AD AD5672RBRUZ-REEL7 Octal, 12-/16-bit nanodac with ppm/â°c reference, spi interface Datasheet

Octal, 12-/16-Bit nanoDAC+ with
2 ppm/°C Reference, SPI Interface
AD5672R/AD5676R
Data Sheet
FEATURES
GENERAL DESCRIPTION
High performance
High relative accuracy (INL): ±3 LSB maximum at 16 bits
Total unadjusted error (TUE): ±0.14% of FSR maximum
Offset error: ±1.5 mV maximum
Gain error: ±0.06% of FSR maximum
Low drift 2.5 V reference: 2 ppm/°C typical
Wide operating ranges
−40°C to +125°C temperature range
2.7 V to 5.5 V power supply range
Easy implementation
User selectable gain of 1 or 2 (GAIN pin/gain bit)
1.8 V logic compatibility
50 MHz SPI with readback or daisy chain
Robust 2 kV HBM and 1.5 kV FICDM ESD rating
20-lead, RoHS-compliant TSSOP and LFCSP
The AD5672R/AD5676R are low power, octal, 12-/16-bit buffered
voltage output digital-to-analog converters (DACs). They include
a 2.5 V, 2 ppm/°C internal reference (enabled by default) and a
gain select pin giving a full-scale output of 2.5 V (gain = 1) or
5 V (gain = 2). The devices operate from a single 2.7 V to 5.5 V
supply and are guaranteed monotonic by design. The AD5672R/
AD5676R are available in a 20-lead TSSOP and in a 20-lead LFCSP
and incorporate a power-on reset circuit and a RSTSEL pin that
ensures that the DAC outputs power up to zero scale or midscale
and remain there until a valid write. The AD5672R/AD5676R
contain a power-down mode, reducing the current consumption to
1 µA typical while in power-down mode.
Table 1. Octal nanoDAC+® Devices
Interface
SPI
APPLICATIONS
Optical transceivers
Base station power amplifiers
Process control (PLC input/output cards)
Industrial automation
Data acquisition systems
Reference
Internal
External
Internal
I2 C
16-Bit
AD5676R
AD5676
AD5675R
12-Bit
AD5672R
Not applicable
AD5671R
PRODUCT HIGHLIGHTS
1.
2.
High Relative Accuracy (INL).
AD5672R (12-bit): ±1 LSB maximum.
AD5676R (16-bit): ±3 LSB maximum.
Low Drift, 2.5 V On-Chip Reference.
FUNCTIONAL BLOCK DIAGRAM
VDD
VREFOUT
AD5672R/AD5676R
SYNC
SDI
SDO
INTERFACE LOGIC
SCLK
2.5V
REF
INPUT
REGISTER
DAC
REGISTER
STRING
DAC 0
INPUT
REGISTER
DAC
REGISTER
STRING
DAC 1
INPUT
REGISTER
DAC
REGISTER
STRING
DAC 2
INPUT
REGISTER
DAC
REGISTER
STRING
DAC 3
INPUT
REGISTER
DAC
REGISTER
STRING
DAC 4
INPUT
REGISTER
DAC
REGISTER
STRING
DAC 5
LDAC
INPUT
REGISTER
DAC
REGISTER
STRING
DAC 6
RESET
INPUT
REGISTER
DAC
REGISTER
STRING
DAC 7
BUFFER
VOUT0
BUFFER
VOUT1
BUFFER
VOUT2
BUFFER
VOUT3
BUFFER
VOUT4
BUFFER
VOUT5
BUFFER
VOUT6
BUFFER
VOUT7
GAIN
×1/×2
POWER-ON
RESET
RSTSEL
GAIN
POWER-DOWN
LOGIC
GND
11954-001
VLOGIC
Figure 1.
Rev. B
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AD5672R/AD5676R
Data Sheet
TABLE OF CONTENTS
Features .............................................................................................. 1
Write and Update Commands .................................................. 26
Applications ....................................................................................... 1
Daisy-Chain Operation ............................................................. 26
General Description ......................................................................... 1
Readback Operation .................................................................. 27
Product Highlights ........................................................................... 1
Power-Down Operation ............................................................ 27
Functional Block Diagram .............................................................. 1
Load DAC (Hardware LDAC Pin) ........................................... 28
Revision History ............................................................................... 2
LDAC Mask Register ................................................................. 28
Specifications..................................................................................... 3
Hardware Reset (RESET) .......................................................... 29
AD5672R Specifications .............................................................. 3
Reset Select Pin (RSTSEL) ........................................................ 29
AD5676R Specifications .............................................................. 5
Amplifier Gain Selection on LFCSP ........................................ 29
AC Characteristics........................................................................ 7
Internal Reference Setup ........................................................... 29
Timing Characteristics ................................................................ 8
Solder Heat Reflow..................................................................... 29
Daisy-Chain and Readback Timing Characteristics ............... 9
Long-Term Temperature Drift ................................................. 29
Absolute Maximum Ratings.......................................................... 11
Thermal Hysteresis .................................................................... 30
Thermal Resistance .................................................................... 11
Applications Information .............................................................. 31
ESD Caution ................................................................................ 11
Power Supply Recommendations............................................. 31
Pin ConfigurationS and Function Descriptions ......................... 12
Microprocessor Interfacing ....................................................... 31
Typical Performance Characteristics ........................................... 13
AD5672R/AD5676R to ADSP-BF531 Interface ..................... 31
Terminology .................................................................................... 22
AD5672R/AD5676R to SPORT Interface ............................... 31
Theory of Operation ...................................................................... 24
Layout Guidelines....................................................................... 31
Digital-to-Analog Converter .................................................... 24
Galvanically Isolated Interface ................................................. 32
Transfer Function ....................................................................... 24
Outline Dimensions ....................................................................... 33
DAC Architecture ....................................................................... 24
Ordering Guide .......................................................................... 34
Serial Interface ............................................................................ 25
Standalone Operation ................................................................ 26
REVISION HISTORY
11/15—Rev. A to Rev. B
Added 20-Lead LFCSP....................................................... Universal
Change to Features ........................................................................... 1
Changed TA = −40°C to +125°C to TMIN to TMAX .......................... 7
Changes to Table 7 .......................................................................... 11
Added Thermal Resistance Section and Table 8; Renumbered
Sequentially ..................................................................................... 11
Added Figure 7; Renumbered Sequentially ................................ 12
Changes to Table 9 .......................................................................... 12
Changes to Transfer Function Section, Internal Reference
Section, and Output Amplifiers Section ...................................... 24
Changes to Table 10 ....................................................................... 25
Changes to Write to and Update DAC Channel n (Independent
of LDAC) Section ............................................................................ 26
Changes to Readback Operation Section .................................... 27
Changes to LDAC Mask Register Section and Table 15 ............ 28
Changes to Reset Select Pin (RSTSEL) Section, Internal
Reference Setup Section, Table 17, and Table 18 ........................ 29
Added Amplifier Gain Selection on LFCSP Section ................. 29
Updated Outline Dimensions ....................................................... 33
Changes to Ordering Guide .......................................................... 34
2/15—Rev. 0 to Rev. A
Added AD5672R Specifications Section ........................................3
Changes to Table 2.............................................................................3
Added AD5676R Specifications Section and Table 3;
Renumbered Sequentially ................................................................5
Change to RESET Pulse Activation Parameter, Table 5 ...............8
Change to Terminology Section ................................................... 22
Changes to Transfer Function Section and Output Amplifiers
Section.............................................................................................. 24
Changes to Hardware Reset (RESET) Section ............................ 29
Changes to Ordering Guide .......................................................... 33
10/14—Revision 0: Initial Version
Rev. B | Page 2 of 34
Data Sheet
AD5672R/AD5676R
SPECIFICATIONS
AD5672R SPECIFICATIONS
VDD = 2.7 V to 5.5 V, 1.8 V ≤ VLOGIC ≤ 5.5 V, RL = 2 kΩ, CL = 200 pF, all specifications TA = −40°C to +125°C, unless otherwise noted.
Table 2.
Parameter
STATIC PERFORMANCE 1
Resolution
Relative Accuracy (INL)
Min
Zero Code Error
Offset Error
Full-Scale Error
Gain Error
TUE
Offset Error Drift 2
DC Power Supply Rejection Ratio (PSRR)2
DC Crosstalk2
Short-Circuit Current 4
Load Impedance at Rails 5
Power-Up Time
REFERENCE OUTPUT
Output Voltage 6
Reference Temperature Coefficient 7, 8
Output Impedance2
Output Voltage Noise2
Output Voltage Noise Density2
Load Regulation Sourcing2
Load Regulation Sinking2
Output Current Load Capability2
Line Regulation2
Long-Term Stability/Drift2
Thermal Hysteresis2
±0.12
±0.12
±0.01
±0.01
0.8
−0.75
−0.1
−0.018
−0.013
+0.04
−0.02
±0.03
±0.006
±1
0.25
±2
±3
±2
±1
±1
±0.1
±0.1
1.6
±2
±1.5
±0.14
±0.07
±0.12
±0.06
±0.18
±0.14
0
0
Output Current Drive
Capacitive Load Stability
Resistive Load 3
Load Regulation
Max
12
Differential Nonlinearity (DNL)
OUTPUT CHARACTERISTICS2
Output Voltage Range
Typ
2.5
5
15
Unit
Bits
LSB
LSB
LSB
LSB
mV
mV
mV
% of FSR
% of FSR
% of FSR
% of FSR
% of FSR
% of FSR
µV/°C
mV/V
µV
µV/mA
µV
183
V
V
mA
nF
nF
kΩ
µV/mA
177
µV/mA
40
25
2.5
mA
Ω
µs
2
10
1
2.4975
2
0.04
13
240
2.5025
5
29
74
±20
43
12
125
25
V
ppm/°C
Ω
µV p-p
nV/√Hz
µV/mA
µV/mA
mA
µV/V
ppm
ppm
ppm
Rev. B | Page 3 of 34
Test Conditions/Comments
Gain = 1
Gain = 2
Gain = 1
Gain = 2
Gain = 1 or gain = 2
Gain = 1
Gain = 2
Gain = 1
Gain = 2
Gain = 1
Gain = 2
Gain = 1
Gain = 2
DAC code = midscale, VDD = 5 V ± 10%
Due to single channel, full-scale output change
Due to load current change
Due to powering down (per channel)
Gain = 1
Gain = 2
RL = ∞
RL = 1 kΩ
VDD = 5 V ± 10%, DAC code = midscale,
−30 mA ≤ IOUT ≤ +30 mA
VDD = 3 V ± 10%, DAC code = midscale,
−20 mA ≤ IOUT ≤ +20 mA
Exiting power-down mode, VDD = 5 V
See the Terminology section
0.1 Hz to 10 Hz
At ambient temperature, f = 10 kHz, CL = 10 nF,
gain = 1 or 2
At ambient temperature
At ambient temperature
VDD ≥ 3 V
At ambient temperature
After 1000 hours at 125°C
First cycle
Additional cycles
AD5672R/AD5676R
Parameter
LOGIC INPUTS2
Input Current
Input Voltage
Low, VINL
High, VINH
Pin Capacitance
LOGIC OUTPUTS (SDO)2
Output Voltage
Low, VOL
High, VOH
Floating State Output Capacitance
POWER REQUIREMENTS
VLOGIC
ILOGIC
VDD
Data Sheet
Min
Typ
Max
Unit
Test Conditions/Comments
±1
µA
Per pin
0.3 × VLOGIC
V
V
pF
0.4
V
V
pF
5.5
1
1.3
0.5
1.3
5.5
5.5
V
µA
µA
µA
µA
V
V
1.26
2.0
1.3
2.1
1.7
1.7
2.5
2.5
5.5
5.5
mA
mA
mA
mA
µA
µA
µA
µA
µA
µA
0.7 × VLOGIC
3
VLOGIC − 0.4
4
1.8
2.7
VREF + 1.5
IDD
Normal Mode 9
All Power-Down Modes 10
1.1
1.8
1.1
1.8
1
1
1
1
1
1
ISINK = 200 μA
ISOURCE = 200 μA
Power-on, −40°C to +105°C
Power-on, −40°C to +125°C
Power-down, −40°C to +105°C
Power-down, −40°C to +125°C
Gain = 1
Gain = 2
VIH = VDD, VIL = GND, VDD = 2.7 V to 5.5 V
Internal reference off, −40°C to +85°C
Internal reference on, −40°C to +85°C
Internal reference off
Internal reference on
Tristate to 1 kΩ, −40°C to +85°C
Power down to 1 kΩ, −40°C to +85°C
Tristate, −40°C to +105°C
Power down to 1 kΩ, −40°C to +105°C
Tristate to 1 kΩ, −40°C to +125°C
Power down to 1 kΩ, −40°C to +125°C
DC specifications tested with the outputs unloaded, unless otherwise noted. Upper dead band = 10 mV and exists only when VREF = VDD with gain = 1, or when VREF/2 =
VDD with gain = 2. Linearity calculated using a reduced code range of 12 to 4080.
2
Guaranteed by design and characterization; not production tested.
3
Together, Channel 0, Channel 1, Channel 2, and Channel 3 can source/sink 40 mA. Similarly, together, Channel 4, Channel 5, Channel 6, and Channel 7 can source/sink
40 mA up to a junction temperature of 125°C.
4
VDD = 5 V. The devices include current limiting intended to protect the devices during temporary overload conditions. Junction temperature can be exceeded during
current limit. Operation above the specified maximum operation junction temperature may impair device reliability.
5
When drawing a load current at either rail, the output voltage headroom with respect to that rail is limited by the 25 Ω typical channel resistance of the output
devices. For example, when sinking 1 mA, the minimum output voltage = 25 Ω × 1 mA = 25 mV.
6
Initial accuracy presolder reflow is ±750 µV; output voltage includes the effects of preconditioning drift. See the Internal Reference Setup section.
7
Reference is trimmed and tested at two temperatures and is characterized from −40°C to +125°C.
8
Reference temperature coefficient calculated as per the box method. See the Terminology section for further information.
9
Interface inactive. All DACs active. DAC outputs unloaded.
10
All DACs powered down.
1
Rev. B | Page 4 of 34
Data Sheet
AD5672R/AD5676R
AD5676R SPECIFICATIONS
VDD = 2.7 V to 5.5 V, 1.8 V ≤ VLOGIC ≤ 5.5 V, RL = 2 kΩ, CL = 200 pF, all specifications TA = −40°C to +125°C, unless otherwise noted.
Table 3.
Parameter
STATIC PERFORMANCE 1
Resolution
Relative Accuracy (INL)
Min
Full-Scale Error
Gain Error
TUE
Offset Error Drift 2
DC Power Supply Rejection
Ratio (PSRR)2
DC Crosstalk2
Short-Circuit Current 4
Load Impedance at Rails 5
Power-Up Time
REFERENCE OUTPUT
Output Voltage 6
Reference Temperature
Coefficient 7, 8
Output Impedance2
Output Voltage Noise2
Output Voltage Noise Density2
Load Regulation Sourcing2
Load Regulation Sinking2
Output Current Load
Capability2
Line Regulation2
Long-Term Stability/Drift2
Thermal Hysteresis2
B Grade
Typ
Max
±8
±8
±1
±1
3
±6
±4
±0.28
±0.14
±0.24
±0.12
±0.3
±0.25
±1.8
±1.7
±0.7
±0.5
0.8
−0.75
−0.1
−0.018
−0.013
+0.04
−0.02
±0.03
±0.006
±1
0.25
±3
±3
±1
±1
1.6
±2
±1.5
±0.14
±0.07
±0.12
±0.06
±0.18
±0.14
Unit
Bits
LSB
LSB
LSB
LSB
mV
mV
mV
% of FSR
% of FSR
% of FSR
% of FSR
% of FSR
% of FSR
µV/°C
mV/V
±2
±2
µV
±3
±2
±3
±2
µV/mA
µV
0
0
Output Current Drive
Capacitive Load Stability
Min
16
±1.8
±1.7
±0.7
±0.5
0.8
−0.75
−0.1
−0.018
−0.013
+0.04
−0.02
±0.03
±0.006
±1
0.25
Zero Code Error
Offset Error
Resistive Load 3
Load Regulation
Max
16
Differential Nonlinearity (DNL)
OUTPUT CHARACTERISTICS2
Output Voltage Range
A Grade
Typ
2.5
5
15
0
0
Gain = 1
Gain = 2
Gain = 1
Gain = 2
Gain = 1 or gain = 2
Gain = 1
Gain = 2
Gain = 1
Gain = 2
Gain = 1
Gain = 2
Gain = 1
Gain = 2
DAC code = midscale, VDD =
5 V ± 10%
Due to single channel, full-scale
output change
Due to load current change
Due to powering down (per channel)
183
183
V
V
mA
nF
nF
kΩ
µV/mA
177
177
µV/mA
40
25
2.5
40
25
2.5
mA
Ω
µs
Exiting power-down mode, VDD = 5 V
V
ppm/°C
See the Terminology section
2
10
2.5
5
15
Test Conditions/Comments
2
10
1
1
2.4975
5
2.5025
20
2.4975
2
2.5025
5
Gain = 1
Gain = 2
RL = ∞
RL = 1 kΩ
VDD = 5 V ± 10%, DAC code =
midscale, −30 mA ≤ IOUT ≤ +30 mA
VDD = 3 V ± 10%, DAC code =
midscale, −20 mA ≤ IOUT ≤ +20 mA
0.04
13
240
0.04
13
240
Ω
µV p-p
nV/√Hz
29
74
±20
29
74
±20
µV/mA
µV/mA
mA
0.1 Hz to 10 Hz
At ambient temperature, f = 10 kHz,
CL = 10 nF, gain = 1 or 2
At ambient temperature
At ambient temperature
VDD ≥ 3 V
43
12
125
25
43
12
125
25
µV/V
ppm
ppm
ppm
At ambient temperature
After 1000 hours at 125°C
First cycle
Additional cycles
Rev. B | Page 5 of 34
AD5672R/AD5676R
Parameter
LOGIC INPUTS2
Input Current
Input Voltage
Low, VINL
High, VINH
Pin Capacitance
LOGIC OUTPUTS (SDO)2
Output Voltage
Low, VOL
High, VOH
Floating State Output
Capacitance
POWER REQUIREMENTS
VLOGIC
ILOGIC
VDD
Data Sheet
Min
A Grade
Typ
Max
Min
B Grade
Typ
Max
Unit
Test Conditions/Comments
±1
±1
µA
Per pin
0.3 ×
VLOGIC
0.3 ×
VLOGIC
V
0.7 ×
VLOGIC
0.7 ×
VLOGIC
3
V
3
0.4
VLOGIC −
0.4
pF
0.4
VLOGIC −
0.4
4
1.8
4
5.5
1
1.3
0.5
1.3
5.5
5.5
2.7
VREF + 1.5
1.8
2.7
VREF + 1.5
V
V
pF
5.5
1
1.3
0.5
1.3
5.5
5.5
V
µA
µA
µA
µA
V
V
IDD
Normal Mode 9
All Power-Down Modes10
ISINK = 200 μA
ISOURCE = 200 μA
1.1
1.8
1.1
1.8
1
1
1
1
1.26
2.0
1.3
2.1
1.7
1.7
2.5
2.5
1.1
1.8
1.1
1.8
1
1
1
1
1.26
2.0
1.3
2.1
1.7
1.7
2.5
2.5
mA
mA
mA
mA
µA
µA
µA
µA
1
1
5.5
5.5
1
1
5.5
5.5
µA
µA
Power-on, −40°C to +105°C
Power-on, −40°C to +125°C
Power-down, −40°C to +105°C
Power-down, −40°C to +125°C
Gain = 1
Gain = 2
VIH = VDD, VIL = GND, VDD = 2.7 V to 5.5 V
Internal reference off, −40°C to +85°C
Internal reference on, −40°C to +85°C
Internal reference off
Internal reference on
Tristate to 1 kΩ, −40°C to +85°C
Power down to 1 kΩ, −40°C to +85°C
Tristate, −40°C to +105°C
Power down to 1 kΩ, −40°C to
+105°C
Tristate to 1 kΩ, −40°C to +125°C
Power down to 1 kΩ, −40°C to +125°C
DC specifications tested with the outputs unloaded, unless otherwise noted. Upper dead band = 10 mV and exists only when VREF = VDD with gain = 1, or when VREF/2 =
VDD with gain = 2. Linearity calculated using a reduced code range of 256 to 65,280.
Guaranteed by design and characterization; not production tested.
3
Together, Channel 0, Channel 1, Channel 2, and Channel 3 can source/sink 40 mA. Similarly, together, Channel 4, Channel 5, Channel 6, and Channel 7 can source/sink
40 mA up to a junction temperature of 125°C.
4
VDD = 5 V. The devices include current limiting intended to protect the devices during temporary overload conditions. Junction temperature can be exceeded during
current limit. Operation above the specified maximum operation junction temperature may impair device reliability.
5
When drawing a load current at either rail, the output voltage headroom with respect to that rail is limited by the 25 Ω typical channel resistance of the output
devices. For example, when sinking 1 mA, the minimum output voltage = 25 Ω × 1 mA = 25 mV.
6
Initial accuracy presolder reflow is ±750 µV; output voltage includes the effects of preconditioning drift. See the Internal Reference Setup section.
7
Reference is trimmed and tested at two temperatures and is characterized from −40°C to +125°C.
8
Reference temperature coefficient calculated as per the box method. See the Terminology section for further information.
9
Interface inactive. All DACs active. DAC outputs unloaded.
10
All DACs powered down.
1
2
Rev. B | Page 6 of 34
Data Sheet
AD5672R/AD5676R
AC CHARACTERISTICS
VDD = 2.7 V to 5.5 V, 1.8 V ≤ VLOGIC ≤ 5.5 V, RL = 2 kΩ to GND, CL = 200 pF to GND, all specifications TMIN to TMAX unless otherwise
noted. The operating temperature range is −40°C to +125°C; TA = 25°C. Guaranteed by design and characterization, not production tested.
Table 4.
Parameter
OUTPUT VOLTAGE SETTLING TIME 1
AD5672R
AD5676R
SLEW RATE
DIGITAL-TO-ANALOG GLITCH IMPULSE1
DIGITAL FEEDTHROUGH1
CROSSTALK1
Digital
Analog
DAC-to-DAC
TOTAL HARMONIC DISTORTION 2
OUTPUT NOISE SPECTRAL DENSITY1
OUTPUT NOISE1
SIGNAL-TO-NOISE RATIO (SNR)
SPURIOUS-FREE DYNAMIC RANGE (SFDR)
SIGNAL-TO-NOISE-AND-DISTORTION
RATIO (SINAD)
1
2
Min
Typ
Max
Unit
Test Conditions/Comments
5
5
0.8
1.4
0.13
8
8
µs
µs
V/µs
nV-sec
nV-sec
¼ to ¾ scale settling to ±2 LSB
¼ to ¾ scale settling to ±2 LSB
0.1
−0.25
−1.3
−2.0
−80
300
6
90
83
80
nV-sec
nV-sec
nV-sec
nV-sec
dB
nV/√Hz
µV p-p
dB
dB
dB
1 LSB change around major carry (internal reference, gain = 1)
Internal reference, gain = 2
Internal reference, gain = 2
At TA, bandwidth = 20 kHz, VDD = 5 V, fOUT = 1 kHz
DAC code = midscale, 10 kHz, gain = 2
0.1 Hz to 10 Hz, gain = 1
At TA = 25°C, bandwidth = 20 kHz, VDD = 5 V, fOUT = 1 kHz
At TA = 25°C, bandwidth = 20 kHz, VDD = 5 V, fOUT = 1 kHz
At TA = 25°C, bandwidth = 20 kHz, VDD = 5 V, fOUT = 1 kHz
See the Terminology section. Measured using internal reference and gain = 1, unless otherwise noted.
Digitally generated sine wave at 1 kHz.
Rev. B | Page 7 of 34
AD5672R/AD5676R
Data Sheet
TIMING CHARACTERISTICS
All input signals are specified with tR = tF = 1 ns/V (10% to 90% of VDD) and timed from a voltage level of (VIL + VIH)/2. See Figure 2.
VDD = 2.7 V to 5.5 V, 1.8 V ≤ VLOGIC ≤ 5.5 V, and VREFIN = 2.5 V. All specifications −40°C to +125°C, unless otherwise noted. Maximum
SCLK frequency is 50 MHz at VDD = 2.7 V to 5.5 V, 1.8 V ≤ VLOGIC ≤ VDD. Guaranteed by design and characterization; not production tested.
Table 5.
Parameter
t1
t2
t3
t4
t5
t6
t7
t8
t9
t10
t11
t12
t13
t14
2.7 V ≤ VLOGIC ≤ 5.5 V
Min
Max
20
1.7
4.3
10.1
0.8
−0.8
1.25
6.75
9.7
5.45
25
20.3
6.2
80
5.18
Unit
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
μs
Description
SCLK Cycle Time
SCLK High Time
SCLK Low Time
SYNC to SCLK Falling Edge Setup Time
Data Setup Time
Data Hold Time
SCLK Falling Edge to SYNC Rising Edge
Minimum SYNC High Time (Single, Combined, or All Channel Update)
SYNC Falling Edge to SCLK Fall Ignore
LDAC Pulse Width Low
SCLK Falling Edge to LDAC Rising Edge
SCLK Falling Edge to LDAC Falling Edge
RESET Minimum Pulse Width Low
RESET Pulse Activation Time
Power-Up Time 1
Time to exit power-down to normal mode of AD5672R/AD5676R operation, 32nd clock edge to 90% of DAC midscale value, with output unloaded.
t9
t1
SCLK
t8
t3
t4
t2
t7
SYNC
t6
t5
SDI
DB23
DB0
t12
t10
LDAC1
t11
LDAC2
RESET
VOUT
t13
t14
11954-002
1
1.8 V ≤ VLOGIC < 2.7 V
Min
Max
20
4
4.5
15.1
0.8
0.1
0.95
9.65
4.75
4.85
41.25
26.35
4.8
132
5.15
1ASYNCHRONOUS LDAC UPDATE MODE.
2SYNCHRONOUS LDAC UPDATE MODE.
Figure 2. Serial Write Operation
Rev. B | Page 8 of 34
Data Sheet
AD5672R/AD5676R
DAISY-CHAIN AND READBACK TIMING CHARACTERISTICS
All input signals are specified with tR = tF = 1 ns/V (10% to 90% of VDD) and timed from a voltage level of (VIL + VIH)/2. See Figure 4 and
Figure 5. VDD = 2.7 V to 5.5 V, 1.8 V ≤ VLOGIC ≤ 5.5 V, VREF = 2.5 V. All specifications −40°C to +125°C, unless otherwise noted. Maximum
SCLK frequency is 25 MHz or 15 MHz at VDD = 2.7 V to 5.5 V, 1.8 V ≤ VLOGIC ≤ VDD. Guaranteed by design and characterization; not
production tested.
Table 6.
Parameter
t1
t2
t3
t4
t5
t6
t7
t8
t10
t11
1.8 V ≤ VLOGIC < 2.7 V
Min
Max
120
33
2.8
75
1.2
0.3
16.2
55.1
21.5
24.4
2.7 V ≤ VLOGIC ≤ 5.5 V
Min
Max
83.3
25.3
3.25
50
0.5
0.4
13
45
22.7
20.3
Unit
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
Description
SCLK Cycle Time
SCLK High Time
SCLK Low Time
SYNC to SCLK Falling Edge
Data Setup Time
Data Hold Time
SCLK Falling Edge to SYNC Rising Edge
Minimum SYNC High Time
SDO Data Valid from SCLK Rising Edge
SCLK Falling Edge to SYNC Rising Edge
t12
85.5
54
ns
SYNC Rising Edge to SCLK Rising Edge
Circuit Diagram and Daisy-Chain and Readback Timing Diagrams
200µA
VOH (MIN)
CL
20pF
200µA
11954-003
TO OUTPUT
PIN
IOL
IOH
Figure 3. Load Circuit for Digital Output (SDO) Timing Specifications
SCLK
24
48
t11
t8
t12
t4
SYNC
SDI
t6
DB23
DB0
INPUT WORD FOR DAC N
DB23
DB0
t10
INPUT WORD FOR DAC N + 1
DB23
SDO
UNDEFINED
DB0
INPUT WORD FOR DAC N
Figure 4. Daisy-Chain Timing Diagram
Rev. B | Page 9 of 34
11954-004
t5
AD5672R/AD5676R
Data Sheet
t1
SCLK
24
1
t8
t4
t3
24
1
t7
t2
SYNC
t6
t5
DB23
DB0
DB23
INPUT WORD SPECIFIES
REGISTER TO BE READ
SDO
DB23
DB0
NOP CONDITION
t10
DB0
DB0
DB23
UNDEFINED
SELECTED REGISTER DATA
CLOCKED OUT
Figure 5. Readback Timing Diagram
Rev. B | Page 10 of 34
11954-005
SDI
Data Sheet
AD5672R/AD5676R
ABSOLUTE MAXIMUM RATINGS
TA = 25°C, unless otherwise noted.
THERMAL RESISTANCE
Table 7.
The design of the thermal board requires close attention. Thermal
resistance is highly impacted by the printed circuit board (PCB)
being used, layout, and environmental conditions.
Parameter
VDD to GND
VLOGIC to GND
VOUTx to GND
VREF to GND
Digital Input Voltage to GND
Operating Temperature Range
Storage Temperature Range
Junction Temperature
Reflow Soldering Peak Temperature,
Pb-Free (J-STD-020)
ESD Ratings
Human Body Model (HBM)
Field-Induced Charged Device Model
(FICDM)
Rating
−0.3 V to +7 V
−0.3 V to +7 V
−0.3 V to VDD + 0.3 V
−0.3 V to VDD + 0.3 V
−0.3 V to VLOGIC + 0.3 V
−40°C to +125°C
−65°C to +150°C
125°C
260°C
2 kV
1.5 kV
Table 8. Thermal Resistance
Package Type
20-Lead TSSOP
(RU-20)1
20-Lead LFCSP
(CP-20-8)2
θJA
98.65
θJB
44.39
θJC
17.58
ΨJT
1.77
ΨJB
43.9
Unit
°C/W
82
16.67
32.5
0.43
22
°C/W
Thermal impedance simulated values are based on a JEDEC 2S2P thermal
test board. See JEDEC JESD51
2
Thermal impedance simulated values are based on a JEDEC 2S2P thermal
test board with nine thermal vias. See JEDEC JESD51.
1
ESD CAUTION
Stresses at or above those listed under Absolute Maximum
Ratings may cause permanent damage to the product. This is a
stress rating only; functional operation of the product at these
or any other conditions above those indicated in the operational
section of this specification is not implied. Operation beyond
the maximum operating conditions for extended periods may
affect product reliability.
Rev. B | Page 11 of 34
AD5672R/AD5676R
Data Sheet
SDO
SCLK
6
15
LDAC
TOP VIEW
(Not to Scale)
SDI
7
14
RSTSEL
GAIN
8
13
GND
VOUT7
9
12
VOUT4
VOUT6 10
11
VOUT5
VDD 1
VLOGIC 2
SYNC 3
SCLK 4
AD5672R/
AD5676R
SDI 5
15 VREFOUT
14 RESET
13 SDO
12 LDAC
11 GND
TOP VIEW
(Not to Scale)
NOTES
1. NIC = NO INTERNAL CONNECTION.
2. THE EXPOSED PAD MUST BE TIED TO GND.
Figure 6. TSSOP Pin Configuration
11954-107
16
NIC 10
5
18 VOUT2
SYNC
17 VOUT3
16 NIC
RESET
8
17
AD5672R/
AD5676R
9
4
VOUT4
VREFOUT
VLOGIC
VOUT5
18
20 VOUT0
3
6
VOUT3
VDD
7
VOUT2
19
VOUT6
20
VOUT7
1
2
11954-006
VOUT1
VOUT0
19 VOUT1
PIN CONFIGURATIONS AND FUNCTION DESCRIPTIONS
Figure 7. LFCSP Pin Configuration
Table 9. Pin Function Descriptions
Pin No.
TSSOP LFCSP
1
19
2
20
3
1
Mnemonic
VOUT1
VOUT0
VDD
4
5
2
3
VLOGIC
SYNC
6
4
SCLK
7
5
SDI
8
9
10
11
12
GAIN
6
7
8
9
10
11
VOUT7
VOUT6
VOUT5
VOUT4
NIC
GND
RSTSEL
15
12
LDAC
16
13
SDO
17
14
RESET
18
19
20
N/A 1
15
17
18
0
VREFOUT
VOUT3
VOUT2
EPAD
13
14
1
Description
Analog Output Voltage from DAC 1. The output amplifier has rail-to-rail operation.
Analog Output Voltage from DAC 0. The output amplifier has rail-to-rail operation.
Power Supply Input. These devices operate from 2.7 V to 5.5 V. Decouple the VDD supply with a 10 µF
capacitor in parallel with a 0.1 µF capacitor to GND.
Digital Power Supply. The voltage on this pin ranges from 1.8 V to 5.5 V.
Active Low Control Input. This is the frame synchronization signal for the input data. When SYNC goes
low, data transfers in on the falling edges of the next 24 clocks.
Serial Clock Input. Data is clocked into the input shift register on the falling edge of the serial clock input.
Data transfers at rates of up to 50 MHz.
Serial Data Input. This device has a 24-bit input shift register. Data is clocked into the register on the
falling edge of the serial clock input.
Span Set Pin. When this pin is tied to GND, all eight DAC outputs have a span from 0 V to VREF. If this pin is
tied to VLOGIC, all eight DACs output a span of 0 V to 2 × VREF.
Analog Output Voltage from DAC 7. The output amplifier has rail-to-rail operation.
Analog Output Voltage from DAC 6. The output amplifier has rail-to-rail operation.
Analog Output Voltage from DAC 5. The output amplifier has rail-to-rail operation.
Analog Output Voltage from DAC 4. The output amplifier has rail-to-rail operation.
No Internal Connection.
Ground Reference Point for All Circuitry on the Device.
Power-On Reset Pin. Tie this pin to GND to power up all eight DACs to zero scale. Tie this pin to VLOGIC to
power up all eight DACs to midscale.
Load DAC. LDAC operates in two modes, asynchronously and synchronously. Pulsing this pin low allows any or
all DAC registers to be updated if the input registers have new data, which allows all DAC outputs to update
simultaneously. This pin can also be tied permanently low.
Serial Data Output. This pin can be used to daisy-chain a number of devices together, or it can be used for
readback. The serial data transfers on the rising edge of SCLK and is valid on the falling edge.
Asynchronous Reset Input. The RESET input is falling edge sensitive. When RESET is low, all LDAC pulses are
ignored. When RESET is activated, the input register and the DAC register are updated with zero scale or
midscale, depending on the state of the RSTSEL pin.
Reference Output Voltage. When using the internal reference, this is the reference output pin.
Analog Output Voltage from DAC 3. The output amplifier has rail-to-rail operation.
Analog Output Voltage from DAC 2. The output amplifier has rail-to-rail operation.
Exposed Pad. The exposed pad must be tied to GND.
N/A means not applicable.
Rev. B | Page 12 of 34
Data Sheet
AD5672R/AD5676R
TYPICAL PERFORMANCE CHARACTERISTICS
2.0
1.0
0.8
1.5
0.6
DNL ERROR (LSB)
INL ERROR (LSB)
1.0
0.5
0
–0.5
0.4
0.2
0
–0.2
–0.4
–1.0
11954-007
–2.0
0
10000
20000
30000
40000
50000
60000
11954-010
–0.6
–1.5
–0.8
–1.0
70000
0
1000
500
1500
CODE
2000
2500
3000
3500
4000
CODE
Figure 8. AD5676R INL Error vs. Code
Figure 11. AD5672R DNL Error vs. Code
2.0
0.04
1.5
0.03
TUE (% OF FSR)
INL ERROR (LSB)
1.0
0.5
0
–0.5
0.02
0.01
0
–1.0
11954-008
–2.0
0
500
1000
1500
2000 2500
CODE
3000
3500
11954-011
–0.01
–1.5
–0.02
4000
0
10000
Figure 9. AD5672R INL Error vs. Code
20000
30000
40000
CODE
50000
60000
70000
Figure 12. AD5676R TUE vs. Code
0.04
1.0
0.8
0.03
TUE (% of FSR)
0.4
0.2
0
–0.2
0.02
0.01
0
–0.4
–0.6
–0.8
–1.0
0
10000
20000
30000
40000
CODE
50000
Figure 10. AD5676R DNL Error vs. Code
60000
70000
11954-012
–0.01
11954-009
DNL ERROR (LSB)
0.6
–0.02
0
500
1000
1500
2000 2500
CODE
3000
Figure 13. AD5672R TUE vs. Code
3500
4000
Data Sheet
10
10
8
8
6
6
4
4
DNL ERROR (LSB)
2
0
–2
VDD = 5V
TA = 25°C
INTERNAL REFERENCE = 2.5V
–2
0
–20
20
40
–6
11954-013
–8
–10
–40
0
–4
–4
–6
2
60
80
100
–8
–10
–40
120
VDD = 5V
TA = 25°C
INTERNAL REFERENCE = 2.5V
–20
0
TEMPERATURE (°C)
8
0.09
6
0.08
4
0.07
TUE (% OF FSR)
2
0
–2
0.04
VDD = 5V
TA = 25°C
INTERNAL REFERENCE = 2.5V
0
–40
5.2
4
0.07
TUE (% OF FSR)
0.08
2
0
–2
40
60
80
100
120
100
120
0.05
0.04
VDD = 5V
TA = 25°C
INTERNAL REFERENCE = 2.5V
0.02
VDD = 5V
TA = 25°C
INTERNAL REFERENCE = 2.5V
40
20
0.06
0.03
–4
11954-015
DNL ERROR (LSB)
6
20
0
Figure 18. AD5676R TUE vs. Temperature
0.09
0
–20
TEMPERATURE (°C)
8
–20
11954-017
11954-014
4.7
3.7
4.2
SUPPLY VOLTAGE (V)
0.01
0.10
–10
–40
VDD = 5V
TA = 25°C
INTERNAL REFERENCE = 2.5V
0.02
10
–8
120
0.05
Figure 15. AD5672R INL Error vs. Supply Voltage
–6
100
0.06
0.03
–4
3.2
80
60
80
100
11954-018
INL ERROR (LSB)
0.10
–10
2.7
60
Figure 17. AD5672R DNL Error vs. Temperature
10
–8
40
TEMPERATURE (°C)
Figure 14. AD5676R INL Error vs. Temperature
–6
20
11954-016
INL ERROR (LSB)
AD5672R/AD5676R
0.01
0
–40
120
–20
0
20
40
60
80
TEMPERATURE (°C)
TEMPERATURE (°C)
Figure 19. AD5672R TUE vs. Temperature
Figure 16. AD5676R DNL Error vs. Temperature
Rev. B | Page 14 of 34
AD5672R/AD5676R
10
0.10
8
0.08
6
0.06
4
0.04
TUE (% OF FSR)
2
0
–2
–0.02
3.2
3.7
4.2
–0.06
4.7
–0.08
VDD = 5V
TA = 25°C
INTERNAL REFERENCE = 2.5V
–0.10
2.7
5.2
Figure 23. AD5676R TUE vs. Supply Voltage
10
0.10
8
0.08
6
0.06
4
0.04
TUE (% OF FSR)
2
0
–2
–4
0
–0.02
–0.04
VDD = 5V
TA = 25°C
INTERNAL REFERENCE = 2.5V
3.2
3.7
4.2
–0.06
11954-027
–8
0.02
4.7
–0.08
VDD = 5V
TA = 25°C
INTERNAL REFERENCE = 2.5V
–0.10
2.7
5.2
3.2
3.7
SUPPLY VOLTAGE (V)
6
0.06
4
0.04
ERROR (% OF FSR)
0.08
2
0
–2
–4
VDD = 5V
TA = 25°C
INTERNAL REFERENCE = 2.5V
3.2
3.7
4.2
5.2
0.02
FULL-SCALE ERROR
0
GAIN ERROR
–0.02
–0.04
–0.06
11954-028
DNL ERROR (LSB)
0.10
8
–10
2.7
4.7
Figure 24. AD5672R TUE vs. Supply Voltage
10
–8
4.2
SUPPLY VOLTAGE (V)
Figure 21. AD5676R DNL Error vs. Supply Voltage
–6
11954-030
DNL ERROR (LSB)
Figure 20. AD5676R INL Error vs. Supply Voltage
–10
2.7
5.2
4.7
SUPPLY VOLTAGE (V)
SUPPLY VOLTAGE (V)
–6
4.2
3.7
3.2
11954-029
VDD = 5V
TA = 25°C
INTERNAL REFERENCE = 2.5V
11954-025
–8
–10
2.7
0
–0.04
–4
–6
0.02
4.7
–0.08
–0.10
–40
5.2
VDD = 5V
TA = 25°C
INTERNAL REFERENCE = 2.5V
–20
0
20
40
11954-031
INL ERROR (LSB)
Data Sheet
60
80
100
120
TEMPERATURE (°C)
SUPPLY VOLTAGE (V)
Figure 22. AD5672R DNL Error vs. Supply Voltage
Figure 25. AD5676R Gain Error and Full-Scale Error vs. Temperature
Rev. B | Page 15 of 34
AD5672R/AD5676R
Data Sheet
1.8
0.10
0.08
1.5
0.06
VDD = 5V
TA = 25°C
INTERNAL REFERENCE = 2.5V
ERROR (mV)
ERROR (% OF FSR)
1.2
0.04
0.02
0
GAIN ERROR
–0.02
ZERO CODE ERROR
0.9
0.6
OFFSET ERROR
0.3
FULL-SCALE ERROR
–0.04
0
–0.06
0
–20
20
40
–0.3
60
80
100
–0.6
–40
120
11954-035
–0.10
–40
VDD = 5V
TA = 25°C
INTERNAL REFERENCE = 2.5V
11954-032
–0.08
–20
0
TEMPERATURE (°C)
80
100
120
Figure 29. AD5676R Zero Code Error and Offset Error vs. Temperature
Figure 26. AD5672R Gain Error and Full-Scale Error vs. Temperature
1.8
0.10
0.08
1.5
0.06
VDD = 5V
TA = 25°C
INTERNAL REFERENCE = 2.5V
1.2
0.04
ERROR (mV)
ERROR (% OF FSR)
20
40
60
TEMPERATURE (°C)
0.02
GAIN ERROR
0
–0.02
FULL-SCALE ERROR
–0.04
ZERO CODE ERROR
0.9
OFFSET ERROR
0.6
0.3
0
–0.06
–0.10
2.7
VDD = 5V
TA = 25°C
INTERNAL REFERENCE = 2.5V
3.2
3.7
4.2
4.7
–0.6
–40
5.2
11954-036
–0.3
11954-033
–0.08
–20
0
SUPPLY VOLTAGE (V)
Figure 27. AD5676R Gain Error and Full-Scale Error vs. Supply Voltage
20
40
60
TEMPERATURE (°C)
80
100
120
Figure 30. AD5672R Zero Code Error and Offset Error vs. Temperature
1.5
0.10
0.08
1.0
0.04
0.02
GAIN ERROR
–0.02
–0.5
FULL-SCALE ERROR
–0.04
–0.06
–1.0
VDD = 5V
TA = 25°C
INTERNAL REFERENCE = 2.5V
3.2
3.7
4.2
11954-034
–0.10
2.7
OFFSET ERROR
0
4.7
–1.5
2.7
5.2
VDD = 5V
TA = 25°C
INTERNAL REFERENCE = 2.5V
3.2
3.7
4.2
11954-037
0
–0.08
ZERO CODE ERROR
0.5
ERROR (mV)
ERROR (% OF FSR)
0.06
4.7
5.2
SUPPLY VOLTAGE (V)
SUPPLY VOLTAGE (V)
Figure 28. AD5672R Gain Error and Full-Scale Error vs. Supply Voltage
Figure 31. AD5676R Zero Code Error and Offset Error vs. Supply Voltage
Rev. B | Page 16 of 34
Data Sheet
AD5672R/AD5676R
1.5
6
0xFFFF
5
1.0
ZERO CODE ERROR
4
0xC000
3
VOUT (V)
ERROR (mV)
0.5
OFFSET ERROR
0
0x8000
2
0x4000
1
–0.5
0x0000
0
–1.5
2.7
3.2
3.7
–1
11954-038
VDD = 5V
TA = 25°C
INTERNAL REFERENCE = 2.5V
4.2
4.7
–2
–0.06
5.2
11954-042
–1.0
–0.04
–0.02
0.02
0.04
0.06
Figure 35. Source and Sink Capability at 5 V
Figure 32. AD5672R Zero Code Error and Offset Error vs. Supply Voltage
4.0
70
VDD = 5V
TA = 25°C
INTERNAL REFERENCE = 2.5V
60
3.5
3.0
50
0xFFFF
2.5
VOUT (V)
HITS
0
LOAD CURRENT (A)
SUPPLY VOLTAGE (V)
40
30
2.0
0xC000
1.5
0x8000
1.0
0x4000
0.5
20
0x0000
11954-039
–0.5
–1.0
–0.06
1895
1880
1865
1850
1835
1820
1805
1790
1775
1760
1745
1730
1715
1700
0
11954-043
0
10
–0.04
–0.02
0
0.02
LOAD CURRENT (A)
0.04
0.06
IDD FULL SCALE (µA)
Figure 36. Source and Sink Capability at 3 V
Figure 33. Supply Current (IDD) Histogram with Internal Reference
1.6
1.4
SINKING, VDD = –2.7V
SINKING, VDD = –3.0V
SINKING, VDD = –5.0V
SOURCING, VDD = –5.0V
SOURCING, VDD = –3.0V
SOURCING, VDD = –2.7V
1.0
IDD (mA)
1.4
0.2
–0.2
1.3
1.2
–0.6
–1.4
0
0.005
0.010
0.015
0.020
0.025
11954-044
1.1
–1.0
11954-041
ΔVOUT (V)
0.6
U1284
U1285
U1286
1.5
1.0
0
0.030
LOAD CURRENT (A)
10000
20000
30000
40000
CODE
50000
Figure 37. Supply Current (IDD) vs. Code
Figure 34. Headroom/Footroom (ΔVOUT) vs. Load Current
Rev. B | Page 17 of 34
60000
70000
AD5672R/AD5676R
Data Sheet
2.0
2.0
1.8
1.8
FULL-SCALE
1.6
1.6
DAC 1
DAC 2
DAC 3
DAC 4
DAC 5
DAC 5
DAC 7
DAC 8
1.4
ZERO CODE
1.2
1.0
VOUT (V)
IDD (mA)
1.4
1.2
1.0
0.8
EXTERNAL REFERENCE, FULL-SCALE
0.6
0.4
–20
0
20
40
60
80
100
0.2
0
80
120
100
120
TEMPERATURE (°C)
Figure 38. Supply Current (IDD) vs. Temperature
6
1.8
5
1.6
200
0.005
VDD (V)
VOUT0 (V)
VOUT1 (V)
VOUT2 (V)
VOUT3 (V)
VOUT4 (V)
VOUT5 (V)
VOUT6 (V)
VOUT7 (V)
1.4
3
VDD (V)
IDD (mA)
180
0.006
4
FULL-SCALE
ZERO CODE
2
EXTERNAL REFERENCE, FULL-SCALE
1.0
160
Figure 41. Full-Scale Settling Time
2.0
1.2
140
TIME (µs)
0.004
0.003
VOUT (V)
0.4
–40
11954-045
0.6
VDD = 5.5V
GAIN = +1
INTERNAL REFERENCE = 2.5V
1/4 TO 3/4 SCALE
11954-048
0.8
0.002
1
0.001
0
0
0.4
2.7
11954-046
0.6
3.2
3.7
4.2
4.7
–1
5.2
0
2
4
6
8
11954-049
0.8
–0.001
10
TIME (ms)
SUPPLY VOLTAGE (V)
Figure 39. Supply Current (IDD) vs. Supply Voltage
Figure 42. Power-On Reset to 0 V and Midscale
3.0
2.2
2.0
MIDSCALE, GAIN = 2
2.5
FULL-SCALE
1.8
2.0
VOUT (V)
1.4
ZERO CODE
1.2
1.0
EXTERNAL REFERENCE, FULL-SCALE
1.5
MIDSCALE, GAIN = 1
1.0
0.5
0.6
0.4
2.7
3.2
3.7
4.2
4.7
0
–5
5.2
SUPPLY VOLTAGE (V)
VDD = 5V
TA = 25°C
INTERNAL REFERENCE = 2.5V
0
5
TIME (µs)
Figure 40. Supply Current (IDD) vs. Zero Code and Full-Scale
Figure 43. Exiting Power-Down to Midscale
Rev. B | Page 18 of 34
10
11954-050
0.8
11954-047
IDD (mA)
1.6
Data Sheet
AD5672R/AD5676R
0.004
0.003
0.002
1
VOUT (V)
0.001
0
–0.003
–0.004
15
16
17
18
19
20
2
CH1 50.0mV
22
21
11954-054
VDD = 5V
GAIN = 1
TD = 25°C
REFERENCE = 2.5V
CODE = 7FFF TO 8000
ENERGY = 1.209376nV-s
–0.002
11954-051
–0.001
M1.00s
A CH1
401mV
TIME (µs)
Figure 44. Digital-to-Analog Glitch Impulse
Figure 47. 0.1 Hz to 10 Hz Output Noise
0.003
1200
VDD = 5V
TA = 25°C
GAIN = 1
INTERNAL REFERENCE = 2.5V
0.002
1000
0.001
800
NSD (nV/√Hz)
VOUT (V)
0
–0.001
CHANNEL 1
CHANNEL 2
CHANNEL 3
CHANNEL 4
CHANNEL 5
CHANNEL 6
CHANNEL 7
–0.002
–0.003
–0.004
FULL SCALE
MID SCALE
ZERO SCALE
600
400
11954-052
–0.006
0
2
4
6
8
10
12
14
16
18
11954-055
200
–0.005
0
10
20
100
1k
10k
FREQUENCY (Hz)
TIME (µs)
Figure 45. Analog Crosstalk
1M
Figure 48. Noise Spectral Density (NSD)
0.012
0
CHANNEL 1
CHANNEL 2
CHANNEL 3
CHANNEL 4
CHANNEL 5
CHANNEL 6
CHANNEL 7
0.010
0.008
0.006
VDD = 5V
TA = 25°C
INTERNAL REFERENCE = 2.5V
–20
–40
–60
THD (dBV)
0.004
0.002
0
–0.002
–80
–100
–120
–0.004
–140
–0.006
–0.008
–0.010
0
2
4
6
8
10
12
14
16
18
–160
11954-056
11954-053
VOUT (V)
100k
–180
0
20
TIME (µs)
2
4
6
8
10
12
14
16
18
FREQUENCY (kHz)
Figure 46. DAC-to-DAC Crosstalk
Figure 49. Total Harmonic Distortion (THD) at 1 kHz
Rev. B | Page 19 of 34
20
AD5672R/AD5676R
Data Sheet
2.0
1600
1.8
CL = 0nF
CL = 0.1nF
CL = 1nF
CL = 4.7nF
CL = 10nF
VOUT (V)
1.7
1.6
1.5
1.4
1.3
11954-057
1.2
1.1
1.0
0.10
0.11
0.12
0.13
0.14
0.15
0.16
0.17
0.18
0.19
1400
1200
VDD = 5V
TA = 25°C
1000
800
600
400
200
11954–061
INTERNAL REFERENCE NSD (nV/√Hz)
1.9
0
10
0.20
100
1k
TIME (ms)
Figure 50. Settling Time vs. Capacitive Load
100k
1M
Figure 53. Internal Reference NSD vs. Frequency
2.5020
2.0
1.8
2.5015
DEVICE1
DEVICE2
DEVICE3
DEVICE4
DEVICE5
1.6
2.5010
DAC 1
DAC 2
DAC 3
DAC 4
DAC 5
DAC 6
DAC 7
DAC 8
1.2
1.0
0.8
2.5005
VREF (V)
1.4
VOUT (V)
10k
FREQUENCY (Hz)
2.5000
2.4995
0.6
2.4990
0.4
0
80
100
120
140
160
180
2.4980
–40
200
Figure 51. Settling Time, 5.5 V
MIDSCALE,MIDSCALE,
GAINGAIN
= 1= 1
VOUT AT ZS (V)
RESET
0.1
1
ZERO SCALE, GAIN = 1
40
TIME (µs)
0
60
11954-059
VOUT AT MS (V)
0.2
2
20
0
20
40
60
80
100
120
Figure 54. Internal Reference Voltage (VREF) vs. Temperature (A Grade)
0.3
3
0
–20
TEMPERATURE (°C)
TIME (µs)
0
–20
11954-062
2.4985
11954-058
0.2
Figure 52. Hardware Reset
Rev. B | Page 20 of 34
Data Sheet
AD5672R/AD5676R
2.50050
2.5020
TA = 25°C
DEVICE1
DEVICE2
DEVICE3
DEVICE4
DEVICE5
2.5015
2.5010
2.50045
2.50035
2.50025
2.4990
2.50020
2.4985
2.50015
–20
0
20
40
60
80
100
120
Figure 55. Internal Reference Voltage (VREF) vs. Temperature (B Grade)
2.5035
VDD = 5V
TA = 25°C
2.5025
2.5020
2.5015
2.5010
2.5005
11954-064
2.5000
2.4995
–0.035
–0.025
–0.015
–0.005
0.005
0.015
LOAD CURRENT (A)
2.50010
2.5
3.0
3.5
4.0
4.5
5.0
5.5
VDD (V)
TEMPERATURE (°C)
VREF (V)
DEVICE3
2.4995
2.4980
–40
DEVICE2
2.50030
11954-065
VREF (V)
2.5000
11954-063
VREF (V)
2.5005
2.5030
DEVICE1
2.50040
0.025
0.035
Figure 56. Internal Reference Voltage (VREF) vs. Load Current and Supply
Voltage (VDD)
Rev. B | Page 21 of 34
Figure 57. Internal Reference Voltage (VREF) vs. Supply Voltage (VDD)
AD5672R/AD5676R
Data Sheet
TERMINOLOGY
Relative Accuracy or Integral Nonlinearity (INL)
For the DAC, relative accuracy or integral nonlinearity is a
measurement of the maximum deviation, in LSBs, from a straight
line passing through the endpoints of the DAC transfer function.
Differential Nonlinearity (DNL)
Differential nonlinearity is the difference between the measured
change and the ideal 1 LSB change between any two adjacent
codes. A specified differential nonlinearity of ±1 LSB maximum
ensures monotonicity. These DACs are guaranteed monotonic
by design.
Zero Code Error
Zero code error is a measurement of the output error when zero
code (0x0000) is loaded to the DAC register. The ideal output is
0 V. The zero code error is always positive because the output of
the DAC cannot go below 0 V due to a combination of the offset
errors in the DAC and the output amplifier. Zero code error is
expressed in mV.
Full-Scale Error
Full-scale error is a measurement of the output error when fullscale code (0xFFFF) is loaded to the DAC register. The ideal
output is VDD − 1 LSB. Full-scale error is expressed in percent of
full-scale range (% of FSR).
Gain Error
Gain error is a measure of the span error of the DAC. It is the
deviation in slope of the DAC transfer characteristic from the
ideal expressed as % of FSR.
Offset Error Drift
Offset error drift is a measurement of the change in offset error
with a change in temperature. It is expressed in µV/°C.
Offset Error
Offset error is a measure of the difference between VOUT (actual)
and VOUT (ideal) expressed in mV in the linear region of the
transfer function. Offset error is measured with Code 256
loaded in the DAC register. It can be negative or positive.
DC Power Supply Rejection Ratio (PSRR)
The dc power supply rejection ratio indicates how the output of
the DAC is affected by changes in the supply voltage. PSRR is
the ratio of the change in VOUT to a change in VDD for full-scale
output of the DAC. It is measured in mV/V. VREF is held at 2 V,
and VDD is varied by ±10%.
Output Voltage Settling Time
The output voltage settling time is the amount of time it takes
for the output of a DAC to settle to a specified level for a ¼ to ¾
full-scale input change and is measured from the rising edge
of SYNC.
Digital-to-Analog Glitch Impulse
Digital-to-analog glitch impulse is the impulse injected into the
analog output when the input code in the DAC register changes
state. It is normally specified as the area of the glitch in nV-sec,
and is measured when the digital input code is changed by
1 LSB at the major carry transition (0x7FFF to 0x8000).
Digital Feedthrough
Digital feedthrough is a measure of the impulse injected into the
analog output of the DAC from the digital inputs of the DAC,
but is measured when the DAC output is not updated. It is
specified in nV-sec, and measured with a full-scale code change
on the data bus, that is, from all 0s to all 1s and vice versa.
Reference Feedthrough
Reference feedthrough is the ratio of the amplitude of the signal
at the DAC output to the reference input when the DAC output
is not being updated. It is expressed in dB.
Noise Spectral Density
Noise spectral density is a measurement of the internally
generated random noise. Random noise is characterized as a
spectral density (nV/√Hz). It is measured by loading the DAC
to midscale and measuring noise at the output. It is measured in
nV/√Hz.
DC Crosstalk
DC crosstalk is the dc change in the output level of one DAC in
response to a change in the output of another DAC. It is measured
with a full-scale output change on one DAC (or soft power-down
and power-up) while monitoring another DAC kept at midscale. It
is expressed in μV.
DC crosstalk due to load current change is a measure of the
impact that a change in load current on one DAC has on
another DAC kept at midscale. It is expressed in μV/mA.
Digital Crosstalk
Digital crosstalk is the glitch impulse transferred to the output
of one DAC at midscale in response to a full-scale code change
(all 0s to all 1s and vice versa) in the input register of another
DAC. It is measured in standalone mode and is expressed in
nV-sec.
Rev. B | Page 22 of 34
Data Sheet
AD5672R/AD5676R
Analog Crosstalk
Analog crosstalk is the glitch impulse transferred to the output
of one DAC due to a change in the output of another DAC. It is
measured by first loading one of the input registers with a fullscale code change (all 0s to all 1s and vice versa). Then, execute
a software LDAC and monitor the output of the DAC whose
digital code was not changed. The area of the glitch is expressed
in nV-sec.
DAC-to-DAC Crosstalk
DAC-to-DAC crosstalk is the glitch impulse transferred to the
output of one DAC due to a digital code change and subsequent
analog output change of another DAC. It is measured by
loading the attack channel with a full-scale code change (all 0s
to all 1s and vice versa), using the write to and update commands
while monitoring the output of the victim channel that is at
midscale. The energy of the glitch is expressed in nV-sec.
Multiplying Bandwidth
The multiplying bandwidth is a measure of the finite bandwidth
of the amplifiers within the DAC. A sine wave on the reference
(with full-scale code loaded to the DAC) appears on the output.
The multiplying bandwidth is the frequency at which the output
amplitude falls to 3 dB below the input.
Total Harmonic Distortion (THD)
THD is the difference between an ideal sine wave and its
attenuated version using the DAC. The sine wave is used as the
reference for the DAC, and the THD is a measurement of the
harmonics present on the DAC output. It is measured in dB.
Voltage Reference Temperature Coefficient (TC)
Voltage reference TC is a measure of the change in the reference
output voltage with a change in temperature. The reference TC
is calculated using the box method, which defines the TC as the
maximum change in the reference output over a given temperature range expressed in ppm/°C, as follows:
 VREF ( MAX ) − VREF ( MIN ) 
6
TC = 
 × 10
×
Range
V
Temp
 REF ( NOM )

where:
VREF (MAX) is the maximum reference output measured over the
total temperature range.
VREF (MIN) is the minimum reference output measured over the
total temperature range.
VREF (NOM) is the nominal reference output voltage, 2.5 V.
Temp Range is the specified temperature range of −40°C to
+125°C.
Rev. B | Page 23 of 34
AD5672R/AD5676R
Data Sheet
THEORY OF OPERATION
DIGITAL-TO-ANALOG CONVERTER
VREF
The AD5672R/AD5676R are octal, 12-/16-bit, serial input,
voltage output DACs with an internal reference. The devices
operate from supply voltages of 2.7 V to 5.5 V. Data is written to
the AD5672R/AD5676R in a 24-bit word format via a 3-wire
serial interface. The AD5672R/AD5676R incorporate a poweron reset circuit to ensure that the DAC output powers up to a
known output state. The devices also have a software powerdown mode that reduces the typical current consumption to 1 µA.
R
R
R
TO OUTPUT
AMPLIFIER
TRANSFER FUNCTION
The internal reference is on by default.
R
DAC ARCHITECTURE
The AD5672R/AD5676R implement a segmented string DAC
architecture with an internal output buffer. Figure 58 shows the
internal block diagram.
VREF
REF (+)
RESISTOR
STRING
REF (–)
GND
Internal Reference
The AD5672R/AD5676R on-chip reference is enabled at powerup, but can be disabled via a write to the control register. See the
Internal Reference Setup section for details.
The AD5672R/AD5676R have a 2.5 V, 2 ppm/°C reference, giving
a full-scale output of 2.5 V or 5 V, depending on the state of the
GAIN pin or gain bit. The internal reference associated with the
device is available at the VREFOUT pin. This buffered reference is
capable of driving external loads of up to 15 mA.
Output Amplifiers
The output amplifiers can drive a load of 1 kΩ in parallel with
10 nF to GND. The slew rate is 0.8 V/µs with a typical ¼ to ¾
scale settling time of 5 µs.
VOUTX
GAIN
(GAIN = 1 OR 2)
11954-066
DAC
REGISTER
Figure 59. Resistor String Structure
The output buffer amplifier generates rail-to-rail voltages on its
output. The actual range depends on the value of VREF, the gain
setting, the offset error, and the gain error.
2.5V
REF
INPUT
REGISTER
R
11954-067
The gain of the output amplifier can be set to ×1 or ×2 using the
gain select pin (GAIN) on the TSSOP or the gain bit on the LFCSP.
When the GAIN pin is tied to GND, all eight DAC outputs have
a span from 0 V to VREF. When the GAIN pin is tied to VLOGIC,
all eight DACs output a span of 0 V to 2 × VREF. When using the
LFCSP, the gain bit in the internal reference and gain setup
register is used to set the gain of the output amplifier. The gain
bit is 0 by default. When the gain bit is 0, the output span of all
eight DACs is 0 V to VREF. When the gain bit is 1, the output span
of all eight DACs is 0 V to 2 × VREF. The gain bit is ignored on
the TSSOP.
Figure 58. Single DAC Channel Architecture Block Diagram
Figure 59 shows the resistor string structure. The code loaded to
the DAC register determines the node on the string where the
voltage is tapped off and fed into the output amplifier. The voltage
is tapped off by closing one of the switches and connecting the
string to the amplifier. Because each resistance in the string has
same value, R, the string DAC is guaranteed monotonic.
Rev. B | Page 24 of 34
Data Sheet
AD5672R/AD5676R
SERIAL INTERFACE
Table 10. Command Definitions
The AD5672R/AD5676R use a 3-wire serial interface (SYNC,
SCLK, and SDI that is compatible with SPI, QSPI™, and
MICROWIRE interface standards, as well as most DSPs. See
Figure 2 for a timing diagram of a typical write sequence. The
AD5672R/AD5676R contain an SDO pin to allow the user to
daisy-chain multiple devices together (see the Daisy-Chain
Operation section) or for readback.
C3
0
0
Input Shift Register
The input shift register of the AD5672R/AD5676R is 24 bits
wide. Data is loaded MSB first (DB23), and the first four bits are
the command bits, C3 to C0 (see Table 10), followed by the 4bit DAC address bits, A3 to A0 (see Table 11), and finally, the
bit data-word.
The data-word comprises 12-bit or 16-bit input code, followed by
zero or four don’t care bits for the AD5676R and AD5672R,
respectively (see Figure 60 and Figure 61). These data bits are
transferred to the input register on the 24 falling edges of SCLK
and are updated on the rising edge of SYNC.
Commands execute on individual DAC channels, combined DAC
channels, or on all DACs, depending on the address bits selected.
Command
C2 C1 C0
0
0
0
0
0
1
0
0
1
0
0
0
0
0
0
1
0
1
1
1
1
0
1
0
0
1
1
0
1
0
1
0
1
0
1
0
0
1
1
0
1
0
1
0
1
1
1
…
1
1
…
1
0
…
1
0
…
1
Description
No operation
Write to Input Register n where n = 1 to 8,
depending on the DAC selected from the
address bits in Table 11 (dependent
on LDAC)
Update DAC Register n with contents of
Input Register n
Write to and update DAC Channel n
Power down/power up the DAC
Hardware LDAC mask register
Software reset (power-on reset)
Internal reference and gain setup register
Set up the DCEN register (daisy-chain
enable)
Set up the readback register (readback
enable)
Update all channels of the input register
simultaneously with the input data
Update all channels of the DAC register
and input register simultaneously with
the input data
Reserved
Reserved
Table 11. Address Commands
A3
0
0
0
0
0
0
0
0
Selected Channel1
DAC 0
DAC 1
DAC 2
DAC 3
DAC 4
DAC 5
DAC 6
DAC 7
A0
0
1
0
1
0
1
0
1
Any combination of DAC channels can be selected using the address bits.
DB0 (LSB)
DB23 (MSB)
C3
C2
C1
C0
A3
A2
A1
A0
D11
D10
D9
D8
D7
D6
D5
D4
D3
D2
D1
D0
X
X
X
X
DATA BITS
ADDRESS BITS
11954-068
COMMAND BITS
Figure 60. AD5672R Input Shift Register Content
DB23 (MSB)
C3
C2
DB0 (LSB)
C1
C0
A3
A2
A1
A0
D15
D14
D13
D12
D11
D10
D9
D8
D7
D6
D5
D4
D3
D2
D1
D0
DATA BITS
COMMAND BITS
ADDRESS BITS
11954-069
1
Channel Address[3:0]
A1
0
0
1
1
0
0
1
1
A2
0
0
0
0
1
1
1
1
Figure 61. AD5676R Input Shift Register Content
Rev. B | Page 25 of 34
AD5672R/AD5676R
Data Sheet
STANDALONE OPERATION
68HC11*
Bring the SYNC line low to begin the write sequence. Data from
the SDI line is clocked into the 24-bit input shift register on the
falling edge of SCLK. After the last of 24 data bits is clocked in,
bring SYNC high. The programmed function is then executed,
that is, an LDAC-dependent change in DAC register contents
and/or a change in the mode of operation. If SYNC is taken
high at a clock before the 24th clock, it is considered a valid
frame, and invalid data is loaded to the DAC. Bring SYNC high
for a minimum of 20 ns (single channel, see t8 in Figure 2)
before the next write sequence so that a falling edge of SYNC
can initiate the next write sequence. Idle SYNC at rails between
write sequences for even lower power operation. The SYNC line
is kept low for 24 falling edges of SCLK, and the DAC is
updated on the rising edge of SYNC.
MOSI
SDI
SCK
SCLK
PC7
SYNC
PC6
LDAC
SDO
MISO
SDI
AD5672R/
AD5676R
SCLK
SYNC
LDAC
SDO
When data is transferred into the input register of the addressed
DAC, all DAC registers and outputs update by taking LDAC low
while the SYNC line is high.
SDI
AD5672R/
AD5676R
SCLK
WRITE AND UPDATE COMMANDS
SYNC
Write to Input Register n (Dependent on LDAC)
Update DAC Register n with Contents of Input Register n
Command 0010 loads the DAC registers and outputs with the
contents of the input registers selected and updates the DAC
outputs directly.
Write to and Update DAC Channel n (Independent of LDAC)
Command 0011 allows the user to write to the DAC registers
and updates the DAC outputs directly. Bit D7 to Bit D0
determine which DACs have data from the input register
transferred to the DAC register. Setting a bit to 1 transfers data
from the input register to the appropriate DAC register.
DAISY-CHAIN OPERATION
For systems that contain several DACs, the SDO pin can daisychain several devices together and is enabled through a software
executable daisy-chain enable (DCEN) command. Command
1000 is reserved for this DCEN function (see Table 10). The
daisy-chain mode is enabled by setting Bit DB0 in the DCEN
register. The default setting is standalone mode, where DB0 = 0.
Table 12 shows how the state of the bit corresponds to the mode
of operation of the device.
SDO
11954-070
LDAC
Command 0001 allows the user to write the dedicated input
register of each DAC individually. When LDAC is low, the input
register is transparent, if not controlled by the LDAC mask
register.
Figure 62. Daisy-Chaining the AD5672R/AD5676R
The SCLK pin is continuously applied to the input shift register
when SYNC is low. If more than 24 clock pulses are applied, the
data ripples out of the input shift register and appears on the
SDO line. This data is clocked out on the rising edge of SCLK
and is valid on the falling edge. By connecting this line to the
SDI input on the next DAC in the chain, a daisy-chain interface is
constructed. Each DAC in the system requires 24 clock pulses.
Therefore, the total number of clock cycles must equal 24 × N,
where N is the total number of devices updated. If SYNC is
taken high at a clock that is not a multiple of 24, it is considered
a valid frame, and invalid data may be loaded to the DAC.
When the serial transfer to all devices is complete, SYNC goes
high, which latches the input data in each device in the daisy
chain and prevents any further data from being clocked into the
input shift register. The serial clock can be continuous or a gated
clock. If SYNC is held low for the correct number of clock
cycles, a continuous SCLK source is used. In gated clock mode,
use a burst clock containing the exact number of clock cycles,
and take SYNC high after the final clock to latch the data.
Table 12. Daisy-Chain Enable (DCEN) Register
DB0
0
1
AD5672R/
AD5676R
Description
Standalone mode (default)
DCEN mode
Rev. B | Page 26 of 34
Data Sheet
AD5672R/AD5676R
READBACK OPERATION
Table 13. Modes of Operation
Readback mode is invoked through a software executable
readback command. If the SDO output is disabled via the daisychain mode disable bit in the control register, it is automatically
enabled for the duration of the read operation, after which it is
disabled again. Command 1001 is reserved for the readback
function. This command, in association with the address bits
A3 to A0, selects the DAC input register to read (see Table 10
and Table 11). Note that, during readback, only one input
register can be selected. The remaining data bits in the write
sequence are don’t care bits. During the next SPI write, the data
appearing on the SDO output contains the data from the
previously addressed register.
Operating Mode
Normal Operation
Power-Down Modes
1 kΩ to GND
Tristate
1.
2.
Write 0x900000 to the AD5672R/AD5676R input register.
This configures the device for read mode with the DAC
register of Channel 0 selected. Note that all data bits, DB15
to DB0, are don’t care bits.
Follow this with a second write, a no operation (NOP)
condition, 0x000000. During this write, the data from the
register is clocked out on the SDO line. DB23 to DB20
contain undefined data, and the last 16 bits contain the
DB19 to DB4 DAC register contents.
0
1
1
1
When both Bit PD1 and Bit PD0 in the input shift register are set to
0, the device works normally with a typical power consumption of
1 mA at 5 V. However, for the two power-down modes, the
supply current typically falls to 1 µA. In addition to this fall, the
output stage switches internally from the amplifier output to a
resistor network of known values. This has the advantage that the
output impedance of the devices is known while the devices are
in power-down mode. There are two different power-down
options. The output is either connected internally to GND
through a 1 kΩ resistor or it is left open-circuited (tristate).
Figure 63 shows the output stage.
DAC
AMPLIFIER
POWER-DOWN
CIRCUITRY
When SYNC is high, the SDO pin is driven by a weak latch that
holds the last data bit. The SDO pin can be overdriven by the
SDO pin of another device, thus allowing multiple devices to be
read using the same SPI interface.
PD0
0
VOUT
RESISTOR
NETWORK
11954-071
For example, to read back the DAC register for Channel 0,
implement the following sequence:
PD1
0
Figure 63. Output Stage During Power-Down
POWER-DOWN OPERATION
The AD5672R/AD5676R contain two separate power-down
modes. Command 0100 is designated for the power-down
function (see Table 10). These power-down modes are software
programmable by setting 16 bits, Bit DB15 to Bit DB0, in the
input shift register. There are two bits associated with each DAC
channel. Table 13 shows how the state of the two bits corresponds
to the mode of operation of the device.
The bias generator, output amplifier, resistor string, and other
associated linear circuitry shut down when power-down mode is
activated. However, the contents of the DAC register are unaffected
when in power-down. The DAC register updates while the device
is in power-down mode. The time required to exit power-down is
typically 2.5 µs for VDD = 5 V.
To reduce the current consumption further, power off the on-chip
reference. See the Internal Reference Setup section.
Any or all DACs (DAC A to DAC D) power down to the
selected mode by setting the corresponding bits. See Table 14
for the contents of the input shift register during the powerdown/power-up operation.
Table 14. 24-Bit Input Shift Register Contents of Power-Down/Power-Up Operation
[DB23:DB20]
0100
1
DB19
0
[DB18:DB16]
XXX 1
DAC 7
[DB15: B14]
[PD1:PD0]
DAC 6
[DB13: B12]
[PD1:PD0]
DAC 5
[DB11: B10]
[PD1:PD0]
DAC 4
[DB9:DB8]
[PD1:PD0]
X means don’t care
Rev. B | Page 27 of 34
DAC 3
[DB7:DB6]
[PD1:PD0]
DAC 2
[DB5:DB4]
[PD1:PD0]
DAC 1
[DB3:DB2]
[PD1:PD0]
DAC 0
[DB1:DB0]
[PD1:PD0]
AD5672R/AD5676R
Data Sheet
LOAD DAC (HARDWARE LDAC PIN)
Deferred DAC Updating (LDAC is Pulsed Low)
The AD5672R/AD5676R DACs have double buffered interfaces
consisting of two banks of registers: input registers and DAC
registers. The user can write to any combination of the input
registers. Updates to the DAC register are controlled by
the LDAC pin.
LDAC is held high while data is clocked into the input register
using Command 0001. All DAC outputs are asynchronously
updated by taking LDAC low after SYNC is taken high. The
update now occurs on the falling edge of LDAC.
Instantaneous DAC Updating (LDAC Held Low)
Command 0101 is reserved for this software LDAC function.
Address bits are ignored. Writing to the DAC, using
Command 0101, loads the 8-bit LDAC register (DB7 to DB0).
The default for each channel is 0; that is, the LDAC pin works
normally. Setting the bits to 1 forces this DAC channel to ignore
transitions on the LDAC pin, regardless of the state of the
hardware LDAC pin. This flexibility is useful in applications
where the user wishes to select which channels respond to
the LDAC pin.
LDAC is held low while data is clocked into the input register
using Command 0001. Both the addressed input register and
the DAC register are updated on the rising edge of SYNC and
the output begins to change (see Table 16).
AMPLIFIER
VREF
12-/16-BIT
DAC
LDAC
DAC
REGISTER
VOUTX
The LDAC register gives the user extra flexibility and control
over the hardware LDAC pin (see Table 15). Setting the LDAC
bits (DB0 to DB7) to 0 for a DAC channel means that this
channel update is controlled by the hardware LDAC pin.
SCL
11954-172
INPUT
REGISTER
SDA
LDAC MASK REGISTER
INTERFACE
LOGIC
Figure 64. Simplified Diagram of Input Loading Circuitry for a Single DAC
Table 15. LDAC Overwrite Definition
Load LDAC Register
LDAC Bits (DB7 to DB0)
LDAC Pin
LDAC Operation
00000000
11111111
1 or 0
X1
Determined by the LDAC pin.
DAC channels update and override the LDAC pin. DAC channels see LDAC as 1.
1
X means don’t care.
Table 16. Write Commands and LDAC Pin Truth Table 1
Command
0001
Description
Write to Input Register n
(dependent on LDAC)
0010
Update DAC Register n
with contents of Input
Register n
Write to and update DAC
Channel n
0011
Hardware LDAC Pin State
VLOGIC
GND 2
VLOGIC
GND
Input Register Contents
Data update
Data update
No change
No change
DAC Register Contents
No change (no update)
Data update
Updated with input register contents
Updated with input register contents
VLOGIC
GND
Data update
Data update
Data update
Data update
A high to low hardware LDAC pin transition always updates the contents of the contents of the DAC register with the contents of the input register on channels that
are not masked (blocked) by the LDAC mask register.
2
When LDACis permanently tied low, the LDAC mask bits are ignored.
1
Rev. B | Page 28 of 34
Data Sheet
AD5672R/AD5676R
HARDWARE RESET (RESET)
SOLDER HEAT REFLOW
The RESET pin is an active low reset that allows the outputs to
be cleared to either zero scale or midscale. The clear code value
is user selectable via the RESET select pin. It is necessary to
keep the RESET pin low for a minimum time (see Table 5) to
complete the operation. When the RESET signal is returned
high, the output remains at the cleared value until a new value is
programmed. While the RESET pin is low, the outputs cannot
be updated with a new value. A software executable reset function
is also available, which resets the DAC to the power-on reset code.
Command 0110 is designated for this software reset function (see
Table 10). Any events on the LDAC or RESET pins during poweron reset are ignored.
As with all IC reference voltage circuits, the reference value
experiences a shift induced by the soldering process. Analog
Devices, Inc. performs a reliability test called precondition to
mimic the effect of soldering a device to a board. The output
voltage specification quoted previously includes the effect of
this reliability test.
Figure 65 shows the effect of solder heat reflow (SHR) as
measured through the reliability test (precondition).
35
HITS
RESET SELECT PIN (RSTSEL)
The AD5672R/AD5676R contain a power-on reset circuit that
controls the output voltage during power-up. By connecting the
RSTSEL pin low, the output powers up to zero scale. Note that
this is outside the linear region of the DAC; by connecting the
RSTSEL pin high, VOUTx power up to midscale. The output
remains powered up at this level until a valid write sequence is
made to the DAC. The RSTSEL pin is only available on the
TSSOP. When the AD5672R/AD5676R LFCSP is used, the
outputs power up to 0 V
AMPLIFIER GAIN SELECTION ON LFCSP
The output amplifier gain setting for the LFCSP is determined
by the state of the DB2 bit in the internal reference and gain
setup register (see Table 17 and Table 18).
25
PRESOLDER
HEAT REFLOW
20
10
11954-073
5
0
2.497
2.498
2.499
2.500
2.501
2.502
VREF (V)
Figure 65. Solder Heat Reflow Reference Voltage Shift
LONG-TERM TEMPERATURE DRIFT
Figure 66 shows the change in VREF value after 1000 hours in the
life test at 150°C.
70
0 HOURS
168 HOURS
500 HOURS
1000 HOURS
60
The on-chip reference is on at power-up by default. To reduce
the supply current, turn off this reference by setting the software
programmable bit, DB0, in the control register. Table 17 shows
how the state of the bit corresponds to the mode of operation.
Command 0111 is reserved for setting up the internal reference
and the gain setting on the LFCSP (see Table 10).
50
HITS
40
30
20
Table 17. Internal Reference and Gain Setup Register
DB0
POSTSOLDER
HEAT REFLOW
15
INTERNAL REFERENCE SETUP
10
Description
Amplifier gain setting
DB2 = 0: amplifier gain = 1 (default)
DB2 = 1: amplifier gain = 2
Reference enable
DB0 = 0: internal reference enabled (default)
DB0 = 1: internal reference disabled
11954-074
Bit
DB2
30
0
2.498
2.499
2.500
VREF (V)
2.501
2.502
Figure 66. Reference Drift Through to 1000 Hours
Table 18. 24-Bit Input Shift Register Contents for Internal Reference and Gain Setup Command
DB23 (MSB)
0
DB22
1
DB21
1
DB20
1
DB19 to DB3
Don’t care
DB2
Gain
Rev. B | Page 29 of 34
DB1
Reserved. Set to 0
DB0 (LSB)
Reference enable
Data Sheet
AD5672R/AD5676R
THERMAL HYSTERESIS
3
FIRST TEMPERATURE SWEEP
SUBSEQUENT TEMPERATURE SWEEPS
Thermal hysteresis is the voltage difference induced on the
reference voltage by sweeping the temperature from ambient to
cold, to hot, and then back to ambient.
HITS
1
0
–130 –110
11954-075
Figure 67 shows thermal hysteresis data. It is measured by
sweeping the temperature from ambient to −40°C, then to
+125°C, and returning to ambient. The VREF delta, shown in
blue in Figure 67, is then measured between the two ambient
measurements. The same temperature sweep and measurements
were immediately repeated and the results are shown in red in
Figure 67.
2
–90
–70
–50
–30
–10
10
DISTORTION (ppm)
Figure 67. Thermal Hysteresis
Rev. B | Page 30 of 34
30
50
70
Data Sheet
AD5672R/AD5676R
APPLICATIONS INFORMATION
POWER SUPPLY RECOMMENDATIONS
AD5672R/AD5676R TO SPORT INTERFACE
The following supplies typically power the AD5672R/AD5676R:
VDD = 3.3 V and VLOGIC = 1.8 V.
The Analog Devices ADSP-BF527 has one SPORT serial port.
Figure 70 shows how a SPORT interface is used to control the
AD5672R/AD5676R.
LDO
ADP160
LDO
ADSP-BF531
3.3V: VDD
SPORT_TFS
SPORT_TSCK
SPORT_DTO
11954-176
ADP7118
5V
INPUT
AD5672R/
AD5676R
1.8V: VLOGIC
GPIO0
GPIO1
Figure 68. Low Noise Power Solution for the AD5672R/AD5676R
MICROPROCESSOR INTERFACING
AD5672R/AD5676R TO ADSP-BF531 INTERFACE
The SPI interface of the AD5672R/AD5676R can easily
connected to industry-standard DSPs and microcontrollers.
Figure 69 shows the AD5672R/AD5676R connected to the
Analog Devices Blackfin® DSP. The Blackfin has an integrated
SPI port that can connect directly to the SPI pins of the
AD5672R/AD5676R.
AD5672R/
AD5676R
SYNC
SCLK
SDI
In any circuit where accuracy is important, careful consideration
of the power supply and ground return layout helps to ensure
the rated performance. Design the printed circuit board (PCB) on
which the AD5672R/AD5676R are mounted so that the devices
lie on the analog plane.
The AD5672R/AD5676R must have ample supply bypassing of
10 µF in parallel with 0.1 µF on each supply, located as close to
the package as possible, ideally right up against the device. The
10 µF capacitors are tantalum bead type. The 0.1 µF capacitors
must have low effective series resistance (ESR) and low effective
series inductance (ESI), such as the common ceramic types,
which provide a low impedance path to ground at high
frequencies to handle transient currents due to internal logic
switching.
The GND plane on the device can be increased (as shown in
Figure 71) to provide a natural heat sinking effect.
11954-076
LDAC
RESET
LAYOUT GUIDELINES
In systems where there are many devices on one board, it is
often useful to provide some heat sinking capability to allow
the power to dissipate easily.
ADSP-BF531
PF9
PF8
LDAC
RESET
Figure 70. SPORT Interface
Microprocessor interfacing to the AD5672R/AD5676R is
performed via a serial bus that uses a standard protocol
compatible with DSP processors and microcontrollers. The
communications channel requires a 3-wire or 4-wire interface
consisting of a clock signal, a data signal, and a synchronization
signal. The devices require a 24-bit data-word with data valid
on the rising edge of SYNC.
SPISELx
SCK
MOSI
SYNC
SCLK
SDI
11954-077
The ADP7118 can be used to power the VDD pin. The ADP160
can be used to power the VLOGIC pin. Figure 68 shows this setup.
The ADP7118 can operate from input voltages up to 20 V. The
ADP160 can operate from input voltages up to 5.5 V.
AD5672R/
AD5676R
Figure 69. ADSP-BF531 Interface
BOARD
Figure 71. Pad Connection to the Board
Rev. B | Page 31 of 34
11954-078
GND
PLANE
AD5672R/AD5676R
Data Sheet
CONTROLLER
In many process control applications, it is necessary to provide
an isolation barrier between the controller and the unit being
controlled to protect and isolate the controlling circuitry from
any hazardous common-mode voltages that may occur. iCoupler®
products from Analog Devices provide voltage isolation in excess
of 2.5 kV. The serial loading structure of the AD5672R/AD5676R
makes the devices ideal for isolated interfaces because the number
of interface lines is kept to a minimum. Figure 72 shows a
4-channel isolated interface to the AD5672R/AD5676R using
an ADuM1400. For further information, visit
www.analog.com/icoupler.
SERIAL
CLOCK IN
SERIAL
DATA OUT
ADuM14001
VIA
VOA
ENCODE
DECODE
ENCODE
DECODE
ENCODE
DECODE
ENCODE
DECODE
VIB
VOB
VIC
SYNC
LOAD DAC
OUT
1ADDITIONAL
VOC
VID
VOD
PINS OMITTED FOR CLARITY.
Figure 72. Isolated Interface
Rev. B | Page 32 of 34
TO
SCLK
TO
SDI
TO
SYNC
TO
LDAC
11954-079
GALVANICALLY ISOLATED INTERFACE
Data Sheet
AD5672R/AD5676R
OUTLINE DIMENSIONS
6.60
6.50
6.40
20
11
4.50
4.40
4.30
6.40 BSC
1
10
PIN 1
0.65
BSC
1.20 MAX
0.15
0.05
COPLANARITY
0.10
0.30
0.19
0.20
0.09
0.75
0.60
0.45
8°
0°
SEATING
PLANE
COMPLIANT TO JEDEC STANDARDS MO-153-AC
Figure 73. 20-Lead Thin Shrink Small Outline Package [TSSOP]
(RU-20)
Dimensions shown in millimeters
0.30
0.25
0.18
0.50
BSC
PIN 1
INDICATOR
20
16
15
1
EXPOSED
PAD
2.75
2.60 SQ
2.35
11
TOP VIEW
0.80
0.75
0.70
SEATING
PLANE
0.50
0.40
0.30
5
10
6
0.25 MIN
BOTTOM VIEW
0.05 MAX
0.02 NOM
COPLANARITY
0.08
0.20 REF
FOR PROPER CONNECTION OF
THE EXPOSED PAD, REFER TO
THE PIN CONFIGURATION AND
FUNCTION DESCRIPTIONS
SECTION OF THIS DATA SHEET.
COMPLIANT TO JEDEC STANDARDS MO-220-WGGD.
Figure 74. 20-Lead Lead Frame Chip Scale Package [LFCSP_WQ]
4 × 4 mm Body, Very Very Thin Quad
(CP-20-8)
Dimensions shown in millimeters
Rev. B | Page 33 of 34
020509-B
PIN 1
INDICATOR
4.10
4.00 SQ
3.90
AD5672R/AD5676R
Data Sheet
ORDERING GUIDE
Model 1
AD5672RBRUZ
AD5672RBRUZ-REEL7
AD5672RBCPZ-REEL7
AD5672RBCPZ-RL
AD5676RARUZ
AD5676RARUZ REEL7
AD5676RACPZ-REEL7
AD5676RACPZ-RL
AD5676RBRUZ
AD5676RBRUZ-REEL7
AD5676RBCPZ-REEL7
AD5676RBCPZ-RL
EVAL-AD5676RSDZ
1
Resolution
(Bits)
12
12
12
12
16
16
16
16
16
16
16
16
Temperature
Range
−40°C to +125°C
−40°C to +125°C
−40°C to +125°C
−40°C to +125°C
−40°C to +125°C
−40°C to +125°C
−40°C to +125°C
−40°C to +125°C
−40°C to +125°C
−40°C to +125°C
−40°C to +125°C
−40°C to +125°C
Accuracy
(LSB INL)
±1
±1
±1
±1
±8
±8
±8
±8
±3
±3
±3
±3
Typical
Reference Temperature
Coefficient (ppm/°C)
2
2
2
2
5
5
5
5
2
2
2
2
Z = RoHS Compliant Part.
I2C refers to a communications protocol originally developed by Philips Semiconductors (now NXP Semiconductors).
©2014–2015 Analog Devices, Inc. All rights reserved. Trademarks and
registered trademarks are the property of their respective owners.
D11954-0-11/15(B)
Rev. B | Page 34 of 34
Package
Description
20-Lead TSSOP
20-Lead TSSOP
20-Lead LFCSP_WQ
20-Lead LFCSP_WQ
20-Lead TSSOP
20-Lead TSSOP
20-Lead LFCSP_WQ
20-Lead LFCSP_WQ
20-Lead TSSOP
20-Lead TSSOP
20-Lead LFCSP_WQ
20-Lead LFCSP_WQ
Evaluation Board
Package
Option
RU-20
RU-20
CP-20-8
CP-20-8
RU-20
RU-20
CP-20-8
CP-20-8
RU-20
RU-20
CP-20-8
CP-20-8
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