Sample & Buy Product Folder Support & Community Tools & Software Technical Documents bq2961, bq2962 SLUSBU5C – NOVEMBER 2013 – REVISED OCTOBER 2016 bq296xxx Overvoltage Protection for 2-Series, 3-Series, and 4-Series Cell Li-Ion Batteries with Regulated Output Supply 1 Features 3 Description • The bq296xxx family is a high accuracy, low power overvoltage protector with a 1-mA regulated output supply for Li-Ion battery pack applications. 1 • • • • • • • • • 2-Series, 3-Series, and 4-Series Cell Overvoltage Protection (OVP) Fixed Delay Timer to Trigger FET Drive Output (3-s, 4-s, 5.5-s or 6.5-s Options) Factory Programmed OVP Threshold (Threshold Range 3.85 V to 4.6 V) Output Options: Active High High-Accuracy Overvoltage Protection: ±10 mV Regulated Supply Output with self-disable and/or external enable/disable control – Options: 3.3-V, 2.5-V, and 1.8-V (bq2960/61) – Options: 3.3-V, 3.15-V, 3.0-V (bq2962) Low Power Consumption ICC ≈ 4 µA (VCELL(ALL) < VPROTECT) Extra Low Power Consumption with REG output disabled, ICC ~ 1.2 µA Low Leakage Current Per Cell Input < 100 nA Small Package Footprint – 8-Pin WSON (2 mm × 2 mm) The regulated output supply delivers up to 1-mA (max) output current to drive always-on circuits, such as a real-time clock (RTC) oscillator. The bq296xxx family has a self-disable function to turn off the regulated output if any cell voltage falls below a certain threshold, thereby preventing drain on the battery, and provides an external control to enable or disable the regulated output. Device Information(1)(2) PART NUMBER PACKAGE BODY SIZE (NOM) WSON (8) 2.00 mm × 2.00 mm bq2960 bq2961 bq2962 2 Applications • • • • Each cell in a 2-series to 4-series cell stack is individually monitored for an overvoltage condition. An internally fixed-delay timer is initiated upon detection of an overvoltage condition on any cell; upon expiration of the delay timer, an output pin is triggered into an active state to indicate that an overvoltage condition has occurred. (1) For all available packages, see the orderable addendum at the end of the datasheet. (2) The bq2960 is a 2-S to 3-S device. The bq2961 and bq2962 are 2-S to 4-S devices. Notebook PC Ultrabooks Medical UPS Battery Backup Simplified Schematic Protector FETs Pack + Protector FETs 100 Q Pack + 100 Q 1 kQ VCELL3 VCELL2 VCELL1 1 kQ 1 kQ OUT VDD 0.1 µF 0.1 µF V3 V2 V1 5 (*) External Circuit e.g., RTC REG bq2960xy VSS * can be removed if Vss will be connected first during cell connection REG_EN PWPD 0.1 µF 0.1 µF 1 kQ VCELL4 1 kQ 0.1 µF VCELL3 1 kQ 0.1 µF VCELL2 0.47 µF Pack ± VCELL1 1 kQ 0.1 µF 0.1 µF VDD OUT V4 REG V3 bq2961xy 5 (*) VSS * can be removed if Vss will be connected first during cell connection V1 V2 External Circuit e.g., RTC PWPD 0.1 µF 0.47 µF Pack ± MCU bq2960xy REG out is controlled by MCU CTL 10 M (Optional) 1 An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications, intellectual property matters and other important disclaimers. UNLESS OTHERWISE NOTED, this document contains PRODUCTION DATA. bq2961, bq2962 SLUSBU5C – NOVEMBER 2013 – REVISED OCTOBER 2016 www.ti.com Table of Contents 1 2 3 4 5 6 7 8 Features .................................................................. Applications ........................................................... Description ............................................................. Revision History..................................................... Device Comparison Table..................................... Pin Configuration and Functions ......................... Specifications......................................................... 1 1 1 2 3 4 5 7.1 7.2 7.3 7.4 7.5 7.6 5 5 5 5 6 8 Absolute Maximum Ratings ...................................... ESD Ratings.............................................................. Recommended Operating Conditions....................... Thermal Information .................................................. Electrical Characteristics........................................... Typical Characteristics .............................................. Detailed Description ............................................ 10 8.1 Overview ................................................................. 10 8.2 Functional Block Diagram ....................................... 10 8.3 Feature Description................................................. 11 8.4 Device Functional Modes........................................ 14 9 Application and Implementation ........................ 16 9.1 Application Information............................................ 16 9.2 Typical Application .................................................. 16 10 Power Supply Recommendations ..................... 20 11 Layout................................................................... 20 11.1 Layout Guidelines ................................................. 20 11.2 Layout Example .................................................... 20 12 Device and Documentation Support ................. 21 12.1 12.2 12.3 12.4 Community Resources.......................................... Trademarks ........................................................... Electrostatic Discharge Caution ............................ Glossary ................................................................ 21 21 21 21 13 Mechanical, Packaging, and Orderable Information ........................................................... 21 4 Revision History Changes from Revision B (May 2016) to Revision C Page • Added bq2962 REG options .................................................................................................................................................. 1 • Changed Part number to bq2960, bq2961, bq2962 to identify each spin family throughout the datasheet ......................... 1 • Added bq2962 device to Recommened Operating Conditions ............................................................................................. 2 • Added bq296202, bq296203, bq296212, bq296213 .............................................................................................................. 3 • Added bq2962 pinout ............................................................................................................................................................ 4 • Added bq2962 device to Recommened Operating Conditions ............................................................................................. 5 • Added bq2962 VREG specification ....................................................................................................................................... 7 • Added bq2962 regulator programmable option ................................................................................................................... 10 • Changed figure title to apply to bq2962 family .................................................................................................................... 17 • Changed figure title to apply to bq2962 .............................................................................................................................. 20 Changes from Revision A (January 2016) to Revision B • Page Added bq296114 to Device Comparison Table...................................................................................................................... 3 Changes from Original (November 2013) to Revision A Page • Changed the device listing in the data sheet header information to: bq2961 ....................................................................... 1 • Changed bq296106, '107, '111 From: Preview To: Released status .................................................................................... 3 • Added bq296112 to Device Comparison Table ..................................................................................................................... 3 • Added bq296113 to Device Comparison Table...................................................................................................................... 3 • Added Available the bq2961xy configuration range to Device Comparison Table ................................................................ 3 2 Submit Documentation Feedback Copyright © 2013–2016, Texas Instruments Incorporated Product Folder Links: bq2961 bq2962 bq2961, bq2962 www.ti.com SLUSBU5C – NOVEMBER 2013 – REVISED OCTOBER 2016 5 Device Comparison Table bq2961 Family bq2962 Family OVP (V) OVP DELAY (s) UV (V) LDO (V) bq296100 (1) — 4.35 6.5 2.5 3.3 bq296101 (1) — 4.40 6.5 2.5 3.3 bq296102 (1) bq296202 (1) 4.45 6.5 2.5 3.3 bq296103 bq296203 (1) 4.50 6.5 2.5 3.3 (1) — 4.35 6.5 2.8 3.3 bq296105 (1) — 4.40 6.5 2.8 3.3 bq296106 — 4.45 6.5 2.8 3.3 bq296107 — 4.50 6.5 2.8 3.3 bq296108 (1) — 4.50 6.5 2.4 3.3 bq296109 (1) — 4.325 3.0 2.5 3.3 bq296110 (1) — 4.45 3.0 2.5 3.3 bq296111 — 4.45 4.0 2.5 3.3 bq296112 bq296212 (1) 4.50 3.0 2.5 3.3 bq296113 bq296213 (1) 4.35 3.0 2.5 3.3 bq296114 — 4.50 4.0 2.5 3.3 bq2961xy bq2962xy 3.85V - 4.60V in 50mV step 3.0, 4.0, 5.5, 6.5 2.0V - 2.8V in 50mV step 1.8, 2.5, 3.3 (bq2961) 3, 3.15, 3.3 (bq2962) bq296104 (1) Product Preview only Submit Documentation Feedback Copyright © 2013–2016, Texas Instruments Incorporated Product Folder Links: bq2961 bq2962 3 bq2961, bq2962 SLUSBU5C – NOVEMBER 2013 – REVISED OCTOBER 2016 www.ti.com 6 Pin Configuration and Functions 2s-to-3s bq2960xy (Top View) 2s-to-4s bq2962xy (Top View) 1 VDD OUT 8 1 VDD REG 8 2 V3 REG 7 2 V4 OUT 7 3 V2 VSS 6 3 V3 VSS 6 4 V1 REG_EN 5 4 V2 V1 5 2s-to-4s bq2961xy (Top View) 1 VDD OUT 8 2 V4 REG 7 3 V3 VSS 6 4 V2 V1 5 Pin Functions PIN TYPE (1) DESCRIPTION NAME BQ2960 BQ2961 BQ2962 OUT 8 8 7 OA PWPD 9 9 9 P REG 7 7 8 OA Regulated Supply Output. Requires an external ceramic capacitor for stability. REG_EN 5 — — IA Regulated Supply Output Enable. A "high" to enable REG output and "low" to disable REG output. V1 4 5 5 IA Sense input for positive voltage of the lowest cell from the bottom of the stack. V2 3 4 4 IA Sense input for positive voltage of the second cell from the bottom of the stack. V3 2 3 3 IA Sense input for positive voltage of the third cell from the bottom of the stack. V4 — 2 2 IA Sense input for positive voltage of the fourth cell from the bottom of the stack. VDD 1 1 1 P Power supply input VSS 6 6 6 P Electrically connected to integrated circuit ground and negative terminal of the lowest cell in the stack. (1) 4 Analog Output drive for overvoltage fault signal, CMOS Output High or Open Drain Active Low. TI recommends connecting the exposed pad to VSS on PCB. IA = Analog input, OA = Analog Output, P = Power connection Submit Documentation Feedback Copyright © 2013–2016, Texas Instruments Incorporated Product Folder Links: bq2961 bq2962 bq2961, bq2962 www.ti.com SLUSBU5C – NOVEMBER 2013 – REVISED OCTOBER 2016 7 Specifications 7.1 Absolute Maximum Ratings Over operating free-air temperature range (unless otherwise noted) (1) MIN MAX VDD – VSS –0.3 30 V4 – V3, V3 – V2, V2 – V1, V1 – VSS –0.3 30 REG – VSS –0.3 3.6 REG_EN – VSS –0.3 28 –0.3 30 Supply voltage range Input voltage range Output voltage range OUT – VSS Continuous total power dissipation, PTOT UNIT V See Thermal Information. Lead temperature (soldering, 10 s), TSOLDER 300 300 °C Storage temperature,Tstg –65 150 °C (1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Procedures. Exposure to absolute-maximum–rated conditions for extended periods may affect device reliability. 7.2 ESD Ratings VALUE Human body model (HBM), per ANSI/ESDA/JEDEC JS-001, all pins V(ESD) (1) (2) Electrostatic discharge (1) UNIT 2000 Charged device model (CDM), per JEDEC specification JESD22-C101, all pins (2) V 500 JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process. JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process. 7.3 Recommended Operating Conditions Over operating free-air temperature range (unless otherwise noted). MIN Supply voltage, VDD (1) Input voltage range MAX UNIT (1) 3 15 Supply voltage, VDD (1) 3 20 V 5 V , bq2960xy , bq2961xy, bq2962xy Supply voltage, VDD with REG output on 4 Vn - Vn-1 , V1 – VSS 0 REG_EN Operating ambient temperature range, TA (1) NOM Supply voltage, VDD 0 15 V –40 110 °C See Typical Application. 7.4 Thermal Information bq2960xy THERMAL METRIC (1) DSG (WSON) UNIT 8 PINS RθJA Junction-to-ambient thermal resistance 62 °C/W RθJC(top) Junction-to-case(top) thermal resistance 72 °C/W RθJB Junction-to-board thermal resistance 32.5 °C/W ψJT Junction-to-top characterization parameter 1.6 °C/W ψJB Junction-to-board characterization parameter 33 °C/W RθJC(bot) Junction-to-case(bottom) thermal resistance 10 °C/W (1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application report (SPRA953). Submit Documentation Feedback Copyright © 2013–2016, Texas Instruments Incorporated Product Folder Links: bq2961 bq2962 5 bq2961, bq2962 SLUSBU5C – NOVEMBER 2013 – REVISED OCTOBER 2016 www.ti.com 7.5 Electrical Characteristics Typical values stated where TA = 25°C and VDD = 14.4 V, MIN/MAX values stated where TA = –40°C to 110°C, and VDD = 3 V to 15 V (unless otherwise noted). PARAMETER TEST CONDITIONS MIN TYP MAX UNIT Voltage Protection Thresholds VOV V(PROTECT) Overvoltage Detection VHYS OV Detection Hysteresis VOA OV Detection Accuracy VOADRIFT OV Detection Accuracy Across Temperature Applicable Voltage: 3.85 V to 4.6 V in 50 mV steps RIN = 1 kΩ 250 300 V 400 mV TA = 25°C –10 10 mV TA = –40°C –40 40 mV TA = 0°C –20 20 mV TA = 60°C –24 24 mV TA = 110°C –54 54 mV TA = 110°C –54 54 mV 6 µA 8 µA 2 µA 4 µA 0.1 µA Supply and Leakage Current (Vn – Vn-1) = 3.8 V and (V1 – VSS) > VUVREG , VDD = top Vn voltage, IREG = 0 mA, TA = 0°C to 60°C IDD Supply Current 4 (Vn – Vn-1) = 3.8 V and (V1 – VSS) > VUVREG , VDD = top Vn voltage, IREG = 0 mA, TA = –40°C to 110°C (Vn – Vn-1) = 3.8 V and (V1 – VSS) < VUVREG , VDD = top Vn voltage, TA = 0°C to 60°C 1 (Vn – Vn-1) = 3.8 V and (V1 – VSS) < VUVREG , VDD = top Vn voltage, TA = –40°C to 110°C Input Current at Vx Pins IIN (Vn – Vn-1) = (V1 – VSS) = 3.8 V, VDD = top Vn voltage, TA = 25°C –0.1 Output Drive OUT, CMOS Active High (Vn – Vn-1) or (V1 – VSS) > VOV, IOH = 100 µA, VDD = top Vn voltage Output Drive Voltage, Active High VOUT 6 If three of four cells are short circuited, only one cell remains powered and > VOV, VDD = Vn (the remaining cell voltage), IOH = 100 µA VDD – 0.3 (Vn – Vn-1) and (V1 – VSS) < VOV, VDD = sum of the cell stack voltage, IOL = 100 µA measured into OUT pin IOUTH (Vn – Vn-1), (V3 – V2), or (V1 – VSS) > VOV, VDD = top Vn OUT Source Current voltage, (during OV) forced OUT = 0 V, measured out of OUT pin IOUTL OUT Sink Current (no OV) V 250 V 400 mV 4.5 mA 14 mA (Vn – Vn-1) and (V1 – VSS) < VOV, VDD = top Vn voltage, forced OUT = VDD, measured into OUT pin. Pull-up resistor RPU = 5 kΩ to VDD 0.5 Internal Fixed Delay, 3 second delay option 2.4 3 3.6 s Internal Fixed Delay, 4 second delay option 3.2 4 4.8 s Internal Fixed Delay, 5.5 second delay option 4.4 5.5 6.6 s Internal Fixed Delay, 6.5 second delay option 5.2 6.5 7.8 s Internal Fixed Delay Timer OV Delay Time (1) tDELAY tDELAY_CTM (1) 6 Fault Detection Delay Time in Test Mode OV Delay Time Internal Fixed delay 15 ms Specified by design. Not 100% tested in production. Submit Documentation Feedback Copyright © 2013–2016, Texas Instruments Incorporated Product Folder Links: bq2961 bq2962 bq2961, bq2962 www.ti.com SLUSBU5C – NOVEMBER 2013 – REVISED OCTOBER 2016 Electrical Characteristics (continued) Typical values stated where TA = 25°C and VDD = 14.4 V, MIN/MAX values stated where TA = –40°C to 110°C, and VDD = 3 V to 15 V (unless otherwise noted). PARAMETER TEST CONDITIONS MIN TYP MAX UNIT 3.2 3.3 3.4 V 3.05 3.15 3.25 V Regulated Supply Output, REG VREG = 3.3 V , bq2960, bq2961, bq2962 VREG REG Supply VREG = 3.15 V , bq2962 VDD ≥ 4 V, I REG = 0 µA to 1 mA, CREG = 0.47 µF VREG = 3.0 V , bq2962 2.9 3 3.1 V VREG = 2.5 V , bq2960, bq2961 2.425 2.5 2.575 V VREG = 1.8 V , bq2960, bq2961 1.746 1.8 1.854 IREG REG Current Output VDD ≥ 4 V, CREG = 0.47 µF 0 IREG_ REG Output Short Circuit Current Limit REG = VSS, CREG = 0.47 µF 4 REG pull-down resistor REG is disabled SC_Limit RREG_ PD 20 1 V mA mA 30 45 kΩ Regulated Supply Output Enable, REG_EN VIH High-level Input VIL Low-level Input ILKG Input Leakage Current 1.6 V VIH < 6 V 0.4 V 0.1 µA 50 mV Regulated Supply Undervoltage Self-disable VUVREG Undervoltage detection VUVHYS Undervoltage Detection Hysteresis 250 300 400 mV tUVDELAY Undervoltage Detection Delay 4.5 6 7.5 s VUVQUAL Cell voltage to qualify for UV detection Factory Configuration: 2.0 V to 2.8 V in 50 mV steps, TA = 25 °C –50 0.5 Submit Documentation Feedback Copyright © 2013–2016, Texas Instruments Incorporated Product Folder Links: bq2961 bq2962 V 7 bq2961, bq2962 SLUSBU5C – NOVEMBER 2013 – REVISED OCTOBER 2016 www.ti.com 15 350 10 340 Overvoltage Hysteresis (mV) Overvoltage Accuracy (mV) 7.6 Typical Characteristics 5 0 -5 -10 -15 Mean Min Max -20 -25 -60 -40 -20 0 20 40 60 Temperature (qC) 80 100 330 320 310 300 290 280 -60 120 Supply Current (PA) -5 80 100 120 D002 -10 -15 Mean Min Max -40 -20 0 20 40 60 Temperature (qC) 80 100 4 3.5 3 Mean Min Max 2.5 2 -60 120 -40 -20 D003 Figure 3. Undervoltage Accuracy 0 20 40 60 Temperature (qC) 80 100 120 D004 Figure 4. IDD with Regulator On 3.31 1.2 Regulator Output (V) 3.305 Supply Current (PA) 20 40 60 Temperature (qC) 4.5 1.4 1 0.8 0.6 0.4 -40 -20 0 20 40 60 Temperature (qC) 80 100 Mean Min Max 3.3 3.295 3.29 Mean Min Max 0.2 120 3.285 -60 -40 D005 Figure 5. IDD with Regulator Off 8 0 5 0 0 -60 -20 Figure 2. Hysteresis VHYS vs Temperature 5 Undervoltage Accuracy (mV) -40 D001 Figure 1. Overvoltage Threshold (VOV) vs Temperature -20 -60 Mean Min Max -20 0 20 40 60 Temperature (qC) 80 100 120 D006 Figure 6. Regulator Output Without Load Submit Documentation Feedback Copyright © 2013–2016, Texas Instruments Incorporated Product Folder Links: bq2961 bq2962 bq2961, bq2962 www.ti.com SLUSBU5C – NOVEMBER 2013 – REVISED OCTOBER 2016 Typical Characteristics (continued) 8 Mean Min Max -3.4 7 6 -3.45 Output Voltage (V) High-Level Output Current (mA) -3.35 -3.5 -3.55 -3.6 4 3 2 -3.65 -3.7 -60 5 1 0 -40 -20 0 20 40 60 Temperature (qC) 80 100 120 0 5 D008 Figure 7. IOUTH vs Temperature 10 15 20 Supply Voltage (V) 25 30 Figure 8. VOUT vs VDD Submit Documentation Feedback Copyright © 2013–2016, Texas Instruments Incorporated Product Folder Links: bq2961 bq2962 D009 9 bq2961, bq2962 SLUSBU5C – NOVEMBER 2013 – REVISED OCTOBER 2016 www.ti.com 8 Detailed Description 8.1 Overview The bq2960, bq2961 and bq2962 are second-level overvoltage (OV) protectors with a regulated output. Each cell is monitored independently by comparing the actual cell voltage to an overvoltage threshold VOV. The overvoltage threshold is preprogrammed at the factory with a range between 3.85 V to 4.65 V. The regulated output is enabled unless any of the cell voltages fall below the VUVREG threshold. This threshold is preprogrammed at the factory with a range between 2 V to 2.8 V. For bq2960xy family, an external control pin, REG_EN, is available to enable or disable the regulated output in addition to the VUVREG detection. Table 1. Programmable Parameters OVERVOLTAGE RANGE (V) 3.85 to 4.6 in 50 mV step OVERVOLTAGE DELAY (s) UNDERVOLTAGE RANGE (V) 3, 4, 5.5, 6.5 2.0 to 2.8 in 50 mV step REGULATOR (V) 1.8, 2.5, 3.3 (bq2960, bq2961) 3.0, 3.15, 3.3 (bq2962) 8.2 Functional Block Diagram PACK+ R VD C VD VDD 1 Vref R IN V3 2 C IN R IN V2 3 C IN Multiplexer S witch Net work + Amp V1 R IN 4 - Comp + 5 REG_EN UVP_Vref - 7 REG Programmable setting V OV Enable Delay Charging/ Discharge circuit Active OUT 8 Delay Timer C IN VSS 6 9 PWPD PACK± Figure 9. bq2960 Block Diagram 10 Submit Documentation Feedback Copyright © 2013–2016, Texas Instruments Incorporated Product Folder Links: bq2961 bq2962 bq2961, bq2962 www.ti.com SLUSBU5C – NOVEMBER 2013 – REVISED OCTOBER 2016 Functional Block Diagram (continued) PACK+ R VD C VD VDD 1 Vref V4 R IN 2 R IN V3 3 C IN R IN V2 4 C IN Comp + Multiplexer S witch Net work C IN UVP_Vref - 7 REG_EN REG Programmable setting Enable V OV V1 R IN + Amp - Delay Charging/ Discharge circuit 5 C IN Active OUT 8 Delay Timer REG_EN VSS 6 9 PWPD PACK± Figure 10. bq2961 and bq2962 Block Diagram 8.3 Feature Description 8.3.1 Pin Details 8.3.1.1 Input Sense Voltage, Vx These inputs sense each battery cell voltage. A series resistor and a capacitor across the cell for each input is required for noise filtering and stable voltage monitoring. 8.3.1.2 Output Drive, OUT This terminal serves as the fault signal output in Active High. 8.3.1.3 Supply Input, VDD This terminal is the unregulated input power source for the device. A series resistor is connected to limit the current, and a capacitor is connected to ground for noise filtering. 8.3.1.4 Regulated Supply Output, REG This terminal is connected to an external capacitor and provides a regulated supply to power a circuit such as a Real Time Clock integrated circuit, or functions requiring a well-regulated supply. Maximum current load on this pin cannot exceed 1 mA. Submit Documentation Feedback Copyright © 2013–2016, Texas Instruments Incorporated Product Folder Links: bq2961 bq2962 11 bq2961, bq2962 SLUSBU5C – NOVEMBER 2013 – REVISED OCTOBER 2016 www.ti.com Feature Description (continued) The REG output has protection for overcurrent, using a current limit protection circuit, and also detects and protects for excessive power dissipation due to short circuit of the external load. This pin requires a ceramic 1-µF capacitor connection to VSS for improved stability, noise immunity, and ESD performance of the supply output. This capacitor must be placed close to the REG and VSS pins for connection. 8.3.1.5 Regulated Supply Output Enable, REG_EN (bq2960 Only) This terminal is a high voltage input drain to enable and disable the regulated supply output, REG terminal. When the VREG_EN > VIH, the REG terminal output is enabled including the cell undervoltage detection function to self-disable the regulated supply. When the VREG_EN < VIL, the REG terminal output, the cell undervoltage detection and the regulated supply self-disable functions are disabled. To keep the REG output enabled at all times, the recommendation is to connect the REG_EN to the V1 termination. There is a 6-V clamp to protect the REG_EN terminal from a high voltage input. By connecting REG_EN to V1, the clamp circuit is not active. When the REG output is enabled, VREG_EN > VIH, the REG output can be self-disabled if any of the cell voltages are < VUVREG. The self-disable function is used to reduce power consumption when the battery pack is deeply depleted. 8.3.2 Overvoltage Sensing for OUT Cell Voltage (V) (V4-V3, V3-V2, V2-V1, V1-VSS) In the bq296xxx device, each cell is monitored independently. Overvoltage is detected by comparing the actual cell voltage to a protection voltage reference, VOV. If any cell voltage exceeds the programmed OV value, an internal timer circuit is activated. This timer circuit causes a factory pre-programmed fixed delay before the OUT terminal goes from inactive to active state. VOV VOV - VHYS tDELAY OUT (V) Figure 11. Timing for Overvoltage Sensing for OUT 8.3.3 Regulated Output Voltage and REG_EN Pin For bq2960 and bq2961, there are three factory-preprogrammed options for the regulated output voltage, 3.3 V, 2.5 V, and 1.8 V. For bq2962, the regulated output voltage options are 3.3 V, 3.15 V, and 3.0 V. bq2962xy can potentially provide other regulated voltage output between 3.3 V to 3.0 V, contact Texas Instruments for detail. At power up, the regulated output is on by default. If any cell voltage is below VUVREG at device power up, the regulated output will remain on until the tUV_DELAY time has passed, the regulated out turns off after the delay time. During discharge, if any cell voltage falls below the VUVREG threshold for tUV_DELAY time, the regulated output is self-disabled. The regulated output turns on again when all the cell voltages are above VUVREG + VUVHYS. 12 Submit Documentation Feedback Copyright © 2013–2016, Texas Instruments Incorporated Product Folder Links: bq2961 bq2962 bq2961, bq2962 www.ti.com SLUSBU5C – NOVEMBER 2013 – REVISED OCTOBER 2016 Cell Voltage (V) (V3-V2, V2-V1, V1-VSS) Feature Description (continued) VUVREG + VUVHYS VUVREG tUVDELAY REG (V) Figure 12. REG Output Timing For bq2960 family, an external REG_EN pin is available to enable and disable the regulated output function. To enable both the regulated output and the undervoltage self-disable features, the REG_EN pin must be above VIH. A microcontroller can be used to control the REG_EN pin. Alternatively, connecting the REG_EN pin to the bottom cell is another option to enable the regulated output function always. Submit Documentation Feedback Copyright © 2013–2016, Texas Instruments Incorporated Product Folder Links: bq2961 bq2962 13 bq2961, bq2962 SLUSBU5C – NOVEMBER 2013 – REVISED OCTOBER 2016 www.ti.com Feature Description (continued) Pack + Protector FETs 100 Q VCELL3 VCELL2 1 kQ 0.1 µF 1 kQ 0.1 µF 1 kQ VCELL1 VDD OUT V3 REG bq2960xy V2 5 (*) X2 MFP GND VSS VCC Supply Enable SCL RTC IC 0.1 µF 0.1 µF VCC VBAT SDA REG_EN PWPD V1 X1 * can be removed if Vss will be connected first during cell connection 0.47 µF Pack ± REG out is always enabled Pack + Protector FETs 100 Q 1 kQ VCELL3 1 kQ VCELL2 0.1 µF V2 REG bq2960xy 5 (*) MFP Enable RTC IC 0.1 µF 0.1 µF X2 VCC supply GND SCL VSS REG_EN PWPD V1 VCC VBAT SDA 0.1 µF 1 kQ VCELL1 OUT VDD V3 X1 * can be removed if Vss will be connected first during cell connection 0.47 µF Pack ± REG output is enabled or disabled by MCU MCU CTL Figure 13. bq2960xy Application Schematic 8.4 Device Functional Modes 8.4.1 NORMAL Mode When all of the cell voltages are below the VOV threshold AND above VUVREG threshold, the device operates in NORMAL mode. The device monitors the differential cell voltages connected across (V1–VSS), (V2–V1), (V3–V2), and (V4–V3). The OUT pin is inactive in this mode. The regulated output is always enabled for bq2961. For bq2960, the regulated output is on only if the voltage on the REG_EN pin is above VIH. 8.4.2 OVERVOLTAGE Mode OVERVOLTAGE mode is detected if any of the cell voltages exceed the overvoltage threshold, VOV, for configured OV delay time. The OUT pin is activated after a delay time preprogrammed at the factory. The OUT pin will pull high internally. Then an external FET is turned on, shorting the fuse to ground, which allows the battery and/or charger power to blow the fuse. When all of the cell voltages fall below (VOV – VHYS), the device returns to NORMAL mode. The regulated output (if enabled) remains on in this mode. 14 Submit Documentation Feedback Copyright © 2013–2016, Texas Instruments Incorporated Product Folder Links: bq2961 bq2962 bq2961, bq2962 www.ti.com SLUSBU5C – NOVEMBER 2013 – REVISED OCTOBER 2016 Device Functional Modes (continued) 8.4.3 UNDERVOLTAGE Mode The UNDERVOLTAGE mode is detected if any of the cell voltage across (V1–VSS), (V2–V1), (V3–V2), or (V4–V3) is below the VUVREG threshold for tUV_DELAY time. In this mode, the regulated output is disabled. To return to the NORMAL mode, all the cell voltages must be above (VUVREG + VUVHYS). For a low cell configuration, Vn pin can be shorted to the (Vn voltage below VUVQUAL threshold for undervoltage detection. – 1) pin. The device ignores any differential cell 8.4.4 CUSTOMER TEST MODE The Customer Test Mode (CTM) helps to reduce test time for checking the overvoltage delay-timer parameter once the circuit is implemented into the battery pack. To enter CTM, the VDD pin should be set at least 10 V higher than V3 (see Figure 14). The delay timer is greater than 10 ms, but considerably shorter than the timer delay in normal operation. To exit CTM, remove the VDD to VC3 voltage differential of 10 V, so that the decrease in the value automatically causes an exit. CAUTION Avoid exceeding any Absolute Maximum Voltages on any pins when placing the device into CTM. Also avoid exceeding Absolute Maximum Voltages for the individual cell voltages (V3–V2), (V2–V1) and (V1–VSS). Stressing the pins beyond the rated limits can cause permanent damage to the device. Figure 14 shows the timing for the Customer Test Mode. VDD ± V3 = 10V VDD V3 > 10ms OUT (V) Figure 14. Timing for Customer Test Mode Figure 15 shows the measurement for current consumption of the product for both VDD and Vx. ICC IIN 3.6 V IIN 3.6 V 3.6 V IIN 1 VDD OUT 8 2 V3 REG 7 3 V2 VSS 6 4 V1 REG_EN 5 0.1 µF VDC Figure 15. Configuration for Integrated Circuit Current Consumption Test Submit Documentation Feedback Copyright © 2013–2016, Texas Instruments Incorporated Product Folder Links: bq2961 bq2962 15 bq2961, bq2962 SLUSBU5C – NOVEMBER 2013 – REVISED OCTOBER 2016 www.ti.com 9 Application and Implementation NOTE Information in the following applications sections is not part of the TI component specification, and TI does not warrant its accuracy or completeness. TI’s customers are responsible for determining suitability of components for their purposes. Customers should validate and test their design implementation to confirm system functionality. 9.1 Application Information The bq296xxx is a family of second-level protectors used for overvoltage protection of the battery pack in the application. A regulated output is available to drive a small circuit with maximum IREG loading. The device OUT pin is active high, which drives a NMOS FET that connects the fuse to ground in the event of a fault condition. This provides a shorted path to use the battery and/or charger power to blow the fuse and cut the power path. 9.2 Typical Application Figure 13 shows the recommended reference design components. Pack + Protector FETs Protector FETs 100 Q Pack + 100 Q VDD 1 kQ VCELL3 VCELL2 VCELL1 1 kQ 1 kQ OUT 0.1 µF 0.1 µF V3 V2 V1 5 (*) External Circuit e.g., RTC REG bq2960xy VSS * can be removed if Vss will be connected first during cell connection REG_EN PWPD 0.1 µF 0.1 µF 1 kQ VCELL4 1 kQ 0.1 µF VCELL3 1 kQ 0.1 µF VCELL2 0.47 µF Pack ± VCELL1 1 kQ 0.1 µF VDD OUT V4 REG V3 bq2961xy 5 External Circuit e.g., RTC (*) VSS * can be removed if Vss will be connected first during cell connection V1 V2 PWPD 0.1 µF 0.47 µF 0.1 µF Pack ± MCU bq2960xy REG out is controlled by MCU CTL 10 M (Optional) Figure 16. Application Schematic 9.2.1 Design Requirements NOTE Changes to the ranges stated in Table 2 will impact the accuracy of the cell measurements. Table 2. Parameters PARAMETER EXTERNAL COMPONENT MIN NOM MAX Voltage monitor filter resistance RIN 900 1000 4700 UNIT Ω Voltage monitor filter capacitance CIN 0.01 0.1 1.0 µF Supply voltage filter resistance RVD 0.1 — 1 KΩ Supply voltage filter capacitance CVD — 0.1 1.0 µF REG output capacitance CREG 0.47 1 — µF NOTE The device is calibrated using an RIN value = 1 kΩ. Using a value other than the recommended value changes the accuracy of the cell voltage measurements and VOV trigger level. 16 Submit Documentation Feedback Copyright © 2013–2016, Texas Instruments Incorporated Product Folder Links: bq2961 bq2962 bq2961, bq2962 www.ti.com SLUSBU5C – NOVEMBER 2013 – REVISED OCTOBER 2016 9.2.2 Detailed Design Procedure NOTE The device VSS must be connected first during PCB test or cell attachment. Failure to do so can damage the REG pin. 1. If VSS pin cannot be connected first, it is required to add a resistor of a minimum of 5 ohms to a maximum of 10 ohms (a 5-ohm resistor is used in the reference schematic, Figure 17) in series with the REG capacitor. When VSS is floating, the REG capacitor always charges up to the VDD voltage. When VSS is finally connected, the REG capacitor will be discharged. Adding a small resistor in series reduces the current strength and avoids any potential damage to the REG pin. The 5-ohm resistor can be placed in series with the REG connect circuit (as shown in Figure 17) or in series of the REG capacitor (as shown in Figure 18). Placing the resistor in series with the REG circuit results in a small drop of VREG (for example: max loading of 1 mA with a 5-ohm resistor will drop 5 mV on VREG), but such a connection can protect again rush current discharge from both REG capacitor or external filter capacitor connected to the REG pin. Placing the resistor in series with the REG capacitor is an alternative to avoid additional drop in VREG if the filer capacitor used by the external circuit is much smaller than the REG capacitor. 2. After VSS is connected, the device allows random cell connect to the Vx pin. 3. Cell should be connected to the lower Vn pin; the unused Vn pin should be shorted to the (Vn-1) pin. See Figure 17 for details. Protector FETs Pack + 100 Q 1 kQ VCELL3 0.1 µF 1 kQ VCELL2 0.1 µF VCELL1 1 kQ 0.1 µF VDD OUT V4 V3 REG bq2961xy V2 External Circuit e.g., RTC 5Q VSS V1 PWPD 0.1 µF 0.47 µF Pack t Figure 17. 3-Series bq2961 Schematic (also apply to bq2962) 4. A zener diode can be added to the REG pin to VSS as shown in Figure 18. This is recommended to protect the circuit connected to the REG pin if floating VSS in the field is a risk concern. When VSS is floating (during cell connection when VSS is not connected first or in system fault with BAT– wire broken), the REG voltage always pulls up to VDD. In a 4-S configuration, the REG voltage can reach approximately 16 V with VSS floating. Adding a zener diode clamps the REG voltage to a safe level for the external circuits connected to the REG pin. Having the zener diode can also protect the external circuits if REG pin is shorted to OUT pin or any other high-voltage output terminal. If a zener diode is used, TI recommends putting the diode on the battery side with the bq296xxx device to allow protection on both the REG pin as well as the circuit connected to REG under floating VSS condition. The resistor in series with the REG pin is not required in this case. Submit Documentation Feedback Copyright © 2013–2016, Texas Instruments Incorporated Product Folder Links: bq2961 bq2962 17 bq2961, bq2962 SLUSBU5C – NOVEMBER 2013 – REVISED OCTOBER 2016 www.ti.com REG The 5-Ÿ UHVLVWRU OLPLWV WKH UXVK FXUUHQW discharge from the capacitor during cell connection when Vss is not connected first. Loss of Vss connection or REG shorted to high voltage can bring the REG above the regulated range. This optional zener clamp can protect the downstream circuit under such an event. 5Ÿ 0.47 µF This resistor is not required if Vss is connected first in the cell connection sequence. Figure 18. 5-V Zener Diode 5. For 2- to 3-series applications, if an external control for the regulated output is required, select the bq2960xy family. Otherwise, select the bq2961xy family. 9.2.3 Application Curves 18 Figure 19. Overvoltage Protection Figure 20. Overvoltage Protection Release Figure 21. Undervoltage Detection to Turn off Regulator Figure 22. Undervoltage Release to Switch on Regulator Submit Documentation Feedback Copyright © 2013–2016, Texas Instruments Incorporated Product Folder Links: bq2961 bq2962 bq2961, bq2962 www.ti.com SLUSBU5C – NOVEMBER 2013 – REVISED OCTOBER 2016 9.2.4 Other Schematics Protector FETs Pack + 100 Q VCELL3 1 kQ 0.1 µF 1 kQ VCELL2 0.1 µF 1 kQ VCELL1 VDD OUT V3 REG bq2960xy V2 VSS V1 REG_EN 5 0.1 µF PWPD External Circuit e.g., RTC (*) 0.47 µF * can be removed if Vss will be connected first during cell connection 0.1 µF Pack ± Protector FETs Pack + 100 Q 1 kQ VCELL3 1 kQ VCELL2 0.1 µF OUT REG bq2960xy V2 VSS V1 REG_EN PWPD 5 External Circuit e.g., RTC (*) 0.1 µF 1 kQ VCELL1 VDD V3 * can be removed if Vss will be connected first during cell connection 0.1 µF 0.1 µF 0.47 µF Pack ± MCU REG output can be enabled or disabled by MCU CTL 10 M (Optional) Figure 23. bq2960 Schematic with REG Output Always Enabled Submit Documentation Feedback Copyright © 2013–2016, Texas Instruments Incorporated Product Folder Links: bq2961 bq2962 19 bq2961, bq2962 SLUSBU5C – NOVEMBER 2013 – REVISED OCTOBER 2016 www.ti.com Protector FETs Pack + 100 Q 1 kQ VCELL4 1 kQ 0.1 µF VCELL3 1 kQ 0.1 µF VCELL2 1 kQ 0.1 µF VDD OUT V4 REG V3 bq2961xy 5 VSS * can be removed if Vss will be connected first during cell connection V1 V2 PWPD 0.1 µF 0.1 µF VCELL1 External Circuit e.g., RTC (*) 0.47 µF Pack ± Figure 24. bq2961 Schematic (also apply to bq2962) 10 Power Supply Recommendations The maximum power is 15 V for bq2960 and 20 V for bq2961 and bq2962 on VDD. NOTE Connect VSS first during power up. 11 Layout 11.1 Layout Guidelines Use the following layout guidelines. 1. Ensure the RC filters for the Vx pins and VDD pin are placed as close as possible to the target terminal, reducing the tracing loop area. 2. The capacitor for REG should be placed close to the device terminals. 3. Ensure the trace connecting the fuse to the gate, source of the NFET to the Pack– is sufficient to withstand the current during a fuse blown event. 11.2 Layout Example Place the RC filters close to device terminals VCELL3 VCELL2 Power Trace Line VDD OUT V4 REG V3 V2 Pack + 5 PWPD (*) VSS External Circuit e.g., RTC Pack ± V1 VCELL1 * can be removed if Vss will be connected first during cell connection Ensure trace can support sufficient current flow for fuse blow Figure 25. Layout Example 20 Submit Documentation Feedback Copyright © 2013–2016, Texas Instruments Incorporated Product Folder Links: bq2961 bq2962 bq2961, bq2962 www.ti.com SLUSBU5C – NOVEMBER 2013 – REVISED OCTOBER 2016 12 Device and Documentation Support 12.1 Community Resources The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of Use. TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help solve problems with fellow engineers. Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and contact information for technical support. 12.2 Trademarks E2E is a trademark of Texas Instruments. All other trademarks are the property of their respective owners. 12.3 Electrostatic Discharge Caution This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. 12.4 Glossary SLYZ022 — TI Glossary. This glossary lists and explains terms, acronyms, and definitions. 13 Mechanical, Packaging, and Orderable Information The following pages include mechanical, packaging, and orderable information. This information is the most current data available for the designated devices. This data is subject to change without notice and revision of this document. For browser-based versions of this data sheet, refer to the left-hand navigation. Submit Documentation Feedback Copyright © 2013–2016, Texas Instruments Incorporated Product Folder Links: bq2961 bq2962 21 PACKAGE OPTION ADDENDUM www.ti.com 27-Oct-2016 PACKAGING INFORMATION Orderable Device Status (1) Package Type Package Pins Package Drawing Qty Eco Plan Lead/Ball Finish MSL Peak Temp (2) (6) (3) Op Temp (°C) Device Marking (4/5) BQ296103DSGR ACTIVE WSON DSG 8 3000 Green (RoHS & no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR -40 to 110 6103 BQ296103DSGT ACTIVE WSON DSG 8 250 Green (RoHS & no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR -40 to 110 6103 BQ296106DSGR ACTIVE WSON DSG 8 3000 Green (RoHS & no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR -40 to 110 6106 BQ296106DSGT ACTIVE WSON DSG 8 250 Green (RoHS & no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR -40 to 110 6106 BQ296107DSGR ACTIVE WSON DSG 8 3000 Green (RoHS & no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR -40 to 110 6107 BQ296107DSGT ACTIVE WSON DSG 8 250 Green (RoHS & no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR -40 to 110 6107 BQ296111DSGR ACTIVE WSON DSG 8 3000 Green (RoHS & no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR -40 to 110 6111 BQ296111DSGT ACTIVE WSON DSG 8 250 Green (RoHS & no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR -40 to 110 6111 BQ296112DSGR ACTIVE WSON DSG 8 3000 Green (RoHS & no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR -40 to 110 6112 BQ296112DSGT ACTIVE WSON DSG 8 250 Green (RoHS & no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR -40 to 110 6112 BQ296113DSGR ACTIVE WSON DSG 8 3000 Green (RoHS & no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR -40 to 110 6113 BQ296113DSGT ACTIVE WSON DSG 8 250 Green (RoHS & no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR -40 to 110 6113 BQ296114DSGR ACTIVE WSON DSG 8 3000 Green (RoHS & no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR -40 to 110 6114 BQ296114DSGT ACTIVE WSON DSG 8 250 Green (RoHS & no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR -40 to 110 6114 BQ296202DSGR PREVIEW WSON DSG 8 3000 Green (RoHS & no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR -40 to 150 6202 BQ296202DSGT PREVIEW WSON DSG 8 250 Green (RoHS & no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR -40 to 150 6202 BQ296203DSGR PREVIEW WSON DSG 8 3000 Green (RoHS & no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR -40 to 150 6203 Addendum-Page 1 Samples PACKAGE OPTION ADDENDUM www.ti.com Orderable Device 27-Oct-2016 Status (1) Package Type Package Pins Package Drawing Qty Eco Plan Lead/Ball Finish MSL Peak Temp (2) (6) (3) Op Temp (°C) Device Marking (4/5) BQ296203DSGT PREVIEW WSON DSG 8 250 Green (RoHS & no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR -40 to 150 6203 BQ296212DSGR PREVIEW WSON DSG 8 3000 Green (RoHS & no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR -40 to 150 6212 BQ296212DSGT PREVIEW WSON DSG 8 250 Green (RoHS & no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR -40 to 150 6212 BQ296213DSGR PREVIEW WSON DSG 8 3000 Green (RoHS & no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR -40 to 150 6213 BQ296213DSGT PREVIEW WSON DSG 8 250 Green (RoHS & no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR -40 to 150 6213 (1) The marketing status values are defined as follows: ACTIVE: Product device recommended for new designs. LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect. NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design. PREVIEW: Device has been announced but is not in production. Samples may or may not be available. OBSOLETE: TI has discontinued the production of the device. (2) Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability information and additional product content details. TBD: The Pb-Free/Green conversion plan has not been defined. Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes. Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above. Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight in homogeneous material) (3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature. (4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device. (5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation of the previous line and the two combined represent the entire Device Marking for that device. (6) Lead/Ball Finish - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead/Ball Finish values may wrap to two lines if the finish value exceeds the maximum column width. Addendum-Page 2 Samples PACKAGE OPTION ADDENDUM www.ti.com 27-Oct-2016 Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. 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Addendum-Page 3 PACKAGE MATERIALS INFORMATION www.ti.com 29-Oct-2016 TAPE AND REEL INFORMATION *All dimensions are nominal Device Package Package Pins Type Drawing BQ296103DSGR WSON DSG 8 SPQ Reel Reel A0 Diameter Width (mm) (mm) W1 (mm) B0 (mm) K0 (mm) P1 (mm) W Pin1 (mm) Quadrant 3000 180.0 8.4 2.3 2.3 1.15 4.0 8.0 Q2 BQ296103DSGT WSON DSG 8 250 180.0 8.4 2.3 2.3 1.15 4.0 8.0 Q2 BQ296106DSGR WSON DSG 8 3000 180.0 8.4 2.3 2.3 1.15 4.0 8.0 Q2 BQ296106DSGT WSON DSG 8 250 180.0 8.4 2.3 2.3 1.15 4.0 8.0 Q2 BQ296107DSGR WSON DSG 8 3000 180.0 8.4 2.3 2.3 1.15 4.0 8.0 Q2 BQ296107DSGT WSON DSG 8 250 180.0 8.4 2.3 2.3 1.15 4.0 8.0 Q2 BQ296111DSGR WSON DSG 8 3000 180.0 8.4 2.3 2.3 1.15 4.0 8.0 Q2 BQ296111DSGT WSON DSG 8 250 180.0 8.4 2.3 2.3 1.15 4.0 8.0 Q2 BQ296112DSGR WSON DSG 8 3000 180.0 8.4 2.3 2.3 1.15 4.0 8.0 Q2 BQ296112DSGT WSON DSG 8 250 180.0 8.4 2.3 2.3 1.15 4.0 8.0 Q2 BQ296113DSGR WSON DSG 8 3000 180.0 8.4 2.3 2.3 1.15 4.0 8.0 Q2 BQ296113DSGT WSON DSG 8 250 180.0 8.4 2.3 2.3 1.15 4.0 8.0 Q2 BQ296114DSGR WSON DSG 8 3000 180.0 8.4 2.3 2.3 1.15 4.0 8.0 Q2 BQ296114DSGT WSON DSG 8 250 180.0 8.4 2.3 2.3 1.15 4.0 8.0 Q2 BQ296202DSGR WSON DSG 8 3000 180.0 8.4 2.3 2.3 1.15 4.0 8.0 Q2 BQ296202DSGT WSON DSG 8 250 180.0 8.4 2.3 2.3 1.15 4.0 8.0 Q2 BQ296203DSGR WSON DSG 8 3000 180.0 8.4 2.3 2.3 1.15 4.0 8.0 Q2 BQ296203DSGT WSON DSG 8 250 180.0 8.4 2.3 2.3 1.15 4.0 8.0 Q2 Pack Materials-Page 1 PACKAGE MATERIALS INFORMATION www.ti.com 29-Oct-2016 Device Package Package Pins Type Drawing SPQ Reel Reel A0 Diameter Width (mm) (mm) W1 (mm) B0 (mm) K0 (mm) P1 (mm) W Pin1 (mm) Quadrant BQ296212DSGR WSON DSG 8 3000 180.0 8.4 2.3 2.3 1.15 4.0 8.0 Q2 BQ296212DSGT WSON DSG 8 250 180.0 8.4 2.3 2.3 1.15 4.0 8.0 Q2 BQ296213DSGR WSON DSG 8 3000 180.0 8.4 2.3 2.3 1.15 4.0 8.0 Q2 BQ296213DSGT WSON DSG 8 250 180.0 8.4 2.3 2.3 1.15 4.0 8.0 Q2 *All dimensions are nominal Device Package Type Package Drawing Pins SPQ Length (mm) Width (mm) Height (mm) BQ296103DSGR WSON DSG 8 3000 210.0 185.0 35.0 BQ296103DSGT WSON DSG 8 250 210.0 185.0 35.0 BQ296106DSGR WSON DSG 8 3000 210.0 185.0 35.0 BQ296106DSGT WSON DSG 8 250 210.0 185.0 35.0 BQ296107DSGR WSON DSG 8 3000 210.0 185.0 35.0 BQ296107DSGT WSON DSG 8 250 210.0 185.0 35.0 BQ296111DSGR WSON DSG 8 3000 210.0 185.0 35.0 BQ296111DSGT WSON DSG 8 250 210.0 185.0 35.0 BQ296112DSGR WSON DSG 8 3000 210.0 185.0 35.0 BQ296112DSGT WSON DSG 8 250 210.0 185.0 35.0 BQ296113DSGR WSON DSG 8 3000 210.0 185.0 35.0 BQ296113DSGT WSON DSG 8 250 210.0 185.0 35.0 BQ296114DSGR WSON DSG 8 3000 210.0 185.0 35.0 Pack Materials-Page 2 PACKAGE MATERIALS INFORMATION www.ti.com 29-Oct-2016 Device Package Type Package Drawing Pins SPQ Length (mm) Width (mm) Height (mm) BQ296114DSGT WSON DSG 8 250 210.0 185.0 35.0 BQ296202DSGR WSON DSG 8 3000 210.0 185.0 35.0 BQ296202DSGT WSON DSG 8 250 210.0 185.0 35.0 BQ296203DSGR WSON DSG 8 3000 210.0 185.0 35.0 BQ296203DSGT WSON DSG 8 250 210.0 185.0 35.0 BQ296212DSGR WSON DSG 8 3000 210.0 185.0 35.0 BQ296212DSGT WSON DSG 8 250 210.0 185.0 35.0 BQ296213DSGR WSON DSG 8 3000 210.0 185.0 35.0 BQ296213DSGT WSON DSG 8 250 210.0 185.0 35.0 Pack Materials-Page 3 IMPORTANT NOTICE Texas Instruments Incorporated and its subsidiaries (TI) reserve the right to make corrections, enhancements, improvements and other changes to its semiconductor products and services per JESD46, latest issue, and to discontinue any product or service per JESD48, latest issue. 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