ATMEL AT28C010E-12JC 1 megabit 128k x 8 paged cmos e2prom Datasheet

AT28C010 Mil
Features
•
•
•
•
•
•
•
•
•
•
Fast Read Access Time - 120 ns
Automatic Page Write Operation
Internal Address and Data Latches for 128-Bytes
Internal Control Timer
Fast Write Cycle Time
Page Write Cycle Time - 10 ms Maximum
1 to 128-Byte Page Write Operation
Low Power Dissipation
80 mA Active Current
300 µA CMOS Standby Current
Hardware and Software Data Protection
DATA Polling for End of Write Detection
High Reliability CMOS Technology
Endurance: 104 or 105 Cycles
Data Retention: 10 Years
Single 5V ± 10% Supply
CMOS and TTL Compatible Inputs and Outputs
JEDEC Approved Byte-Wide Pinout
1 Megabit
(128K x 8)
Paged
CMOS
E2PROM
Description
The AT28C010 is a high-performance Electrically Erasable and Programmable Read
Only Memory. Its one megabit of memory is organized as 131,072 words by 8 bits.
Manufactured with Atmel’s advanced nonvolatile CMOS technology, the device offers
(continued)
Pin Configurations
Pin Name
Function
A0 - A16
Addresses
CE
Chip Enable
OE
Output Enable
WE
Write Enable
I/O0 - I/O7
Data Inputs/Outputs
NC
No Connect
PGA
Top View
Military
44 LCC
Top View
AT28C010 Mil
CERDIP, FLATPACK
Top View
32 LCC
Top View
0353C
2-243
Description (Continued)
access times to 120 ns with power dissipation of just 440
mW. When the device is deselected, the CMOS standby
current is less than 300 µA.
control timer. The end of a write cycle can be detected by
DATA POLLING of I/O7. Once the end of a write cycle has
been detected a new access for a read or write can begin.
The AT28C010 is accessed like a Static RAM for the read
or write cycle without the need for external components.
The device contains a 128-byte page register to allow writing of up to 128-bytes simultaneously. During a write cycle, the address and 1 to 128-bytes of data are internally
latched, freeing the address and data bus for other operations. Following the initiation of a write cycle, the device
will automatically write the latched data using an internal
Atmel’s 28C010 has additional features to ensure high
quality and manufacturability. The device utilizes internal
error correction for extended endurance and improved
data retention characteristics. An optional software data
protection mechanism is available to guard against inadvertent writes. The device also includes an extra 128bytes of E2PROM for device identification or tracking.
Block Diagram
Absolute Maximum Ratings*
Temperature Under Bias................. -55°C to +125°C
Storage Temperature...................... -65°C to +150°C
All Input Voltages
(including NC Pins)
with Respect to Ground ................... -0.6V to +6.25V
All Output Voltages
with Respect to Ground .............-0.6V to VCC + 0.6V
Voltage on OE and A9
with Respect to Ground ................... -0.6V to +13.5V
2-244
AT28C010 Mil
*NOTICE: Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device.
This is a stress rating only and functional operation of the
device at these or any other conditions beyond those indicated in the operational sections of this specification is not
implied. Exposure to absolute maximum rating conditions
for extended periods may affect device reliability.
AT28C010 Mil
Device Operation
READ: The AT28C010 is accessed like a Static RAM.
When CE and OE are low and WE is high, the data stored
at the memory location determined by the address pins is
asserted on the outputs. The outputs are put in the high
impedance state when either CE or OE is high. This dualline control gives designers flexibility in preventing bus
contention in their system.
BYTE WRITE: A low pulse on the WE or CE input with CE
or WE low (respectively) and OE high initiates a write cycle. The address is latched on the falling edge of CE or
WE, whichever occurs last. The data is latched by the first
rising edge of CE or WE. Once a byte write has been
started it will automatically time itself to completion. Once
a programming operation has been initiated and for the
duration of tWC, a read operation will effectively be a polling operation.
PAGE WRITE: The page write operation of the AT28C010
allows 1 to 128-bytes of data to be written into the device
during a single internal programming period. A page write
operation is initiated in the same manner as a byte write;
the first byte written can then be followed by 1 to 127 additional bytes. Each successive byte must be written within
150 µs (tBLC) of the previous byte. If the tBLC limit is exceeded the AT28C010 will cease accepting data and commence the internal programming operation. All bytes during a page write operation must reside on the same page
as defined by the state of the A7 - A16 inputs. For each
WE high to low transition during the page write operation,
A7 - A16 must be the same.
The A0 to A6 inputs are used to specify which bytes within
the page are to be written. The bytes may be loaded in any
order and may be altered within the same load period.
Only bytes which are specified for writing will be written;
unnecessary cycling of other bytes within the page does
not occur.
DATA POLLING: The AT28C010 features DATA Polling
to indicate the end of a write cycle. During a byte or page
write cycle an attempted read of the last byte written will
result in the complement of the written data to be presented on I/O7. Once the write cycle has been completed,
true data is valid on all outputs, and the next write cycle
may begin. DATA Polling may begin at anytime during the
write cycle.
TOGGLE BIT: In addition to DATA Polling the AT28C010
provides another method for determining the end of a write
cycle. During the write operation, successive attempts to
read data from the device will result in I/O6 toggling between one and zero. Once the write has completed, I/O6
will stop toggling and valid data will be read. Reading the
toggle bit may begin at any time during the write cycle.
DATA PROTECTION: If precautions are not taken, inadvertent writes may occur during transitions of the host system power supply. Atmel has incorporated both hardware
and software features that will protect the memory against
inadvertent writes.
HARDWARE PROTECTION: Hardware features protect
against inadvertent writes to the AT28C010 in the following ways: (a) VCC sense - if VCC is below 3.8V (typical) the
write function is inhibited; (b) VCC power-on delay - once
VCC has reached 3.8V the device will automatically time
out 5 ms (typical) before allowing a write: (c) write inhibit holding any one of OE low, CE high or WE high inhibits
write cycles; (d) noise filter - pulses of less than 15 ns (typical) on the WE or CE inputs will not initiate a write cycle.
SOFTWARE DATA PROTECTION: A software controlled
data protection feature has been implemented on the
AT28C010. When enabled, the software data protection
(SDP), will prevent inadvertent writes. The SDP feature
may be enabled or disabled by the user; the AT28C010 is
shipped from Atmel with SDP disabled.
SDP is enabled by the host system issuing a series of
three write commands; three specific bytes of data are
written to three specific addresses (refer to Software Data
Protection Algorithm). After writing the 3-byte command
sequence and after tWC the entire AT28C010 will be protected against inadvertent write operations. It should be
noted, that once protected the host may still perform a
byte or page write to the AT28C010. This is done by preceding the data to be written by the same 3-byte command
sequence used to enable SDP.
Once set, SDP will remain active unless the disable command sequence is issued. Power transitions do not disable SDP and SDP will protect the AT28C010 during
power-up and power-down conditions. All command sequences must conform to the page write timing specifications. The data in the enable and disable command sequences is not written to the device and the memory addresses used in the sequence may be written with data in
either a byte or page write operation.
After setting SDP, any attempt to write to the device without the 3-byte command sequence will start the internal
write timers. No data will be written to the device; however,
for the duration of tWC, read operations will effectively be
polling operations.
(continued)
2-245
Device Operation (Continued)
DEVICE IDENTIFICATION: A n e x t r a 1 2 8 - b y t e s o f
E2PROM memory are available to the user for device
identification. By raising A9 to 12V ± 0.5V and using address locations 1FF80H to 1FFFFH the bytes may be written to or read from in the same manner as the regular
memory array.
OPTIONAL CHIP ERASE MODE: The entire device can
be erased using a 6-byte software code. Please see Software Chip Erase application note for details.
DC and AC Operating Range
Operating
Temperature (Case)
Mil.
AT28C010-12
AT28C010-15
AT28C010-20
AT28C010-25
-55°C - 125°C
-55°C - 125°C
-55°C - 125°C
-55°C - 125°C
5V ± 10%
5V ± 10%
5V ± 10%
5V ± 10%
VCC Power Supply
Operating Modes
Mode
CE
OE
WE
I/O
Read
VIL
VIL
VIH
DOUT
VIL
VIH
VIL
DIN
VIH
(1)
Write
(2)
Standby/Write Inhibit
X
X
Write Inhibit
X
X
VIH
Write Inhibit
X
VIL
X
Output Disable
X
VIH
X
High Z
High Z
Notes: 1. X can be VIL or VIH.
2. Refer to AC Programming Waveforms.
DC Characteristics
Symbol
Parameter
Condition
Min
Max
Units
ILI
Input Load Current
VIN = 0V to VCC + 1V
10
µA
ILO
Output Leakage Current
VI/O = 0V to VCC
10
µA
ISB1
VCC Standby Current CMOS
CE = VCC - 0.3V to VCC + 1V
300
µA
ISB2
VCC Standby Current TTL
CE = 2.0V to VCC + 1V
3
mA
ICC
VCC Active Current
f = 5 MHz; IOUT = 0 mA
80
mA
VIL
Input Low Voltage
0.8
V
VIH
Input High Voltage
VOL
Output Low Voltage
IOL = 2.1 mA
VOH1
Output High Voltage
IOH = -400 µA
2.4
V
VOH2
Output High Voltage CMOS
IOH = -100 µA; VCC = 4.5V
4.2
V
2-246
AT28C010 Mil
2.0
V
.45
V
AT28C010 Mil
AC Read Characteristics
AT28C010-12
Symbol
Parameter
tACC
Min
AT28C010-15
Max
Min
Max
AT28C010-20
Min
Max
AT28C010-25
Min
Max
Units
Address to Output Delay
120
150
200
250
ns
tCE
(1)
CE to Output Delay
120
150
200
250
ns
tOE
(2)
OE to Output Delay
0
50
0
55
0
55
0
55
ns
tDF (3, 4)
CE or OE to Output
Float
0
50
0
55
0
55
0
55
ns
tOH
Output Hold from OE,
CE or Address,
whichever occurred first
0
0
0
0
ns
AC Read Waveforms (1, 2, 3, 4)
Notes: 1. CE may be delayed up to tACC - tCE after the address
transition without impact on tACC.
2. OE may be delayed up to tCE - tOE after the falling
edge of CE without impact on tCE or by tACC - tOE
after an address change without impact on tACC .
3. tDF is specified from OE or CE whichever occurs first
(CL = 5 pF).
4. This parameter is characterized and is not 100% tested.
Input Test Waveforms and
Measurement Level
Output Test Load
tR, tF < 5 ns
Pin Capacitance (f = 1 MHz, T = 25°C) (1)
Typ
Max
Units
CIN
4
10
pF
VIN = 0V
COUT
8
12
pF
VOUT = 0V
Note:
Conditions
1. This parameter is characterized and is not 100% tested.
2-247
AC Write Characteristics
Symbol
Parameter
tAS, tOES
Address, OE Set-up Time
0
ns
tAH
Address Hold Time
50
ns
tCS
Chip Select Set-up Time
0
ns
tCH
Chip Select Hold Time
0
ns
tWP
Write Pulse Width (WE or CE)
100
ns
tDS
Data Set-up Time
50
ns
tDH, tOEH
Data, OE Hold Time
0
ns
AC Write Waveforms
WE Controlled
CE Controlled
2-248
AT28C010 Mil
Min
Max
Units
AT28C010 Mil
Page Mode Characteristics
Symbol
Parameter
Min
Max
Units
tWC
Write Cycle Time
10
ms
tAS
Address Set-up Time
0
ns
tAH
Address Hold Time
50
ns
tDS
Data Set-up Time
50
ns
tDH
Data Hold Time
0
ns
tWP
Write Pulse Width
100
ns
tBLC
Byte Load Cycle Time
tWPH
Write Pulse Width High
150
50
µs
ns
Page Mode Write Waveforms (1, 2)
Notes: 1. A7 through A16 must specify the page address during each high to low transition of WE (or CE).
2. OE must be high only when WE and CE are both low.
Chip Erase Waveforms
tS = 5 µsec (min.)
tW = tH = 10 msec (min.)
VH = 12.0V ± 0.5V
2-249
Software Data
Protection Enable Algorithm (1)
Software Data
Protection Disable Algorithm (1)
LOAD DATA AA
TO
ADDRESS 5555
LOAD DATA AA
TO
ADDRESS 5555
LOAD DATA 55
TO
ADDRESS 2AAA
LOAD DATA 55
TO
ADDRESS 2AAA
LOAD DATA A0
TO
ADDRESS 5555
LOAD DATA 80
TO
ADDRESS 5555
WRITES ENABLED
(2)
LOAD DATA AA
TO
ADDRESS 5555
LOAD DATA XX
TO
ANY ADDRESS (4)
LOAD LAST BYTE
TO
LAST ADDRESS
LOAD DATA 55
TO
ADDRESS 2AAA
ENTER DATA
PROTECT STATE
LOAD DATA 20
TO
ADDRESS 5555
Notes:
1. Data Format: I/O7 - I/O0 (Hex);
Address Format: A14 - A0 (Hex).
2. Write Protect state will be activated at end of write even if no
other data is loaded.
3. Write Protect state will be deactivated at end of write period
even if no other data is loaded.
4. 1 to 128-bytes of data are loaded.
LOAD DATA XX
TO
ANY ADDRESS (4)
EXIT DATA
PROTECT STATE
LOAD LAST BYTE
TO
LAST ADDRESS
Software Protected Program Cycle Waveform (1, 2, 3)
Notes: 1. A0 - A14 must conform to the addressing sequence for
the first 3-bytes as shown above.
2. After the command sequence has been issued and a
page write operation follows, the page address inputs
(A7 - A16) must be the same for each high to low
transition of WE (or CE).
2-250
AT28C010 Mil
3. OE must be high only when WE and CE are both low.
(3)
AT28C010 Mil
Data Polling Characteristics (1)
Symbol
Parameter
tDH
Data Hold Time
tOEH
OE Hold Time
Min
Typ
Max
10
ns
10
ns
(2)
tOE
OE to Output Delay
tWR
Write Recovery Time
Units
ns
0
Notes: 1. These parameters are characterized and not 100% tested.
ns
2. See AC Read Characteristics.
Data Polling Waveforms
Toggle Bit Characteristics (1)
Symbol
Parameter
tDH
Data Hold Time
tOEH
OE Hold Time
Min
Typ
Max
10
ns
10
ns
(2)
tOE
OE to Output Delay
tOEHP
OE High Pulse
tWR
Write Recovery Time
Units
ns
150
ns
0
ns
Notes: 1. These parameters are characterized and not 100% tested.
2. See AC Read Characteristics.
Toggle Bit Waveforms (1, 2, 3)
Notes: 1. Toggling either OE or CE or both OE and CE will
operate toggle bit.
2. Beginning and ending state of I/O6 will vary.
3. Any address location may be used but the address
should not vary.
2-251
Ordering Information (1)
tACC
ICC (mA)
Ordering Code
Package
0.3
AT28C010(E)-12DM/883
AT28C010(E)-12EM/883
AT28C010-12FM/883
AT28C010(E)-12LM/883
AT28C010(E)-12UM/883
32D6
32L
32F
44L
30U
Military/883C
Class B, Fully Compliant
(-55°C to 125°C)
80
0.3
AT28C010(E)-15DM/883
AT28C010(E)-15EM/883
AT28C010-15FM/883
AT28C010(E)-15LM/883
AT28C010(E)-15UM/883
32D6
32L
32F
44L
30U
Military/883C
Class B, Fully Compliant
(-55°C to 125°C)
200
80
0.3
AT28C010(E)-20DM/883
AT28C010(E)-20EM/883
AT28C010-20FM/883
AT28C010(E)-20LM/883
AT28C010(E)-20UM/883
32D6
32L
32F
44L
30U
Military/883C
Class B, Fully Compliant
(-55°C to 125°C)
250
80
0.3
AT28C010(E)-25DM/883
AT28C010(E)-25EM/883
AT28C010-25FM/883
AT28C010(E)-25LM/883
AT28C010(E)-25UM/883
32D6
32L
32F
44L
30U
Military/883C
Class B, Fully Compliant
(-55°C to 125°C)
120
80
0.3
5962-38267 07 MXX
5962-38267 07 MZX
5962-38267 07 MYX
5962-38267 07 MTX
32D6
32F
44L
30U
Military/883C
Class B, Fully Compliant
(-55°C to 125°C)
150
80
0.3
5962-38267 05 MXX
5962-38267 05 MUX
5962-38267 05 MZX
5962-38267 05 MYX
5962-38267 05 MTX
32D6
32L
32F
44L
30U
Military/883C
Class B, Fully Compliant
(-55°C to 125°C)
200
80
0.3
5962-38267 03 MXX
5962-38267 03 MUX
5962-38267 03 MZX
5962-38267 03 MYX
5962-38267 03 MTX
32D6
32L
32F
44L
30U
Military/883C
Class B, Fully Compliant
(-55°C to 125°C)
250
80
0.3
5962-38267 01 MXX
5962-38267 01 MUX
5962-38267 01 MZX
5962-38267 01 MYX
5962-38267 01 MTX
32D6
32L
32F
44L
30U
Military/883C
Class B, Fully Compliant
(-55°C to 125°C)
80
0.3
AT28C010-W
DIE
(ns)
Active
Standby
120
80
150
Note: 1. See Valid Part Number table on next page.
2-252
AT28C010 Mil
Operation Range
AT28C010 Mil
Valid Part Numbers
The following table lists standard Atmel products that can be ordered.
Device Numbers
Speed
Package and Temperature Combinations
AT28C010
12
DM/883, EM/883, FM/883, LM/883, UM/883
AT28C010E
12
DM/883, EM/883, LM/883, UM/883
AT28C010
15
DM/883, EM/883, FM/883, LM/883, UM/883
AT28C010E
15
DM/883, EM/883, LM/883, UM/883
AT28C010
20
DM/883, EM/883, FM/883, LM/883, UM/883
AT28C010E
20
DM/883, EM/883, LM/883, UM/883
AT28C010
25
DM/883, EM/883, FM/883, LM/883, UM/883
AT28C010E
25
DM/883, EM/883, LM/883, UM/883
Package Type
32D6
32 Lead, 0.600" Wide, Non-Windowed, Ceramic Dual Inline (CERDIP)
32F
32 Lead, Non-Windowed, Ceramic Bottom-Brazed Flat Package (Flatpack)
32L
32 Pad, Non-Windowed, Ceramic Leadless Chip Carrier (LCC)
44L
44 Pad, Non-Windowed, Ceramic Leadless Chip Carrier (LCC)
30U
30 Pin, Ceramic Pin Grid Array (PGA)
W
Die
Options
Blank
Standard Device: Endurance = 10K Write Cycles; Write Time = 10 ms
E
High Endurance Option: Endurance = 100K Write Cycles
2-253
Similar pages