ON MC74HC273ADWR2 Octal d flip−flop with common clock and reset high−performance silicon−gate cmo Datasheet

MC74HC273A
Octal D Flip−Flop with
Common Clock and Reset
High−Performance Silicon−Gate CMOS
The MC74HC273A is identical in pinout to the LS273. The device
inputs are compatible with standard CMOS outputs; with pullup
resistors, they are compatible with LSTTL outputs.
This device consists of eight D flip−flops with common Clock and
Reset inputs. Each flip−flop is loaded with a low−to−high transition of
the Clock input. Reset is asynchronous and active low.
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MARKING
DIAGRAMS
20
20
PDIP−20
N SUFFIX
CASE 738
Features
•
•
•
•
•
•
•
•
Output Drive Capability: 10 LSTTL Loads
Outputs Directly Interface to CMOS, NMOS and TTL
Operating Voltage Range: 2.0 to 6.0 V
Low Input Current: 1.0 mA
High Noise Immunity Characteristic of CMOS Devices
In Compliance with the Requirements Defined by JEDEC Standard
No. 7A
Chip Complexity: 264 FETs or 66 Equivalent Gates
Pb−Free Packages are Available*
MC74HC273AN
AWLYYWWG
1
1
20
20
1
SOIC−20
DW SUFFIX
CASE 751D
74HC273A
AWLYYWWG
1
20
20
1
HC
273A
ALYWG
G
TSSOP−20
DT SUFFIX
CASE 948E
1
20
1
20
SOEIAJ−20
F SUFFIX
CASE 967
1
74HC273A
AWLYWWG
A
= Assembly Location
WL, L
= Wafer Lot
YY, Y
= Year
WW, W = Work Week
G
= Pb−Free Package
G
= Pb−Free Package
(Note: Microdot may be in either location)
ORDERING INFORMATION
See detailed ordering and shipping information in the package
dimensions section on page 2 of this data sheet.
*For additional information on our Pb−Free strategy and soldering details, please
download the ON Semiconductor Soldering and Mounting Techniques
Reference Manual, SOLDERRM/D.
© Semiconductor Components Industries, LLC, 2005
July, 2005 − Rev. 10
1
Publication Order Number:
MC74HC273A/D
MC74HC273A
PIN ASSIGNMENT
RESET
1
20
VCC
Q0
2
19
Q7
D0
3
18
D7
D1
4
17
D6
Q1
5
16
Q6
Q2
6
15
Q5
D2
7
14
D5
D3
8
13
D4
Q5
Q3
9
12
Q4
Q6
GND
10
11
CLOCK
LOGIC DIAGRAM
D0
D1
D2
D3
DATA
INPUTS
D4
D5
D6
D7
CLOCK
RESET
3
2
4
5
7
6
8
9
13
12
14
17
18
11
1
15
16
19
Q0
Q1
Q2
Q3
Q4
NONINVERTING
OUTPUTS
Q7
FUNCTION TABLE
Inputs
PIN 20 = VCC
PIN 10 = GND
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Design Criteria
Value
Units
Internal Gate Count*
66
ea
Internal Gate Propagation Delay
1.5
ns
Internal Gate Power Dissipation
5.0
mW
.0075
pJ
Speed Power Product
Output
Reset
Clock
D
Q
L
H
H
H
H
X
X
H
L
X
X
L
H
L
No Change
No Change
L
*Equivalent to a two−input NAND gate.
ORDERING INFORMATION
Package
Shipping†
MC74HC273AN
PDIP−20
18 Units / Rail
MC74HC273ANG
PDIP−20
(Pb−Free)
18 Units / Rail
MC74HC273ADW
SOIC−20 WIDE
38 Units / Rail
MC74HC273ADWG
SOIC−20 WIDE
(Pb−Free)
38 Units / Rail
MC74HC273ADWR2
SOIC−20 WIDE
1000 Tape & Reel
MC74HC273ADWR2G
SOIC−20 WIDE
(Pb−Free)
1000 Tape & Reel
MC74HC273ADT
TSSOP−20*
75 Units / Rail
MC74HC273ADTG
TSSOP−20*
75 Units / Rail
MC74HC273ADTR2
TSSOP−20*
2500 Tape & Reel
MC74HC273ADTR2G
TSSOP−20*
2500 Tape & Reel
MC74HC273AF
SOEIAJ−20
40 Units / Rail
MC74HC273AFG
SOEIAJ−20
(Pb−Free)
40 Units / Rail
MC74HC273AFEL
SOEIAJ−20
2000 Tape & Reel
MC74HC273AFELG
SOEIAJ−20
(Pb−Free)
2000 Tape & Reel
Device
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging
Specifications Brochure, BRD8011/D.
*This package is inherently Pb−Free.
http://onsemi.com
2
MC74HC273A
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MAXIMUM RATINGS
Symbol
Parameter
Value
Unit
– 0.5 to + 7.0
V
DC Input Voltage (Referenced to GND)
– 0.5 to VCC + 0.5
V
DC Output Voltage (Referenced to GND)
– 0.5 to VCC + 0.5
V
VCC
DC Supply Voltage (Referenced to GND)
Vin
Vout
Iin
DC Input Current, per Pin
± 20
mA
Iout
DC Output Current, per Pin
± 25
mA
ICC
DC Supply Current, VCC and GND Pins
± 50
mA
PD
Power Dissipation in Still Air,
750
500
450
mW
Tstg
Storage Temperature
– 65 to + 150
_C
TL
Lead Temperature, 1 mm from Case for 10 Seconds
Plastic DIP, SOIC or TSSOP Package
Plastic DIP†
SOIC Package†
TSSOP Package†
This device contains protection
circuitry to guard against damage
due to high static voltages or electric
fields. However, precautions must
be taken to avoid applications of any
voltage higher than maximum rated
voltages to this high−impedance circuit. For proper operation, Vin and
Vout should be constrained to the
range GND v (Vin or Vout) v VCC.
Unused inputs must always be
tied to an appropriate logic voltage
level (e.g., either GND or VCC).
Unused outputs must be left open.
_C
260
Maximum ratings are those values beyond which device damage can occur. Maximum ratings
applied to the device are individual stress limit values (not normal operating conditions) and are
not valid simultaneously. If these limits are exceeded, device functional operation is not implied,
damage may occur and reliability may be affected.
†Derating — Plastic DIP: – 10 mW/_C from 65_ to 125_C
SOIC Package: – 7 mW/_C from 65_ to 125_C
TSSOP Package: − 6.1 mW/_C from 65_ to 125_C
For high frequency or heavy load considerations, see Chapter 2 of the ON Semiconductor High−Speed CMOS Data Book (DL129/D).
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RECOMMENDED OPERATING CONDITIONS
Symbol
VCC
Vin, Vout
Parameter
Min
Max
Unit
2.0
6.0
V
0
VCC
V
– 55
+ 125
_C
0
0
0
1000
500
400
ns
DC Supply Voltage (Referenced to GND)
DC Input Voltage, Output Voltage (Referenced to GND)
TA
Operating Temperature, All Package Types
tr, tf
Input Rise and Fall Time
(Figure 1)
VCC = 2.0 V
VCC = 4.5 V
VCC = 6.0 V
DC ELECTRICAL CHARACTERISTICS (Voltages Referenced to GND)
Guaranteed Limit
VCC
V
– 55 to
25_C
Symbol
Parameter
v 85_C
v 125_C
Unit
VIH
Minimum High−Level Input Voltage
Vout = VCC – 0.1 V
|Iout| v 20 mA
2.0
3.0
4.5
6.0
1.5
2.1
3.15
4.2
1.5
2.1
3.15
4.2
1.5
2.1
3.15
4.2
V
VIL
Maximum Low−Level Input Voltage
Vout = 0.1 V
|Iout| v 20 mA
2.0
3.0
4.5
6.0
0.5
0.9
1.35
1.8
0.5
0.9
1.35
1.8
0.5
0.9
1.35
1.8
V
VOH
Minimum High−Level Output
Voltage
Vin = VIH
|Iout| v 20 mA
2.0
4.5
6.0
1.9
4.4
5.9
1.9
4.4
5.9
1.9
4.4
5.9
V
3.0
4.5
6.0
2.48
3.98
5.48
2.34
3.84
5.34
2.2
3.7
5.2
2.0
4.5
6.0
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
3.0
4.5
6.0
0.26
0.26
0.26
0.33
0.33
0.33
0.4
0.4
0.4
Test Conditions
Vin = VIH
VOL
Maximum Low−Level Output
Voltage
|Iout| v 2.4 mA
|Iout| v 6.0 mA
|Iout| v 7.8 mA
Vin = VIL
|Iout| v 20 mA
Vin = VIL
|Iout| v 2.4 mA
|Iout| v 6.0 mA
|Iout| v 7.8 mA
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3
V
MC74HC273A
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DC ELECTRICAL CHARACTERISTICS (Voltages Referenced to GND)
Guaranteed Limit
Symbol
Parameter
Test Conditions
VCC
V
– 55 to
25_C
v 85_C
v 125_C
Unit
Iin
Maximum Input Leakage Current
Vin = VCC or GND
6.0
± 0.1
± 1.0
± 1.0
mA
IOZ
Maximum Three−State Leakage
Current
Output in High−Impedance State
Vin = VIL or VIH
Vout = VCC or GND
6.0
± 0.5
± 5.0
± 10
mA
ICC
Maximum Quiescent Supply
Current (per Package)
Vin = VCC or GND
Iout = 0 mA
6.0
4.0
40
160
mA
NOTE: Information on typical parametric values can be found in Chapter 2 of the ON Semiconductor High−Speed CMOS Data Book
(DL129/D).
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AC ELECTRICAL CHARACTERISTICS (CL = 50 pF, Input tr = tf = 6.0 ns)
Guaranteed Limit
Symbol
Parameter
VCC
V
– 55 to
25_C
v 85_C
v 125_C
Unit
fmax
Maximum Clock Frequency (50% Duty Cycle)
(Figures 1 and 4)
2.0
3.0
4.5
6.0
6.0
15
30
35
5.0
10
24
28
4.0
8.0
20
24
MHz
tPLH
tPHL
Maximum Propagation Delay, Clock to Q
(Figures 1 and 4)
2.0
3.0
4.5
6.0
145
90
29
25
180
120
36
31
220
140
44
38
ns
tPHL
Maximum Propagation Delay, Reset to Q
(Figures 2 and 4)
2.0
3.0
4.5
6.0
145
90
29
25
180
120
36
31
220
140
44
38
ns
tTLH
tTHL
Maximum Output Transition Time, Any Output
(Figures 1 and 4)
2.0
3.0
4.5
6.0
75
27
15
13
95
32
19
16
110
36
22
19
ns
Cin
Maximum Input Capacitance
10
10
10
pF
NOTE: For propagation delays with loads other than 50 pF, and information on typical parametric values, see Chapter 2 of the ON
Semiconductor High−Speed CMOS Data Book (DL129/D).
Typical @ 25°C, VCC = 5.0 V
CPD
48
Power Dissipation Capacitance (Per Enabled Output)*
* Used to determine the no−load dynamic power consumption: PD = CPD VCC
ON Semiconductor High−Speed CMOS Data Book (DL129/D).
2f
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4
pF
+ ICC VCC . For load considerations, see Chapter 2 of the
MC74HC273A
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TIMING REQUIREMENTS (CL = 50 pF, Input tr = tf = 6.0 ns)
Guaranteed Limit
Symbol
Parameter
Figure
VCC
Volts
– 55 to 25_C
Min
Max
v 85_C
Min
Max
v 125_C
Min
Max
Unit
tsu
Minimum Setup Time, Data to Clock
3
2.0
3.0
4.5
6.0
60
23
12
10
75
27
15
13
90
32
18
15
ns
th
Minimum Hold Time, Clock to Data
3
2.0
3.0
4.5
6.0
3.0
3.0
3.0
3.0
3.0
3.0
3.0
3.0
3.0
3.0
3.0
3.0
ns
trec
Minimum Recovery Time, Reset Inactive to
Clock
2
2.0
3.0
4.5
6.0
5.0
5.0
5.0
5.0
5.0
5.0
5.0
5.0
5.0
5.0
5.0
5.0
ns
tw
Minimum Pulse Width, Clock
1
2.0
3.0
4.5
6.0
60
23
12
10
75
27
15
13
90
32
18
15
ns
tw
Minimum Pulse Width, Reset
2
2.0
3.0
4.5
6.0
60
23
12
10
75
27
15
13
90
32
18
15
ns
Maximum Input Rise and Fall Times
1
2.0
3.0
4.5
6.0
tr, tf
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5
1000
800
500
400
1000
800
500
400
1000
800
500
400
ns
MC74HC273A
SWITCHING WAVEFORMS
CLOCK
tw
tf
tr
VCC
90%
50%
10%
tw
GND
1/fmax
Q
50%
trec
90%
50%
10%
CLOCK
tTLH
50%
tTHL
Figure 1.
tsu
GND
th
VCC
50%
GND
D0
Figure 3.
D1
D2
TEST POINT
OUTPUT
DEVICE
UNDER
TEST
GND
VCC
50%
CLOCK
VCC
Figure 2.
VALID
DATA
GND
tPHL
Q
tPHL
tPLH
VCC
50%
RESET
DATA
INPUTS
D3
D4
CL*
D5
D6
*Includes all probe and jig capacitance
Figure 4. Test Circuit
D7
3
4
7
8
13
14
17
18
C
DR
C
DR
C
DR
C
DR
C
DR
C
DR
C
DR
C
DR
Q
Q
Q
Q
Q
Q
Q
Q
2
5
6
9
12
15
16
19
Q0
Q1
Q2
Q3
Q4
Q5
Q6
Q7
11
1
Figure 5. Expanded Logic Diagram
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6
NONINVERTING
OUTPUTS
MC74HC273A
PACKAGE DIMENSIONS
PDIP−20
N SUFFIX
PLASTIC DIP PACKAGE
CASE 738−03
ISSUE E
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
2. CONTROLLING DIMENSION: INCH.
3. DIMENSION L TO CENTER OF LEAD WHEN
FORMED PARALLEL.
4. DIMENSION B DOES NOT INCLUDE MOLD
FLASH.
−A−
20
11
1
10
B
L
C
−T−
K
SEATING
PLANE
M
N
E
G
F
J
D
20 PL
0.25 (0.010)
20 PL
0.25 (0.010)
M
T A
M
T B
M
DIM
A
B
C
D
E
F
G
J
K
L
M
N
INCHES
MIN
MAX
1.010
1.070
0.240
0.260
0.150
0.180
0.015
0.022
0.050 BSC
0.050
0.070
0.100 BSC
0.008
0.015
0.110
0.140
0.300 BSC
0_
15 _
0.020
0.040
MILLIMETERS
MIN
MAX
25.66
27.17
6.10
6.60
3.81
4.57
0.39
0.55
1.27 BSC
1.27
1.77
2.54 BSC
0.21
0.38
2.80
3.55
7.62 BSC
0_
15_
0.51
1.01
M
SOIC−20
DW SUFFIX
CASE 751D−05
ISSUE G
20
11
X 45 _
h
1
10
20X
B
B
0.25
M
T A
S
B
S
A
L
H
M
E
0.25
10X
NOTES:
1. DIMENSIONS ARE IN MILLIMETERS.
2. INTERPRET DIMENSIONS AND TOLERANCES
PER ASME Y14.5M, 1994.
3. DIMENSIONS D AND E DO NOT INCLUDE MOLD
PROTRUSION.
4. MAXIMUM MOLD PROTRUSION 0.15 PER SIDE.
5. DIMENSION B DOES NOT INCLUDE DAMBAR
PROTRUSION. ALLOWABLE PROTRUSION
SHALL BE 0.13 TOTAL IN EXCESS OF B
DIMENSION AT MAXIMUM MATERIAL
CONDITION.
q
A
B
M
D
18X
e
A1
SEATING
PLANE
C
T
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7
DIM
A
A1
B
C
D
E
e
H
h
L
q
MILLIMETERS
MIN
MAX
2.35
2.65
0.10
0.25
0.35
0.49
0.23
0.32
12.65
12.95
7.40
7.60
1.27 BSC
10.05
10.55
0.25
0.75
0.50
0.90
0_
7_
MC74HC273A
PACKAGE DIMENSIONS
TSSOP−20
DT SUFFIX
CASE 948E−02
ISSUE B
20X
0.15 (0.006) T U
2X
K REF
0.10 (0.004)
S
L/2
20
M
T U
S
V
S
K
K1
ÍÍÍÍ
ÍÍÍÍ
ÍÍÍÍ
11
J J1
B
L
−U−
PIN 1
IDENT
SECTION N−N
1
10
0.25 (0.010)
N
0.15 (0.006) T U
S
M
A
−V−
NOTES:
1. DIMENSIONING AND TOLERANCING
PER ANSI Y14.5M, 1982.
2. CONTROLLING DIMENSION:
MILLIMETER.
3. DIMENSION A DOES NOT INCLUDE
MOLD FLASH, PROTRUSIONS OR GATE
BURRS. MOLD FLASH OR GATE BURRS
SHALL NOT EXCEED 0.15 (0.006) PER
SIDE.
4. DIMENSION B DOES NOT INCLUDE
INTERLEAD FLASH OR PROTRUSION.
INTERLEAD FLASH OR PROTRUSION
SHALL NOT EXCEED 0.25 (0.010) PER
SIDE.
5. DIMENSION K DOES NOT INCLUDE
DAMBAR PROTRUSION. ALLOWABLE
DAMBAR PROTRUSION SHALL BE 0.08
(0.003) TOTAL IN EXCESS OF THE K
DIMENSION AT MAXIMUM MATERIAL
CONDITION.
6. TERMINAL NUMBERS ARE SHOWN
FOR REFERENCE ONLY.
7. DIMENSION A AND B ARE TO BE
DETERMINED AT DATUM PLANE −W−.
N
F
DETAIL E
−W−
C
D
G
H
DETAIL E
0.100 (0.004)
−T− SEATING
PLANE
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8
DIM
A
B
C
D
F
G
H
J
J1
K
K1
L
M
MILLIMETERS
MIN
MAX
6.40
6.60
4.30
4.50
−−−
1.20
0.05
0.15
0.50
0.75
0.65 BSC
0.27
0.37
0.09
0.20
0.09
0.16
0.19
0.30
0.19
0.25
6.40 BSC
0_
8_
INCHES
MIN
MAX
0.252
0.260
0.169
0.177
−−−
0.047
0.002
0.006
0.020
0.030
0.026 BSC
0.011
0.015
0.004
0.008
0.004
0.006
0.007
0.012
0.007
0.010
0.252 BSC
0_
8_
MC74HC273A
PACKAGE DIMENSIONS
SOEIAJ−20
F SUFFIX
CASE 967−01
ISSUE O
20
LE
11
Q1
E HE
1
M_
L
10
DETAIL P
Z
D
VIEW P
e
A
c
DIM
A
A1
b
c
D
E
e
HE
L
LE
M
Q1
Z
A1
b
0.13 (0.005)
M
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
2. CONTROLLING DIMENSION: MILLIMETER.
3. DIMENSIONS D AND E DO NOT INCLUDE MOLD
FLASH OR PROTRUSIONS AND ARE MEASURED
AT THE PARTING LINE. MOLD FLASH OR
PROTRUSIONS SHALL NOT EXCEED 0.15 (0.006)
PER SIDE.
4. TERMINAL NUMBERS ARE SHOWN FOR
REFERENCE ONLY.
5. THE LEAD WIDTH DIMENSION (b) DOES NOT
INCLUDE DAMBAR PROTRUSION. ALLOWABLE
DAMBAR PROTRUSION SHALL BE 0.08 (0.003)
TOTAL IN EXCESS OF THE LEAD WIDTH
DIMENSION AT MAXIMUM MATERIAL CONDITION.
DAMBAR CANNOT BE LOCATED ON THE LOWER
RADIUS OR THE FOOT. MINIMUM SPACE
BETWEEN PROTRUSIONS AND ADJACENT LEAD
TO BE 0.46 ( 0.018).
0.10 (0.004)
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9
MILLIMETERS
MIN
MAX
−−−
2.05
0.05
0.20
0.35
0.50
0.18
0.27
12.35
12.80
5.10
5.45
1.27 BSC
7.40
8.20
0.50
0.85
1.10
1.50
10 _
0_
0.70
0.90
−−−
0.81
INCHES
MIN
MAX
−−−
0.081
0.002
0.008
0.014
0.020
0.007
0.011
0.486
0.504
0.201
0.215
0.050 BSC
0.291
0.323
0.020
0.033
0.043
0.059
10 _
0_
0.028
0.035
−−−
0.032
MC74HC273A
ON Semiconductor and
are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes without further notice
to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does SCILLC assume any liability
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“Typical” parameters which may be provided in SCILLC data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All
operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. SCILLC does not convey any license under its patent rights
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