Features • Single Voltage Operation • • • • • • • • • – 5V Read – 5V Programming Fast Read Access Time - 70 ns Internal Erase/Program Control Sector Architecture – One 8K Words (16K bytes) Boot Block with Programming Lockout – Two 4K Words (8K bytes) Parameter Blocks – One 496K Words (992K bytes) Main Memory Array Block Fast Sector Erase Time - 10 seconds Byte-by-byte or Word-by-word Programming - 10 µs Typical Hardware Data Protection DATA Polling For End Of Program Detection Low Power Dissipation – 50 mA Active Current – 300 µA CMOS Standby Current Typical 10,000 Write Cycles 8-megabit (1M x 8/ 512K x 16) Flash Memory Description The AT49F008A(T) and AT49F8192A(T) are 5-volt, 8-megabit Flash memories organized as 1,048,576 words of 8 bits each or 512K words of 16 bits each. Manufactured with Atmel’s advanced nonvolatile CMOS technology, the devices offer access times to 70 ns with power dissipation of just 275 mW. When deselected, the CMOS standby current is less than 300 µA. The device contains a user-enabled “boot block” protection feature. Two versions of the feature are available: the AT49F008A/8192A locates the boot block at lowest order addresses (“bottom boot”); the AT49F008AT/8192AT locates it at highest order addresses (“top boot”). To allow for simple in-system reprogrammability, the AT49F008A(T)/8192A(T) does not require high input voltages for programming. Reading data out of the device is similar to reading from an EPROM; it has standard CE, OE, and WE inputs to avoid bus contention. Reprogramming the AT49F008A(T)/8192A(T) is performed by first erasing a block of data and then programming on a byte-by-byte or word-by-word basis. (continued) AT49F008A AT49F008AT AT49F8192A AT49F8192AT Pin Configurations Pin Name Function A0 - A18 Addresses CE Chip Enable OE Output Enable WE Write Enable RESET Reset RDY/BUSY Ready/Busy Output I/O0 - I/O14 Data Inputs/Outputs I/O15 (A-1) I/O15 (Data Input/Output, Word Mode) A-1 (LSB Address Input, Byte Mode) BYTE Selects Byte or Word Mode NC No Connect Rev. 1199D–08/99 1 AT49F8192A(T) TSOP Top View Type 1 A15 A14 A13 A12 A11 A10 A9 A8 NC NC WE RESET NC NC NC A18 A17 A7 A6 A5 A4 A3 A2 A1 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 48 47 46 45 44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 25 2 3 4 5 6 7 8 A8 NC NC NC A7 A4 A 44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 25 24 23 B AT49F008A(T) Standard Pin Definition CBGA Top View (Ball Down) 3 4 5 6 7 8 A8 NC NC NC A7 A4 A14 A10 WE RST A18 A17 A5 A2 1 2 A14 A10 WE RST A18 A17 A5 A15 A12 A9 NC NC A6 A3 A9 NC NC A6 A3 A16 I/O14 I/O5 I/O11 I/O2 I/O8 CE CE BYTE I/O15 I/O6 I/O12 I/O3 I/O9 I/O0 GND GND I/O7 I/O13 I/O4 VCC I/O10 I/O1 OE 2 A14 A12 A0 E F 1 3 4 5 6 7 8 A8 NC NC NC A7 A4 A15 A10 WE RST A19 A18 A5 A2 A16 A13 A6 A3 A1 A17 NC I/O5 NC I/O2 NC CE A0 A9 NC NC D A16 NC I/O5 NC I/O2 NC A0 AT49F008A(T) Alternate Pin Definition CBGA Top View (Ball Down) A1 D E A17 GND NC A-1 A10 I/O7 I/O6 I/O5 I/O4 VCC VCC NC I/O3 I/O2 I/O1 I/O0 OE GND CE A0 C A15 A12 A1 40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 25 24 23 22 21 B C D 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 A A13 A11 A2 AT49F008A(T) TSOP Top View Type 1 A16 A15 A14 A13 A12 A11 A9 A8 WE RESET NC RDY/BUSY A18 A7 A6 A5 A4 A3 A2 A1 B C NC A-1 I/O6 NC I/O3 NC I/O0 GND F GND I/O7 NC I/O4 VCC NC I/O1 OE E NC A11 I/O6 NC I/O3 NC I/O0 GND F GND I/O7 NC I/O4 VCC NC I/O1 OE “•” denotes a white dot marked on the package. The device is erased by executing the erase command sequence; the device internally controls the erase operation. The memory is divided into four blocks for erase operations. There are two 4K word parameter block sections, the boot block, and the main memory array block. The typical number of program and erase cycles is in excess of 10,000 cycles. The optional 8K word boot block section includes a reprogramming lock out feature to provide data integrity. This feature is enabled by a command sequence. Once the boot block programming lockout feature is enabled, the data in the boot block cannot be changed when input levels of 3.6 2 RESET WE A8 A9 A10 A11 A12 A13 A14 A15 A16 BYTE GND I/O15 I/O7 I/O14 I/O6 I/O13 I/O5 I/O12 I/O4 VCC A A13 A11 Note: 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 NC A18 A17 A7 A6 A5 A4 A3 A2 A1 A0 CE GND OE I/O0 I/O8 I/O1 I/O9 I/O2 I/O10 I/O3 I/O11 A16 BYTE GND I/O15 / A-1 I/O7 I/O14 I/O6 I/O13 I/O5 I/O12 I/O4 VCC I/O11 I/O3 I/O10 I/O2 I/O9 I/O1 I/O8 I/O0 OE GND CE A0 AT49F8192A(T) CBGA Top View (Ball Down) 1 AT49F8192A(T) SOIC (SOP) Top View AT49F008A(T)/8192A(T) volts or less are used. The boot sector is designed to contain user secure code. For the AT49F8192A(T), the BYTE pin controls whether the device data I/O pins operate in the byte or word configuration. If the BYTE pin is set at a logic “1” or left open, the device is in word configuration, I/O0 - I/O15 are active and controlled by CE and OE. If the BYTE pin is set at logic “0”, the device is in byte configuration, and only data I/O pins I/O0 - I/O7 are active and controlled by CE and OE. The data I/O pins I/O8 - I/O14 are tri-stated and the I/O15 pin is used as an input for the LSB (A-1) address function. AT49F008A(T)/8192A(T) AT49F008A(T) Block Diagram AT49F008A VCC AT49F008AT DATA INPUTS/OUTPUTS I/O0 - I/O7 DATA INPUTS/OUTPUTS I/O0 - I/O7 INPUT/OUTPUT BUFFERS INPUT/OUTPUT BUFFERS PROGRAM DATA LATCHES PROGRAM DATA LATCHES GND OE WE CE RESET CONTROL LOGIC Y DECODER ADDRESS INPUTS X DECODER Y-GATING MAIN MEMORY (992K BYTES) PARAMETER BLOCK 2 8K BYTES PARAMETER BLOCK 1 8K BYTES BOOT BLOCK 16K BYTES Y-GATING FFFFF 08000 07FFF 06000 05FFF 04000 03FFF 00000 BOOT BLOCK 16K BYTES PARAMETER BLOCK 1 8K BYTES PARAMETER BLOCK 2 8K BYTES MAIN MEMORY (992K BYTES) FFFFF FC000 FBFFF 7A000 79FFF 78000 77FFF 00000 AT49F8192A(T) Block Diagram AT49F8192A VCC AT49F8192AT DATA INPUTS/OUTPUTS I/O0 - I/O15 DATA INPUTS/OUTPUTS I/O0 - I/O15 INPUT/OUTPUT BUFFERS INPUT/OUTPUT BUFFERS PROGRAM DATA LATCHES PROGRAM DATA LATCHES GND OE WE CE RESET CONTROL LOGIC Y DECODER ADDRESS INPUTS X DECODER Y-GATING Y-GATING MAIN MEMORY (496K WORDS) PARAMETER BLOCK 2 4K WORDS PARAMETER BLOCK 1 4K WORDS BOOT BLOCK 8K WORDS 7FFFF 04000 03FFF 03000 02FFF 02000 01FFF 00000 BOOT BLOCK 8K WORDS PARAMETER BLOCK 1 4K WORDS PARAMETER BLOCK 2 4K WORDS MAIN MEMORY (496K WORDS) 7FFFF 7E000 7DFFF 7D000 7CFFF 7C000 7BFFF 00000 Device Operation READ: The AT49F008A(T)/8192A(T) is accessed like an EPROM. When CE and OE are low and WE is high, the data stored at the memory location determined by the address pins is asserted on the outputs. The outputs are put in the high impedance state whenever CE or OE is high. This dual-line control gives designers flexibility in preventing bus contention. COMMAND SEQUENCES: When the device is first powered on it will be reset to the read or standby mode depending upon the state of the control line inputs. In order to perform other device functions, a series of command sequences are entered into the device. The command sequences are shown in the Command Definitions table (I/O8 - I/O15 are don’t care inputs for the command codes). The command sequences are written by applying a low pulse on the WE or CE input with CE or WE low (respectively) and OE high. The address is latched on the falling edge of CE or WE, whichever occurs last. The data is latched by the first rising edge of CE or WE. Standard microprocessor write timings are used. The address locations used in the command sequences are not affected by entering the command sequences. RESET: A RESET input pin is provided to ease some system applications. When RESET is at a logic high level, the 3 device is in its standard operating mode. A low level on the RESET input halts the present device operation and puts the outputs of the device in a high impedance state. When a high level is reasserted on the RESET pin, the device returns to the Read or Standby mode, depending upon the state of the control inputs. By applying a 12V ± 0.5V input signal to the RESET pin the boot block array can be reprogrammed even if the boot block program lockout feature has been enabled (see Boot Block Programming Lockout Override section). ERASURE: Before a byte or word can be reprogrammed, it must be erased. The erased state of memory bits is a logical “1”. The entire device can be erased by using the Chip Erase command or individual sectors can be erased by using the Sector Erase commands. CHIP ERASE: The entire device can be erased at one time by using the 6-byte chip erase software code. After the chip erase has been initiated, the device will internally time the erase operation so that no external clocks are required. The maximum time to erase the chip is tEC. If the boot block lockout has been enabled, the Chip Erase will not erase the data in the boot block; it will erase the main memory block and the parameter blocks only. After the chip erase, the device will return to the read or standby mode. SECTOR ERASE: As an alternative to a full chip erase, the device is organized into four sectors that can be individually erased. There are two 4K word parameter block sections, one boot block, and the main memory array block. The Sector Erase command is a six bus cycle operation. The sector address is latched on the falling WE edge of the sixth cycle while the 30H data input command is latched at the rising edge of WE. The sector erase starts after the rising edge of WE of the sixth cycle. The erase operation is internally controlled; it will automatically time to completion. Whenever the main memory block is erased and reprogrammed, the two parameter blocks should be erased and reprogrammed before the main memory block is erased again. Whenever a parameter block is erased and reprogrammed, the other parameter block should be erased and reprogrammed before the first parameter block is erased again. Whenever the boot block is erased and reprogrammed, the main memory block and the parameter blocks should be erased and reprogrammed before the boot block is erased again. BYTE/WORD PROGRAMMING: Once a memory block is erased, it is programmed (to a logical “0”) on a byte-by-byte or word-by-word basis. Programming is accomplished via the internal device command register and is a 4 bus cycle operation. The device will automatically generate the required internal program pulses. Any commands written to the chip during the embedded programming cycle will be ignored. If a hardware reset hap- 4 AT49F008A(T)/8192A(T) pens during programming, the data at the location being programmed will be corrupted. Please note that a data “0” cannot be programmed back to a “1”; only erase operations can convert “0”s to “1”s. Programming is completed after the specified tBP cycle time. The DATA polling feature may also be used to indicate the end of a program cycle. BOOT BLOCK PROGRAMMING LOCKOUT: The device has one designated block that has a programming lockout feature. This feature prevents programming of data in the designated block once the feature has been enabled. The size of the block is 8K words. This block, referred to as the boot block, can contain secure code that is used to bring up the system. Enabling the lockout feature will allow the boot code to stay in the device while data in the rest of the device is updated. This feature does not have to be activated; the boot block’s usage as a write protected region is optional to the user. The address range of the boot block is 00000H to 03FFFH for the AT49F008A; FC000H to FFFFFH for the AT49F008AT; 00000H to 01FFFH for the AT49F8192A; and 7E000H to 7FFFFH for the AT49F8192AT. Once the feature is enabled, the data in the boot block can no longer be erased or programmed when input levels of 5.5V or less are used. Data in the main memory block can still be changed through the regular programming method. To activate the lockout feature, a series of six program commands to specific addresses with specific data must be performed. Please refer to the Command Definitions table. BOOT BLOCK LOCKOUT DETECTION: A software method is available to determine if programming of the boot block section is locked out. When the device is in the software product identification mode (see Software Product Identification Entry and Exit sections) a read from the following address location will show if programming the boot block is locked out—00002H for the AT49F008A and AT49F8192A; FC002H for the AT49F008AT; and 7E002H for the AT49F8192AT. If the data on I/O0 is low, the boot block can be programmed; if the data on I/O0 is high, the program lockout feature has been enabled and the block cannot be programmed. The software product identification exit code should be used to return to standard operation. BOOT BLOCK PROGRAMMING LOCKOUT OVERRIDE: The user can override the boot block programming lockout by taking the RESET pin to 12 volts during the entire chip erase, sector erase or word programming operation. When the RESET pin is brought back to TTL levels the boot block programming lockout feature is again active. PRODUCT IDENTIFICATION: The product identification mode identifies the device and manufacturer as Atmel. It may be accessed by hardware or software operation. The hardware operation mode can be used by an external programmer to identify the correct programming algorithm for the Atmel product. AT49F008A(T)/8192A(T) For details, see Operating Modes (for hardware operation) or Software Product Identification. The manufacturer and device code is the same for both modes. DATA POLLING: The AT49F008A(T)/8192A(T) features DATA polling to indicate the end of a program cycle. During a program cycle an attempted read of the last byte loaded will result in the complement of the loaded data on I/O7. Once the program cycle has been completed, true data is valid on all outputs and the next cycle may begin. During a chip or sector erase operation, an attempt to read the device will give a “0” on I/O7. Once the program or erase cycle has completed, true data will be read from the device. DATA polling may begin at any time during the program cycle. T O G G L E B I T : I n a d d i t i o n t o D ATA p o l l i n g t h e AT49F008A(T)/8192A(T) provides another method for determining the end of a program or erase cycle. During a program or erase operation, successive attempts to read data from the device will result in I/O6 toggling between one and zero. Once the program cycle has completed, I/O6 will stop toggling and valid data will be read. Examining the toggle bit may begin at any time during a program cycle. READY/BUSY: For the AT49F008A(T), pin 12 is an open drain READY/BUSY output pin which provides another method of detecting the end of a program or erase operation. RDY/BUSY is actively pulled low during the internal program and erase cycles and it is released at the completion of the cycle. The open drain connection allows for ORtying of several devices to the same RDY/BUSY line. HARDWARE DATA PROTECTION: Hardware features protect against inadvertent programs to the AT49F008A(T)/8192A(T) in the following ways: (a) V CC sense: if VCC is below 3.8V (typical), the program function is inhibited. (b) VCC power on delay: once VCC has reached the VCC sense level, the device will automatically time out 10 ms (typical) before programming. (c) Program inhibit: holding any one of OE low, CE high or WE high inhibits program cycles. (d) Noise filter: pulses of less than 15 ns (typical) on the WE or CE inputs will not initiate a program cycle. AT49F008A(T) ALTERNATE PIN DEFINITION: Two AT49F008A(T) BGA pin definitions are shown. The standard pin definition allows use of the JEDEC standard programming algorithm. If the alternate pin definition is used, the programming algorithm must be modified as shown in the Command Definition for Alternate Pin Definition Table on page 7. 5 Command Definition in Hex(1) Command Sequence 1st Bus Cycle Bus Cycles Addr Data Read 1 Addr DOUT Chip Erase 6 5555 AA 2nd Bus Cycle 3rd Bus Cycle 4th Bus Cycle Data Addr Data Addr Data Addr Data Addr Data 2AAA 55 5555 80 5555 AA 2AAA 55 5555 10 2AAA 55 (4) SA 30 2AAA 55 5555 40 6 5555 AA 2AAA 55 5555 80 5555 AA Byte/Word Program 4 5555 AA 2AAA 55 5555 A0 Addr DIN Boot Block Lockout(2) 6 5555 AA 2AAA 55 5555 80 5555 AA Product ID Entry 3 5555 AA 2AAA 55 5555 90 (3) 3 5555 AA 2AAA 55 5555 F0 (3) 1 xxxx F0 Product ID Exit Notes: 6th Bus Cycle Addr Sector Erase Product ID Exit 5th Bus Cycle 1. The DATA FORMAT in each bus cycle is as follows: I/O15 - I/O8 (Don’t Care); I/O7 - I/O0 (Hex) The ADDRESS FORMAT in each bus cycle is as follows: A15 - A0 (Hex), A-1, and A15 - A18 (Don’t Care) 2. The boot sector has the address range 00000H to 03FFFH for the AT49F008A; FC000H to FFFFFH for the AT49F008AT; 00000H to 01FFFH for the AT49F8192A; and 7E000H to 7FFFFH for the AT49F8192AT. 3. Either one of the Product ID Exit commands can be used. 4. SA = sector addresses: (A0 - A18) For the AT49F008A/8192A SA = 01XXX for BOOT BLOCK SA = 02XXX for PARAMETER BLOCK 1 SA = 03XXX for PARAMETER BLOCK 2 SA = 7FXXX for MAIN MEMORY ARRAY For the AT49F008AT/8192AT SA = 7FXXX for BOOT BLOCK SA = 7DXXX for PARAMETER BLOCK 1 SA = 7CXXX for PARAMETER BLOCK 2 SA = 7BXXX for MAIN MEMORY ARRAY Absolute Maximum Ratings* Temperature Under Bias................................ -55°C to +125°C Storage Temperature ..................................... -65°C to +150°C All Input Voltages (including NC Pins) with Respect to Ground ...................................-0.6V to +6.25V All Output Voltages with Respect to Ground .............................-0.6V to VCC + 0.6V Voltage on RESET with Respect to Ground ...................................-0.6V to +13.5V 6 AT49F008A(T)/8192A(T) *NOTICE: Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. AT49F008A(T)/8192A(T) Command Definition (in Hex) for Alternate Pin Definition of AT49F008A(T)(1) Command Sequence 1st Bus Cycle Bus Cycles Addr Data Read 1 Addr DOUT Chip Erase 6 A555 AA 2nd Bus Cycle 3rd Bus Cycle 4th Bus Cycle Data Addr Data Addr Data Addr Data Addr Data 5AAA 55 A555 80 A555 AA 5AAA 55 A555 10 5AAA 55 (4) SA 30 5AAA 55 A555 40 6 A555 AA 5AAA 55 A555 80 A555 AA Byte/Word Program 4 A555 AA 5AAA 55 A555 A0 Addr DIN Boot Block Lockout(2) 6 A555 AA 5AAA 55 A555 80 A555 AA Product ID Entry 3 A555 AA 5AAA 55 A555 90 (3) 3 A555 AA 5AAA 55 A555 F0 (3) 1 xxxx F0 Product ID Exit Notes: 6th Bus Cycle Addr Sector Erase Product ID Exit 5th Bus Cycle 1. The DATA FORMAT in each bus cycle is as follows: I/O15 - I/O8 (Don’t Care); I/O7 - I/O0 (Hex) The ADDRESS FORMAT in each bus cycle is as follows: A15 - A0 (Hex), A-1, and A15 - A18 (Don’t Care) 2. The boot sector has the address range 00000H to 03FFFH for the AT49F008A; FC000H to FFFFFH for the AT49F008AT; 00000H to 01FFFH for the AT49F8192A; and 7E000H to 7FFFFH for the AT49F8192AT. 3. Either one of the Product ID Exit commands can be used. 4. SA = sector addresses: (A0 - A18) For the AT49F008A/8192A SA = 02XXX for BOOT BLOCK SA = 04XXX for PARAMETER BLOCK 1 SA = 06XXX for PARAMETER BLOCK 2 SA = FEXXX for MAIN MEMORY ARRAY For the AT49F008AT/8192AT SA = FEXXX for BOOT BLOCK SA = FAXXX for PARAMETER BLOCK 1 SA = 78XXX for PARAMETER BLOCK 2 SA = 76XXX for MAIN MEMORY ARRAY Absolute Maximum Ratings* Temperature Under Bias................................ -55°C to +125°C Storage Temperature ..................................... -65°C to +150°C All Input Voltages (including NC Pins) with Respect to Ground ...................................-0.6V to +6.25V All Output Voltages with Respect to Ground .............................-0.6V to VCC + 0.6V *NOTICE: Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. Voltage on RESET with Respect to Ground ...................................-0.6V to +13.5V 7 DC and AC Operating Range Operating Temperature (Case) AT49F008A(T)/8192A(T)-70 AT49F008A(T)/8192A(T)-90 AT49F008A(T)/8192A(T)-120 0°C - 70°C 0°C - 70°C 0°C - 70°C -40°C - 85°C -40°C - 85°C -40°C - 85°C Com. Ind. 5V ± 10% VCC Power Supply 5V ± 10% 5V ± 10% Operating Modes Mode CE OE WE RESET Ai I/O VIL VIL VIH VIH Ai DOUT VIL VIH VIL VIH Ai DIN VIH X(1) X VIH X High Z Program Inhibit X X VIH VIH Program Inhibit X VIL X VIH Output Disable X VIH X VIH Reset X X X VIL Read Program/Erase (2) Standby/Program Inhibit High Z X High Z Product Identification Hardware VIL VIL VIH Software(5) Notes: VIH VIH A1 - A18 = VIL, A9 = VH,(3) A0 = VIL Manufacturer Code(4) A1 - A18 = VIL, A9 = VH,(3) A0 = VIH Device Code(4) A0 = VIL, A1 - A18 = VIL Manufacturer Code(4) A0 = VIH, A1 - A18 = VIL Device Code(4) 1. X can be VIL or VIH. 2. Refer to AC Programming Waveforms. 3. VH = 12.0V ± 0.5V. 4. Manufacturer Code: 1FH Device Code: 22H (AT49F008A), A0H (AT49F8192A), 21H (AT49F008AT), A3H (AT49F8192AT). 5. See details under Software Product Identification Entry/Exit. DC Characteristics Symbol Parameter Condition ILI Input Load Current ILO Max Units VIN = 0V to VCC 10 µA Output Leakage Current VI/O = 0V to VCC 10 µA ISB1 VCC Standby Current CMOS CE = VCC - 0.3V to VCC 300 µA ISB2 VCC Standby Current TTL CE = 2.0V to VCC 3 mA ICC(1) VCC Active Current f = 5 MHz; IOUT = 0 mA 50 mA VIL Input Low Voltage 0.8 V VIH Input High Voltage VOL Output Low Voltage IOL = 2.1 mA VOH Output High Voltage IOH = -400 µA Note: 1. In the erase mode, ICC is 90 mA. 8 AT49F008A(T)/8192A(T) Min 2.0 V 0.45 2.4 V V AT49F008A(T)/8192A(T) AC Read Characteristics AT49F008A(T)/8192A(T)-70 Min AT49F008A(T)/8192A(T)-90 Symbol Parameter Max Min tACC Address to Output Delay 70 tCE(1) CE to Output Delay 70 tOE(2) OE to Output Delay 0 30 0 40 tDF(3)(4) CE or OE to Output Float 0 25 0 25 tOH Output Hold from OE, CE or Address, whichever occurred first 0 tRO RESET to Output Delay AT49F008A(T)/8192A(T)-120 Max Min Max Units 90 120 ns 90 120 ns 0 50 ns 0 30 ns 0 0 800 ns 800 800 ns AC Read Waveforms(1)(2)(3)(4) ADDRESS ADDRESS VALID CE t CE t OE OE t DF t t OH ACC t RO RESET OUTPUT Notes: HIGH Z OUTPUT VALID 1. CE may be delayed up to tACC - tCE after the address transition without impact on tACC. 2. OE may be delayed up to tCE - tOE after the falling edge of CE without impact on tCE or by tACC - tOE after an address change without impact on tACC. 3. tDF is specified from OE or CE whichever occurs first (CL = 5 pF). 4. This parameter is characterized and is not 100% tested. Input Test Waveforms and Measurement Level Output Test Load 3.0V 5.0V 0.0V tR, tF < 5 ns Pin Capacitance f = 1 MHz, T = 25°C(1) Typ Max Units CIN 4 6 pF VIN = 0V COUT 8 12 pF VOUT = 0V Note: Conditions 1. This parameter is characterized and is not 100% tested. 9 AC Word Load Characteristics Symbol Parameter tAS, tOES Address, OE Set-up Time 10 ns tAH Address Hold Time 100 ns tCS Chip Select Set-up Time 0 ns tCH Chip Select Hold Time 0 ns tWP Write Pulse Width (WE or CE) 100 ns tDS Data Set-up Time 100 ns tDH, tOEH Data, OE Hold Time 10 ns tWPH Write Pulse Width High 50 ns AC Byte/Word Load Waveforms WE Controlled CE Controlled 10 AT49F008A(T)/8192A(T) Min Max Units AT49F008A(T)/8192A(T) Program Cycle Characteristics Symbol Parameter Min tBP Byte/Word Programming Time tAS Address Set-up Time tAH Typ Max Units 10 50 µs 0 ns Address Hold Time 100 ns tDS Data Set-up Time 100 ns tDH Data Hold Time 0 ns tWP Write Pulse Width 100 ns tWPH Write Pulse Width High 50 ns tEC Erase Cycle Time 10 seconds Program Cycle Waveforms PROGRAM CYCLE OE CE t WP t BP t WPH WE t AS A0-A18 t DH t AH 5555 5555 2AAA 5555 ADDRESS t DS 55 AA DATA A0 AA INPUT DATA Sector or Chip Erase Cycle Waveforms OE (1) CE t WP t WPH WE t AS A0-A18 t DH t AH 5555 5555 5555 2AAA Note 2 2AAA t EC t DS DATA AA BYTE/ WORD 0 Notes: 55 BYTE/ WORD 1 80 BYTE/ WORD 2 AA BYTE/ WORD 3 55 Note 3 BYTE/ WORD 4 BYTE/ WORD 5 1. OE must be high only when WE and CE are both low. 2. For chip erase, the address should be 5555. For sector erase, the address depends on what sector is to be erased. (See note 4 under command definitions.) 3. For chip erase, the data should be 10H, and for sector erase, the data should be 30H. 11 Data Polling Characteristics(1) Symbol Parameter tDH Data Hold Time tOEH OE Hold Time Min Max OE to Output Delay tWR Write Recovery Time Units 10 ns 10 ns (2) tOE Notes: Typ ns 0 ns 1. These parameters are characterized and not 100% tested. 2. See tOE spec in AC Read Characteristics. Data Polling Waveforms Toggle Bit Characteristics(1) Symbol Parameter tDH Data Hold Time tOEH OE Hold Time Min OE to Output Delay tOEHP OE High Pulse tWR Notes: Write Recovery Time Max Units 10 ns 10 ns (2) tOE Typ ns 150 ns 0 ns 1. These parameters are characterized and not 100% tested. 2. See tOE spec in AC Read Characteristics. Toggle Bit Waveforms(1)(2)(3) Notes: 12 1. Toggling either OE or CE or both OE and CE will operate toggle bit. The tOEHP specification must be met by the toggling input(s). 2. Beginning and ending state of I/O6 will vary. 3. Any address location may be used but the address should not vary. AT49F008A(T)/8192A(T) AT49F008A(T)/8192A(T) Software Product Identification Entry(1) LOAD DATA AA TO ADDRESS 5555(7) Boot Block Lockout Enable Algorithm(1) LOAD DATA AA TO ADDRESS 5555(3) LOAD DATA 55 TO ADDRESS 2AAA(7) LOAD DATA 55 TO ADDRESS 2AAA(3) LOAD DATA 90 TO ADDRESS 5555(7) LOAD DATA 80 TO ADDRESS 5555(3) ENTER PRODUCT IDENTIFICATION MODE(2)(3)(5) LOAD DATA AA TO ADDRESS 5555(3) Software Product Identification Exit(1)(6) LOAD DATA AA TO ADDRESS 5555(7) LOAD DATA 55 TO ADDRESS 2AAA(7) OR LOAD DATA 55 TO ADDRESS 2AAA(3) LOAD DATA F0 TO ANY ADDRESS LOAD DATA 40 TO ADDRESS 5555(3) EXIT PRODUCT IDENTIFICATION MODE(4) PAUSE 1 second(2) LOAD DATA F0 TO ADDRESS 5555(7) EXIT PRODUCT IDENTIFICATION MODE(4) Notes: 1. Data Format: I/O15 - I/O8 (Don’t Care); I/O7 - I/O0 (Hex) Address Format: A15 - A0 (Hex), A-1, and A15 - A18 (Don’t Care). 2. A1 - A18 = VIL. Manufacture Code is read for A0 = VIL; Device Code is read for A0 = VIH. 3. The device does not remain in identification mode if powered down. 4. The device returns to standard operation mode. 5. Manufacturer Code: 1FH Device Code: 22H (AT49F008A), A0H (AT49F8192A), 21H (AT49F008AT), A3H (AT49F8192AT) 6. Either one of the Product ID Exit commands can be used. 7. If the alternate pin definition is used, 5555 should be replaced with A555, 2AAA should be replaced with 5AAA. Notes: 1. Data Format: I/O15 - I/O8 (Don’t Care); I/O7 - I/O0 (Hex) Address Format: A15 - A0 (Hex), A-1, and A15 - A18 (Don’t Care). 2. Boot block lockout feature enabled. 3. If the alternate pin definition is used, 5555 should be replaced with A555, 2AAA should be replaced with 5AAA. 13 AT49F008A(T) Ordering Information tACC (ns) 70 90 120 70 90 120 ICC (mA) Standby Active 50 50 50 50 50 50 0.3 0.3 0.3 0.3 0.3 0.3 Ordering Code Package AT49F008A-70TC AT49F008A-70CC 40T 48C1 Commercial (0° to 70°C) AT49F008A-70TI AT49F008A-70CI 40T 48C1 Industrial (-40° to 85°C) AT49F008A-90TC AT49F008A-90CC 40T 48C1 Commercial (0° to 70°C) AT49F008A-90TI AT49F008A-90CI 40T 48C1 Industrial (-40° to 85°C) AT49F008A-12TC AT49F008A-12CC 40T 48C1 Commercial (0° to 70°C) AT49F008A-12TI AT49F008A-12CI 40T 48C1 Industrial (-40° to 85°C) AT49F008AT-70TC AT49F008AT-70CC 40T 48C1 Commercial (0° to 70°C) AT49F008AT-70TI AT49F008AT-70CI 40T 48C1 Industrial (-40° to 85°C) AT49F008AT-90TC AT49F008AT-90CC 40T 48C1 Commercial (0° to 70°C) AT49F008AT-90TI AT49F008AT-90CI 40T 48C1 Industrial (-40° to 85°C) AT49F008AT-12TC AT49F008AT-12CC 40T 48C1 Commercial (0° to 70°C) AT49F008AT-12TI AT49F008AT-12CI 40T 48C1 Industrial (-40° to 85°C) Package Type 40T 40-Lead, Plastic Thin Small Outline Package (TSOP) 48C1 48-Ball, Chip-Size Ball Grid Array Package (CBGA) 14 AT49F008A(T)/8192A(T) Operation Range AT49F008A(T)/8192A(T) AT49F8192A(T) Ordering Information ICC (mA) tACC (ns) Active Standby 70 50 0.3 90 120 70 90 120 50 50 50 50 50 0.3 0.3 0.3 0.3 0.3 Ordering Code Package AT49F8192A-70TC AT49F8192A-70CC AT49F8192A-70RC 48T 48C1 44R Operation Range Commercial (0° to 70°C) AT49F8192A-70TI AT49F8192A-70CI AT49F8192A-70RI 48T 48C1 44R Industrial (-40° to 85°C) AT49F8192A-90TC AT49F8192A-90CC AT49F8192A-90RC 48T 48C1 44R Commercial (0° to 70°C) AT49F8192A-90TI AT49F8192A-90CI AT49F8192A-90RI 48T 48C1 44R Industrial (-40° to 85°C) AT49F8192A-12TC AT49F8192A-12CC AT49F8192A-12RC 48T 48C1 44R Commercial (0° to 70°C) AT49F8192A-12TI AT49F8192A-12CI AT49F8192A-12RI 48T 48C1 44R Industrial (-40° to 85°C) AT49F8192AT-70TC AT49F8192AT-70CC AT49F8192AT-70RC 48T 48C1 44R Commercial (0° to 70°C) AT49F8192AT-70TI AT49F8192AT-70CI AT49F8192AT-70RI 48T 48C1 44R Industrial (-40° to 85°C) AT49F8192AT-90TC AT49F8192AT-90CC AT49F8192AT-90RC 48T 48C1 44R Commercial (0° to 70°C) AT49F8192AT-90TI AT49F8192AT-90CI AT49F8192AT-90RI 48T 48C1 44R Industrial (-40° to 85°C) AT49F8192AT-12TC AT49F8192AT-12CC AT49F8192AT-12RC 48T 48C1 44R Commercial (0° to 70°C) AT49F8192AT-12TI AT49F8192AT-12CI AT49F8192AT-12RI 48T 48C1 44R Industrial (-40° to 85°C) Package Type 48T 48-Lead, Plastic Thin Small Outline Package (TSOP) 48C1 48-Ball, Chip-Size Ball Grid Array Package (CBGA) 44R 44-lead, 0.525" Wide, Plastic Gull Wing Small Outline Package (SOIC) 15 Packaging Information 40T, 40-Lead, Plastic Thin Small Outline Package (TSOP) Dimensions in Inches and (Millimeters)* 48T, 48-Lead, Plastic Thin Small Outline Package (TSOP) Dimensions in Millimeters and (Inches)* JEDEC OUTLINE MO-142 D *Controlling dimension: millimeters *Controlling dimension: millimeters 48C1, 48-Ball, Chip-Size Ball Grid Array Package (CBGA) Dimensions in Millimeters 44R, 44-lead, 0.525" Wide, Plastic Gull Wing Small Outline Package (SOIC) Dimensions in Inches and (Millimeters) 7.2 (0.283) 6.8 (0.268) 7.2 (0.283) 6.8 (0.268) 0.25 (0.010) 1.25 (0.049) MAX 1.0 (0.040) 0.74 (0.029) 5.25 (0.207) 8 7 6 5 4 3 2 1 1.75 (0.69) 1.48 (0.58) A B C 3.75 (0.148) D E F 0.75 (0.030) BSC NON-ACCUMULATIVE 16 0.30 (0.012) DIA BALL TYP AT49F008A(T)/8192A(T) Atmel Headquarters Atmel Operations Corporate Headquarters Atmel Colorado Springs 2325 Orchard Parkway San Jose, CA 95131 TEL (408) 441-0311 FAX (408) 487-2600 Europe 1150 E. Cheyenne Mtn. Blvd. Colorado Springs, CO 80906 TEL (719) 576-3300 FAX (719) 540-1759 Atmel Rousset Atmel U.K., Ltd. Coliseum Business Centre Riverside Way Camberley, Surrey GU15 3YL England TEL (44) 1276-686-677 FAX (44) 1276-686-697 Zone Industrielle 13106 Rousset Cedex France TEL (33) 4-4253-6000 FAX (33) 4-4253-6001 Asia Atmel Asia, Ltd. Room 1219 Chinachem Golden Plaza 77 Mody Road Tsimhatsui East Kowloon Hong Kong TEL (852) 2721-9778 FAX (852) 2722-1369 Japan Atmel Japan K.K. 9F, Tonetsu Shinkawa Bldg. 1-24-8 Shinkawa Chuo-ku, Tokyo 104-0033 Japan TEL (81) 3-3523-3551 FAX (81) 3-3523-7581 Fax-on-Demand North America: 1-(800) 292-8635 International: 1-(408) 441-0732 e-mail [email protected] Web Site http://www.atmel.com BBS 1-(408) 436-4309 © Atmel Corporation 1999. Atmel Corporation makes no warranty for the use of its products, other than those expressly contained in the Company’s standard warranty which is detailed in Atmel’s Terms and Conditions located on the Company’s web site. The Company assumes no responsibility for any errors which may appear in this document, reserves the right to change devices or specifications detailed herein at any time without notice, and does not make any commitment to update the information contained herein. No licenses to patents or other intellectual property of Atmel are granted by the Company in connection with the sale of Atmel products, expressly or by implication. Atmel’s products are not authorized for use as critical components in life support devices or systems. Marks bearing ® and/or ™ are registered trademarks and trademarks of Atmel Corporation. Terms and product names in this document may be trademarks of others. Printed on recycled paper. 1199D–08/99/xM