ONSEMI MC74HCT374A

MC74HCT374A
Octal 3−State Noninverting
D Flip−Flop with
LSTTL−Compatible Inputs
High−Performance Silicon−Gate CMOS
http://onsemi.com
The MC74HCT374A may be used as a level converter for
interfacing TTL or NMOS outputs to High−Speed CMOS inputs.
The HCT374A is identical in pinout to the LS374.
Data meeting the setup and hold time is clocked to the outputs with
the rising edge of Clock. The Output Enable does not affect the state of
the flip−flops, but when Output Enable is high, the outputs are forced
to the high−impedance state. Thus, data may be stored even when the
outputs are not enabled.
The HCT374A is identical in function to the HCT574A, which has
the input pins on the opposite side of the package from the output pins.
This device is similar in function to the HCT534A, which has
inverting outputs.
MARKING
DIAGRAMS
PDIP−20
N SUFFIX
CASE 738
20
1
•
MC74HCT374AN
AWLYYWWG
1
20
SOICW−20
DW SUFFIX
CASE 751D
20
HCT374A
AWLYYWWG
1
Features
•
•
•
•
•
•
•
•
20
Output Drive Capability: 15 LSTTL Loads
TTL/NMOS−Compatible Input Levels
Outputs Directly Interface to CMOS, NMOS, and TTL
Operating Voltage Range: 4.5 to 5.5 V
Low Input Current: 1.0 mA
In Compliance With the JEDEC Standard No. 7.0 A Requirements
Chip Complexity: 276 FETs or 69 Equivalent Gates
Improvements over HCT374
— Improved Propagation Delays
— 50% Lower Quiescent Power
— Improved Input Noise and Latchup Immunity
Pb−Free Packages are Available*
1
20
20
1
TSSOP−20
DT SUFFIX
CASE 948E
HCT
374A
ALYWG
G
1
20
SOEIAJ−20
F SUFFIX
CASE 967
20
1
74HCT374A
AWLYYWWG
1
A
= Assembly Location
L, WL
= Wafer Lot
Y, YY
= Year
W, WW = Work Week
G
= Pb−Free Package
G
= Pb−Free Package
(Note: Microdot may be in either location)
ORDERING INFORMATION
See detailed ordering and shipping information in the package
dimensions section on page 2 of this data sheet.
*For additional information on our Pb−Free strategy and soldering details, please
download the ON Semiconductor Soldering and Mounting Techniques
Reference Manual, SOLDERRM/D.
© Semiconductor Components Industries, LLC, 2005
June, 2005 − Rev. 10
1
Publication Order Number:
MC74HCT374A/D
MC74HCT374A
PIN ASSIGNMENT
OUTPUT
ENABLE
Q0
LOGIC DIAGRAM
D0
D1
D2
DATA
INPUTS
D3
D4
D5
D6
D7
CLOCK
OUTPUT ENABLE
3
2
4
5
7
6
8
9
13
12
14
15
17
16
18
19
20
VCC
2
19
Q7
D0
3
18
D7
D1
4
17
D6
Q0
Q1
5
16
Q6
Q1
Q2
6
15
Q5
Q2
D2
7
14
D5
D3
8
13
D4
Q3
9
12
Q4
10
11
CLOCK
Q3
NONINVERTING
OUTPUTS
Q4
Q5
GND
Q6
Q7
FUNCTION TABLE
11
1
1
Inputs
Output
Enable
PIN 20 = VCC
PIN 10 = GND
L
L
L
H
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Value
Units
Internal Gate Count*
Design Criteria
69
ea.
Internal Gate Propagation Delay
1.5
ns
Internal Gate Power Dissipation
5.0
mW
.0075
pJ
Speed Power Product
Output
Clock
D
Q
L,H,
X
H
L
X
X
H
L
No Change
Z
X = don’t care
Z = high impedance
*Equivalent to a two−input NAND gate.
ORDERING INFORMATION
Package
Shipping †
MC74HCT374AN
PDIP−20
1440 Units / Box
MC74HCT374ANG
PDIP−20
(Pb−Free)
1440 Units / Box
MC74HCT374ADW
SOIC−20
38 Units / Rail
MC74HCT374ADWG
SOIC−20
(Pb−Free)
38 Units / Rail
MC74HCT374ADWR2
SOIC−20
1000 Units / Reel
MC74HCT374ADWR2G
SOIC−20
(Pb−Free)
1000 Units / Reel
MC74HCT374ADTR2
TSSOP−20*
2500 Units / Reel
MC74HCT374ADTR2G
TSSOP−20*
2500 Units / Reel
MC74HCT374AFEL
SOEIAJ−20
2000 Units / Reel
MC74HCT374AFELG
SOEIAJ−20
(Pb−Free)
2000 Units / Reel
Device
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging
Specifications Brochure, BRD8011/D.
*This package is inherently Pb−Free.
http://onsemi.com
2
MC74HCT374A
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MAXIMUM RATINGS
Symbol
Parameter
Value
Unit
– 0.5 to + 7.0
V
V
VCC
DC Supply Voltage (Referenced to GND)
Vin
DC Input Voltage (Referenced to GND)
– 0.5 to VCC + 0.5
Vout
DC Output Voltage (Referenced to GND)
– 0.5 to VCC + 0.5
V
Iin
DC Input Current, per Pin
± 20
mA
Iout
DC Output Current, per Pin
± 35
mA
ICC
DC Supply Current, VCC and GND Pins
± 75
mA
PD
Power Dissipation in Still Air,
750
500
450
mW
Tstg
Storage Temperature
– 65 to + 150
_C
TL
Lead Temperature, 1 mm from Case for 10 Seconds
(Plastic DIP, SOIC, SSOP or TSSOP Package)
Plastic DIP†
SOIC Package†
TSSOP Package†
This device contains protection
circuitry to guard against damage
due to high static voltages or electric
fields. However, precautions must
be taken to avoid applications of any
voltage higher than maximum rated
voltages to this high−impedance circuit. For proper operation, Vin and
Vout should be constrained to the
range GND v (Vin or Vout) v VCC.
Unused inputs must always be
tied to an appropriate logic voltage
level (e.g., either GND or VCC).
Unused outputs must be left open.
_C
260
Maximum ratings are those values beyond which device damage can occur. Maximum ratings
applied to the device are individual stress limit values (not normal operating conditions) and are
not valid simultaneously. If these limits are exceeded, device functional operation is not implied,
damage may occur and reliability may be affected.
†Derating — Plastic DIP: – 10 mW/_C from 65_ to 125_C
SOIC Package: – 7 mW/_C from 65_ to 125_C
TSSOP Package: − 6.1 mW/_C from 65_ to 125_C
For high frequency or heavy load considerations, see Chapter 2 of the ON Semiconductor High−Speed CMOS Data Book (DL129/D).
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RECOMMENDED OPERATING CONDITIONS
Symbol
VCC
Vin, Vout
Parameter
DC Supply Voltage (Referenced to GND)
Min
Max
Unit
4.5
5.5
V
DC Input Voltage, Output Voltage (Referenced to GND)
TA
Operating Temperature, All Package Types
tr, tf
Input Rise and Fall Time (Figure 1)
0
VCC
V
– 55
+ 125
_C
0
500
ns
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DC ELECTRICAL CHARACTERISTICS (Voltages Referenced to GND)
Guaranteed Limit
VCC
V
– 55 to
25_C
v 85_C
v 125_C
Unit
VIH
Minimum High−Level Input Voltage
Vout = 0.1 V or VCC – 0.1 V
|Iout| v 20 mA
4.5
5.5
2.0
2.0
2.0
2.0
2.0
2.0
V
VIL
Maximum Low−Level Input Voltage
Vout = 0.1 V or VCC – 0.1 V
|Iout| v 20 mA
4.5
5.5
0.8
0.8
0.8
0.8
0.8
0.8
V
VOH
Minimum High−Level Output Voltage
Vin = VIH or VIL
|Iout| v 20 mA
4.5
5.5
4.4
5.4
4.4
5.4
4.4
5.4
V
Vin = VIH or VIL
|Iout| v 6.0 mA
4.5
3.98
3.84
3.7
Vin = VIH or VIL
|Iout| v 20 mA
4.5
5.5
0.1
0.1
0.1
0.1
0.1
0.1
Vin = VIH or VIL
|Iout| v 6.0 mA
Symbol
VOL
Parameter
Maximum Low−Level Output Voltage
Test Conditions
V
4.5
0.26
0.33
0.4
Iin
Maximum Input Leakage Current
Vin = VCC or GND
5.5
± 0.1
± 1.0
± 1.0
mA
IOZ
Maximum Three−State Leakage
Current
Output in High−Impedance State
Vin = VIL or VIH
Vout = VCC or GND
5.5
± 0.5
± 5.0
± 10
mA
ICC
Maximum Quiescent Supply Current
(per Package)
Vin = VCC or GND
Iout = 0 mA
5.5
4.0
40
160
mA
DICC
Additional Quiescent Supply Current
Vin = 2.4 V, Any One Input
Vin = VCC or GND, Other Inputs
lout = 0 mA
≥ −55_C
25_C to 125_C
2.9
2.4
5.5
mA
1. Total Supply Current = ICC + ΣDICC.
Information on typical parametric values can be found in Chapter 2 of the ON Semiconductor High−Speed CMOS Data Book (DL129/D)
http://onsemi.com
3
MC74HCT374A
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AC ELECTRICAL CHARACTERISTICS (VCC = 5.0 V ± 10%, CL = 50 pF, Input tr = tf = 6.0 ns)
Guaranteed Limit
Symbol
Parameter
– 55 to 25_C
v 85_C
v 125_C
Unit
fmax
Maximum Clock Frequency (50% Duty Cycle)
(Figures 1 and 4)
30
24
20
MHz
tPLH,
tPHL
Maximum Propagation Delay, Clock to Q
(Figures 1 and 4)
31
39
47
ns
tPLZ,
tPHZ
Maximum Propagation Delay, Output Enable to Q
(Figures 2 and 5)
30
38
45
ns
tPZL,
tPZH
Maximum Propagation Delay, Output Enable to Q
(Figures 2 and 5)
30
38
45
ns
tTLH,
tTHL
Maximum Output Transition Time, Any Output
(Figures 1 and 4)
12
15
18
ns
Cin
Maximum Input Capacitance
10
10
10
pF
Cout
Maximum Three−State Output Capacitance
(Output in High−Impedance State)
15
15
15
pF
For propagation delays with loads other than 50 pF, and information on typical parametric values, see Chapter 2 of the ON
Semiconductor High−Speed CMOS Data Book (DL129/D)
Typical @ 25°C, VCC = 5.0 V
CPD
Power Dissipation Capacitance (Per Flip−Flop)*
65
pF
* Used to determine the no−load dynamic power consumption: PD = CPD VCC2 f + ICC VCC . For load considerations, see Chapter 2 of the
ON Semiconductor High−Speed CMOS Data Book (DL129/D).
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TIMING REQUIREMENTS (VCC = 5.0 V ± 10%, Input tr = tf = 6.0 ns)
Guaranteed Limit
Symbol
Parameter
– 55 to 25_C
v 85_C
v 125_C
Unit
tsu
Minimum Setup Time, Data to Clock
(Figure 3)
12
15
18
ns
th
Minimum Hold Time, Clock to Data
(Figure 3)
5.0
5.0
5.0
ns
tw
Minimum Pulse Width, Clock
(Figure 1)
12
15
18
ns
Maximum Input Rise and Fall Times
(Figure 1)
500
500
500
ns
tr, tf
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4
MC74HCT374A
SWITCHING WAVEFORMS
tr
CLOCK
tf
GND
tPLZ
tPZL
Q
HIGH
IMPEDANCE
1.3 V
tPHL
tPLH
90%
1.3 V
10%
1.3 V
GND
1/fmax
Q
3V
OUTPUT
ENABLE
VCC
2.7 V
1.3 V
0.3 V
tw
tPZH
Q
10%
VOL
90%
VOH
tPHZ
1.3 V
HIGH
IMPEDANCE
tTHL
tTLH
Figure 1.
Figure 2.
VALID
DATA
3V
1.3 V
tsu
GND
th
3V
CLOCK
1.3 V
GND
Figure 3.
TEST CIRCUITS
TEST POINT
TEST POINT
OUTPUT
DEVICE
UNDER
TEST
DEVICE
UNDER
TEST
C L*
CONNECT TO VCC WHEN
TESTING tPLZ AND tPZL
CONNECT TO GND WHEN
TESTING tPHZ AND tPZH
1 kW
OUTPUT
C L*
*Includes all probe and jig capacitance
*Includes all probe and jig capacitance
Figure 4.
Figure 5.
EXPANDED LOGIC DIAGRAM
D0
3
D1
4
D
Q
D
C
CLOCK
D2
7
Q
D3
8
D
C
Q
D4
13
D
C
Q
D5
14
D
C
Q
D6
17
D
C
Q
D7
18
D
C
Q
D
C
Q
C
11
OUTPUT 1
ENABLE
2
Q0
5
Q1
6
Q2
9
Q3
http://onsemi.com
5
12
Q4
15
Q5
16
Q6
19
Q7
MC74HCT374A
PACKAGE DIMENSIONS
PDIP−20
N SUFFIX
CASE 738−03
ISSUE E
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
2. CONTROLLING DIMENSION: INCH.
3. DIMENSION L TO CENTER OF LEAD WHEN
FORMED PARALLEL.
4. DIMENSION B DOES NOT INCLUDE MOLD
FLASH.
−A−
20
11
1
10
B
C
−T−
K
SEATING
PLANE
M
N
E
G
F
J
D
20 PL
0.25 (0.010)
20 PL
0.25 (0.010)
M
T A
M
T B
M
DIM
A
B
C
D
E
F
G
J
K
L
M
N
INCHES
MIN
MAX
1.010
1.070
0.240
0.260
0.150
0.180
0.015
0.022
0.050 BSC
0.050
0.070
0.100 BSC
0.008
0.015
0.110
0.140
0.300 BSC
0_
15 _
0.020
0.040
MILLIMETERS
MIN
MAX
25.66
27.17
6.10
6.60
3.81
4.57
0.39
0.55
1.27 BSC
1.27
1.77
2.54 BSC
0.21
0.38
2.80
3.55
7.62 BSC
0_
15_
0.51
1.01
M
SOICW−20
DW SUFFIX
CASE 751D−05
ISSUE G
20
11
X 45 _
h
1
10
20X
B
B
0.25
M
T A
S
B
S
A
L
H
M
E
0.25
10X
NOTES:
1. DIMENSIONS ARE IN MILLIMETERS.
2. INTERPRET DIMENSIONS AND TOLERANCES
PER ASME Y14.5M, 1994.
3. DIMENSIONS D AND E DO NOT INCLUDE MOLD
PROTRUSION.
4. MAXIMUM MOLD PROTRUSION 0.15 PER SIDE.
5. DIMENSION B DOES NOT INCLUDE DAMBAR
PROTRUSION. ALLOWABLE PROTRUSION
SHALL BE 0.13 TOTAL IN EXCESS OF B
DIMENSION AT MAXIMUM MATERIAL
CONDITION.
q
A
B
M
D
18X
e
A1
SEATING
PLANE
C
T
http://onsemi.com
6
DIM
A
A1
B
C
D
E
e
H
h
L
q
MILLIMETERS
MIN
MAX
2.35
2.65
0.10
0.25
0.35
0.49
0.23
0.32
12.65
12.95
7.40
7.60
1.27 BSC
10.05
10.55
0.25
0.75
0.50
0.90
0_
7_
MC74HCT374A
TSSOP−20
DT SUFFIX
CASE 948E−02
ISSUE B
20X
0.15 (0.006) T U
2X
K REF
0.10 (0.004)
S
L/2
20
M
T U
S
V
S
K
K1
ÍÍÍÍ
ÍÍÍÍ
ÍÍÍÍ
11
J J1
B
−U−
L
PIN 1
IDENT
SECTION N−N
1
10
0.25 (0.010)
N
0.15 (0.006) T U
S
M
A
−V−
NOTES:
1. DIMENSIONING AND TOLERANCING
PER ANSI Y14.5M, 1982.
2. CONTROLLING DIMENSION:
MILLIMETER.
3. DIMENSION A DOES NOT INCLUDE
MOLD FLASH, PROTRUSIONS OR GATE
BURRS. MOLD FLASH OR GATE BURRS
SHALL NOT EXCEED 0.15 (0.006) PER
SIDE.
4. DIMENSION B DOES NOT INCLUDE
INTERLEAD FLASH OR PROTRUSION.
INTERLEAD FLASH OR PROTRUSION
SHALL NOT EXCEED 0.25 (0.010) PER
SIDE.
5. DIMENSION K DOES NOT INCLUDE
DAMBAR PROTRUSION. ALLOWABLE
DAMBAR PROTRUSION SHALL BE 0.08
(0.003) TOTAL IN EXCESS OF THE K
DIMENSION AT MAXIMUM MATERIAL
CONDITION.
6. TERMINAL NUMBERS ARE SHOWN
FOR REFERENCE ONLY.
7. DIMENSION A AND B ARE TO BE
DETERMINED AT DATUM PLANE −W−.
N
F
DETAIL E
−W−
C
D
G
H
DETAIL E
0.100 (0.004)
−T− SEATING
PLANE
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7
DIM
A
B
C
D
F
G
H
J
J1
K
K1
L
M
MILLIMETERS
MIN
MAX
6.40
6.60
4.30
4.50
−−−
1.20
0.05
0.15
0.50
0.75
0.65 BSC
0.27
0.37
0.09
0.20
0.09
0.16
0.19
0.30
0.19
0.25
6.40 BSC
0_
8_
INCHES
MIN
MAX
0.252
0.260
0.169
0.177
−−− 0.047
0.002
0.006
0.020
0.030
0.026 BSC
0.011
0.015
0.004
0.008
0.004
0.006
0.007
0.012
0.007
0.010
0.252 BSC
0_
8_
MC74HCT374A
PACKAGE DIMENSIONS
SOEIAJ−20
M SUFFIX
CASE 967−01
ISSUE O
20
LE
11
Q1
E HE
1
M_
L
10
DETAIL P
Z
D
VIEW P
e
A
c
DIM
A
A1
b
c
D
E
e
HE
L
LE
M
Q1
Z
A1
b
0.13 (0.005)
M
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
2. CONTROLLING DIMENSION: MILLIMETER.
3. DIMENSIONS D AND E DO NOT INCLUDE MOLD
FLASH OR PROTRUSIONS AND ARE MEASURED
AT THE PARTING LINE. MOLD FLASH OR
PROTRUSIONS SHALL NOT EXCEED 0.15 (0.006)
PER SIDE.
4. TERMINAL NUMBERS ARE SHOWN FOR
REFERENCE ONLY.
5. THE LEAD WIDTH DIMENSION (b) DOES NOT
INCLUDE DAMBAR PROTRUSION. ALLOWABLE
DAMBAR PROTRUSION SHALL BE 0.08 (0.003)
TOTAL IN EXCESS OF THE LEAD WIDTH
DIMENSION AT MAXIMUM MATERIAL CONDITION.
DAMBAR CANNOT BE LOCATED ON THE LOWER
RADIUS OR THE FOOT. MINIMUM SPACE
BETWEEN PROTRUSIONS AND ADJACENT LEAD
TO BE 0.46 ( 0.018).
0.10 (0.004)
MILLIMETERS
MIN
MAX
−−−
2.05
0.05
0.20
0.35
0.50
0.18
0.27
12.35
12.80
5.10
5.45
1.27 BSC
7.40
8.20
0.50
0.85
1.10
1.50
10 _
0_
0.70
0.90
−−−
0.81
INCHES
MIN
MAX
−−− 0.081
0.002
0.008
0.014
0.020
0.007
0.011
0.486
0.504
0.201
0.215
0.050 BSC
0.291
0.323
0.020
0.033
0.043
0.059
0_
10 _
0.028
0.035
−−− 0.032
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MC74HCT374A/D