Am29DL640D Data Sheet This product has been retired and is not available for designs. For new and current designs involving TSOP packages, S29JL064H supersedes Am29DL640D and is the factoryrecommended migration path. Please refer to the S29JL064H datasheet for specifications and ordering information. For new and current designs involving Fine-pitch BGA (FBGA) packages, S29PL064J supersedes Am29DL640D and is the factory-recommended migration path. Please refer to the S29PL064J Datasheet for specifications and ordering information. Availability of this document is retained for reference and historical purposes only. July 2003 The following document specifies Spansion memory products that are now offered by both Advanced Micro Devices and Fujitsu. Although the document is marked with the name of the company that originally developed the specification, these products will be offered to customers of both AMD and Fujitsu. Continuity of Specifications There is no change to this datasheet as a result of offering the device as a Spansion product. Any changes that have been made are the result of normal datasheet improvement and are noted in the document revision summary, where supported. Future routine revisions will occur when appropriate, and changes will be noted in a revision summary. Continuity of Ordering Part Numbers AMD and Fujitsu continue to support existing part numbers beginning with "Am" and "MBM". To order these products, please use only the Ordering Part Numbers listed in this document. For More Information Please contact your local AMD or Fujitsu sales office for additional information about Spansion memory solutions. Publication Number 23695 Revision C Amendment 3 Issue Date December 13, 2005 A D V A N C E I N F O R M A T I O N THIS PAGE LEFT INTENTIONALLY BLANK 2 December 13, 2005 Am29DL640D 64 Megabit (8 M x 8-Bit/4 M x 16-Bit) CMOS 3.0 Volt-only, Simultaneous Read/Write Flash Memory This product has been retired and is not available for designs. For new and current designs involving TSOP packages, S29JL064H supersedes Am29DL640D and is the factory-recommended migration path. Please refer to the S29JL064H datasheet for specifications and ordering information. For new and current designs involving Fine-pitch BGA (FBGA) packages, S29PL064J supersedes Am29DL640D and is the factory-recommended migration path. Please refer to the S29PL064J Datasheet for specifications and ordering information. Availability of this document is retained for reference and historical purposes only. DISTINCTIVE CHARACTERISTICS ARCHITECTURAL ADVANTAGES Simultaneous Read/Write operations — Data can be continuously read from one bank while executing erase/program functions in another bank. — Zero latency between read and write operations Flexible BankTM architecture — Read may occur in any of the three banks not being written or erased. — Four banks may be grouped by customer to achieve desired bank divisions. Boot Sectors — Top and bottom boot sectors in the same device — Any combination of sectors can be erased Manufactured on 0.23 µm process technology Secured Silicon Sector: Extra 256 Byte sector — Factory locked and identifiable: 16 bytes available for secure, random factory Electronic Serial Number; verifiable as factory locked through autoselect function. ExpressFlash option allows entire sector to be available for factory-secured data — Customer lockable: Can be read or programmed just like other sectors. Once locked, data cannot be changed Zero Power Operation — Sophisticated power management circuits reduce power consumed during inactive periods to nearly zero. Compatible with JEDEC standards — Pinout and software compatible with single-power-supply flash standard PACKAGE OPTIONS 63-ball Fine Pitch BGA ■ 48-pin TSOP PERFORMANCE CHARACTERISTICS High performance — Access time as fast as 90 ns — Program time: 4 µs/word typical utilizing Accelerate function Ultra low power consumption (typical values) — 2 mA active read current at 1 MHz — 10 mA active read current at 5 MHz — 200 nA in standby or automatic sleep mode Minimum 1 million erase cycles guaranteed per sector 20 year data retention at 125°C — Reliable operation for the life of the system SOFTWARE FEATURES Data Management Software (DMS) — AMD-supplied software manages data programming, enabling EEPROM emulation — Eases historical sector erase flash limitations Supports Common Flash Memory Interface (CFI) Program/Erase Suspend/Erase Resume — Suspends program/erase operations to allow programming/erasing in same bank Data# Polling and Toggle Bits — Provides a software method of detecting the status of program or erase cycles Unlock Bypass Program command — Reduces overall programming time when issuing multiple program command sequences HARDWARE FEATURES Ready/Busy# output (RY/BY#) — Hardware method for detecting program or erase cycle completion Hardware reset pin (RESET#) — Hardware method of resetting the internal state machine to the read mode WP#/ACC input pin — Write protect (WP#) function protects sectors 0, 1, 140, and 141, regardless of sector protect status — Acceleration (ACC) function accelerates program timing Sector protection — Hardware method of locking a sector, either in-system or using programming equipment, to prevent any program or erase operation within that sector — Temporary Sector Unprotect allows changing data in protected sectors in-system Publication# 23695 Rev: C Amendment/3 Issue Date: December 13, 2005 Refer to AMD’s Website (www.amd.com) for the latest information. GENERAL DESCRIPTION The Am29DL640D is a 64 megabit, 3.0 volt-only flash memory device, organized as 4,194,304 words of 16 bits each or 8,388,608 bytes of 8 bits each. Word mode data appears on DQ0–DQ15; byte mode data appears on DQ0–DQ7. The device is designed to be programmed in-system with the standard 3.0 volt VCC supply, and can also be programmed in standard EPROM programmers. The device is available with an access time of 90 or 120 ns and is offered in 48-pin TSOP and 63-ball Fine-Pitch BGA. Standard control pins—chip enable (CE#), write enable (WE#), and output enable (OE#)—control normal read and write operations, and avoid bus contention issues. The device requires only a single 3.0 volt power supply for both read and write functions. Internally generated and regulated voltages are provided for the program and erase operations. Simultaneous Read/Write Operations with Zero Latency The Simultaneous Read/Write architecture provides simultaneous operation by dividing the memory space into four banks, two 8 Mb banks with small and large sectors, and two 24 Mb banks of large sectors. Sector addresses are fixed, system software can be used to form user-defined bank groups. During an Erase/Program operation, any of the three non-busy banks may be read from. Note that only two banks can operate simultaneously. The device can improve overall system performance by allowing a host system to program or erase in one bank, then immediately and simultaneously read from the other bank, with zero latency. This releases the system from waiting for the completion of program or erase operations. The Am29DL640D can be organized as both a top and bottom boot sector configuration. Bank Megabits Bank 1 8 Mb Bank 2 Bank 3 24 Mb 24 Mb Bank 4 8 Mb Sector Sizes Eight 8 Kbyte/4 Kword, Fifteen 64 Kbyte/32 Kword Forty-eight 64 Kbyte/32 Kword Forty-eight 64 Kbyte/32 Kword Eight 8 Kbyte/4 Kword, Fifteen 64 Kbyte/32 Kword Am29DL640D Features The Secured Silicon Sector is an extra 256 byte sector capable of being permanently locked by AMD or customers. The Secured Silicon Indicator Bit (DQ7) is permanently set to a 1 if the part is factory locked, and set to a 0 if customer lockable. This way, customer lockable parts can never be used to replace a factory locked part. Factory locked parts provide several options. The Secured Silicon Sector may store a secure, random 16 2 byte ESN (Electronic Serial Number), customer code (programmed through AMD’s ExpressFlash service), or both. Customer Lockable parts may utilize the Secured Silicon Sector as bonus space, reading and writing like any other flash sector, or may permanently lock their own code there. DMS (Data Management Software) allows systems to easily take advantage of the advanced architecture of the simultaneous read/write product line by allowing removal of EEPROM devices. DMS also allows the system software to be simplified, as it performs all functions necessary to modify data in file structures, as opposed to single-byte modifications. To write or update a particular piece of data (a phone number or configuration data, for example), the user only needs to state which piece of data is to be updated, and where the updated data is located in the system. This i s a n a d va n t a g e c o m p a r e d t o s y s t e m s w h e r e user-written software must keep track of the old data location, status, logical to physical translation of the data onto the Flash memory device (or memory devices), and more. Using DMS, user-written software does not need to interface with the Flash memory directly. Instead, the user's software accesses the Flash memory by calling one of only six functions. AMD provides this software to simplify system design and software integration efforts. The device offers complete compatibility with the JEDEC single-power-supply Flash command set standard. Commands are written to the command register using standard microprocessor write timings. Reading data out of the device is similar to reading from other Flash or EPROM devices. The host system can detect whether a program or erase operation is complete by using the device status bits: RY/BY# pin, DQ7 (Data# Polling) and DQ6/DQ2 (toggle bits). After a program or erase cycle has been completed, the device automatically returns to the read mode. The sector erase architecture allows memory sectors to be erased and reprogrammed without affecting the data contents of other sectors. The device is fully erased when shipped from the factory. Hardware data protection measures include a low VCC detector that automatically inhibits write operations during power transitions. The hardware sector protection feature disables both program and erase operations in any combination of the sectors of memo r y. T h i s c a n b e a c h i ev e d i n - s y s t e m o r v i a programming equipment. The device offers two power-saving features. When addresses have been stable for a specified amount of time, the device enters the automatic sleep mode. The system can also place the device into the standby mode. Power consumption is greatly reduced in both modes. Am29DL640D December 13, 2005 TABLE OF CONTENTS Product Selector Guide . . . . . . . . . . . . . . . . . . . . . 5 Block Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5 Connection Diagrams . . . . . . . . . . . . . . . . . . . . . . . 6 Pin Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 Ordering Information . . . . . . . . . . . . . . . . . . . . . . . 8 Device Bus Operations . . . . . . . . . . . . . . . . . . . . . . 9 Write Operation Status . . . . . . . . . . . . . . . . . . . . 29 DQ7: Data# Polling ................................................................. 29 Table 1. Am29DL640D Device Bus Operations ................................9 DQ2: Toggle Bit II ................................................................... 31 Reading Toggle Bits DQ6/DQ2 ............................................... 31 DQ5: Exceeded Timing Limits ................................................ 31 DQ3: Sector Erase Timer ....................................................... 31 Word/Byte Configuration ........................................ 9 Requirements for Reading Array Data ..................................... 9 Writing Commands/Command Sequences ............................ 10 Accelerated Program Operation ............................................. 10 Autoselect Functions .............................................................. 10 Simultaneous Read/Write Operations with Zero Latency ....... 10 Standby Mode ...................................................... 10 Automatic Sleep Mode ........................................................... 11 RESET#: Hardware Reset Pin ............................................... 11 Output Disable Mode .............................................................. 11 Table 2. Am29DL640D Sector Architecture ....................................11 Table 3. Bank Address ....................................................................14 Secured Silicon Sector Addresses............................. 14 Autoselect Mode ................................................... 14 Table 5. Am29DL640D Autoselect Codes, (High Voltage Method) 15 Sector/Sector Block Protection and Unprotection 16 Table 6. Am29DL640D Boot Sector/Sector Block Addresses for Protection/Unprotection ........................................................................16 Write Protect (WP#) ................................................................ 17 Table 7. WP#/ACC Modes ..............................................................17 Temporary Sector Unprotect .................................................. 17 Figure 1. Temporary Sector Unprotect Operation........................... 17 Figure 2. In-System Sector Protect/Unprotect Algorithms .............. 18 Secured Silicon Sector Flash Memory Region ............................................................ 19 Figure 3. Secured Silicon Sector Protect Verify .............................. 20 Hardware Data Protection ...................................................... 20 Low VCC Write Inhibit ............................................................ 20 Write Pulse “Glitch” Protection ............................................... 20 Logical Inhibit .......................................................................... 20 Power-Up Write Inhibit ............................................................ 20 Common Flash Memory Interface (CFI) . . . . . . . 20 Table 8. CFI Query Identification String ...................... System Interface String............................................... Table 10. Device Geometry Definition ........................ Table 11. Primary Vendor-Specific Extended Query .. 21 21 22 23 Command Definitions . . . . . . . . . . . . . . . . . . . . . . 24 Reading Array Data ................................................................ 24 Reset Command ..................................................................... 24 Autoselect Command Sequence ............................................ 24 Enter/Exit Secured Silicon Sector Command Sequence .............................................................. 24 Byte/Word Program Command Sequence ............................. 25 Unlock Bypass Command Sequence ..................................... 25 Figure 4. Program Operation .......................................................... 26 Chip Erase Command Sequence ........................................... 26 Sector Erase Command Sequence ........................................ 26 Erase Suspend/Erase Resume Commands ........................... 27 Figure 6. Data# Polling Algorithm .................................................. 29 RY/BY#: Ready/Busy# ......................................... 30 DQ6: Toggle Bit I .................................................................... 30 Figure 7. Toggle Bit Algorithm........................................................ 30 Table 13. Write Operation Status ................................................... 32 Absolute Maximum Ratings . . . . . . . . . . . . . . . . 33 Figure 8. Maximum Negative Overshoot Waveform ...................... 33 Figure 9. Maximum Positive Overshoot Waveform........................ 33 Operating Ranges . . . . . . . . . . . . . . . . . . . . . . . . 33 DC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . 34 Figure 10. ICC1 Current vs. Time (Showing Active and Automatic Sleep Currents) ............................................................. 35 Figure 11. Typical ICC1 vs. Frequency ............................................ 35 Test Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . 36 Figure 12. Test Setup.................................................................... 36 KEY TO SWITCHING WAVEFORMS . . . . . . . . . . 36 Figure 13. Input Waveforms and Measurement Levels ................. 36 AC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . 37 Read-Only Operations ........................................................... 37 Figure 14. Read Operation Timings ............................................... 37 Hardware Reset (RESET#) .................................................... 38 Figure 15. Reset Timings ............................................................... 38 Word/Byte Configuration (BYTE#) .......................................... 39 Figure 16. BYTE# Timings for Read Operations............................ 39 Figure 17. BYTE# Timings for Write Operations............................ 39 Erase and Program Operations .............................................. 40 Figure 18. Program Operation Timings.......................................... Figure 19. Accelerated Program Timing Diagram.......................... Figure 20. Chip/Sector Erase Operation Timings .......................... Figure 21. Back-to-back Read/Write Cycle Timings ...................... Figure 22. Data# Polling Timings (During Embedded Algorithms). Figure 23. Toggle Bit Timings (During Embedded Algorithms)...... Figure 24. DQ2 vs. DQ6................................................................. 41 41 42 43 43 44 44 Temporary Sector Unprotect .................................................. 45 Figure 25. Temporary Sector Unprotect Timing Diagram .............. 45 Figure 26. Sector/Sector Block Protect and Unprotect Timing Diagram ............................................................. 46 Alternate CE# Controlled Erase and Program Operations ..... 47 Figure 27. Alternate CE# Controlled Write (Erase/Program) Operation Timings.......................................................................... 48 Erase And Programming Performance . . . . . . . 49 Latchup Characteristics . . . . . . . . . . . . . . . . . . . . 49 TSOP Pin Capacitance . . . . . . . . . . . . . . . . . . . . . 49 Data Retention. . . . . . . . . . . . . . . . . . . . . . . . . . . . 49 Physical Dimensions . . . . . . . . . . . . . . . . . . . . . . 50 FBE063—63-Ball Fine-Pitch Ball Grid Array (FBGA) 12 x 11 mm package .............................................................. 50 TS 048—48-Pin Standard TSOP ............................................ 51 Revision Summary . . . . . . . . . . . . . . . . . . . . . . . . 52 Figure 5. Erase Operation............................................................... 27 Table 12. Am29DL640D Command Definitions .......... 28 December 13, 2005 Am29DL640D 3 PRODUCT SELECTOR GUIDE Part Number Am29DL640D 90 120 Max Access Time (ns), tACC 90 120 CE# Access (ns), tCE 90 120 OE# Access (ns), tOE 35 50 Speed Option Standard Voltage Range: VCC = 2.7–3.6 V BLOCK DIAGRAM VCC VSS OE# Mux BYTE# Bank 1 Bank 2 X-Decoder A20–A0 RESET# WE# CE# BYTE# WP#/ACC STATE CONTROL & COMMAND REGISTER Status DQ15–DQ0 Control Mux DQ15–DQ0 DQ0–DQ15 Bank 3 Address Bank 3 X-Decoder Bank 4 Address Y-gate A20–A0 X-Decoder A20–A0 DQ15–DQ0 Bank 2 Address DQ15–DQ0 RY/BY# DQ15–DQ0 A20–A0 X-Decoder Y-gate Bank 1 Address A20–A0 Bank 4 Mux 4 Am29DL640D December 13, 2005 CONNECTION DIAGRAMS A15 A14 A13 A12 A11 A10 A9 A8 A19 A20 WE# RESET# NC WP#/ACC RY/BY# A18 A17 A7 A6 A5 A4 A3 A2 A1 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 48 47 46 45 44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 25 48-Pin Standard TSOP 63-Ball Fine-Pitch BGA (FBGA) Top View, Balls Facing Down L8 M8 NC* NC* K7 L7 M7 VSS NC* NC* A8 B8 NC NC A7 B7 C7 D7 E7 F7 G7 NC NC A13 A12 A14 A15 A16 C6 D6 E6 F6 G6 H6 J6 K6 A9 A8 A10 A11 DQ7 DQ14 DQ13 DQ6 C5 D5 E5 F5 G5 H5 J5 K5 WE# RESET# A21 A19 DQ5 DQ12 VCC DQ4 C4 D4 E4 F4 G4 H4 J4 K4 A18 A20 DQ2 DQ10 DQ11 DQ3 RY/BY# WP#/ACC A2 A1 J7 BYTE# DQ15/A-1 C3 D3 E3 F3 G3 H3 J3 K3 A7 A17 A6 A5 DQ0 DQ8 DQ9 DQ1 C2 D2 E2 F2 G2 H2 J2 K2 L2 M2 OE# VSS NC* NC* L1 M1 NC* NC* A3 NC* H7 A16 BYTE# VSS DQ15/A-1 DQ7 DQ14 DQ6 DQ13 DQ5 DQ12 DQ4 VCC DQ11 DQ3 DQ10 DQ2 DQ9 DQ1 DQ8 DQ0 OE# VSS CE# A0 A4 A2 A1 A0 CE# B1 * Balls are shorted together via the substrate but not connected to the die. NC* NC* December 13, 2005 Am29DL640D 5 PIN DESCRIPTION A0–A21 LOGIC SYMBOL = 22 Addresses 22 DQ0–DQ14 = 15 Data Inputs/Outputs (x16-only devices) DQ15/A-1 A0–A21 = DQ15 (Data Input/Output, word mode), A-1 (LSB Address Input, byte mode) DQ0–DQ15 (A-1) CE# CE# = Chip Enable OE# OE# = Output Enable WE# WE# = Write Enable WP#/ACC WP#/ACC = Hardware Write Protect/ Acceleration Pin RESET# RY/BY# BYTE# RESET# = Hardware Reset Pin, Active Low BYTE# = Selects 8-bit or 16-bit mode RY/BY# = Ready/Busy Output VCC = 3.0 volt-only single power supply (see Product Selector Guide for speed options and voltage supply tolerances) VSS = Device Ground NC = Pin Not Connected Internally 6 16 or 8 Am29DL640D December 13, 2005 ORDERING INFORMATION Standard Products AMD standard products are available in several packages and operating ranges. The order number (Valid Combination) is formed by a combination of the following: Am29DL640D 90 E I OPTIONAL PROCESSING Blank = Standard Processing N = 16-byte ESN devices (Contact an AMD representative for more information) TEMPERATURE RANGE I E F K = = = = Industrial (–40°C to +85°C) Extended (–55°C to +125°C) Industrial for Pb-free Package (–40°C to +85°C) Extended for Pb-free Package (–55°C to +125°C) PACKAGE TYPE E = WH = 48-Pin Thin Small Outline Package (TSOP) Standard Pinout (TS 048) 63-Ball Fine-Pitch Ball Grid Array, 0.80 mm pitch, 12 x 11 mm package (FBE063) SPEED OPTION See Product Selector Guide and Valid Combinations DEVICE NUMBER/DESCRIPTION Am29DL640D 64 Megabit (8 M x 8-Bit/4 M x 16-Bit) CMOS Flash Memory 3.0 Volt-only Read, Program, and Erase firm availability of specific valid combinations and to check on newly released combinations. Valid Combinations for TSOP Packages Am29DL640D90 EI, EF Am29DL640D120 EI, EE, EF, EK Valid Combinations for BGA Packages Order Number Valid Combinations Valid Combinations list configurations planned to be supported in volume for this device. Consult the local AMD sales office to con- December 13, 2005 Package Marking Am29DL640D90 WHF, WHI D640D90V I, F Am29DL640D120 WHI, WHE, WHF, WHK D640D12V I, E, F, K Am29DL640D 7 DEVICE BUS OPERATIONS This section describes the requirements and use of the device bus operations, which are initiated through the internal command register. The command register itself does not occupy any addressable memory location. The register is a latch used to store the commands, along with the address and data information needed to execute the command. The contents of Table 1. the register serve as inputs to the internal state machine. The state machine outputs dictate the function of the device. Table 1 lists the device bus operations, the inputs and control levels they require, and the resulting output. The following subsections describe each of these operations in further detail. Am29DL640D Device Bus Operations DQ8–DQ15 WP#/ACC Addresses (Note 2) DQ0– DQ7 BYTE# = VIH BYTE# = VIL H L/H AIN DOUT DOUT L H (Note 3) AIN DIN DIN DQ8–DQ14 = High-Z, DQ15 = A-1 X X VCC ± 0.3 V H X High-Z High-Z High-Z L H H H L/H X High-Z High-Z High-Z Reset X X X L L/H X High-Z High-Z High-Z Sector Protect (Note 2) L H L VID L/H SA, A6 = L, A1 = H, A0 = L DIN X X Sector Unprotect (Note 2) L H L VID (Note 3) SA, A6 = H, A1 = H, A0 = L DIN X X Temporary Sector Unprotect X X X VID (Note 3) AIN DIN DIN High-Z Operation CE# OE# Read L L H Write L H VCC ± 0.3 V Output Disable Standby WE# RESET# Legend: L = Logic Low = VIL, H = Logic High = VIH, VID = 8.5–12.5 V, VHH = 9.0 ± 0.5 V, X = Don’t Care, SA = Sector Address, AIN = Address In, DIN = Data In, DOUT = Data Out Notes: 1. Addresses are A21:A0 in word mode (BYTE# = VIH), A21:A-1 in byte mode (BYTE# = VIL). 2. The sector protect and sector unprotect functions may also be implemented via programming equipment. See the Sector/Sector Block Protection and Unprotection section. 3. If WP#/ACC = VIL, sectors 0, 1, 140, and 141 remain protected. If WP#/ACC = VIH, protection on sectors 0, 1, 140, and 141 depends on whether they were last protected or unprotected using the method described in Sector/Sector Block Protection and Unprotection. If WP#/ACC = VHH, all sectors are unprotected. Word/Byte Configuration Requirements for Reading Array Data The BYTE# pin controls whether the device data I/O pins operate in the byte or word configuration. If the BYTE# pin is set at logic “1,” the device is in word configuration, DQ0–DQ15 are active and controlled by CE# and OE#. To read array data from the outputs, the system must drive the CE# and OE# pins to VIL. CE# is the power control and selects the device. OE# is the output control and gates array data to the output pins. WE# should remain at V IH . The BYTE# pin determines whether the device outputs array data in words or bytes. If the BYTE# pin is set at logic “0,” the device is in byte configuration, and only data I/O pins DQ0–DQ7 are active and controlled by CE# and OE#. The data I/O pins DQ8–DQ14 are tri-stated, and the DQ15 pin is used as an input for the LSB (A-1) address function. 8 The internal state machine is set for reading array data upon device power-up, or after a hardware reset. This ensures that no spurious alteration of the memory content occurs during the power transition. No command is necessary in this mode to obtain array data. Standard microprocessor read cycles that assert valid Am29DL640D December 13, 2005 addresses on the device address inputs produce valid data on the device data outputs. Each bank remains enabled for read access until the command register contents are altered. Refer to the AC Read-Only Operations table for timing specifications and to Figure 14 for the timing diagram. ICC1 in the DC Characteristics table represents the active current specification for reading array data. Writing Commands/Command Sequences To write a command or command sequence (which includes programming data to the device and erasing sectors of memory), the system must drive WE# and CE# to VIL, and OE# to VIH. For program operations, the BYTE# pin determines whether the device accepts program data in bytes or words. Refer to Word/Byte Configuration for more information. The device features an Unlock Bypass mode to facilitate faster programming. Once a bank enters the Unlock Bypass mode, only two write cycles are required to program a word or byte, instead of four. The Byte/Word Program Command Sequence section has details on programming data to the device using both standard and Unlock Bypass command sequences. An erase operation can erase one sector, multiple sectors, or the entire device. Table 2 indicates the address space that each sector occupies. The device address space is divided into four banks: Banks 1 and 4 contains the boot/parameter sectors, and Banks 2 and 3 contains the larger, code sectors of uniform size. A “bank address” is the address bits required to uniquely select a bank. Similarly, a “sector address” is the address bits required to uniquely select a sector. The Command Definitions section has details on erasing a sector or the entire chip, or suspending/resuming the erase operation. ICC2 in the DC Characteristics table represents the active current specification for the write mode. The AC Characteristics section contains timing specification tables and timing diagrams for write operations. Accelerated Program Operation The device offers accelerated program operations through the ACC function. This is one of two functions provided by the WP#/ACC pin. This function is primarily intended to allow faster manufacturing throughput at the factory. If the system asserts VHH on this pin, the device automatically enters the aforementioned Unlock Bypass mode, temporarily unprotects any protected sectors, and uses the higher voltage on the pin to reduce the time required for program operations. The system December 13, 2005 would use a two-cycle program command sequence as required by the Unlock Bypass mode. Removing VHH from the WP#/ACC pin returns the device to normal operation. Note that VHH must not be asserted on WP#/ACC for operations other than accelerated programming, or device damage may result. In addition, the WP#/ACC pin must not be left floating or unconnected; inconsistent behavior of the device may result. See “Write Protect (WP#)” on page 16 for related information. Autoselect Functions If the system writes the autoselect command sequence, the device enters the autoselect mode. The system can then read autoselect codes from the internal register (which is separate from the memory array) on DQ15–DQ0. Standard read cycle timings apply in this mode. Refer to the Autoselect Mode and Autosel e c t C o m m a n d S e q u e n c e s e c t i o n s fo r m o r e information. Simultaneous Read/Write Operations with Zero Latency This device is capable of reading data from one bank of memory while programming or erasing in the other bank of memory. An erase operation may also be suspended to read from or program to another location within the same bank (except the sector being erased). Figure 21 shows how read and write cycles may be initiated for simultaneous operation with zero latency. ICC6 and ICC7 in the DC Characteristics table represent the current specifications for read-while-program and read-while-erase, respectively. Standby Mode When the system is not reading or writing to the device, it can place the device in the standby mode. In this mode, current consumption is greatly reduced, and the outputs are placed in the high impedance state, independent of the OE# input. The device enters the CMOS standby mode when the CE# and RESET# pins are both held at VCC ± 0.3 V. (Note that this is a more restricted voltage range than VIH.) If CE# and RESET# are held at VIH, but not within VCC ± 0.3 V, the device is in the standby mode, but the standby current is greater. The device requires standard access time (t CE ) for read access when the device is in either of these standby modes, before it is ready to read data. If the device is deselected during erasure or programming, the device draws active current until the operation is completed. ICC3 in the DC Characteristics table represents the standby current specification. Am29DL640D 9 Automatic Sleep Mode The automatic sleep mode minimizes Flash device energy consumption. The device automatically enables this mode when addresses remain stable for tACC + 30 ns. The automatic sleep mode is independent of the CE#, WE#, and OE# control signals. Standard add re s s a c ce s s ti m in g s pr ov id e n ew d at a w he n addresses are changed. While in sleep mode, output data is latched and always available to the system. ICC5 in the DC Characteristics table represents the automatic sleep mode current specification. RESET#: Hardware Reset Pin The RESET# pin provides a hardware method of resetting the device to reading array data. When the RESET# pin is driven low for at least a period of tRP, the device immediately terminates any operation in progress, tristates all output pins, and ignores all read/write commands for the duration of the RESET# pulse. The device also resets the internal state machine to reading array data. The operation that was interrupted should be reinitiated once the device is ready to accept another command sequence, to ensure data integrity. Current is reduced for the duration of the RESET# pulse. When RESET# is held at VSS±0.3 V, the device Table 2. Bank Bank 1 10 draws CMOS standby current (ICC4). If RESET# is held at VIL but not within VSS±0.3 V, the standby current is greater. The RESET# pin may be tied to the system reset circuitry. A system reset would thus also reset the Flash memory, enabling the system to read the boot-up firmware from the Flash memory. If RESET# is asserted during a program or erase operation, the RY/BY# pin remains a “0” (busy) until the internal reset operation is complete, which requires a time of tREADY (during Embedded Algorithms). The system can thus monitor RY/BY# to determine whether the reset operation is complete. If RESET# is asserted when a program or erase operation is not executing (RY/BY# pin is “1”), the reset operation is completed within a time of t READY (not during Embedded Algorithms). The system can read data t RH after the RESET# pin returns to VIH. Refer to the AC Characteristics tables for RESET# parameters and to Figure 15 for the timing diagram. Output Disable Mode When the OE# input is at VIH, output from the device is disabled. The output pins are placed in the high impedance state. Am29DL640D Sector Architecture Sector Sector Address A21–A12 Sector Size (Kbytes/Kwords) (x8) Address Range (x16) Address Range SA0 0000000000 8/4 000000h–001FFFh 00000h–00FFFh SA1 0000000001 8/4 002000h–003FFFh 01000h–01FFFh SA2 0000000010 8/4 004000h–005FFFh 02000h–02FFFh SA3 0000000011 8/4 006000h–007FFFh 03000h–03FFFh SA4 0000000100 8/4 008000h–009FFFh 04000h–04FFFh SA5 0000000101 8/4 00A000h–00BFFFh 05000h–05FFFh SA6 0000000110 8/4 00C000h–00DFFFh 06000h–06FFFh SA7 0000000111 8/4 00E000h–00FFFFFh 07000h–07FFFh SA8 0000001xxx 64/32 010000h–01FFFFh 08000h–0FFFFh SA9 0000010xxx 64/32 020000h–02FFFFh 10000h–17FFFh SA10 0000011xxx 64/32 030000h–03FFFFh 18000h–1FFFFh SA11 0000100xxx 64/32 040000h–04FFFFh 20000h–27FFFh SA12 0000101xxx 64/32 050000h–05FFFFh 28000h–2FFFFh SA13 0000110xxx 64/32 060000h–06FFFFh 30000h–37FFFh SA14 0000111xxx 64/32 070000h–07FFFFh 38000h–3FFFFh SA15 0001000xxx 64/32 080000h–08FFFFh 40000h–47FFFh SA16 0001001xxx 64/32 090000h–09FFFFh 48000h–4FFFFh SA17 0001010xxx 64/32 0A0000h–0AFFFFh 50000h–57FFFh SA18 0001011xxx 64/32 0B0000h–0BFFFFh 58000h–5FFFFh SA19 0001100xxx 64/32 0C0000h–0CFFFFh 60000h–67FFFh SA20 0001101xxx 64/32 0D0000h–0DFFFFh 68000h–6FFFFh SA21 0001110xxx 64/32 0E0000h–0EFFFFh 70000h–77FFFh SA22 0001111xxx 64/32 0F0000h–0FFFFFh 78000h–7FFFFh Am29DL640D December 13, 2005 Table 2. Bank Bank 2 Am29DL640D Sector Architecture (Continued) Sector Sector Address A21–A12 Sector Size (Kbytes/Kwords) (x8) Address Range (x16) Address Range SA23 0010000xxx 64/32 100000h–00FFFFh 80000h–87FFFh SA24 0010001xxx 64/32 110000h–11FFFFh 88000h–8FFFFh SA25 0010010xxx 64/32 120000h–12FFFFh 90000h–97FFFh SA26 0010011xxx 64/32 130000h–13FFFFh 98000h–9FFFFh SA27 0010100xxx 64/32 140000h–14FFFFh A0000h–A7FFFh SA28 0010101xxx 64/32 150000h–15FFFFh A8000h–AFFFFh SA29 0010110xxx 64/32 160000h–16FFFFh B0000h–B7FFFh SA30 0010111xxx 64/32 170000h–17FFFFh B8000h–BFFFFh SA31 0011000xxx 64/32 180000h–18FFFFh C0000h–C7FFFh SA32 0011001xxx 64/32 190000h–19FFFFh C8000h–CFFFFh SA33 0011010xxx 64/32 1A0000h–1AFFFFh D0000h–D7FFFh SA34 0011011xxx 64/32 1B0000h–1BFFFFh D8000h–DFFFFh SA35 0011100xxx 64/32 1C0000h–1CFFFFh E0000h–E7FFFh SA36 0011101xxx 64/32 1D0000h–1DFFFFh E8000h–EFFFFh SA37 0011110xxx 64/32 1E0000h–1EFFFFh F0000h–F7FFFh SA38 0011111xxx 64/32 1F0000h–1FFFFFh F8000h–FFFFFh SA39 0100000xxx 64/32 200000h–20FFFFh F9000h–107FFFh SA40 0100001xxx 64/32 210000h–21FFFFh 108000h–10FFFFh SA41 0100010xxx 64/32 220000h–22FFFFh 110000h–117FFFh SA42 0101011xxx 64/32 230000h–23FFFFh 118000h–11FFFFh SA43 0100100xxx 64/32 240000h–24FFFFh 120000h–127FFFh SA44 0100101xxx 64/32 250000h–25FFFFh 128000h–12FFFFh SA45 0100110xxx 64/32 260000h–26FFFFh 130000h–137FFFh SA46 0100111xxx 64/32 270000h–27FFFFh 138000h–13FFFFh SA47 0101000xxx 64/32 280000h–28FFFFh 140000h–147FFFh SA48 0101001xxx 64/32 290000h–29FFFFh 148000h–14FFFFh SA49 0101010xxx 64/32 2A0000h–2AFFFFh 150000h–157FFFh SA50 0101011xxx 64/32 2B0000h–2BFFFFh 158000h–15FFFFh SA51 0101100xxx 64/32 2C0000h–2CFFFFh 160000h–167FFFh SA52 0101101xxx 64/32 2D0000h–2DFFFFh 168000h–16FFFFh SA53 0101110xxx 64/32 2E0000h–2EFFFFh 170000h–177FFFh SA54 0101111xxx 64/32 2F0000h–2FFFFFh 178000h–17FFFFh SA55 0110000xxx 64/32 300000h–30FFFFh 180000h–187FFFh SA56 0110001xxx 64/32 310000h–31FFFFh 188000h–18FFFFh SA57 0110010xxx 64/32 320000h–32FFFFh 190000h–197FFFh SA58 0110011xxx 64/32 330000h–33FFFFh 198000h–19FFFFh SA59 0100100xxx 64/32 340000h–34FFFFh 1A0000h–1A7FFFh SA60 0110101xxx 64/32 350000h–35FFFFh 1A8000h–1AFFFFh SA61 0110110xxx 64/32 360000h–36FFFFh 1B0000h–1B7FFFh SA62 0110111xxx 64/32 370000h–37FFFFh 1B8000h–1BFFFFh SA63 0111000xxx 64/32 380000h–38FFFFh 1C0000h–1C7FFFh SA64 0111001xxx 64/32 390000h–39FFFFh 1C8000h–1CFFFFh SA65 0111010xxx 64/32 3A0000h–3AFFFFh 1D0000h–1D7FFFh SA66 0111011xxx 64/32 3B0000h–3BFFFFh 1D8000h–1DFFFFh SA67 0111100xxx 64/32 3C0000h–3CFFFFh 1E0000h–1E7FFFh SA68 0111101xxx 64/32 3D0000h–3DFFFFh 1E8000h–1EFFFFh SA69 0111110xxx 64/32 3E0000h–3EFFFFh 1F0000h–1F7FFFh SA70 0111111xxx 64/32 3F0000h–3FFFFFh 1F8000h–1FFFFFh December 13, 2005 Am29DL640D 11 Table 2. Bank Bank 3 12 Am29DL640D Sector Architecture (Continued) Sector Sector Address A21–A12 Sector Size (Kbytes/Kwords) (x8) Address Range (x16) Address Range SA71 1000000xxx 64/32 400000h–40FFFFh 200000h–207FFFh SA72 1000001xxx 64/32 410000h–41FFFFh 208000h–20FFFFh SA73 1000010xxx 64/32 420000h–42FFFFh 210000h–217FFFh SA74 1000011xxx 64/32 430000h–43FFFFh 218000h–21FFFFh SA75 1000100xxx 64/32 440000h–44FFFFh 220000h–227FFFh SA76 1000101xxx 64/32 450000h–45FFFFh 228000h–22FFFFh SA77 1000110xxx 64/32 460000h–46FFFFh 230000h–237FFFh SA78 1000111xxx 64/32 470000h–47FFFFh 238000h–23FFFFh SA79 1001000xxx 64/32 480000h–48FFFFh 240000h–247FFFh SA80 1001001xxx 64/32 490000h–49FFFFh 248000h–24FFFFh SA81 1001010xxx 64/32 4A0000h–4AFFFFh 250000h–257FFFh SA82 1001011xxx 64/32 4B0000h–4BFFFFh 258000h–25FFFFh SA83 1001100xxx 64/32 4C0000h–4CFFFFh 260000h–267FFFh SA84 1001101xxx 64/32 4D0000h–4DFFFFh 268000h–26FFFFh SA85 1001110xxx 64/32 4E0000h–4EFFFFh 270000h–277FFFh SA86 1001111xxx 64/32 4F0000h–4FFFFFh 278000h–27FFFFh SA87 1010000xxx 64/32 500000h–50FFFFh 280000h–28FFFFh SA88 1010001xxx 64/32 510000h–51FFFFh 288000h–28FFFFh SA89 1010010xxx 64/32 520000h–52FFFFh 290000h–297FFFh SA90 1010011xxx 64/32 530000h–53FFFFh 298000h–29FFFFh SA91 1010100xxx 64/32 540000h–54FFFFh 2A0000h–2A7FFFh SA92 1010101xxx 64/32 550000h–55FFFFh 2A8000h–2AFFFFh SA93 1010110xxx 64/32 560000h–56FFFFh 2B0000h–2B7FFFh SA94 1010111xxx 64/32 570000h–57FFFFh 2B8000h–2BFFFFh SA95 1011000xxx 64/32 580000h–58FFFFh 2C0000h–2C7FFFh SA96 1011001xxx 64/32 590000h–59FFFFh 2C8000h–2CFFFFh SA97 1011010xxx 64/32 5A0000h–5AFFFFh 2D0000h–2D7FFFh SA98 1011011xxx 64/32 5B0000h–5BFFFFh 2D8000h–2DFFFFh SA99 1011100xxx 64/32 5C0000h–5CFFFFh 2E0000h–2E7FFFh SA100 1011101xxx 64/32 5D0000h–5DFFFFh 2E8000h–2EFFFFh SA101 1011110xxx 64/32 5E0000h–5EFFFFh 2F0000h–2FFFFFh SA102 1011111xxx 64/32 5F0000h–5FFFFFh 2F8000h–2FFFFFh SA103 1100000xxx 64/32 600000h–60FFFFh 300000h–307FFFh SA104 1100001xxx 64/32 610000h–61FFFFh 308000h–30FFFFh SA105 1100010xxx 64/32 620000h–62FFFFh 310000h–317FFFh SA106 1100011xxx 64/32 630000h–63FFFFh 318000h–31FFFFh SA107 1100100xxx 64/32 640000h–64FFFFh 320000h–327FFFh SA108 1100101xxx 64/32 650000h–65FFFFh 328000h–32FFFFh SA109 1100110xxx 64/32 660000h–66FFFFh 330000h–337FFFh SA110 1100111xxx 64/32 670000h–67FFFFh 338000h–33FFFFh SA111 1101000xxx 64/32 680000h–68FFFFh 340000h–347FFFh SA112 1101001xxx 64/32 690000h–69FFFFh 348000h–34FFFFh SA113 1101010xxx 64/32 6A0000h–6AFFFFh 350000h–357FFFh SA114 1101011xxx 64/32 6B0000h–6BFFFFh 358000h–35FFFFh SA115 1101100xxx 64/32 6C0000h–6CFFFFh 360000h–367FFFh SA116 1101101xxx 64/32 6D0000h–6DFFFFh 368000h–36FFFFh SA117 1101110xxx 64/32 6E0000h–6EFFFFh 370000h–377FFFh SA118 1101111xxx 64/32 6F0000h–6FFFFFh 378000h–37FFFFh Am29DL640D December 13, 2005 Table 2. Bank Bank 4 Am29DL640D Sector Architecture (Continued) Sector Sector Address A21–A12 Sector Size (Kbytes/Kwords) (x8) Address Range (x16) Address Range SA119 1110000xxx 64/32 700000h–70FFFFh 380000h–387FFFh SA120 1110001xxx 64/32 710000h–71FFFFh 388000h–38FFFFh SA121 1110010xxx 64/32 720000h–72FFFFh 390000h–397FFFh SA122 1110011xxx 64/32 730000h–73FFFFh 398000h–39FFFFh SA123 1110100xxx 64/32 740000h–74FFFFh 3A0000h–3A7FFFh SA124 1110101xxx 64/32 750000h–75FFFFh 3A8000h–3AFFFFh SA125 1110110xxx 64/32 760000h–76FFFFh 3B0000h–3B7FFFh SA126 1110111xxx 64/32 770000h–77FFFFh 3B8000h–3BFFFFh SA127 1111000xxx 64/32 780000h–78FFFFh 3C0000h–3C7FFFh SA128 1111001xxx 64/32 790000h–79FFFFh 3C8000h–3CFFFFh SA129 1111010xxx 64/32 7A0000h–7AFFFFh 3D0000h–3D7FFFh SA130 1111011xxx 64/32 7B0000h–7BFFFFh 3D8000h–3DFFFFh SA131 1111100xxx 64/32 7C0000h–7CFFFFh 3E0000h–3E7FFFh SA132 1111101xxx 64/32 7D0000h–7DFFFFh 3E8000h–3EFFFFh SA133 1111110xxx 64/32 7E0000h–7EFFFFh 3F0000h–3F7FFFh SA134 1111111000 8/4 7F0000h–7F1FFFh 3F8000h–3F8FFFh SA135 1111111001 8/4 7F2000h–7F3FFFh 3F9000h–3F9FFFh SA136 1111111010 8/4 7F4000h–7F5FFFh 3FA000h–3FAFFFh SA137 1111111011 8/4 7F6000h–7F7FFFh 3FB000h–3FBFFFh SA138 1111111100 8/4 7F8000h–7F9FFFh 3FC000h–3FCFFFh SA139 1111111101 8/4 7FA000h–7FBFFFh 3FD000h–3FDFFFh SA140 1111111110 8/4 7FC000h–7FDFFFh 3FE000h–3FEFFFh SA141 1111111111 8/4 7FE000h–7FFFFFh 3FF000h–3FFFFFh Note: The address range is A21:A-1 in byte mode (BYTE#=VIL) or A21:A0 in word mode (BYTE#=VIH). Table 3. Bank Address Bank 1 2 3 4 A21–A19 000 001, 010, 011 100, 101, 110 111 Table 4. Secured Silicon Sector Addresses Device Sector Size (x8) Address Range (x16) Address Range Am29DL640D 256 bytes 000000h–0000FFh 00000h–0007Fh Autoselect Mode The autoselect mode provides manufacturer and device identification, and sector protection verification, through identifier codes output on DQ7–DQ0. This mode is primarily intended for programming equipm e n t t o a u t o m a t i c a l l y m a t c h a d ev i c e t o b e programmed with its corresponding programming algorithm. However, the autoselect codes can also be accessed in-system through the command register. When using programming equipment, the autoselect mode requires VID (8.5 V to 12.5 V) on address pin A9. Address pins A6, A1, and A0 must be as shown in Table 5. In addition, when verifying sector protection, the sector address must appear on the appropriate highest order address bits (see Table 2). Table 5 December 13, 2005 shows the remaining address bits that are don’t care. When all necessary bits have been set as required, the programming equipment may then read the corresponding identifier code on DQ7–DQ0. However, the autoselect codes can also be accessed in-system through the command register, for instances when the Am29DL640 is erased or programmed in a system without access to high voltage on the A9 pin. The command sequence is illustrated in Table 12. Note that if a Bank Address (BA) on address bits A21, A20, and A19 is asserted during the third write cycle of the autoselect command, the host system can read autoselect data that bank and then immediately read array data from the other bank, without exiting the autoselect mode. Am29DL640D 13 To access the autoselect codes in-system, the host system can issue the autoselect command via the command register, as shown in Table 12. This method Table 5. Description Device ID Manufacturer ID: AMD CE# OE# WE# L L H Am29DL640D Autoselect Codes, (High Voltage Method) A21 to A12 A11 to A10 BA X A9 A8 to A7 VID X DQ8 to DQ15 A6 A5 to A4 A3 A2 A1 A0 L X L L L L X L L L H 22h H H H L 22h H H H H 22h H L X X 01h (protected), 00h (unprotected) H H X X 80h (factory locked), 00h (not factory locked) L Read Cycle 1 Read Cycle 2 does not require VID. Refer to the Autoselect Command Sequence section for more information. L L H BA X VID X Read Cycle 3 L X L Sector Protection Verification L L H SA X VID X L X Secured Silicon Indicator Bit (DQ7) L L H BA X VID X L X L L BYTE# BYTE# = VIH = VIL X DQ7 to DQ0 01h 7Eh X 02h 01h Legend: L = Logic Low = VIL, H = Logic High = VIH, BA = Bank Address, SA = Sector Address, X = Don’t care. 14 Am29DL640D December 13, 2005 Sector/Sector Block Protection and Unprotection Sector A21–A12 Sector/ Sector Block Size (Note: For the following discussion, the term “sector” applies to both sectors and sector blocks. A sector block consists of two or more adjacent sectors that are protected or unprotected at the same time (see Table 6). SA63–SA66 01110XXXXX 256 (4x64) Kbytes SA67–SA70 01111XXXXX 256 (4x64) Kbytes SA71–SA74 10000XXXXX 256 (4x64) Kbytes SA75–SA78 10001XXXXX 256 (4x64) Kbytes SA79–SA82 10010XXXXX 256 (4x64) Kbytes The hardware sector protection feature disables both program and erase operations in any sector. The hardware sector unprotection feature re-enables both program and erase operations in previously protected sectors. Sector protection/unprotection can be implemented via two methods. SA83–SA86 10011XXXXX 256 (4x64) Kbytes SA87–SA90 10100XXXXX 256 (4x64) Kbytes SA91–SA94 10101XXXXX 256 (4x64) Kbytes SA95–SA98 10110XXXXX 256 (4x64) Kbytes SA99–SA102 10111XXXXX 256 (4x64) Kbytes SA103–SA106 11000XXXXX 256 (4x64) Kbytes SA107–SA110 11001XXXXX 256 (4x64) Kbytes SA111–SA114 11010XXXXX 256 (4x64) Kbytes SA115–SA118 11011XXXXX 256 (4x64) Kbytes SA119–SA122 11100XXXXX 256 (4x64) Kbytes SA123–SA126 11101XXXXX 256 (4x64) Kbytes SA127–SA130 11110XXXXX 256 (4x64) Kbytes SA131–SA133 1111100XXX, 1111101XXX, 1111110XXX 192 (3x64) Kbytes Table 6. Am29DL640D Boot Sector/Sector Block Addresses for Protection/Unprotection Sector A21–A12 Sector/ Sector Block Size SA0 0000000000 8 Kbytes SA1 0000000001 8 Kbytes SA2 0000000010 8 Kbytes SA3 0000000011 8 Kbytes SA4 0000000100 8 Kbytes SA134 1111111000 8 Kbytes SA5 0000000101 8 Kbytes SA135 1111111001 8 Kbytes SA6 0000000110 8 Kbytes SA136 1111111010 8 Kbytes SA7 0000000111 8 Kbytes SA137 1111111011 8 Kbytes SA138 1111111100 8 Kbytes SA8–SA10 0000001XXX, 0000010XXX, 0000011XXX, SA139 1111111101 8 Kbytes SA140 1111111101 8 Kbytes SA141 1111111111 8 Kbytes 192 (3x64) Kbytes SA11–SA14 00001XXXXX 256 (4x64) Kbytes SA15–SA18 00010XXXXX 256 (4x64) Kbytes SA19–SA22 00011XXXXX 256 (4x64) Kbytes SA23–SA26 00100XXXXX 256 (4x64) Kbytes SA27-SA30 00101XXXXX 256 (4x64) Kbytes SA31-SA34 00110XXXXX 256 (4x64) Kbytes SA35-SA38 00111XXXXX 256 (4x64) Kbytes SA39-SA42 01000XXXXX 256 (4x64) Kbytes SA43-SA46 01001XXXXX 256 (4x64) Kbytes SA47-SA50 01010XXXXX 256 (4x64) Kbytes SA51-SA54 01011XXXXX 256 (4x64) Kbytes SA55–SA58 01100XXXXX 256 (4x64) Kbytes SA59–SA62 01101XXXXX 256 (4x64) Kbytes December 13, 2005 Sector Protection/Unprotection requires V ID on the RESET# pin only, and can be implemented either in-system or via programming equipment. Figure 2 shows the algorithms and Figure 26 shows the timing diagram. For sector unprotect, all unprotected sectors must first be protected prior to the first sector unprotect write cycle. Note that the sector unprotect algorithm unprotects all sectors in parallel. All previously protected sectors must be individually re-protected. To change data in protected sectors efficiently, the temporary sector unprotect function is available. See “Temporary Sector Unprotect”. Am29DL640D 15 The alternate method intended only for programming equipment requires VID on address pin A9 and OE#. This method is compatible with programmer routines written for earlier 3.0 volt-only AMD flash devices. The device is shipped with all sectors unprotected. AMD offers the option of programming and protecting sectors at its factory prior to shipping the device through AMD’s ExpressFlash™ Service. Contact an AMD representative for details. It is possible to determine whether a sector is protected or unprotected. See the Autoselect Mode section for details. Write Protect (WP#) The Write Protect function provides a hardware method of protecting without using VID. This function is one of two provided by the WP#/ACC pin. Temporary Sector Unprotect (Note: For the following discussion, the term “sector” applies to both sectors and sector blocks. A sector block consists of two or more adjacent sectors that are protected or unprotected at the same time (see Table 6). This feature allows temporary unprotection of previously protected sectors to change data in-system. The Sector Unprotect mode is activated by setting the RESET# pin to VID (8.5 V – 12.5 V). During this mode, formerly protected sectors can be programmed or erased by selecting the sector addresses. Once VID is removed from the RESET# pin, all the previously protected sectors are protected again. Figure 1 shows the algorithm, and Figure 25 shows the timing diagrams, for this feature. If the WP#/ACC pin is at VIL, sectors 0, 1, 140, and 141 remains protected during the Temporary sector Unprotect mode. If the system asserts VIL on the WP#/ACC pin, the device disables program and erase functions in sectors 0, 1, 140, and 141, independently of whether those sectors were protected or unprotected using the method described in Sector/Sector Block Protection and Unprotection. START If the system asserts VIH on the WP#/ACC pin, the device reverts to whether sectors 0, 1, 140, and 141 were last set to be protected or unprotected. That is, sector protection or unprotection for these sectors depends on whether they were last protected or unprotected using the method described in Sector/Sector Block Protection and Unprotection. RESET# = VID (Note 1) Perform Erase or Program Operations Note that the WP#/ACC pin must not be left floating or unconnected; inconsistent behavior of the device may result. Table 7. WP# Input Voltage RESET# = VIH WP#/ACC Modes Temporary Sector Unprotect Completed (Note 2) Device Mode VIL Disables programming and erasing in SA0, SA1, SA140, and SA141 VIH Enables programming and erasing in SA0, SA1, SA140, and SA141 VHH Enables accelerated programming (ACC). See “Accelerated Program Operation” on page 9. Notes: 1. All protected sectors unprotected (If WP#/ACC = VIL, sectors 0, 1, 140, and 141 remain protected). 2. All previously protected sectors are protected once again. Figure 1. 16 Am29DL640D Temporary Sector Unprotect Operation December 13, 2005 START START Protect all sectors: The indicated portion of the sector protect algorithm must be performed for all unprotected sectors prior to issuing the first sector unprotect address PLSCNT = 1 RESET# = VID Wait 1 μs Temporary Sector Unprotect Mode No PLSCNT = 1 RESET# = VID Wait 1 μs No First Write Cycle = 60h? First Write Cycle = 60h? Yes Yes Set up sector address No Sector Protect: Write 60h to sector address with A6 = 0, A1 = 1, A0 = 0 All sectors protected? Yes Set up first sector address Sector Unprotect: Write 60h to any address with A6 = 1, A1 = 1, A0 = 0 Wait 150 µs Verify Sector Protect: Write 40h to sector address with A6 = 0, A1 = 1, A0 = 0 Increment PLSCNT Temporary Sector Unprotect Mode Reset PLSCNT = 1 Read from sector address with A6 = 0, A1 = 1, A0 = 0 Wait 15 ms Verify Sector Unprotect: Write 40h to sector address with A6 = 1, A1 = 1, A0 = 0 Increment PLSCNT No No PLSCNT = 25? Yes Yes No Yes Device failed Read from sector address with A6 = 1, A1 = 1, A0 = 0 Data = 01h? PLSCNT = 1000? Protect another sector? No Data = 00h? Yes Yes Remove VID from RESET# Device failed Last sector verified? Write reset command Sector Protect Algorithm Sector Protect complete Set up next sector address No No Yes Sector Unprotect Algorithm Remove VID from RESET# Write reset command Sector Unprotect complete Figure 2. December 13, 2005 In-System Sector Protect/Unprotect Algorithms Am29DL640D 17 Secured Silicon Sector Flash Memory Region The Secured Silicon Sector feature provides a Flash memory region that enables permanent part identification through an Electronic Serial Number (ESN). The Secured Silicon Sector is 256 bytes in length, and uses a Secured Silicon Sector Indicator Bit (DQ7) to indicate whether or not the Secured Silicon Sector is locked when shipped from the factory. This bit is permanently set at the factory and cannot be changed, which prevents cloning of a factory locked part. This ensures the security of the ESN once the product is shipped to the field. AMD offers the device with the Secured Silicon Sector either factory locked or customer lockable. The factory-locked version is always protected when shipped from the factory, and has the Secured Silicon Sector Indicator Bit permanently set to a “1.” The customer-lockable version is shipped with the Secured Silicon Sector unprotected, allowing customers to utilize the that sector in any manner they choose. The customer-lockable version has the Secured Silicon Sector Indicator Bit permanently set to a “0.” Thus, the Secured Silicon Sector Indicator Bit prevents customer-lockable devices from being used to replace devices that are factory locked. Note that the ACC function and unlock bypass modes are not available when the Secured Silicon Sector is enabled. The system accesses the Secured Silicon Sector Secure through a command sequence (see Enter/Exit Secured Silicon Sector Command Sequence). After the system has written the Enter Secured Silicon Sector command sequence, it may read the Secured Silicon Sector by using the addresses normally occupied by the boot sectors. This mode of operation continues until the system issues the Exit Secured Silicon Sector command sequence, or until power is removed from the device. On power-up, or following a hardware reset, the device reverts to sending commands to the first 256 bytes of Sector 0. Note that the ACC function and unlock bypass modes are not available when the Secured Silicon Sector is enabled. Factory Locked: Secured Silicon Sector Programmed and Protected At the Factory In a factory locked device, the Secured Silicon Sector is protected when the device is shipped from the factory. The Secured Silicon Sector cannot be modified in any way. The device is preprogrammed with both a random number and a secure ESN. The 8-word random number will at addresses 000000h–000007h in word 18 mode (or 000000h–00000Fh in byte mode). The secure ESN is programmed in the next 8 words at addresses 000008h–00000Fh (or 000010h–000020h in byte mode). The device is available preprogrammed with one of the following: A random, secure ESN only Customer code through the ExpressFlash service Both a random, secure ESN and customer code through the ExpressFlash service. Customers may opt to have their code programmed by AMD through the AMD ExpressFlash service. AMD programs the customer’s code, with or without the random ESN. The devices are then shipped from AMD’s factory with the Secured Silicon Sector permanently locked. Contact an AMD representative for details on using AMD’s ExpressFlash service. Customer Lockable: Secured Silicon Sector NOT Programmed or Protected At the Factory If the security feature is not required, the Secured Silicon Sector can be treated as an additional Flash memory space. The Secured Silicon Sector can be read any number of times, but can be programmed and locked only once. Note that the accelerated programming (ACC) and unlock bypass functions are not available when programming the Secured Silicon Sector. The Secured Silicon Sector area can be protected using one of the following procedures: Write the three-cycle Enter Secured Silicon Sector Region command sequence, and then follow the in-system sector protect algorithm as shown in Figure 2, except that RESET# may be at either VIH or VID. This allows in-system protection of the Secured Silicon Sector Region without raising any device pin to a high voltage. Note that this method is only applicable to the Secured Silicon Sector. To verify the protect/unprotect status of the Secured Silicon Sector, follow the algorithm shown in Figure 3. Once the Secured Silicon Sector is locked and verified, the system must write the Exit Secured Silicon Sector Region command sequence to return to reading and writing the remainder of the array. The Secured Silicon Sector lock must be used with caution since, once locked, there is no procedure available for unlocking the Secured Silicon Sector area and none of the bits in the Secured Silicon Sector memory space can be modified in any way. Am29DL640D December 13, 2005 Logical Inhibit Write cycles are inhibited by holding any one of OE# = VIL, CE# = VIH or WE# = VIH. To initiate a write cycle, CE# and WE# must be a logical zero while OE# is a logical one. START RESET# = VIH or VID Wait 1 ms Write 60h to any address Write 40h to SecSi Sector address with A6 = 0, A1 = 1, A0 = 0 Read from SecSi Sector address with A6 = 0, A1 = 1, A0 = 0 Figure 3. If data = 00h, SecSi Sector is unprotected. If data = 01h, SecSi Sector is protected. Power-Up Write Inhibit If WE# = CE# = VIL and OE# = VIH during power up, the device does not accept commands on the rising edge of WE#. The internal state machine is automatically reset to the read mode on power-up. Remove VIH or VID from RESET# COMMON FLASH MEMORY INTERFACE (CFI) Write reset command The Common Flash Interface (CFI) specification outlines device and host system software interrogation handshake, which allows specific vendor-specified software algorithms to be used for entire families of devices. Software support can then be device-independent, JEDEC ID-independent, and forward- and backward-compatible for the specified flash device families. Flash vendors can standardize their existing interfaces for long-term compatibility. SecSi Sector Protect Verify complete Secured Silicon Sector Protect Verify Hardware Data Protection The command sequence requirement of unlock cycles for programming or erasing provides data protection against inadvertent writes (refer to Table 12 for command definitions). In addition, the following hardware data protection measures prevent accidental erasure or programming, which might otherwise be caused by spurious system level signals during VCC power-up and power-down transitions, or from system noise. Low VCC Write Inhibit When VCC is less than VLKO, the device does not accept any write cycles. This protects data during VCC power-up and power-down. The command register and all internal program/erase circuits are disabled, and the device resets to the read mode. Subsequent writes are ignored until VCC is greater than VLKO. The system must provide the proper signals to the control pins to prevent unintentional writes when V CC is greater than VLKO. This device enters the CFI Query mode when the system writes the CFI Query command, 98h, to address 55h in word mode (or address AAh in byte mode), any time the device is ready to read array data. The system can read CFI information at the addresses given in Tables 8–11. To terminate reading CFI data, the system must write the reset command. The CFI Query mode is not accessible when the device is executing an Embedded Program or embedded Erase algorithm. The system can also write the CFI query command when the device is in the autoselect mode. The device enters the CFI query mode, and the system can read CFI data at the addresses given in Tables 8–11. The system must write the reset command to return the device to reading array data. For further information, please refer to the CFI Specification and CFI Publication 100, available via the World Wide Web at http://www.amd.com/flash/cfi. Alternatively, contact an AMD representative for copies of these documents. Write Pulse “Glitch” Protection Noise pulses of less than 5 ns (typical) on OE#, CE# or WE# do not initiate a write cycle. December 13, 2005 Am29DL640D 19 Table 8. CFI Query Identification String Addresses (Word Mode) Addresses (Byte Mode) Data 10h 11h 12h 20h 22h 24h 0051h 0052h 0059h Query Unique ASCII string “QRY” 13h 14h 26h 28h 0002h 0000h Primary OEM Command Set 15h 16h 2Ah 2Ch 0040h 0000h Address for Primary Extended Table 17h 18h 2Eh 30h 0000h 0000h Alternate OEM Command Set (00h = none exists) 19h 1Ah 32h 34h 0000h 0000h Address for Alternate OEM Extended Table (00h = none exists) Table 9. Description System Interface String Addresses (Word Mode) Addresses (Byte Mode) Data 1Bh 36h 0027h VCC Min. (write/erase) D7–D4: volt, D3–D0: 100 millivolt 1Ch 38h 0036h VCC Max. (write/erase) D7–D4: volt, D3–D0: 100 millivolt 1Dh 3Ah 0000h VPP Min. voltage (00h = no VPP pin present) 1Eh 3Ch 0000h VPP Max. voltage (00h = no VPP pin present) 1Fh 3Eh 0004h Typical timeout per single byte/word write 2N µs 20h 40h 0000h Typical timeout for Min. size buffer write 2N µs (00h = not supported) 21h 42h 000Ah Typical timeout per individual block erase 2N ms 22h 44h 0000h Typical timeout for full chip erase 2N ms (00h = not supported) 23h 46h 0005h Max. timeout for byte/word write 2N times typical 24h 48h 0000h Max. timeout for buffer write 2N times typical 25h 4Ah 0004h Max. timeout per individual block erase 2N times typical 26h 4Ch 0000h Max. timeout for full chip erase 2N times typical (00h = not supported) 20 Description Am29DL640D December 13, 2005 Table 10. Addresses (Word Mode) Addresses (Byte Mode) Device Geometry Definition Data Description N 27h 4Eh 0017h Device Size = 2 byte 28h 29h 50h 52h 0002h 0000h Flash Device Interface description (refer to CFI publication 100) 2Ah 2Bh 54h 56h 0000h 0000h Max. number of byte in multi-byte write = 2N (00h = not supported) 2Ch 58h 0003h Number of Erase Block Regions within device 2Dh 2Eh 2Fh 30h 5Ah 5Ch 5Eh 60h 0007h 0000h 0020h 0000h Erase Block Region 1 Information (refer to the CFI specification or CFI publication 100) 31h 32h 33h 34h 62h 64h 66h 68h 007Dh 0000h 0000h 0001h Erase Block Region 2 Information (refer to the CFI specification or CFI publication 100) 35h 36h 37h 38h 6Ah 6Ch 6Eh 70h 0007h 0000h 0020h 0000h Erase Block Region 3 Information (refer to the CFI specification or CFI publication 100) 39h 3Ah 3Bh 3Ch 72h 74h 76h 78h 0000h 0000h 0000h 0000h Erase Block Region 4 Information (refer to the CFI specification or CFI publication 100) December 13, 2005 Am29DL640D 21 Table 11. Primary Vendor-Specific Extended Query Addresses (Word Mode) Addresses (Byte Mode) Data 40h 41h 42h 80h 82h 84h 0050h 0052h 0049h Description Query-unique ASCII string “PRI” 43h 86h 0031h Major version number, ASCII (reflects modifications to the silicon) 44h 88h 0033h Minor version number, ASCII (reflects modifications to the CFI table) 45h 8Ah 0000h Address Sensitive Unlock (Bits 1-0) 0 = Required, 1 = Not Required Silicon Revision Number (Bits 7-2) 46h 8Ch 0002h Erase Suspend 0 = Not Supported, 1 = To Read Only, 2 = To Read & Write 47h 8Eh 0001h Sector Protect 0 = Not Supported, X = Number of sectors in per group 48h 90h 0001h Sector Temporary Unprotect 00 = Not Supported, 01 = Supported 49h 92h 0004h Sector Protect/Unprotect scheme 01 =29F040 mode, 02 = 29F016 mode, 03 = 29F400, 04 = 29LV800 mode 4Ah 94h 0077h (See Note) 4Bh 96h 0000h Burst Mode Type 00 = Not Supported, 01 = Supported 4Ch 98h 0000h Page Mode Type 00 = Not Supported, 01 = 4 Word Page, 02 = 8 Word Page 4Dh 9Ah 0085h 4Eh 9Ch 0095h Simultaneous Operation 00 = Not Supported, X = Number of Sectors in Bank 2 (Uniform Bank) ACC (Acceleration) Supply Minimum 00h = Not Supported, D7-D4: Volt, D3-D0: 100 mV ACC (Acceleration) Supply Maximum 00h = Not Supported, D7-D4: Volt, D3-D0: 100 mV Top/Bottom Boot Sector Flag 4Fh 9Eh 0001h 50h A0h 0001h 57h AEh 0004h 58h B0h *0017h 59h B2h *0030h 5Ah B4h *0030h 5Bh B6h 0017h 00h = Uniform device, 01h = 8 x 8 Kbyte Sectors, Both Top and Bottom Boot with Write Protect, 02h = Bottom Boot Device, 03h = Top Boot Device, 04h = Both Top and Bottom Program Suspend 0 = Not supported, 1 = Supported Bank Organization 00 = Data at 4Ah is zero, X = Number of Banks Bank 1 Region Information X = Number of Sectors in Bank 1 Bank 2 Region Information X = Number of Sectors in Bank 2 Bank 3 Region Information X = Number of Sectors in Bank 3 Bank 4 Region Information X = Number of Sectors in Bank 4 Note: The number of sectors in Bank 2 is device dependent. 22 Am29DL640D December 13, 2005 COMMAND DEFINITIONS Writing specific address and data commands or sequences into the command register initiates device operations. Table 12 defines the valid register command sequences. Writing incorrect address and data values or writing them in the improper sequence may place the device in an unknown state. A reset command is then required to return the device to reading array data. All addresses are latched on the falling edge of WE# or CE#, whichever happens later. All data is latched on the rising edge of WE# or CE#, whichever happens first. Refer to the AC Characteristics section for timing diagrams. Reading Array Data The device is automatically set to reading array data after device power-up. No commands are required to retrieve data. Each bank is ready to read array data after completing an Embedded Program or Embedded Erase algorithm. After the device accepts an Erase Suspend command, the corresponding bank enters the erase-suspend-read mode, after which the system can read data from any non-erase-suspended sector within the same bank. The system can read array data using the standard read timing, except that if it reads at an address within erase-suspended sectors, the device outputs status data. After completing a programming operation in the Erase Suspend mode, the system may once again read array data with the same except i o n . S e e t h e E ra s e S u s p e n d / E ra s e R e s u m e Commands section for more information. The system must issue the reset command to return a bank to the read (or erase-suspend-read) mode if DQ5 goes high during an active program or erase operation, or if the bank is in the autoselect mode. See the next section, Reset Command, for more information. See also Requirements for Reading Array Data in the Device Bus Operations section for more information. The Read-Only Operations table provides the read parameters, and Figure 14 shows the timing diagram. The reset command may be written between the sequence cycles in a program command sequence before programming begins. This resets the bank to which the system was writing to the read mode. If the program command sequence is written to a bank that is in the Erase Suspend mode, writing the reset command retur ns that bank to the erase-suspend-read mode. Once programming begins, however, the device ignores reset commands until the operation is complete. The reset command may be written between the sequence cycles in an autoselect command sequence. Once in the autoselect mode, the reset command must be written to return to the read mode. If a bank entered the autoselect mode while in the Erase Suspend mode, writing the reset command returns that bank to the erase-suspend-read mode. If DQ5 goes high during a program or erase operation, writing the reset command returns the banks to the read mode (or erase-suspend-read mode if that bank was in Erase Suspend). Autoselect Command Sequence The autoselect command sequence allows the host system to access the manufacturer and device codes, and determine whether or not a sector is protected. The autoselect command sequence may be written to an address within a bank that is either in the read or erase-suspend-read mode. The autoselect command may not be written while the device is actively programming or erasing in the other bank. The autoselect command sequence is initiated by first writing two unlock cycles. This is followed by a third write cycle that contains the bank address and the auto s e le c t c o m m an d . T he b a n k t he n e n t er s t h e autoselect mode. The system may read any number of autoselect codes without reinitiating the command sequence. Reset Command Table 12 shows the address and data requirements. To determine sector protection information, the system must write to the appropriate bank address (BA) and sector address (SA). Table 2 shows the address range and bank number associated with each sector. Writing the reset command resets the banks to the read or erase-suspend-read mode. Address bits are don’t cares for this command. The system must write the reset command to return to the read mode (or erase-suspend-read mode if the bank was previously in Erase Suspend). The reset command may be written between the sequence cycles in an erase command sequence before erasing begins. This resets the bank to which the system was writing to the read mode. Once erasure begins, however, the device ignores reset commands until the operation is complete. December 13, 2005 Enter/Exit Secured Silicon Sector Command Sequence The Secured Silicon Sector region provides a secured data area containing a random, sixteen-byte electronic serial number (ESN). The system can access the Secured Silicon Sector region by issuing the three-cycle Am29DL640D 23 Enter Secured Silicon Sector command sequence. The device continues to access the Secured Silicon Sector region until the system issues the four-cycle Exit Secured Silicon Sector command sequence. The Exit Secured Silicon Sector command sequence returns the device to normal operation. The Secured Silicon Sector is not accessible when the device is executing an Embedded Program or embedded Erase algorithm. Table 12 shows the address and data requirements for both command sequences. See also Secured Silicon Sector Flash Memory Region for further information. Note that the ACC function and unlock bypass modes are not available when the Secured Silicon Sector is enabled. Byte/Word Program Command Sequence The system may program the device by word or byte, depending on the state of the BYTE# pin. Programming is a four-bus-cycle operation. The program command sequence is initiated by writing two unlock write cycles, followed by the program set-up command. The program address and data are written next, which in turn initiate the Embedded Program algorithm. The system is not required to provide further controls or timings. The device automatically provides internally generated program pulses and verifies the programmed cell margin. Table 12 shows the address and data requirements for the byte program command sequence. Note that the Secured Silicon Sector, autoselect, and CFI functions are unavailable when a program operation in is progress. When the Embedded Program algorithm is complete, that bank then returns to the read mode and addresses are no longer latched. The system can determine the status of the program operation by using DQ7, DQ6, or RY/BY#. Refer to the Write Operation Status section for information on these status bits. Any commands written to the device during the Embedded Program Algorithm are ignored. Note that a hardware reset immediately terminates the program operation. The program command sequence should be reinitiated once that bank has returned to the read mode, to ensure data integrity. Programming is allowed in any sequence and across sector boundaries. A bit cannot be programmed 24 from “0” back to a “1.” Attempting to do so may cause that bank to set DQ5 = 1, or cause the DQ7 and DQ6 status bits to indicate the operation was successful. However, a succeeding read shows that the data is still “0.” Only erase operations can convert a “0” to a “1.” Unlock Bypass Command Sequence The unlock bypass feature allows the system to program bytes or words to a bank faster than using the standard program command sequence. The unlock bypass command sequence is initiated by first writing two unlock cycles. This is followed by a third write cycle containing the unlock bypass command, 20h. That bank then enters the unlock bypass mode. A two-cycle unlock bypass program command sequence is all that is required to program in this mode. The first cycle in this sequence contains the unlock bypass program command, A0h; the second cycle contains the program address and data. Additional data is programmed in the same manner. This mode dispenses with the initial two unlock cycles required in the standard program command sequence, resulting in faster total programming time. Table 12 shows the requirements for the command sequence. During the unlock bypass mode, only the Unlock Bypass Program and Unlock Bypass Reset commands are valid. To exit the unlock bypass mode, the system must issue the two-cycle unlock bypass reset command sequence. (See Table 12). The device offers accelerated program operations through the WP#/ACC pin. When the system asserts VHH on the WP#/ACC pin, the device automatically enters the Unlock Bypass mode. The system may then write the two-cycle Unlock Bypass program command sequence. The device uses the higher voltage on the WP#/ACC pin to accelerate the operation. Note that the WP#/ACC pin must not be at VHH any operation other than accelerated programming, or device damage may result. In addition, the WP#/ACC pin must not be left floating or unconnected; inconsistent behavior of the device may result. Figure 4 illustrates the algorithm for the program operation. Refer to the Erase and Program Operations table in the AC Characteristics section for parameters, and Figure 18 for timing diagrams. Am29DL640D December 13, 2005 Any commands written during the chip erase operation are ignored. However, note that a hardware reset immediately terminates the erase operation. If that occurs, the chip erase command sequence should be reinitiated once that bank has returned to reading array data, to ensure data integrity. START Figure 5 illustrates the algorithm for the erase operation. Refer to the Erase and Program Operations tables in the AC Characteristics section for parameters, and Figure 20 section for timing diagrams. Write Program Command Sequence Data Poll from System Embedded Program algorithm in progress Verify Data? Sector Erase Command Sequence No Yes Increment Address No Last Address? The device does not require the system to preprogram prior to erase. The Embedded Erase algorithm automatically programs and verifies the entire memory for an all zero data pattern prior to electrical erase. The system is not required to provide any controls or timings during these operations. Yes Programming Completed Note: See Table 12 for program command sequence. Figure 4. Program Operation Chip Erase Command Sequence Chip erase is a six bus cycle operation. The chip erase command sequence is initiated by writing two unlock cycles, followed by a set-up command. Two additional unlock write cycles are then followed by the chip erase command, which in turn invokes the Embedded Erase algorithm. The device does not require the system to preprogram prior to erase. The Embedded Erase algorithm automatically preprograms and verifies the entire memory for an all zero data pattern prior to electrical erase. The system is not required to provide any controls or timings during these operations. Table 12 shows the address and data requirements for the chip erase command sequence. Note that the Secured Silicon Sector, autoselect, and CFI functions are unavailable when an erase operation in is progress. When the Embedded Erase algorithm is complete, that bank returns to the read mode and addresses are no longer latched. The system can determine the status of the erase operation by using DQ7, DQ6, DQ2, or RY/BY#. Refer to the Write Operation Status section for information on these status bits. December 13, 2005 Sector erase is a six bus cycle operation. The sector erase command sequence is initiated by writing two unlock cycles, followed by a set-up command. Two additional unlock cycles are written, and are then followed by the address of the sector to be erased, and the sector erase command. Table 12 shows the address and data requirements for the sector erase command sequence. Note that the Secured Silicon Sector, autoselect, and CFI functions are unavailable when an erase operation in is progress. After the command sequence is written, a sector erase time-out of 80 µs occurs. During the time-out period, additional sector addresses and sector erase commands may be written. Loading the sector erase buffer may be done in any sequence, and the number of sectors may be from one sector to all sectors. The time between these additional cycles must be less than 80 µs, otherwise erasure may begin. Any sector erase address and command following the exceeded time-out may or may not be accepted. It is recommended that processor interrupts be disabled during this time to ensure all commands are accepted. The interrupts can be re-enabled after the last Sector Erase command is written. Any command other than Sector Erase or Erase Suspend during the time-out period resets that bank to the read mode. The system must rewrite the command sequence and any additional addresses and commands. Note that the Secured Silicon Sector, autoselect, and CFI functions are unavailable when an erase operation in is progress. The system can monitor DQ3 to determine if the sector erase timer has timed out (See the section on DQ3: Sector Erase Timer.). The time-out begins from the rising edge of the final WE# pulse in the command sequence. When the Embedded Erase algorithm is complete, the bank returns to reading array data and addresses are Am29DL640D 25 no longer latched. Note that while the Embedded Erase operation is in progress, the system can read data from the non-erasing bank. The system can determine the status of the erase operation by reading DQ7, DQ6, DQ2, or RY/BY# in the erasing bank. Refer to the Write Operation Status section for information on these status bits. Once the sector erase operation has begun, only the Erase Suspend command is valid. All other commands are ignored. However, note that a hardware reset immediately terminates the erase operation. If that occurs, the sector erase command sequence should be reinitiated once that bank has returned to reading array data, to ensure data integrity. Figure 5 illustrates the algorithm for the erase operation. Refer to the Erase and Program Operations tables in the AC Characteristics section for parameters, and Figure 20 section for timing diagrams. Erase Suspend/Erase Resume Commands mode. The system can determine the status of the program operation using the DQ7 or DQ6 status bits, just as in the standard Byte Program operation. Refer to the Write Operation Status section for more information. In the erase-suspend-read mode, the system can also issue the autoselect command sequence. The device allows reading autoselect codes even at addresses within erasing sectors, since the codes are not stored in the memory array. When the device exits the autoselect mode, the device rever ts to the Erase Suspend mode, and is ready for another valid operation. Refer to the Autoselect Mode and Autoselect Command Sequence sections for details. To resume the sector erase operation, the system must write the Erase Resume command (address bits are don’t care). The bank address of the erase-suspended bank is required when writing this command. Further writes of the Resume command are ignored. Another Erase Suspend command can be written after the chip has resumed erasing. The Erase Suspend command, B0h, allows the system to interrupt a sector erase operation and then read data from, or program data to, any sector not selected for erasure. The bank address is required when writing this command. This command is valid only during the sector erase operation, including the 80 µs time-out period during the sector erase command sequence. The Erase Suspend command is ignored if written during the chip erase operation or Embedded Program algorithm. START Write Erase Command Sequence (Notes 1, 2) When the Erase Suspend command is written during the sector erase operation, the device requires a maximum of 20 µs to suspend the erase operation. However, when the Erase Suspend command is written during the sector erase time-out, the device immediately terminates the time-out period and suspends the erase operation. Addresses are “don’t-cares” when wr iting the Erase suspend command. After the erase operation has been suspended, the bank enters the erase-suspend-read mode. The system can read data from or program data to any sector not selected for erasure. (The device “erase suspends” all sectors selected for erasure.) Reading at any address within erase-suspended sectors produces status information on DQ7–DQ0. The system can use DQ7, or DQ6 and DQ2 together, to determine if a sector is actively erasing or is erase-suspended. Refer to the Write Operation Status section for information on these status bits. Data Poll to Erasing Bank from System No Data = FFh? Yes Erasure Completed Notes: 1. See Table 12 for erase command sequence. 2. See the section on DQ3 for information on the sector erase timer. After an erase-suspended program operation is complete, the bank returns to the erase-suspend-read 26 Embedded Erase algorithm in progress Am29DL640D Figure 5. Erase Operation December 13, 2005 Cycles Table 12. Command Sequence (Note 1) (Notes) Read (6) Reset (7) Autoselect (8) Manufacturer ID Device ID (9) Secured Silicon Sector Factory Protect (10) Sector/Sector Block Protect Verify (11) Enter Secured Silicon Sector Region Exit Secured Silicon Sector Region Program Unlock Bypass 1 1 Word Byte Word Byte Word Byte Word Byte Word Byte Word Byte Word Byte Word Byte Sector Erase Word Byte Word Byte Erase Suspend (14) Erase Resume (15) CFI Query (16) 6 4 4 3 4 4 3 2 2 Unlock Bypass Program (12) Unlock Bypass Reset (13) Chip Erase 4 6 6 1 1 Word Byte 1 First Addr Data RA RD XXX F0 555 AA AAA 555 AA AAA 555 AA AAA 555 AA AAA 555 AA AAA 555 AA AAA 555 AA AAA 555 AA AAA XXX A0 BA 90 555 AA AAA 555 AA AAA BA B0 BA 30 55 98 AA Am29DL640D Command Definitions Second Addr Data 2AA 555 2AA 555 2AA 555 2AA 555 2AA 555 2AA 555 2AA 555 2AA 555 PA XXX 2AA 555 2AA 555 55 55 55 55 55 55 55 55 (BA)555 (BA)AAA (BA)555 (BA)AAA (BA)555 (BA)AAA (BA)555 (BA)AAA 555 AAA 555 AAA 555 AAA 555 AAA 90 90 90 90 (BA)X00 Fifth Addr Data Sixth Addr Data 01 (BA)X01 (BA)X0E 7E (BA)X02 (BA)X1C (BA)X03 80/00 (BA)X06 (SA)X02 00/01 (SA)X04 02 (BA)X0F (BA)X1E 01 55 555 AAA 10 55 SA 30 88 90 XXX 00 A0 PA PD 20 PD 00 55 55 Legend: X = Don’t care RA = Address of the memory location to be read. RD = Data read from location RA during read operation. PA = Address of the memory location to be programmed. Addresses latch on the falling edge of the WE# or CE# pulse, whichever happens later. Notes: 1. See Table 1 for description of bus operations. 2. All values are in hexadecimal. 3. Except for the read cycle and the fourth cycle of the autoselect command sequence, all bus cycles are write cycles. 4. Data bits DQ15–DQ8 are don’t care in command sequences, except for RD and PD. 5. Unless otherwise noted, address bits A21–A11 (x16-only devices) or address bits A22–A11 (x8-only devices) are don’t cares for unlock and command cycles, unless SA or PA is required. 6. No unlock or command cycles required when bank is reading array data. 7. The Reset command is required to return to the read mode (or to the erase-suspend-read mode if previously in Erase Suspend) when a bank is in the autoselect mode, or if DQ5 goes high (while the bank is providing status information). 8. The fourth cycle of the autoselect command sequence is a read cycle. The system must provide the bank address to obtain the manufacturer ID, device ID, or Secured Silicon Sector factory protect information. Data bits DQ15–DQ8 are don’t care. See the Autoselect Command Sequence section for more information. December 13, 2005 Bus Cycles (Notes 2–5) Third Fourth Addr Data Addr Data 555 AAA 555 AAA 80 80 555 AAA 555 AAA AA AA 2AA 555 2AA 555 PD = Data to be programmed at location PA. Data latches on the rising edge of WE# or CE# pulse, whichever happens first. SA = Address of the sector to be verified (in autoselect mode) or erased. Address bits A21–A15 uniquely select any sector in a x16-only device. Address bits A22–A16 uniquely select any sector in a x8-only device. Refer to Table 2 for information on sector addresses. BA = Address of the bank that is being switched to autoselect mode, is in bypass mode, or is being erased. 9. 10. 11. 12. 13. 14. 15. 16. The device ID must be read across the fourth, fifth, and sixth cycles. The data is 80h for factory locked and 00h for not factory locked. The data is 00h for an unprotected sector/sector block and 01h for a protected sector/sector block. The Unlock Bypass command is required prior to the Unlock Bypass Program command. The Unlock Bypass Reset command is required to return to the read mode when the bank is in the unlock bypass mode. The system may read and program in non-erasing sectors, or enter the autoselect mode, when in the Erase Suspend mode. The Erase Suspend command is valid only during a sector erase operation, and requires the bank address. The Erase Resume command is valid only during the Erase Suspend mode, and requires the bank address. Command is valid when device is ready to read array data or when device is in autoselect mode. Am29DL640D 27 WRITE OPERATION STATUS The device provides several bits to determine the status of a program or erase operation: DQ2, DQ3, DQ5, DQ6, and DQ7. Table 13 and the following subsections describe the function of these bits. DQ7 and DQ6 each offer a method for determining whether a program or erase operation is complete or in progress. The device also provides a hardware-based output signal, RY/BY#, to determine whether an Embedded Program or Erase operation is in progress or has been completed. has completed the program or erase operation and DQ7 has valid data, the data outputs on DQ0–DQ15 may be still invalid. Valid data on DQ0–DQ15 (or DQ0–DQ7 for x8-only device) appears on successive read cycles. Table 13 shows the outputs for Data# Polling on DQ7. Figure 6 shows the Data# Polling algorithm. Figure 22 in the AC Characteristics section shows the Data# Polling timing diagram. DQ7: Data# Polling The Data# Polling bit, DQ7, indicates to the host system whether an Embedded Program or Erase algorithm is in progress or completed, or whether a bank is in Erase Suspend. Data# Polling is valid after the rising edge of the final WE# pulse in the command sequence. START Read DQ7–DQ0 Addr = VA During the Embedded Program algorithm, the device outputs on DQ7 the complement of the datum programmed to DQ7. This DQ7 status also applies to programming during Erase Suspend. When the Embedded Program algorithm is complete, the device outputs the datum programmed to DQ7. The system must provide the program address to read valid status information on DQ7. If a program address falls within a protected sector, Data# Polling on DQ7 is active for approximately 1 µs, then that bank returns to the read mode. DQ7 = Data? No No During the Embedded Erase algorithm, Data# Polling produces a “0” on DQ7. When the Embedded Erase algorithm is complete, or if the bank enters the Erase Suspend mode, Data# Polling produces a “1” on DQ7. The system must provide an address within any of the sectors selected for erasure to read valid status information on DQ7. 28 DQ5 = 1? Yes Read DQ7–DQ0 Addr = VA After an erase command sequence is written, if all sectors selected for erasing are protected, Data# Polling on DQ7 is active for approximately 100 µs, then the bank returns to the read mode. If not all selected sectors are protected, the Embedded Erase algorithm erases the unprotected sectors, and ignores the selected sectors that are protected. However, if the system reads DQ7 at an address within a protected sector, the status may not be valid. When the system detects DQ7 has changed from the complement to true data, it can read valid data at DQ15–DQ0 (or DQ7–DQ0 for x8-only device) on the following read cycles. Just prior to the completion of an Embedded Program or Erase operation, DQ7 may change asynchronously with DQ8–DQ15 (DQ0–-DQ7 for x8-only device) while Output Enable (OE#) is asser ted low. That is, the device may change from providing status information to valid data on DQ7. Depending on when the system samples the DQ7 output, it may read the status or valid data. Even if the device Yes DQ7 = Data? Yes No FAIL PASS Notes: 1. VA = Valid address for programming. During a sector erase operation, a valid address is any sector address within the sector being erased. During chip erase, a valid address is any non-protected sector address. 2. DQ7 should be rechecked even if DQ5 = “1” because DQ7 may change simultaneously with DQ5. Am29DL640D Figure 6. Data# Polling Algorithm December 13, 2005 RY/BY#: Ready/Busy# The RY/BY# is a dedicated, open-drain output pin which indicates whether an Embedded Algorithm is in progress or complete. The RY/BY# status is valid after the rising edge of the final WE# pulse in the command sequence. Since RY/BY# is an open-drain output, several RY/BY# pins can be tied together in parallel with a pull-up resistor to VCC. If the output is low (Busy), the device is actively erasing or programming. (This includes programming in the Erase Suspend mode.) If the output is high (Ready), the device is in the read mode, the standby mode, or one of the banks is in the erase-suspend-read mode. DQ6 also toggles during the erase-suspend-program mode, and stops toggling once the Embedded Program algorithm is complete. Table 13 shows the outputs for Toggle Bit I on DQ6. Figure 7 shows the toggle bit algorithm. Figure 23 in the AC Characteristics section shows the toggle bit timing diagrams. Figure 24 shows the differences between DQ2 and DQ6 in graphical form. See also the subsection on DQ2: Toggle Bit II. START Table 13 shows the outputs for RY/BY#. Read DQ7–DQ0 DQ6: Toggle Bit I Toggle Bit I on DQ6 indicates whether an Embedded Program or Erase algorithm is in progress or complete, or whether the device has entered the Erase Suspend mode. Toggle Bit I may be read at any address, and is valid after the rising edge of the final WE# pulse in the command sequence (prior to the program or erase operation), and during the sector erase time-out. During an Embedded Program or Erase algorithm operation, successive read cycles to any address cause DQ6 to toggle. The system may use either OE# or CE# to control the read cycles. When the operation is complete, DQ6 stops toggling. Read DQ7–DQ0 Toggle Bit = Toggle? Yes No After an erase command sequence is written, if all sectors selected for erasing are protected, DQ6 toggles for approximately 100 µs, then returns to reading array data. If not all selected sectors are protected, the Embedded Erase algorithm erases the unprotected sectors, and ignores the selected sectors that are protected. DQ5 = 1? Yes Read DQ7–DQ0 Twice The system can use DQ6 and DQ2 together to determine whether a sector is actively erasing or is erase-suspended. When the device is actively erasing (that is, the Embedded Erase algorithm is in progress), DQ6 toggles. When the device enters the Erase Suspend mode, DQ6 stops toggling. However, the system must also use DQ2 to determine which sectors are erasing or erase-suspended. Alternatively, the system can use DQ7 (see the subsection on DQ7: Data# Polling). If a program address falls within a protected sector, DQ6 toggles for approximately 1 µs after the program command sequence is written, then returns to reading array data. Toggle Bit = Toggle? No Yes Program/Erase Operation Not Complete, Write Reset Command Program/Erase Operation Complete Note: The system should recheck the toggle bit even if DQ5 = “1” because the toggle bit may stop toggling as DQ5 changes to “1.” See the subsections on DQ6 and DQ2 for more information. Figure 7. December 13, 2005 No Am29DL640D Toggle Bit Algorithm 29 DQ2: Toggle Bit II The “Toggle Bit II” on DQ2, when used with DQ6, indicates whether a particular sector is actively erasing (that is, the Embedded Erase algorithm is in progress), or whether that sector is erase-suspended. Toggle Bit II is valid after the rising edge of the final WE# pulse in the command sequence. DQ2 toggles when the system reads at addresses within those sectors that have been selected for erasure. (The system may use either OE# or CE# to control the read cycles.) But DQ2 cannot distinguish whether the sector is actively erasing or is erase-suspended. DQ6, by comparison, indicates whether the device is actively erasing, or is in Erase Suspend, but cannot distinguish which sectors are selected for erasure. Thus, both status bits are required for sector and mode information. Refer to Table 13 to compare outputs for DQ2 and DQ6. Figure 7 shows the toggle bit algorithm in flowchart form, and the section DQ2: Toggle Bit II explains the algorithm. See also the DQ6: Toggle Bit I subsection. Figure 23 shows the toggle bit timing diagram. Figure 24 shows the differences between DQ2 and DQ6 in graphical form. Reading Toggle Bits DQ6/DQ2 Refer to Figure 7 for the following discussion. Whenever the system initially begins reading toggle bit status, it must read DQ15–DQ0 (or DQ7–DQ0 for x8-only device) at least twice in a row to determine whether a toggle bit is toggling. Typically, the system would note and store the value of the toggle bit after the first read. After the second read, the system would compare the new value of the toggle bit with the first. If the toggle bit is not toggling, the device has completed the program or erase operation. The system can read array data on DQ15–DQ0 (or DQ7–DQ0 for x8-only device) on the following read cycle. However, if after the initial two read cycles, the system determines that the toggle bit is still toggling, the system also should note whether the value of DQ5 is high (see the section on DQ5). If it is, the system should then determine again whether the toggle bit is toggling, since the toggle bit may have stopped toggling just as DQ5 went high. If the toggle bit is no longer toggling, the device has successfully completed the program or erase operation. If it is still toggling, the device did not completed the operation successfully, and the system must write the reset command to return to reading array data. The remaining scenario is that the system initially determines that the toggle bit is toggling and DQ5 has not gone high. The system may continue to monitor 30 the toggle bit and DQ5 through successive read cycles, determining the status as described in the previous paragraph. Alternatively, it may choose to perform other system tasks. In this case, the system must start at the beginning of the algorithm when it returns to determine the status of the operation (top of Figure 7). DQ5: Exceeded Timing Limits DQ5 indicates whether the program or erase time has exceeded a specified internal pulse count limit. Under these conditions DQ5 produces a “1,” indicating that the program or erase cycle was not successfully completed. The device may output a “1” on DQ5 if the system tries to program a “1” to a location that was previously programmed to “0.” Only an erase operation can change a “0” back to a “1.” Under this condition, the device halts the operation, and when the timing limit has been exceeded, DQ5 produces a “1.” Under both these conditions, the system must write the reset command to return to the read mode (or to the erase-suspend-read mode if a bank was previously in the erase-suspend-program mode). DQ3: Sector Erase Timer After writing a sector erase command sequence, the system may read DQ3 to determine whether or not erasure has begun. (The sector erase timer does not apply to the chip erase command.) If additional sectors are selected for erasure, the entire time-out also applies after each additional sector erase command. When the time-out period is complete, DQ3 switches from a “0” to a “1.” If the time between additional sector erase commands from the system can be assumed to be less than 50 µs, the system need not monitor DQ3. See also the Sector Erase Command Sequence section. After the sector erase command is written, the system should read the status of DQ7 (Data# Polling) or DQ6 (Toggle Bit I) to ensure that the device has accepted the command sequence, and then read DQ3. If DQ3 is “1,” the Embedded Erase algorithm has begun; all further commands (except Erase Suspend) are ignored until the erase operation is complete. If DQ3 is “0,” the device accepts additional sector erase commands. To ensure the command has been accepted, the system software should check the status of DQ3 prior to and following each subsequent sector erase command. If DQ3 is high on the second status check, the last command might not have been accepted. Table 13 shows the status of DQ3 relative to the other status bits. Am29DL640D December 13, 2005 Table 13. Standard Mode Erase Suspend Mode Status Embedded Program Algorithm Embedded Erase Algorithm Erase Erase-Suspend- Suspended Sector Read Non-Erase Suspended Sector Erase-Suspend-Program Write Operation Status DQ7 (Note 2) DQ7# 0 DQ6 Toggle Toggle DQ5 (Note 1) 0 0 DQ3 N/A 1 DQ2 (Note 2) No toggle Toggle RY/BY# 0 0 1 No toggle 0 N/A Toggle 1 Data Data Data Data Data 1 DQ7# Toggle 0 N/A N/A 0 Notes: 1. DQ5 switches to ‘1’ when an Embedded Program or Embedded Erase operation has exceeded the maximum timing limits. Refer to the section on DQ5 for more information. 2. DQ7 and DQ2 require a valid address when reading status information. Refer to the appropriate subsection for further details. 3. When reading write operation status bits, the system must always provide the bank address where the Embedded Algorithm is in progress. The device outputs array data if the system addresses a non-busy bank. December 13, 2005 Am29DL640D 31 ABSOLUTE MAXIMUM RATINGS Storage Temperature Plastic Packages . . . . . . . . . . . . . . . –65°C to +150°C Exposure of the device to absolute maximum rating conditions for extended periods may affect device reliability. Ambient Temperature with Power Applied. . . . . . . . . . . . . . –65°C to +125°C Voltage with Respect to Ground VCC (Note 1) . . . . . . . . . . . . . . . . . –0.5 V to +4.0 V A9, OE#, and RESET# (Note 2) . . . . . . . . . . . . . . . . . . . . –0.5 V to +12.5 V 20 ns 20 ns +0.8 V –0.5 V –2.0 V WP#/ACC . . . . . . . . . . . . . . . . . . –0.5 V to +10.5 V 20 ns All other pins (Note 1) . . . . . . –0.5 V to VCC +0.5 V Output Short Circuit Current (Note 3) . . . . . . 200 mA Notes: 1. Minimum DC voltage on input or I/O pins is –0.5 V. During voltage transitions, input or I/O pins may overshoot V SS to –2.0 V for periods of up to 20 ns. Maximum DC voltage on input or I/O pins is VCC +0.5 V. See Figure 8. During voltage transitions, input or I/O pins may overshoot to VCC +2.0 V for periods up to 20 ns. See Figure 9. 2. Minimum DC input voltage on pins A9, OE#, RESET#, and WP#/ACC is –0.5 V. During voltage transitions, A9, OE#, WP#/ACC, and RESET# may overshoot V SS to –2.0 V for periods of up to 20 ns. See Figure 8. Maximum DC input voltage on pin A9 is +12.5 V which may overshoot to +14.0 V for periods up to 20 ns. Maximum DC input voltage on WP#/ACC is +9.5 V which may overshoot to +12.0 V for periods up to 20 ns. 3. No more than one output may be shorted to ground at a time. Duration of the short circuit should not be greater than one second. Figure 8. Maximum Negative Overshoot Waveform 20 ns VCC +2.0 V VCC +0.5 V 2.0 V 20 ns Figure 9. 20 ns Maximum Positive Overshoot Waveform Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational sections of this data sheet is not implied. OPERATING RANGES Industrial (I) Devices Ambient Temperature (TA) . . . . . . . . . –40°C to +85°C Extended (E) Devices Ambient Temperature (TA) . . . . . . . . –55°C to +125°C VCC Supply Voltages VCC for standard voltage range . . . . . . . 2.7 V to 3.6 V Operating ranges define those limits between which the functionality of the device is guaranteed. 32 Am29DL640D December 13, 2005 DC CHARACTERISTICS CMOS Compatible Parameter Symbol Parameter Description (Notes) Test Conditions Min ILI Input Load Current VIN = VSS to VCC, VCC = VCC max ILIT A9 Input Load Current VCC = VCC max; A9 = 12.5 V ILO Output Leakage Current VOUT = VSS to VCC, VCC = VCC max ICC1 VCC Active Read Current (1, 2) Typ Max Unit ±1.0 µA 35 µA ±1.0 µA CE# = VIL, OE# = VIH, Byte Mode 5 MHz 10 16 1 MHz 2 4 CE# = VIL, OE# = VIH, Word Mode 5 MHz 10 16 1 MHz 2 4 mA ICC2 VCC Active Write Current (2, 3) CE# = VIL, OE# = VIH, WE# = VIL 15 30 mA ICC3 VCC Standby Current (2) CE#, RESET# = VCC ± 0.3 V 0.2 5 µA ICC4 VCC Reset Current (2) RESET# = VSS ± 0.3 V 0.2 5 µA ICC5 Automatic Sleep Mode (2, 4) VIH = VCC ± 0.3 V; VIL = VSS ± 0.3 V 0.2 5 µA ICC6 VCC Active Read-While-Program Current (1, 2) CE# = VIL, OE# = VIH Byte 21 45 Word 21 45 ICC7 VCC Active Read-While-Erase Current (1, 2) CE# = VIL, OE# = VIH Byte 21 45 Word 21 45 ICC8 VCC Active Program-While-Erase-Suspended Current (2, 5) CE# = VIL, OE# = VIH 17 35 mA VIL Input Low Voltage –0.5 0.8 V VIH Input High Voltage 0.7 x VCC VCC + 0.3 V VHH Voltage for WP#/ACC Sector Protect/Unprotect and Program Acceleration VCC = 3.0 V ± 10% 8.5 9.5 V VID Voltage for Autoselect and Temporary VCC = 3.0 V ± 10% Sector Unprotect 11.5 12.5 V VOL Output Low Voltage 0.45 V VOH1 VOH2 VLKO Output High Voltage IOL = 4.0 mA, VCC = VCC min IOH = –2.0 mA, VCC = VCC min 0.85 VCC IOH = –100 µA, VCC = VCC min VCC – 0.4 Low VCC Lock-Out Voltage (5) 2.3 mA mA V 2.5 V Notes: 1. The ICC current listed is typically less than 2 mA/MHz, with OE# at VIH. 2. Maximum ICC specifications are tested with VCC = VCCmax. 3. ICC active while Embedded Erase or Embedded Program is in progress. 4. Automatic sleep mode enables the low power mode when addresses remain stable for tACC + 30 ns. Typical sleep mode current is 200 nA. 5. Not 100% tested. December 13, 2005 Am29DL640D 33 DC CHARACTERISTICS Zero-Power Flash Supply Current in mA 25 20 15 10 5 0 0 500 1000 1500 2000 2500 3000 3500 4000 Time in ns Note: Addresses are switching at 1 MHz Figure 10. ICC1 Current vs. Time (Showing Active and Automatic Sleep Currents) 12 3.6 V 10 2.7 V Supply Current in mA 8 6 4 2 0 1 2 3 Note: T = 25 °C Figure 11. 34 4 5 Frequency in MHz Typical ICC1 vs. Frequency Am29DL640D December 13, 2005 TEST CONDITIONS Table 14. 3.3 V Test Condition 2.7 kΩ Device Under Test CL Test Specifications 6.2 kΩ 90, 120 Output Load 1 TTL gate Output Load Capacitance, CL (including jig capacitance) 30 pF Input Rise and Fall Times 5 ns 0.0–3.0 V Input timing measurement reference levels 1.5 V Output timing measurement reference levels 1.5 V Input Pulse Levels Note: Diodes are IN3064 or equivalent Figure 12. Unit Test Setup KEY TO SWITCHING WAVEFORMS WAVEFORM INPUTS OUTPUTS Steady Changing from H to L Changing from L to H Don’t Care, Any Change Permitted Changing, State Unknown Does Not Apply Center Line is High Impedance State (High Z) KS000010-PAL 3.0 V Input 1.5 V Measurement Level 1.5 V Output 0.0 V Figure 13. December 13, 2005 Input Waveforms and Measurement Levels Am29DL640D 35 AC CHARACTERISTICS Read-Only Operations Parameter Speed Options Description (Notes) JEDEC Std. tAVAV tRC Read Cycle Time (1) tAVQV tACC Address to Output Delay tELQV tCE Chip Enable to Output Delay tGLQV tOE tEHQZ Test Setup 90 120 Unit Min 90 120 ns CE#, OE# = VIL Max 90 120 ns OE# = VIL Max 90 120 ns Output Enable to Output Delay Max 35 50 ns tDF Chip Enable to Output High Z (1, 3) Max 30 ns tGHQZ tDF Output Enable to Output High Z ( 1, 3) Max 30 ns tAXQX tOH Output Hold Time From Addresses, CE# or OE#, Whichever Occurs First Min 0 ns Output Enable Hold Time (1) Read Min 0 ns tOEH Toggle and Data# Polling Min 10 ns Notes: 1. Not 100% tested. 2. See Figure 12 and Table 14 for test specifications 3. Measurements performed by placing a 50Ω termination on the data pin with a bias of VCC/2. The time from OE# high to the data bus driven to VCC/2 is taken as tDF . tRC Addresses Stable Addresses tACC CE# tRH tRH tDF tOE OE# tOEH WE# tCE tOH HIGH Z HIGH Z Output Valid Outputs RESET# RY/BY# 0V Figure 14. 36 Read Operation Timings Am29DL640D December 13, 2005 AC CHARACTERISTICS Hardware Reset (RESET#) Parameter JEDEC Std Description All Speed Options Unit tReady RESET# Pin Low (During Embedded Algorithms) to Read Mode (See Note) Max 20 µs tReady RESET# Pin Low (NOT During Embedded Algorithms) to Read Mode (See Note) Max 500 ns tRP RESET# Pulse Width Min 500 ns tRH Reset High Time Before Read (See Note) Min 50 ns tRPD RESET# Low to Standby Mode Min 20 µs tRB RY/BY# Recovery Time Min 0 ns Note: Not 100% tested. RY/BY# CE#, OE# tRH RESET# tRP tReady Reset Timings NOT during Embedded Algorithms Reset Timings during Embedded Algorithms tReady RY/BY# tRB CE#, OE# RESET# tRP Figure 15. December 13, 2005 Reset Timings Am29DL640D 37 AC CHARACTERISTICS Word/Byte Configuration (BYTE#) Parameter JEDEC Std Speed Options Description 90 120 5 Unit tELFL/tELFH CE# to BYTE# Switching Low or High Max ns tFLQZ BYTE# Switching Low to Output HIGH Z Max 30 30 ns tFHQV BYTE# Switching High to Output Active Min 90 120 ns CE# OE# BYTE# BYTE# Switching from word to byte mode tELFL Data Output (DQ0–DQ7) Data Output (DQ0–DQ14) DQ0–DQ14 Address Input DQ15 Output DQ15/A-1 tFLQZ tELFH BYTE# BYTE# Switching from byte to word mode Data Output (DQ0–DQ7) DQ0–DQ14 Address Input DQ15/A-1 Data Output (DQ0–DQ14) DQ15 Output tFHQV Figure 16. BYTE# Timings for Read Operations CE# The falling edge of the last WE# signal WE# BYTE# tSET (tAS) tHOLD (tAH) Note: Refer to the Erase/Program Operations table for tAS and tAH specifications. Figure 17. 38 BYTE# Timings for Write Operations Am29DL640D December 13, 2005 AC CHARACTERISTICS Erase and Program Operations Parameter Speed Options Description (Notes) JEDEC Std 90 120 Unit tAVAV tWC Write Cycle Time (1) Min 90 120 ns tAVWL tAS Address Setup Time Min 0 tASO Address Setup Time to OE# low during toggle bit polling Min tAH Address Hold Time Min tAHT Address Hold Time From CE# or OE# high during toggle bit polling Min tDVWH tDS Data Setup Time Min tWHDX tDH Data Hold Time Min 0 ns tOEPH Output Enable High during toggle bit polling Min 20 ns tGHWL tGHWL Read Recovery Time Before Write (OE# High to WE# Low) Min 0 ns tELWL tCS CE# Setup Time Min 0 ns tWHEH tCH CE# Hold Time Min 0 ns tWLWH tWP Write Pulse Width Min 35 50 ns tWHDL tWPH Write Pulse Width High Min 30 30 ns tSR/W Latency Between Read and Write Operations Min 0 Byte Typ 8.6 Word Typ 12.6 tWLAX ns 15 45 ns 50 0 45 ns ns 50 ns ns tWHWH1 tWHWH1 Programming Operation (2) tWHWH1 tWHWH1 Accelerated Programming Operation, Word or Byte (2) Typ 4 µs tWHWH2 tWHWH2 Sector Erase Operation (2) Typ 0.7 sec tVCS VCC Setup Time (1) Min 50 µs tRB Write Recovery Time from RY/BY# Min 0 ns Program/Erase Valid to RY/BY# Delay Max 90 ns tBUSY µs Notes: 1. Not 100% tested. 2. See the Erase And Programming Performance section for more information. December 13, 2005 Am29DL640D 39 AC CHARACTERISTICS Program Command Sequence (last two cycles) tAS tWC Addresses Read Status Data (last two cycles) 555h PA PA PA tAH CE# tCH OE# tWHWH1 tWP WE# tWPH tCS tDS tDH PD A0h Data Status tBUSY DOUT tRB RY/BY# VCC tVCS Notes: 1. PA = program address, PD = program data, DOUT is the true data at the program address. 2. Illustration shows device in word mode. Figure 18. Program Operation Timings VHH WP#/ACC VIL or VIH VIL or VIH tVHH Figure 19. 40 tVHH Accelerated Program Timing Diagram Am29DL640D December 13, 2005 AC CHARACTERISTICS Erase Command Sequence (last two cycles) tAS tWC 2AAh Addresses Read Status Data VA SA VA 555h for chip erase tAH CE# tCH OE# tWP WE# tWPH tCS tWHWH2 tDS tDH Data 55h In Progress 30h Complete 10 for Chip Erase tBUSY tRB RY/BY# tVCS VCC Notes: 1. SA = sector address (for Sector Erase), VA = Valid Address for reading status data (see Write Operation Status.) 2. These waveforms are for the word mode. Figure 20. December 13, 2005 Chip/Sector Erase Operation Timings Am29DL640D 41 AC CHARACTERISTICS Addresses tWC tWC tRC Valid PA Valid RA tWC Valid PA Valid PA tAH tCPH tACC tCE CE# tCP tOE OE# tOEH tGHWL tWP WE# tDF tWPH tDS tOH tDH Valid Out Valid In Data Valid In Valid In tSR/W WE# Controlled Write Cycle Read Cycle Figure 21. CE# Controlled Write Cycles Back-to-back Read/Write Cycle Timings tRC Addresses VA VA VA tACC tCE CE# tCH tOE OE# tOEH tDF WE# tOH High Z DQ7 Complement Complement DQ0–DQ6 Status Data Status Data True Valid Data High Z True Valid Data tBUSY RY/BY# Note: VA = Valid address. Illustration shows first status cycle after command sequence, last status read cycle, and array data read cycle. Figure 22. 42 Data# Polling Timings (During Embedded Algorithms) Am29DL640D December 13, 2005 AC CHARACTERISTICS tAHT tAS Addresses tAHT tASO CE# tCEPH tOEH WE# tOEPH OE# tDH DQ6/DQ2 tOE Valid Data Valid Status Valid Status Valid Status (first read) (second read) (stops toggling) Valid Data RY/BY# Note: VA = Valid address; not required for DQ6. Illustration shows first two status cycle after command sequence, last status read cycle, and array data read cycle. Figure 23. Enter Embedded Erasing WE# Erase Suspend Erase Toggle Bit Timings (During Embedded Algorithms) Enter Erase Suspend Program Erase Suspend Read Erase Suspend Program Erase Resume Erase Suspend Read Erase Erase Complete DQ6 DQ2 Note: DQ2 toggles only when read at an address within an erase-suspended sector. The system may use OE# or CE# to toggle DQ2 and DQ6. Figure 24. December 13, 2005 DQ2 vs. DQ6 Am29DL640D 43 AC CHARACTERISTICS Temporary Sector Unprotect Parameter JEDEC Std Description All Speed Options Unit tVIDR VID Rise and Fall Time (See Note) Min 500 ns tVHH VHH Rise and Fall Time (See Note) Min 250 ns tRSP RESET# Setup Time for Temporary Sector Unprotect Min 4 µs tRRB RESET# Hold Time from RY/BY# High for Temporary Sector Unprotect Min 4 µs Note: Not 100% tested. VID RESET# VID VSS, VIL, or VIH VSS, VIL, or VIH tVIDR tVIDR Program or Erase Command Sequence CE# WE# tRRB tRSP RY/BY# Figure 25. 44 Temporary Sector Unprotect Timing Diagram Am29DL640D December 13, 2005 AC CHARACTERISTICS VID VIH RESET# SA, A6, A1, A0 Valid* Valid* Sector/Sector Block Protect or Unprotect Data 60h 60h Valid* Verify 40h Status Sector/Sector Block Protect: 150 µs, Sector/Sector Block Unprotect: 15 ms 1 µs CE# WE# OE# * For sector protect, A6 = 0, A1 = 1, A0 = 0. For sector unprotect, A6 = 1, A1 = 1, A0 = 0. Figure 26. Sector/Sector Block Protect and Unprotect Timing Diagram December 13, 2005 Am29DL640D 45 AC CHARACTERISTICS Alternate CE# Controlled Erase and Program Operations Parameter Speed Options Description (Notes) JEDEC Std 90 120 Unit tAVAV tWC Write Cycle Time (1) Min 90 120 ns tAVWL tAS Address Setup Time Min tELAX tAH Address Hold Time Min 45 50 ns tDVEH tDS Data Setup Time Min 45 50 ns tEHDX tDH Data Hold Time Min 0 ns tGHEL tGHEL Read Recovery Time Before Write (OE# High to WE# Low) Min 0 ns tWLEL tWS WE# Setup Time Min 0 ns tEHWH tWH WE# Hold Time Min 0 ns tELEH tCP CE# Pulse Width Min tEHEL tCPH CE# Pulse Width High Min 30 Byte Typ 8.6 tWHWH1 tWHWH1 Programming Operation (2) Word Typ 12.6 tWHWH1 tWHWH1 Accelerated Programming Operation, Word or Byte (2) Typ 4 µs tWHWH2 tWHWH2 Sector Erase Operation (2) Typ 0.7 sec 0 45 ns 50 ns ns µs Notes: 1. Not 100% tested. 2. See the Erase And Programming Performance section for more information. 46 Am29DL640D December 13, 2005 AC CHARACTERISTICS 555 for program 2AA for erase PA for program SA for sector erase 555 for chip erase Data# Polling Addresses PA tWC tAS tAH tWH WE# tGHEL OE# tWHWH1 or 2 tCP CE# tWS tCPH tBUSY tDS tDH DQ7# Data tRH A0 for program 55 for erase DOUT PD for program 30 for sector erase 10 for chip erase RESET# RY/BY# Notes: 1. Figure indicates last two bus cycles of a program or erase operation. 2. PA = program address, SA = sector address, PD = program data. 3. DQ7# is the complement of the data written to the device. DOUT is the data written to the device. 4. Waveforms are for the word mode. Figure 27. December 13, 2005 Alternate CE# Controlled Write (Erase/Program) Operation Timings Am29DL640D 47 ERASE AND PROGRAMMING PERFORMANCE Typ (Note 1) Max (Note 2) Unit Comments Sector Erase Time 0.7 15 sec Chip Erase Time 100 Excludes 00h programming prior to erasure (Note 4) Parameter sec Byte Program Time 5 150 µs Accelerated Byte/Word Program Time 4 120 µs Word Program Time 7 210 µs Byte Mode 42 126 Word Mode 28 84 Chip Program Time (Note 3) Excludes system level overhead (Note 5) sec Notes: 1. Typical program and erase times assume the following conditions: 25°C, 3.0 V VCC, 1,000,000 cycles. Additionally, programming typicals assume checkerboard pattern. 2. Under worst case conditions of 90°C, VCC = 2.7 V, 1,000,000 cycles. 3. The typical chip programming time is considerably less than the maximum chip programming time listed, since most bytes program faster than the maximum program times listed. 4. In the pre-programming step of the Embedded Erase algorithm, all bytes are programmed to 00h before erasure. 5. System-level overhead is the time required to execute the two- or four-bus-cycle sequence for the program command. See Table 12 for further information on command definitions. 6. The device has a minimum erase and program cycle endurance of 1,000,000 cycles. LATCHUP CHARACTERISTICS Description Min Max Input voltage with respect to VSS on all pins except I/O pins (including A9, OE#, and RESET#) –1.0 V 12.5 V Input voltage with respect to VSS on all I/O pins –1.0 V VCC + 1.0 V –100 mA +100 mA VCC Current Note: Includes all pins except VCC. Test conditions: VCC = 3.0 V, one pin at a time. TSOP PIN CAPACITANCE Parameter Symbol Parameter Description Test Setup Typ Max Unit CIN Input Capacitance VIN = 0 6 7.5 pF COUT Output Capacitance VOUT = 0 8.5 12 pF CIN2 Control Pin Capacitance VIN = 0 7.5 9 pF Test Conditions Min Unit 150°C 10 Years 125°C 20 Years Notes: 1. Sampled, not 100% tested. 2. Test conditions TA = 25°C, f = 1.0 MHz. DATA RETENTION Parameter Description Minimum Pattern Data Retention Time 48 Am29DL640D December 13, 2005 PHYSICAL DIMENSIONS FBE063—63-Ball Fine-Pitch Ball Grid Array (FBGA) 12 x 11 mm package xFBE 063 Dwg rev AF; 10/99 December 13, 2005 Am29DL640D 49 PHYSICAL DIMENSIONS TS 048—48-Pin Standard TSOP Dwg rev AA; 10/99 50 Am29DL640D December 13, 2005 REVISION SUMMARY Revision B+2 (October 11, 2001) Revision A (March 5, 2001) Initial release. Connection Diagrams, Ordering Information, Physical Dimensions Revision A+1 (March 9, 2001) Added 64-ball Fortified BGA package information. Ordering Information Corrected FBGA package marking to include “V” designation. Deleted “0” from 120 ns package marking. Revision B+3 (November 5, 2001) Global Revision B (August 10, 2001) Removed Preliminary designation from document. Global Ordering Information Replaced the phrase “outermost 8 Kb sectors” with the actual sector names (sectors 0, 1, 140, and 141) for greater clarity. Changed data sheet status from “Advance Information” to “Preliminary”. Corrected BGA part numbers and markings. Block Diagram Device Bus Operations Corrected address bus callout from A20 to A21. Added Table 3, Bank Address. Factory Locked: SecSi Sector Programmed and Protected At the Factory Table 10, Device Geometry Definition Distinctive Characteristics Corrected accelerated programming specification. Added definition for address 4Fh. Deleted references to top and bottom boot devices. Revision B+4 (April 15, 2002) Customer Lockable: SecSi Sector NOT Programmed or Protected At the Factory Ordering Information Added P designator to package marking for Fortified BGA package. Deleted reference to 64 Kbyte SecSi Sector. Table 4, SecSi™ Sector Addresses Added table. Revision B+5 (August 19, 2002) Table 5, Am29DL640D Autoselect Codes, (High Voltage Method) Distinctive Characteristics Deleted rows for byte mode. Corrected erase cycles.b Connection Diagram Table 7, WP#/ACC Modes Added table for clarity. Changed all references to RFU to NC. Revision B+1 (August 30, 2001) Table 2. Am29DL640D Sector Architecture Autoselect Command Sequence Corrected SA20 and SA21 sector’s, sector address to 0001101xxx and 0001110xxx. Deleted explanatory bullets and included references to the appropriate tables for autoselect functions. C o r r e c t e d S A 3 5 s e c t o r ’s , s e c t o r a d d r e s s t o 0011100xxx. Table 12, Am29DL640D Command Definitions DC Characteristics Table Added second and third read cycle information for the autoselect device ID command sequence. Deleted the IACC specification row. AC Characteristics: Erase and Program Operations Changed t B U S Y specification from minimum to maximum. Command Definitions Modified the last sentence in the first paragraph. CFI Changed the text at the end of the last sentence in the third paragraph to: “reading array data.” December 13, 2005 Am29DL640D 51 Revision C (January 10, 2003) Noted that the SecSi Sector, autoselect, and CFI functions are unavailable when a program or erase operation is in progress. Package Options Removed the 64-ball Fortified BGA package and pinout. Common Flash Memory Interface (CFI) Sector/Sector Block Protection and Unprotection Revision C+1 (October 7, 2004) Changed CFI website address. Change wording of first sentence of third paragraph. Cover Sheet and Title Page Customer Lockable: SecSi Sector NOT Programmed or Protected at the factory. Added notation to superseding documents. Added second bullet, SecSi sector-protect verify text and figure 3. Revision C+2 (January 11, 2005) SecSi Sector Flash Memory Region, and Enter SecSi Sector/Exit SecSi Sector Command Sequence Added Pb-free package options. Noted that the ACC function and unlock bypass modes are not available when the SecSi sector is enabled. Changed SecSi™ to Selected Silicon Ordering Information and Valid Combinations Updated cross-references. Byte/Word Program Command Sequence, Sector Erase Command Sequence, and Chip Erase Command Sequence Removed Sales Office Listing Revision C+3 (December 13, 2005) This product has been retired and is not available for designs. Availability of this document is retained for reference and historical purposes only. Colophon The products described in this document are designed, developed and manufactured as contemplated for general use, including without limitation, ordinary industrial use, general office use, personal use, and household use, but are not designed, developed and manufactured as contemplated (1) for any use that includes fatal risks or dangers that, unless extremely high safety is secured, could have a serious effect to the public, and could lead directly to death, personal injury, severe physical damage or other loss (i.e., nuclear reaction control in nuclear facility, aircraft flight control, air traffic control, mass transport control, medical life support system, missile launch control in weapon system), or (2) for any use where chance of failure is intolerable (i.e., submersible repeater and artificial satellite). Please note that Spansion will not be liable to you and/or any third party for any claims or damages arising in connection with above-mentioned uses of the products. Any semiconductor devices have an inherent chance of failure. You must protect against injury, damage or loss from such failures by incorporating safety design measures into your facility and equipment such as redundancy, fire protection, and prevention of over-current levels and other abnormal operating conditions. If any products described in this document represent goods or technologies subject to certain restrictions on export under the Foreign Exchange and Foreign Trade Law of Japan, the US Export Administration Regulations or the applicable laws of any other country, the prior authorization by the respective government entity will be required for export of those products. Trademarks Copyright © 2001 – 2005 Advanced Micro Devices, Inc. All rights reserved. AMD, the AMD logo, and combinations thereof are registered trademarks of Advanced Micro Devices, Inc. ExpressFlash is a trademark of Advanced Micro Devices, Inc. Product names used in this publication are for identification purposes only and may be trademarks of their respective companies. 52 Am29DL640D December 13, 2005