IDT IDT74FCT543ALB Fast cmos octal latched transceiver Datasheet


IDT54/74FCT543
IDT54/74FCT543A
IDT54/74FCT543C
FAST CMOS
OCTAL LATCHED
TRANSCEIVER
Integrated Device Technology, Inc.
FEATURES:
DESCRIPTION:
•
•
•
•
The IDT54/74FCT543/A/C is a non-inverting octal transceiver built using an advanced dual metal CMOS technology.
These devices contain two sets of eight D-type latches with
separate input and output controls for each set. For data flow
from A to B, for example, the A-to-B Enable (CEAB) input must
be LOW in order to enter data from A0–A7 or to take data from
B0–B7, as indicated in the Function Table. With CEAB LOW,
a LOW signal on the A-to-B Latch Enable (LEAB) input makes
the A-to-B latches transparent; a subsequent LOW-to-HIGH
transition of the LEAB signal puts the A latches in the storage
mode and their outputs no longer change with the A inputs.
With CEAB and OEAB both LOW, the 3-state B output buffers
are active and reflect the data present at the output of the A
latches. Control of data from B to A is similar, but uses the
CEBA, LEBA and OEBA inputs.
•
•
•
•
•
•
•
•
•
IDT54/74FCT543 equivalent to FAST speed
IDT54/74FCT543A 25% faster than FAST
IDT54/74FCT543C 40% faster than FAST
Equivalent to FAST output drive over full temperature
and voltage supply extremes
IOL = 64mA (commercial), 48mA (military)
Separate controls for data flow in each direction
Back-to-back latches for storage
CMOS power levels (1mW typ. static)
Substantially lower input current levels than FAST
(5µA max.)
TTL input and output level compatible
CMOS output level compatible
Product available in Radiation Tolerant and Radiation
Enhanced versions
Military product compliant to MIL-STD-883, Class B
FUNCTIONAL BLOCK DIAGRAMS
DETAIL A
D
Q
B0
LE
Q
A0
D
LE
A1
A2
A3
A4
A5
A6
A7
DETAIL A x 7
B1
B2
B3
B4
B5
B6
B7
OEBA
OEAB
CEBA
LEBA
CEAB
LEAB
2614 drw 01
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
FAST is a registered trademark of National Semiconductor Co.
MILITARY AND COMMERCIAL TEMPERATURE RANGES
1992 Integrated Device Technology, Inc.
7.17
MAY 1992
DSC-4602/3
1
IDT54/74FCT543/A/C
FAST CMOS OCTAL LATCHED TRANSCEIVER
MILITARY AND COMMERCIAL TEMPERATURE RANGES
IDT54/74FCT861 10-BIT TRANSCEIVERS
1
24
2
23
3
22
4
5
6
7
P24-1,
D24-1,
SO24-2
&
E24-1
21
20
19
18
8
17
9
16
10
15
11
14
12
13
INDEX
Vcc
CEBA
B0
B1
B2
B3
B4
B5
B6
B7
LEAB
OEAB
4
A1
A2
A3
NC
A4
A5
A6
3
25
6
24
7
23
L28-1
8
22
9
21
10
20
11
19
12 13 14 15 16 17 18
B1
B2
B3
NC
B4
B5
B6
2614 drw 02
LCC
TOP VIEW
FUNCTION TABLE (1,2)
PIN DESCRIPTION
OEAB
OEBA
CEAB
CEBA
LEAB
LEBA
28 27 26
1
DIP/SOIC/CERPACK
TOP VIEW
Pin Names
2
5
A7
CEAB
GND
NC
OEAB
LEAB
B7
LEBA
OEBA
A0
A1
A2
A3
A4
A5
A6
A7
CEAB
GND
A0
OEBA
LEBA
NC
Vcc
CEBA
B0
PIN CONFIGURATIONS
For A-to-B (Symmetric with B-to-A)
Description
Latch
Status
A-to-B Output Enable Input (Active LOW)
Inputs
B-to-A Output Enable Input (Active LOW)
A-to-B Enable Input (Active LOW)
B-to-A Enable Input (Active LOW)
A-to-B Latch Enable Input (Active LOW)
B-to-A Latch Enable Input (Active LOW)
A0–A7
A-to-B Data Inputs or B-to-A 3-State Outputs
B0–B7
B-to-A Data Inputs or A-to-B 3-State Outputs
2614 tbl 02
LOGIC SYMBOL
Output
Buffers
CEAB
LEAB
OEAB
H
—
—
Storing
—
H
—
Storing
—
—
H
—
L
L
L
Transparent
Current A Inputs
L
H
L
Storing
Previous* A Inputs
A-to-B
B0–B7
High Z
—
High Z
NOTES:
2614 tbl 01
1. * Before LEAB LOW-to-HIGH Transition
H = HIGH Voltage Level
L = LOW Voltage Level
— = Don’t Care or Irrelevant
2. A-to-B data flow shown; B-to-A flow control is the same, except using
CEBA, LEBA and OEBA.
LEAB CEAB CEBA LEBA
A0
B0
A1
A2
B1
B2
A3
B3
A4
B4
A5
B5
A6
B6
A7
OEBA
B7
OEAB
2614 drw 03
7.17
2
IDT54/74FCT543/A/C
FAST CMOS OCTAL LATCHED TRANSCEIVER
MILITARY AND COMMERCIAL TEMPERATURE RANGES
ABSOLUTE MAXIMUM RATINGS(1)
CAPACITANCE (TA = +25°C, f = 1.0MHz)
Symbol
Rating
VTERM(2) Terminal Voltage
with Respect
to GND
VTERM(3) Terminal Voltage
with Respect
to GND
TA
Operating
Temperature
TBIAS
Temperature
Under Bias
TSTG
Storage
Temperature
PT
Power Dissipation
IOUT
DC Output Current
Symbol
Commercial
Military
Unit
–0.5 to +7.0 –0.5 to +7.0
V
–0.5 to VCC
–0.5 to VCC
V
0 to +70
–55 to +125
°C
–55 to +125
–65 to +135
°C
–55 to +125
–65 to +150
°C
0.5
120
0.5
120
W
mA
Parameter(1)
Conditions Typ.
Max.
Unit
CIN
Input Capacitance
VIN = 0V
6
10
pF
CI/O
I/O Capacitance
VOUT = 0V
8
12
pF
NOTE:
2614 tbl 04
1. This parameter is guaranteed by characterization data and not tested.
NOTES:
2614 tbl 03
1. Stresses greater than those listed under ABSOLUTE MAXIMUM
RATINGS may cause permanent damage to the device. This is a stress
rating only and functional operation of the device at these or any other
conditions above those indicated in the operational sections of this
specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect reliability. No terminal voltage
may exceed VCC by +0.5V unless otherwise noted.
2. Inputs and VCC terminals only.
3. Outputs and I/O terminals only.
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified: VLC = 0.2V, VHC = VCC – 0.2V
Commercial: TA = 0°C to +70°C, VCC = 5.0V ± 5%; Military: TA = –55°C to +125°C, VCC = 5.0V ± 10%
Symbol
Test Conditions(1)
Min.
Typ.(2)
Max.
Unit
VIH
Input HIGH Level
Guaranteed Logic HIGH Level
2.0
—
—
V
VIL
Input LOW Level
Guaranteed Logic LOW Level
—
—
0.8
V
Input HIGH Current
VCC = Max.
µA
IIH
IIL
IIH
IIL
Parameter
VI = VCC
—
—
5
(Except I/O pins)
VI = 2.7V
—
—
5(4)
Input LOW Current
VI = 0.5V
—
—
–5(4)
(Except I/O pins)
VI = GND
—
—
–5
VI = VCC
—
—
15
(I/O pins Only)
VI = 2.7V
—
—
15(4)
Input LOW Current
VI = 0.5V
—
—
–15(4)
(I/O pins Only)
VI = GND
—
—
–15
Input HIGH Current
VCC = Max.
VIK
Clamp Diode Voltage
VCC = Min., IN = –18mA
IOS
Short Circuit Current
VCC = Max.(3), VO = GND
VOH
Output HIGH Voltage
VCC = 3V, VIN = VLC or VHC, IOH = –32µA
VOL
Output LOW Voltage
–0.7
–1.2
V
–120
—
mA
V
VCC
—
VCC
—
IOH = –12mA MIL.
2.4
4.3
—
IOH = –15mA COM’L.
VIN = VIH or VIL
µA
—
VHC
IOH = –300µA
µA
–60
VHC(4)
VCC = Min.
µA
2.4
4.3
—
VCC = 3V, VIN = VLC or VHC, IOL = 300µA
—
GND
VLC
VCC = Min.
IOL = 300µA
—
GND
VLC(4)
VIN = VIH or VIL
IOL = 48mA MIL.(5)
—
0.3
0.55
IOL = 64mA COM’L.(5)
—
0.3
0.55
V
NOTES:
2614 tbl 05
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at VCC = 5.0V, +25°C ambient and maximum loading.
3. Not more than one output should be shorted at one time. Duration of the short circuit test should not exceed one second.
4. This parameter is guaranteed but not tested.
5. These are maximum IOL values per output, for 8 outputs turned on simultaneously. Total maximum IOL (all outputs) is 512mA for commercial and 384mA
for military. Derate IOL for number of outputs exceeding 8 turned on simultaneously.
7.17
3
IDT54/74FCT543/A/C
FAST CMOS OCTAL LATCHED TRANSCEIVER
MILITARY AND COMMERCIAL TEMPERATURE RANGES
POWER SUPPLY CHARACTERISTICS VLC = 0.2V; VHC = VCC – 0.2V
Symbol
Parameter
Test Conditions(1)
Min.
Typ.(2)
Max.
Unit
ICC
Quiescent Power
Supply Current
VCC = Max.
VIN ≥ VHC; VIN ≤ VLC
—
0.2
1.5
mA
∆ICC
Quiescent Power Supply
Current TTL Inputs HIGH
VCC = Max., VIN = 3.4V(3)
—
0.5
2.0
mA
ICCD
Dynamic Power Supply Current(4)
VIN ≥ VHC
VIN ≤ VLC
—
0.15
0.25
mA/
MHz
VCC = Max., Outputs Open
fCP = 10MHz (LEAB)
50% Duty Cycle
CEAB and OEAB = GND
CEBA = VCC
One Bit Toggling
at fi = 5MHz
50% Duty Cycle
VIN ≥ VHC
VIN ≤ VLC
(FCT)
—
1.7
4.0
mA
VIN = 3.4V
VIN = GND
—
2.2
6.0
VCC = Max., Outputs Open
fCP = 10MHz (LEAB)
50% Duty Cycle
CEAB and OEAB = GND
CEBA = VCC
Eight Bits Toggling
at fi = 5MHz
50% Duty Cycle
VIN ≥ VHC
VIN ≤ VLC
(FCT)
—
7.0
12.8(5)
VIN = 3.4V
VIN = GND
—
9.2
21.8(5)
VCC = Max., Outputs Open
CEAB and OEAB = GND
CEBA = VCC
One Input Toggling
50% Duty Cycle
IC
Total Power Supply Current(6)
NOTES:
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at VCC = 5.0V, +25°C ambient.
3. Per TTL driven input (VIN = 3.4V); all other inputs at VCC or GND.
4. This parameter is not directly testable, but is derived for use in Total Power Supply calculations.
5. Values for these conditions are examples of the ICC formula. These limits are guaranteed but not tested.
6. IC = IQUIESCENT +IINPUTS + IDYNAMIC
IC = ICC + ∆ICC DHNT + ICCD(fCP/2 + fiNi)
ICC = Quiescent Current
∆ICC = Power Supply Current for a TTL High Input (VIN = 3.4V)
DH = Duty Cycle for TTL Inputs High
NT = Number of TTL Inputs at DH
ICCD = Dynamic Current Caused by an Input Transition Pair (HLH or LHL)
fCP = Clock Frequency for Register Devices (Zero for Non-Register Devices)
fi = Input Frequency
Ni = Number of Inputs at fi
All currents are in milliamps and all frequencies are in megahertz.
7.17
2614 tbl 06
4
IDT54/74FCT543/A/C
FAST CMOS OCTAL LATCHED TRANSCEIVER
MILITARY AND COMMERCIAL TEMPERATURE RANGES
SWITCHING CHARACTERISTICS OVER OPERATING RANGE
IDT54/74FCT543
Com’l.
Symbol
tPLH
tPHL
tPLH
tPHL
Parameter
Propagation Delay
Transparent Mode
An to Bn or Bn to An
Propagation Delay
LEBA to An, LEAB to Bn
(1)
Condition
CL = 50pF
RL = 500Ω
(2)
Min.
Mil.
(2)
Max. Min.
IDT54/74FCT543A
Com’l.
(2)
Max. Min.
Mil.
(2)
Max. Min.
IDT54/74FCT543C
Com’l.
(2)
Max. Min.
Mil.
(2)
Max. Min.
Max. Unit
2.5
8.5
2.5
10.0 2.5
6.5
2.5
7.5
2.5
5.3
2.5
6.1
ns
2.5
12.5 2.5
14.0 2.5
8.0
2.5
9.0
2.5
7.0
2.5
8.0
ns
tPZH
tPZL
Output Enable Time
OEBA or OEAB to An or Bn
CEBA or CEAB to An or Bn
2.0
12.0 2.0
14.0 2.0
9.0
2.0
10.0
2.0
8.0
2.0
9.0
ns
tPHZ
tPLZ
Output Disable Time
OEBA or OEAB to An or Bn
CEBA or CEAB to An or Bn
2.0
9.0
2.0
13.0 2.0
7.5
2.0
8.5
2.0
6.5
2.0
7.5
ns
tSU
Set-up Time, HIGH or LOW
An or Bn to LEBA or LEAB
3.0
—
3.0
—
2.0
—
2.0
—
2.0
—
2.0
—
ns
tH
Hold Time, HIGH or LOW
An or Bn to LEBA or LEAB
2.0
—
2.0
—
2.0
—
2.0
—
2.0
—
2.0
—
ns
5.0
—
5.0
—
5.0
—
5.0
—
5.0
—
5.0
—
ns
tW
LEBA or LEAB
Pulse Width
LOW
NOTES:
1. See test circuits and waveforms.
2. Minimum limits are guaranteed but not tested on Propagation Delays.
2513 tbl 07
7.17
5
IDT54/74FCT543/A/C
FAST CMOS OCTAL LATCHED TRANSCEIVER
MILITARY AND COMMERCIAL TEMPERATURE RANGES
TEST CIRCUITS AND WAVEFORMS
SWITCH POSITION
TEST CIRCUITS FOR ALL OUTPUTS
VCC
7.0V
500Ω
V OUT
VIN
Pulse
Generator
D.U.T.
50pF
RT
500Ω
SET-UP, HOLD AND RELEASE TIMES
Closed
All Other Tests
Open
3V
1.5V
0V
tH
TIMING
INPUT
3V
1.5V
0V
LOW-HIGH-LOW
PULSE
3V
1.5V
0V
HIGH-LOW-HIGH
PULSE
1.5V
tW
t REM
PRESET
CLEAR
ETC.
SYNCHRONOUS CONTROL
PRESET
CLEAR
CLOCK ENABLE
ETC.
Open Drain
Disable Low
Enable Low
PULSE WIDTH
DATA
INPUT
ASYNCHRONOUS CONTROL
Switch
DEFINITIONS:
2614 tbl 08
CL = Load capacitance: includes jig and probe capacitance.
RT = Termination resistance: should be equal to ZOUT of the Pulse
Generator.
CL
t SU
Test
t SU
1.5V
3V
1.5V
0V
tH
PROPAGATION DELAY
ENABLE AND DISABLE TIMES
ENABLE
DISABLE
3V
3V
1.5V
SAME PHASE
INPUT TRANSITION
t PLH
t PHL
CONTROL
INPUT
t PZL
0V
OUTPUT
NORMALLY SWITCH
LOW CLOSED
t PZH
VOH
1.5V
OUTPUT
VOL
t PLH
t PHL
OUTPUT SWITCH
NORMALLY OPEN
HIGH
3V
OPPOSITE PHASE
INPUT TRANSITION
1.5V
1.5V
0V
t PLZ
3.5V
3.5V
1.5V
0.3V
V OL
t PHZ
0.3V
1.5V
0V
V OH
0V
0V
NOTES
2614 drw 05
1. Diagram shown for input Control Enable-LOW and input Control
Disable-HIGH.
2. Pulse Generator for All Pulses: Rate ≤ 1.0 MHz; ZO ≤ 50Ω; tF ≤ 2.5ns;
tR ≤ 2.5ns.
7.17
6
IDT54/74FCT543/A/C
FAST CMOS OCTAL LATCHED TRANSCEIVER
MILITARY AND COMMERCIAL TEMPERATURE RANGES
ORDERING INFORMATION
IDT
XX
FCT XXXX
Temperature
Range
Device
Type
X
X
Package
Process
Blank
B
Commercial
MIL-STD-883, Class B
P
D
L
SO
E
Plastic DIP
CERDIP
Leadless Chip Carrier
Small Outline IC
CERPACK
543
543A
543C
Octal Registered Transceiver
Fast Octal Registered Transceiver
Super Fast Octal Registered Transceiver
54
74
7.17
-55°C to +125°C
0° to +70°C
2614 drw 04
7
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