DICE/DWF SPECIFICATION LT1007 Low Noise, High Speed Precision Op Amp 6 4 PAD FUNCTION 7 1. 2. 3. 4. 5. 6. 7. 8. VOS TRIM –IN +IN V– NO CONNECT OUT V+ VOS TRIM 3 2 8 DIE CROSS REFERENCE LTC Finished Part Number Order Part Number LT1007C LT1007CDICE LT1007C LT1007CDWF* Please refer to LTC standard product data sheet for other applicable product information. *DWF = DICE in wafer form. Backside (substrate) is an alloyed gold layer. Connect to V– 1 99mils × 83mils, 12mils thick L, LT, LTC, LTM, Linear Technology and the Linear logo are registered trademarks of Linear Technology Corporation. All other trademarks are the property of their respective owners. DICE/DWF ELECTRICAL TEST LIMITS SYMBOL PARAMETER CONDITIONS (Note 1) VOS Input Offset Voltage IOS Input Offset Current IB Input Bias Current VS = ±15V, VCM = 0V, TA = 25°C. Input Voltage Range CMRR Common Mode Rejection Ratio MIN MAX UNITS 60 μV 50 nA ±55 nA ±11.0 V VCM = ±11 110 dB PSRR Power Supply Rejection Ratio VS = ±4V to ±18V 106 dB AVOL Large-Signal Voltage Gain RL ≥ 2k, VO = ±12V RL ≥ 1k, VO = ±10V 5 3.5 V/μV V/μV VOUT Maximum Output Voltage Swing RL ≥ 2k RL ≥ 600Ω SR Slew Rate RL ≥ 2k IS Supply Current ±12.5 ±10.5 V V 1.7 V/μs 4.7 mA Note 1: Input offset voltage measurements are performed by automatic equipment, approximately 0.5 seconds after application of power. 1007dice/dwffa Information furnished by Linear Technology Corporation is believed to be accurate and reliable. However, no responsibility is assumed for its use. Linear Technology Corporation makes no representation that the interconnection of its circuits as described herein will not infringe on existing patent rights. 1 DICE/DWF SPECIFICATION LT1007 Wafer level testing is performed per the indicated specifications for dice. Considerable differences in performance can often be observed for dice versus packaged units due to the influences of packaging and assembly on certain devices and/or parameters. Please consult factory for more information on dice performance and lot qualifications via lot sampling test procedures. Dice data sheet subject to change. Please consult factory for current revision in production. 1007dice/dwffa 2 Linear Technology Corporation I.D.No. 66-13-1007 • LT 1009 REV A • PRINTED IN USA 1630 McCarthy Blvd., Milpitas, CA 95035-7417 (408) 432-1900 ● FAX: (408) 434-0507 ● www.linear.com © LINEAR TECHNOLOGY CORPORATION 2009