HITACHI HM5212325FBPC

HM5212325FBPC-B60
128M LVTTL interface SDRAM
100 MHz
1-Mword × 32-bit × 4-bank
PC/100 SDRAM
ADE-203-1122C (Z)
Rev. 1.0
May. 12 , 2000
Description
The Hitachi HM5212325FBPC is a 128-Mbit SDRAM organized as 1048576-word × 32-bit × 4-bank. All
inputs and outputs are referred to the rising edge of the clock input. It is packaged in standard 90-bump fine
pitch BGA.
Features
•
•
•
•
•
•
•
•
•
•
•
•
Single chip wide bit solution (× 32)
3.3 V power supply
Clock frequency: 100 MHz (max)
LVTTL interface
Extremely small foot print: 0.8 mm pitch
 Package: FBGA (BP-90)
4 banks can operate simultaneously and independently
Burst read/write operation and burst read/single write operation capability
Programmable burst length: 4/8/full page
2 variations of burst sequence
 Sequential (BL = 4/8/full page)
 Interleave (BL = 4/8)
Programmable CAS latency: 2/3
Byte control by DQMB
Refresh cycles: 4096 refresh cycles/64 ms
HM5212325FBPC-B60
• 2 variations of refresh
 Auto refresh
 Self refresh
• Full page burst length capability
 Sequential burst
 Burst stop capability
Ordering Information
Type No.
Frequency
CAS latency
Package
HM5212325FBPC-B60*
100 MHz
3
10 mm × 13 mm 90 bump FBGA (BP-90)
Note: 66 MHz operation at CAS latency = 2.
2
HM5212325FBPC-B60
Pin Arrangement
90-bump FBGA
1
2
3
6
7
8
A
VSS
DQ15
VSS
VCC
DQ0
VCC
B
DQ14
DQ13
VCC
VSS
DQ2
DQ1
C
DQ12
DQ11
VSS
VCC
DQ4
DQ3
D
DQ10
DQ9
VCC
VSS
DQ6
DQ5
E
DQ8
NC
VSS
VCC
NC
DQ7
F
DQ
MB1
Open
NC
CAS
WE
DQ
MB0
G
NC
CKE
CLK
NC
CS
RAS
H
A11
A9
A8
A12
NC
NC
J
A5
A6
A7
A13
A10
A0
K
DQ
MB3
A3
A4
A1
A2
DQ
MB2
L
DQ31
NC
VSS
VCC
NC
DQ16
M
DQ29
DQ30
VCC
VSS
DQ17
DQ18
N
DQ27
DQ28
VSS
VCC
DQ19
DQ20
P
DQ25
DQ26
VCC
VSS
DQ21
DQ22
Q
VSS
DQ24
VSS
VCC
DQ23
VCC
(Top view)
3
HM5212325FBPC-B60
Pin Description
Pin name
Function
A0 to A13
Address input
Row address
A0 to A11
Column address
A0 to A7
Bank select address A12/A13 (BS)
DQ0 to DQ31
Data-input/output
CS
Chip select
RAS
Row address strobe command
CAS
Column address strobe command
WE
Write enable
DQMB0 to DQMB3
Byte data mask* 1
CLK
Clock input
CKE
Clock enable
VCC
Power supply
VSS
Ground
Open
Open* 2
Note:
4
1. DQMB0: DQ0 to DQ7
DQMB1: DQ8 to DQ15
DQMB2: DQ16 to DQ23
DQMB3: DQ24 to DQ31
2. Don’t connect. Internally connected with die.
HM5212325FBPC-B60
Block Diagram
A0 to A13
CS
RAS
CAS
WE
CLK
CKE
14
64-Mbit SDRAM
4M × 16
2
4
DQMB 0 to
DQMB 3
32
DQ 0 to DQ 31
16
64-Mbit SDRAM
4M × 16
2
16
Power-up Sequence and Initialization Sequence
Initialization sequence
Power up sequence
100 µs
VCC
200 µs
0V
CKE, DQMB
Low
CLK
Low
CS, DQ
Low
Power stabilize
5
HM5212325FBPC-B60
Absolute Maximum Ratings
Parameter
Symbol
Value
Unit
Note
Voltage on any pin relative to V SS
VT
–0.5 to VCC + 0.5
(≤ 4.6 (max))
V
1
Supply voltage relative to VSS
VCC
–0.5 to +4.6
V
1
Short circuit output current
Iout
50
mA
Operating temperature
Topr
0 to +70 (Tj max = 110)
°C
Storage temperature
Tstg
–55 to +125
°C
Note:
1. Respect to V SS .
DC Operating Conditions (Tcase = 0 to +70°C [Tj max = 110°C])
Parameter
Symbol
Min
Max
Unit
Notes
Supply voltage
VCC
3.0
3.6
V
1, 2
VSS
0
0
V
3
Input high voltage
VIH
2.0
VCC + 0.3
V
1, 4
Input low voltage
VIL
–0.3
0.8
V
1, 5
Notes: 1.
2.
3.
4.
5.
6
All voltage referred to VSS .
The supply voltage with all VCC pins must be on the same level.
The supply voltage with all VSS pins must be on the same level.
VIH (max) = VCC + 2.0 V for pulse width ≤ 3 ns at VCC.
VIL (min) = VSS – 2.0 V for pulse width ≤ 3 ns at VSS .
HM5212325FBPC-B60
DC Characteristics
(Tcase = 0 to +70°C [Tj max = 110°C]), VCC = 3.3 V ± 0.3 V, VSS = 0 V)
HM5212325F
-B60
Parameter
Symbol
Min
Max
Unit
Test conditions
Notes
Operating current
(CAS latency = 2)
—
100
mA
Burst length = 1
t RC = min
1, 2, 3
I CC1
(CAS latency = 3)
I CC1
—
110
mA
Standby current in power down
I CC2P
—
6
mA
CKE = VIL,
t CK = 12 ns
6
Standby current in power down
(input signal stable)
I CC2PS
—
4
mA
CKE = VIL, t CK = ∞
7
Standby current in non power
down
I CC2N
—
32
mA
CKE, CS = VIH,
t CK = 12 ns
4
Standby current in non power
down (input signal stable)
I CC2NS
—
18
mA
CKE = VIH, t CK = ∞
9
Active standby current in power
down
I CC3P
—
8
mA
CKE = VIL,
t CK = 12 ns
1, 2, 6
Active standby current in power
down (input signal stable)
I CC3PS
—
6
mA
CKE = VIL, t CK = ∞
2, 7
Active standby current in non
power down
I CC3N
—
40
mA
CKE, CS = VIH,
t CK = 12 ns
1, 2, 4
Active standby current in non
power down (input signal stable)
I CC3NS
—
30
mA
CKE = VIH, t CK = ∞
2, 9
I CC4
—
110
mA
t CK = min, BL = 4
1, 2, 5
I CC4
—
135
mA
Refresh current
I CC5
—
190
mA
t RC = min
3
Self refresh current
I CC6
—
2
mA
VIH ≥ VCC – 0.2 V
VIL ≤ 0.2 V
8
Self refresh current (L-version)
I CC6
—
0.8
mA
Input leakage current
I LI
–2
2
µA
0 ≤ Vin ≤ VCC
Output leakage current
I LO
–3
3
µA
0 ≤ Vout ≤ VCC
DQ = disable
Output high voltage
VOH
2.4
—
V
I OH = –4 mA
Output low voltage
VOL
—
0.4
V
I OL = 4 mA
Burst operating current
(CAS latency = 2)
(CAS latency = 3)
7
HM5212325FBPC-B60
Notes: 1. I CC depends on output load condition when the device is selected. ICC (max) is specified at the
output open condition.
2. One bank operation.
3. Input signals are changed once per one clock.
4. Input signals are changed once per two clocks.
5. Input signals are changed once per four clocks.
6. After power down mode, CLK operating current.
7. After power down mode, no CLK operating current.
8. After self refresh mode set, self refresh current.
9. Input signals are V IH or VIL fixed.
Capacitance (Ta = 25°C, VCC = 3.3 V ± 0.3 V)
Parameter
Symbol
Min
Max
Unit
Notes
Input capacitance (CLK)
CI1
4
8
pF
1, 2, 4
Input capacitance
(Input except DQM)
CI2
4
8
pF
1, 2, 4
Input capacitance (DQM)
CI3
2
5
pF
1, 2, 4
Output capacitance (DQ)
CO
2
5
pF
1, 2, 3, 4
Notes: 1.
2.
3.
4.
8
Capacitance measured with Boonton Meter or effective capacitance measuring method.
Measurement condition: f = 1 MHz, 1.4 V bias, 200 mV swing.
DQMB = VIH to disable Dout.
This parameter is sampled and not 100% tested.
HM5212325FBPC-B60
AC Characteristics
(Tcase = 0 to +70°C [Tj max = 110°C]), VCC = 3.3 V ± 0.3 V, VSS = 0 V)
HM5212325F
-B60
Parameter
HITACHI
Symbol
PC/100
Symbol
Min
Max
Unit
System clock cycle time
(CAS latency = 2)
t CK
Tclk
15
—
ns
(CAS latency = 3)
t CK
Tclk
10
—
ns
CLK high pulse width
t CKH
Tch
3
—
ns
1
CLK low pulse width
t CKL
Tcl
3
—
ns
1
Access time from CLK
(CAS latency = 2)
t AC
Tac
—
8
ns
(CAS latency = 3)
t AC
Tac
—
6
ns
Data-out hold time
t OH
Toh
3
—
ns
1, 2
CLK to Data-out low impedance
t LZ
2
—
ns
1, 2, 3
CLK to Data-out high impedance
t HZ
—
6
ns
1, 4
Input setup time
t AS , t CS, t DS, Tsi
t CES
2
—
ns
1, 5, 6
CKE setup time for power down
exit
t CESP
2
—
ns
1
Input hold time
t AH, t CH, t DH, Thi
t CEH
1
—
ns
1, 5
Notes
1
1, 2
Tpde
Ref/Active to Ref/Active command t RC
period
Trc
70
—
ns
1
Active to Precharge command
period
t RAS
Tras
50
120000
ns
1
Active command to column
command (same bank)
t RCD
Trcd
20
—
ns
1
Precharge to active command
period
t RP
Trp
20
—
ns
1
Write recovery or data-in to
precharge lead time
t DPL
Tdpl
10
—
ns
1
Active (a) to Active (b) command
period
t RRD
Trrd
20
—
ns
1
Transition time (rise and fall)
tT
1
5
ns
Refresh period
t REF
—
64
ms
9
HM5212325FBPC-B60
Notes: 1.
2.
3.
4.
5.
6.
AC measurement assumes t T = 1 ns. Reference level for timing of input signals is 1.5 V.
Access time is measured at 1.5 V. Load condition is CL = 50 pF.
t LZ (min) defines the time at which the outputs achieves the low impedance state.
t HZ (max) defines the time at which the outputs achieves the high impedance state.
t CES define CKE setup time to CLK rising edge except power down exit command.
t AS /tAH: Address, tCS/tCH: CS, RAS, CAS, WE, DQM.
t DS/tDH: Data-in, tCES/tCEH: CKE
Test Conditions
• Input and output timing reference levels: 1.5 V
• Input waveform and output load: See following figures
2.4 V
input
0.4 V
I/O
2.0 V
0.8 V
CL
t
10
T
tT
HM5212325FBPC-B60
Package Dimensions
HM5212325FBPC (BP-90)
0.8
11.2
B
0.12 C
13.0
12.8 ± 0.10
Index
A
0.8
-C-
0.20 C A
0.20 C
10.0
A
4×
0.20 C B
0.15
Unit: mm
2.4
5.6
1.45 Max
0.41 – 0.16
+ 0.04
9.8 ± 0.10
90 × φ0.45 ± 0.05
φ0.08 M C A B
Details of the part A
Hitachi Code
JEDEC
EIAJ
Mass (reference value)
BP-90
—
—
0.28 g
11
HM5212325FBPC-B60
Cautions
1. Hitachi neither warrants nor grants licenses of any rights of Hitachi’s or any third party’s patent,
copyright, trademark, or other intellectual property rights for information contained in this document.
Hitachi bears no responsibility for problems that may arise with third party’s rights, including intellectual
property rights, in connection with use of the information contained in this document.
2. Products and product specifications may be subject to change without notice. Confirm that you have
received the latest product standards or specifications before final design, purchase or use.
3. Hitachi makes every attempt to ensure that its products are of high quality and reliability. However,
contact Hitachi’s sales office before using the product in an application that demands especially high
quality and reliability or where its failure or malfunction may directly threaten human life or cause risk of
bodily injury, such as aerospace, aeronautics, nuclear power, combustion control, transportation, traffic,
safety equipment or medical equipment for life support.
4. Design your application so that the product is used within the ranges guaranteed by Hitachi particularly for
maximum rating, operating supply voltage range, heat radiation characteristics, installation conditions and
other characteristics. Hitachi bears no responsibility for failure or damage when used beyond the
guaranteed ranges. Even within the guaranteed ranges, consider normally foreseeable failure rates or
failure modes in semiconductor devices and employ systemic measures such as fail-safes, so that the
equipment incorporating Hitachi product does not cause bodily injury, fire or other consequential damage
due to operation of the Hitachi product.
5. This product is not designed to be radiation resistant.
6. No one is permitted to reproduce or duplicate, in any form, the whole or part of this document without
written approval from Hitachi.
7. Contact Hitachi’s sales office for any questions regarding this document or Hitachi semiconductor
products.
Hitachi, Ltd.
Semiconductor & Integrated Circuits.
Nippon Bldg., 2-6-2, Ohte-machi, Chiyoda-ku, Tokyo 100-0004, Japan
Tel: Tokyo (03) 3270-2111 Fax: (03) 3270-5109
URL
NorthAmerica
: http:semiconductor.hitachi.com/
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: http://www.has.hitachi.com.sg/grp3/sicd/index.htm
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: http://www.hitachi.com.tw/E/Product/SICD_Frame.htm
Asia (HongKong) : http://www.hitachi.com.hk/eng/bo/grp3/index.htm
Japan
: http://www.hitachi.co.jp/Sicd/index.htm
For further information write to:
Hitachi Semiconductor
(America) Inc.
179 East Tasman Drive,
San Jose,CA 95134
Tel: <1> (408) 433-1990
Fax: <1>(408) 433-0223
Hitachi Europe GmbH
Electronic components Group
Dornacher Straße 3
D-85622 Feldkirchen, Munich
Germany
Tel: <49> (89) 9 9180-0
Fax: <49> (89) 9 29 30 00
Hitachi Europe Ltd.
Electronic Components Group.
Whitebrook Park
Lower Cookham Road
Maidenhead
Berkshire SL6 8YA, United Kingdom
Tel: <44> (1628) 585000
Fax: <44> (1628) 778322
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Hitachi Tower
Singapore 049318
Tel: 535-2100
Fax: 535-1533
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Taipei Branch Office
3F, Hung Kuo Building. No.167,
Tun-Hwa North Road, Taipei (105)
Tel: <886> (2) 2718-3666
Fax: <886> (2) 2718-8180
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Group III (Electronic Components)
7/F., North Tower, World Finance Centre,
Harbour City, Canton Road, Tsim Sha Tsui,
Kowloon, Hong Kong
Tel: <852> (2) 735 9218
Fax: <852> (2) 730 0281
Telex: 40815 HITEC HX
Copyright © Hitachi, Ltd., 1998. All rights reserved. Printed in Japan.
12
HM5212325FBPC-B60
Revision Record
Rev.
Date
0.0
0.1
Contents of Modification
Drawn by
Approved by
Oct. 25, 1999 Initial issue
S. Hatano
S. Hatano
Jan. 7, 2000
Y. Kagaya
S. Hatano
Correct errors of pin arrangement
Correct errors of DC Characteristics
I LI: −4/4 to −2/2 µA
I LO : −6/6 to −3/3 µA
Package dimension
Change tolerance value
0.2
Feb. 29, 2000 Capacitance
CI1 min: 5 pF to 4 pF
CI2 min: 5 pF to 4 pF
CI3 min: 2.5 pF to 2 pF
CO min: 3 pF to 2 pF
1.0
May. 12 ,2000 Package dimension
Change of seated height
M. Nishimura I. Hihara
13