Automotive Innovative package options Suffix BQ PW D PW BQ PW GW GM SOT763-1 SOT403-1 SOT108-1 SOT402-1 SOT764-1 SOT360-1 SOT363 SOT886 16-pin 16-pin 14-pin 14-pin 20-pin 20-pin 6-pin 6-pin Width (mm) 2.50 6.40 6.00 6.40 2.50 6.40 2.10 1.00 Length (mm) 3.50 5.00 8.65 5.00 4.50 6.50 2.00 1.45 Pitch (mm) 0.50 0.65 1.27 0.65 0.50 0.65 0.65 0.50 Q100 Logic samples available in e-sample store. Order them today! Haven’t found your function? Please contact your local NXP representative. NXP Logic – Q100 logic portfolio www.nxp.com © 2012 NXP Semiconductors N.V. All rights reserved. Reproduction in whole or in part is prohibited without the prior written consent of the copyright owner. The information presented in this document does not form part of any quotation or contract, is believed to be accurate and reliable and may be changed without notice. No liability will be accepted by the publisher for any consequence of its use. Publication thereof does not convey nor imply any license under patent- or other industrial or intellectual property rights. Date of release: November 2012 Document order number: 9397 750 17356 Printed in the Netherlands Continuing to lead the way in automotive logic Introduction The operating environment of automobile semiconductor components is much more hostile than that of semiconductors used in home or portable applications. A television set will generally spend its operating lifetime within an ambient temperature range of 0 ˚C to 40 ˚C. Due to internal heating, its semiconductor devices can be expected to operate between 20 ˚C and 60 ˚C. By comparison, an automobile is expected to start at temperatures lower than -20 ˚C and, in some cases, operate within the engine compartment at temperatures approaching 125 ˚C. To ensure the reliability of automotive electronics, the Automotive Electronics Council introduced its AEC-Q100 standard which outlines procedures to be followed to ensure integrated circuits meet the quality and reliability levels required by automotive applications. As the global number one supplier, the introduction of its Q100 logic portfolio shows NXP continuing to lead the way in automotive logic. Six sigma design, zero defect test and inspection methodology Six sigma design philosophy is applied to all Q100 devices. This ensures that an end user application designed to the datasheet limits can tolerate a shift as high as one and a half sigma in NXP’s manufacturing processes. As the process control limits are much tighter than one and a half sigma, this virtually guarantees trouble free end user applications. During electrical test process, average test limits or statistical test limits are applied to screen outliers within automotive lots. Figure 1 shows the distribution of devices passing a test and the calculated statistical test limits in red. Although the outliers are within the upper and lower specification limits they are not delivered as Q100 products. LSL Display drivers Display drivers integrate serial-in, parallel-out shift registers, which are common I/O expansion devices, with a number of MOSFET LED drivers. With 8-bit and 12-bit solutions, shift register based display drivers enable a controller to drive 8 or 12 LED’s using 3 output lines. Cascading devices as shown in figure 3 increases the number of LED’s controlled by the same 3 output lines. Display drivers reduce the size, complexity, pin count and ultimately cost of any micro-controller based solution. USL Statistical test limits Key benefits of the Q100 logic portfolio AEC-Q100 product qualification and reliability monitoring Outliers Outliers Fig. 1 Application of statistical test limits Quality Summary Logic Products & MCU Q1/Q2 – 2012 Emile Busink Quality Assurance Logic Products / MCU NXP Semiconductors Building FB-3.107 Gerstweg 2 6534 AE Nijmegen The Netherlands Date: Report: September 01st, 2012 RNR-31/O2172 (rev. CT) Tel: Fax: Email: int + 31 24 353 2116 int + 31 24 353 2820 [email protected] Operating at elevated temperatures reduces the lifetime of a semiconductor and temperature cycling has a negative impact on the stability of a package. In cases where there is no history of a product’s reliability within automotive applications, a series of stresses to simulate the life cycle within an automotive environment must be applied to guarantee conformance to the AEC-Q100 standard. To ensure continued reliability, NXP logic maintains an extensive reliability monitoring program; the results of which are published half yearly. These QSUM reports are available upon request via your NXP sales representative. NXP Semiconductors B.V., Gerstweg 2, 6534 AE Nijmegen, The Netherlands Tel:+ 31 24 3539111 www.nxp.com, Commercial Register Eindhoven no. 17070621 Tightened manufacturing process controls Q100 devices are manufactured in TS16949 certified and VDA approved production facilities flagged as automotive lots subjected to additional process flow quality gates and stricter rules for lot dis-positioning and maverick lot handling Dedicated website and datasheets A summary of NXP logic’s Q100 portfolio including a search by function and a parametric search within each function can be found at www.nxp.com/products/automotive/logic, and unlike the standard types, each Q100 device has a dedicated datasheet confirming that it has been qualified in accordance with AEC-Q100 and is suitable for automotive applications. Priority technical support NXP’s first and second tier technical support teams give Q100 product design-in assistance their highest priority and upon request AEC-Q100 production part approval process (PPAP) qualification data will be made available. Due to the stricter qualification requirements of automotive end user applications, a 180 day process change notification (PCN) approval cycle is applied for Q100 products instead of the 90 day PCN approval cycle for standard types. In the unlikely event of a quality issue, NXP logic guarantees a 10 day through put time with initial verification within 24 hours for its Q100 portfolio. Examples of NXP Q100 logic automotive application areas i/o expansion Large pin count controllers are expensive, so when possible to reduce the complexity and pin-count of control solutions, input/ output expansion devices such as multiplexer/de-multiplexer devices are used. Figure 2 shows an example of an 8:1 multiplexer used to sequentially switch analog sensor signals to a single analog to digital pin of a micro-controller. This ensures that automotive products receive highest priority have greater traceability for improved quality analysis that become outlier lots, passing a quality gate but outside of the acceptable distribution, are assigned to standard, non-Q100, types. Interface logic With high impedance inputs and low impedance outputs, interface logic such as registered or unregistered buffers and line drivers are used to interface between low drive outputs of a controller and higher loads of, for example, water pumps and window motors. Control logic Control applications such as engine control units and body control modules change settings based upon a combination of input signals. Control logic consists of simple Boolean functions, such as AND or NAND, to facilitate changing settings in simple sub-systems that don’t require a micro-controller. Display Logic HEF4894B-Q100 NPIC6C595-Q100 NPIC6C596-Q100 Function 12-stage shift-and-store register LED driver power logic 8-bit shift register; open-drain power logic 8-bit shift register; open-drain Control Logic Function 74LVC1G125-Q100 bus buffer/line driver; 3-state 74LVC1G14-Q100 single Schmitt trigger inverter 74LVC1G17-Q100 single Schmitt trigger buffer Interface logic Function 74LVC1G32-Q100 single 2-input OR gate HEF4093BT-Q100 quad 2-input NAND Schmitt trigger 74LVC244A-Q100 octal buffer/line driver; 3-state HEF4094BT-Q100 8-stage shift-and-store register 74LVC245A-Q100 octal bus transceiver; 3-state 74HC(T)14-Q100 hex inverting Schmitt trigger I/O expansion Function 74HC(T)151-Q100 quad 2-input multiplexer NX3L4051-Q100 low-ohmic single-pole octal-throw analog switch 74HC(T)244-Q100 octal buffer/line driver; 3-state HEF4051B-Q100 8-channel analog multiplexer/demultiplexer 74AHC(T)14-Q100 hex inverting Schmitt trigger HEF4052B-Q100 dual 4-channel analog multiplexer/demultiplexer 74AHC(T)1G08-Q100 2-input AND gate HEF4066BT-Q100 quad single-pole single-throw analog switch 74AHC1G09-Q100 2-input AND gate with open-drain 74HC(T)138-Q100 3-to-8 line decoder/demultiplexer; inverting 74AHC(T)1G125-Q100 bus buffer/line driver; 3-state 74HC(T)165-Q100 8-bit parallel-in/serial out shift register 74AHC(T)244-Q100 bus buffer/line driver; 3-state 74HC(T)4051-Q100 8-channel analog multiplexer/demultiplexer 74AHC(T)125-Q100 quad buffer/line driver; 3-state 74HC(T)4052-Q100 dual 4-channel analog multiplexer/demultiplexer Control Logic Function 74HC(T)4053-Q100 triple 2-channel analog multiplexer/demultiplexer HEF40106B-Q100 hex inverting Schmitt trigger 74HC(T)4066-Q100 16-channel analog multiplexer/demultiplexer 74HC(T)00-Q100 quad 2-input NAND gate 74HC(T)4851-Q100 8-channel analog mux/demux; injection-current control 74HC(T)04-Q100 hex inverter 74HC(T)4852-Q100 dual 4-channel analog mux/demux; injection-current control 74HC(T)08-Q100 quad 2-input AND gate 74HC(T)595-Q100 8-bit serial-in, serial or parallel-out shift register; 3-state 74HC(T)132-Q100 quad 2-input NAND Schmitt trigger 74LVC08-Q100 quad 2-input AND gate 74HC(T)1G08-Q100 2-input AND gate 74LVC14-Q100 hex inverting Schmitt trigger with 5 V tolerant input 74LVC1G08-Q100 single 2-input AND gate