® LA-ispPAC-POWR1014/A Automotive Family In-System Programmable Power Supply Supervisor, Reset Generator and Sequencing Controller June 2008 Data Sheet DS1018 Features Application Block Diagram ■ Monitor and Control Multiple Power Supplies Primary Supply • Simultaneously monitors up to 10 power supplies • Provides up to 14 output control signals • Programmable digital and analog circuitry 3.3V Primary Supply ■ AEC-Q100 Tested and Qualified ■ Embedded PLD for Sequence Control 1.8V POL#1 • Four independent timers • 32µs to 2 second intervals for timing sequences Primary Supply Enables ■ Embedded Programmable Timers POL#N ■ Analog Input Monitoring Other Control/Supervisory Signals ■ High-Voltage FET Drivers ■ 2-Wire (I C/SMBus™ Compatible) Interface 2 • • • • • Comparator status monitor ADC readout Direct control of inputs and outputs Power sequence control Only available with LA-ispPAC-POWR1014A ■ 3.3V Operation, Wide Supply Range 2.8V to 3.96V • In-system programmable through JTAG • Automotive temperature range: -40°C to +105°C • 48-pin TQFP package, lead-free option 12 Digital Outputs 2 MOSFET Drivers Digital Monitoring 10 Analog Inputs and Voltage Monitors • 10 independent analog monitor inputs • Two programmable threshold comparators per analog input • Hardware window comparison • 10-bit ADC for I2C monitoring (LA-ispPACPOWR1014A only) • Power supply ramp up/down control • Programmable current and voltage output • Independently configurable for FET control or digital output Voltage Monitoring • 24-macrocell CPLD implements both state machines and combinatorial logic functions Primary Supply Other Board Circuitry 2.5V Primary Supply CPLD 24 Macrocells 53 Inputs ADC* 4 Timers 4 Digital Inputs I2C Interface I2C Bus* CPU LA-ispPAC-POWR1014A *LA-ispPAC-POWR1014A only. Description Lattice’s Power Manager II LA-ispPAC-POWR1014/A is a general-purpose power-supply monitor and sequence controller, incorporating both in-system programmable logic and in-system programmable analog functions implemented in non-volatile E2CMOS® technology. The LA-ispPAC-POWR1014/A device provides 10 independent analog input channels to monitor up to 10 power supply test points. Each of these input channels has two independently programmable comparators to support both high/low and in-bounds/out-of-bounds (window-compare) monitor functions. Four general-purpose digital inputs are also provided for miscellaneous control functions. The LA-ispPAC-POWR1014/A provides 14 open-drain digital outputs that can be used for controlling DC-DC converters, low-drop-out regulators (LDOs) and optocouplers, as well as for supervisory and general-purpose logic interface functions. Two of these outputs (HVOUT1-HVOUT2) may be configured as high-voltage © 2008 Lattice Semiconductor Corp. All Lattice trademarks, registered trademarks, patents, and disclaimers are as listed at www.latticesemi.com/legal. All other brand or product names are trademarks or registered trademarks of their respective holders. The specifications and information herein are subject to change without notice. www.latticesemi.com 5-1 DS1018_01.1 Lattice Semiconductor LA-ispPAC-POWR1014/A Automotive Family Data Sheet MOSFET drivers. In high-voltage mode these outputs can provide up to 8V for driving the gates of n-channel MOSFETs so that they can be used as high-side power switches controlling the supplies with a programmable ramp rate for both ramp up and ramp down. The LA-ispPAC-POWR1014/A incorporates a 24-macrocell CPLD that can be used to implement complex state machine sequencing for the control of multiple power supplies as well as combinatorial logic functions. The status of all of the comparators on the analog input channels as well as the general purpose digital inputs are used as inputs by the CPLD array, and all digital outputs may be controlled by the CPLD. Four independently programmable timers can create delays and time-outs ranging from 32µs to 2 seconds. The CPLD is programmed using LogiBuilder™, an easy-to-learn language integrated into the PAC-Designer® software. Control sequences are written to monitor the status of any of the analog input channel comparators or the digital inputs. The on-chip 10-bit A/D converter is used to monitor the VMON voltage through the I2C bus of the LA-ispPACPOWR1014A device. The I2C bus/SMBus interface allows an external microcontroller to measure the voltages connected to the VMON inputs, read back the status of each of the VMON comparator and PLD outputs, control logic signals IN2 to IN4 and control the output pins (LA-ispPAC-POWR1014A only). Figure 5-1. LA-ispPAC-POWR1014/A Block Diagram MEASUREMENT ADC* CONTROL LOGIC* 4 DIGITAL INPUTS IN1 IN2 IN3 IN4 JTAG LOGIC CLOCK OSCILLATOR TIMERS (4) GNDD (2) GNDA SDA (POWR1014A only) 5-2 OUT3/(SMBA*) OUT4 OUT5 OUT6 OUT7 OUT8 OUT9 OUT10 OUT11 OUT12 OUT13 OUT14 I 2C INTERFACE SCL (POWR1014A only) RESETb PLDCLK MCLK ATDI TDI TDISEL TCK TMS TDO VCCJ VCCPROG VCCA VCCD (2) VCCINP *LA-ispPAC-POWR1014A only. HVOUT1 HVOUT2 12 OPEN-DRAIN DIGITAL OUTPUTS 53 INPUTS 2 FET DRIVERS CPLD 24 MACROCELLS OUTPUT ROUTING POOL 10 ANALOG INPUTS AND VOLTAGE MONITORS VMON1 VMON2 VMON3 VMON4 VMON5 VMON6 VMON7 VMON8 VMON9 VMON10 Lattice Semiconductor LA-ispPAC-POWR1014/A Automotive Family Data Sheet Pin Descriptions Number Name Pin Type Voltage Range Description 44 IN1 Digital Input VCCINP1, 2 46 IN2 Digital Input VCCINP1, 3 PLD Logic Input 2 Registered by MCLK 47 IN3 Digital Input VCCINP1, 3 PLD Logic Input 3 Registered by MCLK 48 IN4 Digital Input VCCINP1, 3 PLD Logic Input 1 Registered by MCLK PLD Logic Input 4 Registered by MCLK 4 25 VMON1 Analog Input -0.3V to 5.87V Voltage Monitor 1 Input 26 VMON2 Analog Input -0.3V to 5.87V4 Voltage Monitor 2 Input 27 VMON3 Analog Input -0.3V to 5.87V4 Voltage Monitor 3 Input 28 VMON4 Analog Input -0.3V to 5.87V4 Voltage Monitor 4 Input 4 32 VMON5 Analog Input -0.3V to 5.87V Voltage Monitor 5 Input 33 VMON6 Analog Input -0.3V to 5.87V4 Voltage Monitor 6 Input 4 34 VMON7 Analog Input -0.3V to 5.87V Voltage Monitor 7 Input 35 VMON8 Analog Input -0.3V to 5.87V4 Voltage Monitor 8 Input 36 VMON9 Analog Input -0.3V to 5.87V4 Voltage Monitor 9 Input VMON10 Analog Input 4 -0.3V to 5.87V Voltage Monitor 10 Input GNDD5 Ground Ground Digital Ground 37 7, 31 30 5 Ground Ground Analog Ground 6 Power 2.8V to 3.96V Core VCC, Main Power Supply 6 Power 2.8V to 3.96V Analog Power Supply GNDA 41, 23 VCCD 29 VCCA 45 VCCINP Power 2.25V to 5.5V VCC for IN[1:4] Inputs 20 VCCJ Power 2.25V to 3.6V VCC for JTAG Logic Interface Pins 24 VCCPROG Power 3.0V to 3.6V VCC for E2 Programming when the Device is Not Powered by VCCD and VCCA Open Drain Output7 0V to 8V Open-Drain Output 1 Current Source/Sink 12.5µA to 100µA Source High-voltage FET Gate Driver 1 100µA to 3000µA Sink Open Drain Output7 0V to 8V Current Source/Sink 12.5µA to 100µA Source High-voltage FET Gate Driver 2 100µA to 3000µA Sink 15 HVOUT1 Open-Drain Output 2 14 HVOUT2 13 SMBA_OUT3 Open Drain Output7 0V to 5.5V Open-Drain Output 3, (SMBUS Alert Active Low, LA-ispPAC-POWR1014A only). 12 OUT4 Open Drain Output7 0V to 5.5V Open-Drain Output 4 OUT5 7 0V to 5.5V Open-Drain Output 5 7 0V to 5.5V Open-Drain Output 6 7 0V to 5.5V Open-Drain Output 7 7 11 10 9 OUT6 OUT7 Open Drain Output Open Drain Output Open Drain Output 8 OUT8 Open Drain Output 0V to 5.5V Open-Drain Output 8 6 OUT9 Open Drain Output7 0V to 5.5V Open-Drain Output 9 7 5 OUT10 Open Drain Output 0V to 5.5V Open-Drain Output 10 4 OUT11 Open Drain Output7 0V to 5.5V Open-Drain Output 11 3 OUT12 7 Open Drain Output 0V to 5.5V Open-Drain Output 12 2 OUT13 Open Drain Output7 0V to 5.5V Open-Drain Output 13 1 OUT14 7 Open Drain Output 0V to 5.5V Open-Drain Output 14 40 RESETb8 Digital I/O 0V to 3.96V Device Reset (Active Low) - Internal pull-up 0V to 3.96V 250kHz PLD Clock Output (Tristate), CMOS Output - Internal pull-up 42 PLDCLK Digital Output 5-3 Lattice Semiconductor LA-ispPAC-POWR1014/A Automotive Family Data Sheet Pin Descriptions (Cont.) Number Name Pin Type Voltage Range Description 43 MCLK Digital I/O 0V to 3.96V 8MHz Clock I/O (Tristate), CMOS Drive - Internal Pull-up 21 TDO Digital Output 0V to 5.5V JTAG Test Data Out 22 TCK Digital Input 0V to 5.5V JTAG Test Clock Input 16 TMS Digital Input 0V to 5.5V JTAG Test Mode Select - Internal Pull-up 18 TDI Digital Input 0V to 5.5V JTAG Test Data In, TDISEL pin = 1 - Internal Pull-up 17 ATDI Digital Input 0V to 5.5V JTAG Test Data In (Alternate), TDISEL Pin = 0 Internal Pull-up 19 TDISEL Digital Input 0V to 5.5V Select TDI/ATDI Input - Internal Pull-up 39 SCL Digital Input 0V to 5.5V I2C Serial Clock Input (LA-ispPAC-POWR1014A Only) 38 SDA9 Digital I/O 0V to 5.5V I2C Serial Data, Bi-directional Pin, Open Drain (LA-ispPAC-POWR1014A Only) 9 1. [IN1...IN4] are inputs to the PLD. The thresholds for these pins are referenced by the voltage on VCCINP. Unused INx inputs should be tied to GNDD. 2. IN1 pin can also be controlled through JTAG interface. 3. [IN2..IN4] can also be controlled through I2C/SMBus interface (LA-ispPAC-POWR1014A only). 4. The VMON inputs can be biased independently from VCCA. Unused VMON inputs should be tied to GNDD. 5. GNDA and GNDD pins must be connected together on the circuit board. 6. VCCD and VCCA pins must be connected together on the circuit board. 7. Open-drain outputs require an external pull-up resistor to a supply. 8. The RESETb pin should only be used for cascading two or more LA-ispPAC-POWR1014/A devices. 9. These pins should be connected to GNDD (LA-ispPAC-POWR1014 device only). 5-4 Lattice Semiconductor LA-ispPAC-POWR1014/A Automotive Family Data Sheet Absolute Maximum Ratings Absolute maximum ratings are shown in the table below. Stresses beyond those listed may cause permanent damage to the device. Functional operation of the device at these or any other conditions beyond those indicated in the recommended operating conditions of this specification is not implied. Symbol Min. Max. Units Core supply -0.5 4.5 V VCCA Analog supply -0.5 4.5 V VCCINP Digital input supply (IN[1:4]) -0.5 6 V VCCJ JTAG logic supply -0.5 6 V VCCD Parameter Conditions 2 VCCPROG E programming supply -0.5 4 V VIN Digital input voltage (all digital I/O pins) -0.5 6 V VMON VMON input voltage -0.5 6 V HVOUT[1:2] -0.5 8.8 V OUT[3:14] -0.5 VTRI Voltage applied to tri-stated pins ISINKMAXTOTAL Maximum sink current on any output TS Storage temperature -65 150 o TA Ambient temperature -65 125 o Min. Max. Units 2.8 3.96 V 6 V 23 mA C C Recommended Operating Conditions Symbol Parameter Conditions VCCD, VCCA Core supply voltage at pin VCCINP Digital input supply for IN[1:4] at pin 2.25 5.5 V VCCJ JTAG logic supply voltage at pin 2.25 3.6 V VCCPROG E2 programming supply at pin VIN Input voltage at digital input pins VMON Input voltage at VMON pins During E2 programming 3.0 3.6 V -0.3 5.5 V -0.3 5.9 V OUT[3:14] pins -0.3 5.5 V HVOUT[1:2] pins in open-drain mode -0.3 8.4 V -40 85 o VOUT Open-drain output voltage TAPROG Ambient temperature during programming TA Ambient temperature Power applied -40 105 o TJ Junction temperature Power applied -40 110 o Typ. C C C Analog Specifications Max. Units ICC1 Symbol Core and analog supply current Parameter Conditions 20 mA ICCINP VCCINP supply current 5 mA ICCJ JTAG supply current 1 mA ICCPROG Core and analog supply current 20 mA During programming cycle 1. Includes currents on VCCD and VCCA supplies. 5-5 Min. Lattice Semiconductor LA-ispPAC-POWR1014/A Automotive Family Data Sheet Voltage Monitors Symbol Parameter RIN Input resistance Conditions CIN Input capacitance VMON Range Programmable trip-point range VZ Sense Near-ground sense threshold Min. Typ. Max. Units 55 65 75 kΩ 8 0.075 70 1 VMON Accuracy Absolute accuracy of any trip-point HYST Hysteresis of any trip-point (relative to setting) pF 5.867 V 75 80 mV 0.3 1.1 % 1 % 1. Guaranteed by characterization across VCCA range, operating temperature, process. High Voltage FET Drivers Symbol VPP Parameter Gate driver output voltage Conditions Min. Typ. Max. 8V setting 7.6 8 8.4 6V setting 5.7 6 6.3 Units V 12.5 IOUTSRC Gate driver source current (HIGH state) 25 Four settings in software 50 µA 100 FAST OFF mode IOUTSINK Gate driver sink current (LOW state) 1500 3000 100 Controlled ramp settings 250 500 5-6 µA Lattice Semiconductor LA-ispPAC-POWR1014/A Automotive Family Data Sheet ADC Characteristics1 Symbol Parameter Conditions Min. ADC resolution Conversion time TCONVERT VIN Input range full scale Error due to attenuator Max. 10 Programmable attenuator = 1 0 Programmable attenuator = 3 Units Bits Time from I2C request 100 µs 2.048 V 2 0 V 5.9 Programmable attenuator = 1 ADC Step Size LSB Eattenuator Typ. 2 mV Programmable attenuator = 3 6 mV Programmable attenuator = 3 +/- 0.1 % 1. LA-ispPAC-POWR1014A only. 2. Maximum voltage is limited by VMONX pin (theoretical maximum is 6.144V). ADC Error Budget Across Entire Operating Temperature Range1 Symbol TADC Error Parameter Total Measurement Error at Any Voltage2 Conditions Min. Typ. Max. Units Measurement Range 600 mV - 2.048V, Attenuator =1 -10 +/-4 10 mV 1. LA-ispPAC-POWR1014A only. 2. Total error, guaranteed by characterization, includes INL, DNL, Gain, Offset, and PSR specifications of the ADC. Power-On Reset Symbol Parameter Conditions Max. Units 100 µs 10 µs 500 µs 5 µs Delay from brown out to reset state. 11 µs Threshold below which RESETb is LOW1 2.3 V TRST Delay from VTH to start-up state TSTART Delay from RESETb HIGH to PLDCLK rising edge TGOOD Power-on reset to valid VMON comparator output and AGOOD is true. TBRO Minimum duration brown out required to trigger RESETb TPOR VTL Min. Typ. 5 1 1 VTH Threshold above which RESETb is HIGH 2.7 V VT Threshold above which RESETb is valid1 0.8 V CL Capacitive load on RESETb for master/slave operation 200 1. Corresponds to VCCA and VCCD supply voltages. 5-7 pF Lattice Semiconductor LA-ispPAC-POWR1014/A Automotive Family Data Sheet Figure 5-2. LA-ispPAC-POWR1014/A Power-On Reset VTH VTL TBRO VCC TPOR RESETb VT TRST Start Up State Reset State MCLK PLDCLK TSTART Analog Calibration TGOOD 5-8 AGOOD (Internal) Lattice Semiconductor LA-ispPAC-POWR1014/A Automotive Family Data Sheet AC/Transient Characteristics Over Recommended Operating Conditions Symbol Parameter Conditions Min. Typ. Max. Units Voltage Monitors tPD16 Propagation delay input to output glitch filter OFF 16 µs tPD64 Propagation delay input to output glitch filter ON 64 µs Oscillators fCLK Internal master clock frequency (MCLK) 7.6 fCLKEXT Externally applied master clock (MCLK) 7.2 fPLDCLK PLDCLK output frequency fCLK = 8MHz Timeout Range Range of programmable timers (128 steps) fCLK = 8MHz Resolution Spacing between available adjacent timer intervals Accuracy Timer accuracy 8 8.4 MHz 8.8 MHz 250 kHz Timers 0.032 fCLK = 8MHz -6.67 5-9 1966 ms 13 % -12.5 % Lattice Semiconductor LA-ispPAC-POWR1014/A Automotive Family Data Sheet Digital Specifications Over Recommended Operating Conditions Symbol IIL,IIH Parameter Min. Output leakage current IPU Input pull-up current (TMS, TDI, TDISEL, ATDI, MCLK, PLDCLK, RESETb) Voltage input, logic low1 HVOUT[1:2] in open drain mode and pulled up to 8V 35 µA 100 µA µA TDI, TMS, ATDI, TDISEL, 2.5V supply 0.7 V 30% VCCD 30% VCCINP TDI, TMS, ATDI, TDISEL, 3.3V supply 2.0 TDI, TMS, ATDI, TDISEL, 2.5V supply 1.7 IN[1:4] VOH +/-10 0.8 SCL, SDA VOL Units TDI, TMS, ATDI, TDISEL, 3.3V supply IN[1:4] Voltage input, logic high1 Max. 70 SCL, SDA VIH Typ. Input leakage, no pull-up/pull-down IOH-HVOUT VIL Conditions V 70% VCCD VCCD 70% VCCINP VCCINP HVOUT[1:2] (open drain mode), ISINK = 10mA OUT[3:14] ISINK = 20mA 0.8 TDO,MCLK,PLDCLK ISINK = 4mA 0.4 TDO, MCLK, PLDCLK ISRC = 4mA VCCD - 0.4 V 67 mA ISINKTOTAL2 All digital outputs 0.8 1. IN[1:4] referenced to VCCINP; TDO, TDI, TMS, ATDI, TDISEL referenced to VCCJ; SCL, SDA referenced to VCCD. 2. Sum of maximum current sink from all digital outputs combined. Reliable operation is not guaranteed if this value is exceeded. 5-10 V Lattice Semiconductor LA-ispPAC-POWR1014/A Automotive Family Data Sheet I2C Port Characteristics1 100KHz Symbol Definition Min. 2 400KHz Max. Min. 2 Max. 2 100 FI2C I C clock/data rate TSU;STA After start THD;STA After start 4 0.6 us TSU;DAT Data setup 250 100 ns TSU;STO Stop setup THD;DAT Data hold; SCL= Vih_min = 2.1V 0.3 3.45 TLOW Clock low period 4.7 10 THIGH Clock high period 4 TF Fall time; 2.25V to 0.65V 300 300 ns TR Rise time; 0.65V to 2.25V 1000 300 ns TTIMEOUT Detect clock low timeout 25 35 ms TPOR Device must be operational after power-on reset 500 500 ms TBUF Bus free time between stop and start condition 4.7 1.3 us 4.7 400 Units 0.6 4 us 0.6 us 0.3 0.9 1.3 10 0.6 35 25 kHz us us us 1. Applies to LA-ispPAC-POWR1014A only. 2. If FI2C is less than 50kHz, then the ADC DONE status bit is not guaranteed to be set after a valid conversion request is completed. In this case, waiting for the TCONVERT minimum time after a convert request is made is the only way to guarantee a valid conversion is ready for readout. When FI2C is greater than 50kHz, ADC conversion complete is ensured by waiting for the DONE status bit. 5-11 Lattice Semiconductor LA-ispPAC-POWR1014/A Automotive Family Data Sheet Timing for JTAG Operations Symbol Parameter Conditions Min. Typ. Max. Units tISPEN Program enable delay time 10 — — µs tISPDIS Program disable delay time 30 — — µs tHVDIS High voltage discharge time, program 30 — — µs tHVDIS High voltage discharge time, erase 200 — — µs tCEN Falling edge of TCK to TDO active — — 10 ns tCDIS Falling edge of TCK to TDO disable — — 10 ns tSU1 Setup time 5 — — ns tH Hold time 10 — — ns tCKH TCK clock pulse width, high 20 — — ns tCKL TCK clock pulse width, low 20 — — ns fMAX Maximum TCK clock frequency — — 25 MHz tCO Falling edge of TCK to valid output — — 10 ns tPWV Verify pulse width 30 — — µs tPWP Programming pulse width 20 — — ms Figure 5-3. Erase (User Erase or Erase All) Timing Diagram Clock to Shift-IR state and shift in the Discharge Instruction, then clock to the Run-Test/Idle state VIH TMS VIL tSU1 tH tCKH VIH tSU1 tSU1 tH tH tGKL tCKH TCK VIL State Update-IR Run-Test/Idle (Erase) Select-DR Scan tSU1 tH tCKH tSU1 tGKL tSU1 tH tCKH tH tCKH tSU2 Specified by the Data Sheet Run-Test/Idle (Discharge) Figure 5-4. Programming Timing Diagram VIL tSU1 tH tCKH VIH tSU1 tH tCKL tSU1 tPWP tH tCKH TCK VIL State Update-IR Run-Test/Idle (Program) Select-DR Scan 5-12 Clock to Shift-IR state and shift in the next Instruction, which will stop the discharge process VIH TMS tSU1 tH tCKH tSU1 tCKL Update-IR tH tCKH Lattice Semiconductor LA-ispPAC-POWR1014/A Automotive Family Data Sheet VIH TMS VIL tSU1 tH tCKH tSU1 tH tSU1 tCKL tPWV tH tCKH VIH TCK VIL State Update-IR Run-Test/Idle (Program) Select-DR Scan Clock to Shift-IR state and shift in the next Instruction Figure 5-5. Verify Timing Diagram tSU1 tH tSU1 tCKH tH tCKL tCKH Update-IR Figure 5-6. Discharge Timing Diagram tHVDIS (Actual) TMS VIL tSU1 tH tCKH tSU1 tCKL tH tSU1 tPWP tH tCKH VIH TCK VIL State Update-IR Run-Test/Idle (Erase or Program) Select-DR Scan Clock to Shift-IR state and shift in the Verify Instruction, then clock to the Run-Test/Idle state VIH tSU1 tH tCKH tSU1 tCKL tH tSU1 tCKH tPWV tH tCKH Actual tPWV Specified by the Data Sheet Run-Test/Idle (Verify) Theory of Operation Analog Monitor Inputs The LA-ispPAC-POWR1014/A provides 10 independently programmable voltage monitor input circuits as shown in Figure 5-7. Two individually programmable trip-point comparators are connected to an analog monitoring input. Each comparator reference has 372 programmable trip points over the range of 0.672V to 5.867V. Additionally, a 75mV ‘zero-detect’ threshold is selectable which allows the voltage monitors to determine if a monitored signal has dropped to ground level. This feature is especially useful for determining if a power supply’s output has decayed to a substantially inactive condition after it has been switched off. 5-13 Lattice Semiconductor LA-ispPAC-POWR1014/A Automotive Family Data Sheet Figure 5-7. LA-ispPAC-POWR1014/A Voltage Monitors LA-ispPAC-POWR1014/A To ADC (LA-ispPAC-POWR1014A on Comp A/Window Select Comp A VMONx + MUX Trip Point A – Glitch Filter VMONxA Logic Signal PLD Array Comp B + Trip Point B Glitch Filter – Analog Input Window Control VMONxB Logic Signal Filtering VMONx Status I2C Interface Unit (LA-ispPACPOWR1014A only) Figure 5-7 shows the functional block diagram of one of the 10 voltage monitor inputs - ‘x’ (where x = 1...10). Each voltage monitor can be divided into three sections: Analog Input, Window Control, and Filtering. The voltage input is monitored by two individually programmable trip-point comparators, shown as CompA and CompB. Table 5-1 shows all trip points and the range to which any comparator’s threshold can be set. Each comparator outputs a HIGH signal to the PLD array if the voltage at its positive terminal is greater than its programmed trip point setting, otherwise it outputs a LOW signal. A hysteresis of approximately 1% of the setpoint is provided by the comparators to reduce false triggering as a result of input noise. The hysteresis provided by the voltage monitor is a function of the input divider setting. Table 5-3 lists the typical hysteresis versus voltage monitor trip-point. AGOOD Logic Signal All the VMON comparators auto-calibrate immediately after a power-on reset event. During this time, the digital glitch filters are also initialized. This process completion is signalled by an internally generated logic signal: AGOOD. All logic using the VMON comparator logic signals must wait for the AGOOD signal to become active. Programmable Over-Voltage and Under-Voltage Thresholds Figure 5-8 (a) shows the power supply ramp-up and ramp-down voltage waveforms. Because of hysteresis, the comparator outputs change state at different thresholds depending on the direction of excursion of the monitored power supply. 5-14 Lattice Semiconductor LA-ispPAC-POWR1014/A Automotive Family Data Sheet Monitored Power Supply Votlage Figure 5-8. (a) Power Supply Voltage Ramp-up and Ramp-down Waveform and the Resulting Comparator Output, (b) Corresponding to Upper and Lower Trip Points UTP LTP (a) (b) Comparator Logic Output During power supply ramp-up the comparator output changes from logic 0 to 1 when the power supply voltage crosses the upper trip point (UTP). During ramp down the comparator output changes from logic state 1 to 0 when the power supply voltage crosses the lower trip point (LTP). To monitor for over voltage fault conditions, the UTP should be used. To monitor under-voltage fault conditions, the LTP should be used. Tables 1 and 2 show both the under-voltage and over-voltage trip points, which are automatically selected in software depending on whether the user is monitoring for an over-voltage condition or an under-voltage condition. 5-15 Lattice Semiconductor LA-ispPAC-POWR1014/A Automotive Family Data Sheet Table 5-1. Trip Point Table Used For Over-Voltage Detection Coarse Range Setting Fine Range Setting 1 2 3 4 5 6 7 8 9 10 11 12 1 0.806 0.960 1.143 1.360 1.612 1.923 2.290 2.719 3.223 3.839 4.926 5.867 2 0.802 0.955 1.137 1.353 1.603 1.913 2.278 2.705 3.206 3.819 4.900 5.836 3 0.797 0.950 1.131 1.346 1.595 1.903 2.266 2.691 3.190 3.799 4.875 5.806 4 0.793 0.945 1.125 1.338 1.586 1.893 2.254 2.677 3.173 3.779 4.849 5.775 5 0.789 0.940 1.119 1.331 1.578 1.883 2.242 2.663 3.156 3.759 4.823 5.745 6 0.785 0.935 1.113 1.324 1.570 1.873 2.230 2.649 3.139 3.739 4.798 5.714 7 0.781 0.930 1.107 1.317 1.561 1.863 2.219 2.634 3.122 3.719 4.772 5.683 8 0.776 0.925 1.101 1.310 1.553 1.853 2.207 2.620 3.106 3.699 4.746 5.653 9 0.772 0.920 1.095 1.303 1.544 1.843 2.195 2.606 3.089 3.679 4.721 5.622 10 0.768 0.915 1.089 1.296 1.536 1.833 2.183 2.592 3.072 3.659 4.695 5.592 11 0.764 0.910 1.083 1.289 1.528 1.823 2.171 2.578 3.055 3.639 4.669 5.561 12 0.760 0.905 1.077 1.282 1.519 1.813 2.159 2.564 3.038 3.619 4.644 5.531 13 0.755 0.900 1.071 1.275 1.511 1.803 2.147 2.550 3.022 3.599 4.618 5.500 14 0.751 0.895 1.065 1.268 1.502 1.793 2.135 2.535 3.005 3.579 4.592 5.470 15 0.747 0.890 1.059 1.261 1.494 1.783 2.123 2.521 2.988 3.559 4.567 5.439 16 0.743 0.885 1.053 1.254 1.486 1.773 2.111 2.507 2.971 3.539 4.541 5.408 17 0.739 0.880 1.047 1.246 1.477 1.763 2.099 2.493 2.954 3.519 4.515 5.378 18 0.734 0.875 1.041 1.239 1.469 1.753 2.087 2.479 2.938 3.499 4.490 5.347 19 0.730 0.870 1.035 1.232 1.460 1.743 2.075 2.465 2.921 3.479 4.464 5.317 20 0.726 0.865 1.029 1.225 1.452 1.733 2.063 2.450 2.904 3.459 4.438 5.286 21 0.722 0.860 1.024 1.218 1.444 1.723 2.052 2.436 2.887 3.439 4.413 5.256 22 0.718 0.855 1.018 1.211 1.435 1.713 2.040 2.422 2.871 3.419 4.387 5.225 23 0.713 0.850 1.012 1.204 1.427 1.703 2.028 2.408 2.854 3.399 4.361 5.195 24 0.709 0.845 1.006 1.197 1.418 1.693 2.016 2.394 2.837 3.379 4.336 5.164 25 0.705 0.840 1.000 1.190 1.410 1.683 2.004 2.380 2.820 3.359 4.310 5.133 26 0.701 0.835 0.994 1.183 1.402 1.673 1.992 2.365 2.803 3.339 4.284 5.103 27 0.697 0.830 0.988 1.176 1.393 1.663 1.980 2.351 2.787 3.319 4.259 5.072 28 0.692 0.825 0.982 1.169 1.385 1.653 1.968 2.337 2.770 3.299 4.233 5.042 29 0.688 0.820 0.976 1.161 1.377 1.643 1.956 2.323 2.753 3.279 4.207 5.011 30 0.684 0.815 0.970 1.154 1.368 1.633 1.944 2.309 2.736 3.259 4.182 4.981 31 0.680 0.810 0.964 1.147 — 1.623 1.932 2.295 — 3.239 4.156 4.950 Low-V Sense 75mV 5-16 Lattice Semiconductor LA-ispPAC-POWR1014/A Automotive Family Data Sheet Table 5-2. Trip Point Table Used For Under-Voltage Detection Fine Range Setting 1 2 3 4 5 6 7 8 9 10 11 12 1 0.797 0.950 1.131 1.346 1.595 1.903 2.266 2.691 3.190 3.799 4.875 5.806 2 0.793 0.945 1.125 1.338 1.586 1.893 2.254 2.677 3.173 3.779 4.849 5.775 3 0.789 0.940 1.119 1.331 1.578 1.883 2.242 2.663 3.156 3.759 4.823 5.745 4 0.785 0.935 1.113 1.324 1.570 1.873 2.230 2.649 3.139 3.739 4.798 5.714 5 0.781 0.930 1.107 1.317 1.561 1.863 2.219 2.634 3.122 3.719 4.772 5.683 6 0.776 0.925 1.101 1.310 1.553 1.853 2.207 2.620 3.106 3.699 4.746 5.653 7 0.772 0.920 1.095 1.303 1.544 1.843 2.195 2.606 3.089 3.679 4.721 5.622 8 0.768 0.915 1.089 1.296 1.536 1.833 2.183 2.592 3.072 3.659 4.695 5.592 9 0.764 0.910 1.083 1.289 1.528 1.823 2.171 2.578 3.055 3.639 4.669 5.561 10 0.760 0.905 1.077 1.282 1.519 1.813 2.159 2.564 3.038 3.619 4.644 5.531 11 0.755 0.900 1.071 1.275 1.511 1.803 2.147 2.550 3.022 3.599 4.618 5.500 12 0.751 0.895 1.065 1.268 1.502 1.793 2.135 2.535 3.005 3.579 4.592 5.470 13 0.747 0.890 1.059 1.261 1.494 1.783 2.123 2.521 2.988 3.559 4.567 5.439 14 0.743 0.885 1.053 1.254 1.486 1.773 2.111 2.507 2.971 3.539 4.541 5.408 15 0.739 0.880 1.047 1.246 1.477 1.763 2.099 2.493 2.954 3.519 4.515 5.378 16 0.734 0.875 1.041 1.239 1.469 1.753 2.087 2.479 2.938 3.499 4.490 5.347 17 0.730 0.870 1.035 1.232 1.460 1.743 2.075 2.465 2.921 3.479 4.464 5.317 18 0.726 0.865 1.029 1.225 1.452 1.733 2.063 2.450 2.904 3.459 4.438 5.286 19 0.722 0.860 1.024 1.218 1.444 1.723 2.052 2.436 2.887 3.439 4.413 5.256 20 0.718 0.855 1.018 1.211 1.435 1.713 2.040 2.422 2.871 3.419 4.387 5.225 21 0.713 0.850 1.012 1.204 1.427 1.703 2.028 2.408 2.854 3.399 4.361 5.195 22 0.709 0.845 1.006 1.197 1.418 1.693 2.016 2.394 2.837 3.379 4.336 5.164 23 0.705 0.840 1.000 1.190 1.410 1.683 2.004 2.380 2.820 3.359 4.310 5.133 24 0.701 0.835 0.994 1.183 1.402 1.673 1.992 2.365 2.803 3.339 4.284 5.103 25 0.697 0.830 0.988 1.176 1.393 1.663 1.980 2.351 2.787 3.319 4.259 5.072 26 0.692 0.825 0.982 1.169 1.385 1.653 1.968 2.337 2.770 3.299 4.233 5.042 27 0.688 0.820 0.976 1.161 1.377 1.643 1.956 2.323 2.753 3.279 4.207 5.011 28 0.684 0.815 0.970 1.154 1.368 1.633 1.944 2.309 2.736 3.259 4.182 4.981 29 0.680 0.810 0.964 1.147 1.360 1.623 1.932 2.295 2.719 3.239 4.156 4.950 30 0.676 0.805 0.958 1.140 1.352 1.613 1.920 2.281 2.702 3.219 4.130 4.919 31 0.672 0.800 0.952 1.133 - 1.603 1.908 2.267 - 3.199 4.105 4.889 Low-V Sense 75mV 5-17 Lattice Semiconductor LA-ispPAC-POWR1014/A Automotive Family Data Sheet Table 5-3. Comparator Hysteresis vs. Trip-Point Trip-point Range (V) Low Limit High Limit Hysteresis (mV) 0.672 0.806 8 0.800 0.960 10 0.952 1.143 12 1.133 1.360 14 1.346 1.612 17 1.603 1.923 20 1.908 2.290 24 2.267 2.719 28 2.691 3.223 34 3.199 3.839 40 4.105 4.926 51 4.889 5.867 75 mV 61 0 (Disabled) The window control section of the voltage monitor circuit is an AND gate (with inputs: an inverted COMPA “ANDed” with COMPB signal) and a multiplexer that supports the ability to develop a ‘window’ function without using any of the PLD’s resources. Through the use of the multiplexer, voltage monitor’s ‘A’ output may be set to report either the status of the ‘A’ comparator, or the window function of both comparator outputs. The voltage monitor’s ‘A’ output indicates whether the input signal is between or outside the two comparator thresholds. Important: This windowing function is only valid in cases where the threshold of the ‘A’ comparator is set to a value higher than that of the ‘B’ comparator. Table 5-4 shows the operation of window function logic. Table 5-4. Voltage Monitor Windowing Logic Input Voltage Comp A Comp B Window (B and Not A) Comment VIN < Trip-point B < Trip-point A 0 0 0 Outside window, low Trip-point B < VIN < Trip-point A 0 1 1 Inside window Trip-point B < Trip-point A < VIN 1 1 0 Outside window, high Note that when the ‘A’ output of the voltage monitor circuit is set to windowing mode, the ‘B’ output continues to monitor the output of the ‘B’ comparator. This can be useful in that the ‘B’ output can be used to augment the windowing function by determining if the input is above or below the windowing range. The third section in the LA-ispPAC-POWR1014/A’s input voltage monitor is a digital filter. When enabled, the comparator output will be delayed by a filter time constant of 64 µs, and is especially useful for reducing the possibility of false triggering from noise that may be present on the voltages being monitored. When the filter is disabled, the comparator output will be delayed by 16µs. In both cases, enabled or disabled, the filters also provide synchronization of the input signals to the PLD clock. This synchronous sampling feature effectively eliminates the possibility of race conditions from occurring in any subsequent logic that is implemented in the LA-ispPAC-POWR1014/A’s internal PLD logic. The comparator status can be read from the I2C interface (LA-ispPAC-POWR1014A only). For details on the I2C interface, please refer to the I2C/SMBUS Interface section of this data sheet. 5-18 Lattice Semiconductor LA-ispPAC-POWR1014/A Automotive Family Data Sheet VMON Voltage Measurement with the On-chip Analog to Digital Converter (ADC, LA-ispPAC-POWR1014A Only) The LA-ispPAC-POWR1014A has an on-chip analog to digital converter that can be used for measuring the voltages at the VMON inputs. Figure 5-9. ADC Monitoring VMON1 to VMON10 VMON1 VMON2 VMON3 Programmable Digital Multiplier Programmable Analog Attenuator ADC MUX ÷3 / ÷1 ADC x3 / x1 10 VMON10 To I2C Readout Register 12 (LA-ispPAC-POWR1014A Only) Internal VREF- 2.048V VDDA VCCINP 4 1 5 From I 2 C ADC MUX Register (LA-ispPAC-POWR1014A Only) Figure 5-9 shows the ADC circuit arrangement within the LA-ispPAC-POWR1014A device. The ADC can measure all analog input voltages through the multiplexer, ADC MUX. The programmable attenuator between the ADC mux and the ADC can be configured as divided-by-3 or divided-by-1 (no attenuation). The divided-by-3 setting is used to measure voltages from 0V to 6V range and divided-by-1 setting is used to measure the voltages from 0V to 2V range. A microcontroller can place a request for any VMON voltage measurement at any time through the I2C bus (LA-ispPAC-POWR1014A only). Upon the receipt of an I2C command, the ADC will be connected to the I2C selected VMON through the ADC MUX. The ADC output is then latched into the I2C readout registers. Calculation The algorithm to convert the ADC code to the corresponding voltage takes into consideration the attenuation bit value. In other words, if the attenuation bit is set, then the 10-bit ADC result is automatically multiplied by 3 to calculate the actual voltage at that VMON input. Thus, the I2C readout register is 12 bits instead of 10 bits. The following formula can always be used to calculate the actual voltage from the ADC code. Voltage at the VMONx Pins VMON = I2C Readout Register (12 bits1, converted to decimal) * 2mV 1 Note: ADC_VALUE_HIGH (8 bits), ADC_VALUE_LOW (4 bits) read from I2C/SMBUS interface (LA-ispPAC-POWR1014A only). 5-19 Lattice Semiconductor LA-ispPAC-POWR1014/A Automotive Family Data Sheet PLD Block Figure 5-10 shows the LA-ispPAC-POWR1014/A PLD architecture, which is derived from the Lattice's ispMACH™ 4000 CPLD. The PLD architecture allows the flexibility in designing various state machines and control functions used for power supply management. The AND array has 53 inputs and generates 123 product terms. These 123 product terms are divided into three groups of 41 for each of the generic logic blocks, GLB1, GLB2, and GLB3. Each GLB is made up of eight macrocells. In total, there are 24 macrocells in the LA-ispPAC-POWR1014/A device. The output signals of the LA-ispPAC-POWR1014/A device are derived from GLBs as shown in Figure 5-10. GLB3 generates timer control. Figure 5-10. LA-ispPAC-POWR1014/A PLD Architecture Global Reset (Resetb pin) AGOOD 41 MCLK IN[1:4] 4 HVOUT[1..2], OUT[3..8] GLB2 Generic Logic Block 8 Macrocell 41 PT OUT[9..14] Input Register AND Array 53 Inputs 123 PT VMON[1-10] 20 GLB1 Generic Logic Block 8 Macrocell 41 PT Input Register 41 4 Output Feedback GLB3 Generic Logic Block 8 Macrocell 41 PT 41 24 Timer0 Timer1 Timer2 Timer3 IRP Timer Clock 18 PLD Clock Macrocell Architecture The macrocell shown in Figure 5-11 is the heart of the PLD. The basic macrocell has five product terms that feed the OR gate and the flip-flop. The flip-flop in each macrocell is independently configured. It can be programmed to function as a D-Type or T-Type flip-flop. Combinatorial functions are realized by bypassing the flip-flop. The polarity control and XOR gates provide additional flexibility for logic synthesis. The flip-flop’s clock is driven from the common PLD clock that is generated by dividing the 8 MHz master clock by 32. The macrocell also supports asynchronous reset and preset functions, derived from either product terms, the global reset input, or the power-on reset signal. The resources within the macrocells share routing and contain a product term allocation array. The product term allocation array greatly expands the PLD’s ability to implement complex logical functions by allowing logic to be shared between adjacent blocks and distributing the product terms to allow for wider decode functions. All the digital inputs are registered by MCLK and the VMON comparator outputs are registered by the PLD Clock to synchronize them to the PLD logic. 5-20 Lattice Semiconductor LA-ispPAC-POWR1014/A Automotive Family Data Sheet Figure 5-11. LA-ispPAC-POWR1014/A Macrocell Block Diagram Global Reset Power On Reset Global Polarity Fuse for Init Product Term Block Init Product Term Product Term Allocation PT4 PT3 PT2 R PT1 P PT0 D/T To PLD Output Q Polarity CLK Clock Macrocell flip-flop provides D, T, or combinatorial output with polarity Clock and Timer Functions Figure 5-12 shows a block diagram of the LA-ispPAC-POWR1014/A’s internal clock and timer systems. The master clock operates at a fixed frequency of 8MHz, from which a fixed 250kHz PLD clock is derived. Figure 5-12. Clock and Timer System PLD Clock Timer 0 Internal Oscillator 8MHz Timer 1 SW0 To/From PLD 32 Timer 2 SW1 Timer 3 SW2 MCLK PLDCLK The internal oscillator runs at a fixed frequency of 8 MHz. This signal is used as a source for the PLD and timer clocks. It is also used for clocking the comparator outputs and clocking the digital filters in the voltage monitor cir- 5-21 Lattice Semiconductor LA-ispPAC-POWR1014/A Automotive Family Data Sheet cuits and ADC. The LA-ispPAC-POWR1014/A can be programmed to operate in three modes: Master mode, Standalone mode and Slave mode. Table 5-5 summarizes the operating modes of LA-ispPAC-POWR1014/A. Table 5-5. LA-ispPAC-POWR1014/A Operating Modes Timer Operating Mode Standalone Master Slave SW0 SW1 Closed Open Condition Comments When only one LA-ispPAC-POWR1014/A is used. MCLK pin tristated Closed Closed When more than one LA-ispPAC-POWR1014/A is used in a board, one of them should be configured MCLK pin outputs 8MHz clock to operate in this mode. Open Closed When more than one LA-ispPAC-POWR1014/As is used in a board. Other than the master, the rest of MCLK pin is input the LA-ispPAC-POWR1014/As should be programmed as slaves. A divide-by-32 prescaler divides the internal 8MHz oscillator (or external clock, if selected) down to 250kHz for the PLD clock and for the programmable timers. This PLD clock may be made available on the PLDCLK pin by closing SW2. Each of the four timers provides independent timeout intervals ranging from 32µs to 1.96 seconds in 128 steps. Digital Outputs The LA-ispPAC-POWR1014/A provides 14 digital outputs, HVOUT[1:2] and OUT[3:14]. Outputs OUT[3:14] are permanently configured as open drain to provide a high degree of flexibility when interfacing to logic signals, LEDs, opto-couplers, and power supply control inputs. The HVOUT[1:2] pins can be configured as either high voltage FET drivers or open drain outputs. Each of these outputs may be controlled either from the PLD or from the I2C bus (LAispPAC-POWR1014A only). The determination whether a given output is under PLD or I2C control may be made on a pin-by-pin basis (see Figure 5-13). For further details on controlling the outputs through I2C, please see the I2C/ SMBUS Interface section of this data sheet. Figure 5-13. Digital Output Pin Configuration Digital Control from PLD OUTx Pin Digital Control from I2C Register (LA-ispPAC-POWR1014A only) High-Voltage Outputs In addition to being usable as digital open-drain outputs, the LA-ispPAC-POWR1014/A’s HVOUT1-HVOUT2 output pins can be programmed to operate as high-voltage FET drivers. Figure 5-14 shows the details of the HVOUT gate drivers. Each of these outputs may be controlled from the PLD, or with the LA-ispPAC-POWR1014A, from the I2C bus (see Figure 5-14). For further details on controlling the outputs through I2C, please see the I2C/SMBUS Interface section of this data sheet. 5-22 Lattice Semiconductor LA-ispPAC-POWR1014/A Automotive Family Data Sheet Figure 5-14. Basic Function Diagram for an Output in High Voltage MOSFET Gate Driver Mode Charge Pump (6 to 8V) Digital Control from PLD ISOURCE (12.5 to 100 µA) + - HVOUTx Pin ISINK (100 to 500 µA) +Fast Turn-off (3000µA) Input Supply Load Digital Control from I2C Register (LA-ispPAC-POWR1014A Only) Figure 5-14 shows the HVOUT circuitry when programmed as a FET driver. In this mode the output either sources current from a charge pump or sinks current. The maximum voltage that the output level at the pin will rise to is also programmable. The HVOUT pin source current, which is programmable between 12.5 µA and 100 µA, is used to control the FET turn-on rate. Similarly, the HVOUT sink current, which is programmable between 3000 µA and 100 µA, is used to control the turn-off rate. Programmable Output Voltage Levels for HVOUT1- HVOUT2 The HVOUT output voltage can be programmed to 6V or 8V when in FET driver mode. RESETb Signal, RESET Command via JTAG or I2C Activating the RESETb signal (Logic 0 applied to the RESETb pin) or issuing a reset instruction via JTAG, or with the LA-ispPAC-POWR1014A, I2C will force the outputs to the following states independent of how these outputs have been configured in the PINS window: • OUT3-14 will go high-impedance. • HVOUT pins programmed for open drain operation will go high-impedance. • HVOUT pins programmed for FET driver mode operation will pull down. At the conclusion of the RESET event, these outputs will go to the states defined by the PINS window, and if a sequence has been programmed into the device, it will be re-started at the first step. The analog calibration will be re-done and consequently, the VMONs, and ADCs will not be operational until 500 microseconds (max.) after the conclusion of the RESET event. CAUTION: Activating the RESETb signal or issuing a RESET command through I2C or JTAG during the LA-ispPAC-POWR1014/A device operation, results in the device aborting all operations and returning to the power-on reset state. The status of the power supplies which are being enabled by the LA-ispPAC-POWR1014/A will be determined by the state of the outputs shown above. I2C/SMBUS Interface (LA-ispPAC-POWR1014A Only) I2C and SMBus are low-speed serial interface protocols designed to enable communications among a number of devices on a circuit board. The LA-ispPAC-POWR1014A supports a 7-bit addressing of the I2C communications protocol, as well as SMBTimeout and SMBAlert features of the SMBus, enabling it to easily integrated into many types of modern power management systems. Figure 5-15 shows a typical I2C configuration, in which one or more LA-ispPAC-POWR1014As are slaved to a supervisory microcontroller. SDA is used to carry data signals, while SCL provides a synchronous clock signal. The SMBAlert line is only present in SMBus systems. The 7-bit I2C address of the POWR1014A is fully programmable through the JTAG port. 5-23 Lattice Semiconductor LA-ispPAC-POWR1014/A Automotive Family Data Sheet Figure 5-15. LA-ispPAC-POWR1014A in I 2C/SMBUS System V+ SDA/SMDAT (DATA) To Other I2C Devices SCL/SMCLK (CLOCK) SMBALERT SDA SCL SDA INTERRUPT SCL OUT5/ SMBA SDA POWR1014A (I2C SLAVE) MICROPROCESSOR (I2C MASTER) SCL OUT5/ SMBA POWR1014A (I2C SLAVE) In both the I2C and SMBus protocols, the bus is controlled by a single MASTER device at any given time. This master device generates the SCL clock signal and coordinates all data transfers to and from a number of slave devices. The LA-ispPAC-POWR1014A is configured as a slave device, and cannot independently coordinate data transfers. Each slave device on a given I2C bus is assigned a unique address. The LA-ispPAC-POWR1014A implements the 7-bit addressing portion of the standard. Any 7-bit address can be assigned to the LA-ispPAC-POWR1014A device by programming through JTAG. When selecting a device address, one should note that several addresses are reserved by the I2C and/or SMBus standards, and should not be assigned to LA-ispPAC-POWR1014A devices to assure bus compatibility. Table 5-6 lists these reserved addresses. Table 5-6. I 2C/SMBus Reserved Slave Device Addresses I2C function Description Address R/W bit 0000 000 0 0000 000 1 Start Byte Start Byte 0000 001 x CBUS Address CBUS Address 0000 010 x Reserved Reserved 0000 011 x Reserved Reserved General Call Address SMBus Function General Call Address 0000 1xx x HS-mode master code HS-mode master code 0001 000 x NA SMBus Host 0001 100 x NA SMBus Alert Response Address 0101 000 x NA Reserved for ACCESS.bus 0110 111 x NA Reserved for ACCESS.bus 1100 001 x NA SMBus Device Default Address 1111 0xx x 10-bit addressing 10-bit addressing 1111 1xx x Reserved Reserved The LA-ispPAC-POWR1014A’s I2C/SMBus interface allows data to be both written to and read from the device. A data write transaction (Figure 5-16) consists of the following operations: 1. Start the bus transaction 2. Transmit the device address (7 bits) along with a low write bit 3. Transmit the address of the register to be written to (8 bits) 4. Transmit the data to be written (8 bits) 5. Stop the bus transaction 5-24 Lattice Semiconductor LA-ispPAC-POWR1014/A Automotive Family Data Sheet To start the transaction, the master device holds the SCL line high while pulling SDA low. Address and data bits are then transferred on each successive SCL pulse, in three consecutive byte frames of 9 SCL pulses. Address and data are transferred on the first 8 SCL clocks in each frame, while an acknowledge signal is asserted by the slave device on the 9th clock in each frame. Both data and addresses are transferred in a most-significant-bit-first format. The first frame contains the 7-bit device address, with bit 8 held low to indicate a write operation. The second frame contains the register address to which data will be written, and the final frame contains the actual data to be written. Note that the SDA signal is only allowed to change when the SCL is low, as raising SDA when SCL is high signals the end of the transaction. Figure 5-16. I 2C Write Operation SCL SDA 1 2 3 4 5 6 7 8 9 1 2 3 4 5 6 7 8 9 1 2 3 4 5 6 7 8 9 A6 A5 A4 A3 A2 A1 A0 R/W ACK R7 R6 R5 R4 R3 R2 R1 R0 ACK D7 D6 D5 D4 D3 D2 D1 D0 ACK START DEVICE ADDRESS (7 BITS) REGISTER ADDRESS (8 BITS) WRITE DATA (8 BITS) STOP Note: Shaded Bits Asserted by Slave Reading a data byte from the LA-ispPAC-POWR1014A requires two separate bus transactions (Figure 5-17). The first transaction writes the register address from which a data byte is to be read. Note that since no data is being written to the device, the transaction is concluded after the second byte frame. The second transaction performs the actual read. The first frame contains the 7-bit device address with the R/W bit held High. In the second frame the LA-ispPAC-POWR1014A asserts data out on the bus in response to the SCL signal. Note that the acknowledge signal in the second frame is asserted by the master device and not the LA-ispPAC-POWR1014A. Figure 5-17. I 2C Read Operation STEP 1: WRITE REGISTER ADDRESS FOR READ OPERATION SCL SDA 1 2 3 4 5 6 7 8 9 1 2 3 4 5 6 7 8 9 A6 A5 A4 A3 A2 A1 A0 R/W ACK R7 R6 R5 R4 R3 R2 R1 R0 ACK START DEVICE ADDRESS (7 BITS) REGISTER ADDRESS (8 BITS) STOP STEP 2: READ DATA FROM THAT REGISTER SCL SDA START 1 2 3 4 5 6 7 8 9 1 2 3 4 5 6 7 8 9 A6 A5 A4 A3 A2 A1 A0 R/W ACK D7 D6 D5 D4 D3 D2 D1 D0 ACK DEVICE ADDRESS (7 BITS) READ DATA (8 BITS) OPTIONAL STOP Note: Shaded Bits Asserted by Slave The LA-ispPAC-POWR1014ALA-ispPAC-POWR1014A provides 17 registers that can be accessed through its I2C interface. These registers provide the user with the ability to monitor and control the device’s inputs and outputs, and transfer data to and from the device. Table 5-7 provides a summary of these registers. 5-25 Lattice Semiconductor LA-ispPAC-POWR1014/A Automotive Family Data Sheet Table 5-7. I 2C Control Registers Register Address Register Name Read/Write 0x00 vmon_status0 R VMON input status Vmon[4:1] –––– –––– 0x01 vmon_status1 R VMON input status Vmon[8:5] –––– –––– Value After POR1, 2 Description 0x02 vmon_status2 R VMON input status Vmon[10:9] XXXX –––– 0x03 output_status0 R Output status OUT[8:3], HVOUT[2:1] –––– –––– 0x04 output_status1 R Output status OUT[14:9] XX–– –––– 0x06 input_status R Input status IN[4:1] XXXX –––– 0x07 adc_value_low R ADC D[3:0] and status –––– XXX1 0x08 adc_value_high R ADC D[9:4] XX–– –––– 0x09 adc_mux R/W ADC Attenuator and MUX[3:0] XXX– –––– 0x0A UES_byte0 R UES[7:0] –––– –––– 0x0B UES_byte1 R UES[15:8] –––– –––– 0x0C UES_byte2 R UES[23:16] –––– –––– 0x0D UES_byte3 R UES[31:24] –––– –––– 0x0E gp_output1 R/W GPOUT[8:1] 0000 0100 0x0F gp_output2 R/W GPOUT[14:9] XX00 0000 0x11 input_value R/W PLD Input Register [4:2] XXXX 000X 0x12 reset W Resets device on write N/A 1. “X” = Non-functional bit (bits read out as 1’s). 2. “–” = State depends on device configuration or input status. Several registers are provided for monitoring the status of the analog inputs. The three registers VMON_STATUS[0:2] provide the ability to read the status of the VMON output comparators. The ability to read both the ‘a’ and ‘b’ comparators from each VMON input is provided through the VMON input registers. Note that if a VMON input is configured to window comparison mode, then the corresponding VMONxA register bit will reflect the status of the window comparison. Figure 5-18. VMON Status Registers 0x00 - VMON_STATUS0 (Read Only) VMON4B VMON4A VMON3B VMON3A VMON2B VMON2A VMON1B VMON1A b7 b6 b5 b4 b3 b2 b1 b0 0x01 - VMON_STATUS1 (Read Only) VMON8B VMON8A VMON7B VMON7A VMON6B VMON6A VMON5B VMON5A b7 b6 b5 b4 b3 b2 b1 b0 0x02 - VMON_STATUS2 (Read Only) 1 1 1 1 VMON10B VMON10A VMON9B VMON9A b7 b6 b5 b4 b3 b2 b1 b0 It is also possible to directly read the value of the voltage present on any of the VMON inputs by using the LA-ispPAC-POWR1014A’s ADC. Three registers provide the I2C interface to the ADC (Figure 5-19). 5-26 Lattice Semiconductor LA-ispPAC-POWR1014/A Automotive Family Data Sheet Figure 5-19. ADC Interface Registers 0x07 - ADC_VALUE_LOW (Read Only) D3 D2 D1 D0 1 1 1 DONE b7 b6 b5 b4 b3 b2 b1 b0 0x08 - ADC_VALUE_HIGH (Read Only) D11 D10 D9 D8 D7 D6 D5 D4 b7 b6 b5 b4 b3 b2 b1 b0 0x09 - ADC_MUX (Read/Write) X X X ATTEN SEL3 SEL2 SEL1 SEL0 b7 b6 b5 b4 b3 b2 b1 b0 To perform an A/D conversion, one must set the input attenuator and channel selector. Two input ranges may be set using the attenuator, 0 - 2.048V and 0 - 6.144V. Table 5-8 shows the input attenuator settings. Table 5-8. ADC Input Attenuator Control ATTEN (ADC_MUX.4) Resolution Full-Scale Range 0 2mV 2.048 V 1 6mV 6.144 V The input selector may be set to monitor any one of the ten VMON inputs, the VCCA input, or the VCCINP input. Table 5-9 shows the codes associated with each input selection. Table 5-9. VMON Address Selection Table Select Word SEL3 (ADC_MUX.3) SEL2 (ADC_MUX.2) SEL1 (ADC_MUX.1) SEL0 (ADC_MUX.0) Input Channel 0 0 0 0 VMON1 0 0 0 1 VMON2 0 0 1 0 VMON3 0 0 1 1 VMON4 0 1 0 0 VMON5 0 1 0 1 VMON6 0 1 1 0 VMON7 0 1 1 1 VMON8 1 0 0 0 VMON9 1 0 0 1 VMON10 1 1 0 0 VCCA 1 1 0 1 VCCINP Writing a value to the ADC_MUX register to set the input attenuator and selector will automatically initiate a conversion. When the conversion is in process, the DONE bit (ADC_VALUE_LOW.0) will be reset to 0. When the conversion is complete, this bit will be set to 1. When the conversion is complete, the result may be read out of the ADC by performing two I2C read operations; one for ADC_VALUE_LOW, and one for ADC_VALUE_HIGH. It is recommended that the I2C master load a second conversion command only after the completion of the current conversion 5-27 Lattice Semiconductor LA-ispPAC-POWR1014/A Automotive Family Data Sheet command (Waiting for the DONE bit to be set to 1). An alternative would be to wait for a minimum specified time (see TCONVERT value in the specifications) and disregard checking the DONE bit. Note that if the I2C clock rate falls below 50kHz (see FI2C note in specifications), the only way to insure a valid ADC conversion is to wait the minimum specified time (TCONVERT), as the operation of the DONE bit at clock rates lower than that cannot be guaranteed. In other words, if the I2C clock rate is less than 50kHz, the DONE bit may or may not assert even though a valid conversion result is available. To insure every ADC conversion result is valid, preferred operation is to clock I2C at more than 50kHz and verify DONE bit status or wait for the full TCONVERT time period between subsequent ADC convert commands. If an I2C request is placed before the current conversion is complete, the DONE bit will be set to 1 only after the second request is complete. The status of the digital input lines may also be monitored and controlled through I2C commands. Figure 5-20 shows the I2C interface to the IN[1:4] digital input lines. The input status may be monitored by reading the INPUT_STATUS register, while input values to the PLD array may be set by writing to the INPUT_VALUE register. To be able to set an input value for the PLD array, the input multiplexer associated with that bit needs to be set to the I2C register setting in E2CMOS memory otherwise the PLD will receive its input from the INx pin. Figure 5-20. I 2C Digital Input Interface PLD Output/Input_Value Register Select (E2 Configuration) 3 IN1 MUX USERJTAG Bit 2 PLD Array 3 IN[2..4] MUX 3 3 Input_Value Input_Status I2C Interface Unit 0x06 - INPUT_STATUS (Read Only) 1 1 1 1 IN4 IN3 IN2 IN1 b7 b6 b5 b4 b3 b2 b1 b0 0x11 - INPUT_VALUE (Read/Write) X X X X I4 I3 I2 X b7 b6 b5 b4 b3 b2 b1 b0 The digital outputs may also be monitored and controlled through the I2C interface, as shown in Figure 5-21. The status of any given digital output may be read by reading the contents of the associated OUTPUT_STATUS[1:0] register. Note that in the case of the outputs, the status reflected by these registers reflects the logic signal used to drive the pin, and does not sample the actual level present on the output pin. For example, if an output is set high 5-28 Lattice Semiconductor LA-ispPAC-POWR1014/A Automotive Family Data Sheet but is not pulled up, the output status bit corresponding with that pin will read ‘1’, but a high output signal will not appear on the pin. Digital outputs may also be optionally controlled directly by the I2C bus instead of by the PLD array. The outputs may be driven either from the PLD output or from the contents of the GP_OUTPUT[1:0] registers with the choice user-settable in E2CMOS memory. Each output may be independently set to output from the PLD or from the GP_OUTPUT registers. Figure 5-21. I 2C Output Monitor and Control Logic PLD Output/GP_Output Register Select (E2 Configuration) PLD Output Routing Pool 14 14 14 MUX HVOUT[1..2] OUT[3..14] 14 14 GP_Output1 Output_Status0 GP_Output2 Output_Status1 I2C Interface Unit 0x03 - OUTPUT_STATUS0 (Read Only) OUT8 OUT7 OUT6 OUT5 OUT4 OUT3 HVOUT2 HVOUT1 b7 b6 b5 b4 b3 b2 b1 b0 0x04 - OUTPUT_STATUS1 (Read Only) 1 1 OUT14 OUT13 OUT12 OUT11 OUT10 OUT9 b7 b6 b5 b4 b3 b2 b1 b0 0x0E - GP_OUTPUT1 (Read/Write) GP8 GP7 GP6 GP5 GP4 GP3_ENb GP2 GP1 b7 b6 b5 b4 b3 b2 b1 b0 0x0F - GP_OUTPUT2 (Read/Write) X X GP14 GP13 GP12 GP11 GP10 GP9 b7 b6 b5 b4 b3 b2 b1 b0 The UES word may also be read through the I2C interface, with the register mapping shown in Figure 5-22. 5-29 Lattice Semiconductor LA-ispPAC-POWR1014/A Automotive Family Data Sheet Figure 5-22. I 2C Register Mapping for UES Bits 0x0A - UES_BYTE0 (Read Only) UES7 UES6 UES5 UES4 UES3 UES2 UES1 UES0 b7 b6 b5 b4 b3 b2 b1 b0 0x0B - UES_BYTE1 (Read Only) UES15 UES14 UES13 UES12 UES11 UES10 UES9 UES8 b7 b6 b5 b4 b3 b2 b1 b0 0x0C - UES_BYTE2 (Read Only) UES23 UES22 UES21 UES20 UES19 UES18 UES17 UES16 b7 b6 b5 b4 b3 b2 b1 b0 0x0D - UES_BYTE3 (Read Only) UES31 UES30 UES29 UES28 UES27 UES26 UES25 UES24 b7 b6 b5 b4 b3 b2 b1 b0 The I2C interface also provides the ability to initiate reset operations. The LA-ispPAC-POWR1014A may be reset by issuing a write of any value to the I2C RESET register (Figure 5-23). Note: The execution of the I2C reset command is equivalent to toggling the Resetb pin of the chip. Refer to the Resetb Signal, RESET Command via JTAG or I2C section of this data sheet for further information. Figure 5-23. I 2C Reset Register 0x12 - RESET (Write Only) X X X X X X X X b7 b6 b5 b4 b3 b2 b1 b0 5-30 Lattice Semiconductor LA-ispPAC-POWR1014/A Automotive Family Data Sheet SMBus SMBAlert Function The LA-ispPAC-POWR1014A provides an SMBus SMBAlert function so that it can request service from the bus master when it is used as part of an SMBus system. This feature is supported as an alternate function of OUT3. When the SMBAlert feature is enabled, OUT3 is controlled by a combination of the PLD output and the GP3_ENb bit (Figure 5-24). Note: To enable the SMBAlert feature, the SMB_Mode (EECMOS bit) should be set in software. Figure 5-24. LA-ispPAC-POWR1014/A SMBAlert Logic PLD Output/GP_Output Register Select (E2 Configuration) OUT3/SMBA Mode Select (E2 Configuration) PLD Output Routing Pool MUX OUT3/SMBA MUX GP3_ENb SMBAlert Logic I2C Interface Unit The typical flow for an SMBAlert transaction is as follows (Figure 5-24): 1. GP3_ENb bit is forced (Via I2C write) to Low 2. LA-ispPAC-POWR1014A PLD Logic pulls OUT3/SMBA Low 3. Master responds to interrupt from SMBA line 4. Master broadcasts a read operation using the SMBus Alert Response Address (ARA) 5. LA-ispPAC-POWR1014A responds to read request by transmitting its device address 6. If transmitted device address matches LA-ispPAC-POWR1014A address, it sets GP3_ENb bit high. This releases OUT3/SMBA. Figure 5-25. SMBAlert Bus Transaction SMBA SCL 1 2 3 4 5 6 7 SDA 0 0 0 1 1 0 0 SLAVE ASSERTS SMBA START 8 9 1 2 3 4 5 6 7 8 9 R/W ACK A6 A5 A4 A3 A2 A1 A0 x ACK SLAVE ADDRESS (7 BITS) ALERT RESPONSE ADDRESS (0001 100) SLAVE RELEASES SMBA STOP Note: Shaded Bits Asserted by Slave After OUT3/SMBA has been released, the bus master (typically a microcontroller) may opt to perform some service functions in which it may send data to or read data from the LA-ispPAC-POWR1014A. As part of the service functions, the bus master will typically need to clear whatever condition initiated the SMBAlert request, and will also need to reset GP3_ENb to re-enable the SMBAlert function. For further information on the SMBus, the user should consult the SMBus Standard. 5-31 Lattice Semiconductor LA-ispPAC-POWR1014/A Automotive Family Data Sheet Software-Based Design Environment Designers can configure the LA-ispPAC-POWR1014/A using PAC-Designer, an easy to use, Microsoft Windows compatible program. Circuit designs are entered graphically and then verified, all within the PAC-Designer environment. Full device programming is supported using PC parallel port I/O operations and a download cable connected to the serial programming interface pins of the LA-ispPAC-POWR1014/A. A library of configurations is included with basic solutions and examples of advanced circuit techniques are available on the Lattice web site for downloading. In addition, comprehensive on-line and printed documentation is provided that covers all aspects of PAC-Designer operation. The PAC-Designer schematic window, shown in Figure 5-26, provides access to all configurable LA-ispPAC-POWR1014/A elements via its graphical user interface. All analog input and output pins are represented. Static or non-configurable pins such as power, ground, and the serial digital interface are omitted for clarity. Any element in the schematic window can be accessed via mouse operations as well as menu commands. When completed, configurations can be saved, simulated, and downloaded to devices. Figure 5-26. PAC-Designer LA-ispPAC-POWR1014/A Design Entry Screen In-System Programming The LA-ispPAC-POWR1014/A is an in-system programmable device. This is accomplished by integrating all E2 configuration memory and control logic on-chip. Programming is performed through a 4-wire, IEEE 1149.1 compliant serial JTAG interface at normal logic levels. Once a device is programmed, all configuration information is stored on-chip, in non-volatile E2CMOS memory cells. The specifics of the IEEE 1149.1 serial interface and all LAispPAC-POWR1014/A instructions are described in the JTAG interface section of this data sheet. Programming LA-ispPAC-POWR1014/A: Alternate Method Some applications require that the LA-ispPAC-POWR1014/A be programmed before turning the power on to the entire circuit board. To meet such application needs, the LA-ispPAC-POWR1014/A provides an alternate programming method which enables the programming of the LA-ispPAC-POWR1014/A device through the JTAG chain with a separate power supply applied just to the programming section of the LA-ispPAC-POWR1014/A device with the main power supply of the board turned off. 5-32 Lattice Semiconductor LA-ispPAC-POWR1014/A Automotive Family Data Sheet Three special purpose pins, VCCPROG, ATDI and TDISEL, enable programming of the un-programmed LA-ispPAC-POWR1014/A under such circumstances. The VCCPROG pin powers just the programming circuitry of the LA-ispPAC-POWR1014/A device. The ATDI pin provides an alternate connection to the JTAG header while bypassing all the un-powered devices in the JTAG chain. TDISEL pin enables switching between the ATDI and the standard JTAG signal TDI. When the internally pulled-up TDISEL = 1, standard TDI pin is enabled and when the TDISEL = 0, ATDI is enabled. In order to use this feature the JTAG signals of the LA-ispPAC-POWR1014/A are connected to the header as shown in Figure 5-27. Note: The LA-ispPAC-POWR1014/A should be the last device in the JTAG chain. Figure 5-27. LA-ispPAC-POWR1014/A Alternate TDI Configuration Diagram 2. Initial Power Supply Turn-On 3. Sequenced Power Supply Turn-on Other JTAG Device(s) TDI TDO TDI VCCPROG VCCJ VCC VCCIO TDI VCCJ VCC JTAG Signal Connector 1. Power for Programming POWR1014A LA-ispPAC-POWR 1014A TDO ATDI TDISEL TMS TCK TMS TCK TCK TMS TDO TDISEL Alternate TDI Selection Via JTAG Command When the TDISEL pin held high and four consecutive IDCODE instructions are issued, LA-ispPAC-POWR1014/A responds by making its active JTAG data input the ATDI pin. When ATDI is selected, data on its TDI pin is ignored until the JTAG state machine returns to the Test-Logic-Reset state. This method of selecting ATDI takes advantage of the fact that a JTAG device with an IDCODE register will automatically load its unique IDCODE instruction into the Instruction Register after a Test-Logic-Reset. This JTAG capability permits blind interrogation of devices so that their location in a serial chain can be identified without having to know anything about them in advance. A blind interrogation can be made using only the TMS and TCLK control pins, which means TDI and TDO are not required for performing the operation. Figure 5-28 illustrates the logic for selecting whether the TDI or ATDI pin is the active data input to LA-ispPAC-POWR1014/A. 5-33 Lattice Semiconductor LA-ispPAC-POWR1014/A Automotive Family Data Sheet Figure 5-28. LA-ispPAC-POWR1014/A TDI/ATDI Pin Selection Diagram TMS TDI TCK 1 TDO JTAG ATDI 0 Test-Logic-Reset 4 Consecutive IDCODE Instructions Loaded at Update-IR SET Q CLR TDISEL LA-ispPAC-POWR1014/A Table 5-10 shows in truth table form the same conditions required to select either TDI or ATDI as in the logic diagram found in Figure 5-28. Table 5-10. LA-ispPAC-POWR1014/A ATDI/TDI Selection Table TDISEL Pin JTAG State Machine Test-Logic-Reset Four Consecutive IDCODE Commands Loaded at Update-IR Active JTAG Data Input Pin H No Yes ATDI (TDI Disabled) H Yes No TDI (ATDI Disabled) L X X ATDI (TDI Disabled) Please refer to the Lattice application note AN6068, Programming the ispPAC-POWR1220AT8 in a JTAG Chain Using ATDI. The application note includes specific SVF code examples and information on the use of Lattice design tools to verify device operation in alternate TDI mode. VCCPROG Power Supply Pin Because the VCCPROG pin directly powers the on-chip programming circuitry, the LA-ispPAC-POWR1014/A device can be programmed by applying power to the VCCPROG pin (without powering the entire chip though the VCCD and VCCA pins). In addition, to enable the on-chip JTAG interface circuitry, power should be applied to the VCCJ pin. When the LA-ispPAC-POWR1014/A is using the VCCPROG pin, its VCCD and VCCA pins can be open or pulled low. Additionally, other than JTAG I/O pins, all digital output pins are in Hi-Z state, HVOUT pins configured as MOSFET driver are driven low, and all other inputs are ignored. To switch the power supply back to VCCD and VCCA pins, one should turn the VCCPROG supply and VCCJ off before turning the regular supplies on. When VCCD and VCCA are turned back on for normal operation, VCCPROG should be left floating. 5-34 Lattice Semiconductor LA-ispPAC-POWR1014/A Automotive Family Data Sheet User Electronic Signature A user electronic signature (UES) feature is included in the E2CMOS memory of the LA-ispPAC-POWR1014/A. This consists of 32 bits that can be configured by the user to store unique data such as ID codes, revision numbers or inventory control data. The specifics of this feature are discussed in the IEEE 1149.1 serial interface section of this data sheet. Electronic Security An electronic security “fuse” (ESF) bit is provided in every LA-ispPAC-POWR1014/A device to prevent unauthorized readout of the E2CMOS configuration bit patterns. Once programmed, this cell prevents further access to the functional user bits in the device. This cell can only be erased by reprogramming the device, so the original configuration cannot be examined once programmed. Usage of this feature is optional. The specifics of this feature are discussed in the IEEE 1149.1 serial interface section of this data sheet. Production Programming Support Once a final configuration is determined, an ASCII format JEDEC file can be created using the PAC-Designer software. Devices can then be ordered through the usual supply channels with the user’s specific configuration already preloaded into the devices. By virtue of its standard interface, compatibility is maintained with existing production programming equipment, giving customers a wide degree of freedom and flexibility in production planning. Evaluation Fixture Because the features of an LA-ispPAC-POWR1014/A are all included in the larger ispPAC-POWR1220AT8 device, designs implemented in an LA-ispPAC-POWR1014/A can be verified using an ispPAC-POWR1220AT8 engineering prototype board connected to the parallel port of a PC with a Lattice ispDOWNLOAD® cable. The board demonstrates proper layout techniques and can be used in real time to check circuit operation as part of the design process. Input and output connections are provided to aid in the evaluation of the functionality implemented in LAispPAC-POWR1014/A for a given application. (Figure 5-29). Figure 5-29. Download from a PC PAC-Designer Software Other System Circuitry ispDOWNLOAD Cable (6') 4 LA-ispPACPOWR1220AT8 Device IEEE Standard 1149.1 Interface (JTAG) Serial Port Programming Interface Communication with the LA-ispPAC-POWR1014/A is facilitated via an IEEE 1149.1 test access port (TAP). It is used by the LA-ispPAC-POWR1014/A as a serial programming interface. A brief description of the LA-ispPAC-POWR1014/A JTAG interface follows. For complete details of the reference specification, refer to the publication, Standard Test Access Port and Boundary-Scan Architecture, IEEE Std 1149.1-1990 (which now includes IEEE Std 1149.1a-1993). Overview An IEEE 1149.1 test access port (TAP) provides the control interface for serially accessing the digital I/O of the LAispPAC-POWR1014/A. The TAP controller is a state machine driven with mode and clock inputs. Given in the correct sequence, instructions are shifted into an instruction register, which then determines subsequent data input, data output, and related operations. Device programming is performed by addressing the configuration register, 5-35 Lattice Semiconductor LA-ispPAC-POWR1014/A Automotive Family Data Sheet shifting data in, and then executing a program configuration instruction, after which the data is transferred to internal E2CMOS cells. It is these non-volatile cells that store the configuration or the LA-ispPAC-POWR1014/A. A set of instructions are defined that access all data registers and perform other internal control operations. For compatibility between compliant devices, two data registers are mandated by the IEEE 1149.1 specification. Others are functionally specified, but inclusion is strictly optional. Finally, there are provisions for optional data registers defined by the manufacturer. The two required registers are the bypass and boundary-scan registers. Figure 5-30 shows how the instruction and various data registers are organized in an LA-ispPAC-POWR1014/A. Figure 5-30. LA-ispPAC-POWR1014/A TAP Registers DATA REGISTER (123 BITS) E2CMOS NON-VOLATILE MEMORY ADDRESS REGISTER (109 BITS) MULTIPLEXER UES REGISTER (32 BITS) IDCODE REGISTER (32 BITS) CFG ADDRESS REGISTER (12 BITS) CFG DATA REGISTER (56 BITS) BYPASS REGISTER (1 BIT) INSTRUCTION REGISTER (8 BITS) TEST ACCESS PORT (TAP) LOGIC TDI TCK TMS OUTPUT LATCH TDO TAP Controller Specifics The TAP is controlled by the Test Clock (TCK) and Test Mode Select (TMS) inputs. These inputs determine whether an Instruction Register or Data Register operation is performed. Driven by the TCK input, the TAP consists of a small 16-state controller design. In a given state, the controller responds according to the level on the TMS input as shown in Figure 5-31. Test Data In (TDI) and TMS are latched on the rising edge of TCK, with Test Data Out (TDO) becoming valid on the falling edge of TCK. There are six steady states within the controller: Test-Logic-Reset, RunTest/Idle, Shift-Data-Register, Pause-Data-Register, Shift-Instruction-Register and Pause-Instruction-Register. But there is only one steady state for the condition when TMS is set high: the Test-Logic-Reset state. This allows a reset of the test logic within five TCKs or less by keeping the TMS input high. Test-Logic-Reset is the power-on default state. 5-36 Lattice Semiconductor LA-ispPAC-POWR1014/A Automotive Family Data Sheet Figure 5-31. TAP States 1 Test-Logic-Rst 0 0 Run-Test/Idle 1 Select-DR-Scan 1 1 0 Capture-DR Select-IR-Scan 1 0 Capture-IR 0 0 0 Shift-DR 1 1 1 Exit1-IR 0 0 Pause-DR 1 0 Pause-IR Exit2-IR 1 Update-DR 0 0 1 0 Exit2-DR 1 0 Shift-IR 1 Exit1-DR 0 1 1 Update-IR 1 0 Note: The value shown adjacent to each state transition in this figure represents the signal present at TMS at the time of a rising edge at TCK. When the correct logic sequence is applied to the TMS and TCK inputs, the TAP will exit the Test-Logic-Reset state and move to the desired state. The next state after Test-Logic-Reset is Run-Test/Idle. Until a data or instruction shift is performed, no action will occur in Run-Test/Idle (steady state = idle). After Run-Test/Idle, either a data or instruction shift is performed. The states of the Data and Instruction Register blocks are identical to each other differing only in their entry points. When either block is entered, the first action is a capture operation. For the Data Registers, the Capture-DR state is very simple: it captures (parallel loads) data onto the selected serial data path (previously chosen with the appropriate instruction). For the Instruction Register, the Capture-IR state will always load the IDCODE instruction. It will always enable the ID Register for readout if no other instruction is loaded prior to a Shift-DR operation. This, in conjunction with mandated bit codes, allows a “blind” interrogation of any device in a compliant IEEE 1149.1 serial chain. From the Capture state, the TAP transitions to either the Shift or Exit1 state. Normally the Shift state follows the Capture state so that test data or status information can be shifted out or new data shifted in. Following the Shift state, the TAP either returns to the Run-Test/Idle state via the Exit1 and Update states or enters the Pause state via Exit1. The Pause state is used to temporarily suspend the shifting of data through either the Data or Instruction Register while an external operation is performed. From the Pause state, shifting can resume by reentering the Shift state via the Exit2 state or be terminated by entering the Run-Test/Idle state via the Exit2 and Update states. If the proper instruction is shifted in during a Shift-IR operation, the next entry into Run-Test/Idle initiates the test mode (steady state = test). This is when the device is actually programmed, erased or verified. All other instructions are executed in the Update state. Test Instructions Like data registers, the IEEE 1149.1 standard also mandates the inclusion of certain instructions. It outlines the function of three required and six optional instructions. Any additional instructions are left exclusively for the manufacturer to determine. The instruction word length is not mandated other than to be a minimum of two bits, with only the BYPASS and EXTEST instruction code patterns being specifically called out (all ones and all zeroes respectively). The LA-ispPAC-POWR1014/A contains the required minimum instruction set as well as one from the optional instruction set. In addition, there are several proprietary instructions that allow the device to be configured 5-37 Lattice Semiconductor LA-ispPAC-POWR1014/A Automotive Family Data Sheet and verified. Table 5-11 lists the instructions supported by the LA-ispPAC-POWR1014/A JTAG Test Access Port (TAP) controller: Table 5-11. LA-ispPAC-POWR1014/A TAP Instruction Table Instruction Command Code Comments BULK_ERASE 0000 0011 Bulk erase device BYPASS 1111 1111 Bypass - connect TDO to TDI DISCHARGE 0001 0100 Fast VPP discharge ERASE_DONE_BIT 0010 0100 Erases ‘Done’ bit only EXTEST 0000 0000 Bypass - connect TDO to TDI IDCODE 0001 0110 Read contents of manufacturer ID code (32 bits) OUTPUTS_HIGHZ 0001 1000 Force all outputs to High-Z state, FET outputs pulled low SAMPLE/PRELOAD 00011100 Sample/Preload. Default to bypass. PROGRAM_DISABLE 0001 1110 Disable program mode PROGRAM_DONE_BIT 0010 1111 Programs the Done bit PROGRAM_ENABLE 0001 0101 Enable program mode PROGRAM_SECURITY 0000 1001 Program security fuse RESET 0010 0010 Resets device (refer to the RESETb Signal, RESET Command via JTAG or I2C section of this data sheet) IN1_RESET_JTAG_BIT 0001 0010 Reset the JTAG bit associated with IN1 pin to 0 IN1_SET_JTAG_BIT 0001 0011 Set the JTAG bit associated with IN1 pin to 1 CFG_ADDRESS 0010 1011 Select non-PLD address register CFG_DATA_SHIFT 0010 1101 Non-PLD data shift CFG_ERASE 0010 1001 ERASE Just the Non PLD configuration CFG_PROGRAM 0010 1110 Non-PLD program CFG_VERIFY 0010 1000 VRIFY non-PLD fusemap data PLD_ADDRESS_SHIFT 0000 0001 PLD_Address register (109 bits) PLD_DATA_SHIFT 0000 0010 PLD_Data register (123 Bits) PLD_INIT_ADDR_FOR_PROG_INCR 0010 0001 Initialize the address register for auto increment PLD_PROG_INCR 0010 0111 Program column register to E2 and auto increment address register PLD_PROGRAM 0000 0111 Program PLD data register to E2 PLD_VERIFY 0000 1010 Verifies PLD column data PLD_VERIFY_INCR 0010 1010 Load column register from E2 and auto increment address register UES_PROGRAM 0001 1010 Program UES bits into E2 UES_READ 0001 0111 Read contents of UES register from E2 (32 bits) BYPASS is one of the three required instructions. It selects the Bypass Register to be connected between TDI and TDO and allows serial data to be transferred through the device without affecting the operation of the LA-ispPACPOWR1014/A. The IEEE 1149.1 standard defines the bit code of this instruction to be all ones (11111111). The required SAMPLE/PRELOAD instruction dictates the Boundary-Scan Register be connected between TDI and TDO. The LA-ispPAC-POWR1014/A has no boundary scan register, so for compatibility it defaults to the BYPASS mode whenever this instruction is received. The bit code for this instruction is defined by Lattice as shown in Table 5-11. The EXTEST (external test) instruction is required and would normally place the device into an external boundary test mode while also enabling the boundary scan register to be connected between TDI and TDO. Again, since the 5-38 Lattice Semiconductor LA-ispPAC-POWR1014/A Automotive Family Data Sheet LA-ispPAC-POWR1014/A has no boundary scan logic, the device is put in the BYPASS mode to ensure specification compatibility. The bit code of this instruction is defined by the 1149.1 standard to be all zeros (00000000). The optional IDCODE (identification code) instruction is incorporated in the LA-ispPAC-POWR1014/A and leaves it in its functional mode when executed. It selects the Device Identification Register to be connected between TDI and TDO. The Identification Register is a 32-bit shift register containing information regarding the IC manufacturer, device type and version code (Figure 5-32). Access to the Identification Register is immediately available, via a TAP data scan operation, after power-up of the device, or by issuing a Test-Logic-Reset instruction. The bit code for this instruction is defined by Lattice as shown in Table 5-11. Figure 5-32. LA-ispPAC-POWR1014/A ID Code MSB LSB 0001 0000 0001 0100 0101 / 0000 0100 001 / 1 (LA-ispPAC-POWR1014) 0000 0000 0001 0100 0101 / 0000 0100 001 / 1 (LA-ispPAC-POWR1014A) Part Number (20 bits) 00145h = LA-ispPAC-POWR1014A 10145h = LA-ispPAC-POWR1014 JEDEC Manufacturer Identity Code for Lattice Semiconductor (11 bits) Constant 1 (1 bit) per 1149.1-1990 LA-ispPAC-POWR1014/A Specific Instructions There are 25 unique instructions specified by Lattice for the LA-ispPAC-POWR1014/A. These instructions are primarily used to interface to the various user registers and the E2CMOS non-volatile memory. Additional instructions are used to control or monitor other features of the device. A brief description of each unique instruction is provided in detail below, and the bit codes are found in Table 5-11. PLD_ADDRESS_SHIFT – This instruction is used to set the address of the PLD AND/ARCH arrays for subsequent program or read operations. This instruction also forces the outputs into the OUTPUTS_HIGHZ. PLD_DATA_SHIFT – This instruction is used to shift PLD data into the register prior to programming or reading. This instruction also forces the outputs into the OUTPUTS_HIGHZ. PLD_INIT_ADDR_FOR_PROG_INCR – This instruction prepares the PLD address register for subsequent PLD_PROG_INCR or PLD_VERIFY_INCR instructions. PLD_PROG_INCR – This instruction programs the PLD data register for the current address and increments the address register for the next set of data. PLD_PROGRAM – This instruction programs the selected PLD AND/ARCH array column. The specific column is preselected by using PLD_ADDRESS_SHIFT instruction. The programming occurs at the second rising edge of the TCK in Run-Test-Idle JTAG state. The device must already be in programming mode (PROGRAM_ENABLE instruction). This instruction also forces the outputs into the OUTPUTS_HIGHZ. PROGRAM_SECURITY – This instruction is used to program the electronic security fuse (ESF) bit. Programming the ESF bit protects proprietary designs from being read out. The programming occurs at the second rising edge of the TCK in Run-Test-Idle JTAG state. The device must already be in programming mode (PROGRAM_ENABLE instruction). This instruction also forces the outputs into the OUTPUTS_HIGHZ. PLD_VERIFY – This instruction is used to read the content of the selected PLD AND/ARCH array column. This specific column is preselected by using PLD_ADDRESS_SHIFT instruction. This instruction also forces the outputs into the OUTPUTS_HIGHZ. 5-39 Lattice Semiconductor LA-ispPAC-POWR1014/A Automotive Family Data Sheet DISCHARGE – This instruction is used to discharge the internal programming supply voltage after an erase or programming cycle and prepares LA-ispPAC-POWR1014/A for a read cycle. This instruction also forces the outputs into the OUTPUTS_HIGHZ. CFG_ADDRESS – This instruction is used to set the address of the CFG array for subsequent program or read operations. This instruction also forces the outputs into the OUTPUTS_HIGHZ. CFG_DATA_SHIFT – This instruction is used to shift data into the CFG register prior to programming or reading. This instruction also forces the outputs into the OUTPUTS_HIGHZ. CFG_ERASE – This instruction will bulk erase the CFG array. The action occurs at the second rising edge of TCK in Run-Test-Idle JTAG state. The device must already be in programming mode (PROGRAM_ENABLE instruction). This instruction also forces the outputs into the OUTPUTS_HIGHZ. CFG_PROGRAM – This instruction programs the selected CFG array column. This specific column is preselected by using CFG_ADDRESS instruction. The programming occurs at the second rising edge of the TCK in Run-TestIdle JTAG state. The device must already be in programming mode (PROGRAM_ENABLE instruction). This instruction also forces the outputs into the OUTPUTS_HIGHZ. CFG_VERIFY – This instruction is used to read the content of the selected CFG array column. This specific column is preselected by using CFG_ADDRESS instruction. This instruction also forces the outputs into the OUTPUTS_HIGHZ. BULK_ERASE – This instruction will bulk erase all E2CMOS bits (CFG, PLD, UES, and ESF) in the LA-ispPACPOWR1014/A. The device must already be in programming mode (PROGRAM_ENABLE instruction). This instruction also forces the outputs into the OUTPUTS_HIGHZ. OUTPUTS_HIGHZ – This instruction turns off all of the open-drain output transistors. Pins that are programmed as FET drivers will be placed in the active low state. This instruction is effective after Update-Instruction-Register JTAG state. PROGRAM_ENABLE – This instruction enables the programming mode of the LA-ispPAC-POWR1014/A. This instruction also forces the outputs into the OUTPUTS_HIGHZ. IDCODE – This instruction connects the output of the Identification Code Data Shift (IDCODE) Register to TDO (Figure 5-33), to support reading out the identification code. Figure 5-33. IDCODE Register TDO Bit 31 Bit 30 Bit 29 Bit 28 Bit 27 Bit 4 Bit 3 Bit 2 Bit 1 Bit 0 PROGRAM_DISABLE – This instruction disables the programming mode of the LA-ispPAC-POWR1014/A. The Test-Logic-Reset JTAG state can also be used to cancel the programming mode of the LA-ispPAC-POWR1014/A. UES_READ – This instruction both reads the E2CMOS bits into the UES register and places the UES register between the TDI and TDO pins (as shown in Figure 5-30), to support programming or reading of the user electronic signature bits. Figure 5-34. UES Register TDO Bit 15 Bit 14 Bit 13 Bit 12 Bit 11 Bit 10 Bit 9 Bit 8 Bit 7 5-40 Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1 Bit 0 Lattice Semiconductor LA-ispPAC-POWR1014/A Automotive Family Data Sheet UES_PROGRAM – This instruction will program the content of the UES Register into the UES E2CMOS memory. The device must already be in programming mode (PROGRAM_ENABLE instruction). This instruction also forces the outputs into the OUTPUTS_HIGHZ. ERASE_DONE_BIT – This instruction clears the ‘Done’ bit, which prevents the LA-ispPAC-POWR1014/A sequence from starting. PROGRAM_DONE_BIT – This instruction sets the ‘Done’ bit, which enables the LA-ispPAC-POWR1014/A sequence to start. RESET – This instruction resets the PLD sequence and output macrocells. IN1_RESET_JTAG_BIT – This instruction clears the JTAG Register logic input ‘IN1.’ The PLD input has to be configured to take input from the JTAG Register in order for this command to have effect on the sequence. IN1_SET_JTAG_BIT – This instruction sets the JTAG Register logic input ‘IN1.’ The PLD input has to be configured to take input from the JTAG Register in order for this command to have effect on the sequence. PLD_VERIFY_INCR – This instruction reads out the PLD data register for the current address and increments the address register for the next read. Notes: In all of the descriptions above, OUTPUTS_HIGHZ refers both to the instruction and the state of the digital output pins, in which the open-drains are tri-stated and the FET drivers are pulled low. Before any of the above programming instructions are executed, the respective E2CMOS bits need to be erased using the corresponding erase instruction. 5-41 Lattice Semiconductor LA-ispPAC-POWR1014/A Automotive Family Data Sheet Package Diagrams 48-Pin TQFP (Dimensions in Millimeters) PIN 1 INDICATOR 0.20 H A-B D 0.20 C A-B D D1 D N 3. A 1 E1 E B e D 8. 4X 3. 3. SEE DETAIL "A" H b 0.08 C A SEATING PLANE GAUGE PLANE 0.25 A2 B M C A -B D 0.08 C LEAD FINISH A1 B 0.20 MIN. 0-7∞ b L 1.00 REF. c c1 b DETAIL "A" 1 BASE METAL SECTION B - B NOTES: 1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5 - 1982. 2. ALL DIMENSIONS ARE IN MILLIMETERS. 3. DATUMS A, B AND D TO BE DETERMINED AT DATUM PLANE H. 4. DIMENSIONS D1 AND E1 DO NOT INCLUDE MOLD PROTRUSION. ALLOWABLE MOLD PROTRUSION IS 0.254 MM ON D1 AND E1 DIMENSIONS. 7. 8. MIN. NOM. MAX. A - - 1.60 A1 0.05 - 0.15 A2 1.35 1.40 1.45 D 9.00 BSC D1 7.00 BSC E 9.00 BSC E1 L 5. THE TOP OF PACKAGE MAY BE SMALLER THAN THE BOTTOM OF THE PACKAGE BY 0.15 MM. 6. SYMBOL SECTION B-B: THESE DIMENSIONS APPLY TO THE FLAT SECTION OF THE LEAD BETWEEN 0.10 AND 0.25 MM FROM THE LEAD TIP. A1 IS DEFINED AS THE DISTANCE FROM THE SEATING PLANE TO THE LOWEST POINT ON THE PACKAGE BODY. EXACT SHAPE OF EACH CORNER IS OPTIONAL. 5-42 7.00 BSC 0.45 0.60 N 48 e 0.50 BSC 0.22 0.75 b 0.17 0.27 b1 0.17 0.20 0.23 c 0.09 0.15 0.20 c1 0.09 0.13 0.16 Lattice Semiconductor LA-ispPAC-POWR1014/A Automotive Family Data Sheet Part Number Description LA-ispPAC-POWR1014X - 01TN48E Device Family Operating Temperature Range E = Automotive (-40oC to +105oC TA) Device Number Package TN = Lead-Free 48-pin TQFP ADC Support A = ADC present Performance Grade 01 = Standard LA-ispPAC-POWR1014/A Ordering Information Lead-Free Packaging Part Number Package Pins LA-ispPAC-POWR1014A-01TN48E Lead-Free TQFP 48 LA-ispPAC-POWR1014-01TN48E Lead-Free TQFP 48 SDA VMON10 37 SCL RESETB VCCD PLDCLK 41 40 39 38 MCLK IN1 IN3 47 46 45 VCCINP IN4 48 44 43 42 5-43 24 VCCPROG VCCD TCK TDO 20 21 22 23 OUT4 VMON3 VCCJ OUT5 27 26 25 10 11 12 TDISEL OUT6 GNDA 7 8 9 TDI OUT7 30 29 28 LA-ispPAC-POWR1014A 48-Pin TQFP 17 18 19 OUT8 VMON6 ATDI GNDD 33 32 31 TMS OUT9 4 5 6 HVOUT1 OUT10 VMON9 14 15 16 OUT11 36 35 34 13 OUT12 1 2 3 HVOUT2 OUT13 SMBA_OUT3 OUT14 IN2 Package Options VMON8 VMON7 VMON5 GNDD VCCA VMON4 VMON2 VMON1 Lattice Semiconductor LA-ispPAC-POWR1014/A Automotive Family Data Sheet VMON8 VMON7 VMON5 GNDD VCCA VMON4 VMON2 GNDD VMON10 GNDD IN1 RESETB VCCINP 44 43 42 VCCD IN2 45 PLDCLK IN3 47 46 MCLK IN4 48 37 24 VMON1 VCCPROG VCCD TCK TDO 20 21 22 23 OUT4 VMON3 VCCJ OUT5 27 26 25 10 11 12 TDISEL OUT6 GNDA 7 8 9 TDI OUT7 30 29 28 LA-ispPAC-POWR1014 48-Pin TQFP 17 18 19 OUT8 VMON6 ATDI GNDD 33 32 31 TMS OUT9 4 5 6 HVOUT1 OUT10 VMON9 14 15 16 OUT11 36 35 34 13 OUT12 1 2 3 HVOUT2 OUT13 SMBA_OUT3 OUT14 41 40 39 38 Package Options (Cont.) Automotive Disclaimer Products are not designed, intended or warranted to be fail-safe and are not designed, intended or warranted for use in applications related to the deployment of airbags. Further, products are not intended to be used, designed or warranted for use in applications that affect the control of the vehicle unless there is a fail-safe or redundancy feature and also a warning signal to the operator of the vehicle upon failure. Use of products in such applications is fully at the risk of the customer, subject to applicable laws and regulations governing limitations on product liability. Technical Support Assistance Hotline: 1-800-LATTICE (North America) +1-503-268-8001 (Outside North America) e-mail: [email protected] Internet: www.latticesemi.com 5-44 Lattice Semiconductor LA-ispPAC-POWR1014/A Automotive Family Data Sheet Revision History Date Version January 2008 01.0 June 2008 01.1 Change Summary Initial release. Added timing diagram and timing parameters to "Power-On Reset" specifications. Modified PLD Architecture figure to show input registers. Updated I2C Control Registers table. VCCPROG pin usage clarification added. Added automotive disclaimer text section. 5-45