Freescale Semiconductor Technical Data Document Number: MMA6231Q Rev 2, 10/2006 MMA6231Q MMA6233Q ±10g Dual Axis Micromachined Accelerometer The MMA6200 series of low cost capacitive micromachined accelerometers feature signal conditioning, a 1-pole low pass filter and temperature compensation. Zero-g offset full scale span and filter cut-off are factory set and require no external devices. A full system self-test capability verifies system functionality. Features • • • • • • • • • • MMA6230Q Series: X-Y AXIS SENSITIVITY MICROMACHINED ACCELEROMETER ±10 g Low Noise Low Cost Low Power 2.7 V to 3.6 V Operation 6mm x 6mm x 1.98 mm QFN Integral Signal Conditioning with Low Pass Filter Linear Output Ratiometric Performance Self-Test Robust Design, High Shocks Survivability Bottom View Typical Applications 16-LEAD QFN CASE 1477-02 Pedometer Appliance Control Impact Monitoring Vibration Monitoring and Recording Position & Motion Sensing Freefall Detection Smart Portable Electronics 16 15 ORDERING INFORMATION N/C YOUT XOUT Top View N/C • • • • • • • 14 13 NC 1 12 ST NC Package 2 11 N/C MMA6231Q 300 Hz 1.2 mA 1477-02 QFN-16, Tube VDD 3 10 N/C MMA6231QR2 300 Hz 1.2 mA 1477-02 QFN-16,Tape & Reel VSS 4 9 N/C MMA6233Q 900 Hz 2.2 mA 1477-02 QFN-16, Tube MMA6233QR2 900 Hz 2.2 mA 1477-02 QFN-16,Tape & Reel 5 6 7 8 N/C Case No. N/C IDD N/C Bandwidth Response N/C Device Name Figure 1. Pin Connections © Freescale Semiconductor, Inc., 2006. All rights reserved. G-Cell Sensor ST Self Test X-Integrator X-Gain Control Logic & EEPROM Trim Circuits Y-Integrator X-Filter Oscillator Y-Gain VDD X-Temp Comp XOUT Clock Generator Y-Filter Y-Temp Comp YOUT VSS Figure 2. Simplified Accelerometer Functional Block Diagram Table 1. Maximum Ratings (Maximum ratings are the limits to which the device can be exposed without causing permanent damage.) Rating Symbol Value Unit Maximum Acceleration (all axis) gmax ±2000 g Supply Voltage VDD –0.3 to +3.6 V Drop Test(1) Ddrop 1.2 m Tstg –40 to +125 °C Storage Temperature Range 1. Dropped onto concrete surface from any axis. ELECTRO STATIC DISCHARGE (ESD) WARNING: This device is sensitive to electrostatic discharge. Although the Freescale accelerometers contain internal 2 kV ESD protection circuitry, extra precaution must be taken by the user to protect the chip from ESD. A charge of over 2000 volts can accumulate on the human body or associated test equipment. A charge of this magnitude can alter the performance or cause failure of the chip. When handling the accelerometer, proper ESD precautions should be followed to avoid exposing the device to discharges which may be detrimental to its performance. MMA6231Q 2 Sensors Freescale Semiconductor Table 2. Operating Characteristics Unless otherwise noted: -20°C < TA < 85°C, 3.0 V < VDD < 3.6 V, Acceleration = 0g, Loaded output (1) Characteristic Symbol Min Typ Max Unit VDD 2.7 3.3 3.6 V MMA6231Q IDD — 1.2 1.5 mA MMA6233Q IDD — 2.2 3.0 mA Operating Temperature Range TA –20 — +85 °C Acceleration Range gFS — 10 — g Operating Range (2) Supply Voltage(3) Supply Current Output Signal Zero g (TA = 25°C, VDD = 3.3 V)(4) Zero g Sensitivity (TA = 25°C, VDD = 3.3 V) Sensitivity VOFF 1.485 1.65 1.815 V VOFF, TA — 2.0 — mg/°C S 111 120 129 mV/g S, TA — 0.015 — %/°C f_3dB — 300 — Hz Bandwidth Response MMA6231Q MMA6233Q f_3dB — 900 — Hz NLOUT –1.0 — +1.0 % FSO MMA6231Q RMS (0.1 Hz – 1 kHz) nRMS — 0.7 — mVrms MMA6233Q RMS (0.1 Hz – 1 kHz) nRMS — 0.6 — MMA6231Q nPSD — 50 — MMA6233Q nPSD — 30 — gST 2.0 — — g V Nonlinearity Noise Power Spectral Density RMS (0.1 Hz – 1 kHz) ug/√Hz Self-Test Output Response Input Low VIL — — 0.3 VDD Input High VIH 0.7 VDD — VDD V Pull-Down Resistance(5) RPO 43 57 71 kΩ Response Time(6) tST — 2.0 — ms VFSO VSS +0.25 — VDD –0.25 V Output Stage Performance Full-Scale Output Range (IOUT = 200 µA) Drive(7) CL — — 100 pF ZO — 50 300 Ω MMA6231Q tRESPONSE — 2.0 — ms MMA6233Q tRESPONSE — 0.7 — ms VZX, YX, ZY –5.0 — +5.0 % FSO Capacitive Load Output Impedance Power-Up Response Time Mechanical Characteristics Transverse Sensitivity(8) 1. For a loaded output, the measurements are observed after an RC filter consisting of a 1.0 kΩ resistor and a 0.1 µF capacitor to ground. 2. These limits define the range of operation for which the part will meet specification. 3. Within the supply range of 2.7 and 3.6 V, the device operates as a fully calibrated linear accelerometer. Beyond these supply limits the device may operate as a linear device but is not guaranteed to be in calibration. 4. The device can measure both + and – acceleration. With no input acceleration the output is at midsupply. For positive acceleration the output will increase above VDD/2. For negative acceleration, the output will decrease below VDD/2. 5. The digital input pin has an internal pull-down resistance to prevent inadvertent self-test initiation due to external board level leakages. 6. Time for the output to reach 90% of its final value after a self-test is initiated. 7. Preserves phase margin (60°) to guarantee output amplifier stability. 8. A measure of the device’s ability to reject an acceleration applied 90° from the true axis of sensitivity. MMA6231Q Sensors Freescale Semiconductor 3 PRINCIPLE OF OPERATION The Freescale accelerometer is a surface-micromachined integrated-circuit accelerometer. The device consists of a surface micromachined capacitive sensing cell (g-cell) and a signal conditioning ASIC contained in a single integrated circuit package. The sensing element is sealed hermetically at the wafer level using a bulk micromachined cap wafer. The g-cell is a mechanical structure formed from semiconductor materials (polysilicon) using semiconductor processes (masking and etching). It can be modeled as a set of beams attached to a movable central mass that moves between fixed beams. The movable beams can be deflected from their rest position by subjecting the system to an acceleration (Figure 3). As the beams attached to the central mass move, the distance from them to the fixed beams on one side will increase by the same amount that the distance to the fixed beams on the other side decreases. The change in distance is a measure of acceleration. The g-cell plates form two back-to-back capacitors (Figure 4). As the center plate moves with acceleration, the distance between the plates changes and each capacitor's value will change, (C = Aε/D). Where A is the area of the plate, ε is the dielectric constant, and D is the distance between the plates. The ASIC uses switched capacitor techniques to measure the g-cell capacitors and extract the acceleration data from the difference between the two capacitors. The ASIC also signal conditions and filters (switched capacitor) the signal, providing a high level output voltage that is ratiometric and proportional to acceleration. Acceleration Figure 3. Transducer Physical Model SPECIAL FEATURES Filtering These Freescale accelerometers contain an onboard single-pole switched capacitor filter. Because the filter is realized using switched capacitor techniques, there is no requirement for external passive components (resistors and capacitors) to set the cut-off frequency. Self-Test The sensor provides a self-test feature allowing the verification of the mechanical and electrical integrity of the accelerometer at any time before or after installation. A fourth plate is used in the g-cell as a self-test plate. When a logic high input to the self-test pin is applied, a calibrated potential is applied across the self-test plate and the moveable plate. The resulting electrostatic force (Fe = 1/2 AV2/d2) causes the center plate to deflect. The resultant deflection is measured by the accelerometer's ASIC and a proportional output voltage results. This procedure assures both the mechanical (g-cell) and electronic sections of the accelerometer are functioning. Freescale accelerometers include fault detection circuitry and a fault latch. Parity of the EEPROM bits becomes odd in number. Self-test is disabled when EEPROM parity error occurs. Ratiometricity Ratiometricity simply means the output offset voltage and sensitivity will scale linearly with applied supply voltage. That is, as supply voltage is increased, the sensitivity and offset increase linearly; as supply voltage decreases, offset and sensitivity decrease linearly. This is a key feature when interfacing to a microcontroller or an A/D converter because it provides system level cancellation of supply induced errors in the analog to digital conversion process. Figure 4. Equivalent Circuit Model MMA6231Q 4 Sensors Freescale Semiconductor BASIC CONNECTIONS Pinout Description PCB Layout NC N/C 14 13 1 12 ST 2 11 N/C VDD 3 10 N/C VSS 4 9 N/C XOUT YOUT VSS VDD R 1 kΩ R 1 kΩ A/D IN 0.1 µF C A/D IN 0.1 µF C C 0.1 µF Microcontroller NC P0 ST Accelerometer 16 15 YOUT XOUT N/C Top View VSS C 0.1 µF VDD VRH 6 7 8 N/C N/C N/C N/C C 0.1 µF 5 Power Supply Figure 4. Pinout Description Figure 6. Recommend PCB Layout for Interfacing Accelerometer to Microcontroller Pin No. Pin Name 1, 5–7, 13, 16 N/C 14 YOUT Output voltage of the accelerometer. Y Direction. 15 XOUT Output voltage of the accelerometer. X Direction. 2. Physical coupling distance of the accelerometer to the microcontroller should be minimal. 3 VDD Power supply input. 3. Flag underneath package is connected to ground. 4 VSS The power supply ground. 2, 8–11 N/C Used for factory trim. Leave unconnected. 4. Place a ground plane beneath the accelerometer to reduce noise, the ground plane should be attached to all of the open ended terminals shown in Figure 6. 12 ST Logic input pin used to initiate self-test. Description No internal connection. Leave unconnected. NOTES: 1. Use 0.1 µF capacitor on VDD to decouple the power source. 5. Use an RC filter with 1.0 kΩ and 0.1 µF on the outputs of the accelerometer to minimize clock noise (from the switched capacitor filter circuit). 6. PCB layout of power and ground should not couple power supply noise. VDD 7. Accelerometer and microcontroller should not be a high current path. MMA6200Q Series 3 VDD YOUT 14 0.1 µF 0.1 µF 4 Logic Input 1 kΩ 12 X Output Signal VSS XOUT 15 ST 1 kΩ 0.1 µF Y Output Signal 8. A/D sampling rate and any external power supply switching frequency should be selected such that they do not interfere with the internal accelerometer sampling frequency (16 kHz for Low IDD and 52 kHz for Standard IDD for the sampling frequency). This will prevent aliasing errors. 9. PCB layout should not run traces or vias under the QFN part. This could lead to ground shorting to the accelerometer flag. Figure 5. Accelerometer with Recommended Connection Diagram MMA6231Q Sensors Freescale Semiconductor 5 DYNAMIC ACCELERATION Top View +Y 16 +X 15 14 13 1 12 2 11 3 10 4 9 5 6 7 –X 8 –Y 16-Pin QFN Package STATIC ACCELERATION Top View Direction of Earth’s gravity field(1) XOUT @ 0g = 1.65 V YOUT @ -1g = 1.53 V XOUT @ -1g = 1.53 V YOUT @ 0g = 1.65 V XOUT @ +1g = 1.77 V YOUT @ 0g = 1.65 V XOUT @ 0g = 1.65 V YOUT @ +1g = 1.77 V 1. When positioned as shown, the Earth’s gravity will result in a positive 1g output. MMA6231Q 6 Sensors Freescale Semiconductor MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS Surface mount board layout is a critical portion of the total design. The footprint for the surface mount packages must be the correct size to ensure proper solder connection interface between the board and the package. With the correct footprint, the packages will self-align when subjected to a solder reflow process. It is always recommended to design boards with a solder mask layer to avoid bridging and shorting between solder pads. 6.0 0.55 4.25 9 8 1.00 5 16 0.50 6.0 13 12 1 Pin 1 ID (non metallic) 4 Flag Solder areas Non-Solder areas MMA6231Q Sensors Freescale Semiconductor 7 PACKAGE DIMENSIONS PAGE 1 OF 3 CASE 1477-02 ISSUE B 16-LEAD QFN MMA6231Q 8 Sensors Freescale Semiconductor PACKAGE DIMENSIONS PAGE 2 OF 3 CASE 1477-02 ISSUE B 16-LEAD QFN MMA6231Q Sensors Freescale Semiconductor 9 PACKAGE DIMENSIONS PAGE 3 OF 3 CASE 1477-02 ISSUE B 16-LEAD QFN MMA6231Q 10 Sensors Freescale Semiconductor How to Reach Us: Home Page: www.freescale.com E-mail: [email protected] USA/Europe or Locations Not Listed: Freescale Semiconductor Technical Information Center, CH370 1300 N. Alma School Road Chandler, Arizona 85224 +1-800-521-6274 or +1-480-768-2130 [email protected] Europe, Middle East, and Africa: Freescale Halbleiter Deutschland GmbH Technical Information Center Schatzbogen 7 81829 Muenchen, Germany +44 1296 380 456 (English) +46 8 52200080 (English) +49 89 92103 559 (German) +33 1 69 35 48 48 (French) [email protected] Japan: Freescale Semiconductor Japan Ltd. Headquarters ARCO Tower 15F 1-8-1, Shimo-Meguro, Meguro-ku, Tokyo 153-0064 Japan 0120 191014 or +81 3 5437 9125 [email protected] Asia/Pacific: Freescale Semiconductor Hong Kong Ltd. Technical Information Center 2 Dai King Street Tai Po Industrial Estate Tai Po, N.T., Hong Kong +800 2666 8080 [email protected] For Literature Requests Only: Freescale Semiconductor Literature Distribution Center P.O. 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