Eon EN29LV640TB-70BI 64 megabit (8m x 8-bit / 4m x 16-bit) flash memory boot sector flash memory, cmos 3.0 volt-only Datasheet

EN29LV640T/B
EN29LV640T/B
64 Megabit (8M x 8-bit / 4M x 16-bit) Flash Memory
Boot Sector Flash Memory, CMOS 3.0 Volt-only
FEATURES
• Single power supply operation
- Full voltage range: 2.7 to 3.6 volts read and
write operations
• Standard DATA# polling and toggle bits
feature
• High performance
- Access times as fast as 70 ns
• Erase Suspend / Resume modes:
Read and program another Sector during
Erase Suspend Mode
• Low power consumption (typical values at 5
MHz)
- 9 mA typical active read current
- 20 mA typical program/erase current
- Less than 1 μA current in standby or automatic
sleep mode.
• Flexible Sector Architecture:
- Eight 8-Kbyte sectors, One hundred and
twenty-seven 32K-Word / 64K-byte sectors.
- 8-Kbyte sectors for Top or Bottom boot.
- Sector/Sector Group protection:
Hardware locking of sectors to prevent
program or erase operations within individual
sectors
Additionally, temporary Sector Group
Unprotect allows code changes in previously
locked sectors.
•
-
High performance program/erase speed
Word program time: 8µs typical
Sector erase time: 500ms typical
Chip erase time: 64s typical
• JEDEC Standard compatible
• Unlock Bypass Program command supported
• Support JEDEC Common Flash Interface
(CFI).
• Low Vcc write inhibit < 2.5V
• Minimum 100K program/erase endurance
cycles.
• RESET# hardware reset pin
- Hardware method to reset the device to read
mode.
• WP#/ACC input pin
- Write Protect (WP#) function allows
protection of outermost two boot sectors,
regardless of sector protect status
- Acceleration (ACC) function provides
accelerated program times
• Package Options
- 48-pin TSOP (Type 1)
- 48 ball 6mm x 8mm FBGA
• Commercial and Industrial Temperature
Range.
GENERAL DESCRIPTION
The EN29LV640T/B is a 64-Megabit, electrically erasable, read/write non-volatile flash memory,
organized as 8,388,608 bytes or 4,194,304 words. Any word can be programmed typically in 8µs. The
EN29LV640T/B features 3.0V voltage read and write operation, with access times as fast as 70ns to
eliminate the need for WAIT states in high-performance microprocessor systems.
The EN29LV640T/B has separate Output Enable (OE#), Chip Enable (CE#), and Write Enable (WE#)
controls, which eliminate bus contention issues. This device is designed to allow either single Sector
or full Chip erase operation, where each Sector can be individually protected against program/erase
operations or temporarily unprotected to erase or program. The device can sustain a minimum of 100K
program/erase cycles on each Sector.
.
This Data Sheet may be revised by subsequent versions
1
or modifications due to changes in technical specifications.
©2004 Eon Silicon Solution, Inc., www.essi.com.tw
Rev. B, Issue Date: 2007/05/16
EN29LV640T/B
CONNECTION DIAGRAMS
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
2 ©2004 Eon Silicon Solution, Inc., www.essi.com.tw
Rev. B, Issue Date: 2007/05/16
EN29LV640T/B
LOGIC DIAGRAM
TABLE 1. PIN DESCRIPTION
Pin Name
Function
A0-A21
22 Address inputs
DQ0-DQ14
15 Data Inputs/Outputs
DQ15 / A-1
DQ15 (data input/output, in word mode),
A-1 (LSB address input, in byte mode)
CE#
Chip Enable
OE#
Output Enable
WE#
Write Enable
WP#/ACC
Write Protect / Acceleration Pin
RESET#
Hardware Reset Pin
BYTE#
Byte/Word mode selection
RY/BY#
Ready/Busy Output
Vcc
Supply Voltage
(2.7-3.6V)
Vss
Ground
NC
Not Connected to anything
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
3 ©2004 Eon Silicon Solution, Inc., www.essi.com.tw
Rev. B, Issue Date: 2007/05/16
EN29LV640T/B
ORDERING INFORMATION
EN29LV640
T―
70
T
C
P
PACKAGING CONTENT
(Blank) = Conventional
P = Pb Free
TEMPERATURE RANGE
C = Commercial (0°C to +70°C)
I = Industrial (-40°C to +85°C)
PACKAGE
T = 48-pin TSOP
B = 48-Ball Fine Pitch Ball Grid Array (FBGA)
0.80mm pitch, 6mm x 8mm package
SPEED
70 = 70ns
90 = 90ns
BOOT CODE SECTOR ARCHITECTURE
T = Top boot Sector
B = Bottom boot Sector
BASE PART NUMBER
EN = EON Silicon Solution Inc.
29LV = FLASH, 3V Read, Program and Erase
640 = 64 Megabit (8M x 8 / 4M x 16)
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
4 ©2004 Eon Silicon Solution, Inc., www.essi.com.tw
Rev. B, Issue Date: 2007/05/16
EN29LV640T/B
Table 2A. Top Boot Sector Address Tables (EN29LV640T)
U
64/32
Address Range (h)
Byte mode (x8)
000000–00FFFF
Address Range (h)
Word Mode (x16)
000000–007FFF
0000001xxx
64/32
010000–01FFFF
008000–00FFFF
SA2
0000010xxx
64/32
020000–02FFFF
010000–017FFF
SA3
0000011xxx
64/32
030000–03FFFF
018000–01FFFF
SA4
0000100xxx
64/32
040000–04FFFF
020000–027FFF
SA5
0000101xxx
64/32
050000–05FFFF
028000–02FFFF
SA6
0000110xxx
64/32
060000–06FFFF
030000–037FFF
SA7
0000111xxx
64/32
070000–07FFFF
038000–03FFFF
SA8
0001000xxx
64/32
080000–08FFFF
040000–047FFF
SA9
0001001xxx
64/32
090000–09FFFF
048000–04FFFF
SA10
0001010xxx
64/32
0A0000–0AFFFF
050000–057FFF
SA11
0001011xxx
64/32
0B0000–0BFFFF
058000–05FFFF
SA12
0001100xxx
64/32
0C0000–0CFFFF
060000–067FFF
SA13
0001101xxx
64/32
0D0000–0DFFFF
068000–06FFFF
SA14
0001110xxx
64/32
0E0000–0EFFFF
070000–077FFF
SA15
0001111xxx
64/32
0F0000–0FFFFF
078000–07FFFF
SA16
0010000xxx
64/32
100000–10FFFF
080000–087FFF
SA17
0010001xxx
64/32
110000–11FFFF
088000–08FFFF
SA18
0010010xxx
64/32
120000–12FFFF
090000–097FFF
SA19
0010011xxx
64/32
130000–13FFFF
098000–09FFFF
SA20
0010100xxx
64/32
140000–14FFFF
0A0000–0A7FFF
SA21
0010101xxx
64/32
150000–15FFFF
0A8000–0AFFFF
SA22
0010110xxx
64/32
160000–16FFFF
0B0000–0B7FFF
SA23
0010111xxx
64/32
170000–17FFFF
0B8000–0BFFFF
SA24
0011000xxx
64/32
180000–18FFFF
0C0000–0C7FFF
SA25
0011001xxx
64/32
190000–19FFFF
0C8000–0CFFFF
SA26
0011010xxx
64/32
1A0000–1AFFFF
0D0000–0D7FFF
SA27
0011011xxx
64/32
1B0000–1BFFFF
0D8000–0DFFFF
SA28
0011100xxx
64/32
1C0000–1CFFFF
0E0000–0E7FFF
SA29
0011101xxx
64/32
1D0000–1DFFFF
0E8000–0EFFFF
SA30
0011110xxx
64/32
1E0000–1EFFFF
0F0000–0F7FFF
SA31
0011111xxx
64/32
1F0000–1FFFFF
0F8000–0FFFFF
SA32
0100000xxx
64/32
200000–20FFFF
100000–107FFF
SA33
0100001xxx
64/32
210000–21FFFF
108000–10FFFF
SA34
0100010xxx
64/32
220000–22FFFF
110000–117FFF
SA35
0100011xxx
64/32
230000–23FFFF
118000–11FFFF
SA36
0100100xxx
64/32
240000–24FFFF
120000–127FFF
SA37
0100101xxx
64/32
250000–25FFFF
128000–12FFFF
Sector
A21 – A12
Sector Size
(Kbytes / Kwords)
SA0
0000000xxx
SA1
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
5 ©2004 Eon Silicon Solution, Inc., www.essi.com.tw
Rev. B, Issue Date: 2007/05/16
EN29LV640T/B
SA38
0100110xxx
64/32
260000–26FFFF
130000–137FFF
SA39
0100111xxx
64/32
270000–27FFFF
138000–13FFFF
SA40
0101000xxx
64/32
280000–28FFFF
140000–147FFF
SA41
0101001xxx
64/32
290000–29FFFF
148000–14FFFF
SA42
0101010xxx
64/32
2A0000–2AFFFF
150000–157FFF
SA43
0101011xxx
64/32
2B0000–2BFFFF
158000–15FFFF
SA44
0101100xxx
64/32
2C0000–2CFFFF
160000–167FFF
SA45
0101101xxx
64/32
2D0000–2DFFFF
168000–16FFFF
SA46
0101110xxx
64/32
2E0000–2EFFFF
170000–177FFF
SA47
0101111xxx
64/32
2F0000–2FFFFF
178000–17FFFF
SA48
0110000xxx
64/32
300000–30FFFF
180000–187FFF
SA49
0110001xxx
64/32
310000–31FFFF
188000–18FFFF
SA50
0110010xxx
64/32
320000–32FFFF
190000–197FFF
SA51
0110011xxx
64/32
330000–33FFFF
198000–19FFFF
SA52
0110100xxx
64/32
340000–34FFFF
1A0000–1A7FFF
SA53
0110101xxx
64/32
350000–35FFFF
1A8000–1AFFFF
SA54
0110110xxx
64/32
360000–36FFFF
1B0000–1B7FFF
SA55
0110111xxx
64/32
370000–37FFFF
1B8000–1BFFFF
SA56
0111000xxx
64/32
380000–38FFFF
1C0000–1C7FFF
SA57
0111001xxx
64/32
390000–39FFFF
1C8000–1CFFFF
SA58
0111010xxx
64/32
3A0000–3AFFFF
1D0000–1D7FFF
SA59
0111011xxx
64/32
3B0000–3BFFFF
1D8000–1DFFFF
SA60
0111100xxx
64/32
3C0000–3CFFFF
1E0000–1E7FFF
SA61
0111101xxx
64/32
3D0000–3DFFFF
1E8000–1EFFFF
SA62
0111110xxx
64/32
3E0000–3EFFFF
1F0000–1F7FFF
SA63
0111111xxx
64/32
3F0000–3FFFFF
1F8000–1FFFFF
SA64
1000000xxx
64/32
400000–40FFFF
200000–207FFF
SA65
1000001xxx
64/32
410000–41FFFF
208000–20FFFF
SA66
1000010xxx
64/32
420000–42FFFF
210000–217FFF
SA67
1000011xxx
64/32
430000–43FFFF
218000–21FFFF
SA68
1000100xxx
64/32
440000–44FFFF
220000–227FFF
SA69
1000101xxx
64/32
450000–45FFFF
228000–22FFFF
SA70
1000110xxx
64/32
460000–46FFFF
230000–237FFF
SA71
1000111xxx
64/32
470000–47FFFF
238000–23FFFF
SA72
1001000xxx
64/32
480000–48FFFF
240000–247FFF
SA73
1001001xxx
64/32
490000–49FFFF
248000–24FFFF
SA74
1001010xxx
64/32
4A0000–4AFFFF
250000–257FFF
SA75
1001011xxx
64/32
4B0000–4BFFFF
258000–25FFFF
SA76
1001100xxx
64/32
4C0000–4CFFFF
260000–267FFF
SA77
1001101xxx
64/32
4D0000–4DFFFF
268000–26FFFF
SA78
1001110xxx
64/32
4E0000–4EFFFF
270000–277FFF
SA79
1001111xxx
64/32
4F0000–4FFFFF
278000–27FFFF
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
6 ©2004 Eon Silicon Solution, Inc., www.essi.com.tw
Rev. B, Issue Date: 2007/05/16
EN29LV640T/B
SA80
1010000xxx
64/32
500000–50FFFF
280000–287FFF
SA81
1010001xxx
64/32
510000–51FFFF
288000–28FFFF
SA82
1010010xxx
64/32
520000–52FFFF
290000–297FFF
SA83
1010011xxx
64/32
530000–53FFFF
298000–29FFFF
SA84
1010100xxx
64/32
540000–54FFFF
2A0000–2A7FFF
SA85
1010101xxx
64/32
550000–55FFFF
2A8000–2AFFFF
SA86
1010110xxx
64/32
560000–56FFFF
2B0000–2B7FFF
SA87
1010111xxx
64/32
570000–57FFFF
2B8000–2BFFFF
SA88
1011000xxx
64/32
580000–58FFFF
2C0000–2C7FFF
SA89
1011001xxx
64/32
590000–59FFFF
2C8000–2CFFFF
SA90
1011010xxx
64/32
5A0000–5AFFFF
2D0000–2D7FFF
SA91
1011011xxx
64/32
5B0000–5BFFFF
2D8000–2DFFFF
SA92
1011100xxx
64/32
5C0000–5CFFFF
2E0000–2E7FFF
SA93
1011101xxx
64/32
5D0000–5DFFFF
2E8000–2EFFFF
SA94
1011110xxx
64/32
5E0000–5EFFFF
2F0000–2F7FFF
SA95
1011111xxx
64/32
5F0000–5FFFFF
2F8000–2FFFFF
SA96
1100000xxx
64/32
600000–60FFFF
300000–307FFF
SA97
1100001xxx
64/32
610000–61FFFF
308000–30FFFF
SA98
1100010xxx
64/32
620000–62FFFF
310000–317FFF
SA99
1100011xxx
64/32
630000–63FFFF
318000–31FFFF
SA100
1100100xxx
64/32
640000–64FFFF
320000–327FFF
SA101
1100101xxx
64/32
650000–65FFFF
328000–32FFFF
SA102
1100110xxx
64/32
660000–66FFFF
330000–337FFF
SA103
1100111xxx
64/32
670000–67FFFF
338000–33FFFF
SA104
1101000xxx
64/32
680000–68FFFF
340000–347FFF
SA105
1101001xxx
64/32
690000–69FFFF
348000–34FFFF
SA106
1101010xxx
64/32
6A0000–6AFFFF
350000–357FFF
SA107
1101011xxx
64/32
6B0000–6BFFFF
358000–35FFFF
SA108
1101100xxx
64/32
6C0000–6CFFFF
360000–367FFF
SA109
1101101xxx
64/32
6D0000–6DFFFF
368000–36FFFF
SA110
1101110xxx
64/32
6E0000–6EFFFF
370000–377FFF
SA111
1101111xxx
64/32
6F0000–6FFFFF
378000–37FFFF
SA112
1110000xxx
64/32
700000–70FFFF
380000–387FFF
SA113
1110001xxx
64/32
710000–71FFFF
388000–38FFFF
SA114
1110010xxx
64/32
720000–72FFFF
390000–397FFF
SA115
1110011xxx
64/32
730000–73FFFF
398000–39FFFF
SA116
1110100xxx
64/32
740000–74FFFF
3A0000–3A7FFF
SA117
1110101xxx
64/32
750000–75FFFF
3A8000–3AFFFF
SA118
1110110xxx
64/32
760000–76FFFF
3B0000–3B7FFF
SA119
1110111xxx
64/32
770000–77FFFF
3B8000–3BFFFF
SA120
1111000xxx
64/32
780000–78FFFF
3C0000–3C7FFF
SA121
1111001xxx
64/32
790000–79FFFF
3C8000–3CFFFF
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
7 ©2004 Eon Silicon Solution, Inc., www.essi.com.tw
Rev. B, Issue Date: 2007/05/16
EN29LV640T/B
SA122
1111010xxx
64/32
7A0000–7AFFFF
3D0000–3D7FFF
SA123
1111011xxx
64/32
7B0000–7BFFFF
3D8000–3DFFFF
SA124
1111100xxx
64/32
7C0000–7CFFFF
3E0000–3E7FFF
SA125
1111101xxx
64/32
7D0000–7DFFFF
3E8000–3EFFFF
SA126
1111110xxx
64/32
7E0000–7EFFFF
3F0000–3F7FFF
SA127
1111111000
8/4
7F0000–7F1FFF
3F8000–3F8FFF
SA128
1111111001
8/4
7F2000–7F3FFF
3F9000–3F9FFF
SA129
1111111010
8/4
7F4000–7F5FFF
3FA000–3FAFFF
SA130
1111111011
8/4
7F6000–7F7FFF
3FB000–3FBFFF
SA131
1111111100
8/4
7F8000–7F9FFF
3FC000–3FCFFF
SA132
1111111101
8/4
7FA000–7FBFFF
3FD000–3FDFFF
SA133
1111111110
8/4
7FC000–7FDFFF
3FE000–3FEFFF
SA134
1111111111
8/4
7FE000–7FFFFF
3FF000–3FFFFF
Note: The address bus is A21:A-1 in byte mode where BYTE# = V IL or A20:A0 in word mode where
BYTE# = V IH
B
B
B
B
Table 2B. Bottom Boot Sector Address Tables (EN29LV640B)
U
8/4
Address Range (h)
Byte mode (x8)
000000–001FFF
Address Range (h)
Word Mode (x16)
000000–000FFF
0000000001
8/4
002000–003FFF
001000–001FFF
SA2
0000000010
8/4
004000–005FFF
002000–002FFF
SA3
0000000011
8/4
006000–007FFF
003000–003FFF
Sector
A21 – A12
Sector Size
(Kbytes / Kwords)
SA0
0000000000
SA1
SA4
0000000100
8/4
008000–009FFF
004000–004FFF
SA5
0000000101
8/4
00A000–00BFFF
005000–005FFF
SA6
0000000110
8/4
00C000–00DFFF
006000–006FFF
SA7
0000000111
8/4
00E000–00FFFF
007000–007FFF
SA8
0000001xxx
64/32
010000–01FFFF
008000–00FFFF
SA9
0000010xxx
64/32
020000–02FFFF
010000–017FFF
SA10
0000011xxx
64/32
030000–03FFFF
018000–01FFFF
SA11
0000100xxx
64/32
040000–04FFFF
020000–027FFF
SA12
0000101xxx
64/32
050000–05FFFF
028000–02FFFF
SA13
0000110xxx
64/32
060000–06FFFF
030000–037FFF
SA14
0000111xxx
64/32
070000–07FFFF
038000–03FFFF
SA15
0001000xxx
64/32
080000–08FFFF
040000–047FFF
SA16
0001001xxx
64/32
090000–09FFFF
048000–04FFFF
SA17
0001010xxx
64/32
0A0000–0AFFFF
050000–057FFF
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
8 ©2004 Eon Silicon Solution, Inc., www.essi.com.tw
Rev. B, Issue Date: 2007/05/16
EN29LV640T/B
SA18
0001011xxx
64/32
0B0000–0BFFFF
058000–05FFFF
SA19
0001100xxx
64/32
0C0000–0CFFFF
060000–067FFF
SA20
0001101xxx
64/32
0D0000–0DFFFF
068000–06FFFF
SA21
0001110xxx
64/32
0E0000–0EFFFF
070000–077FFF
SA22
0001111xxx
64/32
0F0000–0FFFFF
078000–07FFFF
SA23
0010000xxx
64/32
100000–10FFFF
080000–087FFF
SA24
0010001xxx
64/32
110000–11FFFF
088000–08FFFF
SA25
0010010xxx
64/32
120000–12FFFF
090000–097FFF
SA26
0010011xxx
64/32
130000–13FFFF
098000–09FFFF
SA27
0010100xxx
64/32
140000–14FFFF
0A0000–0A7FFF
SA28
0010101xxx
64/32
150000–15FFFF
0A8000–0AFFFF
SA29
0010110xxx
64/32
160000–16FFFF
0B0000–0B7FFF
SA30
0010111xxx
64/32
170000–17FFFF
0B8000–0BFFFF
SA31
0011000xxx
64/32
180000–18FFFF
0C0000–0C7FFF
SA32
0011001xxx
64/32
190000–19FFFF
0C8000–0CFFFF
SA33
0011010xxx
64/32
1A0000–1AFFFF
0D0000–0D7FFF
SA34
0011011xxx
64/32
1B0000–1BFFFF
0D8000–0DFFFF
SA35
0011100xxx
64/32
1C0000–1CFFFF
0E0000–0E7FFF
SA36
0011101xxx
64/32
1D0000–1DFFFF
0E8000–0EFFFF
SA37
0011110xxx
64/32
1E0000–1EFFFF
0F0000–0F7FFF
SA38
0011111xxx
64/32
1F0000–1FFFFF
0F8000–0FFFFF
SA39
0100000xxx
64/32
200000–20FFFF
100000–107FFF
SA40
0100001xxx
64/32
210000–21FFFF
108000–10FFFF
SA41
0100010xxx
64/32
220000–22FFFF
110000–117FFF
SA42
0100011xxx
64/32
230000–23FFFF
118000–11FFFF
SA43
0100100xxx
64/32
240000–24FFFF
120000–127FFF
SA44
0100101xxx
64/32
250000–25FFFF
128000–12FFFF
SA45
0100110xxx
64/32
260000–26FFFF
130000–137FFF
SA46
0100111xxx
64/32
270000–27FFFF
138000–13FFFF
SA47
0101000xxx
64/32
280000–28FFFF
140000–147FFF
SA48
0101001xxx
64/32
290000–29FFFF
148000–14FFFF
SA49
0101010xxx
64/32
2A0000–2AFFFF
150000–157FFF
SA50
0101011xxx
64/32
2B0000–2BFFFF
158000–15FFFF
SA51
0101100xxx
64/32
2C0000–2CFFFF
160000–167FFF
SA52
0101101xxx
64/32
2D0000–2DFFFF
168000–16FFFF
SA53
0101110xxx
64/32
2E0000–2EFFFF
170000–177FFF
SA54
0101111xxx
64/32
2F0000–2FFFFF
178000–17FFFF
SA55
0110000xxx
64/32
300000–30FFFF
180000–187FFF
SA56
0110001xxx
64/32
310000–31FFFF
188000–18FFFF
SA57
0110010xxx
64/32
320000–32FFFF
190000–197FFF
SA58
0110011xxx
64/32
330000–33FFFF
198000–19FFFF
SA59
0110100xxx
64/32
340000–34FFFF
1A0000–1A7FFF
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
9 ©2004 Eon Silicon Solution, Inc., www.essi.com.tw
Rev. B, Issue Date: 2007/05/16
EN29LV640T/B
SA60
0110101xxx
64/32
350000–35FFFF
1A8000–1AFFFF
SA61
0110110xxx
64/32
360000–36FFFF
1B0000–1B7FFF
SA62
0110111xxx
64/32
370000–37FFFF
1B8000–1BFFFF
SA63
0111000xxx
64/32
380000–38FFFF
1C0000–1C7FFF
SA64
0111001xxx
64/32
390000–39FFFF
1C8000–1CFFFF
SA65
0111010xxx
64/32
3A0000–3AFFFF
1D0000–1D7FFF
SA66
0111011xxx
64/32
3B0000–3BFFFF
1D8000–1DFFFF
SA67
0111100xxx
64/32
3C0000–3CFFFF
1E0000–1E7FFF
SA68
0111101xxx
64/32
3D0000–3DFFFF
1E8000–1EFFFF
SA69
0111110xxx
64/32
3E0000–3EFFFF
1F0000–1F7FFF
SA70
0111111xxx
64/32
3F0000–3FFFFF
1F8000–1FFFFF
SA71
1000000xxx
64/32
400000–40FFFF
200000–207FFF
SA72
1000001xxx
64/32
410000–41FFFF
208000–20FFFF
SA73
1000010xxx
64/32
420000–42FFFF
210000–217FFF
SA74
1000011xxx
64/32
430000–43FFFF
218000–21FFFF
SA75
1000100xxx
64/32
440000–44FFFF
220000–227FFF
SA76
1000101xxx
64/32
450000–45FFFF
228000–22FFFF
SA77
1000110xxx
64/32
460000–46FFFF
230000–237FFF
SA78
1000111xxx
64/32
470000–47FFFF
238000–23FFFF
SA79
1001000xxx
64/32
480000–48FFFF
240000–247FFF
SA80
1001001xxx
64/32
490000–49FFFF
248000–24FFFF
SA81
1001010xxx
64/32
4A0000–4AFFFF
250000–257FFF
SA82
1001011xxx
64/32
4B0000–4BFFFF
258000–25FFFF
SA83
1001100xxx
64/32
4C0000–4CFFFF
260000–267FFF
SA84
1001101xxx
64/32
4D0000–4DFFFF
268000–26FFFF
SA85
1001110xxx
64/32
4E0000–4EFFFF
270000–277FFF
SA86
1001111xxx
64/32
4F0000–4FFFFF
278000–27FFFF
SA87
1010000xxx
64/32
500000–50FFFF
280000–287FFF
SA88
1010001xxx
64/32
510000–51FFFF
288000–28FFFF
SA89
1010010xxx
64/32
520000–52FFFF
290000–297FFF
SA90
1010011xxx
64/32
530000–53FFFF
298000–29FFFF
SA91
1010100xxx
64/32
540000–54FFFF
2A0000–2A7FFF
SA92
1010101xxx
64/32
550000–55FFFF
2A8000–2AFFFF
SA93
1010110xxx
64/32
560000–56FFFF
2B0000–2B7FFF
SA94
1010111xxx
64/32
570000–57FFFF
2B8000–2BFFFF
SA95
1011000xxx
64/32
580000–58FFFF
2C0000–2C7FFF
SA96
1011001xxx
64/32
590000–59FFFF
2C8000–2CFFFF
SA97
1011010xxx
64/32
5A0000–5AFFFF
2D0000–2D7FFF
SA98
1011011xxx
64/32
5B0000–5BFFFF
2D8000–2DFFFF
SA99
1011100xxx
64/32
5C0000–5CFFFF
2E0000–2E7FFF
SA100
1011101xxx
64/32
5D0000–5DFFFF
2E8000–2EFFFF
SA101
1011110xxx
64/32
5E0000–5EFFFF
2F0000–2F7FFF
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
10 ©2004 Eon Silicon Solution, Inc., www.essi.com.tw
Rev. B, Issue Date: 2007/05/16
EN29LV640T/B
SA102
1011111xxx
64/32
5F0000–5FFFFF
2F8000–2FFFFF
SA103
1100000xxx
64/32
600000–60FFFF
300000–307FFF
SA104
1100001xxx
64/32
610000–61FFFF
308000–30FFFF
SA105
1100010xxx
64/32
620000–62FFFF
310000–317FFF
SA106
1100011xxx
64/32
630000–63FFFF
318000–31FFFF
SA107
1100100xxx
64/32
640000–64FFFF
320000–327FFF
SA108
1100101xxx
64/32
650000–65FFFF
328000–32FFFF
SA109
1100110xxx
64/32
660000–66FFFF
330000–337FFF
SA110
1100111xxx
64/32
670000–67FFFF
338000–33FFFF
SA111
1101000xxx
64/32
680000–68FFFF
340000–347FFF
SA112
1101001xxx
64/32
690000–69FFFF
348000–34FFFF
SA113
1101010xxx
64/32
6A0000–6AFFFF
350000–357FFF
SA114
1101011xxx
64/32
6B0000–6BFFFF
358000–35FFFF
SA115
1101100xxx
64/32
6C0000–6CFFFF
360000–367FFF
SA116
1101101xxx
64/32
6D0000–6DFFFF
368000–36FFFF
SA117
1101110xxx
64/32
6E0000–6EFFFF
370000–377FFF
SA118
1101111xxx
64/32
6F0000–6FFFFF
378000–37FFFF
SA119
1110000xxx
64/32
700000–70FFFF
380000–387FFF
SA120
1110001xxx
64/32
710000–71FFFF
388000–38FFFF
SA121
1110010xxx
64/32
720000–72FFFF
390000–397FFF
SA122
1110011xxx
64/32
730000–73FFFF
398000–39FFFF
SA123
1110100xxx
64/32
740000–74FFFF
3A0000–3A7FFF
SA124
1110101xxx
64/32
750000–75FFFF
3A8000–3AFFFF
SA125
1110110xxx
64/32
760000–76FFFF
3B0000–3B7FFF
SA126
1110111xxx
64/32
770000–77FFFF
3B8000–3BFFFF
SA127
1111000xxx
64/32
780000–78FFFF
3C0000–3C7FFF
SA128
1111001xxx
64/32
790000–79FFFF
3C8000–3CFFFF
SA129
1111010xxx
64/32
7A0000–7AFFFF
3D0000–3D7FFF
SA130
1111011xxx
64/32
7B0000–7BFFFF
3D8000–3DFFFF
SA131
1111100xxx
64/32
7C0000–7CFFFF
3E0000–3E7FFF
SA132
1111101xxx
64/32
7D0000–7DFFFF
3E8000–3EFFFF
SA133
1111110xxx
64/32
7E0000–7EFFFF
3F0000–3F7FFF
SA134
1111111xxx
64/32
7F0000–7FFFFF
3F8000–3FFFFF
Note: The address bus is A21:A-1 in byte mode where BYTE# = V IL or A20:A0 in word mode where
BYTE# = V IH
B
B
B
B
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
11 ©2004 Eon Silicon Solution, Inc., www.essi.com.tw
Rev. B, Issue Date: 2007/05/16
EN29LV640T/B
PRODUCT SELECTOR GUIDE
Product Number
EN29LV640T/B
-70
-90
Max Access Time, ns (t acc )
70
90
Max CE# Access, ns (t ce )
70
90
Max OE# Access, ns (t oe )
30
35
Speed Option
B
B
B
B
B
B
BLOCK DIAGRAM
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
12 ©2004 Eon Silicon Solution, Inc., www.essi.com.tw
Rev. B, Issue Date: 2007/05/16
EN29LV640T/B
TABLE 3. OPERATING MODES
64M FLASH USER MODE TABLE
Operation
Read
Write
CE#
L
L
OE#
L
H
WE#
H
L
Accelerated
Program
L
H
L
H
X
X
H
X
High-Z
High-Z
High-Z
0.3V
H
L
X
V cc
0.3V
X
H
X
X
H
X
H
H
L
H
L/H
L/H
High-Z
High-Z
High-Z
High-Z
High-Z
High-Z
High-Z
High-Z
High-Z
Sector (Group)
Protect
L
H
L
V ID
(Note 2)
X
X
Sector
Unprotect
L
H
L
V ID
X
X
X
SA,
A6=L,
A1=H,
A0=L
SA,
A6=H,
A1=H,
A0=L
(Note 2)
X
X
Temporary
Sector
Unprotect
X
X
X
V ID
A IN
(Note 2)
(Note 2)
High-Z
V cc
B
B
CMOS Standby
TTL Standby
Output Disable
Hardware Reset
B
B
B
B
WP#/AC
C
L/H
(Note 1)
A0A21
A IN
A IN
DQ0DQ7
D OUT
D IN
V HH
A IN
D IN
DQ8-DQ15
BYTE#
BYTE#
= V IH
= V IL
D OUT
DQ8DQ14=
D IN
High-Z,
DQ15 =
D IN
A-1
RESET
#
H
H
B
B
(Note 1)
B
(Note 1)
B
B
B
B
B
L/H
B
B
B
B
B
B
B
B
B
B
B
B
B
B
B
B
B
B
B
B
B
L=logic low= V IL , H=Logic High= V IH , V ID =V HH =11
0.5V = 10.5-11.5V, X=Don’t Care (either L or H, but not
floating ), SA=Sector Addresses, D IN =Data In, D OUT =Data Out, A IN =Address In
B
B
B
B
B
B
B
B
B
B
B
B
B
Notes:
1. If WP#/ACC = V IL , the two outermost boot sectors remain protected. If WP# / ACC = V IH , the outermost boot sector
protection depends on whether they were last protected or unprotected. If WP#/ACC = V HH , all sectors will be
unprotected.
B
B
B
B
B
B
2. Please refer to “Sector/Sector Group Protection & Chip Unprotection”, Flowchart 7a and Flowchart 7b.
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
13 ©2004 Eon Silicon Solution, Inc., www.essi.com.tw
Rev. B, Issue Date: 2007/05/16
EN29LV640T/B
TABLE 4. Autoselect Codes (Using High Voltage, V ID )
B
B
64M FLASH MANUFACTURER/DEVICE ID TABLE
CE#
OE#
WE#
A21
to
A12
A11
to
A10
A9
Manufacturer ID:
Eon
L
L
H
X
X
V ID
Device ID
L
Description
2
P
P
A8
H
A6
A5
to
A2
A1
A0
DQ8
to
DQ15
X
L
X
L
L
X
1
P
B
A7
B
1Ch
P
L
Word
L
H
(top boot
sector)
Byte
L
L
H
Device ID
Word
L
L
H
(bottom boot
sector)
Byte
L
L
H
L
L
H
X
X
V ID
B
B
X
7Fh
X
L
X
L
H
X
X
V ID
X
X
L
X
L
H
SA
X
V ID
X
X
L
X
H
L
B
B
22h
B
B
X
C9h
CBh
X
CBh
01h
X
L=logic low= V IL , H=Logic High= V IH , V ID =11
Addresses
B
B
B
B
B
B
C9h
22h
X
Sector Protection
Verification
DQ7 to DQ0
(Protected)
00h
(Unprotected)
0.5V, X=Don’t Care (either L or H, but not floating!), SA=Sector
Note:
1. A8=H is recommended for Manufacturing ID check. If a manufacturing ID is read with A8=L, the chip will output a
configuration code 7Fh.
2. A9 = V ID is for HV A9 Autoselect mode only. A9 must be ≤ Vcc (CMOS logic level) for Command Autoselect Mode.
B
B
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
14 ©2004 Eon Silicon Solution, Inc., www.essi.com.tw
Rev. B, Issue Date: 2007/05/16
EN29LV640T/B
USER MODE DEFINITIONS
Word / Byte Configuration
The signal set on the BYTE# pin controls whether the device data I/O pins DQ15-DQ0 operate in the byte
or word configuration. When the BYTE# Pin is set at logic ‘1’, then the device is in word configuration,
DQ15-DQ0 are active and are controlled by CE# and OE#.
On the other hand, if the BYTE# Pin is set at logic ‘0’, then the device is in byte configuration, and only
data I/O pins DQ0-DQ7 are active and controlled by CE# and OE#. The data I/O pins DQ8-DQ14 are tristated, and the DQ15 pin is used as an input for the LSB (A-1) address function.
Standby Mode
The EN29LV640T/B has a CMOS-compatible standby mode, which reduces the current to < 1µA (typical).
It is placed in CMOS-compatible standby when the CE# pin is at V CC ± 0.5. RESET# and BYTE# pin must
also be at CMOS input levels. The device also has a TTL-compatible standby mode, which reduces the
maximum V CC current to < 1mA. It is placed in TTL-compatible standby when the CE# pin is at V IH .
When in standby modes, the outputs are in a high-impedance state independent of the OE# input.
B
B
B
B
B
B
B
Automatic Sleep Mode
The EN29LV640T/B has a automatic sleep mode, which minimizes power consumption. The devices will
enter this mode automatically when the states of address bus remain stable for tacc + 30ns. ICC4 in the DC
Characteristics table shows the current specification. With standard access times, the device will output
new data when addresses change.
Read Mode
The device is automatically set to reading array data after device power-up or hardware reset. No
commands are required to retrieve data. The device is also ready to read array data after completing an
Embedded Program or Embedded Erase algorithm
After the device accepts an Sector Erase Suspend command, the device enters the Sector Erase
Suspend mode. The system can read array data using the standard read timings, except that if it reads at
an address within erase-suspended sectors, the device outputs status data. After completing a
programming operation in the Sector Erase Suspend mode, the system may once again read array data
with the same exception. See “Sector Erase Suspend/Resume Commands” for more additional
information.
The system must issue the reset command to re-enable the device for reading array data if DQ5 goes
high or while in the autoselect mode. See the “Reset Command” for additional details.
Output Disable Mode
When the OE# pin is at a logic high level (V IH ), the output from the EN29LV640T/B is disabled. The
output pins are placed in a high impedance state.
B
B
Autoselect Identification Mode
The autoselect mode provides manufacturer and device identification, and sector protection verification,
through identifier codes output on DQ15–DQ0. This mode is primarily intended for programming
equipment to automatically match a device to be programmed with its corresponding programming
algorithm. However, the autoselect codes can also be accessed in-system through the command register.
When using programming equipment, the autoselect mode requires V ID (10.5 V to 11.5 V) on address pin
A9. Address pins A6, A1, and A0 must be as shown in Autoselect Codes table. In addition, when verifying
B
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
B
15 ©2004 Eon Silicon Solution, Inc., www.essi.com.tw
Rev. B, Issue Date: 2007/05/16
EN29LV640T/B
sector protection, the sector address must appear on the appropriate highest order address bits. Refer to
the corresponding Sector Address Tables. The “Command Definitions” table shows the remaining
address bits that are don’t-care. When all necessary bits have been set as required, the programming
equipment may then read the corresponding identifier code on DQ15–DQ0.
To access the autoselect codes in-system; the host system can issue the autoselect command via the
command register, as shown in the Command Definitions table. This method does not require V ID . See
“Command Definitions” for details on using the autoselect mode.
B
B
Writing Command Sequences
To write a command or command sequence to program data to the device or erase data, the system has
to drive WE# and CE# to V IL, and OE# to V IH .
B
B
B
For program operations, the BYTE# pin determines whether the device accepts program data in bytes or
words. An erase operation can erase one sector or the whole chip.
The system can also read the autoselect codes by entering the autoselect mode, which need the
autoselect command sequence to be written. Please refer to the “Command Definitions” for all the
available commands.
RESET#: Hardware Reset
When RESET# is driven low for t RP , all output pins are tristates. All commands written in the internal state
machine are reset to reading array data.
B
B
Please refer to timing diagram for RESET# pin in “AC Characteristics”.
Sector/Sector Group Protection & Chip Unprotection
The hardware sector group protection feature disables both program and erase operations in any sector. The
hardware chip unprotection feature re-enables both program and erase operations in previously protected
sectors. A sector group implies three or four adjacent sectors that would be protected at the same time. Please
see the following tables which show the organization of sector groups.
There are two methods to enable this hardware protection circuitry. The first one requires only that the
RESET# pin be at VID and then standard microprocessor timings can be used to enable or disable this
feature. See Flowchart 7a and 7b for the algorithm and Figure. 12 for the timings.
When doing Chip Unprotect, all the unprotected sector groups must be protected prior to any unprotect
write cycle.
The second method is for programming equipment. This method requires VID to be applied to both OE#
and A9 pins and non-standard microprocessor timings are used. This method is described in a separate
document named EN29LV640T/B Supplement, which can be obtained by contacting a representative of Eon
Silicon Solution, Inc.
U
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
16 ©2004 Eon Silicon Solution, Inc., www.essi.com.tw
Rev. B, Issue Date: 2007/05/16
EN29LV640T/B
Top Boot Sector/Sector Group Organization Table (EN29LV640T) for (Un)Protection
Sector Group
Sectors
A21-A12
Sector Group Size
SG 0
SG 1
SG 2
SG 3
SG 4
SG 5
SG 6
SG 7
SG 8
SG 9
SG10
SG11
SG12
SG13
SG14
SG15
SG16
SG17
SG18
SG19
SG20
SG21
SG22
SG23
SG24
SG25
SG26
SG27
SG28
SG29
SG30
SA 0-SA 3
SA 4-SA 7
SA 8-SA 11
SA 12-SA 15
SA 16-SA 19
SA 20-SA 23
SA 24-SA 27
SA 28-SA 31
SA 32-SA 35
SA 36-SA 39
SA 40-SA 43
SA 44-SA 47
SA 48-SA 51
SA 52-SA 55
SA 56-SA 59
SA 60-SA 63
SA 64-SA 67
SA 68-SA 71
SA 72-SA 75
SA 76-SA 79
SA 80-SA 83
SA 84-SA 87
SA 88-SA 91
SA 92-SA 95
SA 96-SA 99
SA100-SA103
SA104-SA107
SA108-SA111
SA112-SA115
SA116-SA119
SA120-SA123
64 Kbytes x 4
64 Kbytes x 4
64 Kbytes x 4
64 Kbytes x 4
64 Kbytes x 4
64 Kbytes x 4
64 Kbytes x 4
64 Kbytes x 4
64 Kbytes x 4
64 Kbytes x 4
64 Kbytes x 4
64 Kbytes x 4
64 Kbytes x 4
64 Kbytes x 4
64 Kbytes x 4
64 Kbytes x 4
64 Kbytes x 4
64 Kbytes x 4
64 Kbytes x 4
64 Kbytes x 4
64 Kbytes x 4
64 Kbytes x 4
64 Kbytes x 4
64 Kbytes x 4
64 Kbytes x 4
64 Kbytes x 4
64 Kbytes x 4
64 Kbytes x 4
64 Kbytes x 4
64 Kbytes x 4
64 Kbytes x 4
SG31
SA124-SA126
SG32
SG33
SG34
SG35
SG36
SG37
SG38
SG39
SA127
SA128
SA129
SA130
SA131
SA132
SA133
SA134
00000XXXXX
00001XXXXX
00010XXXXX
00011XXXXX
00100XXXXX
00101XXXXX
00110XXXXX
00111XXXXX
01000XXXXX
01001XXXXX
01010XXXXX
01011XXXXX
01100XXXXX
01101XXXXX
01110XXXXX
01111XXXXX
10000XXXXX
10001XXXXX
10010XXXXX
10011XXXXX
10100XXXXX
10101XXXXX
10110XXXXX
10111XXXXX
11000XXXXX
11001XXXXX
11010XXXXX
11011XXXXX
11100XXXXX
11101XXXXX
11110XXXXX
1111100XXX
1111101XXX
1111110XXX
1111111000
1111111001
1111111010
1111111011
1111111100
1111111101
1111111110
1111111111
64 Kbytes x 3
8 Kbytes
8 Kbytes
8 Kbytes
8 Kbytes
8 Kbytes
8 Kbytes
8 Kbytes
8 Kbytes
Bottom Boot Sector/Sector Group Organization Table (EN29LV640B) for (Un)Protection
Sector Group
Sectors
A21-A12
Sector Group Size
SG39
SG38
SG37
SG36
SG35
SG34
SG33
SG32
SG31
SG30
SG29
SA134-SA131
SA130-SA127
SA126-SA123
SA122-SA119
SA118-SA115
SA114-SA111
SA110-SA107
SA106-SA103
SA102-SA 99
SA 98-SA 95
SA 94-SA 91
11111XXXXX
11110XXXXX
11101XXXXX
11100XXXXX
11011XXXXX
11010XXXXX
11001XXXXX
11000XXXXX
10111XXXXX
10110XXXXX
10101XXXXX
64 Kbytes x 4
64 Kbytes x 4
64 Kbytes x 4
64 Kbytes x 4
64 Kbytes x 4
64 Kbytes x 4
64 Kbytes x 4
64 Kbytes x 4
64 Kbytes x 4
64 Kbytes x 4
64 Kbytes x 4
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
17 ©2004 Eon Silicon Solution, Inc., www.essi.com.tw
Rev. B, Issue Date: 2007/05/16
EN29LV640T/B
SG28
SG27
SG26
SG25
SG24
SG23
SG22
SG21
SG20
SG19
SG18
SG17
SG16
SG15
SG14
SG13
SG12
SG11
SG10
SG 9
SA
SA
SA
SA
SA
SA
SA
SA
SA
SA
SA
SA
SA
SA
SA
SA
SA
SA
SA
SA
90-SA
86-SA
82-SA
78-SA
74-SA
70-SA
66-SA
62-SA
58-SA
54-SA
50-SA
46-SA
42-SA
38-SA
34-SA
30-SA
26-SA
22-SA
18-SA
14-SA
87
83
79
75
71
67
63
59
55
51
47
43
39
35
31
27
23
19
15
11
SG 8
SA 10-SA
8
SG
SG
SG
SG
SG
SG
SG
SG
SA
SA
SA
SA
SA
SA
SA
SA
7
6
5
4
3
2
1
0
7
6
5
4
3
2
1
0
10100XXXXX
10011XXXXX
10010XXXXX
10001XXXXX
10000XXXXX
01111XXXXX
01110XXXXX
01101XXXXX
01100XXXXX
01011XXXXX
01010XXXXX
01001XXXXX
01000XXXXX
00111XXXXX
00110XXXXX
00101XXXXX
00100XXXXX
00011XXXXX
00010XXXXX
00001XXXXX
0000011XXX
0000010XXX
0000001XXX
0000000111
0000000110
0000000101
0000000100
0000000011
0000000010
0000000001
0000000000
64 Kbytes x 4
64 Kbytes x 4
64 Kbytes x 4
64 Kbytes x 4
64 Kbytes x 3
64 Kbytes x 4
64 Kbytes x 4
64 Kbytes x 4
64 Kbytes x 4
64 Kbytes x 4
64 Kbytes x 4
64 Kbytes x 4
64 Kbytes x 4
64 Kbytes x 4
64 Kbytes x 4
64 Kbytes x 4
64 Kbytes x 4
64 Kbytes x 4
64 Kbytes x 4
64 Kbytes x 4
64 Kbytes x 3
8 Kbytes
8 Kbytes
8 Kbytes
8 Kbytes
8 Kbytes
8 Kbytes
8 Kbytes
8 Kbytes
Write Protect / Accelerated Program (WP# / ACC)
The WP#/ACC pin provides two functions. The Write Protect (WP#) function provides a hardware method
of protecting the outermost two 8K-byte Boot Sector. The ACC function allows faster manufacturing
throughput at the factory, using an external high voltage.
When WP#/ACC is Low, the device protects the outermost tw 8K-byte Boot Sector; no matter the sectors
are protected or unprotected using the method described in “Sector/Sector Group Protection & Chip
Unprotection”, Program and Erase operations in these sectors are ignored.
When WP#/ACC is High, the device reverts to the previous protection status of the outermost two 8K-byte
boot sector. Program and Erase operations can now modify the data in the two outermost 8K-byte Boot
Sector unless the sector is protected using Sector Protection.
When WP#/ACC is raised to VHH the memory automatically enters the Unlock Bypass mode(please refer
to “Command Definitions”), temporarily unprotects every protected sectors, and reduces the time required
for program operation. The system would use a two-cycle program command sequence as required by
the Unlock Bypass mode. When WP#/ACC returns to VIH or VIL, normal operation resumes. The
transitions from VIH or VIL to VHH and from VHH to VIH or VIL must be slower than tBVHHB, see Figure 11.
Note that the WP#/ACC pin must not be left floating or unconnected. In addition, WP#/ACC pin must not
be at VHH for operations other than accelerated programming. It could cause the device to be damaged.
Never raise this pin to VHH from any mode except Read mode, otherwise the memory may be left in an
indeterminate state.
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
18 ©2004 Eon Silicon Solution, Inc., www.essi.com.tw
Rev. B, Issue Date: 2007/05/16
EN29LV640T/B
A 0.1µF capacitor should be connected between the WP#/ACC pin and the VSS Ground pin to decouple
the current surges from the power supply. The PCB track widths must be sufficient to carry the currents
required during Unlock Bypass Program.
Temporary Sector Unprotect
Start
This feature allows temporary unprotection of previously protected
sector groups to change data while in-system. The Temporary
Sector Unprotect mode is activated by setting the RESET# pin to
VBIDB. During this mode, formerly protected sectors can be
programmed or erased by simply selecting the sector addresses.
Once VBIDB is removed from the RESET# pin, all the previously
protected sectors are protected again.
See accompanying
flowchart and figure 10 for more timing details.
Reset#=VID (note 1)
B
B
B
Perform Erase or Program
Operations
RESET#=VIH
B
B
Temporary Sector Unprotect
Completed (note 2)
Notes:
1. All protected sectors are unprotected. (If
WP#/ACC=VIL, outermost boot sectors will remain
protected.)
2. Previously protected sectors are protected again.
B
B
B
B
COMMON FLASH INTERFACE (CFI)
The common flash interface (CFI) specification outlines device and host systems software
interrogation handshake, which allows specific vendor-specified software algorithms to be used for
entire families of devices. Software support can then be device-independent, JEDEC IDindependent, and forward- and backward-compatible for the specified flash device families. Flash
vendors can standardize their existing interfaces for long-term compatibility.
This device enters the CFI Query mode when the system writes the CFI Query command, 98h, to
address 55h in word mode (or address AAh in byte mode), any time the device is ready to read
array data.
The system can read CFI information at the addresses given in Tables 5-8.In word mode, the upper
address bits (A7–MSB) must be all zeros. To terminate reading CFI data, the system must write the
reset command.
The system can also write the CFI query command when the device is in the autoselect mode. The
device enters the CFI query mode and the system can read CFI data at the addresses given in
Tables 5–8. The system must write the reset command to return the device to the autoselect mode.
Table 5. CFI Query Identification String
Addresses
(Word Mode)
10h
11h
12h
13h
14h
15h
16h
17h
18h
19h
1Ah
Adresses
(Byte Mode)
20h
22h
24h
26h
28h
2Ah
2Ch
2Eh
30h
32h
34h
Data
0051h
0052h
0059h
0002h
0000h
0040h
0000h
0000h
0000h
0000h
0000h
Description
Query Unique ASCII string “QRY”
Primary OEM Command Set
Address for Primary Extended Table
Alternate OEM Command set (00h = none exists)
Address for Alternate OEM Extended Table (00h = none exists)
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
19 ©2004 Eon Silicon Solution, Inc., www.essi.com.tw
Rev. B, Issue Date: 2007/05/16
EN29LV640T/B
Table 6. System Interface String
Addresses
(Word Mode)
Addresses
(Byte Mode)
1Bh
36h
1Ch
38h
1Dh
1Eh
1Fh
3Ah
3Ch
3Eh
20h
40h
21h
22h
23h
24h
25h
42h
44h
46h
48h
4Ah
26h
4Ch
Data
0027h
0036h
0000h
0000h
0004h
0000h
000Ah
0000h
0005h
0000h
0004h
0000h
Description
Vcc Min (write/erase)
DQ7-DQ4: volt, DQ3 –DQ0: 100 millivolt
Vcc Max (write/erase)
DQ7-DQ4: volt, DQ3 –DQ0: 100 millivolt
Vpp Min. voltage (00h = no Vpp pin present)
Vpp Max. voltage (00h = no Vpp pin present)
Typical timeout per single byte/word write 2 N S
Typical timeout for Min, size buffer write 2 N S (00h = not
supported)
Typical timeout per individual block erase 2 N ms
Typical timeout for full chip erase 2 N ms (00h = not supported)
Max. timeout for byte/word write 2 N times typical
Max. timeout for buffer write 2 N times typical
Max. timeout per individual block erase 2 N times typical
Max timeout for full chip erase 2 N times typical (00h = not
supported)
P
P
P
P
P
P
P
P
P
P
P
P
P
P
P
P
Table 7. Device Geometry Definition
Addresses
(Word mode)
27h
28h
29h
2Ah
2Bh
2Ch
2Dh
2Eh
2Fh
30h
31h
32h
33h
34h
35h
36h
37h
38h
39h
3Ah
3Bh
3Ch
Addresses
(Byte Mode)
4Eh
50h
52h
54h
56h
58h
5Ah
5Ch
5Eh
60h
62h
64h
66h
68h
6Ah
6Ch
6Eh
70h
72h
74h
76h
78h
Data
0017h
0002h
0000h
0000h
0000h
0002h
0007h
0000h
0020h
0000h
007Eh
0000h
0000h
0001h
0000h
0000h
0000h
0000h
0000h
0000h
0000h
0000h
Description
Device Size = 2 N bytes
P
P
Flash Device Interface description (refer to CFI publication 100)
Max. number of byte in multi-byte write = 2 N
(00h = not supported)
Number of Erase Block Regions within device
P
P
Erase Block Region 1 Information
(refer to the CFI specification of CFI publication 100)
Erase Block Region 2 Information
Erase Block Region 3 Information
Erase Block Region 4 Information
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
20
©2004 Eon Silicon Solution, Inc., www.essi.com.tw
Rev. B, Issue Date: 2007/05/16
EN29LV640T/B
Table 8. Primary Vendor-specific Extended Query
Addresses
(Word Mode)
40h
41h
42h
43h
44h
Addresses
(Byte Mode)
80h
82h
84h
86h
88h
Data
0050h
0052h
0049h
0031h
0031h
45h
8Ah
0000h
46h
8Ch
0002h
47h
8Eh
0004h
48h
90h
0001h
49h
92h
0004h
4Ah
94h
0000h
4Bh
96h
0000h
4Ch
98h
0000h
4Dh
9Ah
00A5h
4Eh
9Ch
00B5h
4Fh
9Eh
0002h/
0003h
Description
Query-unique ASCII string “PRI”
Major version number, ASCII
Minor version number, ASCII
Address Sensitive Unlock
0 = Required, 1 = Not Required
Erase Suspend
0 = Not Supported, 1 = To Read Only, 2 = To Read & Write
Sector Protect
0 = Not Supported, X = Number of sectors in per group
Sector Temporary Unprotect
00 = Not Supported, 01 = Supported
Sector Protect/Unprotect scheme
01 = 29F040 mode, 02 = 29F016 mode,
03 = 29F400 mode, 04 = 29LV800A mode
Simultaneous Operation
00 = Not Supported, 01 = Supported
Burst Mode Type
00 = Not Supported, 01 = Supported
Page Mode Type
00 = Not Supported, 01 = 4 Word Page, 02 = 8 Word Page
Minimum ACC (Acceleration) Supply Voltage
00 = Not Supported, DQ7-DQ4 : Volts, DQ3-DQ0 : 100mV
Maximum ACC (Acceleration) Supply Voltage
00 = Not Supported, DQ7-DQ4 : Volts, DQ3-DQ0 : 100mV
Top/Bottom Boot Sector Identifier
02h = Bottom Boot, 03h = Top Boot
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
21
©2004 Eon Silicon Solution, Inc., www.essi.com.tw
Rev. B, Issue Date: 2007/05/16
EN29LV640T/B
Hardware Data protection
The command sequence requirement of unlock cycles for programming or erasing provides data
protection against inadvertent writes as seen in the Command Definitions table. Additionally, the
following hardware data protection measures prevent accidental erasure or programming, which
might otherwise be caused by false system level signals during Vcc power up and power down
transitions, or from system noise.
Low V CC Write Inhibit
B
B
When Vcc is less than V LKO , the device does not accept any write cycles. This protects data during
Vcc power up and power down. The command register and all internal program/erase circuits are
disabled, and the device resets. Subsequent writes are ignored until Vcc is greater than V LKO . The
system must provide the proper signals to the control pins to prevent unintentional writes when Vcc
is greater than V LKO .
B
B
B
B
B
B
Write Pulse “Glitch” protection
Noise pulses of less than 5 ns (typical) on OE#, CE# or WE# do not initiate a write cycle.
Logical Inhibit
Write cycles are inhibited by holding any one of OE# = V IL , CE# = V IH , or WE# = V IH . To initiate a
write cycle, CE# and WE# must be a logical zero while OE# is a logical one. If CE#, WE#, and OE#
are all logical zero (not recommended usage), it will be considered a read.
B
B
B
B
B
B
Power-up Write Inhibit
During power-up, the device automatically resets to READ mode and locks out write cycles. Even
with CE# = V IL , WE#= V IL and OE# = V IH , the device will not accept commands on the rising edge of
WE#.
B
B
B
B
B
B
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
22
©2004 Eon Silicon Solution, Inc., www.essi.com.tw
Rev. B, Issue Date: 2007/05/16
EN29LV640T/B
COMMAND DEFINITIONS
The operations of the device are selected by one or more commands written into the command
register. Commands are made up of data sequences written at specific addresses via the
command register. The sequences for the specified operation are defined in the Command
Definitions table (Table 9). Incorrect addresses, incorrect data values or improper sequences will
reset the device to Read Mode.
Command
Sequence
Cycles
Table 9. EN29LV640T/B Command Definitions
Bus Cycles
1
st
Cycle
Addr Data
P
P
Read
1
RA
RD
Reset
1
xxx
F0
Word
Manufacturer ID
555
4
Autoselect
Byte
Device ID
Top Boot
Word
Device ID
Bottom Boot
Word
Sector Protect
Verify
Program
Byte
4
AAA
555
2AA
AA
AA
555
2AA
90
555
55
55
AAA
555
Word
555
2AA
555
4
Byte
Word
Byte
4
AA
6
6
AAA
A0
XXX
90
AAA
555
AAA
AA
AA
Sector Erase Suspend
1
xxx
B0
Sector Erase Resume
1
xxx
30
Word
Byte
1
55
AA
55
555
PD
XXX
00
555
2AA
555
555
th
Cycle
Addr Data
P
P
000
100
000
200
x01
7F
1C
7F
1C
22C9
x02
C9
x01
22CB
x02
CB
90
(SA)
X02
(SA)
X04
A0
PA
5
th
th
Addr
2AA
555
P
P
P
Cycle
Data
00
01
00
01
PD
55
55
AAA
555
AAA
555
AAA
20
80
80
555
AAA
555
AAA
AA
AA
555
2AA
555
55
55
98
Address and Data values indicated are in hex. Unless specified, all bus cycles are write cycles
RA = Read Address: address of the memory location to be read. This is a read cycle.
RD = Read Data: data read from location RA during Read operation. This is a read cycle.
PA = Program Address: address of the memory location to be programmed. X = Don’t-Care
PD = Program Data: data to be programmed at location PA
SA = Sector Address: address of the Sector to be erased or verified. Address bits A20-A12 uniquely select any Sector.
Notes:
1. The data is 00H for an unprotected sector/sector block and 01H for a protected sector/sector block.
2. The data is 88H for factory locked and 08H for not factory locked.
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
6
Cycle
Addr Data
P
555
55
PA
2AA
90
4
AAA
2AA
AA
XXX
555
2AA
90
AAA
555
555
3
2
Byte
Word
Byte
555
55
555
AAA
2
Word
AA
AAA
P
AAA
AAA
Unlock Bypass Reset
CFI Query
55
555
Unlock Bypass Program
Sector Erase
555
AAA
Word
Chip Erase
2AA
P
Byte
Byte
Unlock Bypass
Cycle
Addr
Data
P
555
555
3
rd
Cycle
Addr Data
P
AA
AAA
4
2
nd
23
©2004 Eon Silicon Solution, Inc., www.essi.com.tw
Rev. B, Issue Date: 2007/05/16
AAA
SA
10
30
EN29LV640T/B
Reading Array Data
The device is automatically set to reading array data after power up. No commands are required to
retrieve data. The device is also ready to read array data after completing an Embedded Program
or Embedded Erase algorithm.
Following a Sector Erase Suspend command, Sector Erase Suspend mode is entered. The system
can read array data using the standard read timings from sectors other than the one which is being
erase-suspended. If the system reads at an address within erase-suspended sectors, the device
outputs status data. After completing a programming operation in the Sector Erase Suspend mode,
the system may once again read array data with the same exception.
The Reset command must be issued to re-enable the device for reading array data if DQ5 goes high
during an active program or erase operation or while in the autoselect mode. See next section for
details on Reset.
Reset Command
Writing the reset command to the device resets the device to reading array data. Address bits are
don’t-care for this command.
The reset command may be written between the cycle sequences in an erase command sequence
before erasing begins. This resets the device to reading array data. Once erasure begins, however,
the device ignores reset commands until the operation is complete. The reset command may be
written between the sequence cycles in a program command sequence before programming begins.
This resets the device to reading array data (also applies to programming in Sector Erase Suspend
mode). Once programming begins, however, the device ignores reset commands until the operation
is complete.
The reset command may be written between the cycle sequences in an autoselect command
sequence. Once in the autoselect mode, the reset command must be written to return to reading
array data.
If DQ5 goes high during a program or erase operation, writing the reset command returns the device
to reading array data (also applies in Sector Erase Suspend mode).
Autoselect Command Sequence
The autoselect command sequence allows the host system to access the manufacturer and devices
ID codes, and determine whether or not a sector (group) is protected. The Command Definitions
table shows the address and data requirements. This is an alternative to the method that requires
V ID on address bit A9 and is intended for commercial programmers.
B
B
Two unlock cycles followed by the autoselect command initiate the autoselect command sequence.
Autoselect mode is then entered and the system may read at addresses shown in Table 9 any
number of times, without needing another command sequence.
The system must write the reset command to exit the autoselect mode and return to reading array
data.
Word / Byte Programming Command
The device can be programmed by byte or by word, depending on the state of the BYTE# Pin.
Programming the EN29LV640T/B is performed by using a four-bus-cycle operation (two unlock write
cycles followed by the Program Setup command and Program Data Write cycle). When the program
command is executed, no additional CPU controls or timings are necessary. An internal timer
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
24
©2004 Eon Silicon Solution, Inc., www.essi.com.tw
Rev. B, Issue Date: 2007/05/16
EN29LV640T/B
terminates the program operation automatically. Address is latched on the falling edge of CE# or
WE#, whichever is last; data is latched on the rising edge of CE# or WE#, whichever is first.
Any commands written to the device during the program operation are ignored. Programming status
can be checked by sampling data on DQ7 (DATA# polling) or on DQ6 (toggle bit). When the
program operation is successfully completed, the device returns to read mode and the user can read
the data programmed to the device at that address. Note that data can not be programmed from a
“0” to a “1”. Attempting to do so may halt the operation and set DQ5 to “1”, or cause the Data#
Polling algorithm to indicate the operation was successful. However, a succeeding read will show
that the data is still “0”. Only erase operations can convert a “0” to a “1”. When programming time
limit is exceeded, DQ5 will produce a logical “1” and a Reset command can return the device to
Read mode.
Programming is allowed in any sequence across sector boundaries.
Unlock Bypass
To speed up programming operation, the Unlock Bypass Command may be used. Once this feature
is activated, the shorter two-cycle Unlock Bypass Program command can be used instead of the
normal four-cycle Program Command to program the device. During the unlock bypass mode, only
the Unlock Bypass Program and Unlock Bypass Reset command can be accepted. This mode is
exited after issuing the Unlock Bypass Reset Command. The device powers up with this feature
disabled
The device provides accelerated program operations through the WP#/ACC pin. When WP#/ACC is
asserted to V HH , the device automatically enters the Unlock Bypass mode. The system may then
write the two-cycle Unlock Bypass Program command sequence.
B
B
Chip Erase Command
Chip erase is a six-bus-cycle operation. The chip erase command sequence is initiated by writing
two unlock cycles, followed by a set-up command. Two additional unlock write cycles are then
followed by the chip erase command, which in turn invokes the Embedded Erase algorithm. The
device does not require the system to preprogram prior to erase. The Embedded Erase algorithm
automatically preprograms and verifies the entire memory for an all zero data pattern prior to
electrical erase. The system is not required to provide any controls or timings during these
operations. The Command Definitions table shows the address and data requirements for the chip
erase command sequence.
Any commands written to the chip during the Embedded Chip Erase algorithm are ignored.
The system can determine the status of the erase operation by using DQ7, DQ6, or DQ2. See “Write
Operation Status” for information on these status bits. When the Embedded Erase algorithm is
complete, the device returns to reading array data and addresses are no longer latched.
Sector Erase Command Sequence
Sector erase is a six bus cycle operation. The sector erase command sequence is initiated by
writing two un-lock cycles, followed by a set-up command. Two additional unlock write cycles are
then followed by the address of the sector to be erased, and the sector erase command. The
Command Definitions table shows the address and data requirements for the sector erase
command sequence.
Once the sector erase operation has begun, only the Sector Erase Suspend command is valid. All
other commands are ignored. If there are several sectors to be erased, Sector Erase Command
sequences must be issued for each sector. That is, only a sector address can be specified for
each Sector Erase command. Users must issue another Sector Erase command for the next
sector to be erased after the previous one is completed.
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
25
©2004 Eon Silicon Solution, Inc., www.essi.com.tw
Rev. B, Issue Date: 2007/05/16
EN29LV640T/B
When the Embedded Erase algorithm is completed, the device returns to reading array data and
addresses are no longer latched. The system can determine the status of the erase operation by
using DQ7, DQ6, or DQ2. Refer to “Write Operation Status” for information on these status bits.
Flowchart 4 illustrates the algorithm for the erase operation. Refer to the Erase/Program Operations
tables in the “AC Characteristics” section for parameters, and to the Sector Erase Operations Timing
diagram for timing waveforms.
Sector Erase Suspend / Resume Command
The Sector Erase Suspend command allows the system to interrupt a sector erase operation and
then read data from, or program data to, any sector not selected for erasure. This command is valid
only during the sector erase operation. The Sector Erase Suspend command is ignored if written
during the chip erase operation or Embedded Program algorithm. Addresses are don’t-cares when
writing the Sector Erase Suspend command.
When the Sector Erase Suspend command is written during a sector erase operation, the device
requires a maximum of 20 µs to suspend the erase operation.
After the erase operation has been suspended, the system can read array data from or program
data to any sector not selected for erasure. Normal read and write timings and command definitions
apply. Please note that Autoselect command sequence can not be accepted during Sector
Erase Suspend.
Reading at any address within erase-suspended sectors produces status data on DQ7–DQ0. The
system can use DQ7, or DQ6 and DQ2 together, to determine if a sector is actively erasing or is
erase-suspended. See “Write Operation Status” for information on these status bits.
After an erase-suspended program operation is complete, the system can once again read array
data within non-suspended sectors. The system can determine the status of the program operation
using the DQ7 or DQ6 status bits, just as in the standard program operation. See “Write Operation
Status” for more information. The Autoselect command is not supported during Sector Erase
Suspend Mode.
The system must write the Sector Erase Resume command (address bits are don’t-care) to exit the
sector erase suspend mode and continue the sector erase operation. Further writes of the Resume
command are ignored. Another Sector Erase Suspend command can be written after the device has
resumed erasing.
WRITE OPERATION STATUS
DQ7: DATA# Polling
The EN29LV640T/B provides DATA# polling on DQ7 to indicate the status of the embedded
operations. The DATA# Polling feature is active during the Word/Byte Programming, Sector Erase,
Chip Erase, and Sector Erase Suspend. (See Table 10)
When the embedded programming is in progress, an attempt to read the device will produce the
complement of the data written to DQ7. Upon the completion of the programming operation, an
attempt to read the device will produce the true data written to DQ7. DATA# polling is valid after the
rising edge of the fourth WE# or CE# pulse in the four-cycle sequence for program.
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
26
©2004 Eon Silicon Solution, Inc., www.essi.com.tw
Rev. B, Issue Date: 2007/05/16
EN29LV640T/B
When the embedded Erase is in progress, an attempt to read the device will produce a “0” at the
DQ7 output. Upon the completion of the embedded Erase, the device will produce the “1” at the DQ7
output during the read cycles. For Chip Erase or Sector Erase, DATA# polling is valid after the rising
edge of the last WE# or CE# pulse in the six-cycle sequence.
DATA# Polling must be performed at any address within a sector that is being programmed or
erased and not a protected sector. Otherwise, DATA# polling may give an inaccurate result if the
address used is in a protected sector.
Just prior to the completion of the embedded operations, DQ7 may change asynchronously when
the output enable (OE#) is low. This means that the device is driving status information on DQ7 at
one instant of time and valid data at the next instant of time. Depending on the time the system
samples the DQ7 output, it may read the status of valid data. Even if the device has completed the
embedded operation and DQ7 has a valid data, the data output on DQ0-DQ6 may be still invalid.
The valid data on DQ0-DQ7 should be read on the subsequent read attempts.
The flowchart for DATA# Polling (DQ7) is shown on Flowchart 5. The DATA# Polling (DQ7) timing
diagram is shown in Figure 6.
RY/BY#: Ready/Busy Status output
The RY/BY# is a dedicated, open-drain output pin that indicates whether an Embedded Algorithm is
in progress or completed. The RY/BY# status is valid after the rising edge of the final WE# pulse in
the command sequence. Since RY/BY# is an open-drain output, several RY/BY# pins can be tied
together in parallel with a pull-up resistor to Vcc.
In the output-low period, signifying Busy, the device is actively erasing or programming. This
includes programming in the Erase Suspend mode. If the output is high, signifying the Ready, the
device is ready to read array data (including during the Erase Suspend mode), or is in the standby
mode.
DQ6: Toggle Bit I
The EN29LV640T/B provides a “Toggle Bit” on DQ6 to indicate the status of the embedded
programming and erase operations. (See Table 10)
During an embedded Program or Erase operation, successive attempts to read data from the device
at any address (by active OE# or CE#) will result in DQ6 toggling between “zero” and “one”. Once
the embedded Program or Erase operation is completed, DQ6 will stop toggling and valid data will
be read on the next successive attempts. During Programming, the Toggle Bit is valid after the rising
edge of the fourth WE# pulse in the four-cycle sequence. During Erase operation, the Toggle Bit is
valid after the rising edge of the sixth WE# pulse for sector erase or chip erase.
In embedded programming, if the sector being written to is protected, DQ6 will toggles for about 2 μs,
then stop toggling without the data in the sector having changed. In Sector Erase or Chip Erase, if all
selected sectors are protected, DQ6 will toggle for about 100 μs. The chip will then return to the read
mode without changing data in all protected sectors.
The flowchart for the Toggle Bit (DQ6) is shown in Flowchart 6. The Toggle Bit timing diagram is
shown in Figure 7.
DQ5: Exceeded Timing Limits
DQ5 indicates whether the program or erase time has exceeded a specified internal pulse count
limit. Under these conditions DQ5 produces a “1.” This is a failure condition that indicates the
program or erase cycle was not successfully completed. Since it is possible that DQ5 can become a
1 when the device has successfully completed its operation and has returned to read mode, the user
must check again to see if the DQ6 is toggling after detecting a “1” on DQ5.
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
27
©2004 Eon Silicon Solution, Inc., www.essi.com.tw
Rev. B, Issue Date: 2007/05/16
EN29LV640T/B
The DQ5 failure condition may appear if the system tries to program a “1” to a location that is
previously programmed to “0.” Only an erase operation can change a “0” back to a “1.” Under
this condition, the device halts the operation, and when the operation has exceeded the timing limits,
DQ5 produces a “1.” Under both these conditions, the system must issue the reset command to
return the device to reading array data.
DQ3: Sector Erase Timer
After writing a sector erase command sequence, the output on DQ3 can be checked to determine
whether or not an erase operation has begun. (The sector erase timer does not apply to the chip
erase command.) When sector erase starts, DQ3 switches from “0” to “1”. This device does not
support multiple sector erase (continuous sector erase) command sequences so it is not very
meaningful since it immediately shows as a “1” after the first 30h command. Future devices may
support this feature.
DQ2: Erase Toggle Bit II
The “Toggle Bit” on DQ2, when used with DQ6, indicates whether a particular sector is actively
erasing (that is, the Embedded Erase algorithm is in progress), or whether that sector is erasesuspended. Toggle Bit II is valid after the rising edge of the final WE# pulse in the command
sequence. DQ2 toggles when the system reads at addresses within those sectors that have been
selected for erasure. (The system may use either OE# or CE# to control the read cycles.) But DQ2
cannot distinguish whether the sector is actively erasing or is erase-suspended. DQ6, by
comparison, indicates whether the device is actively erasing, or is in Erase Suspend, but cannot
distinguish which sectors are selected for erasure. Thus, both status bits are required for sector and
mode information. Refer to the following table to compare outputs for DQ2 and DQ6.
Flowchart 6 shows the toggle bit algorithm, and the section “DQ2: Toggle Bit” explains the algorithm.
See also the “DQ6: Toggle Bit I” subsection. Refer to the Toggle Bit Timings figure for the toggle bit
timing diagram. The DQ2 vs. DQ6 figure shows the differences between DQ2 and DQ6 in graphical
form.
Reading Toggle Bits DQ6/DQ2
Refer to Flowchart 6 for the following discussion. Whenever the system initially begins reading
toggle bit status, it must read DQ7–DQ0 at least twice in a row to determine whether a toggle bit is
toggling. Typically, a system would note and store the value of the toggle bit after the first read. After
the second read, the system would compare the new value of the toggle bit with the first. If the
toggle bit is not toggling, the device has completed the program or erase operation. The system can
read array data on DQ7–DQ0 on the following read cycle.
However, after the initial two read cycles, the system determines that the toggle bit is still toggling.
And the system also should note whether the value of DQ5 is high (see the section on DQ5). If it is,
the system should then determine again whether the toggle bit is toggling, since the toggle bit may
have stopped toggling just as DQ5 went high. If the toggle bit is no longer toggling, the device has
successfully completed the program or erase operation. If it is still toggling, the device did not
complete the operation successfully, and the system must write the reset command to return to
reading array data.
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
28
©2004 Eon Silicon Solution, Inc., www.essi.com.tw
Rev. B, Issue Date: 2007/05/16
EN29LV640T/B
Write Operation Status
Operation
Standard
Mode
Erase
Suspend
Mode
DQ7
DQ6
DQ5
DQ3
DQ2
RY/BY#
Embedded Program
Algorithm
DQ7#
Toggle
0
N/A
No
toggle
0
Embedded Erase Algorithm
0
Toggle
0
1
Toggle
0
1
No
Toggle
0
N/A
Toggle
1
Data
Data
Data
Data
Data
1
DQ7#
Toggle
0
N/A
N/A
0
Reading within Erase
Suspended Sector
Reading within Non-Erase
Suspended Sector
Erase-Suspend Program
Table 10. Status Register Bits
DQ
Name
Logic Level
‘1’
7
DATA#
POLLING
‘0’
DQ7
DQ7#
‘-1-0-1-0-1-0-1-’
6
TOGGLE BIT
DQ6
‘-1-1-1-1-1-1-1-‘
5
ERROR BIT
3
SECTOR
ERASE TIME
BIT
2
TOGGLE BIT
Definition
Erase Complete or erased sector in Sector Erase
Suspend
Erase On-Going
Program Complete or data of non-erased sector
during Sector Erase Suspend
Program On-Going
Erase or Program On-going
Read during Sector Erase Suspend
Erase Complete
‘1’
Program or Erase Error
‘0’
Program or Erase On-going
‘1’
Erase operation start
‘0’
Erase timeout period on-going
‘-1-0-1-0-1-0-1-’
DQ2
Chip Erase, Sector Erase or Read within EraseSuspended sector. (When DQ5=1, Erase Error due
to currently addressed Sector or Program on
Erase-Suspended sector
Read on addresses of non Erase-Suspend sectors
Notes:
DQ7: DATA# Polling: indicates the P/E status check during Program or Erase, and on completion before checking bits DQ5
for Program or Erase Success.
DQ6: Toggle Bit: remains at constant level when P/E operations are complete or erase suspend is acknowledged.
Successive reads output complementary data on DQ6 while programming or Erase operation are on-going.
DQ5: Error Bit: set to “1” if failure in programming or erase
DQ3: Sector Erase Command Timeout Bit: Operation has started. Only possible command is Erase suspend (ES).
DQ2: Toggle Bit: indicates the Erase status and allows identification of the erased Sector.
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
29
©2004 Eon Silicon Solution, Inc., www.essi.com.tw
Rev. B, Issue Date: 2007/05/16
EN29LV640T/B
EMBEDDED ALGORITHMS
Flowchart 1. Embedded Program
START
Write Program
Command Sequence
(shown below)
Data# Poll Device
Verify Data?
Increment
Address
Last
No
Address?
Yes
Programming Done
Flowchart 2. Embedded Program Command Sequence
(See the Command Definitions section for more information.)
555H / AAH
2AAH / 55H
555H / A0H
PROGRAM ADDRESS / PROGRAM DATA
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
30
©2004 Eon Silicon Solution, Inc., www.essi.com.tw
Rev. B, Issue Date: 2007/05/16
EN29LV640T/B
Flowchart 3. Embedded Erase
START
Write Erase
Command Sequence
Data Poll from
System or Toggle Bit
successfully
completed
Data =FFh?
No
Yes
Erase Done
Flowchart 4. Embedded Erase Command Sequence
(See the Command Definitions section for more information.)
Chip Erase
Sector Erase
555H/AAH
555H/AAH
2AAH/55H
2AAH/55H
555H/80H
555H/80H
555H/AAH
555H/AAH
2AAH/55H
2AAH/55H
555H/10H
Sector Address/30H
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
31
©2004 Eon Silicon Solution, Inc., www.essi.com.tw
Rev. B, Issue Date: 2007/05/16
EN29LV640T/B
Flowchart 5. DATA# Polling
Algorithm
Start
Read Data
DQ7 = Data?
Yes
No
No
DQ5 = 1?
Yes
Read Data (1)
Notes:
(1) This second read is necessary in case the
first read was done at the exact instant when
the status data was in transition.
Yes
DQ7 = Data?
No
Fail
Pass
Start
Flowchart 6. Toggle Bit Algorithm
Read Data twice
No
DQ6 = Toggle?
Yes
No
DQ5 = 1?
Yes
Read Data twice (2)
Notes:
(2) This second set of reads is necessary in
case the first set of reads was done at the
exact instant when the status data was in
transition.
No
DQ6 = Toggle?
Yes
Fail
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
32
Pass
©2004 Eon Silicon Solution, Inc., www.essi.com.tw
Rev. B, Issue Date: 2007/05/16
EN29LV640T/B
Flowchart 7a. In-System Sector (Group) Protect Flowchart
START
PLSCNT = 1
RESET# = VID
Wait 1 μs
No
First Write
Cycle =
60h?
Temporary Chip
Unprotect Mode
Yes
Set up sector
(group) address
To Protect: Write 60h to
sector addr with
A6 = 0, A1 = 1, A0 = 0
Wait 150 μs
To Verify: Write 40h to
sector(group) address
with
A6 = 0, A1 = 1, A0 = 0
Increment
PLSCNT
Reset
PLSCNT = 1
Wait 0.4 μs
Read from sector
address with
A6 = 0, A1 = 1, A0
No
PLSCNT = 25?
No
Data = 01h?
Yes
Yes
Device failed
Protect another
sector?
Yes
No
Remove VID
from RESET#
Write reset
command
Sector Protect Algorithm
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
Sector Protect
complete
33
©2004 Eon Silicon Solution, Inc., www.essi.com.tw
Rev. B, Issue Date: 2007/05/16
EN29LV640T/B
Flowchart 7b. In-System Chip Unprotect Flowchart
START
PLSCNT = 1
Protect all sectors
(groups): The
indicated portion of
the sector protect
algorithm must be
performed for all
unprotected sectors
prior to issuing the
first sector unprotect
address (see
Diagram 7a.)
RESET# = VID
Wait 1 μS
No
Temporary Chip
Unprotect Mode
First Write
Cycle = 60h?
Yes
No
All sectors
protected?
Yes
Set up first sector
address
Chip Unprotect: Write 60H to sector
address with A6 = 1,
A1 = 1, A0 = 0
Wait 15 ms
Increment
PLSCNT
Verify Chip Unprotect: Write
40h to sector address with
A6 = 1, A1 = 1, A0 =0
Wait 0.4 μS
No
PLSCCNT =
1000?
Read from sector address with
A6 = 1, A1 = 1, A0 = 0
No
Yes
Yes
Device failed
Set up next sector
(group) address
Data = 00h?
Last sector
verified?
No
Yes
Chip Unprotect Algorithm
Remove VID from
RESET#
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
34
Write reset
command
Chip Unprotect
complete
©2004 Eon Silicon Solution, Inc., www.essi.com.tw
Rev. B, Issue Date: 2007/05/16
EN29LV640T/B
ABSOLUTE MAXIMUM RATINGS
Parameter
Value
Storage Temperature
-65 to +125
C
Plastic Packages
-65 to +125
C
-55 to +125
C
Ambient Temperature
With Power Applied
Output Short Circuit Current 1
P
P
Voltage with
Respect to Ground
200
MA
-0.5 to +11.5
V
-0.5 to Vcc+0.5
V
-0.5 to + 4.0
V
P
A9, OE#, RESET#
and WP#/ACC 2
P
P
P
All other pins
3
P
Unit
P
Vcc
Notes:
1.
No more than one output shorted at a time. Duration of the short circuit should not be greater than one second.
2.
Minimum DC input voltage on A9, OE#, RESET# and WP#/ACC pins is –0.5V. During voltage transitions, A9, OE#,
RESET# and WP#/ACC pins may undershoot V ss to –1.0V for periods of up to 50ns and to –2.0V for periods of up to 20ns.
See figure below. Maximum DC input voltage on A9, OE#, and RESET# is 11.5V which may overshoot to 12.5V for periods
up to 20ns.
3.
Minimum DC voltage on input or I/O pins is –0.5 V. During voltage transitions, inputs may undershoot V ss to –1.0V for
periods of up to 50ns and to –2.0 V for periods of up to 20ns. See figure below. Maximum DC voltage on output and I/O
pins is V cc + 0.5 V. During voltage transitions, outputs may overshoot to V cc + 1.5 V for periods up to 20ns. See figure
below.
4.
Stresses above the values so mentioned above may cause permanent damage to the device. These values are for a stress
rating only and do not imply that the device should be operated at conditions up to or above these values. Exposure of the
device to the maximum rating values for extended periods of time may adversely affect the device reliability.
B
B
B
B
B
B
RECOMMENDED OPERATING RANGES 1
P
Value
Ambient Operating Temperature
Commercial Devices
Industrial Devices
1.
B
P
Parameter
0 to 70
-40 to 85
Operating Supply Voltage
Vcc
B
Full Voltage Range: 2.7 to
3.6V
Unit
C
V
Recommended Operating Ranges define those limits between which the functionality of the device is guaranteed.
Vcc
+1.5V
Maximum Negative Overshoot
Waveform
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
Maximum Positive Overshoot
Waveform
35
©2004 Eon Silicon Solution, Inc., www.essi.com.tw
Rev. B, Issue Date: 2007/05/16
EN29LV640T/B
DC Characteristics
Table 11. DC Characteristics
(T a = 0°C to 70°C or - 40°C to 85°C; V CC = 2.7-3.6V)
B
B
B
Symbol
I LI
B
Parameter
Test Conditions
Input Leakage Current
B
B
B
Unit
0V≤ V IN ≤ Vcc
±5
µA
0V≤ V OUT ≤ Vcc
±5
µA
(read) CMOS Word
9
16
mA
9
16
mA
20
30
mA
1
5.0
µA
1
5.0
mA
1
5.0
uA
-0.5
0.7 x
Vcc
0.8
Vcc ±
0.3
V
10.5
11.5
V
10.5
11.5
V
0.45
V
B
B
B
CE# = V IL , OE# =
B
I CC2
B
Supply Current (Program or Erase)
B
I CC3
B
I CC4
B
Supply Current (Standby - CMOS)
B
B
Reset Current
B
Automatic Sleep Mode
B
B
B
B
V IL = Vss ± 0.3V
Input High Voltage
V IH
B
B
#WP/ACC Voltage (Write Protect /
Program Acceleration)
Voltage for Autoselect or
Temporary Sector Unprotect
Output Low Voltage
V HH
B
B
V ID
B
B
V OL
B
B
Input Low Voltage
B
B
Output High Voltage TTL
I OL = 4.0 mA
B
B
I OH = -2.0 mA
B
B
V OH
B
B
Output High Voltage CMOS
V LKO
B
B
B
V IH = Vcc ± 0.3V
B
V IL
B
RESET# = Vss ± 0.3V
B
I CC5
B
V IH , WE# = V IL
CE# = BYTE# =
RESET# = Vcc ± 0.3V
(Note 1)
B
Typ
B
CE# = V IL ; OE# = V IH ;
f = 5MHZ
B
B
Min
B
B
Supply Current (read) CMOS Byte
I CC1
Max
B
Output Leakage Current
I LO
B
B
I OH = -100
B
B
A,
Supply voltage (Erase and
Program lock-out)
0.85 x
Vcc
Vcc 0.4V
2.3
V
V
V
2.5
V
Notes:
1. BYTE# pin can also be GND ± 0.3V. BYTE# and RESET# pin input buffers are always enabled so that
they draw power if not at full CMOS supply voltages.
2. Maximum I CC specifications are tested with Vcc = Vcc max.
B
B
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
36
©2004 Eon Silicon Solution, Inc., www.essi.com.tw
Rev. B, Issue Date: 2007/05/16
EN29LV640T/B
Test Conditions
3.3 V
2.7 kΩ
Device under Test
CL
6.2 kΩ
Note: Diodes are IN3064 or equivalent
Test Specifications
Test Conditions
-70
Output Load
-90
Unit
1 TTL Gate
Output Load Capacitance, C L
30
100
pF
Input Rise and Fall times
5
5
ns
Input Pulse Levels
Input timing measurement
reference levels
Output timing measurement
reference levels
0.0-3.0
0.0-3.0
V
1.5
1.5
V
1.5
1.5
V
B
B
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
37
©2004 Eon Silicon Solution, Inc., www.essi.com.tw
Rev. B, Issue Date: 2007/05/16
EN29LV640T/B
AC CHARACTERISTICS
Hardware Reset (RESET#)
Parameter
Std
tREADY
tREADY
tRP
tRH
tRPD
Description
Reset# Pin Low to Read or Write
Embedded Algorithms
Reset# Pin Low to Read or Write
Non Embedded Algorithms
Reset# Pulse Width
Reset# High Time Before Read
Reset# to Standby Mode
Test
Setup
Speed options
-70
-90
Max
20
s
Max
500
nS
Min
Min
Min
500
50
20
nS
nS
s
Figure 1. AC Waveforms for RESET#
Reset# Timings
RY/BY#
0V
CE#
OE#
tRH
RESET#
tRP
tREADY
Reset Timings NOT During Automatic Algorithms
RY/BY#
tREADY
CE#
OE#
RESET#
tRP
tRH
Reset Timings During Automatic Algorithms
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
38
©2004 Eon Silicon Solution, Inc., www.essi.com.tw
Rev. B, Issue Date: 2007/05/16
Unit
EN29LV640T/B
AC CHARACTERISTICS
Word / Byte Configuration (BYTE#)
Std
Parameter
t BCS
t CBH
t RBH
B
B
B
B
B
B
Speed
Description
BYTE# to CE# switching setup time
CE# to BYTE# switching hold time
RY/BY# to BYTE# switching hold time
Min
Min
Min
-70
0
0
0
-90
0
0
0
Figure 2. AC Waveforms for BYTE#
CE#
OE#
Byte#
tCBH
tBCS
Byte# timings for Read Operations
CE#
WE#
Byte#
tRBH
tBCS
RY/BY#
Byte #timings for Write Operations
Note: Switching BYTE# pin not allowed during embedded operations
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
39
©2004 Eon Silicon Solution, Inc., www.essi.com.tw
Rev. B, Issue Date: 2007/05/16
Unit
ns
ns
ns
EN29LV640T/B
AC CHARACTERISTICS
Table 12. Read-only Operations Characteristics
Parameter
Symbols
Speed Options
Test
Setup
JEDEC
Standard
Description
t AVAV
t RC
Read Cycle Time
-70
-90
Unit
Min
70
90
ns
CE# = V IL
OE#
=
V IL
Max
70
90
ns
OE# = V IL
Max
70
90
ns
Output Enable to Output Delay
Max
30
35
ns
t DF
Chip Enable to Output High Z
Max
20
20
ns
t GHQZ
t DF
Output Enable to Output High Z
Max
20
20
ns
t AXQX
t OH
Output Hold Time from
Addresses, CE# or OE#,
whichever occurs first
Min
0
0
ns
Read
Min
0
0
ns
Toggle and
Data# Polling
Min
10
10
ns
B
B
B
B
B
t AVQV
B
t ACC
B
B
Address to Output Delay
B
B
B
t ELQV
B
t GLQV
B
t CE
B
B
t OE
B
B
t EHQZ
B
B
B
B
B
B
B
B
B
Chip Enable To Output Delay
B
B
B
B
B
Output Enable
Hold Time
t OEH
B
Notes:
For - 70
- 90
B
B
B
B
B
B
B
B
B
Vcc = 3.0V – 3.6V
Output Load: 1 TTL gate and 30pF
Input Rise and Fall Times: 5ns
Input Pulse Levels: 0.0 V to 3.0 V
Timing Measurement Reference Level, Input and Output: 1.5 V
Vcc = 2.7V – 3.6V
Output Load: 1 TTL gate and 100 pF
Input Rise and Fall Times: 5 ns
Input Pulse Levels: 0.0 V to 3.0 V
Timing Measurement Reference Level, Input and Output: 1.5 V
Figure 3. AC Waveforms for READ Operations
tRC
B
B
Addresses Stable
Addresses
tACC
B
CE#
tDF
B
tOE
B
OE#
B
tOEH
B
WE#
B
tCE
B
tOH
B
B
Output Valid
Outputs
HIGH Z
RESET#
RY/BY#
0V
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
40
©2004 Eon Silicon Solution, Inc., www.essi.com.tw
Rev. B, Issue Date: 2007/05/16
EN29LV640T/B
AC CHARACTERISTICS
Table 13. Write (Erase/Program) Operations
Parameter
Symbols
Speed Options
JEDEC
Standard
t AVAV
t WC
B
B
t WLAX
B
90
ns
Address Setup Time
Min
0
0
ns
t AH
Address Hold Time
Min
45
40
ns
t DS
Data Setup Time
Min
30
40
ns
B
Data Hold Time
Min
0
0
ns
Output Enable Setup Time
Min
0
0
ns
Min
10
20
ns
Min
0
0
ns
CE# Setup Time
Min
0
0
ns
CE# Hold Time
Min
0
0
ns
Write Pulse Width
Min
45
30
ns
Write Pulse Width High
Min
20
25
ns
Byte
Typ
8
8
Word
Typ
8
8
Accelerated Programming
Operation
(Word AND Byte Mode)
Typ
7
5
µs
Sector Erase Operation
Typ
0.5
0.5
s
Chip Erase Operation
Typ
70
64
s
tVHH
VHH Rise and Fall Time
Min
250
250
ns
t VCS
Vcc Setup Time
Min
50
50
µs
B
t AS
B
B
t WHDX
B
B
B
B
B
B
t DH
B
B
B
t OES
B
B
Output Enable Hold Time
during Toggle and DATA#
Polling
Read Recovery Time before
Write (OE# High to WE# Low)
t OEH
B
t GHWL
B
t ELWL
B
B
B
B
B
t CH
B
B
B
t WLWH
t WP
t WHDL
t WPH
B
B
B
B
B
t WHW1
B
t WHW1
B
t WHW2
B
t WHW3
B
B
t CS
t WHEH
B
B
t GHWL
B
B
B
B
B
B
B
Unit
70
B
B
-90
Min
B
t DVWH
-70
Write Cycle Time
B
t AVWL
Description
B
t WHWH1
B
t WHWH1
B
t WHWH2
B
t WHWH3
B
B
B
B
B
B
B
Programming
Operation
µs
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
41
©2004 Eon Silicon Solution, Inc., www.essi.com.tw
Rev. B, Issue Date: 2007/05/16
EN29LV640T/B
AC CHARACTERISTICS
Table 14. Write (Erase/Program) Operations
Alternate CE# Controlled Writes
Parameter
Symbols
Speed Options
JEDEC
Standard
t AVAV
t WC
t AVEL
t AS
t ELAX
Description
-70
-90
Unit
Write Cycle Time
Min
70
90
ns
Address Setup Time
Min
0
0
ns
t AH
Address Hold Time
Min
45
40
ns
t DVEH
t DS
Data Setup Time
Min
30
40
ns
t EHDX
t DH
Data Hold Time
Min
0
0
ns
Output Enable Setup Time
Min
0
0
ns
Read Recovery Time before
Write (OE# High to CE# Low)
Min
0
0
ns
WE# Setup Time
Min
0
0
ns
WE# Hold Time
Min
0
0
ns
CE# Pulse Width
Min
35
45
ns
CE# Pulse Width High
Min
20
20
ns
Byte
Typ
8
8
Word
Typ
8
8
Accelerated Programming
Operation
(Word AND Byte Mode)
Typ
7
5
µs
Sector Erase Operation
Typ
0.5
0.5
s
B
B
B
B
B
B
B
B
B
B
B
B
B
B
B
B
B
B
B
B
t OES
B
t GHEL
B
B
t GHEL
B
t WLEL
B
t WS
B
t EHWH
B
B
B
B
t WH
B
B
B
t ELEH
t CP
t EHEL
t CPH
B
B
B
B
t WHW1
B
t WHW1
B
t WHW2
B
B
B
B
B
B
B
B
B
t WHWH1
B
t WHWH1
B
t WHWH2
B
B
B
B
Programming
Operation
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
µs
42
©2004 Eon Silicon Solution, Inc., www.essi.com.tw
Rev. B, Issue Date: 2007/05/16
EN29LV640T/B
AC CHARACTERISTICS
Figure 4. AC Waveforms for Chip/Sector Erase Operations Timings
Erase Command Sequence (last 2 cycles)
Addresses
tWC
tAS
0x2AA
SA
Read Status Data (last two cycles)
tAH
VA
VA
0x555 for chip
erase
CE#
tGHW L
OE#
tCH
tWP
WE#
tWPH
tCS
tWHWH2 or tWHWH3
Data
0x55
0x30
tDS
tDH
Status
DOUT
tBUSY
tRB
RY/BY#
VCC
tVCS
Notes:
1. SA=Sector Address (for sector erase), VA=Valid Address for reading status, D out =true data at read address.
2. V cc shown only to illustrate t vcs measurement references. It cannot occur as shown during a valid command
sequence.
B
B
B
B
B
B
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
43
©2004 Eon Silicon Solution, Inc., www.essi.com.tw
Rev. B, Issue Date: 2007/05/16
EN29LV640T/B
Figure 5. Program Operation Timings
Program Command Sequence (last 2 cycles)
Addresses
tWC
tAS
0x555
PA
Program Command Sequence (last 2 cycles)
tAH
PA
PA
CE#
tGHWL
OE#
tWP
WE#
tCH
tWPH
tWHWH1
tCS
Data
PD
OxA0
Status
tDS
tRB
tBUSY
tDH
DOUT
RY/BY#
tVCS
VCC
Notes:
1. PA=Program Address, PD=Program Data, D OUT is the true data at the program address.
2. V CC shown in order to illustrate t VCS measurement references. It cannot occur as shown during a valid
command sequence.
B
B
B
B
B
B
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
44
©2004 Eon Silicon Solution, Inc., www.essi.com.tw
Rev. B, Issue Date: 2007/05/16
EN29LV640T/B
Figure 6. AC Waveforms for /DATA Polling During Embedded Algorithm
Operations
tRC
Addresses
VA
VA
VA
tACC
tCH
tCE
CE#
tOE
OE#
tOEH
tDF
WE#
tOH
Complement
Complement
DQ[7]
DQ[6:0]
Status
Data
Status Data
True
Valid Data
True
Valid Data
tBUS
RY/BY#
Notes:
1. VA=Valid Address for reading Data# Polling status data
2. This diagram shows the first status cycle after the command sequence, the last status read cycle and the array data read cycle.
Figure 7. AC Waveforms for Toggle Bit During Embedded Algorithm
Operations
tRC
Addresses
VA
VA
VA
VA
tACC
tCH
tCE
CE#
tOE
OE#
tOEH
WE#
tDF
tOH
Valid Status
DQ6, DQ2
tBUSY
(first read)
Valid Status
(second
d)
Valid Status
Valid Data
(stops toggling)
RY/BY#
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
45
©2004 Eon Silicon Solution, Inc., www.essi.com.tw
Rev. B, Issue Date: 2007/05/16
EN29LV640T/B
Figure 8. Alternate CE# Controlled Write Operation Timings
PA for Program
SA for Sector Erase
0x555 for Chip Erase
0x555 for Program
0x2AA for Erase
Addresses
VA
tAS
tWC
tAH
WE#
tWH
tGHEL
OE#
tCP
tCPH
tWS
tCWHWH1 / tCWHWH2 / tCWHWH3
CE#
tDS
tBUSY
tDH
Status
Data
DOUT
PD for Program
0x30 for Sector Erase
0x10 for Chip Erase
0xA0 for
Program
RY/BY#
tRH
Reset#
Notes:
PA = address of the memory location to be programmed.
PD = data to be programmed at byte address.
VA = Valid Address for reading program or erase status
D out = array data read at VA
Shown above are the last two cycles of the program or erase command sequence and the last status read cycle
RESETt# shown to illustrate t RH measurement references. It cannot occur as shown during a valid command
sequence.
B
B
B
B
Figure 9. DQ2 vs. DQ6
Enter
Embedded
Erase
WE#
Enter Erase
Suspend
Program
Erase
Suspend
Erase
Erase
Resume
Enter
Suspend
Program
Enter
Suspend
Read
Erase
Suspend
Read
Erase
DQ6
DQ2
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
46
©2004 Eon Silicon Solution, Inc., www.essi.com.tw
Rev. B, Issue Date: 2007/05/16
Erase
Complete
EN29LV640T/B
AC CHARACTERISTICS
Temporary Sector Unprotect
Parameter
Std
Description
t VIDR
V ID Rise and Fall Time
V HH Rise and Fall Time
RESET# Setup Time for Temporary
Sector Unprotect
B
t VIHH
B
B
B
t RSP
B
B
B
B
B
B
Speed Option
-70
-90
Unit
Min
500
Ns
Min
500
Ns
Min
4
µs
Figure 10. Temporary Sector Unprotect Timing Diagram
VID
RESET#
0 or 3 V
0 or 3 V
tVIDR
tVIDR
CE#
WE#
tRSP
RY/BY#
AC CHARACTERISTICS
Write Protect / Accelerated Program
Figure 11. Accelerated Program Timing Diagram
VHH
B
B
WP#/ACC
0 or 3 V
0 or 3 V
tVHH
B
tVHH
B
B
B
CE#
WE#
tRSP
B
B
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
47
©2004 Eon Silicon Solution, Inc., www.essi.com.tw
Rev. B, Issue Date: 2007/05/16
EN29LV640T/B
AC CHARACTERISTICS
Sector (Group) Protect and Chip Unprotect
Figure 12. Sector (Group) Protect and Chip Unprotect Timing Diagram
VID
Vcc
RESET#
0V
0V
tVIDR
tVIDR
SA,
A6,A1,A0
Data
60h
Valid
Valid
Valid
60h
40h
Status
Sector Protect/Unprotect
Verify
CE#
>0.4μS
WE#
>1μS
Protect: 150 uS
Unprotect: 15 mS
OE#
Notes:
Use standard microprocessor timings for this device for read and write cycles.
For Sector (Group) Protect, use A6=0, A1=1, A0=0. For Chip Unprotect, use A6=1, A1=1, A0=0.
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
48
©2004 Eon Silicon Solution, Inc., www.essi.com.tw
Rev. B, Issue Date: 2007/05/16
EN29LV640T/B
ERASE AND PROGRAM PERFORMANCE
Parameter
Limits
Max
Typ
Sector Erase Time
0.5
Chip Erase Time
64
Accelerated Word Program Time
5
120
µS
Word Programming Time
8
300
µS
Chip Programming Time
20
60
Sec
Erase/Program Endurance
Comments
Unit
10
Sec
Sec
100K
Excludes 00h programming prior to
erasure
Minimum 100K cycles
Cycles
Note: Typical Conditions are room temperature, 3V and checkboard pattern programmed.
LATCH UP CHARACTERISTICS
Parameter Description
Min
Max
Input voltage with respect to V ss on all pins except I/O pins
(including A9, Reset and OE#)
-1.0 V
12.0 V
Input voltage with respect to V ss on all I/O Pins
-1.0 V
Vcc + 1.0 V
Vcc Current
-100 mA
100 mA
B
B
B
B
Note: These are latch up characteristics and the device should never be put under these conditions. Refer to
Absolute Maximum ratings for the actual operating limits.
48-PIN TSOP PACKAGE CAPACITANCE
Parameter Symbol
Parameter Description
Test Setup
Typ
Max
Unit
Input Capacitance
V IN = 0
6
7.5
pF
C OUT
Output Capacitance
V OUT = 0
8.5
12
pF
C IN2
Control Pin Capacitance
V IN = 0
7.5
9
pF
C IN
B
B
B
B
B
B
B
B
B
B
B
B
Note: Test conditions are Temperature = 25°C and f = 1.0 MHz.
DATA RETENTION
Parameter Description
Test Conditions
Min
Unit
150°C
10
Years
125°C
20
Years
Minimum Pattern Data Retention Time
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
49
©2004 Eon Silicon Solution, Inc., www.essi.com.tw
Rev. B, Issue Date: 2007/05/16
EN29LV640T/B
FIGURE 13. TSOP 12mm x 20mm
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
50
©2004 Eon Silicon Solution, Inc., www.essi.com.tw
Rev. B, Issue Date: 2007/05/16
EN29LV640T/B
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
51
©2004 Eon Silicon Solution, Inc., www.essi.com.tw
Rev. B, Issue Date: 2007/05/16
EN29LV640T/B
FIGURE 14. 48TFBGA package outline
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
52
©2004 Eon Silicon Solution, Inc., www.essi.com.tw
Rev. B, Issue Date: 2007/05/16
EN29LV640T/B
Revisions List
Revision No
Description
A
Initial Release
2007/3/13
1. Move the feature of SECURED SILICON SECTOR
2. Change the notes for 70 ns products from Vcc = 2.7V – 3.6V
2007/05/16
to Vcc = 3.0V – 3.6V at Table 12. Read-only Operations
Characteristics in page 40
B
Date
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
53
©2004 Eon Silicon Solution, Inc., www.essi.com.tw
Rev. B, Issue Date: 2007/05/16
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