IRF IRFHM831PBF Compatible with existing surface mount technique Datasheet

IRFHM831PbF
HEXFET® Power MOSFET
VDS
30
V
RDS(on) max
7.8
m
Qg (typical)
RG (typical)
7.3
0.5
nC
ID
40h
A
(@VGS = 10V)
(@Tc(Bottom) = 25°C)
:
:
PQFN 3.3mm x 3.3mm
Applications
• Control MOSFET for Buck Converters
Features and Benefits
Benefits
Features
Low Charge (typical 7.3nC)
Low Thermal Resistance to PCB (<4.7°C/W)
100% Rg tested
Low Profile (<1.0mm)
Lower Switching Losses
Enable Better Thermal Dissipation
Increased Reliability
results in Increased Power Density
⇒
Industry-Standard Pinout
Compatible with Existing Surface Mount Techniques
RoHS Compliant Containing no Lead, no Bromide and no Halogen
MSL1, Industrial Qualification
Orderable part number
Package Type
IRFHM831TRPbF
IRFHM831TR2PbF
Multi-Vendor Compatibility
Easier Manufacturing
Environmentally Friendlier
Increased Reliability
Standard Pack
Form
Quantity
PQFN 3.3mm x 3.3mm
Tape and Reel
4000
PQFN 3.3mm x 3.3mm
Tape and Reel
400
Note
EOL notice # 259
Absolute Maximum Ratings
VDS
VGS
ID @ TA = 25°C
ID @ TA = 70°C
ID @ TC(Bottom) = 25°C
ID @ TC(Bottom) = 100°C
IDM
PD @TA = 25°C
PD @ TC(Bottom) = 25°C
Parameter
Drain-to-Source Voltage
Gate-to-Source Voltage
Continuous Drain Current, VGS @ 10V
Continuous Drain Current, VGS @ 10V
Continuous Drain Current, VGS @ 10V
Continuous Drain Current, VGS @ 10V
Pulsed Drain Current
Power Dissipation
Power Dissipation
TJ
TSTG
Linear Derating Factor
Operating Junction and
Storage Temperature Range
g
g
c
g
Max.
30
±20
14
11
40
h
28
96
2.5
27
0.02
-55 to + 150
Units
V
A
W
W/°C
°C
Notes  through † are on page 9
1
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IRFHM831PbF
Static @ TJ = 25°C (unless otherwise specified)
BVDSS
ΔΒVDSS/ΔTJ
RDS(on)
VGS(th)
Parameter
Drain-to-Source Breakdown Voltage
Breakdown Voltage Temp. Coefficient
Static Drain-to-Source On-Resistance
Output Charge
Min.
30
–––
–––
–––
1.35
–––
–––
–––
–––
–––
82
–––
–––
–––
–––
–––
–––
–––
–––
Typ.
–––
0.02
6.6
10.7
1.8
-6.8
–––
–––
–––
–––
–––
16
7.3
1.7
0.9
2.5
2.2
3.4
5.1
Max. Units
Conditions
–––
V VGS = 0V, ID = 250μA
––– V/°C Reference to 25°C, ID = 1mA
VGS = 10V, ID = 12A
7.8
mΩ
VGS = 4.5V, ID = 12A
12.6
2.35
V
VDS = VGS, ID = 25μA
––– mV/°C
1.0
VDS = 24V, VGS = 0V
μA
150
VDS = 24V, VGS = 0V, TJ = 125°C
VGS = 20V
100
nA
-100
VGS = -20V
–––
S VDS = 15V, ID = 12A
–––
nC VGS = 10V, VDS = 15V, ID = 12A
11
–––
VDS = 15V
–––
VGS = 4.5V
nC
–––
ID = 12A
–––
See Fig.17 & 18
–––
–––
nC VDS = 16V, VGS = 0V
Gate Resistance
Turn-On Delay Time
Rise Time
Turn-Off Delay Time
Fall Time
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
–––
–––
–––
–––
–––
–––
–––
–––
0.5
6.9
12
6.2
4.7
1050
190
80
–––
–––
–––
–––
–––
–––
–––
–––
Gate Threshold Voltage
Gate Threshold Voltage Coefficient
Drain-to-Source Leakage Current
ΔVGS(th)
IDSS
IGSS
Gate-to-Source Forward Leakage
Gate-to-Source Reverse Leakage
Forward Transconductance
Total Gate Charge
Total Gate Charge
Pre-Vth Gate-to-Source Charge
Post-Vth Gate-to-Source Charge
Gate-to-Drain Charge
Gate Charge Overdrive
Switch Charge (Qgs2 + Qgd)
gfs
Qg
Qg
Qgs1
Qgs2
Qgd
Qgodr
Qsw
Qoss
RG
td(on)
tr
td(off)
tf
Ciss
Coss
Crss
e
e
Ω
ns
pF
VDD = 15V, VGS = 4.5V
ID = 12A
RG=1.8Ω
See Fig.15
VGS = 0V
VDS = 25V
ƒ = 1.0MHz
Avalanche Characteristics
Parameter
Single Pulse Avalanche Energy
Avalanche Current
EAS
IAR
Diode Characteristics
c
IS
Parameter
Continuous Source Current
ISM
(Body Diode)
Pulsed Source Current
VSD
trr
Qrr
ton
(Body Diode)
Diode Forward Voltage
Reverse Recovery Time
Reverse Recovery Charge
Forward Turn-On Time
Typ.
–––
–––
d
Min.
Typ.
Max. Units
–––
–––
40
–––
c
–––
h
96
Units
mJ
A
Max.
50
12
A
Conditions
MOSFET symbol
showing the
integral reverse
D
G
S
p-n junction diode.
TJ = 25°C, IS = 12A, VGS = 0V
TJ = 25°C, IF = 12A, VDD = 15V
di/dt = 300A/μs
–––
–––
1.0
V
–––
15
22
ns
–––
16
24
nC
Time is dominated by parasitic Inductance
e
e
Thermal Resistance
RθJC (Bottom)
RθJC (Top)
Parameter
g
Junction-to-Ambient g
Junction-to-Ambient
RθJA
RθJA (<10s)
2
f
Junction-to-Case f
Junction-to-Case
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Typ.
–––
Max.
4.7
Units
–––
44
°C/W
–––
50
–––
32
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IRFHM831PbF
1000
≤ 60μs PULSE WIDTH
Tj = 25°C
TOP
100
BOTTOM
VGS
10V
8.0V
4.5V
3.8V
3.5V
3.3V
3.0V
2.8V
≤ 60μs PULSE WIDTH
Tj = 150°C
ID, Drain-to-Source Current (A)
ID, Drain-to-Source Current (A)
1000
10
TOP
100
BOTTOM
VGS
10V
8.0V
4.5V
3.8V
3.5V
3.3V
3.0V
2.8V
10
2.8V
2.8V
1
1
0.1
1
10
100
0.1
VDS, Drain-to-Source Voltage (V)
2.0
RDS(on) , Drain-to-Source On Resistance
(Normalized)
TJ = 150°C
10
TJ = 25°C
1
VDS = 15V
≤ 60μs PULSE WIDTH
0.1
2.0
3.0
4.0
5.0
ID = 12A
VGS = 10V
1.5
1.0
0.5
-60 -40 -20
VGS, Gate-to-Source Voltage (V)
10000
40
60
80 100 120 140 160
14
VGS, Gate-to-Source Voltage (V)
Coss = C ds + C gd
Ciss
Coss
Crss
100
20
Fig 4. Normalized On-Resistance Vs. Temperature
VGS = 0V,
f = 1 MHZ
Ciss = C gs + C gd, C ds SHORTED
Crss = C gd
1000
0
T J , Junction Temperature (°C)
Fig 3. Typical Transfer Characteristics
C, Capacitance (pF)
100
Fig 2. Typical Output Characteristics
100
ID= 12A
12
VDS= 24V
VDS= 15V
VDS= 6.0V
10
8
6
4
2
0
10
1
10
100
0
Fig 5. Typical Capacitance Vs.Drain-to-Source Voltage
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5
10
15
20
QG Total Gate Charge (nC)
VDS, Drain-to-Source Voltage (V)
3
10
VDS, Drain-to-Source Voltage (V)
Fig 1. Typical Output Characteristics
ID, Drain-to-Source Current (A)
1
Fig 6. Typical Gate Charge Vs.Gate-to-Source Voltage
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IRFHM831PbF
1000
ID, Drain-to-Source Current (A)
ISD , Reverse Drain Current (A)
100.0
10.0
TJ = 150°C
TJ = 25°C
1.0
OPERATION IN THIS AREA
LIMITED BY RDS(on)
100
100μsec
10msec
10
1msec
1
Tc = 25°C
Tj = 150°C
Single Pulse
VGS = 0V
0.1
0.1
0.2
0.4
0.6
0.8
0.1
1.0
1
10
100
VDS, Drain-to-Source Voltage (V)
VSD, Source-to-Drain Voltage (V)
Fig 8. Maximum Safe Operating Area
Fig 7. Typical Source-Drain Diode Forward Voltage
50
3.0
VGS(th) Gate threshold Voltage (V)
LIMITED BY PACKAGE
30
20
10
0
25
50
75
100
125
2.5
2.0
ID = 1.0A
ID = 1.0mA
ID = 250μA
ID = 25μA
1.5
1.0
0.5
150
-75
TC, Case Temperature (°C)
-50
-25
0
25
50
75
100
125
150
TJ , Temperature ( °C )
Fig 9. Maximum Drain Current Vs.
Case (Bottom) Temperature
Fig 10. Threshold Voltage Vs. Temperature
10
D = 0.50
Thermal Response ( ZthJC )
ID, Drain Current (A)
40
1
0.20
0.10
0.05
0.1
0.02
0.01
0.01
SINGLE PULSE
( THERMAL RESPONSE )
Notes:
1. Duty Factor D = t1/t2
2. Peak Tj = P dm x Zthjc + Tc
0.001
1E-006
1E-005
0.0001
0.001
0.01
0.1
t1 , Rectangular Pulse Duration (sec)
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case (Bottom)
4
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40
EAS, Single Pulse Avalanche Energy (mJ)
( Ω)
RDS (on), Drain-to -Source On Resistance m
IRFHM831PbF
ID = 12A
35
30
25
20
15
TJ = 125°C
10
5
TJ = 25°C
200
I D
3.1A
6.4A
BOTTOM 12A
TOP
160
120
80
40
0
0
2
4
6
8
10
12
14
16
18
20
25
VGS, Gate-to-Source Voltage (V)
50
75
100
125
Starting TJ, Junction Temperature (°C)
Fig 13. Maximum Avalanche Energy vs. Drain Current
Fig 12. On-Resistance vs. Gate Voltage
V(BR)DSS
tp
15V
DRIVER
L
VDS
D.U.T
RG
+
V
- DD
IAS
20V
A
Fig 14a. Unclamped Inductive Test Circuit
VDS
VGS
RG
RD
Fig 14b. Unclamped Inductive Waveforms
VDS
90%
D.U.T.
+
-VDD
V10V
GS
Pulse Width ≤ 1 µs
Duty Factor ≤ 0.1
Fig 15a. Switching Time Test Circuit
5
I AS
0.01Ω
tp
150
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10%
VGS
td(on)
tr
td(off)
tf
Fig 15b. Switching Time Waveforms
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IRFHM831PbF
D.U.T
Driver Gate Drive
ƒ
+
‚
-
-
„
*
D.U.T. ISD Waveform
Reverse
Recovery
Current
+

RG
•
•
•
•
dv/dt controlled by RG
Driver same type as D.U.T.
ISD controlled by Duty Factor "D"
D.U.T. - Device Under Test
P.W.
Period
VGS=10V
Circuit Layout Considerations
• Low Stray Inductance
• Ground Plane
• Low Leakage Inductance
Current Transformer
-
D=
Period
P.W.
+
V DD
+
Body Diode Forward
Current
di/dt
D.U.T. VDS Waveform
Diode Recovery
dv/dt
Re-Applied
Voltage
-
Body Diode
VDD
Forward Drop
Inductor Curent
ISD
Ripple ≤ 5%
* VGS = 5V for Logic Level Devices
Fig 16. Peak Diode Recovery dv/dt Test Circuit for N-Channel
HEXFET® Power MOSFETs
Id
Vds
Vgs
L
DUT
0
1K
S
VCC
Vgs(th)
Qgs1 Qgs2
Fig 17. Gate Charge Test Circuit
6
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Qgd
Qgodr
Fig 18. Gate Charge Waveform
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IRFHM831PbF
PQFN 3.3x3.3 Outline Package Details
For footprint and stencil design recommendations, please refer to application note AN-1154 at
http://www.irf.com/technical-info/appnotes/an-1154.pdf
PQFN 3.3x3.3 Part Marking
3.3x3.3 PQFN PART MARKING DETAIL
INTERNATIONAL
RECTIFIER LOGO
DATE CODE
ASSEMBLY
SITE CODE
(Per SCOP 200-002)
::::
!;99!
:::::
PIN 1
IDENTIFIER
PART NUMBER
MARKING CODE
(Per Marking Spec)
LOT CODE
(Eng Mode - Min last 4 digits of EATI#)
(Prod Mode - 4 digits of SPN code)
Note: For the most current drawing please refer to IR website at: http://www.irf.com/package/
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IRFHM831PbF
PQFN 3.3x3.3 Tape and Reel
REEL DIMENSIONS
TAPE DIMENSIONS
CODE
Ao
Bo
Ko
P1
W
W1
QUADRANT ASSIGNMENTS FOR PIN 1 ORIENTATION IN TAPE
DIMENSION (MM)
MIN
MAX
3.50
3.70
3.50
3.70
1.10
7.90
1.30
8.10
.043
.311
.051
.319
11.80
12.20
.465
.480
12.30
12.50
.484
.492
Qty
Reel Diameter
CODE
Ao
Bo
Ko
W
P1
DIMENSION (INCH)
MIN
MAX
.138
.146
.138
.146
4000
13 Inches
DESCRIPTION
Dimension des ign to accommodate the component width
Dimension design to accommodate the component lenght
Dimension design to accommodate the component thickness
Overall width of the carrier tape
Pitch between successive cavity centers
Note: For the most current drawing please refer to IR website at: http://www.irf.com/package/
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IRFHM831PbF
Qualification Information
†
††
Qualification level
Moisture Sensitivity Level
RoHS Compliant
†
††
†††
Industrial
†††
(per JEDEC JESD47F guidelines)
MSL1
PQFN 3.3mm x 3.3mm
†††
(per JEDEC J-STD-020D )
Yes
Qualification standards can be found at International Rectifier’s web site
http://www.irf.com/product-info/reliability
Higher qualification ratings may be available should the user have such requirements.
Please contact your International Rectifier sales representative for further information:
http://www.irf.com/whoto-call/salesrep/
Applicable version of JEDEC standard at the time of product release.
Notes:
 Repetitive rating; pulse width limited by max. junction temperature.
‚ Starting TJ = 25°C, L = 0.69mH, RG = 50Ω, IAS = 12A.
ƒ Pulse width ≤ 400μs; duty cycle ≤ 2%.
„ Rθ is measured at TJ of approximately 90°C.
When mounted on 1 inch square 2 oz copper pad on 1.5x1.5 in. board of FR-4 material.
† Calculated continouous current based on maximum allowable junction temperature. Package is limited to 40A by
production test capability.
Revision History
Date
5/14/2014
6/5/2014
Comment
• Updated ordering information to reflect the End-Of-life (EOL) of the mini-reel option (EOL notice #259)
• Updated Package outline on page 7.
• Updated Tape and Reel on page 8.
• Updated data sheet based on corporate template.
• Updated schematic on page1
IR WORLD HEADQUARTERS: 101 N. Sepulveda Blvd., El Segundo, California 90245, USA
To contact International Rectifier, please visit http://www.irf.com/whoto-call/
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