PCN# : P315A Issue Date : Feb. 04, 2013 DESIGN/PROCESS CHANGE NOTIFICATION This is to inform you that a change is being made to the products listed below. Unless otherwise indicated in the details of this notification, the identified change will have no impact on product quality, reliability, electrical, visual or mechanical performance and affected products will remain fully compliant to all published specifications. Products incorporating this change may be shipped interchangeably with existing unchanged products. This change is planned to take effect in 90 calendar days from the date of this notification. Please work with your local Fairchild Sales Representative to manage your inventory of unchanged product if your evaluation of this change will require more than 90 calendar days. Please contact your local Customer Quality Engineer within 30 days of receipt of this notification if you require any additional data or samples. Alternatively, you may send an email request for data, samples or other information to [email protected]. Implementation of change: Expected First Shipment Date for Changed Product : May. 05, 2013 Expected First Date Code of Changed Product :1327 Description of Change (From) : 5/6-in wafer fabrication line at Fairchild Semiconductor Bucheon Korea. Description of Change (To) : 8-in wafer fabrication line at Fairchild Semiconductor Bucheon Korea. Reason for Change: Fairchild Semiconductor is increasing wafer fabrication capacity by qualifying an 8-in wafer fabrication line at Fairchild Semiconductor Bucheon Korea. Quality and reliability remain at the highest standards already demonstrated within Fairchild's existing products. The reliability qualification results used to qualify the 8-in wafer fabrication line are summarized below. The specific groups of products/MOSFET technologies are listed in the affected FSIDs list. Design, die size and layout of the affected products will remain unchanged. There are no changes in the datasheet or electrical performance. 1 of 14 Affected Product(s): FCA20N60 FCA20N60S_F109 FCA47N60 FCA47N60_F109 FCB20N60TM FCD5N60TM FCD7N60TM_WS FCH47N60_F133 FCP11N60F FCP16N60_G FCP20N60 FCP260N60E FCP4N60 FCPF11N60F FCPF11N65 FCPF190N60 FCPF20N60FS FCPF20N60ST_G FCPF380N60 FCPF7N60 FDA24N40F FDA28N50 FDA38N30 FDA59N30 FDB12N50TM FDB33N25TM FDD3N50NZTM FDD6N20TM FDD8N50NZTM FDL100N50F FDP18N20F FDP24N40 FDP39N20 FDP5N50NZ FDPF12N50NZ FDPF33N25T FDPF39N20TLDTU FDPF51N25 FDPF5N50NZ FDPF5N50NZU FCA20N60F FCA20N60_F109 FCA47N60F FCB11N60TM FCBB20CH60SF FCD5N60TM_WS FCH35N60 FCI7N60 FCP11N60_G FCP190N60 FCP20N60FS FCP380N60 FCP7N60 FCPF11N60T FCPF11N65_G FCPF190N60E FCPF20N60S FCPF20N60T FCPF380N60E FCPF7N60YDTU FDA24N50 FDA28N50F FDA50N50 FDA69N25 FDB20N50F FDB44N25TM FDD5N50NZFTM FDD6N25TM FDH45N50F_F133 FDP12N50NZ FDP19N40 FDP26N40 FDP51N25 FDP61N20 FDPF13N50NZ FDPF33N25TRDTU FDPF3N50NZ FDPF51N25RDTU FDPF5N50NZF FDPF8N50NZ 2 of 14 FCA20N60FS FCA35N60 FCA47N60F_SN00171 FCB20N60FTM FCD4N60TM FCD7N60TM FCH47N60F_F133 FCP11N60 FCP16N60 FCP190N60E FCP20N60_G FCP380N60E FCPF11N60 FCPF11N60_G FCPF16N60 FCPF20N60 FCPF20N60ST FCPF260N60E FCPF400N60 FCU5N60TU FDA24N50F FDA33N25 FDA59N25 FDA70N20 FDB28N30TM FDB52N20TM FDD5N50NZTM FDD6N50FTM FDH50N50_F133 FDP15N40 FDP22N50N FDP33N25 FDP52N20 FDP8N50NZ FDPF18N20FT FDPF39N20 FDPF44N25T FDPF51N25YDTU FDPF5N50NZFT FDPF8N50NZF Affected Product(s): FDPF8N50NZU FGD4536TM FGH40N60SFDTU FGH40N60SMDF FGH40N60UFTU FGH80N60FD2TU FGPF4533RDTU FGPF4536YDTU FGPF4636YDTU PCFC47N60FW FDPF9N50NZ FGH20N60SFDTU FGH40N60SFTU FGH40N60UFDTU FGH40N60UFTU_SN00007 FGH80N60FDTU FGPF4536 FGPF4633RDTU PCFC11N60W PCFC47N60FW_SN00201 3 of 14 FGA40N65SMD FGH20N60UFDTU FGH40N60SMD FGH40N60UFDTU_SN00006 FGH40N65UFDTU FGPF4533 FGPF4536JDTU FGPF4633TU PCFC20N60W PCFG40N65SMW Qualification Plan Q20120257 Reliability Test HTGB HTRB HTSL HAST PRCL Device FDA59N25 Package TT3P0003 Device Name Lot No. Process UniFET1 150~250V FDA59N25 FDA59N25 No. of Lots 3 FDA59N25 Condition Standard Duration Result/FA Result/FA Result/FA 100 % Rated VGS, Tj max=150C 80% of Rated BV, Tj max=150C JESD22A108 1000hrs 0/77 0/77 0/77 JESD22A108 1000hrs 0/77 0/77 0/77 1000hrs 0/77 0/77 0/77 96hrs 0/77 0/77 0/77 6000 cycles 0/77 0/77 0/77 10sec 0/30 0/30 0/30 500 cycles 0/77 0/77 0/77 150 C 130 C, 85% RH, Vds=42V Delta 100C, 5 min on, 3.5 min off RSDH 260C TMCL -65 C to 150 C, 30 min/ cycles JESD22A103 JESD22A110 MIL-STD750-1036 JESD22B106 JESD22A104 4 of 14 Q20120257AA Q20120257AB Q20120257AC Qualification Plan Q20120259 Reliability Test HTGB HTRB HTSL HAST PRCL Device FDH50N50_F133 Condition 100 % Rated VGS, Tj max=150 C 80% of Rated BV, Tj max=150 C 150 C 130 C, 85% RH, Vds=42V Delta 100C, 5 min on, 3.5 min off Package TO247003 Device Name Lot No. Process UniFET1 300~500V (Over 24A) No. of Lots 3 FDH50N50_F133 FDH50N50_F133 FDH50N50_F133 Q20120259AA Q20120259AB Q20120259AC Duration Result/FA Result/FA Result/FA JESD22A108 1000hrs 0/77 0/77 0/77 JESD22A108 1000hrs 0/77 0/77 0/77 JESD22A103 1000hrs 0/77 0/77 0/77 JESD22A110 96hrs 0/77 0/77 0/77 MIL-STD750-1036 6000 cycles 0/77 0/77 0/77 Standard RSDH 260C JESD22B106 10sec 0/30 0/30 0/30 TMCL -65 C to 150 C, 30 min/ cycles JESD22A104 500 cycles 0/77 0/77 0/77 5 of 14 Qualification Plan Q20120260 Reliability Test HTGB HTRB Device FDP22N50N Condition Standard 100 % Rated VGS, Tj max=150C 80% of Rated BV, Tj max=150C HTSL 150 C HAST 130 C, 85% RH, Vds=42V PRCL Delta 100C, 3.5 min on, 3.5 min off RSDH 260C TMCL -65 C to 150 C, 30 min/ cycles Qualification Plan Q20120263 Reliability Test HTGB HTRB JESD22A108 JESD22A108 JESD22A103 JESD22A110 MILSTD7501036 JESD22B106 JESD22A104 Device FCP20N60 Condition 100 % Rated VGS, Tj max=150C 80% of Rated BV, Tj max=150C HTSL 150 C HAST 130 C, 85% RH, Vds=42V PRCL Delta 100C, 3.5 min on, 3.5 min off RSDH 260C TMCL -65 C to 150 C, 30 min/ cycles Standard JESD22A108 JESD22A108 JESD22A103 JESD22A110 MILSTD7501036 JESD22B106 JESD22A104 Package TO220003 Process UniFET2 500V No. of Lots 3 FDP22N50N FDP22N50N FDP22N50N Q20120260AA Q20120260AB Q20120260AC Duration Result/FA Result/FA Result/FA 1000hrs 0/77 0/77 0/77 1000hrs 0/77 0/77 0/77 1000hrs 0/77 0/77 0/77 96hrs 0/77 0/77 0/77 8572 cycles 0/77 0/77 0/77 10 sec 0/30 0/30 0/30 500 cycles 0/77 0/77 0/77 Device Name Lot No. Package TO220003 Device Name Lot No. Process Super-FET 600V TO220 No. of Lots 3 FCP20N60 FCP20N60 FCP20N60 Q20120263AA Q20120263AB Q20120263AC Duration Result/FA Result/FA Result/FA 1000hrs 0/77 0/77 0/77 1000hrs 0/77 0/77 0/77 1000hrs 0/77 0/77 0/77 96hrs 0/77 0/77 0/77 8572 cycles 0/77 0/77 0/77 10 sec 0/30 0/30 0/30 500 cycles 0/77 0/77 0/77 6 of 14 Qualification Plan Q20120265 Reliability Test PRECON HTGB HTRB HTSL HAST PRCL RSDH TMCL Device FCB20N60TM Condition L1 245C 100 % Rated VGS, Tj max=150C 80% of Rated BV, Tj max=150C 150 C 130 C, 85% RH, Vds=42V Delta 100C, 3.5 min on, 3.5 min off 260C -65 C to 150 C, 30 min/ cycles Package TT263002 FCB20N60TM Lot No. Q20120265AA Duration Result/FA JESD22-A113 5 Cycles 24 hrs 0/154 JESD22-A108 1000hrs 0/77 JESD22-A108 1000hrs 0/77 JESD22-A103 1000hrs 0/77 JESD22-A110 96hrs 0/77 Standard MIL-STD-7501036 JESD22-B106 8572 cycles 0/77 10 sec 0/30 JESD22-A104 500 cycles 0/77 Device Package Q20120266 FDB52N20TM TT263002 PRECON HTGB HTRB HTSL HAST PRCL RSDH TMCL Condition L1 245C 100 % Rated VGS, Tj max=150C 80% of Rated BV, Tj max=150C 150 C 130 C, 85% RH, Vds=42V Delta 100C, 3.5 min on, 3.5 min off 260C -65 C to 150 C, 30 min/ cycles No. of Lots 1 Device Name Qualification Plan Reliability Test Process Super-FET 600V D2pak Process UNIFET 200V(include 250V /Dpak and D2 pak) No. of Lots 1 Device Name FDB52N20TM Lot No. Q20120266AA Duration Result/FA JESD22-A113 5 Cycles 24 hrs 0/154 JESD22-A108 1000hrs 0/77 JESD22-A108 1000hrs 0/77 JESD22-A103 1000hrs 0/77 JESD22-A110 96hrs 0/77 Standard MIL-STD-7501036 JESD22-B106 8572 cycles 0/77 15 sec 0/30 JESD22-A104 500 cycles 0/77 7 of 14 Qualification Plan Q20120267 Reliability Test Device FDB12N50TM Condition PRECON HTRB HTSL 130 C, 85% RH, Vds=42V Delta 100C, 2 min on, 3.5 min off 260C -65 C to 150 C, 30 min/ cycles HAST PRCL RSDH TMCL Qualification Plan Q20120268 Device FCA47N60 Process UNIFET1 300-500V_D2pak No. of Lots 1 Device Name FDB12N50TM Lot No. Q20120267AA Duration Result/FA JESD22-A113 5 Cycles 24 hrs 0/154 JESD22-A108 1000hrs 0/77 JESD22-A108 1000hrs 0/77 JESD22-A103 1000hrs 0/77 JESD22-A110 96hrs 0/77 Standard L1 245C 100 % Rated VGS, Tj max=150C 80% of Rated BV, Tj max=150C 150 C HTGB Reliability Test Package TT263002 MIL-STD-7501036 JESD22-B106 8572 cycles 0/77 10 sec 0/30 JESD22-A104 500 cycles 0/77 Package TT3P0003 Process SuperFET 600V TO3P/TO247 Condition Standard No. of Lots 1 Device Name FCA47N60 Lot No. Q20120268AA Duration Result/FA HTGB 100 % Rated VGS, Tj max=150C JESD22-A108 1000hrs 0/77 HTRB 80% of Rated BV, Tj max=150C JESD22-A108 1000hrs 0/77 HTSL 150 C JESD22-A103 1000hrs 0/77 HAST 130 C, 85% RH, Vds=42V JESD22-A110 96hrs 0/77 PRCL Delta 100C, 5 min on, 3.5 min off MIL-STD-750-1036 6000 cycles 0/77 RSDH 260C JESD22-B106 10 sec 0/30 TMCL -65 C to 150 C, 30 min/ cycles JESD22-A104 500 cycles 0/77 8 of 14 Qualification Plan Q20120269 Reliability Test PRECON Device FGD4536TM Package TT252003 Condition Process PDP 4GEN Trench IGBT_360V Dpak Standard L1 260C JESD22-A113 No. of Lots 1 Device Name FGD4536TM Lot No. Q20120269AA Duration 5 Cycles 24 hrs Result/FA 0/154 JESD22-A108 1000hrs 0/77 HTRB 100 % Rated VGS, Tj max=150C 80% of Rated BV, Tj max=150C JESD22-A108 1000hrs 0/77 HTSL 150 C JESD22-A103 1000hrs 0/77 HAST JESD22-A110 MIL-STD-7501036 JESD22-B106 96hrs 0/77 10000 cycles 0/77 RSDH 130 C, 85% RH, Vds=42V Delta 100C, 2 min on, 3.5 min off 260C 10 sec 0/30 TMCL -65 C to 150 C, 30 min/ cycles JESD22-A104 500 cycles 0/77 HTGB PRCL Qualification Plan Q20120270 Reliability Test PRECON Device FCD7N60TM Package TT252002 Condition L1 260C Process SuperFET_600V Dpak Standard JESD22-A113 No. of Lots 1 Device Name FCD7N60TM Lot No. Q20120270AA Duration 5 Cycles 24 hrs Result/FA 0/154 JESD22-A108 1000hrs 0/77 HTRB 100 % Rated VGS, Tj max=150C 80% of Rated BV, Tj max=150C JESD22-A108 1000hrs 0/77 HTSL 150 C JESD22-A103 1000hrs 0/77 HAST JESD22-A110 MIL-STD-7501036 JESD22-B106 96hrs 0/77 10000 cycles 0/77 RSDH 130 C, 85% RH, Vds=42V Delta 100C, 2 min on, 3.5 min off 260C 10 sec 0/30 TMCL -65 C to 150 C, 30 min/ cycles JESD22-A104 500 cycles 0/77 HTGB PRCL 9 of 14 Qualification Plan Q20120271 Device FDD7N60NZTM Package TT252003 Process UniFET2 600V Dpak No. of Lots 1 Device Name FDD7N60NZTM Lot No. Q20120271AA Duration 5 Cycles 24 hrs Result/FA JESD22-A108 1000hrs 0/77 JESD22-A108 1000hrs 0/77 JESD22-A103 1000hrs 0/77 JESD22-A110 MIL-STD-7501036 JESD22-B106 96hrs 0/77 10000 cycles 0/77 RSDH 130 C, 85% RH, Vds=42V Delta 100C, 2 min on, 3.5 min off 260C 10sec 0/30 TMCL -65 C to 150 C, 30 min/ cycles JESD22-A104 500 cycles 0/77 Reliability Test PRECON HTGB HTRB HTSL HAST PRCL Condition Standard L1 260’C JESD22-A113 100 % Rated VGS, Tj max=150C 80% of Rated BV, Tj max=150C 150 C 0/154 Qualification Plan Device Package Process No. of Lots Q20120272 FCP190N60 TT220003 Super-FET2 600V 3 Reliability Test HTGB HTRB HTSL HAST PRCL RSDH TMCL Condition 100 % Rated VGS, Tj max=150C 80% of Rated BV, Tj max=150C 150 C Device Name Lot No. FCP190N60 FCP190N60 FCP190N60 Q20120272AA Q20120272AB Q20120272AC Duration Result/FA Result/FA Result/FA JESD22A108 1000hrs 0/77 0/77 0/77 JESD22A108 1000hrs 0/77 0/77 0/77 1000hrs 0/77 0/77 0/77 96hrs 0/77 0/77 0/77 8572 cycles 0/77 0/77 0/77 10 sec 0/30 0/30 0/30 500 cycles 0/77 0/77 0/77 Standard JESD22A103 JESD22A110 130 C, 85% RH, Vds=42V Delta 100C, 2 MIL-STDmin on, 3.5 min 750-1036 off JESD22260C B106 -65 C to 150 C, JESD2230 min/ cycles A104 10 of 14 Qualification Plan Q20120273 Reliability Test Device FCPF190N60 Package TF22S003 Condition Process SuperFET2 600V TO220F Standard No. of Lots 1 Device Name FCPF190N60 Lot No. Q20120273AA Duration Result/FA HTGB 100 % Rated VGS, Tj max=150C JESD22-A108 1000hrs 0/77 HTRB 80% of Rated BV, Tj max=150C JESD22-A108 1000hrs 0/77 HTSL 150 C JESD22-A103 1000hrs 0/77 HAST 130 C, 85% RH, Vds=42V JESD22-A110 96hrs 0/77 PRCL Delta 100C, 2 min on, 3.5 min off MIL-STD-750-1036 8572 cycles 0/77 RSDH 260C JESD22-B106 10 sec 0/30 TMCL -65 C to 150 C, 30 min/ cycles JESD22-A104 500 cycles 0/77 Qualification Plan Q20120277 Reliability Test PRECON Device FDD6N50TM Package TT252002 Condition L1 260’C Process UniFET1 300-500V/Dpak Ipak Standard JESD22-A113 No. of Lots 1 Device Name FDD6N50TM Lot No. Q20120277AA Duration 5 Cycles 24 hrs Result/FA 0/154 JESD22-A108 1000hrs 0/77 HTRB 100 % Rated VGS, Tj max=150C 80% of Rated BV, Tj max=150C JESD22-A108 1000hrs 0/77 HTSL 150 C JESD22-A103 1000hrs 0/77 HAST JESD22-A110 MIL-STD-7501036 JESD22-B106 96hrs 0/77 10000 cycles 0/77 RSDH 130 C, 85% RH, Vds=42V Delta 100C, 2 min on, 3.5 min off 260C 10 sec 0/30 TMCL -65 C to 150 C, 30 min/ cycles JESD22-A104 500 cycles 0/77 HTGB PRCL 11 of 14 Qualification Plan Q20130022A Reliability Test PRECON HTGB HTRB Device FCB20N60FTM FCH47N60F_F133 Condition L1 245’C 100 % Rated VGS, Tj max=150C 80% of Rated BV, Tj max=150C Standard Device Name Lot No. JESD22A113 Duration 5 Cycles 24 hrs Package TT263002 TO247003 Process No. of Lots 2 1 SuperFET FR FET FCB20N60FTM FCB20N60FTM FCH47N60F_F133 Q20130022AA Q20130022AB Q20130022BA Result/FA Result/FA Result/FA 0/154 0/154 - JESD22A108 1000hrs 0/77 0/77 0/77 JESD22A108 1000hrs 0/77 0/77 0/77 HTSL 150 C JESD22A103 1000hrs 0/77 0/77 0/77 HAST 130 C, 85% RH, Vds=42V JESD22A110 96hrs 0/77 0/77 0/77 PRCL Delta 100C, 2 min on, 3.5 min off 0/77 0/77 0/77 RSDH 260C 0/30 0/30 0/30 TMCL -65 C to 150 C, 30 min/ cycles 0/77 0/77 0/77 8572 MIL-STD- cycles 750-1036 5000 cycles JESD2210 sec B106 JESD22A104 500 cycles 12 of 14 Qualification Plan Device Q20130023 FGPF4633TU TF22S003 Reliability Test HTGB HTRB HTSL HAST PRCL RSDH TMCL Condition Package PDP 4GEN Trench IGBT 330V_360V TO220F 3 FGPF4633TU FGPF4633TU FGPF4633TU Q20130023AA Q20130023AB Q20130023AC Duration Result/FA Result/FA Result/FA JESD22A108 1000hrs 0/77 0/77 0/77 JESD22A108 1000hrs 0/77 0/77 0/77 1000hrs 0/77 0/77 0/77 96hrs 0/77 0/77 0/77 8572 cycles 0/77 0/77 0/77 10 sec 0/30 0/30 0/30 500 cycles 0/77 0/77 0/77 JESD22A103 JESD22A110 150 C No. of Lots Device Name Lot No. Standard 100 % Rated VGS, Tj max=150C 80% of Rated BV, Tj max=150C Process 130 C, 85% RH, Vds=42V Delta 100C, 2 MIL-STDmin on, 3.5 min 750-1036 off JESD22260C B106 -65 C to 150 C, JESD2230 min/ cycles A104 Qualification Plan Device Package Process No. of Lots Q20130024 FCP20N60 TO220003 Super-FET 600V TO220 1 Reliability Test Condition Standard Device Name FCP20N60 Lot No. Q20130024AA Duration Result/FA HTGB 100 % Rated VGS, Tj max=150C JESD22-A108 1000hrs 0/77 HTRB 80% of Rated BV, Tj max=150C JESD22-A108 1000hrs 0/77 HTSL 150 C JESD22-A103 1000hrs 0/77 HAST 130 C, 85% RH, Vds=42V JESD22-A110 96hrs 0/77 PRCL Delta 100C, 2 min on, 3.5 min off MIL-STD-750-1036 8572 cycles 0/77 RSDH 260C JESD22-B106 10 sec 0/30 TMCL -65 C to 150 C, 30 min/ cycles JESD22-A104 500 cycles 0/77 13 of 14 Qualification Plan Q20130020 Reliability Test HTGB HTRB HTSL HAST PRCL TMCL Condition 100 % Rated VGS, Tj max=175C 80% of Rated BV, Tj max=175C 150 C 130 C, 85% RH, Vds=42V Delta 100C, 5 min on, 5 min off -65 C to 150 C, 30 min/ cycles Device FGH40N60SMD Package TO247003 Process FS IGBT 600V No. of Lots 3 Device Name Lot No. FGH40N60SMD FGH40N60SMD FGH40N60SMD Q20130020AA Q20130020AB Q20130020AC Duration Result/FA Result/FA Result/FA JESD22A108 1000hrs 0/77 0/77 0/77 JESD22A108 1000hrs 0/77 0/77 0/77 JESD22A103 1000hrs 0/77 0/77 0/77 JESD22A110 96hrs 0/77 0/77 0/77 MIL-STD750-1036 6000 cycles 0/77 0/77 0/77 JESD22A104 500 cycles 0/77 0/77 0/77 Standard 14 of 14