ON ADM1025AARQZ Low cost pc hardware monitor asic Datasheet

Low Cost PC
Hardware Monitor ASIC
ADM1025/ADM1025A
Preliminary Technical Data
FEATURES
PRODUCT DESCRIPTION
Up to 8 measurement channels
5 inputs to measure supply voltages
VCC monitored internally
External temperature measurement with remote diode
On-chip temperature sensor
5 digital inputs for VID bits
Integrated 100 kΩ pull-ups on VID pins (ADM1025 only)
LDCM support
I2C® compatible system management bus (SMBus)
Programmable RST output pin
Programmable INT output pin
Configurable offset for internal/external channel
Shutdown mode to minimize power consumption
Limit comparison of all monitored values
The ADM1025/ADM1025A1 is a complete system hardware
monitor for microprocessor-based systems, providing measurement and limit comparison of various system parameters. Five
voltage measurement inputs are provided for monitoring 2.5 V,
3.3 V, 5 V, and 12 V power supplies and the processor core
voltage. The ADM1025/ADM1025A can monitor a sixth power
supply voltage by measuring its own VCC. One input (two pins)
is dedicated to a remote temperature-sensing diode, and an onchip temperature sensor allows ambient temperature to be
monitored. The ADM1025A has open-drain VID inputs while
the ADM1025 has on-chip 100 kΩ pull-ups on the VID inputs.
Measured values and in/out of limit status can be read out via
an I2C compatible serial System Management Bus. The device
can be controlled and configured over the same serial bus. The
device also has a programmable INT output to indicate
undervoltage, overvoltage, and overtemperature conditions.
APPLICATIONS
Network servers and personal computers
Microprocessor-based office equipment
Test equipment and measuring instruments
The ADM1025/ADM1025A’s 3.0 V to 5.5 V supply voltage
range, low supply current, and I2C compatible interface make it
ideal for a wide range of applications. These include hardware
monitoring and protection applications in personal computers,
electronic test equipment, and office electronics.
FUNCTIONAL BLOCK DIAGRAM
Figure 1.
1
2
Patent Pending. Purchase of licensed I C components of Analog Devices or one of its sublicensed Associated Companies conveys a license for the purchaser under the
Philips I 2C Patent Rights to use these components in an I2C system, provided that the system conforms to the I2C Standard Specification as defined by Philips.
©2008 SCILLC. All rights reserved.
February 2008 – Rev. P5
Publication Order Number:
ADM1025/D
Preliminary Technical Data
ADM1025/ADM1025A
TABLE OF CONTENTS
Features...............................................................................................1
Internal Temperature Measurement ........................................13
Applications .......................................................................................1
External Temperature Measurement........................................13
Product Description .........................................................................1
Layout Considerations ...................................................................14
Functional Block Diagram...............................................................1
Limit Values .................................................................................14
Revision History................................................................................2
Status Registers............................................................................14
Specifications .....................................................................................3
Monitoring Cycle Time..............................................................14
Absolute Maximum Ratings ............................................................5
Input Safety ..................................................................................14
Thermal Characteristics...............................................................5
Layout and Grounding...............................................................15
ESD Caution ..................................................................................5
RST/INT Output .........................................................................15
Pin Configuration and Function Descriptions .............................6
Genterating an SMBALERT ......................................................15
Typical Performance Characteristics..............................................7
NAND Tree Tests ........................................................................16
General Description..........................................................................9
Using the ADM1025/ADM1025A................................................17
Measurement Inputs .....................................................................9
Power-On Reset ..........................................................................17
Sequential Measurement..............................................................9
Initialization ................................................................................17
Processor Voltage ID ....................................................................9
Using the Configuration Register.............................................17
ADD/RST/INT/NTO ...................................................................9
Using the Offset Register ...........................................................17
Internal Registers of the ADM1025/ADM1025A.....................9
Starting Conversion....................................................................17
Serial Bus Interface .......................................................................9
Reduced Power and Shutdown Mode ......................................17
Measurement Inputs ...................................................................11
5 V Operation..............................................................................17
A/D Converter.............................................................................11
Registers ...........................................................................................18
Input Circuits...............................................................................12
Outline Dimensions........................................................................21
Temperature Measurement System ..............................................13
Ordering Guide ...........................................................................21
REVISION HISTORY
02/08—Rev P5: Conversion to ON Semiconductor
x/07—Rev. C to Rev. D
4/03—Rev. B to Rev. C
10/02—Rev. A to Rev. B
11/99—Revision 0: Initial Version
Rev. P5 | Page 2 of 21| www.onsemi.com
Preliminary Technical Data
ADM1025/ADM1025A
SPECIFICATIONS
TA = TMIN to TMAX, VCC = VMIN to VMAX, unless otherwise noted.
Table 1.
Parameter
POWER SUPPLY
Supply Voltage, VCC1
Supply Current, ICC2
Min
Typ
Max
Unit
Test Conditions/Comments
3.0
3.30
1.4
32
5.5
2.5
500
V
mA
μA
Interface Inactive, ADC Active
Standby Mode
±3
°C
°C
°C
°C
°C
μA
μA
TEMPERATURE-TO-DIGITAL CONVERTER
Internal Sensor Accuracy
Resolution
External Diode Sensor Accuracy
1
±5
±3
Resolution
Remote Sensor Source Current
1
180
11
ANALOG-TO-DIGITAL CONVERTER (INCLUDING MUX AND
ATTENUATORS)
Total Unadjusted Error, TUE3
Differential Nonlinearity, DNL
Power Supply Sensitivity
Conversion Time (Analog Input or Internal Temperature)4
Conversion Time (External Temperature)4
Input Resistance (2.5 V, 3.3 V, 5 V, 12 V, VCCPIN)
OPEN-DRAIN DIGITAL OUTPUT ADD/RST/INT/NTO
±2
±1
80
Output Low Voltage, VOL
High Level Output Leakage Current, IOH
RST Pulsewidth
OPEN-DRAIN SERIAL DATABUS OUTPUT (SDA)
Output Low Voltage, VOL
High Level Output Leakage Current, IOH
SERIAL BUS DIGITAL INPUTS (SCL, SDA)
Input High Voltage, VIH
Input Low Voltage, VIL
Hysteresis
DIGITAL INPUT LOGIC LEVELS (ADD, VID0–VID4, NTI)5
VID0–VID3 Input Resistance
VID4 Input Resistance
Input High Voltage, VIH6
Input Low Voltage, VIL6
DIGITAL INPUT LEAKAGE CURRENT
Input High Current, IIH
Input Low Current, IIL
Input Capacitance, CIN
60°C ≤ TA ≤ 100°C; VCC = 3.3 V
High Level
Low Level
±1
11.6
34.8
140
250
%
LSB
%/V
ms
ms
kΩ
0.1
20
0.4
1
45
V
μA
ms
IOUT = −6.0 mA; VCC = 3 V
VOUT = VCC; VCC = 3 V
0.1
0.4
1
V
μA
IOUT = –6.0 mA; VCC = 3 V
VOUT = VCC
0.8
V
V
mV
2.1
500
100
300
100
2.1
0.8
−1
+1
5
Rev. P5 | Page 3 of 21| www.onsemi.com
kΩ
kΩ
kΩ
V
V
ADM1025 Only
ADM1025 Only
ADM1025A
μA
μA
pF
VIN = VCC
VIN = 0
Preliminary Technical Data
ADM1025/ADM1025A
Parameter
SERIAL BUS TIMING
Clock Frequency, fSCLK
Glitch Immunity, tSW
Bus Free Time, tBUF
Start Setup Time, tSU:STA
Start Hold Time, tHD:STA
Stop Condition Setup Time, tSU:STO
SCL Low Time, tLOW
SCL High Time, tHIGH
SCL, SDA Rise Time, tR
SCL, SDA Fall Time, tF
Data Setup Time, tSU:DAT
Data Hold Time, tHD:DAT
Min
Typ
Max
Unit
Test Conditions/Comments
400
kHz
ns
μs
ns
ns
ns
μs
μs
ns
ns
ns
ns
See Figure 2
See Figure 2
See Figure 2
See Figure 2
See Figure 2
See Figure 2
See Figure 2
See Figure 2
See Figure 2
See Figure 2
See Figure 2
See Figure 2
50
1.3
600
600
600
1.3
0.6
300
300
100
300
1
All voltages are measured with respect to GND, unless otherwise specified.
Typicals are at TA = 25°C and represent most likely parametric norm. Shutdown current typ is measured with VCC = 3.3 V.
3
TUE (Total Unadjusted Error) includes Offset, Gain, and Linearity errors of the ADC, multiplexer, and on-chip input attenuators, including an external series input
protection resistor value between zero and 1 kΩ.
4
Total monitoring cycle time is nominally 114.4 ms. Monitoring Cycle consists of 6 Voltage + 1 Internal Temperature + 1 External Temperature readings.
5
ADD is a three-state input that may be pulled high, low, or left open-circuit.
6
Timing specifications are tested at logic levels of VIL = 0.8 V for a falling edge and VIH = 2.2 V for a rising edge.
2
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Preliminary Technical Data
ADM1025/ADM1025A
ABSOLUTE MAXIMUM RATINGS
Table 2.
Parameter
Positive Supply Voltage (VCC)
Voltage on 12 V VIN Pin
Voltage on Any Input or Output Pin
Input Current at Any Pin
Package Input Current
Maximum Junction Temperature (TJ max)
Storage Temperature Range
Lead Temperature, Soldering
Vapor Phase 60 sec
Infrared 15 sec
ESD Rating All Pins
Rating
6.5 V
20 V
−0.3 V to +6.5 V
±5 mA
±20 mA
150°C
–65°C to +150°C
215°C
200°C
2000 V
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
THERMAL CHARACTERISTICS
16-Lead QSOP Package:
θJA = 105°C/W
θJC = 39°C/W
ESD CAUTION
Figure 2. Diagram for Serial Bus Timing
Rev. P5 | Page 5 of 21| www.onsemi.com
Preliminary Technical Data
ADM1025/ADM1025A
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS
Figure 3.Pin Configuration
Table 3. Pin Function Descriptions
Pin
No.
1
Mnemonic
SDA
Description
Digital I/O. Serial bus bidirectional data. Open-drain output.
2
3
4
SCL
GND
VCC
5
VID0
6
VID1
7
VID2
8
VID3
9
D−/NTI
10
11
D+
12VIN/VID4
12
13
14
15
16
5VIN
3.3VIN
2.5VIN
VCCPIN
ADD/RST/INT/NTO
Digital Input. Serial bus clock.
System Ground
Power. Can be powered by 3.3 V standby power if monitoring in low power states is required. This pin also
serves as the analog input to monitor VCC.
Digital Input. Core voltage ID readouts from the processor. This value is read into the VID0−VID3 Status
Register. It has an on-chip 100 kΩ pull-up resistor (ADM1025 only).
Digital Input. Core voltage ID readouts from the processor. This value is read into the VID0−VID3 Status
Register. It has an on-chip 100 kΩ pull-up resistor (ADM1025 only).
Digital Input. Core voltage ID readouts from the processor. This value is read into the VID0−VID3 Status
Register. It has an on-chip 100 kΩ pull-up resistor (ADM1025 only).
Digital Input. Core voltage ID readouts from the processor. This value is read into the VID0−VID3 Status
Register. It has an on-chip 100 kΩ pull-up resistor (ADM1025 only).
Analog/Digital Input. Connected to cathode of external temperature sensing diode. If held high at power-up, it
initiates NAND tree test mode.
Analog Input. Connected to anode of external temperature sensing diode.
Programmable Analog/Digital Input. Defaults to 12 VIN analog input at power-up but may be pro-grammed as
VID4 Core Voltage ID readout from the processor. This value is read into the VID4 Status Register. In analog 12
VIN mode, it has an on-chip voltage attenuator. In VID4 mode, it has an on-chip 300 kΩ pull-up resistor.
Analog Input. Monitors 5 V supply.
Analog Input. Monitors 3.3 V supply.
Analog Input. Monitors 2.5 V supply.
Analog Input. Monitors processor core voltage (0 V to 3.0 V).
Programmable Digital I/O. The lowest order programmable bit of the SMBus Address, sampled on SMB activity
as a three-state input. Can also be configured to give a minimum 20 ms low reset output pulse. Alternatively, it
can be programmed as an interrupt output for temperature/voltage interrupts. Functions as the output of the
NAND tree in NAND tree test mode.
Rev. P5 | Page 6 of 21| www.onsemi.com
Preliminary Technical Data
ADM1025/ADM1025A
TYPICAL PERFORMANCE CHARACTERISTICS
Figure 4. Temperature Error vs. PC Board Track Resistance
Figure 7. Pentium II® Temperature Measurement vs. ADM1025/ADM1025A
Reading
Figure 5. Temperature Error vs. Power Supply Noise Frequency
Figure 8. Temperature Error vs. Capacitance between D+ and D−
Figure 6. Temperature Error vs. Common-Mode Noise Frequency
Figure 9. Temperature Error vs. Differential-Mode Noise Frequency
Pentium II is a registered trademark of Intel Corporation
Rev. P5 | Page 7 of 21| www.onsemi.com
Preliminary Technical Data
ADM1025/ADM1025A
Figure 10. Standby Current vs. Temperature
Rev. P5 | Page 8 of 21| www.onsemi.com
Preliminary Technical Data
ADM1025/ADM1025A
GENERAL DESCRIPTION
The ADM1025/ADM1025A is a complete system hardware
monitor for microprocessor-based systems. The device
communicates with the system via a serial System Management
Bus. The serial bus controller has a hardwired address line for
device selection (Pin 16), a serial data line for reading and
writing addresses and data (Pin 1), and an input line for the
serial clock (Pin 2). All control and programming functions of
the ADM1025/ADM1025A are performed over the serial bus.
MEASUREMENT INPUTS
The device has six measurement inputs, five for voltage and one
for temperature. It can also measure its own supply voltage and
can measure ambient temperature with its on-chip temperature
sensor.
Pins 11 through 15 are analog inputs with on-chip attenuators
configured to monitor 12 V, 5 V, 3.3 V, 2.5 V, and the processor
core voltage, respectively. Pin 11 may alternatively be
programmed as a digital input for Bit 4 of the processor voltage
ID code.
Power is supplied to the chip via Pin 4, and the system also
monitors the voltage on this pin.
bits of the serial bus address. During board-level, NAND tree
connectivity testing, this pin functions as the output of the
NAND tree. During normal operation, Pin 16 may be
programmed as a reset output to provide a low going 20 ms
reset pulse when enabled, or it may be programmed as an
interrupt output for out-of-limit temperature and/or voltage
events. These functions are described in more detail later.
INTERNAL REGISTERS OF THE
ADM1025/ADM1025A
A brief description of the ADM1025/ADM1025A’s principal
internal registers is given below. More detailed information on
the function of each register is given in Table 8 to Table 18.
Configuration Register: Provides control and configuration.
Address Pointer Register: This register contains the address
that selects one of the other internal registers. When writing to
the ADM1025/ADM1025A, the first byte of data is always a
register address, which is written to the Address Pointer
Register.
Status Registers: Two registers to provide status of each limit
comparison.
Remote temperature sensing is provided by the D+ and D−
inputs, to which a diode-connected, external temperaturesensing transistor may be connected.
VID Registers: The status of the VID0 to VID4 pins of the
processor can read from these registers.
An on-chip band gap temperature sensor monitors system
ambient temperature.
Value and Limit Registers: The results of analog voltage inputs
and temperature measurements are stored in these registers,
along with their limit values.
SEQUENTIAL MEASUREMENT
When the ADM1025/ADM1025A monitoring sequence is
started, it cycles sequentially through the measurement of
analog inputs and the temperature sensors. Measured values
from these inputs are stored in Value Registers. These can be
read out over the serial bus or can be compared with
programmed limits stored in the Limit Registers. The results of
out-of-limit comparisons are stored in the Status Registers,
which can be read over the serial bus to flag out of limit
conditions.
PROCESSOR VOLTAGE ID
Five digital inputs (VID4 to VID0—Pins 5 to 8 and 11) read the
processor voltage ID code and store it in the VID registers, from
which it can be read out by the management system over the
serial bus. If Pin 11 is configured as a 12 V analog input (powerup default), the VID4 bit in the VID4 register will default to 0.
The VID pins have internal 100 kΩ pull-up resistors (ADM1025
only).
ADD/RST/INT/NTO
Pin 16 is a programmable digital I/O pin. After power-up, at the
first sign of SMBus activity, it is sampled to set the lowest two
Offset Register: Allows either an internal or external
temperature channel reading to be offset by a twos complement
value written to this register.
SERIAL BUS INTERFACE
Control of the ADM1025/ADM1025A is carried out via the
serial bus. The ADM1025/ADM1025A is connected to this bus
as a slave device, under the control of a master device or master
controller.
The ADM1025/ADM1025A has a 7-bit serial bus address.
When the device is powered up, it will do so with a default
serial bus address. The five MSBs of the address are set to
01011; the two LSBs are determined by the logical states of Pin
16 at power-up. This is a three-state input that can be grounded,
connected to VCC, or left open-circuit to give three different
addresses:
Table 4. Address Selection
ADD Pin
GND
A1
0
A0
0
No Connect
VCC
1
0
0
1
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Preliminary Technical Data
ADM1025/ADM1025A
transmitted over the serial bus in a single READ or
WRITE operation is limited only by what the master and
slave devices can handle.
If ADD is left open-circuit, the default address will be 0101110.
ADD is sampled only after power-up, so any changes made will
have no effect, unless power is cycled.
The facility to make hardwired changes to A1 and A0 allows the
user to avoid conflicts with other devices sharing the same
serial bus if, for example, more than one ADM1025/
ADM1025A is used in a system. However, as previously
mentioned, the ADD pin may also function as a reset output or
interrupt output. Use of these functions may restrict the
addresses that can be set. See the sections on RST and INT for
further information.
The serial bus protocol operates as follows.
1)
2)
The master initiates data transfer by establishing a START
condition, defined as a high-to-low transition on the serial
data line SDA while the serial clock line SCL remains high.
This indicates that an address/data stream will follow. All
slave peripherals connected to the serial bus respond to the
START condition and shift in the next eight bits, consisting
of a 7-bit address (MSB first) plus an R/W bit, which
determines the direction of the data transfer, i.e., whether
data will be written to or read from the slave device.
3)
When all data bytes have been read or written, STOP
conditions are established. In WRITE mode, the master will
pull the data line high during the 10th clock pulse to assert a
STOP condition. In READ mode, the master device will
override the Acknowledge Bit by pulling the data line high
during the low period before the 9th clock pulse. This is
known as No Acknowledge. The master will then take the
data line low during the low period before the 10th clock
pulse, then high during the 10th clock pulse to assert a STOP
condition.
Any number of bytes of data may be transferred over the serial
bus in one operation, but it is not possible to mix read and write
in one operation because the type of operation is determined at
the beginning and cannot subsequently be changed without
starting a new operation.
In the case of the ADM1025/ADM1025A, write operations
contain either one or two bytes, and read operations contain
one byte and perform the following functions.
The peripheral whose address corresponds to the
transmitted address responds by pulling the data line low
during the low period before the ninth clock pulse, known
as the Acknowledge Bit. All other devices on the bus now
remain idle while the selected device waits for data to be
read from or written to it. If the R/W bit is a 0, the master
will write to the slave device. If the R/W bit is a 1, the
master will read from the slave device.
To write data to one of the device data registers or read data
from it, the Address Pointer Register must be set so that the
correct data register is addressed; data can then be written into
that register or read from it. The first byte of a write operation
always contains an address that is stored in the Address Pointer
Register. If data is to be written to the device, the write
operation contains a second data byte that is written to the
register selected by the Address Pointer Register.
Data is sent over the serial bus in sequences of nine clock
pulses, eight bits of data followed by an Acknowledge Bit
from the slave device. Transitions on the data line must
occur during the low period of the clock signal and remain
stable during the high period, since a low-to-high
transition when the clock is high may be interpreted as a
STOP signal. The number of data bytes that can be
This is illustrated in Figure 11. The device address is sent over
the bus followed by R/W set to 0. This is followed by two data
bytes. The first data byte is the address of the internal data
register to be written to, which is stored in the Address Pointer
Register. The second data byte is the data to be written to the
internal data register.
Figure 11. Writing a Register Address to the Address Pointer Register, then Writing Data to the Selected Register
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Preliminary Technical Data
ADM1025/ADM1025A
Figure 12. Writing to the Address Pointer Register Only
Figure 13. Reading Data from a Previously Selected Register
When reading data from a register there are two possibilities:
1.
If the ADM1025/ADM1025A’s Address Pointer Register
value is unknown or not the desired value, it is first
necessary to set it to the correct value before data can be
read from the desired data register. This is done by
performing a write to the ADM1025/ADM1025A as
before, but only the data byte containing the register
address is sent, since data should not be written to the
register. This is shown in Figure 12.
A read operation is then performed consisting of the serial
bus address, R/W bit set to 1, followed by the data byte
read from the data register. This is shown in Figure 13.
2.
If the Address Pointer Register is known to be already at
the desired address, data can be read from the
corresponding data register without first writing to the
Address Pointer Register, so Figure 12 can be omitted.
NOTES
1.
Although it is possible to read a data byte from a data
register without first writing to the Address Pointer
Register, if the Address Pointer Register is already at the
correct value, it is not possible to write data to a register
without writing to the Address Pointer Register because
the first data byte of a write is always written to the
Address Pointer Register.
2.
In Figure 11 to Figure 13, the serial bus address is shown as
the default value 01011(A1)(A0), where A1 and A0 are set
by the three-state ADD pin.
3.
In addition to supporting the Send Byte and Receive Byte
protocols, the ADM1025/ADM1025A also supports the
Read Byte protocol (see System Management Bus
specifications Rev. 1.1 for more information).
4.
If Reset or interrupt functionality is required, the address
pin cannot be strapped to GND, since this would keep the
ADD/RST/INT/NTO pin permanently low.
MEASUREMENT INPUTS
The ADM1025/ADM1025A has six external measurement
inputs, five for voltage and one (two pins) for temperature.
Internal measurements are also carried out on VCC and the onchip temperature sensor.
A/D CONVERTER
These inputs are multiplexed into the on-chip, successiveapproximation, analog-to-digital converter. This has a
resolution of eight bits. The basic input range is 0 V to 2.5 V, but
the inputs have built-in attenuators to allow measurement of
2.5 V, 3.3 V, 5 V, 12 V, and the processor core voltage VCCP
without any external components. To allow for the tolerance of
these supply voltages, the A/D converter produces an output of
¾ full scale (decimal 192) for the nominal input voltage and so
has adequate headroom to cope with overvoltages. Table 5
shows the input ranges of the analog inputs and output codes of
the A/D converter.
When the ADC is running, it samples and converts an input
every 11.6 ms, except for the external temperature (D+ and D−)
input. This has special input signal conditioning and is averaged
over 16 conversions to reduce noise; a measurement on this
input takes nominally 34.8 ms.
Rev. P5 | Page 11 of 21| www.onsemi.com
Preliminary Technical Data
ADM1025/ADM1025A
INPUT CIRCUITS
The internal structure for the analog inputs is shown in
Figure 14. Each input circuit consists of an input protection
diode, an attenuator, plus a capacitor to form a first order lowpass filter that gives the input immunity to high frequency
noise.
Figure 14. Structure of Analog Inputs
Table 5. A/D Output Code vs. VIN
Input Voltage
12 VIN
<0.062
0.062−0.125
0.125–0.188
0.188−0.250
0.250−0.313
0.313−0.375
0.375−0.438
0.438−0.500
0.500−0.563
5 VIN
<0.026
0.026–0.052
0.052−0.078
0.078−0.104
0.104−0.130
0.130−0.156
0.156−0.182
0.182−0.208
0.208−0.234
VCC/3.3 VIN
<0.0172
0.017–0.034
0.034−0.052
0.052−0.069
0.069−0.086
0.086−0.103
0.103−0.120
0.120−0.138
0.138−0.155
4.000−4.063
1.666−1.692
1.100−1.117
8.000−8.063
3.330−3.560
2.200−2.217
12.000−12.063
5.000−5.026
3.300−3.317
15.312−15.375
15.375−15.437
15.437−15.500
15.500−15.563
15.625−15.625
15.625−15.688
15.688−15.750
15.750−15.812
15.812−15.875
15.875−15.938
>15.938
6.380−6.406
6.406−6.432
6.432−6.458
6.458−6.484
6.484−6.510
6.510−6.536
6.536−6.562
6.562−6.588
6.588−6.615
6.615−6.640
>6.640
4.210−4.230
4.230−4.245
4.245−4.263
4.263−4.280
4.280−4.300
4.300−4.314
4.314−4.330
4.331−4.348
4.348−4.366
4.366−4.383
>4.383
A/D Output
2.5 VIN
<0.013
0.013–0.026
0.026−0.039
0.039−0.052
0.052−0.065
0.065−0.078
0.078−0.091
0.091−0.104
0.104−0.117
•
•
0.833−0.846
•
•
1.667−1.680
•
•
2.500−2.513
•
•
3.190−3.203
3.203−3.216
3.216−3.229
3.229−3.242
3.242−3.255
3.255−3.268
3.268−3.281
3.281−3.294
3.294−3.307
3.307−3.320
>3.320
VCCPIN
<0.012
0.012–0.023
0.023−0.035
0.035−0.047
0.047−0.058
0.058−0.070
0.070−0.082
0.082−0.093
0.093−0.105
Decimal
0
1
2
3
4
5
6
7
8
Binary
0000 0000
0000 0001
0000 0010
0000 0011
0000 0100
0000 0101
0000 0110
0000 0111
0000 1000
0.749−0.761
64 (1/4 Scale)
0100 0000
1.499−1.511
128 (1/2 Scale)
1000 0000
2.249−2.261
192 (3/4 Scale)
1100 0000
2.869−2.881
2.881−2.893
2.893−2.905
2.905−2.916
2.916−2.928
2.928−2.940
2.940−2.951
2.951−2.964
2.964−2.975
2.975−2.987
>2.988
245
246
247
248
249
250
251
252
253
254
255
1111 0101
1111 0110
1111 0111
1111 1000
1111 1001
1111 1010
1111 1011
1111 1100
1111 1101
1111 1110
1111 1111
Rev. P5 | Page 12 of 21| www.onsemi.com
Preliminary Technical Data
ADM1025/ADM1025A
TEMPERATURE MEASUREMENT SYSTEM
INTERNAL TEMPERATURE MEASUREMENT
The ADM1025/ADM1025A contains an on-chip band gap
temperature sensor whose output is digitized by the on-chip
ADC. The temperature data is stored in the Local Temperature
Value Register (Address 27h). As both positive and negative
temperatures can be measured, the temperature data is stored in
twos complement format, as shown in Table 6. Theoretically,
the temperature sensor and ADC can measure temperatures
from −128°C to +127°C with a resolution of 1°C, although
temperatures below 0°C and above +100°C are outside the
operating temperature range of the device.
Figure 15. Signal Conditioning for External Diode Temperature Sensors
EXTERNAL TEMPERATURE MEASUREMENT
Table 6. Temperature Data Format
The ADM1025/ADM1025A can measure temperature using an
external diode sensor or diode-connected transistor connected
to Pins 9 and 10.
Temperature
−128°C
−125°C
−100°C
−75°C
−50°C
−25°C
0°C
+10°C
+25°C
+50°C
+75°C
+100°C
+125°C
+127°C
The forward voltage of a diode or diode-connected transistor,
operated at a constant current, exhibits a negative temperature
coefficient of about −2 mV/°C. Unfortunately, the absolute
value of VBE, varies from device to device, and individual
calibration is required to null this out, so the technique is
unsuitable for mass production.
The technique used in the ADM1025/ADM1025A is to measure
the change in VBE when the device is operated at two different
currents. This is given by:
ΔV BE = KT / q × In(N )
where:
K is Boltzmann’s constant.
q is the charge on the carrier.
T is the absolute temperature in Kelvins.
N is the ratio of the two currents.
Digital Output
1000 0000
1000 0011
1001 1100
1011 0101
1100 1110
1110 0111
0000 0000
0000 1010
0001 1001
0011 0010
0100 1011
0110 0100
0111 1101
0111 1111
To prevent ground noise interfering with the measurement, the
more negative terminal of the sensor is not referenced to
ground but is biased above ground by an internal diode at the
D− input.
Figure 15 shows the input signal conditioning used to measure
the output of an external temperature sensor. This figure shows
the external sensor as a substrate transistor provided for
temperature monitoring on some microprocessors, but it could
equally well be a discrete transistor.
If a discrete transistor is used, the collector will not be grounded
and should be linked to the base. If a PNP transistor is used, the
base is connected to the D− input and the emitter to the D+
input. If an NPN transistor is used, the emitter is connected to
the D− input and the base to the D+ input.
Bit 6 of Status Register 2 (42h) is set if a remote diode fault is
detected. The ADM1025/ADM1025A detects shorts from D+ to
GND or supply, as well as shorts/opens between D+/D−.
If the sensor is used in a very noisy environment, a capacitor of
value up to 1 nF may be placed between the D+ and D– inputs
to filter the noise.
To measure ΔVBE, the sensor is switched between operating
currents of I and N × I. The resulting waveform is passed
through a 65 kHz low-pass filter to remove noise, then to a
chopperstabilized amplifier that performs the functions of
amplification and rectification of the waveform to produce a dc
voltage proportional to ΔVBE. This voltage is measured by the
ADC to give a temperature output in 8-bit twos complement
format. To further reduce the effects of noise, digital filtering is
performed by averaging the results of 16 measurement cycles.
An external temperature measurement takes nominally 34.8 ms.
Rev. P5 | Page 13 of 21| www.onsemi.com
Preliminary Technical Data
ADM1025/ADM1025A
LAYOUT CONSIDERATIONS
Digital boards can be electrically noisy environments and care
must be taken to protect the analog inputs from noise,
particularly when measuring the very small voltages from a
remote diode sensor. The following precautions should be
taken:
1.
Place the ADM1025/ADM1025A as close as possible to the
remote sensing diode. Provided that the worst noise
sources, such as clock generators, data/address buses, and
CRTs, are avoided, this distance can be four to eight inches.
2.
Route the D+ and D− tracks close together, in parallel,
with grounded guard tracks on each side. Provide a ground
plane under the tracks if possible.
3.
Use wide tracks to minimize inductance and reduce noise
pickup. 10 mil track minimum width and spacing is
recommended.
Figure 16. Arrangement of Signal Tracks
4.
Try to minimize the number of copper/solder joints, which
can cause thermocouple effects. Where copper/solder
joints are used, make sure that they are in both the D+ and
D− path and at the same temperature.
Thermocouple effects should not be a major problem as
1°C corresponds to about 240 μV, and thermocouple
voltages are about 3 μV/°C of temperature difference.
Unless there are two thermocouples with a big temperature
differential between them, thermocouple voltages should
be much less than 200 μV.
5.
Place 0.1 μF bypass and 1 nF input filter capacitors close to
the ADM1025/ADM1025A.
6.
If the distance to the remote sensor is more than eight
inches, the use of twisted pair cable is recommended. This
will work up to about 6 to 12 feet.
7.
For really long distances (up to 100 feet) use shielded
twisted pair, such as Belden #8451 microphone cable.
Connect the twisted pair to D+ and D− and the shield to
GND close to the ADM1025/ADM1025A. Leave the
remote end of the shield unconnected to avoid ground
loops.
Because the measurement technique uses switched current
sources, excessive cable and/or filter capacitance can affect the
measurement. When using long cables, the filter capacitor may
be reduced or removed.
Cable resistance can also introduce errors. 1 Ω series resistance
introduces about 0.5°C error.
LIMIT VALUES
High and low limit values for each measurement channel are
stored in the appropriate limit registers. As each channel is
measured, the measured value is stored and compared with the
programmed limit.
STATUS REGISTERS
The results of limit comparisons are stored in Status Registers 1
and 2. The Status Register bit for a particular measurement
channel reflects the status of the last measurement and limit
comparison on that channel. If a measurement is within limits,
the corresponding Status Register bit will be cleared to “0.” If
the measurement is out of limits, the corresponding status
register bit will be set to “1.”
The state of the various measurement channels may be polled
by reading the Status Registers over the serial bus. Reading the
Status Registers does not affect their contents. Out-of-limit
temperature/voltage events may also be used to generate an
interrupt so that remedial action, such as turning on a cooling
fan, may be taken immediately. This is described in the section
on RST and INT.
MONITORING CYCLE TIME
The monitoring cycle begins when a 1 is written to the Start Bit
(Bit 0) of the Configuration Register. The ADC measures each
analog input in turn and as each measurement is completed the
result is automatically stored in the appropriate value register.
This “round-robin” monitoring cycle continues until it is
disabled by writing a 0 to Bit 0 of the Configuration Register.
As the ADC will normally be left to free-run in this manner, the
time taken to monitor all the analog inputs will normally not be
of interest, since the most recently measured value of any input
can be read out at any time.
INPUT SAFETY
Scaling of the analog inputs is performed on-chip, so external
attenuators are normally not required. However, since the
power supply voltages will appear directly at the pins, it is
advisable to add small external resistors in series with the
supply traces to the chip to prevent damaging the traces or
power supplies should an accidental short such as a probe
connect two power supplies together.
Rev. P5 | Page 14 of 21| www.onsemi.com
Preliminary Technical Data
ADM1025/ADM1025A
As the resistors will form part of the input attenuators, they will
affect the accuracy of the analog measurement if their value is
too high. The analog input channels are calibrated assuming an
external series resistor of 500 Ω, and the accuracy will remain
within specification for any value from zero to 1 kΩ, so a
standard 510 Ω resistor is suitable.
The worst such accident would be connecting 0 V to 12 V—a
total of 12 V difference. With the series resistors, this would
draw a maximum current of approximately 12 mA.
LAYOUT AND GROUNDING
Analog inputs will provide best accuracy when referred to a
clean ground. A separate, low impedance ground plane for
analog ground, which provides a ground point for the voltage
dividers and analog components, will provide best performance
but is not mandatory.
The power supply bypass, the parallel combination of 10 μF
(electrolytic or tantalum) and 0.1 μF (ceramic) bypass
capacitors connected between Pin 9 and ground, should also be
located as close as possible to the ADM1025/ADM1025A.
RST/INT OUTPUT
As previously mentioned, Pin 16 is a multifunction pin. Its state
after power-on is latched to set the lowest two bits of the serial
bus address. During NAND tree board-level connectivity
testing, it functions as the output of the NAND tree. It may also
be used as a reset output, or as an interrupt output for out-oflimit temperature/voltage events.
1
1
0
1
Voltage Interrupt Only
Voltage and Thermal Interrupts
Note that Bit 7 of VID register should be zero, and that Bits 2 to
7 of Test Register must be zeros.
When Pin 16 is used as a RST or INT output, it is open-drain
and requires an external pull-up resistor. This will restrict the
address function on Pin 16 to being high at power-up. If the
RST or INT function is required and two ADM1025/
ADM1025As are to be used on the same serial bus, A1/A0 can
be set to 10 by using a high value pull-up on Pin 16 (100 kΩ or
greater). This will not override the “floating” condition of ADD
during power-up.
Note, however, that the RST/INT outputs of two or more
devices cannot be wire-OR’d, since the devices would then have
the same address. If the RST/INT outputs need to be connected
to a common interrupt line, they can be OR’d together using the
circuit of Figure 17.
If the RSTor INT functionality is not required, a third address
may be used by setting A1/A0 to 00 by using a 1 kΩ pull-down
resistor on Pin 16. Note that this address should not be used if
RSTor INT is required, since using this address will cause the
device to appear to be generating resets or interrupts, since
Pin 16 will be permanently tied low.
Pin 16 is programmed as a reset output by clearing Bit 0 of the
Test Register and setting Bit 7 of the VID Register. A low going,
20 ms, reset output pulse can then be generated by setting Bit 4
of the Configuration Register.
If Bit 7 of the VID Register is cleared, Pin 16 can be programmed
as an interrupt output for out-of-limit temperature/voltage
events (INT). Desired interrupt operation is achieved by
changing the values of Bits 1 and 0 of the Test Register as shown
in Table 7. Note, however, that Bits 2 to 7 of the Test Register
must be zeros (not don’t cares). If, for example, INT is
programmed for thermal and voltage interrupts, then if any
temperature or voltage measurement goes outside its respective
high or low limit, the INT output will go low. It will remain low
until Status Register 1 is read, when it will be cleared. If the
temperature or voltage remains out of limit, INT will be
reasserted on the next monitoring cycle. INT can also be
cleared by issuing an Alert Response Address Call.
The INT output can be used as an interrupt output or can be
used as an SMBALERT. One or more INT outputs can be
connected to a common SMBALERT line connected to the
master. If a device’s INT line goes low, the following procedure
occurs:
Table 7. Controlling the Operation of INT
1.
SMBALERTis pulled low.
Test Register
Bit 1
Bit 0
0
0
0
1
2.
Master initiates a read operation and sends the Alert
Response Address (ARA = 0001 100). This is a general call
address that must not be used as a specific device address.
Function
Interrupts Disabled
Thermal Interrupt Only
Figure 17. Using Two ADM1025/ADM1025As on the Same Bus with a
Common Interrupt
GENTERATING AN SMBALERT
Rev. P5 | Page 15 of 21| www.onsemi.com
Preliminary Technical Data
ADM1025/ADM1025A
3.
The device whose INT output is low responds to the Alert
Response Address, and the master reads its device address.
The address of the device is now known and it can be
interrogated in the usual way.
4.
If more than one device’s INT output is low, the one with
the lowest device address will have priority, in accordance
with normal SMBus arbitration.
5.
Once the ADM1025/ADM1025A has responded to the
Alert Response Address, it will reset its INT output;
however, if the error condition that caused the interrupt
persists, INT will be reasserted on the next monitoring
cycle.
In NAND test mode, all digital inputs may be tested as
illustrated below. ADD/RST/INT/NTO will become the NAND
test output pin.
To perform a NAND tree test, all pins are initially driven low.
The test vectors set all inputs low, then one-by-one toggle them
high (keeping them high). Exercising the test circuit with this
“walking one” pattern, starting with the input closest to the
output of the tree, cycling toward the farthest, causes the output
of the tree to toggle with each input change. Allow for a typical
propagation delay of 500 ns. The structure of the NAND tree is
shown in Figure 18.
NAND TREE TESTS
A NAND tree is provided in the ADM1025/ADM1025A for
Automated Test Equipment (ATE) board level connectivity
testing. The device is placed into NAND Test Mode by
powering up with Pin 9 (D-/NTI) held high. This pin is
automatically sampled after power-up, and if it is connected
high, the NAND test mode is invoked.
Figure 18. NAND Tree
Note: If any of the inputs shown in Figure 18 are unused, they
should not be connected directly to ground but via a resistor
such as 10 kΩ. This will allow the ATE to drive every input high
so that the NAND tree test can be properly carried out. Refer to
Table 19 for Test Vectors.
Rev. P5 | Page 16 of 21| www.onsemi.com
Preliminary Technical Data
ADM1025/ADM1025A
USING THE ADM1025/ADM1025A
POWER-ON RESET
When power is first applied, the ADM1025/ADM1025A
performs a “power- on reset” on several of its registers.
Registers whose power-on values are not shown have power-on
conditions that are indeterminate. Value and limit registers are
reset to 00h on power-up. The ADC is inactive. In most
applications, usually the first action after power-on would be to
write limits into the Limit Registers.
Power-on reset clears or initializes the following registers (the
initialized values are shown in Table 9):
– Configuration Register
– Status Registers #1 and #2
Bit 7 of the Configuration Register is used to start a
Configuration Register Initialization when it is set to 1.
USING THE OFFSET REGISTER
This register contains a twos complement value that is added
(or subtracted if the number is negative) to either the internal
or external temperature reading. Note that the default value in
the offset register is zero, so zero is always added to the
temperature reading. The offset register is configured for the
external temperature channel by default. It may be switched to
the internal channel by setting Bit 0 of the Test Register to 1,
setting Bit 6 of the VID Register to 1, and clearing Bit 7 of the
VID Register.
STARTING CONVERSION
– VID0-3 Register
– VID4 Register
– Test Register
INITIALIZATION
Configuration Register Initialization performs a similar, but not
identical, function to power-on reset.
Configuration Register Initialization is accomplished by setting
Bit 7 of the Configuration Register high. This bit automatically
clears after being set.
USING THE CONFIGURATION REGISTER
Control of the ADM1025/ADM1025A is provided through the
configuration register. The Configuration Register is used to
start and stop the ADM1025/ADM1025A, program the
operating modes of Pins 11 and 16, and provide the
initialization function described above.
Bit 0 of the Configuration Register controls the monitoring loop
of the ADM1025/ADM1025A. Setting Bit 0 low stops the
monitoring loop and puts the ADM1025/ADM1025A into a
low power mode thereby reducing power consumption. Serial
bus communication is still possible with any register in the
ADM1025/ADM1025A while in low power mode. Setting Bit 0
high starts the monitoring loop.
Bit 4 of the Configuration Register causes a low going 20 ms
(typ) pulse at the RST pin (Pin 16) when set. This bit is selfclearing.
Bit 5 of the Configuration Register selects the operating mode
of Pin 11 between the default of 12 V analog input (Bit 5 = 0)
and VID4 (Bit 5 = 1).
The monitoring function of the ADM1025/ADM1025A is
started by writing to the Configuration Register and setting
Start (Bit 0) high. Limit values should be written into the Limit
Registers before starting the ADC to avoid spurious out-of-limit
conditions. The time taken to complete the analog
measurements depends on how they are configured, as
described elsewhere. Once the measurements have been
completed, the results can be read from the Value Registers at
any time.
REDUCED POWER AND SHUTDOWN MODE
The ADM1025/ADM1025A can be placed in a low power mode
by setting Bit 0 of the Configuration Register to 0. This disables
the internal ADC. Full shutdown mode may then be achieved
by setting Bit 7 of the VID Register to 1 and Bit 0 of the Test
Register to 1. This turns off power to all analog circuits and
stops the monitoring cycle, if running, but it does not affect the
condition of any of the registers. The device will return to its
previous state when these bits are reset to zero.
5 V OPERATION
The ADM1025/ADM1025A may be operated with VCC
connected to any supply voltage between 3.0 V and 5.5 V, but it
should be noted that the device has been optimized for 3.3 V
operation. In particular, the internal voltage divider used to
measure the supply voltage is optimized for 3.3 V. Powering the
device from 5 V will cause the VCC Reading Register (Register
25h) to overrange. In this case, the 5 V measurement should be
read from the 5 V Reading Register (Register 23h), instead of
the VCC Reading Register. Note also that when the 12 VIN/VID4
pin is programmed to read VID4, due to its internal voltage
divider, it will only read VIH = 2.1 V on the 12 VIN/VID4 pin as
logic high if the device is being powered from the 3.3 V supply.
Rev. P5 | Page 17 of 21| www.onsemi.com
Preliminary Technical Data
ADM1025/ADM1025A
REGISTERS
Table 8. Address POINTER Register
Table 10. Register 40h – Configuration Register
Bit
Name
R/W
Description
Bit
Name
R/W
Description
7–0
Address Pointer
Write
Address of ADM1025/
ADM1025A Registers. See
the tables below for detail.
0
START
Read/Write
Logic 1 enables startup of
monitor ASIC, and Logic 0
places the ASIC in standby
mode. At startup, limit
checking functions and
scanning begins. Note, all
HIGH and LOW LIMITS should
be set into the ADM1025/
ADM1025A prior to turning
on this bit. (Power-up Default
= 0.)
1
2
3
4
Reserved
Reserved
Reserved
RESET
Read
Read
Read
Read/Write
5
+12/VID4
Select
Read/Write
6
7
Reserved
Initialization
Read
Read/Write
Table 9. List of Registers
Address
A7–A0
in Hex
40h
Register Name
Configuration
Register
Status Register 1
Status Register 2
VID Register
41h
42h
47h
VID4 Register
49h
Value and Limit
Registers
Company ID
Stepping
15–3Dh
3Eh
3Fh
Power On Value of
Registers: <7:0>
0000 1000
0000 0000
0000 0000
<7:4> = 0000, <3:0> = VID3–
VID0
<0> = VID4; Default = 1000
000 (VID4)
0100 0001
0010 (Bits 3:0 Version
Number)
Rev. P5 | Page 18 of 21| www.onsemi.com
Setting this bit generates a
minimum 20 ms low pulse on
Pin 16 if the function is
enabled.
Selects whether Pin 11 acts
as a 12 V analog input
monitoring pin, or as a VID[4]
input. This pin defaults to the
12 V analog input. (Default =
0.)
Logic 1 restores power-up
default values to the
Configuration Register and
Status Registers. This bit
automatically clears itself and
the power-on default is zero.
Preliminary Technical Data
ADM1025/ADM1025A
Table 11. Register 41h – Status Register 1 (Power-On Default
<7:0> = 00h)
Table 13. Register 47h – VID REGISTER (Power-On Default
= 0000 (VID[3:0]))
Bit
Name
R/W
Description
Bit
Name
R/W
Description
0
+2.5 V_Error
ReadOnly
A 1 indicates a high or low limit
has been exceeded.
0–3
VID[3:0]
Read-Only
1
VCCP_Error
2
+3.3 V_Error
3
+5 V_Error
Reserved
Offset
Config
Read-Only
Read/Write
Local Temp
Error
5
Remote
Temp Error
ReadOnly
A 1 indicates a high or low limit
has been exceeded.
A 1 indicates a high or low limit
has been exceeded.
A 1 indicates a high or low limit
has been exceeded.
A 1 indicates a high or a low
temperature limit has been
exceeded.
A 1 indicates a high or low
Remote temperature limit has
been exceeded.
4–5
6
4
ReadOnly
ReadOnly
ReadOnly
ReadOnly
6
7
Reserved
Reserved
7
RST
ENABLE
Read/Write
The VID[3:0] inputs from
Pentium/PRO power
supplies to indicate the
operating voltage (e.g.,
1.3 V to 2.9 V).
Undefined
Configures offset register
to be used with internal
or external channel. If Bit
0 of Test Register = 1 and
Bit 7 of VID Register = 0,
then setting this bit to 1
configures tHhe Offset
Register to the internal
temperature channel.
Clearing this bit
configures the Offset
Register to the external
temperature channel.
(Default = 0.)
When set to 1, enables
the RST output function
on Pin 16. This bit
defaults to 0 on powerup. (RST Disabled.)
Table 12. Register 42h – Status Register 2 (Power-On Default
<7:0> = 00h)
Bit
Name
R/W
Description
0
+12 V_Error
ReadOnly
A 1 indicates a high or low limit
has been exceeded.
1
VCC_Error
2
Reserved
A 1 indicates a high or low limit
has been exceeded.
Undefined
3
Reserved
ReadOnly
ReadOnly
ReadOnly
ReadOnly
ReadOnly
ReadOnly
4
Reserved
5
Reserved
6
Remote
Diode Fault
7
Reserved
ReadOnly
Undefined
Undefined
Undefined
Table 14. Register 49h – VID4 Register (Power-On Default =
1000 000(VID4))
Bit
Name
R/W
Description
0
VID4
Read
VID4 Input (If Selected)
(Defaults to 0)
1–7
Reserved
Read
A one indicates either a short or
open circuited fault on the
remote thermal diode inputs.
Undefined
Rev. P5 | Page 19 of 21| www.onsemi.com
Preliminary Technical Data
ADM1025/ADM1025A
Table 15. Registers 15h–3Dh – Value and Limit Registers
Table 17. Register 3Eh – Company ID
Address
R/W
Description
15h
1Fh
20h
21h
22h
23h
24h
25h
26h
Read/Write
Read/Write
Read-Only
Read-Only
Read-Only
Read-Only
Read-Only
Read-Only
Read-Only
Manufacturers Test Register
Offset Register
2.5 V Reading
VCCP Reading
3.3 V Reading
5 V Reading
12 V Reading
VCC Reading
Remote Diode Temperature
Reading
Local Temperature Reading
2.5 V High Limit
2.5 V Low Limit
VCCP High Limit
VCCP Low Limit
3.3 V High Limit
3.3 V Low Limit
5 V High Limit
5 V Low Limit
12 V High Limit
12 V Low Limit
VCC High Limit
VCC Low Limit
Remote Temperature High Limit
Remote Temperature Low Limit
Local Temperature High Limit
Local Temperature Low Limit
Value
(Bits
7:0)
0100
0001
27h
2Bh
2Ch
2Dh
2Eh
2Fh
30h
31h
32h
33h
34h
35h
36h
37h
38h
39h
3Ah
Read-Only
Read/Write
Read/Write
Read/Write
Read/Write
Read/Write
Read/Write
Read/Write
Read/Write
Read/Write
Read/Write
Read/Write
Read/Write
Read/Write
Read/Write
Read/Write
Read/Write
R/W
ReadOnly
Table 18. Register 3Fh – Stepping
Value (Bits 7:0)
R/W
Description
0010 [Version]
Read-Only
Stepping ID Number and
Version
Table 19. NAND Tree Test Vectors
SDA
0
SCL
0
VID0
0
VID1
0
VID2
0
VID3
0
1
2
3
4
5
6
7
0
0
0
0
0
1
0
0
0
0
1
1
0
0
0
1
1
1
0
0
1
1
1
1
0
1
1
1
1
1
1
1
1
1
1
1
0
1
0
1
0
1
Table 16. Register 15h – Manufacturers Test Register
R/W
Description
0
Read/Write
1
Read/Write
Used to select RSTor INT
functions. Refer to RST/INT
Output section.
Used to select RST or INT
functions. Refer to RST/INT
Output section.
Reserved. Only values written
to these bits should be zeros.
2–7
Name
Reserved
Read/Write
ADD/RST/
INT/NTO
Vector
No.
1
For the high limits of the voltages, the device is doing a greater-than
comparison. For the low limits, however, it is doing a less-than or equal
comparison.
Bit
Description
This location contains the company
identification number that may be used by
software to determine the manufacturer’s
device. This register is read-only.
Rev. P5 | Page 20 of 21| www.onsemi.com
Preliminary Technical Data
ADM1025/ADM1025A
OUTLINE DIMENSIONS
Figure 19. 16-Lead Shrink Small Outline Package [QSOP]
(RQ-16)
Dimensions shown in inches
ORDERING GUIDE
Model
ADM1025ARQ
Temperature Range
0°C to 100°C
Package Description
16-Lead QSOP
Package Option
RQ-16
Option
Integrated 100 kΩ VID Pull-Ups
ADM1025ARQ-REEL
ADM1025ARQ-REEL7
ADM1025ARQZ1
ADM1025ARQZ-REEL1
ADM1025ARQZ-R71
ADM1025AARQ
ADM1025AARQZ1
0°C to 100°C
0°C to 100°C
0°C to 100°C
0°C to 100°C
0°C to 100°C
0°C to 100°C
0°C to 100°C
16-Lead QSOP
16-Lead QSOP
16-Lead QSOP
16-Lead QSOP
16-Lead QSOP
16-Lead QSOP
16-Lead QSOP
RQ-16
RQ-16
RQ-16
RQ-16
RQ-16
RQ-16
RQ-16
Integrated 100 kΩ VID Pull-Ups
Integrated 100 kΩ VID Pull-Ups
Integrated 100 kΩ VID Pull-Ups
Integrated 100 kΩ VID Pull-Ups
Integrated 100 kΩ VID Pull-Ups
Open-Drain VID Inputs
Open-Drain VID Inputs
1
Z = RoHS Compliant Part.
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