PHILIPS BLF8G20LS-220 Power ldmos transistor Datasheet

BLF8G20LS-220
Power LDMOS transistor
Rev. 2 — 30 May 2013
Product data sheet
1. Product profile
1.1 General description
220 W LDMOS power transistor for base station applications at frequencies from
1800 MHz to 2000 MHz.
Table 1.
Typical performance
Typical RF performance at Tcase = 25 C in a common source class-AB production test circuit.
Test signal
f
(MHz)
(mA)
(V)
(W)
2-carrier W-CDMA
1805 to 1880
1600
28
55
[1]
IDq
VDS
PL(AV)
D
ACPR
(dB)
(%)
(dBc)
18.9
34
31 [1]
Gp
Test signal: 3GPP test model 1; 64 DPCH; PAR = 8.4 dB at 0.01 % probability on CCDF;
carrier spacing 5 MHz.
1.2 Features and benefits









Excellent ruggedness
High efficiency
Low Rth providing excellent thermal stability
Designed for broadband operation
Lower output capacitance for improved performance in Doherty applications
Designed for low memory effects providing excellent pre-distortability
Internally matched for ease of use
Integrated ESD protection
Compliant to Directive 2002/95/EC, regarding Restriction of Hazardous Substances
(RoHS)
1.3 Applications
 RF power amplifiers for W-CDMA base stations and multi carrier applications in the
1800 MHz to 2000 MHz frequency range
BLF8G20LS-220
NXP Semiconductors
Power LDMOS transistor
2. Pinning information
Table 2.
Pinning
Pin
Description
1
drain
2
gate
3
source
Simplified outline
Graphic symbol
1
1
3
[1]
2
2
3
sym112
[1]
Connected to flange.
3. Ordering information
Table 3.
Ordering information
Type number
Package
Name Description
Version
BLF8G20LS-220
-
SOT502B
earless flanged ceramic package; 2 leads
4. Limiting values
Table 4.
Limiting values
In accordance with the Absolute Maximum Rating System (IEC 60134).
Symbol
Parameter
VDS
drain-source voltage
-
65
V
VGS
gate-source voltage
0.5
+13
V
Tstg
storage temperature
65
+150
C
Min
-
225
C
[1]
junction temperature
Tj
[1]
Conditions
Max
Unit
Continuous use at maximum temperature will affect the reliability.
5. Thermal characteristics
Table 5.
BLF8G20LS-220
Product data sheet
Thermal characteristics
Symbol
Parameter
Conditions
Typ
Unit
Rth(j-c)
thermal resistance from junction to case
Tcase = 80 C; PL = 55 W;
VDS = 28 V; IDq = 1600 mA
0.27
K/W
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Power LDMOS transistor
6. Characteristics
Table 6.
DC characteristics
Tj = 25 C, unless otherwise specified.
Symbol Parameter
Conditions
V(BR)DSS drain-source breakdown voltage VGS = 0 V; ID = 2.7 mA
Min
Typ
Max
Unit
65
-
-
V
VGS(th)
gate-source threshold voltage
VDS = 10 V; ID = 270 mA
1.5
1.9
2.3
V
VGSq
gate-source quiescent voltage
VDS = 28 V; ID = 1.6 A
1.7
2.1
2.5
V
IDSS
drain leakage current
VGS = 0 V; VDS = 28 V
-
-
4.2
A
IDSX
drain cut-off current
VGS = VGS(th) + 3.75 V;
VDS = 10 V
-
50.6
-
A
IGSS
gate leakage current
VGS = 11 V; VDS = 0 V
-
-
420
nA
gfs
forward transconductance
VDS = 10 V; ID = 13.5 A
-
19.6
-
S
RDS(on)
drain-source on-state resistance VGS = VGS(th) + 3.75 V;
ID = 9.45 A
-
0.057 -

Table 7.
RF characteristics
Test signal: 2-carrier W-CDMA; PAR = 8.4 dB at 0.01 % probability on CCDF; 3GPP test model 1;
64 DPCH; f1 = 1807.5 MHz; f2 = 1812.5 MHz; f3 = 1872.5 MHz; f4 = 1877.5 MHz; RF performance
at VDS = 28 V; IDq = 1600 mA; Tcase = 25 C; unless otherwise specified; in a production circuit.
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
Gp
power gain
PL(AV) = 55 W
17.8
18.9
-
dB
D
drain efficiency
PL(AV) = 55 W
29
34
-
%
RLin
input return loss
PL(AV) = 55 W
-
15.5 7
dB
ACPR
adjacent channel power ratio
PL(AV) = 55 W
-
31
dBc
26
7. Test information
7.1 Ruggedness in class-AB operation
The BLF8G20LS-220 is capable of withstanding a load mismatch corresponding to
VSWR = 10 : 1 through all phases under the following conditions: VDS = 28 V;
IDq = 1600 mA; PL = 200 W (CW); f = 1805 MHz.
7.2 Impedance information
Table 8.
Typical impedance
Measured load-pull data; IDq = 1600 mA; VDS = 28 V.
f
ZS[1]
ZL[1]
(MHz)
()
()
1805
1.38  j3.45
0.90  j2.50
1843
1.43  j3.63
0.82  j2.37
1880
1.38  j3.56
0.90  j2.60
[1]
BLF8G20LS-220
Product data sheet
ZS and ZL defined in Figure 1.
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Rev. 2 — 30 May 2013
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BLF8G20LS-220
NXP Semiconductors
Power LDMOS transistor
drain
ZL
gate
ZS
001aaf059
Fig 1.
Definition of transistor impedance
7.3 Test circuit
PP
PP
&
&
&
&
&
&
&
5
&
&
PP
%/)*/6B,13873&%
&
&
%/)*/6B2873873&%
&
&
&
&
&
DDD
See Table 9 for list of components.
Fig 2.
Component layout
Table 9.
List of components
See Figure 2 for component layout.
The used PCB material is Rogers RO4350B with a thickness of 0.76 mm.
Component
BLF8G20LS-220
Product data sheet
Description
Value
Remarks
C1, C2, C3, C4, C5,
C6
multilayer ceramic chip capacitor
33 pF
[1]
C7, C8, C9, C10
multilayer ceramic chip capacitor
1 F
[2]
TDK
C11, C12, C13, C14
multilayer ceramic chip capacitor
10 F
[3]
Murata
C15, C16
multilayer ceramic chip capacitor
470 F, 63 V
R1
chip resistor
9.1 
[1]
American Technical Ceramics type 100B or capacitor of same quality.
[2]
TDK or capacitor of same quality.
[3]
Murata or capacitor of same quality.
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Rev. 2 — 30 May 2013
ATC100B
SMD 0805
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Power LDMOS transistor
7.4 Graphical data
7.4.1 CW pulse
DDD
5/LQ
G%
*S
DDD
Ș'
*S
G%
Ș'
3/ :
VDS = 28 V; IDq = 1600 mA; tp = 100 s;  = 10 %.
(1) f = 1805 MHz
(2) f = 1843 MHz
(2) f = 1843 MHz
(3) f = 1880 MHz
(3) f = 1880 MHz
Power gain and drain efficiency as function of
output power; typical values
BLF8G20LS-220
Product data sheet
3/ :
VDS = 28 V; IDq = 1600 mA; tp = 100 s;  = 10 %.
(1) f = 1805 MHz
Fig 3.
Fig 4.
Input return loss as a function of
output power; typical values
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Power LDMOS transistor
7.4.2 1-Carrier W-CDMA
DDD
*S
G%
Ș'
*S
DDD
$&350
G%F
Ș'
3/ :
VDS = 28 V; IDq = 1600 mA.
3/ :
VDS = 28 V; IDq = 1600 mA.
(1) f = 1805 MHz
(1) f = 1805 MHz
(2) f = 1843 MHz
(2) f = 1843 MHz
(3) f = 1880 MHz
(3) f = 1880 MHz
Fig 5.
Power gain and drain efficiency as function of
output power; typical values
Fig 6.
Adjacent channel power ratio (5 MHz) as a
function of output power; typical values
DDD
5/LQ
G%
3/ G%P
VDS = 28 V; IDq = 1600 mA.
(1) f = 1805 MHz
(2) f = 1843 MHz
(3) f = 1880 MHz
Fig 7.
Input return loss as a function of output power; typical values
BLF8G20LS-220
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 30 May 2013
© NXP B.V. 2013. All rights reserved.
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BLF8G20LS-220
NXP Semiconductors
Power LDMOS transistor
7.4.3 2-Carrier W-CDMA
DDD
*S
G%
Ș'
*S
DDD
$&350
G%F
Ș'
3/ :
VDS = 28 V; IDq = 1600 mA; f = 5 MHz;  = 46 %.
3/ :
VDS = 28 V; IDq = 1600 mA; f = 5 MHz;  = 46 %.
(1) f = 1810 MHz
(1) f = 1810 MHz
(2) f = 1843 MHz
(2) f = 1843 MHz
(3) f = 1877.5 MHz
(3) f = 1877.5 MHz
Fig 8.
Power gain and drain efficiency as function of
output power; typical values
Fig 9.
Adjacent channel power ratio (5 MHz) as a
function of output power; typical values
DDD
5/LQ
G%
3/ G%P
VDS = 28 V; IDq = 1600 mA; f = 5 MHz;  = 46 %.
(1) f = 1810 MHz
(2) f = 1843 MHz
(3) f = 1877.5 MHz
Fig 10. Input return loss as a function of output power; typical values
BLF8G20LS-220
Product data sheet
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Rev. 2 — 30 May 2013
© NXP B.V. 2013. All rights reserved.
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NXP Semiconductors
Power LDMOS transistor
8. Package outline
Earless flanged ceramic package; 2 leads
SOT502B
D
A
F
3
D
D1
c
U1
1
L
H
E1
U2
E
2
w2 M D M
b
0
5
Q
10 mm
scale
DIMENSIONS (millimetre dimensions are derived from the original inch dimensions)
UNIT
A
b
c
mm
4.72
3.43
12.83
12.57
0.15
0.08
inches
0.186
0.135
0.505 0.006
0.495 0.003
OUTLINE
VERSION
E
E1
F
H
L
Q
U1
U2
w2
20.02 19.96
19.61 19.66
9.50
9.30
9.53
9.25
1.14
0.89
19.94
18.92
5.33
4.32
1.70
1.45
20.70
20.45
9.91
9.65
0.25
0.788 0.786
0.772 0.774
0.374 0.375
0.366 0.364
0.045 0.785
0.035 0.745
0.210
0.170
0.067 0.815
0.057 0.805
D
D1
REFERENCES
IEC
JEDEC
JEITA
0.390
0.010
0.380
EUROPEAN
PROJECTION
ISSUE DATE
07-05-09
12-05-02
SOT502B
Fig 11. Package outline SOT502B
BLF8G20LS-220
Product data sheet
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Rev. 2 — 30 May 2013
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BLF8G20LS-220
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Power LDMOS transistor
9. Handling information
CAUTION
This device is sensitive to ElectroStatic Discharge (ESD). Observe precautions for handling
electrostatic sensitive devices.
Such precautions are described in the ANSI/ESD S20.20, IEC/ST 61340-5, JESD625-A or
equivalent standards.
10. Abbreviations
Table 10.
Abbreviations
Acronym
Description
3GPP
3rd Generation Partnership Project
CCDF
Complementary Cumulative Distribution Function
CW
Continuous Wave
DPCH
Dedicated Physical CHannel
ESD
ElectroStatic Discharge
LDMOS
Laterally Diffused Metal Oxide Semiconductor
PAR
Peak-to-Average Ratio
SMD
Surface Mounted Device
VSWR
Voltage Standing Wave Ratio
W-CDMA
Wideband Code Division Multiple Access
11. Revision history
Table 11.
Revision history
Document ID
Release date
Data sheet status
Change notice
Supersedes
BLF8G20LS-220 v.2
20130530
Product data sheet
-
BLF8G20LS-220 v.1
Modifications:
BLF8G20LS-220 v.1
BLF8G20LS-220
Product data sheet
•
•
Table 1 on page 1: table has been updated
Table 7 on page 3: table has been updated
20130307
Objective data sheet
-
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Rev. 2 — 30 May 2013
-
© NXP B.V. 2013. All rights reserved.
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12. Legal information
12.1 Data sheet status
Document status[1][2]
Product status[3]
Definition
Objective [short] data sheet
Development
This document contains data from the objective specification for product development.
Preliminary [short] data sheet
Qualification
This document contains data from the preliminary specification.
Product [short] data sheet
Production
This document contains the product specification.
[1]
Please consult the most recently issued document before initiating or completing a design.
[2]
The term ‘short data sheet’ is explained in section “Definitions”.
[3]
The product status of device(s) described in this document may have changed since this document was published and may differ in case of multiple devices. The latest product status
information is available on the Internet at URL http://www.nxp.com.
12.2 Definitions
Draft — The document is a draft version only. The content is still under
internal review and subject to formal approval, which may result in
modifications or additions. NXP Semiconductors does not give any
representations or warranties as to the accuracy or completeness of
information included herein and shall have no liability for the consequences of
use of such information.
Short data sheet — A short data sheet is an extract from a full data sheet
with the same product type number(s) and title. A short data sheet is intended
for quick reference only and should not be relied upon to contain detailed and
full information. For detailed and full information see the relevant full data
sheet, which is available on request via the local NXP Semiconductors sales
office. In case of any inconsistency or conflict with the short data sheet, the
full data sheet shall prevail.
Product specification — The information and data provided in a Product
data sheet shall define the specification of the product as agreed between
NXP Semiconductors and its customer, unless NXP Semiconductors and
customer have explicitly agreed otherwise in writing. In no event however,
shall an agreement be valid in which the NXP Semiconductors product is
deemed to offer functions and qualities beyond those described in the
Product data sheet.
12.3 Disclaimers
Limited warranty and liability — Information in this document is believed to
be accurate and reliable. However, NXP Semiconductors does not give any
representations or warranties, expressed or implied, as to the accuracy or
completeness of such information and shall have no liability for the
consequences of use of such information. NXP Semiconductors takes no
responsibility for the content in this document if provided by an information
source outside of NXP Semiconductors.
In no event shall NXP Semiconductors be liable for any indirect, incidental,
punitive, special or consequential damages (including - without limitation - lost
profits, lost savings, business interruption, costs related to the removal or
replacement of any products or rework charges) whether or not such
damages are based on tort (including negligence), warranty, breach of
contract or any other legal theory.
Notwithstanding any damages that customer might incur for any reason
whatsoever, NXP Semiconductors’ aggregate and cumulative liability towards
customer for the products described herein shall be limited in accordance
with the Terms and conditions of commercial sale of NXP Semiconductors.
Right to make changes — NXP Semiconductors reserves the right to make
changes to information published in this document, including without
limitation specifications and product descriptions, at any time and without
notice. This document supersedes and replaces all information supplied prior
to the publication hereof.
BLF8G20LS-220
Product data sheet
Suitability for use — NXP Semiconductors products are not designed,
authorized or warranted to be suitable for use in life support, life-critical or
safety-critical systems or equipment, nor in applications where failure or
malfunction of an NXP Semiconductors product can reasonably be expected
to result in personal injury, death or severe property or environmental
damage. NXP Semiconductors and its suppliers accept no liability for
inclusion and/or use of NXP Semiconductors products in such equipment or
applications and therefore such inclusion and/or use is at the customer’s own
risk.
Applications — Applications that are described herein for any of these
products are for illustrative purposes only. NXP Semiconductors makes no
representation or warranty that such applications will be suitable for the
specified use without further testing or modification.
Customers are responsible for the design and operation of their applications
and products using NXP Semiconductors products, and NXP Semiconductors
accepts no liability for any assistance with applications or customer product
design. It is customer’s sole responsibility to determine whether the NXP
Semiconductors product is suitable and fit for the customer’s applications and
products planned, as well as for the planned application and use of
customer’s third party customer(s). Customers should provide appropriate
design and operating safeguards to minimize the risks associated with their
applications and products.
NXP Semiconductors does not accept any liability related to any default,
damage, costs or problem which is based on any weakness or default in the
customer’s applications or products, or the application or use by customer’s
third party customer(s). Customer is responsible for doing all necessary
testing for the customer’s applications and products using NXP
Semiconductors products in order to avoid a default of the applications and
the products or of the application or use by customer’s third party
customer(s). NXP does not accept any liability in this respect.
Limiting values — Stress above one or more limiting values (as defined in
the Absolute Maximum Ratings System of IEC 60134) will cause permanent
damage to the device. Limiting values are stress ratings only and (proper)
operation of the device at these or any other conditions above those given in
the Recommended operating conditions section (if present) or the
Characteristics sections of this document is not warranted. Constant or
repeated exposure to limiting values will permanently and irreversibly affect
the quality and reliability of the device.
Terms and conditions of commercial sale — NXP Semiconductors
products are sold subject to the general terms and conditions of commercial
sale, as published at http://www.nxp.com/profile/terms, unless otherwise
agreed in a valid written individual agreement. In case an individual
agreement is concluded only the terms and conditions of the respective
agreement shall apply. NXP Semiconductors hereby expressly objects to
applying the customer’s general terms and conditions with regard to the
purchase of NXP Semiconductors products by customer.
No offer to sell or license — Nothing in this document may be interpreted or
construed as an offer to sell products that is open for acceptance or the grant,
conveyance or implication of any license under any copyrights, patents or
other industrial or intellectual property rights.
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may be subject to export control regulations. Export might require a prior
authorization from competent authorities.
Non-automotive qualified products — Unless this data sheet expressly
states that this specific NXP Semiconductors product is automotive qualified,
the product is not suitable for automotive use. It is neither qualified nor tested
in accordance with automotive testing or application requirements. NXP
Semiconductors accepts no liability for inclusion and/or use of
non-automotive qualified products in automotive equipment or applications.
In the event that customer uses the product for design-in and use in
automotive applications to automotive specifications and standards, customer
(a) shall use the product without NXP Semiconductors’ warranty of the
product for such automotive applications, use and specifications, and (b)
whenever customer uses the product for automotive applications beyond
NXP Semiconductors’ specifications such use shall be solely at customer’s
own risk, and (c) customer fully indemnifies NXP Semiconductors for any
liability, damages or failed product claims resulting from customer design and
use of the product for automotive applications beyond NXP Semiconductors’
standard warranty and NXP Semiconductors’ product specifications.
Translations — A non-English (translated) version of a document is for
reference only. The English version shall prevail in case of any discrepancy
between the translated and English versions.
12.4 Trademarks
Notice: All referenced brands, product names, service names and trademarks
are the property of their respective owners.
13. Contact information
For more information, please visit: http://www.nxp.com
For sales office addresses, please send an email to: [email protected]
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Product data sheet
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14. Contents
1
1.1
1.2
1.3
2
3
4
5
6
7
7.1
7.2
7.3
7.4
7.4.1
7.4.2
7.4.3
8
9
10
11
12
12.1
12.2
12.3
12.4
13
14
Product profile . . . . . . . . . . . . . . . . . . . . . . . . . . 1
General description . . . . . . . . . . . . . . . . . . . . . 1
Features and benefits . . . . . . . . . . . . . . . . . . . . 1
Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . 1
Pinning information . . . . . . . . . . . . . . . . . . . . . . 2
Ordering information . . . . . . . . . . . . . . . . . . . . . 2
Limiting values. . . . . . . . . . . . . . . . . . . . . . . . . . 2
Thermal characteristics . . . . . . . . . . . . . . . . . . 2
Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . 3
Test information . . . . . . . . . . . . . . . . . . . . . . . . . 3
Ruggedness in class-AB operation . . . . . . . . . 3
Impedance information . . . . . . . . . . . . . . . . . . . 3
Test circuit. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4
Graphical data . . . . . . . . . . . . . . . . . . . . . . . . . 5
CW pulse . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5
1-Carrier W-CDMA . . . . . . . . . . . . . . . . . . . . . . 6
2-Carrier W-CDMA . . . . . . . . . . . . . . . . . . . . . . 7
Package outline . . . . . . . . . . . . . . . . . . . . . . . . . 8
Handling information. . . . . . . . . . . . . . . . . . . . . 9
Abbreviations . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
Revision history . . . . . . . . . . . . . . . . . . . . . . . . . 9
Legal information. . . . . . . . . . . . . . . . . . . . . . . 10
Data sheet status . . . . . . . . . . . . . . . . . . . . . . 10
Definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
Disclaimers . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
Trademarks. . . . . . . . . . . . . . . . . . . . . . . . . . . 11
Contact information. . . . . . . . . . . . . . . . . . . . . 11
Contents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
Please be aware that important notices concerning this document and the product(s)
described herein, have been included in section ‘Legal information’.
© NXP B.V. 2013.
All rights reserved.
For more information, please visit: http://www.nxp.com
For sales office addresses, please send an email to: [email protected]
Date of release: 30 May 2013
Document identifier: BLF8G20LS-220
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