BVDSS = 800 V RDS(on) typ = 1.55 Ω HFP7N80 ID = 7.0 A 800V N-Channel MOSFET TO-220 FEATURES Originative New Design 1 Superior Avalanche Rugged Technology Robust Gate Oxide Technology 2 3 1.Gate 2. Drain 3. Source Very Low Intrinsic Capacitances Excellent Switching Characteristics Unrivalled Gate Charge : 35 nC (Typ.) Extended Safe Operating Area Lower RDS(ON) : 1.55 Ω (Typ.) @VGS=10V 100% Avalanche Tested Absolute Maximum Ratings Symbol TC=25℃ unless otherwise specified Parameter Value Units 800 V VDSS Drain-Source Voltage ID Drain Current – Continuous (TC = 25℃) 7.0 A Drain Current – Continuous (TC = 100℃) 4.4 A IDM Drain Current – Pulsed 28 A VGS Gate-Source Voltage ±30 V EAS Single Pulsed Avalanche Energy (Note 2) 580 mJ IAR Avalanche Current (Note 1) 7.0 A EAR Repetitive Avalanche Energy (Note 1) 16.7 mJ dv/dt Peak Diode Recovery dv/dt (Note 3) 4.5 V/ns PD Power Dissipation (TC = 25℃) - Derate above 25℃ 167 W TJ, TSTG Operating and Storage Temperature Range TL Maximum lead temperature for soldering purposes, 1/8” from case for 5 seconds (Note 1) 1.33 W/℃ -55 to +150 ℃ 300 ℃ Thermal Resistance Characteristics Typ. Max. RθJC Symbol Junction-to-Case Parameter -- 0.75 RθCS Case-to-Sink 0.5 -- RθJA Junction-to-Ambient -- 62.5 Units ℃/W ◎ SEMIHOW REV.A0,June 2005 HFP7N80 June 2005 Symbol Parameter unless otherwise specified Test Conditions Min Typ Max Units On Characteristics VGS RDS(ON) Gate Threshold Voltage VDS = VGS, ID = 250 ㎂ 2.5 -- 4.5 V Static Drain-Source On-Resistance VGS = 10 V, ID = 3.5 A -- 1.55 1.9 Ω VGS = 0 V, ID = 250 ㎂ 800 -- -- V ID = 250 ㎂, Referenced to25℃ -- 0.93 -- V/℃ VDS = 800 V, VGS = 0 V -- -- 1 ㎂ VDS = 640 V, TC = 125℃ -- -- 10 ㎂ Off Characteristics BVDSS Drain-Source Breakdown Voltage ΔBVDSS Breakdown Voltage Temperature Coefficient /ΔTJ IDSS Zero Gate Voltage Drain Current IGSSF Gate-Body Leakage Current, Forward VGS = 30 V, VDS = 0 V -- -- 100 ㎁ IGSSR Gate-Body Leakage Current, Reverse VGS = -30 V, VDS = 0 V -- -- -100 ㎁ -- 1500 1950 ㎊ -- 120 155 ㎊ -- 18 24 ㎊ -- 40 80 ㎱ -- 120 240 ㎱ -- 60 120 ㎱ -- 70 140 ㎱ -- 35 45 nC -- 10 -- nC -- 13 -- nC Dynamic Characteristics Ciss Input Capacitance Coss Output Capacitance Crss Reverse Transfer Capacitance VDS = 25 V, VGS = 0 V, f = 1.0 MHz Switching Characteristics td(on) Turn-On Time tr Turn-On Rise Time td(off) Turn-Off Delay Time tf Turn-Off Fall Time Qg Total Gate Charge Qgs Gate-Source Charge Qgd VDS = 400 V, ID = 7.0 A, RG = 25 Ω (Note 4,5) VDS = 640V, ID = 7.0 A, VGS = 10 V (Note 4,5) Gate-Drain Charge Source-Drain Diode Maximum Ratings and Characteristics IS Continuous Source-Drain Diode Forward Current -- -- 7.0 ISM Pulsed Source-Drain Diode Forward Current -- -- 28 VSD Source-Drain Diode Forward Voltage IS = 7.0 A, VGS = 0 V -- -- 1.4 V trr Reverse Recovery Time -- 780 -- ㎱ Qrr Reverse Recovery Charge IS = 7.0 A, VGS = 0 V diF/dt = 100 A/μs (Note 4) -- 9.0 -- μC A Notes ; 1. Repetitive Rating : Pulse width limited by maximum junction temperature 2. L=22.2mH, IAS=7.0A, VDD=50V, RG=25Ω, Starting TJ =25°C 3. ISD≤7.0A, di/dt≤200A/μs, VDD≤BVDSS , Starting TJ =25 °C 4. Pulse Test : Pulse Width ≤ 300μs, Duty Cycle ≤ 2% 5. Essentially Independent of Operating Temperature ◎ SEMIHOW REV.A0,June 2005 HFP7N80 Electrical Characteristics TC=25 °C HFP7N80 Typical Characteristics VGS 15.0 V 10.0 V 8.0 V 7.0 V 6.5 V 6.0 V Bottom : 5.5 V Top : ID, Drain Current [A] 0 1 10 ID, Drain Current [A] 1 10 10 -1 10 ※ Notes : 1. 250μ s Pulse Test 2. TC = 25 ℃ -2 150oC -55oC o 25 C 0 10 ※ Notes : 1. VDS = 50V 2. 250μ s Pulse Test -1 10 -1 0 10 10 1 10 2 10 4 6 8 10 VGS, Gate-Source Voltage [V] VDS, Drain-Source Voltage [V] Figure 1. On Region Characteristics Figure 2. Transfer Characteristics 3.0 IDR, Reverse Drain Current [A] 3.5 VGS = 10V VGS = 20V 2.5 2.0 1.5 ※ Note : TJ = 25 ℃ 1.0 3 6 9 0 10 150 ℃ 25℃ ※ Notes : 1. VGS = 0V 2. 250μ s Pulse Test 12 15 10 18 0.2 0.4 0.6 0.8 1.0 1.2 1.4 ID, Drain Current [A] VSD, Source-Drain voltage [V] Figure 3. On Resistance Variation vs Drain Current and Gate Voltage Figure 4. Body Diode Forward Voltage Variation with Source Current and Temperature 2500 12 Ciss = Cgs + Cgd (Cds = shorted) Coss = Cds + Cgd Crss = Cgd 2000 Capacitance [pF] 1 10 -1 0 Ciss 1500 Coss 1000 ※ Notes : 1. VGS = 0 V 2. f = 1 MHz 500 Crss VDS = 160V VGS, Gate-Source Voltage [V] RDS(ON) [Ω ], Drain-Source On-Resistance 4.0 10 VDS = 400V VDS = 640V 8 6 4 2 ※ Note : ID = 7.0A 0 -1 10 0 0 10 1 10 0 5 10 15 20 25 30 35 40 VDS, Drain-Source Voltage [V] QG, Total Gate Charge [nC] Figure 5. Capacitance Characteristics Figure 6. Gate Charge Characteristics ◎ SEMIHOW REV.A0,June 2005 (continued) 1.2 3.0 RDS(ON), (Normalized) Drain-Source On-Resistance BVDSS, (Normalized) Drain-Source Breakdown Voltage HFP7N80 Typical Characteristics 1.1 1.0 ※ Notes : 1. VGS = 0 V 2. ID = 250 μ A 0.9 0.8 -100 -50 0 50 100 150 2.5 2.0 1.5 1.0 * Notes : 1. VGS = 10 V 2. ID = 3.5 A 0.5 0.0 -100 200 -50 100 150 Figure 7. Breakdown Voltage Variation vs Temperature Figure 8. On-Resistance Variation vs Temperature 200 8 2 Operation in This Area is Limited by R DS(on) 10 µs 10 ID, Drain Current [A] 100 µs 1 1 ms 10 ms DC 0 10 -1 10 ※ Notes : o 1. TC = 25 C o 2. TJ = 150 C 3. Single Pulse 0 10 1 2 10 3 10 6 4 2 0 25 -2 10 50 75 100 125 150 TC, Case Temperature [ ℃] VDS, Drain-Source Voltage [V] Figure 9. Maximum Safe Operating Area Figure 10. Maximum Drain Current vs Case Temperature 0 10 D=0.5 Zθ JC(t), Thermal Response ID, Drain Current [A] 50 TJ, Junction Temperature [ C] 10 10 0 TJ, Junction Temperature [oC] o 0.2 ※ Notes : 1. Zθ JC(t) = 0.75 ℃/W Max. 2. Duty Factor, D=t1/t2 3. TJM - TC = PDM * Zθ JC(t) -1 10 0.1 0.05 PDM 0.02 0.01 t1 single pulse -2 10 -5 10 -4 10 -3 10 -2 10 -1 10 t2 0 10 1 10 t1, Square Wave Pulse Duration [sec] Figure 11. Transient Thermal Response Curve ◎ SEMIHOW REV.A0,June 2005 HFP7N80 Fig 12. Gate Charge Test Circuit & Waveform 50KΩ 12V VGS Same Type as DUT Qg 200nF 10V 300nF VDS VGS Qgs Qgd DUT 3mA Charge Fig 13. Resistive Switching Test Circuit & Waveforms RL VDS VDS 90% VDD RG ( 0.5 rated VDS ) Vin DUT 10V 10% tr td(on) td(off) t on tf t off Fig 14. Unclamped Inductive Switching Test Circuit & Waveforms BVDSS 1 EAS = ---- LL IAS2 -------------------2 BVDSS -- VDD L VDS VDD ID BVDSS IAS RG 10V ID (t) DUT VDS (t) VDD tp Time ◎ SEMIHOW REV.A0,June 2005 HFP7N80 Fig 15. Peak Diode Recovery dv/dt Test Circuit & Waveforms DUT + VDS _ IS L Driver RG VGS VGS ( Driver ) Same Type as DUT VDD • dv/dt controlled by RG • IS controlled by pulse period Gate Pulse Width D = -------------------------Gate Pulse Period 10V IFM , Body Diode Forward Current IS ( DUT ) di/dt IRM Body Diode Reverse Current VDS ( DUT ) Body Diode Recovery dv/dt Vf VDD Body Diode Forward Voltage Drop ◎ SEMIHOW REV.A0,June 2005 HFP7N80 Package Dimension TO-220 (A) 9.90±0.20 0. 0± .6 20 4.50±0.20 6.50±0.20 9.19±0.20 2.80±0.20 1.27±0.20 1.52±0.20 1.30±0.20 2.40±0.20 3.02±0.20 13.08±0.20 15.70±0.20 φ3 0.80±0.20 2.54typ 2.54typ 0.50±0.20 ◎ SEMIHOW REV.A0,June 2005 HFP7N80 TO-220 (B) ±0.20 84 4.57±0.20 6.30±0.20 1.27±0.20 9.14±0.20 2.74±0.20 15.44±0.20 . φ3 0 .2 ±0 1.27±0.20 2.67±0.20 13.28±0.20 2.67±0.20 0.81±0.20 2.54typ 2.54typ 0.40±0.20 ◎ SEMIHOW REV.A0,June 2005