HITTITE HMC282

HMC282
MICROWAVE CORPORATION
GaAs MMIC LOW NOISE AMPLIFIER 36 - 40 GHz
V01.0700
FEBRUARY 2001
General Description
NOISE FIGURE: 3.5 dB
The HMC282 chip is a four stage GaAs MMIC
Low Noise Amplifier (LNA) which covers the
frequency range of 36 to 40 GHz. The chip can
easily be integrated into Multi-Chip Modules
(MCMs) due to its small (2.30 mm2) size. The
chip utilizes a GaAs PHEMT process offering 26
dB gain from a bias supply of +3.5V @ 90 mA with
a noise figure of 3.5 dB. This LNA can be used in
millimeterwave point-to-point radios, VSAT, and
other SATCOM applications. All data is with the
chip in a 50 ohm test fixture connected via ribbon
bonds of minimal length. The HMC282 may be
used in conjunction with the HMC259 mixer to
realize a millimeterwave system receiver.
STABLE GAIN vs. TEMPERATURE: 26dB ± 1.2dB
SMALL SIZE: 1.11 mm x 2.07 mm
IDEAL FOR 38 GHz RADIOS, E1 & T1
DIE
AMPLIFIERS
1
Features
Guaranteed Performance,
Parameter
Vdd = +3.5V*, Idd = 90mA, -55 to +85 deg C
Min.
Typ.
Frequency Range
Gain
Max.
Min.
36 - 40
21
27
Gain Flatness (Any 1Ghz BW)
±1
Noise Figure
3.8
21
5.8
Typ.
Max.
Units
37 - 39
GHz
26
dB
±1
dB
3.5
5.3
dB
Input Return Loss
7
6
dB
Output Return Loss
5
5
dB
Reverse Isolation
Output Power for 1dB Compression (P1dB)
40
46
40
46
dB
5
9
5
9
dB m
12
dB m
21
27
dB m
3.25
3.5
Saturated Output Power (Psat)
Output Third Order Intercept (IP3)
Supply Voltage (Vdd)
Gate Bias Voltage (Vg1, 2 & Vg3, 4)
12
18
25
3.25
3.5
3.75
-0.45 / -0.3
Supply Current (Idd)
(Vdd = +3.5V, Vg1, 2, 3, 4 = -0.15V Typ.)
90
3.75
-0.45 / -0.3
140
90
V dc
V dc
140
mA
* Vdd = +3.5V , adjust Vg1, 2 & Vg3, 4 between-2.0 to +0.4V to achieve Idd = 90 mA typical.
12 Elizabeth Drive, Chelmsford, MA 01824
1 - 60
Phone: 978-250-3343
Fax: 978-250-3373
Web Site: www.hittite.com
HMC282
MICROWAVE CORPORATION
HMC282 LOW NOISE AMPLIFIER 36 - 40 GHz
V01.0700
FEBRUARY 2001
Gain vs. Temperature
Broadband Gain & Return Loss
(S22)
-55 C
-10
15
(S11)
10
-15
5
25
+85 C
AMPLIFIERS
20
1
30
RETURN LOSS (dB)
-5
25
GAIN (dB)
30
GAIN (dB)
35
0
35
+25 C
20
0
15
-20
-5
26
28
30
32
34
36
38
32
34
36
40
38
40
FREQUENCY (GHz)
FREQUENCY (GHz)
0
0
-2
OUTPUT RETURN LOSS (dB)
INPUT RETURN LOSS (dB)
DIE
Output Match (S22)
Input Match (S11)
-5
-10
-15
-20
-4
-6
-8
-10
-12
-14
-16
-18
-20
-25
30
32
34
36
38
30
40
32
34
36
38
40
FREQUENCY (GHz)
FREQUENCY (GHz)
Noise Figure vs. Temperature
8
NOISE FIGURE (dB)
7
+85 C
6
5
4
3
2
+25 C
-55 C
1
0
35
36
37
38
39
40
FREQUENCY (GHz)
All data is with the chip in a 50 ohm test fixture connected via ribbon bonds of minimal length.
12 Elizabeth Drive, Chelmsford, MA 01824
Phone: 978-250-3343
Fax: 978-250-3373
Web Site: www.hittite.com
1 - 61
HMC282
MICROWAVE CORPORATION
HMC282 LOW NOISE AMPLIFIER 36 - 40 GHz
V01.0700
FEBRUARY 2001
Isolation
IP3 Output @ Vdd = +3.5V
0
+85 C
-10
1
30
-20
IP3 (dBm)
ISOLATION (dB)
AMPLIFIERS
35
-30
-40
25
20
-55 C
-50
+25 C
15
-60
-70
10
DIE
10
15
20
25
30
35
40
35
36
FREQUENCY (GHz)
37
38
39
40
FREQUENCY (GHz)
P1dB Output @ Vdd = +3.5V
16
14
+85 C
P1dB (dBm)
12
10
8
6
+25 C
4
-55 C
2
0
35
36
37
38
39
40
FREQUENCY (GHz)
All data is with the chip in a 50 ohm test fixture connected via ribbon bonds of minimal length.
12 Elizabeth Drive, Chelmsford, MA 01824
1 - 62
Phone: 978-250-3343
Fax: 978-250-3373
Web Site: www.hittite.com
HMC282
MICROWAVE CORPORATION
HMC282 LOW NOISE AMPLIFIER 36 - 40 GHz
V01.0700
FEBRUARY 2001
Absolute Maximum Ratings
Vdd
Supply Voltage (Vdd)
RF IN
RF OUT
Vg1, 2
+4 Vdc
Supply Current (Idd)
200 mA
Gate Bias Voltage (Vgg)
-2 to +0.4V
DC Gate Current (mA)
4 MA
Input Power (RFin)(Vdd=+3V)
+13 dBm
Channel Temperature (Tc)
175 °C
Thermal Resistance (
(Channel Backside)
90 °C/W
Vg3, 4
Backside is Ground
j c)
1
Storage Temperature
-65 to +150 °C
Operating Temperature
-55 to +85 °C
DIE
Outline
ALL DIMENSION IN MILLIMETERS (INCHES)
ALL TOLERANCES ARE ±0.025 (0.001)
DIE THICKNESS IS 0.100 (0.004) BACKSIDE IS GROUND
BOND PADS ARE 0.100 (0.004) SQUARE
BACKSIDE METALLIZATION : GOLD
BOND PAD METALLIZATION : GOLD
12 Elizabeth Drive, Chelmsford, MA 01824
AMPLIFIERS
Schematic
Phone: 978-250-3343
Fax: 978-250-3373
Web Site: www.hittite.com
1 - 63
HMC282
MICROWAVE CORPORATION
HMC282 LOW NOISE AMPLIFIER 36 - 40 GHz
FEBRUARY 2001
V01.0700
DIE
AMPLIFIERS
1
Mounting & Bonding Techniques for Millimeterwave GaAs MMICs
The die should be attached directly to the ground plane eutectically or with conductive epoxy (see HMC general Handling,
Mounting, Bonding Note).
50 Ohm Microstrip transmission lines on 0.127mm (5 mil) thick alumina thin film substrates are recommended for bringing
RF to and from the chip (Figure 1). If 0.254mm (10 mil) thick alumina thin film substrates must be used, the die should
be raised 0.150mm (6 mils) so that the surface of the die is coplanar with the surface of the substrate. One way to
accomplish this is to attach the 0.102mm (4 mil) thick die to a 0.150mm (6 mil) thick molybdenum heat spreader (molytab) which is then attached to the ground plane (Figure 2).
Microstrip substrates should brought as close to the die as possible
in order to minimize bond length. Typical die-to-substrate spacing is 0.076mm (3 mils). Gold ribbon of 0.076 mm x 0.013
mm (3mil x 0.5 mil) is recommended to minimize inductance on the RF ports. 0.025 mm (1 mil) diameter ball or wedge
bonds are acceptable for DC bias connections.
RF bypass capacitor should be used on the Vdd & Vgg inputs. 100 pF single layer capacitors (mounted eutectically or
by conductive epoxy) placed no further than 0.762mm (30 Mils) from the chip are recommended.
12 Elizabeth Drive, Chelmsford, MA 01824
1 - 64
Phone: 978-250-3343
Fax: 978-250-3373
Web Site: www.hittite.com
HMC282
MICROWAVE CORPORATION
HMC282 LOW NOISE AMPLIFIER 36 - 40 GHz
FEBRUARY 2001
V01.0700
Handling Precautions
DIE
Mounting
The chip is back-metallized and can be die mounted with AuSn eutectic preforms or with electrically
conductive epoxy. The mounting surface should be clean and flat.
Eutectic Die Attach:
A 80/20 gold tin preform is recommended with a work surface temperature of 255 deg. C and a tool temperature of 265 deg. C. When hot 90/10 nitrogen/hydrogen gas is applied, tool tip temperature should be
290 deg. C.
DO NOT expose the chip to a temperature greater than 320 deg. C for more than 20 seconds. No more
than 3 seconds of scrubbing should be required for attachment.
Epoxy Die Attach:
Apply a minimum amount of epoxy to the mounting surface so that a thin epoxy fillet is observed around
the perimeter of the chip once it is placed into position.
Cure epoxy per the manufacturer's schedule.
Wire Bonding
Ball or wedge bond with 0.025 mm (1 mil) diameter pure gold wire (DC bias) or ribbon bond (RF ports) with
0.076 mm x 0.013 mm (3 mil x 0.5 mil) size is recommended. Thermosonic wirebonding with a nominal
stage temperature of 150 deg. C and a ball bonding force of 40 to 50 grams or wedge bonding force of 18 to
22 grams is recommended. Use the minimum level of ultrasonic energy to achieve reliable wirebonds.
Wirebonds should be started on the chip and terminated on the package or substrate. All bonds should be
as short as possible <0.31 mm (12 mils).
12 Elizabeth Drive, Chelmsford, MA 01824
Phone: 978-250-3343
Fax: 978-250-3373
1
AMPLIFIERS
Follow these precautions to avoid permanent damage.
Cleanliness: Handle the chips in a clean environment. DO NOT attempt to clean the chip using liquid
cleaning systems.
Static Sensitivity: Follow ESD precautions to protect against ESD strikes ( see page 8 - 2 ).
Transients: Suppress instrument and bias supply transients while bias is applied. Use shielded signal and
bias cables to minimize inductive pick-up.
General Handling: Handle the chip along the edges with a vacuum collet or with a sharp pair of bent tweezers. The surface of the chip has fragile air bridges and should not be touched with vacuum collet, tweezers, or fingers.
Web Site: www.hittite.com
1 - 65