CD54ACT74, CD74ACT74 DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH CLEAR AND PRESET SCHS321 – DECEMBER 2002 D D D D D D CD54ACT74 . . . F PACKAGE CD74ACT74 . . . E OR M PACKAGE (TOP VIEW) Inputs Are TTL-Voltage Compatible Speed of Bipolar F, AS, and S, With Significantly Reduced Power Consumption Balanced Propagation Delays ±24-mA Output Drive Current – Fanout to 15 F Devices SCR-Latchup-Resistant CMOS Process and Circuit Design Exceeds 2-kV ESD Protection Per MIL-STD-883, Method 3015 1CLR 1D 1CLK 1PRE 1Q 1Q GND 1 14 2 13 3 12 4 11 5 10 6 9 7 8 VCC 2CLR 2D 2CLK 2PRE 2Q 2Q description/ordering information The ’ACT74 dual positive-edge-triggered devices are D-type flip-flops. A low level at the preset (PRE) or clear (CLR) inputs sets or resets the outputs, regardless of the levels of the other inputs. When PRE and CLR are inactive (high), data at the data (D) input meeting the setup time requirements is transferred to the outputs on the positive-going edge of the clock pulse. Clock triggering occurs at a voltage level and is not related directly to the rise time of the clock pulse. Following the hold-time interval, data at the D input can be changed without affecting the levels at the outputs. ORDERING INFORMATION PDIP – E 55°C to 125°C –55°C ORDERABLE PART NUMBER PACKAGE† TA SOIC – M Tube CD74ACT74E Tube CD74ACT74M Tape and reel CD74ACT74M96 TOP-SIDE MARKING CD74ACT74E ACT74M CDIP – F Tube CD54ACT74F3A CD54ACT74F3A † Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at www.ti.com/sc/package. FUNCTION TABLE (each flip-flop) INPUTS OUTPUTS PRE CLR CLK D Q Q L H X X H L H L X X L H L L X X H† H† H H ↑ H H L H H ↑ L L H H H L X Q0 Q0 † This configuration is nonstable; that is, it does not persist when PRE or CLR returns to its inactive (high) level. Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. Copyright 2002, Texas Instruments Incorporated PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. On products compliant to MIL-PRF-38535, all parameters are tested unless otherwise noted. On all other products, production processing does not necessarily include testing of all parameters. POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 1 CD54ACT74, CD74ACT74 DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH CLEAR AND PRESET SCHS321 – DECEMBER 2002 logic diagram, each flip-flop (positive logic) PRE CLK C C C Q TG C C C C D TG TG TG C C C Q CLR absolute maximum ratings over operating free-air temperature range (unless otherwise noted)† Supply voltage range, VCC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . – 0.5 V to 6 V Input clamp current, IIK (VI < 0 or VI > VCC) (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±20 mA Output clamp current, IOK (VO < 0 or VO > VCC) (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±50 mA Continuous output current, IO (VO = 0 to VCC) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±50 mA Continuous current through VCC or GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±100 mA Package thermal impedance, θJA (see Note 2): E package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 80°C/W M package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 86°C/W Storage temperature range, Tstg . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . – 65°C to 150°C † Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. NOTES: 1. The input and output voltage ratings may be exceeded if the input and output current ratings are observed. 2. The package thermal impedance is calculated in accordance with JESD 51-7. recommended operating conditions (see Note 3) TA = 25°C –40°C to 85°C UNIT MIN MAX MIN MAX MIN MAX 4.5 5.5 4.5 5.5 4.5 5.5 VCC VIH Supply voltage VIL VI Low-level input voltage Input voltage 0 VO IOH Output voltage 0 High-level output current –24 IOL ∆t/∆v Low-level output current Input transition rise or fall rate High-level input voltage –55°C to 125°C 2 2 0.8 2 V 0.8 V VCC VCC V –24 –24 mA 24 24 24 mA 10 10 10 ns/V VCC VCC 0.8 V 0 0 VCC VCC 0 0 V NOTE 3: All unused inputs of the device must be held at VCC or GND to ensure proper device operation. Refer to the TI application report, Implications of Slow or Floating CMOS Inputs, literature number SCBA004. 2 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 CD54ACT74, CD74ACT74 DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH CLEAR AND PRESET SCHS321 – DECEMBER 2002 electrical characteristics over recommended operating free-air temperature range (unless otherwise noted) PARAMETER TEST CONDITIONS MIN VOH VOL VI = VIH or VIL VI = VIH or VIL II ICC VI = VCC or GND VI = VCC or GND, DICC‡ VI = VCC – 2.1 V –55°C to 125°C TA = 25°C VCC MAX MIN –40°C to 85°C MAX MIN UNIT MAX IOH = –50 µA IOH = –24 mA 4.5 V 4.4 4.5 V 3.94 IOH = –50 mA† IOH = –75 mA† 5.5 V IOL = 50 µA IOL = 24 mA IOL = 50 mA† 4.5 V 0.1 0.1 0.1 4.5 V 0.36 0.5 0.44 IOL = 75 mA† 5.5 V 4.4 4.4 3.7 3.8 5.5 V 3.85 5.5 V IO = 0 V 3.85 1.65 V 1.65 5.5 V ±0.1 ±1 ±1 µA 5.5 V 4 80 40 µA 2.4 3 2.8 mA 4.5 V to 5.5 V Ci 10 10 10 pF † Test one output at a time, not exceeding 1-second duration. Measurement is made by forcing indicated current and measuring voltage to minimize power dissipation. Test verifies a minimum 50-Ω transmission-line drive capability at 85°C and 75-Ω transmission-line drive capability at 125°C. ‡ Additional quiescent supply current per input pin, TTL inputs high, 1 unit load ACT INPUT LOAD TABLE INPUT UNIT LOAD Data 0.53 PRE or CLR 0.58 CLK 1 Unit load is ∆ICC limit specified in electrical characteristics table (e.g., 2.4 mA at 25°C). timing requirements over recommended operating free-air temperature range, VCC = 5 V ± 0.5 V (unless otherwise noted) (see Figure 1) –55°C to 125°C MIN fclock Clock frequency tw Pulse duration tsu Setup time th trec Hold time Data after CLK↑ Recovery time, before CLK↑ CLR↑ or PRE↑ –40°C to 85°C MAX MIN 85 PRE or CLR low 97 MHz 5 4.4 CLK 5.7 5 Data 4 3.5 0 0 ns 2.7 2.4 ns PRE or CLR inactive POST OFFICE BOX 655303 UNIT MAX • DALLAS, TEXAS 75265 ns ns ns 3 CD54ACT74, CD74ACT74 DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH CLEAR AND PRESET SCHS321 – DECEMBER 2002 switching characteristics over recommended operating free-air temperature range, VCC = 5 V ± 0.5 V (unless otherwise noted) (see Figure 1) PARAMETER fmax tPLH tPHL tPLH tPHL FROM (INPUT) TO (OUTPUT) –55°C to 125°C MIN MAX 85 CLK Q or Q PRE or CLR Q or Q –40°C to 85°C MIN UNIT MAX 97 MHz 2.4 9.5 2.5 8.6 2.4 9.5 2.5 8.6 2.9 11.5 3 10.5 3.1 12.5 3.2 11.4 ns ns operating characteristics, VCC = 5 V, TA = 25°C PARAMETER Cpd 4 Power dissipation capacitance POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 TYP UNIT 55 pF CD54ACT74, CD74ACT74 DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH CLEAR AND PRESET SCHS321 – DECEMBER 2002 PARAMETER MEASUREMENT INFORMATION S1 R1 = 500 Ω From Output Under Test 2 × VCC Open GND CL = 50 pF (see Note A) R2 = 500 Ω TEST S1 tPLH/tPHL tPLZ/tPZL tPHZ/tPZH Open 2 × VCC GND tw 3V 1.5 V Input LOAD CIRCUIT 1.5 V 0V VOLTAGE WAVEFORMS PULSE DURATION CLR Input 3V Reference Input 3V 1.5 V 1.5 V 0V 0V trec Data Input 3V 1.5 V CLK th tsu 1.5 V 10% 90% 90% tr 0V VOLTAGE WAVEFORMS RECOVERY TIME 3V 1.5 V 10% 0 V tf VOLTAGE WAVEFORMS SETUP AND HOLD AND INPUT RISE AND FALL TIMES 3V Input 1.5 V 1.5 V 0V tPLH In-Phase Output 50% 10% 90% 90% tr 90% 1.5 V 1.5 V 0V tPHL tPHL Out-of-Phase Output 3V Output Control VOH 50% VCC 10% VOL tf tPLH 50% VCC 10% tf 50% 10% 90% VOH VOL tr VOLTAGE WAVEFORMS PROPAGATION DELAY AND OUTPUT TRANSITION TIMES Output Waveform 1 S1 at 2 × VCC (see Note B) tPLZ tPZL 20% VCC tPHZ tPZH Output Waveform 2 S1 at GND (see Note B) ≈VCC 20% VCC VOL 80% VCC VOH 80% VCC ≈0 V VOLTAGE WAVEFORMS OUTPUT ENABLE AND DISABLE TIMES NOTES: A. CL includes probe and test-fixture capacitance. B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control. Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control. C. All input pulses are supplied by generators having the following characteristics: PRR ≤ 1 MHz, ZO = 50 Ω, tr = 3 ns, tf = 3 ns. Phase relationships between waveforms are arbitrary. D. For clock inputs, fmax is measured with the input duty cycle at 50%. E. The outputs are measured one at a time with one input transition per measurement. F. tPLH and tPHL are the same as tpd. G. tPZL and tPZH are the same as ten. H. tPLZ and tPHZ are the same as tdis. Figure 1. Load Circuit and Voltage Waveforms POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 5 PACKAGE OPTION ADDENDUM www.ti.com 8-Aug-2005 PACKAGING INFORMATION Orderable Device Status (1) Package Type CD54ACT74F3A ACTIVE CDIP J 14 1 TBD Call TI Level-NC-NC-NC CD74ACT74E ACTIVE PDIP N 14 25 Pb-Free (RoHS) CU NIPDAU Level-NC-NC-NC CD74ACT74M ACTIVE SOIC D 14 50 Green (RoHS & no Sb/Br) CU NIPDAU Level-1-260C-UNLIM CD74ACT74M96 ACTIVE SOIC D 14 2500 Green (RoHS & no Sb/Br) CU NIPDAU Level-1-260C-UNLIM CD74ACT74M96E4 ACTIVE SOIC D 14 2500 Green (RoHS & no Sb/Br) CU NIPDAU Level-1-260C-UNLIM CD74ACT74ME4 ACTIVE SOIC D 14 CU NIPDAU Level-1-260C-UNLIM Package Drawing Pins Package Eco Plan (2) Qty 50 Green (RoHS & no Sb/Br) Lead/Ball Finish MSL Peak Temp (3) (1) The marketing status values are defined as follows: ACTIVE: Product device recommended for new designs. LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect. NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design. PREVIEW: Device has been announced but is not in production. Samples may or may not be available. OBSOLETE: TI has discontinued the production of the device. (2) Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS) or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability information and additional product content details. TBD: The Pb-Free/Green conversion plan has not been defined. Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes. 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