IXYS IXTT4N150HV N-channel enhancement mode fast intrinsic diode Datasheet

Preliminary Technical Information
High Voltage
Power MOSFETs
VDSS
ID25
IXTA4N150HV
IXTT4N150HV
RDS(on)
= 1500V
= 4A
Ω
≤ 6Ω
N-Channel Enhancement Mode
Fast Intrinsic Diode
TO-263
Symbol
Test Conditions
Maximum Ratings
VDSS
TJ = 25°C to 150°C
1500
V
VDGR
TJ = 25°C to 150°C, RGS = 1MΩ
1500
V
VGSS
Continuous
±30
V
VGSM
Transient
±40
V
ID25
TC = 25°C
4
A
IDM
TC = 25°C, Pulse Width Limited by TJM
12
A
IA
EAS
TC = 25°C
TC = 25°C
4
350
A
mJ
dv/dt
IS ≤ IDM, VDD ≤ VDSS, TJ ≤ 150°C
5
V/ns
PD
TC = 25°C
280
W
- 55 ... +150
150
- 55 ... +150
°C
°C
°C
300
260
°C
°C
2.5
4.0
g
g
TJ
TJM
Tstg
TL
TSOLD
Maximum Lead Temperature for Soldering
1.6 mm (0.062in.) from Case for 10s
Weight
TO-263
TO-268
G
S
D (Tab)
TO-268
G
S
D (Tab)
G = Gate
S = Source
D
= Drain
Tab = Drain
Features
z
z
z
z
High Blocking Voltage
High Voltage Package
Fast Intrinsic Diode
Low Package Inductance
Advantages
Symbol
Test Conditions
(TJ = 25°C, Unless Otherwise Specified)
Characteristic Values
Min.
Typ.
Max.
BVDSS
VGS = 0V, ID = 250μA
1500
VGS(th)
VDS = VGS, ID = 250μA
2.5
IGSS
VGS = ±30V, VDS = 0V
IDSS
VDS = VDSS, VGS = 0V
RDS(on)
VGS = 10V, ID = 0.5 • ID25, Note 1
z
z
z
V
5.0
V
±100 nA
TJ = 125°C
© 2013 IXYS CORPORATION, All Rights Reserved
Easy to Mount
Space Savings
High Power Density
10 μA
100 μA
Applications
z
z
z
6
Ω
High Voltage Power Supplies
Capacitor Discharge
Pulse Circuits
DS100534B(04/13)
IXTA4N150HV
IXTT4N150HV
Symbol
Test Conditions
(TJ = 25°C, Unless Otherwise Specified)
gfs
Characteristic Values
Min.
Typ.
Max.
VDS = 20V, ID = 0.5 • ID25, Note 1
2.8
Ciss
Coss
4.6
S
1576
pF
105
pF
35
pF
19
ns
23
ns
42
ns
22
ns
44.5
nC
VGS = 0V, VDS = 25V, f = 1MHz
Crss
td(on)
tr
td(off)
tf
Resistive Switching Times
VGS = 10V, VDS = 0.5 • VDSS, ID = 0.5 • ID25
RG = 5Ω (External)
Qg(on)
Qgs
VGS = 10V, VDS = 0.5 • VDSS, ID = 0.5 • ID25
Qgd
TO-263 (HV) Outline
7.7
nC
21.7
nC
PIN: 1 - Gate
2 - Source
3 - Drain
0.45 °C/W
RthJC
Source-Drain Diode
Symbol
Test Conditions
(TJ = 25°C, Unless Otherwise Specified)
IS
VGS = 0V
ISM
VSD
trr
IRM
QRM
Characteristic Values
Min.
Typ.
Max.
4
A
Repetitive, Pulse Width Limited by TJM
16
A
IF = IS, VGS = 0V, Note 1
1.3
V
IF = 2A, -di/dt = 100A/μs
VR = 100V, VGS = 0V
0.9
μs
15.0
A
6.7
μC
TO-268 (HV) Outline
PIN:
Note
1 - Gate
2 - Source
3 - Drain
1. Pulse test, t ≤ 300μs, duty cycle, d ≤ 2%.
PRELIMANARY TECHNICAL INFORMATION
The product presented herein is under development. The Technical Specifications offered are
derived from a subjective evaluation of the design, based upon prior knowledge and experience, and constitute a "considered reflection" of the anticipated result. IXYS reserves the right
to change limits, test conditions, and dimensions without notice.
IXYS Reserves the Right to Change Limits, Test Conditions, and Dimensions.
IXYS MOSFETs and IGBTs are covered
4,835,592
by one or moreof the following U.S. patents: 4,860,072
4,881,106
4,931,844
5,017,508
5,034,796
5,049,961
5,063,307
5,187,117
5,237,481
5,381,025
5,486,715
6,162,665
6,259,123 B1
6,306,728 B1
6,404,065 B1
6,534,343
6,583,505
6,683,344
6,727,585
7,005,734 B2
6,710,405 B2 6,759,692
7,063,975 B2
6,710,463
6,771,478 B2 7,071,537
7,157,338B2
IXTA4N150HV
IXTT4N150HV
Fig. 1. Output Characteristics @ T J = 25ºC
Fig. 2. Output Characteristics @ T J = 125ºC
5.0
3.5
VGS = 10V
7V
4.5
VGS = 10V
6V
3.0
4.0
6V
2.5
ID - Amperes
ID - Amperes
3.5
3.0
2.5
2.0
1.5
2.0
5V
1.5
1.0
1.0
5V
0.5
0.5
4V
4V
0.0
0.0
0
4
8
12
16
20
24
0
28
5
10
15
20
35
Fig. 3. RDS(on) Normalized to ID = 2A Value vs.
Junction Temperature
Fig. 4. RDS(on) Normalized to ID = 2A Value vs.
Drain Current
40
2.6
VGS = 10V
VGS = 10V
2.4
2.6
TJ = 125ºC
2.2
R DS(on) - Normalized
2.2
I D = 4A
1.8
I D = 2A
1.4
1.0
2.0
1.8
1.6
1.4
1.2
0.6
TJ = 25ºC
1.0
0.8
0.2
-50
-25
0
25
50
75
100
125
0.0
150
0.5
1.0
1.5
2.0
2.5
3.0
3.5
4.0
4.5
5.0
ID - Amperes
TJ - Degrees Centigrade
Fig. 5. Maximum Drain Current vs.
Case Temperature
Fig. 6. Input Admittance
4.5
4.5
4.0
4.0
3.5
3.5
3.0
3.0
ID - Amperes
ID - Amperes
30
VDS - Volts
3.0
R DS(on) - Normalized
25
VDS - Volts
2.5
2.0
2.5
TJ = 125ºC
2.0
25ºC
1.5
1.5
1.0
1.0
0.5
0.5
- 40ºC
0.0
0.0
-50
-25
0
25
50
75
TC - Degrees Centigrade
© 2013 IXYS CORPORATION, All Rights Reserved
100
125
150
3.5
4.0
4.5
5.0
VGS - Volts
5.5
6.0
IXTA4N150HV
IXTT4N150HV
Fig. 8. Forward Voltage Drop of Intrinsic Diode
Fig. 7. Transconductance
9
14
8
12
TJ = - 40ºC
7
IS - Amperes
g f s - Siemens
10
6
25ºC
5
4
125ºC
8
6
TJ = 125ºC
3
4
2
TJ = 25ºC
2
1
0
0
0.0
0.5
1.0
1.5
2.0
2.5
3.0
3.5
4.0
4.5
0.4
0.5
0.6
0.7
ID - Amperes
0.8
0.9
1.0
VSD - Volts
Fig. 10. Capacitance
Fig. 9. Gate Charge
10
10,000
f = 1 MHz
VDS = 750V
I D = 2A
I G = 10mA
Capacitance - PicoFarads
VGS - Volts
8
6
4
1,000
Ciss
Coss
100
2
Crss
0
10
0
5
10
15
20
25
30
35
40
45
0
5
10
15
QG - NanoCoulombs
20
25
30
35
40
VDS - Volts
Fig. 11. Breakdown and Threshold Voltages vs.
Junction Temperature
Fig. 12. Forward-Bias Safe Operating Area
1.2
100
BVDSS
1.1
1.0
0.9
VGS(th)
TC = 25ºC
Single Pulse
RDS(on) Limit
10
ID - Amperes
BVDSS & VGS(th) - Normalized
TJ = 150ºC
25µs
100µs
1
1ms
10ms
100ms
0.1
0.8
DC
0.01
0.7
-50
-25
0
25
50
75
100
125
150
TJ - Degrees Centigrade
IXYS Reserves the Right to Change Limits, Test Conditions, and Dimensions.
10
100
1000
VDS - Volts
10000
IXTA4N150HV
IXTT4N150HV
Fig. 13. Maximum Transient Thermal Impedance
Z(th)JC - ºC / W
1
0.1
0.01
0.00001
0.0001
0.001
0.01
0.1
1
10
Pulse Width - Seconds
© 2013 IXYS CORPORATION, All Rights Reserved
IXYS REF: T_4N150 (4A) 9-12-12-C
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