TI1 DRV8301 Three phase pre-driver with dual current shunt amplifiers and buck regulator Datasheet

DRV8301
SLOS719 – AUGUST 2011
www.ti.com
Three Phase Pre-Driver with Dual Current Shunt Amplifiers and Buck Regulator
Check for Samples: DRV8301
FEATURES
DESCRIPTION
•
•
The DRV8301 is a gate driver IC for three phase
motor drive applications. It provides three half bridge
drivers, each capable of driving two N-type
MOSFETs, one for the high-side and one for the low
side. It supports up to 2.3A sink and 1.7A source
peak current capability and only needs a single power
supply with a wide range from 8 to 60V. The
DRV8301 uses bootstrap gate drivers with trickle
charge circuitry to support 100% duty cycle. The gate
driver uses automatic hand shaking when high side
FET or low side FET is switching to prevent current
shoot through. Vds of FETs is sensed to protect
external power stage during overcurrent conditions.
1
•
•
•
•
•
•
•
•
•
•
Operating Supply Voltage 8V–60V
2.3A Sink and 1.7A Source Gate Drive Current
Capability
Integrated Dual Shunt Current Amplifiers With
Adjustable Gain and Offset
Integrated Buck Converter to Support up to
1.5A External Load
Independent Control of 3 or 6 PWM Inputs
Bootstrap Gate Driver With 100% Duty Cycle
Support
Programmable Dead Time to Protect External
FETs from Shoot Through
Slew Rate Control for EMI Reduction
Programmable Overcurrent Protection of
External MOSFETs
Support Both 3.3V and 5V Digital Interface
SPI Interface
Thermally Enhanced 56-Pin TSSOP Pad Down
DCA Package
The DRV8301 includes two current shunt amplifiers
for accurate current measurement. The current
amplifiers support bi-directional current sensing and
provide an adjustable output offset of up to 3V.
The DRV8301 also has an integrated switching mode
buck converter with adjustable output and switching
frequency to support MCU or additional system power
needs. The buck is capable to drive up to 1.5A load.
The SPI interface provides detailed fault reporting
and flexible parameter settings such as gain options
for current shunt amplifier, slew rate control of gate
driver, etc.
APPLICATIONS
•
•
•
•
3-Phase Brushless DC Motor and Permanent
Magnet Synchronous Motor
CPAP and Pump
E-bike, Hospital Bed, Wheel Chair
Power Drill, Blender, Chopper
PVDD
DRV8301
GH_ A
GL_A
Buck
Converter
Vs
PWM
3 or 6
SPI
Motor
Controller
Three-Phase
NMOS Gate
Driver
Error
Reporting
Control
and
Protection
Logic
ADC1
MOTOR
GL_B
GH_C
GL_C
_
offset
Vref
ADC2
GH_ B
+
_
offset
+
Figure 1. DRV8301 Simplified Application Schematic
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2011, Texas Instruments Incorporated
DRV8301
SLOS719 – AUGUST 2011
www.ti.com
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
DEVICE INFORMATION
PIN ASSIGNMENT
The DRV8301 is designed to fit the 56pin DCA package. Here is the pinout of the device.
OCTW
FAULT
DTC
SCS
SDI
SDO
SCLK
DC_CAL
GVDD
CP1
CP2
EN_GATE
INH_A
INL_A
INH_B
INL_B
INH_C
INL_C
DVDD
REF
SO1
SO2
AVDD
AGND
2
1
56
2
55
SS_TR
EN_BUCK
PVDD2
PVDD2
3
54
4
53
5
BST_BK
PH
50 PH
49 VDD_S PI
4 8 BST_A
47 GH_A
46 SH_A
45 GL_A
44 SL_A
43 BST_B
42 GH_B
41 SH_B
40 GL_B
39 SL_B
38 BST_C
37 GH_C
36 SH_C
35 GL_C
34 SL_C
33 SN1
32 SP1
31 SN2
30 SP2
29 PVDD1
52
6
51
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
Power Pad (57) - GND
RT_CLK
COMP
VSENSE
PWRGD
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PIN FUNCTIONS
PIN
NAME
NO.
I/O (1)
DESCRIPTION
RT_CLK
1
I
Resistor timing and external clock for buck regulator. Resistor should connect to GND (power pad) with
very short trace to reduce the potential clock jitter due to noise.
COMP
2
O
Buck error amplifier output and input to the output switch current comparator.
VSENSE
3
I
Buck output voltage sense pin. Inverting node of error amplifier.
PWRGD
4
I
An open drain output with external pull-up resistor required. Asserts low if buck output voltage is low
due to thermal shutdown, dropout, over-voltage, or EN_BUCK shut down
OCTW
5
O
Over current or/and over temperature warning indicator. This output is open drain with external pull-up
resistor required. Programmable output mode via SPI registers.
FAULT
6
O
Fault report indicator. This output is open drain with external pull-up resistor required.
DTC
7
I
Dead-time adjustment with external resistor to GND
SCS
8
I
SPI chip select
SDI
9
I
SPI input
SDO
10
O
SPI output
SCLK
11
I
SPI clock signal
DC_CAL
12
I
When DC_CAL is high, device shorts inputs of shunt amplifiers and disconnects loads. DC offset
calibration can be done through external microcontroller.
GVDD
13
P
Internal gate driver voltage regulator. GVDD cap should connect to GND
CP1
14
P
Charge pump pin 1, ceramic cap should be used between CP1 and CP2
CP2
15
P
Charge pump pin 2, ceramic cap should be used between CP1 and CP2
EN_GATE
16
I
Enable gate driver and current shunt amplifiers. Control buck via EN_BUCK pin.
INH_A
17
I
PWM Input signal (high side), half-bridge A
INL_A
18
I
PWM Input signal (low side), half-bridge A
INH_B
19
I
PWM Input signal (high side), half-bridge B
INL_B
20
I
PWM Input signal (low side), half-bridge B
INH_C
21
I
PWM Input signal (high side), half-bridge C
INL_C
22
I
PWM Input signal (low side), half-bridge C
DVDD
23
P
Internal 3.3V supply voltage. DVDD cap should connect to AGND. This is an output, but not specified
to drive external circuitry.
REF
24
I
Reference voltage to set output of shunt amplfiiers with a bias voltage which equals to half of the
voltage set on this pin. Connect to ADC reference in microcontroller.
SO1
25
O
Output of current amplifier 1
SO2
26
O
Output of current amplifier 2
AVDD
27
P
Internal 6V supply voltage, AVDD cap should connect to AGND. This is an output, but not specified to
drive external circuitry.
AGND
28
P
Analog ground pin
PVDD1
29
P
Power supply pin for gate driver, current shunt amplifier, and SPI communication. PVDD1 is
independent of buck power supply, PVDD2. PVDD1 cap should connect to GND
SP2
30
I
Input of current amplifier 2 (connecting to positive input of amplifier). Recommend to connect to ground
side of the sense resistor for the best commom mode rejection.
SN2
31
I
Input of current amplifier 2 (connecting to negative input of amplifier).
SP1
32
I
Input of current amplifier 1 (connecting to positive input of amplifier). Recommend to connect to ground
side of the sense resistor for the best commom mode rejection.
SN1
33
I
Input of current amplifier 1 (connecting to negative input of amplifier).
SL_C
34
I
Low-Side MOSFET source connection, half-bridge C. Low-side VDS measured between this pin and
SH_C.
GL_C
35
O
Gate drive output for Low-Side MOSFET, half-bridge C
SH_C
36
I
High-Side MOSFET source connection, half-bridge C. High-side VDS measured between this pin and
PVDD1.
GH_C
37
O
Gate drive output for High-Side MOSFET, half-bridge C
(1)
KEY: I =Input, O = Output, P = Power
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PIN FUNCTIONS (continued)
PIN
I/O (1)
DESCRIPTION
NAME
NO.
BST_C
38
P
Bootstrap cap pin for half-bridge C
SL_B
39
I
Low-Side MOSFET source connection, half-bridge B. Low-side VDS measured between this pin and
SH_B.
GL_B
40
O
Gate drive output for Low-Side MOSFET, half-bridge B
SH_B
41
I
High-Side MOSFET source connection, half-bridge B. High-side VDS measured between this pin and
PVDD1.
GH_B
42
O
Gate drive output for High-Side MOSFET, half-bridge B
BST_B
43
P
Bootstrap cap pin for half-bridge B
SL_A
44
I
Low-Side MOSFET source connection, half-bridge A. Low-side VDS measured between this pin and
SH_A.
GL_A
45
O
Gate drive output for Low-Side MOSFET, half-bridge A
SH_A
46
I
High-Side MOSFET source connection, half-bridge A. High-side VDS measured between this pin and
PVDD1.
GH_A
47
O
Gate drive output for High-Side MOSFET, half-bridge A
BST_A
48
P
Bootstrap cap pin for half-bridge A
VDD_SPI
49
I
SPI supply pin to support 3.3V or 5V logic. Connect to either 3.3V or 5V.
50, 51
O
The source of the internal high side MOSFET of buck converter
BST_BK
52
P
Bootstrap cap pin for buck converter
PVDD2
53,54
P
Power supply pin for buck converter, PVDD2 cap should connect to GND.
EN_BUCK
55
I
Enable buck converter. Internal pull-up current source. Pull below 1.2V to disable. Float to enable.
Adjust the input undervoltage lockout with two resistors
SS_TR
56
I
Buck soft-start and tracking. An external capacitor connected to this pin sets the output rise time. Since
the voltage on this pin overrides the internal reference, it can be used for tracking and sequencing. Cap
should connect to GND
GND
(POWER
PAD)
57
P
GND pin. The exposed power pad must be electrically connected to ground plane through soldering to
PCB for proper operation and connected to bottom side of PCB through vias for better thermal
spreading.
PH
4
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FUNCTION BLOCK DIAGRAM
OCTW
FAULT
EN _GATE
DTC
SCLK
SDI
SDO
SCS
VDD _SPI
PVDD1
Gate Driver
Control
&
Fault
Handling
(PVDD_UV,
CP_UV,
OTW, OTSD,
OC_LIMIT)
CP2
OSC
Charge
Pump
Regulator
CP1
GVDD
Trickle
Charge
PVDD1
BST _A
Phase A
( repeated for B& C)
Timing
and
Control
Logic
INH_A
INL _A
High Side
Gate Drive
GH _A
Low Side
Gate Drive
GL _A
Motor
SH_A
SL _A
PVDD2
Current
Sense
Amplifier1
VSENSE
BST _ BK
SN1
SP1
Rshunt 1
REF
PH
PGND
DC _ CAL
Offset
½ Vref
EN _ BUCK
PWRGD
SN2
Current
Sense
Amplifier2
Buck
Converter
SP2
Power
Pad
AVDD
Offset
½ Vref
SS _ TR
RT _ CLK
GND
COMP
DVDD
SO1
SO2
AGND
AGND
GND
PGND
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ABSOLUTE MAXIMUM RATINGS (1)
VALUE
MIN
MAX
–0.3
70
UNITS
PVDD
Supply voltage range including transient
Relative to PGND
PVDDRAMP
Maximum supply voltage ramp rate
Voltage rising up to PVDDMAX
VPGND
Maximum voltage between PGND and GND
±0.3
V
IIN_MAX
Maximum current, all digital and analog input pins except FAULT and OCTW pins
±1
mA
IIN_OD_MAX
Maximum sinking current for open drain pins (FAULT and OCTW Pins)
7
mA
VOPA_IN
Voltage range for SPx and SNx pins
±0.6
VLOGIC
Input voltage range for logic/digital pins (INH_A, INL_A, INH_B, INL_B, INH_C,
INL_C, EN_GATE, SCLK, SDI, SCS, DC_CAL)
-0.3
VGVDD
Maximum voltage for GVDD Pin
13.2
V
VAVDD
Maximum voltage for AVDD Pin
8
V
VDVDD
Maximum voltage for DVDD Pin
3.6
V
VVDD_SPI
Maximum voltage for VDD_SPI Pin
7
V
VSDO
Maximum voltage for SDO Pin
VDD_SPI +0.3
V
VREF
Maximum reference voltage for current amplifier
IREF
50
V
V/mS
V
7
V
7
V
Maximum current for REF Pin
100
µA
TJ
Maximum operating junction temperature range
–40
150
°C
TSTORAGE
Storage temperature range
–55
150
°C
Capacitive discharge model
500
V
Human body model
2000
V
(1)
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating
conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
THERMAL INFORMATION
DRV8301
THERMAL METRIC
(1)
DCA
UNITS
(56) PINS
θJA
Junction-to-ambient thermal resistance
30.3
θJCtop
Junction-to-case (top) thermal resistance
33.5
θJB
Junction-to-board thermal resistance
17.5
ψJT
Junction-to-top characterization parameter
0.9
ψJB
Junction-to-board characterization parameter
7.2
θJCbot
Junction-to-case (bottom) thermal resistance
0.9
(1)
6
°C/W
For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report, SPRA953.
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RECOMMENDED OPERATING CONDITIONS
PVDD1
DC supply voltage PVDD1 for normal operation
Relative to PGND
PVDD2
DC supply voltage PVDD2 for buck converter
CAVDD
External capacitance on AVDD pin (ceramic cap) 20% tolerance
CDVDD
CGVDD
MIN
TYP MAX
8
60
3.5
60
UNITS
V
V
1
µF
External capacitance on DVDD pin (ceramic cap) 20% tolerance
1
µF
External capacitance on GVDD pin (ceramic cap) 20% tolerance
2.2
µF
CCP
Flying cap on charge pump pins (between CP1 and CP2) (ceramic cap) 20% tolerance
22
nF
CBST
Bootstrap cap (ceramic cap)
IDIN_EN
Input current of digital pins when EN_GATE is high
IDIN_DIS
Input current of digital pins when EN_GATE is low
CDIN
CO_OPA
RDTC
Dead time control resistor range. Time range is 50ns (-GND) to 500ns (150kΩ) with a
linear approximation.
IFAULT
FAULT pin sink current. Open-drain
IOCTW
OCTW pin sink current. Open-drain
VREF
External voltage reference voltage for current shunt amplifiers
fgate
Operating switching frequency of gate driver
TA
Ambient temperature
100
nF
100
µA
1
µA
Maximum capacitance on digital input pin
10
pF
Maximum output capacitance on outputs of shunt amplifier
20
pF
150
kΩ
V = 0.4 V
2
mA
V = 0.4 V
2
mA
6
V
0
2
Qg(TOT) = 25 nC or total 30 mA gate
drive average current
–40
200
kHz
125
°C
ELECTRICAL CHARACTERISTICS
PVDD = 8-60 V, TC = 25°C, unless specified under test condition
PARAMETER
TEST CONDITIONS
MIN
TYP MAX
UNIT
INPUT PINS: INH_X, INL_X, M_PWM (SCS), M_OC (SDI), GAIN(SDO), EN_GATE, DC_CAL
VIH
High input threshold
2
VIL
Low input threshold
REN_GATE
Internal pull down resistor for EN_GATE
RINH_X
Internal pull down resistor for high side PWMs
(INH_A, INH_B, and INH_C)
RINH_X
V
0.8
V
100
kΩ
EN_GATE high
100
kΩ
Internal pull down resistor for low side PWMs
(INL_A, INL_B, and INL_C)
EN_GATE high
100
kΩ
RSCS
Internal pull down resistor for SCS
EN_GATE high
100
kΩ
RSDI
Internal pull down resistor for SDI
EN_GATE high
100
kΩ
RDC_CAL
Internal pull down resistor for DC_CAL
EN_GATE high
100
kΩ
RSCLK
Internal pull down resistor for SCLK
EN_GATE high
100
kΩ
OUTPUT PINS: FAULT AND OCTW
VOL
Low output threshold
IO = 2 mA
VOH
High output threshold
External 47 kΩ pull up resistor connected to
3-5.5 V
0.4
IOH
Leakage Current on Open Drain Pins When
Logic High (FAULT and OCTW)
2.4
V
1
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ELECTRICAL CHARACTERISTICS (continued)
PVDD = 8-60 V, TC = 25°C, unless specified under test condition
PARAMETER
TEST CONDITIONS
MIN
TYP MAX
UNIT
GATE DRIVE OUTPUT: GH_A, GH_B, GH_C, GL_A, GL_B, GL_C
VGX_NORM
Gate driver Vgs voltage
PVDD = 8–60V
Ioso1
Maximum source current setting 1, peak
Vgs of FET equals to 2 V. REG 0x02
9.5
1.7
11.5
A
Iosi1
Maximum sink current setting 1, peak
Vgs of FET equals to 8 V. REG 0x02
2.3
A
Ioso2
Source current setting 2, peak
Vgs of FET equals to 2 V. REG 0x02
0.7
A
Iosi2
Sink current setting 2, peak
Vgs of FET equals to 8 V. REG 0x02
1
A
Ioso3
Source current setting 3, peak
Vgs of FET equals to 2 V. REG 0x02
0.25
A
Iosi3
Sink current setting 3, peak
Vgs of FET equals to 8 V. REG 0x02
0.5
A
Rgate_off
Gate output impedence during standby mode
when EN_GATE low (pins GH_x, GL_x)
1.6
V
2.4
kΩ
50
µA
SUPPLY CURRENTS
IPVDD1_STB
PVDD1 supply current, standby
EN_GATE is low. PVDD1 = 8V.
20
IPVDD1_OP
PVDD1 supply current, operating
EN_GATE is high, no load on gate drive
output, switching at 10 kHz,
100 nC gate charge
15
IPVDD1_HIZ
PVDD1 Supply current, HiZ
EN_GATE is high, gate not switching
2
5
mA
10
mA
INTERNAL REGULATOR VOLTAGE
AVDD
AVDD voltage
6
6.5
7
V
DVDD
DVDD voltage
3
3.3
3.6
V
VOLTAGE PROTECTION
VPVDD_UV
Under voltage protection limit, PVDD
6
V
VGVDD_UV
Under voltage protection limit, GVDD
8
V
VGVDD_OV
Over voltage protection limit, GVDD
16
V
CURRENT PROTECTION, (VDS SENSING)
VDS_OC
Drain-source voltage protection limit
Toc
OC sensing response time
1.5
µs
TOC_PULSE
OCTW pin reporting pulse stretch length for OC
event
64
µs
8
0.125
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V
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GATE TIMING AND PROTECTION CHARACTERISTICS
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
TIMING, OUTPUT PINS
tpd,If-O
Positive input falling to GH_x falling
CL=1nF, 50% to 50%
45
ns
tpd,Ir-O
Positive input rising to GL_x falling
CL=1nF, 50% to 50%
45
ns
(1)
Td_min
Minimum dead time after hand shaking
Tdtp
Dead Time
With RDTC set to different values
tGDr
Rise time, gate drive output
CL=1nF, 10% to 90%
25
ns
tGDF
Fall time, gate drive output
CL=1nF, 90% to 10%
25
ns
TON_MIN
Minimum on pulse
Not including handshake communication.
Hiz to on state, output of gate driver
Tpd_match
Tdt_match
50
50
ns
500
ns
50
ns
Propagation delay matching between high
side and low side
5
ns
Deadtime matching
5
ns
10
ms
10
us
TIMING, PROTECTION AND CONTROL
tpd,R_GATE-OP
Start up time, from EN_GATE active high
to device ready for normal operation
PVDD is up before start up, all charge
pump caps and regulator caps as in
recommended condition
tpd,R_GATE-Quick
If EN_GATE goes from high to low and
back to high state within quick reset time,
it will only reset all faults and gate driver
without powering down charge pump,
current amp, and related internal voltage
regulators.
Maximum low pulse time
tpd,E-L
Delay, error event to all gates low
200
ns
tpd,E-FAULT
Delay, error event to FAULT low
200
ns
OTW_CLR
Junction temperature for resetting over
temperature warning
115
°C
Junction temperature for over
OTW_SET/OTSD
temperature warning and resetting over
_CLR
temperature shut down
130
°C
150
°C
OTSD_SET
(1)
Junction temperature for over
temperature shut down
5
Dead time programming definition: Adjustable delay from GH_x falling edge to GL_X rising edge, and GL_X falling edge to GH_X rising
edge. This is a minimum dead-time insertion. It is not added to the value set by the microcontroller externally.
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CURRENT SHUNT AMPLIFIER CHARACTERISTICS
TC = 25°C unless otherwise specified
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
G1
Gain option 1
9.5
10
10.5
V/V
G2
Gain option 2
18
20
21
V/V
G3
Gain Option 3
38
40
42
V/V
G4
Gain Option 4
75
80
85
V/V
Tsettling
Settling time to 1%
Tc = 0-60°C, G = 10, Vstep = 2 V
300
ns
Tsettling
Settling time to 1%
Tc = 0-60°C, G = 20, Vstep = 2 V
600
µs
Tsettling
Settling time to 1%
Tc = 0-60°C, G = 40, Vstep = 2 V
1.2
µs
Tsettling
Settling time to 1%
Tc = 0-60°C, G = 80, Vstep = 2 V
Vswing
Output swing linear range
Slew Rate
µs
2.4
0.3
5.7
G = 10
10
DC_offset
Offset error RTI
Drift_offset
Offset drift RTI
G = 10 with input shorted
Ibias
Input bias current
Vin_com
Common input mode range
Vin_dif
Differential input range
Vo_bias
Output bias
With zero input current, Vref up to 6 V
CMRR_OV
Overall CMRR with gain resistor
mismatch
CMRR at DC, gain = 10
4
–0.3
–0.5%
0.5×Vref
70
85
mV
µV/C
10
–0.15
V
V/µs
100
µA
0.15
V
0.3
V
0.5%
V
dB
BUCK CONVERTER CHARACTERISTICS
TC = 25°C unless otherwise specified
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
Internal undervoltage lockout threshold
No voltage hysteresis, rising and falling
ISD(PVDD2)
Shutdown supply current
EN = 0 V, 25°C, 3.5 V ≤ VIN ≤ 60 V
1.3
4
µA
INON_SW(PVDD2)
Operating: nonswitching supply current
VSENSE = 0.83 V, VIN = 12 V
116
136
µA
VEN_BUCK
Enable threshold voltage
No voltage hysteresis, rising and falling,
25°C
1.25
1.55
V
RDS_ON
On-resistance
VIN = 3.5 V, BOOT-PH = 3 V
ILIM
Current limit threshold
VIN = 12 V, TJ = 25°C
1.8
OTSD_BK
Thermal shutdown
Fsw
Switching frequency
RT = 200 kΩ
450
PWRGD
2.5
UNIT
VUVLO
0.9
V
300
mΩ
2.7
A
°C
150
581
720
kHz
VSENSE falling
92%
VSENSE rising
94%
VSENSE rising
109%
VSENSE falling
107%
Hysteresis
VSENSE falling
2%
Output high leakage
VSENSE = VREF, V(PWRGD) = 5.5 V,
25°C
10
nA
On resistance
I(PWRGD) = 3 mA, VSENSE < 0.79 V
50
Ω
VSENSE threshold
SPI CHARACTERISTICS (Slave Mode Only)
PARAMETER
TEST CONDITIONS
MIN
tSPI_READY
SPI ready after EN_GATE transitions to
HIGH
tCLK
Minimum SPI clock period
tCLKH
Clock high time
40
tCLKL
Clock low time
40
10
PVDD > 8 V
100
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TYP
MAX
5
10
UNIT
ms
ns
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SPI CHARACTERISTICS (Slave Mode Only) (continued)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
tSU_SDI
SDI input data setup time
20
ns
tHD_SDI
SDI input data hold time
30
ns
tD_SDO
SDO output data delay time, CLK high to
SDO valid
tHD_SDO
SDO output data hold time
40
tSU_SCS
SCS setup time
50
ns
tHD_SCS
SCS hold time
50
ns
tHI_SCS
SCS minimum high time before SCS active
low
40
ns
tACC
SCS access time, SCS low to SDO out of
high impedance
10
ns
tDIS
SCS disable time, SCS high to SDO high
impedance
10
ns
CL = 20 pF
20
ns
tHI_SCS
_
tHD_SCS
tSU_SCS
SCS
tCLK
SCLK
tCLKH
tCLKL
MSB in
(must be valid)
SDI
tSU_SDI
SDO
LSB
tHD_SDI
MSB out (is valid)
Z
tACC
tD_SDO
LSB
Z
tDIS
tHD_SDO
Figure 2. SPI Slave Mode Timing Definition
SCS
1
2
3
4
X
15
16
SCLK
SDI
MSB
LSB
SDO
MSB
LSB
Receive
latch Points
Figure 3. SPI Slave Mode Timing Diagram
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FUNCTIONAL DESCRIPTION
THREE-PHASE GATE DRIVER
The DRV8301 provides three half bridge drivers, each capable of driving two N-type MOSFETs, one for the
high-side and one for the low side.
Gate driver has following features:
• Internal hand shake between high side and low side FETs during switching transition to prevent current shoot
through.
• Programmable slew rate or current driving capability through SPI interface.
• Support up to 200kHz switching frequency with Qg(TOT)=25nC or total 30mA gate drive average current
• Provide cycle-by-cycle current limiting and latch over-current (OC) shut down of external FETs. Current is
sensed through FET drain-to-source voltage and the over-current level is programmable through SPI interface
• Vds sensing range is programmable from 0.060V to 2.4V and with 5 bit programmable resolution through SPI.
• High side gate drive will survive negative output from half bridge up to –10V for 10ns
• During EN_GATE pin low and fault conditions, gate driver will keep external FETs in high impedance mode.
• Programmable dead time through DTC pin. Dead time control range: 50ns to 500ns. Short DTC pin to ground
will provide minimum dead time (50ns). External dead time will override internal dead time as long as the time
is longer than the dead time setting (minimum hand shake time cannot be reduced in order to prevent shoot
through current).
• Bootstraps are used in high side FETs of three-phase pre-gate driver. Trickle charge circuitry is used to
replenish current leakage from bootstrap cap and support 100% duty cycle operation.
CURRENT SHUNT AMPLIFIERS
The DRV8301 includes two high performance current shunt amplifiers for accurate current measurement. The
current amplifiers provide output offset up to 3V to support bi-directional current sensing.
Current shunt amplifier has following features:
• Programmable gain: 4 gain settings through SPI command
• Programmable output offset through reference pin (half of the Vref)
• Minimize DC offset and drift over temperature with dc calibrating through SPI command or DC_CAL pin.
When DC calibration is enabled, device will short input of current shunt amplifier and disconnect the load. DC
calibrating can be done at anytime even when FET is switching since the load is disconnected. For best
result, perform the DC calibrating during switching off period when no load is present to reduce the potential
noise impact to the amplifier.
The output of current shunt amplifier can be calculated as:
V
VO = REF - G ´ (SNX - SPX )
2
(1)
Where Vref is the reference voltage, G is the gain of the amplifier; SNx and SPx are the inputs of channel x. SPx
should connect to resistor ground for the best common mode rejection.
Figure 4 shows current amplifier simplified block diagram.
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DC_CAL
SN
400 kW
S4
200 kW
S3
100 kW
S2
50 kW
S1
5 kW
AVDD
_
100 W
DC_CAL
SO
5 kW
+
SP
50 kW
S1
100 kW
S2
200 kW
S3
400 kW
S4
DC_CAL
Vref /2
REF
_
AVDD
50 kW
+
50 kW
Figure 4. Current Shunt Amplifier Simplified Block Diagram
BUCK CONVERTER
Although integrated in the same device, buck converter is designed completely independent of rest of the gate
driver circuitry. Since buck will support external MCU or other external power need, the independency of buck
operation is very critical for a reliable system; this will give buck minimum impact from gate driver operations.
Some examples are: when gate driver shuts down due to any failure, buck will still operate unless the fault is
coming from buck itself. The buck keeps operating at much lower PVDD of 3.5V, this will assure the system to
have a smooth power up and power down sequence when gate driver is not able to operate due to a low PVDD.
The buck has an integrated high side n-channel MOSFET. To improve performance during line and load
transients the device implements a constant frequency, current mode control which reduces output capacitance
and simplifies external frequency compensation design.
The wide switching frequency of 300kHz to 2200kHz allows for efficiency and size optimization when selecting
the output filter components. The switching frequency is adjusted using a resistor to ground on the RT_CLK pin.
The device has an internal phase lock loop (PLL) on the RT_CLK pin that is used to synchronize the power
switch turn on to a falling edge of an external system clock.
The buck converter has a default start up voltage of approximately 2.5V. The EN_BUCK pin has an internal
pull-up current source that can be used to adjust the input voltage under voltage lockout (UVLO) threshold with
two external resistors. In addition, the pull up current provides a default condition. When the EN_BUCK pin is
floating the device will operate. The operating current is 116µA when not switching and under no load. When the
device is disabled, the supply current is 1.3µA.
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The integrated 200mΩ high side MOSFET allows for high efficiency power supply designs capable of delivering
1.5 amperes of continuous current to a load. The bias voltage for the integrated high side MOSFET is supplied
by a capacitor on the BOOT to PH pin. The boot capacitor voltage is monitored by an UVLO circuit and will turn
the high side MOSFET off when the boot voltage falls below a preset threshold. The buck can operate at high
duty cycles because of the boot UVLO. The output voltage can be stepped down to as low as the 0.8V
reference.
The BUCK has a power good comparator (PWRGD) which asserts when the regulated output voltage is less
than 92% or greater than 109% of the nominal output voltage. The PWRGD pin is an open drain output which
deasserts when the VSENSE pin voltage is between 94% and 107% of the nominal output voltage allowing the
pin to transition high when a pull-up resistor is used.
The BUCK minimizes excessive output overvoltage (OV) transients by taking advantage of the OV power good
comparator. When the OV comparator is activated, the high side MOSFET is turned off and masked from turning
on until the output voltage is lower than 107%.
The SS_TR (slow start/tracking) pin is used to minimize inrush currents or provide power supply sequencing
during power up. A small value capacitor should be coupled to the pin to adjust the slow start time. A resistor
divider can be coupled to the pin for critical power supply sequencing requirements. The SS_TR pin is
discharged before the output powers up. This discharging ensures a repeatable restart after an over-temperature
fault,
The BUCK, also, discharges the slow start capacitor during overload conditions with an overload recovery circuit.
The overload recovery circuit will slow start the output from the fault voltage to the nominal regulation voltage
once a fault condition is removed. A frequency foldback circuit reduces the switching frequency during startup
and overcurrent fault conditions to help control the inductor current.
PROTECTION FEATURES
Power Stage Protection
The DRV8301 provides over-current and under-voltage protection for the MOSFET power stage. During fault
shut down conditions, all gate driver outputs will be kept low to ensure external FETs at high impedance state.
Over-Current Protection (OCP) and Reporting
To protect the power stage from damage due to high currents, a VDS sensing circuitry is implemented in the
DRV8301. Based on RDS(on) of the power MOSFETs and the maximum allowed IDS, a voltage threshold can be
calculated which, when exceeded, triggers the OC protection feature. This voltage threshold level is
programmable through SPI command.
There are total 4 OC_MODE settings in SPI.
1. Current Limit Mode
When current limit mode is enabled, device operates current limiting instead of OC shut down during OC
event. The over-current event is reported through OCTW pin. OCTW reporting should hold low during same
PWM cycle or for a max 64µs period (internal timer) so external controller has enough time to sample the
warning signal. If in the middle of reporting, other FET(s) gets OC, then OCTW reporting will hold low and
recount another 64µS unless PWM cycles on both FETs are ended.
There are two current control settings in current limit mode (selected by one bit in SPI and default is CBC
mode).
– Setting 1 (CBC mode): during OC event, the FET that detected OC will turn off until next PWM cycle.
– Setting 2 (off-time control mode):
– During OC event, the FET that detected OC will turn off for 64us as off time and back to normal after
that (so same FET will be on again) if PWM signal is still holding high. Since all three phases or 6
FETs share a single timer, if more than one FET get OC, the FETs will not be back to normal until the
all FETs that have OC event pass 64µs.
– If PWM signal is toggled for this FET during timer running period, device will resume normal operation
for this toggled FET. So real off-time could be less than 64uS in this case.
– If two FETs get OC and one FET’s PWM signal gets toggled during timer running period, this FET will
be back to normal, and the other FET will be off till timer end (unless its PWM is also toggled)
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2. OC latch shut down mode
When OC occurs, device will turn off both high side and low side FETs in the same phase if any of the FETs
in that phase has OC.
3. Report only mode
No protection action will be performance in this mode. OC detection will be reported through OCTW pin and
SPI status register. External MCU should take actions based on its own control algorithm. A pulse stretching
of 64µS will be implemented on OCTW pin so controller can have enough time to sense the OC signal.
4. OC disable mode
Device will ignore all the OC detections and will not report them either.
Under-Voltage Protection (UVP)
To protect the power output stage during startup, shutdown and other possible under-voltage conditions, the
DRV8301 provides power stage under-voltage protection by driving its outputs low whenever PVDD is below 6V
(PVDD_UV) or GVDD is below 8V (GVDD_UV). When UVP is triggered, the DRV8301 outputs are driven low
and the external MOSFETs will go to a high impedance state.
Over-Voltage Protection (GVDD_OV)
Device will shut down both gate driver and charge pump if GVDD voltage exceeds 16V to prevent potential issue
related to GVDD or charge pump (e.g. short of external GVDD cap or charge pump). The fault is a latched fault
and can only be reset through a transition on EN_GATE pin.
Over-Temperature Protection
A two-level over-temperature detection circuit is implemented:
• Level 1: over temperature warning (OTW)
OTW is reported through OCTW pin (over-current-temperature warning) for default setting. OCTW pin can be
set to report OTW or OCW only through SPI command. See SPI Register section.
• Level 2: over temperature (OT) latched shut down of gate driver and charge pump (OTSD_GATE)
Fault will be reported to FAULT pin. This is a latched shut down, so gate driver will not be recovered
automatically even OT condition is not present anymore. An EN_GATE reset through pin or SPI
(RESET_GATE) is required to recover gate driver to normal operation after temperature goes below a preset
value, tOTSD_CLR.
SPI operation is still available and register settings will be remaining in the device during OTSD operation as long
as PVDD is still within defined operation range.
Fault and Protection Handling
The FAULT pin indicates an error event with shut down has occurred such as over-current, over-temperature,
over-voltage, or under-voltage. Note that FAULT is an open-drain signal. FAULT will go high when gate driver is
ready for PWM signal (internal EN_GATE goes high) during start up.
The OCTW pin indicates over current event and over temperature event that not necessary related to shut down.
Following is the summary of all protection features and their reporting structure:
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Table 1. Fault and Warning Reporting and Handling
EVENT
ACTION
LATCH
REPORTING ON
FAULT PIN
REPORTING ON
OCTW PIN
REPORTING IN SPI
STATUS REGISTER
PVDD
undervoltage
External FETs HiZ;
Weak pull down of all gate
driver output
N
Y
N
Y
DVDD
undervoltage
External FETs HiZ;
Weak pull down of all gate
driver output; When recovering,
reset all status registers
N
Y
N
N
GVDD
undervoltage
External FETs HiZ;
Weak pull down of all gate
driver output
N
Y
N
Y
GVDD
overvoltage
External FETs HiZ;
Weak pull down of all gate driver
output
Shut down the charge pump
Won’t recover and reset through
SPI reset command or
quick EN_GATE toggling
Y
Y
N
Y
OTW
None
N
N
Y (in default
setting)
Y
OTSD_GATE
Gate driver latched shut down.
Weak pull down of all gate driver
output
to force external FETs HiZ
Shut down the charge pump
Y
Y
Y
Y
OTSD_BUCK
OTSD of Buck
Y
N
N
N
Buck output
undervoltage
UVLO_BUCK: auto-restart
N
Y, in PWRGD pin
N
N
Buck overload
Buck current limiting
(HiZ high side until current reaches
zero and then auto-recovering)
N
N
N
N
External FET
overload – current
limit mode
External FETs current Limiting
(only OC detected FET)
N
N
Y
Y, indicates which phase
has OC
External FET
overload – Latch
mode
Weak pull down of gate driver
output and PWM logic “0” of
LS and HS in the same phase.
External FETs HiZ
Y
Y
Y
Y
External FET
overload –
reporting only
mode
Reporting only
N
N
Y
Y, indicates which phase
has OC
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PIN CONTROL FUNCTIONS
EN_GATE
EN_GATE low is used to put gate driver, charge pump, current shunt amplifier, and internal regulator blocks into
a low power consumption mode to save energy. SPI communication is not supported during this state. Device
will put the MOSFET output stage to high impedance mode as long as PVDD is still present.
When EN_GATE pin goes to high, it will go through a power up sequence, and enable gate driver, current
amplifiers, charge pump, internal regulator, etc and reset all latched faults related to gate driver block. It will also
reset status registers in SPI table. All latched faults can be reset when EN_GATE is toggled after an error event
unless the fault is still present.
When EN_GATE goes from high to low, it will shut down gate driver block immediately, so gate output can put
external FETs in high impedance mode. It will then wait for 10us before completely shutting down the rest of the
blocks. A quick fault reset mode can be done by toggling EN_GATE pin for a very short period (less than 10µS).
This will prevent device to shut down other function blocks such as charge pump and internal regulators and
bring a quicker and simple fault recovery. SPI will still function with such a quick EN_GATE reset mode.
The other way to reset all the faults is to use SPI command (RESET_GATE), which will only reset gate driver
block and all the SPI status registers without shutting down other function blocks.
One exception is to reset a GVDD_OV fault. A quick EN_GATE quick fault reset or SPI command reset won’t
work with GVDD_OV fault. A complete EN_GATE with low level holding longer than 10µS is required to reset
GVDD_OV fault. It is highly recommended to inspect the system and board when GVDD_OV occurs.
EN_BUCK
Buck enable pin, internal pull-up current source. Pull below 1.2V to disable. Float to enable.
DTC
Dead time can be programmed through DTC pin. A resistor should be connected from DTC to ground to control
the dead time. Dead time control range is from 50ns to 500ns. Short DTC pin to ground will provide minimum
dead time (50ns). Resistor range is 0 to 150kΩ. Dead time is linearly set over this resistor range.
Current shoot through prevention protection will be enabled in the device all time independent of dead time
setting and input mode setting.
VDD_SPI
VDD_SPI is the power supply to power SDO pin. It has to be connected to the same power supply (3.3V or 5V)
that MCU uses for its SPI operation.
During power up or down transient, VDD_SPI pin could be zero voltage shortly. During this period, no SDO
signal should be present at SDO pin from any other devices in the system since it causes a parasitic diode in the
DRV8301 conducting from SDO to VDD_SPI pin as a short. This should be considered and prevented from
system power sequence design.
DC_CAL
When DC_CAL is enabled, device will short inputs of shunt amplifier and disconnect from the load, so external
microcontroller can do a DC offset calibration. DC offset calibration can be also done with SPI command. If using
SPI exclusively for DC calibration, the DC_CAL pin can connected to GND.
SPI Pins
SDO pin has to be 3-state, so a data bus line can be connected to multiple SPI slave devices. SCS pin is active
low. When SCS is high, SDO is at high impendence mode.
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STARTUP AND SHUTDOWN SEQUENCE CONTROL
During power-up all gate drive outputs are held low. Normal operation of gate driver and current shunt amplifiers
can be initiated by toggling EN_GATE from a low state to a high state. If no errors are present, the DRV8301 is
ready to accept PWM inputs. Gate driver always has control of the power FETs even in gate disable mode as
long as PVDD is within functional region.
There is an internal diode from SDO to VDD_SPI, so VDD_SPI is required to be powered to the same power
level as other SPI devices (if there is any SDO signal from other devices) all the time. VDD_SPI supply should
be powered up first before any signal appears at SDO pin and powered down after completing all
communications at SDO pin.
SPI COMMUNICATION
SPI Interface
SPI interface is used to set device configuration, operating parameters and read out diagnostic information. The
DRV8301 SPI Interface operates in the slave mode.
The SPI input data (SDI) word consists of 16bit word, with 11 bit data and 5 bit (MSB) command. The SPI output
data (SDO) word consists of 16bit word, with 11 bit register data and 4 bit MSB address data and 1 frame fault
bit (active 1). When a frame is not valid, frame fault bit will set to 1, and rest of SDO bit will shift out zeros.
A valid frame has to meet following conditions:
1. Clock must be low when /SCS goes low.
2. We should have 16 full clock cycles.
3. Clock must be low when /SCS goes high.
When SCS is asserted high, any signals at the SCLK and SDI pins are ignored, and SDO is forced into a high
impedance state. When SCS transitions from HIGH to LOW, SDO is enabled and the SPI response word loads
into the shift register based on 5 bit command in SPI at previous clock cycle.
The SCLK pin must be low when SCS transitions low. While SCS is low, at each rising edge of the clock, the
response bit is serially shifted out on the SDO pin with MSB shifted out first.
While SCS is low, at each falling edge of the clock, the new control bit is sampled on the SDI pin. The SPI
command bits are decoded to determine the register address and access type (read or write). The MSB will be
shifted in first. If the word sent to SDI is less than 16 bits or more than 16 bits, it is considered a frame error. If it
is a write command, the data will be ignored. The fault bit in SDO (MSB) will report 1 at next 16 bit word cycle.
After the 16th clock cycle or when SCS transitions from LOW to HIGH, in case of write access type, the SPI
receive shift register data is transferred into the latch where address matches decoded SPI command address
value. Any amount of time may pass between bits, as long as SCS stays active low. This allows two 8-bit words
to be used.
For a read command (Nth cycle) in SPI, SP0 will send out data in the register with address in read command in
next cycle (N+1).
For a write command in SPI, SPO will send out data in the status register 0x00h in next 16 bit word cycle (N+1).
For most of the time, this feature will maximize SPI communication efficiency when having a write command, but
still get fault status values back without sending extra read command.
SPI Format
SPI input data control word is 16-bit long, consisting of:
• 1 read or write bit W [15]
• 4 address bits A [14:11]
• 11 data bits D [10:0]
SPI output data response word is 16-bit long, and its content depends on the given SPI command (SPI Control
Word) in the previous cycle. When a SPI Control Word is shifted in, the SPI Response Word (that is shifted out
during the same transition time) is the response to the previous SPI Command (shift in SPI Control Word "N" and
shift out SPI Response Word "N-1").
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Therefore, each SPI Control / Response pair requires two full 16-bit shift cycles to complete.
Table 2. SPI Input Data Control Word Format
R/W
Address
Data
Word Bit
B15
B14
B13
B12
B11
B10
B9
B8
B7
B6
B5
B4
B3
B2
B1
B0
Command
W0
A3
A2
A1
A0
D10
D9
D8
D7
D6
D5
D4
D3
D2
D1
D0
Table 3. SPI Output Data Response Word Format
R/W
Data
Word Bit
B15
B14
B13
B12
B11
B10
B9
B8
B7
B6
B5
B4
B3
B2
B1
B0
Command
F0
A3
A2
A1
A0
D10
D9
D8
D7
D6
D5
D4
D3
D2
D1
D0
SPI Control and Status Registers
Read / Write Bit
The MSB bit of SDI word (W0) is read/write bit. When W0 = 0, input data is a write command; when W0 = 1,
input data is a read command, and the register value will send out on the same word cycle from SDO from D10
to D0.
Address Bits
Table 4. Register Address
Register Type
Status
Register
Control
Register
Address [A3..A0]
Register
Name
Description
Read and Write Access
0
0
0
0
Status
Register 1
Report occurred faults after previous
reading
R (auto reset to default values after read)
0
0
0
1
Status
Register 2
Device ID and report occurred faults
after previous reading
Device ID: R
Fault report: R (auto reset to default
values after read)
0
0
1
0
Control
Register 1
R/W
0
0
1
1
Control
Register 2
R/W
SPI Data Bits
Status Registers
Table 5. Status Register 1 (Address: 0x00) (all default values are zero)
Address
Register
Name
D10
D9
D8
D7
D6
D5
D4
D3
D2
D1
D0
0x00
Status
Register 1
FAULT
GVDD_UV
PVDD_UV
OTSD
OTW
FETHA_OC
FETLA_OC
FETHB_OC
FETLB_OC
FETHC_OC
FETLC_OC
Table 6. Status Register 2 (Address: 0x01) (all default values are zero)
•
•
•
•
Address
Register Name
D7
0x01
Status
Register 2
GVDD_OV
D6
D5
D4
D3
D2
D1
D0
0
0
Device ID
0
0
All status register bits are in latched mode. Read each status register will reset the bits in this register. Read
fault register twice to get an updated status condition.
EN_GATE toggling with “low” level holding longer than 10µS will force a shut down and start up sequence
and reset all values in status registers including GVDD_OV fault.
EN_GATE toggling (quick fault reset) with low level holding less than 10uS or GATE_RESET high (in SPI) will
reset all values in status registers except GVDD_OV fault which will still be latched as a fault.
FAULT is high when any fault occurs to cause a shut down (GVDD_UV, PVDD_UV, OTSD, OCSD,
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GVDD_OV), which is opposite to FAULT hardware pin.
Control Registers
Table 7. Control Register 1 for Gate Driver Control (Address: 0x02) (1)
Address
Name
0x02
GATE_CURRENT
GATE_RESET
D1
D0
Gate driver peak current 1.7A (for slew rate
control)
Description
D10
D9
D8
D7
D6
D5
D4
D3
D2
0
0
Gate driver peak current 0.7A
0
1
Gate driver peak current 0.25A
1
0
Reserved
1
1
Normal mode
0
Reset all latched faults related to gate driver, reset
gate driver back to normal operation, reset status
register values to default
1
GATE_RESET value will automatically reset to
zero after gate driver completes reset
PWM_MODE
OC_MODE
(gate driver only)
OC_ADJ_SET
(1)
PWM with six independent inputs
0
PWM with three independent inputs. PWM control
high side gates only. Low side is complementary
to high side gates with minimum internal dead
time.
1
Current limiting when OC detected
0
0
Latched shut down when OC detected
0
1
Report only (no current limiting or shut down)
when OC detected
1
0
OC protection disabled (no OC sensing and
reporting)
1
1
See OC_ADJ_SET table
X
X
X
X
X
Bold is default value
Table 8. Control Register 2 for Current Shunt Amplifiers and Misc Control (Address: 0x03) (1)
Address
Name
0x03
OCTW_SET
GAIN
DC_CAL_CH1
DC_CAL_CH2
OC_TOFF
Description
D1
D0
Report both OT and OC at /OCTW pin
D10
D9
D8
D7
D6
D5
D4
D3
D2
0
0
Report OT only
0
1
Report OC only
1
0
Report OC Only (Reserved)
1
1
Gain of shunt amplifier: 10V/V
0
0
Gain of shunt amplifier: 20V/V
0
1
Gain of shunt amplifier: 40V/V
1
0
Gain of shunt amplifier: 80V/V
1
1
Shunt amplifier 1 connects to load through input pins
0
Shunt amplifier 1 shorts input pins and disconnected from load
for external calibration
1
Shunt amplifier 2 connects to load through input pins
0
Shunt amplifier 2 shorts input pins and disconnected from load
for external calibration
1
Normal CBC operation (recovering at next PWM cycle)
0
Off time control during OC
1
Reserved
(1)
20
Bold value is default value
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DRV8301
SLOS719 – AUGUST 2011
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Over Current Adjustment
When external MOSFET is turned on, the output current flows the MOSFET, which creates a voltage drop VDS.
The overcurrent protection event will be enabled when the VDS exceeds a pre-set value IOC. The OC tripped
value can be programmed through SPI command. Assuming the on resistance of MOSFET is RDS(on), the Vds
can be calculated as:
VDS = IOC × RDS(on)
VDS is measured across the SL_x and SH_x pins for the low-side MOSFET. For the high-side MOSFET, VDS is
measured across PVDD1 (internally) and SH_x. Therefore, it is important to limit the ripple on the PVDD1 supply
for accurate high-side current sensing.
It is also important to note that there can be up to a 20% tolerance across channels for the OC trip point. This is
meant for protection and not to be used for regulating current in a motor phase.
Table 9. OC_ADJ_SET Table
Control Bit (D6–D10) (0xH)
Vds (V)
Control Bit (D6–D10) (0xH)
Vds (V)
Control Bit (D6–D10) (0xH)
Vds (V)
Code Number (0xH)
Vds (V)
0
1
2
3
4
5
6
7
0.060
0.068
0.076
0.086
0.097
0.109
0.123
0.138
8
9
10
11
12
13
14
15
0.155
0.175
0.197
0.222
0.250
0.282
0.317
0.358
16
17
18
19
20
21
22
23
0.403
0.454
0.511
0.576
0.648
0.730
0.822
0.926
24
25
26
27
28
29
30
31
1.043
1.175
1.324
1.491
1.679
1.892
2.131
2.400
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21
DRV8301
SLOS719 – AUGUST 2011
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Application Schematic Example
Example:
Buck: PVDD= 3.5V – 40V, Iout_max = 1.5A, Vo = 3.3V, Fs = 570 kHz
6.8 nF
VCC
PVDD
0 .015 mF
120 pF
205 kW
3 .3
31.6 kW
SS_TR
RT _CLK
16 .2 K
EN_BUCK
COMP
10 kW
10 nF
VSENSE
PVDD 2
PWRGD
PVDD 2
PVDD
10kW
VCC
0.1 mF
0.1 mF
10 kW
2.2 mF
OCTW
BST _BK
FAULT
PH
DTC
PH
SCS
VDD _SPI
SDI
BST _A
SDO
GH_A
SCLK
SH_A
DC_CAL
GL_A
GVDD
22 nF
CP1
Motor
Controller
CP2
PWM
EN_GATE
ADC
1 mF
POWER PAD - GND
SPI
10kW
470 mF
4.7 mF
22 mH
VCC ( 3.3V )
47 mF
VCC
PVDD
0.1 mF
SL _A
MOTOR
0.1 mF
BST _B
GH_B
SH_B
INH_A
GL _B
INL_A
SL_B
INH_B
BST _ C
INL_B
GH_ C
INH_C
SH _ C
INL_C
GL_ C
DVDD
SL_ C
REF
SN1
SO1
SP1
SO2
SN2
0.1 mF
1 nF
10 mW
1 nF
AVDD
SP2
AGND
PVDD 1
Power
Pad
RS1
RS2
10mW
GND
1 mF
PVDD
0 .1 mF
4.7 mF
AGND GND
22
GND
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PGND
Copyright © 2011, Texas Instruments Incorporated
Product Folder Link(s): DRV8301
PACKAGE OPTION ADDENDUM
www.ti.com
9-Aug-2012
PACKAGING INFORMATION
Orderable Device
Status
(1)
Package Type Package
Drawing
Pins
Package Qty
Eco Plan
(2)
Lead/
Ball Finish
MSL Peak Temp
(3)
DRV8301DCA
ACTIVE
HTSSOP
DCA
56
35
Green (RoHS
& no Sb/Br)
CU NIPDAU Level-3-260C-168 HR
DRV8301DCAR
ACTIVE
HTSSOP
DCA
56
2000
Green (RoHS
& no Sb/Br)
CU NIPDAU Level-3-260C-168 HR
Samples
(Requires Login)
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability
information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that
lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between
the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight
in homogeneous material)
(3)
MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
Addendum-Page 1
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