 5 RTHERM5 5 4 8 RTHERM6 4 3 12 RTHERM7 3 2 18 RTHERM8 2 TL 25 RTHERM3 SABER Thermal Model RTHERM4 CTHERM2 7 CTHERM3 6 2 Copper Area = 1.0 in template thermal_model th tl thermal_c th, tl { ctherm.ctherm1 th 8 =2.0e-3 ctherm.ctherm2 8 7 =5.0e-3 ctherm.ctherm3 7 6 =1.0e-2 ctherm.ctherm4 6 5 =4.0e-2 ctherm.ctherm5 5 4 =9.0e-2 ctherm.ctherm6 4 3 =2e-1 ctherm.ctherm7 3 2 1 ctherm.ctherm8 2 tl 3 CTHERM4 5 RTHERM5 CTHERM5 4 RTHERM6 CTHERM6 3 rtherm.rtherm1 th 8 =1e-1 rtherm.rtherm2 8 7 =5e-1 rtherm.rtherm3 7 6 =1 rtherm.rtherm4 6 5 =5 rtherm.rtherm5 5 4 =8 rtherm.rtherm6 4 3 =12 rtherm.rtherm7 3 2 =18 rtherm.rtherm8 2 tl =25 } RTHERM7 CTHERM7 2 RTHERM8 CTHERM8 tl CASE TABLE 1. THERMAL MODELS 0.04 in2 0.28 in2 0.52 in2 0.76 in2 1.0 in2 CTHERM6 1.2e-1 1.5e-1 2.0e-1 2.0e-1 2.0e-1 CTHERM7 0.5 1.0 1.0 1.0 1.0 CTHERM8 1.3 2.8 3.0 3.0 3.0 RTHERM6 26 20 15 13 12 RTHERM7 39 24 21 19 18 RTHERM8 55 38.7 31.3 29.7 25 COMPONANT ©2007 Fairchild Semiconductor Corporation FDS8878 Rev. B 11 www.fairchildsemi.com FDS8878 N-Channel PowerTrench® MOSFET SPICE Thermal Model TRADEMARKS The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is not intended to be an exhaustive list of all such trademarks. ACEx® Across the board. Around the world™ ActiveArray™ Bottomless™ Build it Now™ CoolFET™ CROSSVOLT™ CTL™ Current Transfer Logic™ DOME™ E2CMOS™ EcoSPARK® EnSigna™ FACT Quiet Series™ FACT® FAST® FASTr™ FPS™ FRFET® GlobalOptoisolator™ GTO™ HiSeC™ i-Lo™ ImpliedDisconnect™ IntelliMAX™ ISOPLANAR™ MICROCOUPLER™ MicroPak™ MICROWIRE™ Motion-SPM™ MSX™ MSXPro™ OCX™ OCXPro™ OPTOLOGIC® OPTOPLANAR® PACMAN™ PDP-SPM™ POP™ Power220® Power247® PowerEdge™ PowerSaver™ Power-SPM™ PowerTrench® Programmable Active Droop™ QFET® QS™ QT Optoelectronics™ Quiet Series™ RapidConfigure™ RapidConnect™ ScalarPump™ SMART START™ SPM® STEALTH™ SuperFET™ SuperSOT™-3 SuperSOT™-6 SuperSOT™-8 SyncFET™ TCM™ The Power Franchise® ™ TinyBoost™ TinyBuck™ TinyLogic® TINYOPTO™ TinyPower™ TinyWire™ TruTranslation™ µSerDes™ UHC® UniFET™ VCX™ Wire™ tm DISCLAIMER FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. THESE SPECIFICATIONS DO NOT EXPAND THE TERMS OF FAIRCHILD’S WORLDWIDE TERMS AND CONDITIONS, SPECIFICALLY THE WARRANTY THEREIN, WHICH COVERS THESE PRODUCTS. LIFE SUPPORT POLICY FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury of the user. 2. A critical component in any component of a life support, device, or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. PRODUCT STATUS DEFINITIONS Definition of Terms Datasheet Identification Product Status Advance Information Formative or In Design This datasheet contains the design specifications for product development. Specifications may change in any manner without notice. Preliminary First Production This datasheet contains preliminary data; supplementary data will be published at a later date. Fairchild Semiconductor reserves the right to make changes at any time without notice to improve design. No Identification Needed Full Production This datasheet contains final specifications. Fairchild Semiconductor reserves the right to make changes at any time without notice to improve design. Obsolete Not In Production This datasheet contains specifications on a product that has been discontinued by Fairchild Semiconductor.The datasheet is printed for reference information only. Definition Rev. I26 ©2007 Fairchild Semiconductor Corporation FDS8878 Rev. B 12 www.fairchildsemi.com FDS8878 N-Channel PowerTrench® MOSFET tm