MCP3202 2.7V Dual Channel 12-Bit A/D Converter with SPI Serial Interface Features • • • • • • • • 12-bit resolution ±1 LSB max DNL ±1 LSB max INL (MCP3202-B) ±2 LSB max INL (MCP3202-C) Analog inputs programmable as single-ended or pseudo-differential pairs On-chip sample and hold SPI serial interface (modes 0,0 and 1,1) Single supply operation: 2.7V-5.5V 100 ksps max. sampling rate at VDD = 5V 50 ksps max. sampling rate at VDD = 2.7V Low power CMOS technology - 500 nA typical standby current, 5 μA max. - 550 µA max. active current at 5V Industrial temp range: -40°C to +85°C 8-pin MSOP, PDIP, SOIC and TSSOP packages PDIP, MSOP, SOIC, TSSOP CS/SHDN 1 CH0 2 CH1 3 VSS 4 MCP3202 • • • • • Package Types Sensor Interface Process Control Data Acquisition Battery Operated Systems Description The Microchip Technology Inc. MCP3202 is a successive approximation 12-bit Analog-to-Digital (A/D) Converter with on-board sample and hold circuitry. The MCP3202 is programmable to provide a single pseudodifferential input pair or dual single-ended inputs. Differential Nonlinearity (DNL) is specified at ±1 LSB, and Integral Nonlinearity (INL) is offered in ±1 LSB (MCP3202-B) and ±2 LSB (MCP3202-C) versions. Communication with the device is done using a simple serial interface compatible with the SPI protocol. The device is capable of conversion rates of up to 100 ksps at 5V and 50 ksps at 2.7V. The MCP3202 device operates over a broad voltage range (2.7V-5.5V). Lowcurrent design permits operation with typical standby and active currents of only 500 nA and 375 μA, respectively. The MCP3202 is offered in 8-pin MSOP, PDIP, TSSOP and 150 mil SOIC packages. © 2006 Microchip Technology Inc. VDD/VREF 7 CLK 6 DOUT 5 DIN Functional Block Diagram VDD CH0 CH1 Input Channel Mux VSS DAC Comparator Applications • • • • 8 12-Bit SAR Sample and Hold Control Logic CS/SHDN DIN CLK Shift Register DOUT DS21034D-page 1 MCP3202 1.0 ELECTRICAL CHARACTERISTICS 1.1 Maximum Ratings* PIN FUNCTION TABLE Name Function VDD/VREF +2.7V to 5.5V Power Supply and Reference Voltage Input All inputs and outputs w.r.t. VSS ...... -0.6V to VDD +0.6V CH0 Channel 0 Analog Input Storage temperature ..........................-65°C to +150°C CH1 Channel 1 Analog Input CLK Serial Clock DIN Serial Data In DOUT Serial Data Out CS/SHDN Chip Select/Shutdown Input VDD.........................................................................7.0V Ambient temp. with power applied .....-65°C to +125°C ESD protection on all pins (HBM)......................... > 4 kV *Notice: Stresses above those listed under “Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and functional operation of the device at those or any other conditions above those indicated in the operational listings of this specification is not implied. Exposure to maximum rating conditions for extended periods may affect device reliability. ELECTRICAL CHARACTERISTICS All parameters apply at VDD = 5.5V, VSS = 0V, TAMB = -40°C to +85°C, fSAMPLE = 100 ksps and fCLK = 18*fSAMPLE unless otherwise noted. Parameter Conversion Rate: Conversion Time Sym Min. Typ. Max. Units tCONV — — 12 clock cycles clock cycles 1.5 Analog Input Sample Time tSAMPLE Throughput Rate fSAMPLE — — — — 100 50 ksps ksps DC Accuracy: Resolution Integral Nonlinearity INL Differential Nonlinearity DNL — — — 12 ±0.75 ±1 ±0.5 ±1 ±2 ±1 bits LSB LSB LSB Conditions VDD = VREF = 5V VDD = VREF = 2.7V MCP3202-B MCP3202-C No missing codes over temperature Offset Error — ±1.25 ±3 LSB Gain Error — ±1.25 ±5 LSB Dynamic Performance: Total Harmonic Distortion THD — -82 — dB VIN = 0.1V to 4.9V@1 kHz Signal to Noise and Distortion SINAD — 72 — dB VIN = 0.1V to 4.9V@1 kHz (SINAD) Spurious Free Dynamic Range SFDR — 86 — dB VIN = 0.1V to 4.9V@1 kHz Analog Inputs: — VDD V Input Voltage Range for CH0 or VSS CH1 in Single-Ended Mode See Sections 3.1 and 4.1 Input Voltage Range for IN+ in IN+ IN— VDD+INPseudo-Differential Mode — VSS+100 mV See Sections 3.1 and 4.1 Input Voltage Range for IN- in INVSS-100 Pseudo-Differential Mode Leakage Current — .001 ±1 μA Switch Resistance RSS — 1k — Ω See Figure 4-1 Note 1: This parameter is established by characterization and not 100% tested. 2: Because the sample cap will eventually lose charge, effective clock rates below 10 kHz can affect linearity performance, especially at elevated temperatures. See Section 6.2 for more information. DS21034D-page 2 © 2006 Microchip Technology Inc. MCP3202 ELECTRICAL CHARACTERISTICS (CONTINUED) All parameters apply at VDD = 5.5V, VSS = 0V, TAMB = -40°C to +85°C, fSAMPLE = 100 ksps and fCLK = 18*fSAMPLE unless otherwise noted. Parameter Sample Capacitor Digital Input/Output: Data Coding Format High Level Input Voltage Low Level Input Voltage High Level Output Voltage Low Level Output Voltage Input Leakage Current Output Leakage Current Pin Capacitance (All Inputs/Outputs) Timing Parameters: Clock Frequency Clock High Time Clock Low Time CS Fall To First Rising CLK Edge Data Input Setup Time Data Input Hold Time CLK Fall To Output Data Valid CLK Fall To Output Enable CS Rise To Output Disable CS Disable Time DOUT Rise Time DOUT Fall Time Sym Min. Typ. Max. Units CSAMPLE — 20 — pF VIH VIL VOH VOL ILI ILO CIN, COUT Straight Binary 0.7 VDD — — — — 0.3 VDD 4.1 — — — — 0.4 -10 — 10 -10 — 10 — — 10 fCLK — — tHI tLO tSUCS 250 250 100 tSU tHD tDO tEN tDIS V V V V µA µA pF — — — 1.8 0.9 — — — MHz MHz ns ns ns — — — — — — — — — — 50 50 200 200 100 ns ns ns ns ns tCSH tR 500 — — — — 100 ns ns tF — — 100 ns Conditions See Figure 4-1 IOH = -1 mA, VDD = 4.5V IOL = 1 mA, VDD = 4.5V VIN = VSS or VDD VOUT = VSS or VDD VDD = 5.0V (Note 1) TAMB = 25°C, f = 1 MHz VDD = 5V (Note 2) VDD = 2.7V (Note 2) See Test Circuits, Figure 1-2 See Test Circuits, Figure 1-2 See Test Circuits, Figure 1-2 Note 1 See Test Circuits, Figure 1-2 Note 1 See Test Circuits, Figure 1-2 Note 1 Power Requirements: 2.7 — 5.5 V Operating Voltage VDD Operating Current IDD — 375 550 µA VDD = 5.0V, DOUT unloaded — 0.5 5 µA CS = VDD = 5.0V Standby Current IDDS Temperature Ranges: Specified Temperature Range TA -40 — +85 °C -40 — +85 °C Operating Temperature Range TA Storage Temperature Range TA -65 — +150 °C Thermal Package Resistance: Thermal Resistance, 8L-PDIP θJA — 85 — °C/W Thermal Resistance, 8L-SOIC θJA — 163 — °C/W Thermal Resistance, 8L-MSOP θJA — 206 — °C/W θJA — — °C/W Thermal Resistance, 8L-TSSOP Note 1: This parameter is established by characterization and not 100% tested. 2: Because the sample cap will eventually lose charge, effective clock rates below 10 kHz can affect linearity performance, especially at elevated temperatures. See Section 6.2 for more information. © 2006 Microchip Technology Inc. DS21034D-page 3 MCP3202 tCSH CS tSUCS tLO tHI CLK tSU DIN tHD MSB IN tEN DOUT tR tDO tDIS MSB OUT NULL BIT FIGURE 1-1: tF LSB Serial Timing. Load circuit for tDIS and tEN Load circuit for tR, tF, tDO Test Point 1.4V VDD 3 kΩ Test Point DOUT 3 kΩ tDIS Waveform 2 VDD/2 tEN Waveform DOUT 100 pF CL = 100 pF Voltage Waveforms for tR, tF VOH VOL DOUT Voltage Waveforms for tEN CS tF tR tDIS Waveform 1 VSS 1 CLK 2 3 4 B11 DOUT tEN Voltage Waveforms for tDO Voltage Waveforms for tDIS CS CLK tDO VIH DOUT Waveform 1* DOUT 90% TDIS DOUT Waveform 2† 10% * Waveform 1 is for an output with internal conditions such that the output is high, unless disabled by the output control. † Waveform 2 is for an output with internal conditions such that the output is low, unless disabled by the output control. FIGURE 1-2: Test Circuits. DS21034D-page 4 © 2006 Microchip Technology Inc. MCP3202 2.0 TYPICAL PERFORMANCE CHARACTERISTICS Note: The graphs provided following this note are a statistical summary based on a limited number of samples and are provided for informational purposes only. The performance characteristics listed herein are not tested or guaranteed. In some graphs, the data presented may be outside the specified operating range (e.g., outside specified power supply range) and therefore outside the warranted range. Note: Unless otherwise indicated, VDD = 5V, VSS = 0V, fSAMPLE = 100 ksps, fCLK = 18* fSAMPLE,TA = 25°C 1.0 2.0 Positive INL 0.8 1.0 INL (LSB) 0.4 INL (LSB) VDD = 2.7V 1.5 0.6 0.2 0.0 -0.2 Negative INL -0.4 Positive INL 0.5 0.0 -0.5 Negative INL -1.0 -0.6 -1.5 -0.8 -2.0 -1.0 0 25 50 75 100 125 0 150 20 Sample Rate (ksps) FIGURE 2-1: Rate. Integral Nonlinearity (INL) vs. Sample 80 100 FIGURE 2-4: Integral Nonlinearity (INL) vs. Sample Rate (VDD = 2.7V). 1.0 FSAMPLE = 100 ksps 0.8 FSAMPLE = 50 ksps 0.8 Positive INL 0.6 Positive INL 0.6 0.4 INL (LSB) 0.4 0.2 0.0 -0.2 -0.4 Negative INL 0.2 0.0 -0.2 -0.4 -0.6 -0.6 -0.8 -0.8 Negative INL -1.0 -1.0 3.0 3.5 4.0 4.5 2.5 5.0 3.0 3.5 FIGURE 2-2: 4.0 4.5 5.0 VDD(V) VDD(V) Integral Nonlinearity (INL) vs. VDD. FIGURE 2-5: Integral Nonlinearity (INL) vs. VDD. 1.0 1.0 0.8 0.8 VDD = 2.7V 0.6 0.6 FSAMPLE = 50 ksps 0.4 0.4 INL (LSB) INL (LSB) 60 Sample Rate (ksps) 1.0 INL (LSB) 40 0.2 0.0 -0.2 -0.4 0.2 0.0 -0.2 -0.4 -0.6 -0.6 -0.8 -0.8 -1.0 -1.0 0 512 1024 1536 2048 2560 3072 3584 4096 Digital Code FIGURE 2-3: Integral Nonlinearity (INL) vs. Code (Representative Part). © 2006 Microchip Technology Inc. 0 512 1024 1536 2048 2560 3072 3584 4096 Digital Code FIGURE 2-6: Integral Nonlinearity (INL) vs. Code (Representative Part, VDD = 2.7V). DS21034D-page 5 MCP3202 Note: Unless otherwise indicated, VDD = 5V, VSS = 0V, fSAMPLE = 100 ksps, fCLK = 18* fSAMPLE,TA = 25°C 1.0 1.0 0.8 VDD = 2.7V 0.6 0.6 FSAMPLE = 50 ksps 0.4 0.4 Positive INL INL (LSB) INL (LSB) 0.8 0.2 0.0 Negative INL -0.2 0.2 0.0 -0.2 -0.4 -0.4 -0.6 -0.6 -0.8 -0.8 Negative INL -1.0 -1.0 -50 -25 0 25 50 75 -50 100 -25 FIGURE 2-7: Temperature. Integral Nonlinearity (INL) vs. 25 50 FIGURE 2-10: Integral Nonlinearity Temperature (VDD = 2.7V). 1.0 2.0 0.8 1.5 0.6 75 100 (INL) vs. V DD = 2.7V DNL (LSB) 1.0 0.4 DNL (LSB) 0 Temperature (°C) Temperature (°C) Positive DNL 0.2 0.0 -0.2 Negative DNL -0.4 Positive DNL 0.5 0.0 -0.5 Negative DNL -1.0 -0.6 -1.5 -0.8 -2.0 -1.0 0 25 50 75 100 125 150 0 20 FIGURE 2-8: Differential Sample Rate. 40 60 80 100 Sample Rate (ksps) Sample Rate (ksps) Nonlinearity (DNL) vs. FIGURE 2-11: Differential Sample Rate (VDD = 2.7V). Nonlinearity (DNL) vs. 1.0 1.0 FSAMPLE = 100 ksps 0.8 0.6 0.6 0.4 0.2 0.0 -0.2 -0.4 FSAMPLE = 50 ksps 0.8 Positive DNL DNL (LSB) DNL (LSB) Positive INL Negative DNL Positive DNL 0.4 0.2 0.0 -0.2 -0.4 -0.6 -0.6 -0.8 -0.8 Negative DNL -1.0 -1.0 3.0 3.5 4.0 4.5 5.0 VDD(V) FIGURE 2-9: Differential Nonlinearity (DNL) vs. VDD. DS21034D-page 6 2.5 3.0 3.5 4.0 4.5 5.0 VDD(V) FIGURE 2-12: Differential Nonlinearity (DNL) vs. VDD. © 2006 Microchip Technology Inc. MCP3202 1.0 1.0 0.8 0.8 V DD = 2.7V 0.6 0.6 FSAMPLE = 50 ksps 0.4 0.4 DNL (LSB) DNL (LSB) Note: Unless otherwise indicated, VDD = 5V, VSS = 0V, fSAMPLE = 100 ksps, fCLK = 18* fSAMPLE,TA = 25°C 0.2 0.0 -0.2 -0.4 0.2 0.0 -0.2 -0.4 -0.6 -0.6 -0.8 -0.8 -1.0 -1.0 0 512 1024 1536 2048 2560 3072 3584 4096 0 512 1024 1536 2048 2560 Digital Code Digital Code FIGURE 2-13: Differential Nonlinearity Code (Representative Part). (DNL) vs. FIGURE 2-16: Differential Nonlinearity Code (Representative Part, VDD = 2.7V). 1.0 1.0 0.8 0.8 V DD = 2.7V 0.6 FSAMPLE = 50 ksps Positive DNL DNL (LSB) DNL (LSB) 0.6 0.4 0.2 0.0 -0.2 Negative DNL -0.4 (DNL) vs. Positive DNL 0.4 0.2 0.0 -0.2 Negative DNL -0.4 -0.6 -0.6 -0.8 -0.8 -1.0 -1.0 -50 -25 0 25 50 75 -50 100 -25 Temperature (°C) FIGURE 2-14: Differential Temperature. 0 25 50 75 100 Temperature (°C) Nonlinearity (DNL) vs. FIGURE 2-17: Differential Temperature (VDD = 2.7V). Nonlinearity (DNL) vs. 2.0 2.0 1.8 1.5 FSAMPLE = 10 ksps 1.0 Offset Error (LSB) Gain Error (LSB) 3072 3584 4096 0.5 0.0 -0.5 -1.0 FSAMPLE = 100 ksps -1.5 FSAMPLE = 100 ksps 1.6 1.4 FSAMPLE = 50 ksps 1.2 1.0 0.8 0.6 FSAMPLE = 10 ksps 0.4 0.2 FSAMPLE = 50 ksps -2.0 0.0 2.5 3.0 3.5 4.0 VDD(V) FIGURE 2-15: Gain Error vs. VDD. © 2006 Microchip Technology Inc. 4.5 5.0 2.5 3.0 3.5 4.0 4.5 5.0 VDD(V) FIGURE 2-18: Offset Error vs. VDD. DS21034D-page 7 MCP3202 Note: Unless otherwise indicated, VDD = 5V, VSS = 0V, fSAMPLE = 100 ksps, fCLK = 18* fSAMPLE,TA = 25°C 1.0 2.0 1.8 V DD = 2.7V 0.6 Offset Error (LSB) Gain Error (LSB) 0.8 FSAMPLE = 50 ksps 0.4 0.2 0.0 -0.2 -0.4 -0.6 V DD = 5V -0.8 -50 -25 0 25 50 VDD = 5V 1.4 FSAMPLE = 100 ksps 1.2 1.0 0.8 VDD = 2.7V 0.6 FSAMPLE = 50 ksps 0.4 0.2 FSAMPLE = 100 ksps -1.0 1.6 75 0.0 -50 100 -25 0 FIGURE 2-19: Gain Error vs. Temperature. 75 100 FIGURE 2-22: Offset Error vs. Temperature. 100 100 90 VDD = 5V 90 80 FSAMPLE = 100 ksps 80 60 SINAD (dB) 70 SNR (dB) 50 Temperature (°C) Temperature (°C) VDD = 2.7V 50 FSAMPLE = 50 ksps 40 30 VDD = 5V FSAMPLE = 100 ksps 70 60 50 VDD = 2.7V 40 FSAMPLE = 50 ksps 30 20 20 10 10 0 0 1 10 100 1 10 Input Frequency (kHz) 100 Input Frequency (kHz) FIGURE 2-20: Signal to Noise Ratio (SNR) vs. Input Frequency. FIGURE 2-23: Signal to Noise and Distortion (SINAD) vs. Input Frequency. 0 80 -10 VDD = 5V 70 -20 FSAMPLE = 100 ksps 60 -40 VDD = 2.7V -50 FSAMPLE = 50 ksps SINAD (dB) -30 THD (dB) 25 -60 -70 -80 VDD = 5V -90 FSAMPLE = 100 ksps 50 VDD = 2.7V 40 FSAMPLE = 50 ksps 30 20 10 0 -100 1 10 100 Input Frequency (kHz) FIGURE 2-21: Total Harmonic Distortion (THD) vs. Input Frequency. DS21034D-page 8 -40 -35 -30 -25 -20 -15 -10 -5 0 Input Signal Level (dB) FIGURE 2-24: Signal to Noise and Distortion (SINAD) vs. Signal Level. © 2006 Microchip Technology Inc. MCP3202 Note: Unless otherwise indicated, VDD = 5V, VSS = 0V, fSAMPLE = 100 ksps, fCLK = 18* fSAMPLE,TA = 25°C 12.0 12.0 11.5 FSAMPLE = 100 ksps 11.0 ENOB (rms) ENOB (rms) VDD = 5V 11.5 FSAMPLE = 50ksps 11.0 FSAMPLE = 100 ksps 10.5 10.0 10.5 10.0 9.5 9.0 9.5 V DD = 2.7V 8.5 9.0 2.0 2.5 3.0 3.5 4.0 4.5 FSAMPLE = 50 ksps 8.0 5.0 1 10 VDD (V) FIGURE 2-25: Effective Number of Bits (ENOB) vs. VDD. FIGURE 2-28: Effective Number of Bits (ENOB) vs. Input Frequency. 0 VDD = 5V 90 FSAMPLE = 100 ksps SFDR (dB) 80 70 60 50 V DD = 2.7V 40 FSAMPLE = 50 ksps 30 20 10 0 1 10 100 Power Supply Rejection (dB) 100 -10 -20 -30 -40 -50 -60 -70 -80 1 10 Input Frequency (kHz) FIGURE 2-26: Spurious Free (SFDR) vs. Input Frequency. 0 -10 -20 -30 -40 -50 -60 -70 -80 -90 -100 -110 -120 -130 Dynamic Range FSAMPLE = 100 ksps FINPUT = 9.985 kHz 4096 points 10000 20000 30000 40000 50000 Frequency (Hz) FIGURE 2-27: Frequency Spectrum of 10 kHz input (Representative Part). © 2006 Microchip Technology Inc. 1000 10000 FIGURE 2-29: Power Supply Rejection (PSR) vs. Ripple Frequency. VDD = 5V 0 100 Ripple Frequency (kHz) Amplitude (dB) Amplitude (dB) 100 Input Frequency (kHz) 0 -10 -20 -30 -40 -50 -60 -70 -80 -90 -100 -110 -120 -130 VDD = 2.7V FSAMPLE = 50 ksps FINPUT = 998.76 Hz 4096 points 0 5000 10000 15000 20000 25000 Frequency (Hz) FIGURE 2-30: Frequency Spectrum of 1 kHz input (Representative Part, VDD = 2.7V). DS21034D-page 9 MCP3202 Note: Unless otherwise indicated, VDD = 5V, VSS = 0V, fSAMPLE = 100 ksps, fCLK = 18* fSAMPLE,TA = 25°C 500 80 All points at FCLK = 1.8 MHz except 450 400 60 IDDS (pA) 350 IDD (µA) CS = V DD 70 at VDD = 2.5V, FCLK = 900 kHz 300 250 200 150 50 40 30 20 100 10 50 0 0 2.0 2.5 3.0 3.5 4.0 4.5 5.0 5.5 2.0 6.0 2.5 3.0 3.5 4.0 4.5 5.0 5.5 6.0 VDD (V) VDD (V) FIGURE 2-34: IDDS vs. VDD. FIGURE 2-31: IDD vs. VDD. 100.00 500 450 VDD = CS = 5V 400 V DD = 5V 10.00 300 IDDS (nA) IDD (µA) 350 250 V DD = 2.7V 200 1.00 150 0.10 100 50 0 10 100 1000 0.01 10000 -50 -25 0 Clock Frequency (kHz) FIGURE 2-32: IDD vs. Clock Frequency. FCLK = 1.8 MHz 350 IDD (µA) 75 100 2.0 V DD = 5V Analog Input Leakage (nA) 400 50 FIGURE 2-35: IDDS vs. Temperature. 500 450 25 Temperature (°C) 300 250 200 VDD = 2.7V 150 FCLK = 900 kHz 100 50 0 -50 -25 0 25 50 Temperature (°C) FIGURE 2-33: IDD vs. Temperature. DS21034D-page 10 75 100 1.8 1.6 1.4 1.2 VDD = 5V 1.0 FCLK = 1.8 MHz 0.8 0.6 0.4 0.2 0.0 -50 -25 0 25 50 75 100 Temperature (°C) FIGURE 2-36: Analog Input leakage current vs. Temperature. © 2006 Microchip Technology Inc. MCP3202 3.0 PIN DESCRIPTIONS 4.1 3.1 CH0/CH1 The MCP3202 device offers the choice of using the analog input channels configured as two single-ended inputs or a single pseudo-differential input. Configuration is done as part of the serial command before each conversion begins. When used in the pseudo-differential mode, CH0 and CH1 are programmed as the IN+ and IN- inputs as part of the command string transmitted to the device. The IN+ input can range from IN- to VREF (VDD + IN-). The IN- input is limited to ±100 mV from the VSS rail. The IN- input can be used to cancel small signal common-mode noise which is present on both the IN+ and IN- inputs. Analog inputs for channels 0 and 1 respectively. These channels can programmed to be used as two independent channels in single ended-mode or as a single pseudo-differential input where one channel is IN+ and one channel is IN-. See Section 5.0 for information on programming the channel configuration. 3.2 Chip Select/Shutdown (CS/SHDN) The CS/SHDN pin is used to initiate communication with the device when pulled low and will end a conversion and put the device in low power standby when pulled high. The CS/SHDN pin must be pulled high between conversions. 3.3 Serial Clock (CLK) The SPI clock pin is used to initiate a conversion and to clock out each bit of the conversion as it takes place. See Section 6.2 for constraints on clock speed. 3.4 Serial Data Input (DIN) The SPI port serial data input pin is used to clock in input channel configuration data. 3.5 Serial Data Output (DOUT) The SPI serial data output pin is used to shift out the results of the A/D conversion. Data will always change on the falling edge of each clock as the conversion takes place. 4.0 DEVICE OPERATION The MCP3202 A/D Converter employs a conventional SAR architecture. With this architecture, a sample is acquired on an internal sample/hold capacitor for 1.5 clock cycles starting on the second rising edge of the serial clock after the start bit has been received. Following this sample time, the input switch of the converter opens and the device uses the collected charge on the internal sample and hold capacitor to produce a serial 12-bit digital output code. Conversion rates of 100 ksps are possible on the MCP3202. See Section 6.2 for information on minimum clock rates. Communication with the device is done using a 3-wire SPI-compatible interface. Analog Inputs For the A/D Converter to meet specification, the charge holding capacitor (CSAMPLE) must be given enough time to acquire a 12-bit accurate voltage level during the 1.5 clock cycle sampling period. The analog input model is shown in Figure 4-1. In this diagram, it is shown that the source impedance (RS) adds to the internal sampling switch (RSS) impedance, directly affecting the time that is required to charge the capacitor, CSAMPLE. Consequently, larger source impedances increase the offset, gain, and integral linearity errors of the conversion. Ideally, the impedance of the signal source should be near zero. This is achievable with an operational amplifier such as the MCP601 which has a closed loop output impedance of tens of ohms. The adverse affects of higher source impedances are shown in Figure 4-2. When operating in the pseudo-differential mode, if the voltage level of IN+ is equal to or less than IN-, the resultant code will be 000h. If the voltage at IN+ is equal to or greater than {[VDD + (IN-)] – 1 LSB}, then the output code will be FFFh. If the voltage level at IN- is more than 1 LSB below VSS, then the voltage level at the IN+ input will have to go below VSS to see the 000h output code. Conversely, if IN- is more than 1 LSB above VSS, then the FFFh code will not be seen unless the IN+ input level goes above VDD level. 4.2 Digital Output Code The digital output code produced by an A/D Converter is a function of the input signal and the reference voltage. For the MCP3202, VDD is used as the reference voltage. As the VDD level is reduced, the LSB size is reduced accordingly. The theoretical digital output code produced by the A/D Converter is shown below. 4096•V IN Digital Output Code = -----------------------V DD where: VIN = analog input voltage VDD = supply voltage © 2006 Microchip Technology Inc. DS21034D-page 11 MCP3202 VDD RSS VT = 0.6V CHx CPIN 7 pF VA Sampling Switch VT = 0.6V SS ILEAKAGE ±1 nA RS = 1 kΩ CSAMPLE = DAC capacitance = 20 pF VSS Legend VA RSS CHx CPIN VT ILEAKAGE SS RS CSAMPLE FIGURE 4-1: = = = = = = = = = signal source source impedance input channel pad input pin capacitance threshold voltage leakage current at the pin due to various junctions sampling switch sampling switch resistor sample/hold capacitance Analog Input Model. Clock Frequency (MHz) 2.0 1.8 VDD = 5V 1.6 1.4 1.2 1.0 0.8 0.6 V DD = 2.7V 0.4 0.2 0.0 100 1000 10000 Input Resistance (Ohms) FIGURE 4-2: Maximum Clock Frequency vs. Input Resistance (RS) to maintain less than a 0.1 LSB deviation in INL from nominal conditions. DS21034D-page 12 © 2006 Microchip Technology Inc. MCP3202 5.0 SERIAL COMMUNICATIONS 5.1 Overview Communication with the MCP3202 is done using a standard SPI-compatible serial interface. Initiating communication with the device is done by bringing the CS line low. See Figure 5-1. If the device was powered up with the CS pin low, it must be brought high and back low to initiate communication. The first clock received with CS low and DIN high will constitute a start bit. The SGL/DIFF bit and the ODD/SIGN bit follow the start bit and are used to select the input channel configuration. The SGL/DIFF is used to select single ended or psuedo-differential mode. The ODD/SIGN bit selects which channel is used in single ended mode, and is used to determine polarity in pseudo-differential mode. Following the ODD/SIGN bit, the MSBF bit is transmitted to and is used to enable the LSB first format for the device. If the MSBF bit is high, then the data will come from the device in MSB first format and any further clocks with CS low will cause the device to output zeros. If the MSBF bit is low, then the device will output the converted word LSB first after the word has been transmitted in the MSB first format. See Figure 5-2. Table 5-1 shows the configuration bits for the MCP3202. The device will begin to sample the analog input on the second rising edge of the clock, after the start bit has been received. The sample period will end on the falling edge of the third clock following the start bit. On the falling edge of the clock for the MSBF bit, the device will output a low null bit. The next sequential 12 clocks will output the result of the conversion with MSB first as shown in Figure 5-1. Data is always output from the device on the falling edge of the clock. If all 12 data bits have been transmitted and the device continues to receive clocks while the CS is held low, (and MSBF = 1), the device will output the conversion result LSB first as shown in Figure 5-2. If more clocks are provided to the device while CS is still low (after the LSB first data has been transmitted), the device will clock out zeros indefinitely. If necessary, it is possible to bring CS low and clock in leading zeros on the DIN line before the start bit. This is often done when dealing with microcontroller-based SPI ports that must send 8 bits at a time. Refer to Section 6.1 for more details on using the MCP3202 devices with hardware SPI ports. Config Bits Channel Selection GND Sgl/ Diff Odd/ sign Single Ended Mode 1 1 PseudoDifferentiaL Mode TABLE 5-1: 0 1 0 + — - 1 — + - 0 0 IN+ IN- 0 1 IN- IN+ Configuration Bits for the MCP3202. tCYC tCYC tCSH CS tSUCS CLK Start SGL/ ODD/ MS DIFF SIGN BF DIN HI-Z DOUT tSAMPLE Start SGL/ ODD/ DIFF SIGN Don’t Care Null Bit B11 B10 B9 B8 B7 B6 B5 B4 B3 B2 B1 B0* tCONV HI-Z tDATA** * After completing the data transfer, if further clocks are applied with CS low, the A/D Converter will output zeros indefinitely. See Figure 5-2 below for details on obtaining LSB first data. ** tDATA: during this time, the bias current and the comparator power down while the reference input becomes a high impedance node, leaving the CLK running to clock out the LSB-first data or zeros. FIGURE 5-1: Communication with the MCP3202 using MSB first format only. © 2006 Microchip Technology Inc. DS21034D-page 13 MCP3202 tCYC tCSH CS tSUCS Power Down HI-Z DOUT tSAMPLE MSBF SGL/ DIFF ODD/ SIGN DIN Start CLK Don’t Care Null B11 B10 B9 Bit B8 B7 B6 B5 B4 B3 B2 B1 B0 B1 B2 B3 B4 B5 B6 B7 B8 B9 *B10 B11 HI-Z (MSB) tCONV tDATA ** * After completing the data transfer, if further clocks are applied with CS low, the A/D Converter will output zeros indefinitely. ** tDATA: During this time, the bias circuit and the comparator power down while the reference input becomes a high impedance node, leaving the CLK running to clock out LSB first data or zeroes. FIGURE 5-2: Communication with MCP3202 using LSB first format. DS21034D-page 14 © 2006 Microchip Technology Inc. MCP3202 6.0 APPLICATIONS INFORMATION 6.1 Using the MCP3202 with Microcontroller (MCU) SPI Ports in the ‘low’ state, while Figure 6-2 shows the similar case of SPI Mode 1,1 where the clock idles in the ‘high’ state. As shown in Figure 6-1, the first byte transmitted to the A/D Converter contains seven leading zeros before the start bit. Arranging the leading zeros this way produces the output 12 bits to fall in positions easily manipulated by the MCU. The MSB is clocked out of the A/D Converter on the falling edge of clock number 12. After the second eight clocks have been sent to the device, the MCU receive buffer will contain three unknown bits (the output is at high impedance until the null bit is clocked out), the null bit and the highest order four bits of the conversion. After the third byte has been sent to the device, the receive register will contain the lowest order eight bits of the conversion results. Easier manipulation of the converted data can be obtained by using this method. With most microcontroller SPI ports, it is required to send groups of eight bits. It is also required that the microcontroller SPI port be configured to clock out data on the falling edge of clock and latch data in on the rising edge. Depending on how communication routines are used, it is very possible that the number of clocks required for communication will not be a multiple of eight. Therefore, it may be necessary for the MCU to send more clocks than are actually required. This is usually done by sending ‘leading zeros’ before the start bit, which are ignored by the device. As an example, Figure 6-1 and Figure 6-2 show how the MCP3202 can be interfaced to a MCU with a hardware SPI port. Figure 6-1 depicts the operation shown in SPI Mode 0,0, which requires that the SCLK from the MCU idles CS MCU latches data from A/D Converter on rising edges of SCLK SCLK 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 B5 B4 21 22 23 24 B2 B1 B0 X X ODD/ SIGN DIN SGL/ DIFF Start MSBF Data is clocked out of A/D Converter on falling edges Don’t Care HI-Z DOUT NULL B11 BIT B10 B9 B8 X X X B7 B6 B3 Start Bit MCU Transmitted Data (Aligned with falling edge of clock) MCU Received Data (Aligned with rising edge of clock) X X CS X X X X X X X X X X SGL/ ODD/ MSBF DIFF SIGN 1 X X X Data stored into MCU receive register after transmission of first 8 bits X = Don’t Care Bits FIGURE 6-1: X X X 0 B11 (Null) X B10 B9 X X B7 B8 Data stored into MCU receive register after transmission of second 8 bits X B6 X B5 X B4 X B3 B2 B1 X B0 Data stored into MCU receive register after transmission of last 8 bits SPI Communication using 8-bit segments (Mode 0,0: SCLK idles low). MCU latches data from A/D Converter on rising edges of SCLK 1 SCLK 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 B5 B4 B3 B2 B1 B0 MSBF SGL/ DIFF Start DIN ODD/ SIGN Data is clocked out of A/D Converter on falling edges Don’t Care HI-Z DOUT NULL B11 BIT B10 B9 X X B8 B6 B7 Start Bit MCU Transmitted Data (Aligned with falling edge of clock) 0 MCU Received Data (Aligned with rising edge of clock) 0 X 0 X 0 X 0 X X X SGL/ ODD/ MSBF DIFF SIGN 1 0 0 X X Data stored into MCU receive register after transmission of first 8 bits X X X X X 0 B11 (Null) B10 X X B9 B8 Data stored into MCU receive register after transmission of second 8 bits X B7 X B6 X B5 X B4 X B3 X B2 X B1 B0 Data stored into MCU receive register after transmission of last 8 bits X = Don’t Care Bits FIGURE 6-2: SPI Communication using 8-bit segments (Mode 1,1: SCLK idles high). © 2006 Microchip Technology Inc. DS21034D-page 15 MCP3202 6.2 Maintaining Minimum Clock Speed When the MCP3202 initiates the sample period, charge is stored on the sample capacitor. When the sample period is complete, the device converts one bit for each clock that is received. It is important for the user to note that a slow clock rate will allow charge to bleed off the sample cap while the conversion is taking place. At 85°C (worst case condition), the part will maintain proper charge on the sample capacitor for at least 1.2 ms after the sample period has ended. This means that the time between the end of the sample period and the time that all 12 data bits have been clocked out must not exceed 1.2 ms (effective clock frequency of 10 kHz). Failure to meet this criteria may induce linearity errors into the conversion outside the rated specifications. It should be noted that during the entire conversion cycle, the A/D Converter does not require a constant clock speed or duty cycle, as long as all timing specifications are met. 6.3 Buffering/Filtering the Analog Inputs If the signal source for the A/D Converter is not a low impedance source, it will have to be buffered or inaccurate conversion results may occur. It is also recommended that a filter be used to eliminate any signals that may be aliased back into the conversion results. This is illustrated in Figure 6-3 below where an op amp is used to drive the analog input of the MCP3202. This amplifier provides a low impedance output for the converter input and a low pass filter, which eliminates unwanted high frequency noise. Low pass (anti-aliasing) filters can be designed using Microchip’s interactive FilterLab™ software. FilterLab will calculate capacitor and resistor values, as well as, determine the number of poles that are required for the application. For more information on filtering signals, see the application note AN699 “Anti-Aliasing Analog Filters for Data Acquisition Systems. 6.4 Layout Considerations When laying out a printed circuit board for use with analog components, care should be taken to reduce noise wherever possible. A bypass capacitor should always be used with this device and should be placed as close as possible to the device pin. A bypass capacitor value of 0.1 µF is recommended. Digital and analog traces should be separated as much as possible on the board and no traces should run underneath the device or the bypass capacitor. Extra precautions should be taken to keep traces with high frequency signals (such as clock lines) as far as possible from analog traces. Use of an analog ground plane is recommended in order to keep the ground potential the same for all devices on the board. Providing VDD connections to devices in a “star” configuration can also reduce noise by eliminating current return paths and associated errors. See Figure 6-4. For more information on layout tips when using A/D Converters, refer to AN688 “Layout Tips for 12-Bit A/D Converter Applications” (DS00688). VDD Connection Device 4 Device 1 Device 3 Device 2 ” VDD 10 μF R1 VIN C1 MCP601 + R2 C2 FIGURE 6-4: VDD traces arranged in a ‘Star’ configuration in order to reduce errors caused by current return paths. 0.1 μF IN+ - MCP3202 IN- R3 R4 FIGURE 6-3: The MCP601 Operational Amplifier is used to implement a 2nd order anti-aliasing filter for the signal being converted by the MCP3202. DS21034D-page 16 © 2006 Microchip Technology Inc. MCP3202 7.0 PACKAGING INFORMATION 7.1 Package Marking Information 8-Lead PDIP (300 mil) MCP3202 e3 I/PNNN YYWW XXXXXXXX XXXXXNNN YYWW 8-Lead SOIC (150 mil) Example: MCP3202 e3 ISNYYWW NNN XXXXXXXX XXXXYYWW NNN Example: 8-Lead MSOP XXXXXX YWWNNN 3202I e3 YWWNNN Example: 8-Lead TSSOP XXXX YYWW NNN 3202 IYWW NNN Legend: XX...X Y YY WW NNN Customer-specific information Year code (last digit of calendar year) Year code (last 2 digits of calendar year) Week code (week of January 1 is week ‘01’) Alphanumeric traceability code Pb-free JEDEC designator for Matte Tin (Sn) This package is Pb-free. The Pb-free JEDEC designator (e3 ) can be found on the outer packaging for this package. e3 * Note: * Example: In the event the full Microchip part number cannot be marked on one line, it will be carried over to the next line, thus limiting the number of available characters for customer-specific information. Standard OTP marking consists of Microchip part number, year code, week code, facility code, mask rev#, and assembly code. © 2006 Microchip Technology Inc. DS21034D-page 17 MCP3202 8-Lead Plastic Dual In-line (P) – 300 mil Body (PDIP) Note: For the most current package drawings, please see the Microchip Packaging Specification located at http://www.microchip.com/packaging E1 D 2 n 1 α E A2 A L c A1 β B1 p eB B Units Dimension Limits n p INCHES* NOM 8 .100 .155 .130 MAX MILLIMETERS NOM 8 2.54 3.56 3.94 2.92 3.30 0.38 7.62 7.94 6.10 6.35 9.14 9.46 3.18 3.30 0.20 0.29 1.14 1.46 0.36 0.46 7.87 9.40 5 10 5 10 MAX Number of Pins Pitch Top to Seating Plane A .140 .170 4.32 Molded Package Thickness A2 .115 .145 3.68 Base to Seating Plane .015 A1 Shoulder to Shoulder Width E .300 .313 .325 8.26 Molded Package Width E1 .240 .250 .260 6.60 Overall Length D .360 .373 .385 9.78 Tip to Seating Plane L .125 .130 .135 3.43 c Lead Thickness .008 .012 .015 0.38 Upper Lead Width B1 .045 .058 .070 1.78 Lower Lead Width B .014 .018 .022 0.56 Overall Row Spacing § eB .310 .370 .430 10.92 α Mold Draft Angle Top 5 10 15 15 β Mold Draft Angle Bottom 5 10 15 15 * Controlling Parameter § Significant Characteristic Notes: Dimensions D and E1 do not include mold flash or protrusions. Mold flash or protrusions shall not exceed .010” (0.254mm) per side. JEDEC Equivalent: MS-001 Drawing No. C04-018 DS21034D-page 18 MIN MIN © 2006 Microchip Technology Inc. MCP3202 8-Lead Plastic Small Outline (SN) – Narrow, 150 mil Body (SOIC) Note: For the most current package drawings, please see the Microchip Packaging Specification located at http://www.microchip.com/packaging E E1 p D 2 B n 1 h α 45° c A2 A φ β L Units Dimension Limits n p INCHES* NOM 8 .050 .061 .056 .007 .237 .154 .193 .015 .025 4 .009 .017 12 12 MAX MILLIMETERS NOM 8 1.27 1.35 1.55 1.32 1.42 0.10 0.18 5.79 6.02 3.71 3.91 4.80 4.90 0.25 0.38 0.48 0.62 0 4 0.20 0.23 0.33 0.42 0 12 0 12 MAX Number of Pins Pitch Overall Height A .053 .069 1.75 Molded Package Thickness A2 .052 .061 1.55 Standoff § A1 .004 .010 0.25 Overall Width E .228 .244 6.20 Molded Package Width E1 .146 .157 3.99 Overall Length D .189 .197 5.00 Chamfer Distance h .010 .020 0.51 Foot Length L .019 .030 0.76 φ Foot Angle 0 8 8 c Lead Thickness .008 .010 0.25 Lead Width B .013 .020 0.51 α Mold Draft Angle Top 0 15 15 β Mold Draft Angle Bottom 0 15 15 * Controlling Parameter § Significant Characteristic Notes: Dimensions D and E1 do not include mold flash or protrusions. Mold flash or protrusions shall not exceed .010” (0.254mm) per side. JEDEC Equivalent: MS-012 Drawing No. C04-057 © 2006 Microchip Technology Inc. MIN A1 MIN DS21034D-page 19 MCP3202 8-Lead Plastic Micro Small Outline Package (MS) [MSOP] Note: For the most current package drawings, please see the Microchip Packaging Specification located at http://www.microchip.com/packaging D N E E1 NOTE 1 1 2 e b A2 A ϕ c L1 A1 Number of Pins Pitch Overall Height Molded Package Standoff Overall Width Molded Package Overall Length Foot Length Footprint Foot Angle Lead Thickness Lead Width Units Dimension Limits N e A Thickness A2 A1 E Width E1 D L L1 ϕ c b MIN — 0.75 0.00 0.40 0° 0.08 0.22 MILLIMETERS NOM 8 0.65 BSC — 0.85 — 4.90 BSC 3.00 BSC 3.00 BSC 0.60 0.95 REF — — — L MAX 1.10 0.95 0.15 0.80 8° 0.23 0.40 Notes: 1. Pin 1 visual index feature may vary, but must be located within the hatched area. 2. Dimensions D and E1 do not include mold flash or protrusions. Mold flash or protrusions shall not exceed 0.15 mm per side. 3. Dimensioning and tolerancing per ASME Y14.5M BSC: Basic Dimension. Theoretically exact value shown without tolerances. REF: Reference Dimension, usually without tolerance, for information purposes only. Microchip Technology Drawing No. C04–111, Sept. 8, 2006 DS21034D-page 20 © 2006 Microchip Technology Inc. MCP3202 8-Lead Plastic Thin Shrink Small Outline (ST) – 4.4 mm Body (TSSOP) Note: For the most current package drawings, please see the Microchip Packaging Specification located at http://www.microchip.com/packaging E E1 e D 2 1 n b α c ϕ A β L Units Dimension Limits Number of Pins n Pitch e Overall Height A Molded Package Thickness A2 Standoff A1 Overall Width E Molded Package Width E1 Molded Package Length D Foot Length L Foot Angle ϕ Lead Thickness c Lead Width b Mold Draft Angle Top α Mold Draft Angle Bottom β A2 A1 MIN – .031 .002 .169 .114 .018 0° .004 .007 INCHES NOM 8 .026 BSC – .039 – .252 BSC .173 .118 .024 – – – 12° REF 12° REF MAX .047 .041 .006 .177 .122 .030 8° .008 .012 MILLIMETERS* NOM MAX 8 0.65 BSC – – 1.20 0.80 1.00 1.05 0.05 – 0.15 6.40 BSC 4.30 4.40 4.50 2.90 3.00 3.10 0.45 0.60 0.75 0° – 8° 0.09 – 0.20 0.19 – 0.30 12° REF 12° REF MIN *Controlling Parameter Notes: 1. Dimension D and E1 do not include mold flash or protrusions. Mold flash or protrusions shall not exceed .005" (0.127mm) per side. BSC: Basic Dimension. Theoretically exact value shown without tolerances. See ASME Y14.5M REF: Reference Dimension, usually without tolerance, for information purposes only. See ASME Y14.5M Drawing No. C04-086 Revised 7-25-06 © 2006 Microchip Technology Inc. DS21034D-page 21 MCP3202 NOTES: DS21034D-page 22 © 2006 Microchip Technology Inc. MCP3202 PRODUCT IDENTIFICATION SYSTEM To order or obtain information, e.g., on pricing or delivery, refer to the factory or the listed sales office. PART NO. X X /XX Device Performance Grade Temperature Range Package Device: Performance Grade: MCP3202: 12-Bit Serial A/d Converter MCP3202T: 12-Bit Serial A/D Converter (Tape and Reel) (SOIC, MSOP and TSSOP package only) B C = ±1 LSB INL (TSSOP not available) = ±2 LSB INL Temperature Range: I = -40°C to +85°C Package: MS P SN ST = = = = Examples: a) MCP3202-I/MS: = Industrial temperature, MSOP package. b) MCP3202-BI/P: = B Performance grade, industrial temp., PDIP package c) MCP3202-CI/SN: = C Performance grade, industrial temp., SOIC package d) MCP3202T-BI/SN: = Tape and Reel, B Performance grade, industrial temp., SOIC package a) MCP3202T-CI/ST: = Tape and Reel, C Performance grade, industrial temp., TSSOP package. Plastic Micro Small Outline (MSOP), 8-Lead Plastic DIP (300 mil Body), 8-Lead Plastic SOIC (150 mil Body), 8-Lead TSSOP (4.4 mm Body), 8-Lead (C Grade only) © 2001 Microchip Technology Inc. DS21034C-page23 MCP3202 NOTES: DS21034C-page24 © 2001 Microchip Technology Inc. MCP3202 APPENDIX A: REVISION HISTORY Revision D (December 2006) This revision includes updates to the packaging diagrams. © 2006 Microchip Technology Inc. DS21034D-page 25 NOTES: DS21034D-page 26 © 2006 Microchip Technology Inc. Note the following details of the code protection feature on Microchip devices: • Microchip products meet the specification contained in their particular Microchip Data Sheet. • Microchip believes that its family of products is one of the most secure families of its kind on the market today, when used in the intended manner and under normal conditions. • There are dishonest and possibly illegal methods used to breach the code protection feature. All of these methods, to our knowledge, require using the Microchip products in a manner outside the operating specifications contained in Microchip’s Data Sheets. Most likely, the person doing so is engaged in theft of intellectual property. • Microchip is willing to work with the customer who is concerned about the integrity of their code. • Neither Microchip nor any other semiconductor manufacturer can guarantee the security of their code. Code protection does not mean that we are guaranteeing the product as “unbreakable.” Code protection is constantly evolving. We at Microchip are committed to continuously improving the code protection features of our products. Attempts to break Microchip’s code protection feature may be a violation of the Digital Millennium Copyright Act. If such acts allow unauthorized access to your software or other copyrighted work, you may have a right to sue for relief under that Act. Information contained in this publication regarding device applications and the like is provided only for your convenience and may be superseded by updates. It is your responsibility to ensure that your application meets with your specifications. MICROCHIP MAKES NO REPRESENTATIONS OR WARRANTIES OF ANY KIND WHETHER EXPRESS OR IMPLIED, WRITTEN OR ORAL, STATUTORY OR OTHERWISE, RELATED TO THE INFORMATION, INCLUDING BUT NOT LIMITED TO ITS CONDITION, QUALITY, PERFORMANCE, MERCHANTABILITY OR FITNESS FOR PURPOSE. Microchip disclaims all liability arising from this information and its use. Use of Microchip devices in life support and/or safety applications is entirely at the buyer’s risk, and the buyer agrees to defend, indemnify and hold harmless Microchip from any and all damages, claims, suits, or expenses resulting from such use. No licenses are conveyed, implicitly or otherwise, under any Microchip intellectual property rights. Trademarks The Microchip name and logo, the Microchip logo, Accuron, dsPIC, KEELOQ, microID, MPLAB, PIC, PICmicro, PICSTART, PRO MATE, PowerSmart, rfPIC, and SmartShunt are registered trademarks of Microchip Technology Incorporated in the U.S.A. and other countries. AmpLab, FilterLab, Migratable Memory, MXDEV, MXLAB, SEEVAL, SmartSensor and The Embedded Control Solutions Company are registered trademarks of Microchip Technology Incorporated in the U.S.A. Analog-for-the-Digital Age, Application Maestro, CodeGuard, dsPICDEM, dsPICDEM.net, dsPICworks, ECAN, ECONOMONITOR, FanSense, FlexROM, fuzzyLAB, In-Circuit Serial Programming, ICSP, ICEPIC, Linear Active Thermistor, Mindi, MiWi, MPASM, MPLIB, MPLINK, PICkit, PICDEM, PICDEM.net, PICLAB, PICtail, PowerCal, PowerInfo, PowerMate, PowerTool, REAL ICE, rfLAB, rfPICDEM, Select Mode, Smart Serial, SmartTel, Total Endurance, UNI/O, WiperLock and ZENA are trademarks of Microchip Technology Incorporated in the U.S.A. and other countries. SQTP is a service mark of Microchip Technology Incorporated in the U.S.A. All other trademarks mentioned herein are property of their respective companies. © 2006, Microchip Technology Incorporated, Printed in the U.S.A., All Rights Reserved. Printed on recycled paper. Microchip received ISO/TS-16949:2002 certification for its worldwide headquarters, design and wafer fabrication facilities in Chandler and Tempe, Arizona, Gresham, Oregon and Mountain View, California. The Company’s quality system processes and procedures are for its PIC® 8-bit MCUs, KEELOQ® code hopping devices, Serial EEPROMs, microperipherals, nonvolatile memory and analog products. In addition, Microchip’s quality system for the design and manufacture of development systems is ISO 9001:2000 certified. © 2006 Microchip Technology Inc. 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